TW201415045A - Detecting system for detecting circuit board and leakage current detecting method - Google Patents

Detecting system for detecting circuit board and leakage current detecting method Download PDF

Info

Publication number
TW201415045A
TW201415045A TW101136978A TW101136978A TW201415045A TW 201415045 A TW201415045 A TW 201415045A TW 101136978 A TW101136978 A TW 101136978A TW 101136978 A TW101136978 A TW 101136978A TW 201415045 A TW201415045 A TW 201415045A
Authority
TW
Taiwan
Prior art keywords
test
circuit board
tested
controller
power
Prior art date
Application number
TW101136978A
Other languages
Chinese (zh)
Other versions
TWI459003B (en
Inventor
Hsien-Mi Meug
Wu-Hsiung Sun
Chu-Hsiang Liao
Chi-Lin Chang
Chih-Hung Huang
Original Assignee
Giga Byte Tech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Giga Byte Tech Co Ltd filed Critical Giga Byte Tech Co Ltd
Priority to TW101136978A priority Critical patent/TWI459003B/en
Publication of TW201415045A publication Critical patent/TW201415045A/en
Application granted granted Critical
Publication of TWI459003B publication Critical patent/TWI459003B/en

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)

Abstract

A detecting system is used to perform a leakage current detecting method for detecting leakage current of a circuit board. The method includes placing the circuit board into a detection carrier; providing a DC power to the circuit board, so as to perform power-on test on the circuit board; cutting off the DC power to the circuit, so as to turn off the circuit board; through a leakage current pin, retrieving voltage of leakage current of the circuit board; and determining whether the circuit board passes the leakage current through the voltage of leakage current.

Description

用於測試電路板之測試系統及漏電流測試方法 Test system and leakage current test method for testing circuit boards

本發明係關於一種電路板之漏電流的量測,特別是一種用於測試電路板之測試系統及一種漏電流測試方法。 The invention relates to a measurement of leakage current of a circuit board, in particular to a test system for testing a circuit board and a leakage current test method.

先前技術中,主機板必須經過供電測試、板彎測試、主機板之電池的電壓測試以及漏電流的電壓測試。供電測試係對主機板進行供電開機,並接收主機板訊號輸出埠或特定偵測接點的訊號輸出,判斷電路板是否可正常工作。對於主機板之電池的電壓測試、主機板漏電流的量測,必須在對主機板停止供電,於主機板斷電的狀態下量測。前述量測主要係透過量測治具固定主機板,量測治具透過探針、電連接器等裝置,與主機板的特定接點產生電性連接,進而供外部量測設備,例如電壓計取得前述特定接點的電壓值,以供測試人員透過該些電壓值判斷主機板的漏電流狀況是否位達到容許標準。 In the prior art, the motherboard must undergo a power test, a plate bend test, a voltage test of the battery of the motherboard, and a voltage test of the leakage current. The power supply test system powers on the motherboard, and receives the signal output of the motherboard signal output or the specific detection contact to determine whether the circuit board can work normally. For the voltage test of the battery of the motherboard and the measurement of the leakage current of the motherboard, it is necessary to stop the power supply to the motherboard and measure the power of the motherboard. The above measurement mainly uses a measuring fixture to fix the motherboard, and the measuring fixture is electrically connected to a specific contact of the motherboard through a probe, an electrical connector, etc., and is then supplied to an external measuring device, such as a voltmeter. The voltage value of the specific contact is obtained for the tester to judge whether the leakage current condition of the motherboard reaches the allowable standard through the voltage values.

供電測試、板彎測試、主機板之電池的電壓測試以及漏電流的測試,通常在不同站台進行測試,而需要多個人力的配合才能完成測試作業。例如,供電測試必須在供應電力之主機板的情況下測試,而主機板之電池的電壓測試以及漏電流的測試,又必須在主機板斷電的情況下測試,因此通常在不同站台下測試,而板彎測試因為與主機板的電源狀態無關,而可整合於該些測試步驟其中之一。此外,各項測試結果的判斷、記錄,主要係透過人力達成。在大量批次化測試主機板的過程中,測試的正確性仰賴人 力判讀的正確性。因此,主機板不良率也無法即時更新,僅能在每一批次後進行統計。若要分析供電測試成敗、漏電流大小、電池電壓大小的分佈,則更需要進一步的人力逐一記錄每一主機板的測試結果,而導致測試效率不佳。若同時測試主機板的部分缺陷,例如BIOS電池之端電壓、板彎曲程度,則有更多數據需要記錄及統計,則會更耗費人力,使得精確的數據分析往往被忽略,僅單純的統計不良率。 The power supply test, the plate bend test, the voltage test of the battery of the motherboard, and the leakage current test are usually performed at different stations, and multiple manpower is required to complete the test operation. For example, the power supply test must be tested in the case of a motherboard that supplies power, and the voltage test and leakage current test of the battery of the motherboard must be tested in the case of a power failure of the motherboard, so it is usually tested at different platforms. The plate bending test can be integrated into one of the test steps because it is independent of the power state of the motherboard. In addition, the judgment and record of each test result is mainly achieved through manpower. In the process of batch testing the motherboard, the correctness of the test depends on people. The correctness of the power interpretation. Therefore, the motherboard defect rate cannot be updated in real time, and statistics can only be performed after each batch. To analyze the success or failure of the power supply test, the leakage current, and the distribution of the battery voltage, it is necessary to further record the test results of each motherboard one by one, resulting in poor test efficiency. If you test some defects of the motherboard at the same time, such as the voltage of the BIOS battery and the degree of bending of the board, there is more data to be recorded and counted, which is more labor-intensive, so that accurate data analysis is often ignored, and only the statistical bad rate is simple. .

此外,不同的主機板有不同的漏電流容許標準。在以人力判讀的情況下,容易發生人員以錯誤的容許標準,判讀漏電流電壓值,從而發生測試結果錯誤的問題。 In addition, different motherboards have different leakage current tolerance standards. In the case of human intervention, it is easy for a person to interpret the leakage current voltage value with a wrong tolerance standard, and thus the problem of the test result is wrong.

鑒於以上的問題,本發明在於提供一種用於測試電路板之測試系統及一種供電測試及漏電流測試方法,藉以解決習用技術中,電路板之測試的效率差且不易統計記錄的問題。 In view of the above problems, the present invention provides a test system for testing a circuit board and a power supply test and a leakage current test method, thereby solving the problem that the test of the circuit board is inefficient and difficult to statistically record in the conventional technology.

本發明之用於測試電路板之測試系統,用以對一待測電路板進行供電測試,並進一步測試該待測電路板之漏電流。待測電路板至少包含一BIOS程式碼儲存單元、一BIOS設定值暫存單元、一電池、一主功能電路及一待機電源輸入端,該待機電源輸入端用以取得一待機電力。 The test system for testing a circuit board of the present invention is used for power supply testing of a circuit board to be tested, and further testing the leakage current of the circuit board to be tested. The circuit board to be tested includes at least a BIOS code storage unit, a BIOS set value temporary storage unit, a battery, a main function circuit and a standby power input terminal for obtaining a standby power.

測試系統包含一測試載具及一測試電路。測試載具用以容置待測試電路板,並與待測電路板建立電性連接。測試電路包含一記憶模組、一控制器、一控制腳位總成及一偵測腳位總成。 The test system includes a test vehicle and a test circuit. The test carrier is used to accommodate the circuit board to be tested and establish an electrical connection with the circuit board to be tested. The test circuit includes a memory module, a controller, a control pin assembly and a detection pin assembly.

記憶模組用以儲存程式碼,並暫存各項測試結果及測試設定 值。控制器用以載入並執行程式碼,而執行一測試作業;控制器並於接收測試結果後,將測試結果寫入記憶模組。控制腳位總成至少包含一電力輸入節點及一待機電壓輸入節點,分別連接於控制器。電力輸入節點用以接收電力輸入,以驅動測試電路,待機電壓輸入節點連接於待機電源輸入端,使控制器判別待測電路板是否為關機狀態。偵測腳位總成至少包含一漏電流電壓腳位,連接於待機電源輸入端;控制器透過漏電流電壓腳位判斷待測電路板於關機狀態下是否通過漏電流測試,而產生一漏電流警示。 The memory module is used to store the code and temporarily store various test results and test settings. value. The controller is used to load and execute the code, and performs a test operation; after receiving the test result, the controller writes the test result to the memory module. The control pin assembly includes at least one power input node and a standby voltage input node, which are respectively connected to the controller. The power input node is configured to receive the power input to drive the test circuit, and the standby voltage input node is connected to the standby power input end, so that the controller determines whether the circuit board to be tested is in a shutdown state. The detecting pin assembly includes at least one leakage current voltage pin connected to the standby power input end; the controller determines whether the circuit under test passes the leakage current test in the shutdown state through the leakage current voltage pin, and generates a leakage current. Warning.

測試電路可依序對待測電路板進行供電測試及漏電流測試,並可進一步透過額外的接腳及測試載具的功能擴充,而進一步量測電池之電壓量測及板彎測試,而將電路板所需的測試作業集中於單一站台,並快速收集各項測試數據。因此,本發明測試系統精簡了完成各項測試所需要的站台,而精簡了人力。 The test circuit can sequentially perform the power supply test and the leakage current test on the test board, and further expand the voltage measurement and the plate bend test of the battery through the additional pin and the function expansion of the test carrier, and the circuit The test operations required for the board are concentrated on a single station and the test data is quickly collected. Therefore, the test system of the present invention streamlines the platform required to complete each test, and streamlines the manpower.

本發明進一步提供一種供電測試及漏電流測試方法,用以測試一待測電路板之漏電流。待測電路板至少包含一BIOS程式碼儲存單元、一BIOS設定值暫存單元、一電池、一主功能電路及一待機電源輸入端,待機電源輸入端用以取得一待機電力。 The invention further provides a power supply test and a leakage current test method for testing a leakage current of a circuit board to be tested. The circuit board to be tested includes at least a BIOS code storage unit, a BIOS set value temporary storage unit, a battery, a main function circuit and a standby power input terminal, and the standby power input terminal is used to obtain a standby power.

漏電流測試方法包含:放置待測電路板於一測試載具中;提供一直流電力至待測電路板,以對待測電路板進行供電測試,而藉以待測電路板的於開機後的功能時序是否正常,而判斷待測電路板是否可以正確工作;中斷對待測電路板供應之直流電力,使待測電路板進行關機;透過一漏電流電壓腳位取得待測電路板之漏電流的電壓值;及依據電壓值,判斷待測電路板於關機狀態下 是否會產生漏電流。 The leakage current test method includes: placing the circuit board to be tested in a test vehicle; providing a constant current power to the circuit board to be tested, performing power supply test on the circuit board to be tested, and thereby performing functional timing of the circuit board to be tested after power on Whether it is normal, and judge whether the circuit board to be tested can work correctly; interrupt the DC power supplied by the circuit board to be tested, and shut down the circuit board to be tested; obtain the voltage value of the leakage current of the circuit board to be tested through a leakage current voltage pin. And according to the voltage value, determine that the circuit board to be tested is in the off state Whether leakage current will occur.

本發明之功效在於,透過上述的測試系統及漏電流測試方法,係可驅動電測電路板自動地進行開關機測試,接著由測試系統自動測試漏電流,並將測試結果寫入記憶模組中。透過對記憶模組中的記錄進行擷取,例如由控制器將其進一步傳送至後台,以批次記錄並分析多個待測電路板的供電測試結果及漏電流測試,而不需以人工逐一判斷。此外,透過程式碼的改寫,並變更偵測腳位總成的配置,本測試系統迅速改變其測試對象,並可進一步測試待測電路板的其他缺陷,例如BIOS之電池的端電壓、待測電路板的板彎曲度等。透過單一測試系統及測試順序的安排,本發明可於單一站台依序完成供電測試、漏電流量測、電池的端電壓、待測電路板的板彎曲度等工作,從而減少測試電路板所需人力。 The effect of the invention is that, through the above test system and leakage current test method, the electrical test circuit board can be driven to automatically perform the switch test, and then the test system automatically tests the leakage current and writes the test result into the memory module. . By extracting the records in the memory module, for example, the controller further transmits it to the background, and records and analyzes the power supply test results and the leakage current test of the plurality of circuit boards to be tested in batches, without manual one by one. Judge. In addition, through the rewriting of the code and changing the configuration of the detection pin assembly, the test system quickly changes its test object, and can further test other defects of the circuit board to be tested, such as the battery terminal voltage of the BIOS, to be tested. Board bending of the board, etc. Through a single test system and test sequence arrangement, the present invention can sequentially complete power supply test, leakage current measurement, battery terminal voltage, board bending of the board to be tested, etc. in a single station, thereby reducing the need for test circuit boards. Manpower.

有關本發明的特徵、實作與功效,茲配合圖式作最佳實施例詳細說明如下。 The features, implementations, and utilities of the present invention are described in detail below with reference to the drawings.

請參閱「第1圖」所示,為本發明實施例所揭露之一種用於測試電路板之測試系統,用以進行供電測試、板彎測試、主機板之電池的電壓測試以及漏電流的電壓測試。測試系統包含一測試電路100、一測試載具300及一工作站台400。測試系統用以測試一待測電路板200之漏電流。 Please refer to FIG. 1 , which is a test system for testing a circuit board according to an embodiment of the present invention, for performing power supply test, plate bending test, battery voltage test of main board, and leakage current voltage. test. The test system includes a test circuit 100, a test carrier 300, and a workstation station 400. The test system is used to test the leakage current of a circuit board 200 to be tested.

如「第2圖」所示,待測電路板200至少包含一基本輸入輸出系統210(BIOS 210)。BIOS 210包含一BIOS程式碼儲存單元 211、BIOS設定值暫存單元212、一電池213、一主功能電路220及一待機電源輸入端STB。BIOS程式碼儲存單元211用以儲存BIOS程式碼、BIOS設定值暫存單元212用以暫存該待測電路板200之各項設定值,電池213用以供應電力至BIOS設定值暫存單元212,以維持該BIOS設定值暫存單元212之設定。待機電源輸入端STB用以自一電源供應模組230取得一待機電力,以使該待測電路板200維持待機狀態(Standby Mode),而可隨時被喚醒而回復至進入待機狀態前之狀態。 As shown in "Fig. 2", the circuit board 200 to be tested includes at least a basic input/output system 210 (BIOS 210). BIOS 210 includes a BIOS code storage unit 211. The BIOS set value temporary storage unit 212, a battery 213, a main function circuit 220, and a standby power input terminal STB. The BIOS code storage unit 211 is configured to store the BIOS code, the BIOS setting value temporary storage unit 212 for temporarily storing the setting values of the circuit board 200 to be tested, and the battery 213 for supplying power to the BIOS setting value temporary storage unit 212. To maintain the setting of the BIOS setting value temporary storage unit 212. The standby power input terminal STB is configured to obtain a standby power from a power supply module 230 to maintain the standby circuit board 200 in a standby mode (Standby Mode), and can be awake at any time to return to the state before entering the standby state.

如「第1圖」所示,測試載具300容置待測電路板200,並與待測電路板200建立電性連接,以供應電力至待測電路板200。前述之電源供應模組230係設置於測試載具300中,且測試載具300係可供應一交流電力AC至電源供應模組230,使電源供應模組230產生一直流電力DC,傳輸至該待測電路板200。 As shown in FIG. 1 , the test carrier 300 houses the circuit board 200 to be tested and establishes an electrical connection with the circuit board 200 to be tested to supply power to the circuit board 200 to be tested. The power supply module 230 is disposed in the test carrier 300, and the test carrier 300 can supply an AC power AC to the power supply module 230, so that the power supply module 230 generates a DC power to be transmitted to the power supply module 230. The circuit board 200 to be tested.

如「第3圖」所示,用於測試電路板之測試電路100包含一記憶模組110、一控制器120、一控制腳位總成130、一偵測腳位總成140、一第一資料傳輸介面150、一第二資料傳輸介面160、一電力輸入端口171、一電源開關按鈕172、一電源指示燈173、一重置按鈕181、一啟動按鈕182及一模式切換開關190。前述之測試電路100係可整合於單一印刷電路板上,亦可分散於複數個印刷電路板。 As shown in FIG. 3, the test circuit 100 for testing a circuit board includes a memory module 110, a controller 120, a control pin assembly 130, a detection pin assembly 140, and a first The data transmission interface 150, a second data transmission interface 160, a power input port 171, a power switch button 172, a power indicator light 173, a reset button 181, a start button 182, and a mode switch 190. The aforementioned test circuit 100 can be integrated on a single printed circuit board or distributed on a plurality of printed circuit boards.

如「第3圖」所示,記憶模組110用以儲存程式碼,例如韌體程式。記憶模組110並暫存測試結果及測試設定值。記憶模組110具體實施方式可為非揮發式記憶體模組(如快閃記憶體),儲 存前述之程式碼,且可在斷電後仍持續儲存測試設定值及測試結果。記憶模組110之另一具體實施方式為可讀寫可程式為讀記憶體(EPROM)及隨機存取記憶體(RAM)之結合;其中,EPROM用以儲存程式碼,RAM用以在測試電路100通電的情況下暫存測試設定值及測試結果。 As shown in FIG. 3, the memory module 110 is used to store code, such as a firmware program. The memory module 110 temporarily stores the test result and the test set value. The specific implementation of the memory module 110 can be a non-volatile memory module (such as a flash memory), The above code is stored, and the test set value and test result can be continuously stored after the power is turned off. Another embodiment of the memory module 110 is a combination of readable and writable programmable memory (EPROM) and random access memory (RAM); wherein the EPROM is used to store the code, and the RAM is used in the test circuit. When 100 is energized, the test set value and test result are temporarily stored.

如「第3圖」所示,控制器120電性連接於記憶模組110。控制器120用以自記憶模組110載入並執行程式碼,而執行一測試作業。控制器120於接收測試結果後,將測試結果寫入該記憶模組110中用以暫存。此外,控制器120並以一指定之通訊協定輸出測試結果。 As shown in FIG. 3, the controller 120 is electrically connected to the memory module 110. The controller 120 is configured to load and execute the code from the memory module 110 to perform a test operation. After receiving the test result, the controller 120 writes the test result into the memory module 110 for temporary storage. In addition, controller 120 outputs test results in a specified communication protocol.

電力輸入端口171連接於控制器120,用以輸入一電力,使得測試電路100以自有電力運行,而不需外加電力。於一具體實施例中,電力輸入端口171可為一USB埠,但USB埠僅有5V腳位及接地腳位致能,使得電力輸入端口171可以透過一變壓器取得電力,亦可透過工作站台400或測試載具300取得電力。電源開關按鈕172連接於控制器120,用以產生一觸發訊號,藉以啟動或關閉測試電路100。此外,電源指示燈173電性連接於控制器120,於測試電路100運作時,控制器120致能電源指示燈173,以顯示測試電路100之電源為開啟。而測試電路100之電力關閉時,則控制器120停止致能電源指示燈173。 The power input port 171 is connected to the controller 120 for inputting a power such that the test circuit 100 operates with its own power without additional power. In one embodiment, the power input port 171 can be a USB port, but the USB port only has a 5V pin and a ground pin enable, so that the power input port 171 can obtain power through a transformer, and can also pass through the workstation 400. Or test vehicle 300 to obtain power. The power switch button 172 is coupled to the controller 120 for generating a trigger signal for enabling or disabling the test circuit 100. In addition, the power indicator 173 is electrically connected to the controller 120. When the test circuit 100 is in operation, the controller 120 enables the power indicator 173 to indicate that the power of the test circuit 100 is on. When the power of the test circuit 100 is turned off, the controller 120 stops the enable power indicator 173.

再如「第3圖」所示,重置按鈕181電性連接於控制器120,用以產生一重置訊號,使控制器120進行重置。 As shown in FIG. 3, the reset button 181 is electrically connected to the controller 120 for generating a reset signal for causing the controller 120 to reset.

如「第3圖」及「第4圖」所示,控制腳位總成130至少包 含一電力輸入節點131及一待機電壓輸入節點132,分別連接於控制器120。電力輸入節點131用以接收電力輸入,例如5V Vcc電力,以驅動測試電路100進行運作。待機電壓輸入節點132直接或間接地連接於待測電路板200之待機電源輸入端STB,且控制器120連接於待機電壓輸入節點132;藉由待機電壓的有無(例如5V Standby電壓),控制器120判斷該電源供應模組230是否持續傳送電力至該待測電路板200,藉以判別待測電路板200是否已經關機。 As shown in "Figure 3" and "Figure 4", the control pin assembly 130 is at least included. A power input node 131 and a standby voltage input node 132 are respectively connected to the controller 120. The power input node 131 is configured to receive a power input, such as 5V Vcc power, to drive the test circuit 100 to operate. The standby voltage input node 132 is directly or indirectly connected to the standby power input terminal STB of the circuit board 200 to be tested, and the controller 120 is connected to the standby voltage input node 132; by the presence or absence of the standby voltage (for example, 5V Standby voltage), the controller 120 determines whether the power supply module 230 continuously transmits power to the circuit board 200 to be tested, thereby determining whether the circuit board 200 to be tested has been shut down.

如「第1圖」、「第3圖」及「第4圖」所示,測試載具300更包含一蓋開偵測器310,用以偵測測試載具300的蓋子是否開啟,並於蓋子開啟時產生一蓋開訊號。控制腳位總成130更包含一蓋開訊號輸入端133,電性連接於控制器120。蓋開訊號輸入端用以自蓋開偵測器310接收該蓋開訊號,並傳送至控制器120,藉以使該控制器120判斷測試載具300的蓋子為開啟或是閉合,且該控制器120僅於蓋子閉合時執行測試作業,亦即,該測試作業係於該控制器120接收蓋開訊號時中斷。 As shown in FIG. 1 , FIG. 3 and FIG. 4 , the test vehicle 300 further includes a cover detector 310 for detecting whether the cover of the test carrier 300 is turned on and A cover signal is generated when the cover is opened. The control pin assembly 130 further includes a cover signal input terminal 133 electrically connected to the controller 120. The cover signal input terminal is configured to receive the cover open signal from the cover open detector 310 and transmit the cover open signal to the controller 120, so that the controller 120 determines whether the cover of the test carrier 300 is open or closed, and the controller The test operation is performed only when the cover is closed, that is, the test operation is interrupted when the controller 120 receives the cover open signal.

如「第1圖」、「第3圖」及「第4圖」所示,測試載具300更包含一板彎偵測器320,例如一雷射感應器,用以偵測待測電路板200的彎曲度。控制腳位總成130更包含一板彎訊號輸入端134,連接於控制器120,用以自板彎偵測器320接收彎曲度,並傳送至控制器120。此外,控制器120中更設定一彎曲度門檻值,該控制器120比對該彎曲度與該彎曲門檻值,藉以判斷該待測電路板是否彎曲。 As shown in FIG. 1 , FIG. 3 and FIG. 4 , the test vehicle 300 further includes a plate bend detector 320 , such as a laser sensor for detecting the circuit board to be tested. The curvature of 200. The control pin assembly 130 further includes a plate bend signal input end 134 coupled to the controller 120 for receiving the curvature from the plate bend detector 320 and transmitting to the controller 120. In addition, a threshold value of the curvature is further set in the controller 120, and the controller 120 compares the curvature and the threshold value to determine whether the circuit board to be tested is bent.

如「第3圖」及「第4圖」所示,控制腳位總成130更包含一啟動訊號輸入端135,用以接收一啟動訊號;所述啟動訊號由外部輸入,例如外接於啟動訊號輸入端135的按鈕、工作站台400、測試載具300等,且該控制器120連接於啟動訊號輸入端135,用以接收該啟動訊號,而開始進行測試作業。此外,啟動訊號亦可由啟動按鈕182所產生,直接傳送給控制器120。 As shown in FIG. 3 and FIG. 4, the control pin assembly 130 further includes an activation signal input terminal 135 for receiving an activation signal; the activation signal is externally input, for example, externally connected to the activation signal. The button of the input terminal 135, the workstation station 400, the test vehicle 300, and the like, and the controller 120 is connected to the activation signal input terminal 135 for receiving the activation signal to start the test operation. In addition, the activation signal can also be generated by the start button 182 and transmitted directly to the controller 120.

此外,如「第3圖」及「第4圖」所示,控制腳位總成130更包含一組狀態訊號輸出端136a,136b及一組警示音效輸出端137a,137b。 In addition, as shown in "Fig. 3" and "Fig. 4", the control pin assembly 130 further includes a set of status signal output terminals 136a, 136b and a set of alert audio output terminals 137a, 137b.

狀態訊號輸出端136a,136b連接於控制器120,且連接於一組燈號;控制器120透過狀態訊號輸出端136a,136b輸出狀態訊號,藉以控制各燈號明暗變化,以顯示不同測試結果。所述燈號亦可為內建燈號,直接電性連接於控制器120。 The status signal output terminals 136a, 136b are connected to the controller 120 and connected to a group of lights; the controller 120 outputs status signals through the status signal output terminals 136a, 136b to control the light and dark changes of the lights to display different test results. The light can also be a built-in light and directly electrically connected to the controller 120.

警示音效輸出端137a,137b連接於控制器120,且連接於一揚聲器;控制器120透過狀態訊號輸出端136a,136b輸出警示訊號,藉以控制揚聲器發出警示音。所述燈號亦可為內建揚聲器,直接電性連接於控制器120。 The warning sound output terminals 137a, 137b are connected to the controller 120 and connected to a speaker; the controller 120 outputs an alarm signal through the status signal output terminals 136a, 136b to control the speaker to sound a warning tone. The light can also be a built-in speaker directly connected to the controller 120.

如「第1圖」及「第5圖」所示,偵測腳位總成140連接於控制器120,偵測腳位總成140至少包含漏電流電壓腳位141及一電池電壓量測腳位142。漏電流電壓腳位141連接於待測電路板200之待機電源輸入端STB;藉由漏電流電壓腳位141,控制器120判斷該待測電路板200於關機狀態下是否會產生漏電流,及依據電壓值評估漏電流之大小,從而產生一漏電流警示。電池 電壓量測腳位142連接於BIOS 210之電池213,用以取得電池213之端電壓,以供控制器120判斷電池213之電壓是否落在正常範圍之內。偵測腳位總成140更可包含其他電壓偵測腳位,用以偵測其他電壓,以取得更多的電路板200資訊。 As shown in FIG. 1 and FIG. 5, the detection pin assembly 140 is coupled to the controller 120. The detection pin assembly 140 includes at least a leakage current voltage pin 141 and a battery voltage measuring pin. Bit 142. The leakage current voltage pin 141 is connected to the standby power input terminal STB of the circuit board 200 to be tested; by the leakage current voltage pin 141, the controller 120 determines whether the circuit board 200 to be tested generates a leakage current in a shutdown state, and The magnitude of the leakage current is estimated based on the voltage value, thereby generating a leakage current warning. battery The voltage measuring pin 142 is connected to the battery 213 of the BIOS 210 for obtaining the terminal voltage of the battery 213 for the controller 120 to determine whether the voltage of the battery 213 falls within the normal range. The detection pin assembly 140 can also include other voltage detection pins for detecting other voltages to obtain more information about the board 200.

如「第1圖」及「第3圖」所示,第一資料傳輸介面150連接於控制器120,以連接該控制器120至工作站台400。依據第一資料傳輸介面150之通訊協定,例如COM port協定,控制器120將測試結果予以編碼,透過第一資料傳輸介面150輸出至工作站台400。工作站台400安裝一介面軟體,用以於一顯示畫面中產生一訊息顯示介面,藉以顯示測試結果。 As shown in "1" and "3", the first data transmission interface 150 is connected to the controller 120 to connect the controller 120 to the workstation station 400. Based on the communication protocol of the first data transmission interface 150, such as the COM port protocol, the controller 120 encodes the test result and outputs it to the workstation station 400 through the first data transmission interface 150. The workstation station 400 is provided with an interface software for generating a message display interface in a display screen for displaying test results.

第二資料傳輸介面160連接於控制器120,用以連接控制器120至測試載具300。第二資料傳輸介面160用以由測試載具300傳輸資料至控制器120,以透過控制器120將資料由測試載具300傳輸至工作站台400;或,由控制器120傳輸資料至測試載具300,以透過控制器120將資料由工作站台400傳輸至測試載具300。 The second data transmission interface 160 is coupled to the controller 120 for connecting the controller 120 to the test carrier 300. The second data transmission interface 160 is used for transmitting data from the test carrier 300 to the controller 120 for transmitting data from the test carrier 300 to the workstation station 400 through the controller 120; or, the controller 120 transmits data to the test vehicle. 300, the data is transmitted from the workstation station 400 to the test vehicle 300 through the controller 120.

如「第6圖」及「第7圖」所示,基於前述測試電路100,本發明提出一種供電測試及漏電流測試方法,該方法之步驟說明如下。 As shown in "Fig. 6" and "Fig. 7", based on the aforementioned test circuit 100, the present invention proposes a power supply test and a leakage current test method, the steps of which are explained below.

首先,測試人員打開測試載具300的蓋子,並放置待測電路板200於測試載具300中,如步驟Step 110所示。此時。因為蓋子開啟,蓋開偵測器310產生一蓋開訊號,傳送至控制器120,使得控制器120產生蓋開狀態訊號,由狀態訊號輸出端136a,136b傳輸至燈號,使燈號顯示蓋開狀態,例如以紅、綠燈交互閃爍。 同時,控制器120也產生蓋開提示訊號,由警示音效輸出端137a,137b傳輸至揚聲器,以驅動揚聲器產生蓋開提示音,例如短音Be三聲。 First, the tester opens the cover of the test carrier 300 and places the circuit board 200 to be tested in the test carrier 300, as shown in step 110. at this time. Because the cover is opened, the cover open detector 310 generates a cover open signal, which is transmitted to the controller 120, so that the controller 120 generates a cover open state signal, which is transmitted from the status signal output terminals 136a, 136b to the light number, so that the light display cover The on state, for example, flashes alternately with red and green lights. At the same time, the controller 120 also generates a cover opening prompt signal, which is transmitted to the speaker by the warning sound effect output terminals 137a, 137b to drive the speaker to generate a cover opening prompt sound, for example, a short beep Be three sounds.

接著,測試人員蓋上測試載具300之蓋子,如步驟Step 120所示。此時,因為蓋子關閉,蓋開偵測器310的蓋開訊號中斷,使控制器120產生蓋合閉狀態訊號,由狀態訊號輸出端136a,136b傳輸至燈號,使燈號顯示蓋合閉狀態,例如以綠燈持續發亮。 Next, the tester covers the lid of the test carrier 300, as shown in step 120. At this time, because the cover is closed, the cover open signal of the cover open detector 310 is interrupted, so that the controller 120 generates a cover closed state signal, which is transmitted from the status signal output terminals 136a, 136b to the light number, so that the light display cover is closed. The status, for example, continues to illuminate with a green light.

接著測試載具300對電源供應模組230供應一交流電力AC,以透過電源供應模組230提供DC電力至待測電路板200,藉以對待測電路板200進行供電測試,以判斷待測電路板200是否可正常運作,如步驟Step 130所示。此時待測電路板200持續產生運作資料,透過第二資料傳輸介面160傳輸至控制器120,控制器120再透過第一資料傳輸介面150傳輸運作資料至工作站台400,以供工作站台400判斷該待測電路板200是否可正常運作。此時,控制器120仍持續產生蓋合閉狀態訊號,驅動燈號顯示蓋合閉狀態例如以綠燈持續發亮。 Then, the test vehicle 300 supplies an AC power AC to the power supply module 230 to provide DC power to the circuit board 200 to be tested through the power supply module 230, thereby performing power supply test on the circuit board 200 to determine the circuit board to be tested. Whether the 200 can operate normally, as shown in step 130. At this time, the circuit board 200 continues to generate operational data, and is transmitted to the controller 120 through the second data transmission interface 160. The controller 120 transmits the operation data to the workstation station 400 through the first data transmission interface 150 for the workstation station 400 to determine. Whether the circuit board 200 to be tested can operate normally. At this time, the controller 120 continues to generate the cover closed state signal, and the drive light indicates that the cover is closed, for example, the green light continues to illuminate.

接著,對待測電路板200進行關機,使電源供應模組230對待測電路板200供應之直流電力DC中斷,如步驟Step 140所示。此時,控制器120產生直流電力中斷狀態訊號,驅動燈號顯示直流電力中斷狀態,例如以紅、綠燈交互閃爍,同時,控制器120產生直流電力中斷警示訊號,驅動揚聲器產生直流電力中斷提示音,例如Be聲連續三秒。 Next, the circuit board 200 to be tested is shut down, so that the power supply module 230 interrupts the DC power DC supplied by the circuit board 200 to be tested, as shown in step 140. At this time, the controller 120 generates a DC power interruption state signal, and the driving lamp number displays the DC power interruption state, for example, flashing alternately with red and green lights. At the same time, the controller 120 generates a DC power interruption warning signal to drive the speaker to generate a DC power interruption prompt tone. For example, Be sounds for three consecutive seconds.

控制器120持續判斷第二資料傳輸介面160是否仍有運作資 料輸入,藉以判斷該電源供應模組230是否仍持續供應直流電力DC給待測電路板200,而致使待測電路板200維持開機狀態,從而判斷待測電路板200是否可以正常關機,如步驟Step 150所示;若為是,則回歸步驟Step 130,持續對待測電路板200進行測試。 The controller 120 continues to determine whether the second data transmission interface 160 still has operating resources. The material input is used to determine whether the power supply module 230 continues to supply the DC power DC to the circuit board 200 to be tested, so that the circuit board 200 to be tested is maintained in a power-on state, thereby determining whether the circuit board 200 to be tested can be normally shut down, such as steps. Step 150; if yes, return to step 130 and continue testing the circuit board 200 to be tested.

若,於步驟Step 140判斷直流電力DC已經中斷,使待測電路板200關機,則控制器120再透過蓋開偵測器310,判斷測試載具300的蓋子是否被打開,如步驟Step 160所示。 If it is determined in step 140 that the DC power DC has been interrupted, and the circuit board 200 to be tested is turned off, the controller 120 further determines whether the cover of the test carrier 300 is opened by the cover open detector 310, as in step 160. Show.

若於步驟Step 160中,控制器120判斷測試載具300的蓋子被打開,則控制器120發出蓋開警示訊號,以驅動燈號顯示蓋開狀態,例如紅、綠燈號持續交替閃爍,控制器120並驅動揚聲器發出蓋開警示音效,例如連續短促Be聲,以提示測試人員將蓋子閉合。 If the controller 120 determines in step 160 that the cover of the test vehicle 300 is turned on, the controller 120 issues a cover open warning signal to drive the light to display the cover open state, for example, the red and green lights continue to flash alternately, and the controller 120 and drive the speaker to issue a cover warning sound, such as a short beep, to prompt the tester to close the cover.

若於步驟Step 160中,控制器120判斷測試載具300的蓋子閉合,則控制器120等待啟動訊號,判斷是否接收到啟動訊號。啟動訊號的來源如使用者按下啟動按鈕182,或啟動訊號輸入端135由外部接收到啟動訊號。 If the controller 120 determines in step 160 that the cover of the test vehicle 300 is closed, the controller 120 waits for the start signal to determine whether the start signal is received. The source of the activation signal is such that the user presses the start button 182 or the activation signal input terminal 135 receives the activation signal from the outside.

控制器120收到啟動訊號後,透過漏電流電壓腳位141取得電壓值。控制器120依據電壓值評估漏電流之大小,判斷該待測電路板200於關機狀態下是否會產生漏電流,以決定漏電流測試是否成功,如步驟Step 170所示。 After receiving the start signal, the controller 120 obtains the voltage value through the leakage current voltage pin 141. The controller 120 evaluates the magnitude of the leakage current according to the voltage value, and determines whether the leakage current is generated by the circuit board 200 to be tested in the off state to determine whether the leakage current test is successful, as shown in step 170.

若漏電流測試失敗,則控制器120透過第一資料傳輸介面150傳輸漏電流資料至工作站台400,以供工作站台400傳送至產線資訊整合系統(SFIS,Shop Floor Information System),如步驟Step 180所示,並回歸至步驟Step 140以關閉直流電力DC。同時,控制器120發出漏電流警示訊號,以驅動燈號顯示漏電流警示,例如紅燈號持續亮,控制器120並驅動揚聲器發出漏電流警示音效,例如Be聲持續發出一次,以警示測試人員。 If the leakage current test fails, the controller 120 transmits the leakage current data to the workstation station 400 through the first data transmission interface 150 for the workstation station 400 to transmit to the SFIS (Shop Floor Information System), as in Step Step 180, and returns to step 140 to turn off the DC power DC. At the same time, the controller 120 sends a leakage current warning signal to drive the light to display a leakage current warning. For example, the red light is continuously illuminated, and the controller 120 drives the speaker to emit a leakage current warning sound, for example, the Be sound is continuously sent once to warn the tester. .

若漏電流測試成功,則控制器120同樣透過第一資料傳輸介面150傳輸漏電流資料至工作站台400,以供工作站台400傳送至SFIS,如步驟Step 190所示。同時,控制器120發出漏電流測試成功訊號,以驅動燈號顯示漏電流測試成功,例如綠燈號持續亮,控制器120並驅動揚聲器發出漏電流測試成功音效,例如短促Be聲兩次,以通知測試人員。透過Step 150的判斷流程,可以確保待測電路板200在Step 130至Step 140的供電測試之後,可以確實中斷供給待測電路板200的直流電例DC,以進行漏電流的測試及量測電池213之端電壓。因此,供電測試、漏電流的測試及量測電池213之端電壓可以整合於單一站台,而不需分為不同站台測試。 If the leakage current test is successful, the controller 120 also transmits the leakage current data to the workstation station 400 through the first data transmission interface 150 for the workstation station 400 to transmit to the SFIS, as shown in step 190. At the same time, the controller 120 sends a leakage current test success signal to drive the light to indicate that the leakage current test is successful, for example, the green light number is continuously bright, and the controller 120 drives the speaker to emit a leakage current test successful sound effect, for example, short Be sound twice to notify Testers. Through the judgment process of the Step 150, it can be ensured that the DC circuit DC of the circuit board 200 to be tested can be surely interrupted after the power supply test of the circuit board 200 to be tested to perform the leakage current test and the measurement battery 213. The voltage at the end. Therefore, the power supply test, the leakage current test, and the voltage at the terminal of the measurement battery 213 can be integrated into a single station without being divided into different station tests.

測試人員打開蓋子,以板彎偵測器320進行板彎測試,以取得彎曲度,傳輸至控制器120,藉以供控制器120判斷板彎測試是否成功,如步驟Step 210所示。 The tester opens the cover and performs a plate bending test with the plate bend detector 320 to obtain the curvature and transmits it to the controller 120, so that the controller 120 determines whether the plate bending test is successful, as shown in step 210.

控制器120中設一彎曲度門檻值。若彎曲度小於門檻值,則控制器120判斷板彎測試成功,則控制器120透過第一資料傳輸介面150傳輸板彎測試資料至工作站台400,以供工作站台400傳送至SFIS,並結束測試作業。同時,控制器120發出板彎測試成功訊號,以驅動燈號顯示板彎測試成功,例如紅、綠燈號持續 交替閃爍五秒後,由綠燈長亮;控制器120並驅動揚聲器發出板彎測試成功音效,例如短促Be聲兩次,以通知測試人員。 A threshold value is set in the controller 120. If the degree of curvature is less than the threshold value, the controller 120 determines that the plate bending test is successful, and the controller 120 transmits the plate bending test data to the workstation station 400 through the first data transmission interface 150 for the workstation station 400 to transmit to the SFIS, and ends the test. operation. At the same time, the controller 120 sends a plate bending test success signal to drive the lamp number display plate bending test successfully, for example, the red and green lights continue. After alternately flashing for five seconds, the green light is long; the controller 120 drives the speaker to send a plate bend test successful sound effect, such as short beep twice to inform the tester.

若彎曲度大於門檻值,則控制器120判斷測試失敗;控制器120同樣透過第一資料傳輸介面150傳輸板彎測試資料至工作站台400,以供工作站台400傳送至SFIS,如步驟Step 230所示。同時,控制器120發出板彎測試失敗訊號,以驅動燈號顯示板彎測試失敗,例如紅、綠燈號持續交替閃爍五秒後,由紅燈長亮;控制器120並驅動揚聲器發出板彎測試失敗音效,例如長Be聲一次,以通知測試人員。 If the degree of curvature is greater than the threshold value, the controller 120 determines that the test has failed; the controller 120 also transmits the plate bending test data to the workstation station 400 through the first data transmission interface 150 for the workstation station 400 to transmit to the SFIS, as in step 230. Show. At the same time, the controller 120 sends a plate bending test failure signal to drive the lamp display panel to bend the test failure. For example, the red and green lights continue to flash alternately for five seconds, and then the red light is long; the controller 120 drives the speaker to issue a plate bending test. Failed sound effects, such as a long Be sound, to inform the tester.

接著控制器120判斷板彎測試次數是否超過一預定次數,例如3次,如步驟Step 240所示。若超過預定次數,控制器120同樣結束測試作業。若未超過預定次數,則控制器120等待重測訊號,如Step 250所示,並於接收重測訊號後重新進行板彎測試。等待重測訊號的同時,控制器120驅動燈號提示測試人員按下重測按鈕以發出重測訊號,例如紅、綠燈號持續交替,並驅動揚聲器發出長Be聲一次三秒,以通知測試人員。 The controller 120 then determines whether the number of plate bending tests exceeds a predetermined number of times, for example, three times, as shown in step 240. If the predetermined number of times is exceeded, the controller 120 also ends the test operation. If the predetermined number of times is not exceeded, the controller 120 waits for the retest signal, as shown in step 250, and performs the plate bending test again after receiving the retest signal. While waiting for the retest signal, the controller 120 drives the light to prompt the tester to press the retest button to issue a retest signal, for example, the red and green lights continue to alternate, and the speaker is driven to emit a long Be sound for three seconds to notify the tester. .

參閱「第8圖」及「第9圖」所示,本發明之漏電流測試方法的整體檢測時序說明如下。 Referring to "Fig. 8" and "Fig. 9", the overall detection timing of the leakage current test method of the present invention is explained below.

於第一階段P1,係將測試載具300的蓋子關上,輸入交流電力AC至電源供應模組230。同時,對待測電路板200進行開機,使得電源供應模組230產生直流電力DC輸出至待測電路板200。此時若待測電路板200可正常開機並運作,則該待測電路板200可以產生資料,而控制器120驅動燈號(如綠燈)顯示待測電路 板200正常運作之狀態。此一階段相當於步驟Step 130。 In the first stage P1, the cover of the test carrier 300 is closed, and the AC power AC is input to the power supply module 230. At the same time, the circuit board 200 to be tested is powered on, so that the power supply module 230 generates DC power DC output to the circuit board 200 to be tested. At this time, if the circuit board 200 to be tested can be normally turned on and operated, the circuit board 200 to be tested can generate data, and the controller 120 drives the light signal (such as a green light) to display the circuit to be tested. The state in which the board 200 is operating normally. This phase is equivalent to step 130.

於第二階段P2,對待測電路板200進行關機,此時若正常關機,則交流電力AC雖然仍輸入至電源供應模組230,但電源供應模組230的直流電力DC輸出為關閉。若,直流電力DC輸出中斷,使待測電路板200的正常關機超過10秒,則則控制器120驅動燈號顯示待測電路板200可正常關機(例如綠燈)。若,直流電力DC輸出持續而沒有中斷超過10秒,則待測電路板200的關機程序錯誤,則控制器120驅動燈號(例如紅燈)顯示待測電路板200關機錯誤之狀態。此一階段相當於步驟Step 140。 In the second stage P2, the circuit board 200 to be tested is turned off. At this time, if the power is normally turned off, the AC power AC is still input to the power supply module 230, but the DC power DC output of the power supply module 230 is turned off. If the DC power DC output is interrupted and the normal shutdown of the circuit board 200 to be tested exceeds 10 seconds, the controller 120 drives the light signal to indicate that the circuit board 200 to be tested can be normally shut down (for example, a green light). If the DC power DC output continues without interruption for more than 10 seconds, if the shutdown procedure of the circuit board 200 to be tested is incorrect, the controller 120 drives a lamp number (for example, a red light) to display a state in which the circuit board 200 to be tested is turned off. This phase is equivalent to step 140.

於第三階段P3,確認交流電力AC是否完全中斷,同時重複確認直流電力DC是否中斷。若,交流電力AC與直流電力DC都中斷,控制器120驅動紅色燈號及綠色燈號交替閃爍,顯示待測電路板20斷電作業完成。此外,控制器120更驅動揚聲器音效,例如,Be聲三秒,提示待測電路板200斷電作業完成。此一階段相當於步驟Step 150-Step 160。 In the third stage P3, it is confirmed whether the AC power AC is completely interrupted, and it is repeatedly confirmed whether the DC power DC is interrupted. If the AC power and the DC power DC are both interrupted, the controller 120 drives the red light and the green light to flash alternately, indicating that the circuit board 20 to be tested is powered off. In addition, the controller 120 further drives the speaker sound effect, for example, the Be sound for three seconds, prompting the circuit board 200 to be tested to be powered off. This phase is equivalent to step 150-Step 160.

於第四階段P4,按下啟動按鈕182以發出啟動訊號,使控制器120開始透過漏電流電壓腳位141量測漏電流之電壓,並以電池電壓量測腳位142量測電池213之端電壓。若,漏電流之電壓落在容許範圍內,則待測電路板200之漏電流狀態正常,控制器120驅動燈號顯示漏電流測試成功,例如驅動綠燈亮;若,漏電流之電壓落在容許範圍外,控制器120驅動燈號顯示漏電流測試失敗,例如動紅燈亮。此一階段相當於步驟Step 170。第一階段P1至第三階段P3在完成供電測試之後,可以確保供給待測電路 板200的直流電力DC中斷,而可持續進入第四階段P4進行漏電流及電池213之端電壓的量測,並判斷待測電路板的電源管理(開機及關機功能)是否正常。因此,供電測試、漏電流及電池213之端電壓的量測可以整合在單一站台,而不會因為供電要求不同,而需要分別由不同站台測試,減少人力的配置。 In the fourth stage P4, the start button 182 is pressed to issue a start signal, so that the controller 120 starts measuring the voltage of the leakage current through the leakage current voltage pin 141, and measures the end of the battery 213 with the battery voltage measuring pin 142. Voltage. If the voltage of the leakage current falls within the allowable range, the leakage current state of the circuit board 200 to be tested is normal, and the controller 120 drives the signal to indicate that the leakage current test is successful, for example, the driving green light is on; if, the leakage current voltage falls within the allowable range. Outside the range, the controller 120 drives the light to indicate that the leakage current test has failed, for example, the red light is on. This phase is equivalent to step 170. The first stage P1 to the third stage P3 can ensure supply of the circuit to be tested after the power supply test is completed. The DC power DC of the board 200 is interrupted, and the fourth stage P4 can be continuously performed to measure the leakage current and the voltage of the terminal of the battery 213, and determine whether the power management (power on and power off function) of the circuit board to be tested is normal. Therefore, the power supply test, the leakage current, and the measurement of the voltage of the terminal of the battery 213 can be integrated in a single station, and it is not required to be separately tested by different stations because of different power supply requirements, thereby reducing the configuration of the human.

於第五階段P5,測試載具300之蓋子係被開啟,以供板彎偵測器320偵測板彎狀態。同樣地,若,彎曲度落在容許範圍內,則控制器120驅動燈號顯示板彎測試成功;若,彎曲度落在容許範圍外,控制器120驅動燈號顯示板彎測試失敗。此一階段相當於步驟Step 210。 In the fifth stage P5, the cover of the test carrier 300 is opened for the plate bend detector 320 to detect the plate bending state. Similarly, if the degree of curvature falls within the allowable range, the controller 120 drives the signal display panel to bend the test successfully; if the degree of curvature falls outside the allowable range, the controller 120 drives the indicator display panel to fail the test. This phase is equivalent to step 210.

於第六階段P6,控制器120將測試結果,包含彎曲度、漏電流電壓,傳輸至工作站台400,再由工作站台400傳輸至SFIS的資料庫儲存。此一階段相當於步驟Step 220、Step 230。 In the sixth stage P6, the controller 120 transmits the test result, including the bending degree and the leakage current voltage, to the workstation station 400, and then transmits it to the SFIS database for storage by the workstation station 400. This phase corresponds to steps 220 and 230.

如前所述,工作站台400安裝一介面軟體,用以顯示各項資訊,所示資訊可包含韌體版本、更新日期、採用的資料傳輸介面、鮑率等。此外,亦可顯示電路板之機種名稱。前述機種名稱可以手動輸入,亦可透過記憶模組110取得。工作站台400執行介面軟體後,可透過第一資料傳輸介面150,將測試項目寫入測試電路100的記憶模組110,或自記憶模組110讀取資料。 As described above, the workstation 400 is provided with an interface software for displaying various information. The information shown may include the firmware version, the update date, the data transmission interface used, and the baud rate. In addition, the model name of the board can also be displayed. The model name can be manually input or obtained through the memory module 110. After the workstation 400 executes the interface software, the test item can be written into the memory module 110 of the test circuit 100 or read from the memory module 110 through the first data transmission interface 150.

介面軟體亦可切換至一編輯介面,藉以編輯機種的測試設定值。 The interface software can also be switched to an editing interface to edit the test settings of the model.

參閱「第3圖」所示,為了使機種的測試設定值不被意外變更,測試電路100更包含一模式切換鈕,用以將測試電路100切 換於量測模式及編輯模式。於量測模式中,測試電路100執行測試作業。於編輯模式中,控制器120透過第一資料傳輸介面150,接收工作站台400發出之編輯指令,而編輯機種的測試設定值。 Referring to FIG. 3, in order to prevent the test set value of the model from being accidentally changed, the test circuit 100 further includes a mode switch button for cutting the test circuit 100. Change to measurement mode and edit mode. In the measurement mode, the test circuit 100 performs a test operation. In the edit mode, the controller 120 receives the edit command issued by the workstation station 400 through the first data transmission interface 150, and edits the test set value of the model.

如「第10圖」所示,編輯機種的測試設定值的過程係先以電源開關按鈕172開啟測試電路100之直流電力DC,如步驟Step 310所示。接著以模式切換開關190切換測試電路100為編輯模式,如步驟Step 320所示。工作站台400啟動並執行介面軟體,並以第一資料傳輸介面150連接工作站台400及測試電路100,如步驟Step330及步驟Step 340所示。工作站台400切換軟體介面至編輯介面,以供測試人員編輯機種的測試設定值,如步驟Step 350及步驟Step 360所示。完成編輯後,工作站台400發出編輯指令,將編輯結果寫入測試電路100的記憶模組110,如步驟Step 370所示。最後,透過編輯介面選擇機種,並設定啟用的電壓偵測腳位,完成設定,如步驟Step 380及步驟Step 390所示。 As shown in FIG. 10, the process of editing the test set value of the model first turns on the DC power DC of the test circuit 100 with the power switch button 172, as shown in step 310. The test circuit 100 is then switched to the edit mode by the mode switch 190 as shown in step 320. The workstation station 400 starts and executes the interface software, and connects the workstation station 400 and the test circuit 100 with the first data transmission interface 150, as shown in step 330 and step 340. The workstation station 400 switches the software interface to the editing interface for the tester to edit the test set values of the model, as shown in step 350 and step 360. After the editing is completed, the workstation station 400 issues an editing command, and writes the editing result to the memory module 110 of the test circuit 100, as shown in step 370. Finally, the model is selected through the editing interface, and the enabled voltage detection pin is set to complete the setting, as shown in step 380 and step 390.

100‧‧‧測試電路 100‧‧‧Test circuit

110‧‧‧記憶模組 110‧‧‧Memory Module

120‧‧‧控制器 120‧‧‧ Controller

130‧‧‧控制腳位總成 130‧‧‧Control foot assembly

131‧‧‧電力輸入節點 131‧‧‧Power input node

132‧‧‧待機電壓輸入節點 132‧‧‧Standby voltage input node

133‧‧‧蓋開訊號輸入端 133‧‧‧Open signal input

134‧‧‧板彎訊號輸入端 134‧‧‧ plate bending signal input

135‧‧‧啟動訊號輸入端 135‧‧‧Start signal input

136a,136b‧‧‧狀態訊號輸出端 136a, 136b‧‧‧ Status signal output

137a,137b‧‧‧警示音效輸出端 137a, 137b‧‧‧ warning sound output

140‧‧‧偵測腳位總成 140‧‧‧Detecting the foot assembly

141‧‧‧漏電流電壓腳位 141‧‧‧Leakage current voltage pin

142‧‧‧電池電壓量測腳位 142‧‧‧Battery voltage measurement pin

150‧‧‧第一資料傳輸介面 150‧‧‧First data transmission interface

160‧‧‧第二資料傳輸介面 160‧‧‧Second data transmission interface

171‧‧‧電力輸入端口 171‧‧‧Power input port

172‧‧‧電源開關按鈕 172‧‧‧Power switch button

173‧‧‧電源指示燈 173‧‧‧Power indicator

181‧‧‧重置按鈕 181‧‧‧Reset button

182‧‧‧啟動按鈕 182‧‧‧Start button

190‧‧‧模式切換開關 190‧‧‧ mode switch

200‧‧‧待測電路板 200‧‧‧Device board to be tested

210‧‧‧基本輸入輸出系統 210‧‧‧Basic input and output system

211‧‧‧BIOS程式碼儲存單元 211‧‧‧BIOS code storage unit

212‧‧‧BIOS設定值暫存單元 212‧‧‧BIOS set value temporary storage unit

213‧‧‧電池 213‧‧‧Battery

220‧‧‧主功能電路 220‧‧‧ main function circuit

230‧‧‧電源供應模組 230‧‧‧Power supply module

310‧‧‧蓋開偵測器 310‧‧‧ Cover open detector

320‧‧‧板彎偵測器 320‧‧‧ plate bend detector

300‧‧‧測試載具 300‧‧‧Test Vehicle

400‧‧‧工作站台 400‧‧‧Workstation

STB‧‧‧待機電源輸入端 STB‧‧‧Standby power input

AC‧‧‧交流電力 AC‧‧‧AC power

第1圖為本發明實施例所揭露之用於測試電路板之測試系統之系統方塊圖。 FIG. 1 is a system block diagram of a test system for testing a circuit board according to an embodiment of the present invention.

第2圖為本發明實施例中,待測電路板之電路方塊圖。 FIG. 2 is a circuit block diagram of a circuit board to be tested in the embodiment of the present invention.

第3圖為本發明實施例中,測試電路之電路方塊圖。 FIG. 3 is a circuit block diagram of a test circuit in an embodiment of the present invention.

第4圖為本發明實施例中,控制腳位總成之示意圖。 Figure 4 is a schematic diagram of the control pin assembly in the embodiment of the present invention.

第5圖為本發明實施例中,偵測腳位總成之示意圖。 FIG. 5 is a schematic diagram of detecting a foot assembly according to an embodiment of the present invention.

第6、7圖為本發明漏電流測試方法之流程圖。 Figures 6 and 7 are flow charts of the leakage current testing method of the present invention.

第8、9圖為本發明漏電流測試方法之時序示意圖。 Figures 8 and 9 are timing diagrams of the leakage current test method of the present invention.

第10圖為本發明實施例中,編輯機種的測試設定值之流程圖。 Figure 10 is a flow chart showing the test set values of the editing model in the embodiment of the present invention.

Claims (19)

一種用於測試電路板之測試系統,用以對一待測電路板進行開關機測試,並測試該待測電路板之漏電流,該待測電路板至少包含一BIOS程式碼儲存單元、一BIOS設定值暫存單元、一電池、一主功能電路、一待機電源輸入端及一電源供應模組,該待機電源輸入端用以取得一待機電力,該電源供應模組用以接收一交流電力並產生一直流電力;該測試系統包含:一測試載具,用以容置該待測試電路板,並與該待測電路板建立電性連接,且該測試載具供應該交流電力至該電源供應模組,使該電源供應模組輸出該直流電力,以對該待測電路板進行供電測試,而產生運作資料;及一測試電路,包含:一記憶模組,用以儲存程式碼,並暫存各項測試結果及測試設定值;一控制器,用以載入並執行該程式碼,而執行一測試作業;該控制器並於接收測試結果後,將該測試結果寫入該記憶模組;且該控制器接收該運作資料,從而判斷該待測電路板是否可正常運作,並於供電測試之後對該待測電路板進行關機;一控制腳位總成,至少包含一電力輸入節點及一待機電壓輸入節點,分別連接於該控制器;其中,該電力輸入節點用以接收電力輸入,以驅動該測試電路,該待機電壓輸入節點連接於該待機電源輸入端,使該控制器判別該待 測電路板是否為關機狀態;一偵測腳位總成,至少包含一漏電流電壓腳位,連接於該待機電源輸入端;該控制器透過該漏電流電壓腳位判斷待測電路板於關機狀態下是否通過漏電流測試,而產生一漏電流警示。 A test system for testing a circuit board for performing a power on/off test on a circuit board to be tested and testing a leakage current of the circuit board to be tested, the circuit board to be tested comprising at least a BIOS code storage unit and a BIOS a set value temporary storage unit, a battery, a main function circuit, a standby power input terminal and a power supply module, wherein the standby power input terminal is configured to obtain a standby power, and the power supply module is configured to receive an AC power and The test system includes: a test carrier for accommodating the circuit board to be tested, and establishing an electrical connection with the circuit board to be tested, and the test vehicle supplies the AC power to the power supply The module, the power supply module outputs the DC power to perform power supply test on the circuit board to be tested, and generates operation data; and a test circuit includes: a memory module for storing the code, and temporarily Storing test results and test set values; a controller for loading and executing the code to perform a test operation; and after receiving the test result, the controller The result is written into the memory module; and the controller receives the operation data to determine whether the circuit board to be tested can operate normally, and shuts down the circuit board to be tested after the power supply test; a control pin assembly, At least one power input node and a standby voltage input node are respectively connected to the controller; wherein the power input node is configured to receive a power input to drive the test circuit, and the standby voltage input node is connected to the standby power input end Let the controller discriminate Measuring whether the circuit board is in a shutdown state; a detecting pin position assembly, comprising at least one leakage current voltage pin connected to the standby power input end; the controller determines the circuit board to be tested to be turned off through the leakage current voltage pin Whether the leakage current test is passed in the state, and a leakage current warning is generated. 如請求項1所述之用於測試電路板之測試系統,更包含一工作站台,且該測試電路更包含一第一資料傳輸介面,連接於該控制器,以連接該控制器至該工作站台;其中該控制器將該測試結果予以編碼,透過該第一資料傳輸介面輸出至該工作站台,該工作站台安裝一介面軟體,用以於一顯示畫面中產生一訊息顯示介面,藉以顯示測試結果。 The test system for testing a circuit board according to claim 1, further comprising a workstation station, and the test circuit further comprises a first data transmission interface connected to the controller to connect the controller to the workstation station The controller encodes the test result and outputs the test result to the workstation station through the first data transmission interface, and the workstation station installs an interface software for generating a message display interface in a display screen to display the test result. . 如請求項2所述之用於測試電路板之測試系統,其中該測試電路更包含一模式切換鈕,用以將該測試電路切換於量測模式及編輯模式;其中於該量測模式中,該測試電路執行測試作業,且於該編輯模式中,該控制器接收該工作站台發出之編輯指令,而編輯機種的測試設定值。 The test system for testing a circuit board according to claim 2, wherein the test circuit further includes a mode switching button for switching the test circuit to the measurement mode and the edit mode; wherein in the measurement mode, The test circuit performs a test operation, and in the edit mode, the controller receives an edit command issued by the workstation station, and edits the test set value of the model. 如請求項1所述之用於測試電路板之測試系統,其中該測試電路更包含一第二資料傳輸介面,用以連接控制器至該測試載具,從而傳輸資料於該工作站台及該測試治具之間,藉以判斷該待測電路板是否可正常運作。 The test system for testing a circuit board according to claim 1, wherein the test circuit further comprises a second data transmission interface for connecting the controller to the test vehicle, thereby transmitting data to the workstation station and the test Between the jigs, it is judged whether the circuit board to be tested can operate normally. 如請求項1所述之用於測試電路板之測試系統,其中該測試電路更包含一電力輸入端口及一電源開關按鈕,連接於該控制器;該電力輸入端口用以輸入一電力,使得該測試電路以自有 電力運行;該電源開關按鈕用以產生一觸發訊號,藉以啟動或關閉該測試電路。 The test system for testing a circuit board according to claim 1, wherein the test circuit further comprises a power input port and a power switch button connected to the controller; the power input port is configured to input a power, so that the Test circuit with its own Power operation; the power switch button is used to generate a trigger signal to activate or deactivate the test circuit. 如請求項5所述之用於測試電路板之測試系統,其中該測試電路更包含一電源指示燈,連接於該控制器,該控制器於該測試電路運作時,致能該電源指示燈。 The test system for testing a circuit board according to claim 5, wherein the test circuit further comprises a power indicator light connected to the controller, and the controller enables the power indicator light when the test circuit operates. 如請求項1所述之用於測試電路板之測試系統,其中該測試載具更包含一蓋開偵測器,用以偵測該測試載具的蓋子是否開啟,且該控制器僅於該蓋子閉合時執行測試作業。 The test system for testing a circuit board according to claim 1, wherein the test carrier further includes a cover open detector for detecting whether the cover of the test carrier is turned on, and the controller is only Perform a test job when the lid is closed. 如請求項1所述之用於測試電路板之測試系統,其中該測試載具更包含一板彎偵測器,用以偵測待測該電路板的彎曲度。 The test system for testing a circuit board according to claim 1, wherein the test carrier further comprises a plate bend detector for detecting the curvature of the circuit board to be tested. 如請求項8所述之用於測試電路板之測試系統,其中該控制器中設定一彎曲度門檻值,該控制器比對該彎曲度與該彎曲門檻值,藉以判斷該待測電路板是否彎曲。 The test system for testing a circuit board according to claim 8, wherein a threshold value is set in the controller, and the controller compares the curvature and the bending threshold to determine whether the circuit board to be tested is bending. 如請求項1所述之用於測試電路板之測試系統,其中該控制腳位總成更包含一組狀態訊號輸出端,連接於該控制器,且該控制器透過該些狀態訊號輸出端輸出狀態訊號,以顯示不同測試結果。 The test system for testing a circuit board according to claim 1, wherein the control pin assembly further comprises a set of status signal outputs connected to the controller, and the controller outputs the status signal output terminals. Status signal to show different test results. 如請求項1所述之用於測試電路板之測試系統,其中該控制腳位總成更包含一組警示音效輸出端,連接於該控制器,且該控制器透過該些狀態訊號輸出端輸出警示訊號,藉以發出警示音。 The test system for testing a circuit board according to claim 1, wherein the control pin assembly further comprises a set of warning sound output terminals connected to the controller, and the controller outputs the status signal output terminals. A warning signal to sound a warning tone. 如請求項1所述之用於測試電路板之測試系統,其中該偵測腳位總成更包含一電池電壓量測腳位,用以取得該電池之端電 壓,以供該控制器判斷該電池之電壓是否落在正常範圍之內。 The test system for testing a circuit board according to claim 1, wherein the detection pin assembly further comprises a battery voltage measuring pin for obtaining the terminal power of the battery. Pressing, for the controller to determine whether the voltage of the battery falls within the normal range. 一種漏電流測試方法,用以測試一待測電路板之漏電流,其中該待測電路板至少包含一BIOS程式碼儲存單元、一BIOS設定值暫存單元、一電池、一主功能電路、一待機電源輸入端及一電源供應模組,該待機電源輸入端用以取得一待機電力,該電源供應模組用以接收一交流電力並產生一直流電力;該漏電流測試方法包含:放置該待測電路板於一測試載具中;對該待測電路板進行開機,使該電源供應模組提供直流電力至該待測電路板,以對該待測電路板進行供電測試,並接收該待測電路板運作產生運作資料,以判斷該待測電路板是否可正常運作;對該待測電路板進行關機,使該電源供應模組中斷對該待測電路板供應之直流電力,使該待測電路板進行關機;透過一漏電流電壓腳位取得該待測電路板之漏電流的電壓值;及依據該電壓值,判斷該待測電路板於關機狀態下是否會產生漏電流。 A leakage current test method for testing a leakage current of a circuit board to be tested, wherein the circuit board to be tested includes at least a BIOS code storage unit, a BIOS set value temporary storage unit, a battery, a main function circuit, and a a standby power input terminal and a power supply module, wherein the standby power input terminal is configured to obtain a standby power, and the power supply module is configured to receive an alternating current power and generate a direct current power; the leakage current test method includes: placing the standby power The test circuit board is in a test vehicle; the circuit board to be tested is turned on, so that the power supply module supplies DC power to the circuit board to be tested, to perform power supply test on the circuit board to be tested, and receive the standby The operation of the circuit board generates operation data to determine whether the circuit board to be tested can operate normally; the circuit board to be tested is shut down, so that the power supply module interrupts the DC power supplied to the circuit board to be tested, so that the standby The circuit board is turned off; the voltage value of the leakage current of the circuit board to be tested is obtained through a leakage current voltage pin; and the circuit board to be tested is judged according to the voltage value Whether a leakage current under a state machine. 如請求項13所述之漏電流測試方法,其中更包含一步驟,偵測該測載具之蓋子是否為開啟,並於蓋子開啟時發出警示。 The leakage current testing method of claim 13, further comprising a step of detecting whether the cover of the test vehicle is open and issuing an alert when the cover is opened. 如請求項14所述之漏電流測試方法,其中更包含一步驟,以一板彎偵測器進行板彎測試,以取得該待測電路板之彎曲度。 The leakage current testing method of claim 14, further comprising a step of performing a plate bending test with a plate bend detector to obtain a bending degree of the circuit board to be tested. 如請求項15所述之漏電流測試方法,其中更包含: 設一彎曲度門檻值;及於該彎曲度小於該門檻值時,判斷板彎測試成功,且於該彎曲度大於該門檻值時,判斷板彎測試失敗 The leakage current testing method of claim 15, which further comprises: Setting a bending threshold value; and determining that the bending test is successful when the bending degree is less than the threshold value, and determining that the bending test fails when the bending degree is greater than the threshold value 如請求項14所述之漏電流測試方法,其中對該待測電路板進行供電測試之步驟包含由待測電路板產生之運作資料判斷該待測電路板是否可正常運作。 The leakage current testing method of claim 14, wherein the step of performing power supply testing on the circuit board to be tested comprises determining, by the operational data generated by the circuit board to be tested, whether the circuit board to be tested can operate normally. 如請求項15所述之漏電流測試方法,其中於每一測試步驟之後,更包含以燈號顯示測試結果。 The leakage current test method of claim 15, wherein after each test step, the test result is further displayed by a light number. 如請求項15所述之漏電流測試方法,其中於每一測試步驟之後,更包含以音效提示測試結果。 The leakage current test method of claim 15, wherein after each test step, the test result is further indicated by a sound effect.
TW101136978A 2012-10-05 2012-10-05 Detecting system for detecting circuit board and leakage current detecting method TWI459003B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW101136978A TWI459003B (en) 2012-10-05 2012-10-05 Detecting system for detecting circuit board and leakage current detecting method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW101136978A TWI459003B (en) 2012-10-05 2012-10-05 Detecting system for detecting circuit board and leakage current detecting method

Publications (2)

Publication Number Publication Date
TW201415045A true TW201415045A (en) 2014-04-16
TWI459003B TWI459003B (en) 2014-11-01

Family

ID=52388350

Family Applications (1)

Application Number Title Priority Date Filing Date
TW101136978A TWI459003B (en) 2012-10-05 2012-10-05 Detecting system for detecting circuit board and leakage current detecting method

Country Status (1)

Country Link
TW (1) TWI459003B (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI559014B (en) * 2015-12-18 2016-11-21 技嘉科技股份有限公司 Measurement fixture
TWI559013B (en) * 2015-12-18 2016-11-21 技嘉科技股份有限公司 Measurement fixture
TWI559017B (en) * 2015-12-18 2016-11-21 技嘉科技股份有限公司 Measurement system
TWI559015B (en) * 2015-12-18 2016-11-21 技嘉科技股份有限公司 Measurement fixture
CN106896280A (en) * 2015-12-18 2017-06-27 技嘉科技股份有限公司 Measurement tool
CN108012277A (en) * 2017-09-12 2018-05-08 上海斐讯数据通信技术有限公司 A kind of detection device of MIFI systems, system and method
TWI717222B (en) * 2020-03-06 2021-01-21 森富科技股份有限公司 Prediction method of memory operation ability
TWI792543B (en) * 2021-09-07 2023-02-11 瑞昱半導體股份有限公司 A method for checking power leakage of a circuit and a processing system thereof

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1174536C (en) * 2000-12-01 2004-11-03 神基科技股份有限公司 Automatic test method and device for battery
CN1464358A (en) * 2002-06-12 2003-12-31 华硕电脑股份有限公司 Notebook computer power supply automatic detecting method
TWI303318B (en) * 2006-10-18 2008-11-21 Asustek Comp Inc Testing apparatus and method for testing boot and shut-down process of computer system
CN101901178A (en) * 2009-05-31 2010-12-01 鸿富锦精密工业(深圳)有限公司 Computer system on-off test device and method
CN101706550B (en) * 2009-11-19 2012-02-22 福建联迪商用设备有限公司 Method for testing mainboard

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI559014B (en) * 2015-12-18 2016-11-21 技嘉科技股份有限公司 Measurement fixture
TWI559013B (en) * 2015-12-18 2016-11-21 技嘉科技股份有限公司 Measurement fixture
TWI559017B (en) * 2015-12-18 2016-11-21 技嘉科技股份有限公司 Measurement system
TWI559015B (en) * 2015-12-18 2016-11-21 技嘉科技股份有限公司 Measurement fixture
CN106896280A (en) * 2015-12-18 2017-06-27 技嘉科技股份有限公司 Measurement tool
CN106896280B (en) * 2015-12-18 2019-08-06 技嘉科技股份有限公司 Measure jig
CN108012277A (en) * 2017-09-12 2018-05-08 上海斐讯数据通信技术有限公司 A kind of detection device of MIFI systems, system and method
TWI717222B (en) * 2020-03-06 2021-01-21 森富科技股份有限公司 Prediction method of memory operation ability
TWI792543B (en) * 2021-09-07 2023-02-11 瑞昱半導體股份有限公司 A method for checking power leakage of a circuit and a processing system thereof

Also Published As

Publication number Publication date
TWI459003B (en) 2014-11-01

Similar Documents

Publication Publication Date Title
TWI459003B (en) Detecting system for detecting circuit board and leakage current detecting method
CN108732443B (en) Automatic test system and method based on Linux
US7259567B2 (en) Power tester for electrical outlets
CN105182371A (en) GNSS product automatic test method based on function test
CN101437173A (en) Instrument for detecting flat-plate television failure and detection method thereof
CN104502832B (en) Based on handheld POS machine mainboard auto testing instrument and method of testing
CN103728547A (en) Testing system used for testing circuit board and leakage current testing method
CN105824388A (en) Power-on/off detection method, device and system
CN103149495A (en) Comprehensive test instrument for testing multi-path conducting wire\connector
CN103914361B (en) Detection jig and detection method of computer device
TW201346536A (en) Testing system and method for power on and off
CN111831495A (en) Production automation test method and system
CN108896934A (en) LED module Current Voltage lights detection device and its detection method automatically
TW201312331A (en) Control system for power on and off computer
CN110232881A (en) Front board measuring method
CN106354592A (en) Computer automatic startup and shutdown testing device
CN216248910U (en) Fault detection equipment for electric valve control system
CN209312011U (en) A kind of test macro of USB wireless network card equipment identification certainty
CN105606994A (en) Testing device for SIU module of financial self-service equipment, and testing method thereof
CN215575602U (en) Simple type-C port welding reliability identification and detection device
CN203520072U (en) Signal converter assembly detection device
CN111414283B (en) Automatic test system and automatic test method thereof
CN209028761U (en) A kind of wireless smoke detector test macro
CN112083312A (en) Hardware testing method and system for master control PCBA (printed circuit board assembly) of VR (virtual reality) film watching equipment
KR200318683Y1 (en) Lamp tester