TWI622641B - Composition for forming electroless plating underlayer film - Google Patents

Composition for forming electroless plating underlayer film Download PDF

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TWI622641B
TWI622641B TW103100531A TW103100531A TWI622641B TW I622641 B TWI622641 B TW I622641B TW 103100531 A TW103100531 A TW 103100531A TW 103100531 A TW103100531 A TW 103100531A TW I622641 B TWI622641 B TW I622641B
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electroless plating
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plating
polyaniline
underlayer film
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TW103100531A
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TW201441351A (en
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中村師健
Mitsutake Nakamura
深津文起
Fumioki Fukatsu
小野寺真吾
Shingo Onodera
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出光興產股份有限公司
Idemitsu Kosan Co., Ltd.
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Priority claimed from JP2013000573A external-priority patent/JP2014132104A/en
Priority claimed from JP2013001249A external-priority patent/JP6050687B2/en
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/16Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
    • C23C18/18Pretreatment of the material to be coated
    • C23C18/20Pretreatment of the material to be coated of organic surfaces, e.g. resins
    • C23C18/2006Pretreatment of the material to be coated of organic surfaces, e.g. resins by other methods than those of C23C18/22 - C23C18/30
    • C23C18/2046Pretreatment of the material to be coated of organic surfaces, e.g. resins by other methods than those of C23C18/22 - C23C18/30 by chemical pretreatment
    • C23C18/2053Pretreatment of the material to be coated of organic surfaces, e.g. resins by other methods than those of C23C18/22 - C23C18/30 by chemical pretreatment only one step pretreatment
    • C23C18/2066Use of organic or inorganic compounds other than metals, e.g. activation, sensitisation with polymers

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  • Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Chemically Coating (AREA)

Abstract

本發明之無電解鍍敷底層膜形成用組成物,其係包含導電性聚合物及胺基甲酸酯樹脂。 The composition for forming an electroless plating underlayer film of the present invention contains a conductive polymer and a urethane resin.

Description

無電解鍍敷底層膜形成用組成物 Composition for forming electroless plating underlayer film

本發明為關於無電解鍍敷底層膜形成用組成物、由其所得到的薄膜、鍍敷層合體、無電解鍍敷底層膜之製造方法及無電解鍍敷層合體之製造方法。 The present invention relates to a method for producing a composition for forming an electroless plating underlayer film, a thin film obtained therefrom, a plated laminate, an electroless plating underlayer film, and a method for producing an electroless plating laminate.

又,本發明為關於無電解鍍敷物之製造方法。 Moreover, this invention relates to the manufacturing method of electroless plating.

導電性高分子為使用於電解電容器或電子機器之備用電池、行動電話或筆記型電腦中所使用的鋰離子電池之電極等。 The conductive polymer is an electrode of a lithium ion battery used in an electrolytic capacitor or a backup battery of an electronic device, a mobile phone, or a notebook computer.

例如導電性高分子之1種的聚苯胺,除了該電氣特性外,由於可由廉價的苯胺以相對簡便地予以合成,且具有所謂在顯示導電性之狀態下對於氧等展現出優異安定性之優點及特性。又,藉由專利文獻1之方法,可簡便且得到高導電的聚苯胺。 For example, polyaniline, a type of conductive polymer, has the advantage of exhibiting excellent stability against oxygen and the like in the state of showing conductivity because it can be synthesized relatively easily from inexpensive aniline in addition to the electrical characteristics. And characteristics. In addition, by the method of Patent Document 1, polyaniline having high conductivity can be obtained simply and easily.

又,導電性高分子中亦具多數具有還原力者,發揮此特性而作為無電解鍍敷之底層膜,正被受矚目(專利文獻2~8)。 In addition, most of the conductive polymers have reducing power, and this feature is being used as a base film for electroless plating, which is attracting attention (Patent Documents 2 to 8).

由聚苯胺複合體單體所成的無電解鍍敷底層膜,與聚碳酸酯(PC)或聚對苯二甲酸乙二酯(PET)等之各種基材之黏著性尚不充分。又,與鍍敷層之黏著性亦不充分。 The electroless plated base film made of polyaniline composite monomer has insufficient adhesion to various substrates such as polycarbonate (PC) or polyethylene terephthalate (PET). Also, the adhesion to the plating layer is insufficient.

〔先前技術文獻〕 [Prior Technical Literature] 〔專利文獻〕 [Patent Literature]

[專利文獻1]國際公開第2005/052058號說明書 [Patent Literature 1] International Publication No. 2005/052058 Specification

[專利文獻2]日本國特開2007-270180號公報 [Patent Document 2] Japanese Patent Laid-Open No. 2007-270180

[專利文獻3]日本國特開2008-163371號公報 [Patent Document 3] Japanese Patent Laid-Open No. 2008-163371

[專利文獻4]日本國特開2011-208174號公報 [Patent Document 4] Japanese Patent Laid-Open No. 2011-208174

[專利文獻5]日本國特開2011-168814號公報 [Patent Document 5] Japanese Patent Laid-Open No. 2011-168814

[專利文獻6]日本國特開2011-168813號公報 [Patent Document 6] Japanese Patent Laid-Open No. 2011-168813

[專利文獻7]日本國特開2011-74407號公報 [Patent Document 7] Japanese Patent Laid-Open No. 2011-74407

[專利文獻8]日本國特開2010-95776號公報 [Patent Document 8] Japanese Patent Application Publication No. 2010-95776

本發明之目的為在無電解鍍敷中,提供一種與聚碳酸酯(PC)等之基材之黏著性為充分,且與鍍敷層之黏著性亦為充分的底層膜形成用的組成物。 An object of the present invention is to provide a composition for forming an underlayer film with sufficient adhesion to a substrate such as polycarbonate (PC) and sufficient adhesion to a plating layer in electroless plating .

依據本發明,可提供以下的無電解鍍敷底層膜形成用組成物等。 According to the present invention, the following composition for forming an electroless plating underlayer film and the like can be provided.

[1].含導電性聚合物及胺基甲酸酯樹脂之無電解鍍敷底層膜形成用組成物。 [1]. Composition for forming electroless plating base film containing conductive polymer and urethane resin.

[2].如前述[1]中所記載之無電解鍍敷底層膜形成用組成物,其中,前述導電性聚合物係取代或未取代的聚苯胺以摻雜劑進行摻雜而成的聚苯胺複合體。 [2]. The composition for forming an electroless plating underlayer film as described in [1] above, wherein the conductive polymer-based substituted or unsubstituted polyaniline is doped with a dopant Aniline complex.

[3].如前述[2]中所記載之無電解鍍敷底層膜形成用組成物,其中,前述摻雜劑係以下述式(III)所示的磺基琥珀酸衍生物。 [3]. The composition for electroless plating underlayer film formation described in [2] above, wherein the dopant is a sulfosuccinic acid derivative represented by the following formula (III).

(式(III)中,M為氫原子、有機游離基或無機游離基,m’為M之價數,R13及R14分別為烴基或-(R15O)r-R16基,R15分別為烴基或亞矽烷基,R16為氫原子、烴基或R17 3Si-基,r為1以上之整數,R17分別為烴基)。 (In formula (III), M is a hydrogen atom, an organic radical or an inorganic radical, m 'is a valence of M, R 13 and R 14 are respectively a hydrocarbon group or-(R 15 O) r -R 16 group, R 15 is a hydrocarbon group or a silylene group, R 16 is a hydrogen atom, a hydrocarbon group, or R 17 3 Si- group, r is an integer of 1 or more, and R 17 is a hydrocarbon group, respectively).

[4].如前述[2]或[3]中所記載之無電解鍍敷底層膜形成用組成物,其中,前述摻雜劑為二-2-乙基己基磺基琥珀酸鈉。 [4]. The composition for forming an electroless plating underlayer film as described in [2] or [3], wherein the dopant is sodium di-2-ethylhexylsulfosuccinate.

[5].如前述[1]~[4]中任一項所記載之無電解鍍敷底層膜形成用組成物,其中,相對於前述導電性聚合物及前述胺基甲酸酯樹脂之合計,前述胺基甲酸酯樹脂之比例為 20~80重量%。 [5]. The composition for forming an electroless plating underlayer film according to any one of the above [1] to [4], wherein the total amount of the conductive polymer and the urethane resin is , The ratio of the aforementioned urethane resin is 20 ~ 80% by weight.

[6].一種無電解鍍敷底層膜,其係由前述[1]~[5]中任一項所記載之無電解鍍敷底層膜形成用組成物所得到。 [6]. An electroless plating underlayer film obtained from the composition for forming an electroless plating underlayer film according to any one of the above [1] to [5].

[7].一種鍍敷層合體,其係包含含金屬之無電解鍍敷層、含導電性聚合物及胺基甲酸酯樹脂之無電解鍍敷底層膜、與基板,其中,前述無電解鍍敷層之一面與前述無電解鍍敷底層膜之一面接觸。 [7]. A plating laminate comprising a metal-containing electroless plating layer, an electroless plating underlayer film containing a conductive polymer and a urethane resin, and a substrate, wherein the aforementioned electroless One side of the plating layer is in contact with one side of the aforementioned electroless plating underlayer film.

[8].如前述[7]中所記載之鍍敷層合體,其中,前述導電性聚合物係取代或未取代的聚苯胺以摻雜劑進行摻雜而成的聚苯胺複合體。 [8]. The plated laminate as described in [7] above, wherein the conductive polymer-based substituted or unsubstituted polyaniline is a polyaniline composite doped with a dopant.

[9].如前述[8]中所記載之鍍敷層合體,其中,前述摻雜劑係以下述式(III)所示的磺基琥珀酸衍生物。 [9]. The plated laminate as described in [8] above, wherein the dopant is a sulfosuccinic acid derivative represented by the following formula (III).

(式(III)中,M為氫原子、有機游離基或無機游離基,m’為M之價數,R13及R14分別為烴基或-(R15O)r-R16基,R15分別為烴基或亞矽烷基,R16為氫原子、烴基或 R17 3Si-基,r為1以上之整數,R17分別為烴基)。 (In formula (III), M is a hydrogen atom, an organic radical or an inorganic radical, m 'is a valence of M, R 13 and R 14 are respectively a hydrocarbon group or-(R 15 O) r -R 16 group, R 15 is a hydrocarbon group or a silyl group, R 16 is a hydrogen atom, a hydrocarbon group, or R 17 3 Si- group, r is an integer of 1 or more, and R 17 is a hydrocarbon group, respectively)

[10].如前述[8]或[9]中所記載之鍍敷層合體,其中,前述摻雜劑為二-2-乙基己基磺基琥珀酸鈉。 [10]. The plated laminate as described in [8] or [9], wherein the dopant is sodium di-2-ethylhexylsulfosuccinate.

[11].如前述[7]~[10]中任一項所記載之鍍敷層合體,其中,相對於前述導電性聚合物及前述胺基甲酸酯樹脂之合計,前述胺基甲酸酯樹脂之比例為20~80重量%。 [11]. The plated laminate according to any one of the above [7] to [10], wherein the amino acid is added to the total of the conductive polymer and the carbamate resin The proportion of ester resin is 20 to 80% by weight.

[12].如前述[7]~[11]中任一項所記載之鍍敷層合體,其中,前述金屬為銅。 [12]. The plated laminate as described in any one of [7] to [11], wherein the metal is copper.

[13].如前述[7]~[12]中任一項所記載之鍍敷層合體,其中,前述基板為樹脂。 [13]. The plated laminate according to any one of [7] to [12], wherein the substrate is a resin.

[14].如前述[13]中所記載之鍍敷層合體,其中,前述基板為聚碳酸酯樹脂、聚酯樹脂、聚醯亞胺樹脂、或聚苯硫醚樹脂。 [14]. The plated laminate as described in [13] above, wherein the substrate is a polycarbonate resin, polyester resin, polyimide resin, or polyphenylene sulfide resin.

[15].一種無電解鍍敷底層膜之製造方法,其中,其係使用請求項[1]~[5]中任一項所記載之無電解鍍敷底層膜形成用組成物。 [15]. A method for producing an electroless plating underlayer film, which uses the composition for forming an electroless plating underlayer film as described in any one of claims [1] to [5].

[16].一種無電解鍍敷層合體之製造方法,其係包含下述步驟: 於基板上使用前述[1]~[5]中任一項所記載之無電解鍍敷底層膜形成用組成物,以形成無電解鍍敷底層膜之步驟;及 於前述無電解鍍敷底層膜上形成含金屬之無電解鍍敷層之步驟。 [16]. A manufacturing method of electroless plating laminate, which includes the following steps: A step of forming the electroless plating underlayer film using the composition for forming an electroless plating underlayer film described in any one of the above [1] to [5] on a substrate; and The step of forming a metal-containing electroless plating layer on the aforementioned electroless plating underlayer film.

[17].如前述[16]中所記載之無電解鍍敷層合體之製造 方法,其中,使鈀載持於前述無電解鍍敷底層膜,之後藉由使其與無電解鍍敷液接觸而形成前述無電解鍍敷層。 [17]. Manufacture of electroless plated laminate as described in the aforementioned [16] A method in which palladium is carried on the electroless plating underlayer film, and then the electroless plating layer is formed by bringing it into contact with the electroless plating solution.

[18].如前述[17]之無電解鍍敷層合體之製造方法,其中,前述藉由使氯化鈀溶液與前述無電解鍍敷底層膜接觸,來載持鈀。 [18]. The method for producing an electroless plating laminate as described in [17] above, wherein the palladium chloride solution is brought into contact with the electroless plating underlayer film to support palladium.

[19].如前述[16]~[18]中任一項所記載之無電解鍍敷層合體之製造方法,其中,前述無電解鍍敷液包含選自Cu、Ni、Au、Pd、Ag、Sn、Co及Pt之1種以上之金屬。 [19]. The method for manufacturing an electroless plating laminate as described in any one of the aforementioned [16] to [18], wherein the electroless plating solution contains a material selected from the group consisting of Cu, Ni, Au, Pd, and Ag , Sn, Co and Pt more than one metal.

依據本發明,在無電解鍍敷中,可提供與PC等基材之黏著性為充分,且與鍍敷層之黏著性為充分之底層膜形成用之組成物。 According to the present invention, in electroless plating, it is possible to provide a composition for forming an underlayer film having sufficient adhesion to a substrate such as PC and sufficient adhesion to a plating layer.

又,若作為無電解鍍敷底層劑而使用聚苯胺時,在底層劑之前處理步驟(脫脂步驟)中,以往是使用界面活性劑。然而,為黏著性提升之考量,有時添加黏合劑在底層膜中、或底層膜的膜厚過為厚時,不但脫脂步驟之效果不彰而鍍敷之析出性為降低,且有無法形成均勻的鍍敷皮膜之問題。 In addition, when polyaniline is used as the primer for electroless plating, a surfactant is conventionally used in the treatment step (degreasing step) before the primer. However, for the purpose of improving the adhesion, when the adhesive is added to the base film, or the film thickness of the base film is too thick, not only the effect of the degreasing step is not good, but the precipitation of the plating is reduced, and it may not form The problem of uniform coating film.

本發明之其他的目的為提供一種無電解鍍敷物之製造方法,其係對於使用導電性高分子之無電解鍍敷底層膜部份,可選擇性且安定地形成均勻的鍍敷皮膜。 Another object of the present invention is to provide a method for manufacturing an electroless plated product, which can selectively and stably form a uniform plating film for an electroless plated base film portion using a conductive polymer.

依據本發明,可提供以下的無電解鍍敷物之製造方法。 According to the present invention, the following method for manufacturing electroless plated products can be provided.

[1].一種無電解鍍敷物之製造方法,其係包含下述步 驟:將包含導電性聚合物之無電解鍍敷底層膜形成於基材上之步驟、使前述無電解鍍敷底層膜與標準電極電位E0為E0=-1.00V~-0.10V之酸性的還原劑水溶液接觸之步驟、及於與前述還原劑水溶液接觸後之無電解鍍敷底層膜上形成無電解鍍敷層之步驟。 [1]. A method of manufacturing an electroless plated article, comprising the steps of: forming an electroless plated base film containing a conductive polymer on a substrate, and making the aforementioned electroless plated base film and The standard electrode potential E 0 is the step of contacting an acidic reducing agent aqueous solution with E 0 = -1.00V ~ -0.10V, and forming an electroless plating layer on the electroless plating base film after contact with the aforementioned reducing agent aqueous solution step.

[2].如前述[1]中所記載之無電解鍍敷物之製造方法,其中,前述還原劑水溶液之pH為6以下。 [2]. The method for producing an electroless plated article as described in [1] above, wherein the pH of the reducing agent aqueous solution is 6 or less.

[3].如前述[1]或[2]中所記載之無電解鍍敷物之製造方法,其中,前述還原劑水溶液之pH為5以下。 [3]. The method for producing an electroless plated article as described in [1] or [2] above, wherein the pH of the reducing agent aqueous solution is 5 or less.

[4].如前述[1]~[3]中任一項所記載之無電解鍍敷物之製造方法,其中,前述還原劑水溶液之pH為3以上。 [4]. The method for producing an electroless plated article according to any one of the above [1] to [3], wherein the pH of the reducing agent aqueous solution is 3 or more.

[5].如前述[1]~[4]中任一項所記載之無電解鍍敷物之製造方法,其中,前述還原劑水溶液之標準電極電位E0為E0=-0.80V~-0.20V。 [5]. The method of manufacturing an electroless plated article as described in any one of the above [1] to [4], wherein the standard electrode potential E 0 of the reducing agent aqueous solution is E 0 = -0.80V ~ -0.20 V.

[6].如前述[1]~[5]中任一項所記載之無電解鍍敷物之製造方法,其中,前述還原劑水溶液為亞硫酸氫鈉水溶液。 [6]. The method for producing an electroless plated article according to any one of the above [1] to [5], wherein the aqueous solution of the reducing agent is an aqueous solution of sodium bisulfite.

[7].一種無電解鍍敷物之製造方法,其係包含下述步驟:將包含導電性聚合物之無電解鍍敷底層膜形成於基材上之步驟、使前述無電解鍍敷底層膜與2wt%以上20wt%以下的 還原劑水溶液之亞硫酸氫鈉水溶液接觸之步驟、及於與前述還原劑水溶液接觸後之無電解鍍敷底層膜上形成無電解鍍敷層之步驟。 [7]. A method of manufacturing an electroless plated article, comprising the steps of: forming an electroless plated base film containing a conductive polymer on a substrate, and making the aforementioned electroless plated base film and Above 2wt% and below 20wt% The step of contacting the sodium bisulfite aqueous solution of the reducing agent aqueous solution, and the step of forming the electroless plating layer on the electroless plating base film after contacting with the aforementioned reducing agent aqueous solution.

[8].如前述[1]~[7]中任一項所記載之無電解鍍敷物之製造方法,其中,前述導電性聚合物係取代或未取代的聚苯胺以摻雜劑進行摻雜而成的聚苯胺複合體。 [8]. The method for producing an electroless plated article according to any one of the above [1] to [7], wherein the conductive polymer-based substituted or unsubstituted polyaniline is doped with a dopant Polyaniline complex.

[9].如前述[8]中所記載之無電解鍍敷物之製造方法,其中,前述摻雜劑係以下述式(III)所示。 [9]. The method for producing an electroless plated article as described in [8] above, wherein the dopant is represented by the following formula (III).

(式(III)中,M為氫原子、有機游離基或無機游離基,m’為M之價數,R13及R14分別為烴基或-(R15O)r-R16基,R15分別為烴基或亞矽烷基,R16為氫原子、烴基或R17 3Si-基,r為1以上之整數,R17分別為烴基)。 (In formula (III), M is a hydrogen atom, an organic radical or an inorganic radical, m 'is a valence of M, R 13 and R 14 are respectively a hydrocarbon group or-(R 15 O) r -R 16 group, R 15 is a hydrocarbon group or a silylene group, R 16 is a hydrogen atom, a hydrocarbon group, or R 17 3 Si- group, r is an integer of 1 or more, and R 17 is a hydrocarbon group, respectively).

[10].如前述[1]~[9]中任一項所記載之無電解鍍敷物之製造方法,其中,於前述基材表面之一部份上形成前述無電解鍍敷底層膜,並僅於所形成之無電解鍍敷底層膜上形成無電解鍍敷層。 [10]. The method for producing an electroless plated article as described in any one of the above [1] to [9], wherein the electroless plated underlayer film is formed on a part of the surface of the substrate, and The electroless plating layer is formed only on the formed electroless plating underlayer film.

[11].如前述[1]~[10]中任一項所記載之無電解鍍敷物之製造方法,其中,與前述還原劑水溶液之接觸步驟後, 於前述無電解鍍敷層形成步驟前,包含使無電解鍍敷液用觸媒金屬載持於前述無電解鍍敷底層膜之載持步驟。 [11]. The method for producing an electroless plated article as described in any one of the above [1] to [10], wherein after the contacting step with the reducing agent aqueous solution, Before the step of forming the electroless plating layer, there is a supporting step of supporting the electroless plating solution catalyst metal on the electroless plating underlayer film.

[12].如前述[11]中所記載之無電解鍍敷物之製造方法,其中,前述無電解鍍敷液用觸媒金屬為鈀。 [12]. The method for producing an electroless plated article as described in [11] above, wherein the catalyst metal for the electroless plating solution is palladium.

[13].如前述[11]或[12]中所記載之無電解鍍敷物之製造方法,其中,將包含鈀離子之溶液與前述無電解鍍敷底層膜接觸後,進行前述載持步驟。 [13]. The method for producing an electroless plated article as described in [11] or [12], wherein after the solution containing palladium ions is brought into contact with the electroless plated base film, the supporting step is performed.

[14].如前述[13]中所記載之無電解鍍敷物之製造方法,其中,前述包含鈀離子之溶液為氯化鈀溶液。 [14]. The method for producing an electroless plated article as described in [13] above, wherein the solution containing palladium ions is a palladium chloride solution.

[15].如前述[1]~[14]中任一項所記載之無電解鍍敷物之製造方法,其中,使無電解鍍敷液接觸於與前述還原劑水溶液接觸後之無電解鍍敷底層膜後,進行前述無電解鍍敷層之形成。 [15]. The method for producing an electroless plated article according to any one of the above [1] to [14], wherein the electroless plating solution is brought into contact with the electroless plating after contact with the aqueous solution of the reducing agent After the underlayer film, the aforementioned electroless plating layer is formed.

[16].如前述[15]中所記載之無電解鍍敷物之製造方法,其中,前述無電解鍍敷液為包含選自由銅、鎳、鈷、鈀、銀、金、鉑及錫中之1種以上之金屬離子。 [16]. The method for producing an electroless plated article as described in [15] above, wherein the electroless plating solution comprises a material selected from the group consisting of copper, nickel, cobalt, palladium, silver, gold, platinum and tin More than one metal ion.

依據本發明,可提供一種無電解鍍敷物之製造方法,其係對於使用導電性高分子之無電解鍍敷底層膜部份,可選擇性且安定地形成均勻的鍍敷皮膜。 According to the present invention, it is possible to provide a method for manufacturing an electroless plated article, which can selectively and stably form a uniform plated film for an electroless plated base film portion using a conductive polymer.

1‧‧‧鍍敷層合體 1‧‧‧plated laminate

10‧‧‧基板 10‧‧‧ substrate

20‧‧‧無電解鍍敷底層 20‧‧‧ Electroless plating bottom layer

30‧‧‧無電解鍍敷層 30‧‧‧electroless plating

[圖1]表示本發明之鍍敷層合體之一實施形態的層構成概略圖。 Fig. 1 is a schematic view showing the layer configuration of one embodiment of the plated laminate of the present invention.

〔實施發明之的最佳形態〕 [The best form for carrying out the invention]

[1]無電解鍍敷底層膜形成用組成物、藉此所得到的薄膜、鍍敷層合體、無電解鍍敷底層膜之製造方法及無電解鍍敷層合體之製造方法 [1] Composition for forming an electroless plating underlayer film, thin film obtained therefrom, a plated laminate, a method for producing an electroless plating underlayer film, and a method for producing an electroless plating laminate

本發明之無電解鍍敷底層膜形成用組成物係包含導電性聚合物及胺基甲酸酯樹脂。 The composition for forming an electroless plating underlayer film of the present invention includes a conductive polymer and a urethane resin.

所謂無電解鍍敷係指,不進行電氣分解而使用還原劑之具有自體觸媒作用之金屬之鍍敷方法,例如無電解銅鍍敷時,使用甲醛等之還原劑來還原溶液中之銅離子後使金屬銅皮膜析出,析出之金屬銅成為自體觸媒後,再將銅離子做金屬化並使析出之化學性程序。 The so-called electroless plating refers to a method of plating a metal with an autocatalyst function that uses a reducing agent without electrical decomposition. For example, when electroless copper plating, a reducing agent such as formaldehyde is used to reduce the copper in the solution After ionization, the metal copper film is precipitated, and the precipitated metal copper becomes an autocatalyst, and then the copper ion is metallized and the chemical process of precipitation.

本發明之組成物係使用於無電解鍍敷層之底層之形成。 The composition of the present invention is used to form the bottom layer of an electroless plating layer.

本發明之組成物係藉由混合作為提升黏著性之黏合劑的胺基甲酸酯樹脂,與PC或PET等之各種基材之黏著性為充分,且由於與鍍敷層之黏著性亦為優越,故可作為黏著性良好的鍍敷層合體。 The composition of the present invention is a mixture of a urethane resin as a tackifier to improve the adhesion, and the adhesion to various substrates such as PC or PET is sufficient, and the adhesion to the plating layer is also Excellent, so it can be used as a plated laminate with good adhesion.

[導電性聚合物] [Conductive polymer]

作為導電性聚合物,可舉例π共軛聚合物為以摻雜劑進行摻雜而成的π共軛聚合物複合體,具體而言,可舉例取代或未取代的聚苯胺為以摻雜劑進行摻雜而成的聚苯胺 複合體、取代或未取代的聚吡咯為以摻雜劑進行摻雜而成的聚吡咯複合體,以及取代或未取代的聚噻吩為以摻雜劑進行摻雜而成的聚噻吩複合體,較佳為取代或未取代的聚苯胺為以摻雜劑進行摻雜而成的聚苯胺複合體。 As the conductive polymer, a π-conjugated polymer can be exemplified as a π-conjugated polymer composite doped with a dopant, specifically, a substituted or unsubstituted polyaniline can be exemplified as a dopant Doped polyaniline The composite, substituted or unsubstituted polypyrrole is a polypyrrole composite doped with a dopant, and the substituted or unsubstituted polythiophene is a polythiophene composite doped with a dopant, Preferably, the substituted or unsubstituted polyaniline is a polyaniline composite doped with a dopant.

聚苯胺之重量平均分子量(以下,稱為分子量)較佳為20,000以上。分子量若未達20,000時,由組成物所得到的導電性物品之強度或延伸性有降低之虞。分子量較佳為20,000~500,000,又較佳為20,000~300,000,更佳為20,000~200,000。分子量,例如為50,000~200,000、53,000~200,000。在此,上述之重量平均分子量不為聚苯胺複合體之分子量,而是聚苯胺之分子量。 The weight average molecular weight (hereinafter, referred to as molecular weight) of polyaniline is preferably 20,000 or more. If the molecular weight is less than 20,000, the strength or extensibility of the conductive article obtained from the composition may be reduced. The molecular weight is preferably 20,000 to 500,000, more preferably 20,000 to 300,000, and still more preferably 20,000 to 200,000. The molecular weight is, for example, 50,000 to 200,000 and 53,000 to 200,000. Here, the above-mentioned weight average molecular weight is not the molecular weight of the polyaniline composite, but the molecular weight of polyaniline.

多分散度(即,「重量平均分子量」/「數平均分子量」)係較佳為1.5以上10.0以下。就導電率之觀點而言,以多分散度為小(即,分子量分布為狹小)者為較佳,就對於溶劑之溶解性或成形性之觀點而言,有時以多分散度為大者(即,分子量分布為寬廣)為較佳。 The polydispersity (that is, "weight average molecular weight" / "number average molecular weight") is preferably 1.5 or more and 10.0 or less. From the viewpoint of electrical conductivity, it is preferable that the polydispersity is small (that is, the molecular weight distribution is narrow), and from the viewpoint of the solubility or moldability of the solvent, the polydispersity is sometimes greater (That is, the molecular weight distribution is broad) is preferable.

重量平均分子量、數平均分子量及多分散度係藉由凝膠滲透層析(GPC)以聚苯乙烯換算進行測定。 The weight average molecular weight, number average molecular weight, and polydispersity are measured in terms of polystyrene by gel permeation chromatography (GPC).

作為取代聚苯胺之取代基,可舉例例如甲基、乙基、己基、辛基等之直鏈或分支之烴基;甲氧基、乙氧基等之烷氧基;苯氧基等之芳氧基;三氟甲基(-CF3基)等之鹵化烴基。 Examples of the substituent of the substituted polyaniline include linear or branched hydrocarbon groups such as methyl, ethyl, hexyl, and octyl; alkoxy groups such as methoxy and ethoxy; and aryloxy groups such as phenoxy Group; halogenated hydrocarbon groups such as trifluoromethyl (-CF 3 group).

就汎用性及經濟性之觀點而言,聚苯胺較佳為未取代的聚苯胺。 From the viewpoint of versatility and economy, the polyaniline is preferably an unsubstituted polyaniline.

取代或未取代的聚苯胺,較佳為在不包含氯原子的酸之存在下經聚合所得到的聚苯胺。所謂不包含氯原子的酸係指例如由屬於第1族~16族及18族的原子所構成之酸。具體而言,可舉例磷酸。作為在不包含氯原子的酸之存在下經聚合所得到的聚苯胺,可舉例為在磷酸之存在下經聚合所得到的聚苯胺。 The substituted or unsubstituted polyaniline is preferably a polyaniline obtained by polymerization in the presence of an acid containing no chlorine atom. The acid that does not contain a chlorine atom means an acid composed of atoms belonging to Groups 1 to 16 and 18, for example. Specifically, phosphoric acid can be exemplified. As the polyaniline obtained by polymerization in the presence of an acid not containing a chlorine atom, polyaniline obtained by polymerization in the presence of phosphoric acid can be exemplified.

在不包含氯原子的酸之存在下所得到的聚苯胺,可更降低聚苯胺複合體之氯含有量。 The polyaniline obtained in the presence of an acid that does not contain a chlorine atom can further reduce the chlorine content of the polyaniline complex.

聚苯胺複合體之氯含有量,較佳為0.6重量%以下,又較佳為0.1重量%以下,更佳為0.04重量%以下,最佳為0.0001重量%以下。 The chlorine content of the polyaniline composite is preferably 0.6% by weight or less, more preferably 0.1% by weight or less, more preferably 0.04% by weight or less, and most preferably 0.0001% by weight or less.

聚苯胺複合體之氯含有量若超過0.6重量%時,與聚苯胺複合體接觸之金屬部份有腐蝕之虞。 If the chlorine content of the polyaniline composite exceeds 0.6% by weight, the metal part in contact with the polyaniline composite may be corroded.

上述氯含有量係藉由燃燒-離子色層法來進行測定。 The chlorine content is measured by the combustion-ion chromatography method.

作為聚苯胺複合體之摻雜劑,可舉例例如由布忍斯特酸(Broensted acid)或布忍斯特酸之鹽所產生之布忍斯特酸離子,較佳為由有機酸或有機酸之鹽所生成之有機酸離子,又更佳為由以下述式(I)所示的化合物(質子供給體)所生成之有機酸離子。 As the dopant of the polyaniline complex, for example, the Bronsted acid ion produced by Broensted acid or a salt of Brunsted acid, preferably an organic acid or a salt of an organic acid The generated organic acid ion is more preferably an organic acid ion generated from a compound (proton donor) represented by the following formula (I).

尚,本發明中,摻雜劑若以特定之酸來表現時,及摻雜劑若以特定之鹽來表現時,不論是由特定之酸或特定之鹽所產生之特定之酸離子,皆設為摻雜於上述π共軛聚合物者。 Still, in the present invention, when the dopant is represented by a specific acid, and the dopant is represented by a specific salt, whether it is a specific acid ion produced by a specific acid or a specific salt, It is assumed to be doped with the π-conjugated polymer.

M(XARn)m (I) M (XARn) m (I)

式(I)之M為氫原子、有機游離基或無機游離基。 M in formula (I) is a hydrogen atom, an organic radical or an inorganic radical.

作為上述有機游離基,可舉例例如吡啶鎓基、咪唑基、苯銨基。又,作為上述無機游離基,可舉例例如鋰、鈉、鉀、銫、銨、鈣、鎂、鐵之離子。 Examples of the above-mentioned organic radicals include pyridinium group, imidazolyl group, and anilium group. Examples of the inorganic radicals include ions of lithium, sodium, potassium, cesium, ammonium, calcium, magnesium, and iron.

式(I)之X為陰離子基,可舉例例如-SO3 -基、-PO3 2-基、-PO4(OH)-基、-OPO3 2-基、-OPO2(OH)-基、-COO-基,較佳為-SO3 -基。 X of formula (I) of the anionic group can be exemplified, for example, -SO 3 - group, -PO 3 2- group, -PO 4 (OH) - group, -OPO 3 2- group, -OPO 2 (OH) - group , -COO - group, preferably -SO 3 - group.

式(I)之A為取代或未取代的烴基。 A of formula (I) is a substituted or unsubstituted hydrocarbon group.

上述烴基為鏈狀或環狀飽和脂肪族烴基、鏈狀或環狀之不飽和脂肪族烴基、或芳香族烴基。 The above-mentioned hydrocarbon group is a chain or cyclic saturated aliphatic hydrocarbon group, a chain or cyclic unsaturated aliphatic hydrocarbon group, or an aromatic hydrocarbon group.

作為鏈狀之飽和脂肪族烴基,可舉例直鏈或分支狀之烷基。 As the chain-shaped saturated aliphatic hydrocarbon group, a linear or branched alkyl group can be exemplified.

作為環狀飽和脂肪族烴基,可舉例環戊基、環己基、環庚基、環辛基等之環烷基。環狀飽和脂肪族烴基,亦可為複數個之環狀飽和脂肪族烴基做聚合。可舉例例如降莰基、金剛烷基、聚合之金剛烷基。 Examples of cyclic saturated aliphatic hydrocarbon groups include cycloalkyl groups such as cyclopentyl, cyclohexyl, cycloheptyl, and cyclooctyl. The cyclic saturated aliphatic hydrocarbon group may be polymerized by plural cyclic saturated aliphatic hydrocarbon groups. Examples may include norbornyl, adamantyl, and polymerized adamantyl.

作為芳香族烴基,可舉例苯基、萘基、蒽基。作為鏈狀之不飽和脂肪族烴基,可舉例直鏈或分支狀之烯基。 Examples of the aromatic hydrocarbon group include phenyl, naphthyl and anthracenyl. As the chain-shaped unsaturated aliphatic hydrocarbon group, a linear or branched alkenyl group can be exemplified.

在此,A若為取代的烴基時之取代基為烷基、環烷基、乙烯基、烯丙基、芳基、烷氧基、鹵基、羥基、胺基、亞胺基、硝基、矽烷基(silyl)或酯基。 Here, if A is a substituted hydrocarbon group, the substituents are alkyl, cycloalkyl, vinyl, allyl, aryl, alkoxy, halo, hydroxyl, amine, imino, nitro, Silyl (silyl) or ester group.

式(I)之R為與A鍵結,且分別以-H、 -R1、-OR1、-COR1、-COOR1、-(C=O)-(COR1)、或-(C=O)-(COOR1)所示之取代基,R1亦可包含取代基之烴基、矽烷基、烷基矽烷基、-(R2O)x-R3基、或-(OSiR3 2)x-OR3。R2分別為伸烷基、R3分別為烴基,x為1以上之整數。 R of formula (I) is bonded to A, and -H, -R 1 , -OR 1 , -COR 1 , -COOR 1 ,-(C = O)-(COR 1 ), or-(C = O)-(COOR 1 ) substituent, R 1 may also include a substituent hydrocarbon group, silane group, alkyl silane group,-(R 2 O) xR 3 group, or-(OSiR 3 2 ) x -OR 3 . R 2 is an alkylene group, R 3 is a hydrocarbon group, and x is an integer of 1 or more.

作為R1之烴基,可舉例甲基、乙基、直鏈或分支之丁基、戊基、己基、庚基、辛基、壬基、癸基、十二烷基、十五烷基、二十烷基等。又,上述烴基之取代基為烷基、環烷基、乙烯基、烯丙基、芳基、烷氧基、鹵基、羥基、胺基、亞胺基、硝基或酯基。R3之烴基亦與R1為相同。 Examples of the hydrocarbon group for R 1 include methyl, ethyl, linear or branched butyl, pentyl, hexyl, heptyl, octyl, nonyl, decyl, dodecyl, pentadecyl, di Decayl and so on. Moreover, the substituent of the said hydrocarbon group is an alkyl group, a cycloalkyl group, a vinyl group, an allyl group, an aryl group, an alkoxy group, a halogen group, a hydroxyl group, an amine group, an imino group, a nitro group, or an ester group. The hydrocarbon group of R 3 is also the same as R 1 .

作為R2之伸烷基,可舉例例如亞甲基、伸乙基、伸丙基等。 Examples of the alkylene group of R 2 include methylene group, ethyl group, and propyl group.

式(I)之n為1以上之整數,式(I)之m為M之價數/X之價數。 N in formula (I) is an integer of 1 or more, and m in formula (I) is the price of M / the price of X.

作為以式(I)所示的化合物,較佳為二烷基苯磺酸、二烷基萘磺酸、或含有2以上酯鍵之化合物。 The compound represented by formula (I) is preferably a dialkylbenzenesulfonic acid, a dialkylnaphthalenesulfonic acid, or a compound containing 2 or more ester bonds.

上述含有2以上酯鍵之化合物更佳為磺基鄰苯二甲酸酯、或以下述式(II)所示的化合物。 The compound containing 2 or more ester bonds is more preferably a sulfophthalate or a compound represented by the following formula (II).

式(II)中,M及X為與式(I)為相同。X較佳為-SO3 -基。 In formula (II), M and X are the same as in formula (I). X is preferably a -SO 3 - group.

R4、R5及R6分別為氫原子、烴基或R9 3Si-基。在此,3個R9分別為烴基。 R 4 , R 5 and R 6 are respectively hydrogen atom, hydrocarbon group or R 9 3 Si- group. Here, three R 9 are each a hydrocarbon group.

做為R4、R5及R6若為烴基時之烴基,可舉例碳數1~24之直鏈或分支狀之烷基、芳基、烷基芳基等。 As the hydrocarbon group when R 4 , R 5 and R 6 are hydrocarbon groups, a straight-chain or branched alkyl group having 1 to 24 carbon atoms, an aryl group, an alkylaryl group, etc. may be mentioned.

作為R9之烴基,與R4、R5及R6之情形為相同。 The hydrocarbon group of R 9 is the same as the case of R 4 , R 5 and R 6 .

式(II)之R7及R8分別為烴基或-(R10O)q-R11基。R10為烴基或亞矽烷基,R11為氫原子、烴基或R12 3Si-,q為1以上之整數。3個R12分別為烴基。 R 7 and R 8 in formula (II) are each a hydrocarbon group or a-(R 10 O) q -R 11 group. R 10 is a hydrocarbon group or a silylene group, R 11 is a hydrogen atom, a hydrocarbon group, or R 12 3 Si-, and q is an integer of 1 or more. The three R 12 are each a hydrocarbon group.

作為R7及R8為烴基時之烴基,碳數為1~24,較佳為可舉例碳數4以上之直鏈或分支狀之烷基、芳基、烷基芳基等,作為R7及R8為烴基時之烴基的具體例,可舉例例如直鏈或分支狀丁基、戊基、己基、辛基、癸基等。 As the hydrocarbon group when R 7 and R 8 are hydrocarbon groups, the carbon number is 1 to 24, preferably linear or branched alkyl group, aryl group, alkyl aryl group having 4 or more carbon atoms, etc., as R 7 When R 8 is a hydrocarbon group, specific examples of the hydrocarbon group include linear or branched butyl, pentyl, hexyl, octyl, and decyl groups.

R7及R8中,作為R10為烴基時之烴基,例如碳數1~24之直鏈或分支狀伸烷基、伸芳基、烷基伸芳基、芳基伸烷基。又,R7及R8中,R11及R12為烴基時之烴基,與R4、R5及R6之情形為相同,q較佳為1~10。 In R 7 and R 8 , as the hydrocarbon group when R 10 is a hydrocarbon group, for example, a straight-chain or branched alkylene group having 1 to 24 carbon atoms, an aryl group, an alkylene group, or an aryl alkylene group. In addition, in R 7 and R 8 , when R 11 and R 12 are hydrocarbon groups, the hydrocarbon groups are the same as in the case of R 4 , R 5, and R 6 , and q is preferably 1-10.

作為R7及R8為-(R10O)q-R11基時之式(II)所示化合物的具體例,以下述式所示2種的化合物。 As specific examples of the compound represented by formula (II) when R 7 and R 8 are-(R 10 O) q -R 11 groups, two kinds of compounds represented by the following formulas are used.

(式中,X為與式(I)相同)。 (In the formula, X is the same as the formula (I)).

以上述式(II)所示之化合物,又更佳為以下述式(III)所示的磺基琥珀酸衍生物。 The compound represented by the above formula (II) is more preferably a sulfosuccinic acid derivative represented by the following formula (III).

式(III)中,M為與式(I)相同。m’為M之價數。 In formula (III), M is the same as formula (I). m 'is the price of M.

R13及R14分別為烴基或-(R15O)r-R16基。R15分別為烴基或亞矽烷基,R16為氫原子、烴基或R17 3Si-基,r為1以上之整數。3個R17分別為烴基。 R 13 and R 14 are each a hydrocarbon group or-(R 15 O) r -R 16 group. R 15 is a hydrocarbon group or a silylene group, R 16 is a hydrogen atom, a hydrocarbon group, or R 17 3 Si- group, and r is an integer of 1 or more. The three R 17 are each a hydrocarbon group.

作為R13及R14為烴基時之烴基,與R7及R8相同。 When R 13 and R 14 are hydrocarbon groups, they are the same as R 7 and R 8 .

R13及R14中,作為R15為烴基時之烴基,與上述R10 相同。又,R13及R14中,作為R16及R17為烴基時之烴基,與上述R4、R5及R6相同。 In R 13 and R 14 , the hydrocarbon group when R 15 is a hydrocarbon group is the same as R 10 described above. In addition, R 13 and R 14 are the same as R 4 , R 5 and R 6 when R 16 and R 17 are hydrocarbon groups.

r較佳為1~10。 r is preferably 1-10.

作為R13及R14為-(R15O)r-R16基時的具體例,與R7及R8中之-(R10O)q-R11相同。 Specific examples of when R 13 and R 14 are-(R 15 O) r -R 16 groups are the same as-(R 10 O) q -R 11 in R 7 and R 8 .

作為R13及R14之烴基,與R7及R8相同,較佳為丁基、己基、2-乙基己基、癸基。 The hydrocarbon groups of R 13 and R 14 are the same as R 7 and R 8 , and preferably butyl, hexyl, 2-ethylhexyl, and decyl.

上述摻雜劑,已知藉由改變該構造而能控制聚苯胺複合體之導電性、或對溶劑之溶解性(日本國專利第3384566號)。本發明中,可依照個別用途之要求特性而選擇最合適的摻雜劑。本發明中,作為以式(I)所示的化合物,較佳為二-2-乙基己基磺基琥珀酸、二-2-乙基己基磺基琥珀酸鈉(Aerosol OT)。作為本發明之摻雜劑,較佳為二-2-乙基己基磺基琥珀酸離子。 It is known that the above dopant can control the conductivity of the polyaniline composite or the solubility in the solvent by changing the structure (Japanese Patent No. 3384566). In the present invention, the most suitable dopant can be selected according to the required characteristics of individual applications. In the present invention, the compound represented by formula (I) is preferably di-2-ethylhexylsulfosuccinic acid and sodium di-2-ethylhexylsulfosuccinate (Aerosol OT). As the dopant of the present invention, di-2-ethylhexylsulfosuccinate ion is preferred.

聚苯胺複合體之摻雜劑,可藉由紫外、可視或近紅外線分光法、或X射線光電子分光法,來確認是否摻雜於取代或未取代的聚苯胺,該摻雜劑只要是具有能使聚苯胺產生載體(carrier)為充分之酸性即可,未有特別的化學結構上之限制,係可使用。 The dopant of the polyaniline complex can be confirmed by ultraviolet, visible or near-infrared spectroscopy, or X-ray photoelectron spectroscopy to determine whether it is doped with substituted or unsubstituted polyaniline, as long as the dopant is capable of The polyaniline-generating carrier may be sufficiently acidic, and it can be used without any special restrictions on chemical structure.

對於聚苯胺之摻雜劑之摻雜率,較佳為0.35以上0.65以下,又較佳為0.42以上0.60以下,更佳為0.43以上0.57以下,特佳為0.44以上0.55以下。摻雜率若未達0.35時,聚苯胺複合體之對於有機溶劑之溶解性有無法提高之虞。 The doping rate of the polyaniline dopant is preferably 0.35 or more and 0.65 or less, more preferably 0.42 or more and 0.60 or less, more preferably 0.43 or more and 0.57 or less, and particularly preferably 0.44 or more and 0.55 or less. If the doping rate is less than 0.35, the solubility of the polyaniline composite in organic solvents may not be improved.

尚,摻雜率係以(摻雜於聚苯胺中之摻雜劑之莫耳數)/(聚苯胺之單體單元之莫耳數)所定義。例如,所謂包含未取代聚苯胺與摻雜劑之聚苯胺複合體之摻雜率為0.5時,意味著相對於聚苯胺之單體單元分子2個,摻雜有摻雜劑1個之意。 Still, the doping rate is defined by (the number of moles of dopant doped in polyaniline) / (the number of moles of monomer unit of polyaniline). For example, when the doping rate of the polyaniline composite containing unsubstituted polyaniline and dopant is 0.5, it means that one dopant is doped with respect to two monomer unit molecules of polyaniline.

尚,只要能測定聚苯胺複合體中的摻雜劑與聚苯胺之單體單元之莫耳數,即可算出摻雜率。例如摻雜劑為有機磺酸時,藉由有機元素分析法,來定量由摻雜劑之硫原子之莫耳數,與由聚苯胺之單體單元之氮原子之莫耳數,將藉由此等值之比可算出摻雜率。但,摻雜率之算出方法並不限定於該手段。 Still, as long as the molar number of the monomer unit of the dopant and polyaniline in the polyaniline composite can be measured, the doping rate can be calculated. For example, when the dopant is an organic sulfonic acid, the number of moles of sulfur atoms of the dopant and the number of nitrogen atoms of the monomer unit of polyaniline are determined by organic element analysis The ratio of these values can calculate the doping rate. However, the method of calculating the doping rate is not limited to this method.

聚苯胺複合體係包含未取代聚苯胺與摻雜劑之磺酸離子,較佳為符合下述式(5)。 The polyaniline composite system contains sulfonic acid ions of unsubstituted polyaniline and a dopant, and preferably satisfies the following formula (5).

0.42≦S5/N5≦0.60 (5) 0.42 ≦ S 5 / N 5 ≦ 0.60 (5)

(式中,S5為聚苯胺複合體中所含硫原子的莫耳數之合計,N5為聚苯胺複合體中所含氮原子的莫耳數之合計)。 (In the formula, S 5 is the total number of moles of sulfur atoms contained in the polyaniline complex, and N 5 is the total number of moles of nitrogen atoms contained in the polyaniline complex).

尚,上述氮原子及硫原子之莫耳數為藉由例如有機元素分析法所測定之值。 In addition, the mole number of the above-mentioned nitrogen atom and sulfur atom is a value measured by, for example, an organic element analysis method.

聚苯胺複合體亦可進而包含磷,或不包含磷。 The polyaniline composite may further contain phosphorus or not.

聚苯胺複合體包含磷時,磷之含有量例如10重量ppm以上5000重量ppm以下。又,磷之含有量為例如2000重量ppm以下、500重量ppm以下、250重量ppm 以下。 When the polyaniline composite contains phosphorus, the content of phosphorus is, for example, 10 wtppm or more and 5000 wtppm or less. Moreover, the phosphorus content is, for example, 2000 wtppm or less, 500 wtppm or less, 250 wtppm the following.

上述磷之含有量係以ICP發光分光分析法可進行測定。 The phosphorus content can be measured by ICP emission spectrometry.

又,聚苯胺複合體,以不含有作為雜質的第12族元素(例如鋅)為宜。 In addition, the polyaniline composite preferably contains no Group 12 element (for example, zinc) as an impurity.

聚苯胺複合體係可以周知之製造方法來製造,可藉由例如在包含質子供給體、磷酸及與質子供給體相異的乳化劑且具有二個液相之溶液中對取代或未取代的苯胺進行化學氧化聚合而製造。又,可藉由於包含取代或未取代的苯胺、質子供給體、磷酸、及與質子供給體相異的乳化劑且具有二個液相之溶液中,添加氧化聚合劑而製造。 The polyaniline composite system can be manufactured by a well-known manufacturing method, for example, by performing substitution or unsubstituted aniline in a solution containing a proton donor, phosphoric acid, and an emulsifier different from the proton donor and having two liquid phases Manufactured by chemical oxidation polymerization. In addition, it can be produced by adding an oxidative polymerization agent to a solution having two liquid phases including a substituted or unsubstituted aniline, a proton donor, phosphoric acid, and an emulsifier different from the proton donor.

尚,乳化劑係認為擔任防止後述之相換轉的功能。當在包含質子供給體及磷酸且具有二個液相之溶液中,對取代或未取代的苯胺進行化學氧化聚合來製造聚苯胺複合體時,與非磷酸而使用鹽酸之情形相較下,低分子量成分為增加。於此,由使用磷酸時之聚合中之樣態而言,認為上述二個液相係在聚合中發生相換轉(phase inversion)。又,認為該相換轉為使低分子量成分增加之理由。所謂該相換轉之現象係指連續相之液相變化為分散相、分散相之另一方之液相變化為連續相之現象。 Still, the emulsifier is believed to serve the function of preventing the phase change mentioned later. When a polyaniline composite is produced by chemical oxidation polymerization of substituted or unsubstituted aniline in a solution containing a proton donor and phosphoric acid and having two liquid phases, it is lower than the case where hydrochloric acid is used instead of phosphoric acid The molecular weight component is increased. Here, from the aspect of polymerization when phosphoric acid is used, it is considered that the above two liquid phase systems undergo phase inversion during polymerization. In addition, it is considered that this phase change is a reason for increasing the low molecular weight component. The so-called phase change phenomenon refers to the phenomenon that the liquid phase of the continuous phase changes into a dispersed phase, and the liquid phase of the other side of the dispersed phase changes into a continuous phase.

於此,所謂「具有二個液相之溶液」係指在溶液中不相溶之二個液相為存在之狀態之意。例如,在溶液中以「高極性溶劑之相」與「低極性溶劑之相」存在之 狀態之意。 Here, the so-called "solution with two liquid phases" refers to the existence of two liquid phases that are incompatible in the solution. For example, in the solution, there is a "high-polar solvent phase" and a "low-polar solvent phase". The meaning of status.

又,「具有二個液相之溶液」亦包含一方之液相為連續相而另一方之液相為分散相之狀態。例如可包含「高極性溶劑之相」為連續相而「低極性溶劑之相」為分散相之狀態,及「低極性溶劑之相」為連續相而「高極性溶劑之相」為分散相之狀態。 In addition, "a solution having two liquid phases" also includes a state where one liquid phase is a continuous phase and the other liquid phase is a dispersed phase. For example, it may include the state where the "high-polar solvent phase" is the continuous phase and the "low-polar solvent phase" is the dispersed phase, and the "low-polar solvent phase" is the continuous phase and the "high-polar solvent phase" is the dispersed phase. status.

作為使用於上述聚苯胺複合體之製造方法之高極性溶劑,較佳為水;作為低極性溶劑,較佳為例如甲苯、二甲苯等之芳香族烴。 The high-polarity solvent used in the method for producing the polyaniline composite is preferably water; and the low-polarity solvent is preferably aromatic hydrocarbons such as toluene and xylene.

上述質子供給體較佳為以上述式(I)所示之化合物。 The proton donor is preferably a compound represented by the above formula (I).

質子供給體的使用量,以相對於苯胺單量體1mol,較佳為0.1~0.5mol,又較佳為0.3~0.45mol,更佳為0.35~0.4mol。 The use amount of the proton donor is 1 mol per aniline single body, preferably 0.1 to 0.5 mol, more preferably 0.3 to 0.45 mol, more preferably 0.35 to 0.4 mol.

質子供給體之使用量若較該範圍為多時,於聚合結束後,例如有無法分離「高極性溶劑之相」與「低極性溶劑之相」之虞。 If the usage amount of the proton donor is more than this range, after the completion of the polymerization, for example, there is a possibility that the "high polar solvent phase" and the "low polar solvent phase" may not be separated.

上述乳化劑係可使用以親水性部份為離子性之離子性乳化劑,及親水性部份為非離子性之非離子性乳化劑之任何一者,又,亦可混合1種或2種以上之乳化劑來使用。 The above emulsifiers can use any of ionic emulsifiers whose hydrophilic part is ionic, and nonionic emulsifiers whose hydrophilic part is nonionic, and can also mix 1 or 2 types Use the above emulsifier.

作為離子性乳化劑,可舉例陽離子性乳化劑、陰離子性乳化劑及兩性乳化劑。 Examples of the ionic emulsifiers include cationic emulsifiers, anionic emulsifiers and amphoteric emulsifiers.

作為陰離子性乳化劑(陰離子乳化劑)的具體例,可 舉例脂肪酸、不均化松香皂、高級醇酯、聚氧乙烯烷基醚磷酸酯、烯基琥珀酸、肌胺酸鹽、及該等之鹽。 As a specific example of the anionic emulsifier (anionic emulsifier), Examples are fatty acids, heterogeneous rosin soaps, higher alcohol esters, polyoxyethylene alkyl ether phosphates, alkenyl succinic acid, sarcosinate, and salts of these.

作為陽離子性乳化劑(陽離子乳化劑)的具體例,可舉例烷基二甲基苄基銨鹽、烷基三甲基銨鹽。 Specific examples of the cationic emulsifier (cationic emulsifier) include alkyl dimethyl benzyl ammonium salt and alkyl trimethyl ammonium salt.

作為兩性乳化劑(兩性離子乳化劑)的具體例,可舉例烷基甜菜鹼型、烷基醯胺甜菜鹼型、胺基酸型、胺氧化物型。 Specific examples of the amphoteric emulsifier (zwitterionic emulsifier) include alkyl betaine type, alkyl amide betaine type, amino acid type, and amine oxide type.

作為非離子乳化劑的具體例,可舉例聚氧乙烯烷基醚、聚丙二醇聚乙二醇醚、聚氧乙烯甘油硼酸酯脂肪酸酯、聚氧乙烯去水山梨醇脂肪酸酯。 Specific examples of the nonionic emulsifier include polyoxyethylene alkyl ether, polypropylene glycol polyethylene glycol ether, polyoxyethylene glycerol borate fatty acid ester, and polyoxyethylene sorbitan fatty acid ester.

上述乳化劑之中,較佳為陰離子性乳化劑及非離子乳化劑。 Among the above emulsifiers, anionic emulsifiers and nonionic emulsifiers are preferred.

作為陰離子性乳化劑,又更佳為具有磷酸酯構造的陰離子性乳化劑。又,作為非離子乳化劑,又更佳為具有聚氧乙烯去水山梨醇脂肪酸酯構造之非離子乳化劑。 As the anionic emulsifier, an anionic emulsifier having a phosphate structure is more preferable. Moreover, as the nonionic emulsifier, a nonionic emulsifier having a polyoxyethylene sorbitan fatty acid ester structure is more preferable.

乳化劑的使用量,以相對於苯胺單量體1mol,較佳為0.001~0.1mol,又較佳為0.002~0.02mol,更佳為0.003~0.01mol。 The amount of the emulsifier used is 1 mol per aniline unit, preferably 0.001 to 0.1 mol, more preferably 0.002 to 0.02 mol, more preferably 0.003 to 0.01 mol.

當乳化劑的使用量多於該範圍時,於聚合結束後,有無法分離「高極性溶劑之相」與「低極性溶劑之相」之虞。 When the amount of the emulsifier used is more than this range, there is a possibility that the "high polar solvent phase" and the "low polar solvent phase" cannot be separated after the polymerization is completed.

磷酸之使用濃度,以相對於高極性溶劑為0.3~6mol/L,較佳為1~4mol/L,更佳為1~2mol/L。 The concentration of phosphoric acid is 0.3 to 6 mol / L, preferably 1 to 4 mol / L, more preferably 1 to 2 mol / L, relative to the highly polar solvent.

作為使用於化學氧化聚合之氧化劑,可使用 過硫酸鈉、過硫酸鉀、如過硫酸銨的過硫酸鹽、如過氧化氫的過氧化物、二鉻酸銨、過氯酸銨、硫酸鉀鐵(III)、三氯化鐵(III)、二氧化錳、碘酸、過錳酸鉀、或對甲苯磺酸鐵等,較佳為過硫酸銨等之過硫酸鹽。 As an oxidant used in chemical oxidative polymerization, it can be used Sodium persulfate, potassium persulfate, persulfate such as ammonium persulfate, peroxide such as hydrogen peroxide, ammonium dichromate, ammonium perchlorate, potassium iron (III) sulfate, iron (III) chloride , Manganese dioxide, iodic acid, potassium permanganate, or iron p-toluenesulfonate, etc., preferably persulfates such as ammonium persulfate.

此等氧化劑可單獨使用,亦可併用2種以上。 These oxidants can be used alone or in combination of two or more.

氧化劑的使用量,以相對於苯胺單量體1mol,較佳為0.05~1.8mol,又較佳為0.8~1.6mol,更佳為1.2~1.4mol。藉由將氧化劑的使用量設為該範圍內,可得充分的聚合度。又,由於苯胺充分的聚合,故分液回收容易,又,聚合體的溶解性無降低之虞。 The amount of the oxidizing agent used is 1 mol per aniline unit, preferably 0.05 to 1.8 mol, more preferably 0.8 to 1.6 mol, and still more preferably 1.2 to 1.4 mol. By setting the use amount of the oxidizing agent within this range, a sufficient degree of polymerization can be obtained. In addition, since aniline is sufficiently polymerized, liquid separation and recovery are easy, and the solubility of the polymer does not decrease.

聚合溫度通常為-5~60℃下,較佳為-5~40℃。又,聚合溫度於聚合反應的過程中亦可變更。藉由聚合溫度為該範圍,可避免副反應。 The polymerization temperature is usually -5 to 60 ° C, preferably -5 to 40 ° C. In addition, the polymerization temperature may be changed during the polymerization reaction. With the polymerization temperature within this range, side reactions can be avoided.

聚苯胺複合體,具體而言可使用以下之方法來進行製造。 The polyaniline composite can be produced specifically using the following method.

將甲苯中為溶解有質子供給體及乳化劑之溶液,放入在氮等之惰性氛圍的氣流下的分液瓶中,進而於該溶液中加入取代或未取代的苯胺。之後,添加磷酸(其係不含有作為雜質的氯者)於此溶液中,並將溶液溫度冷卻。 Toluene is a solution in which a proton donor and an emulsifier are dissolved, and placed in a separator bottle under an inert atmosphere of nitrogen or the like, and then substituted or unsubstituted aniline is added to the solution. After that, phosphoric acid (which does not contain chlorine as an impurity) was added to this solution, and the solution temperature was cooled.

使溶液內溫冷卻後,進行攪拌。使用滴液漏斗,將磷酸中為溶解有過硫酸銨之溶液滴液,使進行反應。之後,使溶液溫度上昇並繼續反應。反應結束後,將藉由靜置而分離為二相之水相側分液。於有機相側追加甲苯,藉由以磷酸及離子交換水來進行洗淨,而得到聚苯胺 複合體(經質子化之聚苯胺)之甲苯溶液。 After the internal temperature of the solution was cooled, it was stirred. Using a dropping funnel, a solution in which ammonium persulfate was dissolved in phosphoric acid was dropped to allow the reaction to proceed. After that, the temperature of the solution was increased and the reaction was continued. After the reaction is completed, the liquid phase that is separated into two phases by standing is separated. Toluene is added to the organic phase side, and washed with phosphoric acid and ion-exchanged water to obtain polyaniline Toluene solution of the complex (protonated polyaniline).

除去所得到的複合體溶液中所包含的若干不溶物,而回收聚苯胺複合體之甲苯溶液。將此溶液轉移至蒸發器中,藉由進行加溫及減壓使揮發分蒸發餾去,而得到聚苯胺複合體。 The insoluble matter contained in the obtained composite solution was removed, and the toluene solution of the polyaniline composite was recovered. This solution was transferred to an evaporator, and volatiles were evaporated and distilled off by heating and depressurizing to obtain a polyaniline complex.

聚吡咯之分子量、分子量分布、取代聚吡咯之取代基為與上述聚苯胺相同。 The molecular weight, molecular weight distribution, and substituents of the substituted polypyrrole of polypyrrole are the same as the above-mentioned polyaniline.

作為聚吡咯複合體之摻雜劑,並無特別限制,可適當使用在一般含有吡咯及/或吡咯衍生物之聚合物所成的導電性聚合物中所適合使用的受體性摻雜劑。 The dopant of the polypyrrole complex is not particularly limited, and an acceptor dopant suitable for use in a conductive polymer generally made of a polymer containing pyrrole and / or a pyrrole derivative can be suitably used.

作為代表的種類有:例如聚苯乙烯磺酸、對甲苯磺酸、甲烷磺酸、三氟甲烷磺酸、蒽醌磺酸、苯磺酸、萘磺酸、磺柳酸、十二烷基苯磺酸、烯丙基磺酸等之磺酸類;過氯酸、氯、溴等之鹵素類、路易斯酸、質子酸等。此等可為酸形態,亦可為鹽形態。就對於單體之溶解性之觀點而言,較佳為過氯酸四丁基銨、過氯酸四乙基銨、四氟硼酸四丁基銨、三氟甲烷磺酸四丁基銨、三氟磺醯亞胺四丁基銨、十二烷基苯磺酸、對甲苯磺酸等。 Representative types include: polystyrene sulfonic acid, p-toluene sulfonic acid, methane sulfonic acid, trifluoromethane sulfonic acid, anthraquinone sulfonic acid, benzene sulfonic acid, naphthalene sulfonic acid, sulfosalic acid, dodecylbenzene Sulfonic acids such as sulfonic acid, allyl sulfonic acid, etc .; halogens such as perchloric acid, chlorine, bromine, Lewis acid, protonic acid, etc. These can be in acid form or salt form. From the viewpoint of the solubility of the monomer, tetrabutylammonium perchlorate, tetraethylammonium perchlorate, tetrabutylammonium tetrafluoroborate, tetrabutylammonium trifluoromethanesulfonate, Tetrabutylammonium fluorosulfonamide, dodecylbenzenesulfonic acid, p-toluenesulfonic acid, etc.

使用摻雜劑時之摻雜劑的使用量,以吡咯聚合物單元之每單位,較佳為成為摻雜劑0.01~0.3分子之量。若0.01分子以下時,作為形成足夠的導電性路徑為必須的摻雜劑量會變得不足,難以得到高導電性。另一方面,即使加入0.3分子以上,亦由於摻雜率無法提昇,故0.3分子以上之摻雜劑之添加在經濟上為不宜。在此,所 謂的吡咯聚合物單元單位,指對應於吡咯單體聚合所得到的吡咯聚合物之單體1分子的重複部分。 When the dopant is used, the amount of the dopant used is preferably 0.01 to 0.3 molecules per unit of the pyrrole polymer unit. If it is 0.01 molecules or less, the doping amount necessary to form a sufficient conductive path becomes insufficient, making it difficult to obtain high conductivity. On the other hand, even if 0.3 molecules or more is added, since the doping rate cannot be improved, the addition of 0.3 molecules or more dopants is economically unsuitable. Here, all The so-called pyrrole polymer unit unit refers to a repeating portion corresponding to one molecule of the monomer of the pyrrole polymer obtained by polymerizing the pyrrole monomer.

聚噻吩之分子量、分子量分布、取代聚噻吩之取代基為與上述聚苯胺相同。作為取代聚噻吩,較佳為聚乙烯二氧基噻吩(polyethylenedioxythiophene/PEDOT)。 The molecular weight, molecular weight distribution, and substituents of the substituted polythiophene of polythiophene are the same as those of the above polyaniline. The substituted polythiophene is preferably polyethylenedioxythiophene (PEDOT).

作為聚噻吩複合體之摻雜劑,可舉例陰離子系界面活性劑之有機酸離子、無機酸離子。作為陰離子系界面活性劑之有機酸離子,可舉例磺酸系離子、經酯化之硫酸離子等。作為無機酸離子,可舉例硫酸離子、鹵素離子、硝酸離子、過氯酸離子、六氰鐵酸離子、磷酸離子、磷鉬酸離子等。 Examples of the dopant of the polythiophene complex include organic acid ions and inorganic acid ions of anionic surfactants. Examples of the organic acid ion of the anionic surfactant include sulfonic acid ions and esterified sulfate ions. Examples of inorganic acid ions include sulfate ion, halogen ion, nitric acid ion, perchloric acid ion, hexacyanoferrate ion, phosphoric acid ion, and phosphomolybdate ion.

[胺基甲酸酯樹脂] [Urethane resin]

作為胺基甲酸酯樹脂,可使用例如使聚異氰酸酯與聚醇反應後所得到之物等。 As the urethane resin, for example, a product obtained by reacting polyisocyanate and polyalcohol can be used.

作為聚異氰酸酯,只要至少具有2個以上之異氰酸酯基之化合物,無特別限定並可使用周知之種類。 The polyisocyanate is not particularly limited as long as it has at least two isocyanate groups, and known types can be used.

具體而言,有例如TDI(甲苯二異氰酸酯)系、MDI(二苯基甲烷二異氰酸酯)系、XDI(二甲苯二異氰酸酯)系、NDI(伸萘基1,5-二異氰酸酯)系、TMXDI(四亞甲基二甲苯二異氰酸酯)系等之芳香族系異氰酸酯、IPDI(異佛酮二異氰酸酯)系、H12MDI(氫化MDI、二環己基甲烷二異氰酸酯)系、H6XDI(氫化XDI)系等之 脂環族系異氰酸酯、HDI(六亞甲基二異氰酸酯)系、DDI(二聚物酸二異氰酸酯)系、NBDI(降莰烯‧二異氰酸酯)系等之脂肪族系異氰酸酯等。此等可單獨使用1種,亦可併用2種以上。 Specifically, there are, for example, TDI (toluene diisocyanate), MDI (diphenylmethane diisocyanate), XDI (xylene diisocyanate), NDI (naphthyl 1,5-diisocyanate), TMXDI ( Aromatic isocyanates such as tetramethylene xylene diisocyanate), IPDI (isophorone diisocyanate), H12MDI (hydrogenated MDI, dicyclohexylmethane diisocyanate), H6XDI (hydrogenated XDI), etc. Aliphatic isocyanate such as alicyclic isocyanate, HDI (hexamethylene diisocyanate), DDI (dimer acid diisocyanate), NBDI (norbornene diisocyanate), etc. These can be used alone or in combination of two or more.

又,作為聚醇,可舉出有:聚氧乙二醇、聚氧丙二醇、聚氧基四亞甲基二醇等之聚醚聚醇類、聚己二酸乙二酯(polyethylene adipate)、聚乙烯-己二酸丁二酯(polyethylene-butylene adipate)、聚己內酯等之聚酯聚醇類、丙烯酸系聚醇、聚碳酸酯系聚醇、聚二甲基矽氧烷-環氧乙烷加成物、聚二甲基矽氧烷-環氧丙烷加成物、蓖麻油等。此等可單獨使用1種,亦可併用2種以上。 In addition, examples of the polyalcohol include polyetherpolyols such as polyoxyethylene glycol, polyoxypropylene glycol, and polyoxytetramethylene glycol, polyethylene adipate, and polyethylene adipate. Polyester-polyols such as polyethylene-butylene adipate, polycaprolactone, acrylic polyols, polycarbonate polyols, polydimethylsiloxane-epoxy Ethane adducts, polydimethylsiloxane-propylene oxide adducts, castor oil, etc. These can be used alone or in combination of two or more.

胺基甲酸酯樹脂由於具有柔軟的延伸性,故即使與聚苯胺混合,不損及聚苯胺所具有之延伸追随性。 Because the urethane resin has soft extensibility, even if it is mixed with polyaniline, the extension followability of polyaniline is not impaired.

塗膜中之胺基甲酸酯樹脂之含有量,即,相對於組成物中之導電性聚合物及胺基甲酸酯樹脂之合計,胺基甲酸酯樹脂之比例,較佳為10wt%~90wt%,又較佳為20wt%~80wt%,更佳為30wt%~60wt%,最佳為40wt%~60wt%。 The content of the urethane resin in the coating film, that is, the ratio of the urethane resin to the total of the conductive polymer and the urethane resin in the composition is preferably 10 wt% ~ 90wt%, preferably 20wt% ~ 80wt%, more preferably 30wt% ~ 60wt%, most preferably 40wt% ~ 60wt%.

含有量若過少時,不會展現對基材之黏著性,且有容易剝離之虞。又,若過多時,由於聚苯胺之比例降低,故有鍍敷之析出性變差之虞。 If the content is too small, it will not exhibit adhesion to the substrate and may be easily peeled off. In addition, if the amount is too large, the ratio of polyaniline decreases, so that the precipitation property of plating may deteriorate.

作為胺基甲酸酯樹脂,具體的可舉例HYDRAN AP-20、AP-30F、AP-40F、WLS-213等之HYDRAN系列(DIC公司製)、UCOAT UX-150、UX- 200、UX-310、UWS-145等之UCOAT系列(三洋化成公司製)、Acrit WBR-2018、WBR-016U、WEM-3008等之Acrit系列(大成Fine chemical公司製)、PTG-RSN(DIC Graphics公司製)等。 As the urethane resin, specific examples include HYDRAN series of HYDRAN AP-20, AP-30F, AP-40F, WLS-213 (manufactured by DIC), UCOAT UX-150, UX- 200, UX-310, UWS-145 and other UCOAT series (manufactured by Sanyo Chemicals), Acrit WBR-2018, WBR-016U, WEM-3008 and other Acrit series (manufactured by Dacheng Fine Chemical), PTG-RSN (DIC Graphics Company system) etc.

胺基甲酸酯樹脂係通常具有以下述式所示的構造。 The urethane resin system usually has a structure represented by the following formula.

式中,R及X分別來自於合成胺基甲酸酯樹脂時之單體,係取代或未取代的2價之芳香族烴基、取代或未取代的2價之脂肪族烴基、或1以上的取代或未取代的2價之芳香族烴基與1以上的取代或未取代的2價之脂肪族烴基以任意之順序所鍵結的2價之基。 In the formula, R and X are derived from monomers when synthesizing the urethane resin, respectively, are substituted or unsubstituted divalent aromatic hydrocarbon groups, substituted or unsubstituted divalent aliphatic hydrocarbon groups, or 1 or more A substituted or unsubstituted divalent aromatic hydrocarbon group is a divalent group to which at least one substituted or unsubstituted divalent aliphatic hydrocarbon group is bonded in any order.

作為2價之芳香族烴基,可舉例環形成碳數6~50之芳香族烴基等。具體而言,可舉例伸苯基、伸萘基等。 Examples of the divalent aromatic hydrocarbon group include aromatic hydrocarbon groups having 6 to 50 carbon atoms in the ring. Specifically, phenylene, naphthyl and the like can be mentioned.

作為2價之脂肪族烴基,可舉例碳數6~50之直鏈狀脂肪族烴基、碳數6~50之分支狀脂肪族烴基等。具體而言可舉例亞甲基、伸乙基、伸丙基等。 Examples of the divalent aliphatic hydrocarbon group include a linear aliphatic hydrocarbon group having 6 to 50 carbon atoms, and a branched aliphatic hydrocarbon group having 6 to 50 carbon atoms. Specific examples include methylene, ethylidene, and propylidene.

作為1以上的2價之芳香族烴基與1以上的2價之脂肪族烴基以任意之順序所鍵結的2價之基,可舉例伸苯基與亞甲基所鍵結之基、伸萘基與伸乙基所鍵結之基等。 Examples of the divalent group in which the above 1 divalent aromatic hydrocarbon group and the above 1 divalent aliphatic hydrocarbon group are bonded in any order include a group bonded by phenylene and methylene, and naphthalene. The base to which the ethyl group and ethyl group are bonded, etc.

作為具有取代基時之取代基,可舉例羥基、羧基、硝 基、氰基、胺基等。 Examples of the substituent when having a substituent include a hydroxyl group, a carboxyl group, and a nitro group Group, cyano group, amine group, etc.

本發明之組成物於不損及本發明之效果之範圍內,亦可含有除了導電性聚合物、胺基甲酸酯樹脂及溶劑以外之其他成份,亦可實質上僅由導電性聚合物、胺基甲酸酯樹脂及溶劑、或僅由導電性聚合物、胺基甲酸酯樹脂及溶劑所構成。 The composition of the present invention may contain other components in addition to the conductive polymer, the urethane resin and the solvent, as long as the effect of the present invention is not impaired, or may consist essentially of the conductive polymer, The urethane resin and the solvent, or consist only of the conductive polymer, the urethane resin and the solvent.

在此,所謂「實質上」係指組成物之95重量%以上100重量%以下(較佳為98重量%以上100重量%以下)為導電性聚合物、胺基甲酸酯樹脂及溶劑之意。 Here, "substantially" means that 95% by weight or more and 100% by weight or less (preferably 98% by weight or more and 100% by weight or less) of the composition is a conductive polymer, a urethane resin and a solvent .

作為其他成份,可舉例後述之酚性化合物、耐熱安定化劑等。 Examples of other components include phenolic compounds and heat-resistant stabilizers described later.

本發明之組成物作為導電性聚合物包含聚苯胺複合體時,再者包含著酚性化合物亦可。 When the composition of the present invention contains a polyaniline composite as a conductive polymer, it may further contain a phenolic compound.

酚性化合物只要具有酚性羥基之化合物即可,並無特別限定。所謂具有酚性羥基之化合物係指,如具有1個酚性羥基之化合物、具有複數個酚性羥基之化合物、及由具有1個或複數個酚性羥基之重複單元所構成之聚合物化合物。 The phenolic compound is not particularly limited as long as it has a phenolic hydroxyl group. The compound having a phenolic hydroxyl group means, for example, a compound having one phenolic hydroxyl group, a compound having a plurality of phenolic hydroxyl groups, and a polymer compound composed of a repeating unit having one or more phenolic hydroxyl groups.

具有1個酚性羥基之化合物,較佳為以下述式(A)、(B)及(C)所示之化合物。 The compound having one phenolic hydroxyl group is preferably a compound represented by the following formulas (A), (B), and (C).

(式中,n為1~5之整數,較佳為1~3,又較佳為1。 (In the formula, n is an integer of 1 to 5, preferably 1 to 3, and more preferably 1.

R為碳數1~20之烷基、烯基、環烷基、芳基、烷基芳基或芳基烷基)。 R is alkyl having 1 to 20 carbons, alkenyl, cycloalkyl, aryl, alkylaryl or arylalkyl).

以式(A)所示的酚性化合物中,-OR的取代位置較佳為相對於酚性羥基為間位、或對位。藉由使-OR的取代位置設為間位或對位,可減低酚性羥基之立體阻礙且更提高組成物之導電性。 In the phenolic compound represented by formula (A), the substitution position of -OR is preferably meta or para to the phenolic hydroxyl group. By setting the substitution position of -OR to the meta or para position, the steric hindrance of the phenolic hydroxyl group can be reduced and the conductivity of the composition can be further improved.

作為式(A)所表示之酚性化合物之具體例,舉例如甲氧基苯酚(例如4-甲氧基苯酚)、乙氧基苯酚、丙氧基苯酚、異丙氧基苯酚、丁氧基苯酚、異丁氧基苯酚、第三丁氧基苯酚。 Specific examples of the phenolic compound represented by formula (A) include methoxyphenol (eg 4-methoxyphenol), ethoxyphenol, propoxyphenol, isopropoxyphenol, butoxy Phenol, isobutoxyphenol, and third butoxyphenol.

(式中,n為0~7之整數,較佳為0~3,又較佳為1。 (In the formula, n is an integer of 0 ~ 7, preferably 0 ~ 3, and more preferably 1.

R分別為碳數1~20之烷基、烯基、烷硫基、碳數3~10之環烷基、碳數6~20之芳基、烷基芳基或芳基烷基)。 R is respectively an alkyl group having 1 to 20 carbon atoms, an alkenyl group, an alkylthio group, a cycloalkyl group having 3 to 10 carbon atoms, an aryl group, an alkylaryl group or an arylalkyl group having 6 to 20 carbon atoms).

作為以式(B)所示之酚性化合物的具體例,可舉例 羥基萘。 As a specific example of the phenolic compound represented by the formula (B), there can be exemplified Hydroxynaphthalene.

(式中,n為1~5之整數,較佳為1~3,又較佳為1。 (In the formula, n is an integer of 1 to 5, preferably 1 to 3, and more preferably 1.

R分別為碳數1~20之烷基、烯基、烷硫基、碳數3~10之環烷基、碳數6~20之芳基、烷基芳基或芳基烷基)。 R is respectively an alkyl group having 1 to 20 carbon atoms, an alkenyl group, an alkylthio group, a cycloalkyl group having 3 to 10 carbon atoms, an aryl group, an alkylaryl group or an arylalkyl group having 6 to 20 carbon atoms).

作為以式(C)所示之化合物的具體例,可舉例o-、m-或p-甲酚、o-、m-或p-乙基苯酚、o-、m-或p-丙基苯酚(例如4-異丙基苯酚)、o-、m-或p-丁基苯酚、o-、m-或p-戊基苯酚(例如4-tert-戊基苯酚)。 As a specific example of the compound represented by the formula (C), o-, m- or p-cresol, o-, m- or p-ethylphenol, o-, m- or p-propylphenol can be exemplified (Eg 4-isopropylphenol), o-, m- or p-butylphenol, o-, m- or p-pentylphenol (eg 4-tert-pentylphenol).

關於式(A)、(B)及(C)之R,作為碳數1~20之烷基,可舉例甲基、乙基、丙基、異丙基、丁基、異丁基、第三丁基等。 Regarding R of the formulas (A), (B) and (C), as the alkyl group having 1 to 20 carbon atoms, there can be exemplified methyl, ethyl, propyl, isopropyl, butyl, isobutyl, third Butyl and so on.

作為烯基,可舉例於上述烷基之分子內具有不飽和鍵結之基。 As the alkenyl group, a group having an unsaturated bond in the molecule of the above alkyl group can be exemplified.

作為環烷基,可舉例環戊烷、環己烷等。 Examples of cycloalkyl groups include cyclopentane and cyclohexane.

作為芳基,可舉例苯基、萘基等。 Examples of the aryl group include phenyl and naphthyl.

作為烷基芳基、及芳基烷基,可舉例組合上述烷基與 芳基後所得到的基等。 As the alkylaryl group and the arylalkyl group, the above-mentioned alkyl group and After the aryl group and so on.

表示上述具有1個酚性羥基之化合物之例,但,作為取代酚類的具體例,可舉例苯酚、o-、m-或p-氯苯酚、水楊酸、羥基苯甲酸。作為具有複數個酚性羥基之化合物的具體例,可舉例鄰苯二酚、間苯二酚、以下述式(D)所示的化合物。 An example of the above compound having one phenolic hydroxyl group is shown, but specific examples of substituted phenols include phenol, o-, m- or p-chlorophenol, salicylic acid, and hydroxybenzoic acid. Specific examples of the compound having a plurality of phenolic hydroxyl groups include catechol, resorcinol, and compounds represented by the following formula (D).

(式中,R為烴基、含有雜原子之烴基、鹵素原子、羧酸基、胺基、SH基、磺酸基、或羥基,複數個R可分別互為相同或相異。n為0~6之整數)。 (In the formula, R is a hydrocarbon group, a hydrocarbon group containing a heteroatom, a halogen atom, a carboxylic acid group, an amine group, a SH group, a sulfonic acid group, or a hydroxyl group, and a plurality of R may be the same or different from each other. N is 0 ~ An integer of 6).

以式(D)所示之酚性化合物,較佳為具有不相互鄰接之2個以上羥基。 The phenolic compound represented by formula (D) preferably has two or more hydroxyl groups that are not adjacent to each other.

又,作為以式(D)所示之酚性化合物的具體例,可舉例1,6-萘二醇、2,6-萘二醇、2,7-萘二醇。 In addition, specific examples of the phenolic compound represented by the formula (D) include 1,6-naphthalenediol, 2,6-naphthalenediol, and 2,7-naphthalenediol.

作為由具有1個或複數個酚性羥基之重複單元所構成之聚合物化合物的具體例,可舉例酚樹脂、聚酚、聚(羥基苯乙烯)。 Specific examples of the polymer compound composed of a repeating unit having one or more phenolic hydroxyl groups include phenol resin, polyphenol, and poly (hydroxystyrene).

本發明之組成物若包含作為導電性聚合物之聚苯胺複合體時,酚性化合物之含有量,相對於聚苯胺複合體1g,酚性化合物之莫耳濃度較佳為0.01[mmol/g]以上 100[mol/g]以下,又較佳為0.05[mmol/g]以上1[mol/g]以下,更佳為0.1[mmol/g]以上500[mmol/g]以下,特佳為0.2[mmol/g]以上80[mmol/g」以下的範圍。 When the composition of the present invention contains a polyaniline complex as a conductive polymer, the content of the phenolic compound is preferably 0.01 [mmol / g] relative to 1 g of the polyaniline complex. the above 100 [mol / g] or less, preferably 0.05 [mmol / g] or more and 1 [mol / g] or less, more preferably 0.1 [mmol / g] or more and 500 [mmol / g] or less, particularly preferably 0.2 [ mmol / g] to 80 [mmol / g "or less.

酚性化合物之含有量若過少時,有無法得到電導率之改善效果之虞。另一方面,酚性化合物之含有量若過多時,膜質有變差之虞。又,除去揮發之際,須要大量的熱或時間等之勞力而使成本增加。 If the content of the phenolic compound is too small, there is a possibility that the effect of improving the electrical conductivity cannot be obtained. On the other hand, if the content of the phenolic compound is too large, the film quality may deteriorate. In addition, when removing the volatilization, a lot of labor such as heat or time is required to increase the cost.

本發明之組成物若包含作為導電性聚合物之聚苯胺複合體時,亦可進而包含耐熱安定化劑。 When the composition of the present invention contains a polyaniline composite as a conductive polymer, it may further contain a heat-resistant stabilizer.

所謂耐熱安定化劑係指酸性物質或酸性物質之鹽,且酸性物質為有機酸(有機化合物的酸)、無機酸(無機化合物的酸)之任一種亦可。又,導電性聚合物層亦可包含複數個耐熱安定化劑。 The heat-resistant stabilizer refers to an acidic substance or a salt of an acidic substance, and the acidic substance may be any of an organic acid (acid of an organic compound) and an inorganic acid (acid of an inorganic compound). In addition, the conductive polymer layer may contain a plurality of heat-resistant stabilizers.

本發明之組成物若僅包含作為耐熱安定化劑之酸性物質時,該酸性物質較佳為與聚苯胺複合體之質子供給體為相異之化合物;而本發明之組成物若僅包含作為耐熱安定化劑之酸性物質之鹽時,該酸性物質之鹽較佳為與聚苯胺複合體之質子供給體為相異之化合物。 If the composition of the present invention contains only an acidic substance as a heat-resistant stabilizer, the acidic substance is preferably a compound different from the proton donor of the polyaniline complex; and if the composition of the present invention contains only an acid-resistant substance When the salt of the acidic substance of the stabilizer is used, the salt of the acidic substance is preferably a compound different from the proton donor of the polyaniline complex.

又,本發明之組成物若包含作為耐熱安定化劑之酸性物質及酸性物質之鹽雙方時,較佳為於該酸性物質及酸性物質之鹽中,至少1個為與質子供給體為相異的化合物。 Moreover, when the composition of the present invention contains both an acidic substance and a salt of an acidic substance as a heat-resistant stabilizer, it is preferable that at least one of the acidic substance and the salt of the acidic substance is different from the proton donor compound of.

本發明之組成物若僅包含作為耐熱安定化劑之酸性物質時,較佳為該酸性物質與酚性化合物為相異;本發明之組成物若僅包含作為耐熱安定化劑之酸性物質之 鹽時,較佳為該酸性物質之鹽與酚性化合物為相異。 If the composition of the present invention contains only an acidic substance as a heat-resistant stabilizer, it is preferable that the acidic substance and the phenolic compound are different; if the composition of the present invention contains only an acidic substance as a heat-resistant stabilizer, In the case of salts, it is preferable that the salt of the acidic substance is different from the phenolic compound.

又,對於本發明之組成物若包含作為耐熱安定化劑之酸性物質及酸性物質之鹽雙方時,較佳為於該酸性物質及酸性物質之鹽中,至少1個為與酚性化合物為相異。 Moreover, when the composition of the present invention contains both an acidic substance and a salt of an acidic substance as a heat-resistant stabilizer, it is preferable that at least one of the acidic substance and the salt of the acidic substance be in phase with the phenolic compound different.

耐熱安定化劑之酸性物質,較佳為有機酸,又較佳為具有1個以上的磺酸基、羧基、磷酸基、或膦酸基之有機酸,更佳為具有1個以上的磺酸基之有機酸。 The acidic substance of the heat-resistant stabilizer is preferably an organic acid, and more preferably an organic acid having one or more sulfonic acid groups, carboxyl groups, phosphoric acid groups, or phosphonic acid groups, more preferably one or more sulfonic acids Based organic acids.

上述具有1個以上的磺酸基之有機酸,較佳為具有1個以上的磺酸基之環狀、鏈狀或分支狀之烷基磺酸、取代或未取代的芳香族磺酸、或聚磺酸。 The organic acid having at least one sulfonic acid group is preferably a cyclic, chain or branched alkyl sulfonic acid having one or more sulfonic acid groups, a substituted or unsubstituted aromatic sulfonic acid, or Polysulfonic acid.

作為上述烷基磺酸,可舉例例如甲烷磺酸、乙烷磺酸、二2-乙基己基磺基琥珀酸。在此的烷基較佳為碳數1~18之直鏈或分支之烷基。 Examples of the alkylsulfonic acid include methanesulfonic acid, ethanesulfonic acid, and di-2-ethylhexylsulfosuccinic acid. The alkyl group here is preferably a linear or branched alkyl group having 1 to 18 carbon atoms.

作為上述芳香族磺酸,可舉例例如具有苯環之磺酸、具有萘骨格之磺酸、具有蒽骨格之磺酸、取代或未取代的苯磺酸、取代或未取代的萘磺酸及取代或未取代的蒽磺酸,較佳為萘磺酸。作為具體例可舉例萘磺酸、十二烷基苯磺酸、蒽醌磺酸。 Examples of the aromatic sulfonic acid include sulfonic acid having a benzene ring, sulfonic acid having a naphthalene skeleton, sulfonic acid having an anthracene skeleton, substituted or unsubstituted benzenesulfonic acid, substituted or unsubstituted naphthalenesulfonic acid, and substituted Or unsubstituted anthracene sulfonic acid, preferably naphthalene sulfonic acid. Specific examples include naphthalenesulfonic acid, dodecylbenzenesulfonic acid, and anthraquinonesulfonic acid.

作為取代基,例如選自由:烷基、烷氧基、羥基、硝基、羧基、醯基所構成群之取代基,可由1個以上取代。 As the substituent, for example, a substituent selected from the group consisting of alkyl, alkoxy, hydroxyl, nitro, carboxy, and acetyl may be substituted with one or more.

上述聚磺酸為於高分子鏈之主鏈或側鏈上經複數個的磺酸基所取代之磺酸。可舉例例如聚苯乙烯磺酸。 The above polysulfonic acid is a sulfonic acid substituted with a plurality of sulfonic acid groups on the main chain or side chain of the polymer chain. Examples are polystyrene sulfonic acid.

上述具有1個以上的羧基之有機酸,較佳為具有1個以上的羧基之環狀、鏈狀或分支狀之烷基羧酸、 取代或未取代的芳香族羧酸、或聚羧酸。 The organic acid having more than one carboxyl group is preferably a cyclic, chain or branched alkyl carboxylic acid having more than one carboxyl group, Substituted or unsubstituted aromatic carboxylic acid, or polycarboxylic acid.

作為上述烷基羧酸,可舉例例如十一烯酸、環己烷羧酸、2-乙基己烷酸。在此,烷基較佳為碳數1~18之直鏈或分支之烷基。 Examples of the alkyl carboxylic acid include undecylenic acid, cyclohexanecarboxylic acid, and 2-ethylhexanecarboxylic acid. Here, the alkyl group is preferably a linear or branched alkyl group having 1 to 18 carbon atoms.

作為上述取代或未取代的芳香族羧酸,可舉例例如取代或未取代的苯羧酸及萘羧酸。在此,取代基為例如選自由:磺酸基、烷基、烷氧基、羥基、硝基、醯基所構成群之取代基,可由1個以上取代。作為具體例,可舉例水楊酸、苯甲酸、萘甲酸、均苯三甲酸。 Examples of the substituted or unsubstituted aromatic carboxylic acid include substituted or unsubstituted benzene carboxylic acid and naphthalene carboxylic acid. Here, the substituent is, for example, a substituent selected from the group consisting of: sulfonic acid group, alkyl group, alkoxy group, hydroxyl group, nitro group, and acetyl group, and may be substituted by one or more. As specific examples, salicylic acid, benzoic acid, naphthoic acid, trimesic acid can be mentioned.

具有1個以上的上述磷酸基或膦酸基之有機酸,較佳為具有1個以上的磷酸基或膦酸基之環狀、鏈狀或分支狀之烷基磷酸或烷基膦酸;取代或未取代的芳香族磷酸或芳香族膦酸;聚磷酸或聚膦酸。 Organic acids having more than one phosphoric acid group or phosphonic acid group, preferably cyclic, chain or branched alkyl phosphoric acid or alkylphosphonic acid having more than one phosphoric acid group or phosphonic acid group; substitution Or unsubstituted aromatic phosphoric acid or aromatic phosphonic acid; polyphosphoric acid or polyphosphonic acid.

作為上述烷基磷酸或烷基膦酸,可舉例例如十二烷基磷酸、磷酸氫雙(2-乙基己基)。在此,烷基較佳為碳數1~18之直鏈或分支之烷基。 Examples of the aforementioned alkyl phosphoric acid or alkyl phosphonic acid include dodecyl phosphoric acid and bis (2-ethylhexyl hydrogen phosphate). Here, the alkyl group is preferably a linear or branched alkyl group having 1 to 18 carbon atoms.

作為上述芳香族磷酸及芳香族膦酸,可舉例取代或未取代的苯磺酸或膦酸、及萘磺酸或膦酸等。作為取代基為例如選自由:烷基、烷氧基、羥基、硝基、羧基、醯基所構成群之取代基,可由1個以上取代。可舉例例如苯基膦酸。 Examples of the aromatic phosphoric acid and aromatic phosphonic acid include substituted or unsubstituted benzenesulfonic acid or phosphonic acid, naphthalenesulfonic acid or phosphonic acid, and the like. The substituent is, for example, a substituent selected from the group consisting of alkyl, alkoxy, hydroxy, nitro, carboxy, and acetyl, and may be substituted with one or more. Examples include phenylphosphonic acid.

作為包含本發明之組成物之酸性物質之鹽,可舉例如上述酸性物質之鹽。 Examples of the salt of the acidic substance containing the composition of the present invention include the salts of the above-mentioned acidic substances.

本發明之組成物亦可包含2個以上的耐熱安定化劑之 酸性物質及/或酸性物質之鹽。具體而言,本發明之組成物亦可包含相異的複數個的酸性物質及/或相異的複數個酸性物質之鹽。 The composition of the present invention may also contain more than two heat-resistant stabilizers Acidic substances and / or salts of acidic substances. Specifically, the composition of the present invention may contain a plurality of different acidic substances and / or a salt of different plurality of acidic substances.

聚苯胺複合體之質子供給體為磺酸,且本發明之組成物若僅包含作為耐熱安定化劑之酸性物質時,該酸性物質較佳為與質子供給體相同或相異的磺酸。又,本發明之組成物若僅包含作為耐熱安定化劑之酸性物質之鹽時,該酸性物質之鹽較佳為與聚苯胺複合體之質子供給體為相同或相異的磺酸之鹽。 The proton donor of the polyaniline complex is sulfonic acid, and if the composition of the present invention contains only an acidic substance as a heat-resistant stabilizer, the acidic substance is preferably the same or different sulfonic acid as the proton donor. In addition, when the composition of the present invention contains only a salt of an acid substance as a heat-resistant stabilizer, the salt of the acid substance is preferably a salt of sulfonic acid which is the same as or different from the proton donor of the polyaniline complex.

對於本發明之組成物若包含作為耐熱安定化劑之酸性物質及前述酸性物質之鹽時,酸性物質及酸性物質之鹽中,至少1個較佳為與質子供給體為相同或相異的磺酸或磺酸之鹽。 When the composition of the present invention contains an acidic substance as a heat-resistant stabilizer and a salt of the aforementioned acidic substance, at least one of the acidic substance and the salt of the acidic substance is preferably the same or different sulfonate as the proton donor Salt of acid or sulfonic acid.

本發明之組成物若僅包含作為耐熱安定化劑之磺酸時,較佳為符合式(12);本發明之組成物若僅包含作為耐熱安定化劑之磺酸之鹽時,較佳為符合式(13);本發明之組成物若包含作為耐熱安定化劑之磺酸及磺酸之鹽時,較佳為符合式(14)。 If the composition of the present invention contains only sulfonic acid as a heat-resistant stabilizer, it is preferably in accordance with formula (12); if the composition of the present invention contains only a salt of sulfonic acid as a heat-resistant stabilizer, it is preferably It meets formula (13); when the composition of the present invention contains sulfonic acid and a salt of sulfonic acid as a heat-resistant stabilizer, it preferably conforms to formula (14).

0.01≦S2/N2≦0.5 (12) 0.01 ≦ S 2 / N 2 ≦ 0.5 (12)

0.01≦S3/N3≦0.5 (13) 0.01 ≦ S 3 / N 3 ≦ 0.5 (13)

0.01≦S4/N4≦0.5 (14) 0.01 ≦ S 4 / N 4 ≦ 0.5 (14)

(在此,S2為本發明之組成物中所含全部的酸性物質之硫原子的莫耳數之合計,N2為本發明之組成物中所含全部的聚苯胺複合體之氮原子的莫耳數之合計之意;S3為 本發明之組成物中所含全部的酸性物質之鹽之硫原子的莫耳數之合計,N3為本發明之組成物中所含全部的聚苯胺複合體之氮原子的莫耳數之合計之意;S4為本發明之組成物中所含全部的酸性物質及酸性物質之鹽之硫原子的莫耳數之合計,N4為本發明之組成物中所含全部的聚苯胺複合體之氮原子的莫耳數之合計之意)。 (Here, S 2 is the total number of moles of sulfur atoms of all acidic substances contained in the composition of the present invention, and N 2 is of all nitrogen atoms of the polyaniline complex contained in the composition of the present invention The total number of moles means; S 3 is the total number of moles of sulfur atoms of the salts of all acidic substances contained in the composition of the invention, and N 3 is the total polyaniline contained in the composition of the invention the molar sum of the number of nitrogen atoms composite meaning; the total number of S 4 molar composition of the present invention, the salt of the sulfur atom contained in all of the acidic substance and the acidic substance, N 4 of the present invention (The total number of moles of nitrogen atoms of all polyaniline complexes contained in the composition means).

本發明之組成物若符合上述式(12)、(13)或(14)中任一項時,該組成物較佳為進而符合下述式(11)。 When the composition of the present invention satisfies any of the above formulas (12), (13) or (14), the composition preferably further satisfies the following formula (11).

0.36≦S1/N1≦1.15 (11) 0.36 ≦ S 1 / N 1 ≦ 1.15 (11)

(在此,S1為本發明之組成物中所含硫原子的莫耳數,N1為本發明之組成物中所含氮原子的莫耳數之意)。 (Here, S 1 is the number of moles of sulfur atoms contained in the composition of the present invention, and N 1 is the number of moles of nitrogen atoms contained in the composition of the present invention).

本發明之組成物若僅包含酸性物質時,該酸性物質之酸性度(pKa)較佳為5.0以下。尚,雖然酸度之下限未特別限制,但在包含例如酸度為-4.0以下之酸性物質時,聚苯胺複合體有劣化之虞。 When the composition of the present invention contains only an acidic substance, the acidity (pKa) of the acidic substance is preferably 5.0 or less. Although the lower limit of the acidity is not particularly limited, when an acidic substance having an acidity of -4.0 or less is included, for example, the polyaniline composite may deteriorate.

當本發明之組成物為僅包含酸性物質之鹽時,該酸性物質之鹽之酸性度較佳為5.0以下。對於酸性度的下限,與上述酸性物質為相同。 When the composition of the present invention is a salt containing only an acidic substance, the acidity of the salt of the acidic substance is preferably 5.0 or less. The lower limit of the acidity is the same as the above-mentioned acidic substance.

若本發明之組成物若包含酸性物質及酸性物質之鹽之雙方時,較佳為符合該酸性物質之酸性度為5.0以下,及酸性度為5.0以下的酸性物質之鹽中至少1個。對於酸性度的下限與上述為相同。 If the composition of the present invention includes both the acidic substance and the salt of the acidic substance, it is preferable that at least one of the salts conforming to the acidity of the acidic substance has an acidity of 5.0 or less and an acidity of 5.0 or less. The lower limit for acidity is the same as described above.

酸性度(pKa)係藉由計算化學法所定義。即,使用如Journal of Physical Chemistry之1995年,第99卷,p.2224中所記載之方法:藉由A.Klamt等人所開發出的量子化學計算,計算出分子表面之電荷密度,以算出異種分子間之相互作用而作為活性係數。 Acidity (pKa) is defined by computational chemistry. That is, using the method described in the Journal of Physical Chemistry, 1995, Vol. 99, p. 2224: by the quantum chemistry calculation developed by A. Klamt et al., The charge density on the molecular surface is calculated to calculate The interaction between heterogeneous molecules serves as the activity coefficient.

具體而言,使用「TURBOMOLE Version 6.1」(COSMO logic公司製造),基底函數使用TZVP,使結構最佳化,使用該結構,利用「COSMO therm Version C2.1 Release 01.10」(COSMO logic公司製造)進行COSMO-RS法計算。 Specifically, use "TURBOMOLE Version 6.1" (manufactured by COSMO logic company), and use TZVP as the basis function to optimize the structure. Using this structure, use "COSMO therm Version C2.1 Release 01.10" (manufactured by COSMO logic company) COSMO-RS method calculation.

在此,對「COSMO therm Version C2.1 Release 01.10」中輸入25℃之水溶劑中的條件、分子之化學式、及脫質子之分子之化學式,而可算出pKa。 Here, enter "COSMO therm Version C2.1 Release 01.10" in 25 ℃ water solvent conditions, molecular formula, and deprotonated molecule chemical formula to calculate pKa.

本發明之組成物中,耐熱安定化劑之含有量,相對於聚苯胺複合體100質量份,較佳為1~1000質量份,又較佳為10~100質量份。 In the composition of the present invention, the content of the heat-resistant stabilizer is preferably 1 to 1000 parts by mass, and more preferably 10 to 100 parts by mass relative to 100 parts by mass of the polyaniline composite.

溶劑可為有機溶劑,亦可為水等之無機溶劑,又,單獨1種甚至2種以上之混合溶劑亦可。較佳為有機溶劑。 The solvent may be an organic solvent, an inorganic solvent such as water, or a single solvent or a mixed solvent of two or more. Organic solvents are preferred.

又,有機溶劑為水溶性有機溶劑,亦可是實質上不混和於水中之有機溶劑(水不混和性有機溶劑)。 In addition, the organic solvent is a water-soluble organic solvent, or an organic solvent that is substantially immiscible in water (a water-immiscible organic solvent).

上述水溶性有機溶劑為質子性極性溶劑,亦可為非質子性極性溶劑,可舉例例如異丙醇、1-丁醇、2-丁醇、2-戊醇、苄醇等之醇類;丙酮等之酮類;四氫呋 喃、二噁烷等之醚類;N甲基吡咯啶酮等之非質子性極性溶劑等。 The water-soluble organic solvent is a protic polar solvent or an aprotic polar solvent, such as isopropyl alcohol, 1-butanol, 2-butanol, 2-pentanol, benzyl alcohol and other alcohols; acetone Ketones; tetrahydrofuran Ethers such as pyran and dioxane; aprotic polar solvents such as N-methylpyrrolidone.

作為上述水不混和性有機溶劑,可舉例例如苯、甲苯、二甲苯、乙基苯、四氫萘等之烴系溶劑;氯化甲烷(methylene dichloride)、氯仿、四氯化碳、二氯乙烷、四氯乙烷等之含鹵素系溶劑;乙酸乙酯、乙酸異丁酯、乙酸n-丁酯等之酯系溶劑;甲基異丁基酮、甲基乙基酮、環戊酮、環己酮等之酮類溶劑;環戊基甲基醚等之醚類溶劑等。此等之中,就對於所摻雜的聚苯胺之溶解性為優異之點,較佳為甲苯、二甲苯、甲基異丁基酮(MIBK)、氯仿、三氯乙烷及乙酸乙酯。 Examples of the water-immiscible organic solvents include hydrocarbon solvents such as benzene, toluene, xylene, ethylbenzene, and tetrahydronaphthalene; methylene dichloride, chloroform, carbon tetrachloride, and dichloroethane Halogen-containing solvents such as alkane and tetrachloroethane; ester solvents such as ethyl acetate, isobutyl acetate, and n-butyl acetate; methyl isobutyl ketone, methyl ethyl ketone, cyclopentanone, Ketone solvents such as cyclohexanone; ether solvents such as cyclopentyl methyl ether. Among these, the solubility to the doped polyaniline is excellent, and toluene, xylene, methyl isobutyl ketone (MIBK), chloroform, trichloroethane, and ethyl acetate are preferable.

作為溶劑為使用有機溶劑時,藉由使用水不混和性有機溶劑與水溶性有機溶劑為以99~50:1~50(質量比)混合之混合有機溶劑,可防止保存時之凝膠等之發生,由於可長期保存,故宜。 When the organic solvent is used as the solvent, the water-immiscible organic solvent and the water-soluble organic solvent are mixed organic solvents mixed in a range of 99-50: 1-50 (mass ratio) to prevent gels during storage, etc. Occurred because it can be stored for a long time, so it is appropriate.

作為上述混合有機溶劑之水不混和性有機溶劑,可使用低極性有機溶劑,該低極性有機溶劑較佳為甲苯或氯仿。又,作為混合有機溶劑之水溶性有機溶劑,可使用高極性有機溶劑,較佳為例如甲醇、乙醇、異丙醇、2-甲氧基乙醇、2-乙氧基乙醇、二丙酮醇、3-甲氧基-1-丁醇、3-甲基-3-甲氧基-1-丁醇、乙基卡必醇、丁基卡必醇、丙酮、甲基乙基酮、甲基異丁基酮、四氫呋喃或二乙基醚。 As the water-immiscible organic solvent of the mixed organic solvent, a low-polarity organic solvent can be used, and the low-polarity organic solvent is preferably toluene or chloroform. In addition, as the water-soluble organic solvent of the mixed organic solvent, a highly polar organic solvent can be used, preferably, for example, methanol, ethanol, isopropanol, 2-methoxyethanol, 2-ethoxyethanol, diacetone alcohol, 3 -Methoxy-1-butanol, 3-methyl-3-methoxy-1-butanol, ethyl carbitol, butyl carbitol, acetone, methyl ethyl ketone, methyl isobutyl Ketone, tetrahydrofuran or diethyl ether.

溶劑中之導電性聚合物之比例,依溶劑之種類通常為900g/kg以下,較佳為0.01g/kg以上300g/kg以 下,又較佳為10g/kg以上300g/kg以下,更佳為30g/kg以上300g/kg以下的範圍。 The proportion of the conductive polymer in the solvent is usually 900g / kg or less, preferably 0.01g / kg or more and 300g / kg according to the type of solvent It is further preferably in the range of 10 g / kg or more and 300 g / kg or less, and more preferably 30 g / kg or more and 300 g / kg or less.

導電性聚合物之含有量若過多時,會變得無法保持溶液狀態,且成形為成形體時之操作變為困難而損及成形體之均勻性,進而有產生降低成形體之電氣特性或機械的強度、透明性之虞。另一方面,導電性聚合物之含有量若過少時,藉由後述之方法成膜時,只能製造非常薄之膜,均勻的導電性膜之製造有變困難之虞。 If the content of the conductive polymer is too large, it will become impossible to maintain the state of the solution, and the operation when forming into a molded body becomes difficult, and the uniformity of the molded body is impaired, which further reduces the electrical characteristics or mechanical properties of the molded body The strength and transparency of the product. On the other hand, if the content of the conductive polymer is too small, when the film is formed by the method described later, only a very thin film can be produced, and the production of a uniform conductive film may become difficult.

本發明之組成物亦可進而包含其他的樹脂、無機材料、硬化劑、可塑劑、有機導電材料等之添加劑。 The composition of the present invention may further contain additives such as other resins, inorganic materials, hardeners, plasticizers, organic conductive materials, and the like.

作為其他的樹脂,可舉例例如黏合劑基材、可塑劑、矩陣基材等。 Examples of other resins include adhesive base materials, plasticizers, and matrix base materials.

作為其他的樹脂的具體例,可舉例例如聚乙烯或聚丙烯等之聚烯烴、氯化聚烯烴、聚苯乙烯、聚酯、聚醯胺、聚縮醛、聚對苯二甲酸乙二酯、聚碳酸酯、聚乙二醇、聚環氧乙烷、聚丙烯酸、聚丙烯酸酯、聚甲基丙烯酸酯、聚乙烯醇。 As specific examples of other resins, polyolefins such as polyethylene or polypropylene, chlorinated polyolefins, polystyrene, polyester, polyamide, polyacetal, polyethylene terephthalate, Polycarbonate, polyethylene glycol, polyethylene oxide, polyacrylic acid, polyacrylate, polymethacrylate, polyvinyl alcohol.

又,以代替上述樹脂,或與上述樹脂一併使用,而可包含能形成環氧樹脂、胺基甲酸酯樹脂、酚樹脂等之熱硬化性樹脂、或此等熱硬化性樹脂之前驅物。 In addition, instead of or in combination with the above-mentioned resin, it may contain a thermosetting resin capable of forming an epoxy resin, urethane resin, phenol resin, etc., or a precursor of such thermosetting resin .

無機材料係以例如為了提升強度、表面硬度、尺寸穩定性之其他的機械的物性、或提升導電性等之電氣特性之目的而添加。 The inorganic material is added for the purpose of improving electrical properties such as strength, surface hardness, dimensional stability of other mechanical properties, or electrical conductivity.

作為無機材料的具體例,可舉例例如二氧化矽 (silica)、二氧化鈦(titania)、氧化鋁(alumina)、含有Sn之In2O3(ITO)、含有Zn之In2O3、In2O3之共取代化合物(4價元素及2價元素為經3價之In所取代之氧化物)、含有Sb之SnO2(ATO)、ZnO、含有Al之ZnO(AZO)、含有Ga之ZnO(GZO)等。 Specific examples of the inorganic material can be exemplified, for example, silicon dioxide (Silica), titania (Titania), aluminum oxide (Alumina), the Sn-containing In 2 O 3 (ITO), the Zn-containing In 2 O 3, In 2 O Co-substituted compounds of 3 (4-valent elements and divalent elements are oxides substituted with trivalent In), SnO 2 (ATO) containing Sb, ZnO, ZnO containing Al (AZO), ZnO containing Ga ( GZO) etc.

硬化劑係以例如為了提升強度、表面硬度、尺寸穩定性之其他的機械的物性等之目的而所添加。作為硬化劑的具體例,可舉例例如酚樹脂等之熱硬化劑、由丙烯酸酯系單體與光聚合性起始劑所得到的光硬化劑。 The hardener is added, for example, for the purpose of improving strength, surface hardness, dimensional stability and other mechanical properties. Specific examples of the curing agent include a thermal curing agent such as a phenol resin, and a photo curing agent obtained from an acrylate monomer and a photopolymerizable initiator.

可塑劑係以例如為了提升拉伸強度或彎曲強度等之機械的特性等之目的而所添加。 The plasticizer is added for the purpose of improving mechanical properties such as tensile strength and bending strength.

作為可塑劑的具體例,可舉例例如鄰苯二甲酸酯類或磷酸酯類。 As specific examples of the plasticizer, for example, phthalates or phosphates can be mentioned.

作為有機導電材料,可舉例碳黑、如奈米碳管的碳材料、或除了以本發明所得到的聚苯胺以外的導電性聚合物等。 Examples of the organic conductive material include carbon black, carbon materials such as carbon nanotubes, and conductive polymers other than polyaniline obtained by the present invention.

[無電解鍍敷底層膜] [Electroless plating bottom film]

本發明之無電解鍍敷底層膜(層)係由上述的組成物所得到的。本發明之無電解鍍敷底層膜之形成方法為如同後述。 The electroless plating underlayer film (layer) of the present invention is obtained from the above composition. The method of forming the electroless plating underlayer film of the present invention is as described later.

無電解鍍敷底層膜之乾燥膜厚,較佳為0.1μm以上,又較佳為0.2μm以上。當膜厚未達0.1μm時,由於無法保持基材與鍍敷膜之黏著力,故變得容易剝離。又,未載持 Pd金屬之區域有變多之虞,而無法被無電解鍍敷之區域有變多之虞。 The dry film thickness of the electroless plating underlayer film is preferably 0.1 μm or more, and more preferably 0.2 μm or more. When the film thickness is less than 0.1 μm, the adhesion between the base material and the plating film cannot be maintained, so it becomes easy to peel off. Also, unsupported The area of Pd metal may increase, and the area that cannot be electrolessly plated may increase.

乾燥膜厚之上限未特別限定,例如100μm以下、10μm以下、5.0μm以下。 The upper limit of the dry film thickness is not particularly limited, and is, for example, 100 μm or less, 10 μm or less, and 5.0 μm or less.

[無電解鍍敷底層膜之製造方法] [Manufacturing method of electroless plating underlayer film]

本發明之無電解鍍敷底層膜之製造方法係使用本發明之無電解鍍敷底層膜形成用組成物。本製造方法只要使用本發明之組成物並無特別限定,可舉例例如於基材上藉由桿塗法塗佈本發明之組成物並乾燥之塗佈方法。 The method for producing an electroless plating underlayer film of the present invention uses the composition for forming an electroless plating underlayer film of the present invention. The present production method is not particularly limited as long as the composition of the present invention is used. For example, a coating method in which the composition of the present invention is applied to a substrate by a bar coating method and dried.

[鍍敷層合體] [Plated laminate]

本發明之鍍敷層合體係包含含金屬之無電解鍍敷層、含導電性聚合物及胺基甲酸酯樹脂之無電解鍍敷底層膜、與基板層,無電解鍍敷層之一面與無電解鍍敷底層之一面接觸。 The plating lamination system of the present invention comprises an electroless plating layer containing metal, an electroless plating base film containing a conductive polymer and a urethane resin, and a substrate layer, one side of the electroless plating layer and One side of the bottom layer of electroless plating is in contact.

圖1係表示本發明之鍍敷層合體之一實施形態的層構成之概略圖。 FIG. 1 is a schematic diagram showing the layer configuration of one embodiment of the plated laminate of the present invention.

鍍敷層合體1係於基板10上,包含將無電解鍍敷底層20及無電解鍍敷層30依此順序做層合。 The plated laminate 1 is attached to the substrate 10 and includes laminating the electroless plating base layer 20 and the electroless plating layer 30 in this order.

本發明之鍍敷層合體係藉由後述之本發明之鍍敷層合體之製造方法而可製造。 The plating laminate system of the present invention can be produced by the method for producing a plating laminate of the present invention described later.

[基板] [Substrate]

基板並無特別限定,亦可為金屬、無機素材(陶瓷、玻璃等)、或樹脂。又,亦可為用樹脂完全覆蓋金屬之基板、或無機系素材與樹脂之複合材(例如FRP,玻璃環氧複合材)等。作為樹脂之種類,可舉例聚碳酸酯樹脂、丙烯酸樹脂、尼龍樹脂、聚醯亞胺樹脂、聚酯樹脂、苯乙烯樹脂、酚樹脂、PPS(聚苯硫醚)樹脂等。 The substrate is not particularly limited, and may be metal, inorganic materials (ceramics, glass, etc.), or resin. In addition, a metal substrate completely covered with resin, or a composite material of an inorganic material and a resin (for example, FRP, glass epoxy composite material), or the like. Examples of the types of resins include polycarbonate resins, acrylic resins, nylon resins, polyimide resins, polyester resins, styrene resins, phenol resins, and PPS (polyphenylene sulfide) resins.

作為基板的具體例,可舉例例如易黏著處理PET(東洋紡製A4300)。 As a specific example of the substrate, for example, PET (A4300 manufactured by Toyobo Co., Ltd.) which is easy to adhere can be mentioned.

[無電解鍍敷底層] [Electroless plating bottom layer]

無電解鍍敷底層為包含導電性聚合物及胺基甲酸酯樹脂。導電性聚合物及胺基甲酸酯樹脂如上述。 The bottom layer of electroless plating contains a conductive polymer and a urethane resin. The conductive polymer and the urethane resin are as described above.

無電解鍍敷底層為使用本發明之組成物而可製造。又,形成方法如上述。 The electroless plating base layer can be manufactured using the composition of the present invention. In addition, the forming method is as described above.

[無電解鍍敷層] [Electroless plating]

作為無電解鍍敷層之金屬種,可舉例銅、鎳、鈷、鈀、銀、金、鉑及錫等。又,除了此等以外亦可含有磷、硼、鐵等之元素。又,形成方法如後述。 Examples of the metal species of the electroless plating layer include copper, nickel, cobalt, palladium, silver, gold, platinum, and tin. In addition to these, elements such as phosphorus, boron, and iron may be contained. In addition, the formation method will be described later.

[無電解鍍敷層合體之製造方法] [Manufacturing method of electroless plating laminate]

本發明之無電解鍍敷層合體之製造方法係包含於基板上,使用本發明之無電解鍍敷底層膜形成用組成物來形成無電解鍍敷底層膜之步驟、及於無電解鍍敷底層膜上,含 金屬之形成無電解鍍敷層之步驟。 The manufacturing method of the electroless plating laminate of the present invention includes a step of forming an electroless plating underlayer film using the composition for forming an electroless plating underlayer film of the present invention on a substrate, and applying the electroless plating underlayer On the membrane, containing The step of forming electroless plating layer of metal.

無電解鍍敷底層膜之形成係藉由上述之無電解鍍敷底層膜之製造方法可進行。 The formation of the electroless plating underlayer film can be performed by the above-mentioned method of manufacturing the electroless plating underlayer film.

形成底層膜後,較佳為於形成無電解鍍敷層前來進行脫脂步驟。脫脂步驟為用界面活性劑或醇等之溶劑來脫脂洗淨聚苯胺層表面後而改善濕潤性。 After forming the underlayer film, it is preferable to perform the degreasing step before forming the electroless plated layer. The degreasing step is to degrease and wash the surface of the polyaniline layer with a solvent such as surfactant or alcohol to improve the wettability.

界面活性劑係可適當使用陰離子性、陽離子性或非離子性之種類,較佳為陽離子性界面活性劑。若使用陽離子性界面活性劑時,例如以離子交換水等稀釋至1~3%來使用。 As the surfactant system, anionic, cationic or nonionic types can be used as appropriate, and cationic surfactants are preferred. When a cationic surfactant is used, for example, it is diluted to 1 to 3% with ion exchanged water and used.

形成上述無電解鍍敷底層膜後,較佳為於脫脂步驟後,通常於底層膜上為了使負責無電解鍍敷之觸媒作用之Pd金屬(觸媒金屬)載持,故與Pd化合物溶液接觸。 After the formation of the above-mentioned electroless plating underlayer film, preferably after the degreasing step, usually on the underlayer film in order to support the Pd metal (catalyst metal) responsible for the electroless plating catalyst action, so it is mixed with the Pd compound solution contact.

若與Pd化合物溶液接觸時,聚苯胺複合體等之導電性聚合物不但吸附Pd離子,且藉由該還原作用可將Pd離子還原成Pd金屬。尚,所還原之Pd,即必須為金屬狀態之Pd,否則就無法展現無電解鍍敷中之觸媒作用。 When contacted with a Pd compound solution, a conductive polymer such as a polyaniline complex not only adsorbs Pd ions, but can also reduce Pd ions to Pd metal by this reduction. Still, the Pd to be reduced must be Pd in a metallic state, otherwise the catalytic effect in electroless plating cannot be exhibited.

上述每單元面積之Pd附著量(包含Pd離子及Pd金屬)較佳為1.7μg/cm2以上,又較佳為2.5μg/cm2以上。 Pd adhesion amount per unit area of the above (containing Pd and Pd metal ion) is preferably 1.7μg / cm 2 or more, and preferably 2.5μg / cm 2 or more.

作為Pd化合物較佳為氯化鈀。作為溶劑鹽酸為一般所使用。然而,只要Pd若以離子狀態存在於水溶液中即可,故無限定於鹽酸水溶液中。作為Pd化合物溶液,可舉例例如0.02%氯化鈀-0.01%鹽酸水溶液(pH3)。 The Pd compound is preferably palladium chloride. Hydrochloric acid is generally used as a solvent. However, as long as Pd exists in the aqueous solution in an ionic state, it is not limited to the hydrochloric acid aqueous solution. Examples of the Pd compound solution include 0.02% palladium chloride-0.01% hydrochloric acid aqueous solution (pH 3).

與Pd化合物溶液之接觸溫度通常為20~50℃,較佳為30~40℃,接觸時間通常為0.1~10分鐘,較佳為1~5分鐘。 The contact temperature with the Pd compound solution is usually 20 to 50 ° C, preferably 30 to 40 ° C, and the contact time is usually 0.1 to 10 minutes, preferably 1 to 5 minutes.

接著,為了於底層上形成包含金屬之層(鍍敷層),使以上述所得到的薄膜與無電解鍍敷液接觸。底層與無電解鍍敷液若接觸時,使載持之Pd金屬作為觸媒而作用,並於聚苯胺層上可形成鍍敷層。 Next, in order to form a metal-containing layer (plating layer) on the underlayer, the thin film obtained above was brought into contact with the electroless plating solution. If the bottom layer is in contact with the electroless plating solution, the supported Pd metal acts as a catalyst, and a plating layer can be formed on the polyaniline layer.

作為無電解鍍敷液所含之金屬種類,可舉例銅、鎳、鈷、鈀、銀、金、鉑及錫等。無電解鍍敷液係可包含由Cu、Ni、Au、Pd、Ag、Sn、Co及Pt中選擇之1以上的金屬。又,除了此等以外亦可含有磷、硼、鐵等之元素。 Examples of the metal type contained in the electroless plating solution include copper, nickel, cobalt, palladium, silver, gold, platinum, and tin. The electroless plating solution system may include one or more metals selected from Cu, Ni, Au, Pd, Ag, Sn, Co, and Pt. In addition to these, elements such as phosphorus, boron, and iron may be contained.

與無電解鍍敷液之接觸溫度係依鍍敷浴種類或厚度等而不同,但例如若低溫浴時為20~50℃程度、高溫時則為50~90℃。 The contact temperature with the electroless plating solution varies depending on the type or thickness of the plating bath, but for example, it is about 20 to 50 ° C at low temperature bath and 50 to 90 ° C at high temperature.

又,與無電解鍍敷液之接觸時間亦依鍍敷浴種類或厚度等而不同,例如1~30分鐘、5~15分鐘。即使只有無電解鍍敷亦可,或於以無電解鍍敷設置金屬薄膜後,藉由電解鍍敷再設置同種類、或相異的金屬膜亦可。 In addition, the contact time with the electroless plating solution also varies depending on the type or thickness of the plating bath, for example, 1-30 minutes, 5-15 minutes. Even if it is only electroless plating, or after the metal thin film is formed by electroless plating, the same type or different metal film may be provided by electrolytic plating.

[2]無電解鍍敷物之製造方法 [2] Manufacturing method of electroless plating

本發明之無電解鍍敷物之製造方法係包含形成包含導電性聚合物之無電解鍍敷底層膜於基材上之步驟、使無電解鍍敷底層膜與標準電極電位E0為E0=-1.00V~-0.10V之 酸性的還原劑水溶液接觸之步驟、及於與還原劑水溶液之接觸後之無電解鍍敷底層膜上形成無電解鍍敷層之步驟。 The manufacturing method of the electroless plated article of the present invention includes the steps of forming an electroless plated base film containing a conductive polymer on a substrate, and making the electroless plated base film and the standard electrode potential E 0 to E 0 =- The step of contacting the acidic reducing agent aqueous solution of 1.00V ~ -0.10V, and the step of forming the electroless plating layer on the electroless plating base film after contact with the reducing agent aqueous solution.

替代界面活性劑,藉由使上述的還原劑水溶液與無電解鍍敷底層膜接觸(含浸),即使於鍍敷底層膜若包含黏合劑時、或膜厚若為厚時,於鍍敷底層膜上可均勻的形成鍍敷皮膜。 Instead of surfactants, by contacting (impregnating) the above-mentioned reducing agent aqueous solution with the electroless plating underlayer film, even if the plating underlayer film contains a binder or if the film thickness is thick, the plating underlayer film The coating film can be uniformly formed on the top.

又,依據本發明之製造方法,即使於基材表面之一部份形成鍍敷底層膜時,僅於該鍍敷底層膜上可形成(析出)鍍敷層。即,在無設置鍍敷底層膜之基材表面(不需要鍍敷部份)上,因鍍敷層無法形成,故於基材上可選擇性的做鍍敷。該效果對於基材上形成鍍敷金屬回路時等特別有用。 Moreover, according to the manufacturing method of the present invention, even when a plating base film is formed on a part of the surface of the substrate, a plating layer can be formed (precipitated) only on the plating base film. That is, on the surface of the base material without the plating base film (the portion where no plating is required), since the plating layer cannot be formed, plating can be selectively performed on the base material. This effect is particularly useful when forming a plated metal circuit on the substrate.

1.無電解鍍敷底層膜形成步驟 1. Electroless plating bottom film formation steps

本步驟中,於基材上形成包含導電性聚合物之無電解鍍敷底層膜。 In this step, an electroless plating underlayer film containing a conductive polymer is formed on the substrate.

作為導電性聚合物,較佳為π共軛聚合物為以摻雜劑進行摻雜而成的π共軛聚合物複合體。具體而言,可舉例取代或未取代的聚苯胺為以摻雜劑進行摻雜而成的聚苯胺複合體、取代或未取代的聚吡咯為以摻雜劑進行摻雜而成的聚吡咯複合體、及取代或未取代的聚噻吩為以摻雜劑進行摻雜而成的聚噻吩複合體。尤其,較佳為取代或未取代的聚苯胺為以摻雜劑進行摻雜而成的聚苯胺複合體。 As the conductive polymer, the π-conjugated polymer is preferably a π-conjugated polymer composite doped with a dopant. Specifically, a substituted or unsubstituted polyaniline is a polyaniline composite doped with a dopant, and a substituted or unsubstituted polypyrrole is a polypyrrole composite doped with a dopant The body and the substituted or unsubstituted polythiophene are polythiophene complexes doped with a dopant. In particular, it is preferred that the substituted or unsubstituted polyaniline is a polyaniline composite doped with a dopant.

聚苯胺之重量平均分子量(以下,稱為分子 量)較佳為20,000以上。分子量若未達20,000時,層之強度或延伸性有降低之虞。分子量較佳為20,000~500,000,又較佳為20,000~300,000,更佳為20,000~200,000。分子量為例如50,000~200,000、53,000~200,000。在此,上述之重量平均分子量並非聚苯胺複合體之分子量,而是聚苯胺之分子量。 The weight average molecular weight of polyaniline (hereinafter, referred to as molecular Amount) is preferably 20,000 or more. If the molecular weight is less than 20,000, the strength or extensibility of the layer may be reduced. The molecular weight is preferably 20,000 to 500,000, more preferably 20,000 to 300,000, and still more preferably 20,000 to 200,000. The molecular weight is, for example, 50,000 to 200,000, and 53,000 to 200,000. Here, the above-mentioned weight average molecular weight is not the molecular weight of the polyaniline composite, but the molecular weight of polyaniline.

多分散度(即,「重量平均分子量」/「數平均分子量」)較佳為1.5以上10.0以下。就導電率之觀點而言,較佳為多分散度小者(即,分子量分布為狹小),但,就對溶劑之溶解性或成形性之觀點而言,亦有時較佳為多分散度大者(即,分子量分布為廣)之情形。 The polydispersity (ie, "weight average molecular weight" / "number average molecular weight") is preferably 1.5 or more and 10.0 or less. From the viewpoint of conductivity, the one having a small polydispersity (that is, the molecular weight distribution is narrow) is preferable, but from the viewpoint of solubility or moldability of the solvent, the polydispersity is sometimes preferable. The larger (ie, the molecular weight distribution is broad).

重量平均分子量、數平均分子量及多分散度為藉由凝膠滲透層析(GPC)以聚苯乙烯換算進行測定。 The weight average molecular weight, number average molecular weight, and polydispersity are measured in terms of polystyrene by gel permeation chromatography (GPC).

作為取代聚苯胺之取代基,可舉例例如甲基、乙基、己基、辛基等之直鏈或分支之烴基;甲氧基、乙氧基等之烷氧基;苯氧基等之芳氧基;三氟甲基(-CF3基)等之鹵化烴基。 Examples of the substituent of the substituted polyaniline include straight-chain or branched hydrocarbon groups such as methyl, ethyl, hexyl, and octyl; alkoxy groups such as methoxy and ethoxy groups; Group; halogenated hydrocarbon groups such as trifluoromethyl (-CF 3 group).

就汎用性及經濟性之觀點而言,聚苯胺較佳為未取代的聚苯胺。 From the viewpoint of versatility and economy, the polyaniline is preferably an unsubstituted polyaniline.

取代或未取代的聚苯胺較佳為在不包含氯原子的酸的存在下聚合後所得到的聚苯胺。所謂不包含氯原子的酸係指由例如1族~16族及18族所屬的原子所構成之酸。具體而言,可舉例磷酸。作為在不包含氯原子的酸的存在下聚合後所得到的聚苯胺,可舉例在磷酸的存在下 聚合後所得到的聚苯胺。 The substituted or unsubstituted polyaniline is preferably a polyaniline obtained after polymerization in the presence of an acid containing no chlorine atom. The acid that does not contain a chlorine atom means an acid composed of atoms belonging to, for example, groups 1 to 16 and 18. Specifically, phosphoric acid can be exemplified. As the polyaniline obtained after polymerization in the presence of an acid not containing a chlorine atom, there can be exemplified in the presence of phosphoric acid Polyaniline obtained after polymerization.

在不包含氯原子的酸的存在下所得到的聚苯胺,可使聚苯胺複合體之氯含有量變得較低。 The polyaniline obtained in the presence of an acid that does not contain a chlorine atom can reduce the chlorine content of the polyaniline complex.

聚苯胺複合體之氯含有量較佳為0.6重量%以下。又較佳為0.1重量%以下,更佳為0.04重量%以下,最佳為0.0001重量%以下。 The chlorine content of the polyaniline composite is preferably 0.6% by weight or less. It is preferably 0.1% by weight or less, more preferably 0.04% by weight or less, and most preferably 0.0001% by weight or less.

聚苯胺複合體之氯含有量若超過0.6重量%時,與聚苯胺複合體接觸之金屬部份有腐蝕之虞。 If the chlorine content of the polyaniline composite exceeds 0.6% by weight, the metal part in contact with the polyaniline composite may be corroded.

上述氯含有量為藉由燃燒-離子色層法進行測定。 The chlorine content is measured by combustion-ion chromatography.

作為聚苯胺複合體之摻雜劑,可舉例由例如布忍斯特酸(Broensted acid)或布忍斯特酸(Broensted acid)之鹽所產生之布忍斯特酸(Broensted acid)離子,較佳為由有機酸或有機酸之鹽所產生之有機酸離子,又更佳為由以下述式(I)所示的化合物(質子供給體)所產生之有機酸離子。 As the dopant of the polyaniline complex, there can be exemplified broensted acid ions generated from, for example, broensted acid or a salt of broensted acid, preferably from The organic acid ion generated by the organic acid or the salt of the organic acid is more preferably an organic acid ion generated by a compound (proton donor) represented by the following formula (I).

尚,本發明中有將摻雜劑表現為特定之酸之情形,及亦有將摻雜劑表現為特定之鹽之情形,不論是由特定之酸或特定之鹽所生成的特定之酸離子,皆設為摻雜於上述π共軛聚合物者。 Still, in the present invention, the dopant is expressed as a specific acid, and the dopant is expressed as a specific salt, whether it is a specific acid ion generated by a specific acid or a specific salt Are all doped with the π-conjugated polymer.

M(XARn)m (I) M (XARn) m (I)

式(I)之M為氫原子、有機游離基或無機游離基。 M in formula (I) is a hydrogen atom, an organic radical or an inorganic radical.

作為上述有機游離基,可舉例例如吡啶鎓基、咪唑基、苯銨基。又,作為上述無機游離基,可舉例例如鋰、 鈉、鉀、銫、銨、鈣、鎂、鐵之離子。 Examples of the above-mentioned organic radicals include pyridinium group, imidazolyl group, and anilium group. In addition, as the inorganic radical, for example, lithium, Ions of sodium, potassium, cesium, ammonium, calcium, magnesium, iron.

式(I)之X為陰離子基,可舉例例如-SO3 -基、-PO3 2-基、-PO4(OH)-基、-OPO3 2-基、-OPO2(OH)-基、-COO-基,較佳為-SO3 -基。 X of formula (I) of the anionic group can be exemplified, for example, -SO 3 - group, -PO 3 2- group, -PO 4 (OH) - group, -OPO 3 2- group, -OPO 2 (OH) - group , -COO - group, preferably -SO 3 - group.

式(I)之A為取代或未取代的烴基。 A of formula (I) is a substituted or unsubstituted hydrocarbon group.

上述烴基為鏈狀或環狀飽和脂肪族烴基、鏈狀或環狀之不飽和脂肪族烴基、或芳香族烴基。 The above-mentioned hydrocarbon group is a chain or cyclic saturated aliphatic hydrocarbon group, a chain or cyclic unsaturated aliphatic hydrocarbon group, or an aromatic hydrocarbon group.

作為鏈狀之飽和脂肪族烴基,可舉例直鏈或分支狀之烷基。 As the chain-shaped saturated aliphatic hydrocarbon group, a linear or branched alkyl group can be exemplified.

作為環狀飽和脂肪族烴基,可舉例環戊基、環己基、環庚基、環辛基等之環烷基。環狀飽和脂肪族烴基亦可為縮合複數個的環狀飽和脂肪族烴基。可舉例例如降莰基、金剛烷基、縮合之金剛烷基。 Examples of cyclic saturated aliphatic hydrocarbon groups include cycloalkyl groups such as cyclopentyl, cyclohexyl, cycloheptyl, and cyclooctyl. The cyclic saturated aliphatic hydrocarbon group may be a plurality of cyclic saturated aliphatic hydrocarbon groups condensed. Examples include norbornyl, adamantyl, and condensed adamantyl.

作為芳香族烴基,可舉例苯基、萘基、蒽基。作為鏈狀之不飽和脂肪族烴基,可舉例直鏈或分支狀之烯基。 Examples of the aromatic hydrocarbon group include phenyl, naphthyl and anthracenyl. As the chain-shaped unsaturated aliphatic hydrocarbon group, a linear or branched alkenyl group can be exemplified.

在此,A作為取代的烴基時之取代基為烷基、環烷基、乙烯基、烯丙基、芳基、烷氧基、鹵基、羥基、胺基、亞胺基、硝基、矽烷基(silyl)或酯基。 Here, when A is a substituted hydrocarbon group, the substituents are alkyl, cycloalkyl, vinyl, allyl, aryl, alkoxy, halo, hydroxyl, amine, imino, nitro, silane Group (silyl) or ester group.

式(I)之R為與A鍵結,且分別獨立以-H、-R1、-OR1、-COR1、-COOR1、-(C=O)-(COR1)、或-(C=O)-(COOR1)所示之取代基,R1為亦可包含取代基之烴基、矽烷基(silyl)、烷基矽烷基(alkyl silyl)、-(R2O)x-R3基、或-(OSiR3 2)x-OR3(R2為分別獨立為伸烷基、R3為分 別獨立為烴基,x為1以上之整數)。 R of formula (I) is bonded to A, and independently -H, -R 1 , -OR 1 , -COR 1 , -COOR 1 ,-(C = O)-(COR 1 ), or-( C = O)-(COOR 1 ), R 1 is a hydrocarbon group, silyl, alkyl silyl,-(R 2 O) xR 3 group which may also contain a substituent , Or-(OSiR 3 2 ) x-OR 3 (R 2 is independently an alkylene group, R 3 is independently a hydrocarbon group, and x is an integer of 1 or more).

作為R1之烴基,可舉例甲基、乙基、直鏈或分支之丁基、戊基、己基、庚基、辛基、壬基、癸基、十二烷基、十五烷基、二十烷基等。又,上述烴基之取代基為烷基、環烷基、乙烯基、烯丙基、芳基、烷氧基、鹵基、羥基、胺基、亞胺基、硝基或酯基。R3之烴基亦與R1為相同。 Examples of the hydrocarbon group for R 1 include methyl, ethyl, linear or branched butyl, pentyl, hexyl, heptyl, octyl, nonyl, decyl, dodecyl, pentadecyl, di Decayl and so on. Moreover, the substituent of the said hydrocarbon group is an alkyl group, a cycloalkyl group, a vinyl group, an allyl group, an aryl group, an alkoxy group, a halogen group, a hydroxyl group, an amine group, an imino group, a nitro group, or an ester group. The hydrocarbon group of R 3 is also the same as R 1 .

作為R2之伸烷基,可舉例例如亞甲基、伸乙基、伸丙基等。 Examples of the alkylene group of R 2 include methylene group, ethyl group, and propyl group.

式(I)之n為1以上之整數,式(I)之m為M之價數/X之價數。 N in formula (I) is an integer of 1 or more, and m in formula (I) is the price of M / the price of X.

作為以式(I)所示的化合物,較佳為含有2以上的二烷基苯磺酸、二烷基萘磺酸、或酯鍵之化合物。 The compound represented by formula (I) is preferably a compound containing 2 or more dialkylbenzenesulfonic acid, dialkylnaphthalenesulfonic acid, or ester bond.

上述含有2以上的酯鍵之化合物,更佳為磺基鄰苯二甲酸酯、或以下述式(II)所示的化合物。 The compound containing 2 or more ester bonds is more preferably a sulfophthalate or a compound represented by the following formula (II).

式中,M、m及X為與式(I)相同。X較佳為-SO3 -基。 In the formula, M, m and X are the same as the formula (I). X is preferably a -SO 3 - group.

式(II)之R4、R5及R6分別獨立後為氫原子、烴基或R9 3Si-基(在此,R9為烴基,3個R9為相同或不同)。 R 4 , R 5 and R 6 of the formula (II) are independently hydrogen atoms, hydrocarbon groups or R 9 3 Si- groups (here, R 9 is a hydrocarbon group, and three R 9 are the same or different).

作為R4、R5及R6為烴基時之烴基,可舉例碳數1~24之直鏈或分支狀之烷基、芳基、烷基芳基等。 Examples of the hydrocarbon group when R 4 , R 5 and R 6 are hydrocarbon groups include straight-chain or branched alkyl groups having 1 to 24 carbon atoms, aryl groups, and alkylaryl groups.

作為R9之烴基,與R4、R5及R6之情形相同。 The hydrocarbon group of R 9 is the same as the case of R 4 , R 5 and R 6 .

式(II)之R7及R8分別獨立為烴基或-(R10O)q-R11基[在此,R10為烴基或亞矽烷基,R11為氫原子、烴基或R12 3Si-(R12為烴基,3個R12為相同或不同),q為1以上之整數]。 R 7 and R 8 of the formula (II) are each independently a hydrocarbon group or-(R 10 O) q -R 11 group [here, R 10 is a hydrocarbon group or a silylene group, and R 11 is a hydrogen atom, a hydrocarbon group, or R 12 3 Si- (R 12 is a hydrocarbon group, three R 12 are the same or different), and q is an integer of 1 or more].

作為當R7及R8為烴基時之烴基碳數為1~24,較佳為可舉例碳數4以上之直鏈或分支狀之烷基、芳基、烷基芳基等、作為R7及R8為烴基時之烴基的具體例,可舉例例如直鏈或分支狀丁基、戊基、己基、辛基、癸基等。 When R 7 and R 8 are hydrocarbon groups, the hydrocarbon group has a carbon number of 1 to 24, preferably linear or branched alkyl groups, aryl groups, alkylaryl groups with a carbon number of 4 or more, as R 7 When R 8 is a hydrocarbon group, specific examples of the hydrocarbon group include linear or branched butyl, pentyl, hexyl, octyl, and decyl groups.

R7及R8中作為當R10為烴基時之烴基,例如碳數1~24之直鏈或分支狀伸烷基、伸芳基、烷基伸芳基、芳基伸烷基。又,R7及R8中,作為當R11及R12為烴基時之烴基,與R4、R5及R6之情形相同,q較佳為1~10。 In R 7 and R 8 , when R 10 is a hydrocarbon group, for example, a straight-chain or branched alkylene group having 1 to 24 carbon atoms, an aryl group, an alkylene group, or an arylalkylene group. In addition, in R 7 and R 8 , the hydrocarbon group when R 11 and R 12 are hydrocarbon groups is the same as the case of R 4 , R 5, and R 6 , and q is preferably 1-10.

作為R7及R8為-(R10O)q-R11基時以式(II)所示之化合物的具體例,係以下述式所示2個化合物。 When R 7 and R 8 are-(R 10 O) q -R 11 groups, specific examples of the compound represented by formula (II) are two compounds represented by the following formulas.

(式中,X為與式(I)相同)。 (In the formula, X is the same as the formula (I)).

以上述式(II)所示之化合物,又更佳為以下述式(III)所示的磺基琥珀酸衍生物。 The compound represented by the above formula (II) is more preferably a sulfosuccinic acid derivative represented by the following formula (III).

式(III)中,M為與式(I)相同。m’為M之價數。 In formula (III), M is the same as formula (I). m 'is the price of M.

式(III)之R13及R14分別獨立為烴基或-(R15O)r-R16基[在此,R15分別獨立為烴基或亞矽烷基,R16為氫原子、烴基或R17 3Si-基(在此,R17分別獨立為烴基),r為1以上之整數]。 R 13 and R 14 of the formula (III) are each independently a hydrocarbon group or-(R 15 O) r -R 16 group [Here, R 15 is independently a hydrocarbon group or a silylene group, and R 16 is a hydrogen atom, a hydrocarbon group, or R 17 3 Si- group (here, R 17 is each independently a hydrocarbon group), and r is an integer of 1 or more].

作為當R13及R14為烴基時之烴基,與R7及R8相同。 When R 13 and R 14 are hydrocarbon groups, they are the same as R 7 and R 8 .

R13及R14中,作為當R15為烴基時之烴基,與上述R10相同。又,R13及R14中,作為當R16及R17為烴基時之烴基,與上述R4、R5及R6相同。 Among R 13 and R 14 , the hydrocarbon group when R 15 is a hydrocarbon group is the same as R 10 described above. In addition, R 13 and R 14 are the same as R 4 , R 5 and R 6 as the hydrocarbon groups when R 16 and R 17 are hydrocarbon groups.

r較佳為1~10。 r is preferably 1-10.

作為當R13及R14為-(R15O)r-R16基時的具體例,與R7及R8之-(R10O)q-R11相同。 As specific examples when R 13 and R 14 are-(R 15 O) r -R 16 groups, they are the same as-(R 10 O) q -R 11 of R 7 and R 8 .

作為R13及R14之烴基與R7及R8相同,較佳為丁基、己基、2-乙基己基、癸基。 The hydrocarbon groups for R 13 and R 14 are the same as R 7 and R 8 , and butyl, hexyl, 2-ethylhexyl, and decyl are preferred.

已知上述摻雜劑係藉由改變其構造,可控制聚苯胺複合體之導電性、或對溶劑之溶解性(專利第3384566號)。本發明中,依照每種用途之要求特性,可選擇最合適的摻雜劑。本發明中,作為以式(I)所示的化合物,較佳為二-2-乙基己基磺基琥珀酸、二-2-乙基己基磺基琥珀酸鈉。作為本發明之摻雜劑,較佳為二-2-乙基己基磺基琥珀酸離子。 It is known that the above dopant can control the conductivity of the polyaniline composite or the solubility in the solvent by changing its structure (Patent No. 3384566). In the present invention, the most suitable dopant can be selected according to the required characteristics of each application. In the present invention, the compound represented by formula (I) is preferably di-2-ethylhexylsulfosuccinic acid and sodium di-2-ethylhexylsulfosuccinate. As the dopant of the present invention, di-2-ethylhexylsulfosuccinate ion is preferred.

聚苯胺複合體之摻雜劑,可藉由紫外、可視或近紅外線分光法、或X射線光電子分光法,來確認是否摻雜於取代或未取代的聚苯胺,該摻雜劑只要是具有能使聚苯胺產生載體(carrier)為充分之酸性即可,未有特別的化學結構上之限制,係可使用。 The dopant of the polyaniline complex can be confirmed by ultraviolet, visible or near-infrared spectroscopy, or X-ray photoelectron spectroscopy to determine whether it is doped with substituted or unsubstituted polyaniline, as long as the dopant is capable of The polyaniline-generating carrier may be sufficiently acidic, and it can be used without any special restrictions on chemical structure.

對於聚苯胺之摻雜劑的摻雜率,較佳為0.35以上0.65以下,又較佳為0.42以上0.60以下,更佳為0.43以上0.57以下,特佳為0.44以上0.55以下。摻雜率若未達0.35時,聚苯胺複合體之對於有機溶劑之溶解性 有無法變高之虞。 The doping rate of the polyaniline dopant is preferably 0.35 or more and 0.65 or less, more preferably 0.42 or more and 0.60 or less, more preferably 0.43 or more and 0.57 or less, and particularly preferably 0.44 or more and 0.55 or less. If the doping rate is less than 0.35, the solubility of the polyaniline composite in organic solvents There is a risk of not becoming higher.

尚,摻雜率係以(摻雜於聚苯胺中之摻雜劑之莫耳數)/(聚苯胺之單體單元的莫耳數)所定義。例如,所謂包含未取代聚苯胺與摻雜劑之聚苯胺複合體的摻雜率為0.5時,意味著相對於聚苯胺之單體單元分子2個,摻雜有摻雜劑1個之意。 Still, the doping rate is defined by (the number of moles of dopant doped in polyaniline) / (the number of moles of monomer unit of polyaniline). For example, when the doping rate of the polyaniline composite containing unsubstituted polyaniline and dopant is 0.5, it means that one dopant is doped relative to two monomer unit molecules of polyaniline.

尚,只要能測定聚苯胺複合體中的摻雜劑與聚苯胺之單體單元之莫耳數,即可算出摻雜率。例如摻雜劑為有機磺酸時,藉由有機元素分析法,來定量由摻雜劑之硫原子的莫耳數,與來自於聚苯胺之單體單元之氮原子之莫耳數,以取出此等之值之比,可算出摻雜率。但,摻雜率之算出方法並不限定於該手段。 Still, as long as the molar number of the monomer unit of the dopant and polyaniline in the polyaniline composite can be measured, the doping rate can be calculated. For example, when the dopant is an organic sulfonic acid, the number of moles of sulfur atoms from the dopant and the number of moles of nitrogen atoms from the monomer unit of polyaniline can be quantified by organic element analysis The ratio of these values can calculate the doping rate. However, the method of calculating the doping rate is not limited to this method.

聚苯胺複合體較佳為包含未取代聚苯胺與摻雜劑之磺酸離子,且達到下述式(5)。 The polyaniline composite preferably contains sulfonic acid ions of unsubstituted polyaniline and a dopant, and reaches the following formula (5).

0.42≦S5/N5≦0.60 (5) 0.42 ≦ S 5 / N 5 ≦ 0.60 (5)

(式中,S5為包含於聚苯胺複合體中的硫原子之莫耳數之合計,N5為包含於聚苯胺複合體中的氮原子之莫耳數之合計。尚,上述氮原子及硫原子之莫耳數為藉由例如有機元素分析法而測定之值)。 (In the formula, S 5 is the total number of moles of sulfur atoms contained in the polyaniline complex, and N 5 is the total number of moles of nitrogen atoms contained in the polyaniline complex. In addition, the nitrogen atoms and The molar number of sulfur atoms is a value determined by, for example, organic element analysis).

聚苯胺複合體亦可進而包含磷,或不包含磷。 The polyaniline composite may further contain phosphorus or not.

聚苯胺複合體若包含磷時,磷之含有量為例如10重量ppm以上5000重量ppm以下。又,磷之含有量為例如2000重量ppm以下、500重量ppm以下、250重量ppm 以下。 When the polyaniline composite contains phosphorus, the content of phosphorus is, for example, 10 wtppm or more and 5000 wtppm or less. Moreover, the phosphorus content is, for example, 2000 wtppm or less, 500 wtppm or less, 250 wtppm the following.

上述磷之含有量為用ICP發光分光分析法可進行測定。 The phosphorus content can be measured by ICP emission spectrometry.

又,聚苯胺複合體,以不含有作為雜質的第12族元素(例如鋅)為宜。 In addition, the polyaniline composite preferably contains no Group 12 element (for example, zinc) as an impurity.

聚苯胺複合體係可用周知之方法(例如於鹽酸存在下苯胺之聚合)來進行製造,但較佳為於包含質子供給體、磷酸且具有二個液相之溶液中,將取代或未取代的苯胺以藉由化學氧化聚合來進行製造。 The polyaniline composite system can be manufactured by a well-known method (for example, the polymerization of aniline in the presence of hydrochloric acid), but it is preferable to replace the substituted or unsubstituted aniline in a solution containing a proton donor, phosphoric acid, and two liquid phases To be manufactured by chemical oxidative polymerization.

於此,所謂「具有二個液相之溶液」係指在溶液中不相溶之二個液相為存在之狀態之意。例如,在溶液中以「高極性溶劑之相」與「低極性溶劑之相」存在之狀態之意。 Here, the so-called "solution with two liquid phases" refers to the existence of two liquid phases that are incompatible in the solution. For example, it means the state of existence of "high-polarity solvent phase" and "low-polarity solvent phase" in the solution.

又,「具有二個液相之溶液」亦包含一方之液相為連續相而另一方之液相為分散相之狀態。例如可包含「高極性溶劑之相」為連續相而「低極性溶劑之相」為分散相之狀態,及「低極性溶劑之相」為連續相而「高極性溶劑之相」為分散相之狀態。 In addition, "a solution having two liquid phases" also includes a state where one liquid phase is a continuous phase and the other liquid phase is a dispersed phase. For example, it may include the state where the "high-polar solvent phase" is the continuous phase and the "low-polar solvent phase" is the dispersed phase, and the "low-polar solvent phase" is the continuous phase and the "high-polar solvent phase" is the dispersed phase. status.

作為使用於上述聚苯胺複合體之製造方法之高極性溶劑,較佳為水;作為低極性溶劑,較佳為例如甲苯、二甲苯等之芳香族烴。 The high-polarity solvent used in the method for producing the polyaniline composite is preferably water; and the low-polarity solvent is preferably aromatic hydrocarbons such as toluene and xylene.

上述質子供給體較佳為以上述式(I)所示之化合物。 The proton donor is preferably a compound represented by the above formula (I).

質子供給體的使用量,以相對於苯胺單量體 1mol,較佳為0.1~0.5mol,又較佳為0.3~0.45mol,更佳為0.35~0.4mol。 The amount of proton donor used relative to the aniline single body 1 mol, preferably 0.1 to 0.5 mol, and more preferably 0.3 to 0.45 mol, more preferably 0.35 to 0.4 mol.

質子供給體之使用量若較該範圍為多時,於聚合結束後,例如有無法分離「高極性溶劑之相」與「低極性溶劑之相」之虞。 If the usage amount of the proton donor is more than this range, after the completion of the polymerization, for example, there is a possibility that the "high polar solvent phase" and the "low polar solvent phase" may not be separated.

磷酸之使用濃度,以相對於高極性溶劑為0.3~6mol/L,又較佳為1~4mol/L,更佳為1~2mol/L。 The use concentration of phosphoric acid is 0.3 to 6 mol / L, more preferably 1 to 4 mol / L, and more preferably 1 to 2 mol / L, relative to the highly polar solvent.

作為使用於化學氧化聚合之氧化劑,可使用過硫酸鈉、過硫酸鉀、過硫酸銨、如過氧化氫的過氧化物;二鉻酸銨、過氯酸銨、硫酸鉀鐵(III)、三氯化鐵(III)、二氧化錳、碘酸、過錳酸鉀、或對甲苯磺酸鐵等,較佳為過硫酸銨等之過硫酸鹽。 As the oxidant used in chemical oxidative polymerization, sodium persulfate, potassium persulfate, ammonium persulfate, peroxides such as hydrogen peroxide; ammonium dichromate, ammonium perchlorate, potassium iron (III), trisulfate Iron (III) chloride, manganese dioxide, iodic acid, potassium permanganate, or iron p-toluenesulfonate, etc., preferably persulfates such as ammonium persulfate.

此等氧化劑可單獨使用,亦可併用2種以上。 These oxidants can be used alone or in combination of two or more.

氧化劑的使用量,以相對於苯胺單量體1mol,較佳為0.05~1.8mol,又較佳為0.8~1.6mol,更佳為1.2~1.4mol。由於將氧化劑的使用量設為該範圍內,可得充分的聚合度。又,由於苯胺充分的聚合,分液回收容易,又,聚合體的溶解性無降低之虞。 The amount of the oxidizing agent used is 1 mol per aniline unit, preferably 0.05 to 1.8 mol, more preferably 0.8 to 1.6 mol, and still more preferably 1.2 to 1.4 mol. Since the amount of the oxidizing agent used is within this range, a sufficient degree of polymerization can be obtained. In addition, due to the sufficient polymerization of aniline, liquid separation and recovery are easy, and the solubility of the polymer is not likely to decrease.

聚合溫度通常為-5~60℃下,較佳為-5~40℃。又,聚合溫度於聚合反應的過程中亦可變更。藉由聚合溫度為該範圍,可避免副反應。 The polymerization temperature is usually -5 to 60 ° C, preferably -5 to 40 ° C. In addition, the polymerization temperature may be changed during the polymerization reaction. With the polymerization temperature within this range, side reactions can be avoided.

聚苯胺複合體,具體而言可使用以下之方法來進行製造。 The polyaniline composite can be produced specifically using the following method.

將甲苯中為溶解有質子供給體及乳化劑之溶液,在氮 等之惰性氣氛之氣流下置入於分液瓶中,進而將取代或未取代的苯胺添加於此溶液中。之後,添加磷酸(其係不含有作為雜質的氯者)於此溶液中,並將溶液溫度冷卻。 Toluene is a solution with proton donor and emulsifier dissolved in nitrogen Put it into a separator bottle under the flow of an inert atmosphere, and then add substituted or unsubstituted aniline to this solution. After that, phosphoric acid (which does not contain chlorine as an impurity) was added to this solution, and the solution temperature was cooled.

使溶液內溫冷卻後,進行攪拌。使用滴液漏斗,將磷酸中為溶解有過硫酸銨之溶液滴液,使進行反應。之後,使溶液溫度上昇並繼續反應。反應結束後,將藉由靜置而分離為二相之水相側分液。於有機相側追加甲苯,藉由以磷酸及離子交換水來進行洗淨,而得到聚苯胺複合體(經質子化之聚苯胺)之甲苯溶液。 After the internal temperature of the solution was cooled, it was stirred. Using a dropping funnel, a solution in which ammonium persulfate was dissolved in phosphoric acid was dropped to allow the reaction to proceed. After that, the temperature of the solution was increased and the reaction was continued. After the reaction is completed, the liquid phase that is separated into two phases by standing is separated. Toluene was added on the organic phase side and washed with phosphoric acid and ion-exchanged water to obtain a toluene solution of a polyaniline complex (protonated polyaniline).

除去所得到的複合體溶液中所包含的若干不溶物,而回收聚苯胺複合體之甲苯溶液。將此溶液轉移至蒸發器中,藉由進行加溫及減壓使揮發分蒸發餾去,而得到聚苯胺複合體。 The insoluble matter contained in the obtained composite solution was removed, and the toluene solution of the polyaniline composite was recovered. This solution was transferred to an evaporator, and volatiles were evaporated and distilled off by heating and depressurizing to obtain a polyaniline complex.

如同後述,無電解鍍敷底層膜為使用包含聚苯胺複合體等之導電性聚合物之溶液(塗佈液)而可製造。塗佈液較佳為若包含酚性化合物時。 As described later, the electroless plating underlayer film can be produced by using a solution (coating liquid) containing a conductive polymer such as a polyaniline composite. The coating liquid preferably contains phenolic compounds.

酚性化合物只要具有酚性羥基之化合物即可,並無特別限定。所謂具有酚性羥基之化合物係指,如具有1個酚性羥基之化合物、具有複數個酚性羥基之化合物、及具有1個或複數個酚性羥基之重覆單元所構成之高分子化合物。 The phenolic compound is not particularly limited as long as it has a phenolic hydroxyl group. The compound having a phenolic hydroxyl group refers to a polymer compound composed of a compound having one phenolic hydroxyl group, a compound having a plurality of phenolic hydroxyl groups, and a repeating unit having one or more phenolic hydroxyl groups.

具有1個酚性羥基之化合物,較佳為以下述式(A)、(B)及(C)所示之化合物。 The compound having one phenolic hydroxyl group is preferably a compound represented by the following formulas (A), (B), and (C).

(式中,n為1~5之整數,較佳為1~3,又較佳為1。 (In the formula, n is an integer of 1 to 5, preferably 1 to 3, and more preferably 1.

R為碳數1~20之烷基、烯基、環烷基、芳基、烷基芳基或芳基烷基)。 R is alkyl having 1 to 20 carbons, alkenyl, cycloalkyl, aryl, alkylaryl or arylalkyl).

以式(A)所示的酚性化合物中,-OR的取代位置較佳為相對於酚性羥基為間位、或對位。藉由使-OR的取代位置設為間位或對位,可減低酚性羥基之立體阻礙且更提高組成物之導電性。 In the phenolic compound represented by formula (A), the substitution position of -OR is preferably meta or para to the phenolic hydroxyl group. By setting the substitution position of -OR to the meta or para position, the steric hindrance of the phenolic hydroxyl group can be reduced and the conductivity of the composition can be further improved.

作為式(A)所表示之酚性化合物之具體例,舉例如甲氧基苯酚(例如4-甲氧基苯酚)、乙氧基苯酚、丙氧基苯酚、異丙氧基苯酚、丁氧基苯酚、異丁氧基苯酚、第三丁氧基苯酚。 Specific examples of the phenolic compound represented by formula (A) include methoxyphenol (eg 4-methoxyphenol), ethoxyphenol, propoxyphenol, isopropoxyphenol, butoxy Phenol, isobutoxyphenol, and third butoxyphenol.

(式中,n為0~7之整數,較佳為0~3,又較佳為1。 (In the formula, n is an integer of 0 ~ 7, preferably 0 ~ 3, and more preferably 1.

R分別為碳數1~20之烷基、烯基、烷硫基、碳數3~10之環烷基、碳數6~20之芳基、烷基芳基或芳基烷基)。 R is respectively an alkyl group having 1 to 20 carbon atoms, an alkenyl group, an alkylthio group, a cycloalkyl group having 3 to 10 carbon atoms, an aryl group, an alkylaryl group or an arylalkyl group having 6 to 20 carbon atoms).

作為以式(B)所示之酚性化合物的具體例,可舉例羥基萘。 As a specific example of the phenolic compound represented by the formula (B), hydroxynaphthalene can be exemplified.

(式中,n為1~5之整數,較佳為1~3,又較佳為1。 (In the formula, n is an integer of 1 to 5, preferably 1 to 3, and more preferably 1.

R分別為碳數1~20之烷基、烯基、烷硫基、碳數3~10之環烷基、碳數6~20之芳基、烷基芳基或芳基烷基)。 R is respectively an alkyl group having 1 to 20 carbon atoms, an alkenyl group, an alkylthio group, a cycloalkyl group having 3 to 10 carbon atoms, an aryl group, an alkylaryl group or an arylalkyl group having 6 to 20 carbon atoms).

作為以式(C)所示之化合物的具體例,可舉例o-、m-或p-甲酚、o-、m-或p-乙基苯酚、o-、m-或p-丙基苯酚(例如4-異丙基苯酚)、o-、m-或p-丁基苯酚、o-、m-或p-戊基苯酚(例如4-tert-戊基苯酚)。 As a specific example of the compound represented by the formula (C), o-, m- or p-cresol, o-, m- or p-ethylphenol, o-, m- or p-propylphenol can be exemplified (Eg 4-isopropylphenol), o-, m- or p-butylphenol, o-, m- or p-pentylphenol (eg 4-tert-pentylphenol).

關於式(A)、(B)及(C)之R,作為碳數1~20之烷基,可舉例甲基、乙基、丙基、異丙基、丁基、異丁基、第三丁基等。 Regarding R of the formulas (A), (B) and (C), as the alkyl group having 1 to 20 carbon atoms, there can be exemplified methyl, ethyl, propyl, isopropyl, butyl, isobutyl, third Butyl and so on.

作為烯基,可舉例於上述烷基之分子內具有不飽和鍵 結之基。 As the alkenyl group, there can be exemplified the unsaturated bond in the molecule of the above alkyl group Knot base.

作為環烷基,可舉例環戊烷、環己烷等。 Examples of cycloalkyl groups include cyclopentane and cyclohexane.

作為芳基,可舉例苯基、萘基等。 Examples of the aryl group include phenyl and naphthyl.

作為烷基芳基、及芳基烷基,可舉例組合上述烷基與芳基後所得到的基等。 Examples of the alkylaryl group and the arylalkyl group include a group obtained by combining the above alkyl group and aryl group.

表示上述具有1個酚性羥基之化合物之例,作為取代酚類的具體例,可舉例苯酚、o-、m-或p-氯苯酚、水楊酸、羥基苯甲酸。作為具有複數個酚性羥基之化合物的具體例,可舉例鄰苯二酚、間苯二酚、以下述式(D)所示的化合物。 An example of the above-mentioned compound having one phenolic hydroxyl group is shown. Specific examples of substituted phenols include phenol, o-, m- or p-chlorophenol, salicylic acid, and hydroxybenzoic acid. Specific examples of the compound having a plurality of phenolic hydroxyl groups include catechol, resorcinol, and compounds represented by the following formula (D).

(式中,R為烴基、含有雜原子之烴基、鹵素原子、羧酸基、胺基、SH基、磺酸基、或羥基,複數個R可分別互為相同或相異。n為0~6之整數)。 (In the formula, R is a hydrocarbon group, a hydrocarbon group containing a heteroatom, a halogen atom, a carboxylic acid group, an amine group, a SH group, a sulfonic acid group, or a hydroxyl group, and a plurality of R may be the same or different from each other. N is 0 ~ An integer of 6).

以式(D)所示之酚性化合物,較佳為具有不相互鄰接之2個以上羥基。 The phenolic compound represented by formula (D) preferably has two or more hydroxyl groups that are not adjacent to each other.

又,以式(D)所示的酚性化合物的具體例,可舉例1,6萘二醇、2,6萘二醇、2,7萘二醇。 In addition, specific examples of the phenolic compound represented by the formula (D) include 1,6 naphthalenediol, 2,6 naphthalenediol, and 2,7 naphthalenediol.

作為由具有1個或複數個酚性羥基之重覆單元所構成之高分子化合物的具體例,可舉例酚樹脂、聚 酚、聚(羥基苯乙烯)。 As a specific example of a polymer compound composed of a repeating unit having one or more phenolic hydroxyl groups, phenol resin, polymer Phenol, poly (hydroxystyrene).

包含聚苯胺複合體及酚性化合物,塗佈液中之酚性化合物之含有量,相對於聚苯胺複合體1g,酚性化合物之莫耳濃度較佳為0.01[mmol/g]以上100[mol/g]以下,又較佳0.05[mmol/g]以上1[mol/g]以下,又更佳為0.1[mmol/g]以上500[mmol/g]以下,特佳為0.2[mmol/g]以上80[mmol/g]以下的範圍。 Contains polyaniline complex and phenolic compound. The content of the phenolic compound in the coating solution is preferably 0.01 [mmol / g] or more and 100 [mol] relative to 1 g of the polyaniline complex. / g] or less, preferably 0.05 [mmol / g] or more and 1 [mol / g] or less, still more preferably 0.1 [mmol / g] or more and 500 [mmol / g] or less, particularly preferably 0.2 [mmol / g] ] Above 80 [mmol / g] below the range.

酚性化合物之含有量若過少時,有無法獲得電導率之改善效果之虞。另一方面,酚性化合物之含有量若過多時,膜質有變差之虞。又,除去揮發之際,須要大量的熱或時間等之勞力而使成本增加。 If the content of the phenolic compound is too small, there is a possibility that the effect of improving the electrical conductivity cannot be obtained. On the other hand, if the content of the phenolic compound is too large, the film quality may deteriorate. In addition, when removing the volatilization, a lot of labor such as heat or time is required to increase the cost.

導電性高分子為聚吡咯時,聚吡咯之分子量、分子量分布、取代聚吡咯之取代基為與上述聚苯胺相同。 When the conductive polymer is polypyrrole, the molecular weight, molecular weight distribution, and substituent of the substituted polypyrrole of the polypyrrole are the same as the polyaniline described above.

作為聚吡咯複合體之摻雜劑並無特別限制,可適當使用在一般含有吡咯及/或吡咯衍生物之聚合物所成的導電性聚合物中所適合使用的受體性摻雜劑。 The dopant of the polypyrrole complex is not particularly limited, and an acceptor dopant suitable for use in a conductive polymer generally made of a polymer containing pyrrole and / or a pyrrole derivative can be suitably used.

作為代表的種類有例如聚苯乙烯磺酸、對甲苯磺酸、甲烷磺酸、三氟甲烷磺酸、蒽醌磺酸、苯磺酸、萘磺酸、磺柳酸、十二烷基苯磺酸、烯丙基磺酸等之磺酸類;過氯酸、氯、溴等之鹵素類、路易斯酸、質子酸等。此等可為酸形態,亦可為鹽形態。就對於單體之溶解性之觀點而言,較佳為過氯酸四丁基銨、過氯酸四乙基銨、四氟硼酸四丁基銨、三氟甲烷磺酸四丁基銨、三氟磺醯亞胺四丁基 銨、十二烷基苯磺酸、對甲苯磺酸等。 Representative types include, for example, polystyrenesulfonic acid, p-toluenesulfonic acid, methanesulfonic acid, trifluoromethanesulfonic acid, anthraquinonesulfonic acid, benzenesulfonic acid, naphthalenesulfonic acid, sulfosalic acid, dodecylbenzenesulfonic acid Sulfonic acids such as acids and allyl sulfonic acids; halogens such as perchloric acid, chlorine and bromine, Lewis acids, protonic acids, etc. These can be in acid form or salt form. From the viewpoint of the solubility of the monomer, tetrabutylammonium perchlorate, tetraethylammonium perchlorate, tetrabutylammonium tetrafluoroborate, tetrabutylammonium trifluoromethanesulfonate, Fluorosulfonimide tetrabutyl Ammonium, dodecylbenzenesulfonic acid, p-toluenesulfonic acid, etc.

使用摻雜劑時之摻雜劑的使用量,以吡咯聚合物單元之每單位,較佳為成為摻雜劑0.01~0.3分子之量。若0.01分子以下時,作為形成足夠的導電性路徑為必須的摻雜劑量會變得不足,難以得到高導電性。 When the dopant is used, the amount of the dopant used is preferably 0.01 to 0.3 molecules per unit of the pyrrole polymer unit. If it is 0.01 molecules or less, the doping amount necessary to form a sufficient conductive path becomes insufficient, making it difficult to obtain high conductivity.

另一方面,即使加入0.3分子以上,亦由於摻雜率無法提昇,故0.3分子以上之摻雜劑之添加在經濟上為不宜。在此,所謂的吡咯聚合物單元單位,指對應於吡咯單體聚合所得到的吡咯聚合物之單體1分子的重複部分。 On the other hand, even if 0.3 molecules or more is added, since the doping rate cannot be improved, the addition of 0.3 molecules or more dopants is economically unsuitable. Here, the unit of the pyrrole polymer unit refers to a repeating part corresponding to one molecule of the monomer of the pyrrole polymer obtained by polymerizing the pyrrole monomer.

導電性高分子為聚噻吩時,聚噻吩之分子量、分子量分布、取代聚噻吩之取代基為與上述聚苯胺相同樣。作為取代聚噻吩,較佳為聚乙烯二氧基噻吩(polyethylenedioxythiophene/PEDOT)。 When the conductive polymer is polythiophene, the molecular weight, molecular weight distribution of the polythiophene, and the substituent of the substituted polythiophene are the same as the polyaniline described above. The substituted polythiophene is preferably polyethylenedioxythiophene (PEDOT).

作為聚噻吩複合體之摻雜劑,可舉例陰離子系界面活性劑之有機酸離子、無機酸離子。作為陰離子系界面活性劑之有機酸離子,可舉例磺酸系離子、酯化之硫酸離子等。作為無機酸離子,可舉例硫酸離子、鹵素離子、硝酸離子、過氯酸離子、六氰鐵酸離子、磷酸離子、磷鉬酸離子等。 Examples of the dopant of the polythiophene complex include organic acid ions and inorganic acid ions of anionic surfactants. Examples of organic acid ions of anionic surfactants include sulfonic acid ions and esterified sulfate ions. Examples of inorganic acid ions include sulfate ion, halogen ion, nitric acid ion, perchloric acid ion, hexacyanoferrate ion, phosphoric acid ion, and phosphomolybdate ion.

基材並無特別限定,亦可為金屬、無機素材(陶瓷、玻璃等)、或樹脂。又,亦可為用樹脂完全覆蓋金屬之基材、或無機系素材與樹脂之複合材(例如FRP,玻璃環氧複合材)等。作為樹脂之種類,可舉例聚碳酸酯系、丙烯酸系、尼龍系、聚醯亞胺系、聚酯系、苯乙烯 系、酚系等。又,對於要求耐熱性時,可舉例間規聚苯乙烯(SPS)、聚醯亞胺、聚萘二甲酸乙二酯(PEN)等。 The base material is not particularly limited, and may be metal, inorganic materials (ceramics, glass, etc.), or resin. In addition, the base material of the metal completely covered with resin, or the composite material (for example, FRP, glass epoxy composite material) of the inorganic material and the resin may be used. Examples of the type of resin include polycarbonate, acrylic, nylon, polyimide, polyester, and styrene. System, phenol system, etc. Moreover, when heat resistance is required, syndiotactic polystyrene (SPS), polyimide, polyethylene naphthalate (PEN), etc. are mentioned.

作為基材,較佳為聚對苯二甲酸乙二酯(PET)薄膜。 As the base material, a polyethylene terephthalate (PET) film is preferred.

就基材之可撓性、印刷時之尺寸安定性、及薄膜之取得性之觀點而言,較佳為基材的厚度為2μm以上。例如10μm以上、20μm以上、50μm以上。上限並無特別限定,例如100mm以下、10mm以下、1mm以下。 From the viewpoints of flexibility of the substrate, dimensional stability during printing, and availability of the film, the thickness of the substrate is preferably 2 μm or more. For example, 10 μm or more, 20 μm or more, and 50 μm or more. The upper limit is not particularly limited, for example, 100 mm or less, 10 mm or less, and 1 mm or less.

無電解鍍敷底層膜之形成方法並無特別限定。可舉例例如使用將導電性聚合物溶解於溶劑中之溶液(塗液),藉由桿塗法塗佈於基材上並乾燥之塗佈方法。 The method of forming the electroless plating underlayer film is not particularly limited. For example, a coating method in which a solution (coating liquid) in which a conductive polymer is dissolved in a solvent is applied to a substrate by a bar coating method and dried.

作為上述溶劑,可適當使用芳香族系、酮系、脂肪族系、醇系、醯胺系、酯系等,但,具體的可舉例甲苯、甲酚、己烷、甲基異丁基酮、2-丁酮、2-丙醇、甲醇、二甲基甲醯胺、乙酸丁酯、乙酸乙酯等。此等可單獨使用,亦可組合複數個使用。 As the above solvent, aromatic, ketone, aliphatic, alcohol, amide, ester, etc. can be suitably used, but specific examples include toluene, cresol, hexane, methyl isobutyl ketone, 2-butanone, 2-propanol, methanol, dimethylformamide, butyl acetate, ethyl acetate, etc. These can be used alone or in combination.

上述塗液為了提升與基材之黏著性,亦可包含黏合劑。作為黏合劑,可舉例丙烯酸系、胺基甲酸酯系、環氧系、聚醯胺系、乙烯基系、聚酯系、聚碳酸酯系等。 In order to improve the adhesion to the substrate, the coating liquid may also contain an adhesive. Examples of the binder include acrylic, urethane, epoxy, polyamide, vinyl, polyester, and polycarbonate.

再者,將於末端具有丙烯酸酯、甲基丙烯酸酯等之反應性官能基,並以UV(紫外線)或EB(電子線)等所硬化之單體、低聚物、聚合物作為黏合劑亦可。此時,取代上述溶劑,亦可作為添加單體或低聚物來調整 黏度等液性之無溶劑系來使用。 Furthermore, monomers, oligomers, and polymers that have reactive functional groups such as acrylates and methacrylates at the ends and are hardened with UV (ultraviolet) or EB (electron rays), etc., are also used as binders. can. At this time, instead of the above solvent, it can also be adjusted as an added monomer or oligomer It is used in liquid solvent-free systems such as viscosity.

無電解鍍敷底層膜之乾燥膜厚,較佳為0.1μm以上,又較佳為0.2μm以上。膜厚若未達0.1μm時,因無法保持基材與鍍敷膜之黏著力,故將變為易於剝離。又,Pd金屬無載持之區域有變多之虞,且無電解鍍敷之區域有變多之虞。乾燥膜厚之上限並無特別,例如100μm以下、10μm以下、5.0μm以下。 The dry film thickness of the electroless plating underlayer film is preferably 0.1 μm or more, and more preferably 0.2 μm or more. If the film thickness is less than 0.1 μm, the adhesion between the substrate and the plated film cannot be maintained, so it will be easily peeled off. In addition, there is a possibility that the area where the Pd metal is not supported may increase, and the area where the electroless plating is applied may increase. The upper limit of the dry film thickness is not particularly limited, for example, 100 μm or less, 10 μm or less, and 5.0 μm or less.

2.與酸性還原劑水溶液之接觸步驟 2. Contact procedure with acidic reducing agent aqueous solution

本步驟中,使以上述所得到的無電解鍍敷底層膜,與標準電極電位E0為E0=-1.00V~-0.10V之酸性的還原劑水溶液接觸。 In this step, the electroless plated base film obtained as described above is brought into contact with an acidic reducing agent aqueous solution whose standard electrode potential E 0 is E 0 = -1.00V to -0.10V.

本發明之還原劑水溶液為酸性,還原劑水溶液之pH較佳為6以下,又較佳為5以下。又,還原劑水溶液之pH較佳為3以上。如此,意即較佳為弱酸性範圍。pH係使用pH計進行測定。 The reducing agent aqueous solution of the present invention is acidic, and the pH of the reducing agent aqueous solution is preferably 6 or less, and more preferably 5 or less. In addition, the pH of the reducing agent aqueous solution is preferably 3 or more. This means that the weakly acidic range is preferred. The pH is measured using a pH meter.

又,還原劑水溶液之標準電極電位E0,較佳為E0=-0.20V~-0.80V。標準電極電位係在25℃之條件下,根據用氧化還原電位計(ORP計)所測定之值所算出。尚,本發明之還原劑水溶液因為酸性,故氧化還原電位計之測定亦於酸性環境下進行。 In addition, the standard electrode potential E 0 of the reducing agent aqueous solution is preferably E 0 = -0.20V ~ -0.80V. The standard electrode potential is calculated based on the value measured with an oxidation-reduction potentiometer (ORP meter) under the condition of 25 ° C. Still, since the reducing agent aqueous solution of the present invention is acidic, the measurement of the redox potentiometer is also performed under an acidic environment.

作為還原劑,最佳為亞硫酸氫鈉。 As the reducing agent, sodium bisulfite is the best.

還原劑水溶液之濃度(重量比)較佳為2%~20%,又較佳為3~18%,更佳為4%~16%,最佳為8~ 16%。濃度若過低時,有無法將聚苯胺等之導電性聚合物成為完全還原狀態之虞。 The concentration (weight ratio) of the reducing agent aqueous solution is preferably 2% to 20%, preferably 3 to 18%, more preferably 4% to 16%, and most preferably 8 to 16%. If the concentration is too low, there is a possibility that the conductive polymer such as polyaniline cannot be completely reduced.

尚,於還原劑處理前,為了重整表面之狀態可藉由界面活性劑來進行處理。 Still, before the reducing agent treatment, in order to reform the state of the surface, it can be treated with a surfactant.

於上述接觸步驟後,通常包含使觸媒金屬載持於無電解鍍敷底層膜之步驟。 After the above contacting step, the step of supporting the catalytic metal on the electroless plating underlayer film is generally included.

觸媒金屬之載持,可使觸媒金屬之單體或化合物之溶液(即,包含觸媒金屬離子之溶液)接觸於無電解鍍敷底層膜來進行。 The support of the catalyst metal can be carried out by contacting the solution of the monomer or compound of the catalyst metal (that is, the solution containing the catalyst metal ion) with the electroless plating underlayer film.

使包含觸媒金屬離子之溶液接觸時,聚苯胺複合體等之導電性聚合物不但吸附觸媒金屬離子,且藉由導電性聚合物之還原作用,觸媒金屬離子可還原成觸媒金屬。 When contacting a solution containing catalytic metal ions, conductive polymers such as polyaniline composites not only adsorb catalytic metal ions, but also by catalytic polymer reduction, catalytic metal ions can be reduced to catalytic metals.

尚,觸媒金屬為還原之狀態,即必須為金屬狀態,否則就無法展現無電解鍍敷中之觸媒作用。 Still, the catalyst metal is in a reduced state, that is, it must be in a metallic state, otherwise the catalyst function in electroless plating cannot be exhibited.

上述每單元面積之觸媒金屬附著量(包含觸媒金屬離子及觸媒金屬)較佳為1.7μg/cm2以上,又較佳為2.5μg/cm2以上。 Applied amount of the catalyst metal per unit area of (a catalyst comprising catalytic metal and metal ion) is preferably 1.7μg / cm 2 or more, and preferably 2.5μg / cm 2 or more.

作為觸媒金屬,較佳為鈀(Pd)。又,作為Pd化合物,較佳為氯化鈀。 The catalyst metal is preferably palladium (Pd). In addition, as the Pd compound, palladium chloride is preferred.

作為溶劑,鹽酸為一般所使用。然而,只要Pd以離子狀態存在於水溶液中即可,故不限定於鹽酸水溶液中。作為Pd化合物溶液,可舉例例如0.02%氯化鈀-0.01%鹽酸水溶液(pH3)。 As a solvent, hydrochloric acid is generally used. However, as long as Pd exists in the aqueous solution in an ionic state, it is not limited to the aqueous hydrochloric acid solution. Examples of the Pd compound solution include 0.02% palladium chloride-0.01% hydrochloric acid aqueous solution (pH 3).

Pd化合物溶液與無電解鍍敷底層膜之接觸溫 度通常為20~50℃、較佳為30~40℃,接觸時間通常為0.1~10分鐘,較佳為1~5分鐘。 Contact temperature between Pd compound solution and electroless plating bottom film The degree is usually 20 to 50 ° C, preferably 30 to 40 ° C, and the contact time is usually 0.1 to 10 minutes, preferably 1 to 5 minutes.

3.無電解鍍敷層之形成步驟 3. Formation steps of electroless plating

本步驟中,於已進行上述處理之無電解鍍敷底層膜上形成無電解鍍敷層。 In this step, an electroless plating layer is formed on the electroless plating underlayer film that has been subjected to the above-mentioned treatment.

無電解鍍敷層之形成,可於使無電解鍍敷液與鍍敷底層膜接觸後來進行。鍍敷底層膜與無電解鍍敷液若接觸時,藉由載持之觸媒金屬之觸媒作用,於鍍敷底層膜上可形成鍍敷層。 The formation of the electroless plating layer can be performed after the electroless plating solution is brought into contact with the plating base film. If the plating underlayer film and the electroless plating solution are in contact, a plating layer can be formed on the plating underlayer film by the catalytic action of the supported catalyst metal.

所謂無電解鍍敷係指,使用還原劑來進行之具有自體觸媒作用之金屬之無電解鍍敷。例如無電解銅鍍敷時,使用甲醛等之還原劑來還原溶液中之銅離子後使金屬銅皮膜析出,析出之金屬銅成為自體觸媒後,再將銅離子做金屬化並使析出之化學性程序。 The so-called electroless plating refers to the electroless plating of a metal with an autocatalytic effect using a reducing agent. For example, in electroless copper plating, a reducing agent such as formaldehyde is used to reduce the copper ions in the solution and the metal copper film is precipitated. After the precipitated metal copper becomes an autocatalyst, the copper ions are metalized and precipitated Chemical procedures.

作為無電解鍍敷液,可使用通常的無電解鍍敷液。無電解鍍敷之金屬種類,除了銅以外可舉例鎳、鈷、鈀、銀、金、鉑及錫等。無電解鍍敷液係可包含由銅、鎳、鈷、鈀、銀、金、鉑及錫中選擇之1以上的金屬離子。又,除了此等以外亦可含有磷、硼、鐵等之元素。 As the electroless plating solution, a general electroless plating solution can be used. Examples of metal types for electroless plating include nickel, cobalt, palladium, silver, gold, platinum, and tin, in addition to copper. The electroless plating solution may contain one or more metal ions selected from copper, nickel, cobalt, palladium, silver, gold, platinum, and tin. In addition to these, elements such as phosphorus, boron, and iron may be contained.

與無電解鍍敷液之接觸溫度係依鍍敷浴種類、厚度等而不同,但例如只要低溫浴時為20~50℃程度、高溫時為50~90℃程度。又,與無電解鍍敷液之接觸時間亦依鍍敷浴種類或厚度等而不同,例如1~30分鐘, 較佳為5~15分鐘。 The contact temperature with the electroless plating solution differs depending on the type and thickness of the plating bath, but, for example, as long as it is about 20 to 50 ° C at low temperature baths and about 50 to 90 ° C at high temperatures. In addition, the contact time with the electroless plating solution also varies according to the type or thickness of the plating bath, for example, 1 to 30 minutes, It is preferably 5 to 15 minutes.

亦可以無電解鍍敷進行鍍敷,或亦可以無電解鍍敷來設置金屬薄膜後,再藉由電解鍍敷進而設置同種或相異的金屬膜。 Electroless plating may be used for plating, or after the metal thin film is provided by electroless plating, the same or different metal film may be provided by electrolytic plating.

〔實施例〕 [Example] 製造例1 Manufacturing Example 1 [聚苯胺複合體之製造] [Manufacture of polyaniline complex]

將Aerosol OT(二-2-乙基己基磺基琥珀酸鈉)(AOT)37.8g及具有聚氧乙烯去水山梨醇脂肪酸酯構造之非離子乳化劑Sorbon T-20(東邦化學工業股份有限公司製)1.47g溶解在甲苯600mL中的溶液,在氮氣流下置入於6L的分液瓶中,進而於該溶液中加入22.2g的苯胺。之後,將1M磷酸1800mL添加在溶液中,並將具有甲苯與水之二個液相溶液的溫度冷卻至5℃。 Aerosol OT (di-2-ethylhexyl sodium sulfosuccinate) (AOT) 37.8g and non-ionic emulsifier Sorbon T-20 (Toho Chemical Industry Co., Ltd.) with a polyoxyethylene sorbitan fatty acid ester structure (Produced by the company) 1.47 g of a solution dissolved in 600 mL of toluene was placed in a 6 L separator bottle under a nitrogen stream, and then 22.2 g of aniline was added to this solution. After that, 1800 mL of 1M phosphoric acid was added to the solution, and the temperature of the two liquid-phase solutions with toluene and water was cooled to 5 ° C.

在溶液內溫到達5℃的時候,以每分鐘390回轉來進行攪拌。將65.7g的過硫酸銨溶解於1M磷酸600mL的溶液,利用滴液漏斗花2小時進行滴液。自滴液開始18小時,實施將溶液內溫維持至5℃狀態下使進行反應。之後,使反應溫度上昇至40℃,持續反應1小時。之後,靜置並分離甲苯相。在所得到的甲苯相中添加1500ml甲苯,以1M磷酸500mL洗淨1次、以離子交換水500mL洗淨3次,並靜置分離甲苯相,由於濃度調整 而進行的濃縮,而得到聚苯胺複合體(聚苯胺/AOT複合體)甲苯溶液900g。該聚苯胺複合體甲苯溶液的聚苯胺複合體濃度為5.7重量%。 When the internal temperature of the solution reached 5 ° C, stirring was performed at 390 revolutions per minute. 65.7 g of ammonium persulfate was dissolved in a solution of 600 mL of 1 M phosphoric acid, and the solution was dropped with a dropping funnel for 2 hours. 18 hours from the start of dripping, the reaction was carried out while maintaining the internal temperature of the solution to 5 ° C. Thereafter, the reaction temperature was raised to 40 ° C, and the reaction was continued for 1 hour. Thereafter, the toluene phase was left to stand and separated. To the obtained toluene phase, add 1500 ml of toluene, wash once with 500 mL of 1M phosphoric acid, and wash three times with 500 mL of ion-exchanged water, and stand still to separate the toluene phase due to concentration adjustment Concentration was performed to obtain 900 g of a polyaniline complex (polyaniline / AOT complex) toluene solution. The polyaniline complex toluene solution had a polyaniline complex concentration of 5.7% by weight.

製造例2 Manufacturing Example 2

將以製造例1所得的聚苯胺/AOT複合體甲苯溶液,以60℃的水浴做減壓乾燥,得到乾固的聚苯胺複合體(粉末)51.3g。 The polyaniline / AOT composite toluene solution obtained in Production Example 1 was dried in a water bath at 60 ° C. under reduced pressure to obtain 51.3 g of dry solid polyaniline composite (powder).

實施例1 Example 1 [鍍敷底層膜形成步驟] [Procedure for forming the underlying film]

將以製造例2所得的聚苯胺複合體粉末2.8g溶解在甲基異丁基酮(MIBK:和光純藥製)17g與異丙醇(和光純藥製)8.5g中。之後,添加胺基甲酸酯樹脂ASPU112(DIC股份有限公司製、固形分濃度30%)5.7g並進行攪拌,製作均勻的鍍敷底層形成用塗液。 2.8 g of the polyaniline composite powder obtained in Production Example 2 was dissolved in 17 g of methyl isobutyl ketone (MIBK: manufactured by Wako Pure Chemical Industries) and 8.5 g of isopropyl alcohol (made by Wako Pure Chemical Industries). Thereafter, 5.7 g of the urethane resin ASPU112 (manufactured by DIC Co., Ltd., solid content concentration 30%) was added and stirred to prepare a uniform coating liquid for plating underlayer formation.

將所得到的塗液使用棒式塗佈,塗佈在聚碳酸酯薄膜之碳玻璃薄膜C110C(PC薄膜、旭硝子股份有限公司製)上,以120℃下30分鐘乾燥後形成鍍敷底層膜。鍍敷底層膜之厚度為1μm。鍍敷底層膜中之聚苯胺複合體濃度為62.5wt%、胺基甲酸酯樹脂濃度為37.5wt%。 The obtained coating liquid was applied using a bar coater, applied to a carbon glass film C110C (PC film, manufactured by Asahi Glass Co., Ltd.) of a polycarbonate film, and dried at 120 ° C. for 30 minutes to form a plating base film. The thickness of the plating base film is 1 μm. The concentration of the polyaniline complex in the plating base film was 62.5wt%, and the concentration of the urethane resin was 37.5wt%.

[脫脂步驟] [Degreasing step]

將所得到的薄膜(鍍敷底層膜)在室溫下,在3% DIANOL CDE(椰子油脂肪酸二乙醇胺;非離子界面活性劑、第一工業製藥股份有限公司製)水溶液中浸漬5分鐘進行脫脂處理。尚,該脫脂處理係將濕潤性之提升作為目的。 The obtained thin film (plating base film) at room temperature, in 3% DIANOL CDE (coconut oil fatty acid diethanolamine; nonionic surfactant, manufactured by Daiichi Pharmaceutical Co., Ltd.) was immersed in an aqueous solution for 5 minutes for degreasing treatment. Still, this degreasing treatment aims at improving the wettability.

[使接觸於Pd化合物溶液之步驟] [Step of contacting with Pd compound solution]

將脫脂處理後之薄膜在red Schumer(鈀水溶液、日本KANIGEN股份有限公司製)之5倍稀釋液中以30℃浸漬5分鐘,來進行金屬Pd載持處理。 The film after degreasing treatment was immersed in a 5-fold dilution of red Schumer (a palladium aqueous solution, manufactured by KANIGEN Co., Ltd., Japan) at 30 ° C. for 5 minutes to perform a metal Pd support treatment.

[使接觸於無電解鍍敷液之步驟] [Procedure for contacting with electroless plating solution]

對於Pd金屬載持處理後之薄膜,使用無電解銅鍍敷液「ATS add copper IW」(奥野製藥工業股份有限公司製),以33℃下進行15分鐘鍍敷處理。 The film after the Pd metal supporting treatment was subjected to a plating treatment at 33 ° C for 15 minutes using an electroless copper plating solution "ATS add copper IW" (manufactured by Okuno Pharmaceutical Industry Co., Ltd.).

[格子試驗] [Lattice test]

對於所得到的鍍敷部份,依據JIS-5600在鍍敷膜上以刀片劃出格子狀的痕紋,貼上CELLOTAPE(註冊商標)(NICHIBAN股份有限公司製)並順勢剝下來進行格子試驗。其結果,不但無法觀測到剝離,且黏著性為良好。 With respect to the obtained plated part, a grid-like mark was made with a blade on the plated film according to JIS-5600, and CELLOTAPE (registered trademark) (manufactured by Nichiban Co., Ltd.) was attached and peeled off to perform a grid test. As a result, not only the peeling was not observed, but also the adhesiveness was good.

實施例2 Example 2

除了添加胺基甲酸酯樹脂之UREARNO U301(荒川 化學股份有限公司製、固形分濃度25%)6.8g來替代ASPU112以外,與實施例1相同之方式來製作鍍敷底層形成用塗液及鍍敷底層膜。鍍敷底層膜中之聚苯胺複合體濃度為62.5wt%、胺基甲酸酯樹脂濃度為37.5wt%。 In addition to the addition of urethane resin UREARNO U301 (Arakawa Chemical Co., Ltd., solid content concentration 25%) 6.8 g was used instead of ASPU112, and the coating liquid for forming a plating underlayer and the plating underlayer film were produced in the same manner as in Example 1. The concentration of the polyaniline complex in the plating base film was 62.5wt%, and the concentration of the urethane resin was 37.5wt%.

之後,與實施例1相同之方式來進行脫脂、Pd載持及鍍敷處理,並進行格子試驗。其結果不但無法觀測到剝離,且黏著性為良好。 Thereafter, in the same manner as in Example 1, degreasing, Pd loading, and plating treatment were performed, and a lattice test was performed. As a result, not only was no peeling observed, but the adhesion was good.

實施例3 Example 3

除了添加胺基甲酸酯樹脂之TSP3301(荒川化學股份有限公司製、固形分濃度25%)6.8g來替代ASPU112以外,與實施例1相同之方式來製作鍍敷底層形成用塗液及鍍敷底層膜。鍍敷底層膜中之聚苯胺複合體濃度為62.5wt%、胺基甲酸酯樹脂濃度為37.5wt%。 Except for adding 6.8 g of TSP3301 (made by Arakawa Chemical Co., Ltd., with a solid concentration of 25%) of urethane resin in place of ASPU112, the coating liquid and the plating solution for plating underlayer formation were prepared in the same manner as Example Bottom film. The concentration of the polyaniline complex in the plating base film was 62.5wt%, and the concentration of the urethane resin was 37.5wt%.

之後,與實施例1相同之方式來進行脫脂、Pd載持及鍍敷處理,並進行格子試驗。其結果不但無法觀測到剝離,且黏著性為良好。 Thereafter, in the same manner as in Example 1, degreasing, Pd loading, and plating treatment were performed, and a lattice test was performed. As a result, not only was no peeling observed, but the adhesion was good.

實施例4 Example 4

除了添加胺基甲酸酯樹脂之DAIFERAMINE MAU1008(大日精化股份有限公司製、固形分濃度30%)5.7g來替代添加ASPU112以外,與實施例1相同的製作鍍敷底層形成用塗液及鍍敷底層膜。鍍敷底層膜中之聚苯胺複合體濃度為62.5wt%、胺基甲酸酯樹脂濃度為 37.5wt%。 Except for adding 5.7 g of DAIFERAMINE MAU1008 (manufactured by Dari Fine Chemicals Co., Ltd., solid content concentration of 30%) added with urethane resin instead of adding ASPU112, the same coating liquid and plating as in Example 1 were produced Apply the base film. The concentration of the polyaniline complex in the plating base film is 62.5wt%, and the concentration of the urethane resin is 37.5wt%.

之後,與實施例1相同之方式來進行脫脂、Pd載持及鍍敷處理,並進行格子試驗。其結果不但無法觀測到剝離,且黏著性為良好。 Thereafter, in the same manner as in Example 1, degreasing, Pd loading, and plating treatment were performed, and a lattice test was performed. As a result, not only was no peeling observed, but the adhesion was good.

實施例5 Example 5

除了添加胺基甲酸酯樹脂之DAIFERAMINE MAU1005(大日精化股份有限公司製、固形分濃度30%)5.7g來替代添加ASPU112以外,與實施例1相同的製作鍍敷底層形成用塗液及鍍敷底層膜。鍍敷底層膜中之聚苯胺複合體濃度為62.5wt%、胺基甲酸酯樹脂濃度為37.5wt%。 Except for adding 5.7 g of DAIFERAMINE MAU1005 (manufactured by Dari Fine Chemicals Co., Ltd., solid content concentration of 30%) added with urethane resin instead of adding ASPU112, the same coating liquid and plating as used in Example 1 were prepared Apply the base film. The concentration of the polyaniline complex in the plating base film was 62.5wt%, and the concentration of the urethane resin was 37.5wt%.

之後,與實施例1相同之方式進行脫脂、Pd載持及鍍敷處理,並進行格子試驗。其結果不但無法觀測到剝離,且黏著性為良好。 Thereafter, in the same manner as in Example 1, degreasing, Pd loading, and plating treatment were performed, and a lattice test was performed. As a result, not only was no peeling observed, but the adhesion was good.

實施例6 Example 6

除了添加胺基甲酸酯樹脂之DAIFERAMINE MAU4308HV(大日精化股份有限公司製、固形分濃度35%)4.8g來替代ASPU112以外,與實施例1相同的製作鍍敷底層形成用塗液及鍍敷底層膜。鍍敷底層膜中之聚苯胺複合體濃度為62.5wt%、胺基甲酸酯樹脂濃度為37.5wt%。 Except for adding 4.8 g of DAIFERAMINE MAU4308HV (manufactured by Dari Fine Chemicals Co., Ltd., solid content concentration of 35%) added with urethane resin instead of ASPU112, the same coating liquid and plating as in Example 1 were prepared Bottom film. The concentration of the polyaniline complex in the plating base film was 62.5wt%, and the concentration of the urethane resin was 37.5wt%.

之後,與實施例1相同之方式進行脫脂、Pd載持及 鍍敷處理,並進行格子試驗。其結果不但無法觀測到剝離,且黏著性為良好。 After that, degreasing, Pd loading, and Plating treatment, and lattice test. As a result, not only was no peeling observed, but the adhesion was good.

實施例7 Example 7

除了添加胺基甲酸酯樹脂之DAIFERAMINE MAU1008(大日精化股份有限公司製、固形分濃度30%)2.8g,胺基甲酸酯樹脂之ASPU112(DIC股份有限公司製、固形分濃度30%)2.8g來替代ASPU112以外,與實施例1相同的製作鍍敷底層形成用塗液及鍍敷底層膜。鍍敷底層膜中之聚苯胺複合體濃度為62.5wt%、胺基甲酸酯樹脂濃度為37.5wt%(MAU1008:ASPU=1:1)。 In addition to 2.8 g of DAIFERAMINE MAU1008 (made by Dari Fine Chemicals Co., Ltd., solid content concentration 30%) added with urethane resin, ASPU112 (made by DIC Co., Ltd., solid content concentration 30%) of urethane resin Except for ASPU112 instead of 2.8g, a coating liquid for forming a plating underlayer and a plating underlayer film were produced in the same manner as in Example 1. The concentration of the polyaniline complex in the plating base film was 62.5wt%, and the concentration of the urethane resin was 37.5wt% (MAU1008: ASPU = 1: 1).

之後,與實施例1相同之方式進行脫脂、Pd載持及鍍敷處理,並進行格子試驗。其結果不但無法觀測到剝離,且黏著性為良好。 Thereafter, in the same manner as in Example 1, degreasing, Pd loading, and plating treatment were performed, and a lattice test was performed. As a result, not only was no peeling observed, but the adhesion was good.

實施例8 Example 8

除了添加胺基甲酸酯樹脂之ASPU112(DIC股份有限公司製、固形分濃度30%)2.8g,聚乙烯丁醛之KS-10(積水化學股份有限公司製)0.85g來替代ASPU112以外,與實施例1相同的製作鍍敷底層形成用塗液及鍍敷底層膜。鍍敷底層膜中之聚苯胺複合體濃度為62.5wt%、胺基甲酸酯樹脂濃度為18.75wt%、聚乙烯丁醛濃度為18.75wt%。 In addition to the addition of 2.8 g of ASPU112 (manufactured by DIC Co., Ltd., solid content concentration) of 2.8 g of urethane resin, and 0.85 g of KS-10 (manufactured by Sekisui Chemical Co., Ltd.) of polyethylene butyraldehyde instead of ASPU112 In Example 1, a coating liquid for forming a plating underlayer and a plating underlayer film were produced. The concentration of the polyaniline complex in the plating base film is 62.5 wt%, the concentration of the urethane resin is 18.75 wt%, and the concentration of the polyvinyl butyraldehyde is 18.75 wt%.

之後,與實施例1相同之方式進行脫脂、Pd載持及 鍍敷處理,並進行格子試驗。其結果不但無法觀測到剝離,且黏著性為良好。 After that, degreasing, Pd loading, and Plating treatment, and lattice test. As a result, not only was no peeling observed, but the adhesion was good.

比較例1 Comparative example 1

除了無添加ASPU112以外,與實施例1相同的製作鍍敷底層形成用塗液及鍍敷底層膜。鍍敷底層膜中之聚苯胺複合體濃度為100wt%。 The coating liquid for forming a plating underlayer and the plating underlayer film were produced in the same manner as in Example 1, except that ASPU112 was not added. The concentration of the polyaniline complex in the plating base film is 100 wt%.

之後,與實施例1相同之方式進行脫脂、Pd載持及鍍敷處理,並進行格子試驗。其結果在鍍敷底層膜與Cu鍍敷層之界面上,試驗部份為全面剝離。又,即使鍍敷底層膜露出之部份進行相同的格子試驗之結果,亦在PC薄膜與鍍敷底層膜界面上,試驗部份為全面剝離。 Thereafter, in the same manner as in Example 1, degreasing, Pd loading, and plating treatment were performed, and a lattice test was performed. As a result, at the interface between the plating base film and the Cu plating layer, the test portion was completely peeled off. Furthermore, even if the same lattice test was performed on the exposed portion of the plating underlayer film, the test portion was completely peeled off at the interface between the PC film and the plating underlayer film.

比較例2 Comparative example 2

除了添加聚酯樹脂之BYRON 20SS(東洋紡股份有限公司製、固形分濃度30%)5.7g來替代ASPU112以外,與實施例1相同的製作鍍敷底層形成用塗液及鍍敷底層膜。鍍敷底層膜中之聚苯胺複合體濃度為62.5wt%,聚酯樹脂濃度為37.5wt%。此時,若觀察鍍敷底層膜時,聚苯胺複合體與BYRON 20SS之相溶性差,鍍敷底層膜為不均勻且變為脆弱。 A coating liquid for forming a plating underlayer and a plating underlayer film were produced in the same manner as in Example 1, except that 5.7 g of BYRON 20SS (manufactured by Toyobo Co., Ltd., solid content concentration of 30%) was added instead of ASPU112. The concentration of the polyaniline complex in the plating base film is 62.5% by weight, and the concentration of the polyester resin is 37.5% by weight. At this time, when the plating underlayer film is observed, the compatibility between the polyaniline composite and BYRON 20SS is poor, and the plating underlayer film is uneven and becomes fragile.

之後,與實施例1相同之方式進行脫脂、Pd載持及鍍敷處理,並進行格子試驗。其結果,由於鍍敷底層膜變為脆弱,故可確認來自鍍敷底層膜中間的剝離。 Thereafter, in the same manner as in Example 1, degreasing, Pd loading, and plating treatment were performed, and a lattice test was performed. As a result, since the plating base film becomes fragile, peeling from the middle of the plating base film can be confirmed.

比較例3 Comparative Example 3

除了添加聚酯樹脂之BYRON 50DS(東洋紡股份有限公司製)1.7g來替代ASPU112以外,與實施例1相同的製作鍍敷底層形成用塗液及鍍敷底層膜。若觀察鍍敷底層膜時,聚苯胺複合體與BYRON 50DS之相溶性差,鍍敷底層膜為不均勻且變為脆弱。 A coating liquid for forming a plating underlayer and a plating underlayer film were produced in the same manner as in Example 1, except that 1.7 g of BYRON 50DS (manufactured by Toyobo Co., Ltd.) of polyester resin was added instead of ASPU112. If the bottom coating film is observed, the compatibility between the polyaniline composite and BYRON 50DS is poor, and the bottom coating film is uneven and becomes fragile.

之後,與實施例1相同之方式進行脫脂、Pd載持及鍍敷處理,並進行格子試驗。其結果,由於鍍敷底層膜變為脆弱,故可確認來自鍍敷底層膜中間的剝離。 Thereafter, in the same manner as in Example 1, degreasing, Pd loading, and plating treatment were performed, and a lattice test was performed. As a result, since the plating base film becomes fragile, peeling from the middle of the plating base film can be confirmed.

比較例4 Comparative Example 4

除了添加氯化聚烯烴之Superchlon822(日本製紙chemical股份有限公司製、固形分濃度20%)8.5g來替代ASPU112以外,與實施例1相同的製作鍍敷底層形成用塗液及鍍敷底層膜。鍍敷底層膜中之聚苯胺複合體濃度為62.5wt%,氯化聚烯烴濃度為37.5wt%。 A coating liquid for forming a plating underlayer and a plating underlayer film were produced in the same manner as in Example 1, except that 8.5 g of Superchlon822 (manufactured by Nippon Paper Chemical Co., Ltd., solid content concentration of 20%) was added in place of ASPU112. The concentration of polyaniline complex in the plating base film is 62.5wt%, and the concentration of chlorinated polyolefin is 37.5wt%.

之後,與實施例1相同之方式進行脫脂、Pd載持及鍍敷處理,並進行格子試驗。其結果,鍍敷底層膜與Cu層界面之黏著性為良好,但在鍍敷底層膜與PC薄膜界面上試驗部份為全面剝離。 Thereafter, in the same manner as in Example 1, degreasing, Pd loading, and plating treatment were performed, and a lattice test was performed. As a result, the adhesion between the plating base film and the Cu layer was good, but the test portion was completely peeled off at the interface between the plating base film and the PC film.

比較例5 Comparative Example 5

除了添加酚樹脂之GDP6140(群榮化學股份有限公司 製、固形分濃度30%)5.7g來替代ASPU112以外,與實施例1相同的製作鍍敷底層形成用塗液及鍍敷底層膜。鍍敷底層膜中之聚苯胺複合體濃度為62.5wt%,酚樹脂濃度為37.5wt%。 In addition to GDP6140 with phenol resin added (Qunrong Chemical Co., Ltd. In addition to ASPU112, in the same manner as in Example 1, a coating liquid for forming a plating underlayer and a plating underlayer film were produced in the same manner as in Example 1 except that 5.7 g of solid content and solid content concentration were changed to 5.7 g. The concentration of the polyaniline complex in the plating base film is 62.5wt%, and the concentration of the phenol resin is 37.5wt%.

之後,與實施例1相同之方式進行脫脂、Pd載持及鍍敷處理,並進行格子試驗。其結果,底層膜與Cu層界面之黏著性為良好,但在鍍敷底層膜與PC薄膜界面上試驗部份為全面剝離。 Thereafter, in the same manner as in Example 1, degreasing, Pd loading, and plating treatment were performed, and a lattice test was performed. As a result, the adhesion between the underlayer film and the Cu layer was good, but the test portion was completely peeled off at the interface between the plated underlayer film and the PC film.

比較例6 Comparative Example 6

除了添加聚乙烯丁醛樹脂之KS-10(積水化學股份有限公司製)1.7g來替代ASPU112以外,實施例1相同的製作鍍敷底層形成用塗液及鍍敷底層膜。鍍敷底層膜中之聚苯胺複合體濃度為62.5wt%,聚乙烯丁醛樹脂濃度為37.5wt%。 Except for adding 1.7 g of KS-10 (manufactured by Sekisui Chemical Co., Ltd.) of polyethylene butyraldehyde resin in place of ASPU112, the coating liquid for forming a plating underlayer and the plating underlayer film were prepared in the same manner as in Example 1. The concentration of polyaniline complex in the plating base film is 62.5wt%, and the concentration of polyvinyl butyraldehyde resin is 37.5% wt.

之後,與實施例1相同之方式進行脫脂、Pd載持及鍍敷處理,並進行格子試驗。其結果,鍍敷底層膜與Cu層界面之黏著性為良好,但在鍍敷底層膜與PC薄膜界面上試驗部份為一部份剝離。 Thereafter, in the same manner as in Example 1, degreasing, Pd loading, and plating treatment were performed, and a lattice test was performed. As a result, the adhesion between the plating base film and the Cu layer was good, but the test portion was partially peeled off at the interface between the plating base film and the PC film.

比較例7 Comparative Example 7

除了添加聚醯胺醯亞胺樹脂之TORESIN EF-30T(Nagase ChemteX股份有限公司製)1.7g來替代ASPU112以外,與實施例1相同的製作鍍敷底層形成用塗 液及鍍敷底層膜。鍍敷底層膜中之聚苯胺複合體濃度為62.5wt%,聚醯胺醯亞胺樹脂濃度為37.5wt%。 Except for adding 1.7 g of TORESIN EF-30T (manufactured by Nagase ChemteX Co., Ltd.) of polyamide amide imide resin in place of ASPU112, the same coating as in Example 1 was made to form a coating for forming a plating base layer Liquid and plating the bottom film. The concentration of the polyaniline complex in the plating base film was 62.5wt%, and the concentration of the polyimide amide imine resin was 37.5wt%.

之後,與實施例1相同之方式進行脫脂、Pd載持及鍍敷處理,並進行格子試驗。其結果,在鍍敷底層膜與Cu層界面上試驗部份為全面剝離。又,以鍍敷底層膜為露出之部份進行相同的格子試驗之結果,不但無在鍍敷底層膜與PC薄膜界面上的剝離,且黏著性為良好。 Thereafter, in the same manner as in Example 1, degreasing, Pd loading, and plating treatment were performed, and a lattice test was performed. As a result, the test part was completely peeled off at the interface between the plating base film and the Cu layer. In addition, as a result of performing the same lattice test with the plating base film as the exposed portion, not only was there no peeling at the interface between the plating base film and the PC film, but the adhesion was good.

比較例8 Comparative Example 8

除了添加聚醯胺醯亞胺樹脂之TORESINF-30K(Nagase ChemteX股份有限公司製)1.7g來替代ASPU112以外,與實施例1相同的製作鍍敷底層形成用塗液及鍍敷底層膜。鍍敷底層膜中之聚苯胺複合體濃度為62.5wt%,聚醯胺醯亞胺樹脂濃度為37.5wt%。 Except for adding 1.7 g of TORESINF-30K (manufactured by Nagase ChemteX Co., Ltd.) of polyamide amide imide resin instead of ASPU112, the coating liquid for forming a plating underlayer and the plating underlayer film were produced in the same manner as in Example 1. The concentration of the polyaniline complex in the plating base film was 62.5wt%, and the concentration of the polyimide amide imine resin was 37.5wt%.

之後,與實施例1相同之方式進行脫脂、Pd載持及鍍敷處理,並進行格子試驗。其結果,在鍍敷底層膜與Cu層界面上試驗部份為全面剝離。又,以鍍敷底層膜為露出之部份進行相同的格子試驗之結果,不但無在鍍敷底層膜與PC薄膜界面上的剝離,且黏著性為良好。 Thereafter, in the same manner as in Example 1, degreasing, Pd loading, and plating treatment were performed, and a lattice test was performed. As a result, the test part was completely peeled off at the interface between the plating base film and the Cu layer. In addition, as a result of performing the same lattice test with the plating base film as the exposed portion, not only was there no peeling at the interface between the plating base film and the PC film, but the adhesion was good.

比較例9 Comparative Example 9

除了添加聚醯胺醯亞胺樹脂之VYLOMAX HR-87TD(東洋紡股份有限公司製、固形分濃度25%)6.8g來替代ASPU112以外,與實施例1相同的製作鍍敷底層形成用塗 液及鍍敷底層膜。鍍敷底層膜中之聚苯胺複合體濃度為62.5wt%,聚醯胺醯亞胺樹脂濃度為37.5wt%。 Except for adding 6.8 g of VYLOMAX HR-87TD (manufactured by Toyobo Co., Ltd., with a solid concentration of 25%) of polyimide amide imide resin in place of ASPU112, the same coating as in Example 1 was made to form a coating for the formation of a plating base layer Liquid and plating the bottom film. The concentration of the polyaniline complex in the plating base film was 62.5wt%, and the concentration of the polyimide amide imine resin was 37.5wt%.

之後,與實施例1相同之方式進行脫脂、Pd載持及鍍敷處理,並進行格子試驗。其結果,在鍍敷底層膜與Cu層界面之黏著性為良好,但在鍍敷底層膜與PC薄膜界面上試驗部份為一部份剝離。 Thereafter, in the same manner as in Example 1, degreasing, Pd loading, and plating treatment were performed, and a lattice test was performed. As a result, the adhesion at the interface between the plating base film and the Cu layer was good, but the test portion was partially peeled off at the interface between the plating base film and the PC film.

實施例9 Example 9

將以製造例2所得的聚苯胺粉末3.75g溶解在MIBK(和光純藥製)17g與異丙醇(和光純藥製)8.5g中。之後,添加胺基甲酸酯樹脂之ASPU112(DIC股份有限公司製、固形分濃度30%)2.5g,並進行攪拌來製作均勻的鍍敷底層形成用塗液。以棒式塗佈將所得到的塗液塗佈在聚碳酸酯薄膜之碳玻璃薄膜C110C上(PC薄膜、旭硝子股份有限公司製),以120℃乾燥30分鐘後形成鍍敷底層膜。鍍敷底層膜之厚度為1μm。鍍敷底層膜中之聚苯胺複合體濃度為83wt%,胺基甲酸酯樹脂濃度為17wt%。 3.75 g of polyaniline powder obtained in Production Example 2 was dissolved in 17 g of MIBK (manufactured by Wako Pure Chemical Industries) and 8.5 g of isopropanol (manufactured by Wako Pure Chemical Industries). Thereafter, 2.5 g of ASPU112 (manufactured by DIC Corporation, solid content concentration) of urethane resin 2.5 g was added and stirred to prepare a uniform coating liquid for forming a plating underlayer. The obtained coating liquid was applied on the carbon glass film C110C of the polycarbonate film (PC film, manufactured by Asahi Glass Co., Ltd.) by bar coating, and dried at 120 ° C. for 30 minutes to form a plating base film. The thickness of the plating base film is 1 μm. The concentration of the polyaniline complex in the plating base film was 83% by weight, and the concentration of the urethane resin was 17% by weight.

之後為與實施例1相同的進行鍍敷,並進行格子試驗。其結果不但無法觀測到剝離,且黏著性為良好。 Thereafter, plating was performed in the same manner as in Example 1, and a lattice test was performed. As a result, not only was no peeling observed, but the adhesion was good.

實施例10 Example 10

將以製造例2所得的聚苯胺粉末1.5g溶解在MIBK(和光純藥製)17g與異丙醇(和光純藥製)8.5g中。之後,添加胺基甲酸酯樹脂之ASPU112(DIC股份有限公司 製、固形分濃度30%)10g,並進行攪拌來製作均勻的鍍敷底層形成用塗液。以棒式塗佈將所得到的塗液塗佈在聚碳酸酯薄膜之碳玻璃薄膜C110C上(PC薄膜、旭硝子股份有限公司製),以120℃乾燥30分鐘後形成鍍敷底層膜。鍍敷底層膜之厚度為1μm。鍍敷底層膜中之聚苯胺複合體濃度為33wt%,胺基甲酸酯樹脂濃度為67wt%。 1.5 g of polyaniline powder obtained in Production Example 2 was dissolved in 17 g of MIBK (manufactured by Wako Pure Chemical Industries) and 8.5 g of isopropanol (manufactured by Wako Pure Chemical Industries). After that, add the urethane resin ASPU112 (DIC Co., Ltd. Preparation, solid content concentration 30%) 10g, and stirring to prepare a uniform coating liquid for forming a plating base layer. The obtained coating liquid was applied on the carbon glass film C110C of the polycarbonate film (PC film, manufactured by Asahi Glass Co., Ltd.) by bar coating, and dried at 120 ° C. for 30 minutes to form a plating base film. The thickness of the plating base film is 1 μm. The concentration of the polyaniline complex in the plating base film was 33% by weight, and the concentration of the urethane resin was 67% by weight.

之後為與實施例1相同的進行鍍敷,並進行格子試驗。其結果不但無法觀測到剝離,且黏著性為良好。 Thereafter, plating was performed in the same manner as in Example 1, and a lattice test was performed. As a result, not only was no peeling observed, but the adhesion was good.

實施例11 Example 11

除了添加胺基甲酸酯樹脂之DAIFERAMINE MAU1008(大日精化股份有限公司製、固形分濃度30%)2.8g、胺基甲酸酯樹脂之ASPU112(DIC股份有限公司製、固形分濃度30%)2.8g來替代ASPU112(5.7g)以外,與實施例1相同的調製鍍敷底層形成用塗液。又,使用聚酯樹脂之COSMOSHINE(PET薄膜、東洋紡股份有限公司製)來替代C110C之外,與實施例1相同的製作鍍敷底層膜。鍍敷底層膜中之聚苯胺複合體濃度為62.5wt%,胺基甲酸酯樹脂濃度為37.5wt%(MAU1008:ASPU=1:1)。 In addition to 2.8 g of DAIFERAMINE MAU1008 (made by Dari Fine Chemicals Co., Ltd., solid content concentration of 30%) added with urethane resin, and ASPU112 (made by DIC Co., Ltd., solid concentration of 30%) of urethane resin Except for ASPU112 (5.7g) instead of 2.8g, the coating liquid for forming a plating underlayer was prepared in the same manner as in Example 1. In addition, COMOSHINE (PET film, manufactured by Toyobo Co., Ltd.) of polyester resin was used instead of C110C, and a plating underlayer film was produced in the same manner as in Example 1. The concentration of the polyaniline complex in the plating base film was 62.5 wt%, and the concentration of the urethane resin was 37.5 wt% (MAU1008: ASPU = 1: 1).

之後,與實施例1相同之方式進行脫脂、Pd載持及鍍敷處理而得到鍍敷層合體。 Thereafter, degreasing, Pd loading, and plating treatment were performed in the same manner as in Example 1 to obtain a plated laminate.

實施例12 Example 12

使用聚醯亞胺樹脂之Kapton(DU PONT-TORAY股份有限公司製)來替代COSMOSHINE(PET薄膜、東洋紡製股份有限公司製)之外,與實施例11相同的得到鍍敷層合體。 A plated laminate was obtained in the same manner as in Example 11 except that Kapton (manufactured by DU PONT-TORAY Co., Ltd.) of polyimide resin was used instead of COSMOSHINE (PET film, manufactured by Toyobo Co., Ltd.).

之後,與實施例11相同之方式進行脫脂、Pd載持及鍍敷處理而得到鍍敷層合體。 After that, degreasing, Pd support, and plating were performed in the same manner as in Example 11 to obtain a plated laminate.

實施例13 Example 13

使用PPS樹脂之TORELINA(PPS薄膜、TORAY股份有限公司製)來替代COSMOSHINE(PET薄膜、東洋紡製股份有限公司製)之外,與實施例11相同的得到鍍敷層合體。 A plated laminate was obtained in the same manner as in Example 11 except that TORELINA (PPS film, manufactured by TORAY Co., Ltd.) of PPS resin was used instead of COSMOSHINE (PET film, manufactured by Toyobo Co., Ltd.).

之後,與實施例11相同之方式進行脫脂、Pd載持及鍍敷處理而得到鍍敷層合體。 After that, degreasing, Pd support, and plating were performed in the same manner as in Example 11 to obtain a plated laminate.

將實施例及比較例之黏著性之評價結果表示於下述表1。 The evaluation results of the adhesiveness of Examples and Comparative Examples are shown in Table 1 below.

實施例及比較例之黏著性之評價基準如同下述之內容。即,在界面上無法觀測到剝離且黏著性為良好時以「○」,在界面之一部份上可觀測到時以「△」,在 全部界面上發生剝離時或在鍍敷底層膜中間發生剝離時以「×」。 The evaluation criteria of the adhesiveness of the examples and comparative examples are as follows. That is, when peeling cannot be observed on the interface and the adhesion is good, "○" is used, and when it is observed on a part of the interface, "△" is used. When peeling occurs at all interfaces or when peeling occurs in the middle of the plating base film, "X" is marked.

實施例11 Example 11 [鍍敷底層膜形成步驟] [Procedure for forming the underlying film]

將以製造例2所得的聚苯胺粉末2.8g溶解在MIBK(和光純藥製)17g與異丙醇(和光純藥製)8.5g中。之後,添加胺基甲酸酯樹脂之ASPU112(DIC股份有限公司製、固形分濃度30%)5.7g,並進行攪拌來製作均勻的鍍敷底層形成用塗液。以棒式塗佈將所得到的塗液塗佈在聚碳酸酯薄膜之碳玻璃薄膜C110C(PC薄膜、PC薄膜、旭硝子股份有限公司製)之表面之一部份上,以120℃乾燥30分鐘後形成鍍敷底層膜。此時,鍍敷底層膜之厚度為1μm。鍍敷底層膜中之聚苯胺濃度為62.5wt%,胺基甲酸酯樹脂濃度為37.5wt%。 2.8 g of polyaniline powder obtained in Production Example 2 was dissolved in 17 g of MIBK (manufactured by Wako Pure Chemical Industries) and 8.5 g of isopropanol (manufactured by Wako Pure Chemical Industries). Thereafter, 5.7 g of ASPU112 (manufactured by DIC Co., Ltd., solid content concentration: 30%) of the urethane resin was added and stirred to prepare a uniform coating liquid for forming an underlayer for plating. Apply the obtained coating liquid to a part of the surface of the carbon glass film C110C (PC film, PC film, manufactured by Asahi Glass Co., Ltd.) of polycarbonate film by bar coating, and dry at 120 ° C for 30 minutes After that, a plating base film is formed. At this time, the thickness of the plating base film was 1 μm. The concentration of polyaniline in the plating base film is 62.5wt%, and the concentration of the urethane resin is 37.5wt%.

[前處理步驟] [Pre-processing steps]

將亞硫酸氫鈉(和光純藥股份有限公司製)10g溶解在離子交換水90g中來調製10wt%亞硫酸氫鈉水溶液。 10 g of sodium bisulfite aqueous solution was prepared by dissolving 10 g of sodium bisulfite (Wako Pure Chemical Industries, Ltd.) in 90 g of ion-exchanged water.

將設置鍍敷底層膜之基材全體,以30℃、5分鐘之條件下,浸漬於該10wt%亞硫酸氫鈉水溶液中來進行脫脂處理。 The entire base material provided with the plating base film was immersed in the 10 wt% sodium bisulfite aqueous solution at 30 ° C. for 5 minutes to perform degreasing treatment.

[Pd金屬載持步驟] [Pd metal loading step]

將脫脂處理後之薄膜,以30℃、5分鐘之條件下,浸漬於red Schumer(鈀水溶液、日本KANIGEN股份有限公司製)之5倍稀釋液中,並進行金屬Pd載持處理。 The degreased film was immersed in a 5-fold dilution of red Schumer (a palladium aqueous solution, manufactured by Japan KANIGEN Co., Ltd.) under conditions of 30 ° C and 5 minutes, and subjected to metal Pd support treatment.

[鍍敷層形成步驟] [Procedure for forming plating layer]

對於Pd金屬載持處理後之薄膜,使用無電解銅鍍敷液「ATS add copper IW」(奥野製藥工業股份有限公司製),以33℃下進行15分鐘鍍敷處理。 The film after the Pd metal supporting treatment was subjected to a plating treatment at 33 ° C for 15 minutes using an electroless copper plating solution "ATS add copper IW" (manufactured by Okuno Pharmaceutical Industry Co., Ltd.).

其結果,可確認在鍍敷底層膜上形成均勻的銅鍍敷。又,在鍍敷底層膜以外之部份並無法形成銅鍍敷。 As a result, it was confirmed that uniform copper plating was formed on the plating base film. In addition, copper plating cannot be formed in portions other than the plating underlayer film.

實施例12 Example 12

前處理步驟中,除了使用將亞硫酸氫鈉15g溶解在離子交換水85g中所調製之15wt%亞硫酸氫鈉水溶液來替代10wt%亞硫酸氫鈉水溶液以外,與實施例11相同之方式進行無電解鍍敷處理。 In the pretreatment step, except that a 15 wt% aqueous solution of sodium bisulfite prepared by dissolving 15 g of sodium bisulfite in 85 g of ion-exchanged water was used instead of a 10 wt% aqueous solution of sodium bisulfite, it was carried out in the same manner as in Example 11. Electrolytic plating treatment.

其結果,可確認在鍍敷底層膜上形成均勻的銅鍍敷。又,在鍍敷底層膜以外之部份並無法形成銅鍍敷。 As a result, it was confirmed that uniform copper plating was formed on the plating base film. In addition, copper plating cannot be formed in portions other than the plating underlayer film.

實施例13 Example 13

前處理步驟中,除了使用將亞硫酸氫鈉4g溶解在離子交換水96g中所調製之4wt%亞硫酸氫鈉水溶液來替代10wr%亞硫酸氫鈉水溶液以外,與實施例11相同之方式進行無電解鍍敷處理。 In the pretreatment step, except that a 4 wt% sodium bisulfite aqueous solution prepared by dissolving 4 g of sodium bisulfite in 96 g of ion-exchanged water was used instead of a 10 wr% sodium bisulfite aqueous solution, the same procedure as in Example 11 was performed. Electrolytic plating treatment.

其結果,可確認在鍍敷底層膜上形成均勻的銅鍍敷。又,在鍍敷底層膜以外之部份並無法形成銅鍍敷。 As a result, it was confirmed that uniform copper plating was formed on the plating base film. In addition, copper plating cannot be formed in portions other than the plating underlayer film.

比較例10 Comparative Example 10

前處理步驟中,除了使用將硫代硫酸鈉(和光純藥股份有限公司製)4g溶解在離子交換水96g中所調製之4wt%硫代硫酸鈉水溶液來替代10wt%亞硫酸氫鈉水溶液以外,與實施例11相同之方式進行無電解鍍敷處理。 In the pretreatment step, in addition to using a 4wt% sodium thiosulfate aqueous solution prepared by dissolving 4g of sodium thiosulfate (made by Wako Pure Chemical Industries, Ltd.) in 96g of ion-exchanged water instead of a 10wt% sodium bisulfite aqueous solution, Electroless plating was performed in the same manner as in Example 11.

其結果,在鍍敷底層膜上完全無法形成銅鍍敷。 As a result, copper plating cannot be formed on the plating base film at all.

比較例11 Comparative Example 11

前處理步驟中,除了使用將亞硫酸鈉(和光純藥股份有限公司製)4g溶解在離子交換水96g中所調製之4wt%亞硫酸鈉水溶液來替代10wt%亞硫酸氫鈉水溶液以外,與實施例11相同之方式進行無電解鍍敷處理。 In the pretreatment step, the same as Example 11 except that a 4 wt% sodium sulfite aqueous solution prepared by dissolving 4 g of sodium sulfite (Wako Pure Chemical Industries, Ltd.) in 96 g of ion-exchanged water was used instead of a 10 wt% aqueous sodium bisulfite solution. Electroless plating process.

其結果,可確認在鍍敷底層膜上形成銅鍍敷之部份與無形成之部份,而無法形成均勻的銅鍍敷。 As a result, it was confirmed that the copper plating part and the non-formed part were formed on the plating base film, and uniform copper plating could not be formed.

比較例12 Comparative Example 12

前處理步驟中,除了使用將氫化硼鈉(和光純藥股份有限公司製)0.5g溶解在離子交換水99.5g中所調製之0.5wt%氫化硼鈉水溶液來替代10wt%亞硫酸氫鈉水溶液以外,與實施例11相同之方式進行無電解鍍敷處理。 In the pretreatment step, a 0.5 wt% aqueous solution of sodium borohydride prepared by dissolving 0.5 g of sodium borohydride (manufactured by Wako Pure Chemical Industries, Ltd.) in 99.5 g of ion-exchanged water was used instead of a 10 wt% aqueous solution of sodium bisulfite , Electroless plating was performed in the same manner as in Example 11.

其結果,連無鍍敷底層膜之部份亦析出銅鍍敷,且無 法僅只在鍍敷底層膜部份選擇性的形成銅鍍敷。 As a result, copper plating was deposited even on the part without the plating base film, and there was no The method only selectively forms copper plating on the part of the plating underlying film.

將使用在實施例及比較例之還原劑水溶液之pH表示於以下。尚,PH係使用pH計進行測定。 The pH of the reducing agent aqueous solution used in Examples and Comparative Examples is shown below. Still, the PH system is measured using a pH meter.

10wt%亞硫酸氫鈉:pH4.3 10wt% sodium bisulfite: pH4.3

15wt%亞硫酸氫鈉:pH4.1 15wt% sodium bisulfite: pH4.1

4wt%亞硫酸氫鈉:pH4.3 4wt% sodium bisulfite: pH4.3

4wt%硫代硫酸鈉:pH6.5 4wt% sodium thiosulfate: pH6.5

4wt%亞硫酸鈉:pH9.6 4wt% sodium sulfite: pH9.6

0.5wt%氫化硼鈉:pH13.2 0.5wt% sodium borohydride: pH 13.2

又,將使用在實施例及比較例之還原劑之標準電極電位E0表示於以下。尚,在25℃之條件下,標準電極電位E0係依據利用氧化還原電位計(ORP計)所測定之值來算出。 In addition, the standard electrode potential E 0 of the reducing agent used in Examples and Comparative Examples is shown below. In addition, under the condition of 25 ° C, the standard electrode potential E 0 is calculated based on the value measured with an oxidation-reduction potentiometer (ORP meter).

亞硫酸氫鈉:E0=-0.45V Sodium bisulfite: E 0 = -0.45V

硫代硫酸鈉:E0=0.08V Sodium thiosulfate: E 0 = 0.08V

亞硫酸鈉:E0=-0.93V Sodium sulfite: E 0 = -0.93V

氫化硼鈉:E0=-1.24V Sodium boron hydride: E 0 = -1.24V

將實施例及比較例之評價結果表示於表2。 The evaluation results of Examples and Comparative Examples are shown in Table 2.

在鍍敷底層膜之區域內,是否形成鍍敷之評價(區域內鍍敷形成)中,可確認在鍍敷底層膜上形成均勻的銅鍍敷場合以「○」、可確認在鍍敷底層膜上形成銅鍍敷之部份與無形成之部份,且無形成均勻的銅鍍敷時以「△」、在鍍敷底層膜上完全無形成銅鍍敷場合以「×」。 In the evaluation of whether plating is formed in the area where the underlying film is plated (plating formation in the area), it can be confirmed that a uniform copper plating is formed on the plating underlying film. When copper plating is formed on the film and there is no formed part, and there is no uniform copper plating, "△" is used, and if no copper plating is formed on the underlying film, "×" is used.

又,在鍍敷底層膜以外之區域內,是否能形成多餘的 鍍敷之評價(區域外鍍敷形成)中,無法確認在鍍敷底層膜以外之區域內銅鍍敷之形成時以「○」、確認在鍍敷底層膜以外之區域內銅鍍敷之形成時以「×」。 Also, in areas other than the plating underlayer film, can excess In the evaluation of plating (out-of-area plating formation), it was not possible to confirm the formation of copper plating in areas other than the plating underlayer film with a "○" when confirming the formation of copper plating in areas other than the plating underlayer film When it is "×".

對於比較例10~12如以下之研究。 The comparative examples 10 to 12 are as follows.

使用在比較例10之硫代硫酸鈉還原力低,且無法使聚苯胺成為完全還原狀態。 The sodium thiosulfate used in Comparative Example 10 has a low reducing power and cannot make polyaniline completely reduced.

使用在比較例11之亞硫酸鈉係以在鹼性條件下具有還原力,但隨著反應進行,因溶液逐漸地成為酸性而不具有還原能,而使鍍敷性為降低。 The sodium sulfite system used in Comparative Example 11 has reducing power under alkaline conditions, but as the reaction progresses, the solution gradually becomes acidic and does not have reducing energy, so that the plating performance is reduced.

使用在比較例12之氫化硼鈉,由於還原力非常強,故會侵蝕基材或底層膜。在基材表面上若即使殘留少量氫化硼鈉時,由於連底層膜以外之部份亦會載持Pd,故而引起超出範圍以外之析出。 The sodium boron hydride used in Comparative Example 12 has a very strong reducing power, so it will attack the substrate or the underlying film. Even if a small amount of sodium boron hydride remains on the surface of the base material, Pd will be supported in the portion other than the underlayer film, which may cause precipitation outside the range.

〔產業利用性〕 [Industrial Utilization]

本發明之無電解鍍敷底層膜形成用組成物係可使用在無電解鍍敷。 The composition for forming an electroless plating underlayer film of the present invention can be used for electroless plating.

又,本發明之無電解鍍敷物之製造方法係可使用在無電解鍍敷。 In addition, the method for producing the electroless plated article of the present invention can be used for electroless plating.

雖上述內容已詳細說明幾個本發明之實施形態及/或實施例,但於實質上不自本發明之新穎之啟發及效果脫離之情況下,所屬技術領域中具有通常知識者可容易地對作為該等例示之實施形態及/或實施例加以較多變更。因此,該等較多之變更亦包含於本發明之範圍內。 Although the above has described several implementation forms and / or embodiments of the present invention in detail, without substantial departure from the novel inspiration and effects of the present invention, those of ordinary skill in the art can easily understand Many changes have been made to the illustrated embodiments and / or examples. Therefore, these more changes are also included in the scope of the present invention.

將成為本發明優先權基礎之日本申請說明書之內容全部援用在此。 The contents of the Japanese application specification that forms the basis of the priority of the present invention are all incorporated herein.

Claims (15)

一種無電解鍍敷底層膜形成用組成物,其係包含取代或未取代的聚苯胺以摻雜劑進行摻雜而成的聚苯胺複合體及胺基甲酸酯樹脂,相對於前述聚苯胺複合體及前述胺基甲酸酯樹脂之合計,前述胺基甲酸酯樹脂之比例為20~80重量%。A composition for forming an electroless plating underlayer film, comprising a polyaniline composite and a urethane resin doped with a substituted or unsubstituted polyaniline doped with a dopant, which is compounded with the polyaniline The total of the body and the urethane resin, the ratio of the urethane resin is 20 to 80% by weight. 如請求項1之無電解鍍敷底層膜形成用組成物,其中,前述摻雜劑係以下述式(III)所示的磺基琥珀酸衍生物,
Figure TWI622641B_C0001
(式(III)中,M為氫原子、有機游離基或無機游離基,m’為M之價數,R13及R14分別為烴基或-(R15O)r-R16基,R15分別為烴基或亞矽烷基,R16為氫原子、烴基或R17 3Si-基,r為1以上之整數,R17分別為烴基)。
The composition for forming an electroless plating underlayer film according to claim 1, wherein the dopant is a sulfosuccinic acid derivative represented by the following formula (III),
Figure TWI622641B_C0001
(In formula (III), M is a hydrogen atom, an organic radical or an inorganic radical, m 'is a valence of M, R 13 and R 14 are respectively a hydrocarbon group or-(R 15 O) r -R 16 group, R 15 is a hydrocarbon group or a silylene group, R 16 is a hydrogen atom, a hydrocarbon group, or R 17 3 Si- group, r is an integer of 1 or more, and R 17 is a hydrocarbon group, respectively).
如請求項1或2之無電解鍍敷底層膜形成用組成物,其中,前述摻雜劑為二-2-乙基己基磺基琥珀酸鈉。The composition for electroless plating underlayer film formation according to claim 1 or 2, wherein the dopant is sodium di-2-ethylhexylsulfosuccinate. 一種無電解鍍敷底層膜,其係由請求項1~3中任一項之無電解鍍敷底層膜形成用組成物所得到。An electroless plating underlayer film obtained from the composition for forming an electroless plating underlayer film according to any one of claims 1 to 3. 一種鍍敷層合體,其係包含含金屬之無電解鍍敷層、含取代或未取代的聚苯胺以摻雜劑進行摻雜而成的聚苯胺複合體及胺基甲酸酯樹脂之無電解鍍敷底層膜、與基板,其中,前述無電解鍍敷層之一面與前述無電解鍍敷底層膜之一面接觸,前述無電解鍍敷底層膜中,相對於前述聚苯胺複合體及前述胺基甲酸酯樹脂之合計,前述胺基甲酸酯樹脂之比例為20~80重量%。A plated laminate comprising a metal-containing electroless plating layer, a polyaniline composite containing substituted or unsubstituted polyaniline doped with a dopant, and a non-electrolyzed carbamate resin An underplating film and a substrate, wherein one surface of the electroless plating layer is in contact with one surface of the electroless plating underlayer film, and the electroless plating underlayer film is relative to the polyaniline composite and the amine group The total amount of formate resin, the proportion of the aforementioned urethane resin is 20 to 80% by weight. 如請求項5之鍍敷層合體,其中,前述摻雜劑係以下述式(III)所示的磺基琥珀酸衍生物,
Figure TWI622641B_C0002
(式(III)中,M為氫原子、有機游離基或無機游離基,m’為M之價數,R13及R14分別為烴基或-(R15O)r-R16基,R15分別為烴基或亞矽烷基,R16為氫原子、烴基或R17 3Si-基,r為1以上之整數,R17分別為烴基)。
The plating laminate according to claim 5, wherein the dopant is a sulfosuccinic acid derivative represented by the following formula (III),
Figure TWI622641B_C0002
(In formula (III), M is a hydrogen atom, an organic radical or an inorganic radical, m 'is a valence of M, R 13 and R 14 are respectively a hydrocarbon group or-(R 15 O) r -R 16 group, R 15 is a hydrocarbon group or a silylene group, R 16 is a hydrogen atom, a hydrocarbon group, or R 17 3 Si- group, r is an integer of 1 or more, and R 17 is a hydrocarbon group, respectively).
如請求項5或6之鍍敷層合體,其中,前述摻雜劑為二-2-乙基己基磺基琥珀酸鈉。The plating laminate according to claim 5 or 6, wherein the aforementioned dopant is sodium di-2-ethylhexylsulfosuccinate. 如請求項5之鍍敷層合體,其中,前述金屬為銅。The plated laminate according to claim 5, wherein the aforementioned metal is copper. 如請求項5之鍍敷層合體,其中,前述基板為樹脂。The plated laminate according to claim 5, wherein the substrate is a resin. 如請求項9之鍍敷層合體,其中,前述基板為聚碳酸酯樹脂、聚酯樹脂、聚醯亞胺樹脂、或聚苯硫醚樹脂。The plated laminate according to claim 9, wherein the substrate is polycarbonate resin, polyester resin, polyimide resin, or polyphenylene sulfide resin. 一種無電解鍍敷底層膜之製造方法,其係使用請求項1~3中任一項之無電解鍍敷底層膜形成用組成物。A method for manufacturing an electroless plating underlayer film, which uses the composition for forming an electroless plating underlayer film according to any one of claims 1 to 3. 一種無電解鍍敷層合體之製造方法,其係包含下述步驟:於基板上使用請求項1~3中任一項之無電解鍍敷底層膜形成用組成物,以形成無電解鍍敷底層膜之步驟;及於前述無電解鍍敷底層膜上形成含金屬之無電解鍍敷層之步驟。A method for manufacturing an electroless plating laminate, comprising the steps of: using the composition for forming an electroless plating underlayer film according to any one of claims 1 to 3 on a substrate to form an electroless plating underlayer A film step; and a step of forming a metal-containing electroless plating layer on the aforementioned electroless plating underlayer film. 如請求項12之無電解鍍敷層合體之製造方法,其中,使鈀載持於前述無電解鍍敷底層膜,之後藉由使其與無電解鍍敷液接觸而形成前述無電解鍍敷層。The method for manufacturing an electroless plating laminate according to claim 12, wherein palladium is supported on the electroless plating underlayer film, and then the electroless plating layer is formed by contacting the electroless plating solution . 如請求項13之無電解鍍敷層合體之製造方法,其中,藉由使氯化鈀溶液與前述無電解鍍敷底層膜接觸,來載持鈀。The method for manufacturing an electroless plating laminate according to claim 13, wherein the palladium chloride solution is brought into contact with the aforementioned electroless plating underlayer film to support palladium. 如請求項13或14之無電解鍍敷層合體之製造方法,其中,前述無電解鍍敷液包含選自Cu、Ni、Au、Pd、Ag、Sn、Co及Pt之1種以上之金屬。The method for producing an electroless plating laminate according to claim 13 or 14, wherein the electroless plating solution contains one or more metals selected from Cu, Ni, Au, Pd, Ag, Sn, Co, and Pt.
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