TWI633301B - Calibration method and system thereof for particulate matter sensors - Google Patents

Calibration method and system thereof for particulate matter sensors Download PDF

Info

Publication number
TWI633301B
TWI633301B TW106111591A TW106111591A TWI633301B TW I633301 B TWI633301 B TW I633301B TW 106111591 A TW106111591 A TW 106111591A TW 106111591 A TW106111591 A TW 106111591A TW I633301 B TWI633301 B TW I633301B
Authority
TW
Taiwan
Prior art keywords
light
fine aerosol
detector
fine
module
Prior art date
Application number
TW106111591A
Other languages
Chinese (zh)
Other versions
TW201837457A (en
Inventor
林喆
Original Assignee
林喆
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 林喆 filed Critical 林喆
Priority to TW106111591A priority Critical patent/TWI633301B/en
Application granted granted Critical
Publication of TWI633301B publication Critical patent/TWI633301B/en
Publication of TW201837457A publication Critical patent/TW201837457A/en

Links

Landscapes

  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

一種細懸浮微粒偵測器校正系統包含一偵測光線發射器、一通過粉塵光線偵測器、一光線轉換模組及一校正模組。該偵測光線發射器射出一預定光線於一樣本氣體,且該樣本氣體包含數個細懸浮微粒。該通過粉塵光線偵測器用以量測該預定光線之散射、折射或反射,以獲得一光線量測值,且該光線轉換模組將該光線量測值轉換成一細懸浮微粒量測值。該校正模組利用一系統參數、一偵測光波受干擾參數、一基準點、一現場總最高值、一均值係數及一迴歸參考係數共同結合校正該細懸浮微粒量測值,以便獲得一已校正細懸浮微粒值。 A fine aerosol detector calibration system includes a detection light emitter, a dust light detector, a light conversion module and a correction module. The detection light emitter emits a predetermined light to the same gas, and the sample gas contains a plurality of fine aerosols. The dust light detector is configured to measure the scattering, refraction or reflection of the predetermined light to obtain a light measurement value, and the light conversion module converts the light measurement value into a fine suspended particle measurement value. The calibration module uses a system parameter, a detected light wave interference parameter, a reference point, a total field maximum value, a mean value coefficient, and a regression reference coefficient to jointly correct the fine aerosol measurement value, so as to obtain a Correct the fine aerosol value.

Description

細懸浮微粒偵測器校正方法及其系統 Fine suspension particle detector calibration method and system thereof

本發明係關於一種細懸浮微粒〔particulate matter,PM〕偵測器校正方法及其系統;特別是關於一種細懸浮微粒PM 1.0、PM 2.5、PM 10偵測器校正〔sensor calibration〕方法及其系統;更特別是關於一種光學式〔optical〕細懸浮微粒偵測器校正方法及其系統。 The invention relates to a method for correcting a fine particle (PM) detector and a system thereof, in particular to a fine aerosol PM 1.0, PM 2.5, PM 10 detector calibration method and system thereof More particularly, it relates to an optical (optical) fine aerosol detector calibration method and system thereof.

習用細懸浮微粒偵測系統及其方法,例如:美國專利公開第2013/0036837號〝MULTI-FILTER PM 10-PM 2.5 SAMPLER〞之發明專利申請案,其揭示一種多濾紙PM 10-PM 2.5採樣器。該採樣器包含一PM 10慣性衝擊器、一分歧管、一PM 10流量分配器、數個PM 10濾紙裝置、一PM 2.5慣性衝擊器、一PM 2.5流量分配器、數個PM 2.5濾紙裝置、一合流組件及一抽氣泵浦。 Conventional fine aerosol detection system and method thereof, for example, US Patent Publication No. 2013/0036837, MULTI-FILTER PM 10-PM 2.5 SAMPLER(R) invention patent application, which discloses a multi-filter PM 10-PM 2.5 sampler . The sampler comprises a PM 10 inertial impactor, a manifold, a PM 10 flow distributor, several PM 10 filter devices, a PM 2.5 inertial impactor, a PM 2.5 flow distributor, and several PM 2.5 filter devices. A combined flow component and a pumping pump.

承上,該分歧管具有一頂端、一左端以及一右端,且該頂端連接於該PM 10慣性衝擊器。該PM 10流量分配器具有一入口端及數個出口端,且該入口端連接於該分歧管之左端。該數個PM 10濾紙裝置分別連接於該PM 10流量分配器之數個出口。該PM 2.5慣性衝擊器連接於該分歧管之右端,而該PM 2.5流量分配器具有一入口端及數個出口端,且該入口端連接於該PM 2.5慣性衝擊器。該數個PM 2.5濾紙裝置分別連接於該PM 2.5流量分配器之數個出口端。該合流組件連接於該數個PM 10濾紙裝置及數個PM 2.5濾紙裝置,且該合流組件另連接該 抽氣泵浦。 The branch tube has a top end, a left end and a right end, and the top end is connected to the PM 10 inertial impactor. The PM 10 flow distributor has an inlet end and a plurality of outlet ends, and the inlet end is connected to the left end of the branch pipe. The plurality of PM 10 filter paper devices are respectively connected to a plurality of outlets of the PM 10 flow distributor. The PM 2.5 inertia impactor is coupled to the right end of the manifold, and the PM 2.5 flow distributor has an inlet end and a plurality of outlet ends, and the inlet end is coupled to the PM 2.5 inertia impactor. The plurality of PM 2.5 filter paper devices are respectively connected to the plurality of outlet ends of the PM 2.5 flow distributor. The merging assembly is connected to the plurality of PM 10 filter paper devices and a plurality of PM 2.5 filter paper devices, and the merging assembly is further connected to the Pumping pump.

然而,前述美國專利公開第2013/0036837號之多濾紙PM 10-PM 2.5採樣器顯然僅為多濾紙式空氣品質偵測技術而已,其並非屬於光學式空氣品質偵測技術。事實上,雖然習用光學式空氣品質偵測器具有方便使用及操作迅速的優點,但其偵測值具有相當大的誤差,即其偵測值之準確率極低。 However, the multi-filter paper PM 10-PM 2.5 sampler of the aforementioned U.S. Patent Publication No. 2013/0036837 is obviously only a multi-filter paper type air quality detecting technology, and it is not an optical air quality detecting technology. In fact, although the conventional optical air quality detector has the advantages of convenient use and rapid operation, the detected value has a considerable error, that is, the accuracy of the detected value is extremely low.

顯然,習用光學式空氣品質偵測技術必然存在進一步改善或後續校正其偵測值之需求,且亦存在進一步提供其監控管理系統之需求。前述專利僅為本發明技術背景之參考及說明目前技術發展狀態而已,其並非用以限制本發明之範圍。 Obviously, the conventional optical air quality detection technology necessarily has the need to further improve or subsequently correct its detection value, and there is also a need to further provide its monitoring management system. The foregoing patents are only for the purpose of reference to the present invention, and are not intended to limit the scope of the present invention.

有鑑於此,本發明為了滿足上述技術問題及需求,其提供一種細懸浮微粒偵測器校正方法及其系統,其將一系統參數及一偵測光波受干擾參數做為一光學式偵測器之一基礎校正參數,再於數個環境監測點以實測方式獲得數個環境監測資料,且利用該環境監測資料尋找一基準點、一現場總最高值及一均值係數,再利用該數個環境監測資料進行統計演算而獲得至少一迴歸參考係數,再利用該系統參數、偵測光波受干擾參數、基準點、現場總最高值、均值係數及迴歸參考係數共同結合校正一細懸浮微粒量測值,其相對於習用光學式空氣品質偵測器具有提升準確率之功效。 In view of the above, in order to meet the above technical problems and needs, the present invention provides a fine aerosol detector calibration method and system thereof, which utilizes a system parameter and a detected light wave interference parameter as an optical detector. One of the basic correction parameters, and several environmental monitoring points are obtained by several environmental monitoring points, and the environmental monitoring data is used to find a reference point, a total field maximum value and a mean value coefficient, and then use the several environments. The monitoring data is statistically calculated to obtain at least one regression reference coefficient, and then the system parameters, the detected light wave interference parameter, the reference point, the total field maximum value, the mean coefficient and the regression reference coefficient are combined to correct a fine suspended particle measurement value. It has the effect of improving accuracy compared to the conventional optical air quality detector.

本發明較佳實施例之主要目的係提供一種細懸浮微粒偵測器校正方法及其系統,其將一系統參數及一偵測光波受干擾參數做為一光學式偵測器之一基礎校正參數,再於數個環境監測點以實測方式獲得數個環境監測資料,且利用該環境監測資料尋找一基準點、一現場總最高 值及一均值係數,再利用該數個環境監測資料進行統計演算而獲得至少一迴歸參考係數,再利用該系統參數、偵測光波受干擾參數、基準點、現場總最高值、均值係數及迴歸參考係數共同結合校正一細懸浮微粒量測值,以達成提升細懸浮微粒偵測準確率之目的。 The main object of the preferred embodiment of the present invention is to provide a fine aerosol detector calibration method and system thereof, which use a system parameter and a detected light wave interference parameter as a basic correction parameter of an optical detector. Then, several environmental monitoring data are obtained by actual measurement at several environmental monitoring points, and the environmental monitoring data is used to find a reference point and a total site maximum. Value and a mean coefficient, and then using the plurality of environmental monitoring data for statistical calculation to obtain at least one regression reference coefficient, and then using the system parameters, detecting light wave interference parameters, reference points, total field maximum value, mean coefficient, and regression The reference coefficients are combined to correct a fine aerosol measurement value to achieve the purpose of improving the accuracy of fine aerosol detection.

為了達成上述目的,本發明較佳實施例之細懸浮微粒偵測器校正系統包含:一偵測光線發射器,其以光學式射出一預定光線於一樣本氣體,且該樣本氣體包含數個細懸浮微粒,以便在該預定光線通過該樣本氣體之細懸浮微粒時,造成該預定光線產生一散射、一折射角度或一反射角度;至少一通過粉塵光線偵測器,其相對配置於該偵測光線發射器之一預定光線接收角度,且該通過粉塵光線偵測器用以量測該預定光線之散射、折射或反射,以獲得一光線量測值;一光線轉換模組,其將該光線量測值轉換成一細懸浮微粒量測值;及至少一校正模組,其連接於該光線轉換模組,以便校正計算該細懸浮微粒量測值;其中該校正模組同時利用一系統參數、一偵測光波受干擾參數、一基準點、一現場總最高值、一均值係數及一迴歸參考係數共同結合校正該細懸浮微粒量測值,以便獲得一已校正細懸浮微粒值。 In order to achieve the above object, a fine aerosol detector calibration system according to a preferred embodiment of the present invention includes: a detection light emitter that optically emits a predetermined light to the same gas, and the sample gas contains a plurality of fine Suspending particles, such that when the predetermined light passes through the fine aerosol of the sample gas, causing the predetermined light to generate a scattering, a refractive angle or a reflection angle; at least one of the dust light detectors is oppositely disposed in the detection One of the light emitters predetermined a light receiving angle, and the dust light detector is configured to measure the scattering, refraction or reflection of the predetermined light to obtain a light measurement value; and a light conversion module, the light quantity The measured value is converted into a fine suspended particle measurement value; and at least one calibration module is connected to the light conversion module to correct and calculate the fine suspended particle measurement value; wherein the calibration module simultaneously utilizes a system parameter, Detecting the light wave interference parameter, a reference point, a total field maximum value, a mean value coefficient, and a regression reference coefficient together to correct the fine suspension Tablets measured value to obtain a corrected value of fine suspended particles.

本發明較佳實施例之該偵測光線發射器選擇為一紅外線模組、一雷射光模組、一發光二極體模組或其它光線發射模組。 In the preferred embodiment of the present invention, the detection light emitter is selected as an infrared module, a laser light module, a light emitting diode module or other light emitting module.

本發明較佳實施例之該通過粉塵光線偵測器選擇為一光電二極體、一光電晶體或其它光線偵測器。 In the preferred embodiment of the invention, the dust detector is selected as a photodiode, a photodiode or other photodetector.

本發明較佳實施例之該光線轉換模組及校正 模組結合一體設置,以形成一單一演算模組。 The light conversion module and the correction of the preferred embodiment of the present invention The modules are integrated to form a single calculus module.

本發明較佳實施例之該迴歸參考係數選擇為線性回歸係數、多項式回歸係數或其它迴歸參考係數。 In the preferred embodiment of the invention, the regression reference coefficients are selected as linear regression coefficients, polynomial regression coefficients or other regression reference coefficients.

本發明較佳實施例之該細懸浮微粒量測值為一細懸浮微粒濃度或一細懸浮微粒數量。 The fine aerosol measurement of the preferred embodiment of the invention is a fine aerosol concentration or a fine aerosol particle size.

為了達成上述目的,本發明較佳實施例之細懸浮微粒偵測器校正方法包含:選擇一光學式偵測器,且該光學式偵測器可取得一樣本氣體,而該光學式偵測器適用一系統參數及一偵測光波受干擾參數,且該系統參數及偵測光波受干擾參數為一基礎校正參數;利用數個環境監測資料尋找一基準點、一現場總最高值及一均值係數,且於數個環境監測點以實測方式獲得該數個環境監測資料;利用該數個環境監測資料進行統計演算,以獲得至少一迴歸參考係數;及利用該系統參數、偵測光波受干擾參數、基準點、現場總最高值、均值係數及迴歸參考係數共同結合校正一細懸浮微粒量測值,以獲得一已校正細懸浮微粒值。 In order to achieve the above object, a fine aerosol detector calibration method according to a preferred embodiment of the present invention includes: selecting an optical detector, and the optical detector can obtain the same gas, and the optical detector A system parameter and a detection light wave interference parameter are applied, and the system parameter and the detected light wave interference parameter are a basic correction parameter; using a plurality of environmental monitoring data to find a reference point, a total field maximum value and a mean value coefficient And obtaining the plurality of environmental monitoring data by using a plurality of environmental monitoring points; using the plurality of environmental monitoring data for statistical calculation to obtain at least one regression reference coefficient; and using the system parameter to detect the interference parameter of the optical wave The reference point, the total field maximum value, the mean coefficient and the regression reference coefficient are combined to correct a fine aerosol measurement value to obtain a corrected fine aerosol value.

本發明較佳實施例之該光學式偵測器包含一偵測光線發射器,且該偵測光線發射器選擇為一紅外線模組、一雷射光模組、一發光二極體模組或其它光線發射模組。 In the preferred embodiment of the present invention, the optical detector includes a detection light emitter, and the detection light emitter is selected as an infrared module, a laser light module, a light emitting diode module or the like. Light emission module.

本發明較佳實施例之該光學式偵測器包含一通過粉塵光線偵測器,且該通過粉塵光線偵測器選擇為一光電二極體、一光電晶體或其它光線偵測器。 In the preferred embodiment of the present invention, the optical detector includes a dust photodetector, and the dust detector is selected as a photodiode, a photodiode or other photodetector.

本發明較佳實施例之該迴歸參考係數選擇為線性回歸係數、多項式回歸係數或其它迴歸參考係數。 In the preferred embodiment of the invention, the regression reference coefficients are selected as linear regression coefficients, polynomial regression coefficients or other regression reference coefficients.

本發明較佳實施例之該細懸浮微粒量測值為 一細懸浮微粒濃度或一細懸浮微粒數量。 The measured value of the fine suspended particles in the preferred embodiment of the present invention is A fine aerosol concentration or a small amount of suspended particles.

1‧‧‧細懸浮微粒偵測器校正系統 1‧‧‧Small aerosol detector calibration system

1a‧‧‧細懸浮微粒偵測器校正系統 1a‧‧‧Small aerosol detector calibration system

10‧‧‧可攜式細懸浮微粒檢測器 10‧‧‧Portable fine aerosol detector

100‧‧‧空氣濾淨器 100‧‧‧Air filter

11‧‧‧偵測光線發射器 11‧‧‧Detecting light emitter

12‧‧‧通過粉塵光線偵測器 12‧‧‧Dust dust detector

13‧‧‧光線轉換模組 13‧‧‧Light Conversion Module

14‧‧‧校正模組 14‧‧‧ Calibration module

15‧‧‧警示系統 15‧‧‧ Warning System

2‧‧‧無線傳輸器 2‧‧‧Wireless transmitter

3‧‧‧資料收集器 3‧‧‧ Data Collector

第1圖:本發明第一較佳實施例之細懸浮微粒偵測器校正系統之方塊示意圖。 Figure 1 is a block diagram showing a fine suspension particle detector calibration system in accordance with a first preferred embodiment of the present invention.

第2圖:本發明較佳實施例之細懸浮微粒偵測器校正方法之流程示意圖。 2 is a flow chart showing a method for correcting a fine aerosol detector of a preferred embodiment of the present invention.

第3圖:本發明第一較佳實施例之細懸浮微粒偵測器校正系統配置於可攜式細懸浮微粒檢測器之示意圖。 Figure 3 is a schematic view showing the fine aerosol detector calibration system of the first preferred embodiment of the present invention disposed in a portable fine aerosol detector.

第4圖:本發明第一較佳實施例之細懸浮微粒偵測器校正系統配置於空氣濾淨器之示意圖。 Figure 4 is a schematic view showing the arrangement of the fine aerosol detector calibration system of the first preferred embodiment of the present invention in an air filter.

第5圖:本發明第二較佳實施例之細懸浮微粒偵測器校正系統之方塊示意圖。 Figure 5 is a block diagram showing a fine suspension particle detector calibration system in accordance with a second preferred embodiment of the present invention.

為了充分瞭解本發明,於下文將舉例較佳實施例並配合所附圖式作詳細說明,且其並非用以限定本發明。 In order to fully understand the present invention, the preferred embodiments of the present invention are described in detail below, and are not intended to limit the invention.

本發明較佳實施例之細懸浮微粒偵測器校正方法及其系統適用於各種細懸浮微粒偵測器構造、校正操作方法及其管理系統,例如:可攜式粉塵偵測器、室內〔indoor〕細懸浮微粒監測系統、戶外〔outdoor〕細懸浮微粒監測系統、細懸浮微粒手動〔manual〕監測系統、細懸浮微粒自動監測系統或其它細懸浮微粒偵測系統,但其並非用以限定本發明之範圍。 The fine suspension particle detector calibration method and system thereof are applied to various fine aerosol detector construction, calibration operation methods and management systems thereof, for example: portable dust detector, indoor [indoor a fine aerosol monitoring system, an outdoor fine aerosol monitoring system, a fine suspension manual monitoring system, a fine aerosol automatic monitoring system or other fine aerosol detecting system, but it is not intended to limit the present invention. The scope.

第1圖揭示本發明第一較佳實施例之細懸浮微粒偵測器校正系統之方塊示意圖。請參照第1圖所示,本發明第一較佳實施例之細懸浮微粒偵測器校正系統1包含一偵測光線發射器〔ray irradiation member〕11、一通過粉塵光線偵測器〔ray detector member〕12、一光線轉換模組〔ray conversion module〕13及至少一校正模組 〔calibration module〕14,且該偵測光線發射器11、通過粉塵光線偵測器12、光線轉換模組13及校正模組14適當組配於該細懸浮微粒偵測器校正系統1。 1 is a block diagram showing a fine suspension particle detector calibration system in accordance with a first preferred embodiment of the present invention. Referring to FIG. 1 , the fine aerosol detector calibration system 1 of the first preferred embodiment of the present invention includes a ray irradiation member 11 and a ray detector. Member]12, a ray conversion module 13 and at least one calibration module The calibrating module 14 and the detecting light emitter 11 , the dust detecting device 12 , the light converting module 13 and the correcting module 14 are appropriately combined with the fine aerosol detector calibration system 1 .

請再參照第1圖所示,舉例而言,該偵測光線發射器11可選擇為一紅外線模組〔infra-red module〕、一雷射光模組〔laser module〕、一發光二極體模組〔light emitting diode module〕或其它光線發射模組。該偵測光線發射器11以光學式射出一預定光線於一樣本氣體,且該樣本氣體包含數個細懸浮微粒〔PM 1.0、PM 2.5、PM 10或其它直徑粉塵〕,以便在該預定光線通過該樣本氣體之細懸浮微粒時,造成該預定光線產生一散射、一折射角度或一反射角度。 Referring to FIG. 1 again, for example, the detection light emitter 11 can be selected as an infrared module (infra-red module), a laser module, and a light emitting diode module. Group (light emitting diode module) or other light emitting module. The detecting light emitter 11 optically emits a predetermined light to the same gas, and the sample gas contains a plurality of fine suspended particles [PM 1.0, PM 2.5, PM 10 or other diameter dust] to pass the predetermined light. When the fine particles of the sample gas are suspended, the predetermined light causes a scattering, a refractive angle or a reflection angle.

請再參照第1圖所示,舉例而言,該通過粉塵光線偵測器12可選擇為一光電二極體〔photodiode〕、一光電晶體〔photo transistor〕或其它光線偵測器,或其可選擇散射式量測或非散射式量測。該通過粉塵光線偵測器12相對配置於該偵測光線發射器11之一預定光線接收角度,且該通過粉塵光線偵測器12用以量測該預定光線之散射、折射或反射,以獲得一光線量測值或一通過粉塵光線量測值。 Referring to FIG. 1 again, for example, the dust light detector 12 can be selected as a photodiode, a photo transistor, or other photodetector, or Choose either scatter or non-scatter measurements. The dust light detector 12 is oppositely disposed at a predetermined light receiving angle of the detecting light emitter 11 , and the dust light detector 12 is configured to measure scattering, refraction or reflection of the predetermined light to obtain A measured value of light or a measured value of light passing through the dust.

請再參照第1圖所示,舉例而言,該偵測光線發射器11及通過粉塵光線偵測器12組成一光學式偵測器,如第1圖之虛線框所示。該光學式偵測器可選自各種廠牌光學式偵測器,例如:夏普〔SHARP〕、松下〔Panasonic〕、飛利浦〔PHILIPS〕、大金〔Daikin〕或其它廠牌光學式偵測器,但其初步偵測值通常不精確,因此需要進一步校正。 Referring to FIG. 1 again, for example, the detection light emitter 11 and the dust detector 12 form an optical detector, as shown by the dashed box in FIG. The optical detector can be selected from a variety of brand optical detectors such as SHARP, Panasonic, PHILIPS, Daikin or other optical detectors. However, the initial detection value is usually inaccurate and therefore requires further correction.

請再參照第1圖所示,舉例而言,該光線轉換模組13可選自一實體電路〔physical circuit〕、一虛擬電路 〔virtual circuit〕、一可編輯邏輯晶片〔programmable logic chip〕、一可編輯電腦程式或具類似功能的元件。該光線轉換模組13將該光線量測值〔或通過粉塵光線量測值〕轉換成一細懸浮微粒量測值。 Referring to FIG. 1 again, for example, the light conversion module 13 can be selected from a physical circuit and a virtual circuit. [virtual circuit], an editable logic chip, an editable computer program, or a component with similar functions. The light conversion module 13 converts the light measurement value (or the dust light measurement value) into a fine aerosol measurement value.

請再參照第1圖所示,舉例而言,該校正模組14同樣的可選自一實體電路、一虛擬電路、一可編輯邏輯晶片、一可編輯電腦程式或具類似功能的元件。將該校正模組14連接於該光線轉換模組13,以便校正計算該細懸浮微粒量測值。 Referring to FIG. 1 again, for example, the correction module 14 can be selected from a physical circuit, a virtual circuit, an editable logic chip, an editable computer program, or a similar function. The correction module 14 is connected to the light conversion module 13 to correct and calculate the fine aerosol measurement value.

本發明另一較佳實施例選擇將該光線轉換模組13及校正模組14結合一體設置,以形成一單一演算模組〔calculation module〕或其類似演算功能的模組。舉例而言,該細懸浮微粒量測值為一細懸浮微粒濃度〔mg/m3〕或一細懸浮微粒數量。 In another preferred embodiment of the present invention, the light conversion module 13 and the correction module 14 are integrally combined to form a single calculation module or a module similar to the calculation function. For example, the fine aerosol measurement is a fine aerosol concentration [mg/m 3 ] or a fine aerosol amount.

請再參照第1圖所示,本發明另一較佳實施例之細懸浮微粒偵測器校正系統1包含一警示系統〔warning system〕15,以提供一警示訊號,以便警示該細懸浮微粒量測值是否超標或各種危險等級。舉例而言,該警示訊號由一蜂鳴器、一警示燈或其它警示訊號產生器〔例如:擴音器〕產生。 Referring to FIG. 1 again, the fine aerosol detector calibration system 1 of another preferred embodiment of the present invention includes a warning system 15 for providing a warning signal for alerting the amount of fine aerosol. Whether the measured value exceeds the standard or various dangerous levels. For example, the warning signal is generated by a buzzer, a warning light or other warning signal generator (for example, a loudspeaker).

第2圖揭示本發明較佳實施例之細懸浮微粒偵測器校正方法之流程示意圖,其對應於第1圖之細懸浮微粒偵測器校正系統1。請參照第1及2圖所示,本發明較佳實施例之細懸浮微粒偵測器校正方法包含步驟S1:首先,選擇一光學式偵測器,且該光學式偵測器可取得一樣本氣體,而該光學式偵測器適用一系統參數〔即原廠換算式及參數〕及一偵測光波受干擾參數〔即比例參數,ratio〕,且該系統參數及偵測光波受干擾參數為一基礎校正參數。 FIG. 2 is a flow chart showing a method for correcting a fine aerosol detector according to a preferred embodiment of the present invention, which corresponds to the fine aerosol detector calibration system 1 of FIG. Referring to Figures 1 and 2, the method for correcting the fine aerosol detector of the preferred embodiment of the present invention comprises the step S1: first, an optical detector is selected, and the optical detector can obtain the same Gas, and the optical detector is adapted to a system parameter (ie, original conversion mode and parameter) and a detected light wave interference parameter (ie, proportional parameter, ratio), and the system parameter and the detected light wave interference parameter are A basic correction parameter.

請再參照第1及2圖所示,本發明較佳實施例之細懸浮微粒偵測器校正方法包含步驟S2:接著,利用數個環境監測資料尋找一基準點〔即實測起始值〕、一現場總最高值〔即實測最高值〕及一均值係數〔即均值算式,例如:0.5〕,且於數個環境監測點以實測方式獲得該數個環境監測資料。舉例而言,本發明選擇該數個環境監測點包含新加坡、日本、香港、深圳、上海、台北、台中、彰化、台南、高雄等,即前述地點皆具有地緣關係。 Referring to FIGS. 1 and 2 again, the method for correcting the fine aerosol detector of the preferred embodiment of the present invention comprises the step S2: then, using a plurality of environmental monitoring data to find a reference point (ie, the measured starting value), The total maximum value of the site (that is, the highest measured value) and a mean value coefficient (ie, the mean value formula, for example, 0.5), and the several environmental monitoring data are obtained by actual measurement at several environmental monitoring points. For example, the present invention selects the plurality of environmental monitoring points including Singapore, Japan, Hong Kong, Shenzhen, Shanghai, Taipei, Taichung, Changhua, Tainan, Kaohsiung, etc., that is, the aforementioned locations are all geographically related.

請再參照第1及2圖所示,本發明較佳實施例之細懸浮微粒偵測器校正方法包含步驟S3:接著,於該光線轉換模組13及校正模組14之單一演算模組,利用該數個環境監測資料自動或非自動演算,以獲得至少一迴歸參考係數。舉例而言,該迴歸參考係數選擇為線性回歸〔linear regression〕係數、多項式回歸〔polynomial regression〕係數或其它迴歸參考係數。 Referring to FIG. 1 and FIG. 2 again, the method for correcting the fine aerosol detector of the preferred embodiment of the present invention comprises the step S3: followed by the single calculation module of the light conversion module 13 and the correction module 14 The plurality of environmental monitoring data are automatically or non-automatically calculated to obtain at least one regression reference coefficient. For example, the regression reference coefficient is selected as a linear regression coefficient, a polynomial regression coefficient, or other regression reference coefficients.

請再參照第1及2圖所示,本發明較佳實施例之細懸浮微粒偵測器校正方法包含步驟S4:接著,於該光線轉換模組13及校正模組14之單一演算模組,利用該系統參數、偵測光波受干擾參數、基準點、現場總最高值、均值係數及迴歸參考係數共同結合形成一校正演算函式,並利用該校正演算式校正一細懸浮微粒量測值,以獲得一已校正細懸浮微粒值。 Referring to FIG. 1 and FIG. 2 again, the method for correcting the fine aerosol detector of the preferred embodiment of the present invention includes the step S4: then, the single calculation module of the light conversion module 13 and the correction module 14 Using the system parameters, detecting the interference parameters of the light wave, the reference point, the total field maximum value, the mean coefficient and the regression reference coefficient, a correction calculation function is combined, and the calibration calculus is used to correct a fine aerosol measurement value. Obtain a corrected fine aerosol value.

舉例而言,本發明較佳實施例之校正演算函式選擇如下:基準點+(迴歸參考係數*(((基礎函數)*均值係數)-現場總最高值))其中基礎函數為系統參數及偵測光波受干擾參數之函數。 For example, the correction calculation function of the preferred embodiment of the present invention is selected as follows: reference point + (regression reference coefficient * (((basic function) * mean coefficient) - total field maximum value)) where the basic function is the system parameter and A function that detects the interference of light waves.

第3圖揭示本發明第一較佳實施例之細懸浮微粒偵測器校正系統配置於可攜式細懸浮微粒檢測器之示意圖。請參照第3圖所示,舉例而言,該細懸浮微粒偵測器 校正系統1配置於一可攜式細懸浮微粒檢測器10,以提升細懸浮微粒偵測準確率。 FIG. 3 is a schematic diagram showing the configuration of the fine aerosol detector calibration system of the first preferred embodiment of the present invention in a portable fine aerosol detector. Please refer to Figure 3, for example, the fine aerosol detector The calibration system 1 is disposed in a portable fine aerosol detector 10 to improve the accuracy of fine aerosol detection.

第4圖揭示本發明第一較佳實施例之細懸浮微粒偵測器校正系統配置於空氣濾淨器之示意圖。請參照第4圖所示,該細懸浮微粒偵測器校正系統1配置於一空氣濾淨器100,而該細懸浮微粒偵測器校正系統1包含一光學式偵測器,且該細懸浮微粒偵測器校正系統1連接於該光學式偵測器。 Figure 4 is a schematic view showing the arrangement of the fine aerosol detector calibration system of the first preferred embodiment of the present invention in an air filter. Referring to FIG. 4, the fine aerosol detector calibration system 1 is disposed in an air filter 100, and the fine aerosol detector calibration system 1 includes an optical detector, and the fine suspension A particle detector calibration system 1 is coupled to the optical detector.

第5圖揭示本發明第二較佳實施例之細懸浮微粒偵測器校正系統之方塊示意圖,其對應於第1圖之細懸浮微粒偵測器校正系統1。請參照第5圖所示,相對於第一實施例,本發明第二較佳實施例之細懸浮微粒偵測器校正系統1a另包含一無線傳輸器2及一資料收集器3,且該無線傳輸器2及資料收集器3連接於該光線轉換模組13及校正模組14之單一演算模組。 Figure 5 is a block diagram showing a fine aerosol detector calibration system of the second preferred embodiment of the present invention, which corresponds to the fine aerosol detector calibration system 1 of Figure 1. Referring to FIG. 5, with reference to the first embodiment, the fine aerosol detector calibration system 1a of the second preferred embodiment of the present invention further includes a wireless transmitter 2 and a data collector 3, and the wireless The transmitter 2 and the data collector 3 are connected to the single calculus module of the light conversion module 13 and the correction module 14.

請再參照第5圖所示,舉例而言,該無線傳輸器2可選擇為一WIFI模組、一藍牙〔bluetooth〕模組、一ibeacon模組或其它具類似功能之傳輸元件。同樣的,該資料收集器3亦可選擇為一資料儲存裝置〔data storage device〕、一智慧型手機〔smart phone〕、一電腦裝置〔computer device〕、一筆記型電腦裝置〔laptop computer device〕、一無線通訊裝置〔wireless communication device〕或其它具類似功能之裝置。 Referring to FIG. 5 again, for example, the wireless transmitter 2 can be selected as a WIFI module, a Bluetooth module, an ibeacon module, or other transmission components having similar functions. Similarly, the data collector 3 can also be selected as a data storage device, a smart phone, a computer device, a laptop computer device, A wireless communication device or other device having similar functions.

前述較佳實施例僅舉例說明本發明及其技術特徵,該實施例之技術仍可適當進行各種實質等效修飾及/或替換方式予以實施;因此,本發明之權利範圍須視後附申請專利範圍所界定之範圍為準。本案著作權限制使用於中華民國專利申請用途。 The foregoing preferred embodiments are merely illustrative of the invention and the technical features thereof, and the techniques of the embodiments can be carried out with various substantial equivalent modifications and/or alternatives; therefore, the scope of the invention is subject to the appended claims. The scope defined by the scope shall prevail. The copyright limitation of this case is used for the purpose of patent application in the Republic of China.

Claims (10)

一種細懸浮微粒偵測器校正系統,其包含:一偵測光線發射器,其以光學式射出一預定光線於一樣本氣體,且該樣本氣體包含數個細懸浮微粒,以便在該預定光線通過該樣本氣體之細懸浮微粒時,造成該預定光線產生一散射、一折射角度或一反射角度;至少一通過粉塵光線偵測器,其相對配置於該偵測光線發射器之一預定光線接收角度,且該通過粉塵光線偵測器用以量測該預定光線之散射、折射或反射,以獲得一光線量測值;一光線轉換模組,其將該光線量測值轉換成一細懸浮微粒量測值;及至少一校正模組,其連接於該光線轉換模組,以便校正計算該細懸浮微粒量測值;其中該校正模組同時利用一系統參數、一偵測光波受干擾參數、一基準點、一現場總最高值、一均值係數及一迴歸參考係數共同結合校正該細懸浮微粒量測值,以便獲得一已校正細懸浮微粒值。 A fine aerosol detector calibration system includes: a detection light emitter that optically emits a predetermined light to the same gas, and the sample gas contains a plurality of fine aerosols for passing the predetermined light When the fine particles of the sample gas are suspended, the predetermined light is caused to have a scattering, a refractive angle or a reflection angle; and at least one of the dust light detectors is disposed at a predetermined light receiving angle of the detecting light emitter. And the dust light detector is configured to measure the scattering, refraction or reflection of the predetermined light to obtain a light measurement value; and a light conversion module converts the light measurement value into a fine suspension particle measurement And a calibration module coupled to the light conversion module for correcting and calculating the fine aerosol measurement value; wherein the calibration module simultaneously utilizes a system parameter, a detection light wave interference parameter, and a reference Point, a total field maximum value, a mean value coefficient, and a regression reference coefficient are combined to correct the fine aerosol measurement value to obtain a corrected value Aerosols value. 依申請專利範圍第1項所述之細懸浮微粒偵測器校正系統,其中該偵測光線發射器選擇為一紅外線模組、一雷射光模組或一發光二極體模組。 The fine aerosol detector calibration system according to claim 1, wherein the detection light emitter is selected as an infrared module, a laser light module or a light emitting diode module. 依申請專利範圍第1項所述之細懸浮微粒偵測器校正系統,其中該通過粉塵光線偵測器選擇為一光電二極體或一光電晶體。 The fine aerosol detector calibration system according to claim 1, wherein the dust detector is selected as a photodiode or a photoelectric crystal. 依申請專利範圍第1項所述之細懸浮微粒偵測器校正系統,其中該光線轉換模組及校正模組結合一體設置,以形成一單一演算模組。 According to the fine aerosol detector calibration system described in claim 1, wherein the light conversion module and the correction module are integrated to form a single calculation module. 依申請專利範圍第1項所述之細懸浮微粒偵測器校正系統,其中該細懸浮微粒量測值為一細懸浮微粒濃度或一細懸浮微粒數量。 The fine aerosol detector calibration system of claim 1, wherein the fine aerosol measurement is a fine aerosol concentration or a fine aerosol amount. 一種細懸浮微粒偵測器校正方法,其包含:選擇一光學式偵測器,且該光學式偵測器可取得一樣本氣體,而該光學式偵測器適用一系統參數及一偵測光波受干擾參數,且該系統參數及偵測光波受干擾參數為一基礎校正參數;利用一偵測光線發射器以光學式射出一預定光線於該樣本氣體,且該樣本氣體包含數個細懸浮微粒,以便在該預定光線通過該樣本氣體之細懸浮微粒時,造成該預定光線產生一散射、一折射角度或一反射角度;將至少一通過粉塵光線偵測器相對配置於該偵測光線發射器之一預定光線接收角度,且該通過粉塵光線偵測器用以量測該預定光線之散射、折射或反射,以獲得一光線量測值;利用數個環境監測資料尋找一基準點、一現場總最高值及一均值係數,且於數個環境監測點以實測方式獲得該數個環境監測資料;利用該數個環境監測資料進行統計演算,以獲得至少一迴歸參考係數;及利用該系統參數、偵測光波受干擾參數、基準點、現場總最高值、均值係數及迴歸參考係數共同結合校正一細懸浮微粒量測值,以獲得一已校正細懸浮微粒值。 A fine aerosol detector calibration method includes: selecting an optical detector, wherein the optical detector can obtain the same gas, and the optical detector is adapted to a system parameter and a detection light wave The interference parameter, and the system parameter and the detected light wave interference parameter are a basic correction parameter; a detection light emitter is used to optically emit a predetermined light to the sample gas, and the sample gas comprises several fine aerosols So that when the predetermined light passes through the fine aerosol of the sample gas, the predetermined light is caused to generate a scattering, a refractive angle or a reflection angle; and at least one is disposed opposite to the detection light emitter by the dust light detector. One of the predetermined light receiving angles, and the dust light detector is used to measure the scattering, refraction or reflection of the predetermined light to obtain a light measurement value; using a plurality of environmental monitoring data to find a reference point, a total site The highest value and a mean value coefficient, and the several environmental monitoring data are obtained by actual measurement at several environmental monitoring points; using the several environmental monitoring Performing statistical calculations to obtain at least one regression reference coefficient; and using the system parameters, detecting light wave interference parameters, reference points, total field maximum values, mean coefficients, and regression reference coefficients to jointly correct a fine aerosol measurement value To obtain a corrected fine aerosol value. 依申請專利範圍第6項所述之細懸浮微粒偵測器校正方法,其中該偵測光線發射器選擇為一紅外線模組、一雷射光模組或一發光二極體模組。 The method for correcting a fine aerosol detector according to the sixth aspect of the patent application, wherein the detecting light emitter is selected as an infrared module, a laser light module or a light emitting diode module. 依申請專利範圍第6項所述之細懸浮微粒偵測器校正方法,其中該至少一通過粉塵光線偵測器選擇為一光電二極體或一光電晶體。 The fine aerosol detector calibration method according to claim 6, wherein the at least one selected by the dust detector is a photodiode or a photoelectric crystal. 依申請專利範圍第6項所述之細懸浮微粒偵測器校正方法,其中該迴歸參考係數選擇為線性回歸係數、多項式回歸係數或其它迴歸參考係數。 The fine aerosol detector calibration method according to claim 6, wherein the regression reference coefficient is selected as a linear regression coefficient, a polynomial regression coefficient or other regression reference coefficients. 依申請專利範圍第6項所述之細懸浮微粒偵測器校正方法,其中該細懸浮微粒量測值為一細懸浮微粒濃度或一細懸浮微粒數量。 The fine aerosol detector calibration method according to claim 6, wherein the fine aerosol measurement is a fine aerosol concentration or a fine aerosol amount.
TW106111591A 2017-04-06 2017-04-06 Calibration method and system thereof for particulate matter sensors TWI633301B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW106111591A TWI633301B (en) 2017-04-06 2017-04-06 Calibration method and system thereof for particulate matter sensors

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW106111591A TWI633301B (en) 2017-04-06 2017-04-06 Calibration method and system thereof for particulate matter sensors

Publications (2)

Publication Number Publication Date
TWI633301B true TWI633301B (en) 2018-08-21
TW201837457A TW201837457A (en) 2018-10-16

Family

ID=63960046

Family Applications (1)

Application Number Title Priority Date Filing Date
TW106111591A TWI633301B (en) 2017-04-06 2017-04-06 Calibration method and system thereof for particulate matter sensors

Country Status (1)

Country Link
TW (1) TWI633301B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI787946B (en) * 2021-08-10 2022-12-21 傑明科技有限公司 Aerosol chilling sampling system

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120324982A1 (en) * 2011-06-27 2012-12-27 Delphi Technologies, Inc. Particulate matter detection method for a particulate matter sensor
CN203798703U (en) * 2014-04-25 2014-08-27 周志斌 Sensor for detecting mass concentration of suspended particles in air
TW201522936A (en) * 2009-05-01 2015-06-16 Xtralis Technologies Ltd Particle detection

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201522936A (en) * 2009-05-01 2015-06-16 Xtralis Technologies Ltd Particle detection
US20120324982A1 (en) * 2011-06-27 2012-12-27 Delphi Technologies, Inc. Particulate matter detection method for a particulate matter sensor
CN203798703U (en) * 2014-04-25 2014-08-27 周志斌 Sensor for detecting mass concentration of suspended particles in air

Also Published As

Publication number Publication date
TW201837457A (en) 2018-10-16

Similar Documents

Publication Publication Date Title
US10001438B2 (en) Method of sensing aerosol characteristic parameter using dual-wavelength scattered signal and application thereof
CN102428377B (en) The calibration of particle detection and sensor
CN205506621U (en) Sensor unit
US10928292B2 (en) Dust sensor
CN102636459B (en) Forward scattering and transmission combined visibility measuring instrument and measuring method thereof
CN103439232A (en) Obscuration type soot particle concentration measuring method and device thereof
KR102017633B1 (en) Zero calibration method of optical fine particle measuring sensor
CN103852110A (en) Environmental sensor capable of detecting fouling layer
CN108593587A (en) A kind of non-dispersion infrared gas sensor
KR20140094727A (en) Instrument for measuring the smoke density in use of the infrared sensor
JP7261748B2 (en) Chamberless smoke detector with indoor air quality detection and monitoring
CN102608010B (en) Particulate matter (PM) detecting method and equipment
TWI633301B (en) Calibration method and system thereof for particulate matter sensors
CN211263105U (en) Particle counter based on camera imaging method
US10012628B2 (en) Multifunctional particle analysis device and method of calibrating the same
CN201488935U (en) Air dust particle detector
CN102721667B (en) Optical interference type intelligent gas sensor
CN106442240A (en) Method and device for detecting concentration of peripheral particulate matters of air processing device
CN108449967A (en) Device and system for optical measurement of surface reflectance
CN104089930B (en) Formula Smoke Monitoring System is scattered after a kind of laser
CN107024419A (en) A kind of PM2.5 sensors
CN108549068B (en) Three-dimensional scanning data processing method and data processing system
CN210166520U (en) High-precision infrared optical rainfall sensor
JP2002221577A (en) Radiation measuring device
CN105203439A (en) Air purification control method and device