TWI627840B - Array antenna detection correction method - Google Patents

Array antenna detection correction method Download PDF

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TWI627840B
TWI627840B TW105140743A TW105140743A TWI627840B TW I627840 B TWI627840 B TW I627840B TW 105140743 A TW105140743 A TW 105140743A TW 105140743 A TW105140743 A TW 105140743A TW I627840 B TWI627840 B TW I627840B
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tested
offset
signal
phase
antenna unit
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TW105140743A
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TW201822482A (en
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Chu Hao Cheng
Po Chun Chang
Liang Ju Huang
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Nat Chung Shan Inst Science & Tech
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Abstract

本發明係為一種陣列天線檢測校正方法,其先透過信號分析器分析增益大小進行增益衰減補償,再利用一直流偏移產生器產生一組已知直流偏移量加入信號中,藉此與原始信號於接收端比對可得相位偏移量進行天線校正。藉由此方法來降低運算複雜度及加快校正速度。 The invention is an array antenna detection and correction method, which firstly analyzes the gain size through the signal analyzer to perform gain attenuation compensation, and then uses a DC offset generator to generate a set of known DC offsets to be added to the signal, thereby The signal is corrected at the receiving end by comparing the available phase offsets. This method is used to reduce the computational complexity and speed up the correction.

Description

陣列天線檢測校正方法 Array antenna detection correction method

本發明係與無線通信技術有關,特別係指一種用於檢測天線故障與校正之陣列天線檢測校正方法。 The invention relates to wireless communication technology, in particular to an array antenna detection and correction method for detecting antenna faults and corrections.

陣列天線為現代無線通信與雷達技術常用之裝置,特別是在無線通信方面,為因應下世代接取系統技術,各國民用通訊研究機構的初步技術共通點,皆採用30GHz以上毫米波(Millimeter)頻段、陣列天線、大規模多重輸入多重輸出(Massive MIMO)及波束控制(Beamsteering)之技術方案,將完全顛覆現有射頻(RF)技術的設計思維。對陣列天線而言,當T/R模組發生老化或其他原因失效時,通常無法即時回原廠進行遠場測試系統,為在現場狀況中先行檢測故障、並降低相關檢測校正成本,經由分析驗證參考天線單元與陣列天線單元之關聯性,藉此對系統進行相位調變校正是一種可以提供快速、簡單、低成本、易於實現的可行校正方式。 The array antenna is a commonly used device for modern wireless communication and radar technology, especially in the field of wireless communication. In order to meet the next-generation access system technology, the preliminary technical common points of the various national communication research institutions are all using the millimeter wave (Millimeter) frequency band above 30 GHz. , array antennas, massive multiple input multiple output (Massive MIMO) and beam steering (Beamsteering) technology solutions, will completely subvert the design thinking of existing radio frequency (RF) technology. For the array antenna, when the T/R module is aging or other reasons fail, it is usually impossible to return to the original factory for the far-field test system, in order to detect the fault first in the field condition and reduce the related detection and correction cost. Verifying the correlation between the reference antenna unit and the array antenna unit, thereby performing phase modulation correction on the system is a feasible correction method that can provide fast, simple, low cost and easy implementation.

為解決先前技術之缺點,本發明係提供一種陣列天線檢測校正方法,其先透過信號分析器分析增益大小進行增益衰減補償,再利用一直流偏移產生器產生一組已知直流 偏移量加入信號中,藉此與原始信號於接收端比對可得相位偏移量進行天線校正。藉由此方法來降低運算複雜度及加快校正速度。 In order to solve the shortcomings of the prior art, the present invention provides an array antenna detection and correction method, which first analyzes the gain magnitude through the signal analyzer to perform gain attenuation compensation, and then uses the DC offset generator to generate a set of known DCs. The offset is added to the signal, whereby the phase offset is compared with the original signal at the receiving end for antenna correction. This method is used to reduce the computational complexity and speed up the correction.

為達上述目的及其他目的,本發明提出一種陣列天線檢測校正方法,用於檢測與校正一具有複數待測天線單元之陣列天線,其步驟係包括:(A)一信號產生器提供增益測試信號至一待測天線單元,該待測天線單元發射將該增益測試信號至一參考天線單元;(B)該參考天線單元將接收到之增益測試信號傳至一信號分析器,以進行該待測天線單元之增益分析,並建立一增益校正表;(C)該信號產生器提供相位測試信號,將該相位測試信號加入直流偏移量,再與未加入直流偏移量之相位測試信號一同傳至該待測天線單元;(D)該待測天線單元發射該具直流偏移量與不具直流偏移量之相位測試信號至該參考天線單元,該參考天線單元將接收到之相位測試信號傳至該信號分析器,以獲得該參考天線單元之相位偏移量,並建立一相位校正表;(E)該信號產生器產生最終測試信號,在該待測天線單元發射該最終測試信號前,依據該增益校正表對該待測天線單元進行補償/衰減增益、依據該相位校正表對該待測天線單元進行相位校正;(F)對另一個待測天線單元重複步驟(A)~(E)之動作,直到所有待測天線單元完成檢測校正。 To achieve the above and other objects, the present invention provides an array antenna detection and correction method for detecting and correcting an array antenna having a plurality of antenna elements to be tested, the steps of which include: (A) a signal generator providing a gain test signal Up to the antenna unit to be tested, the antenna unit to be tested transmits the gain test signal to a reference antenna unit; (B) the reference antenna unit transmits the received gain test signal to a signal analyzer to perform the test The gain analysis of the antenna unit and establishing a gain correction table; (C) the signal generator provides a phase test signal, the phase test signal is added to the DC offset, and then transmitted together with the phase test signal without the DC offset added Up to the antenna unit to be tested; (D) the antenna unit to be tested transmits the phase test signal having a DC offset and no DC offset to the reference antenna unit, and the reference antenna unit transmits the received phase test signal Go to the signal analyzer to obtain a phase offset of the reference antenna unit and establish a phase correction table; (E) the signal generator generates a final measurement a signal, before the final test signal is transmitted by the antenna unit to be tested, performing compensation/attenuation gain on the antenna unit to be tested according to the gain correction table, and performing phase correction on the antenna unit to be tested according to the phase correction table; (F) Repeat steps (A) to (E) for the other antenna unit to be tested until all the antenna units to be tested complete the detection correction.

本發明之一實施例中,應用本發明之方法之陣列 天線檢測校正系統係具有一信號產生器、一直流偏移產生器、一信號分析器、一升/降頻電路、複數個發射/接收電路及一陣列天線;該陣列天線係由複數個待測天線單元組成,該些發射/接收電路係具有控制晶片,每一發射/接收電路分別對應一待測天線單元、以控制該些待測天線單元發射或接收信號;該發射/接收電路係具有移相器,以改變或校正該待測天線單元之相位。 In an embodiment of the invention, an array of methods of the invention is applied The antenna detection and correction system has a signal generator, a DC offset generator, a signal analyzer, a one-liter/down-frequency circuit, a plurality of transmitting/receiving circuits, and an array antenna; the array antenna is composed of a plurality of samples to be tested An antenna unit, wherein the transmitting/receiving circuits have control chips, and each of the transmitting/receiving circuits respectively corresponds to an antenna unit to be tested to control the antenna units to be tested to transmit or receive signals; the transmitting/receiving circuit has a shift a phaser to change or correct the phase of the antenna unit to be tested.

本發明之一實施例中,該陣列天線檢測校正系統更包括一參考天線單元,該參考天線單元係用於接收該些待測天線單元發出之信號並回傳給該信號分析器,以對該待測天線單元之性能現況進行檢測與校正。 In an embodiment of the present invention, the array antenna detection and correction system further includes a reference antenna unit, and the reference antenna unit is configured to receive signals sent by the antenna units to be tested and transmit the signals back to the signal analyzer to The performance of the antenna unit to be tested is detected and corrected.

本發明之一實施例中,該陣列天線檢測校正系統更包括一微處理器,該微處理器係用於控制該陣列天線檢測校正系統各元件之動作,並根據接收到之增益測試信號建立該待測天線單元之增益校正表、以及根據接收到之相位測試信號建立該待測天線單元之相位校正表。 In an embodiment of the present invention, the array antenna detection and correction system further includes a microprocessor for controlling the operation of each component of the array antenna detection correction system, and establishing the signal according to the received gain test signal. a gain correction table of the antenna unit to be tested, and a phase correction table of the antenna unit to be tested is established according to the received phase test signal.

本發明之另一實施例中,該陣列天線檢測校正方法之步驟係包括:微處理器發出開啟信號給其中一組發射/接收電路,開啟一組待測天線單元及該參考天線單元以準備進行檢測校正,其餘待測天線單元則關閉;該微處理器控制該信號產生器產生m組增益測試信號至該待測天線單元,該待測天線單元發射該m組增益測試信號給該參考天線單元;該參考 天線單元接收到該些增益測試信號後,回傳至該信號分析器,該信號分析器對接收到之信號進行增益分析後回傳給該微處理器,該微處理器建立該待測天線單元之增益校正表;該微處理器控制該信號產生器產生n組相位測試信號,將該n組相位測試信號同時傳至該升/降頻電路與該直流偏移產生器,該直流偏移產生器將該n組相位測試信號加入直流偏移量、再將該些具直流偏移量之相位測試信號傳至該升/降頻電路;該升/降頻電路將該些有直流偏移量與無直流偏移量之相位測試信號經由該待測天線單元發送至該參考天線單元,同時依據該增益校正表對該待測天線單元進行補償/衰減增益;該參考天線單元將接收到之該些相位測試信號傳至該信號分析器,得到兩組I、Q值(分別是有直流偏移與無直流偏移),該微處理器比較該兩組I、Q值得到該待測天線單元之相位偏移量,建立該待測天線單元之相位校正表;該微處理器控制信號產生器產出最終測試信號給該待測天線單元,在該待測天線單元發射信號前,該升/降頻電路依據該增益校正表對該待測天線單元進行補償/衰減增益、該發射/接收電路根據該相位校正表透過該移相器對該待測天線單元進行相位校正,至此完成該待測天線單元之校正動作;完成一待測天線單元之校正後,依序對其他待測天線單元進行檢測與校正,最後完成對全待測天線單元之校正。 In another embodiment of the present invention, the step of detecting the alignment method of the array antenna includes: the microprocessor sends an enable signal to one of the transmitting/receiving circuits, and turns on a group of antenna units to be tested and the reference antenna unit to prepare for Detecting the correction, and the remaining antenna units to be tested are turned off; the microprocessor controls the signal generator to generate m sets of gain test signals to the antenna unit to be tested, and the antenna unit to be tested transmits the m sets of gain test signals to the reference antenna unit ; reference After receiving the gain test signals, the antenna unit returns to the signal analyzer, and the signal analyzer performs gain analysis on the received signal and transmits the signal back to the microprocessor, and the microprocessor establishes the antenna unit to be tested. a gain correction table; the microprocessor controls the signal generator to generate n sets of phase test signals, and simultaneously transmits the n sets of phase test signals to the up/down circuit and the DC offset generator, the DC offset generation The n sets of phase test signals are added to the DC offset, and the phase test signals having the DC offset are transmitted to the up/down circuit; the rise/down circuits have DC offsets And a phase test signal with no DC offset is sent to the reference antenna unit via the antenna unit to be tested, and the antenna unit to be tested is compensated/attenuated according to the gain correction table; the reference antenna unit will receive the signal The phase test signals are transmitted to the signal analyzer to obtain two sets of I and Q values (both DC offset and no DC offset), and the microprocessor compares the two sets of I and Q values to obtain the antenna unit to be tested. Phase a bit offset, the phase correction table of the antenna unit to be tested is established; the microprocessor control signal generator outputs a final test signal to the antenna unit to be tested, and the rise/fall is performed before the antenna unit to be tested transmits a signal The frequency circuit performs a compensation/attenuation gain on the antenna unit to be tested according to the gain correction table, and the transmitting/receiving circuit performs phase correction on the antenna unit to be tested through the phase shifter according to the phase correction table, thereby completing the antenna to be tested. Correction action of the unit; after completing the correction of the antenna unit to be tested, the other antenna units to be tested are sequentially detected and corrected, and finally the correction of the entire antenna unit to be tested is completed.

本發明之一實施例中,其中m組增益測試信號之 m範圍可為高斯機率分布等隨機分布方法決定,或可根據實際校正速度與精準度需求由使用者制定。 In an embodiment of the invention, wherein m sets of gain test signals are The m range can be determined by a random distribution method such as a Gaussian probability distribution, or can be determined by the user according to the actual calibration speed and accuracy requirements.

本發明之一實施例中,該信號分析器根據該參考天線單元接收到之增益測試信號進行該待測天線單元之增益分析,並計算出平均值以建立該待測天線單元之增益校正表,其中取平均值之方法可用均方根或其他方式。 In an embodiment of the present invention, the signal analyzer performs a gain analysis of the antenna unit to be tested according to the gain test signal received by the reference antenna unit, and calculates an average value to establish a gain correction table of the antenna unit to be tested. The method of averaging may be root mean square or other means.

本發明之一實施例中,該參考天線單元接收到之增益測試信號為兩組波形,取其峰值相減可得其增益值,並存於增益校正表中。 In an embodiment of the present invention, the gain test signal received by the reference antenna unit is two sets of waveforms, and the peak value is subtracted to obtain the gain value, and is stored in the gain correction table.

本發明之一實施例中,該直流偏移產生器由一控制器控制產生指定之直流偏移量;該直流偏移產生器係為電壓位準移相器、偏壓器或其他種類之電壓偏移裝置。 In an embodiment of the invention, the DC offset generator is controlled by a controller to generate a specified DC offset; the DC offset generator is a voltage level shifter, a biaser or other type of voltage Offset device.

本發明之一實施例中,其中n組校正測試信號之n範圍可為高斯機率分布等隨機分布方法決定,或可根據實際校正速度與精準度需求由使用者制定。 In an embodiment of the present invention, the n range of the n sets of calibration test signals may be determined by a random distribution method such as a Gaussian probability distribution, or may be determined by the user according to actual correction speed and accuracy requirements.

本發明之一實施例中,其中該直流偏移產生器產生之直流偏移量信號需為數位調變之信號,可為QPSK、8PSK、APSK或其他種類之數位調變信號。 In an embodiment of the invention, the DC offset signal generated by the DC offset generator needs to be a digitally modulated signal, which may be QPSK, 8PSK, APSK or other kinds of digital modulated signals.

本發明之一實施例中,該參考天線單元接收到由該待測天線單元發射之相位測試信號(包含具直流偏移量及不具直流偏移量之兩種相位測試信號)後再傳至該信號分析器,得星座圖的兩圓,其一有直流偏移、其一沒有。接著透過計 算,共可得n組相位偏移量,並取其平均,再將相位偏移量建立相位校正表。取該平均值的方法可為加權平均或其他方式。 In an embodiment of the present invention, the reference antenna unit receives the phase test signal (including two phase test signals having a DC offset and no DC offset) transmitted by the antenna unit to be tested, and then transmits the phase test signal to the antenna test unit. The signal analyzer has two circles of the constellation, one of which has a DC offset and one of which has no. Then through the meter Calculate, a total of n sets of phase offsets can be obtained, and the average is taken, and then the phase offset is established to establish a phase correction table. The method of taking the average may be a weighted average or other means.

本發明之一實施例中,建立該待測天線單元之增益校正表與相位校正表後,在該待測天線單元執行工作(發射信號)前,根據該增益校正表與相位校正表,於該陣列天線系統之升/降頻電路對該待測天線單元進行增益衰減/補償,並在發射/接收電路內透過移相器來進行相位校正,便可完成該天線之自校。 In an embodiment of the present invention, after the gain correction table and the phase correction table of the antenna unit to be tested are established, before the operation (transmitting signal) of the antenna unit to be tested is performed, according to the gain correction table and the phase correction table, The up/down circuit of the array antenna system performs gain attenuation/compensation on the antenna unit to be tested, and performs phase correction through the phase shifter in the transmitting/receiving circuit to complete the self-calibration of the antenna.

以上之概述與接下來的詳細說明及附圖,皆是為了能進一步說明本發明達到預定目的所採取的方式、手段及功效。而有關本發明的其他目的及優點,將在後續的說明及圖示中加以闡述。 The above summary, the following detailed description and the accompanying drawings are intended to further illustrate the manner, the Other objects and advantages of the present invention will be described in the following description and drawings.

S01~S06‧‧‧方法步驟 S01~S06‧‧‧ method steps

S11~S18‧‧‧方法步驟 S11~S18‧‧‧ method steps

11‧‧‧信號產生器 11‧‧‧Signal Generator

12‧‧‧直流偏移產生器 12‧‧‧DC offset generator

13‧‧‧信號分析器 13‧‧‧Signal Analyzer

14‧‧‧升/降頻電路 14‧‧‧L/D frequency circuit

15‧‧‧微處理器 15‧‧‧Microprocessor

16‧‧‧發射/接收電路 16‧‧‧transmit/receive circuit

17‧‧‧陣列天線 17‧‧‧Array antenna

21‧‧‧倍頻器 21‧‧‧Multiplier

22‧‧‧控制晶片 22‧‧‧Control wafer

23‧‧‧數位控制放大器 23‧‧‧Digital Control Amplifier

24‧‧‧耦合器 24‧‧‧ Coupler

25‧‧‧功率偵測器 25‧‧‧Power Detector

31‧‧‧控制晶片 31‧‧‧Control chip

32‧‧‧天線端 32‧‧‧ antenna end

33‧‧‧功率分配器 33‧‧‧Power splitter

41‧‧‧陣列天線 41‧‧‧Array antenna

411‧‧‧待測天線 411‧‧‧ antenna to be tested

42‧‧‧參考天線 42‧‧‧Reference antenna

43‧‧‧發射/接收電路 43‧‧‧transmit/receive circuit

44‧‧‧升/降頻電路 44‧‧‧L/D frequency circuit

45‧‧‧直流偏移產生器 45‧‧‧DC offset generator

46‧‧‧訊號產生器 46‧‧‧Signal Generator

47‧‧‧訊號分析器 47‧‧‧Signal Analyzer

48‧‧‧計算機 48‧‧‧ computer

圖1係為本發明之陣列天線檢測校正方法步驟圖。 1 is a step diagram of a method for detecting and correcting an array antenna of the present invention.

圖2係為本發明所應用之陣列天線檢測校正系統架構示意圖。 2 is a schematic structural diagram of an array antenna detection and correction system applied to the present invention.

圖3係為本發明之陣列天線檢測校正方法另一實施例步驟圖。 3 is a flow chart showing another embodiment of the array antenna detection and correction method of the present invention.

圖4係為本發明之升/降頻電路實施例之配置架構圖。 4 is a configuration diagram of an embodiment of a rising/downsizing circuit of the present invention.

圖5係為本發明之發射/接收電路實施例之配置架構圖。 FIG. 5 is a configuration diagram of an embodiment of a transmitting/receiving circuit of the present invention.

圖6係為本發明之陣列天線檢測校正方法其中一實施例之星座圖。 FIG. 6 is a constellation diagram of an embodiment of the array antenna detection and correction method of the present invention.

圖7係為應用本發明之陣列天線檢測校正方法之陣列天線檢 測校正系統另一實施例示意圖。 7 is an array antenna inspection using the array antenna detection and correction method of the present invention. A schematic diagram of another embodiment of the calibration system.

圖8係為本發明之天線校正表矩陣(包含該增益校正表與該相位校正表)與陣列天線之比較示意圖。 FIG. 8 is a schematic diagram of comparison of an antenna correction table matrix (including the gain correction table and the phase correction table) and an array antenna according to the present invention.

以下係藉由特定的具體實例說明本發明之實施方式,熟悉此技藝之人士可由本說明書所揭示之內容輕易地瞭解本發明之其他優點與功效。 The embodiments of the present invention are described below by way of specific examples, and those skilled in the art can readily appreciate other advantages and functions of the present invention from the disclosure herein.

本發明之陣列天線檢測校正方法係應用於無線通訊、軍民用雷達之陣列天線系統,用於檢測與校正一具有複數待測天線單元之陣列天線,圖1係為本發明之陣列天線檢測校正方法步驟圖,如圖所示,係包括:(A)一信號產生器提供增益測試信號至一待測天線單元,該待測天線單元發射將該增益測試信號至一參考天線單元S01;(B)該參考天線單元將接收到之增益測試信號傳至一信號分析器,以進行該待測天線單元之增益分析,並建立一增益校正表S02;(C)該信號產生器提供相位測試信號,將該相位測試信號加入直流偏移量,再與未加入直流偏移量之相位測試信號一同傳至該待測天線單元S03;(D)該待測天線單元發射該具直流偏移量與不具直流偏移量之相位測試信號至該參考天線單元,該參考天線單元將接收到之相位測試信號傳至該信號分析器,以獲得該參考天線單元之相位偏移量,並建立一相位校正表S04;(E)該信號產生器產生最終測試信號,在該待測天線單元發射該 最終測試信號前,依據該增益校正表對該待測天線單元進行補償/衰減增益、依據該相位校正表對該待測天線單元進行相位校正S05;(F)對另一個待測天線單元重複步驟(A)~(E)之動作,直到所有待測天線單元完成檢測校正S06。 The array antenna detection and correction method of the present invention is applied to an array antenna system for wireless communication, military and civilian radar, and is used for detecting and correcting an array antenna having a plurality of antenna units to be tested, and FIG. 1 is an array antenna detection and correction method of the present invention. The step diagram, as shown in the figure, includes: (A) a signal generator providing a gain test signal to an antenna unit to be tested, the antenna unit to be tested transmitting the gain test signal to a reference antenna unit S01; (B) The reference antenna unit transmits the received gain test signal to a signal analyzer for performing gain analysis of the antenna unit to be tested, and establishes a gain correction table S02; (C) the signal generator provides a phase test signal, The phase test signal is added with a DC offset, and then transmitted to the antenna unit S03 to be tested together with the phase test signal without the DC offset added; (D) the antenna unit to be tested transmits the DC offset and does not have a DC Offset phase test signal to the reference antenna unit, the reference antenna unit transmits the received phase test signal to the signal analyzer to obtain the reference day a phase shift amount of the line unit, and establishing a phase correction table S04; (E) the signal generator generates a final test signal, and the antenna unit to be tested transmits the Before the final test signal, the compensation/attenuation gain of the antenna unit to be tested is performed according to the gain correction table, and the antenna unit to be tested is subjected to phase correction S05 according to the phase correction table; (F) repeating steps for another antenna unit to be tested The action of (A)~(E) until all the antenna elements to be tested complete the detection correction S06.

本發明之一實施例中,本發明所應用之陣列天線檢測校正系統架構示意圖如圖2所示,該陣列天線系統係具有一信號產生器11、一直流偏移產生器12、一信號分析器13、一升/降頻電路14、一微處理器15、複數個發射/接收電路16及一陣列天線17;該陣列天線係由複數個待測天線單元組成,該些發射/接收電路係具有控制晶片,每一發射/接收電路分別對應一待測天線單元、以控制該些待測天線單元發射或接收信號;該發射/接收電路係具有移相器(圖未示)以改變或校正該待測天線單元之相位。本發明所應用之陣列天線系統更包括一參考天線單元(圖未示),該參考天線單元係用於接收該些待測天線單元發出之信號並回傳給該信號分析器,以對該待測天線單元之性能現況進行檢測與校正。 In an embodiment of the present invention, a schematic diagram of an array antenna detection and correction system used in the present invention is shown in FIG. 2. The array antenna system has a signal generator 11, a DC offset generator 12, and a signal analyzer. 13. A liter/down circuit 14, a microprocessor 15, a plurality of transmitting/receiving circuits 16 and an array antenna 17; the array antenna is composed of a plurality of antenna units to be tested, and the transmitting/receiving circuits have Controlling the chip, each of the transmitting/receiving circuits respectively corresponding to an antenna unit to be tested to control the transmitting or receiving signals of the antenna unit to be tested; the transmitting/receiving circuit has a phase shifter (not shown) to change or correct the The phase of the antenna unit to be tested. The array antenna system to which the present invention is applied further includes a reference antenna unit (not shown) for receiving signals from the antenna units to be tested and transmitting back signals to the signal analyzer to The performance of the antenna unit is tested and corrected.

本發明之陣列天線檢測校正方法另一實施例步驟圖如圖3所示(元件組成關係請參閱圖2),該步驟係包括:微處理器發出開啟信號給其中一組發射/接收電路,開啟一組待測天線單元及該參考天線單元以準備進行檢測校正,其餘待測天線單元則關閉S11;該微處理器控制該信號產生器產生m組增益測試信號至該待測天線單元,該待測天線單元發射該m 組增益測試信號給該參考天線單元S12;該參考天線單元接收到該些增益測試信號後,回傳至該信號分析器,該信號分析器對接收到之信號進行增益分析後回傳給該微處理器,該微處理器建立該待測天線單元之增益校正表S13;該微處理器控制該信號產生器產生n組相位測試信號,將該n組相位測試信號同時傳至該升/降頻電路與該直流偏移產生器,該直流偏移產生器將該n組相位測試信號加入直流偏移量、再將該些具直流偏移量之相位測試信號傳至該升/降頻電路S14;該升/降頻電路將該些有直流偏移量與無直流偏移量之相位測試信號經由該待測天線單元發送至該參考天線單元,同時依據該增益校正表對該待測天線單元進行補償/衰減增益S15;該參考天線單元將接收到之該些相位測試信號傳至該信號分析器,得到兩組I、Q值(分別是有直流偏移與無直流偏移),該微處理器比較該兩組I、Q值得到該待測天線單元之相位偏移量,建立該待測天線單元之相位校正表S16;該微處理器控制信號產生器產出最終測試信號給該待測天線單元,在該待測天線單元發射信號前,該升/降頻電路依據該增益校正表對該待測天線單元進行補償/衰減增益、該發射/接收電路根據該相位校正表透過該移相器對該待測天線單元進行相位校正,至此完成該待測天線單元之校正動作S17;完成一待測天線單元之校正後,依序對其他待測天線單元進行檢測與校正,最後完成對全待測天線單元之校正S18。 Another embodiment step of the array antenna detection and correction method of the present invention is shown in FIG. 3 (refer to FIG. 2 for the component composition relationship), and the step includes: the microprocessor sends an open signal to one of the transmitting/receiving circuits, and turns on. a set of antenna units to be tested and the reference antenna unit are ready for detection and correction, and the remaining antenna units to be tested are closed to S11; the microprocessor controls the signal generator to generate m sets of gain test signals to the antenna unit to be tested, The antenna unit transmits the m The group gain test signal is sent to the reference antenna unit S12; after receiving the gain test signals, the reference antenna unit returns to the signal analyzer, and the signal analyzer performs gain analysis on the received signal and returns the signal to the micro a processor, the microprocessor establishes a gain correction table S13 of the antenna unit to be tested; the microprocessor controls the signal generator to generate n sets of phase test signals, and simultaneously transmits the n sets of phase test signals to the up/down frequency a circuit and the DC offset generator, the DC offset generator adds the n sets of phase test signals to the DC offset, and transmits the DC offset phase test signals to the up/down circuit S14 The rising/downsizing circuit sends the phase test signal having the DC offset and the DC offset to the reference antenna unit via the antenna unit to be tested, and the antenna unit to be tested according to the gain correction table Performing a compensation/attenuation gain S15; the reference antenna unit transmits the received phase test signals to the signal analyzer to obtain two sets of I and Q values (both DC offset and no DC offset, respectively). The microprocessor compares the two sets of I and Q values to obtain a phase offset of the antenna unit to be tested, and establishes a phase correction table S16 of the antenna unit to be tested; the microprocessor control signal generator outputs a final test signal to the The antenna unit to be tested, before the signal to be tested transmits a signal, the up/down circuit performs a compensation/attenuation gain on the antenna unit to be tested according to the gain correction table, and the transmitting/receiving circuit transmits the signal according to the phase correction table. The phase shifter performs phase correction on the antenna unit to be tested, and thus completes the correcting action S17 of the antenna unit to be tested; after completing the correction of the antenna unit to be tested, the other antenna units to be tested are sequentially detected and corrected, and finally completed. Correction S18 for the entire antenna unit to be tested.

本發明之陣列天線檢測校正方法其中一實施例中,該升/降頻電路實施例之配置架構圖如圖4所示,該升/降頻電路內含一振盪器產生一參考時脈,而參考時脈首先經由倍頻器21升頻提高頻率,升頻完的時脈再由功率分配器分成兩條路徑。每條路徑再由放大器放大信號,最後產生本地信號分別提供發射與接收路徑的混頻器。升/降頻電路發射與接收路徑由電路內部的控制晶片22發送控制信號至開關切換。在發射的路徑中,來自信號產生器或直流偏移產生器(圖未示)的信號首先透過放大器與數位控制放大器(DCA)23提高增益,通過帶通濾波器濾波後,進入混頻器與本地信號結合,再經由一連串的驅動放大器與功率放大器輸出射頻信號。最後射頻信號透過耦合器(coupler)24分成兩條路徑,第一條路徑傳送至開關並流經濾波器再到功率分配器,第二條路徑首先來到功率偵測器(PD)25量測信號大小,並將訊息傳回至升/降頻電路內部的控制晶片22,根據發射信號增益以及功率強度需求調整數位控制放大器輸出的增益大小。在接收路徑中,來自功率分配器接收到的射頻信號依序流經濾波器與開關後,再透過數個串接的低雜訊放大器放大信號,由可程式化增益放大器(VGA)控制增益進入混頻器與本地信號結合去除載波,最後通過帶通濾波器與放大器還原成原始信號。信號透過耦合器24分成兩條路徑,第一條路徑直接將信號傳送至信號分析器(圖未示),第二條路徑首先先來到功率偵測器 (PD)25量測信號大小,並將訊息傳回至升/降頻電路內部的控制晶片,根據接收信號增益與功率強度需求調整可程式化增益放大器輸出的增益大小。 The array antenna detection and correction method of the present invention, in one embodiment, the configuration diagram of the embodiment of the up/down frequency circuit is as shown in FIG. 4, and the up/down circuit includes an oscillator to generate a reference clock. The reference clock is first up-converted by the frequency multiplier 21 to increase the frequency, and the up-clocked clock is divided into two paths by the power splitter. Each path is then amplified by an amplifier, and finally a local mixer is provided to provide a mixer for the transmit and receive paths. The transmit/receive circuit transmit and receive paths are transmitted by the control chip 22 inside the circuit to the switch switch. In the path of the transmission, the signal from the signal generator or DC offset generator (not shown) is first boosted by the amplifier and digitally controlled amplifier (DCA) 23, filtered by the bandpass filter, and then into the mixer. The local signals are combined and the RF signal is output via a series of driver amplifiers and power amplifiers. Finally, the RF signal is split into two paths through a coupler 24, the first path is transmitted to the switch and flows through the filter to the power splitter, and the second path first comes to the power detector (PD) 25 The signal is sized and passed back to the control chip 22 inside the up/down circuit to adjust the gain of the digital control amplifier output based on the transmit signal gain and power strength requirements. In the receiving path, the RF signal received from the power splitter sequentially flows through the filter and the switch, and then amplifies the signal through a plurality of serially connected low noise amplifiers, and the gain is controlled by a programmable gain amplifier (VGA). The mixer combines with the local signal to remove the carrier and finally restores the original signal through a bandpass filter and amplifier. The signal is split into two paths through the coupler 24, the first path directly transmits the signal to the signal analyzer (not shown), and the second path first comes to the power detector. The (PD) 25 measures the signal size and passes the message back to the control chip inside the up/down circuit to adjust the gain of the programmable gain amplifier output based on the received signal gain and power strength requirements.

本發明之陣列天線檢測校正方法其中一實施例中,該發射/接收電路實施例之配置架構圖如圖5所示,發射/接收電路分成共同路徑、發射路徑、接收路徑共三個路徑。發射接收電路內含一控制晶片31整合三條路徑,控制內部兩組開關電路分別位於發射路徑和接收路徑連接天線端32與共同路徑,以執行發射或接收的功能切換。共同路徑一端連接功率分配器33,另一端連接發射路徑與接收路徑。共同路徑內含移相器與衰減器,移相器之最大可移相角度與解析度可依照需求組合出合適的規格;衰減器最大衰減範圍與解析度也可依照需求選擇。於檢測或校正模式時,本發明之微處理器(圖未示)發送信號至該發射/接收電路內部的控制晶片31,發送控制信號控制移相器與衰減器,調整相位及增益大小;並控制對應之天線(待測天線單元)開啟或關閉。發射路徑由多級放大器組合而成(包括驅動放大器和功率放大器),可依據增益與功率需求做不同數量的串接。接收路徑使用低雜訊放大器與帶通濾波器,達成高增益及低雜訊的特性。接收路徑與發射路徑連接轉換電路做電路匹配,連結至天線端發射或接收信號。 Array Antenna Detection Correction Method of the Present Invention In one embodiment, the configuration architecture diagram of the transmit/receive circuit embodiment is as shown in FIG. 5, and the transmit/receive circuit is divided into three paths: a common path, a transmit path, and a receive path. The transmitting and receiving circuit includes a control chip 31 integrated with three paths, and the internal two sets of switching circuits are respectively located at the transmitting path and the receiving path connecting the antenna end 32 and the common path to perform function switching of transmitting or receiving. One end of the common path is connected to the power splitter 33, and the other end is connected to the transmit path and the receive path. The common path includes a phase shifter and an attenuator. The maximum phase shift angle and resolution of the phase shifter can be combined according to requirements. The maximum attenuation range and resolution of the attenuator can also be selected according to requirements. In the detecting or correcting mode, the microprocessor (not shown) of the present invention sends a signal to the control chip 31 inside the transmitting/receiving circuit, and sends a control signal to control the phase shifter and the attenuator to adjust the phase and gain size; Control the corresponding antenna (the antenna unit to be tested) to be turned on or off. The transmit path is a combination of multi-stage amplifiers (including driver amplifiers and power amplifiers) that can be cascaded in different quantities depending on gain and power requirements. The receive path uses low noise amplifiers and bandpass filters for high gain and low noise. The receiving path and the transmitting path are connected to the conversion circuit for circuit matching, and are connected to the antenna end to transmit or receive signals.

本發明之陣列天線檢測校正方法其中一實施例 中,該信號分析器透過該參考天線單元接收到該待測天線單元所發射之相位測試信號後,透過網格節點之Y軸座標值經過計算後可進行增益大小之檢測,並可求取出I、Q座標值,經計算描點可得星座圖表。 An embodiment of the array antenna detection and correction method of the present invention After the signal analyzer receives the phase test signal transmitted by the antenna unit to be tested through the reference antenna unit, the Y-axis coordinate value of the mesh node is calculated, and the gain size can be detected, and the I can be extracted. The Q coordinate value can be obtained by calculating the chart.

本發明之陣列天線檢測校正方法其中一實施例中,該相位校正表係透過一已知的直流偏移量來求取天線元件老化造成之偏移量,以進行該天線之相位校正。首先,讓待測天線單元發射一原始信號(即無直流偏移量之相位測試信號)、與一有插入已知直流偏移量之相位測試信號,參考天線單元接收後先利用增益校正表補償/衰減其增益,再透過信號分析器分析後,在I、Q星座圖中可得兩圓,兩圓之相位角分別為。本發明之陣列天線檢測校正方法其中一實施例之星座圖請參閱圖6所示,求取兩相位角之差值得已知直流所造成的相對偏移量(),再將有已知直流偏移信號相位角與原始信號(無直流偏移量、無增益補償衰減)相位角之間的相對偏移量()減去已知直流造成的相對偏移量,便可得該天線元件造成的偏移量( ),最後將偏移量存入相位校正表中,作為後續校正用。 In an embodiment of the present invention, the phase correction table obtains an offset caused by aging of the antenna element by a known DC offset to perform phase correction of the antenna. First, the antenna unit to be tested transmits an original signal (ie, a phase test signal without a DC offset), and a phase test signal with a known DC offset inserted therein, and the reference antenna unit first compensates by using a gain correction table. / Attenuate its gain, and then analyze it through the signal analyzer, two circles are obtained in the I and Q constellation diagrams, and the phase angles of the two circles are respectively , . The array antenna detection and correction method of the present invention is shown in FIG. 6 for the constellation diagram of an embodiment. The difference between the two phase angles is determined by the relative offset caused by the known DC ( ), there will be a known DC offset signal phase angle Phase angle with original signal (no DC offset, no gain compensation attenuation) Relative offset between Subtracting the relative offset caused by the known DC, the offset caused by the antenna element can be obtained ( ), the last offset Stored in the phase correction table for subsequent calibration.

圖7係為應用本發明之陣列天線檢測校正方法之陣列天線檢測校正系統另一實施例示意圖,如圖所示,該實施例包括:一陣列天線41,其係為複數待測天線411組成;一參考天線42;複數發射/接收電路43,係個別對應連接一待測 天線;一升/降頻電路44,係連接該些發射/接收電路;一直流偏移產生器45;一訊號產生器46(即前文所述之信號產生器);一訊號分析器47(即前文所述之信號分析器);以及一計算機48(即前文所述之微處理器)。該實施例之運作流程係為:計算機發出控制信號給全部的發射/接收電路,只保留欲測試之天線單元開啟,其餘皆關閉;由訊號產生器產生m組增益測試信號透過升/降頻電路至待測天線;經由待測天線發射給參考天線,再回傳給訊號分析器進行增益分析,並建立增益校正表;信號產生器產生n組相位測試信號至待測天線,其中該相位測試信號傳遞路徑分為兩路,一路直接傳至升/降頻電路,另一路先經過直流偏移產生器、在該路之相位測試信號中加入直流偏移量後,再傳至升/降頻電路;待測天線將上述兩路之相位測試信號傳至參考天線,同時透過升/降頻電路根據增益校正表對該待測天線進行補償或衰減增益;參考天線接收到該兩路相位測試信號後傳至訊號分析器,可得兩組I、Q值,比較兩組I、Q值繪得該待測天線之星座圖,透過該星座圖可得該待測天線之相位偏移量,進而建立該天線之相位校正表;依上述步驟完成所有待測天線之增益校正表與相位校正表後,在透過該陣列天線發射信號前,根據增益校正表於升/降頻電路進行補償或衰減增益,根據相位校正表在發射/接收電路中透過移相器對該天線進行相位校正,最終完成該陣列天線之檢測與校正動作。 FIG. 7 is a schematic diagram of another embodiment of an array antenna detection and correction system for applying the array antenna detection and correction method of the present invention. As shown in the figure, the embodiment includes: an array antenna 41, which is composed of a plurality of antennas 411 to be tested; a reference antenna 42; a complex transmit/receive circuit 43 for individually connecting one to be tested An antenna; a liter/down circuit 44 is coupled to the transmit/receive circuits; a DC offset generator 45; a signal generator 46 (i.e., the signal generator described above); a signal analyzer 47 (ie, The signal analyzer described above; and a computer 48 (i.e., the microprocessor described above). The operation flow of the embodiment is: the computer sends a control signal to all the transmitting/receiving circuits, only the antenna unit to be tested is turned on, and the rest are turned off; the m-group gain test signal is generated by the signal generator through the rising/lowering circuit The antenna to be tested is transmitted to the reference antenna via the antenna to be tested, and then transmitted back to the signal analyzer for gain analysis, and a gain correction table is established; the signal generator generates n sets of phase test signals to the antenna to be tested, wherein the phase test signal The transmission path is divided into two paths, one channel is directly transmitted to the up/down circuit, and the other path is first passed through the DC offset generator, and the DC offset is added to the phase test signal of the path, and then transmitted to the up/down circuit. The antenna to be tested transmits the phase test signals of the two paths to the reference antenna, and simultaneously compensates or attenuates the antenna to be tested according to the gain correction table through the up/down circuit; the reference antenna receives the two phase test signals. Passed to the signal analyzer, you can get two sets of I and Q values, compare the two sets of I and Q values to draw the constellation of the antenna to be tested, and the constellation map can obtain the test day. Phase offset amount, thereby establishing a phase correction table of the antenna; after completing the gain correction table and the phase correction table of all the antennas to be tested according to the above steps, before the signal is transmitted through the array antenna, the gain correction table is used to raise/lower The frequency circuit performs compensation or attenuation gain, and phase corrects the antenna through the phase shifter in the transmitting/receiving circuit according to the phase correction table, and finally completes the detection and correction operation of the array antenna.

本發明之陣列天線檢測校正方法其中一實施例中,該增益校正表與該相位校正表格式均為一矩陣,請參閱圖8之本發明之天線校正表矩陣(包含該增益校正表與該相位校正表)與陣列天線之比較示意圖。由圖可知矩陣中每一組數值皆對應到陣列天線中的個別天線,使用者可透過一微處理器計算分析該校正表,並依其對個別天線進行增益調控與相位調控。 In an embodiment of the present invention, the gain correction table and the phase correction table format are both a matrix. Please refer to the antenna correction table matrix of the present invention in FIG. 8 (including the gain correction table and the phase). A comparison of the calibration table with the array antenna. It can be seen from the figure that each set of values in the matrix corresponds to an individual antenna in the array antenna, and the user can calculate and analyze the correction table through a microprocessor, and perform gain control and phase control on the individual antennas according to the same.

綜上所述,本發明之陣列天線檢測校正方法係可應用於無線通訊、軍民用雷達之陣列天線系統,用於檢測與校正一具有複數待測天線單元之陣列天線,使該天線於發送訊號前可以自動校正其因長期使用元件老化、或其他內外部因素造成之增益與相位誤差。本發明建立之增益校正表與相位校正表除可即時校正陣列天線的增益、相位誤差外,還可將該校正表作為檢測記錄儲存於微處理器中,以提供使用者於操作維修時的參考資料。本發明使用之運算與校正方法簡便,且基於陣列天線系統固有架構設計,所需額外元件數量少或不需額外元件,即可達到對使用中的陣列天線系統即時檢測與校正之效果。 In summary, the array antenna detection and correction method of the present invention can be applied to an array antenna system for wireless communication and military and civilian radars for detecting and correcting an array antenna having a plurality of antenna units to be tested, so that the antenna transmits signals. It can automatically correct the gain and phase error caused by long-term component aging or other internal and external factors. The gain correction table and the phase correction table established by the invention can correct the gain and phase error of the array antenna in real time, and can also store the calibration table as a detection record in the microprocessor to provide a reference for the user during operation and maintenance. data. The operation and correction method used in the invention is simple, and based on the inherent architecture design of the array antenna system, the effect of the immediate detection and correction of the array antenna system in use can be achieved by requiring a small number of additional components or no additional components.

上述之實施例僅為例示性說明本發明之特點及其功效,而非用於限制本發明之實質技術內容的範圍。任何熟習此技藝之人士均可在不違背本發明之精神及範疇下,對上述實施例進行修飾與變化。因此,本發明之權利保護範圍, 應如後述之申請專利範圍所列。 The above-described embodiments are merely illustrative of the features and functions of the present invention, and are not intended to limit the scope of the technical scope of the present invention. Modifications and variations of the above-described embodiments can be made by those skilled in the art without departing from the spirit and scope of the invention. Therefore, the scope of protection of the present invention, It should be listed in the scope of patent application as described later.

Claims (6)

一種陣列天線檢測校正方法,用於檢測與校正一具有複數待測天線單元之陣列天線,該陣列天線檢測校正方法之步驟係包括:(A)一信號產生器提供增益測試信號至一待測天線單元,該待測天線單元發射將該增益測試信號至一參考天線單元;(B)該參考天線單元將接收到之增益測試信號傳至一信號分析器,以進行該待測天線單元之增益分析,並建立一增益校正表;(C)該信號產生器提供相位測試信號,將該相位測試信號加入直流偏移量,再與未加入直流偏移量之相位測試信號一同傳至該待測天線單元;(D)該待測天線單元發射該具直流偏移量與不具直流偏移量之相位測試信號至該參考天線單元,該參考天線單元將接收到之相位測試信號傳至該信號分析器,以獲得該參考天線單元之相位偏移量,並建立一相位校正表;(E)該信號產生器產生最終測試信號,在該待測天線單元發射該最終測試信號前,依據該增益校正表對該待測天線單元進行補償/衰減增益,再透過該信號分析器分析後,在一I、Q星座圖中得兩圓,該兩圓之相位角分別為,求取兩相位角之差值,得已知直流所造成的相對偏 移量(),再將有已知直流偏移信號相位角、與原始信號相位角之間的相對偏移量( )減去已知直流造成的相對偏移量,便可得該天線元件造成的偏移量(),最後將該偏移量存入該相位校正表中,依據該相位校正表對該待測天線單元進行相位校正;(F)對另一個待測天線單元重複步驟(A)~(E)之動作,直到所有待測天線單元完成檢測校正。 An array antenna detection and correction method for detecting and correcting an array antenna having a plurality of antenna elements to be tested, wherein the step of detecting the correction method of the array antenna comprises: (A) a signal generator providing a gain test signal to an antenna to be tested a unit, the antenna unit to be tested transmits the gain test signal to a reference antenna unit; (B) the reference antenna unit transmits the received gain test signal to a signal analyzer to perform gain analysis of the antenna unit to be tested And establishing a gain correction table; (C) the signal generator provides a phase test signal, adding the phase test signal to the DC offset, and transmitting the phase test signal to the antenna to be tested together with the phase test signal without the DC offset added thereto a unit (D) transmitting the phase test signal having a DC offset and a DC offset to the reference antenna unit, the reference antenna unit transmitting the received phase test signal to the signal analyzer Obtaining a phase offset of the reference antenna element and establishing a phase correction table; (E) the signal generator generates a final test signal, where Before the antenna unit transmits the final test signal, the compensation/attenuation gain of the antenna unit to be tested is performed according to the gain correction table, and then analyzed by the signal analyzer, and two circles are obtained in an I and Q constellation diagram. The phase angles of the circles are , Find the difference between the two phase angles to obtain the relative offset caused by the known DC ), there will be a known DC offset signal phase angle Phase angle with the original signal Relative offset between Subtracting the relative offset caused by the known DC, the offset caused by the antenna element can be obtained ( ), the last offset Depositing in the phase correction table, performing phase correction on the antenna unit to be tested according to the phase correction table; (F) repeating steps (A) to (E) to another antenna unit to be tested until all antennas to be tested are performed The unit completes the detection correction. 一種陣列天線檢測校正方法,用於檢測與校正一具有複數待測天線單元之陣列天線,該陣列天線檢測校正方法之步驟係包括:一微處理器發出開啟信號開啟一組待測天線單元及該參考天線單元,其餘待測天線單元則關閉;該微處理器控制一信號產生器產生增益測試信號至該待測天線單元,該待測天線單元發射該增益測試信號給該參考天線單元;該參考天線單元接收到該些增益測試信號後,回傳至一信號分析器,該信號分析器對接收到之增益測試信號進行增益分析後回傳給該微處理器,該微處理器建立該待測天線單元之增益校正表;該微處理器控制該信號產生器產生相位測試信號,將該相位測試信號同時傳至一升/降頻電路與一直流偏移產生 器,該直流偏移產生器將該相位測試信號加入直流偏移量、再將該些具直流偏移量之相位測試信號傳至該升/降頻電路;該升/降頻電路將該些有直流偏移量與無直流偏移量之相位測試信號經由該待測天線單元發送至該參考天線單元,同時依據該增益校正表對該待測天線單元進行補償/衰減增益;該參考天線單元將接收到之該些相位測試信號傳至該信號分析器,得到兩組I、Q值(分別是有直流偏移與無直流偏移),該微處理器比較該兩組I、Q值得到該待測天線單元之相位偏移量,建立該待測天線單元之相位校正表,再透過該信號分析器分析後,在一I、Q星座圖中得兩圓,該兩圓之相位角分別為,求取兩相位角之差值,得已知直流所造成的相對偏移量(),再將有已知直流偏移信號相位角、與原始信號相位角之間的相對偏移量()減去已知直流造成的相對偏移量,便可得該天線元件造成的偏移量( ),最後將該偏移量存入該相位校正表中;該微處理器控制該信號產生器產出最終測試信號給該待測天線單元,在該待測天線單元發射信號前,該升/降頻電路依據該增益校正表對該待測天線單元進行補償/衰減增益、一發射/接收電路根據該相位校正表透過該移相器 對該待測天線單元進行相位校正,至此完成該待測天線單元之校正動作;完成一待測天線單元之校正後,依序對其他待測天線單元進行檢測與校正,最後完成對全待測天線單元之校正。 An array antenna detection and correction method for detecting and correcting an array antenna having a plurality of antenna units to be tested, wherein the step of detecting the correction method of the array antenna comprises: a microprocessor issuing an enable signal to turn on a group of antenna units to be tested and the Referring to the antenna unit, the remaining antenna unit to be tested is turned off; the microprocessor controls a signal generator to generate a gain test signal to the antenna unit to be tested, and the antenna unit to be tested transmits the gain test signal to the reference antenna unit; After receiving the gain test signals, the antenna unit returns to a signal analyzer, and the signal analyzer performs gain analysis on the received gain test signal and returns the data to the microprocessor, and the microprocessor establishes the test to be tested. a gain correction table of the antenna unit; the microprocessor controls the signal generator to generate a phase test signal, and simultaneously transmits the phase test signal to a one-liter/down-frequency circuit and a DC offset generator, and the DC offset generator The phase test signal is added with a DC offset, and the phase test signals having the DC offset are transmitted to the rise/fall a circuit for transmitting a phase test signal having a DC offset and a DC offset without the DC offset to the reference antenna unit, and the antenna to be tested according to the gain correction table The unit performs compensation/attenuation gain; the reference antenna unit transmits the received phase test signals to the signal analyzer to obtain two sets of I and Q values (both DC offset and no DC offset), the micro The processor compares the two sets of I and Q values to obtain a phase offset of the antenna unit to be tested, establishes a phase correction table of the antenna unit to be tested, and analyzes the signal through the signal analyzer, in an I and Q constellation diagram. Two circles, the phase angles of the two circles are , Find the difference between the two phase angles to obtain the relative offset caused by the known DC ), there will be a known DC offset signal phase angle Phase angle with the original signal Relative offset between Subtracting the relative offset caused by the known DC, the offset caused by the antenna element can be obtained ( ), the last offset Deposited in the phase correction table; the microprocessor controls the signal generator to generate a final test signal to the antenna unit to be tested, and the up/down circuit according to the gain correction table before the antenna unit to be tested transmits a signal Performing compensation/attenuation gain on the antenna unit to be tested, and a transmitting/receiving circuit performs phase correction on the antenna unit to be tested through the phase shifter according to the phase correction table, thereby completing the correcting action of the antenna unit to be tested; After the antenna unit to be tested is corrected, the other antenna units to be tested are detected and corrected in sequence, and finally the correction of the entire antenna unit to be tested is completed. 如請求項1或2所述之陣列天線檢測校正方法,其中該增益校正表為一矩陣格式。 The array antenna detection correction method according to claim 1 or 2, wherein the gain correction table is in a matrix format. 如請求項1或2所述之陣列天線檢測校正方法,其中該相位校正表為一矩陣格式。 The array antenna detection correction method according to claim 1 or 2, wherein the phase correction table is in a matrix format. 如請求項2所述之陣列天線檢測校正方法,其中該直流偏移產生器係為電壓位準移相器、偏壓器或其他種類之電壓偏移裝置。 The array antenna detection and correction method of claim 2, wherein the DC offset generator is a voltage level shifter, a biaser or other type of voltage offset device. 如請求項2所述之陣列天線檢測校正方法,其中該直流偏移產生器產生之直流偏移量信號需為數位調變之信號,可為QPSK、8PSK、APSK或其他種類之數位調變信號。 The array antenna detection and correction method of claim 2, wherein the DC offset signal generated by the DC offset generator needs to be a digitally modulated signal, which may be QPSK, 8PSK, APSK or other kinds of digital modulation signals. .
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