TWI672485B - Emission spectroscopy device - Google Patents

Emission spectroscopy device Download PDF

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TWI672485B
TWI672485B TW107111780A TW107111780A TWI672485B TW I672485 B TWI672485 B TW I672485B TW 107111780 A TW107111780 A TW 107111780A TW 107111780 A TW107111780 A TW 107111780A TW I672485 B TWI672485 B TW I672485B
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gas
pressurizer
gas supply
discharge chamber
discharge
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TW201842312A (en
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菅瀬晶
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日商島津製作所股份有限公司
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/67Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges

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  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
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  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
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Abstract

於發光分光分析裝置中設置:放電室,藉由在內部產生放電來使試樣進行激發發光;加壓器,作為收容液體的容器;氣體供給源,填充有被壓縮成大氣壓以上的惰性氣體;氣體供給用管路,一端與氣體供給源連接,另一端與放電室連接;氣體排出用管路,一端與放電室連接,另一端朝加壓器內的液體中打開;排氣管路,一端於加壓器內配置於比液體的液面更上方,另一端朝該加壓器的外部打開;壓力感測器,測定氣體供給用管路內的惰性氣體的壓力;以及警告部件,當由壓力感測器所得的測定值超過事先規定的值時對用戶發出警告。 The light emitting spectroscopic analysis device is provided with: a discharge chamber that excites the sample by generating an internal discharge; a pressurizer as a container for containing a liquid; a gas supply source filled with an inert gas compressed to an atmospheric pressure or more; One end of the gas supply pipe is connected to the gas supply source and the other end is connected to the discharge chamber. The gas discharge pipe is connected to the discharge chamber at one end and the other end is opened into the liquid in the pressurizer. The exhaust line is at one end. It is arranged in the pressurizer above the liquid level and the other end is opened to the outside of the pressurizer; the pressure sensor measures the pressure of the inert gas in the gas supply pipe; and the warning component The user is warned when the measured value obtained by the pressure sensor exceeds a predetermined value.

Description

發光分光分析裝置 Luminescence spectroscopic analysis device

本發明是有關於一種藉由放電來使固體試樣進行激發發光,並對其發光光進行分光測定的發光分光分析裝置。 The present invention relates to a light emission spectroscopic analysis device that excites and emits a solid sample by electric discharge and performs spectroscopic measurement of the light emitted.

於發光分光分析裝置中,通常藉由電弧放電或火花放電等來對作為金屬或非金屬的固體試樣賦予能量,藉此使該試樣進行蒸發氣化及激發發光,將其發光光導入至分光器中後取出具有各元素所特有的波長的光譜線來進行檢測(例如,參照專利文獻1)。尤其,將火花放電用於激發源的發光分光分析裝置可進行精度高的分析,因此例如於鋼鐵材料或非鐵金屬材料等的生產工廠中,廣泛地用於進行所生產的金屬體中的組成分析。 In a light emission spectroscopic analysis device, an arc discharge, a spark discharge, or the like is usually used to apply energy to a solid sample that is a metal or a nonmetal, thereby evaporating and vaporizing the sample, and exciting the light. Spectral lines having wavelengths peculiar to each element are taken out after detection in the spectroscope (for example, refer to Patent Document 1). In particular, a light-emitting spectroscopic analysis device using a spark discharge as an excitation source can perform high-precision analysis. Therefore, for example, it is widely used for the composition of a produced metal body in a production plant such as a steel material or a non-ferrous metal material. analysis.

將習知一般的發光分光分析裝置的構成示於圖3中。該發光分光分析裝置包括:激發部210,使固體試樣S進行激發發光;分光部220,使來自所述試樣S的發光光進行波長分散來進行檢測;以及控制‧處理部230,進行各部的控制及資料處理。 The configuration of a conventional general light emission spectroscopic analysis device is shown in FIG. 3. The light emission spectroscopic analysis device includes an excitation unit 210 for exciting and emitting solid sample S, a spectroscopic unit 220 for detecting wavelength dispersion of light emitted from the sample S, and a control / processing unit 230 for each unit. Control and data processing.

激發部210具備:放電產生部211、電極棒212、放電室213、試樣載置板214及聚光透鏡215。於放電室213中設置有 朝斜上方敞開的分析開口及用以自放電室213中取出光的導光孔213a,試樣載置板214以覆蓋所述分析開口的方式裝卸自如地安裝於放電室213的上部。試樣載置板214具有比試樣S小的中央開口214a,將試樣S以覆蓋試樣載置板214的中央開口214a的方式載置於試樣載置板214上,藉此試樣S的下表面(被分析面)的一部分露出至放電室213的內部。用於放電的電極棒212以使其前端朝向所述中央開口214a的狀態配設於放電室213的內部。 The excitation unit 210 includes a discharge generating unit 211, an electrode rod 212, a discharge chamber 213, a sample mounting plate 214, and a condenser lens 215. Provided in the discharge chamber 213 An analysis opening opened obliquely upward and a light guide hole 213a for taking out light from the discharge chamber 213. The sample mounting plate 214 is detachably mounted on the upper portion of the discharge chamber 213 so as to cover the analysis opening. The sample mounting plate 214 has a central opening 214a smaller than the sample S, and the sample S is placed on the sample mounting plate 214 so as to cover the central opening 214a of the sample mounting plate 214. Part of the lower surface (analyzed surface) of S is exposed to the inside of the discharge cell 213. The electrode rod 212 for discharging is arranged inside the discharge chamber 213 with its tip facing the central opening 214a.

放電產生部211將脈衝狀的高電壓與規定頻率(例如400Hz)同步地施加至電極棒212中。鐵或非鐵金屬等試樣S藉由來自電極棒212的火花放電而進行激發發光。由試樣S的激發發光所產生的發光光穿過設置於放電室213中的導光孔213a,由聚光透鏡215聚光後經由入口狹縫221而被導入至分光部220中。 The discharge generator 211 applies a high pulse-like voltage to the electrode rod 212 in synchronization with a predetermined frequency (for example, 400 Hz). Samples S such as iron or non-ferrous metals are excited to emit light by spark discharge from the electrode rod 212. The light emitted by the excitation light emission of the sample S passes through the light guide hole 213a provided in the discharge chamber 213, is collected by the condenser lens 215, and is then introduced into the beam splitter 220 through the entrance slit 221.

分光部220如專利文獻1等中所揭示般,為了獲得多個元素各自所特有的波長的光譜線,而具有用以使來自試樣S的光進行波長分散的繞射光柵222,配置於各波長的光譜線到達的位置上的出口狹縫223a、出口狹縫223b、出口狹縫223c,以及配置於各出口狹縫223a、223b、223c的後方的多個光檢測器(通常為光電倍增管)224a、224b、224c。自所述激發部210經由入口狹縫221而射入至分光部220中的光藉由所述繞射光柵222而進行波長分散,其波長分散光中的穿過各出口狹縫223a、223b、223c的規定的波長範圍的光由各光檢測器224a、224b、224c來進行檢測。 As disclosed in Patent Document 1, etc., the spectroscopic section 220 has a diffraction grating 222 for dispersing the wavelength of light from the sample S in order to obtain a spectral line with a wavelength unique to each of the plurality of elements, and is disposed at each An exit slit 223a, an exit slit 223b, an exit slit 223c, and a plurality of photodetectors (usually photomultiplier tubes) arranged behind the exit slits 223a, 223b, and 223c at positions where the spectral line of the wavelength reaches ) 224a, 224b, 224c. The light incident from the excitation unit 210 through the entrance slit 221 into the spectroscopic unit 220 is wavelength-dispersed by the diffraction grating 222, and the wavelength-dispersed light passes through the exit slits 223a, 223b, Light in a predetermined wavelength range of 223c is detected by each of the photodetectors 224a, 224b, and 224c.

藉由試樣的測定所獲得的源自各光檢測器(224a、 224b、224c)的檢測信號經由類比/數位(Analog/Digital,A/D)轉換部225而被輸入至控制‧處理部230中,藉由進行規定的資料處理來求出具有某一含量的某一元素的光譜線的強度,並根據其執行對於各元素的定量分析等。 Each photodetector (224a, 224b, 224c) detection signals are input to the control and processing unit 230 through the analog / digital (A / D) conversion unit 225, and a certain data content is obtained by performing a predetermined data processing. The intensity of the spectral line of an element, and a quantitative analysis of each element and the like are performed according to it.

於如所述般的發光分光分析裝置中,以抑制放電室213內的氣體成分對於分析結果的影響、或使放電穩定來提高分析精度、不使具有真空紫外區域的波長的光衰減而導入至分光器(分光部220)中、以及防止由因放電而蒸發的源自試樣的微粒子停留於放電室213內所引起的分析精度的惡化等為目的,於試樣的測定時,將高純度氬氣導入至放電室213中。因此,於放電室213上連接有用以自儲氣罐等氣體供給源241朝放電室213中供給氬氣的氣體供給用管路242、及用以自放電室213中排出氣體的氣體排出用管路245。於氣體供給用管路242上設置有開關閥243與流量調節閥244,藉由控制‧處理部230或用戶驅動該些閥來執行朝放電室213中的氬氣導入。 In the light emission spectroscopic analysis device as described above, the influence of gas components in the discharge chamber 213 on the analysis result is suppressed, or the discharge is stabilized to improve the analysis accuracy, and the light having a wavelength in the vacuum ultraviolet region is not attenuated and introduced to In the spectroscope (spectroscopy section 220), and to prevent deterioration of the analysis accuracy caused by microparticles originating from the sample that evaporate due to discharge remaining in the discharge chamber 213, etc., the purity of the sample is measured with high purity Argon is introduced into the discharge chamber 213. Therefore, the discharge chamber 213 is connected to a gas supply pipe 242 for supplying argon gas from a gas supply source 241 such as a gas storage tank to the discharge chamber 213, and a gas discharge pipe for discharging gas from the discharge chamber 213. Road 245. The gas supply pipe 242 is provided with an on-off valve 243 and a flow rate adjustment valve 244, and the control / processing unit 230 or a user drives these valves to perform the introduction of argon gas into the discharge chamber 213.

進而,為了防止由來自周圍的空氣的流入所引起的氬氣純度的下降,放電室213內必須維持成比大氣壓高的壓力。因此,氣體排出用管路245的末端並非朝大氣打開,而被導入至被稱為加壓器246的容器中,朝該加壓器246中所收容的水或油等液體246a中打開。此時,自氣體排出用管路245的末端導入至加壓器246內的氣體經由設置於加壓器246中的排氣管路247而排出至外部。再者,該排氣管路247的一端配置於比加壓器246內的液面 更上方,另一端於加壓器246的外部朝大氣打開。 Furthermore, in order to prevent a decrease in the purity of argon gas caused by the inflow of air from the surroundings, the pressure in the discharge chamber 213 must be maintained at a pressure higher than the atmospheric pressure. Therefore, the end of the gas exhaust pipe 245 is not opened to the atmosphere, but is introduced into a container called a pressurizer 246, and opens into a liquid 246a such as water or oil contained in the pressurizer 246. At this time, the gas introduced into the pressurizer 246 from the end of the gas discharge line 245 is discharged to the outside through the exhaust line 247 provided in the pressurizer 246. Furthermore, one end of the exhaust pipe 247 is disposed at a level higher than the liquid level in the pressurizer 246. Further above, the other end is opened to the atmosphere outside the pressurizer 246.

於放電室213內蒸發的源自試樣的微粒子中的一部分由該加壓器246內的液體246a捕捉,但大部分穿過加壓器246。因此,為了防止該微粒子被放出至室內,通常經由排氣設備而將來自加壓器246的排氣放出至室外,或如圖3所示,穿過設置於排氣管路247上的過濾器248而放出至室內。 Some of the sample-derived particles evaporated in the discharge chamber 213 are captured by the liquid 246 a in the pressurizer 246, but most of them pass through the pressurizer 246. Therefore, in order to prevent the particles from being released indoors, the exhaust gas from the pressurizer 246 is usually released to the outside through an exhaust device, or as shown in FIG. 3, passed through a filter provided on the exhaust pipe 247 248 and released indoors.

[現有技術文獻] [Prior Art Literature]

[專利文獻] [Patent Literature]

[專利文獻1]日本專利特開2001-83096號公報 [Patent Document 1] Japanese Patent Laid-Open No. 2001-83096

當如所述般使用過濾器248時,必須定期地更換過濾器。假設於不進行更換而繼續使用的情況下,存在因過濾器248的堵塞而導致來自加壓器246的排氣流量下降,最終完全不流動之虞。另外,即便於不使用過濾器,經由排氣設備而朝室外放出排氣的情況下,例如亦存在因已蒸發的試樣的微粒子堆積於排氣設備的流路內、或於寒冷地區用以朝室外放出排氣的管路的末端結冰,而導致來自加壓器246的排氣不流動的可能性。 When the filter 248 is used as described, the filter must be replaced periodically. If it is continued to be used without replacement, there is a possibility that the exhaust gas flow rate from the pressurizer 246 decreases due to the clogging of the filter 248 and eventually does not flow at all. In addition, even when the exhaust gas is discharged to the outside through the exhaust device without using a filter, for example, particles of the evaporated sample may accumulate in the flow path of the exhaust device or may be used in a cold area. There is a possibility that the end of the pipe that discharges the exhaust gas to the outside freezes, and the exhaust gas from the pressurizer 246 may not flow.

若因此種流路的堵塞而導致來自加壓器246的排氣積壓,則於試樣的測定時自氣體供給源241至加壓器246的氣體流路內(即氣體供給用管路242、放電室213、氣體排出用管路245及加壓器246的內部空間)的壓力增大,於測定結束後在自試樣載置板214上移除試樣S的瞬間,有可能產生加壓器246內的液 體246a倒流至放電室213中而污染放電室213內等不良情況。 If the backlog of exhaust gas from the pressurizer 246 is caused by the clogging of such a flow path, the gas flow path from the gas supply source 241 to the pressurizer 246 (that is, the gas supply line 242, The internal pressure of the discharge chamber 213, the gas exhaust pipe 245, and the pressurizer 246) increases, and pressure may be generated at the moment the sample S is removed from the sample mounting plate 214 after the measurement is completed. Fluid in the vessel 246 The body 246a flows back into the discharge chamber 213 and contaminates the inside of the discharge chamber 213, and the like.

本發明是鑒於此點而成者,其目的在於提供一種不會產生如所述般的由自加壓器起的排氣流路的堵塞所引起的不良情況的發光分光分析裝置。 The present invention has been made in view of this point, and it is an object of the present invention to provide a light emission spectroscopic analysis device that does not cause a failure caused by a clogging of an exhaust flow path from a pressurizer as described above.

為了解決所述課題而形成的第1發明的發光分光分析裝置包括:a)放電室,藉由在內部產生放電來使試樣進行激發發光;b)加壓器,作為收容液體的容器;c)氣體供給源,填充有被壓縮成大氣壓以上的惰性氣體;d)氣體供給用管路,一端與所述氣體供給源連接,另一端與所述放電室連接;e)氣體排出用管路,一端與所述放電室連接,另一端朝所述加壓器內的所述液體中打開;f)排氣管路,一端於所述加壓器內配置於比所述液體的液面更上方,另一端朝該加壓器的外部打開;g)壓力感測器,測定所述氣體供給用管路、所述放電室、所述氣體排出用管路或所述加壓器的任一個的內部空間內的所述惰性氣體的壓力;以及h)警告部件,當由所述壓力感測器所得的測定值超過事先規 定的值時對用戶發出警告。 The light-emitting spectroscopic analysis device of the first invention, which is formed to solve the above-mentioned problems, includes: a) a discharge chamber that emits light to excite a sample by generating an internal discharge; b) a pressurizer as a container for storing a liquid; c ) A gas supply source filled with an inert gas compressed to an atmospheric pressure or more; d) a gas supply pipeline, one end of which is connected to the gas supply source and the other end of which is connected to the discharge chamber; e) a gas discharge pipeline, One end is connected to the discharge chamber, and the other end is opened into the liquid in the pressurizer; f) an exhaust line, one end is disposed in the pressurizer above the liquid level of the liquid , The other end opens toward the outside of the pressurizer; g) a pressure sensor that measures any of the gas supply line, the discharge chamber, the gas exhaust line, or the pressurizer The pressure of the inert gas in the internal space; and h) a warning component, when the measured value obtained by the pressure sensor exceeds a predetermined regulation Warn the user when the value is set.

於如所述般的具備自氣體供給源經由氣體供給用管路而朝放電室內供給惰性氣體,進而自放電室經由氣體排出用管路、加壓器及排氣管路而將該惰性氣體朝外部排出的功能的發光分光分析裝置中,若於來自加壓器的排氣的流路上產生堵塞,則自所述氣體供給源經由放電室而到達加壓器的惰性氣體的流路內的壓力異常地上升。因此,於所述第1發明中,利用壓力感測器對所述惰性氣體的流路,即氣體供給用管路、放電室、氣體排出用管路或加壓器的任一個的內部空間內的所述惰性氣體的壓力進行測定,當所獲得的測定值超過事先規定的值時對用戶發出警告。藉此,用戶可立即知道於來自所述加壓器的排氣的流路上產生了堵塞,例如可採取更換設置於該排氣的流路上的過濾器、或進行包含該流路的排氣設備的檢查‧維修等對策。其結果,可將如所述般的加壓器內的液體的倒流等不良情況防患於未然。 As described above, the inert gas is supplied into the discharge chamber from the gas supply source through the gas supply pipe, and the inert gas is further supplied from the discharge chamber through the gas discharge pipe, the pressurizer, and the exhaust pipe. In a light emission spectroscopic analyzer having a function of external discharge, if a blockage occurs in the flow path of the exhaust gas from the pressurizer, the pressure in the flow path of the inert gas from the gas supply source to the pressurizer via the discharge chamber Rise abnormally. Therefore, in the above-mentioned first invention, the pressure sensor is used for the flow path of the inert gas, that is, in the internal space of any one of a gas supply pipe, a discharge chamber, a gas discharge pipe, or a pressurizer. The pressure of the inert gas is measured, and a warning is issued to the user when the obtained measured value exceeds a predetermined value. Thereby, the user can immediately know that a blockage has occurred in the flow path of the exhaust gas from the pressurizer. For example, it is possible to replace the filter provided on the flow path of the exhaust gas or to perform exhaust equipment including the flow path. Measures such as inspection and maintenance. As a result, problems such as backflow of liquid in the pressurizer as described above can be prevented in advance.

另外,為了解決所述課題而形成的第2發明的發光分光分析裝置包括:a)放電室,藉由在內部產生放電來使試樣進行激發發光;b)加壓器,作為收容液體的容器;c)氣體供給源,填充有被壓縮成大氣壓以上的惰性氣體;d)氣體供給用管路,一端與所述氣體供給源連接,另一端朝所述放電室內打開;e)氣體排出用管路,一端朝所述放電室內打開,另一端朝所 述加壓器內的所述液體中打開;f)排氣管路,一端於所述加壓器內配置於比所述液體的液面更上方,另一端朝該加壓器的外部打開;g)流量感測器,測定所述氣體供給用管路、所述氣體排出用管路或所述排氣管路中的所述惰性氣體的流量;以及h)警告部件,當由所述流量感測器所得的測定值低於事先規定的值時對用戶發出警告。 In addition, a light-emitting spectroscopic analysis device of a second invention formed to solve the above-mentioned problems includes: a) a discharge chamber that emits light to excite a sample by generating an internal discharge; b) a pressurizer as a container for storing a liquid C) a gas supply source filled with an inert gas compressed above atmospheric pressure; d) a gas supply pipe, one end of which is connected to the gas supply source, and the other end opened toward the discharge chamber; e) a gas discharge tube Circuit, one end opens toward the discharge chamber, and the other end faces The liquid in the pressurizer is opened; f) an exhaust pipe, one end of which is arranged in the pressurizer above the liquid level of the liquid, and the other end is opened to the outside of the pressurizer; g) a flow sensor that measures the flow of the inert gas in the gas supply line, the gas exhaust line, or the exhaust line; and h) a warning component, The sensor warns the user when the measured value obtained by the sensor is lower than a predetermined value.

於如所述般的具備自氣體供給源經由氣體供給用管路而朝放電室內供給惰性氣體,進而自放電室經由氣體排出用管路、加壓器及排氣管路而將該惰性氣體朝外部排出的功能的發光分光分析裝置中,若於來自加壓器的排氣的流路上產生堵塞,則所述氣體供給用管路、排出用管路及排氣管路中的惰性氣體的流量異常地下降。因此,於所述第2發明中,利用流量感測器對氣體供給用管路、氣體排出用管路或排氣管路中的所述惰性氣體的流量進行測定,當所獲得的測定值低於事先規定的值時對用戶發出警告。藉此,用戶可立即知道於來自所述加壓器的排氣的流路上產生了堵塞,例如可採取更換設置於該排氣的流路上的過濾器、或進行包含該流路的排氣設備的檢查‧維修等對策。其結果,可將所述加壓器內的液體的倒流等不良情況防患於未然。 As described above, the inert gas is supplied into the discharge chamber from the gas supply source through the gas supply pipe, and the inert gas is further supplied from the discharge chamber through the gas discharge pipe, the pressurizer, and the exhaust pipe. In a light emission spectroscopic analysis device having an external discharge function, if a blockage occurs in a flow path of exhaust gas from a pressurizer, the flow rate of the inert gas in the gas supply pipe, the discharge pipe, and the exhaust pipe Falling abnormally. Therefore, in the second invention, the flow rate of the inert gas in the gas supply pipe, the gas exhaust pipe, or the exhaust pipe is measured by a flow sensor, and the measured value obtained is low when Warn the user at a predetermined value. Thereby, the user can immediately know that a blockage has occurred in the flow path of the exhaust gas from the pressurizer. For example, it is possible to replace the filter provided on the flow path of the exhaust gas or to perform exhaust equipment including the flow path. Measures such as inspection and maintenance. As a result, problems such as backflow of liquid in the pressurizer can be prevented in advance.

再者,作為所述第1發明或第2發明中的所述警告部件,可考慮如下的警告部件:於由所述壓力感測器所得的測定值超過事先規定的值的情況下、或由所述流量感測器所得的測定值 低於事先規定的值的情況下,將該意思或於來自所述加壓器的排氣的流路上產生了堵塞的意思以文字或圖形的形式輸出至監視器的畫面上、或以聲音的形式自揚聲器中輸出。另外,並不限定於該些警告部件,亦可將所述警告部件設為於由所述壓力感測器所得的測定值超過事先規定的值的情況下、或由所述流量感測器所得的測定值低於事先規定的值的情況下,使燈點燈或鳴響蜂鳴器。 Furthermore, as the warning means in the first or second invention, a warning means may be considered in a case where a measured value obtained by the pressure sensor exceeds a predetermined value, or Measured value obtained by the flow sensor When the value is lower than a predetermined value, the meaning or the clogging in the flow path of the exhaust gas from the pressurizer is output to the monitor screen in the form of text or graphics, or in the form of sound. The form is output from the speaker. In addition, it is not limited to these warning members, and the warning member may be set when a measured value obtained by the pressure sensor exceeds a predetermined value or obtained by the flow sensor. When the measured value is lower than the predetermined value, turn on the light or sound the buzzer.

理想的是將所述第1發明或第2發明的發光分光分析裝置設為如下者:進而具有設置於所述氣體供給用管路上的流量調節閥,且所述壓力感測器或所述流量感測器配置在所述氣體供給用管路上的該流量調節閥與所述放電室之間。 It is desirable that the light emission spectroscopic analysis device according to the first or second invention is further provided with a flow rate adjustment valve provided in the gas supply line, and the pressure sensor or the flow rate A sensor is disposed between the flow regulating valve on the gas supply pipe and the discharge chamber.

另外,亦可將所述第1發明或第2發明的發光分光分析裝置設為除了所述警告部件以外或代替所述警告部件,具有氣體供給停止部件,所述氣體供給停止部件於由所述壓力感測器所得的測定值超過事先規定的值的情況下、或由所述流量感測器所得的測定值低於事先規定的值的情況下,停止自所述氣體供給源朝所述放電室中的惰性氣體的供給。 The light emission spectroscopic analysis device according to the first or second invention may include a gas supply stop means in addition to or in place of the warning means, and the gas supply stop means may be provided by the When the measured value obtained by the pressure sensor exceeds a predetermined value, or when the measured value obtained by the flow sensor is lower than a predetermined value, the discharge from the gas supply source to the discharge is stopped. Supply of inert gas in the chamber.

根據此種構成,當於來自加壓器的排氣的流路上產生了堵塞時,所述惰性氣體的供給被自動地停止,因此即便於用戶不在裝置的附近的情況下,亦可防止惰性氣體的壓力進一步上升。 According to this configuration, when a blockage occurs in the flow path of the exhaust gas from the pressurizer, the supply of the inert gas is automatically stopped, so that the inert gas can be prevented even when the user is not in the vicinity of the device. The pressure has risen further.

另外,亦可將所述第1發明或第2發明的發光分光分析裝置設為具備氣體放出部件的構成,所述氣體放出部件於由所述壓力感測器所得的測定值超過事先規定的值的情況下、或由所述 流量感測器所得的測定值低於事先規定的值的情況下,將惰性氣體自所述氣體排出用管路、或所述加壓器朝外部放出。 In addition, the light emission spectroscopic analysis device according to the first or second invention may be configured to include a gas emission member whose measured value obtained by the pressure sensor exceeds a predetermined value. Case, or by the When the measured value obtained by the flow sensor is lower than a predetermined value, an inert gas is discharged from the gas exhaust pipe or the pressurizer to the outside.

另外,亦可設為代替所述氣體放出部件,於所述氣體排出用管路或所述加壓器中設置有伴隨所述惰性氣體的壓力上升而被打開,並將該氣體排出用管路或該加壓器內的惰性氣體朝外部放出的釋放閥(relief valve)的構成。 In addition, instead of the gas discharge member, the gas discharge line or the pressurizer may be provided with a pressure increase of the inert gas to be opened, and the gas discharge line may be opened. Or a configuration of a relief valve which releases an inert gas in the pressurizer to the outside.

根據此種構成,當於來自加壓器的排氣的流路上產生了堵塞時,藉由所述氣體放出部件或所述釋放閥來將惰性氣體自氣體排出用管路或加壓器中排出,因此即便於用戶位於遠離裝置的地方的情況下,亦可立即消除惰性氣體的壓力的異常上升。 According to this configuration, when a blockage occurs in the flow path of the exhaust gas from the pressurizer, the inert gas is discharged from the gas exhaust line or the pressurizer by the gas release member or the release valve. Therefore, even when the user is located away from the device, the abnormal rise in the pressure of the inert gas can be eliminated immediately.

如以上所說明般,根據包含所述構成的本發明的發光分光分析裝置,例如當因如所述般的過濾器的堵塞、試樣微粒子朝排氣設備內的堆積、或管路的結冰等而於來自加壓器的排氣的流路上產生了堵塞時,根據壓力感測器或流量感測器的測定值而探測到該意思,並對用戶發出警告、或停止惰性氣體的供給、或將該惰性氣體朝裝置外排出。因此,可防止不期望的壓力上升,並避免加壓器內的液體倒流等不良情況。 As described above, according to the light-emitting spectroscopic analysis device of the present invention including the above configuration, for example, when the filter is clogged as described above, the sample particles are deposited in the exhaust device, or the pipeline is frozen. When a blockage in the flow path of the exhaust gas from the pressurizer is detected, the meaning is detected based on the measurement value of the pressure sensor or the flow sensor, and the user is warned, or the supply of the inert gas is stopped, Or vent the inert gas outside the device. Therefore, it is possible to prevent an undesired pressure rise, and to avoid problems such as a backflow of liquid in the pressurizer.

110、210‧‧‧激發部 110, 210‧‧‧Excitation Department

111、211‧‧‧放電產生部 111, 211‧‧‧discharge generation unit

112、212‧‧‧電極棒 112, 212‧‧‧ electrode rods

113、213‧‧‧放電室 113, 213‧‧‧discharge chamber

113a、213a‧‧‧導光孔 113a, 213a‧‧‧light guide hole

114、214‧‧‧試樣載置板 114, 214‧‧‧sample mounting plate

114a、214a‧‧‧中央開口 114a, 214a‧‧‧Central opening

115、215‧‧‧聚光透鏡 115, 215‧‧‧ condenser lens

120、220‧‧‧分光部 120, 220‧‧‧Spectral Division

121、221‧‧‧入口狹縫 121, 221‧‧‧ entrance slit

122、222‧‧‧繞射光柵 122, 222‧‧‧diffraction grating

123a~123c、223a~223c‧‧‧出口狹縫 123a ~ 123c, 223a ~ 223c‧‧‧ exit slit

124a~124c、224a~224c‧‧‧光檢測器 124a ~ 124c, 224a ~ 224c‧‧‧Light detector

125、225‧‧‧A/D轉換部 125, 225‧‧‧A / D conversion department

130‧‧‧控制‧處理部(警告部件) 130‧‧‧Control‧Processing Section (Warning part)

131‧‧‧輸入部 131‧‧‧ Input Department

132‧‧‧輸出部(警告部件) 132‧‧‧Output section (warning part)

141、241‧‧‧氣體供給源 141, 241‧‧‧Gas supply source

142、242‧‧‧氣體供給用管路 142, 242‧‧‧‧Gas supply pipeline

143、243‧‧‧開關閥 143, 243‧‧‧ On-off valve

144、244‧‧‧流量調節閥 144, 244‧‧‧ flow regulating valve

145、245‧‧‧氣體排出用管路 145, 245‧‧‧‧gas exhaust pipeline

146、246‧‧‧加壓器 146, 246‧‧‧Pressurizer

147、247‧‧‧排氣管路 147, 247‧‧‧ exhaust pipe

148、248‧‧‧過濾器 148, 248‧‧‧ filters

151‧‧‧壓力感測器 151‧‧‧Pressure sensor

152‧‧‧分流管 152‧‧‧ Diverter

153‧‧‧流路切換閥 153‧‧‧Flow path switching valve

230‧‧‧控制‧處理部 230‧‧‧Control‧Processing Department

246a‧‧‧液體 246a‧‧‧Liquid

Ar‧‧‧氬氣 Ar‧‧‧Argon

S‧‧‧試樣 S‧‧‧Sample

圖1是本發明的一實施形態的發光分光分析裝置的概略構成 圖。 FIG. 1 is a schematic configuration of a light emission spectroscopic analysis apparatus according to an embodiment of the present invention. Illustration.

圖2是本發明的另一實施形態的發光分光分析裝置的概略構成圖。 FIG. 2 is a schematic configuration diagram of a light emission spectroscopic analysis device according to another embodiment of the present invention.

圖3是習知的發光分光分析裝置的概略構成圖。 FIG. 3 is a schematic configuration diagram of a conventional emission spectroscopic analysis device.

以下,列舉實施形態對本發明的發光分光分析裝置進行說明。圖1是表示本實施形態的發光分光分析裝置的要部構成的圖。再者,對與已說明的圖3相同或對應的構成元件標註後兩位一致的符號,並適宜省略說明。 Hereinafter, the light-emitting spectroscopic analysis device of the present invention will be described with examples. FIG. 1 is a diagram showing a configuration of a main part of a light emission spectroscopic analysis apparatus according to this embodiment. In addition, constituent elements that are the same as or corresponding to those in FIG. 3 described above are denoted by the same two-digit symbols, and descriptions thereof are appropriately omitted.

本實施形態的發光分光分析裝置與習知的發光分光分析裝置的主要的不同點是於自氣體供給源141經由放電室113而到達加壓器146的氣體流路上具備壓力感測器151這一點。當於用以排出加壓器146內的氣體的排氣管路147或設置於該排氣管路147上的過濾器148中產生了堵塞時,惰性氣體(此處設為氬氣)無法自加壓器146中適當地排出,因此所述氣體流路內的壓力上升。因此,藉由所述壓力感測器151來對該氣體流路內的壓力進行監視,藉此可立即探測到於所述排氣管路147或過濾器148中產生的堵塞。 The main difference between the light emission spectroscopic analysis device of this embodiment and the conventional light emission spectroscopic analysis device is that the pressure sensor 151 is provided on the gas flow path from the gas supply source 141 to the pressurizer 146 through the discharge chamber 113. . When a blockage occurs in the exhaust line 147 for exhausting the gas in the pressurizer 146 or the filter 148 provided on the exhaust line 147, the inert gas (here, argon) cannot be blocked. Since the pressurizer 146 is appropriately discharged, the pressure in the gas flow path rises. Therefore, the pressure in the gas flow path is monitored by the pressure sensor 151, so that a blockage generated in the exhaust line 147 or the filter 148 can be detected immediately.

再者,壓力感測器151亦可設置於構成所述氬氣的流路的各構成元件,即氣體供給用管路142、放電室113、氣體排出用管路145及加壓器146的任一個中。但是,於放電室113中及比 其更下游側,已蒸發的試樣的微粒子懸浮於氬氣中,因此就避免該微粒子對於測定值的影響的觀點而言,理想的是於比放電室113更上游側設置壓力感測器151。另外,比流量調節閥144更上游側的流路內的壓力高於下游側,即便產生如所述般的排氣管路147或過濾器148的堵塞,壓力的變動範圍亦小於下游側。因此,於本實施形態的發光分光分析裝置中,於比氣體供給用管路142上的流量調節閥144更下游側的位置上配置壓力感測器151。 In addition, the pressure sensor 151 may be provided in each of the constituent elements constituting the argon flow path, that is, any of the gas supply pipe 142, the discharge chamber 113, the gas discharge pipe 145, and the pressurizer 146. One in. However, in the discharge chamber 113, On the further downstream side, fine particles of the evaporated sample are suspended in argon. Therefore, from the viewpoint of avoiding the influence of the fine particles on the measured value, it is desirable to provide a pressure sensor 151 on the upstream side of the discharge chamber 113. . In addition, the pressure in the flow path on the upstream side is higher than the flow rate control valve 144, and even if the exhaust line 147 or the filter 148 is clogged as described above, the pressure fluctuation range is smaller than the downstream side. Therefore, in the light emission spectroscopic analysis device of this embodiment, the pressure sensor 151 is disposed at a position further downstream than the flow rate adjustment valve 144 on the gas supply pipe 142.

來自壓力感測器151的檢測信號被送出至控制‧處理部130中。另外,來自分光部120的光檢測器124a、光檢測器124b、光檢測器124c的檢測信號經由A/D轉換部125而被輸入至控制‧處理部130中。控制‧處理部130包含專用的硬體或通用的硬體(個人電腦等)、或其組合,進而連接有包含鍵盤等的輸入部131、及包含監視器或揚聲器的輸出部132。該控制‧處理部130除了根據來自所述壓力感測器151或光檢測器124a、光檢測器124b、光檢測器124c的檢測信號執行規定的資料處理以外,進行放電產生部111、開關閥143及流量調節閥144等的控制。再者,於本實施例中,控制‧處理部130及輸出部132協作來作為本發明中的警告部件發揮功能。 The detection signal from the pressure sensor 151 is sent to the control and processing unit 130. In addition, the detection signals from the photodetector 124a, 124b, and 124c of the spectroscopic section 120 are input to the control / processing section 130 via the A / D conversion section 125. The control and processing unit 130 includes dedicated hardware or general-purpose hardware (such as a personal computer) or a combination thereof, and is further connected to an input unit 131 including a keyboard and the like, and an output unit 132 including a monitor or a speaker. The control and processing unit 130 performs a predetermined data processing based on the detection signals from the pressure sensor 151 or the photodetector 124a, the photodetector 124b, and the photodetector 124c, and performs a discharge generating unit 111 and an on-off valve 143. And flow control valve 144. Furthermore, in this embodiment, the control and processing unit 130 and the output unit 132 cooperate to function as a warning means in the present invention.

繼而,對在本實施形態的發光分光分析裝置中進行試樣的測定時的基本的操作流程進行說明。首先,用戶將試樣S設置於激發部110的試樣載置板114上,然後利用輸入部131進行規定的操作,藉此對控制‧處理部130指示放電室113的沖洗(purge) 開始。於是,控制‧處理部130打開設置於自氣體供給源141至放電室113的氣體供給用管路142上的開關閥143,利用氬氣沖洗放電室113的內部的空氣。 Next, a basic operation flow when measuring a sample in the light emission spectroscopic analysis device of this embodiment will be described. First, the user sets the sample S on the sample mounting plate 114 of the excitation section 110, and then performs a predetermined operation using the input section 131, thereby instructing the control and processing section 130 to purge the discharge chamber 113 Start. Then, the control / processing unit 130 opens the on-off valve 143 provided in the gas supply line 142 from the gas supply source 141 to the discharge chamber 113, and flushes the air inside the discharge chamber 113 with argon.

此時的氬氣的流量藉由流量調節閥144來調節。流量調節閥144具有用以縮小於氣體供給用管路142中流動的流體的流量的針閥(needle valve)及用以調節該針閥的開度的刻度盤(dial),用戶手動操作該刻度盤來使所述針閥的開度變化,藉此可調節氬氣的流量。再者,於所述刻度盤的周圍記載有使該刻度盤旋轉成各種角度時所獲得的流量的基準,於執行試樣測定時將該流量設定成比較高的值(例如5L/min),於其以外時設定成比較低的值(例如1L/min)。以下,將前者稱為流量「高」的狀態,將後者稱為流量「低」的狀態。再者,於所述沖洗操作的開始時間點,將所述流量設定為「低」。 The flow rate of argon gas at this time is adjusted by a flow rate adjustment valve 144. The flow regulating valve 144 includes a needle valve for reducing the flow rate of the fluid flowing in the gas supply pipe 142, and a dial for adjusting the opening degree of the needle valve. The user manually operates the scale. To change the opening of the needle valve, thereby adjusting the flow rate of argon gas. In addition, a reference of a flow rate obtained when the dial is rotated at various angles is described around the scale, and the flow rate is set to a relatively high value (for example, 5 L / min) when the sample measurement is performed. Otherwise, set to a relatively low value (for example, 1 L / min). Hereinafter, the former is referred to as a state where the flow is "high", and the latter is referred to as a state where the flow is "low". Furthermore, at the start point of the flushing operation, the flow rate is set to "low".

其後,於自所述放電室113的沖洗開始起經過規定的時間的時間點,用戶操作設置於流量調節閥144上的所述刻度盤來使氬氣流量變成「高」,繼而,利用輸入部131進行規定的操作而對控制‧處理部130指示試樣測定的執行。於是,控制‧處理部130控制放電產生部111,藉此自該放電產生部111對電極棒112施加脈衝狀的高電壓,並藉由來自電極棒112的火花放電而使試樣S進行激發發光。此時所獲得的發光光穿過設置於放電室113中的導光孔113a,由聚光透鏡115聚光後朝分光部120射出。自激發部110射出的發光光經由入口狹縫121而射入分光部120中, 並藉由繞射光柵122而進行波長分散。而且,該經波長分散的光中的規定的波長範圍的光穿過出口狹縫123a、出口狹縫123b、出口狹縫123c,由光檢測器124a、光檢測器124b、光檢測器124c來進行檢測。 Thereafter, at a point in time when a predetermined time has elapsed since the flushing of the discharge chamber 113 was started, the user operates the dial provided on the flow adjustment valve 144 to make the argon flow rate "high", and then, uses the input The unit 131 performs a predetermined operation and instructs the control / processing unit 130 to execute the sample measurement. Then, the control / processing unit 130 controls the discharge generating unit 111, thereby applying a high pulse-like voltage to the electrode rod 112 from the discharge generating unit 111, and exciting and emitting the sample S by the spark discharge from the electrode rod 112. . The luminous light obtained at this time passes through the light guide hole 113a provided in the discharge chamber 113, is collected by the condenser lens 115, and is emitted toward the beam splitter 120. The light emitted from the excitation unit 110 enters the beam splitting unit 120 through the entrance slit 121, Wavelength dispersion is performed by the diffraction grating 122. The light in the predetermined wavelength range of the wavelength-dispersed light passes through the exit slit 123a, the exit slit 123b, and the exit slit 123c, and is performed by the photodetector 124a, the photodetector 124b, and the photodetector 124c. Detection.

若完成一次試樣測定,則用戶再次操作流量調節閥144的刻度盤來使氬氣流量恢復成「低」。然後,更換試樣S、或以試樣S的被測定面中的未供於測定的區域自中央開口114a露出的方式變更試樣載置板114上的試樣S的位置或方向。其後,用戶再次操作流量調節閥144的刻度盤來使氬氣流量變成「高」,並利用輸入部131對控制‧處理部130指示試樣測定的執行。 Once the sample measurement is completed, the user operates the dial of the flow control valve 144 again to return the argon flow to "low". Then, the sample S is replaced, or the position or direction of the sample S on the sample mounting plate 114 is changed so that an area not to be measured in the measurement surface of the sample S is exposed from the central opening 114a. Thereafter, the user operates the dial of the flow rate adjustment valve 144 again to make the argon gas flow rate “high”, and uses the input unit 131 to instruct the control and processing unit 130 to execute the measurement of the sample.

其後,交替地執行如以上般的試樣的更換或位置變更與試樣測定,於所需的測定全部完成的時間點,用戶經由輸入部131而對控制‧處理部130指示放電室113的沖洗結束。於是,控制‧處理部130關閉氣體供給用管路142的開關閥143,停止朝放電室113中的氬氣導入。 Thereafter, the above-mentioned sample replacement or position change and sample measurement are performed alternately, and at the time point when all the required measurements are completed, the user instructs the control and processing unit 130 via the input unit 131 on the discharge chamber 113. Rinse is over. Then, the control / processing unit 130 closes the on-off valve 143 of the gas supply pipe 142 and stops the introduction of argon gas into the discharge chamber 113.

於本實施形態的發光分光分析裝置中,在伴隨如以上般的試樣測定的自放電室113的沖洗開始至該沖洗結束為止的期間內,藉由壓力感測器151來監視氣體供給用管路142內的壓力。即,來自該壓力感測器151的檢測信號以規定的時間間隔被送出至控制‧處理部130中,控制‧處理部130依次判定根據該檢測信號所求出的壓力的測定值是否超過事先規定的上限值。而且,當判定該測定值超過所述上限值時,自輸出部132的揚聲器發出 警告音,並且將對用戶通知於自加壓器146起的排氣流路(即排氣管路147及過濾器148)上產生了堵塞的意思的訊息顯示於輸出部132中所設置的監視器的畫面上。 In the light emission spectroscopic analysis device of this embodiment, the gas supply tube is monitored by the pressure sensor 151 during the period from the start of the flushing of the discharge chamber 113 to the end of the flushing with the sample measurement as described above. Pressure inside the road 142. That is, the detection signal from the pressure sensor 151 is sent to the control / processing unit 130 at predetermined time intervals, and the control / processing unit 130 sequentially determines whether the measured value of the pressure obtained based on the detection signal exceeds a predetermined value. The upper limit. When it is determined that the measured value exceeds the upper limit value, it is emitted from a speaker of the output unit 132. A warning sound, and a message notifying the user that there is a blockage in the exhaust flow path (ie, the exhaust line 147 and the filter 148) from the pressurizer 146 is displayed on the monitor provided in the output section 132 Screen.

再者,即便於正常地進行來自加壓器146的排氣的情況下,於氬氣流量「高」時與「低」時,氣體供給用管路142內的壓力亦不同。即,於流量「高」時氣體供給用管路142的內壓相對高,於流量「低」時所述內壓相對變低。因此,作為所述上限值,理想的是個別地設定流量「高」時所應用的上限值、及流量「低」時所應用的上限值。可於測定時用戶自輸入部131設定該些上限值,或者亦可於本裝置的工廠出貨的時間點設定該些上限值,並儲存於控制‧處理部130內的記憶體中。 Furthermore, even when the exhaust from the pressurizer 146 is performed normally, the pressure in the gas supply line 142 is different between when the argon flow rate is "high" and when it is "low". That is, the internal pressure of the gas supply line 142 is relatively high when the flow rate is "high", and the internal pressure is relatively low when the flow rate is "low". Therefore, as the upper limit value, it is desirable to individually set the upper limit value applied when the flow rate is "high" and the upper limit value applied when the flow rate is "low". The upper limits may be set by the user from the input section 131 during the measurement, or may be set at the time of shipment from the factory of the device, and stored in the memory in the control and processing section 130.

以上,列舉具體例對用以實施本發明的形態進行了說明,但本發明並不限定於所述例,容許於本發明的主旨的範圍內適宜變更。例如,於所述例中,設為根據壓力感測器的檢測值來檢測來自加壓器的排氣的流路的堵塞者,但亦可設為設置流量感測器來代替該壓力感測器的構成。於此情況下,將該流量感測器設為設置於氣體供給用管路142、氣體排出用管路145及排氣管路147的任一個上,當由該流量感測器所檢測到的流量低於事先規定的下限值時對用戶發出警告。 As mentioned above, although the form for implementing this invention was demonstrated using the specific example, this invention is not limited to the said example, It can change suitably within the range of the summary of this invention. For example, in the above example, it is assumed that the flow path of the exhaust gas from the pressurizer is blocked based on the detection value of the pressure sensor, but a flow sensor may be provided instead of the pressure sensor. Composition. In this case, the flow sensor is provided in any one of the gas supply pipe 142, the gas exhaust pipe 145, and the exhaust pipe 147. When the flow sensor detects the Warn the user when the flow is below a predetermined lower limit.

另外,除了如所述般的對於用戶的警告或代替該警告,亦可於壓力感測器的測定值超過規定的上限值的情況或流量感測器的測定值低於規定的下限值的情況下,控制‧處理部130關閉 設置於氣體供給用管路142上的開關閥143來停止氬氣的供給。根據此種構成,當來自加壓器146的排氣無法正常地流動時,朝放電室113中的氬氣的供給被自動地停止,因此即便於用戶不在裝置的附近的情況下,亦可防止氬氣的壓力的進一步的上升。 In addition to the warning to the user or replacing the warning as described above, the measurement value of the pressure sensor may exceed the predetermined upper limit value or the measurement value of the flow sensor may be lower than the predetermined lower limit value. In the case of the control, the processing unit 130 is turned off An on-off valve 143 provided in the gas supply line 142 stops the supply of argon gas. According to this configuration, when the exhaust gas from the pressurizer 146 does not flow normally, the supply of argon gas to the discharge chamber 113 is automatically stopped. Therefore, even when the user is not in the vicinity of the device, it can be prevented A further rise in the pressure of argon.

另外,如圖2所示,亦可於氣體排出用管路145上設置分流管152及流路切換閥153,於壓力感測器151的測定值超過規定的上限值的情況或流量感測器的測定值低於規定的下限值的情況下,控制‧處理部130進行該流路切換閥153的切換,藉此使自放電室113中排出的氬氣朝分流管152側而非加壓器146側流動。根據此種構成,當於排氣管路147或過濾器148中產生了堵塞時,氬氣被自動地自氣體排出用管路145朝外部排出,因此即便於用戶位於遠離裝置的地方的情況下,亦可立即降低流路內的壓力。另外,亦可設為設置用以於壓力的異常上升時使氣體自氣體排出用管路145中逃脫的釋放閥(排放閥)來代替如上所述的分流管152及流路切換閥153的構成。該釋放閥於通常時呈藉由彈簧的力來關閉閥的狀態,但若因內壓的上升而承受該彈簧的力以上的壓力,則閥打開,其結果,氣體排出用管路145內的氬氣被排出至外部。再者,當設置所述流路切換閥153或釋放閥時,為了防止來自放電室113的排氣中所含有的試樣的微粒子被放出至裝置的周圍,理想的是將來自所述分流管152或釋放閥的排氣送出至規定的回收容器中而非大氣中。 In addition, as shown in FIG. 2, a shunt pipe 152 and a flow path switching valve 153 may be provided on the gas exhaust pipe 145. When the measured value of the pressure sensor 151 exceeds a predetermined upper limit value or the flow rate is sensed. When the measured value of the device is lower than the predetermined lower limit value, the control and processing unit 130 switches the flow path switching valve 153, so that the argon gas discharged from the discharge chamber 113 is directed toward the shunt pipe 152 instead of being added. The presser 146 flows. According to this configuration, when clogging occurs in the exhaust line 147 or the filter 148, argon gas is automatically discharged from the gas exhaust line 145 to the outside, so even when the user is located away from the device , Can also immediately reduce the pressure in the flow path. In addition, it is also possible to provide a configuration in which a release valve (drain valve) for escaping gas from the gas discharge line 145 when the pressure is abnormally increased is used instead of the branch pipe 152 and the flow path switching valve 153 described above. . The release valve is normally closed by the force of a spring. However, if the pressure exceeds the force of the spring due to an increase in the internal pressure, the valve is opened. As a result, the gas in the gas exhaust pipe 145 Argon is exhausted to the outside. In addition, when the flow path switching valve 153 or the release valve is provided, in order to prevent particles of the sample contained in the exhaust gas from the discharge chamber 113 from being discharged to the periphery of the device, it is desirable to remove the particles from the shunt pipe. The exhaust gas from 152 or the release valve is sent to the specified recovery container instead of the atmosphere.

Claims (8)

一種發光分光分析裝置,包括:a)放電室,藉由在內部產生放電來使試樣進行激發發光;b)加壓器,作為收容液體的容器;c)氣體供給源,填充有被壓縮成大氣壓以上的惰性氣體;d)氣體供給用管路,一端與所述氣體供給源連接,另一端與所述放電室連接;e)氣體排出用管路,一端與所述放電室連接,另一端朝所述加壓器內的所述液體中打開;f)排氣管路,一端於所述加壓器內配置於比所述液體的液面更上方,另一端朝所述加壓器的外部打開;g)壓力感測器,測定所述氣體供給用管路、所述放電室、所述氣體排出用管路或所述加壓器的任一個的內部空間內的所述惰性氣體的壓力;h)警告部件,當由所述壓力感測器所得的測定值超過事先規定的值時對用戶發出警告;以及流量調節閥,設置於所述氣體供給用管路上,所述壓力感測器配置在所述氣體供給用管路上的所述流量調節閥與所述放電室之間。 A luminescence spectroscopic analysis device includes: a) a discharge chamber that causes a sample to emit light by generating an internal discharge; b) a pressurizer as a container for holding a liquid; c) a gas supply source filled with a compressed gas Inert gas above atmospheric pressure; d) gas supply pipe, one end is connected to the gas supply source, and the other end is connected to the discharge chamber; e) gas discharge pipe, one end is connected to the discharge chamber, and the other end Open to the liquid in the pressurizer; f) an exhaust line, one end of which is disposed in the pressurizer above the liquid level of the liquid, and the other end of The outside is opened; g) a pressure sensor that measures the inert gas in the internal space of any one of the gas supply pipe, the discharge chamber, the gas discharge pipe, or the pressurizer; Pressure; h) a warning component that warns a user when a measured value obtained by the pressure sensor exceeds a predetermined value; and a flow regulating valve provided on the gas supply pipeline, the pressure sensing The device is arranged in the gas supply pipe Between the flow regulating valve on the road and the discharge chamber. 如申請專利範圍第1項所述的發光分光分析裝置,除了所述警告部件以外或代替所述警告部件,包括氣體供給停止部件,所述氣體供給停止部件於由所述壓力感測器所得的測定值超 過事先規定的值的情況下,停止自所述氣體供給源朝所述放電室中的惰性氣體的供給。 The light emission spectroscopic analysis device according to item 1 of the scope of patent application, in addition to or in place of the warning part, includes a gas supply stop part which is obtained from the pressure sensor. Measured value exceeded When the value exceeds a predetermined value, the supply of the inert gas from the gas supply source to the discharge chamber is stopped. 如申請專利範圍第1項所述的發光分光分析裝置,除了所述警告部件以外或代替所述警告部件,包括氣體放出部件,所述氣體放出部件於由所述壓力感測器所得的測定值超過事先規定的值的情況下,將惰性氣體自所述氣體排出用管路或所述加壓器朝外部放出。 The light emitting spectroscopic analysis device according to item 1 of the scope of patent application, in addition to or in place of the warning part, includes a gas emission part, and the gas emission part is measured by the pressure sensor. When the value exceeds a predetermined value, an inert gas is discharged from the gas exhaust pipe or the pressurizer to the outside. 如申請專利範圍第1項所述的發光分光分析裝置,除了所述警告部件以外或代替所述警告部件,於所述氣體排出用管路或所述加壓器中設置有釋放閥,所述釋放閥伴隨所述惰性氣體的壓力上升而被打開,並將所述氣體排出用管路或所述加壓器內的惰性氣體朝外部放出。 According to the light emission spectroscopic analysis device according to item 1 of the scope of patent application, in addition to or in place of the warning member, a release valve is provided in the gas exhaust line or the pressurizer, and The release valve is opened as the pressure of the inert gas rises, and releases the inert gas in the gas discharge line or the pressurizer to the outside. 一種發光分光分析裝置,包括:a)放電室,藉由在內部產生放電來使試樣進行激發發光;b)加壓器,作為收容液體的容器;c)氣體供給源,填充有被壓縮成大氣壓以上的惰性氣體;d)氣體供給用管路,一端與所述氣體供給源連接,另一端朝所述放電室內打開;e)氣體排出用管路,一端朝所述放電室內打開,另一端朝所述加壓器內的所述液體中打開;f)排氣管路,一端於所述加壓器內配置於比所述液體的液面更上方,另一端朝所述加壓器的外部打開; g)流量感測器,測定所述氣體供給用管路、所述氣體排出用管路或所述排氣管路中的所述惰性氣體的流量;以及h)警告部件,當由所述流量感測器所得的測定值低於事先規定的值時對用戶發出警告;以及流量調節閥,設置於所述氣體供給用管路上,所述流量感測器配置在所述氣體供給用管路上的所述流量調節閥與所述放電室之間。 A luminescence spectroscopic analysis device includes: a) a discharge chamber that causes a sample to emit light by generating an internal discharge; b) a pressurizer as a container for holding a liquid; c) a gas supply source filled with a compressed gas Inert gas above atmospheric pressure; d) gas supply pipe, one end is connected to the gas supply source, and the other end is opened to the discharge chamber; e) gas discharge pipe, one end is opened to the discharge chamber, and the other end Open to the liquid in the pressurizer; f) an exhaust line, one end of which is disposed in the pressurizer above the liquid level of the liquid, and the other end of Externally open g) a flow sensor that measures the flow of the inert gas in the gas supply line, the gas exhaust line, or the exhaust line; and h) a warning component, Warn the user when the measured value obtained by the sensor is lower than a predetermined value; and a flow regulating valve is provided on the gas supply pipe, and the flow sensor is disposed on the gas supply pipe Between the flow regulating valve and the discharge chamber. 如申請專利範圍第5項所述的發光分光分析裝置,除了所述警告部件以外或代替所述警告部件,包括氣體供給停止部件,所述氣體供給停止部件於由所述流量感測器所得的測定值低於事先規定的值的情況下,停止自所述氣體供給源朝所述放電室中的惰性氣體的供給。 The luminescent spectroscopic analysis device according to item 5 of the scope of application for a patent, in addition to or in place of the warning member, includes a gas supply stop member, which is obtained from the flow sensor. When the measured value is lower than a predetermined value, the supply of the inert gas from the gas supply source to the discharge chamber is stopped. 如申請專利範圍第5項所述的發光分光分析裝置,除了所述警告部件以外或代替所述警告部件,包括氣體放出部件,所述氣體放出部件於由所述流量感測器所得的測定值低於事先規定的值的情況下,將惰性氣體自所述氣體排出用管路或所述加壓器朝外部放出。 The light emitting spectroscopic analysis device according to item 5 of the scope of patent application, in addition to or in place of the warning part, includes a gas emission part, and the gas emission part is a measured value obtained by the flow sensor. When the value is lower than a predetermined value, an inert gas is discharged from the gas exhaust pipe or the pressurizer to the outside. 如申請專利範圍第5項所述的發光分光分析裝置,除了所述警告部件以外或代替所述警告部件,於所述氣體排出用管路或所述加壓器中設置有釋放閥,所述釋放閥伴隨所述惰性氣體的壓力上升而被打開,並將所述氣體排出用管路或所述加壓器內的惰性氣體朝外部放出。 According to the light emission spectroscopic analysis device according to item 5 of the scope of patent application, in addition to or in place of the warning member, a release valve is provided in the gas exhaust line or the pressurizer, and The release valve is opened as the pressure of the inert gas rises, and releases the inert gas in the gas discharge line or the pressurizer to the outside.
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