TWI629559B - Positive-type photosensitive resin composition and cured film prepared therefrom - Google Patents

Positive-type photosensitive resin composition and cured film prepared therefrom Download PDF

Info

Publication number
TWI629559B
TWI629559B TW103112975A TW103112975A TWI629559B TW I629559 B TWI629559 B TW I629559B TW 103112975 A TW103112975 A TW 103112975A TW 103112975 A TW103112975 A TW 103112975A TW I629559 B TWI629559 B TW I629559B
Authority
TW
Taiwan
Prior art keywords
copolymer
structural units
meth
acrylate
photosensitive resin
Prior art date
Application number
TW103112975A
Other languages
Chinese (zh)
Other versions
TW201504752A (en
Inventor
權五榮
崔慶植
朴錫鳳
金蓮玉
趙午炯
Original Assignee
羅門哈斯電子材料韓國公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 羅門哈斯電子材料韓國公司 filed Critical 羅門哈斯電子材料韓國公司
Publication of TW201504752A publication Critical patent/TW201504752A/en
Application granted granted Critical
Publication of TWI629559B publication Critical patent/TWI629559B/en

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/039Macromolecular compounds which are photodegradable, e.g. positive electron resists
    • G03F7/0392Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07DHETEROCYCLIC COMPOUNDS
    • C07D277/00Heterocyclic compounds containing 1,3-thiazole or hydrogenated 1,3-thiazole rings
    • C07D277/60Heterocyclic compounds containing 1,3-thiazole or hydrogenated 1,3-thiazole rings condensed with carbocyclic rings or ring systems
    • C07D277/62Benzothiazoles
    • C07D277/64Benzothiazoles with only hydrocarbon or substituted hydrocarbon radicals attached in position 2
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/022Quinonediazides
    • G03F7/0226Quinonediazides characterised by the non-macromolecular additives
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/022Quinonediazides
    • G03F7/023Macromolecular quinonediazides; Macromolecular additives, e.g. binders
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/022Quinonediazides
    • G03F7/023Macromolecular quinonediazides; Macromolecular additives, e.g. binders
    • G03F7/0233Macromolecular quinonediazides; Macromolecular additives, e.g. binders characterised by the polymeric binders or the macromolecular additives other than the macromolecular quinonediazides
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/039Macromolecular compounds which are photodegradable, e.g. positive electron resists
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/075Silicon-containing compounds
    • G03F7/0757Macromolecular compounds containing Si-O, Si-C or Si-N bonds
    • G03F7/0758Macromolecular compounds containing Si-O, Si-C or Si-N bonds with silicon- containing groups in the side chains

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Materials For Photolithography (AREA)
  • Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)

Abstract

本文所揭露者係光敏樹脂組成物,其係包含:(1)共聚物A-1與共聚物A-2之混合物,其中,共聚物A-1係包含(1-1)衍生自含羧基之不飽和單體的結構單元、(1-2)衍生自含至少一個環氧基之不飽和單體的結構單元、(1-3)衍生自含苯基之不飽和單體的結構單元、以及(1-4)衍生自不飽和單體且不同於結構單元(1-1)至(1-3)的結構單元,且共聚物A-2係包含(1-5)衍生自含羧基之不飽和單體的結構單元、(1-6)衍生自含酚羥基之不飽和單體的結構單元、以及(1-7)衍生自不飽和單體且不同於結構單元(1-5)及(1-6)的結構單元;以及(2)光活性化合物。自該光敏樹脂組成物製備之經硬化膜係具有高敏感性,以及優異之圖案顯影能力及防拖尾(anti-smearing)特性,且其可作為介電層有效地用於液晶顯示器(LCD)裝置中。 Disclosed herein is a photosensitive resin composition comprising: (1) a mixture of copolymer A-1 and copolymer A-2, wherein copolymer A-1 comprises (1-1) a carboxyl group-derived Structural units of unsaturated monomers, (1-2) structural units derived from unsaturated monomers containing at least one epoxy group, (1-3) structural units derived from unsaturated monomers containing phenyl groups, and (1-4) Structural units derived from unsaturated monomers and different from structural units (1-1) to (1-3), and copolymer A-2 contains (1-5) Structural units of saturated monomers, (1-6) structural units derived from phenolic hydroxyl-containing unsaturated monomers, and (1-7) derived from unsaturated monomers and different from structural units (1-5) and ( 1-6) a structural unit; and (2) a photoactive compound. The cured film prepared from the photosensitive resin composition has high sensitivity, excellent pattern developing ability and anti-smearing characteristics, and it can be effectively used as a dielectric layer in a liquid crystal display (LCD). Device.

Description

正型光敏樹脂組成物及自其製備之經硬化膜 Positive type photosensitive resin composition and hardened film prepared therefrom

本發明係關於正型光敏樹脂組成物及自其製備之經硬化膜,尤係關於可作為液晶顯示器(LCD)之薄膜電晶體(TFT)陣列之層間介電層材料用的正型光敏樹脂組成物,及自其製備之經硬化膜。 The present invention relates to a positive photosensitive resin composition and a cured film prepared therefrom, and more particularly to a positive photosensitive resin composition which can be used as an interlayer dielectric layer material of a thin film transistor (TFT) array of a liquid crystal display (LCD) Materials, and hardened films made therefrom.

於液晶顯示器(LCD)中使用之薄膜電晶體(TFT)基板係具有置於TFT裝置與形成像素電極之透明導電層之間的層間介電層,以保護TFT陣列。接觸孔係形成於層間介電層內部,從而將形成自TFT陣列之汲電極的電氣線連結至透明導電層。故,介電層係需要具有良好透光性、化學安定性、及優異的層間黏著性。 A thin film transistor (TFT) substrate used in a liquid crystal display (LCD) has an interlayer dielectric layer disposed between a TFT device and a transparent conductive layer forming a pixel electrode to protect the TFT array. The contact holes are formed inside the interlayer dielectric layer, thereby connecting the electrical lines formed from the drain electrodes of the TFT array to the transparent conductive layer. Therefore, the dielectric layer system needs to have good light transmittance, chemical stability, and excellent interlayer adhesion.

正型或負型光敏樹脂組成物係作為用於此層間介電層之材料而使用。 A positive or negative photosensitive resin composition is used as a material for this interlayer dielectric layer.

於曝光、顯影後硬烘烤、及短波長光如UV射線之吸收的製程中,含有鹼溶性樹脂及重氮1,2-醌(1,2-quinonediazide)化合物之習知正型光敏組成物往往伴 隨多種問題,如由於熱解造成的上色或由於產生雜質造成LCD中的非所欲之後像。 In the processes of exposure, hard baking after development, and absorption of short-wavelength light such as UV rays, conventional positive-type photosensitive compositions containing alkali-soluble resins and diazo 1,2-quinonediazide compounds are often used. Companion With various problems, such as coloring due to pyrolysis or undesired afterimages in the LCD due to generation of impurities.

就此而言,業經作出嘗試以改良正型光敏樹脂組成物之特性(參見韓國專利案早期公開第10-2004-0078554號,韓國專利案第10-0758867號,以及日本專利案早期公開第2004-286968號)。儘管此等習知光敏樹脂組成物達成了相當高透光性,其敏感性水準仍未令人滿意。 In this regard, attempts have been made to improve the characteristics of the positive photosensitive resin composition (see Korean Patent Case Early Publication No. 10-2004-0078554, Korean Patent Case No. 10-0758867, and Japanese Patent Case Early Publication No. 2004- No. 286968). Although these conventional photosensitive resin compositions have achieved quite high light transmittance, their level of sensitivity has not been satisfactory.

據此,本發明之目標係提供具有高敏感性、以及優異之圖案顯影能力及防拖尾特性的正型光敏樹脂組成物,以及自該光敏樹脂組成物製備之經硬化膜。 Accordingly, an object of the present invention is to provide a positive-type photosensitive resin composition having high sensitivity, excellent pattern developing ability, and anti-smearing characteristics, and a cured film prepared from the photosensitive resin composition.

根據本發明之一態樣,係提供光敏樹脂組成物,其係包含:(1)共聚物A-1與共聚物A-2之混合物,其中,共聚物A-1係包含(1-1)衍生自含羧基之不飽和單體的結構單元、(1-2)衍生自含至少一個環氧基之不飽和單體的結構單元、(1-3)衍生自含苯基之不飽和單體的結構單元、以及(1-4)衍生自不飽和單體且不同於結構單元(1-1)至(1-3)的結構單元,且共聚物A-2係包含(1-5)衍生自含羧基之不飽和單體的結構單元、(1-6)衍生自含酚羥基之不飽和單體的結構單元、以及(1-7)衍生自不飽和單體且不同於結構單元(1-5)及(1-6)的結構單元;以及(2)光活性化合物。 According to one aspect of the present invention, a photosensitive resin composition is provided, which comprises: (1) a mixture of copolymer A-1 and copolymer A-2, wherein copolymer A-1 comprises (1-1) Structural units derived from carboxyl-containing unsaturated monomers, (1-2) structural units derived from unsaturated monomers containing at least one epoxy group, (1-3) derived from phenyl-containing unsaturated monomers And (1-4) are derived from unsaturated monomers and are different from the structural units (1-1) to (1-3), and the copolymer A-2 series contains (1-5) derivation Structural units derived from carboxyl-containing unsaturated monomers, (1-6) structural units derived from phenolic hydroxyl-containing unsaturated monomers, and (1-7) derived from unsaturated monomers and different from structural units (1 -5) and the structural units of (1-6); and (2) a photoactive compound.

本發明之光敏樹脂組成物係具有高敏感性,以及優異之圖案顯影能力及防拖尾特性,故其可用於 製備液晶顯示器(LCD)裝置中的介電層。 The photosensitive resin composition of the present invention has high sensitivity, excellent pattern developing ability and anti-smearing characteristics, so it can be used in A dielectric layer is prepared in a liquid crystal display (LCD) device.

本發明之正型光敏樹脂組成物係包含(1)共聚物A-1與共聚物A-2之混合物,其中,共聚物A-1係包含(1-1)衍生自含羧基之不飽和單體的結構單元、(1-2)衍生自含至少一個環氧基之不飽和單體的結構單元、(1-3)衍生自含苯基之不飽和單體的結構單元、以及(1-4)衍生自不飽和單體且不同於結構單元(1-1)至(1-3)的結構單元,且共聚物A-2係包含(1-5)衍生自含羧基之不飽和單體的結構單元、(1-6)衍生自含酚羥基之不飽和單體的結構單元、以及(1-7)衍生自不飽和單體且不同於結構單元(1-5)及(1-6)的結構單元;以及(2)光活性化合物。其可復包含(3)環氧系化合物、(4)溶劑、及/或如需要(5)添加劑,包括(5-1)界面活性劑及/或(5-2)矽烷偶合劑。 The positive photosensitive resin composition system of the present invention comprises (1) a mixture of copolymer A-1 and copolymer A-2, wherein copolymer A-1 comprises (1-1) an unsaturated monomer derived from a carboxyl group Structural units, (1-2) structural units derived from unsaturated monomers containing at least one epoxy group, (1-3) structural units derived from unsaturated monomers containing phenyl groups, and (1- 4) A structural unit derived from an unsaturated monomer and different from the structural units (1-1) to (1-3), and the copolymer A-2 contains (1-5) an unsaturated monomer derived from a carboxyl group Structural units, (1-6) derived from unsaturated monomers containing phenolic hydroxyl groups, and (1-7) derived from unsaturated monomers and different from structural units (1-5) and (1-6 ) A structural unit; and (2) a photoactive compound. It may further comprise (3) an epoxy-based compound, (4) a solvent, and / or (5) an additive if necessary, including (5-1) a surfactant and / or (5-2) a silane coupling agent.

後文將詳細介紹本發明之成份。 The components of the present invention will be described in detail later.

(1)共聚物A-1與A-2之混合物(1) Mixture of copolymers A-1 and A-2

於本發明中使用的共聚物之混合物係包含:共聚物A-1,其係包含(1-1)衍生自含羧基之不飽和單體的結構單元、(1-2)衍生自含至少一個環氧基之不飽和單體的結構單元、(1-3)衍生自含苯基之不飽和單體的結構單元、以及(1-4)衍生自不飽和單體且不同於結構單元(1-1)至(1-3)的結構單元,且共聚物A-2係包含(1-5)衍生自含羧基之不飽和單 體的結構單元、(1-6)衍生自含酚羥基之不飽和單體的結構單元、以及(1-7)衍生自不飽和單體且不同於結構單元(1-5)及(1-6)的結構單元。 The mixture of copolymers used in the present invention comprises: Copolymer A-1, which comprises (1-1) a structural unit derived from an unsaturated monomer containing a carboxyl group, and (1-2) derived from at least one Structural units of epoxy-based unsaturated monomers, (1-3) structural units derived from phenyl-containing unsaturated monomers, and (1-4) derived from unsaturated monomers and different from structural units (1 -1) to (1-3), and the copolymer A-2 contains (1-5) unsaturated monomer derived from a carboxyl group Structural units, (1-6) derived from unsaturated monomers containing phenolic hydroxyl groups, and (1-7) derived from unsaturated monomers and different from structural units (1-5) and (1- 6) The structural unit.

(1-1)衍生自含羧基之不飽和單體的結構單元 (1-1) Structural units derived from unsaturated monomers containing carboxyl groups

含羧基之不飽和單體可藉由不飽和羧酸例示之,如具有至少一個羧基之不飽和多元羧酸,如不飽和單羧酸、不飽和二羧酸、不飽和三羧酸等。此等不飽和單羧酸之實例係包括(甲基)丙烯酸、巴豆酸、α-氯丙烯酸、肉桂酸等。於上述化合物中,對於良好之顯影及可聚合能力,較佳係(甲基)丙烯酸。結構單元(1-1)之用量可係,以共聚物A-1之總重量為基準計,1至40重量(wt)%,較佳2至35wt%。於此量範圍內,可改良曝光敏感性,並可輕易地維持顯影特性。 The unsaturated monomer containing a carboxyl group can be exemplified by an unsaturated carboxylic acid, such as an unsaturated polycarboxylic acid having at least one carboxyl group, such as an unsaturated monocarboxylic acid, an unsaturated dicarboxylic acid, an unsaturated tricarboxylic acid, and the like. Examples of such unsaturated monocarboxylic acids include (meth) acrylic acid, crotonic acid, α-chloroacrylic acid, cinnamic acid, and the like. Among the above compounds, (meth) acrylic acid is preferred for good development and polymerizable ability. The amount of the structural unit (1-1) may be 1 to 40% by weight, preferably 2 to 35% by weight based on the total weight of the copolymer A-1. Within this range, exposure sensitivity can be improved, and development characteristics can be easily maintained.

(1-2)衍生自含至少一個環氧基之不飽和單體的結構單元 (1-2) Structural units derived from unsaturated monomers containing at least one epoxy group

結構單元(1-2)係衍生自含至少一個環氧基之不飽和單體。含至少一個環氧基之不飽和單體之具體實例係包括(甲基)丙烯酸縮水甘油酯、丙烯酸4-羥基丁酯縮水甘油醚、(甲基)丙烯酸3,4-環氧丁酯、(甲基)丙烯酸4,5-環氧戊酯、(甲基)丙烯酸5,6-環氧己酯、(甲基)丙烯酸6,7-環氧庚酯、(甲基)丙烯酸2,3-環氧環戊酯、(甲基)丙烯酸3,4-環氧環己酯、α-乙基丙烯酸縮水甘油酯(α-ethyl glycidy acrylate)、α-正丙基丙烯酸縮水甘油酯(α-n-propyl glycidyl acrylate)、α-正丁基丙烯酸縮水甘油酯(α-n-butyl glycidyl acrylate)、N-(4-(2,3-環氧基丙氧基)-3,5-二甲基苄基)丙烯醯胺、N-(4-(2,3-環氧基丙氧基)-3,5-二甲基苯基丙基)丙烯醯胺、烯丙基縮水甘油醚、2-甲基烯丙基縮水甘油醚、及其混合物。以室溫儲存安定性及溶解度觀點看來,較佳係(甲基)丙烯酸縮水甘油酯、丙烯酸4-羥基丁酯縮水甘油醚、及其混合物。 The structural unit (1-2) is derived from an unsaturated monomer containing at least one epoxy group. Specific examples of the unsaturated monomer containing at least one epoxy group include glycidyl (meth) acrylate, glycidyl ether of 4-hydroxybutyl acrylate, 3,4-epoxybutyl (meth) acrylate, ( 4,5-epoxyamyl methacrylate, 5,6-epoxyhexyl (meth) acrylate, 6,7-epoxyheptyl (meth) acrylate, 2,3- (meth) acrylic acid Epoxy cyclopentyl ester, 3,4-epoxy cyclohexyl (meth) acrylate, α-ethyl glycidy acrylate, α-n-propyl glycidyl acrylate (α-n -propyl glycidyl acrylate), α-n-butyl glycidyl acrylate, N- (4- (2,3-epoxypropoxy) -3,5-dimethyl Benzyl) acrylamide, N- (4- (2,3-epoxypropoxy) -3,5-dimethylphenylpropyl) acrylamide, allyl glycidyl ether, 2- Methylallyl glycidyl ether, and mixtures thereof. From the viewpoint of storage stability and solubility at room temperature, preferred are glycidyl (meth) acrylate, glycidyl ether of 4-hydroxybutyl acrylate, and mixtures thereof.

結構單元(1-2)可以共聚物A-1之總重量為基準計,5至45wt%,較佳10至40wt%之量使用。於此含量範圍內,可維持組成物之儲存安定性,並可獲得良好的硬化後保持率(retention rate)。 The structural unit (1-2) can be used in an amount of 5 to 45 wt%, preferably 10 to 40 wt%, based on the total weight of the copolymer A-1. Within this content range, the storage stability of the composition can be maintained, and a good retention rate after hardening can be obtained.

(1-3)衍生自含苯基之不飽和單體的結構單元 (1-3) Structural units derived from phenyl-containing unsaturated monomers

含苯基之不飽和單體之具體實例可係選自下列所組成之群組的至少一種化合物:(甲基)丙烯酸苯酯、(甲基)丙烯酸苄酯、(甲基)丙烯酸2-苯氧基乙酯、苯氧基二乙二醇(甲基)丙烯酸酯、對壬基苯氧基聚乙二醇(甲基)丙烯酸酯、對壬基苯氧基聚丙二醇(甲基)丙烯酸酯、(甲基)丙烯酸三溴苯酯;苯乙烯;具有烷基取代基之苯乙烯,如甲基苯乙烯、二甲基苯乙烯、三甲基苯乙烯、乙基苯乙烯、二乙基苯乙烯、三乙基苯乙烯、丙基苯乙烯、丁基苯乙烯、己基苯乙烯、庚基苯乙烯及辛基苯乙烯;具有鹵素之苯乙烯,如氟苯乙烯、氯苯乙烯、溴苯乙烯及碘苯乙烯;具有烷氧基取代基之苯乙烯,如甲氧基苯乙烯、乙氧基苯乙烯及丙氧基苯乙烯;乙醯基苯乙烯、乙烯基甲苯、二乙烯基苯、(鄰、間、對)-乙烯基苄基甲基醚、及(鄰、間、對)-乙烯基苄基 縮水甘油醚。具體地,對於良好的可聚合性,較佳係苯乙烯系化合物;而對於良好之保持率,較佳係(甲基)丙烯酸苄酯或(甲基)丙烯酸苯酯。 Specific examples of the phenyl-containing unsaturated monomer may be at least one compound selected from the group consisting of: phenyl (meth) acrylate, benzyl (meth) acrylate, 2-benzene (meth) acrylate Ethoxyethyl ester, phenoxy diethylene glycol (meth) acrylate, p-nonylphenoxy polyethylene glycol (meth) acrylate, p-nonylphenoxy polypropylene glycol (meth) acrylate Tribromophenyl (meth) acrylate; styrene; styrene with alkyl substituents, such as methylstyrene, dimethylstyrene, trimethylstyrene, ethylstyrene, diethylbenzene Ethylene, triethylstyrene, propylstyrene, butylstyrene, hexylstyrene, heptylstyrene and octylstyrene; halogen-containing styrenes such as fluorostyrene, chlorostyrene, bromostyrene And iodostyrene; styrenes with alkoxy substituents, such as methoxystyrene, ethoxystyrene, and propoxystyrene; ethylfluorenylstyrene, vinyltoluene, divinylbenzene, ( (O-, m-, p-)-vinylbenzyl methyl ether, and (o-, m-, p-)-vinylbenzyl Glycidyl ether. Specifically, for good polymerizability, a styrene-based compound is preferred; for good retention, benzyl (meth) acrylate or phenyl (meth) acrylate is preferred.

結構單元(1-3)可以共聚物A-1之總重量為基準計,1至40wt%,較佳5至35%之量使用。於此含量範圍內,可獲得對於顯影能力及曝光敏感性之改良。 The structural unit (1-3) can be used in an amount of 1 to 40 wt%, preferably 5 to 35%, based on the total weight of the copolymer A-1. Within this content range, improvements in developing ability and exposure sensitivity can be obtained.

(1-4)衍生自不飽和單體且不同於結構單元(1-1)至(1-3)的結構單元 (1-4) Structural units derived from unsaturated monomers and different from the structural units (1-1) to (1-3)

不同於結構單元(1-1)至(1-3)之不飽和單體的具體實例係包括:N-取代之馬來醯亞胺類,如N-甲基馬來醯亞胺、N-乙基馬來醯亞胺、N-丙基馬來醯亞胺、N-異丙基馬來醯亞胺、N-丁基馬來醯亞胺、N-異丁基馬來醯亞胺、N-第三丁基馬來醯亞胺、N-環己基馬來醯亞胺、N-苄基馬來醯亞胺、N-苯基馬來醯亞胺、N-氯苯基馬來醯亞胺、N-甲基苯基馬來醯亞胺、N-溴苯基馬來醯亞胺、N-甲氧基苯基馬來醯亞胺、N-羧基苯基馬來醯亞胺、N-硝基苯基馬來醯亞胺及N-萘基馬來醯亞胺;不飽和羧酸酯,如(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸丁酯、(甲基)丙烯酸二甲基胺基乙酯、(甲基)丙烯酸異丁酯、(甲基)丙烯酸第三丁酯、(甲基)丙烯酸環己酯、(甲基)丙烯酸乙基己酯、(甲基)丙烯酸四氫呋喃甲酯、(甲基)丙烯酸羥基乙酯、(甲基)丙烯酸2-羥基丙酯、(甲基)丙烯酸2-羥基-3-氯丙酯、(甲基)丙烯酸4-羥基丁酯、(甲基)丙烯酸甘油酯、α-羥基甲基丙烯酸甲酯、α-羥基甲基丙烯酸乙酯、α-羥基甲基丙 烯酸丙酯、α-羥基甲基丙烯酸丁酯、(甲基)丙烯酸2-甲氧基乙酯、(甲基)丙烯酸3-甲氧基丁酯、乙氧基二乙二醇(甲基)丙烯酸酯、甲氧基三乙二醇(甲基)丙烯酸酯、甲氧基三丙二醇(甲基)丙烯酸酯、聚乙二醇甲基醚(甲基)丙烯酸酯、(甲基)丙烯酸四氟丙酯、(甲基)丙烯酸1,1,1,3,3,3-六氟異丙酯、(甲基)丙烯酸八氟戊酯、(甲基)丙烯酸十七氟癸酯、(甲基)丙烯酸異冰片酯、(甲基)丙烯酸二環戊烷酯、(甲基)丙烯酸二環戊烯酯、(甲基)丙烯酸二環戊烷基氧基乙酯、及(甲基)丙烯酸二環戊烯基氧基乙酯;具有N-乙烯基之三級胺類,如N-乙烯基吡咯、N-乙烯基咔唑、及N-乙烯基嗎啉;以及不飽和醚類,如乙烯基甲基醚及乙烯基乙基醚。此等化合物可單獨使用,或兩者或更多者合用。 Specific examples of unsaturated monomers other than the structural units (1-1) to (1-3) include: N -substituted maleimides, such as N -methylmaleimide, N- Ethylmaleimide, N -propylmaleimide, N -isopropylmaleimide, N -butylmaleimide, N -isobutylmaleimide, N - third maleate (PEI), N - (PEI) cyclohexylmaleimide, N - benzylmaleimide (PEI), N - phenylmaleimide (PEI), N - chlorophenyl maleimide XI Imine, N -methylphenylmaleimide, N -bromophenylmaleimide, N -methoxyphenylmaleimide, N -carboxyphenylmaleimide, N -nitrophenylmaleimide and N -naphthylmaleimide; unsaturated carboxylic acid esters, such as methyl (meth) acrylate, ethyl (meth) acrylate, (meth) acrylic acid Butyl ester, dimethylaminoethyl (meth) acrylate, isobutyl (meth) acrylate, third butyl (meth) acrylate, cyclohexyl (meth) acrylate, ethyl (meth) acrylate Hexyl ester, tetrahydrofuran methyl (meth) acrylate, hydroxyethyl (meth) acrylate, 2-hydroxy (meth) acrylate Ester, 2-hydroxy-3-chloropropyl (meth) acrylate, 4-hydroxybutyl (meth) acrylate, glyceryl (meth) acrylate, α-hydroxymethyl methacrylate, α-hydroxymethyl Ethyl acrylate, α-hydroxy methacrylate, α-hydroxy methacrylate, 2-methoxyethyl (meth) acrylate, 3-methoxybutyl (meth) acrylate, ethoxylate Diethylene glycol (meth) acrylate, methoxytriethylene glycol (meth) acrylate, methoxytripropylene glycol (meth) acrylate, polyethylene glycol methyl ether (meth) acrylate Ester, tetrafluoropropyl (meth) acrylate, 1,1,1,3,3,3-hexafluoroisopropyl (meth) acrylate, octafluoropentyl (meth) acrylate, (meth) acrylic acid Heptafluorodecyl, isobornyl (meth) acrylate, dicyclopentane (meth) acrylate, dicyclopentenyl (meth) acrylate, dicyclopentyloxyethyl (meth) acrylate Esters, and dicyclopentenyloxyethyl (meth) acrylate; tertiary amines with N -vinyl, such as N -vinylpyrrole, N -vinylcarbazole, and N -vinylmorpholine ; And unsaturated ethers, such as vinyl methyl ether and vinyl Ethyl ether. These compounds may be used alone or in combination of two or more.

結構單元(1-4)可以共聚物A-1之總重量為基準計,15至70wt%,較佳20至65%之量使用。於此含量範圍內,可獲得於顯影後具有良好形狀的圖案。 The structural unit (1-4) can be used in an amount of 15 to 70 wt%, preferably 20 to 65% based on the total weight of the copolymer A-1. Within this content range, a pattern having a good shape after development can be obtained.

(1-5)衍生自含羧基之不飽和單體的結構單元 (1-5) Structural units derived from unsaturated monomers containing carboxyl groups

衍生自含羧基之不飽和單體的結構單元係與結構單元(1-1)一致,但結構單元(1-5)之量係以共聚物A-2之總重量為基準計。 The structural unit derived from the carboxyl group-containing unsaturated monomer is the same as the structural unit (1-1), but the amount of the structural unit (1-5) is based on the total weight of the copolymer A-2.

(1-6)衍生自含酚羥基之不飽和單體的結構單元 (1-6) Structural units derived from phenolic hydroxyl-containing unsaturated monomers

該衍生自含酚羥基之不飽和單體的結構單元可藉由下式(I)表示: The structural unit derived from a phenolic hydroxyl-containing unsaturated monomer can be represented by the following formula (I):

其中,R1係氫、C1-6烷基、鹵素或氰基;R2係C1-6烷基、a係0至4之整數,且當a為2或更大之整數時,複數個R2係彼此相同或不同;b係1至5之整數,且a與b之和係1至5之整數;以及Y係單鍵或C1-6伸烷基,其中,該烷基及伸烷基係視需要經至少一個鹵素、硝基、C1-6烷氧基或C6-12芳基取代。 Among them, R 1 is hydrogen, C 1-6 alkyl, halogen or cyano; R 2 is C 1-6 alkyl, a is an integer of 0 to 4, and when a is an integer of 2 or more, plural R 2 are the same or different from each other; b is an integer from 1 to 5, and the sum of a and b is an integer from 1 to 5; and Y is a single bond or a C 1-6 alkyl group, wherein the alkyl group and The alkylene is optionally substituted with at least one halogen, nitro, C 1-6 alkoxy or C 6-12 aryl.

含酚羥基之不飽和單體的具體實例係包括,但不限於,(甲基)丙烯酸對羥基苯酯、(甲基)丙烯酸間羥基苯酯、(甲基)丙烯酸對羥基苯基甲酯、α-氯丙烯酸對羥基苯基甲酯、(甲基)丙烯酸間羥基苯基甲酯、(甲基)丙烯酸2-(對羥基苯基)乙酯、α-三氟甲基丙烯酸2-(對羥基苯基)乙酯、α-氯丙烯酸2-(對羥基苯基)乙酯、α-溴丙烯酸2-(對羥基苯基)乙酯、α-氰基丙烯酸2-(對羥基苯基)乙酯、(甲基)丙烯酸2-(間羥基苯基)乙酯、(甲基)丙烯酸2-(3,5-二羥基苯基)乙酯、(甲基)丙烯酸2-(3,5-二甲基-4-羥基苯基)乙酯、(甲基)丙烯酸1-(對羥基苯基)-1-甲基乙酯、(甲基)丙烯酸1-(間羥基苯基)-1-甲基乙酯、(甲基)丙烯酸1-(3,5-二羥基苯基)-1-甲基乙酯、及其混合物。 Specific examples of the phenolic hydroxyl-containing unsaturated monomer include, but are not limited to, p-hydroxyphenyl (meth) acrylate, m-hydroxyphenyl (meth) acrylate, p-hydroxyphenyl methyl (meth) acrylate, α-chloroacrylic acid p-hydroxyphenyl methyl ester, (meth) acrylic acid m-hydroxyphenyl methyl ester, (meth) acrylic acid 2- (p-hydroxyphenyl) ethyl ester, α-trifluoromethacrylic acid 2- (p- Hydroxyphenyl) ethyl ester, 2- (p-hydroxyphenyl) ethyl α-chloroacrylate, 2- (p-hydroxyphenyl) ethyl α-bromoacrylate, 2- (p-hydroxyphenyl) α-cyanoacrylate Ethyl ester, 2- (m-hydroxyphenyl) ethyl (meth) acrylate, 2- (3,5-dihydroxyphenyl) ethyl (meth) acrylate, 2- (3,5) (meth) acrylate -Dimethyl-4-hydroxyphenyl) ethyl ester, (meth) acrylic acid 1- (p-hydroxyphenyl) -1-methylethyl ester, (meth) acrylic acid 1- (m-hydroxyphenyl) -1 -Methyl ethyl ester, 1- (3,5-dihydroxyphenyl) -1-methyl ethyl (meth) acrylate, and mixtures thereof.

結構單元(1-5)可以共聚物A-2之總重量為基準計,5至70wt%,較佳20至65%之量使用。於此含量範圍內,可獲得具有良好之顯影後形狀以及高敏感性的圖案。 The structural unit (1-5) can be used in an amount of 5 to 70 wt%, preferably 20 to 65%, based on the total weight of the copolymer A-2. Within this content range, patterns with good developed shape and high sensitivity can be obtained.

(1-7)衍生自不飽和單體且不同於結構單元(1-5)及(1-6)的結構單元 (1-7) Structural units derived from unsaturated monomers and different from the structural units (1-5) and (1-6)

不同於結構單元(1-5)及(1-6)之不飽和單體的具體實例係包括,但不限於,含有芳環之烯系不飽和單體、N-取代之馬來醯亞胺單體、及其他烯系不飽和單體。 Specific examples of unsaturated monomers different from the structural units (1-5) and (1-6) include, but are not limited to, ethylenically unsaturated monomers containing an aromatic ring, N -substituted maleimine Monomers, and other ethylenically unsaturated monomers.

含有芳環之烯系不飽和單體的具體實例係包括選自下列所組成之群組的至少一種化合物:(甲基)丙烯酸苯酯、(甲基)丙烯酸苄酯、(甲基)丙烯酸2-苯氧基乙酯、苯氧基二乙二醇(甲基)丙烯酸酯、對壬基苯氧基聚乙二醇(甲基)丙烯酸酯、對壬基苯氧基聚丙二醇(甲基)丙烯酸酯、(甲基)丙烯酸三溴苯酯;苯乙烯;具有烷基取代基之苯乙烯,如甲基苯乙烯、二甲基苯乙烯、三甲基苯乙烯、乙基苯乙烯、二乙基苯乙烯、三乙基苯乙烯、丙基苯乙烯、丁基苯乙烯、己基苯乙烯、庚基苯乙烯、辛基苯乙烯;具有鹵素之苯乙烯,如氟苯乙烯、氯苯乙烯、溴苯乙烯及碘苯乙烯;具有烷氧基取代基之苯乙烯,如甲氧基苯乙烯、乙氧基苯乙烯及丙氧基苯乙烯;乙醯基苯乙烯、乙烯基甲苯、二乙烯基苯、(鄰、間、對)-乙烯基苄基甲基醚及(鄰、間、對)-乙烯基苄基縮水甘油醚。於上述化合物中,對於良好之可聚合性,較佳係苯乙烯系化合物;而對於良好之保持率,較佳係(甲基)丙烯酸苄酯或(甲基)丙烯酸苯酯。 Specific examples of the aromatic ring-containing ethylenically unsaturated monomer include at least one compound selected from the group consisting of: phenyl (meth) acrylate, benzyl (meth) acrylate, (meth) acrylic acid 2 -Phenoxyethyl ester, phenoxydiethylene glycol (meth) acrylate, p-nonylphenoxy polyethylene glycol (meth) acrylate, p-nonylphenoxy polypropylene glycol (methyl) Acrylate, tribromophenyl (meth) acrylate; styrene; styrene with alkyl substituents, such as methylstyrene, dimethylstyrene, trimethylstyrene, ethylstyrene, diethyl Basic styrene, triethylstyrene, propylstyrene, butylstyrene, hexylstyrene, heptylstyrene, octylstyrene; halogen-containing styrenes such as fluorostyrene, chlorostyrene, bromine Styrene and iodostyrene; styrenes with alkoxy substituents, such as methoxystyrene, ethoxystyrene and propoxystyrene; ethenylstyrene, vinyltoluene, divinylbenzene (Ortho, meta, para) -vinylbenzyl methyl ether and (ortho, meta, para) -vinylbenzyl glycidyl ether. Among the above compounds, for good polymerizability, a styrene-based compound is preferred; for good retention, a benzyl (meth) acrylate or phenyl (meth) acrylate is preferred.

N-取代之馬來醯亞胺單體的實例係包括,但不限於,N-甲基馬來醯亞胺、N-乙基馬來醯亞胺、N-丙基馬來醯亞胺、N-異丙基馬來醯亞胺、N-丁基馬來醯亞胺、N-異丁基馬來醯亞胺、N-第三丁基馬來醯亞胺、N-環己基馬來醯亞胺、N-苄基馬來醯亞胺、N-苯基馬來醯亞胺、N-氯苯基馬來醯亞胺、N-甲基苯基馬來醯亞胺、N-溴苯基馬來醯亞胺、N-甲氧基苯基馬來醯亞胺、N-羧基苯基馬來醯亞胺、N-硝基苯基馬來醯亞胺、N-萘基馬來醯亞胺、及其混合物。於上述化合物中,對於改良之保持率,較佳係N-苯基馬來醯亞胺、N-環己基馬來醯亞胺或其混合物,更佳係N-苯基馬來醯亞胺。 Examples of N -substituted maleimide imide monomers include, but are not limited to, N -methylmaleimide, N -ethylmaleimide, N -propylmaleimide, N -isopropylmaleimide, N -butylmaleimide, N -isobutylmaleimide, N -tertiarybutylmaleimide, N -cyclohexylmaleimide (PEI), N - benzylmaleimide (PEI), N - phenylmaleimide (PEI), N - chlorophenyl maleimide (PEI), N - acyl methylphenyl maleic imide, N - bromo Phenylmaleimide, N -methoxyphenylmaleimide, N -carboxyphenylmaleimide, N -nitrophenylmaleimide, N -naphthylmaleimide Hydrazone, and mixtures thereof. In the above compounds, for improvement of retention, based preferred N - phenylmaleimide (PEI), N - cyclohexyl maleimide (PEI), or mixtures thereof, more preferably Department of N - phenylmaleimide (PEI).

其他烯系不飽和單體之具體實例係包括不飽和羧酸酯類,如(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸丁酯、(甲基)丙烯酸二甲基胺基乙酯、(甲基)丙烯酸異丁酯、(甲基)丙烯酸第三丁酯、(甲基)丙烯酸環己酯、(甲基)丙烯酸乙基己酯、(甲基)丙烯酸四氫呋喃甲酯、(甲基)丙烯酸羥基乙酯、(甲基)丙烯酸2-羥基丙酯、(甲基)丙烯酸2-羥基-3-氯丙酯、(甲基)丙烯酸4-羥基丁酯、(甲基)丙烯酸甘油酯、α-羥基甲基丙烯酸甲酯、α-羥基甲基丙烯酸乙酯、α-羥基甲基丙烯酸丙酯、α-羥基甲基丙烯酸丁酯、(甲基)丙烯酸2-甲氧基乙酯、(甲基)丙烯酸3-甲氧基丁酯、乙氧基二乙二醇(甲基)丙烯酸酯、甲氧基三乙二醇(甲基)丙烯酸酯、甲氧基三丙二醇(甲基)丙烯酸酯、聚(乙二醇)甲基醚(甲基)丙烯酸酯、(甲基)丙烯酸四氟丙酯、(甲基)丙烯酸 1,1,1,3,3,3-六氟異丙酯、(甲基)丙烯酸八氟戊酯、(甲基)丙烯酸十七氟癸酯、(甲基)丙烯酸異冰片酯、(甲基)丙烯酸二環戊烷酯、(甲基)丙烯酸二環戊烯酯、(甲基)丙烯酸二環戊烷基氧基乙酯及(甲基)丙烯酸二環戊烯基氧基乙酯;具有N-乙烯基之三級胺類,如N-乙烯基吡咯、N-乙烯基咔唑及N-乙烯基嗎啉;以及不飽和醚類,如乙烯基甲基醚及乙烯基乙基醚。此等化合物可單獨使用,或兩者或更多者合用。 Specific examples of other ethylenically unsaturated monomers include unsaturated carboxylic acid esters, such as methyl (meth) acrylate, ethyl (meth) acrylate, butyl (meth) acrylate, and dimethacrylate Methylaminoethyl, isobutyl (meth) acrylate, tertiary butyl (meth) acrylate, cyclohexyl (meth) acrylate, ethylhexyl (meth) acrylate, (meth) acrylic acid Tetrahydrofuran methyl ester, hydroxyethyl (meth) acrylate, 2-hydroxypropyl (meth) acrylate, 2-hydroxy-3-chloropropyl (meth) acrylate, 4-hydroxybutyl (meth) acrylate, Glyceryl (meth) acrylate, α-hydroxymethyl methacrylate, α-hydroxymethyl acrylate, α-hydroxymethacrylate, α-hydroxymethacrylate, 2 (meth) acrylic acid 2 -Methoxyethyl, 3-methoxybutyl (meth) acrylate, ethoxydiethylene glycol (meth) acrylate, methoxytriethylene glycol (meth) acrylate, methoxy Tripropylene glycol (meth) acrylate, poly (ethylene glycol) methyl ether (meth) acrylate, tetrafluoropropyl (meth) acrylate, 1,1,1,3,3 , 3-hexafluoroisopropyl ester, (meth) propyl Octafluoropentyl enoate, heptafluorodecyl (meth) acrylate, isobornyl (meth) acrylate, dicyclopentane (meth) acrylate, dicyclopentene (meth) acrylate, ( Dicyclopentyloxyethyl (meth) acrylate and dicyclopentenyloxyethyl (meth) acrylate; tertiary amines with N -vinyl, such as N -vinylpyrrole, N -ethylene Carbazole and N -vinylmorpholine; and unsaturated ethers, such as vinyl methyl ether and vinyl ethyl ether. These compounds may be used alone or in combination of two or more.

結構單元(1-7)可以共聚物A-2之總重量為基準計,15至70wt%,較佳20至65%之量使用。於此量範圍內,可獲得圖案之顯影能力的改良。 The structural unit (1-7) can be used in an amount of 15 to 70 wt%, preferably 20 to 65% based on the total weight of the copolymer A-2. Within this amount, an improvement in the developing ability of the pattern can be obtained.

於本說明書中,「(甲基)丙烯醯基」係指「丙烯醯基」及/或「甲基丙烯醯基」,且「(甲基)丙烯酸酯」係指「丙烯酸酯」及/或「甲基丙烯酸酯」。 In this specification, "(meth) acrylfluorenyl" means "acrylfluorenyl" and / or "methacrylfluorenyl", and "(meth) acrylate" means "acrylate" and / or "Methacrylate".

又,每一共聚物,亦即,共聚物A-1與A-2各者之重量平均分子量(Mw)可係500至50,000,較佳1,000至50,000,更佳3,000至30,000之範圍。於上揭範圍內,對於基板之黏著性、物理特性及耐化學性可為所欲者。重量平均分子量係以聚苯乙烯為參考物之重量平均分子量,其係藉由凝膠滲透層析術(GPC,洗提液:四氫呋喃)量測。 In addition, the weight average molecular weight (Mw) of each copolymer, that is, each of the copolymers A-1 and A-2 may be in the range of 500 to 50,000, preferably 1,000 to 50,000, and more preferably 3,000 to 30,000. Within the scope of the disclosure, the adhesion, physical properties, and chemical resistance of the substrate can be as desired. The weight average molecular weight is a weight average molecular weight using polystyrene as a reference, which is measured by gel permeation chromatography (GPC, eluent: tetrahydrofuran).

共聚物A-1及A-2可各自藉由發明所屬技術領域中已知之任意習知方法製備之。 Copolymers A-1 and A-2 can each be prepared by any conventional method known in the art to which the invention belongs.

共聚物A-1與共聚物A-2之重量比可係10至90:90至10。 The weight ratio of the copolymer A-1 to the copolymer A-2 may be 10 to 90:90 to 10.

共聚物A-1與A-2之混合物可以光敏樹脂組成物不包 括溶劑的總量為基準計(亦即,以固體含量為基準計),50至95wt%,較佳60至85wt%之量使用。於上揭範圍內,可獲得具有良好顯影後形狀之圖案,且可改良諸如保持率及耐化學性之此等特性。 Copolymers A-1 and A-2 can be used without the photosensitive resin composition Including the total amount of the solvent as a basis (ie, based on the solid content), an amount of 50 to 95% by weight, preferably 60 to 85% by weight, is used. Within the scope of the above disclosure, a pattern having a good developed shape can be obtained, and characteristics such as retention and chemical resistance can be improved.

(2)光活性化合物(2) Photoactive compounds

本發明之光敏樹脂組成物可包含重氮醌系光活性化合物,作為光敏劑,其係對於g-射線、h-射線及i-射線敏感。該重氮醌系化合物係重氮1,2-醌化合物,其在曝光於輻射時產生羧酸。舉例而言,酚或醇化合物(後文中指為「支架」)與重氮1,2-萘醌磺醯鹵之縮合產物可用作重氮1,2-醌化合物。 The photosensitive resin composition of the present invention may include a diazoquinone-based photoactive compound, and as a photosensitizer, it is sensitive to g-rays, h-rays, and i-rays. The diazoquinone compound is a diazo1,2-quinone compound, which generates a carboxylic acid when exposed to radiation. For example, a condensation product of a phenol or alcohol compound (hereinafter referred to as a "scaffold") and a diazo 1,2-naphthoquinonesulfonium halide can be used as the diazo 1,2-quinone compound.

於本發明中,該支架可為,例如,三羥基二苯甲酮、四羥基二苯甲酮、五羥基二苯甲酮、六羥基二苯甲酮或(多羥基苯基)烷等。 In the present invention, the stent may be, for example, trihydroxybenzophenone, tetrahydroxybenzophenone, pentahydroxybenzophenone, hexahydroxybenzophenone, or (polyhydroxyphenyl) alkane.

支架之具體實例係包括,但不限於,例如,三羥基二苯甲酮,如2,3,4-三羥基二苯甲酮及2,4,6-三羥基二苯甲酮;四羥基二苯甲酮,如2,2’,4,4’-四羥基二苯甲酮、2,3,4,3’-四羥基二苯甲酮、2,3,4,4’-四羥基二苯甲酮、2,3,4,2’-四羥基-4’-甲基二苯甲酮及2,3,4,4’-四羥基-3’-甲氧基二苯甲酮;五羥基二苯甲酮,如2,3,4,2’,6’-五羥基二苯甲酮;六羥基二苯甲酮,如2,4,6,3’,4’,5’-六羥基二苯甲酮及3,4,5,3’,4’,5’-六羥基二苯甲酮;(多羥基苯基)烷,如雙(2,4-二羥基苯基)甲烷、雙(對羥基苯基)甲烷、三(對羥基苯基)甲烷、1,1,1-三(對羥基苯基)乙烷、雙(2,3,4-三羥基苯 基)甲烷、2,2-雙(2,3,4-三羥基苯基)丙烷、1,1,3-三(2,5-二甲基-4-羥基苯基)-3-苯基丙烷、4,4’-(1-(4-(1-(4-羥基苯基)-1-甲基乙基)苯基)亞乙基)雙酚、雙(2,5-二甲基-4-羥基苯基)-2-羥基苯基甲烷、3,3,3’,3’-四甲基-1,1’-螺雙茚-5,6,7,5’,6’,7’-己醇及2,2,4-三甲基-7,2’,4’-三羥基丙烷;及其他支架,如2-甲基-2-(2,4-二羥基苯基)-4-(4-羥基苯基)-7-羥基苯并哌喃、2-[雙{(5-異丙基-4-羥基-2-甲基)苯基}甲基]苯、1-[1-(3-{1-(4-羥基苯基)-1-甲基乙基}-4,6-二羥基苯基)-1-甲基乙基]-3-(1-(3-{1-(4-羥基苯基)-1-甲基乙基}-4,6-二羥基苯基)-1-甲基乙基)苯及4,6-雙{1-(4-羥基苯基)-1-甲基乙基}-1,3-二羥基苯。 Specific examples of the scaffold include, but are not limited to, for example, trihydroxybenzophenones, such as 2,3,4-trihydroxybenzophenone and 2,4,6-trihydroxybenzophenone; tetrahydroxydione Benzophenones, such as 2,2 ', 4,4'-tetrahydroxybenzophenone, 2,3,4,3'-tetrahydroxybenzophenone, 2,3,4,4'-tetrahydroxydione Benzophenone, 2,3,4,2'-tetrahydroxy-4'-methylbenzophenone and 2,3,4,4'-tetrahydroxy-3'-methoxybenzophenone; five Hydroxybenzophenone, such as 2,3,4,2 ', 6'-pentahydroxybenzophenone; hexahydroxybenzophenone, such as 2,4,6,3', 4 ', 5'-hexa Hydroxybenzophenone and 3,4,5,3 ', 4', 5'-hexahydroxybenzophenone; (polyhydroxyphenyl) alkanes, such as bis (2,4-dihydroxyphenyl) methane, Bis (p-hydroxyphenyl) methane, tris (p-hydroxyphenyl) methane, 1,1,1-tris (p-hydroxyphenyl) ethane, bis (2,3,4-trihydroxybenzene) Methyl), methane, 2,2-bis (2,3,4-trihydroxyphenyl) propane, 1,1,3-tris (2,5-dimethyl-4-hydroxyphenyl) -3-phenyl Propane, 4,4 '-(1- (4- (1- (4-hydroxyphenyl) -1-methylethyl) phenyl) ethylene) bisphenol, bis (2,5-dimethyl 4-hydroxyphenyl) -2-hydroxyphenylmethane, 3,3,3 ', 3'-tetramethyl-1,1'-spirobisindene-5,6,7,5', 6 ', 7'-hexanol and 2,2,4-trimethyl-7,2 ', 4'-trihydroxypropane; and other scaffolds, such as 2-methyl-2- (2,4-dihydroxyphenyl) 4- (4-hydroxyphenyl) -7-hydroxybenzopiperan, 2- [bis {(5-isopropyl-4-hydroxy-2-methyl) phenyl} methyl] benzene, 1- [1- (3- {1- (4-hydroxyphenyl) -1-methylethyl} -4,6-dihydroxyphenyl) -1-methylethyl] -3- (1- (3 -{1- (4-hydroxyphenyl) -1-methylethyl} -4,6-dihydroxyphenyl) -1-methylethyl) benzene and 4,6-bis {1- (4- Hydroxyphenyl) -1-methylethyl} -1,3-dihydroxybenzene.

又,亦可使用具有醯胺鏈結替代上文例示支架中之酯鏈結的重氮1,2-萘醌磺醯胺。舉例而言,較佳係可使用2,3,4-三羥基二苯甲酮-重氮1,2-萘醌-4-磺醯胺等。 In addition, it is also possible to use a diazo1,2-naphthoquinonesulfonamide having a sulfonamide chain instead of the ester chain in the stent exemplified above. For example, 2,3,4-trihydroxybenzophenone-diazo 1,2-naphthoquinone-4-sulfonamide and the like can be preferably used.

再者,作為重氮1,2-萘醌磺醯鹵,較佳係重氮1,2-萘醌磺醯氯。具體實例可包括重氮1,2-萘醌-4-磺醯氯及重氮1,2-萘醌-5-磺醯氯。於上揭化合物中,較佳係重氮1,2-萘醌-5-磺醯氯。 The diazo 1,2-naphthoquinonesulfonium halide is preferably diazo 1,2-naphthoquinonesulfonyl chloride. Specific examples may include diazo1,2-naphthoquinone-4-sulfosulfonyl chloride and diazo1,2-naphthoquinone-5-sulfonyl chloride. Among the compounds disclosed above, diazo1,2-naphthoquinone-5-sulfonyl chloride is preferred.

於縮合反應中使用之支架及重氮1,2-萘醌磺醯鹵可以每1mol之支架,使用1.0至6.0mol之重氮1,2-萘醌磺醯鹵,較佳以每1mol之支架,使用1.0至5.0mol重氮1,2-萘醌磺醯鹵之量使用。本發明之縮合反應可藉由發明所屬技術領域中已知之任意習知方法施行。 The scaffold used in the condensation reaction and 1,2-naphthoquinone sulfonium diazonium can be used per 1 mol of the stent, and 1.0 to 6.0 mol of 1,2-naphthoquinone sulfonium halide is preferably used. It is used in an amount of 1.0 to 5.0 mol of diazo 1,2-naphthoquinone sulfonium halide. The condensation reaction of the present invention can be performed by any conventional method known in the technical field to which the invention belongs.

慮及提升光敏樹脂組成物之敏感性及保持率,重氮醌 系化合物較佳係具有式(II)之結構的化合物: Considering the improvement of the sensitivity and retention of the photosensitive resin composition, the diazoquinone compound is preferably a compound having a structure of formula (II):

其中,R係各自獨立為氫、式(IIa)之取代基、或式(IIb)之取代基,惟至少一個R係式(IIa)之取代基或式(IIb)之取代基。 Among them, R is each independently hydrogen, a substituent of formula (IIa), or a substituent of formula (IIb), but at least one R is a substituent of formula (IIa) or a substituent of formula (IIb).

光活性化合物量可為,以共聚物混合物之總重量(固體含量)為100重量份為基準計,0.5至40重量份,較佳10至30重量份之量使用。於上述範圍內,可獲得良好之顯影後保持率,且可改良諸如敏感性及顯影能力之此類特性。 The amount of the photoactive compound may be 0.5 to 40 parts by weight, preferably 10 to 30 parts by weight, based on the total weight (solid content) of the copolymer mixture as 100 parts by weight. Within the above range, good retention after development can be obtained, and characteristics such as sensitivity and development ability can be improved.

(3)環氧系化合物(3) epoxy compounds

本發明之環氧系化合物可包含式(III)之重複單元: The epoxy-based compound of the present invention may include a repeating unit of formula (III):

其中,R5係氫或C1-4烷基;以及R6係C1-10伸烷基、伸苯基、C3-10伸環烷基、C3-10伸雜環烷基、或C2-10伸雜烷基,其中,該R6係視需要經至少一個羥基取代。 Wherein R 5 is hydrogen or C 1-4 alkyl; and R 6 is C 1-10 alkylene, phenylene, C 3-10 cycloalkyl, C 3-10 heterocycloalkyl, or C 2-10 heteroalkyl, wherein the R 6 is optionally substituted with at least one hydroxyl group.

如本文中所使用,除特別另行指出者,術語「伸雜烷基」係指具有選自O、S及N之至少一個雜原子的伸烷基化合物。 As used herein, unless specifically stated otherwise, the term "heteroalkyl" refers to an alkylene compound having at least one heteroatom selected from O, S, and N.

式(III)中,R5之具體實例係包括氫、甲基、乙基、丙基、正丁基、異丁基、及第三丁基,且較佳係氫或甲基。 Specific examples of R 5 in formula (III) include hydrogen, methyl, ethyl, propyl, n-butyl, isobutyl, and third butyl, and are preferably hydrogen or methyl.

R6之具體實例係包括亞甲基、伸乙基、伸丙基、伸丁基、伸戊基、伸己基、伸庚基、伸辛基、伸壬基、伸癸基、-C2H4-O-C2H4-、-C4H8-O-C4H8-、-C4H8-O-CH2-、-C4H8-O-C2H4-、-C2H4-O-CH2-、-C2H4-COO-C2H4-、-C4H8-COO-C4H8-、-C4H8-COO-CH2-、-C4H8-COO-C2H4-、-C2H4-COO-CH2-、-C2H4-OCONH-C2H4-、-C2H4-CH(OH)-C2H4-等,且較佳係亞甲基或-C4H8-O-CH2-。 Specific examples of R 6 include methylene, ethylene, propyl, butyl, pentyl, hexyl, heptyl, octyl, danyl, decyl, -C 2 H 4 -OC 2 H 4- , -C 4 H 8 -OC 4 H 8- , -C 4 H 8 -O-CH 2- , -C 4 H 8 -OC 2 H 4- , -C 2 H 4- O-CH 2- , -C 2 H 4 -COO-C 2 H 4- , -C 4 H 8 -COO-C 4 H 8- , -C 4 H 8 -COO-CH 2- , -C 4 H 8 -COO-C 2 H 4- , -C 2 H 4 -COO-CH 2- , -C 2 H 4 -OCONH-C 2 H 4- , -C 2 H 4 -CH (OH) -C 2 H 4 -etc., and preferably methylene or -C 4 H 8 -O-CH 2- .

本發明中,含有式(III)之重複單元之環氧系化合物的重量平均分子量可係1,000至9,000之範圍,較佳係1,000至7,000,更佳係2,000至5,000。於上述範圍內,可獲得良好之黏著性及耐化學性。重量平均分子量係以聚苯乙烯為參考物之重量平均分子量,其係藉由凝膠滲透層析術(GPC,洗提液:四氫呋喃)量測。 In the present invention, the weight average molecular weight of the epoxy-based compound containing the repeating unit of the formula (III) may be in the range of 1,000 to 9,000, preferably 1,000 to 7,000, and more preferably 2,000 to 5,000. Within the above range, good adhesion and chemical resistance can be obtained. The weight average molecular weight is a weight average molecular weight using polystyrene as a reference, which is measured by gel permeation chromatography (GPC, eluent: tetrahydrofuran).

環氧系化合物可藉由發明所屬技術領域中已知之任意 習知方法製備。 The epoxy-based compound may be any one known in the technical field to which the invention belongs. Prepared by conventional methods.

環氧系化合物可為,以共聚物混合物之總重量(作為固體含量)為100重量份為基準計,0.5至30重量份,較佳2至25重量份之量使用。於上述範圍內,可獲得良好之保持率及耐化學性。 The epoxy-based compound may be used in an amount of 0.5 to 30 parts by weight, preferably 2 to 25 parts by weight, based on 100 parts by weight of the total weight of the copolymer mixture (as a solid content). Within the above range, good retention and chemical resistance can be obtained.

(4)溶劑(4) Solvent

根據本發明之光敏樹脂組成物可藉由發明所屬技術領域中已知之任意習知方法製備,較佳係藉由將上述成份於溶劑中混合而製備為液體組成物。於本發明之光敏樹脂組成物中,對於溶劑之量並無具體限制。惟,慮及光敏樹脂組成物之塗覆特性及安定性,本發明之光敏樹脂組成物可包含溶劑,活劑之含量為令組成物之固體含量範圍為,以組成物之總重量為基準計,5至70wt%,較佳10至50wt%。 The photosensitive resin composition according to the present invention can be prepared by any conventional method known in the technical field to which the invention belongs, and is preferably prepared as a liquid composition by mixing the above components in a solvent. In the photosensitive resin composition of the present invention, the amount of the solvent is not specifically limited. However, considering the coating characteristics and stability of the photosensitive resin composition, the photosensitive resin composition of the present invention may include a solvent, and the content of the active agent is such that the solid content range of the composition is based on the total weight of the composition as a basis 5 to 70 wt%, preferably 10 to 50 wt%.

固體含量係意指,自本發明之樹脂組成物中移除溶劑後所得之成份的含量。 The solid content means the content of the components obtained after removing the solvent from the resin composition of the present invention.

溶劑之具體實例係包括:乙二醇單烷基醚醋酸酯類,如乙二醇單甲基醚醋酸酯及乙二醇單乙基醚醋酸酯;丙二醇單烷基醚類,如丙二醇單甲基醚、丙二醇單乙基醚、丙二醇單丙基醚及丙二醇單丁基醚;丙二醇二烷基醚類,如丙二醇二甲基醚、丙二醇二乙基醚、丙二醇二丙基醚及丙二醇二丁基醚;二丙二醇二烷基醚類,如二丙二醇二甲基醚;丙二醇單烷基醚醋酸酯類,如丙二醇單甲基醚醋酸酯、丙二醇單乙基醚醋酸酯、丙二醇單丙基醚醋酸酯及丙二醇單丁基醚醋酸酯;賽璐蘇類(cellosolves),如乙基賽璐蘇及 丁基賽璐蘇;卡必醇類,如丁基卡必醇;乳酸酯類,如乳酸甲酯、乳酸乙酯、乳酸正丙酯及乳酸異丙酯;脂族羧酸酯類,如醋酸乙酯、醋酸正丙酯、醋酸異丙酯、醋酸正丁酯、醋酸異丁酯、醋酸正戊酯、醋酸異戊酯、丙酸異丙酯、丙酸正丁酯及丙酸異丁酯;酯類,如3-甲氧基丙酸甲酯、3-甲氧基丙酸乙酯、3-乙氧基丙酸甲酯、3-乙氧基丙酸乙酯、丙酮酸甲酯及丙酮酸乙酯;芳族烴類,如甲苯及二甲苯;酮類,如2-庚酮、3-庚酮、4-庚酮及環己酮;醯胺類,如N-二甲基甲醯胺、N-甲基乙醯胺、N,N-二甲基乙醯胺及N-甲基吡咯啶酮;內酯類,如γ-丁內酯;及其混合物。 Specific examples of the solvent include: ethylene glycol monoalkyl ether acetates such as ethylene glycol monomethyl ether acetate and ethylene glycol monoethyl ether acetate; propylene glycol monoalkyl ethers such as propylene glycol monomethyl ether Ethers, propylene glycol monoethyl ether, propylene glycol monopropyl ether, and propylene glycol monobutyl ether; propylene glycol dialkyl ethers, such as propylene glycol dimethyl ether, propylene glycol diethyl ether, propylene glycol dipropyl ether, and propylene glycol dibutyl ether Ethers; dipropylene glycol dialkyl ethers, such as dipropylene glycol dimethyl ether; propylene glycol monoalkyl ether acetates, such as propylene glycol monomethyl ether acetate, propylene glycol monoethyl ether acetate, propylene glycol monopropyl ether Acetate and propylene glycol monobutyl ether acetate; cellosolves, such as ethylcellulose and butylcellulose; carbitols, such as butylcarbitol; lactates, such as lactic acid Methyl ester, ethyl lactate, n-propyl lactate and isopropyl lactate; aliphatic carboxylic acid esters, such as ethyl acetate, n-propyl acetate, isopropyl acetate, n-butyl acetate, isobutyl acetate, acetic acid N-pentyl ester, isoamyl acetate, isopropyl propionate, n-butyl propionate and isopropyl propionate Butyl esters; esters, such as methyl 3-methoxypropionate, ethyl 3-methoxypropionate, methyl 3-ethoxypropionate, ethyl 3-ethoxypropionate, methylpyruvate Esters and ethyl pyruvate; aromatic hydrocarbons, such as toluene and xylene; ketones, such as 2-heptanone, 3-heptanone, 4-heptanone, and cyclohexanone; amidoamines, such as N -dimethyl Methylformamide, N -methylacetamide, N, N -dimethylacetamide and N -methylpyrrolidone; lactones, such as γ-butyrolactone; and mixtures thereof.

於上述化合物中,對於良好之塗覆能力及高安定性,較佳係二丙二醇二甲基醚、丙二醇單甲基醚醋酸酯及3-甲氧基丙酮酸甲酯。 Among the above compounds, for good coating ability and high stability, dipropylene glycol dimethyl ether, propylene glycol monomethyl ether acetate and methyl 3-methoxypyruvate are preferred.

(5)其他成份(5) Other ingredients

根據本發明之光敏樹脂組成物可復包含其他成份以改良其特性。例如,其他成份可包含(5-1)界面活性劑及/或(5-2)矽烷偶合劑。 The photosensitive resin composition according to the present invention may further contain other components to improve its characteristics. For example, other ingredients may include (5-1) a surfactant and / or (5-2) a silane coupling agent.

(5-1)界面活性劑 (5-1) Surfactant

若需要,為了提升塗覆能力並預防缺陷之形成,根據本發明之光敏樹脂組成物可復包含界面活性劑。界面活性劑並不限於特定類別,且較佳係氟系界面活性劑、矽系界面活性劑、非離子性界面活性劑等。界面活性劑之實例係包括:氟系或矽系界面活性劑,如BM-1000、BM-1100(由BM CHEMIE Co.,Ltd.製造),Megapack F142 D、Megapack F172、Megapack F173、Megapack F183、F-470、F-471、F-475、F-482、F-489(由Dai Nippon Ink Chemical Kogyo Co.,Ltd.製造)、Florad FC-135、Florad FC-170C、Florad FC-430、Florad FC-431(由Sumitomo 3M Ltd.製造),Sufron S-112、Sufron S-113、Sufron S-131、Sufron S-141、Sufron S-145、Sufron S-382、Sufron SC-101、Sufron SC-102、Sufron SC-103、Sufron SC-104、Sufron SC-105、Sufron SC-106(由Asahi Glass Co.,Ltd.製造),Eftop EF301、Eftop 303、Eftop 352(由Shinakida Kasei Co.,Ltd.製造)、SH-28 PA、SH-190、SH-193、SZ-6032、SF-8428、DC-57、DC-190(由Toray Silicon Co.,Ltd.製造)、DC3PA、DC7PA、SH11PA、SH21PA、SH8400、GE、FZ-2100、FZ-2110、FZ-2122、FZ-2222、FZ-2233(由Dow Corning Toray Silicon Co.,Ltd.製造)、TSF-4440、TSF-4300、TSF-4445、TSF-4446、TSF-4460、TSF-4452(由GE Toshiba Silicon Co.,Ltd.製造)、以及BYK-333(由BYK Co.,Ltd.製造);非離子性界面活性劑,如聚氧乙烯烷基醚類,包括聚氧乙烯月桂醚、聚氧乙烯硬脂基醚、聚氧乙烯油基醚等,聚氧乙烯芳基醚類,包括聚氧乙烯辛基苯基醚、聚氧乙烯壬基苯基醚等,以及聚氧乙烯二烷基酯類,包括聚氧乙烯二月桂酸酯、聚氧乙烯二硬脂酸酯等;以及有機矽氧烷聚合物KP341(由Shin-Etsu Chemical Co.,Ltd.製造),(甲基)丙烯酸酯系共聚物Polyflow No.57,95(Kyoei Yuji Chemical Co.,Ltd.)等。他們可單獨使用,或兩種或更多種合用。 If necessary, in order to improve the coating ability and prevent the formation of defects, the photosensitive resin composition according to the present invention may further contain a surfactant. The surfactant is not limited to a specific category, and is preferably a fluorine-based surfactant, a silicon-based surfactant, a nonionic surfactant, and the like. Examples of the surfactant include fluorine-based or silicon-based surfactants, such as BM-1000, BM-1100 (manufactured by BM CHEMIE Co., Ltd.), Megapack F142 D, Megapack F172, Megapack F173, Megapack F183, F-470, F-471, F-475, F-482, F-489 (manufactured by Dai Nippon Ink Chemical Kogyo Co., Ltd.), Florad FC-135, Florad FC- 170C, Florad FC-430, Florad FC-431 (manufactured by Sumitomo 3M Ltd.), Sufron S-112, Sufron S-113, Sufron S-131, Sufron S-141, Sufron S-145, Sufron S-382, Sufron SC-101, Sufron SC-102, Sufron SC-103, Sufron SC-104, Sufron SC-105, Sufron SC-106 (manufactured by Asahi Glass Co., Ltd.), Eftop EF301, Eftop 303, Eftop 352 ( (Manufactured by Shinakida Kasei Co., Ltd.), SH-28 PA, SH-190, SH-193, SZ-6032, SF-8428, DC-57, DC-190 (manufactured by Toray Silicon Co., Ltd.) , DC3PA, DC7PA, SH11PA, SH21PA, SH8400, GE, FZ-2100, FZ-2110, FZ-2122, FZ-2222, FZ-2233 (manufactured by Dow Corning Toray Silicon Co., Ltd.), TSF-4440, TSF-4300, TSF-4445, TSF-4446, TSF-4460, TSF-4452 (manufactured by GE Toshiba Silicon Co., Ltd.), and BYK-333 (manufactured by BYK Co., Ltd.); non-ionic Surfactants, such as polyoxyethylene alkyl ethers, including polyoxyethylene lauryl ether, polyoxyethylene hard Ethers, polyoxyethylene oleyl ethers, etc., polyoxyethylene aryl ethers, including polyoxyethylene octylphenyl ether, polyoxyethylene nonylphenyl ether, etc., and polyoxyethylene dialkyl esters, including Polyoxyethylene dilaurate, polyoxyethylene distearate, etc .; and organosiloxane polymer KP341 (manufactured by Shin-Etsu Chemical Co., Ltd.), (meth) acrylate copolymer Polyflow No. 57, 95 (Kyoei Yuji Chemical Co., Ltd.) and the like. They can be used alone or in combination of two or more.

本發明之光敏樹脂組成物可包含以共聚物混合物之總重量(固體含量)為100重量份為基準計,0.001至5重量份,較佳0.05至3重量份量之界面活性劑。於上述範圍內,可輕易地塗覆組成物。 The photosensitive resin composition of the present invention may include a surfactant in an amount of 0.001 to 5 parts by weight, preferably 0.05 to 3 parts by weight, based on the total weight (solid content) of the copolymer mixture as 100 parts by weight. Within the above range, the composition can be easily applied.

(5-2)矽烷偶合劑 (5-2) Silane coupling agent

根據本發明之光敏樹脂組成物可復包含矽烷偶合劑作為改良塗層與基板間的黏著性的黏著劑。矽烷偶合劑可具有選自下列所組成群組之反應性取代基:羧基、甲基丙烯醯基、異氰酸基、環氧基、咪唑基、巰基、胺基等。矽烷偶合劑之實例係包括,但不限於三甲氧基矽基苯甲酸、γ-甲基丙烯醯基氧基丙基三甲氧基矽烷、乙烯基三乙醯氧基矽烷、乙烯基三甲氧基矽烷、γ-異氰酸基丙基三乙氧基矽烷、γ-環氧丙基氧基丙基三甲氧基矽烷(γ-glycidoxypropyltrimethoxysilane)、γ-環氧丙基氧基丙基三乙氧基矽烷、β-(3,4-環氧環己基)乙基三甲氧基矽烷、N-苯基-3-胺基丙基三乙氧基矽烷、及其混合物。 The photosensitive resin composition according to the present invention may further include a silane coupling agent as an adhesive agent for improving the adhesion between the coating and the substrate. The silane coupling agent may have a reactive substituent selected from the group consisting of a carboxyl group, a methacryl group, an isocyanate group, an epoxy group, an imidazolyl group, a mercapto group, an amino group, and the like. Examples of silane coupling agents include, but are not limited to, trimethoxysilylbenzoic acid, γ-methacrylfluorenyloxypropyltrimethoxysilane, vinyltriethoxysilane, vinyltrimethoxysilane Γ-isocyanatopropyltriethoxysilane, γ-glycidoxypropyltrimethoxysilane, γ-glycidoxypropyltrimethoxysilane, γ-glycidoxypropyltrimethoxysilane , Β- (3,4-epoxycyclohexyl) ethyltrimethoxysilane, N -phenyl-3-aminopropyltriethoxysilane, and mixtures thereof.

矽烷偶合劑可為以共聚物混合物的總重量(固體含量)為100重量份為基準計,0.001至5重量份,較佳0.05至3重量份之量使用。於上述範圍內,可改良組成物對基板之黏著性。 The silane coupling agent may be used in an amount of 0.001 to 5 parts by weight, preferably 0.05 to 3 parts by weight, based on the total weight (solid content) of the copolymer mixture as 100 parts by weight. Within the above range, the adhesion of the composition to the substrate can be improved.

再者,於不破壞光敏樹脂組成物之物理特性的前提下,可包括其他添加劑如溶解加速劑、敏化劑、抗氧化劑、光安定劑(UV吸收劑)等。 Moreover, other additives such as a dissolution accelerator, a sensitizer, an antioxidant, a light stabilizer (UV absorber), and the like may be included without prejudice to the physical characteristics of the photosensitive resin composition.

再者,本發明係提供自上述光敏樹脂組成物製備之經 硬化膜。 Furthermore, the present invention provides a process for preparing the above-mentioned photosensitive resin composition. Hardened film.

經硬化膜可藉由發明所屬技術領域中已知之任意習知方法製備,例如,藉由將光敏樹脂組成物塗覆於基板之上,並令其歷經硬化製程。更詳而言,塗覆於基板上之光敏樹脂組成物可於諸如60℃至130℃之溫度歷經預烘烤以移除溶劑;採用具有所欲之圖案的光罩曝露於光中;並使用諸如氫氧化四甲基銨溶液(TMAH)之顯影劑顯影,以於塗覆膜上形成圖案。隨後,若需要,令所得圖案化塗覆膜於諸如150℃至300℃之溫度條件下歷經10分鐘至5小時之後烘烤,以製備所欲之經硬化膜。光曝光可於200至450奈米(nm)之波長範圍內,且曝光量為20至100毫焦耳(mJ)/平方公分(cm2)進行。 The cured film can be prepared by any conventional method known in the technical field to which the invention belongs, for example, by coating a photosensitive resin composition on a substrate and subjecting it to a curing process. More specifically, the photosensitive resin composition coated on the substrate may be pre-baked at a temperature such as 60 ° C to 130 ° C to remove the solvent; exposed to light using a photomask having a desired pattern; and used A developer such as a tetramethylammonium hydroxide solution (TMAH) is developed to form a pattern on the coating film. Subsequently, if necessary, the obtained patterned coating film is baked at a temperature such as 150 ° C. to 300 ° C. for 10 minutes to 5 hours to prepare a desired cured film. Light exposure can be performed in a wavelength range of 200 to 450 nanometers (nm) and an exposure amount of 20 to 100 millijoules (mJ) / cm 2 (cm 2 ).

當自根據本發明之正型光敏樹脂組成物製造經硬化膜時,經硬化膜係顯示良好之圖案形成、保持率及化學安定性。 When a cured film is produced from the positive-type photosensitive resin composition according to the present invention, the cured film system exhibits good pattern formation, retention, and chemical stability.

由於其優異之特性,根據本發明製備之經硬化膜可有效地用作為液晶顯示器裝置中之層間介電層。據此,本發明係提供包含經硬化膜作為介電層之電子部件。 Due to its excellent characteristics, the cured film prepared according to the present invention can be effectively used as an interlayer dielectric layer in a liquid crystal display device. Accordingly, the present invention provides an electronic component including a cured film as a dielectric layer.

後文中,將參照下述實施例更詳細揭示本發明。惟,此等實施例係述以說明本發明,而本發明之範疇並不限於此。 Hereinafter, the present invention will be described in more detail with reference to the following examples. However, these embodiments are described to illustrate the present invention, and the scope of the present invention is not limited thereto.

於下述實施例中,重量平均分子量係藉由凝膠滲透層析術(GPC)手段使用聚苯乙烯標準品測定。 In the following examples, the weight average molecular weight is determined by gel permeation chromatography (GPC) using polystyrene standards.

[實施例] [Example]

製備例1:共聚物A-1a之製備Preparation Example 1: Preparation of Copolymer A-1a

將200重量份之丙二醇單甲基醚醋酸酯作為溶劑置於配備冷凝管及攪拌器之燒瓶中,緩慢攪拌,並將其溫度升至70℃。將13.5重量份之甲基丙烯酸、31.0重量份之(甲基)丙烯酸縮水甘油酯、13.6重量份之苯乙烯、32.3重量份之(甲基)丙烯酸甲酯及9.7重量份之(甲基)丙烯酸異冰片酯加入其中,且藉由以5小時區間逐滴加入作為自由基聚合起始劑的3重量份之2,2’-偶氮雙(2,4-二甲基戊腈)而令如是獲得之混合物進行聚合反應。獲得具有重量平均分子量為9,800之共聚物A-1a(固體含量=30wt%)。 200 parts by weight of propylene glycol monomethyl ether acetate was placed in a flask equipped with a condenser tube and a stirrer as a solvent, stirred slowly, and the temperature was raised to 70 ° C. 13.5 parts by weight of methacrylic acid, 31.0 parts by weight of glycidyl (meth) acrylate, 13.6 parts by weight of styrene, 32.3 parts by weight of methyl (meth) acrylate, and 9.7 parts by weight of (meth) acrylic acid Isobornyl ester was added thereto, and this was made by adding 3 parts by weight of 2,2'-azobis (2,4-dimethylvaleronitrile) as a radical polymerization initiator dropwise in a 5-hour interval. The obtained mixture was subjected to polymerization. Copolymer A-1a (solid content = 30 wt%) having a weight average molecular weight of 9,800 was obtained.

製備例2:共聚物A-2a之製備Preparation Example 2: Preparation of copolymer A-2a

將200重量份之丙二醇單甲基醚醋酸酯作為溶劑置於配備冷凝管及攪拌器之燒瓶中,緩慢攪拌,並將其溫度升至70℃。將4.4重量份之甲基丙烯酸、52.2重量份之(甲基)丙烯酸對羥基苯基甲酯、35.2重量份之(甲基)丙烯酸甲酯及8.1重量份之(甲基)丙烯酸異冰片酯加入其中,且藉由以5小時區間逐滴加入作為自由基聚合起始劑的3重量份之2,2’-偶氮雙(2,4-二甲基戊腈)而令如是獲得之混合物進行聚合反應。獲得具有重量平均分子量為12,700之共聚物A-2a(固體含量=30wt%)。 200 parts by weight of propylene glycol monomethyl ether acetate was placed in a flask equipped with a condenser tube and a stirrer as a solvent, stirred slowly, and the temperature was raised to 70 ° C. 4.4 parts by weight of methacrylic acid, 52.2 parts by weight of p-hydroxyphenylmethyl (meth) acrylate, 35.2 parts by weight of methyl (meth) acrylate, and 8.1 parts by weight of isobornyl (meth) acrylate were added Among them, by adding dropwise 3 parts by weight of 2,2'-azobis (2,4-dimethylvaleronitrile) as a radical polymerization initiator in a 5-hour interval, the mixture thus obtained was performed. Polymerization. Copolymer A-2a having a weight average molecular weight of 12,700 (solid content = 30 wt%) was obtained.

製備例3:共聚物A-1b之製備Preparation Example 3: Preparation of Copolymer A-1b

重複製備例1之過程,但使用15.0重量份之甲基丙烯酸、31.0重量份之(甲基)丙烯酸縮水甘油酯、13.6重量份之苯乙烯、30.6重量份之(甲基)丙烯酸甲酯及9.7重量份之 (甲基)丙烯酸異冰片酯以獲得具有重量平均分子量為10,400的共聚物A-1b(固體含量=30wt%)。 The procedure of Preparation Example 1 was repeated, but using 15.0 parts by weight of methacrylic acid, 31.0 parts by weight of glycidyl (meth) acrylate, 13.6 parts by weight of styrene, 30.6 parts by weight of methyl (meth) acrylate, and 9.7 Parts by weight Isobornyl (meth) acrylate to obtain a copolymer A-1b having a weight average molecular weight of 10,400 (solid content = 30 wt%).

製備例4:共聚物A-2b之製備Preparation Example 4: Preparation of copolymer A-2b

重複製備例2之過程,但使用6.3重量份之甲基丙烯酸、52.4重量份之(甲基)丙烯酸對羥基苯基甲酯、33.1重量份之(甲基)丙烯酸甲酯及8.2重量份之(甲基)丙烯酸異冰片酯以獲得具有重量平均分子量為11,800的共聚物A-2b(固體含量=30wt%)。 The procedure of Preparation Example 2 was repeated, but using 6.3 parts by weight of methacrylic acid, 52.4 parts by weight of p-hydroxyphenylmethyl (meth) acrylate, 33.1 parts by weight of methyl (meth) acrylate, and 8.2 parts by weight of ( Isobornyl (meth) acrylate to obtain copolymer A-2b (solid content = 30 wt%) having a weight average molecular weight of 11,800.

製備例5:環氧系化合物C-1之製備Preparation Example 5: Preparation of epoxy-based compound C-1

將100重量份之(甲基)丙烯酸縮水甘油酯與作為溶劑的195重量份之3-甲氧基丙酸甲酯於配備冷凝管及攪拌器之燒瓶中混合。將反應器中之氣氛以氮氣置換後,於緩慢攪拌該混合物之同時將溫度升至60℃。藉由在維持該溫度的同時,以2小時區間逐滴加入作為自由基聚合起始劑的3重量份之偶氮雙異丁腈而令如是獲得之混合物進行聚合反應。結果,獲得包含式(IV)之重複單元且具有重量平均分子量為3,500的化合物C-1,其固體含量為34.5%。 100 parts by weight of glycidyl (meth) acrylate and 195 parts by weight of methyl 3-methoxypropionate as a solvent were mixed in a flask equipped with a condenser and a stirrer. After the atmosphere in the reactor was replaced with nitrogen, the temperature was raised to 60 ° C while slowly stirring the mixture. While maintaining the temperature, 3 parts by weight of azobisisobutyronitrile as a radical polymerization initiator was added dropwise over a period of 2 hours, so that the obtained mixture was subjected to polymerization. As a result, a compound C-1 containing a repeating unit of the formula (IV) and having a weight average molecular weight of 3,500 was obtained, and its solid content was 34.5%.

實施例1Example 1

於作為溶劑的340重量份之3-甲氧基丙酸甲酯(MMP) 中,將(1)70重量份作為固體成份之製備例1中獲得之共聚物A-1與30重量份作為固體成份之製備例2中獲得之共聚物A-2a的混合物、(2)21.5重量份作為固體成份之重氮醌系光活性化合物(MIPHOTO TPA523,Miwon Commercial)、(3)0重量份作為固體成份之於製備例5中製備之環氧系化合物C-1、(4)0.15重量份作為固體成份之界面活性劑(FZ-2122,Dow Corning Toray Silicon)、以及(5)0.22重量份作為固體成份之矽烷偶合劑(KBE-9007,Shin-Etsu)均質混合2小時,以獲得作為液體之光敏樹脂組成物。 340 parts by weight of methyl 3-methoxypropionate (MMP) as a solvent In (1) a mixture of (1) 70 parts by weight of copolymer A-1 obtained in Preparation Example 1 as a solid component and 30 parts by weight of copolymer A-2a obtained in Preparation Example 2 as a solid component, (2) 21.5 Part by weight of a diazoquinone-based photoactive compound (MIPHOTO TPA523, Miwon Commercial) as a solid component, (3) 0 parts by weight of an epoxy-based compound C-1, (4) 0.15 prepared in Preparation Example 5 as a solid component Parts by weight of solid surfactant (FZ-2122, Dow Corning Toray Silicon) and (5) 0.22 parts by weight of silane coupling agent (KBE-9007, Shin-Etsu) as solid ingredients are homogeneously mixed for 2 hours to obtain As a liquid photosensitive resin composition.

實施例2至11及比較例1至8Examples 2 to 11 and Comparative Examples 1 to 8

為製備光敏樹脂組成物,重複實施例1之過程,但使用下表1中列述之成份及量(重量份)製備每一溶液。 To prepare the photosensitive resin composition, the procedure of Example 1 was repeated, but each solution was prepared using the ingredients and amounts (parts by weight) listed in Table 1 below.

為了評估其敏感性、圖案顯影能力及顯影後之濁度,根據下述方法測試使用自實施例1至11及比較例1至8中獲得之樹脂組成物製備的經硬化膜。結果係顯示於下表2中。 In order to evaluate its sensitivity, pattern development ability, and turbidity after development, the cured films prepared using the resin compositions obtained in Examples 1 to 11 and Comparative Examples 1 to 8 were tested according to the following methods. The results are shown in Table 2 below.

1.敏感性之評估Assessment of sensitivity

[樣本之製備] [Preparation of samples]

使用旋轉塗覆器將光敏樹脂組成物之每一者塗覆於玻璃基板上,且將經塗覆之基板於100℃進行後烘烤90秒,以形成具有厚度為4微米(μm)之塗覆膜。將具有由尺寸為1至15μm範圍且間距為1μm之方孔組成之圖案的圖案罩置於如是獲得之塗覆膜的頂部。以該罩與該基板間之間距為25μm,使用對準器(型號:MA6)將該膜於具有強度為15毫瓦(mW)/cm2之UV光源下以基於365nm之波長為0至200mJ/cm2的曝光速率曝光一段時間,該對準器係發射具有波長為200至450nm的光。隨後,藉由透過噴嘴於23℃噴灑2.38wt%氫氧化四甲基銨水溶液作為顯影劑而將該膜顯影。 Each of the photosensitive resin compositions was coated on a glass substrate using a spin coater, and the coated substrate was post-baked at 100 ° C for 90 seconds to form a coating having a thickness of 4 micrometers (μm). Laminated. A pattern cover having a pattern consisting of square holes having a size ranging from 1 to 15 μm and a pitch of 1 μm was placed on top of the coating film thus obtained. With a distance between the cover and the substrate of 25 μm, the film was aligned with an aligner (model: MA6) under a UV light source with an intensity of 15 milliwatts (mW) / cm 2 at a wavelength of 0 to 200 mJ based on 365 nm With an exposure rate of / cm 2 for a period of time, the aligner emits light having a wavelength of 200 to 450 nm. Subsequently, the film was developed by spraying a 2.38 wt% tetramethylammonium hydroxide aqueous solution as a developer through a nozzle at 23 ° C.

[敏感性之量測] [Measurement of sensitivity]

對於藉由透過10μm之罩尺寸而圖案化所形成之孔圖案,量測達到10μm之臨界維度(CD,單位:μm)所需之曝光劑量。 For the hole pattern formed by patterning through a mask size of 10 μm, the exposure dose required to reach a critical dimension (CD, unit: μm) of 10 μm was measured.

2.圖案顯影能力之評估(劑量:70mJ/cm2. Evaluation of pattern development ability (dose: 70mJ / cm 22 ,罩尺寸:10μm), Cover size: 10μm)

於上揭敏感性量測測試之經硬化膜的製備製程中,係 透過10μm之罩尺寸曝光於70mJ/cm2之輻照劑量中。量測如是獲得之圖案的臨界維度,隨後,使用下述等式計算圖案顯影能力之值(%)。圖案顯影能力之值愈低,則經硬化層之特性愈好。 In the process of preparing the cured film for the sensitivity measurement test, the exposure was performed at a radiation dose of 70 mJ / cm 2 through a mask size of 10 μm. The critical dimension of the obtained pattern is measured, and then the value (%) of the pattern developing ability is calculated using the following equation. The lower the value of the pattern developing ability, the better the characteristics of the hardened layer.

圖案顯影能力(%)=[(罩之尺寸-孔圖案之CD)/(罩之尺寸)]×100 Pattern developing ability (%) = [(size of cover-CD of hole pattern) / (size of cover)] × 100

3.顯影後之濁度3. Turbidity after development

評估自每一樣本獲得之經硬化膜未經曝光部份的顯影後濁度(×:無濁度;○:觀察到濁度)。 The haze after development of the unexposed portion of the cured film obtained from each sample was evaluated (×: no haze; ○: haze was observed).

當經硬化膜顯示無濁度時,則視該膜之特性為滿意。 When the cured film shows no turbidity, the characteristics of the film are regarded as satisfactory.

於上表2之測試結果可見,自實施例1至11製備的包含二元黏合劑之光敏樹脂組成物,亦即,共聚物之混合物,係提供具有高敏感性以及未顯示顯影後濁度(拖尾問題)之優異圖案顯影能力的經硬化膜。 As can be seen from the test results in Table 2 above, the photosensitive resin composition containing the binary adhesive prepared from Examples 1 to 11, that is, the copolymer mixture, is provided with high sensitivity and does not show turbidity after development ( Tail problem) A cured film with excellent pattern development ability.

另一態樣,比較例1至8中製備之僅採用一種共聚物而不使用二元黏合劑的光敏樹脂組成物,係提供具有相對差敏感性及圖案顯影能力的經硬化膜。特別是使用比較例2及4至8之光敏樹脂組成物製備的經硬化膜於顯影後顯示某種程度之濁度。 In another aspect, the photosensitive resin composition prepared in Comparative Examples 1 to 8 using only one copolymer without using a binary adhesive is provided with a cured film having relatively poor sensitivity and pattern development ability. In particular, the cured films prepared using the photosensitive resin compositions of Comparative Examples 2 and 4 to 8 showed a certain degree of haze after development.

Claims (5)

一種光敏樹脂組成物,係包含:(1)共聚物A-1與共聚物A-2之混合物,其中該共聚物A-1係包含(1-1)衍生自含羧基之不飽和單體的結構單元、(1-2)衍生自含至少一個環氧基之不飽和單體的結構單元、(1-3)衍生自含苯基之不飽和單體的結構單元、以及(1-4)衍生自不飽和單體且不同於該結構單元(1-1)至(1-3)的結構單元,其中,該共聚物A-1係包含以該共聚物A-1之總重量為基準計含量分別為1至40wt%、5至45wt%、1至40wt%、及15至70wt%範圍之該結構單元(1-1)、(1-2)、(1-3)及(1-4);以及該共聚物A-2係包含(1-5)衍生自含羧基之不飽和單體的結構單元、(1-6)衍生自含酚羥基之不飽和單體的結構單元、以及(1-7)衍生自不飽和單體且不同於該結構單元(1-5)及(1-6)的結構單元,其中,該共聚物A-2係包含以該共聚物A-2之總重量為基準計含量分別為1至40wt%、5至70wt%、及15至70wt%之範圍之該結構單元(1-5)、(1-6)及(1-7),以及其中,該共聚物A-1與共聚物A-2之混合物係包含重量比為10至90:90至10的該共聚物A-1及該共聚物A-2;以及(2)重氮醌系光活性化合物,其中,以該共聚物之該混合物之總重量為基準計,該重氮醌系光活性化合物為0.5至40重量份之含量。A photosensitive resin composition comprising: (1) a mixture of copolymer A-1 and copolymer A-2, wherein the copolymer A-1 comprises (1-1) a carboxyl group-containing unsaturated monomer Structural units, (1-2) structural units derived from unsaturated monomers containing at least one epoxy group, (1-3) structural units derived from unsaturated monomers containing phenyl groups, and (1-4) A structural unit derived from an unsaturated monomer and different from the structural units (1-1) to (1-3), wherein the copolymer A-1 includes a basis based on the total weight of the copolymer A-1 The structural units (1-1), (1-2), (1-3), and (1-4) in the range of 1 to 40 wt%, 5 to 45 wt%, 1 to 40 wt%, and 15 to 70 wt%, respectively. ); And the copolymer A-2 comprises (1-5) a structural unit derived from an unsaturated monomer containing a carboxyl group, (1-6) a structural unit derived from an unsaturated monomer containing a phenolic hydroxyl group, and ( 1-7) Structural units derived from unsaturated monomers and different from the structural units (1-5) and (1-6), wherein the copolymer A-2 comprises the total of the copolymer A-2 The weight is based on the structural unit (1-5) in the range of 1 to 40 wt%, 5 to 70 wt%, and 15 to 70 wt%, respectively. (1-6) and (1-7), and wherein the mixture of the copolymer A-1 and the copolymer A-2 includes the copolymer A-1 and the copolymer A-1 in a weight ratio of 10 to 90:90 to 10 The copolymer A-2; and (2) a diazoquinone-based photoactive compound, wherein the diazoquinone-based photoactive compound is 0.5 to 40 parts by weight based on the total weight of the mixture of the copolymer. content. 如申請專利範圍第1項所述之光敏樹脂組成物,其中,該含苯基之不飽和單體係苯乙烯。The photosensitive resin composition according to item 1 of the patent application scope, wherein the phenyl-containing unsaturated monosystem styrene. 如申請專利範圍第1項所述之光敏樹脂組成物,其中,該結構單元(1-6)係藉由式(I)表示:其中,R1係氫、C1-6烷基、鹵素或氰基;R2係C1-6烷基、a係0至4之整數,且當a為2或更大之整數時,該複數個R2係彼此相同或不同;b係1至5之整數,且a與b之和係1至5之整數;以及Y係單鍵或C1-6伸烷基,其中,該烷基及伸烷基係視需要經至少一個鹵素、硝基、C1-6烷氧基或C6-12芳基取代。The photosensitive resin composition according to item 1 of the scope of patent application, wherein the structural unit (1-6) is represented by formula (I): Wherein R 1 is hydrogen, C 1-6 alkyl, halogen or cyano; R 2 is C 1-6 alkyl, a is an integer of 0 to 4, and when a is an integer of 2 or more, the A plurality of R 2 are the same or different from each other; b is an integer from 1 to 5 and the sum of a and b is an integer from 1 to 5; and Y is a single bond or a C 1-6 alkylene group, wherein the alkyl group And alkylene is optionally substituted with at least one halogen, nitro, C 1-6 alkoxy or C 6-12 aryl. 如申請專利範圍第1項所述之光敏樹脂組成物,其中,該重氮醌系光活性化合物係具有式(II)之結構化合物:其中,R係各自獨立為氫、式(IIa)之取代基或式(IIb)之取代基,惟至少一個R係式(IIa)之取代基或式(IIb)之取代基: The photosensitive resin composition according to item 1 of the scope of patent application, wherein the diazoquinone-based photoactive compound is a compound having a structure of formula (II): Among them, R is each independently hydrogen, a substituent of formula (IIa) or a substituent of formula (IIb), but at least one R is a substituent of formula (IIa) or a substituent of formula (IIb): 如申請專利範圍第1項所述之光敏樹脂組成物,其復包含環氧系化合物,該化合物係包含式(III)之重複單元:其中,R5係氫或C1-4烷基;以及R6係C1-10伸烷基、伸苯基、C3-10伸環烷基、C3-10伸雜環烷基、或C2-10伸雜烷基,其中,該R6係視需要經至少一個羥基取代。The photosensitive resin composition according to item 1 of the scope of the patent application, which contains an epoxy-based compound, the compound containing a repeating unit of formula (III): Wherein R 5 is hydrogen or C 1-4 alkyl; and R 6 is C 1-10 alkylene, phenylene, C 3-10 cycloalkyl, C 3-10 heterocycloalkyl, or C 2-10 heteroalkyl, wherein the R 6 is optionally substituted with at least one hydroxyl group.
TW103112975A 2013-04-08 2014-04-08 Positive-type photosensitive resin composition and cured film prepared therefrom TWI629559B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
??10-2013-0038090 2013-04-08
KR1020130038090A KR102172818B1 (en) 2013-04-08 2013-04-08 Positive-type photosensitive resin composition and cured film prepared therefrom

Publications (2)

Publication Number Publication Date
TW201504752A TW201504752A (en) 2015-02-01
TWI629559B true TWI629559B (en) 2018-07-11

Family

ID=51993071

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103112975A TWI629559B (en) 2013-04-08 2014-04-08 Positive-type photosensitive resin composition and cured film prepared therefrom

Country Status (2)

Country Link
KR (1) KR102172818B1 (en)
TW (1) TWI629559B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102674721B1 (en) * 2018-11-29 2024-06-14 듀폰스페셜티머터리얼스코리아 유한회사 Positive-type photosensitive resin composition and cured film using same

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001042518A (en) * 1999-07-27 2001-02-16 Sumitomo Bakelite Co Ltd Positive photosensitive resin composition and semiconductor device using same
JP2004286968A (en) * 2003-03-20 2004-10-14 Toray Ind Inc Positive radiation-sensitive composition
JP2006285035A (en) * 2005-04-01 2006-10-19 Jsr Corp Negative radiation sensitive resin composition

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4207604B2 (en) 2003-03-03 2009-01-14 Jsr株式会社 Radiation-sensitive resin composition, interlayer insulating film and microlens, and method for forming them
JP2006259083A (en) 2005-03-16 2006-09-28 Tokyo Ohka Kogyo Co Ltd Photosensitive resin composition for interlayer insulation film
JP5110279B2 (en) * 2007-12-20 2012-12-26 Jsr株式会社 Radiation sensitive resin composition, interlayer insulating film and method for producing the same
JP5343664B2 (en) * 2009-03-30 2013-11-13 Jsr株式会社 Radiation-sensitive resin composition, organic EL display element partition and insulating film, and method for forming the same
JP5771944B2 (en) * 2010-10-18 2015-09-02 Jsr株式会社 Manufacturing method of color filter

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001042518A (en) * 1999-07-27 2001-02-16 Sumitomo Bakelite Co Ltd Positive photosensitive resin composition and semiconductor device using same
JP2004286968A (en) * 2003-03-20 2004-10-14 Toray Ind Inc Positive radiation-sensitive composition
JP2006285035A (en) * 2005-04-01 2006-10-19 Jsr Corp Negative radiation sensitive resin composition

Also Published As

Publication number Publication date
KR20140121630A (en) 2014-10-16
TW201504752A (en) 2015-02-01
KR102172818B1 (en) 2020-11-02

Similar Documents

Publication Publication Date Title
TWI702472B (en) Positive-type photosensitive resin composition and cured film prepared therefrom
JP7240847B2 (en) Photosensitive resin composition and cured film prepared therefrom
JP2021009361A (en) Positive-type photosensitive resin composition and cured film prepared therefrom
TWI677759B (en) Photosensitive resin composition, and insulating film and electric device using same
JP2019120932A (en) Positive-type photosensitive resin composition and cured film prepared therefrom
TW201807071A (en) Photosensitive resin composition and cured film prepared therefrom
JP2020109509A (en) Positive type photosensitive composition and cured film using the same
TWI773690B (en) Photosensitive resin composition and cured film prepared therefrom
TWI629559B (en) Positive-type photosensitive resin composition and cured film prepared therefrom
US20230109843A1 (en) Photosensitive resin composition and cured film prepared therefrom
US10890846B2 (en) Photosensitive resin composition and cured film prepared therefrom
TWI832930B (en) Positive-type photosensitive resin composition and cured film prepared therefrom
KR102239543B1 (en) Positive-type photosensitive resin composition and cured film prepared therefrom
KR102183741B1 (en) Positive-type photosensitive resin composition and cured film prepared therefrom
TWI722039B (en) Photosensitive resin composition and cured film prepared therefrom
KR102069746B1 (en) Positive-type photosensitive resin composition and cured film prepared therefrom
KR101976210B1 (en) Positive-type photosensitive resin composition and insulating film using the same
KR102016443B1 (en) Positive-type photosensitive resin composition and cured film prepared therefrom
KR102057338B1 (en) Positive-type photosensitive resin composition and cured film prepared therefrom
TW202325789A (en) Positive-type photosensitive resin composition and cured film prepared therefrom