TWI659913B - Component loading-in and orderly supplying device having electrostatic auxiliary arrangement - Google Patents

Abstract

Disclosed is a component feeding arrangement supply device with an electrostatically assisted arrangement, which includes a base, a cover plate, and an electrostatic adsorption device. One side of the base is provided with a guide material gap. The cover plate is connected to the base and is combined with a plurality of module guides. The module guides include an introduction guide, a plurality of outer ring guides, and a discharge guide. The electrostatic adsorption device is fixed on the base and has an adsorption strip that assists the arrangement of the components to be tested and is located below the gap of the guide material. When the cover is in the closed state, the suction bar is aligned with the discharge guide, so that the component to be tested is loaded on a test turntable one by one by one side of the discharge guide, so as to improve the loading of the passive component under test. The phenomenon of vibration displacement when testing the turntable to solve the problem that the components to be tested are not aligned on the test turntable.

Description

Component feeding arrangement supply device with electrostatic auxiliary arrangement

The present invention relates to a feeding arrangement supply device for passive components, and more particularly to a feeding arrangement supply device for components having an electrostatic auxiliary arrangement.

It is known that passive components and miniaturized electronic components should be visually inspected before they can be bonded to circuit boards. In order to speed up the test efficiency, it has been proposed that the passive components to be tested can be arranged in a row on a test turntable, and the test turntable is used to perform multiple testing and classification processes. The entire arrangement of the passive components to be tested is reproduced by the feeding arrangement supply device. However, with the development trend of component miniaturization, the passive components to be tested are more susceptible to the vibration displacement of the reprint. How to accurately and quickly arrange the passive components to be tested on the test turntable is a serious issue.

There are two main differences between the traditional passive component feed arrangement and supply devices, which are straight rail vibration in-line type and double turntable in-line type. A conventional straight-track vibration in-line feeding arrangement supply device has been disclosed in the national invention patent publication number I433804. A "workpiece supply device" is disclosed, which is a conveying bowl having a workaround path and a work conveying path, and the conveying bowl is wound around an axis. Rotary shaker that reciprocates. The workpiece winding path is configured as a ring shape that is closed around the axis and has a workpiece holding surface on the outer periphery. The workpiece conveying path is configured to move around the axis from a predetermined position of the workpiece winding path toward the outer peripheral side. The direction branches obliquely and rises gradually around the axis. Through the reciprocating vibration of the conveying bowl about the axis, the workpiece moves toward the predetermined direction on the workpiece surrounding path and the workpiece conveying path. When a workpiece is introduced into the workpiece orbit, the conveying body reciprocates around the axis by using the shock generated by the shock body. The imported workpiece is subjected to centrifugal force on the closed annular workpiece orbiting path, which is pressed against the outer peripheral side. The workpiece holding surface is wound in the specified direction at the same time. In addition, regarding the double-turntable in-line feed arrangement and supply device, the “component feed arrangement and supply device” disclosed in the domestic new patent publication number M506133 and the “inspection machine for automatic arrangement and supply” of the national invention publication patent 201332866 will become The scattered and scattered passive components are dispersed and arranged through the guides of the dispersing turntable and the cover plate and are sequentially transferred to the test turntable for appearance inspection of the passive components.

In order to solve the above problems, the main purpose of the present invention is to provide a component feeding arrangement supply device with an electrostatically assisted arrangement, which is applied to the double-turntable in-line type to improve the vibration of the passive component under test when it is loaded on the test turntable. Displacement phenomenon to solve the problem of uneven arrangement of the components to be tested on the test turntable.

The object of the present invention and its technical problems are solved by using the following technical solutions. The invention discloses a component feeding arrangement supplying device with an electrostatic assisted arrangement, which is arranged in a component appearance inspection machine and is located on one side of a test turntable. The component feeding arrangement device includes a base, a cover plate and an electrostatic adsorption device. The base is provided with a material distribution turntable, and a first side of the base is provided with a material guide gap, so that the material distribution turntable partially overlaps the test turntable. The cover plate is connected to the base and is used to cover the material dividing turntable. The cover plate is combined with a plurality of pressing members and a plurality of module guides to make the module guides detachable. Close to the cover An inner surface, wherein the module guides include an introduction guide, a plurality of intermittently arranged outer guides, and a discharge guide. The electrostatic adsorption device is fixed on the base, and the electrostatic adsorption device has an adsorption strip that assists the arrangement of the components to be tested and is located below the gap of the guide material. Wherein, when the cover is in a closed state, the suction bar is aligned with the discharge guide, so that the component to be tested is loaded by the distribution turntable one by one to the test in such a way that the component to be tested relies on one entire side of the discharge guide. Turntable.

The object of the present invention and its technical problems can be further achieved by adopting the following technical measures.

In the aforementioned component feed arrangement and supply device, the suction bar may be located below the overlapping area of the distribution carousel and the test carousel and does not exceed the entire side of the discharge guide bar. Therefore, when the component to be tested is loaded one by one from the material-distributing turntable to the test turntable, the auxiliary static electricity generated by the electrostatic adsorption device can perform electrostatic adsorption at a specified position by the position of the adsorption bar, and assist the component under test Neatly arranged.

In the aforementioned component feeding arrangement supply device, the component feeding arrangement supply device may further include a feeding device, and the cover plate may further have a feeding port and be combined on an outer surface of the cover plate. There is a hopper connected to the feeding port for the feeding device to feed the component to be tested to the distribution carousel. In this way, the passive component to be tested can be fed into the feeding device, and can be fed into the material dividing turntable through the hopper of the feeding port.

In the aforementioned component feeding arrangement supply device, the module guides may further include a plurality of return guides, which may be located inside the outer ring guides. This can help eliminate passive components to be tested that are not in order.

In the aforementioned component feeding arrangement supply device, a handle may be provided on a second side of the cover plate. Therefore, the cover can be conveniently flipped by the handle.

In the aforementioned component feeding arrangement feeding device, the cover plate may further have a device hole, and the cover plate may further be provided with a feeding detection device and a feeding dispersion device, one of the feeding dispersion device. The blow-off nozzle is aligned in the device hole. In this way, the passive components under test loaded on the turntable can be scattered.

In the aforementioned component feeding arrangement supply device, the cover may further be provided with a first component arrangement rejection device. With this, components with poor ranking can be eliminated.

In the aforementioned component feed arrangement supply device, the base may be provided with a second component arrangement rejection device which is adjacent to the material guide gap. With this, components with poor ranking can be eliminated.

In the aforementioned component feeding arrangement supply device, the material-distributing turntable may be a conductive film, and the test turntable may be a glass sheet. Thereby, the material-distributing turntable can be a turntable having a high conductivity function and the test turntable can be a turntable having a low conductivity function.

In the aforementioned component feeding arrangement supply device, it is preferable that the exhaust guide bar is connected with an exhaust pipe, which is connected to an adsorption hole on a bottom surface of the exhaust guide bar, so that the component to be tested is led out of the material distribution. In the course of the turntable, it can rely on the entire row of sides of the discharge guide.

By means of the above-mentioned technical means, the present invention can arrange the passive components to be tested by electrostatically assisting the adsorption strip, so that the passive components to be tested are arranged neatly, so as to improve the vibration displacement phenomenon of the passive components under test when they are loaded on the test turntable. In order to solve the problem that the components to be tested are not aligned on the test turntable.

10‧‧‧Component appearance inspection machine

11‧‧‧test turntable

100‧‧‧ component feeding arrangement supply device

110‧‧‧ base

111‧‧‧ the first side

112‧‧‧Guide gap

120‧‧‧ Cover

121‧‧‧Inner surface

122‧‧‧ Outer surface

123‧‧‧ Urgent

124‧‧‧Inlet

125‧‧‧ Hopper

126‧‧‧ second side

127‧‧‧handle

128‧‧‧device hole

129‧‧‧Combination hole

130‧‧‧Distribution turntable

131‧‧‧ overlapping area

140‧‧‧Module guide

141‧‧‧Import guide

142‧‧‧Outer ring guide

143‧‧‧Discharge guide

144‧‧‧ side of the entire row

145‧‧‧Reflow guide

146‧‧‧Exclude guide

147‧‧‧Exhaust pipe

148‧‧‧ adsorption hole

150‧‧‧ electrostatic adsorption device

151‧‧‧Adsorption Strip

152‧‧‧Fixed parts

160‧‧‧Feeding device

161‧‧‧Feeding track

162‧‧‧Turntable

163‧‧‧Aggregate Funnel

170‧‧‧Feed detection device

180‧‧‧feed dispersing device

181‧‧‧Blowing nozzle

191‧‧‧Rejection device for poor arrangement of first component

192‧‧‧Second component arrangement rejection device

193‧‧‧component arrangement detection device

FIG. 1 is a schematic three-dimensional view of a component feed arrangement and supply device with an electrostatic auxiliary arrangement installed on a component appearance inspection machine according to a specific embodiment of the present invention.

FIG. 2 is a schematic perspective view of the component feeding arrangement supply device according to a specific embodiment of the present invention.

FIG. 3 is a schematic perspective view of the component feeding arrangement supply device and the corresponding test turntable in a top view according to a specific embodiment of the present invention.

FIG. 4 is a three-dimensional schematic diagram of the component feeding arrangement supply device in a state of overturning a cover plate and a corresponding test turntable according to a specific embodiment of the present invention.

Fig. 5: Partial side view of the component feeding arrangement supply device at its discharge guide bar according to a specific embodiment of the present invention.

FIG. 6 is a partially enlarged perspective view showing the installation position of an electrostatic adsorption device, which is one of the component feeding and supplying devices, according to a specific embodiment of the present invention.

In the following, the embodiments of the present invention will be described in detail with the accompanying diagrams. However, it should be noted that these diagrams are simplified schematic diagrams, and the basic structure or implementation method of the invention is only illustrated by a schematic method. The relationship between the components and combinations in this case. The components shown in the figure are not drawn in proportion to the actual number, shape, and size. Some size ratios and other related size ratios have been exaggerated or simplified to provide more clarity. description of. The actual number, shape, and size ratio are optional designs, and the detailed component layout may be more complicated.

According to a specific embodiment of the present invention, as shown in FIG. 1, a component feeding arrangement supply device 100 having an electrostatic auxiliary arrangement can be installed on a component appearance inspection machine 10 and located on one side of a test turntable 11. The component appearance inspection machine 10 further includes a plurality of inspection stations and at least one sorting box, which are arranged around the test turntable 11 (not shown in the figure), and the test turntable 11 is used to carry the entire array of to be tested Passive components are tested. The component feeding arrangement supply device 100 is illustrated in FIG. 2 as an example. A three-dimensional schematic diagram of the component feeding arrangement supply device 100 includes a base 110, a cover plate 120, and an electrostatic adsorption device 150. FIG. 3 is a perspective view of the component feeding arrangement supply device 100 and the corresponding test turntable 11 in a top view, and FIG. 4 is the component feeding arrangement supply device 100 in the state of overturning the cover plate 120 and its corresponding Three-dimensional schematic diagram of the test turntable 11. FIG. 5 is a partial side view of the component feed arrangement supply device 100 at its discharge guide 143, and FIG. 6 is a partial view showing the installation position of the electrostatic adsorption device 150 of the component feed arrangement supply device 100 Enlarge the perspective view.

Please refer to FIG. 1 to FIG. 4. The base 110 is provided with a material dividing turntable 130, which is driven by a rotating shaft to rotate. The base 110 has a first side 111 for transferring the passive component to be tested from the material-distributing turntable 130 to a side of a test turntable 11 of the component appearance inspection machine 10. The first side edge 111 is provided with a material guide notch 112 so that the material dividing turntable 130 partially overlaps the test turntable 11 of the component appearance inspection machine 10. A plurality of passive components to be tested can be rotated on the material-distributing turntable 130 to be dispersed and arranged in a row. The material-distributing turntable 130 is partially overlapped with the test turntable 11 at the material guide gap 112, so that the arranged passive components to be tested can be transferred to the test turntable 11 for appearance inspection. The periphery of the test turntable 11 may be provided with a feed sensing mechanism between the test stations and the component loading area. In this embodiment, the material-distributing turntable 130 may be a conductive film, and the test turntable 11 may be a glass sheet. Accordingly, the distribution turntable 130 can be a soft turntable with a high conductivity function and the test turntable 11 can be a hard turntable with a low conductivity function, so that the distribution turntable 130 can be partially laminated on the test turntable 11, In order to reduce the height difference of component reproduction. The average thickness of the distribution turntable 130 may be 1.7 millimeters, and the average thickness of the test turntable 11 may be greater than the average thickness of the distribution turntable 130.

Referring to FIGS. 2 to 4, the cover plate 120 is connected to the base 110 and is used to cover the material-distributing turntable 130. The cover plate 120 and the base 110 can be connected by a one-sided pivot connection. In this embodiment, a second side 126 of the cover 120 may be provided with a handle 127. So it can be done with the handle 127 Advantageously, the cover 120 is flipped. The cover plate 120 uses a plurality of pressing members 123 to combine a plurality of module guide bars 140 in a manner of penetrating the plurality of combining holes 129 of the cover plate 120. The pressing members 123 may be screws and the rod length thereof Exceeding the thickness of the cover plate 120, and the module guide bars 140 have corresponding screw holes or fixing nuts. Therefore, the module guide bars 140 are detachably attached to an inner surface 121 of the cover plate 120. By using the module guides 140 located under the cover plate 120 and not in contact with the distribution carousel 130, the passive components to be tested can be arranged in an orderly array under the rotation of the distribution carousel 130. . More specifically, the module guides 140 include an introduction guide 141, a plurality of intermittently arranged outer ring guides 142, and a discharge guide 143. The module guides 140 are preferably more It includes a plurality of return guides 145 and a rejection guide 146. The return guides 145 and the rejection guide 146 are located inside the outer ring guides 142. This can help eliminate passive components to be tested that are not in order. When the passive component to be tested enters the distribution carousel 130, the introduction guide bar 141 can help the passive component to be tested to make a preliminary arrangement on the distributing carousel 130, and the outer ring guide bars 142 can help neatly arrange the The passive component to be tested is loaded into the test turntable 11 by the material-distributing turntable 130, and the rejection guide bar 146 can assist in removing the passive components to be tested and move it toward the inner circle of the material-distributing turntable 130, and the reflow The guide bar 145 can assist in re-arrangement of the passive components to be tested that are poorly arranged on the distribution turntable 130.

Please refer to FIGS. 1 to 6. The electrostatic adsorption device 150 is fixed on the base 110. The electrostatic adsorption device 150 has an adsorption strip 151 that assists the arrangement of the components to be tested and is located in the guide gap 112. Below. A fixing member 152 fixed to the base 110 on one side is used to fix the adsorption strip 151 so as not to contact the test turntable 11 (as shown in FIG. 5).

Please refer to FIGS. 3 and 5, when the cover plate 120 is in a closed state, the suction strip 151 is aligned with the discharge guide 143 so that the component to be tested depends on a whole row of side surfaces 144 of the discharge guide 143. Loaded into the test turntable 11 from the distribution turntable 130 one by one. Preferably, the adsorption strip 151 is located at the point The material turntable 130 and one of the test turntables 11 are below the overlapping area 131 and do not exceed the entire side 144 of the discharge guide 143. The overlapped region 131 is a shuttle-like shape in which two circles partially overlap. Preferably, the outer end of the ejection guide bar 143 can extend beyond the overlapping area 131. Therefore, when the components to be tested are loaded one by one from the distribution carousel 130 to the test carousel 11, the auxiliary static electricity generated by the electrostatic adsorption device 150 can be electrostatically adsorbed at a specified position by the position of the adsorption bar 151 to Assist the neat arrangement of the components under test.

More specifically, referring to FIGS. 1 to 4, the component feeding arrangement supply device 100 may further include a feeding device 160, and the cover plate 120 may further have a feeding inlet 124 (as shown in FIG. 2). (Shown), and a hopper 125 communicating with the feeding port 124 is combined on an outer surface 122 of the cover plate 120 for the feeding device 160 to feed the component to be tested to the distribution turntable 130. A collecting hopper 163 on the feeding device 160 can be poured into a passive component to be tested, and a rotating table 162 on the feeding device 160 is used to rotate, so that a feeding outlet of a feeding track 161 of the feeding device 160 is aligned. The hopper 125 is aligned, and the passive components to be tested can be sent to the hopper 125 through the feeding track 161. Thereby, the passive component to be tested can be fed into the feeding device 160, and can be fed into the distribution carousel 130 through the hopper 125 of the feeding port 124.

Please refer to FIG. 2, the cover plate 120 may further have a device hole 128, and the cover plate 120 may further be provided with a feed detection device 170 and a feed dispersion device 180. The feed dispersion device 180 One of the blow-off nozzles 181 is disposed and aligned in the device hole 128. Thereby, the passive components to be tested loaded on the material dividing turntable 130 can be blown away. When the number of passive components to be tested on the distribution turntable 130 is insufficient, the insufficient detection state will be detected by the feeding detection device 170, and a feeding start signal will be provided to the feeding device 160 to drive the rotary table 162. The rotation and the movement of the feeding track 161. A blowing nozzle 181 of the feed dispersing device 180 is arranged and aligned in the hole 128 of the device. The blowing nozzle 181 can be in a state of constant blowing. Thereby, the passive components to be tested that have been loaded into the material-distributing turntable 130 and grouped together can be blown away. See section 2 As shown in FIG. 3, the upper outer surface 122 of the cover plate 120 is preferably further provided with a first component arrangement rejection device 191. In this way, the passive components to be tested can be eliminated due to poor ranking.

In addition, referring to FIGS. 2 to 4, the base 110 may be provided with a second component arrangement rejection device 192, which is adjacent to the guide gap 112. The base 110 is further provided with a component arrangement detection device 193. By using the component arrangement detection device 193 to detect a passive component under test that is poorly sorted, the second component arrangement culling rejection device 192 can be used to eliminate the passive component under test that is poorly sorted.

Therefore, according to the present invention, the passive components to be tested can be aligned by the electrostatic assistance of the adsorption strip 151, so that the passive components to be tested derived from the distribution turntable 130 can be neatly arranged on the entire side 144 of the discharge guide 143 until The passive component to be tested is reproduced on the test turntable 11, and the discharge guide bar 143 can be suspended from the distribution turntable 130 to improve the vibration displacement phenomenon of the passive component to be tested when it is loaded on the test turntable 11. The problem that the components to be tested are not aligned on the test turntable 11 is solved.

Preferably, the exhaust guide bar 143 is connected with an exhaust pipe 147, which is connected to a suction hole 148 on the bottom surface of the exhaust guide bar 143, so that the component to be tested is led out of the dispensing turntable 130. It can rely on the entire row of side surfaces 144 of the discharge guide 143.

What has been disclosed above are only the preferred embodiments of the present invention, and of course, the scope of rights of the present invention cannot be limited by this. Therefore, equivalent changes made according to the claims of the present invention still fall within the scope of the present invention.

Claims (9)

A component feeding arrangement supply device with an electrostatic assisted arrangement is arranged in a component appearance inspection machine and is located on one side of a test turntable. The component feeding arrangement supply device includes: a base, the base The upper part is provided with a material-distributing turntable, and a first side of the base is provided with a material guide gap so that the material-distributing turntable partially overlaps the test turntable; a cover plate is connected to the base, and The cover is closed on the material-distributing turntable, and the cover plate is combined with a plurality of module guide bars by using a plurality of pressing members, so that the module guide bars are detachably attached to an inner surface of the cover plate. The module guide bars include an introduction guide bar, a plurality of intermittently arranged outer ring guide bars, and a discharge guide bar; and an electrostatic adsorption device is fixedly installed on the base. The electrostatic adsorption device is There is an adsorption bar that assists the arrangement of the tested components, and is located below the guide gap. The adsorption bar is located below the overlapping area of the distribution carousel and the test carousel and does not exceed one row of the discharge guide bar. Side, and the strip is not touching The test turntable; wherein, when the cover plate is in a closed state, the suction bar is aligned with the discharge guide bar, so that the component to be tested is loaded on the test turntable one by one by the side of the entire row. . As described in item 1 of the scope of the patent application, the component feeding arrangement supply device with an electrostatically assisted arrangement further includes a feeding device, and the cover plate further has a feeding inlet and is on an outer surface of the cover plate. A hopper connected to the feeding port is connected to the feeding device for feeding the component to be tested to the distributing turntable. As described in item 1 of the scope of the patent application, the component feeding arrangement supply device with electrostatic auxiliary arrangement, wherein the module guides further include a plurality of reflow guides, which are located inside the outer guides. As described in item 1 of the scope of the patent application, the component feeding arrangement supply device with an electrostatically assisted arrangement, wherein a handle is provided on a second side of one of the cover plates. According to item 1 of the scope of the patent application, a component feeding arrangement supply device with an electrostatic auxiliary arrangement, wherein the cover plate is further provided with a device hole, and the cover plate is further provided with a feeding detection device and a The material dispersing device, a blowing dispersing nozzle of one of the feeding dispersing devices, is arranged and aligned in the hole of the device. According to item 5 of the scope of the patent application, the component feeding arrangement supply device with electrostatically assisted arrangement, wherein the cover is further provided with a first component arrangement rejection device. According to item 6 of the patent application scope, a component feeding arrangement supply device with an electrostatically assisted arrangement, wherein the base is provided with a second component arrangement defect rejection device, which is adjacent to the guide material gap. According to the component feed arrangement and supply device with electrostatically assisted arrangement described in item 1 of the scope of the patent application, the material dividing turntable is a conductive film, and the test turntable is a glass sheet. According to any one of items 1 to 8 of the scope of the patent application, the component feeding arrangement supply device with an electrostatic auxiliary arrangement, wherein the exhaust guide bar is connected with an exhaust pipe, which is conducted to a position on the exhaust guide bar Adsorption holes on the bottom surface.