TWI559015B - Measurement fixture - Google Patents

Measurement fixture Download PDF

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TWI559015B
TWI559015B TW104142704A TW104142704A TWI559015B TW I559015 B TWI559015 B TW I559015B TW 104142704 A TW104142704 A TW 104142704A TW 104142704 A TW104142704 A TW 104142704A TW I559015 B TWI559015 B TW I559015B
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slot
processing unit
motherboard
connection end
measuring
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TW104142704A
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TW201723517A (en
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李延霖
黃勁勳
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技嘉科技股份有限公司
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Description

量測治具Measuring fixture

本發明係關於一種量測治具,特別是一種電子元件的量測治具。The present invention relates to a measuring jig, and more particularly to a measuring jig for an electronic component.

作為電子產品中的各種電子元件的溝通媒介,主機板上搭載有所述的多種電子元件,以提供使用者多樣化的功能。而為了因應不同的需求,對應電子產品因而需要不同等級或不同類型的運算效能。即使是同一類型的電子產品,廠商也會因客群的不同而推出不同系列的產品系列。As a communication medium for various electronic components in an electronic product, the plurality of electronic components described above are mounted on a motherboard to provide a user with diverse functions. In order to meet different needs, corresponding electronic products require different levels or different types of computing performance. Even for the same type of electronic products, manufacturers will launch different series of products depending on the customer base.

在以往的量測方式上,除了提供電源給主機板之外,還需要啟動主機板,例如啟動主機板的基本輸入輸出系統(basic input output system, BIOS),才能令主機板對量測治具輸出電流電壓以進行量測。但是啟動主機板需要不少的啟動時間,因此這樣的做法相當耗時,降低了測試過程的效率。In the past measurement method, in addition to providing power to the motherboard, it is also necessary to start the motherboard, for example, to start the basic input output system (BIOS) of the motherboard, in order to make the motherboard to measure the fixture. The current and voltage are output for measurement. However, starting the motherboard requires a lot of startup time, so this is quite time consuming and reduces the efficiency of the testing process.

本發明在於提供一種量測治具,以克服以往量測主機板時需要耗時啟動主機板的問題。The invention provides a measuring jig to overcome the problem that it takes time to start the main board when measuring the main board.

本發明提供了一種量測治具,適於插設於一主機板的一第一插槽。所述量測治具包含第一連接端、第二連接端與處理單元。第一連接端用以可插拔的插設於第一插槽。第二連接端用以可插拔的插設於第一插槽。處理單元電性連接第一連接端與第二連接端。當第一連接端或第二連接端插設於第一插槽時,處理單元用以透過第一插槽傳送控制信號至主機板的控制單元。The invention provides a measuring fixture suitable for being inserted into a first slot of a motherboard. The measuring fixture comprises a first connecting end, a second connecting end and a processing unit. The first connection end is inserted and inserted into the first slot. The second connecting end is inserted and inserted into the first slot. The processing unit is electrically connected to the first connection end and the second connection end. When the first connection end or the second connection end is inserted into the first slot, the processing unit is configured to transmit a control signal to the control unit of the motherboard through the first slot.

綜上所述,本發明提供了一種量測治具。當第一連接端或第二連接端插設於主機板的第一插槽時,處理單元用以透過第一插槽傳送控制信號至主機板的控制單元。藉此,在量測時可藉由本發明所提供的量測治具控制主機板的控制單元,從而控制主機板上的各元件作動以提供對應的電壓、電流或訊號。進而能在不用啟動主機板的情況下,對主機板進行量測。In summary, the present invention provides a measuring fixture. When the first connection end or the second connection end is inserted into the first slot of the motherboard, the processing unit is configured to transmit a control signal to the control unit of the motherboard through the first slot. Thereby, during the measurement, the control unit of the motherboard can be controlled by the measuring fixture provided by the invention, thereby controlling the operation of each component on the motherboard to provide a corresponding voltage, current or signal. In addition, the motherboard can be measured without starting the motherboard.

以上之關於本揭露內容之說明及以下之實施方式之說明係用以示範與解釋本發明之精神與原理,並且提供本發明之專利申請範圍更進一步之解釋。The above description of the disclosure and the following description of the embodiments of the present invention are intended to illustrate and explain the spirit and principles of the invention, and to provide further explanation of the scope of the invention.

以下在實施方式中詳細敘述本發明之詳細特徵以及優點,其內容足以使任何熟習相關技藝者了解本發明之技術內容並據以實施,且根據本說明書所揭露之內容、申請專利範圍及圖式,任何熟習相關技藝者可輕易地理解本發明相關之目的及優點。以下之實施例係進一步詳細說明本發明之觀點,但非以任何觀點限制本發明之範疇。The detailed features and advantages of the present invention are set forth in the Detailed Description of the Detailed Description of the <RTIgt; </ RTI> <RTIgt; </ RTI> </ RTI> </ RTI> <RTIgt; The objects and advantages associated with the present invention can be readily understood by those skilled in the art. The following examples are intended to describe the present invention in further detail, but are not intended to limit the scope of the invention.

請先參照圖1A、圖1B、圖2A與圖2B,圖1A係為根據本發明一實施例所繪示之量測治具的功能方塊圖,圖1B係為根據本發明圖1A所繪示之量測治具的立體示意圖,圖2A係為根據本發明另一實施例所繪示之量測治具的功能方塊圖,圖2B係為根據本發明圖2A所繪示之量測治具的立體示意圖。如圖所示,量測治具1000適於插設於主機板2000的第一插槽2200。量測治具1000包含第一連接端1200、第二連接端1400與處理單元1600。第一連接端1200用以可插拔的插設於第一插槽2200。第二連接端1400用以可插拔的插設於第一插槽2200’。處理單元1600電性連接第一連接端1200與第二連接端1400。主機板2000例如具有第一插槽2200、第二插槽2600、電子元件2400與控制單元2800。第一插槽2200或第一插槽2200’電性連接第二插槽2600與控制單元2800。1A, FIG. 1B, FIG. 2A and FIG. 2B, FIG. 1A is a functional block diagram of a measuring jig according to an embodiment of the present invention, and FIG. 1B is a diagram of FIG. 1A according to the present invention. FIG. 2A is a functional block diagram of a measuring jig according to another embodiment of the present invention, and FIG. 2B is a measuring jig according to FIG. 2A of the present invention. A three-dimensional diagram. As shown, the measurement jig 1000 is adapted to be inserted into the first slot 2200 of the motherboard 2000. The measuring fixture 1000 includes a first connecting end 1200, a second connecting end 1400 and a processing unit 1600. The first connection end 1200 is inserted into the first slot 2200 in a pluggable manner. The second connecting end 1400 is inserted into the first slot 2200'. The processing unit 1600 is electrically connected to the first connection end 1200 and the second connection end 1400. The motherboard 2000 has, for example, a first slot 2200, a second slot 2600, an electronic component 2400, and a control unit 2800. The first slot 2200 or the first slot 2200' is electrically connected to the second slot 2600 and the control unit 2800.

第一插槽2200或第一插槽2200’例如為外部連結標準(Peripheral Component Interconnect, PCI)的相關介面或快捷外部連結標準X1版本的相關介面(Peripheral Component Interconnect Express X1, PCI-E X1)。在一實施例中,第一連接端1200與第二連接端1400不相同。第一連接端1200與第二連接端1400例如分別為外部連結標準的相關介面或快捷外部連結標準X1版本的相關介面。第二插槽2600例如為中央處理器(central processing unit, CPU)的插槽。處理單元1600例如為微控制器(micro control unit, MCU)、專用集成電路(Application-specific integrated circuit, ASIC)或現場可程式化閘陣列(Field-programmable gate array, FPGA)。控制單元2800例如為主機板2000的南橋晶片或北橋晶片。電子元件2400例如為脈波寬度調變積體電路(pulse width modulation integrated circuit, PWM IC)或用以產生時脈信號或控制信號的相關電路。上述僅為舉例示範,然實際上並不以此為限。The first slot 2200 or the first slot 2200' is, for example, a related interface of a Peripheral Component Interconnect (PCI) or a related interface of a Fast External Link Standard X1 version (Peripheral Component Interconnect Express X1, PCI-E X1). In an embodiment, the first connection end 1200 is different from the second connection end 1400. The first connection end 1200 and the second connection end 1400 are respectively related interfaces of the external connection standard or related interfaces of the shortcut external connection standard X1 version. The second slot 2600 is, for example, a slot of a central processing unit (CPU). The processing unit 1600 is, for example, a micro control unit (MCU), an application-specific integrated circuit (ASIC), or a field-programmable gate array (FPGA). The control unit 2800 is, for example, a south bridge wafer or a north bridge wafer of the motherboard 2000. The electronic component 2400 is, for example, a pulse width modulation integrated circuit (PWM IC) or a correlation circuit for generating a clock signal or a control signal. The above is merely an example, but it is not limited to this.

後續將以第一插槽2200與第一連接端1200為外部連結標準的相關介面,以及第一插槽2200’、第二連接端1400為快捷外部連結標準X1版本的相關介面的實施例進行說明。換句話說,在圖1所對應的實施例中,第一插槽2200與第一連接端1200為外部連結標準的相關介面,量測治具1000係以第一插槽2200電性連接主機板2000。而在圖2所對應的實施例中,第一插槽2200’與第二連接端1400係為外部連結標準的相關介面,量測治具1000係以第二連接端1400電性連接主機板2000。The following describes an embodiment in which the first slot 2200 and the first connection end 1200 are related to the external connection standard, and the first slot 2200' and the second connection end 1400 are related interfaces of the shortcut external connection standard X1 version. . In other words, in the embodiment corresponding to FIG. 1, the first slot 2200 and the first connection end 1200 are related interfaces of the external connection standard, and the measurement fixture 1000 is electrically connected to the motherboard by the first slot 2200. 2000. In the embodiment corresponding to FIG. 2, the first slot 2200' and the second connecting end 1400 are related interfaces of the external connection standard, and the measuring fixture 1000 is electrically connected to the motherboard 2000 by the second connecting end 1400. .

當第一連接端1200插設於第一插槽2200時或第二連接端1400插設於第一插槽2200’時,處理單元1600用以經由第一插槽2200或第一插槽2200’傳送控制信號至主機板2000的控制單元2800,以指示控制單元2800控制主機板2000的其他元件。後續係以圖1A、圖1B對應的實施例進行說明。在一實施例中,處理單元1600係經由第一插槽2200指示控制單元2800控制主機板2000上的電子元件2400供電、提供時脈信號或提供控制信號給第二插槽2600。When the first connection end 1200 is inserted into the first slot 2200 or the second connection end 1400 is inserted into the first slot 2200 ′, the processing unit 1600 is configured to pass the first slot 2200 or the first slot 2200 ′. A control signal is transmitted to the control unit 2800 of the motherboard 2000 to instruct the control unit 2800 to control other components of the motherboard 2000. The subsequent description will be described with reference to the embodiments corresponding to FIGS. 1A and 1B. In an embodiment, the processing unit 1600 instructs the control unit 2800 to control the power supply of the electronic component 2400 on the motherboard 2000 via the first slot 2200, provide a clock signal, or provide a control signal to the second slot 2600.

在上述的架構下,第二插槽2600還可設置有另一類型的第二量測治具以量測第二插槽2600中的各接點上的電壓準位是否符合要求。因此,在另一實施例中,第一插槽2200係以主機板2000上的通道或者是以其他元件另外橋接的傳輸通道電性連接第二插槽2600。當量測治具1000指示控制單元2800控制主機板2000上的電子元件2400供電給第二插槽2600時,主機板2000上的第二量測治具量測得相關結果並經由第二插槽2600與前述的通道傳輸一回饋信號給第一插槽2200,使得量測治具1000經由第一插槽2200接收得回饋信號。前述的通道例如為系統管理匯流排(system management bus, SM bus),但並不以此為限。而於更一實施例中,量測治具1000更依據接收得的回饋信號產生關於第二插槽2600的量測結果。所述的量測結果例如指示第二插槽2600的相關線路是否有短路或斷路的情況發生,但並不以此為限。Under the above structure, the second slot 2600 can also be provided with another type of second measuring fixture to measure whether the voltage level on each of the contacts in the second slot 2600 meets the requirements. Therefore, in another embodiment, the first slot 2200 is electrically connected to the second slot 2600 by a channel on the motherboard 2000 or a transmission channel that is otherwise bridged by other components. The equivalent test fixture 1000 indicates that the control unit 2800 controls the electronic component 2400 on the motherboard 2000 to supply power to the second slot 2600, and the second amount of the test fixture on the motherboard 2000 measures the relevant result and passes through the second slot. The 2600 transmits a feedback signal to the first slot 2200 with the aforementioned channel, so that the measuring jig 1000 receives the feedback signal via the first slot 2200. The aforementioned channel is, for example, a system management bus (SM bus), but is not limited thereto. In a further embodiment, the measuring jig 1000 generates a measurement result about the second slot 2600 according to the received feedback signal. The measurement result indicates, for example, whether the relevant line of the second slot 2600 has a short circuit or an open circuit, but is not limited thereto.

此外,處理單元1600可依據收到的回饋信號進行更詳細的判斷。於一實施例中,處理單元1600更判讀相關針腳上的電壓準位的變化是否在可以忍受的範圍或標準,以判斷相關線路是否有異常。例如,處理單元1600可判讀相關針腳上的電壓準位是否大於一預設上限或小於一預設下限。或者,處理單元1600可判讀相關針腳上的電壓準位是否在一預設時間拉回所欲的電壓準位。甚或,處理單元1600可判讀相關針腳上在一預設時間內的平均電壓是否符合要求。事實上,對應於第二插槽2600所收到之信號的類型,例如脈波寬度調變信號或或直流電壓信號,處理單元1600係可進行對應的分析判斷。上述僅為舉例示範,在此並不限定處理單元1600如何依據相關針腳上的電壓準位進行判斷。In addition, the processing unit 1600 can make a more detailed determination according to the received feedback signal. In one embodiment, the processing unit 1600 further determines whether the change in the voltage level on the associated pin is within a tolerable range or standard to determine whether the associated line is abnormal. For example, the processing unit 1600 can determine whether the voltage level on the relevant pin is greater than a predetermined upper limit or less than a predetermined lower limit. Alternatively, the processing unit 1600 can determine whether the voltage level on the associated pin is pulled back to the desired voltage level for a predetermined time. Alternatively, the processing unit 1600 can determine whether the average voltage on the associated pin for a predetermined time meets the requirements. In fact, corresponding to the type of signal received by the second slot 2600, such as a pulse width modulation signal or a DC voltage signal, the processing unit 1600 can perform a corresponding analysis determination. The above is merely an example, and it is not limited herein how the processing unit 1600 determines based on the voltage level on the associated pin.

請接著參照圖3,圖3係為根據本發明更一實施例所繪示之量測治具的功能方塊圖。相較於圖1A、圖1B,於圖3所對應的實施例中,量測治具1000更具有儲存媒介1300。儲存媒介1300用以儲存如前述的回饋信號或者是量測結果。而儲存媒介1300例如是揮發性記憶體或非揮發性記憶體。當儲存媒介1300為非揮發性記憶體時,即使不提供電能給量測治具1000或不提供電能給儲存媒介1300,儲存媒介1300還是可以儲存有所述的回饋信號或量測結果。因此,在此實施例中,使用者可以將儲存媒介1300自量測治具1000上卸下,並以其他的測試設備對儲存媒介1300中所儲存的資料進行分析判斷。Please refer to FIG. 3, which is a functional block diagram of the measuring jig according to a further embodiment of the present invention. Compared with FIG. 1A and FIG. 1B , in the embodiment corresponding to FIG. 3 , the measuring jig 1000 further has a storage medium 1300 . The storage medium 1300 is used to store a feedback signal as described above or a measurement result. The storage medium 1300 is, for example, a volatile memory or a non-volatile memory. When the storage medium 1300 is a non-volatile memory, the storage medium 1300 can store the feedback signal or the measurement result even if no power is supplied to the measuring fixture 1000 or no power is supplied to the storage medium 1300. Therefore, in this embodiment, the user can remove the storage medium 1300 from the measuring fixture 1000, and analyze and judge the data stored in the storage medium 1300 by using other testing devices.

請接著參照圖4,圖4係為根據本發明再一實施例所繪示之量測治具的功能方塊圖。相較於圖1A、圖1B,於圖4所對應的實施例中,量測治具1000更具有控制連接端1800。控制連接端1800用以可插拔地電性連接電腦3000。量測治具1000可藉由控制連接端1800而自電腦3000接收控制信號。或者,量測治具1000亦可藉由控制連接端1800將接收得的回饋信號或所產生的量測結果傳輸給電腦3000。使用者因而得以使用電腦指示量測治具1000以傳輸指令給主機板2000,或者使用者亦可使用電腦對自量測治具1000取得的回饋信號或量測結果進行處理。控制連接端1800例如為各個版本的通用串列匯流排(universal serial bus, USB)、RJ45網路傳輸介面,甚或是藍芽(bluetooth, BT)、無線保真(wireless fidelity, WIFI)或第二代以至於第四代(2 nd, 3 rd, 4 thgeneration, 2G, 3G, 4G)的無線傳輸技術等的相關無線傳輸介面。電腦3000亦可以是任何具有運算功能的計算機設備。上述僅為舉例示範,實際上並不以此為限。 Referring to FIG. 4, FIG. 4 is a functional block diagram of a measuring jig according to still another embodiment of the present invention. Compared with FIG. 1A and FIG. 1B , in the embodiment corresponding to FIG. 4 , the measuring jig 1000 further has a control connection end 1800 . The control connector 1800 is configured to be electrically connected to the computer 3000 in a pluggable manner. The measurement fixture 1000 can receive a control signal from the computer 3000 by controlling the connection terminal 1800. Alternatively, the measuring fixture 1000 can transmit the received feedback signal or the generated measurement result to the computer 3000 by the control connection 1800. The user can then use the computer to instruct the measuring jig 1000 to transmit instructions to the motherboard 2000, or the user can use the computer to process the feedback signal or measurement result obtained by the self-measuring jig 1000. The control connection 1800 is, for example, a universal serial bus (USB), an RJ45 network transmission interface, or even a bluetooth (BT), a wireless fidelity (WIFI) or a second. It is equivalent to the wireless transmission technology of the fourth generation (2 nd , 3 rd , 4 th generation, 2G, 3G, 4G) wireless transmission technology. The computer 3000 can also be any computer device with computing functions. The above is merely an example and is not limited to this.

請接著參照圖5,圖5係為根據本發明又一實施例所繪示之量測治具的功能方塊圖。較於圖1A、圖1B,於圖4所對應的實施例中,量測治具1000更具有電源連接端1900。電源連接端1900用以可插拔地電性連接電源供應器4000。在一實施例中,量測治具1000係藉由電源連接端1900而自電源供應器4000取得交流電能。而於另一實施例中,量測治具1000係藉由電源連接端1900而自電源供應器4000取得直流電能。量測治具1000的相關供電規格係為所屬技術領域舉有通常知識者經詳閱本說明書後能依實際所需而自由規劃,在此並不加以限制。而於另一實施例中,當量測治具1000並不具有電源連接端1900時,量測治具1000亦可經由第一插槽2200而自主機板2000取得所需的電能。Referring to FIG. 5, FIG. 5 is a functional block diagram of a measuring jig according to still another embodiment of the present invention. Compared with FIG. 1A and FIG. 1B , in the embodiment corresponding to FIG. 4 , the measuring jig 1000 further has a power connection end 1900 . The power connection terminal 1900 is configured to be electrically connected to the power supply 4000 in a pluggable manner. In one embodiment, the measurement fixture 1000 draws AC power from the power supply 4000 via the power connection 1900. In another embodiment, the measuring fixture 1000 obtains DC power from the power supply 4000 by the power connection terminal 1900. The relevant power supply specifications of the measuring jig 1000 are those of ordinary skill in the art, and can be freely planned according to actual needs after reading the present specification, and are not limited herein. In another embodiment, when the equivalent jig 1000 does not have the power connection end 1900, the measuring jig 1000 can also obtain the required electric energy from the main board 2000 via the first slot 2200.

綜上所述,本發明提供了一種量測治具。所述的量測治具藉由第一連接端或第二連接端插設於主機板的第一插槽,量測治具的處理單元用以透過第一插槽傳送控制信號至主機板的控制單元。藉此,在量測時可藉由本發明所提供的量測治具控制主機板的控制單元,從而控制主機板上的各元件作動以提供對應的電壓、電流或訊號。進而能在不用啟動主機板的情況下,對主機板進行量測。這樣的做法,不但提升了量測的速度,縮短了人工檢測的時間,更還降低了人為的誤判所造成的損失,並提高了檢測精準度而連帶提升產品的品質,避免因為檢測誤判而造成成本的上升。In summary, the present invention provides a measuring fixture. The measuring fixture is inserted into the first slot of the motherboard through the first connecting end or the second connecting end, and the processing unit of the measuring fixture transmits the control signal to the motherboard through the first slot. control unit. Thereby, during the measurement, the control unit of the motherboard can be controlled by the measuring fixture provided by the invention, thereby controlling the operation of each component on the motherboard to provide a corresponding voltage, current or signal. In addition, the motherboard can be measured without starting the motherboard. This approach not only improves the speed of measurement, shortens the time of manual detection, but also reduces the loss caused by human error, and improves the accuracy of detection and improves the quality of products, avoiding the detection of misjudgment. The cost rises.

雖然本發明以前述之實施例揭露如上,然其並非用以限定本發明。在不脫離本發明之精神和範圍內,所為之更動與潤飾,均屬本發明之專利保護範圍。關於本發明所界定之保護範圍請參考所附之申請專利範圍。Although the present invention has been disclosed above in the foregoing embodiments, it is not intended to limit the invention. It is within the scope of the invention to be modified and modified without departing from the spirit and scope of the invention. Please refer to the attached patent application for the scope of protection defined by the present invention.

1000‧‧‧量測治具
1200‧‧‧第一連接端
1300‧‧‧儲存媒介
1400‧‧‧第二連接端
1600‧‧‧處理單元
1800‧‧‧控制連接端
1900‧‧‧電源連接端
2000、2000’‧‧‧主機板
2200、2200’‧‧‧第一插槽
2400‧‧‧電子元件
2600‧‧‧第二插槽
2800‧‧‧控制單元
3000‧‧‧電腦
4000‧‧‧電源供應器
1000‧‧‧Measurement fixture
1200‧‧‧ first connection
1300‧‧‧Storage medium
1400‧‧‧second connection
1600‧‧‧Processing unit
1800‧‧‧Control connection
1900‧‧‧Power connection
2000, 2000 '‧‧‧ motherboard
2200, 2200'‧‧‧ first slot
2400‧‧‧Electronic components
2600‧‧‧second slot
2800‧‧‧Control unit
3000‧‧‧ computer
4000‧‧‧Power supply

圖1A係為根據本發明一實施例所繪示之量測治具的功能方塊圖。 圖1B係為根據本發明圖1A所繪示之量測治具的立體示意圖。 圖2A係為根據本發明另一實施例所繪示之量測治具的功能方塊圖。 圖2B係為根據本發明圖2A所繪示之量測治具的立體示意圖。 圖3係為根據本發明更一實施例所繪示之量測治具的功能方塊圖。 圖4係為根據本發明再一實施例所繪示之量測治具的功能方塊圖。 圖5係為根據本發明又一實施例所繪示之量測治具的功能方塊圖。FIG. 1A is a functional block diagram of a measuring jig according to an embodiment of the invention. FIG. 1B is a perspective view of the measuring jig shown in FIG. 1A according to the present invention. 2A is a functional block diagram of a measuring jig according to another embodiment of the present invention. 2B is a perspective view of the measuring jig shown in FIG. 2A according to the present invention. 3 is a functional block diagram of a measuring jig according to a further embodiment of the present invention. FIG. 4 is a functional block diagram of a measuring jig according to still another embodiment of the present invention. FIG. 5 is a functional block diagram of a measuring jig according to still another embodiment of the present invention.

1000‧‧‧量測治具 1000‧‧‧Measurement fixture

1200‧‧‧第一連接端 1200‧‧‧ first connection

1400‧‧‧第二連接端 1400‧‧‧second connection

1600‧‧‧處理單元 1600‧‧‧Processing unit

2000‧‧‧主機板 2000‧‧‧ motherboard

2200‧‧‧第一插槽 2200‧‧‧first slot

2400‧‧‧電子元件 2400‧‧‧Electronic components

2600‧‧‧第二插槽 2600‧‧‧second slot

2800‧‧‧控制單元 2800‧‧‧Control unit

Claims (9)

一種量測治具,適於插設於一主機板的一第一插槽,所述量測治具包含:一第一連接端,用以可插拔的插設於該第一插槽;一第二連接端,用以可插拔的插設於該第一插槽;以及一處理單元,電性連接該第一連接端與該第二連接端,當該第一連接端或該第二連接端插設於該第一插槽時,該處理單元用以透過該第一插槽傳送一控制信號至該主機板的一控制單元;其中,該處理單元更透過該第一插槽接收來自該主機板的一第二插槽的一回饋信號。 The measuring fixture is adapted to be inserted into a first slot of a motherboard, and the measuring fixture comprises: a first connecting end, wherein the first connecting end is inserted and inserted into the first slot; a second connection end for plugging and unplugging into the first slot; and a processing unit electrically connecting the first connection end and the second connection end, when the first connection end or the first When the second terminal is inserted into the first slot, the processing unit transmits a control signal to a control unit of the motherboard through the first slot; wherein the processing unit receives the first slot through the first slot A feedback signal from a second slot of the motherboard. 如第1項所述的量測治具,更包含一儲存媒介,電性連接該處理單元,用以儲存該回饋信號。 The measuring fixture of the first aspect further includes a storage medium electrically connected to the processing unit for storing the feedback signal. 如第1項所述的量測治具,其中該處理單元更依據該控制信號與該回饋信號,產生關於該第二插槽的一量測結果。 The measuring fixture of the first aspect, wherein the processing unit generates a measurement result about the second slot according to the control signal and the feedback signal. 如第3項所述的量測治具,更包含一儲存媒介,電性連接該處理單元,用以儲存該回饋信號或該量測結果。 The measuring fixture of the third aspect further includes a storage medium electrically connected to the processing unit for storing the feedback signal or the measurement result. 如第1項所述的量測治具,其中該第一連接端的格式與該第二連接端的格式不同。 The measuring jig of item 1, wherein the format of the first connection end is different from the format of the second connection end. 如第1項所述的量測治具,更包含一控制連接端,電性連接該處理單元,用以可插拔的連接於一電腦。 The measuring fixture of the first aspect further includes a control connector electrically connected to the processing unit for pluggable connection to a computer. 如第6項所述的量測治具,該處理單元更透過該控制連接端從該電 腦取得電能。 The measuring jig according to item 6, wherein the processing unit further transmits the electric power from the control terminal The brain gets electrical energy. 如第1項所述的量測治具,該處理單元更透過該第一插槽從該主機板取得電能。 The measuring fixture of item 1, wherein the processing unit further obtains electrical energy from the motherboard through the first slot. 如第1項所述的量測治具,更包含一電源連接端,用以可插拔的連接於一電源供應器。 The measuring fixture of the first aspect further includes a power connection end for pluggable connection to a power supply.
TW104142704A 2015-12-18 2015-12-18 Measurement fixture TWI559015B (en)

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Citations (5)

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Publication number Priority date Publication date Assignee Title
TW201109913A (en) * 2009-09-02 2011-03-16 Inventec Corp Main system board error-detecting system and its pluggable error-detecting board
TWM410221U (en) * 2010-12-22 2011-08-21 Elitegroup Computer Sys Co Ltd Testing device
TWM468671U (en) * 2013-08-28 2013-12-21 Giga Byte Tech Co Ltd Measure socket
TW201415045A (en) * 2012-10-05 2014-04-16 Giga Byte Tech Co Ltd Detecting system for detecting circuit board and leakage current detecting method
TW201508295A (en) * 2013-08-22 2015-03-01 Hon Hai Prec Ind Co Ltd System and method of detecting jump state

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201109913A (en) * 2009-09-02 2011-03-16 Inventec Corp Main system board error-detecting system and its pluggable error-detecting board
TWM410221U (en) * 2010-12-22 2011-08-21 Elitegroup Computer Sys Co Ltd Testing device
TW201415045A (en) * 2012-10-05 2014-04-16 Giga Byte Tech Co Ltd Detecting system for detecting circuit board and leakage current detecting method
TW201508295A (en) * 2013-08-22 2015-03-01 Hon Hai Prec Ind Co Ltd System and method of detecting jump state
TWM468671U (en) * 2013-08-28 2013-12-21 Giga Byte Tech Co Ltd Measure socket

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