TWI675913B - Detergent composition for substrate for hard disk - Google Patents

Detergent composition for substrate for hard disk Download PDF

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TWI675913B
TWI675913B TW106116866A TW106116866A TWI675913B TW I675913 B TWI675913 B TW I675913B TW 106116866 A TW106116866 A TW 106116866A TW 106116866 A TW106116866 A TW 106116866A TW I675913 B TWI675913 B TW I675913B
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mass
less
substrate
cleaning
detergent composition
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TW106116866A
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TW201809250A (en
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高沢史博
Fumihiro TAKAZAWA
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日商花王股份有限公司
Kao Corporation
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Abstract

本發明提供一種殘留於基板表面之顆粒之清潔性優異的硬碟用基板用之清潔劑組合物。 本發明係關於一種硬碟用基板用之清潔劑組合物,其含有聚合物(成分A),該聚合物包含源自下述通式(I)所表示之單體a1或其酐之結構單元(a1)、以及源自選自下述通式(II)所表示之單體及下述通式(III)所表示之單體中之至少1種單體a2的結構單元(a2),成分A之重量平均分子量為15000以上且200000以下,pH值為8以上。 The present invention provides a cleaning agent composition for a hard disk substrate having excellent cleanability of particles remaining on the surface of the substrate. The present invention relates to a cleaner composition for a hard disk substrate, which contains a polymer (ingredient A) which contains a structural unit derived from the monomer a1 or an anhydride represented by the following general formula (I) (a1), and a structural unit (a2) derived from at least one monomer a2 selected from a monomer represented by the following general formula (II) and a monomer represented by the following general formula (III), a component The weight average molecular weight of A is 15,000 or more and 200,000 or less, and the pH value is 8 or more.

Description

硬碟用基板用之清潔劑組合物Detergent composition for hard disk substrate

本發明係關於一種硬碟用基板用之清潔劑組合物、基板之清潔方法及硬碟用基板之製造方法。The present invention relates to a cleaning agent composition for a hard disk substrate, a method for cleaning the substrate, and a method for manufacturing a hard disk substrate.

近年來,於個人電腦或各種電子器件中開始處理動態圖像或音頻等較大之資料,變得需要大容量之資訊記錄裝置。其結果為,對資訊記錄媒體之高記錄密度化之要求逐年變高。為了應對該情況,對於硬碟,業界正推進垂直磁記錄方式之採用、量產化。關於垂直磁記錄方式,對資訊記錄媒體用基板(以下,亦稱為「硬碟用基板」)要求較目前之基板更高水準之基板耐熱性及表面平滑性。進而,對硬碟用基板表面所要求之潔淨度亦變高。 作為硬碟用基板所使用之材料,有於表面實施有鎳-磷鍍覆之鋁、玻璃等。近來,於基板材質不同者之半導體用基板領域,亦要求基板表面之較高之潔淨度,開發出各種清潔劑。 於專利文獻1中,作為對於被研磨液中之研磨劑粒子、其等之凝聚物、被研磨物之研磨屑等固體污漬所污染的研磨中所使用之研磨墊等墊之清潔有效之清潔劑組合物,揭示有含有於分子中具有1種以上選自-COOR及-SO3 R(R表示氫原子、無機鹼或有機鹼)中之基之陰離子性界面活性劑的清潔劑組合物。 於專利文獻2中,作為於矽晶圓等半導體用基板上形成半導體元件時使用的對於去除有機或者無機之微小異物及油分有效且發泡性較小之清潔劑組合物,揭示有如下之半導體基板用或半導體元件用清潔劑組合物,其係含有重量平均分子量為500~15萬之聚羧酸化合物而成,該聚羧酸化合物係以選自丙烯酸、甲基丙烯酸及順丁烯二酸中之至少1種作為單體成分,使用全部單體成分之使用量之20莫耳%以上之該單體成分而獲得。 於專利文獻3中,作為對環境之負擔較少,且對在化學機械研磨(CMP)前後殘留於半導體用基板等半導體零件上之氧化矽、氧化鋁等CMP研磨粒、CMP中所含之金屬雜質或者基於金屬配線等之Fe、Mn、Al、Ce、Cu、W、Ti等雜質而言清潔效果較高之清潔劑,揭示有以將至少包含伊康酸(鹽)之單體成分進行(共)聚合而成之(共)聚合物作為主成分之半導體零件用清潔劑。 先前技術文獻 專利文獻 專利文獻1:日本專利特開2000-309796號公報 專利文獻2:日本專利特開平11-181494號公報 專利文獻3:日本專利特開2001-64680號公報In recent years, large data such as moving images or audio have been processed in personal computers or various electronic devices, and large-capacity information recording devices have become necessary. As a result, the demand for higher recording density of the information recording medium has been increasing year by year. To cope with this situation, the industry is promoting the adoption and mass production of perpendicular magnetic recording methods for hard disks. Regarding the perpendicular magnetic recording method, a substrate for an information recording medium (hereinafter, also referred to as a “hard disk substrate”) requires a higher level of substrate heat resistance and surface smoothness than the current substrate. Furthermore, the required cleanliness on the surface of the hard disk substrate is also increased. As a material for the substrate for a hard disk, there are aluminum, glass, and the like having nickel-phosphorus plating on the surface. Recently, in the field of semiconductor substrates with different substrate materials, higher cleanliness of the substrate surface is also required, and various cleaners have been developed. Patent Document 1 is an effective cleaning agent for cleaning pads such as polishing pads used in polishing contaminated with abrasive particles such as abrasive particles in abrasive liquids, their agglomerates, and solid stains such as abrasive particles of abrasives. The composition discloses a detergent composition containing an anionic surfactant having a group selected from the group consisting of -COOR and -SO 3 R (R represents a hydrogen atom, an inorganic base, or an organic base) in a molecule. Patent Document 2 discloses the following semiconductors as a cleaning composition effective for removing organic or inorganic fine foreign matters and oil components and having a small foaming property when forming a semiconductor element on a semiconductor substrate such as a silicon wafer. A cleaning composition for a substrate or a semiconductor element, which is a polycarboxylic acid compound having a weight average molecular weight of 500 to 150,000, and the polycarboxylic acid compound is selected from acrylic acid, methacrylic acid, and maleic acid At least one of them is used as the monomer component, and it is obtained by using the monomer component in an amount of 20 mol% or more of the total amount of the monomer component. In Patent Document 3, as a burden on the environment, CMP abrasive grains such as silicon oxide and alumina remaining on semiconductor parts such as semiconductor substrates before and after chemical mechanical polishing (CMP), and metals contained in CMP are included. Impurities or cleaners based on impurities such as Fe, Mn, Al, Ce, Cu, W, and Ti, such as metal wiring, have higher cleaning effects. Detergent for semiconductor parts with (co) polymer as a main component, which is copolymerized. Prior Art Literature Patent Literature Patent Literature 1: Japanese Patent Laid-Open No. 2000-309796 Patent Literature 2: Japanese Patent Laid-Open No. 11-181494 Patent Literature 3: Japanese Patent Laid-Open No. 2001-64680

[發明所欲解決之問題] 一般而言,硬碟用基板之製造步驟中包括使用研磨液組合物之研磨步驟。若於經過研磨步驟之基板表面殘留有研磨屑或研磨粒等顆粒,則會對磁碟之性能及良率產生不良影響。尤其是,即便微小之顆粒暫時自基板剝離,亦容易再附著於基板表面,對於清潔劑組合物亦要求具有較高之顆粒分散性。 因此,本發明提供一種殘留於基板表面之顆粒之清潔性優異之清潔劑組合物、以及使用其之基板之清潔方法及硬碟用基板之製造方法。 [解決問題之技術手段] 於一態樣中,本發明係關於一種硬碟用基板用之清潔劑組合物,其含有聚合物(成分A),該聚合物包含源自下述通式(I)所表示之單體a1或其酐之結構單元(a1)、以及源自選自下述通式(II)所表示之單體及下述通式(III)所表示之單體中之至少1種單體a2的結構單元(a2),成分A之重量平均分子量為15000以上且200000以下,pH值為8以上。 [化1][式(I)中,R1 、R2 及R3 分別獨立地表示氫原子、甲基或-(CH2 )p COOM2 ,M1 及M2 分別獨立地表示氫原子、鹼金屬、鹼土金屬(1/2原子)、有機銨基、或銨基,p表示0以上且2以下之整數] [化2][式(II)中,R4 及R5 分別獨立地表示氫原子或甲基,q表示0以上且2以下之整數,AO表示碳數為2或3之伸烷基氧基,n為AO之平均加成莫耳數,表示4以上且300以下之數,X表示氫原子或碳數為1以上且3以下之烷基] [化3][式(III)中,R6 及R7 分別獨立地表示氫原子或甲基,r表示0以上且2以下之整數,AO表示碳數為2或3之伸烷基氧基,m為AO之平均加成莫耳數,表示4以上且300以下之數,Y表示氫原子或碳數為1以上且3以下之烷基] 於另一態樣中,本發明係關於一種基板之清潔方法,其包括使用本發明之清潔劑組合物對被清潔基板進行清潔之清潔步驟,上述被清潔基板為利用研磨液組合物進行研磨後之基板。 於又一態樣中,本發明係關於一種硬碟用基板之製造方法,其包括使用本發明之清潔劑組合物對被清潔基板進行清潔之清潔步驟,上述被清潔基板為利用研磨液組合物進行研磨後之基板。 [發明之效果] 根據本發明,可提供殘留於基板表面之顆粒之清潔性優異之清潔劑組合物。而且,根據使用本發明之清潔劑組合物之清潔方法及製造方法,可獲得清潔後之基板表面之潔淨度優異之硬碟用基板。進而,根據使用本發明之清潔劑組合物之清潔方法及製造方法,可獲得高記錄密度之硬碟記錄裝置。[Problems to be Solved by the Invention] Generally, a manufacturing step of a hard disk substrate includes a polishing step using a polishing liquid composition. If particles such as abrasive dust or abrasive particles remain on the surface of the substrate after the polishing step, the performance and yield of the magnetic disk will be adversely affected. In particular, even if fine particles are temporarily peeled from the substrate, they are likely to reattach to the surface of the substrate, and the detergent composition is also required to have high particle dispersibility. Therefore, the present invention provides a detergent composition having excellent cleanability of particles remaining on the surface of a substrate, a method for cleaning the substrate using the same, and a method for manufacturing a substrate for a hard disk. [Technical means to solve the problem] In one aspect, the present invention relates to a cleaning agent composition for a substrate for a hard disk, which contains a polymer (ingredient A) which contains a polymer derived from the following general formula (I The structural unit (a1) of the monomer a1 or its anhydride represented by), and derived from at least one selected from the monomers represented by the following general formula (II) and the monomers represented by the following general formula (III) The structural unit (a2) of one type of monomer a2 has a weight average molecular weight of component A of 15,000 or more and 200,000 or less, and a pH value of 8 or more. [Chemical 1] [In formula (I), R 1 , R 2, and R 3 each independently represent a hydrogen atom, a methyl group, or-(CH 2 ) p COOM 2 , and M 1 and M 2 each independently represent a hydrogen atom, an alkali metal, or alkaline earth. Metal (1/2 atom), organic ammonium group, or ammonium group, p represents an integer of 0 or more and 2 or less] [化 2] [In formula (II), R 4 and R 5 each independently represent a hydrogen atom or a methyl group, q represents an integer of 0 or more and 2 or less, AO represents an alkyleneoxy group having 2 or 3 carbon atoms, and n is AO The average addition mole number is a number of 4 or more and 300 or less, and X is a hydrogen atom or an alkyl group having 1 or more and 3 or less carbon] [Chemical 3] [In formula (III), R 6 and R 7 each independently represent a hydrogen atom or a methyl group, r represents an integer of 0 or more and 2 or less, AO represents an alkyleneoxy group having 2 or 3 carbon atoms, and m is AO The average addition mole number is 4 or more and 300 or less, and Y is a hydrogen atom or an alkyl group having 1 or more and 3 or less carbon] In another aspect, the present invention relates to a method for cleaning a substrate It includes a cleaning step of cleaning the substrate to be cleaned by using the cleaning agent composition of the present invention. The substrate to be cleaned is a substrate that is polished by using a polishing liquid composition. In yet another aspect, the present invention relates to a method for manufacturing a substrate for a hard disk, which includes a cleaning step of cleaning the substrate to be cleaned using the cleaning agent composition of the present invention, wherein the substrate to be cleaned uses a polishing liquid composition The substrate after polishing. [Effects of the Invention] According to the present invention, it is possible to provide a detergent composition having excellent cleanability of particles remaining on the substrate surface. In addition, according to the cleaning method and manufacturing method using the detergent composition of the present invention, a substrate for a hard disk having excellent cleanliness on the surface of the substrate after cleaning can be obtained. Furthermore, according to the cleaning method and manufacturing method using the detergent composition of the present invention, a hard disk recording device with a high recording density can be obtained.

本發明基於如下見解:若使用包含特定之聚合物(成分A)且pH值為8以上之清潔劑組合物對利用研磨液組合物進行研磨後之基板進行清潔,則可提高殘留於基板表面之顆粒之去除性。 即,於一態樣中,本發明係關於一種硬碟用基板用之清潔劑組合物(以下,亦稱為「本發明之清潔劑組合物」),其含有聚合物(成分A),該聚合物包含源自以上述通式(I)表示之單體a1或其酐之結構單元(a1)、以及源自選自以上述通式(II)表示之單體及下述通式(III)所表示之單體中之至少1種單體a2的結構單元(a2),成分A之重量平均分子量為15000以上且200000以下,pH值為8以上。 表現出本發明之效果的詳細機制尚不明確,推斷如下。 推測藉由使清潔劑組合物中之聚合物(成分A)之羧基吸附於基板表面及顆粒表面,而於基板表面及顆粒表面形成因聚伸烷基氧基引起之立體障壁,於基板表面-顆粒間或顆粒-顆粒間產生立體排斥,結果促進顆粒自基板表面之去除,又,顆粒向基板表面之再附著、及顆粒彼此之凝聚得到抑制,可高效率地自基板表面去除顆粒,而可提高清潔性。 進而,認為藉由使聚合物(成分A)具有特定之重量平均分子量,而更有效地產生上述立體排斥之作用,可更有效地抑制顆粒向基板表面之再附著或顆粒彼此之凝聚。通常,與源自研磨粒之顆粒相比,源自研磨屑之顆粒之粒徑較小且難以去除,但認為本發明之清潔劑組合物藉由含有特定之聚合物(成分A),亦可高效率地去除難以去除之源自研磨屑之顆粒。 然而,本發明並不限定於該等機制而加以解釋。 因此,根據本發明之清潔劑組合物,於一個或複數個實施形態中,清潔劑組合物中之顆粒之分散性優異,可有效地去除殘留於基板表面之顆粒。而且,根據使用本發明之清潔劑組合物之清潔方法及製造方法,於一個或複數個實施形態中,可獲得潔淨度優異之硬碟用基板。進而,藉由使用利用本發明之清潔劑組合物進行清潔之硬碟用基板,可實現高記錄密度之硬碟記錄裝置。 於本發明中,所謂「顆粒」係指殘留或附著於基板表面之異物。本發明之「顆粒」包括:源自氧化鎳、氧化矽等之研磨屑之異物;源自氧化矽(silica)、氧化鋁(alumina)、氧化鈰(ceria)等之研磨粒之異物等。 以下,對本發明之清潔劑組合物中所含之各成分進行說明。 [成分A:聚合物] 本發明之清潔劑組合物中所含之成分A係如下之聚合物,其含有源自下述通式(I)所表示之單體a1或其酐之結構單元(a1)、以及源自選自下述通式(II)所表示之單體及下述通式(III)所表示之單體中之至少1種單體a2的結構單元(a2)。 (單體a1) [化4]式(I)中,R1 、R2 及R3 分別獨立地表示氫原子、甲基或-(CH2 )p COOM2 ,M1 及M2 分別獨立地表示氫原子、鹼金屬、鹼土金屬(1/2原子)、有機銨基、或銨基,p表示0以上且2以下之整數。 式(I)中,R1 、R2 及R3 為選自氫原子、甲基及-(CH2 )p COOM2 中之至少1種,就提高清潔性之觀點而言,較佳為R1 及R3 為氫原子,R2 為氫原子或甲基,更佳為R1 及R3 為氫原子,R2 為甲基。 式(I)中,M1 及M2 為選自氫原子、鹼金屬、鹼土金屬(1/2原子)、有機銨基及銨基中之至少1種,就提高清潔性之觀點而言,較佳為鹼金屬,更佳為鈉及鉀。 式(I)中,p為0以上且2以下之整數,就提高清潔性之觀點而言,較佳為0或1,更佳為0。 式(I)所表示之單體a1亦可為酸酐。 作為單體a1,例如可列舉丙烯酸、甲基丙烯酸、順丁烯二酸、反丁烯二酸、伊康酸等及其等之酸酐、以及其等之鹽,就提高清潔性之觀點而言,較佳為選自丙烯酸、甲基丙烯酸、順丁烯二酸及順丁烯二酸酐中之至少1種,更佳為丙烯酸及甲基丙烯酸中之至少一者,進而較佳為甲基丙烯酸。作為鹽,可列舉鹼金屬鹽、鹼土金屬鹽、銨鹽、有機銨鹽等,就提高清潔性之觀點而言,較佳為鹼金屬鹽,更佳為鈉鹽及鉀鹽。 (單體a2) 單體a2係選自下述通式(II)所表示之單體(以下,亦稱為「單體a21」)及下述通式(III)所表示之單體(以下,亦稱為「單體a22」)中之至少1種單體。 <單體a21> [化5]式(II)中,R4 及R5 分別獨立地表示氫原子或甲基,q表示0以上且2以下之整數,AO表示碳數為2或3之伸烷基氧基,n為AO之平均加成莫耳數,表示4以上且300以下之數,X表示氫原子或碳數為1以上且3以下之烷基。 式(II)中,AO表示碳數為2或3之伸烷基氧基,該伸烷基氧基可為直鏈狀及支鏈狀中之任一形態。AO可為1種,亦可為2種以上。於AO為2種以上時,其加成形式可為無規狀,亦可為嵌段狀。作為AO,例如可列舉氧基伸乙基(EO)、氧基伸丙基(PO),就清潔性之觀點而言,較佳為氧基伸乙基(EO)。 式(II)中,n為4以上且300以下之數,就提高清潔性之觀點而言,較佳為6以上,更佳為9以上,進而較佳為20以上,進而更佳為40以上,進而更佳為80以上,而且,就相同之觀點而言,較佳為200以下,更佳為150以下,進而較佳為130以下。 式(II)中,X表示氫原子或碳數為1以上且3以下之烷基,就提高清潔性之觀點而言,較佳為碳數為1以上且3以下之烷基。該烷基可為直鏈狀及支鏈狀中之任一形態。作為碳數為1以上且3以下之烷基,例如可列舉甲基、乙基、正丙基、異丙基。 作為單體a21,於式(II)中之q為0之情形時,例如可列舉甲氧基聚乙二醇(甲基)丙烯酸酯、乙氧基聚乙二醇(甲基)丙烯酸酯、丙氧基聚乙二醇(甲基)丙烯酸酯、甲氧基聚丙二醇(甲基)丙烯酸酯、乙氧基聚丙二醇(甲基)丙烯酸酯、及丙氧基聚丙二醇(甲基)丙烯酸酯等,就提高清潔性之觀點而言,較佳為選自甲氧基聚乙二醇(甲基)丙烯酸酯、乙氧基聚乙二醇(甲基)丙烯酸酯、及丙氧基聚乙二醇(甲基)丙烯酸酯中之至少1種,更佳為甲氧基聚乙二醇(甲基)丙烯酸酯,進而更佳為甲氧基聚乙二醇甲基丙烯酸酯。所謂「(甲基)丙烯酸酯」係指丙烯酸酯及甲基丙烯酸酯中之至少1種。 作為單體a21,於式(II)中之q為1之情形時,例如可列舉甲氧基聚乙二醇3-丁烯酸酯、乙氧基聚乙二醇3-丁烯酸酯、丙氧基聚乙二醇3-丁烯酸酯、甲氧基聚丙二醇3-丁烯酸酯、乙氧基聚丙二醇3-丁烯酸酯、及丙氧基聚丙二醇3-丁烯酸酯等。 作為單體a21,於式(II)中之q為2之情形時,例如可列舉甲氧基聚乙二醇4-戊烯酸酯、乙氧基聚乙二醇4-戊烯酸酯、丙氧基聚乙二醇4-戊烯酸酯、甲氧基聚丙二醇4-戊烯酸酯、乙氧基聚丙二醇4-戊烯酸酯、及丙氧基聚丙二醇4-戊烯酸酯等。 <單體a22> [化6]式(III)中,R6 及R7 分別獨立地表示氫原子或甲基,r表示0以上且2以下之整數,AO表示碳數為2或3之伸烷基氧基,m為AO之平均加成莫耳數,表示4以上且300以下之數,Y表示氫原子或碳數為1以上且3以下之烷基。 式(III)中,AO表示碳數為2或3之伸烷基氧基,該伸烷基氧基可為直鏈狀及支鏈狀中之任一形態。AO可為1種,亦可為2種以上。於AO為2種以上時,其加成形式可為無規狀,亦可為嵌段狀。作為AO,例如可列舉氧基伸乙基(EO)、氧基伸丙基(PO),就清潔性之觀點而言,較佳為氧基伸乙基(EO)。 式(III)中,m為4以上且300以下之數,就提高清潔性之觀點而言,較佳為6以上,更佳為9以上,進而較佳為20以上,進而更佳為40以上,進而更佳為80以上,而且,就相同之觀點而言,較佳為200以下,更佳為150以下,進而較佳為130以下。 式(III)中,Y表示氫原子或碳數為1以上且3以下之烷基,就提高清潔性之觀點而言,較佳為碳數為1以上且3以下之烷基。該烷基可為直鏈狀及支鏈狀中之任一形態。作為碳數為1以上且3以下之烷基,例如可列舉甲基、乙基、正丙基、異丙基。 作為單體a22,於式(III)中之r為0之情形時,例如可列舉聚乙二醇乙烯基醚、甲氧基聚乙二醇乙烯基醚、乙氧基聚乙二醇乙烯基醚、丙氧基聚乙二醇乙烯基醚、聚丙二醇乙烯基醚、甲氧基聚丙二醇乙烯基醚、乙氧基聚丙二醇乙烯基醚、丙氧基聚丙二醇乙烯基醚、聚乙二醇異丙烯基醚、聚丙二醇異丙烯基醚等。 作為單體a22,於式(III)中之r為1之情形時,例如可列舉聚乙二醇烯丙基醚、甲氧基聚乙二醇烯丙基醚、乙氧基聚乙二醇烯丙基醚、丙氧基聚乙二醇烯丙基醚、聚丙二醇烯丙基醚、甲氧基聚丙二醇烯丙基醚、乙氧基聚丙二醇烯丙基醚、丙氧基聚丙二醇烯丙基醚、聚乙二醇2-甲基烯丙基醚、聚丙二醇2-甲基烯丙基醚、聚乙二醇2-丁烯基醚、聚丙二醇2-丁烯基醚等。 作為單體a22,於式(III)中之r為2之情形時,例如可列舉聚乙二醇3-丁烯基醚、甲氧基聚乙二醇3-丁烯基醚、乙氧基聚乙二醇3-丁烯基醚、丙氧基聚乙二醇3-丁烯基醚、聚丙二醇3-丁烯基醚、甲氧基聚丙二醇3-丁烯基醚、乙氧基聚丙二醇3-丁烯基醚、丙氧基聚丙二醇3-丁烯基醚、聚乙二醇3-甲基-3-丁烯基醚、甲氧基聚乙二醇3-甲基-3-丁烯基醚、乙氧基聚乙二醇3-甲基-3-丁烯基醚、丙氧基聚乙二醇3-甲基-3-丁烯基醚、聚丙二醇3-甲基-3-丁烯基醚、甲氧基聚丙二醇3-甲基-3-丁烯基醚、乙氧基聚丙二醇3-甲基-3-丁烯基醚、丙氧基聚丙二醇3-甲基-3-丁烯基醚等。 就提高清潔性之觀點而言,本發明之成分A之全部結構單元中之結構單元(a1)相對於結構單元(a2)的莫耳比a1/a2較佳為0.1以上,更佳為0.5以上,進而較佳為1以上,進而更佳為2以上,而且,就相同之觀點而言,較佳為100以下,更佳為50以下,進而較佳為30以下,進而更佳為20以下。就提高清潔性之觀點而言,成分A之全部結構單元中之莫耳比a1/a2較佳為0.1以上且100以下,更佳為0.5以上且50以下,進而較佳為1以上且30以下。進而更佳為2以上且20以下。 本發明之成分A可進而含有結構單元(a1)及結構單元(a2)以外之其他結構單元。作為其他結構單元,例如可列舉源自選自(甲基)丙烯酸烷基酯、(甲基)丙烯酸羥基乙酯、丙烯醯胺類、乙酸乙烯酯、苯乙烯、烯烴、乙烯醇、烯丙醇、烯丙醇之聚環氧烷加成物等中之至少1種化合物的結構單元。就表現出本發明之效果之觀點而言,本發明之成分A之全部結構單元中之上述其他結構單元的含量較佳為10質量%以下,更佳為3質量%以下,進而較佳為1質量%以下。 本發明之成分A可藉由利用溶液聚合法使包含單體a1及單體a2之單體混合物進行聚合等公知方法而獲得。作為溶液聚合所使用之溶劑,可列舉:水;甲苯、二甲苯等芳香族系烴;乙醇、2-丙醇等醇;丙酮、甲基乙基酮等酮;四氫呋喃、二乙二醇二甲醚等醚等。作為聚合所使用之聚合起始劑,可使用公知之自由基起始劑,例如可列舉:過氧二硫酸銨(過硫酸銨鹽)、過氧化氫水、過氧二硫酸鈉等。於聚合時,進而可使用鏈轉移劑,例如可列舉:2-巰基乙醇、β-巰基丙酸等硫醇繫鏈轉移劑;1,2-丙二醇等鏈轉移劑兼溶劑。於本發明中,成分A之全部結構單元中之各結構單元之含量可視為各單體之使用量相對於聚合所使用之單體總量的比率。 構成成分A之各結構單元之排列可為無規、嵌段或接枝中之任一種。 於成分A具有源自單體a1之鹽生成基(-COOH、-(CH2 )p COOH)之情形時,可利用中和劑加以中和而使用。作為中和劑,例如可列舉:氫氧化鈉、氫氧化鉀、氨等。 就清潔性之觀點而言,成分A之重量平均分子量為15000以上,較佳為20000以上,更佳為25000以上,進而較佳為30000以上,進而更佳為50000以上,而且,就相同之觀點而言,為200000以下,較佳為150000以下,更佳為100000以下,進而較佳為80000以下。就清潔性之觀點而言,成分A之重量平均分子量為15000以上且200000以下,較佳為20000以上且150000以下,更佳為20000以上且100000以下,進而較佳為20000以上且80000以下,進而更佳為25000以上且80000以下。於本發明中,重量平均分子量係藉由凝膠滲透層析法(聚乙二醇換算)所測得者,具體而言,可藉由實施例中所記載之方法進行測定。 就提高清潔性之觀點而言,本發明之清潔劑組合物中之成分A相對於水以外之成分之合計質量的含量較佳為1質量%以上,更佳為10質量%以上,進而較佳為15質量%以上,進而更佳為20質量%以上,而且,就相同之觀點而言,較佳為99.9質量%以下,更佳為99質量%以下,進而較佳為98質量%以下。進而,就提高清潔性之觀點而言,清潔劑組合物中之成分A相對於水以外之成分之合計質量的含量較佳為1質量%以上且99.9質量%以下,更佳為10質量%以上且99.9質量%以下,進而較佳為15質量%以上且99質量%以下,進而更佳為20質量%以上且98質量%以下。 就清潔性之觀點而言,本發明之清潔劑組合物之清潔時之成分A的含量較佳為0.001質量%以上,更佳為0.005質量%以上,進而較佳為0.01質量%以上,而且,就相同之觀點而言,較佳為10質量%以下,更佳為5質量%以下,進而較佳為2質量%以下,進而更佳為1質量%以下,進而更佳為0.5質量%以下,進而更佳為0.2質量%以下。進而,就相同之觀點而言,清潔劑組合物中之清潔時之成分A之含量較佳為0.001質量%以上且10質量%以下,更佳為0.005質量%以上且5質量%以下,進而較佳為0.01質量%以上且2質量%以下,進而更佳為0.01質量%以上且1質量%以下,進而更佳為0.01質量%以上且0.5質量%以下,進而更佳為0.01質量%以上且0.2質量%以下。 如下所述,本發明之清潔劑組合物亦可製成濃縮物,於進行清潔時加以稀釋而使用,因此於本發明中,於一個或複數個實施形態中,「清潔劑組合物之清潔時之各成分之含量」係指於清潔步驟中使用之清潔劑組合物之各成分之含量。因此,於本發明中,於一個或複數個實施形態中,清潔時之清潔劑組合物、即清潔步驟中使用之清潔劑組合物係指稀釋狀態下之清潔劑組合物。 [成分B:鹼劑] 本發明之清潔劑組合物亦可進而含有鹼劑(成分B)。作為鹼劑,可列舉能夠對清潔劑組合物賦予鹼性之化合物、或能夠將清潔劑組合物之pH值調整至下述範圍內之化合物,例如可列舉無機鹼劑及有機鹼劑等。作為無機鹼劑,例如可列舉:氨;氫氧化鉀及氫氧化鈉等鹼金屬氫氧化物等。作為有機鹼劑,例如可列舉:羥基烷基胺、四級銨鹽等。作為羥基烷基胺,例如可列舉:單乙醇胺、二乙醇胺、三乙醇胺、甲基乙醇胺、甲基二乙醇胺、單丙醇胺、二丙醇胺、三丙醇胺、甲基丙醇胺、乙基二丙醇胺、及胺基乙基乙醇胺等。作為四級銨鹽,例如可列舉:氫氧化四甲基銨、及膽鹼等。該等鹼劑可單獨使用,亦可將兩種以上混合而使用。 作為成分B,就提高清潔性之觀點而言,較佳為選自鹼金屬氫氧化物、羥基烷基胺、及四級銨鹽中之至少1種,就減少排水處理之負擔之觀點而言,更佳為鹼金屬氫氧化物,進而較佳為氫氧化鉀及氫氧化鈉中之至少1種。 就提高清潔性之觀點而言,本發明之清潔劑組合物中之成分B相對於水以外之成分之合計質量的含量較佳為0.1質量%以上,更佳為0.3質量%以上,進而較佳為0.5質量%以上,而且,就相同之觀點而言,較佳為99質量%以下,更佳為90質量%以下,進而較佳為80質量%以下,進而更佳為75質量%以下。進而,就提高清潔性之觀點而言,本發明之清潔劑組合物中之成分B相對於水以外之成分之合計質量的含量較佳為0.1質量%以上且99質量%以下,更佳為0.1質量%以上且90質量%以下,進而較佳為0.3質量%以上且80質量%以下,進而更佳為0.5質量%以上且75質量%以下。 就清潔性之觀點而言,本發明之清潔劑組合物之清潔時之成分B之含量較佳為0.00005質量%以上,更佳為0.0001質量%以上,進而較佳為0.001質量%以上,而且,就相同之觀點而言,較佳為2.0質量%以下,更佳為0.3質量%以下,進而較佳為0.1質量%以下,進而更佳為0.07質量%以下,進而更佳為0.05質量%以下。進而,就相同之觀點而言,清潔劑組合物之清潔時之成分B之含量較佳為0.00005質量%以上且2.0質量%以下,更佳為0.00005質量%以上且0.3質量%以下,進而較佳為0.00005質量%以上且0.1質量%以下,進而更佳為0.0001質量%以上且0.07質量%以下,進而更佳為0.001質量%以上且0.05質量%以下。 就提高清潔性之觀點而言,本發明之清潔劑組合物中之成分A之含量相對於成分B之含量的比A/B較佳為0.01以上,更佳為0.1以上,進而較佳為0.3以上,而且,就相同之觀點而言,較佳為20000以下,更佳為1000以下,進而較佳為100以下。就提高清潔性之觀點而言,清潔劑組合物中之含量之比A/B較佳為0.01以上且20000以下,更佳為0.1以上且1000以下,進而較佳為0.3以上且100以下。 [成分C:水] 本發明之清潔劑組合物亦可進而含有水(成分C)。上述水只要為能夠發揮作為溶劑之作用者,則無特別限制,例如可列舉:超純水、純水、離子交換水、或蒸餾水等,較佳為超純水、純水、或離子交換水,更佳為超純水。純水及超純水例如可藉由如下方式獲得:將自來水通過活性碳進行離子交換處理,進而進行蒸餾,對於所獲得者視需要利用特定之紫外線殺菌燈進行照射或使其通過過濾器。 就清潔性之提高及清潔劑組合物之穩定化之觀點而言,本發明之清潔劑組合物之清潔時之成分C之含量較佳為90質量%以上,更佳為95質量%以上,進而較佳為99質量%以上,而且,就相同之觀點而言,較佳為99.99質量%以下,更佳為99.98質量%以下,進而較佳為99.97質量%以下。 [任意成分] 本發明之清潔劑組合物除上述成分A~C以外,亦可含有螯合劑、陰離子聚合物、非離子性界面活性劑、助溶劑、抗氧化劑、防腐劑、消泡劑、抗菌劑等任意成分。任意成分較佳為於無損本發明之效果之範圍內含有於清潔劑組合物中,清潔劑組合物之清潔時之任意成分之含量較佳為0質量%以上且2.0質量%以下,更佳為0質量%以上且1.5質量%以下,進而較佳為0質量%以上且1.3質量%以下,進而更佳為0質量%以上且1.0質量%以下。 (螯合劑) 就提高清潔性之觀點而言,本發明之清潔劑組合物亦可含有螯合劑。作為螯合劑,例如可列舉:選自由葡萄糖酸、葡庚糖酸等醛糖酸類;乙二胺四乙酸、二乙三胺五乙酸等胺基羧酸類;檸檬酸、蘋果酸等羥基羧酸類;1-羥基亞乙基-1,1-二膦酸等膦酸類;及該等之鹽所組成之群中之至少1種。 (陰離子聚合物) 就提高清潔性之觀點而言,本發明之清潔劑組合物亦可含有羧酸系聚合物等陰離子聚合物。作為羧酸系聚合物,例如可列舉:丙烯酸聚合物、甲基丙烯酸聚合物、順丁烯二酸聚合物、丙烯酸/甲基丙烯酸之共聚物、丙烯酸/順丁烯二酸之共聚物、甲基丙烯酸/丙烯酸甲酯之共聚物等結構單元中包含甲基丙烯酸或丙烯酸之陰離子聚合物。 (非離子性界面活性劑) 就提高清潔性之觀點而言,本發明之清潔劑組合物亦可含有非離子性界面活性劑。作為非離子性界面活性劑,例如可列舉聚伸烷基二醇烷基醚等。 (助溶劑) 就提高保存穩定性之觀點而言,本發明之清潔劑組合物亦可含有助溶劑。作為助溶劑,例如可列舉:選自對甲苯磺酸、二甲基苯磺酸、2-乙基己酸、及該等之鹽中之至少1種。 本發明之清潔劑組合物除上述水以外,亦可進而含有水系溶劑(例如乙醇等醇)作為溶劑,本發明之清潔劑組合物中所含之溶劑較佳為僅包含水。 [清潔劑組合物之pH值] 本發明之清潔劑組合物之清潔時之pH值為8以上,就清潔性之觀點而言,較佳為9以上,更佳為9.5以上,進而較佳為10以上,進而更佳為10.5以上,而且,就相同之觀點而言,較佳為14以下,更佳為13以下,進而較佳為12.5以下,進而更佳為12以下,進而更佳為11.5以下。例如,就提高清潔性之觀點而言,可使用酸或成分B之鹼劑進行本發明之清潔劑組合物之pH值之調整。作為酸,例如可列舉:硝酸、硫酸、鹽酸等無機酸;羥基羧酸、胺基酸等有機酸等。於本發明中,所謂「清潔時之pH值」係指於25℃下使用清潔劑組合物時(稀釋後)之pH值,可利用pH值計進行測定,較佳為將pH值計之電極於清潔劑組合物中浸漬3分鐘後之數值。 [清潔劑組合物之製造方法] 本發明之清潔劑組合物可藉由如下方式製造:藉由公知之方法將成分A、以及視需要之成分B、成分C及任意成分加以調配。例如,本發明之清潔劑組合物可製成至少調配成分A而成者。因此,本發明係關於一種包含至少調配成分A之步驟的清潔劑組合物之製造方法。於本發明中,「調配」包括如下情形:同時或按照任意之順序混合成分A、以及視需要之成分B、成分C及任意成分。於本發明之清潔劑組合物之製造方法中,各成分之調配量可設為與上述本發明之清潔劑組合物之各成分的含量相同。 就儲存及運輸之觀點而言,本發明之清潔劑組合物亦可製成濃縮物,於使用時進行稀釋。就儲存及運輸之觀點而言,清潔劑組合物之濃縮物較佳為製成稀釋倍率為3倍以上之濃縮物,就保管穩定性之觀點而言,較佳為製成稀釋倍率為200倍以下之濃縮物。清潔劑組合物之濃縮物可於使用時,以各成分之含量成為上述含量(即,清潔時之含量)之方式利用水加以稀釋而使用。進而,清潔劑組合物之濃縮物亦可於使用時,分別添加各成分而使用。於本發明中,所謂清潔劑組合物之濃縮物之「使用時」或「清潔時」係指清潔劑組合物之濃縮物經稀釋之狀態。 就提高稀釋後之清潔性之觀點而言,本發明之清潔劑組合物之濃縮物之pH值較佳為8以上,更佳為9.0以上,進而較佳為9.5以上,進而更佳為10.0以上,而且,就相同之觀點而言,較佳為14.0以下,更佳為13.0以下,進而較佳為12.0以下。本發明之清潔劑組合物之濃縮物之pH值可藉由與上述本發明之清潔劑組合物之pH值相同之方法進行測定。 [被清潔基板] 於一個或複數個實施形態中,本發明之清潔劑組合物可用於清潔利用研磨液組合物進行研磨後之基板、或殘留或附著有顆粒之基板。 作為被清潔基板,例如可列舉:經Ni-P鍍覆之鋁合金基板、玻璃基板等。作為玻璃基板,可為結晶化玻璃基板,亦可為非結晶化玻璃基板。 於一個或複數個實施形態中,作為殘留或附著於被清潔基板之顆粒,可列舉:源自氧化鎳、氧化矽等之研磨屑之顆粒;源自氧化矽、氧化鋁、氧化鈰等之研磨粒之顆粒等。 於一個或複數個實施形態中,就清潔效果之方面而言,本發明之清潔劑組合物可適宜地用於清潔附著有源自氧化鎳、氧化矽等之研磨屑之顆粒、較佳為源自氧化鎳之研磨屑之顆粒的基板。進而,於一個或複數個實施形態中,就清潔效果之方面而言,本發明之清潔劑組合物可較佳地用於清潔經Ni-P鍍覆之鋁合金基板、較佳為利用研磨液組合物進行研磨後之經Ni-P鍍覆之鋁合金基板、更佳為利用含有氧化矽研磨粒之研磨液組合物進行研磨後之經Ni-P鍍覆之鋁合金基板。 [基板之清潔方法] 於一態樣中,本發明係關於一種基板之清潔方法(以下,亦稱為「本發明之清潔方法」),其包括使用本發明之清潔劑組合物對被清潔基板進行清潔之清潔步驟,上述被清潔基板為利用研磨液組合物進行研磨後之基板。本發明之清潔方法可進而包括將上述本發明之清潔劑組合物之濃縮物加以稀釋之稀釋步驟。作為被清潔基板,可使用上述基板。於一個或複數個實施形態中,上述清潔步驟可包括使本發明之清潔劑組合物與被清潔基板接觸之步驟。於一個或複數個實施形態中,上述清潔步驟可包括進行浸漬清潔及/或洗刷清潔。根據本發明之清潔方法,可高效率地去除附著於基板表面之顆粒、較佳為源自氧化鎳、氧化矽等之研磨屑之顆粒、更佳為源自氧化鎳之研磨屑之顆粒。 (浸漬清潔) 作為被清潔基板於清潔劑組合物中之浸漬條件,並無特別限制。例如,就作業性及操作性之觀點而言,清潔劑組合物之溫度較佳為20~100℃。例如,就提高清潔劑組合物之清潔性之觀點而言,浸漬時間較佳為5秒以上,更佳為10秒以上,進而較佳為100秒以上,而且,就提高經清潔之基板之生產效率之觀點而言,浸漬時間較佳為30分鐘以下,更佳為10分鐘以下,進而較佳為5分鐘以下。就提高殘留物之去除性及殘留物之分散性之觀點而言,較佳為對清潔劑組合物賦予超音波振動。作為超音波之頻率,例如較佳為20~2000 kHz,更佳為40~2000 kHz,進而較佳為40~1500 kHz。 (洗刷清潔) 作為洗刷清潔之方法,就促進研磨粒子等殘留物之清潔性或油分之溶解性之觀點而言,較佳為藉由如下方式進行清潔:射出正被施加超音波振動之清潔劑組合物而使清潔劑組合物與被清潔基板之表面接觸來清潔該表面;或藉由射出而於被清潔基板之表面上供給清潔劑組合物,並利用清潔用刷擦洗供給有清潔劑組合物之該表面。進而,就相同之觀點而言,洗刷清潔之方法較佳為藉由如下方式進行清潔:藉由射出而將正被施加超音波振動之清潔劑組合物供於清潔對象之表面,並利用清潔用刷擦洗供給有清潔劑組合物之該表面。 作為將清潔劑組合物供於被清潔基板之表面上之方法,例如可使用噴霧嘴等機構。作為清潔用刷,並無特別限制,例如可使用尼龍刷或PVA(聚乙烯醇)海棉刷等。作為超音波之頻率,例如可設為與上述浸漬清潔中較佳地採用之值相同。 本發明之清潔方法除上述浸漬清潔及/或上述洗刷清潔以外,亦可包含1個以上使用擺動清潔、利用旋轉器等之旋轉之清潔、覆液清潔等公知清潔的步驟。 本發明之清潔方法可逐個清潔被清潔基板,亦可一次彙集複數片欲清潔之被清潔基板而進行清潔。清潔時使用之清潔槽之數量可為1個,亦可為複數個。 [硬碟用基板之製造方法] 於一態樣中,本發明係關於一種硬碟用基板之製造方法(以下,亦稱為「本發明之製造方法」),其包括使用本發明之清潔劑組合物對被清潔基板進行清潔之步驟。作為被清潔基板,可使用上述基板。 一般而言,可藉由使成為硬碟用基板之基礎之基材經過形狀加工步驟、粗研削步驟、精研削步驟、粗研磨步驟、精研磨步驟等而製造硬碟用基板。而且,有於上述各步驟之間包括清潔步驟之情形。硬碟用基板例如可藉由在最終之清潔步驟後經過記錄部形成步驟而成為磁硬碟。 記錄部形成步驟例如可藉由如下方式進行:藉由濺鍍等方法將具有磁記錄區域且包含金屬薄膜之磁性層形成於硬碟用基板上。作為構成上述金屬薄膜之金屬材料,例如可列舉:鉻、鉭、鉑等與鈷之合金、鐵與鉑等之合金等。磁性層可形成於硬碟用基板之兩主表面側,亦可僅形成於一主表面側。 上述粗研磨步驟與上述精研磨步驟例如依該順序進行。作為進行粗研磨步驟時使用之研磨劑組合物中所含之無機微粒子,例如基於能夠實現高速研磨之理由,較佳為氧化鈰粒子或氧化鋁粒子。基於提高表面之平滑性(表面粗糙度)之理由,進行精研磨步驟時使用之研磨劑組合物中所含之無機微粒子較佳為氧化矽粒子。 於一個或複數個實施形態中,可於粗研磨步驟後,依序進行使用清潔劑組合物之清潔步驟(第1清潔步驟)、沖洗步驟(第1沖洗步驟)、乾燥步驟(第1乾燥步驟)、精研磨步驟、使用清潔劑組合物之清潔步驟(第2清潔步驟)、沖洗步驟(第2沖洗步驟)、及乾燥步驟(第2乾燥步驟)。本發明之清潔方法可應用於上述第1清潔步驟及/或上述第2清潔步驟。就提高清潔性之觀點而言,本發明之清潔方法較佳為於第2清潔步驟中使用。 因此,於一態樣中,本發明係關於一種包括以下之步驟(1)及步驟(2)的硬碟用基板之製造方法。 (1)使用研磨液組合物對被研磨基板進行研磨之研磨步驟。 (2)使用本發明之清潔劑組合物對在步驟(1)中獲得之基板(被清潔基板)進行清潔之清潔步驟。 上述步驟(1)之被研磨基板通常為經過精研削步驟後之基板,較佳為經過粗研磨步驟後之基板。關於被研磨基板,可使用與上述被清潔基板相同之基板。步驟(1)可藉由如下等方式進行:於被研磨基板之研磨對象面供給研磨液組合物,使研磨墊與上述研磨對象面接觸,一面施加特定之壓力(負重),一面移動研磨墊或被研磨基板。就提高最終之基板之品質之觀點而言,步驟(1)較佳為使用有包含氧化矽粒子之研磨液組合物之精研磨步驟。於精研磨步驟中,較佳為反覆使用研磨液組合物。 上述步驟(2)之清潔步驟可與上述本發明之清潔方法同樣地進行。 [套組] 於一態樣中,本發明係關於一種套組(以下,亦稱為「本發明之套組」),其係用以製造清潔劑組合物者,並且包含將包含成分A之溶液收容於容器的容器裝之成分A溶液。本發明之套組可進而包含收納於與上述容器裝之成分A溶液不同之容器的選自成分B、成分C及任意成分中之至少1種。例如,作為本發明之套組,可列舉:以不相互混合之狀態保管包含成分A之溶液(第一液體)、與包含成分B之溶液(第二液體),於使用時將該等溶液進行混合之套組(2液型清潔劑組合物)。第一液體及第二液體中視需要亦可分別混合上述成分C及任意成分。於第一液體與第二液體之混合時,例如可藉由調整第二液體之使用量而調整清潔劑組合物中之各成分之濃度。 根據本發明,可提供可獲得殘留於基板表面之顆粒之清潔性優異的硬碟用基板用之清潔劑組合物之套組。 [硬碟記錄裝置] 於一態樣中,本發明係關於一種硬碟記錄裝置(以下,亦稱為「本發明之硬碟記錄裝置」),其使用利用本發明之清潔劑組合物進行清潔之硬碟用基板。藉由使用利用本發明之清潔劑組合物進行清潔之硬碟用基板,可提供高記錄密度之硬碟記錄裝置。 進而,本發明係關於以下之一個或複數個實施形態。 <1>一種硬碟用基板用之清潔劑組合物,其含有聚合物(成分A),該聚合物包含源自下述通式(I)所表示之單體a1或其酐之結構單元(a1)、以及源自選自下述通式(II)所表示之單體及下述通式(III)所表示之單體中之至少1種單體a2的結構單元(a2), 成分A之重量平均分子量為15000以上且200000以下, pH值為8以上。 [化7][式(I)中,R1 、R2 及R3 分別獨立地表示氫原子、甲基或-(CH2 )p COOM2 ,M1 及M2 分別獨立地表示氫原子、鹼金屬、鹼土金屬(1/2原子)、有機銨基、或銨基,p表示0以上且2以下之整數] [化8][式(II)中,R4 及R5 分別獨立地表示氫原子或甲基,q表示0以上且2以下之整數,AO表示碳數為2或3之伸烷基氧基,n為AO之平均加成莫耳數,表示4以上且300以下之數,X表示氫原子或碳數為1以上且3以下之烷基] [化9][式(III)中,R6 及R7 分別獨立地表示氫原子或甲基,r表示0以上且2以下之整數,AO表示碳數為2或3之伸烷基氧基,m為AO之平均加成莫耳數,表示4以上且300以下之數,Y表示氫原子或碳數為1以上且3以下之烷基] <2>如<1>所記載之清潔劑組合物,其中式(I)中,R1 、R2 及R3 為選自氫原子、甲基及-(CH2 )p COOM2 中之至少1種,較佳為R1 及R3 為氫原子,R2 為氫原子或甲基,更佳為R1 及R3 為氫原子,R2 為甲基。 <3>如<1>或<2>所記載之清潔劑組合物,其中式(I)中,M1 及M2 為選自氫原子、鹼金屬、鹼土金屬(1/2原子)、有機銨基及銨基中之至少1種,較佳為鹼金屬,更佳為鈉及鉀。 <4>如<1>至<3>中任一項所記載之清潔劑組合物,其中式(I)中,p為0以上且2以下之整數,較佳為0或1,更佳為0。 <5>如<1>至<4>中任一項所記載之清潔劑組合物,其中式(II)中,n為4以上,較佳為6以上,更佳為9以上,進而較佳為20以上,進而更佳為40以上,進而更佳為80以上。 <6>如<1>至<5>中任一項所記載之清潔劑組合物,其中式(II)中,n為300以下,較佳為200以下,更佳為150以下,進而較佳為130以下。 <7>如<1>至<6>中任一項所記載之清潔劑組合物,其中式(II)中,X為氫原子或碳數為1以上且3以下之烷基,較佳為碳數為1以上且3以下之烷基。 <8>如<1>至<7>中任一項所記載之清潔劑組合物,其中成分A之全部結構單元中之結構單元(a1)相對於結構單元(a2)之莫耳比a1/a2較佳為0.1以上,更佳為0.5以上,進而較佳為1以上,進而更佳為2以上。 <9>如<1>至<8>中任一項所記載之清潔劑組合物,其中成分A之全部結構單元中之結構單元(a1)相對於結構單元(a2)之莫耳比a1/a2較佳為100以下,更佳為50以下,進而較佳為30以下,進而更佳為20以下。 <10>如<1>至<9>中任一項所記載之清潔劑組合物,其中成分A之全部結構單元中之結構單元(a1)相對於結構單元(a2)之莫耳比a1/a2較佳為0.1以上且100以下,更佳為0.5以上且50以下,進而較佳為1以上且30以下,進而更佳為2以上且20以下。 <11>如<1>至<10>中任一項所記載之清潔劑組合物,其中成分A之重量平均分子量為15000以上,較佳為20000以上,更佳為25000以上,進而較佳為30000以上,進而更佳為50000以上。 <12>如<1>至<11>中任一項所記載之清潔劑組合物,其中成分A之重量平均分子量為200000以下,較佳為150000以下,更佳為100000以下,進而較佳為80000以下。 <13>如<1>至<12>中任一項所記載之清潔劑組合物,其中成分A之重量平均分子量為15000以上且200000以下,較佳為20000以上且150000以下,更佳為20000以上且100000以下,進而較佳為20000以上且80000以下,進而更佳為25000以上且80000以下。 <14>如<1>至<13>中任一項所記載之清潔劑組合物,其中清潔劑組合物中之成分A相對於水以外之成分之合計質量的含量較佳為1質量%以上,更佳為10質量%以上,進而較佳為15質量%以上,進而更佳為20質量%以上。 <15>如<1>至<14>中任一項所記載之清潔劑組合物,其中清潔劑組合物中之成分A相對於水以外之成分之合計質量的含量較佳為99.9質量%以下,更佳為99質量%以下,進而較佳為98質量%以下。 <16>如<1>至<15>中任一項所記載之清潔劑組合物,其中清潔劑組合物中之成分A相對於水以外之成分之合計質量的含量較佳為1質量%以上且99.9質量%以下,更佳為10質量%以上且99.9質量%以下,進而較佳為15質量%以上且99質量%以下,進而更佳為20質量%以上且98質量%以下。 <17>如<1>至<16>中任一項所記載之清潔劑組合物,其中清潔劑組合物之清潔時之成分A之含量較佳為0.001質量%以上,更佳為0.005質量%以上,進而較佳為0.01質量%以上。 <18>如<1>至<17>中任一項所記載之清潔劑組合物,其中清潔劑組合物之清潔時之成分A之含量較佳為10質量%以下,更佳為5質量%以下,進而較佳為2質量%以下,進而更佳為1質量%以下,進而更佳為0.5質量%以下,進而更佳為0.2質量%以下。 <19>如<1>至<18>中任一項所記載之清潔劑組合物,其中清潔劑組合物中之清潔時之成分A之含量較佳為0.001質量%以上且10質量%以下,更佳為0.005質量%以上且5質量%以下,進而較佳為0.01質量%以上且2質量%以下,進而更佳為0.01質量%以上且1質量%以下,進而更佳為0.01質量%以上且0.5質量%以下,進而更佳為0.01質量%以上且0.2質量%以下。 <20>如<1>至<19>中任一項所記載之清潔劑組合物,其進而含有鹼劑(成分B)。 <21>如<20>所記載之清潔劑組合物,其中成分B較佳為選自鹼金屬氫氧化物、羥基烷基胺及四級銨鹽中之至少1種,更佳為鹼金屬氫氧化物,進而較佳為氫氧化鉀及氫氧化鈉中之至少1種。 <22>如<20>或<21>中任一項所記載之清潔劑組合物,其中清潔劑組合物中之成分B相對於水以外之成分之合計質量的含量較佳為0.1質量%以上,更佳為0.3質量%以上,進而較佳為0.5質量%以上。 <23>如<20>至<22>中任一項所記載之清潔劑組合物,其中清潔劑組合物中之成分B相對於水以外之成分之合計質量的含量較佳為99質量%以下,更佳為90質量%以下,進而較佳為80質量%以下,進而更佳為75質量%以下。 <24>如<20>至<23>中任一項所記載之清潔劑組合物,其中清潔劑組合物中之成分B相對於水以外之成分之合計質量的含量較佳為0.1質量%以上且90質量%以下,更佳為0.3質量%以上且80質量%以下,進而較佳為0.5質量%以上且75質量%以下。 <25>如<20>至<24>中任一項所記載之清潔劑組合物,其中清潔劑組合物之清潔時之成分B之含量較佳為0.00005質量%以上,更佳為0.0001質量%以上,進而較佳為0.001質量%以上。 <26>如<20>至<25>中任一項所記載之清潔劑組合物,其中清潔劑組合物之清潔時之成分B之含量較佳為2.0質量%以下,更佳為0.3質量%以下,進而較佳為0.1質量%以下,進而更佳為0.07質量%以下,進而更佳為0.05質量%以下。 <27>如<20>至<26>中任一項所記載之清潔劑組合物,其中清潔劑組合物之清潔時之成分B之含量較佳為0.00005質量%以上且2.0質量%以下,更佳為0.00005質量%以上且0.3質量%以下,進而較佳為0.00005質量%以上且0.1質量%以下,進而更佳為0.0001質量%以上且0.07質量%以下,進而更佳為0.001質量%以上且0.05質量%以下。 <28>如<20>至<27>中任一項所記載之清潔劑組合物,其中清潔劑組合物中之成分A之含量相對於成分B之含量的比A/B較佳為0.01以上,更佳為0.1以上,進而較佳為0.3以上。 <29>如<20>至<28>中任一項所記載之清潔劑組合物,其中清潔劑組合物中之成分A之含量相對於成分B之含量的比A/B較佳為20000以下,更佳為1000以下,進而較佳為100以下。 <30>如<20>至<29>中任一項所記載之清潔劑組合物,其中清潔劑組合物中之成分A之含量相對於成分B之含量的比A/B較佳為0.01以上且20000以下,更佳為0.1以上且1000以下,進而較佳為0.3以上且100以下。 <31>如<1>至<30>中任一項所記載之清潔劑組合物,其進而含有水(成分C)。 <32>如<31>所記載之清潔劑組合物,其中清潔劑組合物之清潔時之成分C之含量較佳為90質量%以上,更佳為95質量%以上,進而較佳為99質量%以上。 <33>如<31>或<32>所記載之清潔劑組合物,其中清潔劑組合物之清潔時之成分C之含量較佳為99.99質量%以下,更佳為99.98質量%以下,進而較佳為99.97質量%以下。 <34>如<1>至<33>中任一項所記載之清潔劑組合物,其進而含有選自螯合劑、陰離子聚合物、非離子性界面活性劑、助溶劑、抗氧化劑、防腐劑、消泡劑及抗菌劑中之至少1種任意成分。 <35>如<34>所記載之清潔劑組合物,其中清潔劑組合物之清潔時之任意成分之含量較佳為0質量%以上且2.0質量%以下,更佳為0質量%以上且1.5質量%以下,進而較佳為0質量%以上且1.3質量%以下,進而更佳為0質量%以上且1.0質量%以下。 <36>如<1>至<35>中任一項所記載之清潔劑組合物,其中清潔時之pH值為8以上,較佳為9以上,更佳為9.5以上,進而較佳為10以上,進而更佳為10.5以上。 <37>如<1>至<36>中任一項所記載之清潔劑組合物,其中清潔時之pH值較佳為14以下,更佳為13以下,進而較佳為12.5以下,進而更佳為12以下,進而更佳為11.5以下。 <38>一種如<1>至<37>中任一項所記載之清潔劑組合物之用途,其係用於清潔利用研磨液組合物進行研磨後之基板、或殘留或附著有顆粒之基板。 <39>一種基板之清潔方法,其包括使用如<1>至<37>中任一項所記載之清潔劑組合物對被清潔基板進行清潔之清潔步驟,上述被清潔基板為利用研磨液組合物進行研磨後之基板。 <40>如<39>所記載之清潔方法,其中上述基板為經Ni-P鍍覆之鋁合金基板。 <41>如<39>或<40>所記載之清潔方法,其中上述研磨液組合物為含有氧化矽研磨粒之研磨液組合物。 <42>一種硬碟用基板之製造方法,其包括使用如<1>至<37>中任一項所記載之清潔劑組合物對被清潔基板進行清潔之清潔步驟,上述被清潔基板為利用研磨液組合物進行研磨後之基板。 <43>一種套組,其係用以製造如<1>至<37>中任一項所記載之清潔劑組合物者,其包括將包含成分A之溶液收容於容器中的容器裝之成分A溶液。 <44>一種硬碟記錄裝置,其使用利用如<1>至<37>中任一項所記載之清潔劑組合物進行清潔之硬碟用基板。 <45>一種如<1>至<37>中任一項所記載之清潔劑組合物之用途,其係用於清潔硬碟用基板。 [實施例] 以下,藉由實施例具體地說明本發明,但本發明不受該等實施例之任何限定。 1.聚合物(成分A)之製備 於製備表1所示之聚合物A1~A16時,使用下述原料。 <單體a1> (1)MAA:甲基丙烯酸(東京化成工業股份有限公司製造) (2)AA:丙烯酸(和工純藥工業股份有限公司製造) (3)MA:順丁烯二酸酐(三菱化學股份有限公司製造) <單體a2> (1)單體a2-1 將於80℃下熔融之環氧乙烷加成莫耳數為120之聚乙二醇單甲醚(重量平均分子量為5344)1000質量份裝入至具備溫度計、攪拌機、滴液漏斗、氮氣導入管及冷卻冷凝器之玻璃製反應容器。其次,投入對苯二酚3質量份、對甲苯磺酸32質量份。此處,以相對於聚乙二醇單甲醚與甲基丙烯酸之合計質量1 kg成為6 ml/min之流量將空氣導入至反應液中,進而一面以12 ml/min之流量向反應容器之氣相部導入氮氣,一面投入甲基丙烯酸483質量份(相對於聚乙二醇單甲醚而為30莫耳倍之量),而開始加熱及反應容器內之減壓。壓力係控制為26.7 kPa,將反應液溫度到達105℃之時間點設為反應開始時刻,一面繼續進行加熱將反應液溫度保持為110℃而使反應水與甲基丙烯酸餾液,一面進行反應。壓力係於反應開始1小時後減壓至12~13.3 kPa,其後保持該狀態。於自反應開始6小時後,將壓力恢復至常壓,向對甲苯磺酸添加1.05倍當量之48%氫氧化鈉水溶液進行中和而結束反應。其後,將反應液溫度保持為130℃以下,藉由真空蒸餾法回收未反應之甲基丙烯酸而獲得酯化反應物。於冷卻至100℃後,向該反應物添加飽和食鹽水200質量份、甲苯1000質量份,並調整為50℃。於反覆進行5次經分層之下層之萃取、飽和食鹽水200質量份之追加、分層後,蒸餾去除甲苯而獲得精製之單體a2-1之甲氧基聚乙二醇甲基丙烯酸酯(EO平均加成莫耳數為120)。 (2)單體a2-2 甲氧基聚乙二醇甲基丙烯酸酯(EO平均加成莫耳數為23)、M-230G(新中村化學工業股份有限公司製造) (3)單體a2-3 甲氧基聚乙二醇甲基丙烯酸酯(EO平均加成莫耳數為9)、M-90G(新中村化學工業股份有限公司製造) (4)單體a2-4 將聚乙二醇單甲醚之環氧乙烷加成莫耳數變為41(重量平均分子量為1838)、將甲基丙烯酸投入量變為1405質量份,除此以外,與上述單體a2-1同樣地製造而獲得精製之單體a2-4之甲氧基聚乙二醇甲基丙烯酸酯(EO平均加成莫耳數為41)。 (5)EG:乙二醇 (6)單體a2-5 甲氧基聚乙二醇烯丙基醚(平均分子量為1500,EO平均加成莫耳數為32)、Uniox PKA-5010(日油股份有限公司製造) (7)單體a2-6 聚乙二醇3-甲基-3-丁烯基醚(EO平均加成莫耳數為50) (8)單體a2-7 聚乙二醇烯丙基醚(EO平均加成莫耳數為25) (9)單體a2-8 聚乙二醇丙烯酸酯(EO平均加成莫耳數為5) <聚合鏈轉移劑> ・2-巰基乙醇(東京化成工業股份有限公司製造) ・β-巰基丙酸(東京化成工業股份有限公司製造) <聚合鏈轉移劑兼溶劑> ・1,2-丙二醇(和光純藥工業股份有限公司製造) <聚合起始劑> ・過氧二硫酸銨(過硫酸銨)(Nacalai Tesque股份有限公司製造) ・過氧化氫水(30~35.5質量%之水溶液,Nacalai Tesque股份有限公司製造) ・過氧二硫酸鈉(Nacalai Tesque股份有限公司製造) <中和劑> ・氫氧化鈉(48質量%之NaOH,旭硝子股份有限公司製造) [聚合物A1之製造例] 於附有攪拌機之反應容器中裝入水:282 g(15.7莫耳),一面進行攪拌,一面進行氮氣置換,於氮氣環境中升溫至75℃。以2小時將混合溶解MAA:20.7 g(0.24莫耳)、單體a2-1:323 g(0.06莫耳)(質量比=6/94,莫耳比=80/20)及水:239 g(13.3莫耳)所獲得者、10質量%之過硫酸銨水溶液:34.7 g、以及2-巰基乙醇:1.8 g分別同時滴加至反應系中。其次,以30分鐘滴加10質量%之過硫酸銨水溶液:13.9 g,於相同之溫度(75℃)下熟化1小時。於熟化結束後,添加48質量%之NaOH水溶液23.9 g進行中和而獲得聚合物A1(37質量%之水溶液)。 [聚合物A2之製造例] 於附有攪拌機之反應容器中裝入水:367 g(20.4莫耳),一面進行攪拌,一面進行氮氣置換,於氮氣環境中升溫至80℃。以2小時將混合溶解MAA:62.9 g(0.73莫耳)、單體a2-2:300 g(0.27莫耳)(質量比=17.3/82.7,莫耳比=73/27)及水:173 g(9.6莫耳)所獲得者、10質量%之過硫酸銨水溶液:34.1 g、以及2-巰基乙醇:2.9 g分別同時滴加至反應系中。其次,以30分鐘滴加10質量%之過硫酸銨水溶液:11.4 g,於相同之溫度(75℃)下熟化1小時。於熟化結束後,添加48質量%之NaOH水溶液61 g進行中和而獲得聚合物A2(36質量%之水溶液)。 [聚合物A3之製造例] 於附有攪拌機之反應容器中裝入水:317 g(17.6莫耳),一面進行攪拌,一面進行氮氣置換,於氮氣環境中升溫至75℃。以2小時將混合溶解MAA:46.5 g(0.54莫耳)、單體a2-1 323 g(0.06莫耳)(質量比=12.6/87.4,莫耳比=90/10)及水:239 g(13.3莫耳)所獲得者、10質量%之過硫酸銨水溶液:41.7 g、以及2-巰基乙醇:1.9 g分別同時滴加至反應系中。其次,以30分鐘滴加10質量%之過硫酸銨水溶液:13.9 g,於相同之溫度(75℃)下熟化1小時。於熟化結束後,添加48質量%之NaOH水溶液49.3 g進行中和而獲得聚合物A3(36質量%之水溶液)。 [聚合物A4之製造例] 於附有攪拌機之反應容器中裝入水:275 g(15.3莫耳),一面進行攪拌,一面進行氮氣置換,於氮氣環境中升溫至75℃。以2小時將混合溶解MAA:9.5 g(0.11莫耳)、單體a2-1:323 g(0.06莫耳)(質量比=2.9/97.1,莫耳比a1/a2=65/35)及水:239 g(13.3莫耳)所獲得者、10質量%之過硫酸銨水溶液:3.8 g、以及2-巰基乙醇1.2 g分別同時滴加至反應系中。其次,以30分鐘滴加10質量%之過硫酸銨水溶液:11.9 g,於相同之溫度(75℃)下熟化1小時。於熟化結束後,添加48質量%之NaOH水溶液13.1 g進行中和而獲得聚合物A4(38質量%水溶液)。 [聚合物A5之製造例] 於附有攪拌機之反應容器中裝入水:449 g(24.9)莫耳,一面進行攪拌,一面進行氮氣置換,於氮氣環境中升溫至80℃。以2小時將混合溶解MAA:55.9 g(0.65莫耳)、單體a2-2:390 g(0.35莫耳)(質量比=12.5/87.5,莫耳比=65/35)及水:220 g(12.2莫耳)所獲得者、10質量%之過硫酸銨水溶液:31.0 g、以及2-巰基乙醇:4.2 g分別同時滴加至反應系中。其次,以30分鐘滴加10質量%之過硫酸銨水溶液:10.5 g,於相同之溫度(75℃)下熟化1小時。於熟化結束後,添加48質量%之NaOH水溶液54.2 g進行中和而獲得聚合物A5(37質量%水溶液)。 [聚合物A6之製造例] 於附有攪拌機之反應容器中裝入水:292 g(16.2莫耳),一面進行攪拌,一面進行氮氣置換,於氮氣環境中升溫至75℃。以2小時將混合溶解MAA:102 g(1.19莫耳)、單體a2-1:339 g(0.063莫耳)(質量比=23.1/76.9,莫耳比=95/5)及水:252 g(14.0莫耳)所獲得者、10質量%之過硫酸銨水溶液:71.5 g、以及2-巰基乙醇:10.3 g分別同時滴加至反應系中。其次,以30分鐘滴加10質量%之過硫酸銨水溶液:57.2 g,於相同之溫度(75℃)下熟化1小時。於熟化結束後,添加48質量%之NaOH水溶液103.3 g進行中和而獲得聚合物A6(36質量%水溶液)。 [聚合物A7之製造例] 於附有攪拌機之反應容器中裝入水:303 g(16.8莫耳),一面進行攪拌,一面進行氮氣置換,於氮氣環境中升溫至75℃。以2小時將混合溶解MAA:40.4 g(0.47莫耳)、單體a2-3:257 g(0.53莫耳)(質量比=13.3/86.7,莫耳比=47/53)及水:152 g(8.42莫耳)所獲得者、10質量%之過硫酸銨水溶液:15.5 g、以及2-巰基乙醇:2.1 g分別同時滴加至反應系中。其次,以30分鐘滴加10質量%之過硫酸銨水溶液:5.2 g,於相同之溫度(75℃)下熟化1小時。於熟化結束後,添加48質量%之NaOH水溶液39.2 g進行中和而獲得聚合物A7(37質量%水溶液)。 [聚合物A8之製造例] 於附有攪拌機之反應容器中裝入水:22.6 g(1.26莫耳),一面進行攪拌,一面進行氮氣置換,於氮氣環境中升溫至85℃。以1.5小時將混合溶解AA:8.7 g(0.12莫耳)、單體a2-4:89.6 g(0.047莫耳)(質量比=8.8/91.2,莫耳比=72/28)及水:92.3 g(5.13莫耳)所獲得者、5質量%之過硫酸銨水溶液:15.0 g、以及6質量%之β-巰基丙酸水溶液:15.0 g分別同時滴加至反應系中。其次,以5分鐘滴加22質量%之過硫酸銨水溶液:5.0 g,於相同之溫度(85℃)下熟化0.5小時。於熟化結束後,添加48質量%之NaOH水溶液10.1 g進行中和而獲得聚合物A8(38質量%水溶液)。 [聚合物A9] ・聚丙烯酸鈉「Aron A-210」(43質量%之水溶液,重量平均分子量為3000,東亞合成股份有限公司製造) [聚合物A10] ・聚丙烯酸鈉(35質量%之水溶液,重量平均分子量為60000,Polysciences, Inc.製造) [聚合物A11] ・聚乙二醇甲醚(數量平均分子量為5000,Sigmα-Aldrich公司製造) [聚合物A12] ・十二烷基苯磺酸鈉「Neopelex G-25」(25質量%之水溶液,花王股份有限公司製造) [聚合物A13之製造例] 於附有攪拌機之反應容器中裝入水:90.5 g(5.0莫耳),一面進行攪拌,一面進行氮氣置換,於氮氣環境中升溫至75℃。以2小時將混合溶解MA:63.7 g(0.65莫耳)、單體a2-5:525 g(0.35莫耳)(質量比=11/89,莫耳比=65/35)及水:161 g(8.9莫耳)所獲得者、10質量%之過硫酸銨水溶液:37.0 g分別同時滴加至反應系中。其次,以30分鐘滴加10質量%之過硫酸銨水溶液:14.8 g,於相同之溫度(75℃)下熟化3小時。於熟化結束後,添加48質量%之NaOH水溶液108 g進行中和而獲得聚合物A13(60質量%之水溶液)。 [聚合物A14之製造例] 於附有攪拌機之反應容器中裝入水:234 g(13.0莫耳)、單體a2-6:546 g(0.24莫耳),一面進行攪拌,一面進行氮氣置換,於氮氣環境中升溫至65℃,滴加過氧化氫水8.6 g。其次,以2小時將混合溶解AA:54.4 g(0.76莫耳)及水:45.6 g(2.5莫耳)所獲得者、以及混合溶解β-巰基丙酸:8.0 g、L-抗壞血酸3.3 g及水:38.8 g所獲得者分別同時滴加至反應系中。其後,於相同之溫度(65℃)下熟化1小時。於熟化結束後,添加48質量%之NaOH水溶液62.9 g進行中和而獲得聚合物A14(60質量%之水溶液)(AA/單體a2-6質量比=9/91,莫耳比=76/24)。 [聚合物A15之製造例] 於附有攪拌機之反應容器中裝入水:193 g(10.7莫耳)、1,2-丙二醇:295 g(3.9莫耳)、AA:5.0 g(0.069莫耳)、單體a2-7:150 g(0.13莫耳),一面進行攪拌,一面進行氮氣置換,於氮氣環境中升溫至85℃。以75分鐘將混合溶解AA:49.7 g(0.69莫耳)、單體a2-7:150 g(0.13莫耳)及水:50.3 g(2.8莫耳)所獲得者、以及混合溶解過氧二硫酸鈉:5.3 g及水:21.2 g所獲得者分別同時滴加至反應系中。其次,以135分鐘將混合溶解AA:45.1 g(0.63莫耳)、過氧二硫酸鈉:4.8 g及水:30.3 g所獲得者分別同時滴加至反應系中。其後,於相同之溫度(85℃)下熟化3小時。於熟化結束後,添加48質量%之NaOH水溶液52.2 g進行中和而獲得聚合物A15(40質量%之溶液)(AA/單體a2-7質量比=25/75,莫耳比=84/16)。 [聚合物A16] 於聚合物A16中使用丙烯酸/聚乙二醇丙烯酸酯(EO平均加成莫耳數為5)共聚物之鈉鹽(重量平均分子量為10000,日本專利特開2000-309796號公報中記載之化合物E)。於表1中,成為聚合物A16之結構單元(a1)之丙烯酸表示為AA,成為結構單元(a2)之聚乙二醇丙烯酸酯(EO平均加成莫耳數為5)表示為單體a2-8。 [重量平均分子量之測定] 使用凝膠滲透層析(以下亦稱為「GPC」)法,於下述條件下測定聚合物A1~A11、A13~A16之重量平均分子量。將測定結果示於表1。 表1中之聚合物A12之重量平均分子量(348.5)為國際化學物質安全性卡所記載之值。 [GPC條件] 管柱:G4000PWXL+G2500PWXL(Tosoh股份有限公司製造) 溶離液:0.2M磷酸緩衝液/CH3 CN=9/1(體積比) 流量:1.0 mL/min 管柱溫度:40℃ 檢測:RI(Refractive Index,折射率) 樣品尺寸:0.5 mg/mL 標準物質:聚乙二醇換算 [表1] 2.清潔劑組合物之製備(實施例1~22及比較例1~8) 藉由以表2中所記載之比率(質量%,有效成分)調配混合表2中所記載之各成分,而製備實施例1~22及比較例1~8之清潔劑組合物。pH值係25℃下之清潔劑組合物之pH值,測定將pH值計(東亞電波工業股份有限公司,HM-30G)之電極於清潔劑組合物中浸漬3分鐘後之數值。於調整pH值時,使用氫氧化鉀及硫酸。成分B及成分C係使用以下者。 <成分B:鹼劑> KOH:氫氧化鉀(關東化學股份有限公司製造,鹿特級,固形物成分48質量%) MEA:單乙醇胺(日本觸媒股份有限公司製造) MDA:N-甲基二乙醇胺(日本乳化劑股份有限公司製造,胺基醇MDA) EA:N-(β-胺基乙基)乙醇胺(日本乳化劑股份有限公司製造,胺基醇EA) <成分C:水> 水:使用栗田工業股份有限公司製造之連續純水製造裝置(Pureconti PC-2000VRL型)與子系統(Makuace KC-05H型)製造之超純水 <其他成分> 硫酸:和工純藥工業股份有限公司製造,試劑特級,純度為95.0質量% 3.評估方法 [分散性試驗方法] 將清潔劑組合物30.0 g加入至50 mL之聚丙烯瓶,添加氧化鎳粒子(平均粒徑未達50 nm)0.15 g,利用超音波清潔機UT-105HS(Sharp Manufacturing System股份有限公司製造,100 W,35 kHz,30分鐘)進行攪拌,並利用紫外可見分光光度計UV-2700(島津製作所股份有限公司製造,測定波長為660 nm)而測定剛攪拌後及靜置1小時後之上清液之吸光度。將剛攪拌後之吸光度設為100,將其相對值作為分散性而示於表2。數值越大,分散性越優異。 [清潔性試驗方法] 藉由將經Ni-P鍍覆之鋁合金基板(外徑:95 mm f,內徑:25 mm f,厚度:1.75 mm)於含有相當於研磨屑之氧化鎳粒子(平均粒徑未達50 nm)之分散液(濃度:0.0025質量%)中浸漬2分鐘,而準備經污染之被清潔基板、即附著有顆粒之被清潔基板。然後,使用各清潔劑組合物進行上述被清潔基板之清潔,對各清潔劑組合物之清潔性進行評估。清潔係藉由如下方式進行。 (清潔) 使用清潔裝置,於以下之條件下清潔5片被清潔基板。準備2組沖洗槽。 (1)清潔-1:製備用於清潔之清潔劑組合物4000 g。將所製備之清潔劑組合物加入至清潔槽(a),以清潔槽(a)內之液溫成為25℃之方式進行設定。然後,將被清潔基板浸漬於清潔槽(a)內之清潔劑組合物中,一面照射超音波(200 kHz),一面清潔120秒鐘。 (2)沖洗-1:將超純水加入至沖洗槽(b),以沖洗槽(b)內之液溫成為25℃之方式進行設定。然後,將清潔槽(a)內之被清潔基板移至沖洗槽(b)而浸漬於沖洗槽(b)內之超純水中,一面照射超音波(600 kHz),一面沖洗120秒鐘。 (3)使用以與沖洗槽(b)相同之條件準備之加入有超純水之沖洗槽(c)再次重複進行(2)。 (4)清潔-2:將沖洗槽(c)內之被清潔基板移至組裝有清潔刷之洗刷清潔單元(A)。然後,對清潔刷射出25℃之清潔劑組合物,一面於存在該清潔劑組合物之條件下使清潔刷以400 rpm於被清潔基板之兩個面旋轉,一面進行壓抵,藉此於25℃下清潔5秒鐘。清潔劑組合物係使用與「(1)清潔-1」中所使用之清潔劑組合物相同之組成者。 (5)沖洗-2:將被清潔基板移至以與洗刷清潔單元(A)相同之條件準備之洗刷清潔單元(B),射出25℃之超純水,一面使清潔刷與(4)同樣地以400 rpm於被清潔基板之兩個面旋轉,一面進行壓抵,藉此於25℃下沖洗5秒鐘。 (6)使用以與洗刷清潔單元(A)相同之條件準備之洗刷清潔單元(C)、以與洗刷清潔單元(B)相同之條件準備之洗刷清潔單元(D)再次重複進行(4)與(5)。 (7)沖洗-3:將超純水加入至沖洗槽(e),以沖洗槽(e)內之液溫成為25℃之方式進行設定。然後,將被清潔基板移至沖洗槽(e)而浸漬於沖洗槽(e)內之超純水中,一面照射超音波(170 kHz),一面沖洗600秒鐘。 (8)乾燥:將被清潔基板移至旋轉乾燥器,以轉數700 rpm以60秒鐘使基板表面完全乾燥。 [清潔性之評估方法] 利用光學式微小缺陷檢查裝置(Candela 7100,KLA-Tencor公司製造)之模式Q-散射對以10000 rpm旋轉之經清潔之基板照射雷射,而實施缺陷數量(基板上的異物數量)之測定。針對各清潔劑組合物,各對10片基板進行上述測定,算出平均值。將比較例1之值設為100,將相對值示於表2。值越小,缺陷數量越少,可評估為清潔性優異。 [表2] 如表2所示,實施例1~22之清潔劑組合物顯示出優於比較例1~8之清潔劑組合物之分散性。進而,實施例1~22之清潔劑組合物顯示出優於比較例1~8之清潔劑組合物之清潔性。The present invention is based on the insight that if a substrate that has been polished with a polishing liquid composition is cleaned using a detergent composition containing a specific polymer (ingredient A) and a pH value of 8 or more, the residue on the surface of the substrate can be increased. Removability of particles. That is, in one aspect, the present invention relates to a cleaning composition for a substrate for a hard disk (hereinafter, also referred to as "the cleaning composition of the present invention"), which contains a polymer (ingredient A), which The polymer includes a structural unit (a1) derived from the monomer a1 represented by the general formula (I) or an anhydride thereof, and a polymer selected from the monomers represented by the general formula (II) and the following general formula (III) In the structural unit (a2) of at least one monomer a2 among the monomers represented by), the weight average molecular weight of component A is 15,000 or more and 200,000 or less, and the pH value is 8 or more. The detailed mechanism showing the effect of the present invention is not clear, but it is inferred as follows. It is speculated that by adsorbing the carboxyl group of the polymer (ingredient A) in the detergent composition on the substrate surface and the particle surface, a three-dimensional barrier caused by a polyalkylene oxide group is formed on the substrate surface and the particle surface, and on the substrate surface- There is a three-dimensional repulsion between particles or between particles. As a result, the removal of particles from the surface of the substrate is promoted, and the re-attachment of particles to the surface of the substrate and the aggregation of particles with each other are suppressed. The particles can be efficiently removed from the surface of the substrate, and Improve cleanliness. Furthermore, it is considered that by having the polymer (ingredient A) a specific weight average molecular weight, the above-mentioned steric repulsion effect is more effectively produced, and the re-attachment of particles to the surface of the substrate or the aggregation of particles with each other can be more effectively suppressed. Generally, compared with particles derived from abrasive particles, particles derived from abrasive particles have a smaller particle size and are difficult to remove. However, it is considered that the detergent composition of the present invention can also contain a specific polymer (ingredient A). Efficiently removes hard-to-remove particles from abrasive particles. However, the present invention is not limited to these mechanisms and is explained. Therefore, according to the detergent composition of the present invention, in one or more embodiments, the dispersibility of the particles in the detergent composition is excellent, and the particles remaining on the surface of the substrate can be effectively removed. Furthermore, according to the cleaning method and manufacturing method using the detergent composition of the present invention, in one or more embodiments, a substrate for a hard disk having excellent cleanliness can be obtained. Furthermore, by using a hard disk substrate cleaned with the detergent composition of the present invention, a hard disk recording device with a high recording density can be realized. In the present invention, the "particle" refers to a foreign substance remaining or adhering to the surface of a substrate. The "particles" of the present invention include foreign matter derived from abrasive particles such as nickel oxide, silicon oxide, and the like; foreign matter derived from abrasive particles such as silicon oxide, alumina, and ceria. Hereinafter, each component contained in the cleaner composition of this invention is demonstrated. [Component A: Polymer] The component A contained in the detergent composition of the present invention is a polymer containing a structural unit derived from the monomer a1 or its anhydride represented by the following general formula (I) ( a1) and a structural unit (a2) derived from at least one monomer a2 selected from a monomer represented by the following general formula (II) and a monomer represented by the following general formula (III). (Monomer a1) In formula (I), R 1 , R 2 And R 3 Each independently represents a hydrogen atom, a methyl group, or-(CH 2 ) p COOM 2 , M 1 And M 2 Each independently represents a hydrogen atom, an alkali metal, an alkaline earth metal (1/2 atom), an organic ammonium group, or an ammonium group, and p represents an integer of 0 or more and 2 or less. In formula (I), R 1 , R 2 And R 3 Is selected from the group consisting of a hydrogen atom, a methyl group, and-(CH 2 ) p COOM 2 At least one of them is preferably R from the viewpoint of improving cleanability. 1 And R 3 Is a hydrogen atom, R 2 A hydrogen atom or a methyl group, more preferably R 1 And R 3 Is a hydrogen atom, R 2 Is methyl. In formula (I), M 1 And M 2 It is at least one selected from the group consisting of a hydrogen atom, an alkali metal, an alkaline earth metal (1/2 atom), an organic ammonium group, and an ammonium group. From the viewpoint of improving cleanability, an alkali metal is preferred, and sodium and Potassium. In formula (I), p is an integer of 0 or more and 2 or less. From the viewpoint of improving the cleanability, 0 or 1 is preferable, and 0 is more preferable. The monomer a1 represented by the formula (I) may be an acid anhydride. Examples of the monomer a1 include acrylic acid, methacrylic acid, maleic acid, fumaric acid, itaconic acid and the like, acid anhydrides thereof, and salts thereof, and from the viewpoint of improving cleanability , Preferably at least one selected from the group consisting of acrylic acid, methacrylic acid, maleic acid and maleic anhydride, more preferably at least one of acrylic acid and methacrylic acid, and further preferably methacrylic acid . Examples of the salt include an alkali metal salt, an alkaline earth metal salt, an ammonium salt, and an organic ammonium salt. From the viewpoint of improving cleanability, an alkali metal salt is preferable, and a sodium salt and a potassium salt are more preferable. (Monomer a2) The monomer a2 is selected from a monomer represented by the following general formula (II) (hereinafter, also referred to as "monomer a21") and a monomer represented by the following general formula (III) (hereinafter , Also known as "monomer a22"). < monomer a21 > [chemical 5] In formula (II), R 4 And R 5 Each independently represents a hydrogen atom or a methyl group, q represents an integer of 0 or more and 2 or less, AO represents an alkyleneoxy group having 2 or 3 carbon atoms, n is an average addition mole number of AO, and represents 4 or more and 300 or less, X represents a hydrogen atom or an alkyl group having 1 or more and 3 or less carbon atoms. In the formula (II), AO represents an alkyleneoxy group having 2 or 3 carbon atoms, and the alkyleneoxy group may have any of a linear form and a branched form. AO may be 1 type, and may be 2 or more types. When there are two or more types of AO, the addition form may be random or block. Examples of AO include oxyethylene (EO) and oxyethylene (PO). In terms of cleanability, oxyethylene (EO) is preferred. In the formula (II), n is a number of 4 or more and 300 or less. From the viewpoint of improving the cleanability, it is preferably 6 or more, more preferably 9 or more, still more preferably 20 or more, and even more preferably 40 or more. It is more preferably 80 or more, and from the same viewpoint, it is preferably 200 or less, more preferably 150 or less, and still more preferably 130 or less. In the formula (II), X represents a hydrogen atom or an alkyl group having 1 or more and 3 carbon atoms, and from the viewpoint of improving cleanability, an alkyl group having 1 or more and 3 carbon atoms is preferred. The alkyl group may have any of a linear form and a branched form. Examples of the alkyl group having 1 to 3 carbon atoms include methyl, ethyl, n-propyl, and isopropyl. As the monomer a21, when q in Formula (II) is 0, for example, methoxypolyethylene glycol (meth) acrylate, ethoxypolyethylene glycol (meth) acrylate, Propoxy polyethylene glycol (meth) acrylate, methoxy polypropylene glycol (meth) acrylate, ethoxy polypropylene glycol (meth) acrylate, and propoxy polypropylene glycol (meth) acrylate From the viewpoint of improving cleanability, it is preferably selected from the group consisting of methoxy polyethylene glycol (meth) acrylate, ethoxy polyethylene glycol (meth) acrylate, and propoxy polyethylene. At least one of the glycol (meth) acrylates is more preferably a methoxypolyethylene glycol (meth) acrylate, and even more preferably a methoxypolyethylene glycol methacrylate. The "(meth) acrylate" means at least one of an acrylate and a methacrylate. As the monomer a21, when q in Formula (II) is 1, for example, methoxypolyethylene glycol 3-butenoate, ethoxypolyethylene glycol 3-butenoate, Propoxy polyethylene glycol 3-butenoate, methoxy polypropylene glycol 3-butenoate, ethoxy polypropylene glycol 3-butenoate, and propoxy polypropylene glycol 3-butenoate Wait. As the monomer a21, when q in the formula (II) is 2, for example, methoxy polyethylene glycol 4-pentenoate, ethoxy polyethylene glycol 4-pentenoate, Propoxy polyethylene glycol 4-pentenoate, methoxy polypropylene glycol 4-pentenoate, ethoxy polypropylene glycol 4-pentenoate, and propoxy polypropylene glycol 4-pentenoate Wait. < monomer a22 > [chemical 6] In formula (III), R 6 And R 7 Each independently represents a hydrogen atom or a methyl group, r represents an integer of 0 or more and 2 or less, AO represents an alkyleneoxy group having 2 or 3 carbon atoms, and m is an average addition mole number of AO, representing 4 or more and A number of 300 or less, Y represents a hydrogen atom or an alkyl group having 1 or more and 3 or less carbon atoms. In the formula (III), AO represents an alkyleneoxy group having 2 or 3 carbon atoms, and the alkyleneoxy group may have any of a linear form and a branched form. AO may be 1 type, and may be 2 or more types. When there are two or more types of AO, the addition form may be random or block. Examples of AO include oxyethylene (EO) and oxyethylene (PO). In terms of cleanability, oxyethylene (EO) is preferred. In formula (III), m is a number of 4 or more and 300 or less. From the viewpoint of improving the cleanability, it is preferably 6 or more, more preferably 9 or more, still more preferably 20 or more, and even more preferably 40 or more. It is more preferably 80 or more, and from the same viewpoint, it is preferably 200 or less, more preferably 150 or less, and still more preferably 130 or less. In the formula (III), Y represents a hydrogen atom or an alkyl group having 1 or more and 3 carbon atoms, and from the viewpoint of improving cleanability, an alkyl group having 1 or more and 3 carbon atoms is preferred. The alkyl group may have any of a linear form and a branched form. Examples of the alkyl group having 1 to 3 carbon atoms include methyl, ethyl, n-propyl, and isopropyl. As the monomer a22, when r in the formula (III) is 0, for example, polyethylene glycol vinyl ether, methoxy polyethylene glycol vinyl ether, and ethoxy polyethylene glycol vinyl are mentioned. Ether, propoxy polyethylene glycol vinyl ether, polypropylene glycol vinyl ether, methoxy polypropylene glycol vinyl ether, ethoxy polypropylene glycol vinyl ether, propoxy polypropylene glycol vinyl ether, polyethylene glycol Isopropenyl ether, polypropylene glycol isopropenyl ether, and the like. As the monomer a22, when r in Formula (III) is 1, for example, polyethylene glycol allyl ether, methoxy polyethylene glycol allyl ether, and ethoxy polyethylene glycol can be exemplified. Allyl ether, propoxy polyethylene glycol allyl ether, polypropylene glycol allyl ether, methoxy polypropylene glycol allyl ether, ethoxy polypropylene glycol allyl ether, propoxy polypropylene glycol Propyl ether, polyethylene glycol 2-methylallyl ether, polypropylene glycol 2-methylallyl ether, polyethylene glycol 2-butenyl ether, polypropylene glycol 2-butenyl ether, and the like. As the monomer a22, when r in the formula (III) is 2, for example, polyethylene glycol 3-butenyl ether, methoxy polyethylene glycol 3-butenyl ether, and ethoxy group may be mentioned. Polyethylene glycol 3-butenyl ether, propoxy polyethylene glycol 3-butenyl ether, polypropylene glycol 3-butenyl ether, methoxy polypropylene glycol 3-butenyl ether, ethoxy poly Propylene glycol 3-butenyl ether, propoxy polypropylene glycol 3-butenyl ether, polyethylene glycol 3-methyl-3-butenyl ether, methoxypolyethylene glycol 3-methyl-3- Butenyl ether, ethoxy polyethylene glycol 3-methyl-3-butenyl ether, propoxy polyethylene glycol 3-methyl-3-butenyl ether, polypropylene glycol 3-methyl- 3-butenyl ether, methoxy polypropylene glycol 3-methyl-3-butenyl ether, ethoxy polypropylene glycol 3-methyl-3-butenyl ether, propoxy polypropylene glycol 3-methyl -3-butenyl ether and the like. From the viewpoint of improving the cleanability, the molar ratio a1 / a2 of the structural unit (a1) to the structural unit (a2) in all the structural units of the component A of the present invention is preferably 0.1 or more, more preferably 0.5 or more It is more preferably 1 or more, further more preferably 2 or more, and from the same viewpoint, it is preferably 100 or less, more preferably 50 or less, still more preferably 30 or less, and even more preferably 20 or less. From the viewpoint of improving the cleanability, the molar ratio a1 / a2 in all the structural units of the component A is preferably 0.1 or more and 100 or less, more preferably 0.5 or more and 50 or less, and further preferably 1 or more and 30 or less. . Furthermore, it is more preferably 2 or more and 20 or less. Component A of the present invention may further contain structural units (a1) and structural units other than the structural unit (a2). Examples of other structural units include those derived from alkyl (meth) acrylate, hydroxyethyl (meth) acrylate, acrylamide, vinyl acetate, styrene, olefin, vinyl alcohol, and allyl alcohol. A structural unit of at least one compound among polyalkylene oxide adducts of allyl alcohol. From the viewpoint of exhibiting the effects of the present invention, the content of the other structural units in all the structural units of the component A of the present invention is preferably 10% by mass or less, more preferably 3% by mass or less, and even more preferably 1 Mass% or less. The component A of the present invention can be obtained by a known method such as polymerizing a monomer mixture containing a monomer a1 and a monomer a2 by a solution polymerization method. Examples of solvents used in solution polymerization include water; aromatic hydrocarbons such as toluene and xylene; alcohols such as ethanol and 2-propanol; ketones such as acetone and methyl ethyl ketone; tetrahydrofuran and diethylene glycol dimethyl Ether and other ethers. As the polymerization initiator used in the polymerization, a known radical initiator can be used, and examples thereof include ammonium peroxodisulfate (ammonium persulfate), hydrogen peroxide water, sodium peroxodisulfate, and the like. At the time of polymerization, a chain transfer agent can be further used, and examples thereof include thiol-based chain transfer agents such as 2-mercaptoethanol and β-mercaptopropionic acid; and chain transfer agents and solvents such as 1,2-propanediol. In the present invention, the content of each structural unit in all the structural units of component A can be regarded as the ratio of the amount of each monomer used to the total amount of monomers used for polymerization. The arrangement of the structural units of the component A may be any of random, block, or graft. A salt-forming group (-COOH,-(CH 2 ) p In the case of COOH), it can be neutralized with a neutralizing agent and used. Examples of the neutralizing agent include sodium hydroxide, potassium hydroxide, and ammonia. From the viewpoint of cleanness, the weight average molecular weight of the component A is 15,000 or more, preferably 20,000 or more, more preferably 25,000 or more, still more preferably 30,000 or more, and even more preferably 50,000 or more, and from the same viewpoint In other words, it is 200,000 or less, preferably 150,000 or less, more preferably 100,000 or less, and even more preferably 80,000 or less. From the viewpoint of cleanness, the weight average molecular weight of the component A is 15,000 or more and 200,000 or less, preferably 20,000 or more and 150,000 or less, more preferably 20,000 or more and 100,000 or less, and further preferably 20,000 or more and 80,000 or less, and furthermore More preferably, it is 25,000 or more and 80,000 or less. In the present invention, the weight average molecular weight is measured by gel permeation chromatography (polyethylene glycol conversion), and specifically, it can be measured by a method described in Examples. From the viewpoint of improving the cleanability, the content of the component A in the detergent composition of the present invention with respect to the total mass of components other than water is preferably 1% by mass or more, more preferably 10% by mass or more, and further preferably It is 15% by mass or more, more preferably 20% by mass or more, and from the same viewpoint, it is preferably 99.9% by mass or less, more preferably 99% by mass or less, and still more preferably 98% by mass or less. Furthermore, from the viewpoint of improving the cleanability, the content of the component A in the detergent composition with respect to the total mass of components other than water is preferably 1% by mass or more and 99.9% by mass or less, and more preferably 10% by mass or more. The content is 99.9% by mass or less, more preferably 15% by mass or more and 99% by mass or less, and still more preferably 20% by mass or more and 98% by mass or less. From the viewpoint of cleanability, the content of the component A at the time of cleaning of the detergent composition of the present invention is preferably 0.001% by mass or more, more preferably 0.005% by mass or more, and still more preferably 0.01% by mass or more. From the same viewpoint, it is preferably 10% by mass or less, more preferably 5% by mass or less, still more preferably 2% by mass or less, still more preferably 1% by mass or less, and still more preferably 0.5% by mass or less. It is more preferably 0.2% by mass or less. Furthermore, from the same viewpoint, the content of the component A at the time of cleaning in the detergent composition is preferably 0.001% by mass or more and 10% by mass or less, more preferably 0.005% by mass or more and 5% by mass or less, and more 0.01 mass% or more and 2 mass% or less, still more preferably 0.01 mass% or more and 1 mass% or less, still more preferably 0.01 mass% or more and 0.5 mass% or less, and still more preferably 0.01 mass% or more and 0.2 Mass% or less. As described below, the detergent composition of the present invention can also be made into a concentrate, which is diluted and used during cleaning. Therefore, in the present invention, in one or more embodiments, "when cleaning agent composition is cleaned, The content of each component "means the content of each component of the detergent composition used in the cleaning step. Therefore, in the present invention, in one or more embodiments, the detergent composition during cleaning, that is, the detergent composition used in the cleaning step refers to the detergent composition in a diluted state. [Component B: Alkali agent] The detergent composition of the present invention may further contain an alkali agent (component B). Examples of the alkaline agent include compounds capable of imparting alkalinity to the detergent composition, or compounds capable of adjusting the pH value of the detergent composition to the following range, and examples thereof include inorganic alkali agents and organic alkali agents. Examples of the inorganic alkali agent include ammonia; alkali metal hydroxides such as potassium hydroxide and sodium hydroxide. Examples of the organic alkali agent include hydroxyalkylamine, quaternary ammonium salt, and the like. Examples of the hydroxyalkylamine include monoethanolamine, diethanolamine, triethanolamine, methylethanolamine, methyldiethanolamine, monopropanolamine, dipropanolamine, tripropanolamine, methylpropanolamine, and ethyl acetate. Dipropanolamine, and aminoethylethanolamine. Examples of the quaternary ammonium salt include tetramethylammonium hydroxide and choline. These alkali agents may be used alone or as a mixture of two or more. As the component B, at least one selected from the group consisting of an alkali metal hydroxide, a hydroxyalkylamine, and a quaternary ammonium salt is preferable from the viewpoint of improving the cleanability, and from the viewpoint of reducing the burden of the drainage treatment Is more preferably an alkali metal hydroxide, and even more preferably at least one of potassium hydroxide and sodium hydroxide. From the viewpoint of improving cleanability, the content of the component B in the detergent composition of the present invention with respect to the total mass of components other than water is preferably 0.1% by mass or more, more preferably 0.3% by mass or more, and further preferably It is 0.5 mass% or more, and from the same viewpoint, it is preferably 99 mass% or less, more preferably 90 mass% or less, still more preferably 80 mass% or less, and still more preferably 75 mass% or less. Furthermore, from the viewpoint of improving cleanability, the content of the component B in the detergent composition of the present invention with respect to the total mass of components other than water is preferably 0.1% by mass or more and 99% by mass or less, and more preferably 0.1%. Mass% or more and 90 mass% or less, more preferably 0.3 mass% or more and 80 mass% or less, still more preferably 0.5 mass% or more and 75 mass% or less. From the viewpoint of cleanness, the content of the component B during cleaning of the detergent composition of the present invention is preferably 0.00005 mass% or more, more preferably 0.0001 mass% or more, and further preferably 0.001 mass% or more. From the same viewpoint, it is preferably 2.0% by mass or less, more preferably 0.3% by mass or less, still more preferably 0.1% by mass or less, still more preferably 0.07% by mass or less, and still more preferably 0.05% by mass or less. Furthermore, from the same viewpoint, the content of the component B at the time of cleaning of the detergent composition is preferably 0.00005 mass% or more and 2.0 mass% or less, more preferably 0.00005 mass% or more and 0.3 mass% or less, and further preferably It is 0.00005 mass% or more and 0.1 mass% or less, still more preferably 0.0001 mass% or more and 0.07 mass% or less, and still more preferably 0.001 mass% or more and 0.05 mass% or less. From the viewpoint of improving cleanability, the ratio A / B of the content of the component A to the content of the component B in the detergent composition of the present invention is preferably 0.01 or more, more preferably 0.1 or more, and even more preferably 0.3. Above, from the same viewpoint, it is preferably 20,000 or less, more preferably 1,000 or less, and even more preferably 100 or less. From the viewpoint of improving the cleanability, the content ratio A / B in the detergent composition is preferably 0.01 or more and 20,000 or less, more preferably 0.1 or more and 1,000 or less, and still more preferably 0.3 or more and 100 or less. [Component C: Water] The detergent composition of the present invention may further contain water (component C). The water is not particularly limited as long as it can function as a solvent, and examples thereof include ultrapure water, pure water, ion-exchanged water, or distilled water, and ultrapure water, pure water, or ion-exchanged water is preferred. , More preferably ultrapure water. Pure water and ultrapure water can be obtained, for example, by subjecting tap water to ion-exchange treatment with activated carbon and then performing distillation, and irradiating or passing a filter through a specific ultraviolet germicidal lamp as needed for the obtained person. From the viewpoint of improving the cleanability and stabilizing the detergent composition, the content of the component C at the time of cleaning of the detergent composition of the present invention is preferably 90% by mass or more, more preferably 95% by mass or more, and further It is preferably 99% by mass or more, and from the same viewpoint, it is preferably 99.99% by mass or less, more preferably 99.98% by mass or less, and still more preferably 99.97% by mass or less. [Optional component] In addition to the above components A to C, the detergent composition of the present invention may contain a chelating agent, an anionic polymer, a nonionic surfactant, a co-solvent, an antioxidant, a preservative, an antifoaming agent, and an antibacterial agent. Agents and other optional ingredients. The optional component is preferably contained in the detergent composition within a range that does not impair the effect of the present invention. The content of the optional component during cleaning of the detergent composition is preferably 0% by mass or more and 2.0% by mass or less, more preferably 0 mass% or more and 1.5 mass% or less, more preferably 0 mass% or more and 1.3 mass% or less, and still more preferably 0 mass% or more and 1.0 mass% or less. (Chelating agent) The cleaning composition of the present invention may contain a chelating agent from the viewpoint of improving the cleanability. Examples of the chelating agent include: selected from aldonic acids such as gluconic acid and glucoheptanoic acid; aminocarboxylic acids such as ethylenediaminetetraacetic acid and diethylenetriaminepentaacetic acid; hydroxycarboxylic acids such as citric acid and malic acid; Phosphonic acids such as 1-hydroxyethylene-1,1-diphosphonic acid; and at least one of the group consisting of these salts. (Anionic polymer) The cleaner composition of the present invention may contain an anionic polymer such as a carboxylic acid polymer from the viewpoint of improving cleanability. Examples of the carboxylic acid-based polymer include an acrylic polymer, a methacrylic polymer, a maleic acid polymer, an acrylic acid / methacrylic acid copolymer, an acrylic acid / maleic acid copolymer, and formic acid. An anionic polymer containing methacrylic acid or acrylic acid in a structural unit such as a methacrylic acid / methyl acrylate copolymer. (Nonionic Surfactant) The cleansing composition of the present invention may contain a nonionic surfactant from the viewpoint of improving cleanability. Examples of the nonionic surfactant include polyalkylene glycol alkyl ethers. (Cosolvent) The cleaning composition of the present invention may contain a cosolvent from the viewpoint of improving storage stability. Examples of the co-solvent include at least one selected from the group consisting of p-toluenesulfonic acid, dimethylbenzenesulfonic acid, 2-ethylhexanoic acid, and salts thereof. In addition to the water described above, the detergent composition of the present invention may further contain an aqueous solvent (for example, an alcohol such as ethanol) as a solvent. The solvent contained in the detergent composition of the present invention preferably contains only water. [PH value of the detergent composition] The pH value of the detergent composition of the present invention at the time of cleaning is 8 or more. From the viewpoint of cleanability, it is preferably 9 or more, more preferably 9.5 or more, and even more preferably 10 or more, more preferably 10.5 or more, and from the same viewpoint, 14 or less is more preferable, 13 or less is more preferable, 12.5 or less is further preferable, 12 or less is further preferable, and 11.5 is further more preferable. the following. For example, from the viewpoint of improving the cleanability, the pH value of the detergent composition of the present invention can be adjusted using an acid or an alkali agent of component B. Examples of the acid include inorganic acids such as nitric acid, sulfuric acid, and hydrochloric acid; and organic acids such as hydroxycarboxylic acid and amino acid. In the present invention, the "pH value during cleaning" refers to the pH value when the detergent composition is used (after dilution) at 25 ° C, and can be measured by a pH meter, preferably an electrode with a pH meter Value after immersing in the detergent composition for 3 minutes. [Manufacturing Method of Detergent Composition] The detergent composition of the present invention can be produced by mixing component A, and optionally component B, component C, and optional components by a known method. For example, the detergent composition of the present invention can be prepared by blending at least component A. Therefore, the present invention relates to a method for producing a detergent composition including a step of formulating at least component A. In the present invention, the "mixing" includes a case where the component A, the component B, the component C, and an optional component are mixed at the same time or in an arbitrary order. In the manufacturing method of the detergent composition of this invention, the compounding quantity of each component can be set to the same content as each component of the said detergent composition of this invention. From the standpoint of storage and transportation, the detergent composition of the present invention can also be made into a concentrate and diluted during use. From the standpoint of storage and transportation, the concentrate of the detergent composition is preferably made into a concentrate having a dilution ratio of 3 times or more, and from the standpoint of storage stability, it is preferably made to have a dilution ratio of 200 times. The following concentrates. The concentrate of the detergent composition can be used by diluting with the water so that the content of each component becomes the above-mentioned content (that is, the content at the time of cleaning) during use. Furthermore, the concentrate of a detergent composition can also be used by adding each component separately at the time of use. In the present invention, the "during use" or "during cleaning" of the concentrate of the detergent composition refers to a state where the concentrate of the detergent composition is diluted. From the viewpoint of improving the cleanability after dilution, the pH value of the concentrate of the detergent composition of the present invention is preferably 8 or more, more preferably 9.0 or more, still more preferably 9.5 or more, and even more preferably 10.0 or more. Moreover, from the same viewpoint, it is preferably 14.0 or less, more preferably 13.0 or less, and even more preferably 12.0 or less. The pH value of the concentrate of the detergent composition of the present invention can be measured by the same method as the pH value of the detergent composition of the present invention described above. [Substrate to be cleaned] In one or more embodiments, the detergent composition of the present invention can be used to clean a substrate polished with a polishing liquid composition, or a substrate remaining or having particles adhered thereto. Examples of the substrate to be cleaned include an aluminum alloy substrate and a glass substrate coated with Ni-P. The glass substrate may be a crystallized glass substrate or an amorphous glass substrate. In one or more embodiments, the particles remaining or attached to the substrate to be cleaned include particles derived from abrasive particles such as nickel oxide, silicon oxide, and the like; abrasives derived from silicon oxide, aluminum oxide, and cerium oxide, etc. Grain and so on. In one or more embodiments, the cleaning composition of the present invention may be suitably used for cleaning particles to which abrasive particles derived from nickel oxide, silicon oxide, etc. are adhered, and preferably a source, in terms of cleaning effect. Substrate of abrasive particles of nickel oxide. Furthermore, in one or more embodiments, in terms of cleaning effect, the cleaning composition of the present invention can be preferably used for cleaning an aluminum alloy substrate plated with Ni-P, preferably using a polishing liquid. The Ni-P-plated aluminum alloy substrate after the composition is polished, more preferably, the Ni-P-plated aluminum alloy substrate after being polished using a polishing liquid composition containing silicon oxide abrasive particles. [Cleaning method of substrate] In one aspect, the present invention relates to a method for cleaning a substrate (hereinafter, also referred to as "the cleaning method of the present invention"), which includes using the cleaning agent composition of the present invention to clean a substrate to be cleaned. A cleaning step is performed. The substrate to be cleaned is a substrate that has been polished with a polishing liquid composition. The cleaning method of the present invention may further include a dilution step of diluting the above-mentioned concentrate of the cleaning composition of the present invention. As the substrate to be cleaned, the above substrate can be used. In one or more embodiments, the cleaning step may include a step of bringing the cleaning agent composition of the present invention into contact with the substrate to be cleaned. In one or more embodiments, the cleaning step may include performing dip cleaning and / or scrub cleaning. According to the cleaning method of the present invention, particles adhering to the surface of the substrate can be efficiently removed, preferably particles of abrasive dust derived from nickel oxide, silicon oxide, etc., and more preferably particles of abrasive dust derived from nickel oxide. (Immersion Cleaning) There are no particular restrictions on the immersion conditions of the substrate to be cleaned in the detergent composition. For example, from the viewpoints of workability and operability, the temperature of the detergent composition is preferably from 20 to 100 ° C. For example, from the viewpoint of improving the cleanability of the detergent composition, the immersion time is preferably 5 seconds or more, more preferably 10 seconds or more, and still more preferably 100 seconds or more, and the production of the cleaned substrate is improved. From the viewpoint of efficiency, the immersion time is preferably 30 minutes or less, more preferably 10 minutes or less, and even more preferably 5 minutes or less. From the viewpoint of improving the removability of the residue and the dispersibility of the residue, it is preferable to give ultrasonic cleaner to the detergent composition. The frequency of the ultrasonic wave is, for example, preferably from 20 to 2000 kHz, more preferably from 40 to 2000 kHz, and even more preferably from 40 to 1500 kHz. (Scrubbing and cleaning) As a method of scrubbing and cleaning, from the viewpoint of promoting the cleanability of residues such as abrasive particles or the solubility of oil, it is preferred to perform cleaning by spraying a cleaning agent being subjected to ultrasonic vibration The composition cleans the surface of the substrate to be cleaned by bringing the cleaning composition into contact with the surface of the substrate; or the cleaning composition is supplied by spraying onto the surface of the substrate to be cleaned, and the cleaning composition is scrubbed with a cleaning brush. The surface. Further, from the same point of view, the method of scrubbing and cleaning is preferably performed by cleaning the surface of the object to be cleaned by applying a cleaning agent composition to which ultrasonic vibration is applied by injection, and using the cleaning agent. The surface to which the detergent composition is supplied is scrubbed. As a method for applying the cleaning agent composition to the surface of the substrate to be cleaned, a mechanism such as a spray nozzle can be used. The cleaning brush is not particularly limited, and for example, a nylon brush or a PVA (polyvinyl alcohol) sponge brush can be used. The frequency of the ultrasonic wave can be set, for example, to the same value as that preferably used in the above-mentioned dipping cleaning. The cleaning method of the present invention may include, in addition to the above-mentioned dipping cleaning and / or the above-mentioned scrub cleaning, one or more well-known cleaning steps such as swing cleaning, cleaning using a spinner or the like, and liquid cleaning. The cleaning method of the present invention can clean the substrates to be cleaned one by one, and can also collect multiple pieces of the substrates to be cleaned at a time for cleaning. The number of cleaning tanks used during cleaning may be one or plural. [Manufacturing Method of Hard Disk Substrate] In one aspect, the present invention relates to a manufacturing method of a hard disk substrate (hereinafter, also referred to as "the manufacturing method of the present invention"), which includes using the cleaning agent of the present invention A step of cleaning the substrate to be cleaned by the composition. As the substrate to be cleaned, the above substrate can be used. In general, a substrate for a hard disk can be manufactured by subjecting a base material that becomes the base of the substrate for a hard disk to a shape processing step, a rough grinding step, a fine grinding step, a rough grinding step, a fine grinding step, and the like. Moreover, there may be a case where a cleaning step is included between the above steps. The hard disk substrate can be made into a magnetic hard disk, for example, by passing through the recording portion forming step after the final cleaning step. The recording portion forming step can be performed, for example, by forming a magnetic layer having a magnetic recording area and including a metal thin film on a hard disk substrate by a method such as sputtering. Examples of the metal material constituting the metal thin film include an alloy of chromium, tantalum, platinum, and the like with cobalt, an alloy of iron, and platinum, and the like. The magnetic layer may be formed on both main surface sides of the hard disk substrate, or may be formed only on one main surface side. The rough grinding step and the fine grinding step are performed in this order, for example. As the inorganic fine particles contained in the abrasive composition used when performing the rough grinding step, for example, cerium oxide particles or alumina particles are preferred for reasons of enabling high-speed grinding. For the purpose of improving the smoothness (surface roughness) of the surface, it is preferable that the inorganic fine particles contained in the abrasive composition used in the fine grinding step are silica particles. In one or more embodiments, after the rough grinding step, the cleaning step (the first cleaning step), the rinsing step (the first rinsing step), and the drying step (the first drying step) using the detergent composition may be sequentially performed. ), A fine grinding step, a cleaning step (second cleaning step) using a detergent composition, a rinsing step (second rinsing step), and a drying step (second drying step). The cleaning method of the present invention can be applied to the first cleaning step and / or the second cleaning step. From the viewpoint of improving the cleanability, the cleaning method of the present invention is preferably used in the second cleaning step. Therefore, in one aspect, the present invention relates to a method for manufacturing a hard disk substrate including the following steps (1) and (2). (1) A polishing step of polishing a substrate to be polished using a polishing liquid composition. (2) A cleaning step of cleaning the substrate (the substrate to be cleaned) obtained in step (1) using the detergent composition of the present invention. The substrate to be polished in the above step (1) is generally a substrate after the fine grinding step, and preferably a substrate after the rough grinding step. As the substrate to be polished, the same substrate as the substrate to be cleaned can be used. Step (1) can be performed by supplying a polishing liquid composition to the polishing target surface of the substrate to be polished, bringing the polishing pad into contact with the polishing target surface, and applying a specific pressure (load) while moving the polishing pad or The substrate to be polished. From the viewpoint of improving the quality of the final substrate, step (1) is preferably a fine polishing step using a polishing liquid composition containing silicon oxide particles. In the fine grinding step, it is preferable to repeatedly use the polishing liquid composition. The cleaning step of the above step (2) can be performed in the same manner as the cleaning method of the present invention described above. [Set] In one aspect, the present invention relates to a set (hereinafter, also referred to as the "set of the present invention"), which is used to manufacture a detergent composition, and includes The solution contained the container-containing component A solution in a container. The kit of the present invention may further include at least one selected from the group consisting of component B, component C, and an arbitrary component stored in a container different from the component A solution contained in the container. For example, as the set of the present invention, the solution containing the component A (first liquid) and the solution containing the component B (second liquid) are stored in a state where they are not mixed with each other. Mixing kit (2-liquid cleaner composition). In the first liquid and the second liquid, if necessary, the above-mentioned component C and any component may be mixed, respectively. When the first liquid and the second liquid are mixed, for example, the concentration of each component in the detergent composition can be adjusted by adjusting the usage amount of the second liquid. According to the present invention, it is possible to provide a kit for obtaining a detergent composition for a substrate for a hard disk having excellent cleanability of particles remaining on the substrate surface. [Hard Disk Recording Device] In one aspect, the present invention relates to a hard disk recording device (hereinafter, also referred to as "the hard disk recording device of the present invention") which uses the cleaning agent composition of the present invention for cleaning Substrate for hard disk. By using a substrate for a hard disk to be cleaned using the detergent composition of the present invention, a hard disk recording device with a high recording density can be provided. Furthermore, the present invention relates to one or more of the following embodiments. <1> A cleaner composition for a substrate for a hard disk, comprising a polymer (component A) containing a structural unit derived from a monomer a1 or an anhydride thereof represented by the following general formula (I) ( a1) and a structural unit (a2) derived from at least one monomer a2 selected from a monomer represented by the following general formula (II) and a monomer represented by the following general formula (III), component A The weight average molecular weight is 15,000 or more and 200,000 or less, and the pH is 8 or more. [Chemical 7] [In formula (I), R 1 , R 2 And R 3 Each independently represents a hydrogen atom, a methyl group, or-(CH 2 ) p COOM 2 , M 1 And M 2 Each independently represents a hydrogen atom, an alkali metal, an alkaline earth metal (1/2 atom), an organic ammonium group, or an ammonium group, and p represents an integer of 0 or more and 2 or less] [Chem. 8] [In formula (II), R 4 And R 5 Each independently represents a hydrogen atom or a methyl group, q represents an integer of 0 or more and 2 or less, AO represents an alkyleneoxy group having 2 or 3 carbon atoms, n is an average addition mole number of AO, and represents 4 or more and 300 or less, X represents a hydrogen atom or an alkyl group having 1 to 3 carbon atoms] [Chem. 9] [In formula (III), R 6 And R 7 Each independently represents a hydrogen atom or a methyl group, r represents an integer of 0 or more and 2 or less, AO represents an alkyleneoxy group having 2 or 3 carbon atoms, and m is an average addition mole number of AO, representing 4 or more and 300 or less, Y represents a hydrogen atom or an alkyl group having a carbon number of 1 or more and 3 or less] <2> The cleaner composition according to <1>, wherein in the formula (I), R 1 , R 2 And R 3 Is selected from the group consisting of a hydrogen atom, a methyl group, and-(CH 2 ) p COOM 2 At least one of them, preferably R 1 And R 3 Is a hydrogen atom, R 2 A hydrogen atom or a methyl group, more preferably R 1 And R 3 Is a hydrogen atom, R 2 Is methyl. <3> The cleaner composition according to <1> or <2>, wherein in formula (I), M 1 And M 2 It is at least one selected from the group consisting of a hydrogen atom, an alkali metal, an alkaline earth metal (1/2 atom), an organic ammonium group, and an ammonium group, preferably an alkali metal, and more preferably sodium and potassium. <4> The cleaner composition according to any one of <1> to <3>, wherein in the formula (I), p is an integer of 0 or more and 2 or less, preferably 0 or 1, and more preferably 0. <5> The cleaner composition according to any one of <1> to <4>, wherein in the formula (II), n is 4 or more, preferably 6 or more, more preferably 9 or more, and even more preferably It is 20 or more, more preferably 40 or more, and even more preferably 80 or more. <6> The cleaner composition according to any one of <1> to <5>, wherein in formula (II), n is 300 or less, preferably 200 or less, more preferably 150 or less, and further preferably It is 130 or less. <7> The cleaner composition according to any one of <1> to <6>, wherein in the formula (II), X is a hydrogen atom or an alkyl group having a carbon number of 1 or more and 3 or less, preferably An alkyl group having 1 to 3 carbon atoms. <8> The cleaner composition according to any one of <1> to <7>, wherein the molar ratio a1 / of the structural unit (a1) to the structural unit (a2) in all the structural units of the component A a2 is preferably 0.1 or more, more preferably 0.5 or more, even more preferably 1 or more, and even more preferably 2 or more. <9> The cleaner composition according to any one of <1> to <8>, in which the molar ratio a1 / of the structural unit (a1) to the structural unit (a2) of all the structural units of the component A is 1 / a2 is preferably 100 or less, more preferably 50 or less, still more preferably 30 or less, and even more preferably 20 or less. <10> The cleaner composition according to any one of <1> to <9>, in which the molar ratio a1 / of the structural unit (a1) to the structural unit (a2) of all the structural units of the component A is 1 / a2 is preferably 0.1 or more and 100 or less, more preferably 0.5 or more and 50 or less, still more preferably 1 or more and 30 or less, and even more preferably 2 or more and 20 or less. <11> The cleaner composition according to any one of <1> to <10>, wherein the weight average molecular weight of component A is 15,000 or more, preferably 20,000 or more, more preferably 25,000 or more, and even more preferably 30,000 or more, more preferably 50,000 or more. <12> The cleaner composition according to any one of <1> to <11>, wherein the weight average molecular weight of the component A is 200,000 or less, preferably 150,000 or less, more preferably 100,000 or less, and even more preferably Below 80,000. <13> The cleaner composition according to any one of <1> to <12>, wherein the weight average molecular weight of the component A is 15,000 or more and 200,000 or less, preferably 20,000 or more and 150,000 or less, and more preferably 20,000 The above is 100,000 or less, more preferably 20,000 or more and 80,000 or less, and even more preferably 25,000 or more and 80,000 or less. <14> The cleaner composition according to any one of <1> to <13>, wherein the content of component A in the detergent composition relative to the total mass of components other than water is preferably 1% by mass or more 10% by mass or more, more preferably 15% by mass or more, and even more preferably 20% by mass or more. <15> The cleaner composition according to any one of <1> to <14>, wherein the content of component A in the detergent composition relative to the total mass of components other than water is preferably 99.9% by mass or less , More preferably 99% by mass or less, still more preferably 98% by mass or less. <16> The cleaner composition according to any one of <1> to <15>, wherein the content of component A in the detergent composition relative to the total mass of components other than water is preferably 1% by mass or more The content is 99.9% by mass or less, more preferably 10% by mass or more and 99.9% by mass or less, still more preferably 15% by mass or more and 99% by mass or less, and still more preferably 20% by mass or more and 98% by mass or less. <17> The cleaner composition according to any one of <1> to <16>, wherein the content of the component A during cleaning of the cleaner composition is preferably 0.001% by mass or more, and more preferably 0.005% by mass The above is more preferably 0.01% by mass or more. <18> The cleaner composition according to any one of <1> to <17>, wherein the content of the component A during cleaning of the cleaner composition is preferably 10% by mass or less, and more preferably 5% by mass Hereinafter, it is more preferably 2% by mass or less, still more preferably 1% by mass or less, still more preferably 0.5% by mass or less, still more preferably 0.2% by mass or less. <19> The cleaner composition according to any one of <1> to <18>, wherein the content of the component A at the time of cleaning in the cleaner composition is preferably 0.001% by mass or more and 10% by mass or less, More preferably, it is 0.005 mass% or more and 5 mass% or less, still more preferably 0.01 mass% or more and 2 mass% or less, still more preferably 0.01 mass% or more and 1 mass% or less, and still more preferably 0.01 mass% or more and 0.5 mass% or less, more preferably 0.01 mass% or more and 0.2 mass% or less. <20> The cleaner composition as described in any one of <1> to <19>, which further contains an alkali agent (component B). <21> The cleaner composition according to <20>, wherein component B is preferably at least one selected from the group consisting of alkali metal hydroxides, hydroxyalkylamines, and quaternary ammonium salts, and more preferably alkali metal hydrogen The oxide is more preferably at least one of potassium hydroxide and sodium hydroxide. <22> The cleaner composition according to any one of <20> or <21>, wherein the content of component B in the detergent composition relative to the total mass of components other than water is preferably 0.1% by mass or more , More preferably 0.3% by mass or more, and even more preferably 0.5% by mass or more. <23> The cleaner composition according to any one of <20> to <22>, wherein the content of component B in the detergent composition relative to the total mass of components other than water is preferably 99% by mass or less It is more preferably 90% by mass or less, still more preferably 80% by mass or less, and even more preferably 75% by mass or less. <24> The cleaner composition according to any one of <20> to <23>, wherein the content of component B in the detergent composition relative to the total mass of components other than water is preferably 0.1% by mass or more And 90% by mass or less, more preferably 0.3% by mass or more and 80% by mass or less, still more preferably 0.5% by mass or more and 75% by mass or less. <25> The cleaner composition according to any one of <20> to <24>, wherein the content of the component B during cleaning of the cleaner composition is preferably 0.00005% by mass or more, more preferably 0.0001% by mass The above is more preferably 0.001% by mass or more. <26> The cleaner composition according to any one of <20> to <25>, wherein the content of the component B during cleaning of the cleaner composition is preferably 2.0% by mass or less, and more preferably 0.3% by mass Hereinafter, it is more preferably 0.1% by mass or less, still more preferably 0.07% by mass or less, and still more preferably 0.05% by mass or less. <27> The cleaner composition according to any one of <20> to <26>, wherein the content of the component B during cleaning of the cleaner composition is preferably 0.00005% by mass or more and 2.0% by mass or less, more 0.00005 mass% or more and 0.3 mass% or less, more preferably 0.00005 mass% or more and 0.1 mass% or less, still more preferably 0.0001 mass% or more and 0.07 mass% or less, still more preferably 0.001 mass% or more and 0.05 Mass% or less. <28> The cleaner composition according to any one of <20> to <27>, wherein the ratio A / B of the content of the component A to the content of the component B in the detergent composition is preferably 0.01 or more , More preferably 0.1 or more, and even more preferably 0.3 or more. <29> The cleaner composition according to any one of <20> to <28>, wherein the ratio A / B of the content of the component A to the content of the component B in the detergent composition is preferably 20,000 or less Is more preferably 1,000 or less, and even more preferably 100 or less. <30> The cleaner composition according to any one of <20> to <29>, wherein the ratio A / B of the content of the component A to the content of the component B in the detergent composition is preferably 0.01 or more It is 20,000 or less, more preferably 0.1 or more and 1,000 or less, and still more preferably 0.3 or more and 100 or less. <31> The cleaner composition as described in any one of <1> to <30>, further containing water (component C). <32> The cleaner composition according to <31>, wherein the content of component C during cleaning of the cleaner composition is preferably 90% by mass or more, more preferably 95% by mass or more, and still more preferably 99% by mass %the above. <33> The cleaner composition according to <31> or <32>, wherein the content of the component C during cleaning of the cleaner composition is preferably 99.99% by mass or less, more preferably 99.98% by mass or less, It is preferably 99.97 mass% or less. <34> The cleaner composition according to any one of <1> to <33>, further comprising a member selected from the group consisting of a chelating agent, an anionic polymer, a nonionic surfactant, a co-solvent, an antioxidant, and a preservative At least one of any of the antifoaming agents and antibacterial agents. <35> The cleaner composition according to <34>, wherein the content of any component during cleaning of the cleaner composition is preferably 0% by mass or more and 2.0% by mass or less, more preferably 0% by mass or more and 1.5 The mass% or less is more preferably 0 mass% or more and 1.3 mass% or less, and still more preferably 0 mass% or more and 1.0 mass% or less. <36> The cleaner composition according to any one of <1> to <35>, wherein the pH value during cleaning is 8 or more, preferably 9 or more, more preferably 9.5 or more, and even more preferably 10 The above is more preferably 10.5 or more. <37> The cleaner composition according to any one of <1> to <36>, in which the pH value during cleaning is preferably 14 or lower, more preferably 13 or lower, even more preferably 12.5 or lower, and even more It is preferably 12 or less, and more preferably 11.5 or less. <38> The use of the cleaner composition according to any one of <1> to <37>, which is used to clean a substrate polished by a polishing liquid composition, or a substrate remaining or attached with particles . <39> A substrate cleaning method, comprising a cleaning step of cleaning a substrate to be cleaned using the detergent composition according to any one of <1> to <37>, wherein the substrate to be cleaned is a combination of polishing liquids The substrate after polishing. <40> The cleaning method according to <39>, wherein the substrate is an aluminum alloy substrate plated with Ni-P. <41> The cleaning method according to <39> or <40>, wherein the polishing liquid composition is a polishing liquid composition containing silicon oxide abrasive particles. <42> A method for manufacturing a substrate for a hard disk, comprising a cleaning step of cleaning the substrate to be cleaned using the detergent composition according to any one of <1> to <37>, wherein the substrate to be cleaned is used The substrate after the polishing liquid composition is polished. <43> A kit for producing the detergent composition according to any one of <1> to <37>, comprising a container-packed component containing a solution containing the component A in a container A solution. <44> A hard disk recording device using a substrate for a hard disk that is cleaned with the detergent composition according to any one of <1> to <37>. <45> Use of the cleaner composition as described in any one of <1> to <37> for cleaning the board | substrate for hard disks. [Examples] Hereinafter, the present invention will be specifically described by examples, but the present invention is not limited to these examples. 1. Preparation of polymer (ingredient A) When preparing polymers A1 to A16 shown in Table 1, the following raw materials were used. <Monomer a1> (1) MAA: methacrylic acid (manufactured by Tokyo Chemical Industry Co., Ltd.) (2) AA: acrylic acid (manufactured by Kogyo Pharmaceutical Co., Ltd.) (3) MA: maleic anhydride ( (Manufactured by Mitsubishi Chemical Corporation) <Monomer a2> (1) Monomer a2-1 Polyethylene glycol monomethyl ether (weight average molecular weight) of ethylene oxide addition mol number 120 which will melt at 80 ° C 5344) 1000 parts by mass was charged into a glass reaction container provided with a thermometer, a stirrer, a dropping funnel, a nitrogen introduction tube, and a cooling condenser. Next, 3 parts by mass of hydroquinone and 32 parts by mass of p-toluenesulfonic acid were added. Here, air was introduced into the reaction solution at a flow rate of 6 ml / min based on a total mass of 1 kg of polyethylene glycol monomethyl ether and methacrylic acid. Nitrogen was introduced into the gas phase part, and 483 parts by mass of methacrylic acid (30 mol times with respect to polyethylene glycol monomethyl ether) was introduced while heating and pressure reduction in the reaction vessel were started. The pressure system was controlled to 26.7 kPa, and the time when the temperature of the reaction solution reached 105 ° C was set as the reaction start time. The reaction was continued while the temperature of the reaction solution was kept at 110 ° C while the reaction water and methacrylic acid distillate were reacted. The pressure was reduced to 12 to 13.3 kPa 1 hour after the start of the reaction, and the state was maintained thereafter. After 6 hours from the start of the reaction, the pressure was returned to normal pressure, and 1.05 times equivalent of a 48% sodium hydroxide aqueous solution was added to p-toluenesulfonic acid to neutralize the reaction. Thereafter, the temperature of the reaction solution was maintained at 130 ° C. or lower, and unreacted methacrylic acid was recovered by a vacuum distillation method to obtain an esterification reaction product. After cooling to 100 ° C, 200 parts by mass of saturated saline and 1,000 parts by mass of toluene were added to the reaction mixture, and the reaction mixture was adjusted to 50 ° C. The lower layer extraction was repeated 5 times, and 200 parts by mass of saturated saline was added and the layer was separated. Then, toluene was distilled off to obtain refined methoxypolyethylene glycol methacrylate of monomer a2-1. (The average EO addition mole number is 120). (2) Monomer a2-2 methoxypolyethylene glycol methacrylate (average addition mole number of EO is 23), M-230G (manufactured by Shin Nakamura Chemical Industry Co., Ltd.) (3) Monomer a2 -3 methoxy polyethylene glycol methacrylate (average EO addition mole number is 9), M-90G (manufactured by Shin Nakamura Chemical Industry Co., Ltd.) (4) monomer a2-4 will be polyethylene The ethylene oxide addition mole number of the monomethyl ether was changed to 41 (weight average molecular weight is 1838), and the amount of methacrylic acid was changed to 1405 parts by mass. The same procedure was followed as in the above-mentioned monomer a2-1. The methoxypolyethylene glycol methacrylate of the refined monomer a2-4 was obtained (the average addition mole number of EO was 41). (5) EG: ethylene glycol (6) monomer a2-5 methoxypolyethylene glycol allyl ether (average molecular weight is 1500, EO average addition mole number is 32), Uniox PKA-5010 (day (Manufactured by Oil Corporation) (7) Monomer a2-6, polyethylene glycol 3-methyl-3-butenyl ether (average addition mole number of EO is 50) (8) Monomer a2-7, polyethylene Glycol allyl ether (average addition mole number of EO is 25) (9) Monomer a2-8 polyethylene glycol acrylate (average addition mole number of EO is 5) <Polymerization chain transfer agent> ・ 2 -Mercaptoethanol (manufactured by Tokyo Chemical Industry Co., Ltd.) ・ β-Mercaptopropionic acid (manufactured by Tokyo Chemical Industry Co., Ltd.) <Polymer chain transfer agent and solvent> ・ 1,2-propanediol (manufactured by Wako Pure Chemical Industries, Ltd.) ) 〈Polymerization initiator〉 ・ Ammonium peroxodisulfate (ammonium persulfate) (manufactured by Nacalai Tesque Co., Ltd.) Sodium disulfate (manufactured by Nacalai Tesque Co., Ltd.) <neutralizer> ・ Sodium hydroxide (48% by mass of NaOH, manufactured by Asahi Glass Co., Ltd.) [Production example of polymer A1] attached The reaction vessel was charged with a stirrer in water: 282 g (15.7 mole), stirred for one side, one side was replaced with nitrogen, warmed to 75 deg.] C in a nitrogen atmosphere. MAA: 20.7 g (0.24 mole), monomer a2-1: 323 g (0.06 mole) (mass ratio = 6/94, mole ratio = 80/20) and water: 239 g (13.3 mol) The obtained, 10% by mass aqueous ammonium persulfate solution: 34.7 g, and 2-mercaptoethanol: 1.8 g were simultaneously added dropwise to the reaction system. Next, a 10 mass% ammonium persulfate aqueous solution: 13.9 g was added dropwise over 30 minutes, and the mixture was aged at the same temperature (75 ° C) for 1 hour. After the aging was completed, 23.9 g of a 48% by mass aqueous NaOH solution was added and neutralized to obtain a polymer A1 (37% by mass aqueous solution). [Production Example of Polymer A2] A reaction vessel with a stirrer was charged with water: 367 g (20.4 mol), while stirring, nitrogen substitution was performed, and the temperature was raised to 80 ° C. in a nitrogen environment. MAA: 62.9 g (0.73 moles), monomer a2-2: 300 g (0.27 moles) (mass ratio = 17.3 / 82.7, mole ratio = 73/27) and water: 173 g (9.6 mol) The obtained, 10% by mass of an aqueous solution of ammonium persulfate: 34.1 g, and 2-mercaptoethanol: 2.9 g were simultaneously added dropwise to the reaction system. Next, a 10 mass% ammonium persulfate aqueous solution: 11.4 g was added dropwise over 30 minutes, and the mixture was aged at the same temperature (75 ° C) for 1 hour. After the aging was completed, 61 g of a 48% by mass aqueous NaOH solution was added for neutralization to obtain a polymer A2 (36% by mass aqueous solution). [Production example of polymer A3] Water was charged in a reaction vessel with a stirrer: 317 g (17.6 mol), and the mixture was stirred while being replaced with nitrogen, and the temperature was raised to 75 ° C. in a nitrogen environment. MAA was mixed and dissolved in 2 hours: 46.5 g (0.54 mole), monomer a2-1 323 g (0.06 mole) (mass ratio = 12.6 / 87.4, mole ratio = 90/10), and water: 239 g ( 13.3 moles), 10% by mass of an ammonium persulfate aqueous solution: 41.7 g, and 2-mercaptoethanol: 1.9 g were simultaneously added dropwise to the reaction system. Next, a 10 mass% ammonium persulfate aqueous solution: 13.9 g was added dropwise over 30 minutes, and the mixture was aged at the same temperature (75 ° C) for 1 hour. After the aging was completed, 49.3 g of a 48% by mass aqueous NaOH solution was added and neutralized to obtain a polymer A3 (36% by mass aqueous solution). [Production example of polymer A4] Water was charged in a reaction container with a stirrer: 275 g (15.3 mol), and while stirring, nitrogen was substituted, and the temperature was raised to 75 ° C. in a nitrogen environment. MAA: 9.5 g (0.11 mole), monomer a2-1: 323 g (0.06 mole) (mass ratio = 2.9 / 97.1, mole ratio a1 / a2 = 65/35) and water were dissolved and mixed in 2 hours. : 239 g (13.3 mol) of the obtained, a 10% by mass aqueous solution of ammonium persulfate: 3.8 g, and 1.2 g of 2-mercaptoethanol were simultaneously added dropwise to the reaction system. Next, a 10 mass% ammonium persulfate aqueous solution: 11.9 g was added dropwise over 30 minutes, and the mixture was aged at the same temperature (75 ° C) for 1 hour. After the aging was completed, 13.1 g of a 48% by mass aqueous NaOH solution was added and neutralized to obtain a polymer A4 (38% by mass aqueous solution). [Production example of polymer A5] Water was charged in a reaction container with a stirrer: 449 g (24.9) moles, while stirring and nitrogen substitution, and the temperature was raised to 80 ° C in a nitrogen environment. MAA: 55.9 g (0.65 moles), monomer a2-2: 390 g (0.35 moles) (mass ratio = 12.5 / 87.5, mole ratio = 65/35) and water: 220 g (12.2 mol) The obtained, 10% by mass aqueous ammonium persulfate solution: 31.0 g, and 2-mercaptoethanol: 4.2 g were added to the reaction system simultaneously and dropwise, respectively. Next, a 10 mass% ammonium persulfate aqueous solution: 10.5 g was added dropwise over 30 minutes, and the mixture was aged at the same temperature (75 ° C) for 1 hour. After the aging was completed, 54.2 g of a 48% by mass NaOH aqueous solution was added and neutralized to obtain a polymer A5 (37% by mass aqueous solution). [Production Example of Polymer A6] Water was charged in a reaction container with a stirrer: 292 g (16.2 mol), while stirring and nitrogen substitution, and the temperature was raised to 75 ° C. in a nitrogen environment. MAA: 102 g (1.19 moles), monomer a2-1: 339 g (0.063 moles) (mass ratio = 23.1 / 76.9, mole ratio = 95/5), and water: 252 g (14.0 mol) The obtained, 10% by mass of an aqueous solution of ammonium persulfate: 71.5 g, and 2-mercaptoethanol: 10.3 g were simultaneously added dropwise to the reaction system. Next, a 10 mass% ammonium persulfate aqueous solution: 57.2 g was added dropwise over 30 minutes, and the mixture was aged at the same temperature (75 ° C) for 1 hour. After the aging was completed, 103.3 g of a 48% by mass NaOH aqueous solution was added and neutralized to obtain a polymer A6 (36% by mass aqueous solution). [Production example of polymer A7] A reaction vessel with a stirrer was charged with water: 303 g (16.8 mol), while stirring, nitrogen substitution was performed, and the temperature was raised to 75 ° C. in a nitrogen environment. MAA: 40.4 g (0.47 moles), monomer a2-3: 257 g (0.53 moles) (mass ratio = 13.3 / 86.7, mole ratio = 47/53) and water: 152 g (8.42 mol) The obtained, 10 mass% ammonium persulfate aqueous solution: 15.5 g, and 2-mercaptoethanol: 2.1 g were simultaneously added dropwise to the reaction system. Next, a 10% by mass ammonium persulfate aqueous solution: 5.2 g was added dropwise over 30 minutes, and the mixture was aged at the same temperature (75 ° C.) for 1 hour. After the aging was completed, 39.2 g of a 48% by mass NaOH aqueous solution was added and neutralized to obtain a polymer A7 (37% by mass aqueous solution). [Production Example of Polymer A8] Water was charged in a reaction vessel with a stirrer: 22.6 g (1.26 mol), and while stirring, nitrogen was replaced, and the temperature was raised to 85 ° C in a nitrogen environment. AA: 8.7 g (0.12 mole), monomer a2-4: 89.6 g (0.047 mole) (mass ratio = 8.8 / 91.2, mole ratio = 72/28) and water: 92.3 g (5.13 mole) The obtained, a 5% by mass aqueous solution of ammonium persulfate: 15.0 g, and a 6% by mass aqueous solution of β-mercaptopropionic acid: 15.0 g were simultaneously added dropwise to the reaction system. Next, a 22 mass% ammonium persulfate aqueous solution: 5.0 g was added dropwise over 5 minutes, and the mixture was aged at the same temperature (85 ° C) for 0.5 hours. After the aging was completed, 10.1 g of a 48% by mass aqueous NaOH solution was added and neutralized to obtain a polymer A8 (38% by mass aqueous solution). [Polymer A9] ・ Sodium polyacrylate "Aron A-210" (43 mass% aqueous solution, weight average molecular weight is 3000, manufactured by Toa Synthesis Co., Ltd.) [Polymer A10] ・ Sodium polyacrylate (35 mass% aqueous solution , Weight average molecular weight is 60,000, manufactured by Polysciences, Inc.] [Polymer A11] • Polyethylene glycol methyl ether (number average molecular weight is 5000, manufactured by Sigmα-Aldrich) [Polymer A12] • Dodecylbenzenesulfonic acid Sodium "Neopelex G-25" (25% by mass aqueous solution, manufactured by Kao Corporation) [Production example of polymer A13] Fill a reaction vessel with a stirrer with water: 90.5 g (5.0 mol) on one side The mixture was stirred and replaced with nitrogen, and the temperature was raised to 75 ° C in a nitrogen environment. MA was mixed and dissolved in 2 hours: 63.7 g (0.65 moles), monomer a2-5: 525 g (0.35 moles) (mass ratio = 11/89, mole ratio = 65/35), and water: 161 g (8.9 moles) The obtained, 10% by mass aqueous ammonium persulfate solution: 37.0 g were simultaneously added dropwise to the reaction system. Next, a 10 mass% ammonium persulfate aqueous solution: 14.8 g was added dropwise over 30 minutes, and the mixture was aged at the same temperature (75 ° C) for 3 hours. After the aging was completed, 108 g of a 48% by mass aqueous NaOH solution was added and neutralized to obtain a polymer A13 (a 60% by mass aqueous solution). [Production Example of Polymer A14] A reaction vessel with a stirrer was charged with water: 234 g (13.0 mol) and monomer a2-6: 546 g (0.24 mol), while stirring and nitrogen replacement. , The temperature was raised to 65 ° C. in a nitrogen environment, and 8.6 g of hydrogen peroxide water was added dropwise. Next, a mixture obtained by dissolving AA: 54.4 g (0.76 moles) and water: 45.6 g (2.5 moles), and dissolving β-mercaptopropionic acid: 8.0 g, L-ascorbic acid 3.3 g, and water were mixed and dissolved in 2 hours. : 38.8 g of each obtained were added dropwise to the reaction system at the same time. Thereafter, it was aged at the same temperature (65 ° C) for 1 hour. After maturation, 62.9 g of a 48% by mass aqueous NaOH solution was added for neutralization to obtain a polymer A14 (60% by mass aqueous solution) (AA / monomer a2-6 mass ratio = 9/91, Molar ratio = 76 / twenty four). [Production Example of Polymer A15] A reaction vessel with a stirrer was charged with water: 193 g (10.7 mol), 1,2-propylene glycol: 295 g (3.9 mol), AA: 5.0 g (0.069 mol) ), Monomer a2-7: 150 g (0.13 mol), while stirring, nitrogen substitution, and the temperature was raised to 85 ° C. in a nitrogen environment. The mixture obtained by dissolving AA: 49.7 g (0.69 mol), monomer a2-7: 150 g (0.13 mol), and water: 50.3 g (2.8 mol) was mixed and dissolved in 75 minutes, and the peroxodisulfate was mixed and dissolved. Sodium: 5.3 g and water: 21.2 g were simultaneously added dropwise to the reaction system. Next, the obtained AA: 45.1 g (0.63 mol), sodium peroxodisulfate: 4.8 g, and water: 30.3 g were mixed and dissolved in the reaction system at the same time in 135 minutes. Thereafter, it was aged at the same temperature (85 ° C) for 3 hours. After the aging was completed, 52.2 g of a 48% by mass NaOH aqueous solution was added for neutralization to obtain a polymer A15 (a 40% by mass solution) (AA / monomer a2-7 mass ratio = 25/75, Molar ratio = 84 / 16). [Polymer A16] Sodium salt of copolymer of acrylic acid / polyethylene glycol acrylate (average addition mole number of EO is 5) in polymer A16 (weight average molecular weight is 10,000, Japanese Patent Laid-Open No. 2000-309796) Compound E) described in the gazette. In Table 1, the acrylic acid that becomes the structural unit (a1) of the polymer A16 is represented as AA, and the polyethylene glycol acrylate that becomes the structural unit (a2) (the average addition mole number of EO is 5) is represented as the monomer a2 -8. [Measurement of weight average molecular weight] The weight average molecular weights of the polymers A1 to A11 and A13 to A16 were measured using a gel permeation chromatography (hereinafter also referred to as "GPC") method under the following conditions. The measurement results are shown in Table 1. The weight average molecular weight (348.5) of the polymer A12 in Table 1 is a value recorded on an international chemical substance safety card. [GPC conditions] Column: G4000PWXL + G2500PWXL (manufactured by Tosoh Co., Ltd.) Eluent: 0.2M phosphate buffer solution / CH 3 CN = 9/1 (volume ratio) Flow rate: 1.0 mL / min Column temperature: 40 ° C Detection: RI (Refractive Index, refractive index) Sample size: 0.5 mg / mL Standard substance: Polyethylene glycol conversion [Table 1] 2. Preparation of Detergent Compositions (Examples 1 to 22 and Comparative Examples 1 to 8) Each component described in Table 2 was mixed by mixing the ratio (mass%, active ingredient) described in Table 2 and The detergent compositions of Examples 1 to 22 and Comparative Examples 1 to 8 were prepared. The pH value is the pH value of the detergent composition at 25 ° C, and the value after immersing the electrode of the pH meter (East Asia Electric Industrial Co., Ltd., HM-30G) in the detergent composition for 3 minutes was measured. When adjusting the pH, potassium hydroxide and sulfuric acid are used. Component B and component C use the following. <Component B: Alkali agent> KOH: Potassium hydroxide (manufactured by Kanto Chemical Co., Ltd., deer grade, solid content of 48% by mass) MEA: monoethanolamine (manufactured by Japan Catalyst Co., Ltd.) MDA: N-methyldiamine Ethanolamine (manufactured by Japan Emulsifier Co., Ltd., amino alcohol MDA) EA: N- (β-amino ethyl) ethanolamine (manufactured by Japan Emulsifier Co., Ltd., amino alcohol EA) <Component C: Water> Water: Ultra-pure water made using continuous pure water manufacturing equipment (Pureconti PC-2000VRL type) and subsystems (Makuace KC-05H type) manufactured by Kurita Industry Co., Ltd. <Other components> Sulfuric acid: manufactured by Wako Pure Chemical Industries, Ltd. , Reagent special grade, purity is 95.0% by mass 3. Evaluation method [dispersion test method] Add 30.0 g of the detergent composition to a 50 mL polypropylene bottle, and add 0.15 g of nickel oxide particles (average particle size is less than 50 nm) , Using an ultrasonic cleaner UT-105HS (manufactured by Sharp Manufacturing System Co., Ltd., 100 W, 35 kHz, 30 minutes) for stirring, and using an ultraviolet-visible spectrophotometer UV-2700 (manufactured by Shimadzu Corporation, measuring waves) The length was 660 nm), and the absorbance of the supernatant was measured immediately after stirring and after standing for 1 hour. The absorbance immediately after stirring was set to 100, and the relative value is shown in Table 2 as the dispersibility. The larger the value, the better the dispersibility. [Cleanability test method] Ni-P plated aluminum alloy substrate (outer diameter: 95 mm f, inner diameter: 25 mm f, thickness: 1.75 mm) Dipping into a dispersion (concentration: 0.0025 mass%) of the average particle diameter of less than 50 nm) for 2 minutes, and preparing a cleaned substrate to be contaminated, that is, a cleaned substrate to which particles are attached. Then, the above-mentioned substrate to be cleaned was cleaned using each detergent composition, and the cleanability of each detergent composition was evaluated. Cleaning is performed as follows. (Cleaning) Using a cleaning device, clean five substrates to be cleaned under the following conditions. Prepare two sets of flushing tanks. (1) Cleaning-1: 4000 g of a detergent composition for cleaning is prepared. The prepared detergent composition was added to the cleaning tank (a), and the liquid temperature in the cleaning tank (a) was set to 25 ° C. Then, the substrate to be cleaned was immersed in the detergent composition in the cleaning tank (a), and the ultrasonic wave (200 kHz) was irradiated while the substrate was cleaned for 120 seconds. (2) Rinse-1: Add ultrapure water to the washing tank (b), and set it so that the liquid temperature in the washing tank (b) becomes 25 ° C. Then, the substrate to be cleaned in the cleaning tank (a) was moved to the washing tank (b) and immersed in ultrapure water in the washing tank (b), and the ultrasonic wave (600 kHz) was irradiated while washing for 120 seconds. (3) Repeat the procedure (2) again using the rinse tank (c) with ultrapure water prepared under the same conditions as the rinse tank (b). (4) Cleaning-2: Move the substrate to be cleaned in the washing tank (c) to the cleaning and cleaning unit (A) equipped with a cleaning brush. Then, the cleaning brush was sprayed with a cleaning composition at 25 ° C, while the cleaning brush was rotated at 400 rpm on both sides of the substrate to be cleaned in the presence of the cleaning composition, and pressed against each other at 25 ° C. Clean for 5 seconds at ℃. The detergent composition uses the same composition as the detergent composition used in "(1) Cleaning-1". (5) Rinse-2: Move the substrate to be cleaned to the scrubbing and cleaning unit (B) prepared under the same conditions as those of the scrubbing and cleaning unit (A), and spray ultra-pure water at 25 ° C. Make the cleaning brush the same as (4) The ground was rotated at 400 rpm on both sides of the substrate to be cleaned, and pressed on one side, thereby rinsing at 25 ° C for 5 seconds. (6) The scrubbing and cleaning unit (C) prepared under the same conditions as the scrubbing and cleaning unit (A), and the scrubbing and cleaning unit (D) prepared under the same conditions as those of the scrubbing and cleaning unit (B) are repeated (4) and (5). (7) Rinse-3: Add ultrapure water to the washing tank (e), and set the temperature of the liquid in the washing tank (e) to 25 ° C. Then, the substrate to be cleaned was moved to the washing tank (e) and immersed in ultrapure water in the washing tank (e), and was irradiated with ultrasonic waves (170 kHz) while being washed for 600 seconds. (8) Drying: The substrate to be cleaned is moved to a spin dryer, and the surface of the substrate is completely dried at a speed of 700 rpm for 60 seconds. [Evaluation method of cleanliness] Using a mode Q-scattering of an optical micro defect inspection device (Candela 7100, manufactured by KLA-Tencor), the cleaned substrate rotated at 10,000 rpm was irradiated with laser light, and the number of defects (on the substrate Of foreign matter). The above measurement was performed on each of the ten substrates for each detergent composition, and an average value was calculated. The value of Comparative Example 1 was set to 100, and the relative values are shown in Table 2. The smaller the value, the smaller the number of defects, and it can be evaluated that the cleanliness is excellent. [Table 2] As shown in Table 2, the detergent compositions of Examples 1 to 22 showed better dispersibility than the detergent compositions of Comparative Examples 1 to 8. Furthermore, the cleaner compositions of Examples 1 to 22 exhibited better cleanability than the cleaner compositions of Comparative Examples 1 to 8.

Claims (10)

一種用於硬碟用基板之清潔劑組合物,其含有聚合物(成分A),該聚合物包含源自下述通式(I)所表示之單體a1或其酐之結構單元(a1)、以及源自選自下述通式(II)所表示之單體及下述通式(III)所表示之單體中之至少1種單體a2的結構單元(a2),成分A之重量平均分子量為15000以上且200000以下,pH值為8以上,[式(I)中,R1、R2及R3分別獨立地表示氫原子、甲基或-(CH2)pCOOM2,M1及M2分別獨立地表示氫原子、鹼金屬、鹼土金屬(1/2原子)、或銨基,p表示0以上且2以下之整數][式(II)中,R4及R5分別獨立地表示氫原子或甲基,q表示0以上且2以下之整數,AO表示碳數為2或3之伸烷基氧基,n為AO之平均加成莫耳數,表示4以上且300以下之數,X表示氫原子或碳數為1以上且3以下之烷基][化3][式(III)中,R6及R7分別獨立地表示氫原子或甲基,r表示0以上且2以下之整數,AO表示碳數為2或3之伸烷基氧基,m為AO之平均加成莫耳數,表示4以上且300以下之數,Y表示氫原子或碳數為1以上且3以下之烷基]。A cleaner composition for a substrate for a hard disk, comprising a polymer (ingredient A) containing a structural unit (a1) derived from the monomer a1 or an anhydride represented by the following general formula (I) And the weight of component A derived from the structural unit (a2) of at least one monomer a2 selected from the monomers represented by the following general formula (II) and the monomers represented by the following general formula (III) The average molecular weight is 15,000 or more and 200,000 or less, and the pH is 8 or more. [In formula (I), R 1 , R 2, and R 3 each independently represent a hydrogen atom, a methyl group, or-(CH 2 ) p COOM 2 , and M 1 and M 2 each independently represent a hydrogen atom, an alkali metal, or alkaline earth. Metal (1/2 atom), or ammonium group, p represents an integer from 0 to 2] [In formula (II), R 4 and R 5 each independently represent a hydrogen atom or a methyl group, q represents an integer of 0 or more and 2 or less, AO represents an alkyleneoxy group having 2 or 3 carbon atoms, and n is AO The average addition mole number represents a number of 4 or more and 300 or less, and X represents a hydrogen atom or an alkyl group having a carbon number of 1 or more and 3 or less] [Chemical 3] [In formula (III), R 6 and R 7 each independently represent a hydrogen atom or a methyl group, r represents an integer of 0 or more and 2 or less, AO represents an alkyleneoxy group having 2 or 3 carbon atoms, and m is AO The average addition mole number represents a number of 4 or more and 300 or less, and Y represents a hydrogen atom or an alkyl group having a carbon number of 1 or more and 3 or less]. 如請求項1之清潔劑組合物,其中式(I)中,M1及M2分別獨立地表示有機銨基。The detergent composition according to claim 1, wherein in the formula (I), M 1 and M 2 each independently represent an organic ammonium group. 如請求項1之清潔劑組合物,其中成分A之重量平均分子量為20000以上且80000以下。The detergent composition according to claim 1, wherein the weight average molecular weight of the component A is 20,000 or more and 80,000 or less. 如請求項1至3中任一項之清潔劑組合物,其進而含有鹼劑(成分B)。The detergent composition according to any one of claims 1 to 3, further comprising an alkali agent (ingredient B). 如請求項4之清潔劑組合物,其中成分B為選自鹼金屬氫氧化物、羥基烷基胺及四級銨鹽中之至少1種。The detergent composition according to claim 4, wherein component B is at least one selected from the group consisting of an alkali metal hydroxide, a hydroxyalkylamine, and a quaternary ammonium salt. 如請求項1至3中任一項之清潔劑組合物,其中清潔劑組合物之清潔時之成分A之含量為0.001質量%以上且10質量%以下。The cleaner composition according to any one of claims 1 to 3, wherein the content of the component A during cleaning of the cleaner composition is 0.001% by mass or more and 10% by mass or less. 一種基板之清潔方法,其包括使用如請求項1至6中任一項之清潔劑組合物對被清潔基板進行清潔之清潔步驟,上述被清潔基板為利用研磨液組合物進行研磨後之基板。A substrate cleaning method includes a cleaning step of cleaning a substrate to be cleaned using the detergent composition according to any one of claims 1 to 6, wherein the substrate to be cleaned is a substrate that has been polished with a polishing liquid composition. 如請求項7之清潔方法,其中上述基板為經Ni-P鍍覆之鋁合金基板。The cleaning method of claim 7, wherein the substrate is an aluminum alloy substrate plated with Ni-P. 如請求項7或8之清潔方法,其中上述研磨液組合物為含有氧化矽研磨粒之研磨液組合物。The cleaning method according to claim 7 or 8, wherein the polishing liquid composition is a polishing liquid composition containing silicon oxide abrasive particles. 一種硬碟用基板之製造方法,其包括使用如請求項1至6中任一項之清潔劑組合物對被清潔基板進行清潔之清潔步驟,上述被清潔基板為利用研磨液組合物進行研磨後之基板。A method for manufacturing a substrate for a hard disk, comprising a cleaning step of cleaning a substrate to be cleaned using the detergent composition according to any one of claims 1 to 6, wherein the substrate to be cleaned is polished by using a polishing liquid composition The substrate.
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