TW202024650A - Device for testing capacitor - Google Patents

Abstract

A device for testing capacitor is disclosed. The device comprises a feeding module, a pre-test module, and a charging test module. The feeding module puts a plurality of capacitors at a plurality of test sites, respectively. The pre-test module tests the capacitors located at the test sites, and determines whether each of the capacitors matches a pre-test standard. The charging test module performs a charging test procedure to the capacitors matching the pre-test standard. Wherein when the pre-test module determines that one of the capacitors fails to match the pre-test standard, the pre-test module removes the unqualified capacitor from the corresponding test site.

Description

Capacitance testing device

The present invention relates to a capacitance test device, in particular to a capacitance test device that performs pre-check before charging test.

With the advancement of technology, more and more types of electronic products are becoming more popular. As each electronic product will need to use different numbers of capacitors, inevitably, the market demand for capacitors is increasing. At present, large-capacity capacitors have been introduced in the market, such as supercapacitors (electrostatic double-layer capacitors, EDLC or double-layer capacitors), which have various discharge times and current sizes to choose from.

When the super capacitor leaves the factory, it may undergo repeated tests to check the reliability of the super capacitor. Take the aging test of supercapacitors as an example. When multiple supercapacitors are tested in batches, it is necessary to use a rack to clamp the connecting pins of multiple supercapacitors, and then bake them in a high-temperature oven for a certain period of time to simulate the aging of the supercapacitors. status. At this time, the shelf may provide current to all the clamped supercapacitors at the same time to speed up the process of subsequent detection (such as leakage current detection). However, if the connecting pins of some supercapacitors are not clamped by the rack, or the connecting pins of some supercapacitors are skewed or damaged during transportation, the subsequent test will be inaccurate, and the test machine may even be damaged. .

Therefore, the industry needs a new capacitance test device that can detect whether the connecting pin of the capacitor is indeed clamped before the charging test, and can detect whether the connecting pin of the capacitor is damaged.

The invention provides a capacitance testing device, which can pre-check before the charging test and charge the capacitors that meet the pre-check standards. In this way, the present invention can stop the subsequent test of the capacitor in time after it is found that the capacitor does not meet the pre-inspection standard, so as to avoid unexpected failure or damage of the test machine.

The invention provides a capacitance testing device, which includes a feeding module, a pre-check module and a charging test module. The feeding module is used for placing a plurality of capacitors to be tested in a plurality of positions to be tested respectively. The pre-inspection module is used to test a plurality of capacitors to be tested in the plurality of positions to be tested, and to determine whether each capacitor to be tested meets the pre-inspection standard. The charging test module is used to perform a charging test procedure on the capacitor to be tested that meets the pre-check standard. Wherein, when the pre-inspection module determines that one of the plurality of capacitors to be tested does not meet the pre-inspection standard, the pre-inspection module removes the capacitor to be tested that does not meet the pre-inspection standard from the corresponding position to be tested.

In some embodiments, the pre-check module may include a first voltage source, a first current setting unit, and a plurality of voltage detection units. The first voltage source is electrically connected to the first terminal and the second terminal of each position to be tested, and is used to provide the first test voltage to the first terminal and the second terminal of each position to be tested. The first current setting unit is used for setting the first test current flowing through each position to be tested. Each voltage detection unit is electrically connected to one of the plurality of positions to be measured for detecting whether the capacitance to be measured in the plurality of positions to be measured meets the pre-inspection standard. Here, one of the plurality of positions to be tested may be defined as the first position to be tested, and the first voltage source and the first current setting unit are respectively used to provide the first test voltage and the first test current to the first test voltage. Location, and lasts for a preset period of time. In addition, the voltage detection unit can determine whether the voltage across the first terminal and the second terminal of the first position to be measured is within the preset voltage range. When the voltage across the first terminal and the second terminal of the first position to be measured is within the preset voltage Within the range, the capacitance to be measured in the first position to be measured meets the pre-inspection standard.

In some embodiments, the feeding module is used to place the plurality of capacitors to be tested on the plurality of positions to be tested on the carrier, and the plurality of positions to be tested are arranged in a first array. The pre-inspection module can simultaneously determine whether the multiple positions to be tested corresponding to one row of the first array meet the pre-inspection standard. The pre-inspection module can mark the position to be tested that does not meet the pre-inspection standard in the first array.

In summary, the capacitance testing device provided by the present invention has a pre-inspection module, and the pre-inspection module can check whether the capacitance to be tested meets a certain standard before the charging test. When the pre-inspection module believes that the capacitor under test does not meet the standard, it will not continue to charge the capacitor under test. Thereby, the capacitance testing device of the present invention can reduce the chance of damage to the capacitance testing device when testing capacitance.

The features, objectives and functions of the present invention will be further disclosed below. However, the following are only examples of the present invention, and should not be used to limit the scope of the present invention, that is, all equivalent changes and modifications made in accordance with the scope of the patent application of the present invention will still be the essence of the present invention. Without departing from the spirit and scope of the present invention, it should be regarded as a further embodiment of the present invention.

Please refer to FIG. 1. FIG. 1 is a functional block diagram of a capacitance testing device according to an embodiment of the present invention. As shown in FIG. 1, the capacitance testing device 1 includes a feeding module 10, a pre-inspection module 12 and a charging test module 14. The capacitance test device 1 may be an automatic test device, which is used to perform electrical tests on the capacitance to be measured (not shown in FIG. 1). The feeding module 10, the pre-inspection module 12, and the charging test module 14 can be used in the electrical testing process of the capacitor to be tested, for example, can be used to perform high temperature aging testing of the capacitor under test. Of course, the capacitance testing device 1 may additionally have a discharging module, or a computer used to control the feeding module 10, the pre-check module 12, and the charging test module 14, which is not limited in this embodiment. In other words, the feeding module 10, the pre-inspection module 12, and the charging test module 14 can be only a part of the capacitance testing device 1, which is used to ensure that the capacitor to be tested can be fed correctly and actively detect non-standard The capacitor to be tested, so that only the capacitor to be tested that meets the standard is tested for charging. Each part of the capacitance testing device 1 will be described below.

The feeding module 10 can be controlled by the control computer to place a plurality of capacitors to be measured at a plurality of positions to be measured. In one example, the feeding module 10 may place the plurality of capacitors to be measured on a plurality of positions to be measured on the carrier, and the plurality of positions to be measured may be arranged in a first array. Please refer to FIG. 1 and FIG. 2 together. FIG. 2 is a schematic diagram of a carrier plate applied to a feeding module according to an embodiment of the present invention. As shown in the figure, the carrier 2 may have a plurality of positions 200 to be measured arranged in an array (first array), the array may for example have a plurality of rows 20a-20e, and the number of positions to be measured in each row Can be multiple. For example, the number of positions to be tested in each row can be between 30 and 50, and the total number of positions to be tested on the tray 2 can be, for example, between 3,000 and 5,000. This embodiment is not here. Be restricted.

In one example, the feeding module 10 may include a vibration device (not shown), and the carrier 2 may be connected to the vibration device. When multiple capacitors to be tested are scattered on the carrier disk 2, the vibration device can be turned on to make the carrier disk 2 vibrate with the vibration device, so that the capacitors to be tested can each fall to different positions to be tested after being vibrated. in. In addition, the shape of each position 200 to be measured in the carrier 2 can also be specially designed. For example, the shape of each position 200 to be measured can be designed to accommodate only one capacitance to be measured, and multiple capacitances to be measured can be regular The ground is arranged in the tray 2. In one example, the designed position 200 to be tested can make the connecting pins of the capacitor to be tested face the same direction. For example, when the capacitance to be measured is placed in the position to be measured 200, one connecting pin of the capacitance to be measured can be designed to be located at the first end of the position to be measured 200, and the other connecting pin of the capacitance to be measured can be designed to be located in the position to be measured. Position 200 at the second end. In practice, a plurality of capacitors to be tested can also be placed in the position to be tested 200 in other ways, such as using automated equipment to place them with a robotic arm, or even manually, which is not limited in this embodiment.

After a plurality of capacitors to be tested have been individually placed in different positions 200 to be tested in the carrier plate 2, the feeding module 10 can determine that the feeding step has been completed at this time. Therefore, the tray 2 can be separated from the feeding module 10 and moved to the pre-inspection module 12 for subsequent steps. In one example, the feeding module 10 and the pre-inspection module 12 can be regarded as different inspection stations in the capacitance testing device 1, and the carrier 2 can be used in the feeding module 10 and the pre-inspection module by a robotic arm or a conveyor belt. Move between groups of 12.

The pre-inspection module 12 can be used to test the capacitors to be tested in each of the locations 200 to be tested, and determine whether each capacitor to be tested meets the pre-inspection standards. For the convenience of description, please refer to FIG. 1, FIG. 2 and FIG. 3. FIG. 3 is a functional block diagram of a pre-check module according to an embodiment of the present invention. As shown in the figure, the pre-check module 12 may include a voltage source 120 (first voltage source), a current setting unit 122 (first current setting unit), and a voltage detection unit 124. The voltage source 120 can be electrically connected to the first terminal 2000 and the second terminal 2002 of each location 200 to be tested, for providing a test voltage (first test voltage) to the first terminal 2000 and the second terminal 2002. The current setting unit 122 can be used to set a test current (first test current) flowing through each position 200 to be tested. The voltage detection unit 124 is electrically connected to one of the locations 200 to be tested for detecting whether the capacitance DUT in the location to be tested 200 meets the pre-inspection standard.

In practice, the pre-inspection module 12 may have a plurality of voltage detection units 124 corresponding to a plurality of positions 200 to be measured in the carrier 2 so that the capacitance DUTs in the positions 200 to be measured can be measured in batches. In one example, multiple voltage detection units 124 may correspond to multiple locations 200 to be tested in the same row, so that the pre-inspection module 12 can test multiple locations 200 to be tested column by column. In an example, taking the position to be measured 200 (the first position to be measured) corresponding to one of the voltage detection units 124 as an example, the voltage detection unit 124 may have a conductive clip, and the voltage detection unit 124 may use the conductive clip to try to clamp The first end 2000 and the second end 2002 of the position 200 to be measured. If the connection pins of the capacitor DUT to be tested are normal, the conductive clip should be able to smoothly clamp the two connection pins of the capacitor DUT to be tested. Conversely, if the connecting pins of the capacitor DUT to be tested are damaged or skewed, the conductive clip may not be able to smoothly clamp the two connecting pins of the capacitor DUT to be tested, or can only clamp one of the connecting pins of the capacitor DUT to be tested. Those with ordinary knowledge in the technical field should understand that the main function of the conductive clip is not to fix the connecting pin of the capacitor DUT to be measured, but to electrically connect the connecting pin of the capacitor DUT to be measured. Therefore, this embodiment does not limit the voltage detection unit 124 to use a conductive clip to electrically connect the first terminal 2000 and the second terminal 2002. The voltage detection unit 124 can also use a probe or other suitable electrical connection to the first terminal 2000. With the second end 2002 components.

In a practical example, the voltage source 120 will stably output a known voltage to the position to be measured 200, and the current flowing through the position to be measured 200 can be set by the current setting unit 122. When the quality and connection pins of the capacitor DUT to be tested are normal, the voltage detection unit 124 can measure the cross voltage of the capacitor DUT from the first terminal 2000 and the second terminal 2002, and use the cross voltage of the capacitor DUT to be tested , Judge whether the capacitance DUT under test meets the pre-inspection standard. For example, the voltage source 120 can stably charge the capacitor DUT to be tested for a period of time (preset time), and the voltage detection unit 124 can repeatedly measure whether the voltage across the capacitor DUT (the voltage difference between the two connecting pins) varies Increase with time, and calculate whether the capacitance value of the capacitor DUT under test is normal based on the cross-voltage that increases with time. In practice, when the voltage, current, and charging time (preset time) are all known, a person with ordinary knowledge in the relevant technical field should be able to easily calculate the capacitance value of the capacitor DUT to be tested, and can calculate it by The capacitance value, to determine whether the capacitance DUT to be tested meets the pre-inspection standard. For example, generally speaking, the capacitance value of the capacitor DUT under test is within a preset range, for example, meeting the requirements of quality control, that is, it can be inferred that the capacitor DUT under test meets the pre-inspection standard.

On the other hand, when the quality or the connection pins of the capacitor DUT to be tested are abnormal, the voltage detection unit 124 can measure from the first terminal 2000 and the second terminal 2002 that the voltage across the capacitor DUT to be tested is abnormal. For example, when the quality of the capacitor DUT under test is abnormal, the voltage detection unit 124 may not be able to measure the voltage difference from the first terminal 2000 and the second terminal 2002, that is, there is a short circuit inside the capacitor DUT under test. Since it is obviously not within the preset voltage range, the voltage detection unit 124 can directly determine that the capacitance DUT under test does not meet the pre-inspection standard. Alternatively, the voltage detection unit 124 may find that the efficiency of the increase in the cross voltage is obviously problematic (for example, the increase in the cross voltage is too fast or too slow), and it can directly determine that the capacitance DUT under test does not meet the pre-check standard. In addition, when the connecting pin of the capacitor DUT to be tested is skewed and is not correctly located at the first terminal 2000 or the second terminal 2002, the first terminal 2000 and the second terminal 2002 are in a disconnected state. At this time, not only can the voltage detection unit 124 determine that the capacitance DUT under test does not meet the pre-inspection standard based on the voltage difference between the first terminal 2000 and the second terminal 2002, but also the current setting unit 122 can find that the current is abnormal (no open circuit). Current), it is directly judged that the capacitance DUT under test does not meet the pre-inspection standard.

In one example, if the pre-inspection module 12 determines that the capacitance DUT of the specific test position 200 does not meet the pre-inspection standard, the capacitance DUT that does not meet the pre-inspection standard can be removed from the corresponding test position 200. In other words, the pre-inspection module 12 may have a mechanism for rejecting defective products, so as to prevent the capacitor DUT under test that does not meet the pre-inspection standard from remaining at the test position 200. For example, the pre-inspection module 12 may have a spring or an elastic piece to directly eject the capacitor DUT in a specific position 200 out of the carrier 2, or the pre-inspection module 12 may have a robotic arm or a fixture to remove the capacitor DUT in the specific position 200 The capacitor DUT to be tested is clamped outside the carrier 2 (for example, placed in a defective box). Of course, the pre-inspection module 12 can also mark the location to be tested 200 that does not meet the pre-inspection standard, so that the subsequent charging test procedure does not charge the location to be tested 200, so as not to correctly eliminate the bad capacitor DUT under test. It will cause damage to the capacitance testing device 1.

Continuing to refer to FIG. 1, the charging test module 14 can perform a charging test procedure on the capacitor DUT to be tested that meets the pre-check standard. This embodiment does not limit the test items and methods of the charging test program. For example, the charging test module 14 can perform charging tests, discharge tests, high temperature tests, leakage tests, internal resistance tests, or other electrical tests, etc. Examples are not limited here. It is worth mentioning that the pre-inspection module 12 can use the voltage source 120 and the current setting unit 122 to restrict the pre-inspection module 12 from operating at low voltage and low current. The charging test module 14 may use a larger voltage. Or the current is used to test the capacitance DUT under test. The purpose of limiting the pre-inspection module 12 to operate with low voltage and low current is to first use a lower voltage and current for testing because it is uncertain whether the capacitor DUT to be tested is normal, so as to avoid damage to the capacitor testing device 1. After that, when the capacitor DUT to be tested is simply tested and screened by the pre-inspection module 12, the capacitor DUT that has obvious defects in quality can be excluded first, and then the charging test module 14 performs higher voltage and current on the capacitor DUT to be tested The electrical test can better guarantee the capacitance test device 1.

In summary, the capacitance test device provided by the present invention can perform a pre-inspection before the charging test, and charge the capacitor to be tested that meets the pre-inspection standard. Thereby, the capacitance testing device of the present invention can eliminate the capacitance to be tested that does not meet the pre-inspection standard before the large voltage and large current testing, so as to avoid unexpected failure or damage of the testing machine.

1: Capacitance testing device 10: Feeding module 12: Pre-check module 120: voltage source 122: current setting unit 124: Voltage detection unit 14: Charging test module 2: carrier 20a~20e: row 200: position to be measured 2000: first end 2002: second end DUT: Capacitance to be measured

FIG. 1 is a functional block diagram of a capacitance testing device according to an embodiment of the invention.

FIG. 2 is a schematic diagram of a carrier plate applied by a feeding module according to an embodiment of the present invention.

FIG. 3 is a functional block diagram of a pre-check module according to an embodiment of the invention.

1: Capacitance testing device

10: Feeding module

12: Pre-check module

14: Charging test module

Claims (8)

A capacitor test device, comprising: a feeding module for placing a plurality of capacitors to be tested in a plurality of positions to be tested respectively; a pre-inspection module for testing the positions to be tested in the positions to be tested The capacitor determines whether each capacitor under test meets a pre-inspection standard; and a charging test module for performing a charging test procedure on the capacitor under test that meets the pre-inspection standard; wherein, when the pre-inspection module When it is determined that one of the capacitors to be tested does not meet the pre-inspection standard, the pre-inspection module removes the capacitor to be tested that does not meet the pre-inspection standard from the corresponding position to be tested. The capacitance test device according to claim 1, wherein the pre-check module comprises: a first voltage source, electrically connected to a first end and a second end of each of the positions to be tested, for providing a A first test voltage is applied to the first terminal and the second terminal of each of the positions to be tested; a first current setting unit for setting a first test current flowing through each of the positions to be tested; multiple voltages A detection unit, each of the voltage detection units is electrically connected to one of the positions to be measured, and used to detect whether the capacitances to be measured in the positions to be measured meet the pre-inspection standard. The capacitance test device according to claim 2, wherein one of the positions to be tested is defined as a first position to be tested, and the first voltage source and the first current setting unit are respectively used to provide the first test voltage And the first test current to the first to-be-tested position for a preset time. The capacitance testing device according to claim 3, wherein the voltage detection unit determines whether the voltage across the first end and the second end of the first to-be-tested position is within a preset voltage range, and when the first to-be-tested position If the voltage across the first end and the second end of the position is within the preset voltage range, the capacitance to be measured in the first position to be measured meets the pre-check standard. The capacitance test device according to claim 2, wherein the charging test module has a second voltage source for providing a second test voltage, and the first test voltage is smaller than the second test voltage. The capacitance test device according to claim 1, wherein the feeding module is used to place the capacitors to be tested on the positions to be tested on a carrier, and the positions to be tested are arranged in a first array. The capacitance testing device according to claim 6, wherein the pre-inspection module also determines whether the positions to be tested corresponding to one row of the first array meet the pre-inspection standard. The capacitance test device according to claim 6, wherein the pre-inspection module marks the position or positions to be tested that do not meet the pre-inspection standard in the first array.

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