TWI572876B - Memory card detection device - Google Patents

Memory card detection device Download PDF

Info

Publication number
TWI572876B
TWI572876B TW104109197A TW104109197A TWI572876B TW I572876 B TWI572876 B TW I572876B TW 104109197 A TW104109197 A TW 104109197A TW 104109197 A TW104109197 A TW 104109197A TW I572876 B TWI572876 B TW I572876B
Authority
TW
Taiwan
Prior art keywords
detecting
memory card
storage medium
disposed
base
Prior art date
Application number
TW104109197A
Other languages
Chinese (zh)
Other versions
TW201634943A (en
Inventor
Johnson Hsu
Original Assignee
Rich Flash Tech Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rich Flash Tech Ltd filed Critical Rich Flash Tech Ltd
Priority to TW104109197A priority Critical patent/TWI572876B/en
Priority to CN201520237543.5U priority patent/CN204638576U/en
Publication of TW201634943A publication Critical patent/TW201634943A/en
Application granted granted Critical
Publication of TWI572876B publication Critical patent/TWI572876B/en

Links

Description

記憶卡檢測裝置 Memory card detection device

本發明是有關於一種檢測裝置,特別是指一種記憶卡檢測裝置。 The present invention relates to a detecting device, and more particularly to a memory card detecting device.

現有的記憶卡於生產過程中為了確保產品品質,在製作完成後均會執行檢測作業,以檢測記憶卡是否損壞,進而淘汰出不良品。而目前的記憶卡檢測作業是以人工方式將記憶卡插置於讀卡機,透過讀卡機作資料交換,以供電腦之內部程式對記憶卡作檢測判別,並顯示檢測結果以告知該記憶卡為良品或不良品。由於人工作業一次僅能測試一個記憶卡,不僅製造流程相當緩慢耗時,且對於數量龐大之記憶卡而言,需要配置相當多的人力及設備才能維持穩定的生產效率,以致大幅增加成本。因此,在講求全面自動化及品質提升的趨勢下,記憶卡之檢測方式實有改進之必要,故,如何開發出一種可自動化檢測且確保品質之記憶卡檢測機,成為值得研究的課題。 In order to ensure the quality of the products in the production process, the existing memory card will perform the testing operation after the completion of the production to detect whether the memory card is damaged, and then eliminate the defective products. The current memory card detection operation is to manually insert the memory card into the card reader, and exchange data through the card reader for the internal program of the computer to detect and discriminate the memory card, and display the detection result to inform the memory. The card is a good or bad product. Since manual testing can only test one memory card at a time, not only is the manufacturing process quite slow and time consuming, but for a large number of memory cards, a considerable amount of manpower and equipment is required to maintain stable production efficiency, resulting in a substantial increase in cost. Therefore, under the trend of comprehensive automation and quality improvement, the detection method of the memory card is really necessary. Therefore, how to develop a memory card detector that can automatically detect and ensure quality has become a research topic worthy of study.

因此,本發明之其中一目的,即在提供一種全 自動化檢測記憶卡且能將記憶卡分級的記憶卡檢測裝置。 Therefore, one of the objects of the present invention is to provide a full A memory card detection device that automatically detects a memory card and can classify the memory card.

於是,本發明記憶卡檢測裝置在一些實施態樣中,適用於檢測多個容置於一儲存媒體承載盤的記憶卡,該儲存媒體承載盤包含多個分別供該等記憶卡容納的限位區,每一限位區包括一底壁及一形成於該底壁的通孔,該通孔使各該記憶卡的金手指區能顯露於外,該記憶卡檢測裝置包含:一檢測機構以及一分料機構。該檢測機構包括一基座、多個探針、一支撐單元、及一升降單元。該等探針可升降地設置於該基座並用於檢測該等記憶卡的金手指區,該支撐單元可升降地設置於該基座上且供該儲存媒體承載盤置放,該升降單元設置於該基座上,並具有一能相對於該基座在一檢測位置及一非檢測位置移動的壓抵平台,當該壓抵平台移動至該檢測位置時,該壓抵平台的底部壓抵於該儲存媒體承載盤的頂部周緣,該等探針分別穿過該等通孔以接觸於該等記憶卡的金手指區並進行檢測。該分料機構包括一設置於該檢測機構之基座的輸送滑台,及多個分級站。當該等探針檢測完成後,該壓抵平台移動至該非檢測位置時,該輸送滑台將該儲存媒體承載盤內的該等記憶卡依據檢測資料分送至該等分級站。 Therefore, in some implementations, the memory card detecting apparatus of the present invention is suitable for detecting a plurality of memory cards accommodated in a storage medium carrying tray, wherein the storage medium carrying tray includes a plurality of limit positions respectively for the memory cards. Each of the limiting areas includes a bottom wall and a through hole formed in the bottom wall, the through hole opening the gold finger area of each of the memory cards, the memory card detecting device comprising: a detecting mechanism and A distribution mechanism. The detecting mechanism includes a base, a plurality of probes, a supporting unit, and a lifting unit. The probes are disposed on the base and are used for detecting the gold finger area of the memory card. The support unit is vertically disposed on the base and placed for the storage medium carrying tray. The lifting unit is disposed. And a pressing platform capable of moving relative to the base at a detecting position and a non-detecting position, when the pressing platform moves to the detecting position, the bottom of the pressing platform is pressed On the top periphery of the storage medium carrying tray, the probes respectively pass through the through holes to contact the gold finger regions of the memory cards and detect them. The dispensing mechanism includes a transport slide disposed on a base of the detection mechanism, and a plurality of sorting stations. When the pressing platform moves to the non-detecting position after the detection of the probes is completed, the transporting slides distribute the memory cards in the storage medium carrying tray to the sorting stations according to the detection data.

在一些實施態樣中,該檢測機構還包括數量對應該等探針且可升降地設置於該基座的頂伸件,當該壓抵平台由該非檢測位置移動至該檢測位置時,該等頂伸件分別將該等記憶卡向上頂抵並貼合於該壓抵平台的底部。 In some embodiments, the detecting mechanism further includes a plurality of corresponding protrusions corresponding to the probes and hoistably disposed on the base, and when the pressing platform is moved from the non-detecting position to the detecting position, the same The top piece respectively lifts the memory card upward and abuts against the bottom of the pressing platform.

在一些實施態樣中,該檢測機構之壓抵平台的 底部形成有數量對應該儲存媒體承載盤之該等限位區的容置區,當該壓抵平台在該檢測位置時,該等記憶卡分別貼合於該等容置區。 In some implementations, the detection mechanism is pressed against the platform The bottom portion is formed with a plurality of accommodating areas corresponding to the limit areas of the media carrying tray. When the pressing platform is at the detecting position, the memory cards are respectively attached to the accommodating areas.

在一些實施態樣中,該檢測機構之支撐單元具有四個可升降地設置於該基座上的支撐柱,該等支撐柱分別撐抵於該儲存媒體承載盤的底部。 In some embodiments, the support unit of the detecting mechanism has four support columns that are vertically disposed on the base, and the support columns respectively support the bottom of the storage medium carrying tray.

在一些實施態樣中,該檢測機構之升降單元還具有四個設置於該基座的連接臂,該壓抵平台可升降地設置於該等連接臂且能沿該等連接臂上下移動。 In some embodiments, the lifting unit of the detecting mechanism further has four connecting arms disposed on the base, and the pressing platform is detachably disposed on the connecting arms and movable up and down along the connecting arms.

在一些實施態樣中,該記憶卡檢測裝置還包含一入料機構,該入料機構能將該儲存媒體承載盤輸送至該檢測機構。 In some embodiments, the memory card detecting device further includes a feeding mechanism that can transport the storage medium carrying tray to the detecting mechanism.

在一些實施態樣中,該記憶卡檢測裝置還包含一出料機構,該出料機構能將該儲存媒體承載盤由該輸送滑台輸送出。 In some embodiments, the memory card detecting device further includes a discharging mechanism capable of conveying the storage medium carrying tray out of the conveying slide.

在一些實施態樣中,該記憶卡檢測裝置還包含一機架,該機架供該入料機構、該檢測機構、該分料機構及該出料機構設置於其上。 In some embodiments, the memory card detecting device further includes a rack on which the feeding mechanism, the detecting mechanism, the dispensing mechanism, and the discharging mechanism are disposed.

本發明之功效在於:透過該檢測機構的該等探針分別穿過該儲存媒體承載盤的該等通孔以接觸於該等記憶卡的金手指區並進行檢測,再藉由該分料機構的輸送滑台將該儲存媒體承載盤內的該等記憶卡依據檢測資料分送至該等分級站,如此一來,該記憶卡檢測裝置即可達到全自動化檢測記憶卡且將記憶卡分級的目標。 The effect of the present invention is that the probes passing through the detecting mechanism respectively pass through the through holes of the storage medium carrying tray to contact and detect the gold finger area of the memory card, and then the detecting mechanism The transporting slides distribute the memory cards in the storage medium carrying tray to the sorting stations according to the detection data, so that the memory card detecting device can fully automate the detection of the memory card and classify the memory card. aims.

1‧‧‧儲存媒體承載盤 1‧‧‧Storage media carrier

11‧‧‧限位區 11‧‧‧Limited area

111‧‧‧底壁 111‧‧‧ bottom wall

112‧‧‧通孔 112‧‧‧through hole

12‧‧‧圍繞壁 12‧‧‧ Around the wall

2‧‧‧記憶卡 2‧‧‧ memory card

22‧‧‧金手指區 22‧‧‧Gold Finger Area

3‧‧‧機架 3‧‧‧Rack

4‧‧‧入料機構 4‧‧‧Feeding agency

5‧‧‧檢測機構 5‧‧‧Testing agency

51‧‧‧基座 51‧‧‧Base

52‧‧‧探針 52‧‧‧ probe

53‧‧‧頂伸件 53‧‧‧Top extension

54‧‧‧支撐單元 54‧‧‧Support unit

541‧‧‧支撐柱 541‧‧‧Support column

55‧‧‧升降單元 55‧‧‧ Lifting unit

551‧‧‧連接臂 551‧‧‧Connecting arm

552‧‧‧壓抵平台 552‧‧‧Pushing platform

553‧‧‧容置區 553‧‧‧Receiving area

6‧‧‧分料機構 6‧‧‧Distribution agency

61‧‧‧輸送滑台 61‧‧‧Conveying slide

62‧‧‧分級站 62‧‧‧ Rating Station

7‧‧‧出料機構 7‧‧‧Distribution agency

71‧‧‧出料升降機 71‧‧‧Output lift

本發明之其他的特徵及功效,將於參照圖式的實施例詳細說明中清楚地呈現,其中:圖1是一立體圖,說明本發明記憶卡檢測裝置的一實施例;圖2是一立體圖,說明該實施例的一檢測機構用於檢測一儲存媒體承載盤內的多個記憶卡;圖3是圖2的俯視圖,說明該實施例的一分料機構的一輸送滑台輸送該儲存媒體承載盤;圖4是一側視圖,說明該實施例的該檢測機構之一升降單元的一壓抵平台在一非檢測位置;圖5是一側視圖,說明該實施例的該檢測機構之升降單元的壓抵平台在一檢測位置;圖6是一示意圖,說明該實施例的該檢測機構之升降單元的壓抵平台在該非檢測位置;圖7是一示意圖,說明該實施例的該檢測機構之升降單元的壓抵平台往下移動且壓抵於該儲存媒體承載盤;圖8是一示意圖,說明該實施例的該檢測機構之升降單元的壓抵平台往下移動且多個頂伸件將該等記憶卡頂抵於該壓抵平台的底部;及圖9是一示意圖,說明該實施例的該檢測機構之升降單元的壓抵平台往下移動,多個探針接觸於該等記憶卡並進行檢測。 The other features and advantages of the present invention will be apparent from the following detailed description of the embodiments of the invention, wherein: FIG. 1 is a perspective view showing an embodiment of the memory card detecting device of the present invention; FIG. 2 is a perspective view. A detecting mechanism of the embodiment is used for detecting a plurality of memory cards in a storage medium carrying tray; FIG. 3 is a top view of FIG. 2, illustrating a transporting slide of a dispensing mechanism of the embodiment for transporting the storage medium carrying Figure 4 is a side elevational view showing a pressing platform of the lifting unit of the detecting mechanism of the embodiment in a non-detecting position; Figure 5 is a side view showing the lifting unit of the detecting mechanism of the embodiment The pressing platform is in a detecting position; FIG. 6 is a schematic view showing that the pressing platform of the lifting unit of the detecting mechanism of the embodiment is in the non-detecting position; FIG. 7 is a schematic diagram illustrating the detecting mechanism of the embodiment. The pressing platform of the lifting unit is moved downward and pressed against the storage medium carrying tray; FIG. 8 is a schematic diagram illustrating that the pressing unit of the detecting unit of the detecting mechanism moves downwardly against the platform and a lifting member abuts the bottom of the pressing plate against the bottom of the platform; and FIG. 9 is a schematic view showing that the pressing unit of the detecting unit of the detecting mechanism moves downwardly against the platform, and the plurality of probes are in contact with each other. Check the memory cards.

下列實施例的說明是參考附加的圖式,用以例示本發明可用以實施之特定實施例。本發明所提到的方向用語,例如「上」、「下」、「前」、「後」、「左」、「右」等,僅是參考附加圖式的方向。因此,使用的方向用語是用來說明,而非用來限制本發明。 The following description of the embodiments is intended to be illustrative of the specific embodiments The directional terms mentioned in the present invention, such as "upper", "lower", "front", "back", "left", "right", etc., are merely directions referring to the additional drawings. Therefore, the directional terminology used is for the purpose of illustration and not limitation.

參閱圖1、圖2、圖3與圖6,本發明記憶卡檢測裝置之一實施例適用於檢測多個分別容置於多個儲存媒體承載盤1的記憶卡2,各該儲存媒體承載盤1包含多個分別供該等記憶卡2容納的限位區11,及一環繞於該等限位區11的圍繞壁12。每一限位區11包括一底壁111及一形成於該底壁111的通孔112,該通孔112使各該記憶卡2的金手指區22能顯露於外,其具體結構已揭露於台灣專利公告案第M482065號,一併列入本案參考。詳細來說,在本實施例中,各該儲存媒體承載盤1包含120個限位區11,該等限位區11彼此相連接且呈15×8的矩陣排列,因此,每一儲存媒體承載盤1可承載120個記憶卡2。 Referring to FIG. 1 , FIG. 2 , FIG. 3 and FIG. 6 , an embodiment of the memory card detecting device of the present invention is applicable to detecting a plurality of memory cards 2 respectively accommodated in a plurality of storage media carrier disks 1 , each of the storage media carrier disks 1 includes a plurality of limiting areas 11 respectively accommodated by the memory cards 2, and a surrounding wall 12 surrounding the limiting areas 11. Each of the limiting regions 11 includes a bottom wall 111 and a through hole 112 formed in the bottom wall 111. The through hole 112 can expose the gold finger region 22 of each of the memory cards 2, and the specific structure thereof has been disclosed. Taiwan Patent Notice No. M482065 is included in the reference of this case. In detail, in this embodiment, each of the storage media carrying trays 1 includes 120 limit areas 11 which are connected to each other and arranged in a matrix of 15×8. Therefore, each storage medium carries The disc 1 can carry 120 memory cards 2.

本發明記憶卡檢測裝置包含:一機架3、一入料機構4、多個檢測機構5、一分料機構6,及一出料機構7。該機架3供該入料機構4、該等檢測機構5、該分料機構6,及該出料機構7設置於其上。 The memory card detecting device of the present invention comprises: a frame 3, a feeding mechanism 4, a plurality of detecting mechanisms 5, a dispensing mechanism 6, and a discharging mechanism 7. The frame 3 is provided with the feeding mechanism 4, the detecting mechanism 5, the dispensing mechanism 6, and the discharging mechanism 7 thereon.

該入料機構4能將該等儲存媒體承載盤1分別輸送至該等檢測機構5,具體來說,該入料機構4可承載150個儲存媒體承載盤1且分成五排,每一排具有30個彼此上下堆疊的儲存媒體承載盤1,而每一次該入料機構4 是將各排最上層的儲存媒體承載盤1一起輸送至該等檢測機構5,所以每一次將有600個儲存媒體承載盤1同時進行檢測。 The feeding mechanism 4 can transport the storage medium carrying trays 1 to the detecting mechanisms 5 respectively. Specifically, the feeding mechanism 4 can carry 150 storage medium carrying trays 1 and is divided into five rows, each row having 30 storage media carriers 1 stacked on top of each other, and each time the feeding mechanism 4 The storage medium carrying trays 1 of the uppermost rows of the rows are transported together to the detecting mechanisms 5, so that 600 storage media carrying trays 1 will be simultaneously detected each time.

各該檢測機構5包括一基座51、多個頂伸件53、多個探針52、一支撐單元54、及一升降單元55。該等頂伸件53的數量與該等探針52的數量皆對應於各該儲存媒體承載盤1的該等限位區11的數量,因此,該等頂伸件53與該等探針52的數量皆為120個,且該等頂伸件53彼此相間隔呈15×8的矩陣排列,而該等探針52則分別與該等頂伸件53相鄰,且各頂伸件53與各探針52皆可升降地設置於該基座51,其中,各頂伸件53用於頂抵各記憶卡2,而各探針52則用於開卡並檢測各記憶卡2的金手指區22。 Each of the detecting mechanisms 5 includes a base 51, a plurality of protruding members 53, a plurality of probes 52, a supporting unit 54, and a lifting unit 55. The number of the protruding members 53 and the number of the probes 52 correspond to the number of the limiting regions 11 of each of the storage medium carrying trays 1. Therefore, the protruding members 53 and the probes 52 The number of the protrusions 53 is 120, and the protrusions 53 are arranged in a matrix of 15×8, and the probes 52 are respectively adjacent to the protrusions 53 and the extensions 53 and Each of the probes 52 is detachably disposed on the base 51, wherein each of the protrusions 53 is used to abut against each of the memory cards 2, and each of the probes 52 is used to open the card and detect the golden fingers of each of the memory cards 2. District 22.

該支撐單元54具有四個可升降地設置於該基座51上的支撐柱541,該等支撐柱541分別撐抵於該儲存媒體承載盤1的底部以供該儲存媒體承載盤1置放。且該儲存媒體承載盤1的各限位區11的通孔112位置對應於各頂伸件53與各探針52,使各記憶卡2的金手指區22能位於各頂伸件53與各探針52的正上方。 The support unit 54 has four support columns 541 that are vertically disposed on the base 51. The support columns 541 are respectively supported on the bottom of the storage medium carrying tray 1 for the storage medium carrying tray 1 to be placed. The position of the through hole 112 of each of the limiting regions 11 of the storage medium carrying tray 1 corresponds to each of the protruding members 53 and the probes 52, so that the gold finger regions 22 of the memory cards 2 can be located at the respective protruding members 53 and Directly above the probe 52.

參閱圖4與圖5,該升降單元55具有四個設置於該基座51的連接臂551,及一可升降地設置於該等連接臂551的壓抵平台552。該壓抵平台552能沿該等連接臂551上下移動,因此,該壓抵平台552能相對於該基座51在一檢測位置(如圖5所示)及一非檢測位置(如圖4所示)移 動。且該壓抵平台552的底部形成有數量對應該儲存媒體承載盤1之該等限位區11的容置區553(見圖6),各容置區553的位置對應於各限位區11的位置。 Referring to FIG. 4 and FIG. 5 , the lifting unit 55 has four connecting arms 551 disposed on the base 51 , and a pressing platform 552 disposed on the connecting arms 551 . The pressing platform 552 can move up and down along the connecting arms 551. Therefore, the pressing platform 552 can be in a detecting position (as shown in FIG. 5) and a non-detecting position relative to the base 51 (as shown in FIG. 4). Shift move. The bottom of the pressing platform 552 is formed with a plurality of accommodating areas 553 (see FIG. 6) corresponding to the limiting areas 11 of the media carrying tray 1. The positions of the accommodating areas 553 correspond to the limiting areas 11 s position.

搭配參閱圖1,該分料機構6包括一輸送滑台61,及多個分級站62。該輸送滑台61設置於該等檢測機構5的基座51上,用於將各該儲存媒體承載盤1內的該等記憶卡2依據檢測資料分送至該等分級站62,而該等分級站62依據記憶卡2的容量分成16G、8G、4G、2G、1G與瑕疵品的級別,當然該等分級站62也可依據其他的檢測數據進行級別分類,並不以本實施例所揭露的分級方式為限。 Referring to FIG. 1, the dispensing mechanism 6 includes a transport slide 61 and a plurality of sorting stations 62. The transporting slides 61 are disposed on the base 51 of the detecting mechanism 5 for distributing the memory cards 2 in each of the storage medium carrying trays 1 to the sorting stations 62 according to the detection data. The classification station 62 is divided into 16G, 8G, 4G, 2G, 1G and defective products according to the capacity of the memory card 2. Of course, the classification stations 62 can also classify the levels according to other detection data, and are not disclosed in the embodiment. The grading method is limited.

該出料機構7能將由該輸送滑台61輸送來的檢測完後的該等儲存媒體承載盤1輸送出記憶卡檢測裝置,在本實施例中,該出料機構7包括兩台出料升降機71,每一出料升降機71能承載120個儲存媒體承載盤1且分成四排,每一排具有30個彼此上下堆疊的儲存媒體承載盤1,當兩台出料升降機71一起輸送時,每次可將240個儲存媒體承載盤1輸送出,以提升整體檢測效率。 The discharging mechanism 7 can transport the detected storage medium carrying trays 1 transported by the transporting slide 61 out of the memory card detecting device. In the embodiment, the discharging mechanism 7 includes two discharging elevators. 71. Each discharge elevator 71 can carry 120 storage medium carrying trays 1 and is divided into four rows, each row having 30 storage medium carrying trays 1 stacked on top of each other, when the two discharge elevators 71 are transported together, each 240 storage media carrier disks 1 can be transported out to improve overall detection efficiency.

以下說明本發明記憶卡檢測裝置之實施例的各該檢測機構5的運作方式。 Next, the operation of each of the detecting mechanisms 5 of the embodiment of the memory card detecting device of the present invention will be described.

參閱圖4、圖6與圖7,當該壓抵平台552由該非檢測位置下降時,該壓抵平台552的底部會壓抵於該儲存媒體承載盤1的頂部周緣(即圍繞壁12頂緣),搭配參閱圖8,當該壓抵平台552繼續下降時,該壓抵平台552會將該儲存媒體承載盤1往下壓,使該等記憶卡2分別透過該 等通孔112先接觸到該等頂伸件53,然後該等記憶卡2開始脫離對應的該等底壁111,而當該壓抵平台552再繼續下降時,該等頂伸件53向下收縮並將該等記憶卡2分別向上頂抵且貼合於該等容置區553,同時該等探針52亦分別穿過該等通孔112以接觸於該等記憶卡2的金手指區22。 Referring to FIG. 4, FIG. 6, and FIG. 7, when the pressing platform 552 is lowered from the non-detecting position, the bottom of the pressing platform 552 is pressed against the top periphery of the storage medium carrying tray 1 (ie, the top edge of the surrounding wall 12). With reference to FIG. 8, when the pressing platform 552 continues to descend, the pressing platform 552 presses the storage medium carrying tray 1 downward, so that the memory cards 2 respectively pass through the The through holes 112 first contact the top extensions 53, and then the memory cards 2 start to detach from the corresponding bottom walls 111, and when the pressing platform 552 continues to descend, the extensions 53 are downward. Shrinking and aligning the memory cards 2 to the accommodating regions 553, respectively, and the probes 52 also pass through the through holes 112 to contact the gold finger regions of the memory cards 2, respectively. twenty two.

參閱圖5與圖9,當該壓抵平台552繼續向下移動至該檢測位置時,該等頂伸件53與該等探針52同時向下收縮,且各頂伸件53下降至低於各探針52的位置,使各探針52進行開卡及檢測。而當各探針52檢測完成後,該壓抵平台552向上移動至該非檢測位置時,該輸送滑台61將各該儲存媒體承載盤1內的該等記憶卡2依據檢測資料分送至該等分級站62(見圖1),如此即完成記憶卡2的檢測。 Referring to FIGS. 5 and 9, when the pressing platform 552 continues to move downward to the detecting position, the protruding members 53 and the probes 52 simultaneously contract downward, and each of the protruding members 53 descends below. The position of each probe 52 causes each probe 52 to open and detect. When the pressing platform 552 is moved up to the non-detecting position after the detection of the probes 52 is completed, the transporting slide 61 distributes the memory cards 2 in the storage medium carrying trays 1 according to the detection data to the The classification station 62 (see Fig. 1) is thus completed, so that the detection of the memory card 2 is completed.

綜上所述,透過各該檢測機構5的該等探針52分別穿過各該儲存媒體承載盤1的該等通孔112以接觸於該等記憶卡2的金手指區22並進行開卡及檢測,再藉由該分料機構6的輸送滑台61將各該儲存媒體承載盤1內的該等記憶卡2依據檢測資料分送至該等分級站62,如此一來,該記憶卡檢測裝置即可達到全自動化檢測記憶卡2且將記憶卡2精準分級的功效,不僅節省人力與時間成本,還能精確且無誤地將記憶卡2分級,故確實能達成本發明之目的。 In summary, the probes 52 passing through the detecting mechanisms 5 respectively pass through the through holes 112 of each of the storage media carriers 1 to contact the gold finger regions 22 of the memory cards 2 and perform card opening. And detecting, and the memory cards 2 in each of the storage medium carrying trays 1 are distributed to the sorting stations 62 according to the detection data by the transporting slide 61 of the dispensing mechanism 6, so that the memory card The detection device can achieve the function of fully automatic detection of the memory card 2 and accurate classification of the memory card 2, which not only saves manpower and time cost, but also accurately and unambiguously classifies the memory card 2, so that the object of the present invention can be achieved.

惟以上所述者,僅為本發明之實施例而已,當不能以此限定本發明實施之範圍,即大凡依本發明申請專 利範圍及專利說明書內容所作之簡單的等效變化與修飾,皆仍屬本發明專利涵蓋之範圍內。 However, the above is only an embodiment of the present invention, and the scope of the present invention cannot be limited thereto, that is, the application according to the present invention is The simple equivalent changes and modifications made by the scope of the patent and the contents of the patent specification are still within the scope of the invention.

1‧‧‧儲存媒體承載盤 1‧‧‧Storage media carrier

3‧‧‧機架 3‧‧‧Rack

4‧‧‧入料機構 4‧‧‧Feeding agency

5‧‧‧檢測機構 5‧‧‧Testing agency

6‧‧‧分料機構 6‧‧‧Distribution agency

62‧‧‧分級站 62‧‧‧ Rating Station

7‧‧‧出料機構 7‧‧‧Distribution agency

71‧‧‧出料升降機 71‧‧‧Output lift

Claims (7)

一種記憶卡檢測裝置,適用於檢測多個容置於一儲存媒體承載盤的記憶卡,該儲存媒體承載盤包含多個分別供該等記憶卡容納的限位區,每一限位區包括一底壁及一形成於該底壁的通孔,該通孔使各該記憶卡的金手指區能顯露於外,該記憶卡檢測裝置包含:一檢測機構,包括一基座,多個探針,可升降地設置於該基座並用於檢測該等記憶卡的金手指區,一支撐單元,可升降地設置於該基座上且供該儲存媒體承載盤置放,及一升降單元,設置於該基座上,並具有一能相對於該基座在一檢測位置及一非檢測位置移動的壓抵平台,當該壓抵平台移動至該檢測位置時,該壓抵平台的底部壓抵於該儲存媒體承載盤的頂部周緣,該等探針分別穿過該等通孔以接觸於該等記憶卡的金手指區並進行檢測;以及一分料機構,包括一設置於該檢測機構之基座的輸送滑台,及多個分級站,當該等探針檢測完成後,該壓抵平台移動至該非檢測位置時,該輸送滑台將該儲存媒體承載盤內的該等記憶卡依據檢測資料分送至該等分級站,其中,該檢測機構還包括數量對應該等探針且可升 降地設置於該基座的頂伸件,當該壓抵平台由該非檢測位置移動至該檢測位置時,該等頂伸件分別將該等記憶卡向上頂抵並貼合於該壓抵平台的底部。 A memory card detecting device is configured to detect a plurality of memory cards that are disposed on a storage medium carrier disk. The storage media carrier disk includes a plurality of limiting areas respectively accommodated by the memory cards, each of the limiting areas includes a a bottom wall and a through hole formed in the bottom wall, the through hole enables the gold finger area of each of the memory cards to be exposed, the memory card detecting device comprises: a detecting mechanism, including a base and a plurality of probes And a lifting unit is disposed on the base and used for detecting the gold finger area of the memory card, a supporting unit is vertically disposed on the base and is disposed for the storage medium carrying tray, and a lifting unit is disposed And a pressing platform capable of moving relative to the base at a detecting position and a non-detecting position, when the pressing platform moves to the detecting position, the bottom of the pressing platform is pressed On the top periphery of the storage medium carrier, the probes respectively pass through the through holes to contact and detect the gold finger area of the memory card; and a dispensing mechanism includes a receiving mechanism disposed on the detecting mechanism Pedestal conveyor slide And a plurality of sorting stations, when the pressing platform moves to the non-detecting position after the detecting of the probes is completed, the transporting slides distribute the memory cards in the storage medium carrying tray according to the detection data to the plurality of sorting stations. a grading station, wherein the detecting mechanism further includes a number corresponding to the probe and can be raised a descending member disposed on the base of the base, and when the pressing platform is moved from the non-detecting position to the detecting position, the protruding members respectively lift the memory card upwardly and adhere to the pressing platform bottom of. 如請求項1所述記憶卡檢測裝置,其中,該檢測機構之壓抵平台的底部形成有數量對應該儲存媒體承載盤之該等限位區的容置區,當該壓抵平台在該檢測位置時,該等記憶卡分別貼合於該等容置區。 The memory card detecting device of claim 1, wherein the bottom of the pressing mechanism of the detecting mechanism is formed with a plurality of receiving areas corresponding to the limiting areas of the media carrying tray, when the pressing platform is in the detecting In the position, the memory cards are respectively attached to the accommodating areas. 如請求項1所述記憶卡檢測裝置,其中,該檢測機構之支撐單元具有四個可升降地設置於該基座上的支撐柱,該等支撐柱分別撐抵於該儲存媒體承載盤的底部。 The memory card detecting device of claim 1, wherein the supporting unit of the detecting mechanism has four supporting columns that are vertically disposed on the base, and the supporting columns respectively support the bottom of the storage medium carrying tray . 如請求項1所述記憶卡檢測裝置,其中,該檢測機構之升降單元還具有四個設置於該基座的連接臂,該壓抵平台可升降地設置於該等連接臂且能沿該等連接臂上下移動。 The memory card detecting device of claim 1, wherein the lifting unit of the detecting mechanism further has four connecting arms disposed on the base, and the pressing platform is vertically disposed on the connecting arms and can be along the same The connecting arm moves up and down. 如請求項1所述記憶卡檢測裝置,還包含一入料機構,該入料機構能將該儲存媒體承載盤輸送至該檢測機構。 The memory card detecting device of claim 1, further comprising a feeding mechanism capable of conveying the storage medium carrying tray to the detecting mechanism. 如請求項5所述記憶卡檢測裝置,還包含一出料機構,該出料機構能將該儲存媒體承載盤由該輸送滑台輸送出。 The memory card detecting device of claim 5, further comprising a discharging mechanism capable of conveying the storage medium carrying tray out of the conveying slide. 如請求項6所述記憶卡檢測裝置,還包含一機架,該機架供該入料機構、該檢測機構、該分料機構及該出料機構設置於其上。 The memory card detecting device of claim 6, further comprising a rack, the rack for the feeding mechanism, the detecting mechanism, the dispensing mechanism and the discharging mechanism being disposed thereon.
TW104109197A 2015-03-23 2015-03-23 Memory card detection device TWI572876B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW104109197A TWI572876B (en) 2015-03-23 2015-03-23 Memory card detection device
CN201520237543.5U CN204638576U (en) 2015-03-23 2015-04-20 Memory card detection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW104109197A TWI572876B (en) 2015-03-23 2015-03-23 Memory card detection device

Publications (2)

Publication Number Publication Date
TW201634943A TW201634943A (en) 2016-10-01
TWI572876B true TWI572876B (en) 2017-03-01

Family

ID=54091351

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104109197A TWI572876B (en) 2015-03-23 2015-03-23 Memory card detection device

Country Status (2)

Country Link
CN (1) CN204638576U (en)
TW (1) TWI572876B (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5290134A (en) * 1991-12-03 1994-03-01 Advantest Corporation Pick and place for automatic test handler
CN101901634B (en) * 2009-05-26 2013-01-02 鸿劲科技股份有限公司 USB memory testing sorter
TWI416136B (en) * 2006-03-08 2013-11-21 Testmetrix Inc Apparatus and method for testing semiconductor devices
TW201407171A (en) * 2012-08-10 2014-02-16 Hon Tech Inc Electronic component testing and classification equipment
TW201411156A (en) * 2012-09-07 2014-03-16 Hon Tech Inc Opposite-arranged electronic member testing and classification equipment

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5290134A (en) * 1991-12-03 1994-03-01 Advantest Corporation Pick and place for automatic test handler
TWI416136B (en) * 2006-03-08 2013-11-21 Testmetrix Inc Apparatus and method for testing semiconductor devices
CN101901634B (en) * 2009-05-26 2013-01-02 鸿劲科技股份有限公司 USB memory testing sorter
TW201407171A (en) * 2012-08-10 2014-02-16 Hon Tech Inc Electronic component testing and classification equipment
TW201411156A (en) * 2012-09-07 2014-03-16 Hon Tech Inc Opposite-arranged electronic member testing and classification equipment

Also Published As

Publication number Publication date
CN204638576U (en) 2015-09-16
TW201634943A (en) 2016-10-01

Similar Documents

Publication Publication Date Title
US6248967B1 (en) IC testing apparatus
US9250292B2 (en) Testing system for testing semiconductor package stacking chips and semiconductor automatic tester thereof
CN1159227A (en) Semiconductor device tester and semiconductor device testing system
TW201628471A (en) Material feeding and discharging inspection equipment for PCB board testing machine and material feeding and discharging inspection flow process
CN107533102A (en) Element processor
TWI373623B (en) Apparatus for testing system-in-package (sip) devices
TWI572876B (en) Memory card detection device
TWM505613U (en) Memory card detection device
TW201407171A (en) Electronic component testing and classification equipment
CN102439707A (en) System and processing of a substrate
JP2007024907A (en) Ic testing system
US6765378B2 (en) Test handler apparatus for SMD (surface mount devices), BGA (ball grid arrays) and CSP (chip scale packages)
CN216283313U (en) Detection device of antenna module
TWM637372U (en) Chip inspection device
CN212597209U (en) Automatic product label detection equipment
KR20090015938A (en) Electronic component testing apparatus
CN216869453U (en) Apron size outward appearance detector
CN215905421U (en) Be applied to automatic turn-over area NG of AOR support plate tool and deposit functional equipment
TWM497275U (en) Electronic component test equipment with multi-layer architecture
TWI324260B (en) Testing and classifying machine for use in memory ics
KR100270782B1 (en) Device for unloading semiconductor device according to grade in horizontal handler
CN216888631U (en) Feeding device
CN217213025U (en) Circuit board radio frequency test equipment
CN113770047B (en) Automatic turn-over area NG of many tools of cooperation AOR deposits function all-in-one
CN219728950U (en) Batch transfer tray frame for collecting pipes

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees