TWI598987B - Electrostatic chuck device and its control method - Google Patents

Electrostatic chuck device and its control method Download PDF

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TWI598987B
TWI598987B TW102109296A TW102109296A TWI598987B TW I598987 B TWI598987 B TW I598987B TW 102109296 A TW102109296 A TW 102109296A TW 102109296 A TW102109296 A TW 102109296A TW I598987 B TWI598987 B TW I598987B
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electrostatic chuck
electrostatic
workpiece
capacitance
variable
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TW201403742A (en
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菅原利文
天□康之
林基樹
辰己良昭
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創意科技股份有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6831Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
    • H01L21/6833Details of electrostatic chucks
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02NELECTRIC MACHINES NOT OTHERWISE PROVIDED FOR
    • H02N13/00Clutches or holding devices using electrostatic attraction, e.g. using Johnson-Rahbek effect

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Jigs For Machine Tools (AREA)

Description

靜電吸盤裝置及其控制方法 Electrostatic chuck device and control method thereof

該發明關於靜電性地吸附並保持被吸附物(工件),且為了對被吸附物進行其定位用於固定,或是用於將被吸附物搬運至特定目的之場所的靜電吸盤裝置,尤其關於工件脫離時之吸盤釋放性優良之靜電吸盤裝置及其控制方法。 The invention relates to an electrostatic chuck device for electrostatically adsorbing and holding an adsorbate (workpiece), and for positioning the adsorbate for fixing, or for transporting the adsorbed object to a specific purpose, particularly An electrostatic chuck device excellent in suction release when the workpiece is detached and a control method thereof.

在矽等之半導體晶圓形成積體電路而製造IC或LSI等之半導體(積體電路)之半導體製造製程中,使用蝕刻裝置、用於化學氣相蒸鍍(CVD)之薄膜形成等的電漿處理裝置、電子曝光裝置、離子描劃裝置、離子注入裝置等之裝置,再者,在製造電視畫面或電腦用顯示器等所使用之液晶顯示面板的液晶面板製造過程中,使用離子摻雜裝置、於進行液晶壓入至玻璃等之絕緣性基板之時所使用之基板貼合裝置等之裝置,在該些裝置中,以為了晶圓或玻璃等之定位所進行之保持或搬運為目的,廣泛使用靜電吸盤。該係因靜電吸盤比起利用機械性機構之保持手段,不會有對晶圓或玻璃等之被吸附物(工件)造成損傷之問題 ,從機械性損傷所導致的微粒產生之問題,或保持的被吸附物之平坦性之補償等的觀點來看,發揮更優良性能之故。 In a semiconductor manufacturing process for manufacturing a semiconductor (integrated circuit) such as an IC or an LSI by forming an integrated circuit on a semiconductor wafer such as a semiconductor wafer, an etching device or a thin film formed by chemical vapor deposition (CVD) is used. An apparatus such as a slurry processing apparatus, an electron exposure apparatus, an ion drawing apparatus, and an ion implantation apparatus, and an ion doping apparatus is used in the manufacture of a liquid crystal panel for manufacturing a liquid crystal display panel used for a television screen or a computer monitor. An apparatus such as a substrate bonding apparatus used for injecting a liquid crystal into an insulating substrate such as glass, for the purpose of holding or transporting a wafer or glass for positioning. Electrostatic chucks are widely used. This system does not cause damage to adsorbed objects (workpieces) such as wafers or glass because the electrostatic chuck is held by a mechanical mechanism. From the viewpoint of the problem of the generation of fine particles caused by mechanical damage, or the compensation of the flatness of the adsorbed material to be retained, the performance is further improved.

然後,該靜電吸盤由於其吸附方式或吸附原理之不同,有使用絕緣材料當作介電體之庫倫力型、使用固定電阻值為108~1013Ω.cm之半導體的強生拉貝克(Johnson-Rahbek)力型、具有梳齒形狀或複層電極構成等之各種圖案、構成的電極而在吸附面上形成不均勻電場,吸附玻璃等之絕緣材料的梯度(Gradient)力型等,任一者皆於脫離晶圓或玻璃等之工件之時,在靜電吸盤之吸附面和工件之間殘留電荷,因該殘留電荷有工件難以從靜電吸盤之吸附面脫離之情況,當工件難以從靜電吸盤之吸附面脫離時,對用以工件定位之保持或搬送產生大的障礙。 Then, the electrostatic chuck has a Coulomb force type using an insulating material as a dielectric body due to its adsorption mode or adsorption principle, and the fixed resistance value is 10 8 ~ 10 13 Ω. The Johnson-Rahbek force type of the semiconductor of cm, the various patterns and the constituent electrodes of the comb-tooth shape or the multi-layer electrode structure form an uneven electric field on the adsorption surface, and absorb the gradient of the insulating material such as glass. (Gradient) force type, etc., when leaving the workpiece such as wafer or glass, the charge remains between the adsorption surface of the electrostatic chuck and the workpiece, and the residual charge is difficult to separate from the adsorption surface of the electrostatic chuck. In this case, when the workpiece is difficult to be detached from the adsorption surface of the electrostatic chuck, a large obstacle is caused to the holding or transport of the workpiece.

在此,即使在以往中,有提案用以解決如此之問題的幾個提案。 Here, even in the past, there are several proposals for solving such problems.

例如,在專利文獻1中,提案除了對靜電吸附裝置之各對電極間施加電壓的電源外,設置被連接於該電源之斷開時,以零電位為基準而使施加於各對電極間之電壓正負交互地予以衰減振動的電阻及線圈之串聯電路,在將被處理物載置在靜電吸盤之吸附面之狀態下使電極間之電壓成為斷開狀態之瞬間,形成由串聯電路和靜電吸盤之靜電電容所構成之RLC放電電路,以該放電電路使電極間電壓正負交互地予以衰減振動而使覆蓋電極之絕緣物成為電中性,迴避被處理物難以從吸附面脫離之現象。 For example, in Patent Document 1, it is proposed that, in addition to a power source that applies a voltage between each pair of electrodes of the electrostatic adsorption device, when it is connected to the power source, it is applied between the pair of electrodes based on the zero potential. A series circuit of a resistor and a coil in which the voltage is positively and negatively alternately attenuated and vibrated. When the object to be processed is placed on the adsorption surface of the electrostatic chuck, the voltage between the electrodes is turned off, and the series circuit and the electrostatic chuck are formed. The RLC discharge circuit composed of the electrostatic capacitance causes the voltage between the electrodes to alternately attenuate and vibrate, and the insulator covering the electrode is electrically neutral, thereby avoiding the phenomenon that the object to be processed is difficult to be detached from the adsorption surface.

再者,在專利文獻2中,於脫離被靜電吸附在承載器之被吸附體之時,切離電荷供給源,並且以反極性將中和電容器連接於靜電吸盤,並且藉由該中和電容器中和被蓄積於承載器和被吸附體間之電荷,依此可以實現被吸附體之脫離時間之短縮化的靜電吸盤。 Further, in Patent Document 2, when the detachment is electrostatically adsorbed on the adsorbed body of the carrier, the charge supply source is cut off, and the neutralization capacitor is connected to the electrostatic chuck with reverse polarity, and the neutralization capacitor is used The electric charge accumulated between the carrier and the adsorbed body is neutralized, whereby the electrostatic chuck in which the detachment time of the adsorbed body is shortened can be achieved.

並且,在專利文獻3中,提案有一種殘留電荷之檢測及除去系統,該係於將在反應室內被夾持於靜電吸盤之半導體製程零件進行吸盤釋放時,對靜電吸盤之電極施加相反極性之放電直流電壓,並且藉由上升銷單元,提供殘量電荷接地之出口而除去殘留電荷,此時將上升銷單元保持在與靜電吸盤之台座相同之電位而防止於施加RF功率時產生火花,再者,以電荷感測器檢測及測量殘留電荷之量而調整下一次之吸盤釋放工程中的相反極性之放電電壓的參數。 Further, Patent Document 3 proposes a system for detecting and removing a residual charge by applying a reverse polarity to an electrode of an electrostatic chuck when a semiconductor process component held in an electrostatic chuck in a reaction chamber is released by a chuck. Discharging the DC voltage and providing the residual charge grounding outlet by the rising pin unit to remove the residual charge. At this time, the rising pin unit is held at the same potential as the pedestal of the electrostatic chuck to prevent sparking when the RF power is applied. The parameter of the discharge voltage of the opposite polarity in the next suction release process is adjusted by the charge sensor detecting and measuring the amount of residual charge.

並且,在專利文獻4中,提案有雙極型靜電吸盤,該是針對雙極型靜電吸盤之第一電極部和第二電極部,施加互相不同之極性的電壓時,構成在具有一方極性的電極周圍配置具有另一方之極性的電極,依此,藉由施加電壓所產生之電力線停留在吸附面附近而使工件脫離時留在吸附面之殘留電荷之量成為最小限度,並且使殘留在某電極之電荷與殘留在其周邊之異極之電極的電荷有效率地互相抵銷,而於工件脫離時可以快速地消除殘留電荷。 Further, Patent Document 4 proposes a bipolar electrostatic chuck in which a first electrode portion and a second electrode portion of a bipolar electrostatic chuck are applied with voltages having mutually different polarities, and are configured to have one polarity. An electrode having the other polarity is disposed around the electrode, and accordingly, the amount of residual electric charge remaining on the adsorption surface when the power line generated by applying the voltage stays in the vicinity of the adsorption surface and the workpiece is detached is minimized, and remains in a certain The charge of the electrode and the charge of the electrode remaining at the periphery of the electrode are efficiently offset each other, and the residual charge can be quickly eliminated when the workpiece is detached.

在上述專利文獻1~3中所提案之方法,係於靜電吸盤之工件脫離時一旦阻斷該靜電吸盤之電性電路, 使滯留於靜電吸盤之吸附面或工件之殘留電荷接地而洩放,或藉由使相反極性之電荷流入至存在殘留電荷之吸附面或工件而進行中和,但是近年來,由於對靜電吸盤要求提升其吸附力或工件之吸附、脫離之高速化,隨此靜電吸盤之構造變得複雜化,故在僅進行接地使電荷洩放之方法或藉由流入相反極性之電荷而進行中和之方法中,難以快速並且完全地除去殘留電荷。 The method proposed in the above Patent Documents 1 to 3 is to block the electrical circuit of the electrostatic chuck when the workpiece of the electrostatic chuck is detached. The residual charge remaining on the adsorption surface or the workpiece of the electrostatic chuck is grounded and discharged, or neutralized by causing charges of opposite polarity to flow into the adsorption surface or the workpiece having residual charges, but in recent years, due to the requirement for the electrostatic chuck The method of increasing the adsorption force or the adsorption and detachment of the workpiece, and the structure of the electrostatic chuck is complicated, so that the method of grounding only the charge is discharged or the method of neutralizing the charge of the opposite polarity is used for neutralization. In it, it is difficult to remove the residual charge quickly and completely.

而且,針對該些專利文獻1~3之方法中,由於無法取得如任一者所期待之除去殘留電荷之效果,故至今幾乎還未被實用化或製品化,期盼開發出具有更有實效性之解決手段。 Further, in the methods of Patent Documents 1 to 3, since the effect of removing residual charges as expected from any one cannot be obtained, it has hardly been put into practical use or product production, and it is expected to be more effective. The solution to sex.

再者,在專利文獻4之方法中,係在雙極型靜電吸盤之電極部之構造上加工,使工件脫離時殘留在吸附面之殘留電荷之量成為最小限度,並且快速消除之技術,其技術特徵係在於靜電吸盤之電極構造之圖案形成,期盼開發出以對靜電吸盤之電性電路加工之另外的技術性為視點的解決手段。 Further, in the method of Patent Document 4, the technique of processing the electrode portion of the bipolar electrostatic chuck, the amount of residual electric charge remaining on the adsorption surface when the workpiece is detached is minimized, and the technique is quickly eliminated. The technical feature lies in the pattern formation of the electrode structure of the electrostatic chuck, and it is desired to develop a solution that is based on the additional technical aspects of the electrical circuit processing of the electrostatic chuck.

[先前技術文獻] [Previous Technical Literature] [專利文獻] [Patent Literature]

[專利文獻1]日本特開平06-244270號公報 [Patent Document 1] Japanese Laid-Open Patent Publication No. 06-244270

[專利文獻2]日本特開平11-040660號公報 [Patent Document 2] Japanese Patent Laid-Open No. Hei 11-040660

[專利文獻3]日本特開2010-258452號公報 [Patent Document 3] Japanese Patent Laid-Open Publication No. 2010-258452

[專利文獻4]日本特表2010-004915號公報 [Patent Document 4] Japanese Patent Publication No. 2010-004915

在此,本發明者針對如和解決靜電吸盤之工件脫離時因殘留電荷所引起之各種問題,精心研究之結果,藉由在靜電吸盤和直流電源之間串聯連接靜電電容可變化之靜電電容可變手段及/或電容器,找出以簡單構造而且確實解決因工件脫離時之殘留電荷所引起之問題而改善靜電吸盤之吸盤釋放性,完成本發明。 Here, the present inventors have carefully studied the various problems caused by the residual charge when the workpiece of the electrostatic chuck is detached, and the electrostatic capacitance which can be changed by connecting the electrostatic capacitor in series between the electrostatic chuck and the DC power source can be used. The present invention has been accomplished by modifying the means and/or the capacitor to find out the suction release of the electrostatic chuck by a simple construction and indeed solving the problem caused by the residual charge when the workpiece is detached.

再者,本發明者發現在靜電吸盤和直流電源之間串聯連接靜電電容可變化之靜電電容可變手段之時,藉由使該靜電電容可變手段之靜電電容變化,不僅不用阻斷對靜電吸盤施加電壓,可以使靜電吸盤之電荷量在工件吸附時之高值和工作脫離時之低值之間變化(即是,進行靜電吸盤之電荷量控制),依此,不僅解決因工件脫離時之殘留電荷所引起之問題而改善靜電吸盤之吸盤釋放性,也可以解決因電源之接通、斷開引起的各種問題(即是,於重複使用靜電吸盤之時,每次以靜電吸盤吸附工件,再者每次脫離時需要進行電源之接通、斷開,然而於該電源接通、斷開時之每次的電源接通時,在靜電吸盤之電路流入大的衝擊電流,該成為電弧等之靜電吸盤之故障原因,或對電源的負載變大而成為開關元件等之電源元件之故障原因等),而完成本發明。 Furthermore, the inventors have found that when the electrostatic capacitance variable means in which the electrostatic capacitance can be changed is connected in series between the electrostatic chuck and the DC power source, the electrostatic capacitance of the electrostatic capacitance variable means is changed, so that it is not necessary to block the static electricity. The voltage applied to the suction cup can change the charge amount of the electrostatic chuck between the high value of the workpiece suction and the low value when the work is released (that is, the charge amount control of the electrostatic chuck), thereby not only solving the problem when the workpiece is detached. The problem caused by the residual charge improves the release of the suction cup of the electrostatic chuck, and can also solve various problems caused by the turning on and off of the power source (that is, when the electrostatic chuck is repeatedly used, the workpiece is attracted by the electrostatic chuck every time. In addition, the power supply needs to be turned on and off each time it is detached. However, each time the power is turned on when the power is turned on or off, a large inrush current flows into the circuit of the electrostatic chuck, which becomes an arc. The present invention has been completed by the cause of malfunction of the electrostatic chuck, or the cause of the failure of the power source due to the increase in the load on the power source.

因此,本發明之目的係解決因靜電吸盤之工件脫離時之殘留電荷所引起之問題而提供吸盤釋放性優良之靜電吸盤裝置。 Accordingly, an object of the present invention is to provide an electrostatic chuck device which is excellent in suction release property due to a problem caused by residual charges when a workpiece of an electrostatic chuck is detached.

再者,本發明之其他目的,提供不僅解決靜電吸盤之工件脫離時之殘留電荷所引起之問題,亦可以解決因電源之接通、斷開而引起之問題的吸盤釋放性優良之靜電吸盤裝置。 Furthermore, another object of the present invention is to provide an electrostatic chuck device which is excellent in not only the problem of residual electric charge when the workpiece of the electrostatic chuck is detached, but also the release of the suction cup due to the problem of turning on or off the power source. .

並且,本發明之其他目的係針對被連接於直流電源之靜電吸盤,提供不用阻斷對靜電吸盤施加電壓,可以配合靜電吸盤之工件吸附及工件脫離之動作,使靜電吸盤之電荷量在工件吸附時之高值和工件脫離時之低值之間變化(即是,進行靜電吸盤之電荷量控制)的靜電吸盤裝置之控制方法。 Moreover, the other object of the present invention is to provide an electrostatic chuck connected to a DC power source, which can provide an action of adsorbing the workpiece of the electrostatic chuck and the workpiece detachment without blocking the application of a voltage to the electrostatic chuck, so that the charge amount of the electrostatic chuck is adsorbed on the workpiece. A method of controlling the electrostatic chuck device that changes between the high value of the time and the low value when the workpiece is detached (that is, the charge amount control of the electrostatic chuck).

即是,本發明為吸盤釋放性優良之靜電吸盤裝置,其特徵為具備:靜電吸盤、該靜電吸盤之直流電源、及被串聯連接於上述靜電吸盤和直流電源之間的靜電電容可變手段,藉由使上述靜電電容可變手段之靜電電容變化,在對上述靜電吸盤施加電壓之狀態下,使該靜電吸盤之電荷量在工件吸附時之高值和工件脫離時之低值之間予以變化。 That is, the present invention is an electrostatic chuck device excellent in suction release property, comprising: an electrostatic chuck, a DC power source of the electrostatic chuck, and a capacitance changing means connected in series between the electrostatic chuck and a DC power source, By changing the electrostatic capacitance of the electrostatic capacitance variable means, a voltage is applied to the electrostatic chuck, and the amount of charge of the electrostatic chuck is changed between a high value when the workpiece is adsorbed and a low value when the workpiece is detached. .

再者,本發明為吸盤釋放性優良之靜電吸盤裝置,其特徵為具備:靜電吸盤、該靜電吸盤之直流電源、 及被串聯連接於上述靜電吸盤和直流電源之間的電容器。 Furthermore, the present invention is an electrostatic chuck device excellent in suction release property, comprising: an electrostatic chuck, a DC power source of the electrostatic chuck, And a capacitor connected in series between the electrostatic chuck and the DC power source.

然後,本發明為一種靜電吸盤裝置之控制方法,為被連接於直流電源之靜電吸盤之控制方法,其特徵為:在上述靜電吸盤之電極和直流電源之間串聯連接靜電電容可變手段,藉由使該靜電電容可變手段之靜電電容變化,在維持對上述靜電吸盤施加電壓之狀態下,配合上述靜電吸盤之工件吸附及工件脫離之動作,使該靜電吸盤之電荷量在工件吸附時之高值和工件脫離時之低值之間予以變化。 Then, the present invention is a method for controlling an electrostatic chuck device, which is a method for controlling an electrostatic chuck connected to a DC power source, characterized in that a capacitive variable means is connected in series between an electrode of the electrostatic chuck and a DC power source. By changing the electrostatic capacitance of the electrostatic capacitance variable means, in the state in which the voltage is applied to the electrostatic chuck, the operation of the workpiece suction and the workpiece detachment of the electrostatic chuck is performed, so that the charge amount of the electrostatic chuck is absorbed by the workpiece. The high value changes between the low value and the low value of the workpiece.

在本發明中,理想上係在上述靜電吸盤的電極和直流電源之間串聯連接靜電電容可變手段,藉由該靜電電容可變手段,將靜電吸盤之靜電電容設為C1,再者將靜電電容可變手段之靜電電容設為C2時,將該靜電電容可變手段之靜電電容C2控制成於工件吸附時成為C1<C2,於工件脫離時成為C1>C2。藉由如此控制靜電電容可變手段之靜電電容而使變化,靜電吸盤於其工件吸附時吸附並保持工件,並且於工件脫離時,不會有在維持對靜電吸盤施加電壓之狀態下切斷直流電源之情形,可以防止靜電吸盤之電荷量強制性被降低,並且工件脫離時殘留電荷或電源之接通、斷開所引起的問題。 In the present invention, it is preferable to connect the electrostatic capacitance variable means in series between the electrode of the electrostatic chuck and the DC power source, and the electrostatic capacitance of the electrostatic chuck is set to C 1 by the electrostatic capacitance variable means, and 2 means the capacitance of the variable capacitance is C, the capacitance of the variable capacitance means C 2 C 1 is controlled to be at the workpiece suction <C 2, C 1 becomes the disengaged the workpiece> C 2. By controlling the electrostatic capacitance of the electrostatic capacitance variable means to change, the electrostatic chuck sucks and holds the workpiece while the workpiece is being sucked, and when the workpiece is detached, the DC power supply is not cut while maintaining the voltage applied to the electrostatic chuck. In this case, it is possible to prevent the charge amount of the electrostatic chuck from being forcibly lowered, and the problem caused by the residual charge or the power source being turned on or off when the workpiece is detached.

在本發明中,針對所使用之靜電吸盤之類型並不特別限制,就以靜電吸盤而言,即使為使用絕緣材料當作介電體的庫倫力型之靜電吸盤,再者使用固有電阻值為108~1013Ω.cm之半導體的強生拉貝克型之靜電吸盤 ,再者即使為使用具有梳齒形狀或複層電極構成等之各種圖案、構成的電極而在吸附面上形成不均勻電場之梯度力型之靜電吸盤亦可。尤其,於使用梯度力型靜電吸盤以作為靜電吸盤之時,有靜電電容之變化量比較小且容易控制之優點。 In the present invention, the type of the electrostatic chuck to be used is not particularly limited, and in the case of an electrostatic chuck, even if it is a Coulomb type electrostatic chuck using an insulating material as a dielectric, the inherent resistance value is used. 10 8 ~ 10 13 Ω. The electrostatic chuck of the Johnson & Johnson Baker type of the semiconductor of cm, and the electrostatic chuck of the gradient force type which forms an uneven electric field on the adsorption surface even by using various patterns and constituent electrodes having a comb shape or a multi-layer electrode configuration. Also. In particular, when a gradient force type electrostatic chuck is used as the electrostatic chuck, there is an advantage that the amount of change in electrostatic capacitance is small and easy to control.

再者,即使針對在本發明中所使用之靜電電容可變手段,其本身之靜電電容可變化,若將靜電吸盤之電荷量,若配合其靜電吸盤之工件吸附及工件脫離之動作,可在工件吸附時之高值和工件脫離時之低值之間變化即可,並不特別限制,但是由於使靜電電容變化之時之操作或控制容易,故以可變電容器為理想,再者,為構成可脫離地使導電體吸附於具有特定吸附面積之吸附面,且藉由使導電體對該吸附面之吸附面積變化,靜電電容容易變化之庫倫力型或強生拉貝克型的輔助靜電吸盤。 Furthermore, even for the electrostatic capacitance variable means used in the present invention, the electrostatic capacitance of the electrostatic chuck can be changed. If the charge amount of the electrostatic chuck is combined with the workpiece suction of the electrostatic chuck and the workpiece is detached, The value of the high value when the workpiece is adsorbed and the low value when the workpiece is detached are not particularly limited. However, since the operation or control is easy when the electrostatic capacitance is changed, the variable capacitor is preferable, and further, The Coulomb force type or Johnson & Johnson type auxiliary electrostatic chuck which is capable of detachably adsorbing the conductor to the adsorption surface having a specific adsorption area and changing the adsorption area of the conductor to the adsorption surface, and the capacitance easily changes.

在本發明中,針對控制靜電吸盤之電荷量的靜電電容可變手段,即使以可變電容器或輔助靜電吸盤等之一個靜電容量可變手段構成要素所構成亦可,再者,即使以被互相串聯連接之複數靜電電容可變手段構成要素來構成亦可,並且即使以被互相並聯連接之複數靜電電容可變手段構成要素來構成亦可。 In the present invention, the capacitance variable means for controlling the amount of charge of the electrostatic chuck may be constituted by one element of a capacitance variable means such as a variable capacitor or an auxiliary electrostatic chuck, and further, even if they are mutually The plurality of capacitance-capable means may be configured as a constituent element in series, and may be constituted by a plurality of capacitance-capable means constituent elements connected in parallel to each other.

在本發明中,針對上述靜電電容可變手段及/或電容器,即使將此組裝於靜電吸盤側亦可,再者即使組裝於直流電源側亦可,但是當構成組裝於直流電源側而內藏該靜電電容可變手段之直流電源裝置時,因應該內藏之 靜電電容可變手段之可變化的靜電電容之範圍,當作具有各種類型或是各種吸附性能之靜電吸盤之直流電源裝置使用,可以利用於其靜電吸盤之電荷量控制。 In the present invention, the capacitance variable means and/or the capacitor may be assembled to the side of the electrostatic chuck, and may be incorporated in the DC power supply side. When the DC power supply device of the electrostatic capacitance variable means is included, it should be built in The range of the variable capacitance of the electrostatic capacitance variable means is used as a DC power supply device of an electrostatic chuck having various types or various adsorption properties, and can be utilized for the charge amount control of the electrostatic chuck.

本發明之靜電吸盤裝置由於在其靜電吸盤和直流電源之間串聯連接靜電電容可變手段及/或電容器,故解決靜電吸盤之工件脫離時因殘留電荷所引起之各種問題,吸盤釋放性優良。 In the electrostatic chuck device of the present invention, since the electrostatic capacitance changing means and/or the capacitor are connected in series between the electrostatic chuck and the DC power source, various problems caused by residual charges when the workpiece of the electrostatic chuck is detached are solved, and the suction plate release property is excellent.

再者,於在靜電吸盤和直流電源之間串聯連接靜電電容可變手段之情況,藉由使靜電電容可變手段之靜電電容變化,容易控制靜電吸盤之電荷量,依此不用阻斷對靜電吸盤施加電壓,可以配合靜電吸盤之工件吸附及工件脫離之動作,使靜電吸盤之電荷量在工件吸附時之高值和工件脫離時之低值之間變化,並且不單係解決靜電吸盤之工件脫離時殘留電荷之問題而吸盤釋放性優良而已,也可以解決因電源之接通、斷開所引起之各種問題。 Furthermore, in the case where the electrostatic capacitance variable means is connected in series between the electrostatic chuck and the DC power source, it is easy to control the amount of charge of the electrostatic chuck by changing the electrostatic capacitance of the electrostatic capacitance variable means, and thus it is not necessary to block the static electricity. The voltage applied by the suction cup can be matched with the action of the workpiece suction of the electrostatic chuck and the detachment of the workpiece, so that the charge amount of the electrostatic chuck changes between the high value of the workpiece suction and the low value when the workpiece is detached, and the workpiece of the electrostatic chuck is not only solved. At the time of the problem of residual charge and excellent suction release, it is also possible to solve various problems caused by the turning on and off of the power source.

並且,若藉由本發明之靜電吸盤裝置之控制方法,針對被連接於直流電源之靜電吸盤,不用阻斷對靜電吸盤施加電壓,可配合靜電吸盤之工件吸附及工件脫離之動作,使靜電吸盤之電荷量在工件吸附時之高值和工件脫離時之低值之間變化,不會產生由於靜電吸盤之工件脫離時殘留電荷或電源接通、斷開所引起之各種問題。 Moreover, according to the control method of the electrostatic chuck device of the present invention, the electrostatic chuck connected to the DC power source can be used to prevent the voltage applied to the electrostatic chuck, and the electrostatic chuck can be combined with the workpiece suction of the electrostatic chuck and the workpiece to be detached. The amount of charge changes between the high value at the time of workpiece adsorption and the low value at which the workpiece is detached, and does not cause various problems caused by residual charge or power-on or disconnection due to the workpiece of the electrostatic chuck being detached.

1a、1b、1c、1d、1f‧‧‧靜電吸盤裝置 1a, 1b, 1c, 1d, 1f‧‧‧ electrostatic chuck device

2‧‧‧靜電吸盤 2‧‧‧Electrostatic suction cup

2a‧‧‧介電體部 2a‧‧‧Dielectric body

2b‧‧‧正電極 2b‧‧‧ positive electrode

2c‧‧‧負電極 2c‧‧‧negative electrode

2x‧‧‧電容器 2x‧‧‧ capacitor

2y‧‧‧電阻 2y‧‧‧resistance

3‧‧‧直流電源 3‧‧‧DC power supply

4‧‧‧靜電電容可變手段 4‧‧‧Solid capacitance means

4a、4b‧‧‧可變電容器 4a, 4b‧‧‧variable capacitors

4c‧‧‧電容器 4c‧‧‧ capacitor

4x‧‧‧輔助靜電吸盤 4x‧‧‧Auxiliary electrostatic chuck

4y‧‧‧導電體 4y‧‧‧Electrical conductor

W‧‧‧工件 W‧‧‧Workpiece

C1、C2、C3‧‧‧靜電電容 C 1 , C 2 , C 3 ‧‧‧ electrostatic capacitors

第1圖 Figure 1

為用以說明本發明之第一實施型態之說明圖(a)及電路圖(b)。 Description (a) and circuit diagram (b) for explaining the first embodiment of the present invention.

第2圖 Figure 2

為用以說明本發明之第二實施型態之說明圖。 It is an explanatory diagram for explaining the second embodiment of the present invention.

第3圖 Figure 3

為用以說明本發明之第三實施型態之說明圖(a)及電路圖(b)。 Description (a) and circuit diagram (b) for explaining the third embodiment of the present invention.

第4圖 Figure 4

為用以說明本發明之第四實施型態之說明圖。 It is an explanatory view for explaining the fourth embodiment of the present invention.

第5圖 Figure 5

為用以說明本發明之第五實施型態之說明圖。 It is explanatory drawing for explaining the fifth embodiment of the present invention.

第6圖 Figure 6

為用以說明本發明之第六實施型態之說明圖。 It is explanatory drawing for explaining the sixth embodiment of the present invention.

第7圖 Figure 7

為用以說明本發明之第七實施型態之說明圖。 It is explanatory drawing for explaining the seventh embodiment of the present invention.

第8圖 Figure 8

第8圖為表示與本發明之實施例有關之靜電吸盤裝置之說明圖。 Fig. 8 is an explanatory view showing an electrostatic chuck device according to an embodiment of the present invention.

[第一實施型態] [First embodiment]

第1圖(a)表示與本發明有關之第一實施型態有關的靜電吸盤裝置1a。該靜電吸盤裝置1a係由介電體部2a和被埋入在該介電體部2a內之正電極2b及負電極2c所構成之雙極型之靜電吸盤2,和對該靜電吸盤2之各電極2b、2c之間施加直流電壓的直流電源3,和當作被串聯連接於該些靜電吸盤2之正電極2b和直流電源3之正極之間的靜電電容可變手段4之可變電容器4a所構成。 Fig. 1(a) shows an electrostatic chuck device 1a according to a first embodiment of the present invention. The electrostatic chuck device 1a is a bipolar electrostatic chuck 2 composed of a dielectric body portion 2a and a positive electrode 2b and a negative electrode 2c embedded in the dielectric body portion 2a, and an electrostatic chuck 2 for the electrostatic chuck 2 A DC power source 3 to which a DC voltage is applied between the electrodes 2b and 2c, and a variable capacitor as a capacitance variable means 4 connected between the positive electrode 2b of the electrostatic chuck 2 and the positive electrode of the DC power source 3 in series 4a is composed.

在此,針對兩個電極2b、2c被埋入在介電體部2a內之雙極型靜電吸盤2,當電性地觀看此時,可以視為一對電容器2X和存在於其間的電阻2y所構成之一個電容器,故針對與組裝該雙極型靜電吸盤2之第一實施型態有關之靜電吸盤裝置1a,可以當作第1圖(b)所示之等效電路而予以掌握。 Here, the bipolar electrostatic chuck 2 in which the two electrodes 2b and 2c are buried in the dielectric body portion 2a can be regarded as a pair of capacitors 2X and a resistor 2y present therebetween when viewed electrically. Since the electrostatic chuck device 1a related to the first embodiment in which the bipolar electrostatic chuck 2 is assembled can be used as an equivalent circuit shown in Fig. 1(b).

在此,在與該第一實施型態有關之靜電吸盤裝置1a中,將靜電吸盤2之靜電電容設為C1,將可變電容器4a之靜電電容設為C2,再者,將從直流電源3被施加之直流電壓設為V之時,在靜電吸盤2吸附工件W之工件吸附時和工件W從該靜電吸盤2脫離之工件脫離時,藉由使當作靜電電容可變手段4之可變電容器4a之靜電電容C2變化,可以使靜電吸盤2之電荷量Q在增加至為了吸附工件W所需要的足夠電荷量Q1之工件吸附時之 狀態A,和降低至工件W容易脫離而不會產生殘留電荷之問題的電荷量Q2的工件脫離時之狀態B之間變化。 Here, in the electrostatic chuck device 1a according to the first embodiment, the electrostatic capacitance of the electrostatic chuck 2 is set to C 1 , the electrostatic capacitance of the variable capacitor 4a is set to C 2 , and further, from the direct current. When the DC voltage applied to the power source 3 is set to V, when the workpiece that adsorbs the workpiece W by the electrostatic chuck 2 is detached from the workpiece from which the workpiece W is detached from the electrostatic chuck 2, by using the electrostatic capacitance variable means 4 The electrostatic capacitance C 2 of the variable capacitor 4a is changed so that the charge amount Q of the electrostatic chuck 2 can be increased to the state A when the workpiece of the sufficient charge amount Q 1 required for adsorbing the workpiece W is adsorbed, and the workpiece W can be easily separated from the workpiece W. The state B of the charge amount Q 2 which does not cause the problem of residual charge changes when the workpiece is detached.

在此,針對可變電容器4中之靜電電容C2之控制,理想上係控制成於工件吸附時成為C1<C2,於工件脫離時成為C1>C2即可,依此,可以使靜電吸盤2之電荷量Q在其工件吸附時之狀態A中所需並且足夠之電荷量Q1和不會產生在工件脫離時之狀態B下殘留電荷之問題的電荷量Q2之間確實變化。 Here, the control of the capacitance C 2 in the variable capacitor 4 is preferably controlled to be C 1 <C 2 when the workpiece is adsorbed, and C 1 >C 2 when the workpiece is detached. the amount of charge between the electrostatic chuck of the charge amount Q 2 in its state of work required and the adsorption a sufficient amount of charge Q 1 and no problems in the state of the residual electric charge from the workpiece B, Q 2 do Variety.

[第二實施型態] [Second embodiment]

第2圖表示與本發明之第二實施型態有關的靜電吸盤裝置1b。該靜電吸盤裝置1b與上述第一實施型態有關之靜電吸盤裝置1a之情況不同,靜電吸盤2以僅一個電極(在本實施型態中為正電極2b)被埋入在介電體部2a內之單極型之靜電吸盤2所構成。然後,在該第二實施型態有關之靜電吸盤裝置1b中,在靜電吸盤2和負極被接地之直流電源3之正極之間串聯連接有當作靜電電容可變手段4之可變電容器4a,於進行工件W之吸附、脫離的靜電吸盤裝置1b之操作時在該工件W被接地之狀態下被使用。 Fig. 2 shows an electrostatic chuck device 1b according to a second embodiment of the present invention. The electrostatic chuck device 1b is different from the electrostatic chuck device 1a according to the first embodiment described above, and the electrostatic chuck 2 is embedded in the dielectric portion 2a with only one electrode (the positive electrode 2b in this embodiment). The unipolar electrostatic chuck 2 is constructed. Then, in the electrostatic chuck device 1b according to the second embodiment, a variable capacitor 4a serving as the capacitance variable means 4 is connected in series between the electrostatic chuck 2 and the positive electrode of the DC power source 3 to which the negative electrode is grounded. When the electrostatic chuck device 1b that performs adsorption and detachment of the workpiece W is operated, the workpiece W is used in a state where the workpiece W is grounded.

即使在與該第二實施型態有關之靜電吸盤裝置1b中,與上述第一實施型態有關之靜電吸盤裝置1a之情況相同,因可以將一個正電極2b埋入至介電體部2a內之單極型之靜電吸盤2視為一個電容器(靜電電容C1),故藉由使當作靜電電容可變手段4之可變電容器4a之靜電 電容C2變化,可以將靜電吸盤2之電荷量Q在工件吸附時之電荷量Q1之狀態A,和工件脫離時之電荷量Q2之狀態B之間變化,再者,即使針對該可變電容器4a之靜電電容C2控制,理想上也係控制成於工件吸附時成為C1<C2,於工件脫離時成為C1>C2為佳。 Even in the electrostatic chuck device 1b according to the second embodiment, as in the case of the electrostatic chuck device 1a according to the first embodiment described above, a positive electrode 2b can be buried in the dielectric body portion 2a. The unipolar electrostatic chuck 2 is regarded as a capacitor (electrostatic capacitor C 1 ), so that the electrostatic chuck 2 can be charged by changing the electrostatic capacitance C 2 of the variable capacitor 4a serving as the electrostatic variable means 4 The amount Q changes between the state A of the charge amount Q 1 when the workpiece is adsorbed and the state B of the charge amount Q 2 when the workpiece is detached, and further, even if the electrostatic capacitance C 2 of the variable capacitor 4a is controlled, it is ideal. It is also controlled to become C 1 <C 2 when the workpiece is adsorbed, and it is preferable to become C 1 >C 2 when the workpiece is detached.

[第三至第五實施型態] [Third to Fifth Embodiments]

第3圖為表示與本發明之第三實施型態有關之靜電吸盤裝置1c,與第1圖之第一實施型態有關之靜電吸盤裝置1a不同,靜電電容可變手段4係由被串聯連接於靜電吸盤2之正電極2b和直流電源3之正極之間的可變電容器4a,和被串聯連接於負電極2c和直流電源3之負極之間的可變電容器4b之兩個可變電容器所構成。再者,第4圖係表示與本發明之第四實施型態有關之靜電吸盤裝置1d,與第1圖之第一實施型態有關之靜電吸盤裝置1a不同,靜電電容可變手段4係由被互相並聯連接之兩個可變電容器4a、4b所構成之兩個可變電容器所構成。並且,第5圖係表示與本發明之第四實施型態有關之靜電吸盤裝置1e,與第1圖之第一實施型態有關之靜電吸盤裝置1a不同,靜電電容可變手段4係由被互相並聯連接之兩個可變電容器4a和電容器4c所構成。 Fig. 3 is a view showing an electrostatic chuck device 1c according to a third embodiment of the present invention. Unlike the electrostatic chuck device 1a according to the first embodiment of the first embodiment, the electrostatic capacitance changing means 4 is connected in series. a variable capacitor 4a between the positive electrode 2b of the electrostatic chuck 2 and the positive electrode of the DC power source 3, and two variable capacitors of the variable capacitor 4b connected in series between the negative electrode 2c and the negative electrode of the DC power source 3 Composition. Further, Fig. 4 is a view showing an electrostatic chuck device 1d according to a fourth embodiment of the present invention. Unlike the electrostatic chuck device 1a according to the first embodiment of the first embodiment, the electrostatic capacitance changing means 4 is composed of Two variable capacitors composed of two variable capacitors 4a and 4b connected in parallel to each other are formed. Further, Fig. 5 is a view showing an electrostatic chuck device 1e according to a fourth embodiment of the present invention. Unlike the electrostatic chuck device 1a according to the first embodiment of the first embodiment, the electrostatic capacitance varying means 4 is The two variable capacitors 4a and 4c are connected in parallel to each other.

即使與該些第三至第五實施型態有關之靜電吸盤1c、1d、1e中,也與上述第一實施型態有關之靜電吸盤裝置1a之情況相同,藉由使當作靜電電容可變手段 4之可變電容器4a、4b之靜電電容C2變化,可以使靜電吸盤2之電荷量Q在工件吸附時之電荷量Q1之狀態A,和工件脫離時之電荷量Q2之狀態B之間變化。 Even in the electrostatic chucks 1c, 1d, and 1e relating to the third to fifth embodiments, the electrostatic chuck device 1a according to the first embodiment described above is the same as the electrostatic capacitance. The electrostatic capacitance C 2 of the variable capacitors 4a, 4b of the means 4 is changed, and the state A of the charge amount Q 1 of the electrostatic chuck 2 when the workpiece is adsorbed, and the state B of the charge amount Q 2 when the workpiece is detached can be made. Change between.

[第六實施型態] [Sixth embodiment]

第6圖係表示與本發明之第六實施型態有關之靜電吸盤裝置1f,該靜電吸盤裝置1f係與第1圖之第一實施型態有關之靜電吸盤裝置1a不同,靜電電容可變手段4係由以庫倫型靜電吸盤所構成之輔助靜電吸盤4x,和以特定面積吸附於該輔助靜電吸盤4x之吸附面的鋁板、銅箔等之導電體4y所構成,藉由使該導電體4y對輔助靜電吸盤4x之吸附面的吸附面積變化,使靜電吸盤4x之靜電電容C2變化,依此使靜電吸盤2之電荷量Q在工件吸附時之電荷量Q1之狀態A,和工件脫離時之電荷量Q2之狀態B之間變化。 Figure 6 is a view showing an electrostatic chuck device 1f according to a sixth embodiment of the present invention. The electrostatic chuck device 1f is different from the electrostatic chuck device 1a according to the first embodiment of the first embodiment. 4 is composed of an auxiliary electrostatic chuck 4x composed of a Coulomb type electrostatic chuck, and an electric conductor 4y such as an aluminum plate or a copper foil which is adsorbed on the adsorption surface of the auxiliary electrostatic chuck 4x by a specific area, and the electric conductor 4y is made. The change of the adsorption area of the adsorption surface of the auxiliary electrostatic chuck 4x changes the electrostatic capacitance C 2 of the electrostatic chuck 4x, thereby causing the state A of the charge amount Q 1 of the electrostatic chuck 2 when the workpiece is adsorbed, and the workpiece to be separated from the workpiece. B change between the time the charge amount Q 2 of the state.

在與該第六實施型態有關之靜電吸盤裝置1f中,因藉由使導電體4y對輔助靜電吸盤4x之吸附面之吸附面積變化,可以容易使輔助靜電吸盤4x之靜電電容C2變化,故利用與藉由靜電吸盤2被吸附、脫離之工件W的關係,將工件吸附時和工件脫離時之吸附面積設定成最佳值,依此進行輔助靜電吸盤4x之靜電電容C2控制,理想上控制成工件吸附時成為C1<C2,於工件脫離時成為C1>C2為佳。 In the electrostatic chuck device 1f according to the sixth embodiment, the electrostatic capacitance C 2 of the auxiliary electrostatic chuck 4x can be easily changed by changing the adsorption area of the conductor 4y to the adsorption surface of the auxiliary electrostatic chuck 4x. Therefore, the adsorption area when the workpiece is adsorbed and detached from the workpiece is set to an optimum value by the relationship with the workpiece W that is adsorbed and detached by the electrostatic chuck 2, whereby the electrostatic capacitance C 2 of the auxiliary electrostatic chuck 4x is controlled, which is ideal. the controlled adsorption of the workpiece becomes C 1 <C 2, C 1 becomes the disengaged the workpiece> C 2 preferably.

第7圖係表示本發明之第七實施型態有關之 靜電吸盤裝置1g,該靜電吸盤裝置1g係由在靜電吸盤2側及/或直流電源3側安裝其靜電電容可變手段4之電容器4c所構成,藉由該電容器4c之存在,減輕殘留電荷之問題,改善靜電吸盤2之吸盤釋放性。 Figure 7 is a diagram showing the seventh embodiment of the present invention. The electrostatic chuck device 1g is composed of a capacitor 4c having a capacitance variable means 4 mounted on the side of the electrostatic chuck 2 and/or the DC power source 3, and the residual charge is reduced by the presence of the capacitor 4c. The problem is to improve the suction of the suction cup of the electrostatic chuck 2.

[實施例] [Examples]

如第8圖所示般,作為靜電吸盤2,使用具有夾持電極間絕緣層而在其工件吸附面側疊層被圖案化之電極層,再者在其相反側疊層其他電極層之複層電極構成,並且具有220mm×58mm之大小的吸附面之梯度力型靜電吸盤(ESC)(例如,參照專利第4825220號公報),再者,作為靜電電容可變手段4之輔助靜電吸盤4x而言,使用具有300mm×300mm之大小之吸附面的庫倫型靜電吸盤,並且作為吸附於其吸附面之導電體4y,使用350mm×350mm×1.1mm之鋁板,並且,作為直流電源3,使用1kV之直流電源,然後,在靜電吸盤2之正電極2b連接輔助靜電吸盤4x之負電極,將該輔助靜電吸盤4x之正電極連接於直流電源3之正極,再者將該直流電源3之負極連接於靜電吸盤2之負電極2c,而構成與該實施例有關之靜電吸盤裝置1f。 As shown in Fig. 8, as the electrostatic chuck 2, an electrode layer having a pattern in which an insulating layer is interposed between the electrodes and patterned on the side of the workpiece adsorption surface is laminated, and another electrode layer is laminated on the opposite side. A gradient force type electrostatic chuck (ESC) having an adsorption surface of a size of 220 mm × 58 mm (see, for example, Patent No. 4825220), and further, as an auxiliary electrostatic chuck 4x of the capacitance variable means 4 In other words, a Coulomb type electrostatic chuck having an adsorption surface of a size of 300 mm × 300 mm is used, and as the conductor 4y adsorbed to the adsorption surface thereof, an aluminum plate of 350 mm × 350 mm × 1.1 mm is used, and as the DC power source 3, 1 kV is used. DC power supply, then, the positive electrode 2b of the electrostatic chuck 2 is connected to the negative electrode of the auxiliary electrostatic chuck 4x, the positive electrode of the auxiliary electrostatic chuck 4x is connected to the positive electrode of the DC power source 3, and the negative electrode of the DC power source 3 is connected to The negative electrode 2c of the electrostatic chuck 2 constitutes an electrostatic chuck device 1f according to this embodiment.

[吸盤釋放性能之評估試驗] [Evaluation test of suction release performance]

針對上述靜電吸盤裝置1f,首先,不使工件W吸附在其靜電吸盤2之吸附面,構成將導電體4y載置在輔助 輔助靜電吸盤4x之吸附面的初期狀態,再者,使吸附於靜電吸盤2之吸附面,再者,使用大小20mm×20mm×0.5mm之晶圓作為脫離之被附著物之工件W,以下述順序調查該靜電吸盤裝置1f中之吸盤釋放性能。 With respect to the electrostatic chuck device 1f described above, first, the workpiece W is not adsorbed on the adsorption surface of the electrostatic chuck 2, and the conductor 4y is placed on the auxiliary body. In the initial state of the adsorption surface of the auxiliary electrostatic chuck 4x, the adsorption surface of the electrostatic chuck 2 is adsorbed, and a wafer having a size of 20 mm × 20 mm × 0.5 mm is used as the workpiece W to be removed. The suction release performance in the electrostatic chuck device 1f was sequentially investigated.

順序1:以IPA(異丙醇)使靜電吸盤裝置1f之靜電吸盤2、輔助靜電吸盤4x及導電體4y和工件W進行清淨化。 Sequence 1: The electrostatic chuck 2, the auxiliary electrostatic chuck 4x, the conductor 4y, and the workpiece W of the electrostatic chuck device 1f are cleaned by IPA (isopropyl alcohol).

順序2:在使直流電源3成為斷開之狀態下使工件W載置在靜電吸盤2之吸附面。 In the second step, the workpiece W is placed on the adsorption surface of the electrostatic chuck 2 while the DC power source 3 is turned off.

順序3:使直流電源3成為接通。 Sequence 3: The DC power source 3 is turned on.

順序4:直流電源3之電壓在1kV左右安定(約2秒後),以其吸附面成為垂直之方式使靜電吸盤2旋轉90°。 Sequence 4: The voltage of the DC power source 3 is stabilized at about 1 kV (after about 2 seconds), and the electrostatic chuck 2 is rotated by 90° so that the adsorption surface thereof becomes vertical.

順序5:剝下並除去吸附於輔助靜電吸盤4x之吸附面的導電體4y,觀察此時之工件W之掉落狀態。 Sequence 5: The conductor 4y adsorbed to the adsorption surface of the auxiliary electrostatic chuck 4x was peeled off and removed, and the falling state of the workpiece W at this time was observed.

順序6:使直流電源3成為斷開,觀察此時之工件W之落下狀態。 Sequence 6: The DC power source 3 is turned off, and the falling state of the workpiece W at this time is observed.

[靜電吸盤及輔助靜電吸盤之電荷量變化之測量] [Measurement of changes in charge amount of electrostatic chucks and auxiliary electrostatic chucks]

在上述吸盤釋放性能之評估試驗中,首先在靜電吸盤2載置大小155mm×60mm×55μm之銅箔以作為工件W,再者,在輔助靜電吸盤4x載置導電體4y,各測量上述順序5之前後的靜電吸盤2及輔助靜電吸盤4x之電荷量Q之變化,各測量工件吸附時之電荷量Q1及工件脫離時之電荷量Q2In the above evaluation test of the suction-release performance, first, a copper foil having a size of 155 mm × 60 mm × 55 μm is placed on the electrostatic chuck 2 as a workpiece W, and further, the conductor 4y is placed on the auxiliary electrostatic chuck 4x, and the above-described order is measured. The change in the charge amount Q of the electrostatic chuck 2 and the auxiliary electrostatic chuck 4x before and after the measurement, the amount of charge Q 1 when the workpiece is adsorbed, and the amount of charge Q 2 when the workpiece is detached.

將結果表示於表1。 The results are shown in Table 1.

接著,準備一片上述工件W,再者準備一片上述導電體4y之鋁板,針對重複5次工件W依循順序1~6而進行的上述吸盤釋放性能之評估試驗,調查此時之吸盤釋放性能。再者,此時,就以比較例而言,除了上述輔助靜電吸盤4x及導電體4y之外僅使用靜電吸盤2及直流電源3以作為靜電吸盤裝置,依照上述順序1→順序2→順序3→順序4→順序6而評估靜電吸盤2之吸盤釋放性能。 Next, one piece of the above-described workpiece W was prepared, and an aluminum plate of the above-mentioned conductor 4y was prepared. The suction cup release performance evaluation test was performed in accordance with the sequence 1 to 6 in which the workpiece W was repeated five times, and the suction release performance at this time was investigated. In this case, in the comparative example, only the electrostatic chuck 2 and the DC power source 3 are used as the electrostatic chuck device except for the auxiliary electrostatic chuck 4x and the conductor 4y, in accordance with the above sequence 1 → sequence 2 → sequence 3 → Sequence 4 → Sequence 6 to evaluate the suction release performance of the electrostatic chuck 2.

並且,針對該吸盤釋放性能之評估,將工件W在5秒內從靜電吸盤2之吸附面掉落之情況評估成○,再者將不掉落之情況評估成×。 Further, for the evaluation of the suction performance of the suction cup, the case where the workpiece W was dropped from the adsorption surface of the electrostatic chuck 2 within 5 seconds was evaluated as ○, and the case where the workpiece W was not dropped was evaluated as ×.

將該些結果表示於表2。 These results are shown in Table 2.

從表1所示之結果明顯可知,於使用實施例之靜電吸盤裝置1f之時,藉由導電體4y(鋁板)對輔助靜電吸盤4x之吸附面的吸附及脫離,可控制工件W對靜電吸盤2之吸附面的吸附及脫離,再者,藉由剝下吸附於輔助靜電吸盤4x之吸附面的導電體4y(銅箔),靜電吸盤2之吸附面中之工件吸附力下降,改善工件脫離時之吸盤解放性,除了吸盤釋放性能優良而可以解決靜電吸盤之工件脫離時因殘留電荷所引起之各種問題外,不需要直流電源之接通、斷開操作,也可以解決因電源之接通、斷開所引起之各種問題。再者,當注視順序6後之掉落率時,於使用實施例之靜電吸盤裝置1f之情況比起比較例,明顯改善其掉落率,由於僅存在輔助靜電吸盤4x,就可看出吸盤釋放性能被改善,故可理解即使在靜電吸盤和直流電源之間串聯連接電容器亦可以改善吸盤釋放性能。 As is apparent from the results shown in Table 1, when the electrostatic chuck device 1f of the embodiment is used, the workpiece W can be controlled by the adsorption and detachment of the auxiliary electrostatic chuck 4x by the conductor 4y (aluminum plate). Adsorption and detachment of the adsorption surface of 2, and further, by peeling off the conductor 4y (copper foil) adsorbed on the adsorption surface of the auxiliary electrostatic chuck 4x, the adsorption force of the workpiece in the adsorption surface of the electrostatic chuck 2 is lowered, and the workpiece is detached. When the suction cup is liberating, in addition to the excellent release performance of the suction cup, it can solve various problems caused by residual charge when the workpiece of the electrostatic chuck is detached, and the DC power supply is not required to be turned on or off, and the power supply can be solved. And disconnect the various problems caused. Further, when the drop rate after the sequence 6 is observed, the case where the electrostatic chuck device 1f of the embodiment is used is significantly improved in comparison with the comparative example, and since only the auxiliary electrostatic chuck 4x is present, the suction cup can be seen. The release performance is improved, so it is understood that the suction release performance can be improved even if a capacitor is connected in series between the electrostatic chuck and the DC power source.

1a‧‧‧靜電吸盤裝置 1a‧‧‧Electrostatic suction cup device

2‧‧‧靜電吸盤 2‧‧‧Electrostatic suction cup

2a‧‧‧介電體部 2a‧‧‧Dielectric body

2b‧‧‧正電極 2b‧‧‧ positive electrode

2c‧‧‧負電極 2c‧‧‧negative electrode

2x‧‧‧電容器 2x‧‧‧ capacitor

2y‧‧‧電阻 2y‧‧‧resistance

3‧‧‧直流電源 3‧‧‧DC power supply

4‧‧‧靜電電容可變手段 4‧‧‧Solid capacitance means

4a‧‧‧可變電容器 4a‧‧‧Variable Capacitors

W‧‧‧工件 W‧‧‧Workpiece

C1、C2‧‧‧靜電電容 C 1 , C 2 ‧‧‧ electrostatic capacitor

Claims (9)

一種靜電吸盤裝置,其特徵為具備:靜電吸盤、該靜電吸盤之直流電源、及被串聯連接於上述靜電吸盤和直流電源之間的靜電電容可變手段,藉由使上述靜電電容可變手段之靜電電容變化,在對上述靜電吸盤施加電壓之狀態下,使該靜電吸盤之電荷量在工件吸附時之高值和工件脫離時之低值之間予以變化。 An electrostatic chuck device comprising: an electrostatic chuck, a DC power source of the electrostatic chuck, and a capacitive variable means connected in series between the electrostatic chuck and a DC power source, wherein the electrostatic capacitance variable means The electrostatic capacitance changes, and in a state where a voltage is applied to the electrostatic chuck, the amount of charge of the electrostatic chuck is changed between a high value when the workpiece is adsorbed and a low value when the workpiece is detached. 如申請專利範圍第1項所記載之靜電吸盤裝置,其中於將靜電吸盤之靜電電容設為C1,將靜電電容可變手段之靜電電容設為C2之時,將該靜電電容可變手段之靜電電容C2控制成在工件吸附時成為C1<C2,在工件脫離時成為C1>C2The electrostatic chuck device according to claim 1, wherein the electrostatic capacitance variable means is provided when the electrostatic capacitance of the electrostatic chuck is C 1 and the electrostatic capacitance of the electrostatic capacitance means is C 2 C 2 of the capacitance C is controlled to become adsorbed while the workpiece 1 <C 2, while the workpiece becoming disengaged. 1 C> C 2. 如申請專利範圍第1或2項所記載之靜電吸盤裝置,其中上述靜電電容可變手段為可變電容器。 The electrostatic chuck device according to claim 1 or 2, wherein the capacitance variable means is a variable capacitor. 如申請專利範圍第1或2項所記載之靜電吸盤裝置,其中上述靜電電容可變手段為導電體可脫離地吸附於具有特定吸附面積之吸附面的庫倫力型或強生拉貝克(Johnson-Rahbek)型之輔助靜電吸盤,藉由使導電體對該輔助靜電吸盤之吸附面的吸附面積予以變化,使靜電吸盤之靜電電容變化。 The electrostatic chuck device according to claim 1 or 2, wherein the electrostatic capacitance changing means is a Coulomb force type or Johnson-Rahbek in which an electric conductor is detachably adsorbed to an adsorption surface having a specific adsorption area (Johnson-Rahbek) The auxiliary electrostatic chuck of the type changes the electrostatic capacitance of the electrostatic chuck by changing the adsorption area of the conductor to the adsorption surface of the auxiliary electrostatic chuck. 如申請專利範圍第1或2項所記載之靜電吸盤裝 置,其中上述靜電電容可變手段係由互相串聯連接之複數可變電容器及/或輔助靜電吸盤所構成,該輔助靜電吸盤為導電體可脫離地吸附於具有特定吸附面積之吸附面的庫倫力型或強生拉貝克(Johnson-Rahbek)型,藉由使導電體對該輔助靜電吸盤之吸附面的吸附面積予以變化,使靜電吸盤之靜電電容變化。 Such as the electrostatic chuck installed in the scope of claim 1 or 2 The electrostatic capacitance changing means is composed of a plurality of variable capacitors and/or auxiliary electrostatic chucks connected in series with each other, and the auxiliary electrostatic chuck is a Coulomb force that the conductor can be detachably adsorbed to the adsorption surface having a specific adsorption area. The type or Johnson-Rahbek type changes the electrostatic capacitance of the electrostatic chuck by changing the adsorption area of the conductor to the adsorption surface of the auxiliary electrostatic chuck. 如申請專利範圍第1或2項所記載之靜電吸盤裝置,其中上述靜電電容可變手段係由互相並聯連接之複數可變電容器及/或輔助靜電吸盤所構成,該輔助靜電吸盤為導電體可脫離地吸附於具有特定吸附面積之吸附面的庫倫力型或強生拉貝克(Johnson-Rahbek)型,藉由使導電體對該輔助靜電吸盤之吸附面的吸附面積予以變化,使靜電吸盤之靜電電容變化。 The electrostatic chuck device according to claim 1 or 2, wherein the electrostatic capacitance changing means comprises a plurality of variable capacitors and/or an auxiliary electrostatic chuck connected in parallel with each other, and the auxiliary electrostatic chuck is an electric conductor. A Coulomb force type or a Johnson-Rahbek type that is adsorbed to an adsorption surface having a specific adsorption area, and the electrostatic adsorption surface is electrostatically changed by causing the electric conductor to change the adsorption area of the adsorption surface of the auxiliary electrostatic chuck. Capacitance changes. 如申請專利範圍第1或2項所記載之靜電吸盤裝置,其中上述靜電電容可變手段被安裝於直流電源側。 The electrostatic chuck device according to claim 1 or 2, wherein the capacitance variable means is mounted on a DC power source side. 一種靜電吸盤裝置之控制方法,為被連接於直流電源之靜電吸盤之控制方法,其特徵為:在上述靜電吸盤和直流電源之間串聯連接靜電電容可變手段,藉由使該靜電電容可變手段之靜電電容變化,在 維持對上述靜電吸盤施加電壓之狀態下,配合上述靜電吸盤之工件吸附及工件脫離之動作,使該靜電吸盤之電荷量在工件吸附時之高值和工件脫離時之低值之間予以變化。 A control method for an electrostatic chuck device is a method for controlling an electrostatic chuck connected to a DC power source, characterized in that a capacitance variable means is connected in series between the electrostatic chuck and a DC power source, by making the electrostatic capacitance variable The electrostatic capacitance of the means changes While maintaining a voltage applied to the electrostatic chuck, the charge of the electrostatic chuck is changed between the high value of the workpiece suction and the low value of the workpiece when the workpiece is adsorbed and the workpiece is detached. 如申請專利範圍第8項所記載之靜電吸盤裝置之控制方法,其中於將靜電吸盤之靜電電容設為C1,將靜電電容可變手段之靜電電容設為C2之時,將該靜電電容可變手段之靜電電容C2控制成在工件吸附時成為C1<C2,在工件脫離時成為C1>C2The control method of the electrostatic chuck device according to the eighth aspect of the invention, wherein the electrostatic capacitance of the electrostatic chuck is C 1 and the electrostatic capacitance of the variable capacitance means is C 2 the variable capacitance means C 2 C controlled to become adsorbed while the workpiece 1 <C 2, while the workpiece becoming disengaged. 1 C> C 2.
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