TWI616425B - MgO-TiO sintered body target and manufacturing method thereof - Google Patents

MgO-TiO sintered body target and manufacturing method thereof Download PDF

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TWI616425B
TWI616425B TW103108109A TW103108109A TWI616425B TW I616425 B TWI616425 B TW I616425B TW 103108109 A TW103108109 A TW 103108109A TW 103108109 A TW103108109 A TW 103108109A TW I616425 B TWI616425 B TW I616425B
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mgo
tio
sintered body
powder
sputtering
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TW201500323A (en
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Hideo Takami
Yuichiro Nakamura
Atsutoshi Arakawa
Shin-Ichi Ogino
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Jx Nippon Mining & Metals Corp
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    • G11B5/127Structure or manufacture of heads, e.g. inductive
    • G11B5/33Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
    • G11B5/39Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
    • G11B5/3903Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
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Abstract

一種MgO-TiO燒結體,其含有25~90mol%之TiO,且剩餘部分由MgO及不可避免之雜質構成。課題在於提供高密度之靶及其製造方法,該高密度之靶可進行成膜速度快且顆粒產生少之直流(DC)濺鍍。 A MgO-TiO sintered body contains 25 to 90 mol% of TiO, and the remaining portion is composed of MgO and unavoidable impurities. The problem is to provide a high-density target and a method for manufacturing the same. The high-density target can be subjected to direct current (DC) sputtering with a high film formation speed and few particles.

Description

MgO-TiO燒結體靶及其製造方法 MgO-TiO sintered body target and manufacturing method thereof

本發明係關於一種氧化鎂系靶及其製造方法,該氧化鎂系靶係用以形成磁碟裝置用之磁性記錄媒體或穿隧磁阻效應(TMR)元件等電子設備用的氧化鎂層,尤其是關於一種具有導電性且高密度的濺鍍用燒結體氧化鎂系靶及其製造方法。 The present invention relates to a magnesium oxide target and a method for manufacturing the same. The magnesium oxide target is used to form a magnesium oxide layer for a magnetic recording medium for a magnetic disk device or an electronic device such as a tunnel magnetoresistance (TMR) element. In particular, it relates to a conductive and high-density sintered body magnesium oxide target for sputtering and a method for producing the same.

近年來,隨著磁碟之小型化、高記錄密度化,進行磁性記錄媒體之研究、開發,尤其一直對磁性層或基底層進行各種改良。硬碟之記錄密度逐年急速地增大,認為將來能自現今之600Gbit/in2之面密度達到1Tbit/in2。若記錄密度達到1Tbit/in2,則記錄位元之尺寸會成為10nm以下,於此情形時,預料由熱波動引起之順磁性化成為問題,且預料目前正使用之材料,例如對Co-Cr基合金添加Pt而提高了結晶磁異向性之材料並不足以解決問題。其原因在於,以10nm以下之尺寸穩定地發揮強磁性之磁性粒子必須具有更高之結晶磁異向性。 In recent years, with the miniaturization and high recording density of magnetic disks, research and development of magnetic recording media have been carried out. In particular, various improvements have been made to magnetic layers or base layers. The hard disk recording density increases rapidly year by year, can be considered in the future from today's 600Gbit / in 2 areal density of the reach 1Tbit / in 2. If the recording density reaches 1 Tbit / in 2 , the size of the recording bit will be less than 10 nm. In this case, it is expected that paramagnetization caused by thermal fluctuations will become a problem, and materials currently being used are expected, for example, for Co-Cr Adding Pt to the base alloy to improve the crystal magnetic anisotropy is not enough to solve the problem. The reason for this is that magnetic particles that exhibit stable ferromagnetism with a size of 10 nm or less must have higher crystalline magnetic anisotropy.

由於如上所述之原因,具有L10結構之FePt相作為超高密度記錄媒體材料受到關注。具有L10結構之FePt相之結晶磁異向性高,並且耐蝕性、耐氧化性優異,故而期待其成為適於用作磁性記錄媒體之材料。而且,要求開發如下技術:於將FePt相用作超高密度記錄媒體材料之情形時,使規則化之FePt磁性粒子在磁性孤立之狀態下儘可能以高密度且使方向一 致地分散。為了對FePt薄膜賦予磁異向性,必須控制結晶方向,其可藉由選擇單晶基板而容易地實現。報告有如下情況,即,對於使磁化方位軸垂直地配向而言,氧化鎂膜適合作為FePt層之基底層。 The reasons described above, with the phase FePt L1 0 structure as ultrahigh density recording media material attracted attention. The FePt phase having the L1 0 structure has high crystal magnetic anisotropy, and is excellent in corrosion resistance and oxidation resistance. Therefore, it is expected to be a material suitable for use as a magnetic recording medium. Furthermore, when the FePt phase is used as an ultra-high-density recording medium material, it is required to develop a technique in which regular FePt magnetic particles are dispersed in a magnetically isolated state at a high density and in a uniform direction as much as possible. In order to impart magnetic anisotropy to the FePt thin film, it is necessary to control the crystallization direction, which can be easily achieved by selecting a single crystal substrate. It has been reported that, for orienting the magnetization azimuth axis vertically, a magnesium oxide film is suitable as a base layer of the FePt layer.

進而,亦已知如下情況:亦用於用作磁頭(硬碟用)或MRAM所使用之TMR元件之絕緣層(隧道障壁)之氧化鎂膜等。如上所述之氧化鎂膜先前係藉由真空蒸鍍法形成,但最近,為了容易達成製造步驟之簡化或大面積化,進行有使用濺鍍法之氧化鎂膜之製作。作為習知技術,有下述公知文獻。 Furthermore, it is also known that a magnesium oxide film or the like is also used as an insulating layer (tunnel barrier) of a TMR element used for a magnetic head (for a hard disk) or a MRAM. The magnesium oxide film described above was previously formed by a vacuum evaporation method, but recently, in order to facilitate the simplification of the manufacturing process or increase the area, a magnesium oxide film using a sputtering method has been produced. As a conventional technique, there are the following known documents.

上述專利文獻1揭示一種氧化鎂靶,其係由氧化鎂純度99.9%以上、相對密度99%以上之氧化鎂燒結體構成,平均粒徑為60μm以下,且具有於晶粒內存在平均粒徑2μm以下之帶弧度之氣孔的微結構,可應對1000Å/min以上之濺鍍製膜速度。其係以如下方法為基礎:於高純度氧化鎂粉末添加混合平均粒徑100nm以下之氧化鎂微粉末並成形,再對成形體進行一次燒結及二次燒結。 The above Patent Document 1 discloses a magnesium oxide target composed of a magnesium oxide sintered body having a purity of 99.9% or more and a relative density of 99% or more, an average particle size of 60 μm or less, and an average particle size of 2 μm within the crystal grains. The following microstructures with radians of pores can cope with sputter filming speeds above 1000Å / min. The method is based on the following method: adding and mixing magnesium oxide fine powder having an average particle diameter of 100 nm or less to a high-purity magnesium oxide powder, and then forming the molded body by primary sintering and secondary sintering.

上述專利文獻2提出有一種氧化鎂靶,其係由相對密度99%以上之氧化鎂燒結體構成,且於Ar環境或Ar-O2混合環境中之濺鍍成膜中可獲得500Å/min以上之成膜速度,並且其係以如下方式獲得:以3t/cm2以上之壓力對平均粒徑0.1~2μm之高密度氧化鎂粉末進行CIP成形,並對所獲得之成形體進行燒結。 The above patent document 2 proposes a magnesium oxide target, which is composed of a magnesium oxide sintered body with a relative density of 99% or more, and can obtain 500 Å / min or more in a sputtering film formation in an Ar environment or an Ar-O 2 mixed environment. The film formation speed is obtained by CIP forming a high-density magnesium oxide powder having an average particle diameter of 0.1 to 2 μm at a pressure of 3 t / cm 2 or more, and sintering the obtained formed body.

於上述專利文獻3中記載有一種氧化鎂靶,其係由氧化鎂純度99.9%以上、相對密度99.0%以上之氧化鎂燒結體構成者,為可應對600Å/min以上之濺鍍成膜速度之由氧化鎂構成之靶,並且記載有如下方法:於高純度氧化鎂粉末添加並混合電熔氧化鎂粉末及平均粒徑100nm以下之氧化鎂微粉末,進行成形,再對成形體進行一次燒結及二次燒結;可藉由濺鍍法以更高的成膜速度產生具有良好之配向性、結晶性及膜特性之 氧化鎂膜。 In the aforementioned Patent Document 3, a magnesium oxide target is described, which is composed of a magnesium oxide sintered body having a purity of 99.9% or more and a relative density of 99.0% or more. The magnesium oxide target is capable of responding to a sputtering film formation speed of 600 Å / min or more. A target composed of magnesium oxide is described as follows: a high-purity magnesium oxide powder is added and mixed with fused magnesium oxide powder and magnesium oxide fine powder having an average particle diameter of 100 nm or less, and then the molded body is sintered once and Secondary sintering; sputter method can be used to produce films with good alignment, crystallinity, and film characteristics at higher film formation speeds. Magnesium oxide film.

於上述專利文獻4中提出有一種以MgO為主成分之靶及其製造方法,其以放電電壓低、放電時之耐濺鍍性、快之放電應答性、絕緣性為目的,且為了用於AC型PDP之介電層之保護膜,而使La粒子、Y粒子、Sc粒子分散於以MgO為主成分之靶內。 The above-mentioned Patent Document 4 proposes a target containing MgO as a main component and a method for manufacturing the same, which are aimed at low discharge voltage, sputtering resistance during discharge, fast discharge response, and insulation, and are used for the protective film A C dielectric layer of the PDP type, the particle La, Y particle, Sc particles are dispersed in the MgO as a main component of a target.

於上述專利文獻5中提出有一種以MgO為主成分之靶,其以提高強度、破壞韌性值、耐熱衝擊性為目的,而使LaB6粒子分散於MgO基質中,並且在燒結前於還原氣體環境中進行還原處理,於特定溫度進行一次燒結、二次燒結。 In the aforementioned Patent Document 5, a target mainly composed of MgO is proposed, which aims to improve the strength, fracture toughness value, and thermal shock resistance, and disperse LaB 6 particles in the MgO matrix, and reduce the gas before sintering. Reduction treatment is performed in the environment, and primary sintering and secondary sintering are performed at a specific temperature.

於上述專利文獻6中記載有一種以MgO為主成分之靶,其規定相對密度且將平均結晶粒徑規定為0.5~100μm,並且使作為稀土元素之Sc、Y、La、Ce、Gd、Yb、Nd分散於MgO基質中。於上述專利文獻7中提出有以製造高密度燒結體為目的,藉由放電電漿燒結法對MgO壓粉體進行燒結。 The above-mentioned Patent Document 6 describes a target containing MgO as a main component, which specifies a relative density and an average crystal grain size of 0.5 to 100 μm, and uses rare earth elements such as Sc, Y, La, Ce, Gd, Yb Nd is dispersed in MgO matrix. In the aforementioned Patent Document 7, it is proposed to sinter MgO compacts by a discharge plasma sintering method for the purpose of producing a high-density sintered body.

於上述專利文獻8及專利文獻9中提出:將最終極限密度設為3.568g/cm3,以使機械性質及導熱性良好且減少因氣體產生導致之環境污染為目的,藉由單軸加壓燒結獲得配向有較多(111)面之MgO燒結體;對粒徑為1μm以下之MgO原料粉末進行單軸加壓燒結,其後於氧氣環境中以1273K以上之溫度進行熱處理。於此情形時,原料粉末係使用MgO,提高密度之方法受燒結條件限定。 In the above-mentioned Patent Documents 8 and 9, it is proposed that the final limiting density be set to 3.568 g / cm 3 in order to improve mechanical properties and thermal conductivity and reduce environmental pollution caused by gas generation, by uniaxial pressure Sintered to obtain MgO sintered body with many (111) planes; uniaxial pressure sintering of MgO raw material powder with a particle size of 1 μm or less, and then heat treatment in an oxygen environment at a temperature of 1273K or more. In this case, MgO is used as the raw material powder, and the method for increasing the density is limited by the sintering conditions.

上述專利文獻10提出大規模且均勻地成膜MgO膜之靶,且提出:規定平均結晶粒徑、密度、抗彎力、靶表面之中心線平均粗糙度,並且將原料粉末之粒徑設為1μm以下,其後經過造粒步驟,以特定之荷重及溫度進行燒結,將靶之中心線平均粗糙度Ra表面精加工成1μm以下。再者,於專利文獻11中記載有一種垂直磁性記錄媒體,其中於非磁性基體 與非磁性基底層之間形成由具有NaCl型結構之MgO、NiO、TiO或Ti之碳化物中之任一種材料構成之非磁性晶種層(seed layer)。 The above-mentioned patent document 10 proposes a target for large-scale and uniform film formation of MgO film, and proposes that the average crystal grain size, density, bending resistance, and centerline average roughness of the target surface are specified, and the particle size of the raw material powder is set as 1 μm or less, followed by a granulation step, sintering at a specific load and temperature, and finishing the centerline average roughness Ra surface of the target to 1 μm or less. Furthermore, Patent Document 11 describes a perpendicular magnetic recording medium in which a non-magnetic substrate is used. A non-magnetic seed layer composed of any one of MgO, NiO, TiO or Ti carbides having a NaCl-type structure is formed with the non-magnetic base layer.

專利文獻1:日本特開平10-130827號公報 Patent Document 1: Japanese Patent Application Laid-Open No. 10-130827

專利文獻2:日本特開平10-130828號公報 Patent Document 2: Japanese Patent Application Laid-Open No. 10-130828

專利文獻3:日本特開平10-158826號公報 Patent Document 3: Japanese Patent Application Laid-Open No. 10-158826

專利文獻4:日本特開平10-237636號公報 Patent Document 4: Japanese Patent Application Laid-Open No. 10-237636

專利文獻5:日本特開平11-6058號公報 Patent Document 5: Japanese Patent Application Laid-Open No. 11-6058

專利文獻6:日本特開平11-335824號公報 Patent Document 6: Japanese Patent Application Laid-Open No. 11-335824

專利文獻7:日本特開平11-139862號公報 Patent Document 7: Japanese Patent Application Laid-Open No. 11-139862

專利文獻8:日本特開2009-173502號公報 Patent Document 8: Japanese Patent Application Laid-Open No. 2009-173502

專利文獻9:國際公開2009/096384號說明書 Patent Document 9: International Publication No. 2009/096384

專利文獻10:日本特開2000-169956號公報 Patent Document 10: Japanese Patent Application Laid-Open No. 2000-169956

專利文獻11:日本特開2004-213869號公報 Patent Document 11: Japanese Patent Application Laid-Open No. 2004-213869

近年來,以磁碟裝置(硬碟)之磁性記錄媒體、穿隧磁阻效應(TMR)元件等電子設備為用途,氧化鎂膜之需求不斷提高。該氧化鎂為絕緣性材料,故而通常使用高頻(RF)濺鍍。然而,該RF濺鍍存在如下問題:因成膜速度慢而生產性差,且因容易產生顆粒(particle)而使膜品質劣化。因此,本發明之課題在於提供一種可進行成膜速度快且顆粒產生少之直流(DC)濺鍍的高密度靶及其製造方法。 In recent years, the use of electronic devices such as magnetic recording media of magnetic disk devices (hard disks), tunneling magnetoresistance (TMR) elements, and the like has increased the demand for magnesium oxide films. Since this magnesium oxide is an insulating material, high frequency (RF) sputtering is generally used. However, this RF sputtering has the following problems: the film formation speed is slow, the productivity is poor, and particles are easily generated, which deteriorates the film quality. Therefore, an object of the present invention is to provide a high-density target capable of performing direct-current (DC) sputtering with high film formation speed and few particle generation, and a method for manufacturing the same.

為了解決上述課題,本發明人等經潛心研究,結果獲得如下見解:藉由製成於氧化鎂MgO混合有具有與其相同之NaCl型結晶結構且 晶格常數具有相近值之導電性氧化鈦TiO的複合氧化物之靶,可獲得具有導電性之燒結體,可進行DC濺鍍,而且獲得之膜具有與氧化鎂同等之結晶結構,故而不會使作為基底膜等之功能受損。 In order to solve the above problems, the present inventors made intensive studies, and as a result, they obtained the following insight: MgO made of magnesium oxide is mixed with a NaCl-type crystal structure having the same structure and The target of a composite oxide of conductive titanium oxide TiO with a lattice constant having a similar value can obtain a conductive sintered body, which can be DC sputtered, and the obtained film has the same crystal structure as magnesium oxide, so it will not Impairs its function as a basement membrane.

基於此種見解,本發明提供:1)一種MgO-TiO燒結體,其含有25~90mol%之TiO,且剩餘部分由MgO及不可避免之雜質構成;2)如上述1)之MgO-TiO燒結體,其相對密度為95%以上;3)如上述1)或2)之MgO-TiO燒結體,其容積電阻率(bulk resistivity)為10Ω.cm以下;4)如上述1)至3)中任一項之MgO-TiO燒結體,其中,存在TiO相及MgO相2種相且該MgO相之最長直徑成為50μm以上之區域,每1mm2為10個以下;5)一種MgO-TiO燒結體之製造方法,係於MgO含有25mol%以上且90mol%以下之TiO之濺鍍用燒結體之製造方法,其特徵在於:將由平均粒徑為10μm以下之MgO粉與平均粒徑為50μm以下之TiO粉構成之原料粉混合,並以1250~1450℃之溫度、200kgf/cm2以上之加壓力對其進行熱壓而製作。 Based on this knowledge, the present invention provides: 1) a MgO-TiO sintered body, which contains 25 to 90 mol% of TiO, and the remainder is composed of MgO and unavoidable impurities; 2) the sintering of MgO-TiO as described in 1) above Body, its relative density is 95% or more; 3) The MgO-TiO sintered body as described in 1) or 2) above has a bulk resistivity of 10Ω. cm or less; 4) The MgO-TiO sintered body according to any one of 1) to 3) above, wherein there are two types of phases, namely, a TiO phase and an MgO phase, and the longest diameter of the MgO phase is 50 μm or more, each 1 mm 2 5 or less; 5) A method for producing a MgO-TiO sintered body, which is a method for producing a sintered body for sputtering using MgO containing 25 mol% or more and 90 mol% or less of TiO, which is characterized in that the average particle size is 10 μm The following MgO powder is mixed with a raw material powder composed of TiO powder having an average particle diameter of 50 μm or less, and hot-pressed at a temperature of 1250 to 1450 ° C. and a pressure of 200 kgf / cm 2 or more.

本發明可提供一種高密度且容積電阻率較低之氧化鎂系燒結體。於將其用作靶之情形時,可藉由DC濺鍍成膜,因此可顯著提高成膜速度,而且可實現穩定之濺鍍,故而具有顆粒之產生量少的優異效果。又,由於不需要RF濺鍍用的價格昂貴之RF電源,故而具有可降低裝置設備之成本的優異效果。 The present invention can provide a magnesium oxide-based sintered body with high density and low volume resistivity. When it is used as a target, the film can be formed by DC sputtering, so the film forming speed can be significantly increased, and stable sputtering can be achieved, so it has the excellent effect of generating a small amount of particles. In addition, since an expensive RF power source for RF sputtering is not required, it has an excellent effect that the cost of equipment can be reduced.

圖1係利用雷射顯微鏡對實施例2之靶進行觀察所得之組織圖像。 FIG. 1 is a tissue image obtained by observing the target of Example 2 using a laser microscope.

圖2係利用雷射顯微鏡對實施例2之靶進行觀察所得之組織圖像(將圖1縮小約1/5而成之圖像)。 FIG. 2 is a tissue image obtained by observing the target of Example 2 using a laser microscope (an image obtained by reducing FIG. 1 by about 1/5).

本發明之MgO-TiO燒結體之一大特徵為於MgO添加TiO。藉由添加具有導電性之TiO,可獲得由MgO-TiO構成之導電性之燒結體,因此使用該燒結體製作之濺鍍靶可進行DC濺鍍,又,可減少濺鍍時產生顆粒之量。 A major feature of the MgO-TiO sintered body of the present invention is the addition of TiO to MgO. By adding conductive TiO, a conductive sintered body made of MgO-TiO can be obtained. Therefore, a sputtering target made of the sintered body can be used for DC sputtering, and the amount of particles generated during sputtering can be reduced. .

如上述所示,本發明係藉由添加具有導電性之TiO而對燒結體賦予導電性,從而可進行DC濺鍍,更重要之方面在於:上述TiO具有與MgO相同之NaCl型結晶結構,且具有與MgO相近值之晶格常數,與MgO為同種氧化物而不會與MgO反應生成中間化合物。因此,藉由濺鍍形成之膜與習知之單獨氧化鎂之膜相比,具有不會損及其特性之優異效果。 As described above, the present invention is capable of performing DC sputtering by adding conductivity to the sintered body by adding conductive TiO, and the more important aspect is that the TiO has the same NaCl type crystal structure as MgO, and It has a lattice constant similar to that of MgO. It is the same oxide as MgO and will not react with MgO to form an intermediate compound. Therefore, the film formed by sputtering has an excellent effect of not impairing its characteristics compared with the conventional film of magnesium oxide alone.

又,作為可應用於本發明之導電性材料,除TiO外,亦可列舉TiN、TiC、CrN、NbN、NbC、TaN、TaC、ZrN、ZrC、VN、VC等。若僅就晶格常數之觀點而言,則希望為TiC、VC、WC、TiN,但認為該等碳化物或氮化物,於原料粉中含有大量氧雜質,故與MgO混合並燒結時有可能會分解,或將MgO之氧還原,或與MgO生成中間化合物,會損及Mg或「TiC、VC、WC、TiN」原本所具有之特性(晶格常數等)。 Examples of the conductive material applicable to the present invention include TiN, TiC, CrN, NbN, NbC, TaN, TaC, ZrN, ZrC, VN, VC, and the like in addition to TiO. From the standpoint of lattice constant, TiC, VC, WC, and TiN are desired. However, it is considered that these carbides or nitrides contain a large amount of oxygen impurities in the raw material powder, so it is possible to mix and sinter with MgO It will decompose, or reduce the oxygen of MgO, or form intermediate compounds with MgO, which will impair the original characteristics (lattice constants, etc.) of Mg or "TiC, VC, WC, TiN".

於本發明之MgO-TiO燒結體中,TiO之含量係設為25mol%以上且90mol%以下,較佳設為35mol%以上且70mol%以下。若未達25mol%,則不易獲得可進行DC濺鍍之容積電阻,另一方面,若超過90mol%,則形成之膜其特性接近純TiO,會無法獲得想要之特性,故而欠佳。 In the MgO-TiO sintered body of the present invention, the content of TiO is set to 25 mol% or more and 90 mol% or less, preferably 35 mol% or more and 70 mol% or less. If it is less than 25 mol%, it is difficult to obtain a volume resistance capable of performing DC sputtering. On the other hand, if it exceeds 90 mol%, the formed film has characteristics close to that of pure TiO, and the desired characteristics cannot be obtained, which is not satisfactory.

再者,於本發明中,只要為可進行DC濺鍍且不會使膜之特性顯著變化 之範圍,則亦包含添加其他材料之情形。 In addition, in the present invention, as long as DC sputtering can be performed without significantly changing the characteristics of the film, The scope also includes the case of adding other materials.

又,關於本發明之MgO-TiO燒結體,較佳相對密度為95%以上。進而較佳相對密度為98%以上。於將此種高密度燒結體用作濺鍍用靶之情形時,濺鍍時可減少顆粒之產生量。 The MgO-TiO sintered body of the present invention preferably has a relative density of 95% or more. Furthermore, the relative density is preferably 98% or more. When such a high-density sintered body is used as a sputtering target, the amount of particles generated during sputtering can be reduced.

又,關於本發明之MgO-TiO燒結體,較佳容積電阻率為10Ω.cm以下。進而較佳為0.01Ω.cm以下。於將如此容積電阻值低之燒結體用作濺鍍用靶之情形時,可進行更穩定之DC濺鍍。藉此,與習知之RF濺鍍相比,可加快成膜速度,故而可提高生產性。 Also, regarding the MgO-TiO sintered body of the present invention, the volume resistivity is preferably 10Ω. cm or less. Furthermore, it is preferably 0.01Ω. cm or less. When a sintered body having such a low volume resistance value is used as a sputtering target, more stable DC sputtering can be performed. Thereby, compared with the conventional RF sputtering, since the film-forming speed can be accelerated, productivity can be improved.

再者,當然應理解,即便為超過上述容積電阻率之範圍,只要可進行DC濺鍍,則包含於本發明。 In addition, it should be understood that even if it exceeds the range of the volume resistivity, as long as DC sputtering can be performed, it is included in the present invention.

又,關於本發明之MgO-TiO燒結體,較佳為存在TiO相及MgO相2種相,且MgO相之最長直徑為50μm以上之區域,每1mm2為10個以下。進而較佳是MgO相之最長直徑為30μm以上之區域,每1mm2為25個以下。TiO相理想為連結成網狀地分散。 Moreover, it is preferable that the MgO-TiO sintered body of the present invention has two types of phases, namely, a TiO phase and an MgO phase, and the longest diameter of the MgO phase is 50 μm or more, and 10 or less per 1 mm 2 . Further, it is preferable that the longest diameter of the MgO phase is 30 μm or more, and 25 or less per 1 mm 2 . The TiO phase is desirably connected in a network and dispersed.

本發明為導電率分別大不相同之MgO與TiO共存的燒結體,但若存在粗大之MgO相,則會容易發生以其為起點之異常放電。藉由極力減少此種粗大之MgO相之區域,可抑制以粗大之MgO相為起點之異常放電,可減少顆粒量。再者,所謂MgO相之最長直徑,係指於自靶之一部分採取之樣品的研磨面所形成MgO相之粒子的最大長度。 The present invention is a sintered body in which MgO and TiO coexist with greatly different electrical conductivity. However, if a coarse MgO phase is present, abnormal discharge with the starting point easily occurs. By reducing the area of such coarse MgO phase as much as possible, abnormal discharge starting from the coarse MgO phase can be suppressed, and the amount of particles can be reduced. In addition, the longest diameter of the MgO phase refers to the maximum length of the particles of the MgO phase formed on the polished surface of the sample taken from a part of the target.

本發明之MgO-TiO燒結體可藉由以下方法製作。 The MgO-TiO sintered body of the present invention can be produced by the following method.

首先,準備MgO粉及TiO粉作為原料。MgO粉末較佳使用平均粒徑為10μm以下者,TiO粉末較佳使用平均粒徑為50μm以下者。若粉末之粒徑超過該範圍,則難以實現均勻之混合,而且會產生偏析及結晶之粗大化,故而欠佳。原料粉末之粒徑以微細為佳,但TiO難以微細化,就生產方面之觀點而言,較佳設為平均粒徑1μm以上。 First, MgO powder and TiO powder were prepared as raw materials. The MgO powder is preferably one having an average particle diameter of 10 μm or less, and the TiO powder is preferably one having an average particle diameter of 50 μm or less. If the particle diameter of the powder exceeds this range, it is difficult to achieve uniform mixing, and segregation and coarsening of crystals occur, which is not preferable. The particle diameter of the raw material powder is preferably fine, but it is difficult to miniaturize TiO. From the viewpoint of production, the average particle diameter is preferably 1 μm or more.

其次,以成為特定莫耳比之方式稱量該等原料粉末,使用球磨機等公知之方法同時粉碎及混合。 Next, these raw material powders are weighed so as to have a specific molar ratio, and they are simultaneously pulverized and mixed using a known method such as a ball mill.

利用熱壓法使以此種方式獲得之混合粉末於真空環境、或非活性氣體環境中成型、燒結。又,除上述熱壓以外,亦可使用電漿放電燒結法等各種加壓燒結方法。尤其是熱靜水壓燒結法對提高燒結體之密度有效。燒結時之保持溫度較佳設為1250~1450℃之溫度範圍。又,燒結時之保持壓力較佳設為200kgf/cm2以上之壓力範圍。 The mixed powder obtained in this way is shaped and sintered in a vacuum environment or an inert gas environment by a hot pressing method. In addition to the above hot pressing, various pressure sintering methods such as plasma discharge sintering can be used. In particular, the hydrostatic and hydrostatic sintering method is effective for increasing the density of a sintered body. The holding temperature during sintering is preferably set to a temperature range of 1250 to 1450 ° C. The holding pressure during sintering is preferably set to a pressure range of 200 kgf / cm 2 or more.

又,於本發明中,可藉由利用研削等將以此種方式獲得之燒結體加工成想要之形狀而製作濺鍍靶。以此種方式製成之濺鍍靶可進行DC濺鍍,故而成膜速度顯著提高,可大幅度地改善生產性。進而,可減少濺鍍時產生之顆粒量,故而具有可提高成膜時之產率的優異效果。 Further, in the present invention, a sputtering target can be produced by processing the sintered body obtained in this way into a desired shape by grinding or the like. The sputtering target produced in this way can be subjected to DC sputtering, so the film forming speed is significantly increased, and productivity can be greatly improved. Furthermore, since the amount of particles generated during sputtering can be reduced, there is an excellent effect that the yield during film formation can be improved.

[實施例] [Example]

以下,基於實施例及比較例進行說明。再者,本實施例僅為一例,並不受此例之任何限制。即,本發明僅受申請專利範圍限制,包含本發明所含之實施例以外之各種變形。 Hereinafter, it demonstrates based on an Example and a comparative example. Furthermore, this embodiment is only an example, and is not limited in any way by this example. That is, the present invention is limited only by the scope of the patent application, and includes various modifications other than the embodiments included in the present invention.

(實施例1) (Example 1)

準備平均粒徑1μm且純度4N(99.99%)之MgO粉末、平均粒徑30μm且純度3N(99.9%)之TiO粉作為原料粉。繼而,以成為表1記載之組成比之方式調配該等原料粉。 MgO powder having an average particle diameter of 1 μm and a purity of 4N (99.99%), and TiO powder having an average particle diameter of 30 μm and a purity of 3N (99.9%) were prepared as raw material powders. Then, these raw material powders were prepared so as to have the composition ratios described in Table 1.

其次,將稱量之粉末與粉碎介質之二氧化鋯磨球(zirconia ball)一併於Ar環境下封入容量10升之球磨機容器(ball mill pot),以使兩粉末均勻地分散之方式旋轉20小時以上而混合、粉碎。 Next, the powder to be weighed and the zirconia ball of the crushing medium are sealed together in a Ar mill with a capacity of 10 liters in a ball mill pot, and the two powders are rotated uniformly to disperse the powder 20 Mix and pulverize for more than one hour.

其次,將自容器取出之粉末填充至直徑180mm之石墨模具,並使用熱壓裝置使其成形、燒結。熱壓之條件如下:設為真空環境、保持溫度1400℃,自升溫開始時起以250kgf/cm2進行加壓直至保持結束。 Next, the powder taken out of the container was filled into a graphite mold with a diameter of 180 mm, and it was shaped and sintered using a hot pressing device. The conditions of the hot pressing are as follows: set to a vacuum environment, keep the temperature at 1400 ° C, and pressurize at 250 kgf / cm 2 from the start of the temperature increase until the end of the hold.

對以此種方式製作之燒結體進行利用阿基米德法(Archimedes method)之密度測定,結果具有98%之相對密度。此處,相對密度為將靶之實測密度除以計算密度(亦稱為理論密度)而求出之值。計算密度為假定靶之構成成分以相互擴散或未反應的方式混合存在時之密度,式:計算密度=Σ(構成成分之分子量×構成成分之莫耳比)/Σ(構成成分之分子量×構成成分之莫耳比/構成成分之理論密度),再者,MgO之理論密度係採用3.585g/cm3,TiO之理論密度係採用4.93g/cm3。於以下實施例及比較例中亦同樣。 The sintered body produced in this way was subjected to a density measurement using the Archimedes method, and as a result, it had a relative density of 98%. Here, the relative density is a value obtained by dividing a measured density of a target by a calculated density (also referred to as a theoretical density). The calculated density is the density when it is assumed that the constituent components of the target are mixed in an interdiffusion or unreacted manner. Formula: Calculated density = Σ (molecular weight of constituent components × mole ratio of constituent components) / Σ (molecular weight of constituent components × composition The molar ratio of the ingredients / theoretical density of the constituents), and the theoretical density of MgO is 3.585 g / cm 3 , and the theoretical density of TiO is 4.93 g / cm 3 . The same applies to the following examples and comparative examples.

又,藉由四端子法進行燒結體之容積電阻測定,結果為0.01Ω.cm。又,研磨該燒結體之剖面,並利用雷射顯微鏡對中心部進行觀察,結果可觀察到MgO相及TiO相2種相,MgO相之最長直徑成為50μm以上、30μm以上之區域,分別為5個/mm2、15個/mm2The volume resistance measurement of the sintered body by the four-terminal method was found to be 0.01Ω. cm. The cross section of the sintered body was ground, and the center portion was observed with a laser microscope. As a result, two types of phases, MgO phase and TiO phase, were observed. The longest diameter of the MgO phase was 50 μm or more and 30 μm or more. Pcs / mm 2 , 15 pcs / mm 2 .

進而,利用研削機將燒結體研磨加工成靶形狀,而製作圓盤狀之靶。將其安裝於DC濺鍍裝置而進行濺鍍。濺鍍之條件設為濺鍍功率:0.5kW、Ar氣壓:5Pa,於矽基板上成膜30秒鐘。繼而,利用顆粒計數器測定附著在基板上之顆粒個數。此時之顆粒個數為120個。 Furthermore, the sintered body was ground into a target shape by a grinding machine to produce a disk-shaped target. This was mounted on a DC sputtering apparatus to perform sputtering. The sputtering conditions were set to sputtering power: 0.5 kW, Ar gas pressure: 5 Pa, and a film was formed on a silicon substrate for 30 seconds. Then, the number of particles attached to the substrate was measured using a particle counter. The number of particles at this time was 120.

(實施例2) (Example 2)

準備平均粒徑1μm且純度4N(99.99%)之MgO粉末、平均粒徑20μm且純度3N(99.9%)之TiO粉作為原料粉。繼而,以成為表1記載之組成比之方式調配該等原料粉。 MgO powder having an average particle diameter of 1 μm and a purity of 4N (99.99%), and TiO powder having an average particle diameter of 20 μm and a purity of 3N (99.9%) were prepared as raw material powders. Then, these raw material powders were prepared so as to have the composition ratios described in Table 1.

其次,將所稱量之粉末與粉碎介質之二氧化鋯磨球一併於Ar環境下封入容量10升之球磨機容器,並以使兩粉末均勻地分散之方式旋轉20小時以上而混合、粉碎。 Next, the weighed powder and the zirconia grinding ball of the pulverizing medium are sealed in a ball mill container with a capacity of 10 liters in an Ar environment, and the two powders are rotated and dispersed uniformly for more than 20 hours to mix and pulverize.

其次,將自容器取出之粉末填充至直徑180mm之石墨模具,並使用熱壓裝置使其成形、燒結。熱壓之條件如下:設為真空環境、保持溫度1400℃,自升溫開始時起以300kgf/cm2進行加壓直至保持結束。 Next, the powder taken out of the container was filled into a graphite mold with a diameter of 180 mm, and it was shaped and sintered using a hot pressing device. The conditions of the hot pressing are as follows: set the vacuum environment, keep the temperature at 1400 ° C, and pressurize at 300 kgf / cm 2 from the start of the temperature rise until the end of the hold.

對以此種方式製作之燒結體進行利用阿基米德法之密度測定,結果具有98%之相對密度。又,藉由四端子法進行燒結體之容積電阻測定,結果為0.003Ω.cm。又,研磨該燒結體之剖面,並利用雷射顯微鏡對中心部進行觀察。將其結果示於圖1。如圖1所示,可觀察到MgO相(深灰之部分)與TiO相(淺灰之部分)2種相。又,MgO相之最長直徑成為50μm以上、30μm以上之區域,如2所示分別為1個、2個,將該圖像區域換算成每1mm2之面積時,分別為3個/mm2、5個/mm2。再者,於其他實施例及比較例(其中,比較例1除外)中,亦在與圖1同倍率之組織圖像確認由MgO相與TiO相2種相形成的情況,於與圖2同倍率之圖像區域中,對最長直徑為50μm以上及30μm以上之MgO相之個數進行計數,並將其換算成每1mm2之面積,而設為每單位面積之個數。 The density measurement by the Archimedes method was performed on the sintered body produced in this manner, and the relative density was 98%. The volume resistance measurement of the sintered body by the four-terminal method was 0.003Ω. cm. The cross section of the sintered body was ground, and the center portion was observed with a laser microscope. The results are shown in Fig. 1. As shown in FIG. 1, two types of phases, an MgO phase (dark gray portion) and a TiO phase (light gray portion), were observed. In addition, the longest diameter of the MgO phase is 50 μm or more and 30 μm or more. As shown in FIG. 2, there are one and two, respectively. When the image area is converted into an area per 1 mm 2 , it is 3 / mm 2 , 5 pieces / mm 2 . Furthermore, in other examples and comparative examples (except for Comparative Example 1), it was confirmed in the structure image of the same magnification as in FIG. 1 that the MgO phase and the TiO phase were formed in two phases. In the magnified image area, the number of MgO phases with a maximum diameter of 50 μm or more and 30 μm or more is counted and converted into an area per 1 mm 2 to be the number per unit area.

進而,利用研削機將燒結體研磨加工成靶形狀,而製成圓盤狀之靶。將其安裝於DC濺鍍裝置而進行濺鍍。濺鍍之條件設為濺鍍功率:0.5kW、Ar氣壓:5Pa,於矽基板上成膜30秒鐘。繼而,利用顆粒計數器測定附著在基板上之顆粒個數。此時之顆粒個數為51個。 Furthermore, the sintered body was ground into a target shape by a grinding machine to obtain a disk-shaped target. This was mounted on a DC sputtering apparatus to perform sputtering. The sputtering conditions were set to sputtering power: 0.5 kW, Ar gas pressure: 5 Pa, and a film was formed on a silicon substrate for 30 seconds. Then, the number of particles attached to the substrate was measured using a particle counter. The number of particles at this time was 51.

(實施例3) (Example 3)

準備平均粒徑1μm且純度4N(99.99%)之MgO粉末、平均粒徑30μm且純度3N(99.9%)之TiO粉作為原料粉。繼而,以成為表1記載之組成比之方式調配該等原料粉。 MgO powder having an average particle diameter of 1 μm and a purity of 4N (99.99%), and TiO powder having an average particle diameter of 30 μm and a purity of 3N (99.9%) were prepared as raw material powders. Then, these raw material powders were prepared so as to have the composition ratios described in Table 1.

其次,將所稱量之粉末與粉碎介質之二氧化鋯磨球一併於Ar環境下封入容量10升之球磨機容器,並以使兩粉末均勻地分散之方式旋轉20小時以上而混合、粉碎。 Next, the weighed powder and the zirconia grinding ball of the pulverizing medium are sealed in a ball mill container with a capacity of 10 liters in an Ar environment, and the two powders are rotated and dispersed uniformly for more than 20 hours to mix and pulverize.

其次,將自容器取出之粉末填充至直徑180mm之石墨模具,並使用熱壓裝置使其成形、燒結。熱壓之條件如下:設為真空環境、保持溫度1400℃,自升溫開始時起以250kgf/cm2進行加壓直至保持結束。 Next, the powder taken out of the container was filled into a graphite mold with a diameter of 180 mm, and it was shaped and sintered using a hot pressing device. The conditions of the hot pressing are as follows: set to a vacuum environment, keep the temperature at 1400 ° C, and pressurize at 250 kgf / cm 2 from the start of the temperature increase until the end of the hold.

對以此種方式製作之燒結體進行利用阿基米德法之密度測定,結果具有99.5%之相對密度。又,藉由四端子法進行燒結體之容積電阻測定,結果為0.002Ω.cm。又,研磨該燒結體之剖面,並利用雷射顯微鏡對中心部進行觀察,結果可觀察到MgO相及TiO相2種相,MgO相之最長直徑成為50μm以上、30μm以上之區域,分別為O個/mm2、5個/mm2The sintered body produced in this manner was subjected to a density measurement by the Archimedes method, and as a result, had a relative density of 99.5%. The volume resistance measurement of the sintered body by the four-terminal method was 0.002Ω. cm. In addition, the cross section of the sintered body was ground, and the center portion was observed with a laser microscope. As a result, two types of MgO phase and TiO phase were observed. The longest diameter of the MgO phase was 50 μm or more and 30 μm or more. Pcs / mm 2 , 5 pcs / mm 2 .

進而,利用研削機將燒結體研磨加工成靶形狀,而製作圓盤狀之靶。將其安裝於DC濺鍍裝置而進行濺鍍。濺鍍之條件設為濺鍍功率:0.5kW、Ar氣壓:5Pa,於矽基板上成膜30秒鐘。繼而,利用顆粒計數器測定附著在基板上之顆粒個數。此時之顆粒個數為46個。 Furthermore, the sintered body was ground into a target shape by a grinding machine to produce a disk-shaped target. This was mounted on a DC sputtering apparatus to perform sputtering. The sputtering conditions were set to sputtering power: 0.5 kW, Ar gas pressure: 5 Pa, and a film was formed on a silicon substrate for 30 seconds. Then, the number of particles attached to the substrate was measured using a particle counter. The number of particles at this time was 46.

(實施例4) (Example 4)

準備平均粒徑1μm且純度4N(99.99%)之MgO粉末、平均粒徑30μm且純度3N(99.9%)之TiO粉作為原料粉。繼而,以成為表1記載之組成比之方式調配該等原料粉。 MgO powder having an average particle diameter of 1 μm and a purity of 4N (99.99%), and TiO powder having an average particle diameter of 30 μm and a purity of 3N (99.9%) were prepared as raw material powders. Then, these raw material powders were prepared so as to have the composition ratios described in Table 1.

其次,將所稱量之粉末與粉碎介質之二氧化鋯磨球一併於Ar環境下封入容量10升之球磨機容器,並以使兩粉末均勻地分散之方式旋轉10小時以 上而混合、粉碎。 Next, the weighed powder and the zirconium dioxide grinding ball of the crushing medium are sealed in a ball mill container with a capacity of 10 liters in an Ar environment, and the two powders are rotated uniformly for 10 hours to Mix on top and crush.

其次,將自容器取出之粉末填充至直徑180mm之石墨模具,並使用熱壓裝置使其成形、燒結。熱壓之條件如下:設為真空環境、保持溫度1400℃,自升溫開始時起以250kgf/cm2進行加壓直至保持結束。 Next, the powder taken out of the container was filled into a graphite mold with a diameter of 180 mm, and it was shaped and sintered using a hot pressing device. The conditions of the hot pressing are as follows: set to a vacuum environment, keep the temperature at 1400 ° C, and pressurize at 250 kgf / cm 2 from the start of the temperature increase until the end of the hold.

對以此種方式製作之燒結體進行利用阿基米德法之密度測定,結果具有99.5%之相對密度。又,藉由四端子法進行燒結體之容積電阻測定,結果為0.0005Ω.cm。又,研磨該燒結體之剖面,並利用雷射顯微鏡對中心部進行觀察,結果可觀察到MgO相及TiO相2種相,MgO相之最長直徑成為50μm以上、30μm以上之區域,分別為0個/mm2、0個/mm2The sintered body produced in this manner was subjected to a density measurement by the Archimedes method, and as a result, had a relative density of 99.5%. The volume resistance measurement of the sintered body by the four-terminal method was 0.0005Ω. cm. In addition, the cross section of the sintered body was ground, and the center portion was observed with a laser microscope. As a result, two types of phases, MgO phase and TiO phase, were observed. The longest diameter of the MgO phase was 50 μm or more and 30 μm or more. Pcs / mm 2 , 0 pcs / mm 2 .

進而,利用研削機將燒結體研磨加工成靶形狀,而製成圓盤狀之靶。將其安裝於DC濺鍍裝置而進行濺鍍。濺鍍之條件設為濺鍍功率:0.5kW、Ar氣壓:5Pa,於矽基板上成膜30秒鐘。繼而,利用顆粒計數器測定附著在基板上之顆粒之個數。此時之顆粒個數為22個。 Furthermore, the sintered body was ground into a target shape by a grinding machine to obtain a disk-shaped target. This was mounted on a DC sputtering apparatus to perform sputtering. The sputtering conditions were set to sputtering power: 0.5 kW, Ar gas pressure: 5 Pa, and a film was formed on a silicon substrate for 30 seconds. Then, the number of particles attached to the substrate was measured using a particle counter. The number of particles at this time was 22 particles.

(比較例1) (Comparative example 1)

僅準備平均粒徑1μm、純度4N(99.99%)之MgO粉末作為原料粉。繼而,將該粉末與粉碎介質之二氧化鋯磨球一併封入至容量10升之球磨機容器,使其旋轉10小時而進行粉碎。 Only MgO powder having an average particle diameter of 1 μm and a purity of 4N (99.99%) was prepared as a raw material powder. Then, the powder was sealed in a ball mill container with a capacity of 10 liters together with a zirconia grinding ball of a pulverizing medium, and the powder was pulverized by rotating it for 10 hours.

其次,將自容器取出之粉末填充至直徑180mm之石墨模具,並使用熱壓裝置使其成形、燒結。熱壓之條件如下:設為真空環境、保持溫度1500℃,自升溫開始時起以300kgf/cm2進行加壓直至保持結束。 Next, the powder taken out of the container was filled into a graphite mold with a diameter of 180 mm, and it was shaped and sintered using a hot pressing device. The conditions of the hot pressing are as follows: set to a vacuum environment, keep the temperature at 1500 ° C, and pressurize at 300 kgf / cm 2 from the beginning of the temperature rise until the end of the hold.

對以此種方式製作之燒結體進行利用阿基米德法之密度測定,結果具有99%之相對密度。又,藉由四端子法進行燒結體之容積電阻測定,但電阻值高而無法測定。 The sintered body produced in this way was subjected to density measurement by the Archimedes method, and as a result, it had a relative density of 99%. Moreover, the volume resistance measurement of the sintered body was performed by the four-terminal method, but the resistance value was too high to measure.

利用車床將該燒結體切削加工成靶形狀,而製作圓盤狀之靶。將其安裝於DC濺鍍裝置而進行濺鍍,但無法進行DC濺鍍。 This sintered body was cut into a target shape by a lathe to produce a disk-shaped target. Although it was sputtered by mounting it in a DC sputtering apparatus, it was not able to perform DC sputtering.

(比較例2) (Comparative example 2)

準備平均粒徑1μm且純度4N(99.99%)之MgO粉末、平均粒徑25μm且純度3N(99.9%)之TiO粉作為原料粉。繼而,以成為表1記載之組成比之方式調配該等原料粉。 MgO powder having an average particle diameter of 1 μm and a purity of 4N (99.99%), and TiO powder having an average particle diameter of 25 μm and a purity of 3N (99.9%) were prepared as raw material powders. Then, these raw material powders were prepared so as to have the composition ratios described in Table 1.

其次,將稱量之粉末與粉碎介質之二氧化鋯磨球一併於Ar環境下封入容量10升之球磨機容器,並以使兩粉末均勻地分散之方式旋轉20小時以上而混合、粉碎。 Next, the weighed powder and the zirconium dioxide grinding ball of the pulverizing medium are sealed in a ball mill container with a capacity of 10 liters in an Ar environment, and the two powders are rotated and dispersed uniformly for more than 20 hours to mix and pulverize.

其次,將自容器取出之粉末填充至直徑180mm之石墨模具,並使用熱壓裝置使其成形、燒結。熱壓之條件如下:設為真空環境、保持溫度1400℃,自升溫開始時起以300kgf/cm2進行加壓直至保持結束。 Next, the powder taken out of the container was filled into a graphite mold with a diameter of 180 mm, and it was shaped and sintered using a hot pressing device. The conditions of the hot pressing are as follows: set the vacuum environment, keep the temperature at 1400 ° C, and pressurize at 300 kgf / cm 2 from the start of the temperature rise until the end of the hold.

對以此種方式製作之燒結體進行利用阿基米德法之密度測定,結果具有96%之相對密度。又,藉由四端子法進行燒結體之容積電阻測定,結果電阻值高而無法測定。又,研磨該燒結體之剖面,並利用雷射顯微鏡對中心部進行觀察,結果可觀察到MgO相及TiO相2種相,MgO相之最長直徑成為50μm以上、30μm以上之區域,分別為13個/mm2、35個/mm2The sintered body produced in this way was subjected to a density measurement by the Archimedes method, and as a result, it had a relative density of 96%. In addition, the volume resistance measurement of the sintered body was performed by the four-terminal method. As a result, the resistance value was high and the measurement was impossible. In addition, the cross section of the sintered body was ground, and the center portion was observed with a laser microscope. As a result, two types of phases, MgO phase and TiO phase, were observed. The longest diameter of the MgO phase was 50 μm or more and 30 μm or more. Pcs / mm 2 , 35 pcs / mm 2 .

利用研削機將燒結體研磨加工成靶形狀,而製成圓盤狀之靶。將其安裝於DC濺鍍裝置而進行濺鍍,但無法進行DC濺鍍。 The sintered body was ground into a target shape by a grinding machine to form a disk-shaped target. Although it was sputtered by mounting it in a DC sputtering apparatus, it was not able to perform DC sputtering.

(比較例3) (Comparative example 3)

準備平均粒徑1μm且純度4N(99.99%)之MgO粉末、平均粒徑100μm且純度3N(99.9%)之TiO粉作為原料粉。繼而,以成為表1記載之組成比之方式調配該等原料粉。 MgO powder having an average particle diameter of 1 μm and a purity of 4N (99.99%), and TiO powder having an average particle diameter of 100 μm and a purity of 3N (99.9%) were prepared as raw material powders. Then, these raw material powders were prepared so as to have the composition ratios described in Table 1.

其次,將稱量之粉末與粉碎介質之二氧化鋯磨球一併於Ar環境下封入容量10升之球磨機容器,並以使兩粉末均勻地分散之方式旋轉5小時以上而混合、粉碎。 Next, the weighed powder and the zirconium dioxide grinding ball of the pulverizing medium are enclosed in a ball mill container with a capacity of 10 liters in an Ar environment, and the two powders are rotated and dispersed for more than 5 hours to mix and pulverize.

其次,將自容器取出之粉末填充至直徑180mm之石墨模具,並使用熱壓裝置使其成形、燒結。熱壓之條件如下:設為真空環境、保持溫度1400℃,自升溫開始時起以300kgf/cm2進行加壓直至保持結束。 Next, the powder taken out of the container was filled into a graphite mold with a diameter of 180 mm, and it was shaped and sintered using a hot pressing device. The conditions of the hot pressing are as follows: set the vacuum environment, keep the temperature at 1400 ° C, and pressurize at 300 kgf / cm 2 from the start of the temperature rise until the end of the hold.

對以此種方式製作之燒結體進行利用阿基米德法之密度測定,結果具有97%之相對密度。又,藉由四端子法進行燒結體之容積電阻測定,結果為0.007Ω.cm。又,研磨該燒結體之剖面,並利用雷射顯微鏡對中心部進行觀察,結果可觀察到MgO相及TiO相2種相,MgO相之最長直徑成為50μm以上、30μm以上之區域,分別為25個/mm2、53個/mm2The sintered body produced in this way was subjected to density measurement by the Archimedes method, and as a result, it had a relative density of 97%. The volume resistance measurement of the sintered body by the four-terminal method was 0.007Ω. cm. In addition, the cross section of the sintered body was ground, and the center portion was observed with a laser microscope. As a result, two types of phases, MgO phase and TiO phase, were observed. The longest diameters of the MgO phase were 50 μm or more and 30 μm or more. Pcs / mm 2 , 53 pcs / mm 2 .

進而,利用研削機將燒結體研磨加工成靶形狀,而製成圓盤狀之靶。將其安裝於DC濺鍍裝置而進行濺鍍。濺鍍之條件設為濺鍍功率:0.5kW、Ar氣壓:5Pa,於矽基板上成膜30秒鐘。繼而,利用顆粒計數器測定附著在基板上之顆粒個數。此時之顆粒個數為2000個。 Furthermore, the sintered body was ground into a target shape by a grinding machine to obtain a disk-shaped target. This was mounted on a DC sputtering apparatus to perform sputtering. The sputtering conditions were set to sputtering power: 0.5 kW, Ar gas pressure: 5 Pa, and a film was formed on a silicon substrate for 30 seconds. Then, the number of particles attached to the substrate was measured using a particle counter. The number of particles at this time was 2,000.

(比較例4) (Comparative Example 4)

準備平均粒徑1μm且純度4N(99.99%)之MgO粉末、平均粒徑100μm且純度3N(99.9%)之TiO粉作為原料粉。繼而,以成為表1記載之組成比之方式調配該等原料粉。 MgO powder having an average particle diameter of 1 μm and a purity of 4N (99.99%), and TiO powder having an average particle diameter of 100 μm and a purity of 3N (99.9%) were prepared as raw material powders. Then, these raw material powders were prepared so as to have the composition ratios described in Table 1.

其次,將稱量之粉末與粉碎介質之二氧化鋯磨球一併於Ar環境下封入容量10升之球磨機容器,並以使兩粉末均勻地分散之方式旋轉5小時以上而混合、粉碎。 Next, the weighed powder and the zirconium dioxide grinding ball of the pulverizing medium are enclosed in a ball mill container with a capacity of 10 liters in an Ar environment, and the two powders are rotated and dispersed for more than 5 hours to mix and pulverize.

其次,將自容器取出之粉末填充至直徑180mm之石墨模具,並使用熱壓裝置使其成形、燒結。熱壓之條件如下:設為真空環境、保持溫度1400℃,自升溫開始時起以300kgf/cm2進行加壓直至保持結束。 Next, the powder taken out of the container was filled into a graphite mold with a diameter of 180 mm, and it was shaped and sintered using a hot pressing device. The conditions of the hot pressing are as follows: set the vacuum environment, keep the temperature at 1400 ° C, and pressurize at 300 kgf / cm 2 from the start of the temperature rise until the end of the hold.

對以此種方式製作之燒結體進行利用阿基米德法之密度測定,結果具有99.5%之相對密度。又,藉由四端子法進行燒結體之容積電阻測定,結果為0.002Ω.cm。又,研磨該燒結體之剖面,並利用雷射顯微鏡進 行觀察,結果可觀察到MgO相及TiO相2種相,MgO相之最長直徑成為50μm以上、30μm以上之區域,分別為15個/mm2、41個/mm2The sintered body produced in this manner was subjected to a density measurement by the Archimedes method, and as a result, had a relative density of 99.5%. The volume resistance measurement of the sintered body by the four-terminal method was 0.002Ω. cm. In addition, the cross section of the sintered body was ground and observed with a laser microscope. As a result, two types of phases, MgO phase and TiO phase, were observed. The longest diameter of the MgO phase was 50 μm or more and 30 μm or more, 15 / mm. 2 , 41 / mm 2 .

進而,利用研削機將燒結體研磨加工成靶形狀,而製成圓盤狀之靶。將其安裝於DC濺鍍裝置而進行濺鍍。濺鍍之條件設為濺鍍功率:0.5kW、Ar氣壓:5Pa,於矽基板上成膜30秒鐘。繼而,利用顆粒計數器測定附著在基板上之顆粒個數。此時之顆粒個數為500個。 Furthermore, the sintered body was ground into a target shape by a grinding machine to obtain a disk-shaped target. This was mounted on a DC sputtering apparatus to perform sputtering. The sputtering conditions were set to sputtering power: 0.5 kW, Ar gas pressure: 5 Pa, and a film was formed on a silicon substrate for 30 seconds. Then, the number of particles attached to the substrate was measured using a particle counter. The number of particles at this time was 500.

[產業上之可利用性] [Industrial availability]

本發明之MgO-TiO燒結體可進行DC濺鍍,故而與對習知之MgO燒結體進行RF濺鍍之情形相比,可顯著提高成膜速度,獲得提高生產性的大效果。又,DC濺鍍可藉由利用價廉之DC電源而實現,故而可直接利用既有設備,可降低設備投資之成本。 The MgO-TiO sintered body of the present invention can be DC sputtered, so that compared with the case of RF sputtered conventional MgO sintered body, the film formation speed can be significantly increased, and a large effect of improving productivity can be obtained. In addition, DC sputtering can be realized by using an inexpensive DC power supply, so existing equipment can be directly used, and the cost of equipment investment can be reduced.

根據上述情況,本發明之MgO-TiO燒結體作為形成磁碟裝置用之磁性記錄媒體或穿隧磁阻效應(TMR)元件等電子設備用之薄膜時所使用的氧化鎂系濺鍍靶有用。又,亦可作為習知之絕緣性MgO無法實現之導電性陶瓷材料而用於去靜電或耐熱構件等新領域。 In view of the foregoing, the MgO-TiO sintered body of the present invention is useful as a magnesium oxide-based sputtering target used for forming a thin film for an electronic device such as a magnetic recording medium for a magnetic disk device or a tunneling magnetoresistance effect (TMR) element. In addition, it can be used in new fields such as antistatic or heat-resistant members as a conductive ceramic material that conventional insulating MgO cannot achieve.

Claims (4)

一種MgO-TiO燒結體,其含有25~90mol%之TiO,剩餘部分由MgO及不可避免之雜質構成,並且,存在TiO相與MgO相2種相,該MgO相之最長直徑成為50μm以上之區域,每1mm2為10個以下。 A sintered MgO-TiO sintered body containing 25 to 90 mol% of TiO, and the remaining portion is composed of MgO and unavoidable impurities. In addition, there are two types of phases, the TiO phase and the MgO phase, and the longest diameter of the MgO phase is a region of 50 μm or more , 10 per 1 mm 2 or less. 如申請專利範圍第1項之MgO-TiO燒結體,其相對密度為95%以上。 For example, the MgO-TiO sintered body in the first patent application scope has a relative density of 95% or more. 如申請專利範圍第1或2項之MgO-TiO燒結體,其容積電阻率(bulk resistivity)為10Ω.cm以下。 For example, the bulk resistivity of the MgO-TiO sintered body in the first or second scope of the patent application is 10Ω. cm or less. 一種MgO-TiO燒結體之製造方法,係申請專利範圍第1~3項中任一項之MgO-TiO燒結體之製造方法,並且,為於MgO含有25mol%以上且90mol%以下之TiO之濺鍍用燒結體之製造方法,其特徵在於:將由平均粒徑為10μm以下之MgO粉末與平均粒徑為50μm以下之TiO粉末構成之原料粉混合,並以1250~1450℃之溫度、200kgf/cm2以上之加壓力對其進行熱壓而製作。 A method for manufacturing a MgO-TiO sintered body is a method for manufacturing a MgO-TiO sintered body according to any one of claims 1 to 3, and is a sputtering method in which MgO contains 25 mol% or more and 90 mol% or less of TiO. A method for producing a sintered body for plating, characterized in that: a raw material powder composed of MgO powder having an average particle diameter of 10 μm or less and TiO powder having an average particle diameter of 50 μm or less is mixed at a temperature of 1250 to 1450 ° C. and 200 kgf / cm It is produced by hot-pressing at a pressure of 2 or more.
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