TWI561823B - Improved connecting apparatus and testing interface using the same - Google Patents

Improved connecting apparatus and testing interface using the same

Info

Publication number
TWI561823B
TWI561823B TW104129134A TW104129134A TWI561823B TW I561823 B TWI561823 B TW I561823B TW 104129134 A TW104129134 A TW 104129134A TW 104129134 A TW104129134 A TW 104129134A TW I561823 B TWI561823 B TW I561823B
Authority
TW
Taiwan
Prior art keywords
same
connecting apparatus
testing interface
improved connecting
improved
Prior art date
Application number
TW104129134A
Other languages
English (en)
Other versions
TW201710684A (zh
Inventor
Don-Lung Qui
Hung-Chan Lin
Original Assignee
King Yuan Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by King Yuan Electronics Co Ltd filed Critical King Yuan Electronics Co Ltd
Priority to TW104129134A priority Critical patent/TWI561823B/zh
Application granted granted Critical
Publication of TWI561823B publication Critical patent/TWI561823B/zh
Publication of TW201710684A publication Critical patent/TW201710684A/zh

Links

TW104129134A 2015-09-03 2015-09-03 Improved connecting apparatus and testing interface using the same TWI561823B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW104129134A TWI561823B (en) 2015-09-03 2015-09-03 Improved connecting apparatus and testing interface using the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW104129134A TWI561823B (en) 2015-09-03 2015-09-03 Improved connecting apparatus and testing interface using the same

Publications (2)

Publication Number Publication Date
TWI561823B true TWI561823B (en) 2016-12-11
TW201710684A TW201710684A (zh) 2017-03-16

Family

ID=58227292

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104129134A TWI561823B (en) 2015-09-03 2015-09-03 Improved connecting apparatus and testing interface using the same

Country Status (1)

Country Link
TW (1) TWI561823B (zh)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5663655A (en) * 1995-09-22 1997-09-02 Everett Charles Technologies, Inc. ESD protection for universal grid type test fixtures
US5818248A (en) * 1996-07-29 1998-10-06 Delaware Capital Formation, Inc Loaded board test fixture with integral translator fixture for testing closely spaced test sites
TWM240040U (en) * 2003-05-19 2004-08-01 Ching-Feng Shen Structure of two-section probe
CN202661566U (zh) * 2012-06-14 2013-01-09 东莞市新泽谷机械制造股份有限公司 一种电子元件引脚检测装置
TWM508148U (zh) * 2014-11-10 2015-09-01 Wistron Corp 電連接器及連接埠組合

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5663655A (en) * 1995-09-22 1997-09-02 Everett Charles Technologies, Inc. ESD protection for universal grid type test fixtures
US5818248A (en) * 1996-07-29 1998-10-06 Delaware Capital Formation, Inc Loaded board test fixture with integral translator fixture for testing closely spaced test sites
TWM240040U (en) * 2003-05-19 2004-08-01 Ching-Feng Shen Structure of two-section probe
CN202661566U (zh) * 2012-06-14 2013-01-09 东莞市新泽谷机械制造股份有限公司 一种电子元件引脚检测装置
TWM508148U (zh) * 2014-11-10 2015-09-01 Wistron Corp 電連接器及連接埠組合

Also Published As

Publication number Publication date
TW201710684A (zh) 2017-03-16

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