TWI679429B - Device for testing capacitor - Google Patents

Abstract

The invention provides a capacitance test device, which includes a feeding module, a pre-check module and a charging test module. The feeding module is used to place a plurality of capacitors to be tested at a plurality of locations to be tested, respectively. The pre-check module is used to test a plurality of capacitors to be tested in the plurality of locations to be tested, and to determine whether each capacitor to be tested meets a pre-check standard. The charging test module is used to perform a charging test procedure on the capacitor under test that meets the pre-check standards. When the pre-inspection module determines that one of the plurality of capacitors to be tested does not meet the pre-inspection standard, the pre-inspection module removes the capacitor to be tested that does not meet the pre-inspection standard from the corresponding position to be tested.

Description

Capacitance test device

The invention relates to a capacitance testing device, and more particularly to a capacitance testing device that performs a pre-check before a charging test.

With the advancement of science and technology, more and more electronic products are becoming more and more popular. As each electronic product will need to use a different number of capacitors, inevitably, the market demand for capacitors is increasing. At present, large-capacity capacitors have been introduced in the market, such as supercapacitors (electrostatic double-layer capacitors, EDLC or double-layer capacitors). There are various discharge times and current sizes to choose from.

When the supercapacitor leaves the factory, it may be repeatedly tested to check the reliability of the supercapacitor. Take the supercapacitor for aging test as an example. When multiple supercapacitors are tested in batches, it is necessary to use a rack to clamp the connecting pins of multiple supercapacitors, and then bake them in a high-temperature oven for a certain time to simulate the supercapacitor aging status. At this time, the rack may provide current to all the clamped supercapacitors at the same time to speed up the subsequent detection (such as leakage current detection) process. However, if some of the supercapacitor's connecting pins are not actually clamped by the rack, or some of the supercapacitors are bumped or damaged during transportation, it will make subsequent tests inaccurate and even cause damage to the test machine. .

Therefore, the industry needs a new capacitance testing device that can detect whether the connection pins of the capacitor are actually clamped before the charging test, and can detect whether the connection pins of the capacitor have been damaged.

The invention provides a capacitance testing device, which can perform pre-check before charging test, and charge the capacitor that meets the pre-check standard. With this, after the invention finds that the capacitor does not meet the pre-inspection standard, the subsequent testing of the capacitor can be stopped in time to avoid unexpected failure or damage to the test machine.

The invention provides a capacitance test device, which includes a feeding module, a pre-check module and a charging test module. The feeding module is used to place a plurality of capacitors to be tested at a plurality of locations to be tested, respectively. The pre-check module is used to test a plurality of capacitors to be tested in the plurality of locations to be tested, and to determine whether each capacitor to be tested meets a pre-check standard. The charging test module is used to perform a charging test procedure on the capacitor under test that meets the pre-check standards. When the pre-inspection module determines that one of the plurality of capacitors to be tested does not meet the pre-inspection standard, the pre-inspection module removes the capacitor to be tested that does not meet the pre-inspection standard from the corresponding position to be tested.

In some embodiments, the pre-check module may include a first voltage source, a first current setting unit, and a plurality of voltage detection units. The first voltage source is electrically connected to the first end and the second end of each of the positions to be tested, and is used to provide a first test voltage to the first end and the second end of each of the positions to be tested. The first current setting unit is used to set a first test current flowing through each position to be measured. Each voltage detection unit is electrically connected to one of the plurality of positions to be tested, and is used to detect whether the capacitance to be tested in the plurality of positions to be tested meets a pre-check standard. Here, one of the plurality of test positions may be defined as a first test position, and the first voltage source and the first current setting unit are respectively used to provide a first test voltage and a first test current to the first test position. Position for a preset time. In addition, the voltage detection unit may determine whether the cross-voltage between the first end and the second end of the first position to be measured is within a preset voltage range, and when the cross-voltage between the first end and the second end of the first position to be measured is within a preset voltage Within the range, the capacitor to be tested in the first location to be tested meets the pre-check criteria.

In some embodiments, the feeding module is used to place the plurality of capacitors to be tested on the plurality of locations to be tested on the carrier, and the plurality of locations to be tested are arranged in a first array. The pre-checking module can simultaneously determine whether the plurality of positions to be tested corresponding to one of the columns of the first array meet the pre-checking criteria. The pre-check module can mark the positions to be tested in the first array that do not meet the pre-check criteria.

In summary, the capacitance test device provided by the present invention has a pre-check module. The pre-check module can check whether the capacitor to be tested meets a certain standard before the charging test. When the pre-check module determines that the capacitor under test does not meet the standard, it will not continue to charge the capacitor under test. Thereby, the capacitance testing device of the present invention can reduce the chance of the capacitance testing device being damaged when testing the capacitance.

The features, objects, and functions of the present invention will be further disclosed below. However, the following are only examples of the present invention. When the scope of the present invention cannot be limited by it, that is, any equivalent changes and modifications made in accordance with the scope of the patent application of the present invention will still be the essence of the present invention. Without departing from the spirit and scope of the present invention, it should be regarded as a further embodiment of the present invention.

Please refer to FIG. 1, which is a functional block diagram of a capacitance testing device according to an embodiment of the present invention. As shown in FIG. 1, the capacitance test device 1 includes a charging module 10, a pre-check module 12, and a charging test module 14. The capacitance test device 1 may be an automatic test device for performing electrical tests on the capacitance to be tested (not shown in FIG. 1). The feeding module 10, the pre-inspection module 12, and the charging test module 14 can be used for the electrical detection process of the capacitor under test, for example, it can be used to perform high temperature aging detection of the capacitor under test. Of course, the capacitance testing device 1 may also have a discharging module or a computer for controlling the feeding module 10, the pre-check module 12, and the charging test module 14, which is not limited in this embodiment. In other words, the feeding module 10, the pre-check module 12, and the charging test module 14 can be only a part of the capacitor testing device 1 to ensure that the capacitor to be tested can be correctly charged and actively detect non-standard Capacitance under test, so that only the capacitor under test is tested for charging. Each part of the capacitance test device 1 will be described below.

The feeding module 10 can be controlled by the control computer to place a plurality of capacitors to be tested at a plurality of locations to be tested, respectively. In one example, the loading module 10 may place the plurality of capacitors to be tested at a plurality of locations to be tested on the carrier, and the plurality of locations to be tested may be arranged in a first array. Please refer to FIG. 1 and FIG. 2 together. FIG. 2 is a schematic diagram illustrating a carrier disk applied with a feeding module according to an embodiment of the present invention. As shown in the figure, the carrier disk 2 may have a plurality of positions to be measured 200 arranged in an array (first array). The array may have, for example, a plurality of rows 20a to 20e, and the number of positions to be measured in each row Can be multiple. For example, the number of positions to be tested in each row may be between 30 and 50, and the total number of positions to be tested on the carrier 2 may be, for example, between 3000 and 5000. This embodiment does not Be restricted.

In one example, the feeding module 10 may include a vibration device (not shown), and the carrier 2 may be connected to the vibration device. When multiple capacitors to be tested are scattered on the carrier plate 2, the vibration device can be turned on to cause the carrier plate 2 to vibrate with the vibration device, so that multiple capacitors to be tested can be dropped to different locations to be tested after vibration. in. In addition, the shape of each measured position 200 in the carrier 2 can also be specially designed. For example, the shape of each measured position 200 can be designed to accommodate only one capacitor to be tested, and multiple capacitors to be tested can be regular. The ground is arranged in the carrier 2. In one example, the designed test position 200 can make the connection pins of the capacitor under test face the same direction. For example, when the capacitor to be tested is placed at the position 200 to be tested, one connection pin of the capacitor to be tested can be designed at the first end of the position 200 to be tested, and the other connection pin of the capacitor to be tested can be designed to be located at the test point 200. The second end of position 200. In practice, a plurality of capacitors to be tested can also be placed in the location to be tested 200 by other methods, such as robotic arms using automated equipment, or even manual placement, which is not limited in this embodiment.

After a plurality of capacitors to be tested have been individually placed in different locations 200 to be tested in the carrier 2, the feeding module 10 can determine that the feeding step has been completed at this time. Therefore, the carrier tray 2 can leave the feeding module 10 and move to the pre-inspection module 12 for subsequent steps. In one example, the feeding module 10 and the pre-inspection module 12 can be regarded as different detection stations in the capacitance testing device 1. The carrier 2 can be used in the feeding module 10 and the pre-inspection module by a robotic arm or a conveyor belt. Move between groups of 12.

The pre-check module 12 can be used to test the capacitors to be tested in each of the positions 200 to be tested, and determine whether each of the capacitors to be tested meets the pre-check standard. For convenience of explanation, please refer to FIG. 1, FIG. 2, and FIG. 3 together. FIG. 3 is a functional block diagram of a pre-check module according to an embodiment of the present invention. As shown in the figure, the pre-check module 12 may include a voltage source 120 (first voltage source), a current setting unit 122 (first current setting unit), and a voltage detection unit 124. The voltage source 120 can be electrically connected to the first terminal 2000 and the second terminal 2002 of each of the positions 200 to be tested, and is used to provide a test voltage (first test voltage) to the first terminal 2000 and the second terminal 2002. The current setting unit 122 can be used to set a test current (first test current) flowing through each of the positions 200 to be measured. The voltage detection unit 124 is electrically connected to one of the positions 200 to be tested, and is used to detect whether the capacitance DUT under test in the position 200 meets a pre-check standard.

In practice, the pre-check module 12 may have a plurality of voltage detection units 124, which may correspond to a plurality of positions to be tested 200 in the carrier disk 2, so that the capacitances DUT to be tested in the positions 200 to be tested can be measured in batches. In one example, the plurality of voltage detection units 124 may correspond to the plurality of positions 200 to be tested in the same row, so that the pre-check module 12 can test the plurality of positions 200 to be tested column by column. In one example, taking the position 200 to be measured (the first position to be measured) corresponding to one of the voltage detection units 124 as an example, the voltage detection unit 124 may have a conductive clip, and the voltage detection unit 124 may try to clamp using the conductive clip. The first end 2000 and the second end 2002 of the position 200 to be measured. If the connection pins of the capacitor DUT under test are normal, the conductive clip should be able to clamp the two connection pins of the capacitor DUT under test. Conversely, if the connection pin of the capacitor under test under test is damaged or skewed, the conductive clip may not be able to successfully clamp the two connection pins of the capacitor under test under test, or only one of the connection pins of the capacitor under test under test. Those with ordinary knowledge in the technical field should understand that the main function of the conductive clip is not to fix the connection pin of the capacitor DUT under test, but to connect the connection pin of the capacitor DUT to be tested electrically. Therefore, this embodiment does not limit the voltage detection unit 124 to apply a conductive clip to electrically connect the first end 2000 and the second end 2002. The voltage detection unit 124 may also use a probe or other suitable for electrically connecting the first end 2000. Components with second end 2002.

Taking a practical example, the voltage source 120 can stably output a known voltage to the position 200 to be measured, and the current flowing through the position 200 to be measured can be set by the current setting unit 122. When the quality of the capacitor DUT under test and the connection pins are normal, the voltage detection unit 124 can measure the cross-voltage of the capacitor DUT under test from the first end 2000 and the second terminal 2002, and use the cross-voltage of the capacitor DUT under test , To determine whether the capacitor DUT under test meets the pre-check criteria. For example, the voltage source 120 can stably charge the capacitor DUT under test for a period of time (preset time), and the voltage detection unit 124 can measure the cross-voltage (voltage difference between the two connecting pins) of the capacitor DUT under test multiple times. It increases with time, and estimates whether the capacitance value of the capacitor under test DUT is normal through the increase of the voltage across time. In practice, when the voltage, current, and charging time (preset time) are known, those with ordinary knowledge in the technical field should be able to easily calculate the capacitance value of the capacitor DUT to be measured, and the calculated value can be calculated by Capacitance value to determine whether the DUT of the capacitor under test meets the pre-check standard. For example, in general, the capacitance value of the capacitor DUT under test is within a preset range, for example, if it meets the requirements of quality control, it can be concluded that the capacitor DUT under test meets the pre-check standard.

On the other hand, when the quality or connection pin of the capacitor DUT to be tested is abnormal, the voltage detection unit 124 can measure the abnormality in the cross-voltage of the capacitor DUT to be measured from the first end 2000 and the second end 2002. For example, when the quality of the capacitor DUT to be measured is abnormal, the voltage detection unit 124 may not be able to measure a voltage difference from the first end 2000 and the second end 2002, that is, there is a short circuit in the capacitor DUT to be tested. Since it is obviously not within the preset voltage range, the voltage detection unit 124 can directly determine that the capacitor DUT under test does not meet the pre-check standard. Alternatively, the voltage detection unit 124 may find that the efficiency of the increase in the cross-voltage is obviously problematic (for example, the increase in the cross-voltage is too fast or too slow), and it may be directly judged that the capacitance DUT to be tested does not meet the pre-check standard. In addition, when the connection pin of the capacitor DUT to be tested is skewed and is not correctly located at the first end 2000 or the second end 2002, the first end 2000 and the second end 2002 are equal to an open circuit state. At this time, not only the voltage detection unit 124 can judge that the capacitor DUT under test does not meet the pre-check standard by the voltage difference between the first terminal 2000 and the second terminal 2002, but also the current setting unit 122 can detect an abnormal current (there is no open circuit). Current) to directly determine that the capacitor under test DUT does not meet the pre-check criteria.

In one example, if the pre-check module 12 determines that the capacitor DUT under test at a specific position 200 to be tested does not meet the pre-check standard, the capacitor DUT under test that does not meet the pre-check standard may be removed from the corresponding position 200 to be tested. In other words, the pre-inspection module 12 may have a mechanism for removing defective products to prevent the capacitor DUT to be tested that does not meet the pre-inspection standard from remaining on the position 200 to be tested. For example, the pre-inspection module 12 may have a spring or a shrapnel to directly eject the capacitor DUT under test in a specific position 200 out of the carrier plate 2, or the pre-inspection module 12 may have a robot arm or a jig to remove the The capacitor DUT to be tested is clamped outside the carrier 2 (for example, in a defective product box). Of course, the pre-inspection module 12 can also mark the position to be tested 200 that does not meet the pre-inspection standard, so that subsequent charging test procedures should not charge this position 200 to be tested, so as to prevent the bad DUT of the capacitor under test from being correctly excluded This may cause damage to the capacitance test device 1.

With continued reference to FIG. 1, the charging test module 14 may perform a charging test procedure on the capacitor DUT to be tested that meets the pre-check standard. This embodiment does not limit the test items and methods of the charging test program. For example, the charging test module 14 can perform charging tests, discharge tests, high temperature tests, leakage tests, internal resistance tests, or other electrical tests. Examples are not limited here. It is worth mentioning that the pre-check module 12 can limit the operation of the pre-check module 12 to a low voltage and low current state through the voltage source 120 and the current setting unit 122. The charging test module 14 may use a larger voltage Or current to test the DUT of the capacitor under test. The purpose of limiting the operation of the pre-check module 12 with low voltage and low current is that, because it is uncertain whether the capacitor DUT to be tested is normal, the test is first performed with a lower voltage and current to avoid damage to the capacitance test device 1. After that, after the capacitor DUT under test is simply tested and screened by the pre-check module 12, the capacitor DUT with obvious defects in quality can be excluded first, and then the charging test module 14 performs higher voltage and current on the capacitor DUT under test. The electrical test can better guarantee the capacitance test device 1.

In summary, the capacitance test device provided by the present invention can perform pre-check before charging test, and charge the capacitor to be tested that meets the pre-check standard. Therefore, the capacitance test device of the present invention can exclude the capacitors to be tested that do not meet the pre-check standard before the high voltage and high current test, so as to avoid unexpected failure or damage to the test machine.

1‧‧‧Capacitance test device

10‧‧‧ Feeding module

12‧‧‧Pre-check module

120‧‧‧Voltage source

122‧‧‧Current Setting Unit

124‧‧‧Voltage detection unit

14‧‧‧Charge test module

2‧‧‧ tray

20a ~ 20e‧‧‧Rank

200‧‧‧Test position

2000‧‧‧ the first end

2002‧‧‧ the second end

DUT‧‧‧Capacitance under test

FIG. 1 is a functional block diagram of a capacitance testing device according to an embodiment of the present invention.

FIG. 2 is a schematic diagram of a carrier disk applied to a feed module according to an embodiment of the present invention.

FIG. 3 is a functional block diagram of a pre-check module according to an embodiment of the present invention.

Claims (7)

A capacitance testing device includes: a feeding module for placing a plurality of capacitors to be tested at a plurality of positions to be tested respectively; and a pre-checking module for testing the ones to be tested at the positions to be tested Capacitance to determine whether each capacitor under test meets a pre-check standard; and a charging test module for performing a charge test procedure on the capacitor under test that meets the pre-check standard; wherein, when the pre-check module When it is determined that one of the capacitors to be tested does not meet the pre-check standard, the pre-check module removes the capacitor to be tested that does not meet the pre-check standard from the corresponding position to be tested; wherein the pre-check module includes : A first voltage source electrically connected to a first end and a second end of each of the positions to be tested for providing a first test voltage to the first end and the first end of each of the positions to be tested The second end; a first current setting unit configured to set a first test current flowing through each of the positions to be measured; and a plurality of voltage detection units, each of the voltage detection units being electrically connected to the positions to be measured One of them to detect these These measured capacitive sensing the position of the pre-inspection standards compliance. The capacitance testing device according to claim 1, wherein one of the positions to be tested is defined as a first position to be tested, and the first voltage source and the first current setting unit are respectively used to provide the first test voltage And the first test current reaches the first position to be tested for a preset time. The capacitance testing device according to claim 2, wherein the voltage detection unit determines whether the cross-voltage between the first end and the second end of the first position to be measured is within a preset voltage range, and when the first test is performed, The cross-voltage between the first end and the second end of the position is within the preset voltage range, and then the capacitance under test in the first position under test meets the pre-check standard. The capacitance test device according to claim 1, wherein the charging test module has a second voltage source for providing a second test voltage, and the first test voltage is smaller than the second test voltage. The capacitor testing device according to claim 1, wherein the feeding module is used to place the capacitors to be tested on the test positions on a carrier, and the test positions are arranged in a first array. The capacitance test device according to claim 5, wherein the pre-check module simultaneously determines whether the positions to be tested corresponding to one of the columns of the first array meet the pre-check standard. The capacitance testing device according to claim 5, wherein the pre-check module marks the one or more positions to be tested in the first array that do not meet the pre-check criteria.