TWI668529B - Positive and negative type photoresist separation device for developer regeneration system - Google Patents

Positive and negative type photoresist separation device for developer regeneration system Download PDF

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TWI668529B
TWI668529B TW107122741A TW107122741A TWI668529B TW I668529 B TWI668529 B TW I668529B TW 107122741 A TW107122741 A TW 107122741A TW 107122741 A TW107122741 A TW 107122741A TW I668529 B TWI668529 B TW I668529B
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control valve
photoresist
waste liquid
positive
developer
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TW107122741A
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TW202006479A (en
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陳俊吉
余彥明
西村保二
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陳俊吉
余彥明
西村保二
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Abstract

本發明係一種顯影液再生系統的正負型光阻分離裝置,主要係由一儲存槽透過一送液組及一壓力/流量感應器連接一超過濾膜,並由該超過濾膜分別連接一排放量/時間比例控制組所組成;當一顯影廢液於該儲存槽,並由該送液組使顯影廢液流入該超過濾膜,以將正負型光阻進行分離,則該超過濾膜係將過濾分離後的一清澈顯影液回收至一顯影液再生設備進行再生處理,又將一高光阻廢液透過該排放量/時間比例控制組進行調節以排出一含高濃度光阻廢液;藉由預先分離該顯影廢液中過大之光阻粒子,達到提升系統耐用性、鹼度、顯影液再生品質的目的。The present invention relates to a positive-negative photoresist separation device for a developer regeneration system, which is mainly connected from a storage tank through a liquid supply group and a pressure/flow sensor to an ultrafiltration membrane, and is connected to the discharge membrane by the ultrafiltration membrane. The quantity/time ratio control group is composed; when a developing waste liquid is in the storage tank, and the developing waste liquid is caused to flow into the ultrafiltration membrane by the liquid supply group to separate the positive and negative type photoresists, the ultrafiltration membrane system is Collecting a clear developing solution after separation by filtration to a developing solution regeneration device for regeneration treatment, and adjusting a high photoresist waste liquid through the discharge amount/time ratio control group to discharge a high concentration resist waste liquid; By pre-separating the excessively large photoresist particles in the development waste liquid, the purpose of improving system durability, alkalinity, and developer regeneration quality is achieved.

Description

顯影液再生系統的正負型光阻分離裝置Positive and negative type photoresist separation device for developer regeneration system

本發明係關於一種顯影液再生系統,尤指一種顯影液再生系統的正負型光阻分離裝置。 The present invention relates to a developer regeneration system, and more particularly to a positive-negative photoresist separation device for a developer regeneration system.

隨著我國光電、半導體等產業的蓬勃發展,在基板製造過程、印刷機板製造或半導體製程中,經常將顯影液回收再利用,作為顯示正/負型光阻或顏料光阻用的顯影液包括:氫氧化四甲基胺(TMAH)、氫氧化鈉(NaOH)、碳酸氫鈉/碳酸鈉(NaHCO3/Na2CO3)、氫氧化鉀(KOH)。 With the vigorous development of China's optoelectronics, semiconductor and other industries, in the substrate manufacturing process, printing plate manufacturing or semiconductor manufacturing process, the developer is often recycled and reused as a developer for displaying positive/negative photoresist or pigment photoresist. Including: tetramethylammonium hydroxide (TMAH), sodium hydroxide (NaOH), sodium bicarbonate / sodium carbonate (NaHCO3 / Na2CO3), potassium hydroxide (KOH).

如我國發明公告第I264618號「顯影液再生裝置」(以下簡稱前案),其主要是由一第一供給機構將顯影廢液供給一錯流(Cross Flow)式第一膜分離機構(如奈米過濾器),該第一膜分離機構對感光性有機樹脂用鹼系顯影廢液進行膜分離,並由一第二供給機構將第一透過液供給一式第二膜分離機構(如奈米過濾器)進行膜分離,將該第一膜分離機構的膜分離結果透過一第一回流機構回流至該第一供給機構的顯影廢液中,並透過至少一光阻濃度測定機構側對透過該第一回流機構所回流前的非透過液或回流後的顯影廢液之光阻濃度進行測定,依據該光阻濃度測定機構的測定結果,將非透過液或顯影廢液通過一廢棄機構加以廢棄。 For example, the invention of the invention No. I264618 "developing solution regeneration device" (hereinafter referred to as the previous case) mainly supplies a developing waste liquid to a cross flow type first membrane separation mechanism (such as Nai) by a first supply mechanism. a rice filter), the first membrane separation mechanism performs membrane separation on the photosensitive organic resin with an alkali-based developing waste liquid, and supplies the first permeate to a second membrane separation mechanism (such as nanofiltration) by a second supply mechanism. The membrane separation is performed, and the membrane separation result of the first membrane separation mechanism is returned to the developing waste liquid of the first supply mechanism through a first reflux mechanism, and transmitted through at least one photoresist concentration measuring mechanism side. The concentration of the photoresist of the non-permeate or the developed waste liquid after the reflux of the reflow mechanism is measured, and the non-permeate or the development waste is discarded by a waste mechanism according to the measurement result of the resist concentration measuring means.

雖然前案的顯影液再生裝置,係將一鹼系顯影液的鹼濃度及一光阻濃度自動控制在既定的濃度,並且設置有複數的奈米過濾器加強過濾效果,藉由保持顯影性能、又可降低換液成本,但是隨著科技日新月異,作為顯示正/負型光阻或顏料光阻用的顯影液,如氫氧化四甲基胺(TMAH)、氫氧化鈉(NaOH)、碳酸氫鈉/碳酸鈉(NaHCO3/Na2CO3)、KOH氫氧化鉀等 顯影液,其光阻粒子偏大,經常造成設置在顯影液再生設備或前案的顯影液再生裝置裡的奈米過濾器阻塞,使得耐用度降低、更換機構的成本提高,因此如何因應未來不同類型之顯影液的光阻粒子過大,使得顯影液再生設備品質不佳、經常更換等問題,就業者而言,確實有待進一步提出更佳解決方案的必要性。 Although the developer regenerating device of the prior embodiment automatically controls the alkali concentration and the photoresist concentration of the alkali-based developing solution to a predetermined concentration, and provides a plurality of nano filters to enhance the filtering effect, by maintaining the developing performance, It can also reduce the cost of liquid replacement, but as the technology changes with each passing day, it is used as a developing solution for displaying positive/negative photoresist or pigment photoresist, such as tetramethylammonium hydroxide (TMAH), sodium hydroxide (NaOH), hydrogencarbonate. Sodium/sodium carbonate (NaHCO3/Na2CO3), KOH potassium hydroxide, etc. In the developer, the photoresist particles are too large, which often causes the nano filter disposed in the developer regeneration device or the developer regeneration device of the previous case to be clogged, so that the durability is lowered and the cost of the replacement mechanism is increased, so how to adapt to the future The photoresist particles of the type of developer are too large, which causes problems such as poor quality and frequent replacement of the developer regeneration equipment, and it is indeed necessary for the employer to further propose a better solution.

有鑑於上述現有技術之不足,本發明的主要目的係提供一種顯影液再生系統的正負型光阻分離裝置,利用將正/負型光阻進行分離的前處理技術,預先將顯影廢液中過大之光阻粒子過濾、分離,進而提升系統耐用性、鹼度、顯影液再生品質。 In view of the above-mentioned deficiencies of the prior art, the main object of the present invention is to provide a positive-negative photoresist separation device for a developer regeneration system, which utilizes a pretreatment technique for separating positive/negative photoresists to prematurely develop the development waste liquid. The photoresist particles are filtered and separated to improve the durability, alkalinity and developer regeneration quality of the system.

為達成上述目的所採取的主要技術手段係令前述顯影液再生系統的正負型光阻分離裝置包括:一第一儲存槽,供存放一含光阻顯影廢液;一第一送液組,係與該第一儲存槽連接,並用以調整該含光阻顯影廢液的流量;一第一壓力/流量感應器,係設在該第一送液組上,感測該含光阻顯影廢液於該第一送液組之壓力與流量,作為調節流量之參考;一超過濾膜,係與該第一送液組連接,並供流入該含光阻顯影廢液,該含光阻顯影廢液通過該超過濾膜使得正/負型光阻被分離,以產生一高光阻廢液及一清澈顯影液;一排放量/時間比例控制組,係與該超過濾膜連接,供流入該高光阻廢液,並進行排放比例調節以排出一含高濃度光阻廢液。 The main technical means adopted for achieving the above object is that the positive-negative type photoresist separation device of the developing solution regeneration system comprises: a first storage tank for storing a photoresist-containing developing waste liquid; and a first liquid supply group; Connected to the first storage tank and used to adjust the flow rate of the photoresist-containing waste liquid; a first pressure/flow sensor is disposed on the first liquid supply group to sense the photoresist-containing developing waste liquid The pressure and flow rate of the first liquid supply group are used as a reference for adjusting the flow rate; an ultrafiltration membrane is connected to the first liquid supply group, and is supplied to the photoresist-containing development waste liquid, and the photoresist-containing development waste The liquid passes through the ultrafiltration membrane such that the positive/negative photoresist is separated to generate a high photoresist waste liquid and a clear developing solution; a discharge amount/time ratio control group is connected to the ultrafiltration membrane for flowing into the high light Resist the waste liquid and adjust the discharge ratio to discharge a high concentration resist waste liquid.

根據上述構造,該第一儲存槽中係收集該含光阻顯影廢液,並由該第一送液組使顯影廢液流入該超過濾膜,以將面板、半導體、封測等基板 製作所用之正負型光阻,或者顏料光阻用TMAH、NaOH、NaHCO3/Na2CO3、KOH等顯影液進行分離、過濾處理,由該超過濾膜係將分離、過濾分離後的該清澈顯影液回收至一顯影液再生設備,由該顯影液再生設備進行顯影液的回收再利用;另外,該超過濾膜又將一高光阻廢液透過該排放量/時間比例控制組進行調節,以將該含高濃度光阻廢液排出;藉由預先分離該顯影廢液中過大之光阻粒子,以達到提升系統耐用性、鹼度、顯影液再生品質的目的。 According to the above configuration, the photoresist storage waste liquid is collected in the first storage tank, and the development waste liquid is caused to flow into the ultrafiltration membrane by the first liquid supply group to plate the substrate, the semiconductor, the package, and the like. The positive and negative photoresist used in the production, or the pigment photoresist is separated and filtered by a developing solution such as TMAH, NaOH, NaHCO3/Na2CO3, or KOH, and the clear developing solution separated and separated by filtration is recovered from the ultrafiltration membrane system. a developer regeneration device for recovering and reusing the developer by the developer regeneration device; in addition, the ultrafiltration membrane further adjusts a high photoresist waste liquid through the discharge amount/time ratio control group to adjust the height The concentration photoresist waste liquid is discharged; by separating the excessive photoresist particles in the development waste liquid in advance, the purpose of improving system durability, alkalinity, and developer regeneration quality is achieved.

10‧‧‧正負型光阻分離裝置 10‧‧‧ positive and negative resistive separation device

11‧‧‧第一儲存槽 11‧‧‧First storage tank

121‧‧‧第一閥 121‧‧‧first valve

122‧‧‧第一泵 122‧‧‧First pump

123‧‧‧第二閥 123‧‧‧Second valve

13‧‧‧第一壓力/流量感應器 13‧‧‧First pressure/flow sensor

14‧‧‧超過濾膜 14‧‧‧Ultrafiltration membrane

151‧‧‧第二壓力/流量感應器 151‧‧‧Second pressure/flow sensor

152‧‧‧廢液排放調節閥 152‧‧‧Waste discharge control valve

153‧‧‧流量感應器 153‧‧‧Flow sensor

16‧‧‧溫度感應器 16‧‧‧Temperature sensor

17‧‧‧第一熱交換器 17‧‧‧First heat exchanger

180‧‧‧細微粒子過濾器 180‧‧‧ Fine particle filter

181‧‧‧第一控制閥 181‧‧‧First control valve

182‧‧‧第二控制閥 182‧‧‧Second control valve

183‧‧‧第三控制閥 183‧‧‧third control valve

184‧‧‧第四控制閥 184‧‧‧fourth control valve

185‧‧‧第五控制閥 185‧‧‧ fifth control valve

186‧‧‧第六控制閥 186‧‧‧ sixth control valve

187‧‧‧第七控制閥 187‧‧‧ seventh control valve

19‧‧‧第三壓力/流量感應器 19‧‧‧ Third pressure/flow sensor

20‧‧‧顯影液再生設備 20‧‧‧developer regeneration equipment

201‧‧‧第一回收儲存槽 201‧‧‧First recycling storage tank

204‧‧‧第一過濾器 204‧‧‧First filter

205‧‧‧第一奈米過濾器 205‧‧‧First nano filter

207‧‧‧第一光度計 207‧‧‧First photometer

210‧‧‧第二熱交換器 210‧‧‧second heat exchanger

21‧‧‧第二回收儲存槽 21‧‧‧Second recovery storage tank

211‧‧‧第二奈米過濾器 211‧‧‧Second Nano Filter

212‧‧‧第一調合槽 212‧‧‧First blending slot

213‧‧‧第二光度計 213‧‧‧Second photometer

216‧‧‧負荷感應器 216‧‧‧Load sensor

218‧‧‧第三熱交換器 218‧‧‧ third heat exchanger

219‧‧‧小槽 219‧‧‧ small slot

22‧‧‧第三回收儲存槽 22‧‧‧ Third recovery storage tank

223‧‧‧粒子過濾器 223‧‧‧Particle filter

圖1 係本發明之一較佳實施例的系統架構方塊圖。 1 is a block diagram of a system architecture of a preferred embodiment of the present invention.

圖2 係本發明之又一較佳實施例的系統元件配置示意圖。 2 is a schematic diagram showing the configuration of a system component of still another preferred embodiment of the present invention.

圖3 係本發明之另一較佳實施例的又一系統元件配置示意圖。 3 is a schematic diagram of still another system component configuration of another preferred embodiment of the present invention.

圖4 係本發明之較佳實施例的顯影液再生設備的系統元件配置示意圖。 Figure 4 is a schematic view showing the system component configuration of the developer regenerating apparatus of the preferred embodiment of the present invention.

關於本發明提出一顯影液再生系統之一較佳實施例,請參考圖1所示,其主要係由一正負型光阻分離裝置10透過送液管線連接一顯影液再生設備20所組成,該正負型光阻分離裝置10包括一第一儲存槽11、一第一送液組、一第一壓力/流量感應器13、一超過濾膜(Ultra Filtration,UF)14以及一排放量/時間比例控制組,該第一儲存槽11供存放一含光阻顯影廢液,該第一送液組連接該第一儲存槽11,並用以調整該含光阻顯影廢液的流量,該第一壓力/流量感應器13係安裝設置在該第一送液組上,用以感測該含光阻顯影廢液於該第一送液組之壓力與流量,並且作為調節流量之參考,該超過濾膜14具有一輸入端、一第一輸出端及一第二輸出端,該超過濾膜14的輸入端係連接該第一送 液組,並供流入該含光阻顯影廢液,令該含光阻顯影廢液通過該超過濾膜時使得正/負型光阻被分離,以產生一高光阻廢液及一清澈顯影液。 A preferred embodiment of a developer regenerating system is provided in the present invention. Referring to FIG. 1 , the method is mainly composed of a positive-negative photoresist separation device 10 connected to a developer regeneration device 20 through a liquid supply line. The positive and negative resistive separation device 10 includes a first storage tank 11, a first liquid supply group, a first pressure/flow sensor 13, an ultrafiltration membrane (UF) 14, and a discharge/time ratio. a first storage tank 11 for storing a photoresist-containing development waste liquid, the first liquid supply group being connected to the first storage tank 11 and for adjusting a flow rate of the photoresist-containing development waste liquid, the first pressure / flow sensor 13 is installed on the first liquid supply group for sensing the pressure and flow rate of the photoresist-containing waste liquid in the first liquid supply group, and as a reference for adjusting the flow rate, the ultrafiltration The membrane 14 has an input end, a first output end and a second output end, and the input end of the ultrafiltration membrane 14 is connected to the first sending a liquid group for flowing into the photoresist-containing developing waste liquid, so that the photoresist film-containing waste liquid passes through the ultrafiltration membrane to separate the positive/negative photoresist to produce a high-resistance waste liquid and a clear developing solution .

該清澈顯影液透過該超過濾膜14的第一輸出端流入一顯影液再生設備20進行再生處理,藉由該第一送液組使顯影廢液流入該超過濾膜14,以將面板、半導體、封測等基板製作所用之正負型光阻,或者顏料光阻用TMAH、NaOH、NaHCO3/Na2CO3、KOH等顯影液進行分離、過濾處理,由該超過濾膜14係將分離、過濾分離後的該清澈顯影液回收至該顯影液再生設備20,由該顯影液再生設備20進行顯影液的回收再利用;另外,該高光阻廢液可透過該超過濾膜14的第二輸出端流入該排放量/時間比例控制組,當該高光阻廢液流入該排放量/時間比例控制組,該排放量/時間比例控制組進行排放比例調節以排出一含高濃度光阻廢液;以預先分離該顯影廢液中過大之光阻粒子之技術,提升系統耐用性、鹼度、顯影液再生品質。 The clear developing solution flows into the developing solution regeneration device 20 through the first output end of the ultrafiltration membrane 14 for regeneration treatment, and the developing waste liquid flows into the ultrafiltration membrane 14 by the first liquid supply group to cover the panel and the semiconductor. Positive and negative photoresists used for substrate production such as sealing and measuring, or pigment photoresists such as TMAH, NaOH, NaHCO3/Na2CO3, KOH, etc., are separated and filtered, and the ultrafiltration membrane 14 is separated and separated by filtration. The clear developing solution is recovered to the developer regenerating device 20, and the developer regenerating device 20 recovers and reuses the developing solution; in addition, the high photoresist waste liquid can flow into the discharge through the second output end of the ultrafiltration membrane 14 a quantity/time ratio control group, when the high photoresist waste liquid flows into the discharge amount/time ratio control group, the emission amount/time ratio control group performs emission ratio adjustment to discharge a high concentration photoresist waste liquid; The technique of developing excessive photoresist particles in the waste liquid improves the durability, alkalinity, and developer regeneration quality of the system.

如圖1所示,於本較佳實施例中,該第一送液組包括一第一閥121、一第一泵122以及一第二閥123;其中,該第一閥121與該第一泵122係設置於該第一儲存槽11與該第一壓力/流量感應器13之間的送液管線上,且該第一泵122與該第一壓力/流量感應器13連接、該第一閥121分別與該第一儲存槽11及該第一泵122連接,用以調節該含光阻顯影廢液的流量;該第二閥123具有一輸入端及一輸出端,該第二閥123的輸入端係連接於該超過濾膜14的第二輸出端,該第二閥123的輸出端係連接於該第一儲存槽11與該第一閥121之間的送液管線上,藉此讓該高光阻廢液回流,並再次流入該超過濾膜14進行分離、過濾處理。 As shown in FIG. 1 , in the preferred embodiment, the first liquid supply group includes a first valve 121 , a first pump 122 , and a second valve 123 ; wherein the first valve 121 and the first The pump 122 is disposed on the liquid supply line between the first storage tank 11 and the first pressure/flow sensor 13, and the first pump 122 is connected to the first pressure/flow sensor 13, the first The valve 121 is respectively connected to the first storage tank 11 and the first pump 122 for adjusting the flow rate of the photoresist-containing developing waste liquid; the second valve 123 has an input end and an output end, and the second valve 123 The input end is connected to the second output end of the ultrafiltration membrane 14 , and the output end of the second valve 123 is connected to the liquid supply line between the first storage tank 11 and the first valve 121 , thereby The high-resistance waste liquid is returned to the ultrafiltration membrane 14 for separation and filtration treatment.

進一步的,於本較佳實施例中,該排放量/時間比例控制組包括一第二壓力/流量感應器151、一廢液排放調節閥152以及一流量感應器153,該第二壓力/流量感應器151係連接該超過濾膜14的第二輸出端,該廢液 排放調節閥152係分別與該第二壓力/流量感應器151、該流量感應器153連接,該廢液排放調節閥152係用以調節該含光阻顯影廢液之排放量/時間比例,並用以提高顯影液回收率,因此當該高光阻廢液依序流經該第二壓力/流量感應器151、該廢液排放調節閥152、該流量感應器153,並經該廢液排放調節閥152進行排放比例調節以排出該含高濃度光阻廢液。 Further, in the preferred embodiment, the emission/time ratio control group includes a second pressure/flow sensor 151, a waste liquid discharge regulating valve 152, and a flow sensor 153, the second pressure/flow The inductor 151 is connected to the second output end of the ultrafiltration membrane 14, the waste liquid The discharge regulating valve 152 is respectively connected to the second pressure/flow sensor 151 and the flow sensor 153, and the waste liquid discharge regulating valve 152 is used for adjusting the discharge/time ratio of the photoresist-containing waste liquid, and In order to increase the developer recovery rate, the high-resistance waste liquid flows through the second pressure/flow sensor 151, the waste liquid discharge regulating valve 152, the flow sensor 153, and the waste liquid discharge regulating valve. 152 performs a discharge ratio adjustment to discharge the high concentration photoresist waste liquid.

關於本發明之又一較佳實施例,請參考圖2所示,其主要技術內容與前一實施例大致相同,惟本較佳實施例中進一步包括一溫度感應器16以及一第一熱交換器17;其中,該溫度感應器16係設置於該第一送液組的第一壓力/流量感應器13與該超過濾膜14的輸入端之間的送液管線上,用以感測該第一送液組的第一泵122產生之循環熱能/功率;該第一熱交換器17係設置在該超過濾膜14的第二輸出端與該第一送液組的第二閥123之間的送液管線上,該第一熱交換器17係可根據該溫度感應器16感測到的熱能/功率超過一門檻值而進行降溫,透過該溫度感應器16、該第一熱交換器17進行溫控,以保護並提生系統安全性。於本較佳實施例中,該超過濾膜14係呈一柱狀,該超過濾膜14具有一濾孔徑及一截留分子量,於本較佳實施例中該濾孔徑為0.02~0.005(um/單位)、該截留分子量(Molecular Weight Cut-Off,MWCO)為1500~50000(Dalton/單位),透過該超過濾膜14並以錯流(Cross Flow)式進行分離、過濾,針對面板、半導體、封測等基板製作所用之正負型光阻,或者顏料光阻用TMAH、NaOH、NaHCO3/Na2CO3、KOH等顯影液進行分離、過濾處理,能夠達到較佳分離效果;另外,顏料光阻特性、顯影液特性可依不同的截留分子量之超過濾膜濾。 Referring to FIG. 2, the main technical content of the present invention is substantially the same as that of the previous embodiment. However, the preferred embodiment further includes a temperature sensor 16 and a first heat exchange. The temperature sensor 16 is disposed on the liquid supply line between the first pressure/flow sensor 13 of the first liquid supply group and the input end of the ultrafiltration membrane 14 for sensing the The first pump 122 of the first liquid supply group generates the circulating heat energy/power; the first heat exchanger 17 is disposed at the second output end of the ultrafiltration membrane 14 and the second valve 123 of the first liquid supply group. The first heat exchanger 17 can be cooled according to the thermal energy/power sensed by the temperature sensor 16 exceeding a threshold value, through the temperature sensor 16, the first heat exchanger. 17 temperature control to protect and enhance system safety. In the preferred embodiment, the ultrafiltration membrane 14 has a columnar shape, and the ultrafiltration membrane 14 has a filter pore size and a molecular weight cut off. In the preferred embodiment, the filtration pore size is 0.02 to 0.005 (um/ The molecular weight cut-off (MWCO) is 1500 to 50000 (Dalton/unit), and is separated and filtered by the ultrafiltration membrane 14 in a cross-flow manner, and is applied to a panel, a semiconductor, or the like. Positive and negative photoresists used for substrate fabrication, such as sealing and measuring, or pigment photoresists such as TMAH, NaOH, NaHCO3/Na2CO3, KOH, etc., can be separated and filtered to achieve better separation. In addition, pigment photoresist properties and development The liquid properties can be filtered by ultrafiltration membranes of different molecular weight cutoffs.

關於本發明之另一較佳實施例,請參考圖3所示,其主要技術內容與前述各個實施例大致相同,惟本較佳實施例中進一步包括一初級過濾模組、一第三壓力/流量感應器19;其中,該第三壓力/流量感應器19係安裝設 置在靠近該超過濾膜14的輸入端之送液管線上,該初級過濾模組係設置於該第一壓力/流量感應器13、該第三壓力/流量感應器19之間的送液管線上,藉由該初級過濾模組的重新製程剝離之正/負型光阻,以延長/保護該超過濾膜14,達到雙重過濾保護的效果。 Referring to FIG. 3, the main technical content of the present invention is substantially the same as that of the foregoing embodiments. However, the preferred embodiment further includes a primary filter module and a third pressure/ a flow sensor 19; wherein the third pressure/flow sensor 19 is installed The primary filter module is disposed on the liquid supply line near the input end of the ultrafiltration membrane 14 , and the primary filter module is disposed between the first pressure/flow sensor 13 and the third pressure/flow sensor 19 On the line, the positive/negative photoresist is stripped by the re-process of the primary filter module to extend/protect the ultrafiltration membrane 14 to achieve double filtration protection.

於本較佳實施例中,進一步的,如圖3所示,該初級過濾模組更包括一細微粒子過濾器180、一第一控制閥181、一第二控制閥182、一第三控制閥183、一第四控制閥184、一第五控制閥185、一第六控制閥186以及一第七控制閥187;該第一控制閥181連接該第一壓力/流量感應器13,該細微粒子過濾器180配置在該第一控制閥181、該第二控制閥182之間,該第二控制閥182連接該第三壓力/流量感應器19。 In the preferred embodiment, further, as shown in FIG. 3, the primary filter module further includes a fine particle filter 180, a first control valve 181, a second control valve 182, and a third control valve. 183, a fourth control valve 184, a fifth control valve 185, a sixth control valve 186 and a seventh control valve 187; the first control valve 181 is connected to the first pressure / flow sensor 13, the fine particles The filter 180 is disposed between the first control valve 181 and the second control valve 182, and the second control valve 182 is connected to the third pressure/flow sensor 19.

又如圖3所示,該第三控制閥183、該第四控制閥184、該第五控制閥185、該第六控制閥186、該第七控制閥187係分別與該細微粒子過濾器180連接;其中,該第三控制閥183用以調節一潔淨乾燥空氣(Clean Dry Air,CDA)的流量,該第四控制閥184、該第五控制閥185係用以調節一超純水(De-ionized Water,DIW)的流量,該第六控制閥186、該第七控制閥187係用以將殘存高濃度光阻廢液進行排放,以免影響回收顯影液鹼濃度變化;於本較佳實施例中,係由該第一送液組的第一壓力/流量感應器13、該第三壓力/流量感應器19、該初級過濾模組構成一自動逆流機制。 As shown in FIG. 3, the third control valve 183, the fourth control valve 184, the fifth control valve 185, the sixth control valve 186, and the seventh control valve 187 are respectively associated with the fine particle filter 180. The third control valve 183 is configured to regulate the flow rate of a Clean Dry Air (CDA), and the fourth control valve 184 and the fifth control valve 185 are used to adjust an ultrapure water (De The flow rate of the -ionized water (DIW), the sixth control valve 186 and the seventh control valve 187 are used for discharging the residual high-concentration photoresist waste liquid so as not to affect the change of the alkali concentration of the recovered developer; In the example, the first pressure/flow sensor 13 of the first liquid supply group, the third pressure/flow sensor 19, and the primary filter module form an automatic backflow mechanism.

為說明該自動逆流機制的運作方式,再如圖3所示,藉由該第一壓力/流量感應器13、該第三壓力/流量感應器19感測到之壓力/流量所產生相對應大小之一電流/電壓值,並判斷該電流/電壓值是否超過一臨界值,若是,則代表測知該細微粒子過濾器180因過濾光阻而阻塞;當該細微粒子過濾器180阻塞,而必須啟動該自動逆流機制,則先關閉該第一控制閥181、該第二 控制閥182,以免影響回收顯影液之品質/鹼濃度變化,並且繼續執行以下步驟:關閉該第三控制閥183、該第五控制閥185及該第六控制閥186,開啟該第四控制閥184以注入該超純水,並由該第七控制閥187將高濃度光阻廢液排放;關閉該第三控制閥183、該第四控制閥184及該第七控制閥187,開啟該第五控制閥185以注入該超純水,並由該第六控制閥186將高濃度光阻廢液排放;以及再關閉該第三控制閥183、該第五控制閥185及該第六控制閥186,開啟該第四控制閥184以注入該超純水,並由該第七控制閥187將高濃度光阻廢液排放;關閉該第四控制閥184、該第五控制閥185及該第六控制閥186,開啟該第三控制閥183以注入該潔淨乾燥空氣,並由該第七控制閥187將殘存之高濃度光阻廢液及水排放,以免影響回收顯影液鹼濃度變化。 To illustrate the operation mode of the automatic counterflow mechanism, as shown in FIG. 3, the corresponding pressure/flow rate is sensed by the first pressure/flow sensor 13 and the third pressure/flow sensor 19. a current/voltage value, and determining whether the current/voltage value exceeds a critical value, and if so, indicating that the fine particle filter 180 is blocked by the filter photoresist; when the fine particle filter 180 is blocked, it is necessary to Starting the automatic counterflow mechanism, first closing the first control valve 181, the second The valve 182 is controlled so as not to affect the quality/alkali concentration change of the recovered developer, and the following steps are continued: the third control valve 183, the fifth control valve 185 and the sixth control valve 186 are closed, and the fourth control valve is opened. 184 to inject the ultrapure water, and discharge the high concentration photoresist waste liquid by the seventh control valve 187; close the third control valve 183, the fourth control valve 184 and the seventh control valve 187, and open the first a fifth control valve 185 for injecting the ultrapure water, and discharging the high concentration photoresist waste liquid by the sixth control valve 186; and closing the third control valve 183, the fifth control valve 185 and the sixth control valve 186, the fourth control valve 184 is opened to inject the ultrapure water, and the seventh control valve 187 discharges the high concentration photoresist waste liquid; the fourth control valve 184, the fifth control valve 185, and the first The sixth control valve 186 opens the third control valve 183 to inject the clean dry air, and the remaining high-concentration photoresist waste liquid and water are discharged by the seventh control valve 187 so as not to affect the change of the alkali concentration of the recovered developer.

關於前述藉由該第一送液組使顯影廢液流入該超過濾膜14,以將面板、半導體、封測等基板製作所用之正負型光阻,或者顏料光阻用TMAH、NaOH、NaHCO3/Na2CO3、KOH等顯影液進行分離、過濾處理,並由該超過濾膜14係將分離、過濾分離後的該清澈顯影液回收至該顯影液再生設備20,再由該顯影液再生設備20進行顯影液的回收再利用;於本較佳實施例中,進一步揭示該顯影液再生設備20的構造,請參閱圖4所示,該顯影液再生設備20包括一第一回收儲存槽201、一第一過濾器204、一第一奈米過濾器205、一第一光度計207、一第二熱交換器210、一第二回收儲存槽21、一第二奈米過濾器211、一第一調合槽212、一第二光度計213、一負荷感應器216、一第三熱交換器218、一具有鹼濃度計及溫度計之小槽219、一第三回收儲存槽22以及一粒子過濾器223。 The positive and negative photoresist used for fabricating a substrate such as a panel, a semiconductor, or a package, or the like, or TMAH, NaOH, NaHCO3/ for a photoresist photoresist, by flowing the development waste liquid into the ultrafiltration membrane 14 by the first liquid supply group. The developing solution such as Na2CO3 or KOH is subjected to separation and filtration treatment, and the clear developing solution separated and separated by filtration is collected by the ultrafiltration membrane 14 to the developing solution regenerating device 20, and then developed by the developing solution regenerating device 20. In the preferred embodiment, the structure of the developer regeneration device 20 is further disclosed. Referring to FIG. 4, the developer regeneration device 20 includes a first recovery storage tank 201, a first The filter 204, a first nano filter 205, a first photometer 207, a second heat exchanger 210, a second recovery storage tank 21, a second nano filter 211, and a first blending tank 212, a second photometer 213, a load sensor 216, a third heat exchanger 218, a small tank 219 having an alkali concentration meter and a thermometer, a third recovery storage tank 22, and a particle filter 223.

當該清澈顯影液回收至該顯影液再生設備20後,該清澈顯影液進入該第一回收儲存槽201中,利用該顯影液再生設備20中的該第一奈米過濾器205、該第二奈米過濾器211、該粒子過濾器223進行再生處理,因此,透過該正負型光阻分離裝置10能夠預先分離該顯影廢液中過大之光阻粒子,以提升該顯影液再生設備20之耐用性、鹼度、顯影液再生品質。 After the clear developing solution is recovered to the developer regenerating device 20, the clear developing solution enters the first recovery storage tank 201, and the first nano filter 205 and the second in the developing solution regeneration device 20 are utilized. Since the nano filter 211 and the particle filter 223 are subjected to regeneration processing, the positive and negative resistive separation device 10 can preliminarily separate the excessive photoresist particles in the development waste liquid to enhance the durability of the developer regeneration device 20. Properties, alkalinity, and developer regeneration quality.

Claims (8)

一種顯影液再生系統的正負型光阻分離裝置,其包括:一第一儲存槽,供存放一含光阻顯影廢液;一第一送液組,係與該第一儲存槽連接,並用以調整該含光阻顯影廢液的流量;一第一壓力/流量感應器,係設在該第一送液組上,感測該含光阻顯影廢液於該第一送液組之壓力與流量,作為調節流量之參考;一超過濾膜,係與該第一送液組連接,並供流入該含光阻顯影廢液,該含光阻顯影廢液通過該超過濾膜使得正/負型光阻被分離,以產生一高光阻廢液及一清澈顯影液;一排放量/時間比例控制組,係與該超過濾膜連接,供流入該高光阻廢液,並進行排放比例調節以排出一含高濃度光阻廢液;其中,該排放量/時間比例控制組包括一第二壓力/流量感應器、一廢液排放調節閥以及一流量感應器,該第二壓力/流量感應器係連接該超過濾膜,該廢液排放調節閥係分別與該第二壓力/流量感應器、該流量感應器連接,調節該含光阻顯影廢液之排放量/時間比例;該含高濃度光阻廢液不回流至該第一儲存槽。 A positive-negative photoresist separation device for a developer regeneration system, comprising: a first storage tank for storing a photoresist-containing developing waste liquid; and a first liquid supply group connected to the first storage tank and used for Adjusting the flow rate of the photoresist-containing waste liquid; a first pressure/flow sensor is disposed on the first liquid supply group, and sensing the pressure of the photoresist-containing waste liquid in the first liquid supply group The flow rate is used as a reference for adjusting the flow rate; an ultrafiltration membrane is connected to the first liquid supply group and is configured to flow into the photoresist-containing development waste liquid, and the photoresist-containing development waste liquid passes through the ultrafiltration membrane to make positive/negative The photoresist is separated to generate a high photoresist waste liquid and a clear developing solution; a discharge amount/time ratio control group is connected to the ultrafiltration membrane for flowing into the high photoresist waste liquid, and the emission ratio is adjusted. Discharging a high concentration photoresist waste liquid; wherein the discharge/time ratio control group includes a second pressure/flow sensor, a waste liquid discharge regulating valve, and a flow sensor, the second pressure/flow sensor Connecting the ultrafiltration membrane, the waste liquid discharge adjustment System respectively, the flow sensor is connected to the second pressure / flow rate sensor, adjusting the waste containing photoresist development of emissions / time ratio; the photoresist waste containing a high concentration is not returned to the first storage tank. 如請求項1所述之顯影液再生系統的正負型光阻分離裝置,該第一送液組包括一第一閥、一第一泵,該第一閥與該第一泵設於該第一儲存槽與該第一壓力/流量感應器之間調節流量。 The positive and negative type photoresist separation device of the developer regeneration system of claim 1, wherein the first liquid supply group comprises a first valve and a first pump, and the first valve and the first pump are disposed at the first The flow rate is adjusted between the storage tank and the first pressure/flow sensor. 如請求項1所述之顯影液再生系統的正負型光阻分離裝置,進一步包括一溫度感應器以及一第一熱交換器,該溫度感應器係設於該第一送液組與該超過濾膜之間,感測該第一送液組的循環熱能/功率;該第一熱交換器係設在該超過濾膜與該第一送液組之間,該第一熱交換器根據該溫度感應器感測到的熱能/功率超過一門檻值而進行降溫。 The positive and negative type photoresist separation device of the developer regeneration system of claim 1, further comprising a temperature sensor and a first heat exchanger, wherein the temperature sensor is disposed in the first liquid supply group and the ultrafiltration Between the membranes, sensing the circulating heat energy/power of the first liquid supply group; the first heat exchanger is disposed between the ultrafiltration membrane and the first liquid supply group, the first heat exchanger according to the temperature The sensor's sensed thermal energy/power exceeds a threshold and is cooled. 如請求項1至3中任一項所述之顯影液再生系統的正負型光阻分離裝置,進一步包括一初級過濾模組、一第三壓力/流量感應器,;其中,該第三壓力/流量感應器係安裝設在靠近該超過濾膜,該初級過濾模組係設於該第一壓力/流量感應器、該第三壓力/流量感應器之間。 The positive and negative type photoresist separation device of the developer regeneration system according to any one of claims 1 to 3, further comprising a primary filter module, a third pressure/flow sensor, wherein the third pressure/ The flow sensor is installed adjacent to the ultrafiltration membrane, and the primary filter module is disposed between the first pressure/flow sensor and the third pressure/flow sensor. 如請求項4所述之顯影液再生系統的正負型光阻分離裝置,該初級過濾模組更包括一細微粒子過濾器、一第一控制閥、一第二控制閥、一第三控制閥、一第四控制閥、一第五控制閥、一第六控制閥以及一第七控制閥;該第一控制閥連接該第一壓力/流量感應器,該細微粒子過濾器設在該第一控制閥、該第二控制閥之間,該第二控制閥連接該第三壓力/流量感應器;該第三控制閥、該第四控制閥、該第五控制閥、該第六控制閥、該第七控制閥係分別與該細微粒子過濾器連接;其中,該第三控制閥調節一潔淨乾燥空氣的流量,該第四控制閥、該第五控制閥係調節一超純水的流量,該第六控制閥、該第七控制閥係將殘存高濃度光阻廢液排放。 The positive and negative type photoresist separation device of the developer regeneration system according to claim 4, wherein the primary filter module further comprises a fine particle filter, a first control valve, a second control valve, and a third control valve. a fourth control valve, a fifth control valve, a sixth control valve and a seventh control valve; the first control valve is connected to the first pressure/flow sensor, and the fine particle filter is disposed in the first control Between the valve and the second control valve, the second control valve is connected to the third pressure/flow sensor; the third control valve, the fourth control valve, the fifth control valve, the sixth control valve, the a seventh control valve is respectively connected to the fine particle filter; wherein the third control valve adjusts a flow rate of a clean dry air, and the fourth control valve and the fifth control valve adjust a flow rate of the ultrapure water, The sixth control valve and the seventh control valve discharge residual high-concentration photoresist waste liquid. 如請求項5所述之顯影液再生系統的正負型光阻分離裝置,其中該超過濾膜具有一截留分子量,該截留分子量(Molecular Weight Cut-Off,MWCO)為1500~50000(Dalton/單位)。 The positive-negative type photoresist separation device of the developer regeneration system according to claim 5, wherein the ultrafiltration membrane has a molecular weight cut off, and the molecular weight cut-off (MWCO) is 1500 to 50000 (Dalton/unit). . 一種顯影液再生系統,其包括:一正負型光阻分離裝置,係如請求項1至6項中任一項所述之顯影液再生系統的正負型光阻分離裝置;一顯影液再生設備,係與該正負型光阻分離裝置連接,並接收一清澈顯影液,進行顯影液的回收再利用。 A developer regenerating system, comprising: a positive-negative type photoresist separation device, wherein the positive-negative type photoresist separation device of the developer regenerating system according to any one of claims 1 to 6; It is connected to the positive and negative type photoresist separation device, and receives a clear developing solution to recover and reuse the developing solution. 如請求項7所述之顯影液再生系統,該顯影液再生設備包括一第一回收儲存槽、一第一奈米過濾器、一第二奈米過濾器以及一粒子過濾器,當該清澈顯影液回收至該顯影液再生設備後,該清澈顯影液進入該第一回收儲存 槽中,利用該顯影液再生設備中的該第一奈米過濾器、該第二奈米過濾器、該粒子過濾器進行再生處理。 The developer regenerating system according to claim 7, wherein the developer regenerating apparatus comprises a first recovery storage tank, a first nano filter, a second nano filter, and a particle filter, when the clear development After the liquid is recovered to the developer regeneration device, the clear developer enters the first recovery storage In the tank, the first nano filter, the second nano filter, and the particle filter in the developer regeneration device are subjected to regeneration treatment.
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CN110668529A (en) * 2018-07-02 2020-01-10 陈俊吉 Developing solution regeneration system and positive and negative photoresist separation device thereof

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TWI264618B (en) * 2001-07-26 2006-10-21 Kemitekku Kk Developer regeneration unit

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Publication number Priority date Publication date Assignee Title
TWI264618B (en) * 2001-07-26 2006-10-21 Kemitekku Kk Developer regeneration unit

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110668529A (en) * 2018-07-02 2020-01-10 陈俊吉 Developing solution regeneration system and positive and negative photoresist separation device thereof

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