TWI679774B - Patterned photovoltaic substrate with enhanced photoelectricity function, light emitting diode and manufacturing method thereof - Google Patents

Patterned photovoltaic substrate with enhanced photoelectricity function, light emitting diode and manufacturing method thereof Download PDF

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TWI679774B
TWI679774B TW108100844A TW108100844A TWI679774B TW I679774 B TWI679774 B TW I679774B TW 108100844 A TW108100844 A TW 108100844A TW 108100844 A TW108100844 A TW 108100844A TW I679774 B TWI679774 B TW I679774B
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substrate
patterned
layer
enhanced
photoelectricity
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TW108100844A
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TW202027295A (en
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柯文政
Wen-Cheng Ke
凃益儒
Yi-Zu Tu
何嘉哲
Chia-Che Ho
洪福益
Fwu-Yih Houng
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中國砂輪企業股份有限公司
Kinik Company Ltd.
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/005Processes
    • H01L33/0062Processes for devices with an active region comprising only III-V compounds
    • H01L33/0066Processes for devices with an active region comprising only III-V compounds with a substrate not being a III-V compound
    • H01L33/007Processes for devices with an active region comprising only III-V compounds with a substrate not being a III-V compound comprising nitride compounds
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/12Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a stress relaxation structure, e.g. buffer layer
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/20Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate
    • H01L33/22Roughened surfaces, e.g. at the interface between epitaxial layers

Abstract

本發明提供具有強化光電性功能之圖案化光電基板之製作方法,包括:提供基板;蝕刻基板表面,以形成第一圖案化結構及間隔區域;形成二金屬層於第一圖案化結構及間隔區域表面;形成第二圖案化結構於第一圖案化結構上及間隔區域上方之其中一者或兩者;蝕刻第二圖案化結構,以向下延伸至基板部分表面;使間隔區域形成平坦面;移除金屬層,以形成具有第一圖案化結構、第二圖案化結構以及具有平坦的間隔區域之基板。此外,本發明更提供藉由上述方法製作的具有強化光電性功能之圖案化光電基板,以及具有該基板的發光二極體。The invention provides a method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function, including: providing a substrate; etching the surface of the substrate to form a first patterned structure and a spaced region; and forming a two metal layer on the first patterned structure and a spaced region. The surface; forming a second patterned structure on one or both of the first patterned structure and above the spaced region; etching the second patterned structure to extend down to the surface of the substrate portion; so that the spaced region forms a flat surface; The metal layer is removed to form a substrate having a first patterned structure, a second patterned structure, and a flat spaced region. In addition, the present invention further provides a patterned photovoltaic substrate with enhanced photoelectricity function manufactured by the above method, and a light emitting diode having the substrate.

Description

具有強化光電性功能之圖案化光電基板、發光二極體及其製作方法Patterned photovoltaic substrate with enhanced photoelectricity function, light emitting diode and manufacturing method thereof

本發明係關於一種具有強化光電性功能之圖案化光電基板及其製作方法,尤指一種具有平坦面的間隔區域之圖案化光電基板,以及具有該基板之發光二極體,以便於改善差排缺陷以及電性問題,進一步強化發光二極體之電性功能。The invention relates to a patterned photovoltaic substrate with enhanced photoelectricity function and a manufacturing method thereof, in particular to a patterned photovoltaic substrate having a flat surface space region, and a light emitting diode having the substrate, so as to improve the differential discharge Defects and electrical problems further strengthen the electrical functions of the light emitting diode.

人類照明歷史發展至今已進入固態照明時代,發光亮度更亮、售價更低廉、壽命更長、穩定性更高..等特性需求為固態照明產業共同追求的目標。而照明市場首重發光二極體之亮度需求,一般而言,發光二極體的最大光輸出(L max)主要由外部量子效率(η ext)及最大操作電流(I max)所決定,即L maxext×I max,其中,外部量子效率(η ext)又為內部量子效率(η int)及光萃取效率(η extr)所決定,即η extint×η extr。目前一般藍光發光二極體的內部量子效率已達70%以上,然而綠光發光二極體的內部量子效率卻驟降至40%以下,因此,藉由提升內部量子效率與光萃取效率以改善發光二極體的外部量子效率或增加發光二極體的發光亮度仍存在很大空間。 The historical development of human lighting has entered the era of solid-state lighting. Brighter brightness, lower prices, longer life, higher stability, etc. are the common goals pursued by the solid-state lighting industry. In the lighting market, the brightness requirements of light-emitting diodes are the first. In general, the maximum light output (L max ) of a light-emitting diode is mainly determined by the external quantum efficiency (η ext ) and the maximum operating current (I max ), that is, L max = η ext × I max , where the external quantum efficiency (η ext ) is again determined by the internal quantum efficiency (η int ) and the light extraction efficiency (η extr ), that is, η ext = η int × η extr . At present, the internal quantum efficiency of blue light-emitting diodes has generally reached more than 70%, but the internal quantum efficiency of green light-emitting diodes has suddenly dropped to less than 40%. Therefore, the internal quantum efficiency and light extraction efficiency have been improved to improve There is still much room for the external quantum efficiency of a light emitting diode or increasing the light emitting brightness of the light emitting diode.

由於氮化鎵與藍寶石基板間之晶格不匹配程度高達16%,當以藍寶石基板作為基材,進行氮化鎵薄膜磊晶時,氮化鎵薄膜內部會存在著應力,並出現許多不同種類差排缺陷,使氮化鎵薄膜差排密度達10 9至10 10cm -2,嚴重影響磊晶薄膜品質,且缺陷通常扮演非輻射的復合中心,造成發光效率降低。因此,圖案化藍寶石基板製作技術的開發,其關鍵在於缺陷密度的降低,以實質提升氮化鎵薄膜磊晶品質及增加發光亮度。藉由氮化鎵薄膜在圖案基板側壁上成長以改變氮化鎵薄膜差排缺陷成長方向,差排缺陷將彎曲90°,使互相交錯形成堆疊錯位等消除缺陷,並且在磊晶時透過三維應力釋放減少缺陷形成,降低薄膜內部差排密度以提升晶體品質。目前研究亦指出使用圖案藍寶石基板成長之氮化鎵薄膜發現可以降低差排缺陷密度到10 8至10 9cm -2,並進一步提升發光二極體的內部量子效率及發光亮度。 Because the degree of lattice mismatch between GaN and sapphire substrate is as high as 16%, when using sapphire substrate as the substrate to perform epitaxial GaN thin film, there will be stress in the GaN thin film, and many different types will appear. Differential defect, which makes the differential discharge density of GaN film reach 10 9 to 10 10 cm -2 , which seriously affects the quality of the epitaxial film, and the defect usually acts as a non-radiative recombination center, resulting in a decrease in luminous efficiency. Therefore, the key to the development of patterned sapphire substrate manufacturing technology is to reduce the defect density in order to substantially improve the epitaxial quality of GaN thin films and increase the luminous brightness. By growing the GaN thin film on the sidewall of the pattern substrate to change the growth direction of the GaN thin film differential defect, the differential defect will be bent by 90 °, which will eliminate the defect by interlacing each other to form a stacking misalignment, and transmit three-dimensional stress during epitaxy. Releasing reduces the formation of defects and reduces the differential density within the film to improve crystal quality. Current research has also pointed out that the use of patterned sapphire substrates for the growth of GaN films has been found to reduce the density of differential defects to 10 8 to 10 9 cm -2 and further increase the internal quantum efficiency and luminous brightness of light-emitting diodes.

承上所述,在基板上具有圖案的結構中,若基板上的圖案包括微米結構或者次微米結構的各種圖案,則由於無圖案之C面區域面積減少,將增加磊晶層在磊晶過程中的困難度,造成差排的問題,進一步影響LED的電性功能,例如抗靜電能力減弱等問題。此外,若以此基板作為LED基板,將造成LED的逆向漏電流提升,亦容易使得LED產生發熱的問題。As mentioned above, in the structure with a pattern on the substrate, if the pattern on the substrate includes various patterns of microstructure or submicron structure, the area of the C-plane area without a pattern will be reduced, which will increase the epitaxial layer during the epitaxial process Difficulties in the medium cause the problem of poor row, and further affect the electrical function of the LED, such as weakening of antistatic ability. In addition, if this substrate is used as the LED substrate, the reverse leakage current of the LED will be increased, and the LED will also easily generate heat.

在最新的研究中,亦有使用次微米尺度圖案基板來成長發光二極體結構,對於同一面積之圖案基板,縮小圖案尺寸增加圖案數量將提升側向成長的有效區域面積,側向成長機制增強,造成更容易改變成長方向並形成堆疊錯位以消除差排缺陷,及大幅減低薄膜內部差排密度,同時由於圖案間距較短,易在氮化鎵磊晶時形成空洞阻擋缺陷延伸,提升氮化鎵薄膜磊晶品質。研究結果顯示,使用微米尺度圖案藍寶石基板成長之氮化鎵薄膜可以降低差排密度到10 8cm -2,如將圖案基板改成次微米尺度時,由於單位體積應力釋放程度增加,則可將差排密度降低至10 7cm -2或更低。 In the latest research, sub-micron-scale pattern substrates are also used to grow light-emitting diode structures. For pattern substrates of the same area, reducing the pattern size and increasing the number of patterns will increase the area of the effective area for lateral growth and enhance the lateral growth mechanism. As a result, it is easier to change the growth direction and form stacking misalignment to eliminate differential defects, and greatly reduce the internal differential density of the film. At the same time, due to the short pattern spacing, it is easy to form voids during the epitaxial growth of gallium nitride to prevent the extension of defects and improve the nitride. Epitaxial quality of gallium thin film. The research results show that the growth of gallium nitride films using micron-scale patterned sapphire substrates can reduce the differential density to 10 8 cm -2 . If the pattern substrate is changed to sub-micron scale, the degree of stress release per unit volume can be increased. The differential row density is reduced to 10 7 cm -2 or lower.

已知技術中,如中華民國公告專利第I396297號,係揭示一種發光二極體,包括:基板,具有微米級孔洞於其中;作為緩衝層之奈米級多孔性光子晶體結構,形成於基板之上;第一型磊晶層,形成於上述緩衝層多孔性光子晶體結構之上;發光層,形成於上述第一型磊晶層之上;第二型磊晶層,形成於上述發光層之上;第一接觸電極,形成於上述該第一型磊晶層之上;以及,第二接觸電極,形成於上述第二型磊晶層之上。In the known technology, such as the Republic of China Publication Patent No. I396297, a light-emitting diode is disclosed, including: a substrate having micron-sized holes therein; and a nano-sized porous photonic crystal structure as a buffer layer formed on the substrate. The first type epitaxial layer is formed on the porous photonic crystal structure of the buffer layer; the light emitting layer is formed on the first type epitaxial layer; the second type epitaxial layer is formed on the light emitting layer; A first contact electrode is formed on the first type epitaxial layer; and a second contact electrode is formed on the second type epitaxial layer.

另一中華民國公開專利第201251113號,係揭示一種LED基板之製造方法、LED基板及白光LED構造,主要目的係為使LED發出演色性佳之高亮度白光,該基板之反射面上係形成複數頂部呈曲面之凸起顆粒,該些凸起顆粒之底部寬度為2微米至4微米,高度為1.2微米至1.8微米,相鄰凸起顆粒之間距則為0.6微米至3微米,並使一氮化銦鎵磊晶層於通電後發出波長為380至410奈米範圍內之紫外光,紫外光經由該基板之反射面及該些凸起顆粒反射,並激發混合氧化鋅及釔鋁石榴石之螢光物質而產生紫外光之互補色光,而於相互混色後,由一封裝體散射出演色性佳之高亮度白光,而可用於照明等用途。Another published patent of the Republic of China No. 201251113 discloses a method for manufacturing an LED substrate, an LED substrate, and a white LED structure. The main purpose is to make the LED emit high-brightness white light with good color rendering. The reflective surface of the substrate forms a plurality of numbers. The convex particles with curved surfaces on the top, the width of the bottom of these convex particles is 2 micrometers to 4 micrometers, the height of 1.2 micrometers to 1.8 micrometers, and the distance between adjacent convex particles is 0.6 micrometers to 3 micrometers. The indium gallium epitaxial layer emits ultraviolet light with a wavelength in the range of 380 to 410 nanometers after being energized. The ultraviolet light is reflected by the reflective surface of the substrate and the raised particles, and excites the mixed zinc oxide and yttrium aluminum garnet. Fluorescent substances generate complementary color light of ultraviolet light, and after mixing with each other, a package body scatters high-brightness white light with good color rendering, which can be used for lighting and other purposes.

然而,上述發明二極體中,主要都是藉由單獨在基板上形成一奈米級多孔性光子晶體結構或微米級凸起顆粒以提高發光二極體之發光效率,然而,前述微米級或奈米級結構設計對於降低差排密度程度或強化光電性功能的程度都仍有其本質上的限制。However, in the above-mentioned inventive diodes, a nanometer-sized porous photonic crystal structure or micron-sized convex particles are mainly formed on the substrate to improve the luminous efficiency of the light-emitting diode. However, the micron-sized or Nano-level structural design still has its inherent limitations in reducing the degree of differential row density or strengthening the photoelectricity function.

此外,如本案申請人申請的中華民國專利申請案第102111662號,係揭示一種光電元件的基板,提供至少一光電元件形成於該基板的一上表面,其特徵在於,該基板的該上表面具有複數個微米結構與複數個次微米結構以構成一粗糙表面,其中該些次微米結構的尺寸小於該些微米結構。藉此,可改善基板之光學漫射率,並可增進成長於基板上的磊晶薄膜材料品質,進而提升光電元件之光萃取效率,達到提升整體光電元件之發光亮度。本發明另提供一種光電元件。其中,該前案為本案申請人所提出藉由微米結構及次微米結構之組合以增進磊晶薄膜材料品質或提升整體光電元件之發光亮度。In addition, as in the Republic of China Patent Application No. 102111662 filed by the applicant of the present application, a substrate for a photovoltaic element is disclosed, and at least one photovoltaic element is provided on an upper surface of the substrate, characterized in that the upper surface of the substrate has The plurality of micro-structures and the plurality of sub-micro-structures constitute a rough surface, wherein the sizes of the sub-micro structures are smaller than the micro-structures. In this way, the optical diffusion rate of the substrate can be improved, and the quality of the epitaxial thin film material grown on the substrate can be improved, thereby improving the light extraction efficiency of the photovoltaic element and achieving the luminous brightness of the entire photovoltaic element. The invention further provides a photovoltaic element. Among them, the previous case is a combination of micro-structure and sub-micro-structure proposed by the applicant of the present application to improve the quality of the epitaxial thin film material or the luminous brightness of the overall photovoltaic device.

因此,目前急需發展出一種具有強化光電性功能之圖案化光電基板及具有該基板之發光二極體,其可以有效降低氮化鎵薄膜之差排缺陷密度,並增加發光二極體之發光效率,進而提高發光二極體之應用性及價值實有其需要。Therefore, there is an urgent need to develop a patterned photovoltaic substrate with enhanced photoelectricity function and a light emitting diode having the substrate, which can effectively reduce the differential defect density of the gallium nitride film and increase the light emitting efficiency of the light emitting diode. In order to further improve the applicability and value of light-emitting diodes, there is a need for them.

本發明之主要目的係在提供一種具有強化光電性功能之圖案化光電基板之製作方法,其步驟包括:The main purpose of the present invention is to provide a method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function. The steps include:

步驟S1:提供一基板;Step S1: providing a substrate;

步驟S2:藉由一第一蝕刻處理於該基板表面形成一第一圖案化結構及一間隔區域;Step S2: forming a first patterned structure and a space region on the surface of the substrate by a first etching process;

步驟S3:形成一第一金屬層及一第二金屬層於該基板上之該第一圖案化結構及該間隔區域表面;Step S3: forming a first metal layer and a second metal layer on the first patterned structure and the surface of the space region on the substrate;

步驟S4:藉由一第二蝕刻處理於該第二金屬層上形成一第二圖案化結構,該第二圖案化結構係位於該第一圖案化結構上及該間隔區域上方之其中一者或兩者;Step S4: forming a second patterned structure on the second metal layer by a second etching process, the second patterned structure is located on one of the first patterned structure and above the gap region or Both

步驟S5:藉由一第三蝕刻處理使該第二圖案化結構向下延伸至該第一金屬層及該基板之部分表面;Step S5: the third patterned structure is extended downward to the first metal layer and a part of the surface of the substrate by a third etching process;

步驟S6:進行一第四蝕刻處理一預定時間,使該間隔區域為一平坦面;以及Step S6: performing a fourth etching process for a predetermined time so that the interval region is a flat surface; and

步驟S7:藉由一酸液處理以自該基板上移除該第二金屬層以及該第一金屬層,以形成該第一圖案化結構為一微米級突出結構、該第二圖案化結構為一次微米級凹槽結構、以及該間隔區域為一平坦面之基板。Step S7: removing the second metal layer and the first metal layer from the substrate by an acid solution to form the first patterned structure as a micron-scale protruding structure, and the second patterned structure as The primary micron-scale groove structure and the substrate with the spaced region as a flat surface.

本發明所提出的具有強化光電性功能之圖案化光電基板之製作方法,其中該步驟S6更包括一預設條件,包括:一蝕刻氣體流量,介於每分鐘1至40標準立方厘米之間;一基板偏壓,介於50至700瓦之間;以及一供應電源,介於150至1200瓦之間。The method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function according to the present invention, wherein step S6 further includes a preset condition, including: an etching gas flow rate between 1 and 40 standard cubic centimeters per minute; A substrate bias voltage is between 50 and 700 watts; and a power supply is between 150 and 1200 watts.

本發明所提出的具有強化光電性功能之圖案化光電基板之製作方法,其中該預定時間介於150秒至1000秒之間。The method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function provided by the present invention, wherein the predetermined time is between 150 seconds and 1000 seconds.

本發明所提出的具有強化光電性功能之圖案化光電基板之製作方法,其中,更包括一步驟S8:提供一二維材料層,形成於該間隔區域上及該第一圖案化結構上方。The method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function provided by the present invention further includes a step S8: providing a two-dimensional material layer formed on the spaced region and above the first patterned structure.

本發明所提出的具有強化光電性功能之圖案化光電基板之製作方法,其中該二維材料層包括石墨烯(Graphene)。The manufacturing method of the patterned photovoltaic substrate with enhanced photoelectricity function provided by the present invention, wherein the two-dimensional material layer includes graphene.

本發明所提出的具有強化光電性功能之圖案化光電基板之製作方法,其中該石墨烯係藉由以下步驟產生:設置一銅層於該間隔區域上;藉由氫氣、甲烷與該銅層之化學作用,使得該銅層之上以及該銅層之下分別產生一石墨烯層;移除該銅層之上的該石墨烯層;以及移除該銅層,以便於留下該銅層之下之該石墨烯層於該間隔區域上。According to the present invention, a method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function, wherein the graphene is generated by the following steps: a copper layer is disposed on the space region; and hydrogen, methane, and the copper layer are used to produce the graphene. A chemical action causes a graphene layer to be generated above the copper layer and below the copper layer; removing the graphene layer above the copper layer; and removing the copper layer so as to leave the copper layer The graphene layer is on the spaced region.

本發明所提出的具有強化光電性功能之圖案化光電基板之製作方法,其中該銅層係藉由熱蒸鍍或濺鍍方法產生。In the method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function, the copper layer is produced by a thermal evaporation method or a sputtering method.

本發明所提出的具有強化光電性功能之圖案化光電基板之製作方法,其中該銅層之一厚度介於50至500奈米之間。In the method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function, the thickness of one of the copper layers is between 50 and 500 nanometers.

本發明所提出的具有強化光電性功能之圖案化光電基板之製作方法,其中該氫氣、該甲烷與該銅層之該化學作用係藉由300至1500度之一工作溫度產生該石墨烯層。The method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function according to the present invention, wherein the chemical action of the hydrogen, the methane, and the copper layer generates the graphene layer at an operating temperature of 300 to 1500 degrees.

本發明所再提出一種具有強化光電性功能之圖案化光電基板,包括:The invention further provides a patterned photovoltaic substrate with enhanced photoelectricity function, including:

一第一圖案化結構,係為一微米級突出結構;A first patterned structure, which is a micron-scale protruding structure;

一間隔區域,係為一平坦面;以及A spaced area that is a flat surface; and

一第二圖案化結構,係為一次微米級凹槽結構,並形成於該第一圖案化結構上。A second patterned structure is a micron-level groove structure and is formed on the first patterned structure.

本發明所提出的具有強化光電性功能之圖案化光電基板,更包括一二維材料層,形成於該間隔區域上及該第一圖案化結構上方。The patterned photovoltaic substrate with enhanced photoelectricity function provided by the present invention further includes a two-dimensional material layer formed on the interval region and above the first patterned structure.

本發明所提出的具有強化光電性功能之圖案化光電基板,其中該二維材料層包括石墨烯。The patterned photovoltaic substrate with enhanced photoelectricity function provided by the present invention, wherein the two-dimensional material layer includes graphene.

本發明再提出一種具有強化光電性功能之圖案化光電基板之發光二極體,包括:The present invention further provides a light-emitting diode of a patterned photovoltaic substrate with enhanced photoelectricity function, including:

一基板,該基板係為依據前述中任一項的具有強化光電性功能之圖案化光電基板;A substrate, which is a patterned photovoltaic substrate with enhanced photoelectricity function according to any one of the foregoing;

一緩衝層,設置於該基板上;以及A buffer layer disposed on the substrate; and

一光電元件,設置於該緩衝層上,且包含一第一半導體層、一發光層、及一第二半導體層;A photovoltaic element is disposed on the buffer layer and includes a first semiconductor layer, a light emitting layer, and a second semiconductor layer;

其中,該第一半導體層係接合至該緩衝層,該發光層係夾設於該第一半導體層及該第二半導體層之間。The first semiconductor layer is bonded to the buffer layer, and the light emitting layer is sandwiched between the first semiconductor layer and the second semiconductor layer.

本發明所提出的具有強化光電性功能之圖案化光電基板之發光二極體,更包括一二維材料層,形成於該基板之該間隔區域上及該第一圖案化結構上方。The light-emitting diode of the patterned photovoltaic substrate with enhanced photoelectricity function provided by the present invention further includes a two-dimensional material layer formed on the spaced region of the substrate and above the first patterned structure.

本發明所提出的具有強化光電性功能之圖案化光電基板之發光二極體,其中該二維材料層包括石墨烯(Graphene)。The light-emitting diode of the patterned photovoltaic substrate with enhanced photoelectricity function provided by the present invention, wherein the two-dimensional material layer includes graphene.

本發明所提出的具有強化光電性功能之圖案化光電基板之發光二極體,其中,該緩衝層為氮化鋁(Aluminum Nitride)。The light-emitting diode of the patterned photovoltaic substrate with enhanced photoelectricity function provided by the present invention, wherein the buffer layer is aluminum nitride (Aluminum Nitride).

本發明所提出的具有強化光電性功能之圖案化光電基板之發光二極體,其中,該緩衝層係設置於該基板之該二維材料層之上。The light-emitting diode of the patterned photovoltaic substrate with enhanced photoelectricity function provided by the present invention, wherein the buffer layer is disposed on the two-dimensional material layer of the substrate.

以下係藉由特定的具體實施例說明本發明之實施方式,熟習此技藝之人士可由本說明書所揭示之內容輕易地了解本發明之其他優點與功效。本發明亦可藉由其他不同的具體實施例加以施行或應用,本說明書中的各項細節亦可針對不同觀點與應用,在不悖離本發明之精神下進行各種修飾與變更。The following is a description of specific embodiments of the present invention. Those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied by other different specific embodiments, and various details in this specification can also be modified and changed for different viewpoints and applications without departing from the spirit of the present invention.

請參考圖1,為本發明提出一具有強化光電性功能之圖案化光電基板的製作方法步驟流程圖,其步驟包括:Please refer to FIG. 1, which is a flowchart of steps of a method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function according to the present invention. The steps include:

步驟S1:提供一基板10;請參考圖2A,在一實施例中,基板10係選用一平面表面的一藍寶石基板,或選用一平面表面的矽基板亦可。Step S1: Provide a substrate 10; please refer to FIG. 2A. In one embodiment, the substrate 10 is a sapphire substrate with a flat surface or a silicon substrate with a flat surface.

步驟S2:請參考圖2B,藉由第一蝕刻處理於該基板10表面形成第一圖案化結構11及間隔區域12。在一實施例中,第一蝕刻處理處理可為一等向性蝕刻(Isotropic etching)或一非等向性蝕刻(Anisotropic etching),其中,可為電感式偶合電漿反應性離子蝕刻法(ICP-RIE)、化學液蝕刻法、乾式蝕刻法、電漿蝕刻法、或雷射加工法。此外,等向性蝕刻可利用化學蝕刻液(例如強酸)在高溫環境下進行化學蝕刻反應,以在基板10上製作出具有一定週期性之微米級突出或凹槽結構;此外,非等向性蝕刻程序為先在基板10上形成一圖案化光阻層,再利用電感式耦合電漿反應性離子蝕刻(ICP-RIE)技術進行蝕刻,以選擇性地移除部分基板10,同樣可達到上述形成具有一定週期性之微米級突出或凹槽結構之目的。Step S2: Referring to FIG. 2B, a first patterned structure 11 and a space region 12 are formed on the surface of the substrate 10 by a first etching process. In one embodiment, the first etching process may be an isotropic etching or an anisotropic etching, and may be an inductively coupled plasma reactive ion etching (ICP) method. -RIE), chemical liquid etching, dry etching, plasma etching, or laser processing. In addition, isotropic etching can use a chemical etching solution (such as a strong acid) to perform a chemical etching reaction under a high temperature environment to produce a micron-level protrusion or groove structure with a certain periodicity on the substrate 10; in addition, anisotropic The etching procedure is to first form a patterned photoresist layer on the substrate 10, and then use inductively coupled plasma reactive ion etching (ICP-RIE) technology to perform etching to selectively remove part of the substrate 10, which can also achieve the above. The purpose of forming a micron-scale protrusion or groove structure with a certain periodicity.

此外,在步驟S2中,更包括提供一第一光阻層(未圖示)設置於基板10之部分表面上,使第一蝕刻處理可為選擇性地移除部分的基板10;此外,在前述本發明之一種具有強化光電性功能之圖案化光電基板之製作方法中,該第一圖案化結構11可為一微米級突出結構(如圖2B所示)或一微米級凹槽結構,且間隔區域12可為一平面結構。於本發明之一實施態樣中,第一圖案化結構11可為一微米級突出結構,其高度為1.2微米至2微米,外徑為1微米至5微米,相鄰的該第一圖案化結構11之間距(即為該間隔區域12之長度或寬度)為0.3微米至1微米。此外,於本發明之另一實施態樣中,第一圖案化結構11可為一微米級凹槽結構,此部分將於後面詳細說明。In addition, in step S2, it further includes providing a first photoresist layer (not shown) disposed on a part of the surface of the substrate 10, so that the first etching process can selectively remove part of the substrate 10; In the aforementioned method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function of the present invention, the first patterned structure 11 may be a micron-level protruding structure (as shown in FIG. 2B) or a micron-level groove structure, and The separation region 12 may be a planar structure. In one embodiment of the present invention, the first patterned structure 11 may be a one-micron-scale protruding structure having a height of 1.2 micrometers to 2 micrometers and an outer diameter of 1 micrometer to 5 micrometers. The distance between the structures 11 (that is, the length or width of the spacing region 12) is 0.3 μm to 1 μm. In addition, in another embodiment of the present invention, the first patterned structure 11 may be a micron-level groove structure, which will be described in detail later.

步驟S3:請參考圖2C,形成第一金屬層13及第二金屬層14於基板10上之第一圖案化結構11及間隔區域12的表面。其中,第一金屬層13或第二屬層14之形成可藉由塗佈法、化學電鍍法、濺鍍法、蒸鍍法、陰極電弧法、或化學氣相沉積法,其中,蒸鍍法包括電子束蒸鍍法、熱蒸鍍法、高週波蒸鍍法、或雷射蒸鍍法等,本發明並未侷限於此。在此,本發明所揭露之一種具有強化光電性功能之圖案化光電基板之製作方法中,第一金屬層13為至少一選擇由鈦、鉻、鉬、或二氧化矽(SiO 2)組合等所組成之群組,且第一金屬層13之厚度可為1奈米至1微米;此外,第二金屬層14為鋁,且第二金屬層14之厚度可為10奈米至100微米。而於本發明之另一實施態樣中,第一金屬層13則選用鈦為主。 Step S3: Please refer to FIG. 2C, forming the first patterned structure 11 and the space 12 of the first metal layer 13 and the second metal layer 14 on the substrate 10. The first metal layer 13 or the second metal layer 14 can be formed by a coating method, a chemical plating method, a sputtering method, a vapor deposition method, a cathodic arc method, or a chemical vapor deposition method. Among them, the vapor deposition method The method includes an electron beam evaporation method, a thermal evaporation method, a high frequency evaporation method, or a laser evaporation method, and the present invention is not limited thereto. Here, in a method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function disclosed in the present invention, the first metal layer 13 is at least one selected from the group consisting of titanium, chromium, molybdenum, or silicon dioxide (SiO 2 ). The group is formed, and the thickness of the first metal layer 13 may be 1 nanometer to 1 micrometer. In addition, the second metal layer 14 is aluminum, and the thickness of the second metal layer 14 may be 10 nanometers to 100 micrometers. In another embodiment of the present invention, the first metal layer 13 is mainly titanium.

步驟S4:請參考圖2D,藉由第二蝕刻處理於第二金屬層14上形成一第二圖案化結構15,第二圖案化結構15係位於第一圖案化結構11上及間隔區域12上方之其中一者或兩者。在一實施例中,第二蝕刻處理是使用一陽極氧化鋁處理(anodic aluminum oxide,AAO),但並不以此為限。以使用陽極氧化鋁處理來說,其包含提供一第二光阻層設置於第一圖案化結構11上方之第二金屬層14的表面,使該陽極氧化鋁處理可為選擇性地移除部分的間隔區域12上方之該第二金屬層14,因此,第二圖案化結構15可形成於間隔區域12上方之第二金屬層14,但第一圖案化結構11上方之第二金屬層14則不會具有該第二圖案化結構15。於另一實施例,在前述本發明之一種具有強化光電性功能之圖案化光電基板之製作方法中,於步驟S4中,更包括提供第二光阻層設置於間隔區域12上方之第二金屬層14表面,使陽極氧化鋁處理可為選擇性地移除部分的第一圖案化結構11上方之第二金屬層14,因此,第二圖案化結構15可形成於第一圖案化結構11上方之第二金屬層14,但間隔區域12上方之第二金屬層14則不會具有該第二圖案化結構15。Step S4: Referring to FIG. 2D, a second patterned structure 15 is formed on the second metal layer 14 by a second etching process. The second patterned structure 15 is located on the first patterned structure 11 and above the spacer region 12. Either or both. In one embodiment, the second etching process is an anodic aluminum oxide (AAO) process, but it is not limited thereto. In the case of using anodized aluminum, it includes providing a second photoresist layer on the surface of the second metal layer 14 above the first patterned structure 11, so that the anodized aluminum can be selectively removed. The second metal layer 14 above the spacer region 12, therefore, the second patterned structure 15 may be formed on the second metal layer 14 above the spacer region 12, but the second metal layer 14 above the first patterned structure 11 is It will not have the second patterned structure 15. In another embodiment, in the aforementioned method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function of the present invention, in step S4, it further includes providing a second photoresist layer disposed on the second region over the second metal 12 On the surface of the layer 14, the anodized aluminum treatment can selectively remove a portion of the second metal layer 14 above the first patterned structure 11. Therefore, the second patterned structure 15 can be formed above the first patterned structure 11. The second metal layer 14, but the second metal layer 14 above the spacer region 12 does not have the second patterned structure 15.

步驟S5:請參考圖2E,藉由第三蝕刻處理使第二圖案化結構15向下延伸至第一金屬層13及基板10之部分表面;在此所述的第三蝕刻處理的方式可以同前述之第一蝕刻處理,在此則不再贅述。Step S5: Please refer to FIG. 2E. The third patterning structure 15 is extended downward to the first metal layer 13 and a part of the surface of the substrate 10 through a third etching process. The third etching process described herein can be performed in the same manner. The foregoing first etching process is not repeated here.

步驟S6:請參考圖2F與圖2G,進行一第四蝕刻處理一預定時間,使間隔區域12成為一平坦面。在此步驟中,其中,預定時間可以介於150秒至1000秒之間,在一預定時間的初期,基板10的表面變化如圖2F所示,所進行的第四蝕刻處理對於間隔區域12上方的蝕刻速率會高於第一圖案化結構11,而當預定時間的持續進行,則基板10的表面變化接近如圖2G所示,間隔區域12的上方表面第一金屬層13與第二金屬層14已被移除、且間隔區域12已成為一平坦化的結構,而第一圖案化結構11的上則仍然保留。而要特別說明的是,欲達到使間隔區域12表面獲得最佳化的平坦面,第四蝕刻處理更包括一預設條件,包括:一蝕刻氣體流量,介於每分鐘1至40標準立方厘米(sccm,standard cubic centimeter per minute)之間;一基板偏壓,介於50至700瓦之間;一工作腔室壓力,介於1至25毫米托(torr)之間;以及一供應電源,介於150至1200瓦之間。於本發明之一實施例中,蝕刻氣體包括三氯化硼。Step S6: Referring to FIG. 2F and FIG. 2G, a fourth etching process is performed for a predetermined time, so that the interval region 12 becomes a flat surface. In this step, the predetermined time may be between 150 seconds and 1000 seconds. At the beginning of a predetermined time, the surface of the substrate 10 changes as shown in FIG. 2F. The fourth etching process performed on the space region 12 The etching rate will be higher than that of the first patterned structure 11. When the predetermined time continues, the surface of the substrate 10 changes as shown in FIG. 2G. The first metal layer 13 and the second metal layer on the upper surface of the spacer region 12 14 has been removed, and the spacer region 12 has become a planarized structure, while the top of the first patterned structure 11 remains. It should be particularly noted that in order to achieve a flat surface optimized for the surface of the spacer region 12, the fourth etching process further includes a preset condition, including: an etching gas flow rate, between 1 and 40 standard cubic centimeters per minute. (sccm, standard cubic centimeter per minute); a substrate bias voltage between 50 and 700 watts; a working chamber pressure between 1 and 25 millimeter torr; and a power supply, Between 150 and 1200 watts. In one embodiment of the present invention, the etching gas includes boron trichloride.

步驟S7:請參考圖2H,藉由一酸液處理以自基板10上移除殘留的第二金屬層14以及第一金屬層13,以形成第一圖案化結構11為一微米級突出結構、第二圖案化結構15為一次微米級凹槽結構、以及間隔區域12具有一平坦面之基板10。Step S7: Referring to FIG. 2H, an acid solution is used to remove the remaining second metal layer 14 and the first metal layer 13 from the substrate 10 to form the first patterned structure 11 as a micron-scale protruding structure, The second patterned structure 15 is a primary micro-scale groove structure, and the substrate 10 with a flat surface in the spacing region 12.

其中,第二圖案化結構15為角錐狀之次微米級凹槽結構,深度為10奈米至10微米,外徑為20奈米至950奈米,使第一圖案化結構11上含有第二圖案化結構15之數目為每平方公分1×10 8至2.5×10 11個。 Wherein, the second patterned structure 15 is a pyramid-shaped sub-micron groove structure, with a depth of 10 nanometers to 10 micrometers and an outer diameter of 20 nanometers to 950 nanometers, so that the first patterned structure 11 contains a second The number of the patterned structures 15 is 1 × 10 8 to 2.5 × 10 11 per cm 2.

承上所述,於本發明之核心重點為使間隔區域12的表面平坦化,用以改善間隔區域12上方磊晶良率不佳的問題。而使其平坦化的方法包括蝕刻,於本發明中並不以此為限。所述的預定時間是指使間隔區域12的表面平坦化的時間,介於150秒至1000秒之間,其係根據基板材質以及凹槽結構的深寬比而定。若凹槽結構越深,其需要平坦化處理的時間越久;若凹槽結構越淺,其需要平坦化處理的時間越短。As mentioned above, the core focus of the present invention is to planarize the surface of the spacer region 12 to improve the problem of poor epitaxial yield over the spacer region 12. The method for planarizing includes etching, which is not limited in the present invention. The predetermined time refers to a time for flattening the surface of the interval region 12 and is between 150 seconds and 1000 seconds, which is determined according to the substrate material and the aspect ratio of the groove structure. The deeper the groove structure, the longer it takes to flatten; the shallower the groove structure, the shorter the time it takes to planarize.

請參閱圖3A至圖6D,其係為以本發明具有強化光電性功能之圖案化光電基板的製作方法根據上述至少一預設條件所生成的掃描式電子顯微鏡影像圖。在本實施例中,此一預設條件為如下所述,但並不以此為限:真空壓力在5*10 -3torr,釋放氯化硼30sccm,功率400瓦,偏壓功率為300瓦,分別蝕刻250秒、300秒、350秒、以及400秒後的掃描式電子顯微鏡影像,依序為圖3A至圖3D、圖4A至圖4D、圖5A至圖5D以及圖6A至圖6D,每一圖中分別有放大6000倍、10000倍以及20000倍之俯視圖,以及放大20000倍後的剖面圖,圖中包括第一圖案化結構11、間隔區域12以及第二圖案化結構15。由圖3A至圖3D、圖4A至圖4D、圖5A至圖5D以及圖6A至圖6D可看出,若使用者在未能以本發明上述的至少一預設條件以及預定時間設定的情況下,其完成的基板結構在間隔區域上仍然殘留有部分凹槽結構。而根據本發明的方法設定上述的至少一預設條件以及預定時間,所完成的基板結構,其間隔區域的表面則為平坦面,如圖6A至圖6D所示。 Please refer to FIG. 3A to FIG. 6D, which are scanning electron microscope image images generated by the method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function according to the present invention according to at least one of the preset conditions. In this embodiment, this preset condition is as follows, but not limited to this: the vacuum pressure is 5 * 10 -3 torr, the boron chloride is released 30 sccm, the power is 400 watts, and the bias power is 300 watt Scanning electron microscope images after etching for 250 seconds, 300 seconds, 350 seconds, and 400 seconds, respectively, are FIG. 3A to FIG. 3D, FIG. 4A to FIG. 4D, FIG. 5A to FIG. 5D, and FIG. 6A to FIG. 6D. Each figure has a top view of 6000 times, 10,000 times, and 20,000 times, and a cross-sectional view of 20,000 times. The figure includes a first patterned structure 11, a space region 12, and a second patterned structure 15. It can be seen from FIG. 3A to FIG. 3D, FIG. 4A to FIG. 4D, FIG. 5A to FIG. 5D, and FIG. 6A to FIG. 6D that if the user fails to set the above-mentioned at least one preset condition and predetermined time of the present invention, Next, the completed substrate structure still has a part of the groove structure on the interval region. According to the method of the present invention, the at least one preset condition and the predetermined time are set, and the surface of the spaced region of the completed substrate structure is a flat surface, as shown in FIGS. 6A to 6D.

此外,本發明所提出的具有強化光電性功能之圖案化光電基板之製作方法,其中,更包含一步驟8,請參考圖2I,包括提供二維材料層16,形成於間隔區域12上及第一圖案化結構11上方。於本發明之一實施例中,二維材料層16包括石墨烯(Graphene),其具有高電子遷移率、高熱電導率、高電流密度、高機械強度、高彎曲性、光透明度等特性。據此,本發明藉由在平坦化間隔區域12後,加上二維材料層16可進一步提升、改良以此為基板的發光二極體的電性功能。In addition, the method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function provided by the present invention further includes a step 8. Please refer to FIG. 2I, which includes providing a two-dimensional material layer 16 formed on the spacer region 12 and the first Above a patterned structure 11. In one embodiment of the present invention, the two-dimensional material layer 16 includes graphene, which has characteristics such as high electron mobility, high thermal conductivity, high current density, high mechanical strength, high flexibility, and light transparency. Accordingly, the present invention can further improve and improve the electrical function of the light emitting diode used as the substrate by adding the two-dimensional material layer 16 after planarizing the gap region 12.

承上所述,石墨烯係藉由以下步驟產生:設置一銅層於間隔區域上。藉由氫氣、甲烷與銅層的化學作用,使得銅層之上以及銅層之下分別產生石墨烯層。移除銅層之上的石墨烯層。移除銅層,以便於留下銅層之下的石墨烯層於間隔區域上。As mentioned above, graphene is produced by the following steps: a copper layer is disposed on the space region. Through the chemical action of hydrogen, methane and the copper layer, a graphene layer is generated above the copper layer and below the copper layer, respectively. Remove the graphene layer over the copper layer. The copper layer is removed so as to leave the graphene layer under the copper layer on the spacer region.

此外,於本發明之一實施例中,銅層係藉由熱蒸鍍或濺鍍方法產生。銅層的厚度介於50至500奈米之間。氫氣、甲烷與銅層的化學作用係藉由300至1500度的工作溫度產生石墨烯層。移除銅層之上的石墨烯層以及移除銅層的方法包括研磨及鹽酸蝕刻,於本發明中並不以此為限。In addition, in one embodiment of the present invention, the copper layer is generated by a thermal evaporation method or a sputtering method. The thickness of the copper layer is between 50 and 500 nanometers. The chemical action of the hydrogen, methane, and copper layers produces a graphene layer at an operating temperature of 300 to 1500 degrees. The method for removing the graphene layer on the copper layer and the method for removing the copper layer includes grinding and hydrochloric acid etching, which is not limited in the present invention.

此外,以下則根據本發明具有強化光電性功能之圖案化光電基板的製作方法提出各種不同實施例,但於本發明中並不限於此。In addition, the following describes various embodiments according to the method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function of the present invention, but the present invention is not limited thereto.

請參考圖7A至圖7C,係為本發明實施例2具有強化光電性功能之圖案化光電基板之示意圖。實施例2與前述的實施例1所述具有強化光電性功能之圖案化光電基板及其製作流程大致相同,除了在第一圖案化結構之凹凸型態不同。不同於前述的實施例1為具有圓錐狀之微米級突出結構之第一圖案化結構11(請一併參考圖2B),在實施例2中,係提供一第一光阻層(圖未顯示)設置於基板20部分表面上,使第一蝕刻處理為選擇性地移除部分的基板20,以形成具有圓錐狀之微米級凹槽結構之第一圖案化結構21及平面結構之間隔區域22;接著,並依據實施例1之製作流程,使第一圖案化結構21上含有複數個第二圖案化結構25,以形成具有第一圖案化結構21及第二圖案化結構25之圖案化光電基板20。於圖7B的圖中,則藉由第四蝕刻處理間隔區域22一預定時間,使得間隔區域22形成平坦面。於圖7C的圖中,設置二維材料26於間隔區域22及第一圖案化結構21上方。Please refer to FIG. 7A to FIG. 7C, which are schematic diagrams of a patterned photovoltaic substrate with enhanced photoelectricity function according to Embodiment 2 of the present invention. The embodiment 2 is substantially the same as the patterned photovoltaic substrate with enhanced photoelectricity function described in the foregoing embodiment 1 and the manufacturing process thereof, except that the uneven pattern of the first patterned structure is different. Different from the foregoing embodiment 1, the first patterned structure 11 (see FIG. 2B together) having a conical micro-scale protruding structure is provided. In the embodiment 2, a first photoresist layer is provided (not shown in the figure). ) Is disposed on a part of the surface of the substrate 20 so that the first etching process is to selectively remove a part of the substrate 20 to form a first patterned structure 21 having a conical micro-scale groove structure and a space region 22 of a planar structure Then, according to the manufacturing process of Embodiment 1, the first patterned structure 21 includes a plurality of second patterned structures 25 to form a patterned photovoltaic having the first patterned structure 21 and the second patterned structure 25. Substrate 20. In the diagram of FIG. 7B, the fourth etching process is performed on the interval region 22 for a predetermined time, so that the interval region 22 forms a flat surface. In the diagram of FIG. 7C, a two-dimensional material 26 is disposed above the spacer region 22 and the first patterned structure 21.

請參考圖8A至圖8I,係本發明實施例3至實施例5具有強化光電性功能之圖案化光電基板之示意圖。實施例3至實施例5與前述實施例1所述具有強化光電性功能之圖案化光電基板及其製作流程大致相同,除了在第一圖案化結構之形狀不同。Please refer to FIG. 8A to FIG. 8I, which are schematic diagrams of patterned photovoltaic substrates with enhanced photoelectricity function in Embodiments 3 to 5 of the present invention. Embodiments 3 to 5 are substantially the same as the patterned photovoltaic substrates with enhanced photoelectricity function described in the foregoing embodiment 1 and the manufacturing process thereof, except that the shape of the first patterned structure is different.

不同於實施例1為具有圓錐狀之微米級突出結構之第一圖案化結構11(請一併參考圖2B),請參考圖8A至8C,在實施例3中,係提供一第一光阻層(圖未顯示)設置於基板301部分表面上,使第一蝕刻處理為選擇性地移除部分的基板301,以形成具有三角錐狀之微米級突出結構之第一圖案化結構311及平面結構之間隔區域321;接著,並依據實施例1之製作流程,使第一圖案化結構311上含有複數個第二圖案化結構351,以形成具有第一圖案化結構311及第二圖案化結構351之圖案化光電基板301。於圖8B的圖中,則藉由第四蝕刻處理間隔區域321一預定時間,使得間隔區域321形成平坦面。於圖8C的圖中,並且,設置二維材料36於間隔區域321與第一圖案化結構351上方。Different from the first patterned structure 11 having a conical micron-scale protruding structure in Embodiment 1 (please refer to FIG. 2B together), please refer to FIGS. 8A to 8C. In Embodiment 3, a first photoresist is provided. A layer (not shown) is provided on a part of the surface of the substrate 301, so that the first etching process is to selectively remove a part of the substrate 301 to form a first patterned structure 311 and a plane having a triangular pyramid-shaped micron-scale protruding structure. The spacing region 321 of the structure; then, according to the manufacturing process of Embodiment 1, the first patterned structure 311 includes a plurality of second patterned structures 351 to form the first patterned structure 311 and the second patterned structure. Patterned photovoltaic substrate 301 of 351. In the diagram of FIG. 8B, the fourth etching process is performed on the interval region 321 for a predetermined time, so that the interval region 321 forms a flat surface. As shown in FIG. 8C, a two-dimensional material 36 is disposed above the spaced region 321 and the first patterned structure 351.

請參考圖8D至8F,在實施例4中,係提供一第一光阻層(圖未顯示)設置於基板302部分表面上,使第一蝕刻處理為選擇性地移除部分的基板302,以形成具有四角柱狀之微米級突出結構之第一圖案化結構312及平面結構之間隔區域322;接著,並依據實施例1之製作流程,使第一圖案化結構312上含有複數個第二圖案化結構352,以形成具有第一圖案化結構312及第二圖案化結構352之圖案化光電基板302。於圖8E的圖中,則藉由第四蝕刻處理間隔區域322一預定時間,使得間隔區域322形成平坦面。於圖8F的圖中,設置二維材料37於間隔區域322與第二圖案化結構352上。Please refer to FIGS. 8D to 8F. In Embodiment 4, a first photoresist layer (not shown) is provided on a portion of the surface of the substrate 302, so that the first etching process is to selectively remove a portion of the substrate 302. A first patterned structure 312 having a quadrangular pillar-shaped micrometer-scale protruding structure and a space region 322 of a planar structure are formed; then, according to the manufacturing process of Embodiment 1, the first patterned structure 312 contains a plurality of second The patterned structure 352 is formed to form a patterned photovoltaic substrate 302 having a first patterned structure 312 and a second patterned structure 352. In the diagram of FIG. 8E, the fourth etching process is performed on the interval region 322 for a predetermined time, so that the interval region 322 forms a flat surface. In the diagram of FIG. 8F, a two-dimensional material 37 is disposed on the spacer region 322 and the second patterned structure 352.

請參考圖8G至8I,在實施例5中,係提供一第一光阻層(圖未顯示)設置於基板303部分表面上,使第一蝕刻處理為選擇性地移除部分的基板303,以形成具有五角柱狀(即,三角錐狀及四角柱狀之結合)之微米級突出結構之第一圖案化結構313及平面結構之間隔區域323;接著,並依據實施例1之製作流程,使第一圖案化結構313上含有複數個第二圖案化結構353,以形成具有第一圖案化結構313及第二圖案化結構353之圖案化光電基板303。於圖8H的圖中,則藉由第四蝕刻處理間隔區域323一預定時間,使得間隔區域323形成平坦面。於圖8I的圖中,設置二維材料38於間隔區域323與第一圖案化結構313上。Please refer to FIGS. 8G to 8I. In Embodiment 5, a first photoresist layer (not shown) is provided on a part of the surface of the substrate 303, so that the first etching process is to selectively remove a part of the substrate 303. To form a first patterned structure 313 with a micrometer-scale protruding structure having a pentagonal columnar shape (ie, a combination of a triangular pyramid shape and a quadrangular columnar shape) and a space region 323 of a planar structure; The first patterned structure 313 includes a plurality of second patterned structures 353 to form a patterned photovoltaic substrate 303 having the first patterned structure 313 and the second patterned structure 353. In the diagram of FIG. 8H, the fourth etching process is performed on the interval region 323 for a predetermined time, so that the interval region 323 forms a flat surface. In the diagram of FIG. 8I, a two-dimensional material 38 is disposed on the spacer region 323 and the first patterned structure 313.

請參考圖9A至9C,係本發明實施例6具有強化光電性功能之圖案化光電基板的示意圖。實施例6與前述實施例1所述具有強化光電性功能之圖案化光電基板及其製作流程大致相同,除了在第二圖案化結構之分佈位置不同。Please refer to FIGS. 9A to 9C, which are schematic diagrams of a patterned photovoltaic substrate with enhanced photoelectricity function according to Embodiment 6 of the present invention. Embodiment 6 is substantially the same as the patterned photovoltaic substrate with enhanced photoelectricity function described in the foregoing embodiment 1 and the manufacturing process thereof, except that the distribution position of the patterned photovoltaic substrate is different in the second patterned structure.

不同於實施例1之第二圖案化結構同時位於第一圖案化結構及間隔區域兩者之上方,請參考圖9A,在實施例6中,係提供一第二光阻層(圖未顯示)設置於第一圖案化結構411上方之第二金屬層表面(圖未顯示),使陽極氧化鋁處理為選擇性地移除部分的間隔區域421上方之第二金屬層;接著,並依據實施例1之製作流程,形成具有第一圖案化結構411及第二圖案化結構451之圖案化光電基板401,其中,第一圖案化結構411上方不具有第二圖案化結構451,只有在間隔區域421上方具有第二圖案化結構451。於圖9B的圖中,則藉由第四蝕刻處理間隔區域421一預定時間,使得間隔區域421形成平坦面。於圖9C的圖中,設置二維材料46於間隔區域421與第一圖案化結構411上。The second patterned structure different from Embodiment 1 is located above both the first patterned structure and the space region. Please refer to FIG. 9A. In Embodiment 6, a second photoresist layer is provided (not shown) The surface of the second metal layer (not shown in the figure) disposed on the first patterned structure 411, so that the anodized aluminum is treated to selectively remove a portion of the second metal layer above the spaced region 421; then, according to the embodiment The manufacturing process of 1 forms a patterned photovoltaic substrate 401 having a first patterned structure 411 and a second patterned structure 451. Among them, the first patterned structure 411 does not have the second patterned structure 451, but only in the space region 421 There is a second patterned structure 451 above. In the diagram of FIG. 9B, the fourth etching process is performed on the interval region 421 for a predetermined time, so that the interval region 421 forms a flat surface. In the diagram of FIG. 9C, a two-dimensional material 46 is disposed on the spacer region 421 and the first patterned structure 411.

請參考圖10,係本發明實施例7具有強化光電性功能之該圖案化光電基板之發光二極體的示意圖,其係提供一緩衝層及一光電元件形成於前述實施例1具有強化光電性功能之圖案化光電基板上,以形成一發光二極體。Please refer to FIG. 10, which is a schematic diagram of a light-emitting diode of the patterned photovoltaic substrate with enhanced photoelectricity function in Embodiment 7 of the present invention. It provides a buffer layer and a photovoltaic element formed in the foregoing Embodiment 1 and has enhanced photoelectricity. Functionally pattern the photovoltaic substrate to form a light emitting diode.

本發明另外再提出一具有強化光電性功能之圖案化光電基板之發光二極體,請參考圖10,在此實施例7中,其包括:一基板10,此基板10的結構特徵係為前述實施例1至實施例6中任一種具有強化光電性功能之圖案化光電基板;一緩衝層50,設置於該基板10上,其可為一氮化鎵層,由於此基板10的間隔區域12具有一平坦的表面,且上方更設置有一二維材料層56,在此,二維材料層56包括但不限於石墨烯,據此,當緩衝層50設置於此基板10上時,中間設置的二維材料層56可以改善晶格不匹配的問題而導致的差排現象;以及一光電元件,該光電元件係設置於該緩衝層50上,且該光電元件含有第一半導體層51、發光層52、及第二半導體層53,其中,第一半導體層51接合至緩衝層50,發光層52為夾設於第一半導體層51及第二半導體層53之間。The present invention further proposes a light-emitting diode of a patterned photovoltaic substrate with enhanced photoelectricity function. Please refer to FIG. 10. In this seventh embodiment, it includes: a substrate 10 whose structural characteristics are as described above. Any of the patterned photovoltaic substrates with enhanced photoelectricity function of any of Embodiments 1 to 6; a buffer layer 50 disposed on the substrate 10, which may be a gallium nitride layer, because the spacer region 12 of the substrate 10 It has a flat surface, and a two-dimensional material layer 56 is further arranged above. Here, the two-dimensional material layer 56 includes, but is not limited to, graphene. According to this, when the buffer layer 50 is disposed on the substrate 10, it is disposed in the middle. The two-dimensional material layer 56 can improve the problem of misalignment caused by the problem of lattice mismatch; and a photovoltaic element, the photovoltaic element is disposed on the buffer layer 50, and the photovoltaic element includes a first semiconductor layer 51 and a light emitting element. The layer 52 and the second semiconductor layer 53, wherein the first semiconductor layer 51 is bonded to the buffer layer 50, and the light emitting layer 52 is sandwiched between the first semiconductor layer 51 and the second semiconductor layer 53.

上述之基板10具有第一圖案化結構11、間隔區域12及第二圖案化結構15,該第二圖案化結構15同時形成於第一圖案化結構11及間隔區域12之兩者,且第一圖案結構11為微米級突出結構,該第二圖案化結構15為次微米級凹槽結構;此外,其包括第一電極54及第二電極55,且第一電極54及第二電極55為分別電性接合於第一半導體51及第二半導體層53。此外,要特別說明的是,此基板10的間隔區域12係利用前述的製作方法而使其表面具有一平坦的表面。The above-mentioned substrate 10 has a first patterned structure 11, a spacer region 12, and a second patterned structure 15. The second patterned structure 15 is simultaneously formed on both the first patterned structure 11 and the spaced region 12. The pattern structure 11 is a micro-scale protruding structure, and the second patterned structure 15 is a sub-micron-scale groove structure. In addition, it includes a first electrode 54 and a second electrode 55, and the first electrode 54 and the second electrode 55 are respectively The first semiconductor 51 and the second semiconductor layer 53 are electrically bonded. In addition, it should be particularly noted that the space 12 of the substrate 10 has a flat surface by using the aforementioned manufacturing method.

再者,要特別說明的是,本發明所提出的具有強化光電性功能之圖案化光電基板更包括二維材料層56,形成於間隔區域12與第一圖案化結構11上。二維材料層56包括但不限於石墨烯(Graphene),據此,其基板表面之設置一二維材料層於平坦的間隔區域12上及具有第一圖案化結構11上方,當然,以整個基板10來說,其在非平坦的C面之上,也可以長二維材料層56的材料,如石墨烯。此外,緩衝層50可以是氮化鋁(Aluminum Nitride),基板10的材質可以使用藍寶石,據此,透過二維材料層可以提升磊晶品質或減少氮化鎵薄膜之差排缺陷密度,降低逆向漏電流,提升導熱率,更具有優異的電性功能以及抗靜電能力。Furthermore, it should be particularly noted that the patterned photovoltaic substrate with enhanced photoelectricity function provided by the present invention further includes a two-dimensional material layer 56 formed on the space region 12 and the first patterned structure 11. The two-dimensional material layer 56 includes, but is not limited to, graphene. According to this, a two-dimensional material layer is disposed on the surface of the substrate on the flat spaced region 12 and above the first patterned structure 11. Of course, the entire substrate For example, on the non-planar C-plane, the material of the two-dimensional material layer 56 may be long, such as graphene. In addition, the buffer layer 50 may be aluminum nitride, and the material of the substrate 10 may be sapphire. According to this, the two-dimensional material layer can improve the epitaxial quality or reduce the differential defect density of the gallium nitride film and reduce the reverse Leakage current, improve thermal conductivity, more excellent electrical function and antistatic ability.

上述實施例僅係為了方便說明而舉例而已,本發明所主張之權利範圍自應以申請專利範圍所述為準,而非僅限於上述實施例。The above embodiments are merely examples for the convenience of description. The scope of the claimed rights of the present invention should be based on the scope of the patent application, rather than being limited to the above embodiments.

S1、S2、S3、S4、S5、S6、S7、S8‧‧‧步驟
10、20、301、302、303、401、402‧‧‧基板
11、21、311、312、313、411‧‧‧第一圖案化結構
12、22、321、322、323、421‧‧‧間隔區域
13‧‧‧第一金屬層
14‧‧‧第二金屬層
15、25、351、352、353、451‧‧‧第二圖案化結構
16、26、36、37、38、46、56‧‧‧二維材料層
50‧‧‧緩衝層
51‧‧‧第一半導體層
52‧‧‧發光層
53‧‧‧第二半導體層
54‧‧‧第一電極
55‧‧‧第二電極
S1, S2, S3, S4, S5, S6, S7, S8‧‧‧ steps
10, 20, 301, 302, 303, 401, 402‧‧‧ substrate
11, 21, 311, 312, 313, 411‧‧‧ the first patterned structure
12, 22, 321, 322, 323, 421‧‧‧ spaced areas
13‧‧‧ first metal layer
14‧‧‧Second metal layer
15, 25, 351, 352, 353, 451‧‧‧ second patterned structure
16, 26, 36, 37, 38, 46, 56‧‧‧ two-dimensional material layers
50‧‧‧ buffer layer
51‧‧‧First semiconductor layer
52‧‧‧Light-emitting layer
53‧‧‧Second semiconductor layer
54‧‧‧first electrode
55‧‧‧Second electrode

圖1為本發明所提出之一種具有強化光電性功能之圖案化光電基板之製作方法的步驟流程圖。
圖2A至2I本發明實施例1之具有強化光電性功能之圖案化光電基板之製備流程示意圖;
圖3A至圖6D係為以本發明具有強化光電性功能之圖案化光電基板的製作方法根據至少一預設條件所生成的掃描式電子顯微鏡影像圖;
圖7A至圖7C係為本發明實施例2具有強化光電性功能之圖案化光電基板之示意圖;
圖8A至圖8I係本發明實施例3至實施例5具有強化光電性功能之圖案化光電基板之示意圖;
圖9A至圖9C係本發明實施例6具有強化光電性功能之圖案化光電基板之示意圖;
圖10係本發明實施例7具有強化光電性功能之具有該圖案化光電基板之發光二極體之示意圖。
FIG. 1 is a flowchart of the steps of a method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function according to the present invention.
2A to 2I are schematic diagrams of a manufacturing process of a patterned photovoltaic substrate with enhanced photoelectricity function according to Embodiment 1 of the present invention;
3A to 6D are scanning electron microscope image diagrams generated according to at least one preset condition by the method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function according to the present invention;
7A to 7C are schematic diagrams of a patterned photovoltaic substrate with enhanced photoelectricity function according to Embodiment 2 of the present invention;
FIG. 8A to FIG. 8I are schematic diagrams of patterned photovoltaic substrates with enhanced photoelectricity function in Embodiments 3 to 5 of the present invention;
9A to 9C are schematic diagrams of a patterned photovoltaic substrate with enhanced photoelectricity function according to Embodiment 6 of the present invention;
FIG. 10 is a schematic diagram of a light-emitting diode having the patterned photovoltaic substrate with enhanced photoelectricity function according to Embodiment 7 of the present invention.

Claims (16)

一種具有強化光電性功能之圖案化光電基板之製作方法,其步驟包括:步驟S1:提供一基板;步驟S2:藉由一第一蝕刻處理於該基板表面形成一第一圖案化結構及一間隔區域;步驟S3:形成一第一金屬層及一第二金屬層於該基板上之該第一圖案化結構及該間隔區域表面;步驟S4:藉由一第二蝕刻處理於該第二金屬層上形成一第二圖案化結構,該第二圖案化結構係位於該第一圖案化結構上及該間隔區域上方之其中一者或兩者;步驟S5:藉由一第三蝕刻處理使該第二圖案化結構向下延伸至該第一金屬層及該基板之部分表面;步驟S6:進行一第四蝕刻處理一預定時間,使該間隔區域為一平坦面;以及;步驟S7:藉由一酸液處理以自該基板上移除該第二金屬層以及該第一金屬層,以形成該第一圖案化結構為一微米級突出結構、該第二圖案化結構為一次微米級凹槽結構、以及該間隔區域為一平坦面之基板。A method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity functions, the steps include: step S1: providing a substrate; step S2: forming a first patterned structure and a space on the surface of the substrate by a first etching process Region; step S3: forming a first metal layer and a second metal layer on the substrate, the first patterned structure and the surface of the space region; step S4: processing the second metal layer by a second etching process A second patterned structure is formed thereon, the second patterned structure is located on one or both of the first patterned structure and above the space region; step S5: the third patterned structure is processed by a third etching process. Two patterned structures extend downward to the first metal layer and a part of the surface of the substrate; step S6: performing a fourth etching process for a predetermined time so that the space region is a flat surface; and step S7: using a Acid treatment to remove the second metal layer and the first metal layer from the substrate to form the first patterned structure as a micron-scale protruding structure, and the second patterned structure as a micron-level concave Structure, the spacer region and a flat surface of a substrate. 如申請專利範圍第1項所述具有強化光電性功能之圖案化光電基板之製作方法,其中該步驟S6更包括一預設條件,包括:一蝕刻氣體流量,介於每分鐘1至40標準立方厘米之間;一基板偏壓,介於50至700瓦之間;以及一供應電源,介於150至1200瓦之間。According to the method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function described in item 1 of the scope of patent application, the step S6 further includes a preset condition, including: an etching gas flow rate, between 1 and 40 standard cubic meters per minute Centimeters; a substrate bias between 50 and 700 watts; and a power supply between 150 and 1200 watts. 如申請專利範圍第2項所述具有強化光電性功能之圖案化光電基板之製作方法,其中該預定時間介於150秒至1000秒之間。The method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function as described in item 2 of the scope of patent application, wherein the predetermined time is between 150 seconds and 1000 seconds. 如申請專利範圍第1項所述具有強化光電性功能之圖案化光電基板之製作方法,其中,更包括一步驟S8:提供一二維材料層,形成於該間隔區域及該第一圖案化結構上方。The method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function as described in item 1 of the scope of the patent application, further comprising a step S8: providing a two-dimensional material layer formed in the space region and the first patterned structure Up. 如申請專利範圍第4項所述具有強化光電性功能之圖案化光電基板之製作方法,其中該二維材料層包括石墨烯(Graphene)。The method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function as described in item 4 of the scope of the patent application, wherein the two-dimensional material layer includes graphene. 如申請專利範圍第5項所述具有強化光電性功能之圖案化光電基板之製作方法,其中該石墨烯係藉由以下步驟產生:設置一銅層於該間隔區域上;藉由氫氣、甲烷與該銅層之化學作用,使得該銅層之上以及該銅層之下分別產生一石墨烯層;移除該銅層之上的該石墨烯層;以及移除該銅層,以便於留下該銅層之下之該石墨烯層於該間隔區域上。As described in item 5 of the scope of the patent application, a method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function, wherein the graphene is generated by the following steps: a copper layer is disposed on the space region; and hydrogen, methane, and The chemical action of the copper layer causes a graphene layer to be generated above the copper layer and below the copper layer; removing the graphene layer above the copper layer; and removing the copper layer so as to leave The graphene layer under the copper layer is on the spacer region. 如申請專利範圍第6項所述具有強化光電性功能之圖案化光電基板之製作方法,其中該銅層係藉由熱蒸鍍或濺鍍方法產生。The method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function as described in item 6 of the scope of the patent application, wherein the copper layer is produced by a thermal evaporation or sputtering method. 如申請專利範圍第6項所述具有強化光電性功能之圖案化光電基板之製作方法,其中該銅層之一厚度介於50至500奈米之間。According to the method for manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function described in item 6 of the scope of the patent application, one of the copper layers has a thickness between 50 and 500 nanometers. 如申請專利範圍第6項所述具有強化光電性功能之圖案化光電基板之製作方法,其中該氫氣、該甲烷與該銅層之該化學作用係藉由300至1500度之一工作溫度產生該石墨烯層。According to the method of manufacturing a patterned photovoltaic substrate with enhanced photoelectricity function described in item 6 of the scope of the patent application, wherein the chemical action of the hydrogen, the methane, and the copper layer is generated at an operating temperature of 300 to 1500 degrees. Graphene layer. 一種具有強化光電性功能之圖案化光電基板,包括:一第一圖案化結構,係為一微米級突出結構;一間隔區域,具有一平坦面;一第二圖案化結構,係為一次微米級凹槽結構,並形成於該第一圖案化結構上;以及一二維材料層,形成於該具有平坦面之間隔區域上及該第一圖案化結構上方。A patterned photovoltaic substrate with enhanced photoelectricity function includes: a first patterned structure, which is a micron-level protruding structure; a spaced region, which has a flat surface; a second patterned structure, which is a one-micron level A groove structure is formed on the first patterned structure; and a two-dimensional material layer is formed on the spaced region having a flat surface and above the first patterned structure. 如申請專利範圍第10項所述具有強化光電性功能之圖案化光電基板,其中該二維材料層包括石墨烯。The patterned photovoltaic substrate with enhanced photoelectricity function described in item 10 of the scope of the patent application, wherein the two-dimensional material layer includes graphene. 一種具有強化光電性功能之圖案化光電基板之發光二極體,包括:一基板,該基板係為依據申請專利範圍第10至11中任一項所述具有強化光電性功能之圖案化光電基板;一緩衝層,設置於該基板上;以及一光電元件,設置於該緩衝層上,且包含一第一半導體層、一發光層、及一第二半導體層;其中,該第一半導體層係接合至該緩衝層,該發光層係夾設於該第一半導體層及該第二半導體層之間。A light-emitting diode of a patterned photovoltaic substrate having a function of enhancing photoelectricity, comprising: a substrate, the substrate being a patterned photovoltaic substrate having a function of strengthening photoelectricity according to any one of claims 10 to 11 of the scope of patent application A buffer layer disposed on the substrate; and a photovoltaic element disposed on the buffer layer and including a first semiconductor layer, a light emitting layer, and a second semiconductor layer; wherein the first semiconductor layer is Bonded to the buffer layer, the light emitting layer is sandwiched between the first semiconductor layer and the second semiconductor layer. 如申請專利範圍第12項所述具有強化光電性功能之圖案化光電基板之發光二極體,更包括一二維材料層,形成於該基板之該間隔區域上及該第一圖案化結構上方。As described in item 12 of the scope of the patent application, the light-emitting diode of the patterned photovoltaic substrate with enhanced photoelectricity function further includes a two-dimensional material layer formed on the spaced region of the substrate and above the first patterned structure. . 如申請專利範圍第13項所述具有強化光電性功能之圖案化光電基板之發光二極體,其中該二維材料層包括石墨烯(Graphene)。As described in item 13 of the scope of the patent application, the light-emitting diode of the patterned photovoltaic substrate with enhanced photoelectricity function, wherein the two-dimensional material layer includes graphene. 如申請專利範圍第12項所述具有強化光電性功能之圖案化光電基板之發光二極體,其中,該緩衝層為氮化鋁(Aluminum Nitride)。As described in item 12 of the scope of the patent application, the light-emitting diode of the patterned photovoltaic substrate with enhanced photoelectricity function, wherein the buffer layer is aluminum nitride (Aluminum Nitride). 如申請專利範圍第15項所述具有強化光電性功能之圖案化光電基板之發光二極體,其中,該緩衝層係設置於該基板之該二維材料層之上。As described in item 15 of the scope of the patent application, the light-emitting diode of the patterned photovoltaic substrate with enhanced photoelectricity function, wherein the buffer layer is disposed on the two-dimensional material layer of the substrate.
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