CN108946065B - Component feeding arrangement and supply device with vacuum guide - Google Patents
Component feeding arrangement and supply device with vacuum guide Download PDFInfo
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- CN108946065B CN108946065B CN201710349203.5A CN201710349203A CN108946065B CN 108946065 B CN108946065 B CN 108946065B CN 201710349203 A CN201710349203 A CN 201710349203A CN 108946065 B CN108946065 B CN 108946065B
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- guide
- vacuum
- turntable
- feeding
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G47/00—Article or material-handling devices associated with conveyors; Methods employing such devices
- B65G47/02—Devices for feeding articles or materials to conveyors
- B65G47/04—Devices for feeding articles or materials to conveyors for feeding articles
- B65G47/12—Devices for feeding articles or materials to conveyors for feeding articles from disorderly-arranged article piles or from loose assemblages of articles
- B65G47/14—Devices for feeding articles or materials to conveyors for feeding articles from disorderly-arranged article piles or from loose assemblages of articles arranging or orientating the articles by mechanical or pneumatic means during feeding
- B65G47/1407—Devices for feeding articles or materials to conveyors for feeding articles from disorderly-arranged article piles or from loose assemblages of articles arranging or orientating the articles by mechanical or pneumatic means during feeding the articles being fed from a container, e.g. a bowl
- B65G47/1478—Devices for feeding articles or materials to conveyors for feeding articles from disorderly-arranged article piles or from loose assemblages of articles arranging or orientating the articles by mechanical or pneumatic means during feeding the articles being fed from a container, e.g. a bowl by means of pick-up devices, the container remaining immobile
- B65G47/1485—Devices for feeding articles or materials to conveyors for feeding articles from disorderly-arranged article piles or from loose assemblages of articles arranging or orientating the articles by mechanical or pneumatic means during feeding the articles being fed from a container, e.g. a bowl by means of pick-up devices, the container remaining immobile using suction or magnetic forces
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- Mechanical Engineering (AREA)
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Abstract
The invention provides a component feeding arrangement and supply device with vacuum guide, which comprises a base, a cover plate, a vacuum guide device and an electrostatic adsorption device. One side of the base is provided with a material guiding notch. The cover plate is pivoted to the base and combined with a plurality of module guide bars, and each module guide bar comprises a guide-in guide bar and a plurality of outer ring guide bars. The vacuum guide device is arranged on the cover plate and is provided with a guide piece, the electrostatic adsorption device is fixedly arranged on the base and is provided with an adsorption strip for assisting the arrangement and the derivation of the element to be tested, and the adsorption strip is positioned below the material guide notch. When the cover plate is closed, the adsorption strip is aligned to the guide piece, so that the elements to be tested are tightly close to the guide piece and are loaded into the test turntable one by one, the vibration displacement phenomenon of the elements to be tested when the elements to be tested are loaded into the test turntable is improved, and the problem that the elements to be tested are not arranged on the test turntable in an orderly manner is solved.
Description
Technical Field
The present invention relates to a component feeding arrangement and supply device, and more particularly to a component feeding arrangement and supply device with vacuum guide.
Background
It is known that passive devices and miniaturized electronic devices should be first inspected for appearance and then bonded to a circuit board. In order to speed up the testing efficiency, it is proposed that the passive devices to be tested can be arranged in an array on a testing turntable, and a plurality of testing and sorting processes are performed by using the rotation of the testing turntable. And the whole-column arrangement of the passive elements to be tested is realized by the transshipment of the feeding arrangement and supply device. However, with the trend of miniaturization of devices, the passive devices to be tested are more likely to be displaced by the transferred vibration, and therefore, how to precisely and rapidly arrange the passive devices to be tested in a row on the test turntable becomes a serious issue.
The traditional feeding arrangement and supply device for passive elements is mainly divided into two types, namely a straight rail vibration integral type and a double-turntable integral type. A known straight-rail vibrating in-line pan feeding arrangement feeder is disclosed in taiwan patent No. I433804, which discloses a "workpiece feeder" having a workpiece encircling path and a workpiece conveying path of a conveying bowl and a rotary vibrator for vibrating the conveying bowl reciprocally about an axis. The workpiece circulation path is annular and closed around the axis, and has a workpiece holding surface on the outer peripheral edge, and the workpiece conveying path is branched obliquely from a predetermined position of the workpiece circulation path toward the outer peripheral side in a predetermined direction around the axis and gradually ascends around the axis. The workpiece is moved in the prescribed direction on the workpiece circulation path and the workpiece transfer path by the reciprocating vibration of the transfer bowl about the axis. When a workpiece is introduced into the workpiece circulation path, the conveyor reciprocates about the axis by the action of the shock generated by the shock generator, and the introduced workpiece is subjected to a centrifugal force on the closed annular workpiece circulation path, and is pressed against the workpiece holding surface on the outer peripheral side and circulates in a predetermined direction.
In addition, regarding the double-turntable all-in-one type feeding and arranging device, the "component feeding and arranging device" disclosed in taiwan patent No. M506133 and the "appearance inspection machine with automatic arrangement and supply" disclosed in taiwan patent No. 201332866, the passive components scattered in a pile are scattered and arranged by the dispersion turntable and the guide bars of the cover plate, and are sequentially transferred and introduced onto the test turntable for the appearance inspection operation of the passive components.
Disclosure of Invention
In order to solve the above problems, the present invention provides a feeding, arranging and supplying device with vacuum guiding for components, which is applied to a dual-turntable arrangement type for improving the vibration displacement phenomenon of the components to be tested when loaded into the testing turntable, so as to solve the problem of the uneven arrangement of the components to be tested on the testing turntable.
A component feeding arrangement and supply device with vacuum guide is used for being installed on a component appearance detection machine, the component appearance detection machine is provided with a test turntable, the component feeding arrangement and supply device with vacuum guide is arranged on one side of the test turntable, and the component feeding arrangement and supply device with vacuum guide comprises: the test device comprises a base, a test turntable and a test module, wherein the base is provided with a material distribution turntable and is provided with a first side edge, and the first side edge is provided with a material guide notch so that the material distribution turntable is partially overlapped on the test turntable; the cover plate is pivoted to the base and used for covering the material distribution turntable, the cover plate is provided with an inner surface, a plurality of module guide bars are detachably combined on the inner surface, and each module guide bar comprises a lead-in guide bar and a plurality of outer ring guide bars which are arranged in a threaded shape in an intermittent manner; the vacuum guide device is arranged on the inner surface of the cover plate and comprises a guide piece, the guide piece is provided with a vacuum groove and a guide front surface which are communicated with the vacuum device, and the guide front surface is positioned on one side of the vacuum groove; the electrostatic adsorption device is fixedly arranged on the base and provided with an adsorption strip for assisting the arrangement and the derivation of the element to be detected, and the adsorption strip is positioned below the material guide notch; when the cover plate is in a covering state, the adsorption strip is aligned to the guide piece, so that the elements to be tested are tightly close to the guide face and are loaded into the test turntable one by one through the material distribution turntable.
In one embodiment, the vacuum groove is communicated with the vacuum device through a vacuum exhaust tube.
In one embodiment, the vacuum groove is connected with the vacuum pumping pipe through an air hole.
In one embodiment, the guide surface is a mirror surface.
In one embodiment, the adsorption strip is positioned below the overlapping area of the material distribution turntable and the test turntable and does not exceed the guide surface of the guide member.
In one embodiment, the device further comprises a feeding device, the cover plate is provided with a feeding port, and a hopper communicated with the feeding port is combined on the outer surface of the cover plate, so that the feeding device feeds the components to be tested to the material distribution turntable.
In one embodiment, the module conducting bar further comprises a plurality of reflow conducting bars, which are located at the inner side of the outer ring conducting bar.
In one embodiment, the cover plate further has a device hole, the cover plate is further provided with a feeding detection device and a feeding dispersion device, and the feeding dispersion device has a blow-off nozzle aligned in the device hole.
In one embodiment, the cover plate is also provided with a first component arrangement defect removing device; the base is provided with a second element arrangement defect removing device which is adjacent to the material guide notch.
In one embodiment, the material distributing turntable is a conductive film, and the test turntable is a glass sheet.
Through the technical means, the passive elements to be tested can be arranged in order by the aid of the static electricity of the guide piece and the adsorption strip of the vacuum guide device, so that the phenomenon of vibration displacement of the passive elements to be tested when the passive elements to be tested are loaded into the test turntable is improved, and the problem that the elements to be tested are not arranged in order on the test turntable is solved.
In addition, the invention can also be suitable for the arrangement of the O-shaped rings, thereby avoiding the phenomena of the distortion and knotting of the O-shaped rings or the blocking of materials by the plug material.
Drawings
FIG. 1 is a perspective view of the present invention installed in an element appearance inspection machine;
FIG. 2 is a schematic perspective view of the present invention;
FIG. 3 is a perspective view of a corresponding test turntable of the present invention from a top view;
FIG. 4 is a perspective view of the present invention with the cover plate lifted and the corresponding test turntable;
FIG. 5 is a partial side view of the present invention at the pilot;
FIG. 6 is a perspective view of a pilot of the present invention;
FIG. 7 is a partially enlarged perspective view of the mounting position of the electrostatic adsorption device of the present invention;
FIG. 8 is a schematic view of another embodiment of the present invention showing the invention used for O-ring alignment;
description of reference numerals:
a component appearance inspection machine 10;
a test turntable 11;
a component feeding arrangement supply device 100;
a base 110;
a first side 111;
a material guiding gap 112;
a cover plate 120;
an inner surface 121;
an outer surface 122;
the urging member 123;
a feed inlet 124;
a hopper 125;
a second side edge 126;
a handle 127;
a device aperture 128;
a coupling hole 129;
a material distribution turntable 130;
the overlap region 131;
a module conductive bar 140;
a lead-in bar 141;
an outer ring guide bar 142;
a return conductor 145;
removing the conducting bars 146;
an electrostatic adsorption device 150;
an absorbent strip 151;
a fixing member 152;
a feeding device 160;
a feed rail 161;
a rotating table 162;
an aggregate funnel 163;
a material inlet detecting device 170;
a feed dispersion device 180;
a blow-off nozzle 181;
a first component arrangement defect removal device 191;
a second component poor arrangement rejecting device 192;
a device arrangement detection device 193;
a vacuum pilot device 20;
a pilot member 21;
a bonding surface 211;
a bottom surface 212;
a vacuum groove 213;
an air hole 214;
a lead face 215;
a vacuum exhaust tube 22;
a first image sensor 30;
a second image sensor 31;
a third image sensor 32;
the magazines 33, 34;
an O-ring 200.
Detailed Description
Reference will now be made in detail to the present embodiments of the invention, examples of which are illustrated in the accompanying drawings, but which can be embodied in many different forms and varied in the manner defined and covered by the claims.
As shown in fig. 1, a component feeding arrangement feeding apparatus 100 with vacuum guiding according to an embodiment of the present invention is configured to be mounted on a component appearance inspection machine 10 and located at one side of a test turntable 11 of the component appearance inspection machine 10, wherein the component appearance inspection machine 10 further includes a plurality of inspection stations and at least one sorting cassette, which are arranged at a periphery (not shown) of the test turntable 11, and the test turntable 11 is configured to carry an array of passive components to be tested for testing.
The component feeding arrangement and supply apparatus 100 includes a base 110, a cover 120, a vacuum guiding apparatus 20, and an electrostatic adsorbing apparatus 150.
Referring to fig. 1 to 4, a material-separating turntable 130 is rotatably disposed on the base 110, and the base 110 has a first side 111 for transferring the passive component to be tested from the material-separating turntable 130 to the side of the testing turntable 11 of the component appearance testing machine 10. The first side 111 has a material guiding gap 112, so that the material distributing turntable 130 partially overlaps the testing turntable 11 of the component appearance inspection machine 10. A plurality of passive components to be tested can be rotated on the material-distributing turntable 130 and arranged in a dispersed and aligned manner. The material distributing turntable 130 is partially overlapped on the testing turntable 11 at the material guiding gap 112, so that the arranged passive components to be tested can be transferred to the testing turntable 11 for appearance detection. The test turntable 11 can be further provided with a material-feeding sensing mechanism at the periphery thereof between the detection station and the component loading area.
In the present embodiment, the material-separating turntable 130 may be a conductive film, and the test turntable 11 may be a glass sheet. Therefore, the material separating turntable 130 can be a soft turntable with high conductive function, and the test turntable 11 can be a hard turntable with low conductive function, so that the material separating turntable 130 can be partially overlapped on the test turntable 11 to reduce the height difference of the reloading of the components. The average thickness of the dispensing carousel 130 may be 1.7 millimeters, and the average thickness of the test carousel 11 may be greater than the average thickness of the dispensing carousel 130.
Referring to fig. 2 to 4, the cover plate 120 is pivotally connected to the base 110 and is used for covering the material-separating turntable 130. In this embodiment, the second side 126 of the cover plate 120 may be provided with a handle 127. The cover plate 120 is conveniently openable by means of a handle 127. The cover plate 120 is coupled to the module guide bars 140 by means of the plurality of pressing members 123 penetrating through the plurality of coupling holes 129 of the cover plate 120, the pressing members 123 may be screws, the length of the screw exceeds the thickness of the cover plate 120, and the module guide bars 140 have corresponding screw holes or fixing nuts for coupling and fixing the pressing members 123. Therefore, the module conducting bar 140 is detachably attached to the inner surface 121 of the cover plate 120. The module conducting bars 140, which are located under the cover plate 120 and are not in contact with the material-dividing turntable 130, are used to guide the passive components to be tested to be sequentially arranged in rows under the rotation action of the material-dividing turntable 130.
More specifically, the module bar 140 includes a lead-in bar 141 located at the center of the cover plate 120 and a plurality of outer ring bars 142 intermittently arranged in a thread shape, the module bar 140 further includes a plurality of reflow bars 145 and a removal bar 146, and the reflow bars 145 and the removal bar 146 are located inside the outer ring bars 142. Therefore, the passive component to be tested with poor sorting can be removed. When the passive components to be tested enter the material-dividing turntable 130, the guiding-in guide strips 141 can assist the passive components to be tested to be primarily arranged on the material-dividing turntable 130, the outer-ring guide strips 142 can assist the passive components to be tested which are regularly arranged to be loaded into the test turntable 11 from the material-dividing turntable 130, the removing guide strips 146 can assist the passive components to be tested which are badly arranged to be removed and make the passive components to be tested move towards the inner ring of the material-dividing turntable 130, and the backflow guide strips 145 can assist the passive components to be tested which are badly arranged on the material-dividing turntable 130 to be reflowed.
As shown in fig. 1 to 6, the vacuum guiding device 20 is disposed on the inner surface 121 of the cover plate 120 and located at the material guiding gap 112, the vacuum guiding device 20 includes a guiding member 21, the guiding member 21 is similar to the module guide bar 140 and detachably fixed on the inner surface 121 of the cover plate 120 by the fastening member 123, and the guiding member 21 has a combining surface 211 combined to the inner surface 121 and an opposite bottom surface 212. The bottom surface 212 is recessed with a racetrack-shaped vacuum groove 213 and an air hole 214 communicating with the vacuum groove 213, and one side of the vacuum groove 213 is provided with a front guide surface 215. The air hole 214 is used to connect to the vacuum pumping tube 22 and is connected to the vacuum device through the vacuum pumping tube 22. Through the vacuum absorption effect, the passive component to be tested can be attached to the guiding surface 215 in the process of guiding out the material distributing turntable 130, and then arranged at the correct position, so as to have the guiding effect. The guiding surface 215 is a mirror surface, which can reduce the friction force of the passive component to be tested during the operation process.
Referring to fig. 1 to 7, the electrostatic adsorption device 150 is fixed to the base 110, and the electrostatic adsorption device 150 has an adsorption bar 151 for assisting the device under test to be arranged and guided out, which is located below the material guiding gap 112, and fixes the adsorption bar 151 in a clamping manner by a fixing member 152 fixed to the base 110 at one side so as not to be attached to and contacted with the test turntable 11 (as shown in fig. 7).
Referring to fig. 3 and 6, when the cover plate 120 is in a closed state, the absorption bars 151 are aligned with the guiding members 21, so that the devices to be tested are loaded one by one onto the testing turntable 11 by the material distributing turntable 130 in a manner of depending on the guiding surfaces 215 of the guiding members 21. Preferably, the suction strip 151 may be located below the overlapping region 131 of the material separating turntable 130 and the test turntable 11 and not beyond the pilot surface 215 of the pilot member 21. The overlap region 131 is a shuttle shape in which two circles partially overlap. Preferably, the outer end of the pilot 21 may extend beyond the overlap region 131. Therefore, when the devices to be tested are loaded one by one from the material-separating turntable 130 to the test turntable 11, the auxiliary static electricity generated by the electrostatic adsorption device 150 can perform the electrostatic adsorption of the designated position through the position of the adsorption bar 151, so as to assist the devices to be tested to be arranged regularly.
More specifically, referring to fig. 1-4, the component feeding arrangement feeding device 100 may further include a feeding device 160, and the cover plate 120 may further have a feeding port 124 (as shown in fig. 2), and a hopper 125 connected to the feeding port 124 is combined on the outer surface 122 of the cover plate 120 to feed the component to be tested to the material distribution turntable 130 through the feeding device 160. The passive component to be tested can be poured from the hopper 163 of the feeding device 160, and rotated by the rotary table 162 of the feeding device 160, so that the feeding outlet of the feeding rail 161 of the feeding device 160 is aligned with the hopper 125, and the passive component to be tested can be delivered to the hopper 125 via the feeding rail 161. Therefore, the passive component to be tested can be fed into the feeding device 160 and fed into the material distribution turntable 130 through the hopper 125 of the feeding port 124.
Referring to fig. 2, the cover plate 120 may further have a device hole 128, and the cover plate 120 may further have a material feeding detection device 170 and a material feeding dispersion device 180, wherein the material feeding dispersion device 180 has a blow-off nozzle 181 aligned with the device hole 128. Therefore, the passive components to be tested loaded into the material-distributing turntable 130 can be blown away. When the number of passive components to be tested on the material distribution turntable 130 is insufficient, the material feeding detection device 170 detects the insufficient state and provides a feeding start signal to the material feeding device 160 to drive the rotation of the rotary table 162 and the movement of the feeding track 161. The blow-off nozzle 181 of the feed dispersion device 180 is aligned with the device hole 128, and the blow-off nozzle 181 may be in a permanent blowing state. Therefore, the passive components to be tested, which are loaded into the material-separating turntable 130 and are clustered, can be blown away.
Referring to fig. 2 and 3, preferably, a first component misarrangement removing device 191 is further disposed on the upper outer surface 122 of the cover plate 120. Therefore, the passive components to be tested with poor sequence can be removed.
In addition, referring to fig. 2 to 4, the base 110 may be provided with a second component misarrangement removing device 192 adjacent to the material guiding gap 112. The base 110 is further provided with a device arrangement detection device 193. The passive components to be tested with poor sorting detected by the component arrangement detecting device 193 can be rejected by the second component arrangement poor rejecting device 192.
Therefore, the present invention can arrange the passive devices to be tested by the electrostatic assistance of the vacuum guiding device 20 and the absorption strip 151, so that the passive devices to be tested guided out by the material separating turntable 130 are regularly arranged on the guiding surface 215 of the guiding member 21 until the passive devices to be tested are transferred onto the testing turntable 11, and the discharge guide strip 143 can be suspended on the material separating turntable 130 to improve the vibration displacement phenomenon of the passive devices to be tested when loaded onto the testing turntable 11, so as to solve the problem of irregular arrangement of the devices to be tested on the testing turntable 11.
FIG. 8 is a schematic view of another embodiment of the present invention showing the invention used for O-ring alignment. The device 100 for arranging and supplying component feeding materials can also be used for arranging the O-rings 200, wherein when the component to be tested is the O-ring 200, the O-ring 200 is removed from the overlapped part by the module guide strip 140 and the blow-off nozzle 181 through the non-vibration flow platform, and is guided into a row to be supplied to the testing turntable 11, and the first image sensor 30, the second image sensor 31 and the third image sensor 32 are used for detecting the size surface defect and the thickness respectively, and then are respectively distributed to the correct material boxes 33 and 34. Compared with other feeding modes of a conveyer belt, the vibration-free flow platform material distribution alignment mode uses the blowing nozzles 181 to eliminate the overlapped part and the alignment of the module guide bars 40, and can avoid the phenomena of twisting and knotting of the O-shaped rings 200 and material blockage caused by a shifting plate or a brush mode.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A component feeding arrangement and supply device with vacuum guide is used for being installed on a component appearance detection machine, the component appearance detection machine is provided with a test turntable, the component feeding arrangement and supply device with vacuum guide is arranged on one side of the test turntable, and the component feeding arrangement and supply device with vacuum guide comprises:
the test device comprises a base, a test turntable and a test module, wherein the base is provided with a material distribution turntable and is provided with a first side edge, and the first side edge is provided with a material guide notch so that the material distribution turntable is partially overlapped on the test turntable;
the cover plate is pivoted to the base and used for covering the material distribution turntable, the cover plate is provided with an inner surface, a plurality of module guide bars are detachably combined on the inner surface, and each module guide bar comprises a lead-in guide bar and a plurality of outer ring guide bars which are arranged in a threaded shape in an intermittent manner;
the vacuum guide device is arranged on the inner surface of the cover plate and comprises a guide piece, the guide piece is provided with a vacuum groove and a guide front surface which are communicated with the vacuum device, and the guide front surface is positioned on one side of the vacuum groove; and
the electrostatic adsorption device is fixedly arranged on the base and provided with an adsorption strip for assisting the arrangement and the derivation of the element to be detected, and the adsorption strip is positioned below the material guide notch;
when the cover plate is in a covering state, the adsorption strip is aligned to the guide piece, so that the elements to be tested are tightly close to the guide face and are loaded into the test turntable one by one through the material distribution turntable.
2. A component feeding arrangement feeding device with vacuum guiding as claimed in claim 1, wherein said vacuum groove is connected to said vacuum device through a vacuum suction tube.
3. The component feeding arrangement feeding device with vacuum guiding as claimed in claim 2, wherein said vacuum groove is connected to said vacuum suction tube through an air hole.
4. The component pan feeding arrangement feeding device with vacuum guide as claimed in claim 1, wherein the guide face is a mirror face.
5. The component feeding arrangement feeding device with vacuum guide of claim 1, wherein said suction strip is located below the overlapping area of said distributing turntable and said testing turntable and does not exceed the guide surface of said guide member.
6. The component feeding arrangement and feeding device with vacuum guiding as claimed in claim 1, further comprising a feeding device, wherein the cover plate has a feeding port, and a hopper connected to the feeding port is combined on an outer surface of the cover plate, so that the feeding device feeds the components to be tested to the material distribution turntable.
7. A component feeding arrangement feeding device with vacuum guide as claimed in claim 1, wherein said modular guide further comprises a plurality of return guides located inside said outer ring guide.
8. The component feeding arrangement feeding device with vacuum guiding as claimed in claim 1, wherein the cover plate further has a device hole, the cover plate is further provided with a feeding detection device and a feeding dispersion device, and the feeding dispersion device has a blow-off nozzle aligned in the device hole.
9. The component feeding arrangement feeding device with vacuum guide function as claimed in claim 8, wherein the cover plate is further provided with a first component arrangement failure removing device; the base is provided with a second element arrangement defect removing device which is adjacent to the material guide notch.
10. The component feeding arrangement feeding device with vacuum guiding as claimed in claim 1, wherein the material separating turntable is a conductive film, and the testing turntable is a glass sheet.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710349203.5A CN108946065B (en) | 2017-05-17 | 2017-05-17 | Component feeding arrangement and supply device with vacuum guide |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710349203.5A CN108946065B (en) | 2017-05-17 | 2017-05-17 | Component feeding arrangement and supply device with vacuum guide |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108946065A CN108946065A (en) | 2018-12-07 |
| CN108946065B true CN108946065B (en) | 2020-03-24 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710349203.5A Active CN108946065B (en) | 2017-05-17 | 2017-05-17 | Component feeding arrangement and supply device with vacuum guide |
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Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| TWI774534B (en) * | 2021-08-24 | 2022-08-11 | 瀚萱科技有限公司 | A kind of counting equipment for micro electronic components |
| TWI774533B (en) * | 2021-08-24 | 2022-08-11 | 瀚萱科技有限公司 | Device and method for counting materials of micro electronic components |
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| WO2012125352A1 (en) * | 2011-03-14 | 2012-09-20 | The Procter & Gamble Company | Article feed system for aligning and singulating articles |
| TW201332866A (en) * | 2012-02-15 | 2013-08-16 | Lung Shen Technology Co Ltd | Appearance detector with automatically orientating supply |
| CN204297649U (en) * | 2014-11-21 | 2015-04-29 | 广东太安堂药业股份有限公司 | The bottle produced for Chinese medicine arranges apparatus for temporary storage |
| TWM506133U (en) * | 2015-04-30 | 2015-08-01 | Yoli New Technology Co Ltd | Component loading-in and orderly supplying device |
| CN204702182U (en) * | 2015-06-23 | 2015-10-14 | 方醒 | Touch key fills connection pay-off automatically |
| CN105398789A (en) * | 2015-11-09 | 2016-03-16 | 长兴佳瑞清洁用品有限公司 | Single object feeding device |
| CN206798546U (en) * | 2017-05-17 | 2017-12-26 | 友立新科技股份有限公司 | Element pan feeding arrangement feedway with vacuum correcting |
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2017
- 2017-05-17 CN CN201710349203.5A patent/CN108946065B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2012125352A1 (en) * | 2011-03-14 | 2012-09-20 | The Procter & Gamble Company | Article feed system for aligning and singulating articles |
| TW201332866A (en) * | 2012-02-15 | 2013-08-16 | Lung Shen Technology Co Ltd | Appearance detector with automatically orientating supply |
| CN204297649U (en) * | 2014-11-21 | 2015-04-29 | 广东太安堂药业股份有限公司 | The bottle produced for Chinese medicine arranges apparatus for temporary storage |
| TWM506133U (en) * | 2015-04-30 | 2015-08-01 | Yoli New Technology Co Ltd | Component loading-in and orderly supplying device |
| CN204702182U (en) * | 2015-06-23 | 2015-10-14 | 方醒 | Touch key fills connection pay-off automatically |
| CN105398789A (en) * | 2015-11-09 | 2016-03-16 | 长兴佳瑞清洁用品有限公司 | Single object feeding device |
| CN206798546U (en) * | 2017-05-17 | 2017-12-26 | 友立新科技股份有限公司 | Element pan feeding arrangement feedway with vacuum correcting |
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| Publication number | Publication date |
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| CN108946065A (en) | 2018-12-07 |
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