TWI629928B - Heat dissipating system and operating method thereof - Google Patents

Heat dissipating system and operating method thereof Download PDF

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TWI629928B
TWI629928B TW106127308A TW106127308A TWI629928B TW I629928 B TWI629928 B TW I629928B TW 106127308 A TW106127308 A TW 106127308A TW 106127308 A TW106127308 A TW 106127308A TW I629928 B TWI629928 B TW I629928B
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driving
current value
piezoelectric sheet
heat dissipation
piezoelectric
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TW106127308A
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TW201912002A (en
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蘇献欽
王岩
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蘇献欽
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Abstract

一種散熱系統,包括驅動晶片及電性連接於驅動晶片的散熱裝置。散熱裝置包含承載件及擺動結構。擺動結構包含壓電片及安裝於壓電片一端的葉片,壓電片的另一端固定於承載件。驅動晶片能執行測試功能,以依序傳輸不同頻率的多次測試信號至壓電片、並測得每次測試信號所對應的壓電片內的電流值。多個電流值中的最高電流值定義為運轉電流值,運轉電流值所對應的測試信號定義為驅動信號。驅動晶片能執行驅動功能,以持續地傳輸驅動信號至壓電片,使壓電片產生擺動且同步帶動葉片產生擺動。此外,本發明另公開一種散熱系統的運作方法。 A heat dissipation system includes a driving chip and a heat sink electrically connected to the driving wafer. The heat sink includes a carrier and a swinging structure. The oscillating structure includes a piezoelectric piece and a blade attached to one end of the piezoelectric piece, and the other end of the piezoelectric piece is fixed to the carrier. The driving chip can perform a test function to sequentially transmit a plurality of test signals of different frequencies to the piezoelectric piece, and measure the current value in the piezoelectric piece corresponding to each test signal. The highest current value among the plurality of current values is defined as the operating current value, and the test signal corresponding to the operating current value is defined as the driving signal. The driving wafer can perform a driving function to continuously transmit a driving signal to the piezoelectric piece, causing the piezoelectric piece to oscillate and synchronously driving the blade to oscillate. In addition, the present invention further discloses a method of operating a heat dissipation system.

Description

散熱系統及其運作方法 Heat dissipation system and its operation method

本發明涉及一種散熱系統,尤其涉及一種通過葉片擺動來散熱的散熱系統及其運作方法。 The invention relates to a heat dissipation system, in particular to a heat dissipation system for dissipating heat by blade oscillation and a method for operating the same.

本發明人先前提出一種散熱裝置(台灣第M529149號新型專利),其能透過葉片之擺動來達到快速散熱的效果。但如何改良上述散熱裝置,藉以更有效地提升散熱裝置的散熱效果,則成為本發明人亟欲完善的目標之一。 The inventors previously proposed a heat sink (Taiwan No. M529149) which is capable of achieving rapid heat dissipation through the oscillation of the blade. However, how to improve the above-mentioned heat dissipating device, thereby more effectively improving the heat dissipating effect of the heat dissipating device, has become one of the objects that the inventors intend to perfect.

於是,本發明人認為上述缺陷可改善,乃特潛心研究並配合科學原理的運用,終於提出一種設計合理且有效改善上述缺陷的本發明。 Accordingly, the inventors believe that the above-mentioned defects can be improved, and that the invention has been studied with great interest and with the use of scientific principles, and finally proposes a present invention which is rational in design and effective in improving the above-mentioned defects.

本發明實施例在於提供一種散熱系統及其運作方法,能有效地改善現有散熱裝置所可能產生的缺失。 The embodiment of the invention provides a heat dissipation system and a method for operating the same, which can effectively improve the defects that may occur in the existing heat dissipation device.

本發明實施例公開一種散熱系統,包括:一驅動晶片,能選擇性地執行一測試功能與一驅動功能;以及一散熱裝置,包含:一承載件;及至少一擺動結構,包含有一壓電片及安裝於所述壓電片上的一葉片,所述壓電片具有一固定端與一擺動端,所述壓電片的所述固定端固定於所述承載件,所述葉片連接於所述壓電片的所述擺動端,並且所述葉片包含遠離所述擺動端的一自由端部;其中,所述驅動晶片能執行所述測試功能,以依序傳輸不同頻率的多次測試信號至所述壓電片、並測得每次所述測試信號所 對應的所述壓電片內的一電流值;其中,多個所述電流值中的最高所述電流值定義為一運轉電流值,所述運轉電流值所對應的測試信號定義為一驅動信號;其中,所述驅動晶片能執行所述驅動功能,以持續地傳輸所述驅動信號至所述壓電片,使所述壓電片通過所述驅動信號的驅動而令所述擺動端產生週期性的往復擺動,以同步帶動所述葉片的所述自由端部產生擺動。 The embodiment of the invention discloses a heat dissipation system comprising: a driving chip capable of selectively performing a testing function and a driving function; and a heat dissipating device comprising: a carrier; and at least one swinging structure comprising a piezoelectric piece And a blade mounted on the piezoelectric sheet, the piezoelectric sheet has a fixed end and a swing end, the fixed end of the piezoelectric piece is fixed to the carrier, and the blade is connected to the The oscillating end of the piezoelectric sheet, and the blade includes a free end remote from the oscillating end; wherein the driving wafer is capable of performing the test function to sequentially transmit a plurality of test signals of different frequencies to the a piezoelectric piece, and measuring each test signal Corresponding a current value in the piezoelectric sheet; wherein a highest one of the plurality of current values is defined as an operating current value, and a test signal corresponding to the operating current value is defined as a driving signal Wherein the driving chip is capable of performing the driving function to continuously transmit the driving signal to the piezoelectric sheet, so that the piezoelectric sheet generates a period of the swing end by driving the driving signal The reciprocating swing of the nature causes the free end of the blade to simultaneously oscillate.

本發明實施例也公開一種散熱系統的運作方法,包括:提供一散熱裝置以及電性連接於所述散熱裝置的一驅動晶片;其中,所述散熱裝置包含有一承載件、安裝於所述承載件的一壓電片、及安裝於所述壓電片的一葉片;以所述驅動晶片執行一測試功能,以依序傳輸不同頻率的多次測試信號至所述壓電片、並測得每次所述測試信號所對應的所述壓電片內的一電流值;其中,多個所述電流值中的最高所述電流值所對應的測試信號定義為一驅動信號;以及以所述驅動晶片執行一驅動功能,以持續地傳輸所述驅動信號至所述壓電片,使所述壓電片通過所述驅動信號的驅動而產生週期性往復擺動,以同步驅使所述葉片產生擺動。 The embodiment of the invention also discloses a method for operating a heat dissipation system, comprising: providing a heat dissipation device and a driving chip electrically connected to the heat dissipation device; wherein the heat dissipation device comprises a carrier and is mounted on the carrier a piezoelectric sheet, and a blade mounted on the piezoelectric sheet; performing a test function on the driving wafer to sequentially transmit a plurality of test signals of different frequencies to the piezoelectric sheet, and measuring each a current value in the piezoelectric sheet corresponding to the test signal; wherein, a test signal corresponding to a highest one of the plurality of current values is defined as a driving signal; and The wafer performs a driving function to continuously transmit the driving signal to the piezoelectric sheet, causing the piezoelectric sheet to generate a periodic reciprocating oscillation by driving of the driving signal to synchronously drive the blade to swing.

綜上所述,本發明實施例所公開的散熱系統及其運作方法,能通過執行測試功能,而得知能與散熱裝置的葉片產生共振的電流頻率,藉以使驅動晶片在執行驅動功能時,能夠輸入與葉片相互共振的電流(驅動信號),從而有效地提升散熱裝置的散熱效果。 In summary, the heat dissipation system and the operation method thereof disclosed in the embodiments of the present invention can learn the current frequency that can resonate with the blades of the heat dissipation device by performing the test function, thereby enabling the drive wafer to perform the driving function. The current (drive signal) that resonates with the blades is input, thereby effectively improving the heat dissipation effect of the heat sink.

為能更進一步瞭解本發明的特徵及技術內容,請參閱以下有關本發明的詳細說明與附圖,但是此等說明與附圖僅用來說明本發明,而非對本發明的保護範圍作任何的限制。 For a better understanding of the features and technical aspects of the present invention, reference should be made to the accompanying claims limit.

1000‧‧‧散熱系統 1000‧‧‧heating system

100‧‧‧散熱裝置 100‧‧‧heating device

1‧‧‧承載件 1‧‧‧ Carrier

11‧‧‧上端部 11‧‧‧Upper end

12‧‧‧下端部 12‧‧‧ lower end

13‧‧‧固定槽 13‧‧‧fixed slot

14‧‧‧鎖固孔 14‧‧‧Lock hole

2‧‧‧擺動結構 2‧‧‧ swing structure

21‧‧‧壓電片 21‧‧‧ Piezo Pieces

211‧‧‧固定端 211‧‧‧ fixed end

212‧‧‧擺動端 212‧‧‧Swing end

22‧‧‧葉片 22‧‧‧ blades

221‧‧‧自由端部 221‧‧‧Free end

222‧‧‧安裝端部 222‧‧‧Installation end

200‧‧‧驅動晶片 200‧‧‧ drive chip

201‧‧‧控制模塊 201‧‧‧Control Module

2011‧‧‧儲存單元 2011‧‧‧ storage unit

202‧‧‧供電模塊 202‧‧‧Power supply module

203‧‧‧反饋模塊 203‧‧‧Feedback module

P‧‧‧電源 P‧‧‧Power supply

圖1為本發明散熱系統的功能方塊示意圖。 1 is a functional block diagram of a heat dissipation system of the present invention.

圖2為本發明散熱系統的散熱裝置立體示意圖。 2 is a perspective view of a heat dissipation device of a heat dissipation system of the present invention.

圖3為圖2的分解示意圖。 Figure 3 is an exploded perspective view of Figure 2.

圖4為圖2的運作示意圖。 Figure 4 is a schematic view of the operation of Figure 2.

圖5為圖2的另一運作示意圖。 FIG. 5 is another schematic diagram of the operation of FIG. 2.

圖6為本發明散熱裝置的壓電片擺動端部分地埋置於葉片安裝端部內的示意圖。 Fig. 6 is a schematic view showing the oscillating end of the piezoelectric piece of the heat dissipating device of the present invention partially embedded in the mounting end portion of the blade.

圖7為本發明散熱裝置的葉片貼附於壓電片擺動端一側的示意圖。 Fig. 7 is a schematic view showing the blade of the heat sink of the present invention attached to the side of the swing end of the piezoelectric sheet.

圖8為本發明散熱裝置的兩個擺動結構安裝於一個承載件的示意圖。 Figure 8 is a schematic view of the two swinging structures of the heat sink of the present invention mounted on a carrier.

圖9為本發明散熱裝置的兩個擺動結構各自安裝於相對應承載件的示意圖。 FIG. 9 is a schematic view showing the two swinging structures of the heat dissipating device of the present invention respectively mounted on corresponding bearing members.

請參閱圖1至圖9,為本發明的實施例,需先說明的是,本實施例對應附圖所提及的相關數量與外型,僅用來具體地說明本發明的實施方式,以便於了解本發明的內容,而非用來侷限本發明的保護範圍。 Please refer to FIG. 1 to FIG. 9 for an embodiment of the present invention. It should be noted that the related embodiments of the present invention are only used to specifically describe the embodiments of the present invention, so that It is to be understood that the scope of the invention is not intended to limit the scope of the invention.

請參閱圖1及圖2,本實施例公開一種散熱系統1000,包含有一散熱裝置100及電性連接於上述散熱裝置100的一驅動晶片200,並且上述驅動晶片200是用來接收一電源P並且能選擇性地執行一測試功能與一驅動功能,但本發明的驅動晶片200不受限於接收上述電源P。 Referring to FIG. 1 and FIG. 2 , the present embodiment discloses a heat dissipation system 1000 including a heat dissipation device 100 and a driving chip 200 electrically connected to the heat dissipation device 100 , and the driving chip 200 is configured to receive a power source P and A test function and a driving function can be selectively performed, but the driving chip 200 of the present invention is not limited to receiving the above-described power source P.

須說明的是,本實施例是以驅動晶片200電性連接於單個散熱裝置100,但本發明不受限於此,也就是說,上述驅動晶片200也可以是電性連接於多個散熱裝置100。以下將先就所述散熱裝置100的構造作一說明,而後再介紹驅動晶片200與散熱裝置100之間的連接關係。 It should be noted that, in this embodiment, the driving die 200 is electrically connected to the single heat sink 100, but the invention is not limited thereto, that is, the driving chip 200 may be electrically connected to the plurality of heat sinks. 100. Hereinafter, the configuration of the heat sink 100 will be described first, and then the connection relationship between the drive wafer 200 and the heat sink 100 will be described.

如圖2至圖3所示,所述散熱裝置100包含有一承載件1及一擺動結構2。其中,所述擺動結構2裝設於承載件1。 As shown in FIG. 2 to FIG. 3 , the heat dissipation device 100 includes a carrier 1 and a swing structure 2 . The swinging structure 2 is mounted on the carrier 1 .

所述承載件1為適用於通過射出成形製造的構造,並且所述承載件1具有一上端部11及一下端部12。其中,所述上端部11凹陷形成有一固定槽13,用以固定一片狀元件(如:壓電片21),而所述下端部12凹陷形成有一鎖固孔14,藉此使所述承載件1能夠經由螺絲(圖中未示出)穿過鎖固孔14而固定於一電子器件的任意位置(尤其是需要散熱的位置)上。再者,所述鎖固孔14可以是盲孔或貫穿孔。 The carrier 1 is of a configuration suitable for manufacturing by injection molding, and the carrier 1 has an upper end portion 11 and a lower end portion 12. The upper end portion 11 is recessed to form a fixing groove 13 for fixing a one-piece member (for example, the piezoelectric sheet 21), and the lower end portion 12 is recessed to form a locking hole 14, thereby the carrier member is 1 can be fixed to any position of an electronic device (especially a position requiring heat dissipation) through a locking hole 14 via a screw (not shown). Furthermore, the locking hole 14 can be a blind hole or a through hole.

所述擺動結構2包含有一壓電片21(piezoelectric sheet)及安裝於壓電片21上的一葉片22。 The oscillating structure 2 includes a piezoelectric sheet 21 and a blade 22 mounted on the piezoelectric sheet 21.

所述壓電片21是由壓電材質製成(如:壓電單晶體、壓電多晶體、壓電聚合物、及壓電複合材料的至少其中之一)。所述壓電片21具有一固定端211與一擺動端212,並且所述壓電片21的固定端211是藉由卡合的方式固定於承載件1的固定槽13內,但本發明不受限於此。進一步地說,所述壓電片21是電性連接於所述驅動晶片200(如:圖1),並且所述壓電片21可透過驅動晶片200所輸出的驅動信號,根據逆壓電效應,將該驅動信號轉換為一機械能,以產生機械擺動。而由於所述壓電片21的固定端211是固定於承載件1的固定槽13內,因此所述壓電片21主要是透過其擺動端212進行擺動。 The piezoelectric sheet 21 is made of a piezoelectric material (for example, at least one of a piezoelectric single crystal, a piezoelectric polycrystal, a piezoelectric polymer, and a piezoelectric composite). The piezoelectric piece 21 has a fixed end 211 and a swing end 212, and the fixed end 211 of the piezoelectric piece 21 is fixed in the fixing groove 13 of the carrier 1 by the snapping manner, but the present invention does not Limited by this. Further, the piezoelectric sheet 21 is electrically connected to the driving wafer 200 (eg, FIG. 1), and the piezoelectric sheet 21 can transmit a driving signal outputted by the driving wafer 200 according to an inverse piezoelectric effect. The drive signal is converted to a mechanical energy to produce a mechanical swing. Since the fixed end 211 of the piezoelectric piece 21 is fixed in the fixing groove 13 of the carrier 1, the piezoelectric piece 21 is mainly oscillated through the swing end 212 thereof.

所述葉片22為單個矩形片體並且較佳為玻璃纖維葉片或是聚酯薄膜葉片。所述葉片22連接於壓電片21的擺動端212,並且所述葉片22包含遠離擺動端212的一自由端部221。較佳地,所述葉片22進一步包含有固定於壓電片21的一安裝端部222,並且所述壓電片21的擺動端212是完全地埋置於葉片22的安裝端部222內,藉此,所述葉片22能穩固地安裝於壓電片21上,而所述葉片22的自由端部221能隨著所述壓電片21擺動端212的擺動而擺動(如:圖4及圖5)。值得一提的是,本實施例雖然是以壓電片21的擺動端212完全地埋置於葉片22的安裝端部222內作說 明,但本發明不受限於此。舉例來說,所述壓電片21的擺動端212也可以僅是部分地埋置於葉片22的安裝端部222內(如:圖6),或者所述葉片22也可以是藉由貼合的方式貼附於壓電片21擺動端212的一側(如:圖7),只要所述壓電片21與葉片22的連結關係,可以讓所述壓電片21同步帶動葉片22的自由端部221產生擺動即可。 The blade 22 is a single rectangular piece and is preferably a fiberglass blade or a polyester film blade. The blade 22 is coupled to the oscillating end 212 of the piezoelectric sheet 21 and the blade 22 includes a free end 221 remote from the oscillating end 212. Preferably, the blade 22 further includes a mounting end portion 222 fixed to the piezoelectric piece 21, and the swing end 212 of the piezoelectric piece 21 is completely embedded in the mounting end portion 222 of the blade 22. Thereby, the blade 22 can be stably mounted on the piezoelectric sheet 21, and the free end portion 221 of the blade 22 can swing with the swinging end of the piezoelectric piece 21 (see FIG. 4 and Figure 5). It is worth mentioning that, in this embodiment, the oscillating end 212 of the piezoelectric piece 21 is completely buried in the mounting end portion 222 of the blade 22. However, the invention is not limited thereto. For example, the oscillating end 212 of the piezoelectric sheet 21 may also be partially embedded in the mounting end portion 222 of the blade 22 (eg, FIG. 6), or the blade 22 may also be laminated. The manner of attaching to the side of the swing end 212 of the piezoelectric piece 21 (for example, FIG. 7) allows the piezoelectric piece 21 to simultaneously drive the blade 22 freely as long as the piezoelectric piece 21 is coupled to the blade 22. The end portion 221 can be swung.

須說明的是,本實施例中的擺動結構2數量是以一個為例,但本發明不受限於此。舉例來說,所述擺動結構2的數量也可以是兩個以上。而所述承載件1的數量,或者承載件1固定槽13的數量可以隨著擺動結構2的數量而進行相對應的調整。如圖8所示,所述擺動結構2的數量為兩個,而所述承載件1固定槽13的數量也是兩個(一個承載件1具有兩個固定槽13)。或者,如圖9所示,所述擺動結構2的數量為兩個,而所述承載件1的數量也是兩個(兩個承載件1各自具有一個固定槽13)。 It should be noted that the number of the swinging structures 2 in the present embodiment is exemplified, but the present invention is not limited thereto. For example, the number of the swinging structures 2 may be two or more. The number of the carriers 1 or the number of the fixing grooves 13 of the carrier 1 can be adjusted correspondingly with the number of the swinging structures 2. As shown in Fig. 8, the number of the swinging structures 2 is two, and the number of the fixing grooves 13 of the carrier 1 is also two (one carrier 1 has two fixing grooves 13). Alternatively, as shown in FIG. 9, the number of the swinging structures 2 is two, and the number of the carriers 1 is also two (two carriers 1 each have one fixing groove 13).

如圖1和圖2所示,所述驅動晶片200能通過執行測試功能,而得知能與散熱裝置100的葉片22產生共振的電流頻率,藉以使驅動晶片200在執行驅動功能時,能夠輸入與葉片22相互共振的電流,進而使得葉片22在與輸入的電流共振的情況下提升其擺動效果,從而提升散熱裝置100的散熱效果。 As shown in FIG. 1 and FIG. 2, the driving wafer 200 can know the current frequency that can resonate with the blades 22 of the heat sink 100 by performing a test function, thereby enabling the driving wafer 200 to input and perform a driving function. The currents that the blades 22 resonate with each other, thereby causing the blades 22 to enhance their swinging effect while resonating with the input current, thereby improving the heat dissipation effect of the heat sink 100.

更詳細地說,所述驅動晶片200能執行測試功能,以依序傳輸不同頻率的多次測試信號至所述壓電片21、並測得每次所述測試信號所對應的壓電片21內的一電流值(如下表)。其中,上述多個電流值中的最高電流值(如:Z10mA)定義為一運轉電流值,而上述運轉電流值所對應的測試信號定義為一驅動信號。也就是說,在上述驅動晶片200執行測試功能的過程中,所述散熱裝置100的葉片22是大致共振於上述運轉電流值(如:Z10mA)所對應的頻率(如:50Hz)。 In more detail, the driving wafer 200 can perform a test function to sequentially transmit a plurality of test signals of different frequencies to the piezoelectric sheet 21, and measure the piezoelectric sheet 21 corresponding to each of the test signals. A current value inside (as shown in the table below). The highest current value (eg, Z 10 mA) of the plurality of current values is defined as an operating current value, and the test signal corresponding to the operating current value is defined as a driving signal. That is, in the process in which the driving chip 200 performs the test function, the blade 22 of the heat sink 100 is substantially resonant with a frequency (eg, 50 Hz) corresponding to the above-described operating current value (eg, Z 10 mA).

據此,所述驅動晶片200能執行驅動功能,以持續地傳輸所述驅動信號至壓電片21,使所述壓電片21通過驅動信號的驅動而令所述壓電片21的擺動端212產生週期性的往復擺動,以同步帶動所述葉片22的自由端部221產生擺動。 According to this, the driving wafer 200 can perform a driving function to continuously transmit the driving signal to the piezoelectric sheet 21, so that the piezoelectric sheet 21 drives the swing end of the piezoelectric sheet 21 by driving of a driving signal. The 212 produces a periodic reciprocating swing to simultaneously drive the free end 221 of the blade 22 to oscillate.

以上所述的驅動晶片200的測試功能與驅動功能是能夠通過軟體或是硬體設計等各種方式實現,本實施例難以逐個介紹所有的可能態樣,所以下述僅以其中一個實施態樣來對驅動晶片200作一說明。 The test function and the driving function of the driving chip 200 described above can be realized by various methods such as software or hardware design. This embodiment is difficult to introduce all possible aspects one by one, so the following only one embodiment is adopted. A description will be given of the drive wafer 200.

所述驅動晶片200包含有一控制模塊201、電性連接於所述控制模塊201與壓電片21的一供電模塊202、及電性連接於所述控制模塊201與壓電片21的一反饋模塊203。其中,在驅動晶片200執行測試功能時,所述供電模塊202能通過控制模塊201的指示而依序輸出分別具備不同頻率的多次測試信號至所述壓電片21,以使所述壓電片21在不同的多個電流值下運作(如上表所載)。所述反饋模塊203能測得分別對應於上述多次測試信號的多個電流值、並且傳輸上述多個電流值至所述控制模塊201。 The driving chip 200 includes a control module 201, a power supply module 202 electrically connected to the control module 201 and the piezoelectric sheet 21, and a feedback module electrically connected to the control module 201 and the piezoelectric sheet 21. 203. The power supply module 202 can sequentially output a plurality of test signals respectively having different frequencies to the piezoelectric sheet 21 through the indication of the control module 201, so that the piezoelectric Sheet 21 operates at different current values (as listed above). The feedback module 203 can measure a plurality of current values respectively corresponding to the plurality of test signals, and transmit the plurality of current values to the control module 201.

其中,所述控制模塊201內能設有一儲存單元2011,用來儲存反饋模塊203所傳送的資料。所述控制模塊201能將上述多個 電流值中的最高電流值定義為運轉電流值、並且將上述運轉電流值所對應的測試信號定義為驅動信號。 The storage module 201 can be configured to store the data transmitted by the feedback module 203. The control module 201 can The highest current value among the current values is defined as the operating current value, and the test signal corresponding to the above-described operating current value is defined as a driving signal.

據此,在驅動晶片200執行驅動功能時,所述控制模塊201能使上述供電模塊202持續地傳輸所述驅動信號至散熱裝置100的壓電片21,藉以使所述散熱裝置100的葉片22能夠大致共振於上述驅動信號的頻率,進而令散熱裝置100提升其散熱效果。 Accordingly, when the driving chip 200 performs the driving function, the control module 201 enables the power supply module 202 to continuously transmit the driving signal to the piezoelectric sheet 21 of the heat sink 100, thereby causing the blade 22 of the heat sink 100 The frequency of the above-mentioned driving signal can be substantially resonated, thereby further improving the heat dissipation effect of the heat sink 100.

須說明的是,所述驅動晶片200能夠依序設計者的需求而在不同的時間點執行測試功能,例如:在所述散熱裝置100剛開始要運作時,上述驅動晶片200能夠先執行測試功能,以利於測得適合散熱裝置100的運轉電流值。 It should be noted that the driving chip 200 can perform the testing function at different time points according to the needs of the designer. For example, when the heat sink 100 is initially to be operated, the driving chip 200 can perform the testing function first. In order to facilitate measuring the operating current value of the heat sink 100.

此外,由於散熱裝置100在運作一段時間之後,所述葉片22可能因為老化、沾染灰塵、或其他因素,而導致葉片22所能共振的電流頻率產生改變。因此,所述驅動晶片200能夠週期性地執行所述測試功能,以重新定義上述運轉電流值及相對應的驅動信號,進而使散熱裝置100能夠持續提升其散熱效果。 Moreover, since the heat sink 100 is operating for a period of time, the blades 22 may cause a change in the frequency of the current that the blades 22 can resonate due to aging, contamination of dust, or other factors. Therefore, the driving chip 200 can periodically perform the testing function to redefine the operating current value and the corresponding driving signal, thereby enabling the heat sink 100 to continuously improve its heat dissipation effect.

或者,所述控制模塊201能在上述驅動晶片200執行驅動功能時,通過所述反饋模塊203來監控上述壓電片21內的一即時電流值,並且控制模塊201能在上述即時電流值與運轉電流值相差超過一特定差值時,啟動驅動晶片200去執行測試功能,以重新定義所述運轉電流值及相對應的所述驅動信號,進而使散熱裝置100能夠持續提升其散熱效果。 Alternatively, the control module 201 can monitor an instantaneous current value in the piezoelectric sheet 21 through the feedback module 203 when the driving chip 200 performs a driving function, and the control module 201 can operate at the instantaneous current value. When the current values differ by more than a certain difference, the driving chip 200 is activated to perform a test function to redefine the operating current value and the corresponding driving signal, thereby enabling the heat sink 100 to continuously improve its heat dissipation effect.

其中,所述特定差值能夠依序使用者的需求而加以調整變化,而本實施例中的特定差值為運轉電流值的0.01%~5%(較佳是3%~5%),藉以利於散熱裝置100持續提升其散熱效果,但本發明的特定差值不以此為限。 Wherein, the specific difference can be adjusted and changed according to the needs of the user, and the specific difference in the embodiment is 0.01% to 5% (preferably 3% to 5%) of the running current value, thereby Conducive to the heat sink 100 continues to enhance its heat dissipation effect, but the specific difference of the present invention is not limited thereto.

須說明的是,所述驅動晶片200可以是安裝於上述散熱裝置100的承載件1上,或者所述驅動晶片200與散熱裝置為分離設置,本發明在此不加以限制。 It should be noted that the driving chip 200 may be mounted on the carrier 1 of the heat dissipating device 100, or the driving chip 200 may be disposed separately from the heat dissipating device, and the invention is not limited thereto.

以上所述為本實施例散熱系統1000的說明,請接著參閱圖1所示,其大致說明上述散熱系統1000的運作方法,但本發明不受限於此。 The above description of the heat dissipation system 1000 of the present embodiment, please refer to FIG. 1 , which generally illustrates the operation method of the heat dissipation system 1000 described above, but the invention is not limited thereto.

步驟S110:提供上述散熱裝置100以及電性連接於散熱裝置100並接收電源P的所述驅動晶片200。其中,有關散熱裝置100的具體構造及驅動晶片200的可能實施態樣請參閱本實施例的上述所載,在此不加以贅述。 Step S110: providing the heat sink 100 and the driving chip 200 electrically connected to the heat sink 100 and receiving the power source P. For the specific configuration of the heat sink 100 and the possible implementation of the driving chip 200, please refer to the above description of the embodiment, and details are not described herein.

步驟S120:以所述驅動晶片200執行測試功能,以依序傳輸不同頻率的多次測試信號至所述壓電片21、並測得每次測試信號所對應的壓電片21內的一電流值(如上表);其中,所述驅動晶片200能將上述多個電流值中的最高電流值所對應的測試信號定義為一驅動信號。 Step S120: Perform a test function on the driving chip 200 to sequentially transmit a plurality of test signals of different frequencies to the piezoelectric sheet 21, and measure a current in the piezoelectric sheet 21 corresponding to each test signal. The value (as in the above table); wherein the driving chip 200 can define a test signal corresponding to the highest current value among the plurality of current values as a driving signal.

步驟S130:以所述驅動晶片200執行驅動功能,以持續地傳輸所述驅動信號至上述散熱裝置100的壓電片21,使所述壓電片21通過所述驅動信號的驅動而產生週期性往復擺動,以同步驅使所述葉片22產生擺動。 Step S130: performing a driving function on the driving wafer 200 to continuously transmit the driving signal to the piezoelectric sheet 21 of the heat dissipating device 100, so that the piezoelectric sheet 21 generates periodicity by driving the driving signal. The reciprocating oscillations drive the blades 22 to oscillate in synchronization.

須說明的是,所述驅動晶片200能夠依序設計者的需求而在不同的時間點執行步驟S120,例如:在所述散熱裝置100剛開始要運作時,上述驅動晶片200能夠先執行步驟S120,以利於測得適合散熱裝置100的運轉電流值;或者,所述驅動晶片200週期性地執行(如:每5天執行一次)步驟S120(測試功能),以重新定義上述運轉電流值及相對應的驅動信號;又或者,在所述驅動晶片200執行步驟S130(驅動功能)的過程中,所述驅動晶片200監控所述壓電片21內的一即時電流值,並且當所述即時電流值與運轉電流值相差超過一特定差值(如:運轉電流值的0.01%~5%)時,所述驅動晶片200執行步驟S120(測試功能),以重新定義運轉電流值及相對應的驅動信號。 It should be noted that the driving chip 200 can perform step S120 at different time points according to the needs of the designer. For example, when the heat sink 100 is initially to be operated, the driving chip 200 can first perform step S120. In order to facilitate measuring the operating current value suitable for the heat sink 100; or, the driving wafer 200 is periodically executed (eg, every 5 days) in step S120 (test function) to redefine the operating current value and phase Corresponding driving signal; or alternatively, in the process of the driving wafer 200 performing step S130 (driving function), the driving wafer 200 monitors an instantaneous current value in the piezoelectric sheet 21, and when the current is current When the value differs from the operating current value by more than a specific difference (eg, 0.01% to 5% of the operating current value), the driving wafer 200 performs step S120 (test function) to redefine the operating current value and the corresponding driving. signal.

[本發明實施例的技術功效] [Technical effect of the embodiment of the present invention]

綜上所述,本發明實施例所公開的散熱系統及其運作方法,能通過執行測試功能,而得知能與散熱裝置的葉片產生共振的電流頻率,藉以使驅動晶片在執行驅動功能時,能夠輸入與葉片相互共振的電流(驅動信號),從而有效地提升散熱裝置的散熱效果。 In summary, the heat dissipation system and the operation method thereof disclosed in the embodiments of the present invention can learn the current frequency that can resonate with the blades of the heat dissipation device by performing the test function, thereby enabling the drive wafer to perform the driving function. The current (drive signal) that resonates with the blades is input, thereby effectively improving the heat dissipation effect of the heat sink.

再者,本發明實施例所公開的散熱裝置及其擺動結構,能通過在所述擺動結構中設有壓電片,以有效減少散熱裝置所需的零件種類,從而有效地減少散熱裝置(或擺動結構)的體積、重量及生產成本。 Furthermore, the heat dissipating device and the swinging structure thereof disclosed in the embodiments of the present invention can effectively reduce the number of parts required for the heat dissipating device by providing a piezoelectric piece in the swinging structure, thereby effectively reducing the heat dissipating device (or The volume, weight and production cost of the oscillating structure).

另,本發明實施例所公開的散熱裝置及其擺動結構,能通過在所述壓電片的擺動端連結所述葉片,以增加所述擺動結構整體的擺動幅度,從而更有效地提升散熱裝置(或擺動結構)的散熱效果。 In addition, the heat dissipating device and the swinging structure thereof disclosed in the embodiments of the present invention can increase the swing amplitude of the whole swinging structure by connecting the vanes at the swing end of the piezoelectric sheet, thereby more effectively lifting the heat dissipating device. (or swing structure) heat dissipation effect.

以上所述僅為本發明的優選可行實施例,並非用來侷限本發明的保護範圍,凡依本發明申請專利範圍所做的均等變化與修飾,皆應屬本發明的權利要求書的保護範圍。 The above are only the preferred embodiments of the present invention, and are not intended to limit the scope of the present invention. The equivalents and modifications made by the scope of the present invention should fall within the scope of the claims of the present invention. .

Claims (10)

一種散熱系統,包括:一驅動晶片,能選擇性地執行一測試功能與一驅動功能;以及一散熱裝置,包含:一承載件;及至少一擺動結構,包含有一壓電片及安裝於所述壓電片上的一葉片,所述壓電片具有一固定端與一擺動端,所述壓電片的所述固定端固定於所述承載件,所述葉片連接於所述壓電片的所述擺動端,並且所述葉片包含遠離所述擺動端的一自由端部;其中,所述驅動晶片能執行所述測試功能,以依序傳輸不同頻率的多次測試信號至所述壓電片、並測得每次所述測試信號所對應的所述壓電片內的一電流值;其中,多個所述電流值中的最高所述電流值定義為一運轉電流值,所述運轉電流值所對應的測試信號定義為一驅動信號;其中,所述驅動晶片能執行所述驅動功能,以持續地傳輸所述驅動信號至所述壓電片,使所述壓電片通過所述驅動信號的驅動而令所述擺動端產生週期性的往復擺動,以同步帶動所述葉片的所述自由端部產生擺動。 A heat dissipation system comprising: a driving chip capable of selectively performing a test function and a driving function; and a heat sink comprising: a carrier; and at least one swing structure including a piezoelectric piece and mounted on the a blade on the piezoelectric sheet, the piezoelectric sheet having a fixed end and a swing end, the fixed end of the piezoelectric piece being fixed to the carrier, the blade being connected to the piezoelectric piece a swing end, and the blade includes a free end remote from the swing end; wherein the drive wafer is capable of performing the test function to sequentially transmit a plurality of test signals of different frequencies to the piezoelectric sheet, And measuring a current value in the piezoelectric sheet corresponding to each of the test signals; wherein a highest one of the plurality of current values is defined as an operating current value, the operating current value The corresponding test signal is defined as a driving signal; wherein the driving chip can perform the driving function to continuously transmit the driving signal to the piezoelectric sheet, and pass the piezoelectric sheet through the driving signal The order of the oscillating end drive and generate a periodic swing back and forth in a synchronous drive the free end of the blade pivot generated. 如請求項1所述的散熱系統,其中,所述驅動晶片包含有:一控制模塊;一供電模塊,電性連接於所述壓電片並且能通過所述控制模塊的指示而依序輸出分別具備不同頻率的多次所述測試信號至所述壓電片,以使所述壓電片在不同的多個所述電流值下運作;及一反饋模塊,電性連接於所述控制模塊,所述反饋模塊能測得分別對應於多次所述測試信號的多個所述電流值、並且傳輸 多個所述電流值至所述控制模塊;其中,所述控制模塊能使所述供電模塊持續地傳輸所述驅動信號至所述壓電片。 The heat dissipation system of claim 1, wherein the driving chip comprises: a control module; a power supply module electrically connected to the piezoelectric piece and capable of sequentially outputting respectively through the indication of the control module And having a plurality of the test signals of the different frequencies to the piezoelectric sheet, so that the piezoelectric sheet operates under different current values; and a feedback module electrically connected to the control module, The feedback module can measure a plurality of the current values respectively corresponding to the test signal multiple times, and transmit a plurality of the current values to the control module; wherein the control module enables the power supply module to continuously transmit the drive signal to the piezoelectric sheet. 如請求項2所述的散熱系統,其中,所述控制模塊能在所述驅動晶片執行所述驅動功能時,通過所述反饋模塊來監控所述壓電片內的一即時電流值;並且所述控制模塊能在所述即時電流值與所述運轉電流值相差超過一特定差值時,啟動所述驅動晶片去執行所述測試功能,以重新定義所述運轉電流值及相對應的所述驅動信號。 The heat dissipation system of claim 2, wherein the control module is capable of monitoring an instantaneous current value in the piezoelectric sheet by the feedback module when the driving function is performed by the driving chip; The control module can activate the driving chip to perform the testing function to redefine the operating current value and the corresponding one when the instantaneous current value and the operating current value differ by more than a specific difference Drive signal. 如請求項3所述的散熱系統,其中,所述特定差值為所述運轉電流值的0.01%~5%。 The heat dissipation system of claim 3, wherein the specific difference is 0.01% to 5% of the operating current value. 如請求項1所述的散熱系統,其中,所述驅動晶片能夠週期性地執行所述測試功能,以重新定義所述運轉電流值及相對應的所述驅動信號。 The heat dissipation system of claim 1, wherein the drive wafer is capable of periodically performing the test function to redefine the operating current value and the corresponding drive signal. 如請求項1至5中任一項所述的散熱系統,其中,所述葉片包含有固定於所述壓電片的一安裝端部,並且所述壓電片的所述擺動端埋置於所述安裝端部內。 The heat dissipation system according to any one of claims 1 to 5, wherein the blade includes a mounting end fixed to the piezoelectric piece, and the oscillating end of the piezoelectric piece is embedded Inside the mounting end. 一種散熱系統的運作方法,包括:提供一散熱裝置以及電性連接於所述散熱裝置的一驅動晶片;其中,所述散熱裝置包含有一承載件、安裝於所述承載件的一壓電片、及安裝於所述壓電片的一葉片;以所述驅動晶片執行一測試功能,以依序傳輸不同頻率的多次測試信號至所述壓電片、並測得每次所述測試信號所對應的所述壓電片內的一電流值;其中,多個所述電流值中的最高所述電流值定義為一運轉電流值且其所對應的測試信號定義為一驅動信號;以及以所述驅動晶片執行一驅動功能,以持續地傳輸所述驅動信號至所述壓電片,使所述壓電片通過所述驅動信號的驅動而產生週期性往復擺動,以同步驅使所述葉片產生擺動。 A method for operating a heat dissipation system includes: providing a heat sink and a driving chip electrically connected to the heat sink; wherein the heat sink comprises a carrier, a piezoelectric piece mounted on the carrier, And a blade mounted on the piezoelectric sheet; performing a test function on the driving wafer to sequentially transmit a plurality of test signals of different frequencies to the piezoelectric sheet, and measuring each of the test signals Corresponding a current value in the piezoelectric sheet; wherein a highest one of the plurality of current values is defined as an operating current value and a corresponding test signal is defined as a driving signal; The driving wafer performs a driving function to continuously transmit the driving signal to the piezoelectric sheet, so that the piezoelectric sheet generates periodic reciprocating oscillation by driving of the driving signal to synchronously drive the blade to generate swing. 如請求項7所述的散熱系統的運作方法,其中,在所述驅動晶片執行所述驅動功能的過程中,所述驅動晶片監控所述壓電片內的一即時電流值,並且當所述即時電流值與所述運轉電流值相差超過一特定差值時,所述驅動晶片執行所述測試功能,以重新定義所述運轉電流值及相對應的所述驅動信號。 The method of operating a heat dissipation system according to claim 7, wherein the driving wafer monitors an instantaneous current value in the piezoelectric sheet during the driving of the driving function, and when The drive die performs the test function to redefine the operating current value and the corresponding drive signal when the instantaneous current value differs from the operating current value by more than a certain difference. 如請求項8所述的散熱系統的運作方法,其中,所述特定差值為所述運轉電流值的0.01%~5%。 The method for operating a heat dissipation system according to claim 8, wherein the specific difference is 0.01% to 5% of the operating current value. 如請求項7所述的散熱系統的運作方法,其中,所述驅動晶片週期性地執行所述測試功能,以重新定義所述運轉電流值及相對應的所述驅動信號。 The method of operating a heat dissipation system of claim 7, wherein the drive wafer periodically performs the test function to redefine the operating current value and the corresponding drive signal.
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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101978172A (en) * 2008-03-25 2011-02-16 株式会社村田制作所 Piezoelectric fan device and air-cooling apparatus using the piezoelectric fan device
TWI454620B (en) * 2012-07-10 2014-10-01 Hsiao Kang Ma Magnetic-force interactive fan
TWM521322U (en) * 2015-12-18 2016-05-01 Xian-Qin Su Heat dissipation device and swing structure thereof

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101978172A (en) * 2008-03-25 2011-02-16 株式会社村田制作所 Piezoelectric fan device and air-cooling apparatus using the piezoelectric fan device
TWI454620B (en) * 2012-07-10 2014-10-01 Hsiao Kang Ma Magnetic-force interactive fan
TWM521322U (en) * 2015-12-18 2016-05-01 Xian-Qin Su Heat dissipation device and swing structure thereof

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