TWI553757B - Substrate processing system and display element manufacturing method - Google Patents

Substrate processing system and display element manufacturing method Download PDF

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TWI553757B
TWI553757B TW100146431A TW100146431A TWI553757B TW I553757 B TWI553757 B TW I553757B TW 100146431 A TW100146431 A TW 100146431A TW 100146431 A TW100146431 A TW 100146431A TW I553757 B TWI553757 B TW I553757B
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substrate
substrate processing
housing
processing
processing system
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TW201234509A (en
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濱田智秀
木內徹
增川孝志
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尼康股份有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67775Docking arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67721Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations the substrates to be conveyed not being semiconductor wafers or large planar substrates, e.g. chips, lead frames
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67736Loading to or unloading from a conveyor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67745Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber characterized by movements or sequence of movements of transfer devices

Description

基板處理系統及顯示元件之製造方法Substrate processing system and method of manufacturing display element

本發明係關於基板處理系統及顯示元件之製造方法 The present invention relates to a substrate processing system and a method of manufacturing a display element

本申請案主張2010年12月15日申請之美國專利暫時申請第61/423,222號之優先權,並將其內容援用於此。 The present application claims priority to U.S. Patent Application Serial No. 61/423,222, filed on Dec.

作為構成顯示器裝置等顯示裝置之顯示元件,例如已有液晶顯示元件、有機電激發光(有機EL)元件。目前,此等顯示元件,係以對應各像素於基板表面形成薄膜電晶體(Thin Film Transistor:TFT)之主動元件(active device)為主流。 As a display element constituting a display device such as a display device, for example, a liquid crystal display element or an organic electroluminescence (organic EL) element is known. At present, these display elements are mainly active devices that form thin film transistors (TFTs) corresponding to respective pixels on the surface of the substrate.

近年來,出現了一種在片狀基板(例如薄膜構件等)上形成顯示元件之技術。作為此種技術,例如以被稱為捲對捲(roll to roll)方式(以下,簡稱(捲繞方式))之手法已廣為人知(例如,參照專利文獻1)。捲繞方式,係將捲在基板供應側之供應用滾筒之一片片狀基板(例如,帶狀的薄膜構件)送出,並將被送出之基板一邊捲在基板回收側之回收用滾筒、一邊以設在供應用滾筒與回收用滾筒之間之處理裝置,對基板施予所欲之加工。 In recent years, there has been a technique of forming a display element on a sheet substrate (for example, a film member or the like). As such a technique, for example, a method called a roll to roll method (hereinafter, simply referred to as a "winding method") is widely known (for example, refer to Patent Document 1). In the winding method, a sheet-like substrate (for example, a strip-shaped film member) wound on a substrate supply side is fed, and the substrate to be fed is wound on the recovery roller on the substrate recovery side. A processing device provided between the supply roller and the recovery roller is used to apply the desired processing to the substrate.

並在從送出基板至捲繞基板之期間,例如使用複數個搬送滾筒等搬送基板,使用複數個處理裝置(單元)形成構成TFT之閘極、閘絶緣膜、半導體膜、源-汲極等,於基板之被處理面上依序形成顯示元件之構成要素。例如,在形成有機EL元件之場合,係於基板上依序形成發光層、陽極、陰極、電路等。While the substrate is being transferred from the substrate to the wound substrate, for example, a plurality of transfer rollers are used to transport the substrate, and a plurality of processing devices (units) are used to form a gate electrode, a gate insulating film, a semiconductor film, a source-drain, and the like which constitute the TFT. The constituent elements of the display element are sequentially formed on the surface to be processed of the substrate. For example, in the case of forming an organic EL element, a light-emitting layer, an anode, a cathode, a circuit, and the like are sequentially formed on a substrate.

先行技術文獻Advanced technical literature

[專利文獻1] 國際公開第2006/100868號公報[Patent Document 1] International Publication No. 2006/100868

在進行上述捲繞方式之場合,被要求一處理效率高、可獲得高生產量之處理系統。In the case of performing the above-described winding method, a processing system having high processing efficiency and high throughput can be obtained.

本發明態樣之目的在提供一種可獲得高生產量之基板處理系統及顯示元件之製造方法。It is an object of the present invention to provide a substrate processing system and a method of manufacturing a display element which can achieve high throughput.

本發明一態樣提供一種基板處理系統,具備:複數個基板收容裝置,具有收容基板之收容室;複數個基板處理裝置,具有連接於複數個前述基板收容裝置之連接部,在前述基板收容裝置連接於前述連接部的狀態下對前述基板進行處理;引導裝置,引導複數個前述基板收容裝置分別與複數個前述基板處理裝置之各個連接;以及控制裝置,控制前述引導裝置以使複數個前述基板收容裝置分別與複數個前述基板處理裝置之各個以既定順序連接。An aspect of the present invention provides a substrate processing system including: a plurality of substrate housing devices having a housing chamber for housing a substrate; and a plurality of substrate processing devices having a connection portion connected to the plurality of substrate housing devices, wherein the substrate housing device The substrate is processed while being connected to the connecting portion; the guiding device guides each of the plurality of substrate receiving devices to each of the plurality of substrate processing devices; and the control device controls the guiding device to make the plurality of the substrates Each of the housing devices is connected to each of the plurality of substrate processing apparatuses in a predetermined order.

本發明另一態樣提供一種顯示元件之製造方法,係使用上述態樣之基板處理系統於基板形成顯示元件。Another aspect of the present invention provides a method of fabricating a display device in which a display device is formed on a substrate using the substrate processing system of the above aspect.

根據本發明之態樣,可提供一種能獲得高生產量之基板處理系統及顯示元件之製造方法。According to an aspect of the present invention, a substrate processing system capable of obtaining a high throughput and a method of manufacturing a display element can be provided.

以下,參照圖式說明本發明之實施形態。Hereinafter, embodiments of the present invention will be described with reference to the drawings.

圖1係顯示本實施形態之基板處理系統SYS之全體構成的前視圖。Fig. 1 is a front view showing the overall configuration of a substrate processing system SYS of the present embodiment.

如圖1所示,基板處理系統SYS例如係設在製造工廠之地面FL,具有第一層部分1及第二層部分2。As shown in FIG. 1, the substrate processing system SYS is provided, for example, on the floor FL of a manufacturing plant, and has a first layer portion 1 and a second layer portion 2.

於基板處理系統SYS之第一層部分1,設有收容裝置搬入口10、收容裝置搬出口11及基板裝填裝置12。基板處理系統SYS之第二層部分2係以壁部2a圍起來之無塵室。於第二層部分2設有於一方向排列配置之複數個基板處理裝置PR。此外,於第一層部分1及第二層部分2連接有引導裝置GD及複數個基板收容裝置ST。In the first layer portion 1 of the substrate processing system SYS, a receiving device loading port 10, a receiving device carrying port 11 and a substrate loading device 12 are provided. The second layer portion 2 of the substrate processing system SYS is a clean room surrounded by the wall portion 2a. The second layer portion 2 is provided with a plurality of substrate processing apparatuses PR arranged in a line. Further, a guiding device GD and a plurality of substrate housing devices ST are connected to the first layer portion 1 and the second layer portion 2.

以下,於基板處理系統SYS之說明中,設定一XYZ正交座標系,一邊參照此XYZ正交座標系一邊說明各構件之位置關係。於以下之圖中,係將XYZ正交座標系中與地面FL平行之平面設為XY平面。XY平面中、複數個基板處理裝置PR排列之方向設為Y方向、與Y方向正交之方向設為X方向。又,與地面FL(XY平面)垂直之方向設為Z軸方向。Hereinafter, in the description of the substrate processing system SYS, an XYZ orthogonal coordinate system is set, and the positional relationship of each member will be described with reference to the XYZ orthogonal coordinate system. In the following figures, the plane parallel to the ground FL in the XYZ orthogonal coordinate system is set to the XY plane. In the XY plane, the direction in which the plurality of substrate processing apparatuses PR are arranged is set to the Y direction, and the direction orthogonal to the Y direction is set to the X direction. Further, the direction perpendicular to the ground FL (XY plane) is set to the Z-axis direction.

基板處理系統SYS,係對形成為帶狀之具有可撓性的基板S表面施以各種處理的卷對卷方式(以下,簡稱「捲繞方式」)的系統。基板處理系統SYS,係用在於基板S上例如形成有機EL元件、液晶顯示元件等顯示元件(電子元件)等場合。當然,在形成此等元件以外之元件之場合,亦可使用基板處理系統SYS。The substrate processing system SYS is a system in which a roll-to-roll method (hereinafter, simply referred to as a "winding method") is applied to various surfaces of a flexible substrate S formed in a strip shape. The substrate processing system SYS is used to form, for example, a display element (electronic element) such as an organic EL element or a liquid crystal display element on the substrate S. Of course, the substrate processing system SYS can also be used in the case of forming components other than these components.

基板處理系統SYS中作為處理對象之基板S,可使用例如樹脂薄膜及不鏽鋼等之箔(foil)。例如樹脂薄膜可使用聚乙烯樹脂、聚丙烯樹脂、聚酯樹脂、乙烯乙烯基共聚物樹脂、聚氯乙烯樹脂、纖維素樹脂、聚醯胺樹脂、聚醯亞胺樹脂、聚碳酸酯樹脂、聚苯乙烯樹脂、聚乙烯醇樹脂等材料。For the substrate S to be processed in the substrate processing system SYS, for example, a resin film or a foil such as stainless steel can be used. For example, a resin film may be a polyethylene resin, a polypropylene resin, a polyester resin, an ethylene vinyl copolymer resin, a polyvinyl chloride resin, a cellulose resin, a polyamide resin, a polyimide resin, a polycarbonate resin, or a poly Styrene resin, polyvinyl alcohol resin and other materials.

基板S之短邊方向尺寸係形成為例如50cm~2m程度,而長邊方向尺寸(1周尺寸)則形成為例如10m以上。當然,此尺寸僅為一例,並不限於此。例如基板S之短邊方向尺寸可以是50cm以下、亦可以是2m以上。本實施形態中,可使用短邊方向尺寸超過2m之基板S。此外,基板S長邊方向尺寸可以是10m以下。The dimension of the substrate S in the short-side direction is, for example, about 50 cm to 2 m, and the dimension in the longitudinal direction (one-week dimension) is, for example, 10 m or more. Of course, this size is only an example and is not limited thereto. For example, the dimension of the substrate S in the short side direction may be 50 cm or less, or may be 2 m or more. In the present embodiment, the substrate S having a short side dimension of more than 2 m can be used. Further, the dimension of the substrate S in the longitudinal direction may be 10 m or less.

基板S具有例如1mm以下之厚度,並形成為具有可撓性。此處所稱之可撓性,係指例如對基板施以至少自重程度之既定力亦不會斷裂或破裂、而能將該基板加以彎折之性質。此外,例如因上述既定力而彎折之性質亦包含於所指之可撓性。又,上述可撓性會隨著該基板材質、大小、厚度、以及温度等之環境等而改變。再者,基板S可使用一片帶狀之基板、亦可使用將複數單位基板加以連接而形成為帶狀之構成。The substrate S has a thickness of, for example, 1 mm or less and is formed to have flexibility. The term "flexibility" as used herein means, for example, the property of imparting a predetermined force to the substrate at least to its own weight, without breaking or cracking, and bending the substrate. Further, for example, the property of being bent by the predetermined force described above is also included in the flexibility indicated. Further, the flexibility described above varies depending on the material, size, thickness, temperature, and the like of the substrate. Further, as the substrate S, a strip-shaped substrate may be used, or a plurality of unit substrates may be connected to form a strip shape.

基板S,以承受例如200℃程度之熱其尺寸亦不變化之熱膨漲係數小者較佳。例如可將無機填料混於樹脂薄膜以降低熱膨漲係數。作為無機填料,例如有氧化鈦、氧化鋅、氧化鋁、氧化矽等。It is preferable that the substrate S has a small thermal expansion coefficient which does not change in size to withstand heat of, for example, about 200 °C. For example, an inorganic filler may be mixed in the resin film to lower the thermal expansion coefficient. Examples of the inorganic filler include titanium oxide, zinc oxide, aluminum oxide, cerium oxide, and the like.

圖2係顯示基板收容裝置ST之構成的剖面圖。Fig. 2 is a cross-sectional view showing the configuration of the substrate housing device ST.

如圖2所示,基板收容裝置ST具有具複數個壁面之容器(筐體)20。容器20係形成為例如其外形大致為長方體。於容器20內部,形成有以構成容器20之壁部圍繞之收容室RM。基板S被收容在此收容室RM。容器20在一壁部20a具有二個開口部(EN、EX)。本實施形態中,基板收容裝置ST係在此壁部20a朝向+X側之狀態下使用。As shown in FIG. 2, the substrate housing device ST has a container (case) 20 having a plurality of wall surfaces. The container 20 is formed, for example, in a substantially rectangular parallelepiped shape. Inside the container 20, a housing chamber RM that surrounds the wall portion constituting the container 20 is formed. The substrate S is housed in the housing chamber RM. The container 20 has two openings (EN, EX) in one wall portion 20a. In the present embodiment, the substrate housing device ST is used in a state where the wall portion 20a faces the +X side.

二個開口部中之一方係將基板搬入收容室RM之基板搬入口EN。二個開口部中之另一方係用以將收容室RM之基板搬出之基板搬出口EX。本實施形態雖以基板搬入口EN配置在基板搬出口EX之-Z側之構成為例做了說明,但當然亦可以是相反的配置。One of the two openings is to carry the substrate into the substrate transfer inlet EN of the storage chamber RM. The other of the two openings is a substrate carrying port EX for carrying out the substrate of the storage chamber RM. In the present embodiment, the configuration in which the substrate loading port EN is disposed on the -Z side of the substrate carrying-out port EX has been described as an example. However, the arrangement may be reversed.

於容器20之-Z側之面(底面)設有複數個輪子(載台驅動部)28。複數個輪子28於X方向配置成二行。於基板收容裝置ST設有驅動輪子28以使容器20往X方向移動之驅未圖示的驅動機構。控制裝置CONT可藉由此驅動機構調整容器20之移動量及移動時序等。A plurality of wheels (stage driving portions) 28 are provided on the surface (bottom surface) on the -Z side of the container 20. A plurality of wheels 28 are arranged in two rows in the X direction. The substrate housing device ST is provided with a drive mechanism (not shown) that drives the wheels 28 to move the container 20 in the X direction. The control unit CONT can adjust the amount of movement of the container 20, the movement timing, and the like by the drive mechanism.

在收容室RM中之基板搬入口EN近旁設有搬入滾筒22。搬入滾筒22係在將從基板搬入口EN往收容室RM於-X方向搬入之基板S從Z方向夾著的位置設置一對。搬入滾筒22可旋轉以將從基板搬入口EN搬入之基板S拉入收容室RM。A loading roller 22 is provided in the vicinity of the substrate loading inlet EN in the storage chamber RM. The loading roller 22 is provided in a pair between the substrate S that is carried in the -X direction from the substrate loading port EN in the -X direction. The loading roller 22 is rotatable to pull the substrate S carried in from the substrate loading inlet EN into the storage chamber RM.

於搬入滾筒22之下游側設有方向轉換滾筒23。方向轉換滾筒23具有滾筒23a及23b。於方向轉換滾筒23之下游側設有折返部24。折返部24具有複數個(此處為8個)滾筒24a~24h。各滾筒24a~24h分別形成為圓筒狀,被配置成中心軸沿Y軸延伸,於X方向彼此平行。A direction change roller 23 is provided on the downstream side of the loading roller 22. The direction change roller 23 has rollers 23a and 23b. A folded-back portion 24 is provided on the downstream side of the direction change roller 23. The folded portion 24 has a plurality of (here, eight) rollers 24a to 24h. Each of the rollers 24a to 24h is formed in a cylindrical shape, and is disposed such that the central axis extends along the Y axis and is parallel to each other in the X direction.

滾筒24a、24c、24e及24g沿著容器20之+Z側壁部配置。滾筒24b、24d、24f及24h則沿著容器20之-Z側壁部配置。對以此方式配置之滾筒24a~24h,基板S係以滾筒24a、滾筒24b、滾筒24c、滾筒24d、滾筒24e、滾筒24f、滾筒24g、滾筒24h之順序掛於其上。如此,由於係交互掛在配置於Z側之滾筒與配置在-Z側之滾筒,因此係一能有效收容形成為帶狀之基板S的構成。The rollers 24a, 24c, 24e, and 24g are disposed along the +Z side wall portion of the container 20. The rollers 24b, 24d, 24f, and 24h are disposed along the -Z side wall portion of the container 20. In the rollers 24a to 24h arranged in this manner, the substrate S is hung thereon in the order of the drum 24a, the drum 24b, the drum 24c, the drum 24d, the drum 24e, the drum 24f, the drum 24g, and the drum 24h. In this way, since the drum disposed on the Z side and the drum disposed on the -Z side are alternately suspended, the configuration of the substrate S formed in a strip shape can be effectively accommodated.

於滾筒24h下游側、基板搬出口EX之近旁設有搬出滾筒25。搬出滾筒25在Z方向夾著基板S之位置設有一對。亦即,搬出滾筒25在基板S之表面側及背面側分別設有一個。搬出滾筒25可旋轉以將從基板搬出口EX搬出之基板S送出至收容室RM外部。又,於容器20之+X側壁部20a設有突出於+X方向之突出部29。A carry-out drum 25 is provided on the downstream side of the drum 24h and in the vicinity of the substrate discharge port EX. The carry-out drum 25 is provided with a pair at a position sandwiching the substrate S in the Z direction. That is, the carry-out roller 25 is provided one on each of the front side and the back side of the substrate S. The carry-out drum 25 is rotatable to feed the substrate S carried out from the substrate carry-out port EX to the outside of the storage chamber RM. Further, the +X side wall portion 20a of the container 20 is provided with a protruding portion 29 that protrudes in the +X direction.

又,為兩了將基板S在如圖2所示之折返狀態下收容至收容室RM,亦可在基板S之搬送路徑、例如各滾筒之間、設置引導基板S之表面或背面的導板。此導板,可設在基板S之表面側或背面側之任一方、亦可設在兩方。此外,作為此導板,亦可使用空氣導引。Further, in order to accommodate the substrate S in the folded-back state as shown in FIG. 2, the guide plate RM may be placed on the transfer path of the substrate S, for example, between the respective rollers, and the guide plate may be provided on the front or back surface of the guide substrate S. . The guide plate may be provided on either the front side or the back side of the substrate S, or may be provided on both sides. Further, as the guide, air guiding can also be used.

如圖1所示,設在基板處理系統SYS之第一層部分1之收容裝置搬入口10,係搬入上述基板收容裝置ST之部分。又,收容裝置搬出口11係搬出基板收容裝置ST之部分。收容裝置搬出口11設在收容裝置搬入口10之+Y側。基板裝填裝置12將基板S充填至基板收容裝置ST之收容室RM。基板裝填裝置12設在收容裝置搬入口10之-Y側。As shown in FIG. 1, the storage device loading port 10 provided in the first layer portion 1 of the substrate processing system SYS is carried into the portion of the substrate housing device ST. Further, the storage device outlet 11 is a portion that carries out the substrate storage device ST. The storage device outlet 11 is provided on the +Y side of the storage device inlet 10. The substrate loading device 12 fills the substrate S into the storage chamber RM of the substrate housing device ST. The substrate loading device 12 is provided on the -Y side of the storage device carrying inlet 10.

圖3係顯示基板裝填裝置12之構成的圖。FIG. 3 is a view showing the configuration of the substrate loading device 12.

如圖3所示,基板裝填裝置12具有片材卷121R、導帶卷122R、片材搬送滾筒123RL、導帶搬送滾筒124、加工台125、切刀126、接著單元127、排出滾筒128、連接埠129及排出埠(基板挿入部)130。As shown in FIG. 3, the substrate loading device 12 has a sheet roll 121R, a tape roll 122R, a sheet conveying roller 123RL, a tape transfer roller 124, a processing table 125, a cutter 126, an following unit 127, a discharge roller 128, and a connection. The crucible 129 and the discharge crucible (substrate insertion portion) 130.

片材卷121R係充填至基板收容裝置ST之基板S之供應源,捲繞有基板S。導帶卷122R係貼於基板S前端及後端之導帶L之供應源,捲繞有此導帶L。從片材卷121R及導帶卷122R分別送出基板S及導帶L。The sheet roll 121R is filled with a supply source of the substrate S of the substrate housing device ST, and the substrate S is wound. The tape guide roll 122R is attached to a supply source of the tape L at the front end and the rear end of the substrate S, and the tape L is wound. The substrate S and the conduction tape L are respectively delivered from the sheet roll 121R and the tape guide roll 122R.

片材搬送滾筒123RL將從片材卷121R送出之基板S往加工台125搬送。導帶搬送滾筒124將從導帶卷122R送出之導帶L往加工台125搬送。切刀126用切斷被搬送至加工台125之導帶L。接著單元127則將被切斷之導帶L與基板S之前端(或後端)加以接著。The sheet conveying roller 123RL transports the substrate S sent from the sheet roll 121R to the processing table 125. The tape guide roller 124 conveys the tape L sent from the tape roll 122R to the processing table 125. The cutter 126 cuts the conduction belt L that is conveyed to the processing table 125. Next, the unit 127 follows the cut-off conduction band L and the front end (or the rear end) of the substrate S.

排出滾筒128將接著了導帶L之基板S從排出埠130排出至基板裝填裝置12之外部。連接埠129具有用以使基板收容裝置ST之突出部29挿入的凹部。在突出部29插入連接埠129之凹部之狀態下,將基板收容裝置ST與基板裝填裝置12加以連接。The discharge roller 128 discharges the substrate S following the tape L from the discharge port 130 to the outside of the substrate loading device 12. The port 129 has a recess for inserting the protruding portion 29 of the substrate housing device ST. The substrate housing device ST is connected to the substrate loading device 12 in a state where the protruding portion 29 is inserted into the concave portion of the connection port 129.

於突出部29及連接埠129分別設有未圖示之端子,藉由將突出部29插入連接埠129之凹部,使基板收容裝置ST與基板裝填裝置12電連接。當然,亦可作成於突出部29及連接埠129分別配置空壓系管線之端部、及真空系管線之端部,藉由將突出部29插入連接埠129之凹部據以將基板收容裝置ST之管線與基板裝填裝置12之管線加以連接。A terminal (not shown) is provided in each of the protruding portion 29 and the connection port 129, and the substrate storage device ST is electrically connected to the substrate loading device 12 by inserting the protruding portion 29 into the concave portion of the connection port 129. Of course, it is also possible to form the end portion of the air pressure system line and the end portion of the vacuum line in the protruding portion 29 and the port 129, and insert the protruding portion 29 into the recess of the port 129 to thereby press the substrate housing device ST. The pipeline is connected to the pipeline of the substrate loading device 12.

圖4係顯示貼有導帶L之狀態之基板S構成的圖。Fig. 4 is a view showing a configuration of a substrate S in a state in which the conduction band L is attached.

如圖4所示,於基板S在排列於長邊方向之複數個區域3形成有元件(例如大型顯示器等)。又,導帶L,具有貼在基板S之前端Sh之前端導帶L1、與貼在基板S之後端Se之後端導帶L2。於前端導帶L1及後端導帶L2分別設有缺口部La及開口部Lb。As shown in FIG. 4, an element (for example, a large display or the like) is formed on a plurality of regions 3 in which the substrate S is arranged in the longitudinal direction. Further, the conduction band L has an end conduction band L1 attached to the front end Sh of the substrate S, and an end conduction band L2 attached to the rear end Se of the substrate S. The front end conduction belt L1 and the rear end conduction belt L2 are respectively provided with a notch portion La and an opening portion Lb.

缺口部La及開口部Lb,係用於例如掛在基板處理系統SYS所具備之處理裝置PR內之搬送系之突起部等、或用作為位置對準之基準位置的部分。又,於前端導帶L1形成有進行方向標記Lc,於後端導帶L2則形成有進行方向標記Ld。此種貼有導帶L之基板S被收容在基板收容裝置ST之收容室RM。The notch portion La and the opening portion Lb are used, for example, in a projection portion of a transport system that is hung in the processing device PR included in the substrate processing system SYS, or as a reference position for alignment. Further, the front end guide belt L1 is formed with the direction mark Lc, and the rear end belt L2 is formed with the direction mark Ld. The substrate S to which the tape guide tape L is attached is housed in the housing chamber RM of the substrate housing device ST.

又,設在前端導帶L1及後端導帶L2之缺口部La及開口部Lb,可以圖3所示之切刀126等進行加工。Moreover, the notch part La and the opening part Lb provided in the front end conduction belt L1 and the rear end conduction belt L2 can be processed by the cutter 126 etc. shown in FIG.

又,於導帶L設有未圖示之電子標籤(IC tag)或磁條等之資訊記錄部。於此資訊記錄部中,記錄有對基板S之加工及處理相關之各種資料(處理條件、處理結果、批次管理等之資訊)。記錄在資訊記錄部之資訊,係記錄成可覆寫至例如設於基板收容裝置ST之記憶部、即設於控制裝置CONT之記憶部等。Further, the tape L is provided with an information recording unit such as an electronic tag (IC tag) or a magnetic strip (not shown). In the information recording unit, various materials (processing conditions, processing results, batch management, and the like) related to the processing and processing of the substrate S are recorded. The information recorded in the information recording unit is recorded so as to be rewritable to, for example, a memory unit provided in the substrate housing device ST, that is, a memory unit provided in the control unit CONT.

圖5係從上方觀察圖1所示之基板處理系統SYS之第二層部分2之構成的俯視圖。圖6係顯示第二層部分2之部分構成的側視圖。Fig. 5 is a plan view showing the configuration of the second layer portion 2 of the substrate processing system SYS shown in Fig. 1 as viewed from above. Fig. 6 is a side view showing a part of the second layer portion 2.

如圖1、圖5及圖6所示,設在基板處理系統SYS之第二層部分2之基板處理裝置PR,係進行用以對基板S形成顯示元件之各種處理的裝置。作為此種基板處理裝置PR,本實施形態中,例如可以是用以在基板S形成間隔壁的間隔壁形成裝置、用以形成用來驅動有機EL元件之電極的電極形成裝置、用以形成有機EL元件之發光層的發光層形成裝置等。As shown in FIG. 1, FIG. 5, and FIG. 6, the substrate processing apparatus PR provided in the second layer portion 2 of the substrate processing system SYS is a device for performing various processes for forming a display element on the substrate S. In the present embodiment, the substrate processing apparatus PR may be, for example, a partition forming device for forming a partition wall on the substrate S, and an electrode forming device for forming an electrode for driving the organic EL element to form an organic A light-emitting layer forming device or the like of the light-emitting layer of the EL element.

具體而言,例如有液滴塗布裝置(例如噴墨型塗布裝置、凹版(photogravure)印刷裝置等)、蒸鍍裝置、濺鍍裝置等成膜裝置、以及曝光裝置、顯影裝置、表面改質裝置、洗淨裝置等。本實施形態中,係從-Y側往+Y側依序配置此種進行各種處理之第一基板處理裝置PR1、第二基板處理裝置PR2、第三基板處理裝置PR3及第四基板處理裝置PR4。又,作為處理裝置,亦可配置其他進行各種工程(加熱等)之處理裝置。Specifically, for example, a film forming device such as a droplet applying device (for example, an inkjet coating device or a photogravure printing device), a vapor deposition device, a sputtering device, and the like, and an exposure device, a developing device, and a surface modifying device , washing equipment, etc. In the present embodiment, the first substrate processing apparatus PR1, the second substrate processing apparatus PR2, the third substrate processing apparatus PR3, and the fourth substrate processing apparatus PR4 that perform various processes are sequentially disposed from the -Y side to the +Y side. . Further, as the processing device, other processing devices for performing various types of engineering (heating or the like) may be disposed.

各基板處理裝置PR具有在與基板收容裝置ST之間進行基板S之收授的收授部30。收授部30,具有將基板S排出至基板收容裝置ST之基板搬入口EN的排出埠30N、與從基板收容裝置ST之基板搬出口EX擷取基板S之擷取埠(拉入埠、基板拉出部)30X。此外,各基板處理裝置PR具有連接於基板收容裝置ST之突出部29的連接埠39(圖6)。Each of the substrate processing apparatuses PR has a receiving unit 30 that performs the reception of the substrate S with the substrate housing device ST. The receiving unit 30 includes a discharge port 30N for discharging the substrate S to the substrate transfer inlet EN of the substrate storage device ST, and a pick-up device for drawing the substrate S from the substrate transfer port EX of the substrate storage device ST (pull-in, substrate) Pull out) 30X. Further, each of the substrate processing apparatuses PR has a port 39 (FIG. 6) connected to the protruding portion 29 of the substrate housing device ST.

於連接埠39分別設有未圖示之端子,藉由將突出部29插入連接埠39之凹部,據以使基板收容裝置ST與各個之基板處理裝置PR電連接。當然,亦可作成於連接埠39配置空壓系之管線端部及真空系之管線端部,並藉由將突出部29插入連接埠39之凹部以將基板收容裝置ST之管線與基板處理裝置PR之管線連接。Each of the ports 39 is provided with a terminal (not shown), and the projecting portion 29 is inserted into the recess of the port 39 to electrically connect the substrate housing device ST to each of the substrate processing devices PR. Of course, it is also possible to form the end portion of the line in which the air pressure system is connected to the port 39 and the end portion of the line of the vacuum system, and to insert the protrusion 29 into the recess of the port 39 to connect the line and the substrate processing device of the substrate housing device ST. Pipeline connection for PR.

圖7係顯示作為基板處理裝置PR之一例,使用間隔壁形成裝置PR1時之構成的圖。FIG. 7 is a view showing a configuration in which the partition forming device PR1 is used as an example of the substrate processing apparatus PR.

如圖7所示,間隔壁形成裝置PR1具有包含紫外線硬化樹脂層形成部31、調温部32、印記(imprint)形成部33、紫外線照射部34、緩衝部35及空調部36的處理部。此外,間隔壁形成裝置PR1具有上述排出埠30N及擷取埠30X。As shown in FIG. 7, the partition wall forming apparatus PR1 has a processing unit including an ultraviolet curable resin layer forming portion 31, a temperature adjusting portion 32, an imprint forming portion 33, an ultraviolet ray irradiating portion 34, a buffer portion 35, and an air conditioning portion 36. Further, the partition wall forming device PR1 has the above-described discharge port 30N and the suction port 30X.

紫外線硬化樹脂層形成部31以塗布法在從擷取埠30X擷取至裝置內之基板S表面形成紫外線硬化樹脂之層。調温部32進行形成有紫外線硬化樹脂層之基板S之調温。控制裝置CONT可控制調温部32之調整量。印記形成部33於紫外線硬化樹脂層形成既定圖案。The ultraviolet curable resin layer forming portion 31 forms a layer of an ultraviolet curable resin on the surface of the substrate S which is drawn from the pick 30X to the inside of the device by a coating method. The temperature adjustment unit 32 performs temperature adjustment of the substrate S on which the ultraviolet curable resin layer is formed. The control unit CONT controls the amount of adjustment of the temperature adjustment unit 32. The imprint forming portion 33 forms a predetermined pattern on the ultraviolet curable resin layer.

印記形成部33具有壓模(stamper)滾筒33a及壓接滾筒33b。於壓模滾筒33a表面形成有待形成於紫外線硬化樹脂層之間隔壁的模。壓接滾筒33b將基板S之表面側壓接於壓模滾筒33a表面。因此,基板S即被搬送通過壓模滾筒33a與壓接滾筒33b之間,據以將間隔壁之圖案形成在基板S上之紫外線硬化樹脂層。The stamp forming portion 33 has a stamper roller 33a and a pressure roller 33b. A mold to be formed on the partition wall of the ultraviolet curable resin layer is formed on the surface of the stamper drum 33a. The pressure roller 33b presses the surface side of the substrate S against the surface of the stamper drum 33a. Therefore, the substrate S is conveyed between the stamper drum 33a and the pressure roller 33b, and the pattern of the partition walls is formed on the ultraviolet curable resin layer on the substrate S.

紫外線照射部34對基板S之紫外線硬化樹脂層照射紫外線。紫外線照射部34具有照射紫外線之複數個光源。於通過紫外線照射部34之基板S即形成硬化狀態之間隔壁。緩衝部35係通過紫外線照射部34之基板S被收容一定量之部分。經由緩衝部35之基板S從擷取埠30X往基板收容裝置ST排出。空調部36具有從間隔壁形成裝置PR1內之空氣中除去塵埃等異物之過濾器36a及36b。過濾器36a及36b係使用HEPA過濾器等。The ultraviolet ray irradiation unit 34 irradiates the ultraviolet ray curable resin layer of the substrate S with ultraviolet rays. The ultraviolet ray irradiation unit 34 has a plurality of light sources that emit ultraviolet rays. The substrate S passing through the ultraviolet ray irradiation portion 34 forms a partition wall in a hardened state. The buffer portion 35 is housed in a predetermined amount by the substrate S of the ultraviolet irradiation unit 34. The substrate S passing through the buffer portion 35 is discharged from the suction cassette 30X to the substrate housing device ST. The air conditioning unit 36 has filters 36a and 36b for removing foreign matter such as dust from the air in the partition forming device PR1. The filters 36a and 36b use a HEPA filter or the like.

此外,如圖1所示,引導裝置GD具有、車架40、軌(引導軌條)41、台車(載台)42、升降機構43及44。引導裝置GD在第一層部分1及第二層部分2及該等之間引導基板收容裝置ST。車架40在基板收容裝置ST之引導方向(Y方向)設在一直線上。軌41形成為延伸於Y方向,於車架40之+Z側面上於X方向設定二條(參照圖3)。Further, as shown in FIG. 1, the guiding device GD has a frame 40, a rail (guide rail) 41, a carriage (stage) 42, and lifting mechanisms 43 and 44. The guiding device GD guides the substrate housing device ST between the first layer portion 1 and the second layer portion 2 and between. The frame 40 is disposed on a straight line in the guiding direction (Y direction) of the substrate housing device ST. The rail 41 is formed to extend in the Y direction, and two rails are disposed on the +Z side of the frame 40 in the X direction (see FIG. 3).

台車42被設置成能沿軌41移動於Y方向。於台車42之-Z側之面42b形成有嵌入軌41之凹部42d。台車42被設置成能在軌41嵌入凹部42d之狀態下沿此軌41移動於Y方向。The trolley 42 is arranged to be movable in the Y direction along the rail 41. A recess 42d of the embedded rail 41 is formed on the surface 42b on the -Z side of the carriage 42. The carriage 42 is disposed to be movable in the Y direction along the rail 41 in a state where the rail 41 is fitted into the recess 42d.

台車42具有裝載基板收容裝置ST之裝載面42a。於台車42之裝載面42a形成有平行延伸於X方向之一對軌42c。於軌42c裝載基板收容裝置ST之輪子28。此輪子28分別配置在與軌42c對向之位置。因此,各輪子28可沿軌42c移動。承上所述,基板收容裝置ST係設置成可相對引導裝置GD獨立的移動於X方向。The carriage 42 has a loading surface 42a on which the substrate housing device ST is mounted. The loading surface 42a of the carriage 42 is formed with a pair of rails 42c extending in parallel in the X direction. The wheel 28 of the substrate housing device ST is loaded on the rail 42c. This wheel 28 is disposed at a position opposite to the rail 42c, respectively. Thus, each wheel 28 is movable along rail 42c. As described above, the substrate housing device ST is provided to be movable in the X direction independently of the guiding device GD.

升降機構43在裝載了基板收容裝置ST之狀態下往+Z方向移動,據以將基板收容裝置ST從第一層部分1搬往第二層部分2。升降機構44裝載來自第二層部分2之基板收容裝置ST往-Z方向移動,據以將基板收容裝置ST從第二層部分2搬往第一層部分1。The elevating mechanism 43 moves in the +Z direction while the substrate housing device ST is loaded, and accordingly, the substrate housing device ST is transported from the first layer portion 1 to the second layer portion 2. The elevating mechanism 44 carries the substrate housing device ST from the second layer portion 2 in the -Z direction, whereby the substrate housing device ST is transported from the second layer portion 2 to the first layer portion 1.

其次,說明具有上述構成之基板處理系統SYS之動作。Next, the operation of the substrate processing system SYS having the above configuration will be described.

控制裝置CONT,在從外部將基板收容裝置ST搬入第一層部分1之收容裝置搬入口10時,將台車42配置在此基板收容裝置ST之-Z側,並將基板收容裝置ST裝載於裝載面42a。基板收容裝置ST以既定間隔從收容裝置搬入口10搬入。When the substrate accommodating device ST is carried into the accommodating device loading port 10 of the first layer portion 1 from the outside, the control unit CONT is placed on the -Z side of the substrate accommodating device ST, and the substrate accommodating device ST is loaded on the loading device. Face 42a. The substrate storage device ST is carried in from the storage device loading port 10 at a predetermined interval.

在裝載基板收容裝置ST後,控制裝置CONT使台車42往-Y方向移動將基板收容裝置ST引導至基板裝填裝置12。控制裝置CONT使基板收容裝置ST沿著形成於台車42之軌42c往+X側移動,以將突出部29插入連接埠129。在此狀態下,控制裝置CONT從基板裝填裝置12將基板S裝填至基板收容裝置ST。此基板S,係在圖4所示之貼有導帶L之狀態下被收容在基板收容裝置ST。After the substrate housing device ST is loaded, the control device CONT moves the carriage 42 in the -Y direction to guide the substrate housing device ST to the substrate loading device 12. The control unit CONT moves the substrate housing device ST along the rail 42c formed on the carriage 42 to the +X side to insert the projection 29 into the port 129. In this state, the control unit CONT loads the substrate S from the substrate loading device 12 to the substrate housing device ST. This substrate S is housed in the substrate housing device ST in a state in which the tape L is attached as shown in FIG. 4 .

基板S被收容在基板收容裝置ST後,控制裝置CONT使台車42移動至升降機構43上。之後,控制裝置CONT使升降機構43往+Z側移動,將台車42往第二層部分2搬送。控制裝置CONT使台車42往+Y側移動,將此台車42配置在第二層部分2之軌41上。台車42之移動後,控制裝置CONT使升降機構43往-Z側移動,使接著將被搬入之基板收容裝置ST處於待機狀態。如此,控制裝置CONT使用升降機構43將被搬入第一層部分1之基板收容裝置ST依序往第二層部分2搬送。After the substrate S is housed in the substrate housing device ST, the control device CONT moves the carriage 42 to the lifting mechanism 43. Thereafter, the control unit CONT moves the elevating mechanism 43 to the +Z side, and transports the bogie 42 to the second layer portion 2. The control unit CONT moves the carriage 42 to the +Y side, and the carriage 42 is placed on the rail 41 of the second layer portion 2. After the movement of the carriage 42, the control unit CONT moves the elevating mechanism 43 to the -Z side, and then the substrate storage device ST to be carried in is placed in a standby state. In this way, the control device CONT transports the substrate housing device ST carried into the first layer portion 1 to the second layer portion 2 in order using the elevating mechanism 43.

控制裝置CONT,將在第二層部分2從升降機構43往軌41移動之台車42,先配置在第一基板處理裝置PR1之-X側。於此狀態下,控制裝置CONT使台車42之位置固定,並使基板收容裝置ST單獨往+X側移動。藉由此動作,突出部29即插入連接埠39,基板收容裝置ST連接於各基板處理裝置PR。The control unit CONT first arranges the carriage 42 that moves from the elevating mechanism 43 to the rail 41 in the second layer portion 2 on the -X side of the first substrate processing apparatus PR1. In this state, the control unit CONT fixes the position of the carriage 42 and moves the substrate housing unit ST to the +X side alone. By this operation, the protruding portion 29 is inserted into the connection port 39, and the substrate housing device ST is connected to each substrate processing device PR.

在基板收容裝置ST連接於第一基板處理裝置PR1後,控制裝置CONT,使基板S從基板收容裝置ST之基板搬出口EX排出。此外,控制裝置CONT,將排出之基板S從第一基板處理裝置PR1之擷取埠30X搬入第一基板處理裝置PR1之內部。於第一基板處理裝置PR1之內部,對基板S分別進行上述間隔壁形成處理。After the substrate housing device ST is connected to the first substrate processing device PR1, the control device CONT causes the substrate S to be discharged from the substrate carrying port EX of the substrate housing device ST. Further, the control unit CONT carries the discharged substrate S from the first 处理 30X of the first substrate processing apparatus PR1 into the inside of the first substrate processing apparatus PR1. The partition wall forming process is performed on the substrate S in the inside of the first substrate processing apparatus PR1.

於第一基板處理裝置PR1對所有基板S進行了處理、並將基板S收容於基板收容裝置ST之收容室RM後,控制裝置CONT使基板收容裝置ST往-X側移動。藉由此動作,基板收容裝置ST與第一基板處理裝置PR1之連接即被解除。After the first substrate processing apparatus PR1 has processed all the substrates S and the substrate S is housed in the storage chamber RM of the substrate housing apparatus ST, the control unit CONT moves the substrate housing apparatus ST to the -X side. By this operation, the connection between the substrate housing device ST and the first substrate processing device PR1 is released.

控制裝置CONT,將解除了與第一基板處理裝置PR1之連接之基板收容裝置ST配置於第二基板處理裝置PR2之+X側,並使基板收容裝置ST連接於第二基板處理裝置PR2。控制裝置CONT,於第二基板處理裝置PR2,對收容在基板收容裝置ST之基板S進行處理。處理結束後,即解除與第二基板處理裝置PR2之連接。The control device CONT arranges the substrate housing device ST that has been disconnected from the first substrate processing device PR1 on the +X side of the second substrate processing device PR2, and connects the substrate housing device ST to the second substrate processing device PR2. The control device CONT processes the substrate S housed in the substrate housing device ST in the second substrate processing device PR2. After the end of the process, the connection with the second substrate processing apparatus PR2 is released.

之後,使基板收容裝置ST依序連接於第三基板處理裝置PR3及第四基板處理裝置PR4,對基板S進行處理。於第二基板處理裝置PR2、第三基板處理裝置PR3及第四基板處理裝置PR4,係進行作為在第一基板處理裝置PR1進行之間隔壁形成處理之後製程的處理。此種處理,例如有電極形成處理及發光層形成處理等。Thereafter, the substrate housing device ST is sequentially connected to the third substrate processing device PR3 and the fourth substrate processing device PR4 to process the substrate S. The second substrate processing apparatus PR2, the third substrate processing apparatus PR3, and the fourth substrate processing apparatus PR4 perform processing as a process after the partition wall forming process performed by the first substrate processing apparatus PR1. Such a treatment includes, for example, an electrode formation treatment and a light-emitting layer formation treatment.

此種在第二層部分2之動作,例如針對一基板收容裝置ST結束了在第一基板處理裝置PR1之處理後,連接於第二基板處理裝置PR2之場合,第一基板處理裝置PR1即成為空的狀態。因此,控制裝置CONT即使次一基板收容裝置ST連接於此空狀態之第一基板處理裝置PR1。如此,藉由依序使次一基板收容裝置ST連接於空的基板處理裝置PR以進行處理,即能以高效率進行對基板S之處理。When the second substrate portion 2 is connected to the second substrate processing device PR2 after the processing of the first substrate processing device PR1 is completed, for example, the first substrate processing device PR1 becomes Empty state. Therefore, the control device CONT is connected to the first substrate processing device PR1 in the empty state even if the next substrate housing device ST is connected. In this way, by sequentially connecting the next substrate housing device ST to the empty substrate processing device PR for processing, the processing of the substrate S can be performed with high efficiency.

在各基板處理裝置PR之處理(本實施形態中,係在第四基板處理裝置PR4之處理)結束後,控制裝置CONT使台車42往+Y側移動將其裝載於升降機構44上。在將台車42裝載於升降機構44上後,控制裝置CONT使升降機構44往-Z側移動,將台車42及裝載在此台車42之基板收容裝置ST往第一層部分1搬送。升降機構44到達第一層部分1後,控制裝置CONT使台車42往-Y側移動,將其配置在第一層部分1之軌41上。又,在使台車42移動後,控制裝置CONT使升降機構44往+Z側移動,使下一個處理將結束之基板收容裝置ST待機。After the processing of each substrate processing apparatus PR (in the present embodiment, the processing by the fourth substrate processing apparatus PR4) is completed, the control unit CONT moves the carriage 42 to the +Y side and mounts it on the elevating mechanism 44. After the carriage 42 is mounted on the elevating mechanism 44, the control unit CONT moves the elevating mechanism 44 to the -Z side, and transports the bogie 42 and the substrate housing apparatus ST loaded on the bobbin 42 to the first layer portion 1. After the lifting mechanism 44 reaches the first layer portion 1, the control unit CONT moves the carriage 42 to the -Y side and arranges it on the rail 41 of the first layer portion 1. Further, after the carriage 42 is moved, the control unit CONT moves the elevating mechanism 44 to the +Z side, and the substrate housing apparatus ST that has finished the next process stands by.

控制裝置CONT,使在第一層部分1從升降機構44配置至軌41上之台車42,往收容裝置搬出口11之正面移動。於此狀態下,控制裝置CONT將台車42上之基板收容裝置ST從收容裝置搬出口11搬出。搬出基板收容裝置ST後,使台車42往收容裝置搬入口10之正面移動。於此狀態下,控制裝置CONT,使下一個將從收容裝置搬入口10搬入之空的基板收容裝置ST待機。如以上所述,台車42係以在第一層部分1及第二層部分2之間循環之方式移動。從收容裝置搬出口11搬出至外部之基板收容裝置ST,被搬送至另一房間(建築物)或工廠,經由顯示元件之組裝步驟,成為空的狀態回到收容裝置搬入口10。The control unit CONT moves the carriage 42 disposed on the rail 41 from the elevating mechanism 44 in the first layer portion 1 to the front surface of the storage unit discharge port 11. In this state, the control unit CONT carries the substrate accommodation device ST on the carriage 42 out of the storage unit discharge port 11. After the substrate storage device ST is carried out, the carriage 42 is moved to the front side of the storage device loading port 10. In this state, the control unit CONT waits for the next substrate storage device ST that has been carried in from the storage device loading port 10. As described above, the trolley 42 moves in a manner to circulate between the first layer portion 1 and the second layer portion 2. The substrate storage device ST that has been carried out from the storage device outlet 11 to the outside is transported to another room (building) or factory, and is returned to the storage device loading port 10 in an empty state via the assembly step of the display elements.

如此,根據本實施形態,由於裝備了:具有收容基板S之收容室RM的複數個基板收容裝置ST、具有連接於複數個基板收容裝置ST各個之連接埠39並在基板收容裝置ST連接於連接埠39之狀態下對基板S進行處理的複數個基板處理裝置PR、引導複數個基板收容裝置ST之各個與複數個基板處理裝置PR之各個連接的引導裝置GD、以及控制引導裝置GD使複數個基板收容裝置ST之各個對複數個基板處理裝置PR之各個以既定順序連接的控制裝置CONT,因此能有效率的對收容在基板收容裝置ST之基板S進行處理。據此,能提供一種能獲得高生產量之基板處理系統SYS。According to the present embodiment, the plurality of substrate storage devices ST having the storage chamber RM in which the substrate S is housed are provided, and the connection ports 39 connected to the plurality of substrate storage devices ST are connected to the substrate storage device ST. In the state of the 埠39, the plurality of substrate processing apparatuses PR for processing the substrate S, the guiding device GD for guiding each of the plurality of substrate housing devices ST, and the plurality of substrate processing apparatuses PR, and the control guiding device GD are plural Since each of the plurality of substrate processing apparatuses PR is connected to the control unit CONT of each of the plurality of substrate processing apparatuses PR in a predetermined order, the substrate S accommodated in the substrate housing apparatus ST can be efficiently processed. According to this, it is possible to provide a substrate processing system SYS capable of obtaining a high throughput.

又,可進行收納在基板收容裝置ST之基板S之每既定長度之批次管理,因此能提升生產管理、降低停機時間(down time)。Moreover, since batch management for each predetermined length of the substrate S accommodated in the substrate housing apparatus ST can be performed, the production management can be improved and the down time can be reduced.

此外,亦可視例如顯示元件之大小及顯示元件之數量預先決定基板S之長度,教該尺寸之基板S收容於基板收容裝置ST。Further, the length of the substrate S may be determined in advance, for example, by the size of the display element and the number of display elements, and the substrate S of the size may be accommodated in the substrate housing device ST.

此場合,收容於基板收容裝置ST之基板S之長度,可視顯示元件之大小及顯示元件之數量而於每一基板收容裝置ST不同。In this case, the length of the substrate S accommodated in the substrate housing device ST differs depending on the size of the display element and the number of display elements in each of the substrate housing devices ST.

又,控制裝置CONT可考慮基板收容裝置ST收容之基板S之長度,來管理複數個基板處理裝置PR之處理時間等。Moreover, the control unit CONT can manage the processing time of the plurality of substrate processing apparatuses PR in consideration of the length of the substrate S accommodated in the substrate housing apparatus ST.

本發明之技術範圍不限於上述實施形態,在不脫離本發明之趣旨範圍內當然可以有適當的變更。The technical scope of the present invention is not limited to the above-described embodiments, and may be appropriately modified without departing from the scope of the invention.

上述實施形態中,雖係舉複數個基板處理裝置PR設在車架40之+X側之構成為例做了說明,但不限於此。例如圖8所示,亦可以是基板處理裝置PR之一部分設在車架40之-X側之構成。In the above embodiment, the configuration in which a plurality of substrate processing apparatuses PR are provided on the +X side of the frame 40 has been described as an example, but the present invention is not limited thereto. For example, as shown in FIG. 8, one of the substrate processing apparatuses PR may be provided on the -X side of the frame 40.

圖8所示構成中,第三基板處理裝置PR3與第五基板處理裝置PR5於X方向隔著車架40設置。第五基板處理裝置PR5係與第三基板處理裝置PR3進行相同處理之裝置。第五基板處理裝置PR5被配置成連接埠39朝向+X側。In the configuration shown in Fig. 8, the third substrate processing apparatus PR3 and the fifth substrate processing apparatus PR5 are disposed in the X direction via the frame 40. The fifth substrate processing apparatus PR5 is a device that performs the same processing as the third substrate processing apparatus PR3. The fifth substrate processing apparatus PR5 is configured such that the connection port 39 faces the +X side.

又,第三基板處理裝置PR3與第五基板處理裝置PR5進行之相同處理,係指例如液滴塗布處理、蒸鍍處理、曝光處理、成膜處理、蝕刻處理、表面改質處理、洗淨處理等,第三基板處理裝置PR3與第五基板處理裝置PR5只要具備此種處理功能即可,裝置製造廠及處理機構可以不同。The third substrate processing apparatus PR3 and the fifth substrate processing apparatus PR5 perform the same processing, for example, a droplet coating process, a vapor deposition process, an exposure process, a film formation process, an etching process, a surface modification process, and a cleaning process. For example, the third substrate processing apparatus PR3 and the fifth substrate processing apparatus PR5 may have such a processing function, and the apparatus manufacturing plant and the processing mechanism may be different.

又,第三基板處理裝置PR3係相對車架40於+X側隔著間隔配置。在車架40中被第三基板處理裝置PR3與第五基板處理裝置PR5夾著之位置,設有可移動於X方向之可動部分45。可動部分45係以可移動之方式設在延伸於X方向之軌45a上。當可動部分45在裝載了基板收容裝置ST之狀態下往+X側滑動時,即將基板收容裝置ST配置在能與基板處理裝置PR3連接之位置。Further, the third substrate processing apparatus PR3 is disposed on the +X side with respect to the frame 40 at intervals. A movable portion 45 movable in the X direction is provided at a position sandwiched by the third substrate processing apparatus PR3 and the fifth substrate processing apparatus PR5 in the frame 40. The movable portion 45 is movably provided on the rail 45a extending in the X direction. When the movable portion 45 slides to the +X side in a state where the substrate housing device ST is loaded, the substrate housing device ST is placed at a position connectable to the substrate processing device PR3.

於第五基板處理裝置PR5與車架40之間設有轉盤46。轉盤46設置成能藉由第二載台驅動部(未圖示)以Z軸為中心旋轉。於轉盤46之+Z側之面形成有可連接於軌45a之軌46a。在軌46a中連接於軌45a之連接部46b被配置在+X側之狀態下,可動部分45可移至轉盤46上。A turntable 46 is disposed between the fifth substrate processing apparatus PR5 and the frame 40. The turntable 46 is provided to be rotatable about the Z axis by the second stage drive unit (not shown). A rail 46a connectable to the rail 45a is formed on the +Z side of the turntable 46. In the state where the connecting portion 46b connected to the rail 45a in the rail 46a is disposed on the +X side, the movable portion 45 can be moved to the turntable 46.

當可動部分45配置在轉盤46上之狀態下轉盤46旋轉180°時,裝載於可動部分45之基板收容裝置ST之基板搬入口EN及基板搬出口EX即朝向-X側。因此,基板收容裝置ST可連接於第五基板處理裝置PR5。藉由此構成,在例如第三基板處理裝置PR3之節拍(takt)較低之場合等,可平行設置複數個此低節拍製程之基板處理裝置PR。When the movable portion 45 is placed on the turntable 46, the turntable 46 is rotated by 180°, and the substrate transfer inlet EN and the substrate transfer opening EX of the substrate housing device ST mounted on the movable portion 45 are oriented toward the -X side. Therefore, the substrate housing device ST can be connected to the fifth substrate processing device PR5. With this configuration, for example, when the takt of the third substrate processing apparatus PR3 is low, a plurality of substrate processing apparatuses PR of the low-tempo processing can be arranged in parallel.

又,圖8中,在第三基板處理裝置PR3與第五基板處理裝置PR5之間,相同構造之二個可動部分45於X方向排列設置。而其中一方之可動部分45為將基板收容裝置ST連接於第三基板處理裝置PR3而往X方向移動,另一方之可動部分45則為將基板收容裝置ST連接於第五基板處理裝置PR3而往X方向移動。Further, in Fig. 8, between the third substrate processing apparatus PR3 and the fifth substrate processing apparatus PR5, the two movable portions 45 of the same structure are arranged in the X direction. The movable portion 45 of one of the movable portions 45 is connected to the third substrate processing apparatus PR3 and moved in the X direction, and the other movable portion 45 is connected to the fifth substrate processing apparatus PR3 by the substrate housing device ST. Move in the X direction.

如此,藉由設置二個可動部分45,可同時使用第三基板處理裝置PR3與第五基板處理裝置PR5之雙方。Thus, by providing the two movable portions 45, both the third substrate processing device PR3 and the fifth substrate processing device PR5 can be used at the same time.

為充分活用此優點,圖8中雖設置了轉盤46,但亦可代替性的,省略轉盤46之設置,而具有一可使將基板收容裝置ST連接於第五基板處理裝置PR5側之可動部分45移動於X方向移動,並以Z軸為中心旋轉180°之機構。此場合,可旋轉之可動部分45即擔負可動部分及轉盤之角色,構成一可藉由第二載台驅動部(未圖示)移動及旋轉之第二載台。In order to fully utilize this advantage, although the turntable 46 is provided in FIG. 8, the arrangement of the turntable 46 may be omitted, and a movable portion for connecting the substrate housing device ST to the side of the fifth substrate processing apparatus PR5 may be provided instead. 45 A mechanism that moves in the X direction and rotates 180° around the Z axis. In this case, the rotatable movable portion 45 functions as a movable portion and a turntable to constitute a second stage that can be moved and rotated by the second stage driving portion (not shown).

例如,在對於第二基板處理裝置PR之處理結束之一基板收容裝置ST進行次一處理時,當先行之基板收容裝置ST連接於第三基板處理裝置PR3之情形時,使此一基板收容裝置ST連接於第五基板處理裝置PR5。據此,可降低基板收容裝置ST之處理等待時間。如此,即能根據在基板處理裝置PR之處理時間之長度,設定各個基板收容裝置ST之引導目標,據以防止基板處理系統SYS整體之節拍(takt)降低。For example, when the substrate receiving device ST is subjected to the next processing for the end of the processing of the second substrate processing apparatus PR, when the preceding substrate housing apparatus ST is connected to the third substrate processing apparatus PR3, the substrate housing apparatus is provided. The ST is connected to the fifth substrate processing apparatus PR5. According to this, the processing waiting time of the substrate housing device ST can be reduced. In this way, the guidance target of each substrate storage device ST can be set in accordance with the length of the processing time of the substrate processing apparatus PR, thereby preventing the takt of the entire substrate processing system SYS from being lowered.

又,亦可以是例如圖9A及圖9B所示,第五基板處理裝置PR5在第三基板處理裝置PR3之+Z側階層配置之構成。圖9A所示構成中,設有在第三基板處理裝置PR3與第五基板處理裝置PR5之間搬送基板收容裝置ST之升降裝置(第二載台)90。升降裝置(第二載台)90係設置成可藉由第二載台驅動部(未圖示)沿Z軸升降。Further, for example, as shown in FIGS. 9A and 9B, the fifth substrate processing apparatus PR5 may be arranged in a layer on the +Z side of the third substrate processing apparatus PR3. In the configuration shown in FIG. 9A, a lifting device (second stage) 90 that transports the substrate housing device ST between the third substrate processing device PR3 and the fifth substrate processing device PR5 is provided. The lifting device (second stage) 90 is provided so as to be movable up and down along the Z-axis by the second stage driving unit (not shown).

升降裝置90具有升降機91及支柱部92。升降機91具有裝載基板收容裝置ST之裝載部91a及91b。裝載部91a及裝載部91b係於Z方向設置為二層。此裝載部91a與裝載部91b之間隔係和第三基板處理裝置PR3與第五基板處理裝置PR5之間隔相等。The lifting device 90 has an elevator 91 and a pillar portion 92. The lifter 91 has loading portions 91a and 91b on which the substrate housing device ST is mounted. The loading unit 91a and the loading unit 91b are provided in two layers in the Z direction. The interval between the loading portion 91a and the loading portion 91b is equal to the interval between the third substrate processing device PR3 and the fifth substrate processing device PR5.

因此,藉由將基板收容裝置ST分別裝載於裝載部91a及裝載部91b,即如圖9B所示,成為裝載於裝載部91a之基板收容裝置ST與裝載於裝載部91b之基板收容裝置ST同時連接於基板處理裝置PR。Therefore, the substrate storage device ST is mounted on the mounting portion 91a and the loading portion 91b, respectively, that is, as shown in FIG. 9B, the substrate housing device ST mounted on the loading portion 91a and the substrate housing device ST mounted on the loading portion 91b are simultaneously Connected to the substrate processing apparatus PR.

圖9B中,裝載於裝載部91a之基板收容裝置ST之突出部29連接於第三基板處理裝置PR3之連接埠39,且裝載於裝載部91b之基板收容裝置ST之突出部29連接於第五基板處理裝置PR5之連接埠39。如此,藉由複數個基板處理裝置PR於重力方向重疊配置之構成,與圖8所示之構成同樣的,在第三基板處理裝置PR3節拍較低之情形等時,可平行設置複數個此低節拍製程之基板處理裝置PR,而能防止基板處理系統SYS整體之節拍降低。In Fig. 9B, the protruding portion 29 of the substrate housing device ST mounted on the loading portion 91a is connected to the port 39 of the third substrate processing device PR3, and the protruding portion 29 of the substrate housing device ST mounted on the loading portion 91b is connected to the fifth portion. The connection of the substrate processing apparatus PR5 is 埠39. In this manner, a plurality of substrate processing apparatuses PR are arranged to overlap each other in the direction of gravity, and similarly to the configuration shown in FIG. 8, when the third substrate processing apparatus PR3 has a low beat, etc., a plurality of such lows can be set in parallel. The substrate processing apparatus PR of the process is tempered, and the overall beat of the substrate processing system SYS can be prevented from being lowered.

又,上述實施形態中,雖係舉基板處理裝置PR配置成直線狀或階層狀之構成為例做了說明,但不限於此。例如,亦可以是將複數個基板處理裝置PR沿圓周方向配置之構成。圖10所示之構成中,係將6個基板處理裝置PRA~PRF圍著形成為圓環狀之環狀轉盤(第二載台)TTR配置。環狀轉盤(第二載台)TTR設置可藉由第二載台驅動部(未圖示)以Z軸為中心旋轉。Further, in the above-described embodiment, the configuration in which the substrate processing apparatus PR is arranged in a straight line or a hierarchical shape has been described as an example, but the present invention is not limited thereto. For example, a plurality of substrate processing apparatuses PR may be arranged in the circumferential direction. In the configuration shown in Fig. 10, six substrate processing apparatuses PRA to PRF are disposed around an annular turntable (second stage) TTR formed in an annular shape. The ring-shaped turntable (second stage) TTR is set to be rotatable about the Z-axis by the second stage drive unit (not shown).

如圖10所示,基板處理裝置PRA~PRF分別沿著環狀轉盤TTR之周方向配置。各基板處理裝置PRA~PRF於環狀轉盤TTR之周方向配置在分別錯開45°之位置。基板處理裝置PRA~PRF配置成各個連接埠39朝向環狀轉盤TTR之外周側。As shown in FIG. 10, the substrate processing apparatuses PRA to PRF are arranged along the circumferential direction of the ring-shaped turntable TTR, respectively. Each of the substrate processing apparatuses PRA to PRF is disposed at a position shifted by 45° in the circumferential direction of the ring-shaped turntable TTR. The substrate processing apparatuses PRA to PRF are disposed such that the respective ports 39 are oriented toward the outer peripheral side of the ring-shaped turntable TTR.

於環狀轉盤TTR上形成有軌部221~228。軌部221~228分別具有平行配置之一對軌。軌部221~228延伸於朝向環狀轉盤TTR中心之方向。軌部221~228係在環狀轉盤TTR之周方向配置在分別錯開45°之位置。Rail portions 221 to 228 are formed on the ring-shaped turntable TTR. The rail portions 221 to 228 each have a pair of rails arranged in parallel. The rail portions 221 to 228 extend in a direction toward the center of the ring-shaped turntable TTR. The rail portions 221 to 228 are disposed at positions shifted by 45° in the circumferential direction of the ring-shaped turntable TTR.

於軌部221~228,設有裝載基板收容裝置ST之8個裝載部211~218。圖10所示之狀態,裝載部211~216分別配置在與基板處理裝置PRA~PRF對向之位置。裝載部217係配置在從環狀轉盤TTR搬出基板收容裝置ST之位置。裝載部218則係配置在將基板收容裝置ST搬入環狀轉盤TTR之位置。The rail portions 221 to 228 are provided with eight mounting portions 211 to 218 on which the substrate housing device ST is mounted. In the state shown in FIG. 10, the loading units 211 to 216 are respectively disposed at positions facing the substrate processing apparatuses PRA to PRF. The loading unit 217 is disposed at a position where the substrate housing device ST is carried out from the ring-shaped turntable TTR. The loading unit 218 is disposed at a position where the substrate housing device ST is carried into the ring-shaped turntable TTR.

裝載部211~218設置成能沿著軌部221~228之延伸方向移動。藉由使配置在與基板處理裝置PRA~PRF對向位置之裝載部211~216在搭載有基板收容裝置ST之狀態下移動至環狀轉盤TTR之外周側,而使各裝載部211~216上之基板收容裝置ST分別連接於基板處理裝置PRA~PRF。又,裝載部211~216從此狀態移動至環狀轉盤TTR之內周側,據以解除各基板收容裝置ST與基板處理裝置PRA~PRF之連接。The loading portions 211 to 218 are provided to be movable in the extending direction of the rail portions 221 to 228. By moving the mounting units 211 to 216 disposed at the positions facing the substrate processing apparatuses PRA to PRF to the outer peripheral side of the ring-shaped turntable TTR while the substrate housing device ST is mounted, the loading units 211 to 216 are placed on the mounting portions 211 to 216. The substrate housing devices ST are connected to the substrate processing devices PRA to PRF, respectively. Moreover, the loading units 211 to 216 are moved from the state to the inner peripheral side of the ring-shaped turntable TTR, and the connection between the substrate storage apparatuses ST and the substrate processing apparatuses PRA to PRF is released.

在各基板收容裝置ST與基板處理裝置PRA~PRF之連接被解除之狀態下使環狀轉盤TTR旋轉45°,各基板收容裝置ST即被配置在與之前連接之基板處理裝置PRA~PRF相鄰之基板處理裝置PRA~PRF對向的位置。以此方式,在每次對基板收容裝置ST之處理結束後使環狀轉盤TTR例如旋轉45°,依序進行基板處理裝置PRA~PRF之各處理,即能有效率的進行處理。When the connection between the substrate storage device ST and the substrate processing devices PRA to PRF is released, the ring-shaped turntable TTR is rotated by 45°, and each of the substrate housing devices ST is disposed adjacent to the previously connected substrate processing devices PRA to PRF. The position at which the substrate processing apparatuses PRA to PRF oppose each other. In this manner, each time the processing of the substrate housing apparatus ST is completed, the ring-shaped turntable TTR is rotated by 45°, for example, and the respective processes of the substrate processing apparatuses PRA to PRF are sequentially performed, that is, the processing can be performed efficiently.

又,於環狀轉盤TTR之中央部設有圓板狀之中央轉盤TTC。中央轉盤TTC設置成能於圓周方向旋轉。於中央轉盤TTC形成有軌部201。軌部201具有平行配置於一方向之一對軌。Further, a center-shaped turntable TTC having a disk shape is provided at a central portion of the ring-shaped turntable TTR. The center turntable TTC is set to be rotatable in the circumferential direction. The rail portion 201 is formed on the center turntable TTC. The rail portion 201 has a pair of rails arranged in parallel in one direction.

軌部201之一對軌之間隔,與分別構成設在環狀轉盤TTR之軌部221~228之一對軌之間隔相同。因此,視中央轉盤TTC之角度位置,連接軌部201與軌部221~228。The interval between one of the rail portions 201 and the rail is the same as the interval between one of the rail portions 221 to 228 provided in the ring-shaped turntable TTR. Therefore, the rail portion 201 and the rail portions 221 to 228 are connected depending on the angular position of the center turntable TTC.

在軌部201連接於軌部221~228中任一者之狀態下,配置在此連接之軌部221~228上之裝載部211~218即能移動至中央轉盤TTC上。因此,可使基板收容裝置ST暫時的退避至中央轉盤TTC上。藉由此構成,例如在使基板處理裝置PRA~PRF中任一者之處理暫時中斷之場合等時,可使連接於此中斷處理之基板處理裝置PR之基板收容裝置ST暫時退避至中央轉盤TTC上。When the rail portion 201 is connected to any of the rail portions 221 to 228, the loading portions 211 to 218 disposed on the rail portions 221 to 228 connected thereto can be moved to the center turntable TTC. Therefore, the substrate housing device ST can be temporarily retracted to the center turntable TTC. With this configuration, for example, when the processing of any of the substrate processing apparatuses PRA to PRF is temporarily interrupted, the substrate housing apparatus ST connected to the substrate processing apparatus PR interrupted by the processing can be temporarily evacuated to the center turntable TTC. on.

又,藉由此構成,能例如使在一基板處理裝置PR之處理結束之基板收容裝置ST暫時退避至中央轉盤TTC上,而視在其他基板處理裝置PR之處理的進展狀況,使基板收容裝置ST適當的從中央轉盤TTC移動至其他基板處理裝置PR。In this configuration, for example, the substrate housing device ST that has been processed by the substrate processing apparatus PR can be temporarily evacuated to the center turntable TTC, and the substrate housing device can be made depending on the progress of the processing of the other substrate processing apparatus PR. The ST is appropriately moved from the center turntable TTC to the other substrate processing apparatus PR.

又,關於基板收容裝置ST之構成,除上述實施形態中之構成外,亦可作成如圖11所示之構成。圖11之構成中,引導基板S之複數個滾筒101~123中之滾筒101~121,係將先前圖2所示之基板S之單次折返狀態作成三次,而配置在將此基板S折返之各該位置。Further, the configuration of the substrate housing device ST may be configured as shown in Fig. 11 in addition to the configuration of the above embodiment. In the configuration of FIG. 11, the rollers 101 to 121 of the plurality of rollers 101 to 123 of the guide substrate S are three times of the single-folded state of the substrate S shown in FIG. 2, and are disposed in the substrate S. Each of these locations.

具體而言,於滾筒106,係以基板S之第一面Sa彼此相對之方式折返基板S。此處,將基板S中、經由滾筒106而折返至此滾筒106下游側之部分稱為第一部分S1。又,將基板S中、經由滾筒106而被折返至與第一部分S1相反方向之部分稱為第四部分S4。Specifically, in the drum 106, the substrate S is folded back so that the first surface Sa of the substrate S faces each other. Here, a portion of the substrate S that is folded back to the downstream side of the drum 106 via the drum 106 is referred to as a first portion S1. Further, a portion of the substrate S that is folded back to the direction opposite to the first portion S1 via the drum 106 is referred to as a fourth portion S4.

於滾筒107,係以第一部分S1之第二面Sb彼此相對之方式折返此第一部分S1。此處,將基板S中、經由滾筒107而被折返至此滾筒107下游側之部分稱為第二部分S2。In the drum 107, the first portion S1 is folded back in such a manner that the second surface Sb of the first portion S1 faces each other. Here, a portion of the substrate S that is folded back to the downstream side of the drum 107 via the drum 107 is referred to as a second portion S2.

於滾筒108及滾筒109,此第二部分S2係被方向轉換為朝向滾筒106。此處,將基板S中、經由滾筒108及滾筒109而被方向轉換之部分稱為第三部分S3。In the drum 108 and the drum 109, this second portion S2 is directionally shifted toward the drum 106. Here, a portion of the substrate S that is direction-converted via the drum 108 and the drum 109 is referred to as a third portion S3.

於滾筒110,此第三部分S3被折返成沿著第四部分S4。同時,例如在基板S從基板搬入口EN往基板搬出口EX之移動狀態中,此第三部分S3經由滾筒110折返成第三部分S3與第四部分S4移動於相反方向。In the drum 110, this third portion S3 is folded back along the fourth portion S4. At the same time, for example, in the moving state of the substrate S from the substrate carrying-in EN to the substrate-ejecting exit EX, the third portion S3 is folded back via the drum 110 so that the third portion S3 and the fourth portion S4 move in opposite directions.

於滾筒106至滾筒110途中,基板S係以上述方式被折返,因此基板S中掛在滾筒101~107之部分、與基板S中掛在滾筒109~115之部分,即成為在Z方向與X方向相隔既定間隔配置。同樣的,於滾筒113至滾筒117途中亦係以大致相同構成折返基板S,因此基板S中掛在滾筒109~115之部分、與基板S中掛在滾筒116~121之部分,成為在Z方向與X方向相隔既定間隔配置。如此,即能在收容室RM之有限的空間中以良好效率收容基板S。In the middle of the drum 106 to the drum 110, the substrate S is folded back in the above manner. Therefore, the portion of the substrate S that is hung between the rollers 101 to 107 and the portion of the substrate S that is hung on the rollers 109 to 115 is in the Z direction and X. The directions are arranged at regular intervals. Similarly, the folding substrate S is substantially the same in the middle of the drum 113 to the roller 117. Therefore, the portion of the substrate S that is hung between the rollers 109 to 115 and the portion of the substrate S that is hung on the rollers 116 to 121 is in the Z direction. It is spaced apart from the X direction by a predetermined interval. In this way, the substrate S can be accommodated with good efficiency in a limited space of the storage chamber RM.

又,上述實施形態中針對引導裝置GD之構成,作為使台車42循環之引導軌條,雖係舉配置在車架40之軌41之構成為例做了說明,但不限於此,亦可以是例如使用金屬線等其他引導軌條之構成。Further, in the above-described embodiment, the configuration of the guide device GD is described as an example in which the guide rail that circulates the bogie 42 is placed on the rail 41 of the frame 40. However, the present invention is not limited thereto. For example, a configuration of other guide rails such as a metal wire is used.

又,本發明並不僅限定於上述實施形態所說明之基板收容裝置ST及基板處理裝置PR(PR1~PR5、PRA~PRF)之構成。以下,針對基板收容裝置(基板保管裝置)及基板處理裝置(處理裝置)之其他構成,參照圖12~圖20加以說明。Further, the present invention is not limited to the configuration of the substrate housing device ST and the substrate processing device PR (PR1 to PR5, PRA to PRF) described in the above embodiments. Hereinafter, other configurations of the substrate housing device (substrate storage device) and the substrate processing device (processing device) will be described with reference to FIGS. 12 to 20 .

圖12係顯示基板保管裝置(基板收容裝置)STR之內部構成的圖。Fig. 12 is a view showing the internal structure of a substrate storage device (substrate storage device) STR.

如圖12所示,基板保管裝置STR具有:收容形成為帶狀具有可撓性之基板S的容器CT、與張掛基板S之基板搬送部CV。基板保管裝置STR,例如係將基板S收容於透過輪子28裝載在未圖示之台車42上之容器CT,並以張掛於基板搬送部CV之狀態加以保管。基板S形成為長邊方向呈無端狀。As shown in FIG. 12, the substrate storage device STR includes a container CT that accommodates a flexible substrate S and a substrate transfer portion CV that mounts the substrate S. For example, the substrate storage device STR is housed in a container CT that is placed on a carriage 42 (not shown) through a wheel 28, and is stored in a state of being attached to the substrate transfer unit CV. The substrate S is formed to have an endless shape in the longitudinal direction.

容器CT形成為例如外形呈大致長方體。又,容器CT之-X側之壁部CTa係成+Z側端部例如傾斜於+X側之形狀。此外,容器CT之+X側端部CTb則成+Z側端部例如向+X側突出之形狀。於容器CT之內部形成有以構成容器CT之壁部(含壁部CTa及CTb)圍繞之收容室RM。The container CT is formed to have, for example, a substantially rectangular parallelepiped shape. Further, the wall portion CTa on the -X side of the container CT is formed such that the end portion on the +Z side is inclined to the +X side, for example. Further, the +X side end portion CTb of the container CT has a shape in which the +Z side end portion protrudes toward the +X side, for example. A storage chamber RM surrounded by a wall portion (including wall portions CTa and CTb) constituting the container CT is formed inside the container CT.

容器CT於壁部CTa具有窗部W。窗部W係連通容器CT之外部與收容室RM而貫通壁部CTa形成之開口部。窗部W配置在壁部CTa之Z方向大致中央。於壁部CTa設有連接部J。連接部J係連接於例如設在處理裝置PA等外部裝置之裝置側連接部590及591的部分。The container CT has a window portion W at the wall portion CTa. The window portion W is an opening portion that communicates with the outside of the container CT and the storage chamber RM and penetrates the wall portion CTa. The window portion W is disposed substantially at the center in the Z direction of the wall portion CTa. A connection portion J is provided in the wall portion CTa. The connection portion J is connected to, for example, a portion of the device-side connection portions 590 and 591 provided in an external device such as the processing device PA.

又,於窗部W設有後述之門片構件,此門片構件因連接處理裝置PA而打開、因處理裝置PA之連接解除而關閉。亦即,在未連接處理裝置PA之狀態中,此門片構件可防止塵埃及碎屑等異物侵入容器CT內。Further, a window member W to be described later is provided in the window portion W, and the door member is opened by the connection processing device PA, and is closed by the connection of the processing device PA. That is, in a state where the processing device PA is not connected, the shutter member prevents foreign matter such as dust and debris from entering the container CT.

連接部J可以處理裝置PA與容器CT之相對位置的偏移受到抑制之方式將處理裝置PA與容器CT加以連接。裝置側連接部590及591係連接於容器CT之壁部CTa中窗部W之緣部。此場合,連接部J係以對應裝置側連接部590及591之連接位置之方式設於窗部W之緣部。如此,連接部J係設在與設置窗部W之壁部CTa相同之壁部CTa,配置在窗部W之周圍。The connecting portion J connects the processing device PA to the container CT in such a manner that the offset of the relative position of the processing device PA and the container CT is suppressed. The device side connecting portions 590 and 591 are connected to the edge portion of the window portion W in the wall portion CTa of the container CT. In this case, the connection portion J is provided at the edge of the window portion W so as to correspond to the connection position of the device-side connection portions 590 and 591. In this way, the connection portion J is provided on the wall portion CTa which is the same as the wall portion CTa of the installation window portion W, and is disposed around the window portion W.

於前述處理裝置PA,除裝置側連接部590及591之外,亦設有夾持滾筒592及593、以及處理部595等。夾持滾筒592及593係配置在於Z方向夾著處理部595之位置。夾持滾筒592之+X側端點及夾持滾筒593之+X側端點皆接觸於與YZ平面平行之平面。In addition to the apparatus side connecting portions 590 and 591, the processing device PA is provided with grip rollers 592 and 593, a processing portion 595, and the like. The grip rollers 592 and 593 are disposed at positions sandwiching the treatment portion 595 in the Z direction. The +X side end of the holding roller 592 and the +X side end of the holding roller 593 are all in contact with a plane parallel to the YZ plane.

處理部595係形成為對圖12中以虛線所示之處理面595a進行既定處理。處理面595a被設定為與YZ平面平行,設定在例如包含夾持滾筒592及593之+X側端點之平面上。前述既定處理,例如有塗布處理、膜形成處理、曝光處理、顯影處理、加熱處理、冷卻處理等。當然,亦可以是進行其他處理之構成。The processing unit 595 is formed to perform predetermined processing on the processing surface 595a indicated by a broken line in Fig. 12 . The processing surface 595a is set to be parallel to the YZ plane, and is set, for example, on a plane including the +X side end points of the grip rollers 592 and 593. The predetermined treatment includes, for example, a coating treatment, a film formation treatment, an exposure treatment, a development treatment, a heat treatment, a cooling treatment, and the like. Of course, it is also possible to carry out other processing.

基板搬送部CV,於收容室RM具有折返基板S之複數個滾筒R。以下,在區別複數個滾筒R之情形時,記載為滾筒511~滾筒566。各滾筒R,分別具有與Y方向平行之軸部Ra。各滾筒R,此軸部Ra被以可旋轉之方式支承於例如容器CT之+Y側及-Y側之壁部。於各滾筒R之軸部Ra周圍,設有用來張掛所收容之基板S之圓筒狀外周部Rb。The substrate transfer unit CV has a plurality of rolls R that are folded back into the substrate S in the storage chamber RM. Hereinafter, when a plurality of rollers R are distinguished, they are described as drums 511 to 566. Each of the rollers R has a shaft portion Ra parallel to the Y direction. Each of the rollers R is rotatably supported by, for example, a wall portion on the +Y side and the -Y side of the container CT. A cylindrical outer peripheral portion Rb for holding the accommodated substrate S is provided around the shaft portion Ra of each of the rollers R.

複數個滾筒R依序配置在收容室RM中之基板S之搬送路徑。複數個滾筒R係相對收容室RM之中央部上下分開配置。本實施形態中,複數個滾筒R係分開配置在相對收容室RM中之Z方向中央部的-Z側第一部分RM1、與相對收容室RM中之Z方向中央部的+Z側第二部分RM2。A plurality of rollers R are sequentially disposed in the transport path of the substrate S in the storage chamber RM. The plurality of rollers R are arranged vertically apart from the central portion of the storage chamber RM. In the present embodiment, the plurality of rollers R are disposed apart from the -Z side first portion RM1 in the Z direction central portion of the storage chamber RM and the +Z side second portion RM2 in the Z direction center portion of the relative storage chamber RM. .

於收容室RM中之第一部分RM1,於Z方向設有3列於X方向配置8個之狀態之滾筒R的列。構成一列之滾筒R之直徑皆相同。又,從-Z側往+Z側越接近收容室RM之Z方向中央部、滾筒R之直徑越小。此外,上述滾筒R之列之外,亦設有轉換基板S之方向之滾筒512及滾筒513。以下,在區別第一部分RM1之滾筒R之列時,將從收容室RM之-Z側往+Z側依序稱為第一列L1~第三列L3。In the first portion RM1 of the storage chamber RM, three rows of rollers R arranged in the X direction are provided in the Z direction. The rollers R constituting one row have the same diameter. Further, the closer to the +Z side from the -Z side, the closer to the center portion of the storage chamber RM in the Z direction, and the smaller the diameter of the drum R. Further, in addition to the row of the rollers R, a roller 512 and a roller 513 for switching the direction of the substrate S are also provided. Hereinafter, when the row of the rollers R of the first portion RM1 is distinguished, the first column L1 to the third row L3 are sequentially referred to from the -Z side to the +Z side of the storage chamber RM.

第一部分RM中,第一列L1、第二列L2及第三列L3之滾筒R中分別配置在最-X側之滾筒529、533、565係以滾筒支承構件567加以固定。滾筒支承構件567設置成能沿引導部568移動於Z方向。滾筒支承構件567連接於例如驅動機構569。此驅動機構569可使滾筒支承構件567滑動於Z方向。藉由此驅動機構569之滾筒支承構件567之移動量及移動時序係以例如控制裝置CONT加以控制。In the first portion RM, the rollers 529, 533, and 565 disposed on the most-X side of the rollers R of the first row L1, the second row L2, and the third row L3 are fixed by the roller supporting member 567. The drum support member 567 is disposed to be movable in the Z direction along the guide portion 568. The drum support member 567 is coupled to, for example, a drive mechanism 569. This drive mechanism 569 can slide the roller support member 567 in the Z direction. The amount of movement and the movement timing of the roller supporting member 567 by the driving mechanism 569 are controlled by, for example, the control unit CONT.

於收容室RM中之第二部分RM2,於Z方向設有3列於X方向配置9個之狀態之滾筒R的列。構成一列之滾筒R之直徑皆相同。又,從+Z側往-Z側越接近收容室RM之Z方向中央部、滾筒R之直徑越小。於第二部分RM2,除上述滾筒R之列外,亦設有轉換基板S之方向之滾筒511、滾筒531及滾筒549。In the second portion RM2 of the storage chamber RM, three rows of rollers R arranged in the X direction are arranged in the Z direction. The rollers R constituting one row have the same diameter. Further, the closer to the -Z side from the +Z side to the -Z side, the smaller the diameter of the roller R is in the central portion in the Z direction of the storage chamber RM. In the second portion RM2, in addition to the row of the rollers R, a drum 511, a drum 531, and a drum 549 for converting the direction of the substrate S are also provided.

又,配置於第二部分RM2之滾筒511及配置於第一部分RM1之滾筒512,配置在於Z方向挾著窗部W之位置。以下,在區別第二部分RM2之滾筒R之列時,將從收容室RM之-Z側往+Z側依序稱為第四列L4~第六列L6。Further, the drum 511 disposed in the second portion RM2 and the drum 512 disposed in the first portion RM1 are disposed at positions where the window portion W is located in the Z direction. Hereinafter, when the column R of the second portion RM2 is distinguished, the fourth column L4 to the sixth column L6 are sequentially referred to from the -Z side to the +Z side of the storage chamber RM.

基板S係依序掛於滾筒511~滾筒566,據以被引導其於收容室RM之搬送路徑。本實施形態中,由於基板S形成為無端狀,因此搬送路徑係於收容室RM循環之路徑。以下,針對基板S之搬送路徑,以滾筒511為起點、以順時鐘方向為順方向加以說明。The substrate S is sequentially attached to the drum 511 to the drum 566, and is guided to the transport path of the storage chamber RM. In the present embodiment, since the substrate S is formed in an endless shape, the transport path is a path through which the storage chamber RM circulates. Hereinafter, the transport path of the substrate S will be described with the drum 511 as a starting point and the clockwise direction as a forward direction.

掛於滾筒511之基板S,經由配在此滾筒511之-Z側之滾筒512而彎向+X側。基板S在滾筒512之下游側,經由配置在收容室RM之-Z側且+X側之角部近旁之滾筒513而被彎折向+Z側。基板S之滾筒513之下游側,經由滾筒R之第四列L4中配置在最+X側之滾筒514而被彎折向-Z側。The substrate S attached to the drum 511 is bent toward the +X side via a drum 512 disposed on the -Z side of the drum 511. The substrate S is bent to the +Z side via the drum 513 disposed on the -Z side of the storage chamber RM and near the corner of the +X side on the downstream side of the drum 512. The downstream side of the drum 513 of the substrate S is bent to the -Z side via the drum 514 disposed on the most +X side in the fourth row L4 of the drum R.

基板S之滾筒514之下游側,經由滾筒R之第一列L1中配置在最+X側之滾筒515而被彎折向+Z側。基板S之滾筒515之下游側,經由第四列L4中與滾筒514於-X側相鄰配置之滾筒516而被彎折向-Z側。基板S之滾筒516之下游側,經由第一列L1中與滾筒515於-X側相鄰配置之滾筒517而被彎折向+Z側。The downstream side of the drum 514 of the substrate S is bent to the +Z side via the drum 515 disposed on the most +X side in the first row L1 of the drum R. The downstream side of the drum 515 of the substrate S is bent to the -Z side via the drum 516 disposed adjacent to the drum 514 on the -X side in the fourth row L4. The downstream side of the drum 516 of the substrate S is bent to the +Z side via the drum 517 disposed adjacent to the drum 515 on the -X side in the first row L1.

之後,於-X方向交互的經由(掛於)第四列L4之滾筒R(滾筒518、520、522、524、526、528及530)與第一列L1之滾筒R(滾筒519、521、523、525、527及529)。經由第四列L4中最-X側之滾筒530之基板S之下游側被彎折向-X側,而掛於方向轉換用滾筒531。Thereafter, the rollers R (rollers 518, 520, 522, 524, 526, 528, and 530) passing through the fourth column L4 and the rollers R (the rollers 519, 521 of the first column L1) are alternately engaged in the -X direction. 523, 525, 527 and 529). The downstream side of the substrate S passing through the drum 530 on the most-X side in the fourth row L4 is bent to the -X side, and is hung on the direction changing roller 531.

基板S之滾筒531之下游側,經由滾筒530之+Z側相鄰配置之滾筒532而被彎折向-Z側。之後,基板S於+X方向交互的經由第二列L2之滾筒R(滾筒533、535、537、539、541、543、545及547)與第五列R5之滾筒R(滾筒534、536、538、540、542、544、546及548)之間。經由第五列L5中最+X側之滾筒548之基板S之下游側被彎折向+X側,而掛於方向轉換用之滾筒549。The downstream side of the drum 531 of the substrate S is bent to the -Z side via the drum 532 disposed adjacent to the +Z side of the drum 530. Thereafter, the substrate S interacts in the +X direction via the rollers R (rollers 533, 535, 537, 539, 541, 543, 545, and 547) of the second column L2 and the rollers R of the fifth column R5 (the rollers 534, 536, Between 538, 540, 542, 544, 546, and 548). The downstream side of the substrate S passing through the roller 548 on the most +X side in the fifth row L5 is bent to the +X side, and is hung on the roller 549 for direction conversion.

基板S之滾筒549之下游側,經由滾筒548之+Z側相鄰配置之滾筒550而被彎折向-Z側。之後,基板S於-X方向交互的經由第三列L3之滾筒R(滾筒551、553、555、557、559、561、563及565)與第五列R5之滾筒R(滾筒552、554、556、558、560、562、564及566)之間。經由第六列L6中最-X側之滾筒566之基板S之下游側被彎折向-Z側,而掛於上述滾筒511。The downstream side of the drum 549 of the substrate S is bent to the -Z side via the drum 550 disposed adjacent to the +Z side of the drum 548. Thereafter, the substrate S interacts in the -X direction via the rollers R (rollers 551, 553, 555, 557, 559, 561, 563, and 565) of the third column L3 and the rollers R of the fifth column R5 (the rollers 552, 554, Between 556, 558, 560, 562, 564 and 566). The downstream side of the substrate S passing through the drum 566 on the most-X side in the sixth row L6 is bent to the -Z side, and is hung on the drum 511.

上述構成中,由於滾筒511及滾筒512係配置在於Z方向夾著窗部W之位置,因此掛在滾筒511及滾筒512之基板S中的滾筒511與滾筒512之間之部分,即被配置在-X側之面(基板S之第二面Sb)露出於窗部W之位置。In the above configuration, since the drum 511 and the drum 512 are disposed at positions sandwiching the window portion W in the Z direction, the portion between the drum 511 and the drum 512 which are hung on the substrate S of the drum 511 and the drum 512 is disposed. The surface on the -X side (the second surface Sb of the substrate S) is exposed at the position of the window portion W.

又,基板搬送部CV具有基板支承部SP。基板支承部SP係配置在與容器CT之窗部W之間夾著基板S之位置。基板支承部SP於Z方向係配置在滾筒511與滾筒512之間。基板支承部SP,具有支承基板S之第一面Sa的支承板571、一對支承滾筒572及573、以及支承此等支承板571、支承滾筒572及573的支承構件574。Further, the substrate transfer portion CV has a substrate support portion SP. The substrate support portion SP is disposed at a position sandwiching the substrate S between the window portion W of the container CT. The substrate support portion SP is disposed between the drum 511 and the drum 512 in the Z direction. The substrate supporting portion SP has a support plate 571 that supports the first surface Sa of the substrate S, a pair of support rollers 572 and 573, and a support member 574 that supports the support plates 571 and the support rollers 572 and 573.

支承板571具有形成在-X側之支承面571a。支承面571a係平坦的形成。支承板571被配置成支承面571a與YZ平面平行。此狀態下,支承面571a係與基板S之第一面Sa對向配置。The support plate 571 has a support surface 571a formed on the -X side. The support surface 571a is formed flat. The support plate 571 is configured such that the support surface 571a is parallel to the YZ plane. In this state, the support surface 571a is disposed to face the first surface Sa of the substrate S.

支承滾筒572及573係設在於Z方向夾著支承板571之位置。支承滾筒572及573形成為圓筒狀或圓柱狀。支承滾筒572及573被配置成中心軸平行於Y方向。支承滾筒572及573之Y方向尺寸大於基板S之Y方向尺寸。支承滾筒572及573被支承構件574支承為能於周方向旋轉。The support rollers 572 and 573 are disposed at positions sandwiching the support plate 571 in the Z direction. The support rollers 572 and 573 are formed in a cylindrical shape or a cylindrical shape. The support rollers 572 and 573 are arranged such that the central axis is parallel to the Y direction. The Y-direction dimensions of the support rollers 572 and 573 are larger than the Y-direction dimension of the substrate S. The support rollers 572 and 573 are supported by the support member 574 so as to be rotatable in the circumferential direction.

支承構件574被固定為一體以避免支承板571、支承滾筒572及573獨立的移動於X方向、Y方向及Z方向。在被支承構件574支承之狀態下,支承滾筒572及573各個之-X側端部(支承基板S之點)與支承面571a係被配置在同一平面上。因此,基板S係被支承面571a及與此支承面571a配置成同一平面狀之二個支承滾筒572、573所支承。The support member 574 is fixed integrally to prevent the support plate 571 and the support rollers 572 and 573 from moving independently in the X direction, the Y direction, and the Z direction. In the state supported by the support member 574, the -X side end portion (the point of the support substrate S) of each of the support rollers 572 and 573 is disposed on the same plane as the support surface 571a. Therefore, the substrate S is supported by the support surface 571a and the two support rollers 572 and 573 which are disposed in the same plane shape as the support surface 571a.

支承構件574設置成可於X方向移動。基板搬送部CV具有可使支承構件574往X方向移動之驅動機構575。控制裝置CONT藉控制此驅動機構575,可調整支承構件574往X方向之移動量及移動時序等。The support member 574 is disposed to be movable in the X direction. The substrate transfer unit CV has a drive mechanism 575 that can move the support member 574 in the X direction. By controlling the drive mechanism 575, the control unit CONT can adjust the amount of movement of the support member 574 in the X direction, the movement timing, and the like.

其次,說明以上述方式構成之基板保管裝置STR之動作。此處,係以對被保管於基板保管裝置STR之基板S進行處理之情形為例加以說明。Next, the operation of the substrate storage device STR configured as described above will be described. Here, a case where the substrate S stored in the substrate storage device STR is processed will be described as an example.

圖13係顯示基板保管裝置STR之一動作例的圖。Fig. 13 is a view showing an example of the operation of the substrate storage device STR.

如圖13所示,在對被保管於基板保管裝置STR之基板S進行處理之情形時,首先,使外部之處理裝置PA之裝置側連接部590及591連接於基板保管裝置STR之連接部J。As shown in FIG. 13, when the substrate S stored in the substrate storage device STR is processed, first, the device-side connecting portions 590 and 591 of the external processing device PA are connected to the connection portion J of the substrate storage device STR. .

在處理裝置PA之連接完成後,控制裝置CONT即控制驅動機構575使支承構件574往-X方向移動。藉由此動作,支承滾筒572及573接觸於基板S之第一面Sa,此第一面Sa被往-X側拉出。控制裝置CONT使支承構件574移動至在支承滾筒572、573與夾持滾筒592、593之間挾持基板S之位置。After the connection of the processing device PA is completed, the control device CONT controls the drive mechanism 575 to move the support member 574 in the -X direction. By this action, the support rollers 572 and 573 are in contact with the first surface Sa of the substrate S, and the first surface Sa is pulled out toward the -X side. The control device CONT moves the support member 574 to a position where the substrate S is held between the support rollers 572, 573 and the clamp rollers 592, 593.

因支承構件574之移動,基板S中被支承滾筒572與夾持滾筒592挾持的部分、以及被支承滾筒573與夾持滾筒593挾持的部分之間的部分Sc,及從窗部W被拉至收容室RM之外部,而呈相對處理裝置PA之處理部595為露出的狀態。Due to the movement of the support member 574, the portion of the substrate S held by the support roller 572 and the grip roller 592, and the portion Sc between the portion supported by the support roller 573 and the grip roller 593 are pulled up from the window portion W. The outside of the storage chamber RM is in a state in which the processing unit 595 of the processing unit PA is exposed.

此露出部分Sc被支承板571之支承面571a支承,沿著此支承面571a被配置成與YZ平面平行。又,露出部分Sc沿著支承面571a配置,而成為被配置在處理裝置PA之處理部595的處理面595a上。The exposed portion Sc is supported by the support surface 571a of the support plate 571, and is disposed parallel to the YZ plane along the support surface 571a. Further, the exposed portion Sc is disposed along the support surface 571a, and is placed on the processing surface 595a of the processing portion 595 of the processing apparatus PA.

另一方面,藉由上述動作之進行,基板S之搬送路徑從圖12之狀態開始變化。具體而言,沿著基板保管裝置STR之-X側壁部CTa之搬送路徑,即變得長露出部分Sc從窗部W被拉出至基板保管裝置STR外部之份。相對於此,被保管在基板保管裝置STR之基板S係形成為無端狀,其長度一定。因此,須調整基板S之張力,以避免對基板S施加過度之張力。On the other hand, by the above operation, the transport path of the substrate S changes from the state of FIG. Specifically, the transport path along the -X side wall portion CTa of the substrate storage device STR, that is, the long exposed portion Sc is pulled out from the window portion W to the outside of the substrate storage device STR. On the other hand, the substrate S stored in the substrate storage device STR is formed in an endless shape, and its length is constant. Therefore, the tension of the substrate S must be adjusted to avoid excessive tension applied to the substrate S.

為此,控制裝置CONT控制驅動機構569使滾筒支承構件567往+Z側移動。藉由此動作,滾筒529、533、565即與滾筒支承構件567一起沿著引導部568往+Z側移動。因此,基板S中被掛於此滾筒529、533、565之部分之搬送路徑變短。To this end, the control unit CONT controls the drive mechanism 569 to move the roller support member 567 to the +Z side. By this action, the rollers 529, 533, and 565 move along the guide portion 568 toward the +Z side together with the roller support member 567. Therefore, the transport path of the portion of the substrate S that is hung on the rollers 529, 533, and 565 is shortened.

此場合,控制裝置CONT調整支承構件574之移動量及滾筒支承構件567之移動量中至少一方,以使因支承構件574之移動而變化之基板S之搬送路徑之變化量與因滾筒支承構件567之移動而變化之搬送路徑之變化量相等。藉由此動作,基板S之搬送路徑之路徑長被維持於一定,因此不會對基板S施加過度之張力。In this case, the control unit CONT adjusts at least one of the amount of movement of the support member 574 and the amount of movement of the roller support member 567 so that the amount of change in the conveyance path of the substrate S that changes due to the movement of the support member 574 is dependent on the roller support member 567. The amount of change in the transport path that changes as it moves is equal. By this operation, the path length of the transport path of the substrate S is maintained constant, so that excessive tension is not applied to the substrate S.

如上所述,在一邊維持基板S之搬送路徑之路徑長一定、一邊將基板S配置在處理部595之處理面595a上後,以處理部595進行對基板S之第二面Sb之處理。此處理完成後,控制裝置CONT控制驅動機構569及驅動機構575,一邊將基板S之搬送路徑之路徑長保持一定、一邊使滾筒支承構件567及支承構件574回到原來位置。之後,使裝置側連接部590及591從連接部J脫離,使處理裝置PA從基板保管裝置STR退出。以此方式,進行對基板S之處理。As described above, after the substrate S is placed on the processing surface 595a of the processing unit 595 while maintaining the path length of the transport path of the substrate S, the processing unit 595 performs processing on the second surface Sb of the substrate S. After the completion of the process, the control unit CONT controls the drive mechanism 569 and the drive mechanism 575 to return the roller support member 567 and the support member 574 to their original positions while keeping the path length of the transport path of the substrate S constant. Thereafter, the device side connecting portions 590 and 591 are detached from the connecting portion J, and the processing device PA is withdrawn from the substrate storage device STR. In this way, the processing of the substrate S is performed.

如以上所述,根據本實施形態,由於裝備了具有收容具可撓性形成為無端狀之基板S之收容室RM的容器CT、設於此容器CT之窗部W、以及以收容在收容室RM之基板S之一部分Sc與窗部W對向之方式搬送基板S的基板搬送部CV,因此能於窗部W使基板S露出至收容室RM外部且不會使基板S之其餘部分露出。據此,由於能抑制基板S之露出範圍,因此能抑制塵埃等異物附著在基板S。As described above, according to the present embodiment, the container CT having the storage chamber RM having the substrate S having the endless shape of the storage device, the window portion W provided in the container CT, and the housing portion are housed in the storage chamber. Since one portion Sc of the substrate S of the RM and the substrate portion W are transferred to the substrate transport portion CV of the substrate S, the substrate portion S can be exposed to the outside of the storage chamber RM without exposing the remaining portion of the substrate S. According to this, since the exposure range of the substrate S can be suppressed, it is possible to prevent foreign matter such as dust from adhering to the substrate S.

又,在不對基板S之表面進行加工處理時,可以門片構件關閉窗部W以維持防塵性。Further, when the surface of the substrate S is not processed, the window member can be closed to maintain dustproofness.

又,根據本實施形態,由於係作成基板S被收容在收容室RM之狀態下將處理裝置PA連接於基板保管裝置STR,來對基板S進行處理,因此能在一異物不易附著於基板S之環境進行處理。據此,能防止異物附著於基板S。Further, according to the present embodiment, since the processing apparatus PA is connected to the substrate storage device STR while the substrate S is stored in the storage chamber RM, the substrate S is processed, so that it is less likely to adhere to the substrate S in a foreign matter. The environment is processed. According to this, it is possible to prevent foreign matter from adhering to the substrate S.

圖14係顯示基板保管裝置STR2之構成的圖。基板保管裝置STR2,其在窗部W近旁之容器CT之構成與基板保管裝置STR不同,因此以此相違點為中心進行說明。Fig. 14 is a view showing the configuration of the substrate storage device STR2. In the substrate storage device STR2, the configuration of the container CT in the vicinity of the window portion W is different from that of the substrate storage device STR. Therefore, the description will be focused on this point.

如圖14所示,基板保管裝置STR2,具有用以將基板S從窗部W拉出至外部的拉出部670及671。此拉出部670及671具有安裝在窗部W內周部之機械臂部674及675。機械臂部674安裝在窗部W之+Z側內周面。機械臂部675則安裝在窗部W之-Z側之面。As shown in FIG. 14, the substrate storage device STR2 has pull-out portions 670 and 671 for pulling the substrate S from the window portion W to the outside. The pull-out portions 670 and 671 have robot arm portions 674 and 675 attached to the inner peripheral portion of the window portion W. The mechanical arm portion 674 is attached to the inner circumferential surface of the window portion W on the +Z side. The mechanical arm portion 675 is attached to the side of the window portion W on the -Z side.

機械臂部674及675被設置成能以安裝位置為中心向θY方向旋轉。機械臂部674及675分別連接於機械臂驅動部676及677。機械臂驅動部676及677具有例如未圖示之馬達機構等。控制裝置CONT可控制以機械臂驅動部676及677進行之驅動量及驅動時序。The arm portions 674 and 675 are provided to be rotatable in the θY direction about the mounting position. The arm portions 674 and 675 are connected to the arm driving portions 676 and 677, respectively. The arm driving units 676 and 677 have, for example, a motor mechanism (not shown). The control unit CONT can control the driving amount and the driving timing by the arm driving units 676 and 677.

於機械臂部674及675之前端部分安裝有引導滾筒672及673。引導滾筒672及673係形成為圓筒狀,配置成中心軸與Y軸平行。引導滾筒672及673被設置成能於周方向(θY方向)旋轉。又,於容器CT形成有用以安裝外部之處理裝置PA的裝著部678。此外,亦可取代裝著部678而形成用以配置外部之處理裝置PA的開口部。Guide rollers 672 and 673 are attached to the front end portions of the robot arms 674 and 675. The guide rollers 672 and 673 are formed in a cylindrical shape, and are arranged such that the central axis is parallel to the Y axis. The guide rollers 672 and 673 are provided to be rotatable in the circumferential direction (θY direction). Further, a mounting portion 678 for attaching the external processing device PA to the container CT is formed. Further, instead of the mounting portion 678, an opening for arranging the external processing device PA may be formed.

從此狀態下將基板S拉出至窗部W外部時,控制裝置CONT控制機械臂驅動部676及677,使機械臂部674於圖中反時鐘方向、機械臂部675於圖中順時鐘方向分別旋轉。隨著機械臂部674及機械臂部675之旋轉移動,安裝在機械臂部674及機械臂部675各前端部之引導滾筒672及673即拉著基板S,將基板S拉出至窗部W之外側。When the substrate S is pulled out to the outside of the window portion W from this state, the control unit CONT controls the arm driving portions 676 and 677 so that the mechanical arm portion 674 is in the counterclockwise direction in the drawing, and the mechanical arm portion 675 is clockwise in the figure. Rotate. With the rotational movement of the mechanical arm portion 674 and the mechanical arm portion 675, the guide rollers 672 and 673 attached to the front end portions of the mechanical arm portion 674 and the mechanical arm portion 675 pull the substrate S, and pull the substrate S to the window portion W. Outside.

圖15係顯示以拉出部670及671將基板S從窗部W拉出至收容室RM外部之狀態的圖。FIG. 15 is a view showing a state in which the substrate S is pulled out from the window portion W to the outside of the storage chamber RM by the drawing portions 670 and 671.

如圖15所示,在基板S被拉出的狀態下,配置成機械臂部674及675之前端朝向-X側。As shown in FIG. 15, in a state in which the substrate S is pulled out, the front ends of the arm portions 674 and 675 are arranged to face the -X side.

基板S在掛於引導滾筒672及673之狀態下露出於窗部W之外側。於基板S之引導滾筒672及673間之露出部分Sc的第二面Sb,壓接基板支承構件679之支承面679a。支承面679a形成為例如往+X側凸出之彎曲面。因壓接支承面679a,露出部分Sc即貼著支承面679a而成為往+X側彎曲配置的狀態。又,基板支承構件679係例如旋轉筒。The substrate S is exposed on the outer side of the window portion W in a state of being hung on the guide rollers 672 and 673. The second surface Sb of the exposed portion Sc between the guide rollers 672 and 673 of the substrate S is pressed against the support surface 679a of the substrate supporting member 679. The support surface 679a is formed as, for example, a curved surface that protrudes toward the +X side. The exposed portion Sc is pressed against the support surface 679a by the pressure-bonding support surface 679a, and is in a state of being bent toward the +X side. Further, the substrate supporting member 679 is, for example, a rotating cylinder.

又,因上述機械臂部674及675之動作,沿著壁部CTa之部分之基板S之搬送路徑的路徑長將變長。因此,控制裝置CONT控制驅動機構569以使滾筒支承構件567沿引導部568往+Z側移動,以調整基板S之搬送路徑之路徑長。又,於基板保管裝置STR2,與基板保管裝置STR相較,可以作成使滾筒支承構件567能於Z方向在較大範圍內移動。如此,基板S之搬送路徑之路徑長的調整量即較大。Further, due to the operation of the mechanical arm portions 674 and 675, the path length of the transport path along the substrate S of the portion of the wall portion CTa becomes longer. Therefore, the control unit CONT controls the drive mechanism 569 to move the roller support member 567 toward the +Z side along the guide portion 568 to adjust the path length of the transport path of the substrate S. Further, in the substrate storage device STR2, the roller support member 567 can be moved over a wide range in the Z direction as compared with the substrate storage device STR. Thus, the adjustment amount of the path length of the transport path of the substrate S is large.

在將基板S拉出至收容室RM外部後,將處理裝置PA配置於容器CT之裝著部678。在處理裝置PA裝著於裝著部678之狀態下,處理部695係朝向窗部W之-X側。因此,從X方向觀察露出部分Sc係配置在處理部695之對向位置。於此狀態下,處理部695對基板S之第一面Sa進行處理。After the substrate S is pulled out to the outside of the storage chamber RM, the processing device PA is placed in the attachment portion 678 of the container CT. In a state where the processing device PA is attached to the mounting portion 678, the processing portion 695 faces the -X side of the window portion W. Therefore, the exposed portion Sc is disposed in the opposing position of the processing portion 695 as viewed from the X direction. In this state, the processing unit 695 processes the first surface Sa of the substrate S.

在以處理部695進行處理後,將處理裝置PA從裝著部678取下。取下處理裝置PA後,控制裝置CONT將機械臂部674及675收容至容器CT之收容室RM,同時使滾筒支承構件567往-Z側移動。藉由此動作,一邊將基板S之搬送路徑之路徑長保持一定、一邊與機械臂部674及675一起將基板S收容於收容室RM。After the processing by the processing unit 695, the processing device PA is removed from the mounting portion 678. After the treatment device PA is removed, the control unit CONT accommodates the arm portions 674 and 675 in the storage chamber RM of the container CT while moving the roller support member 567 toward the -Z side. By this operation, the substrate S is accommodated in the storage chamber RM together with the mechanical arm portions 674 and 675 while keeping the path length of the transport path of the substrate S constant.

如上所述,本實施形態,由於係使用機械臂部674及675將基板S從窗部W大幅拉至外部,並在基板S之露出部分Sc與容器CT之間安裝處理裝置PA等外部裝置之構成,因此能對基板S之第一面Sa進行處理。As described above, in the present embodiment, the substrate S is largely pulled out from the window portion W by the robot arm portions 674 and 675, and an external device such as the processing device PA is attached between the exposed portion Sc of the substrate S and the container CT. With this configuration, the first surface Sa of the substrate S can be processed.

又,本實施形態,由於係使用形成有圓柱狀支承面679a之基板支承構件(例如,旋轉鼓)679來支承基板S,因此能以對應支承面679a形狀之形狀將基板S配置在處理部695之對向位置。例如,若支承面679a為平坦面的話,基板S即是以平坦的狀態配置在處理部695之對向位置。Further, in the present embodiment, since the substrate S is supported by the substrate supporting member (for example, the rotating drum) 679 having the columnar supporting surface 679a formed thereon, the substrate S can be disposed in the processing portion 695 in a shape corresponding to the shape of the supporting surface 679a. The opposite position. For example, when the support surface 679a is a flat surface, the substrate S is placed in a flat state at the opposing position of the processing portion 695.

本發明之技術範圍不限制於上述實施形態,在不脫離本發明趣旨之範圍內可適當的加以變更。The technical scope of the present invention is not limited to the above-described embodiments, and can be appropriately modified without departing from the scope of the present invention.

例如,上述實施形態中,雖是窗部W配置在壁部CTa之構成,但當然不限於此,可以是如圖16所示,窗部W配置在壁部CTb或其他壁部之構成。For example, in the above-described embodiment, the window portion W is disposed on the wall portion CTa. However, the present invention is not limited thereto. For example, as shown in FIG. 16, the window portion W may be disposed on the wall portion CTb or another wall portion.

又,上述實施形態中,雖係窗部W設於容器CT之一處的構成,但不限於此,亦可如圖16所示,於容器CT之複數處設置窗部W的構成。此場合,可以是在一壁部配置複數個窗部W的構成,亦可以是在複數個壁部各設置一個或各設置複數個窗部W的構成。Further, in the above-described embodiment, the window portion W is provided in one of the containers CT. However, the configuration is not limited thereto, and as shown in FIG. 16, the window portion W may be provided at a plurality of places of the container CT. In this case, a plurality of window portions W may be disposed in one wall portion, or one or a plurality of window portions W may be provided in each of the plurality of wall portions.

又,除上述實施形態之構成外,亦可如圖17所示,於前述窗部W設置門片構件。作為此門片構件,圖17中,可以是開關窗部W之滑件SL。滑件SL連接於滑動驅動部700。滑動驅動部700可藉由控制裝置CONT之控制,來控制驅動量及驅動之時序(時機)。Further, in addition to the configuration of the above embodiment, as shown in Fig. 17, a window member may be provided in the window portion W. As the door member, in Fig. 17, it may be the slider SL of the switch window portion W. The slider SL is connected to the slide driving unit 700. The slide driving unit 700 can control the driving amount and the timing (timing) of the driving by the control of the control unit CONT.

此構成中,控制裝置CONT可視與外部處理裝置的連接狀態來使窗部W開關。此場合,控制裝置CONT,在外部處理裝置連接於連接部J之情形時,使滑件SL移動至-Z側以使窗部W成為打開狀態。又,控制裝置CONT,在外部處理裝置與連接部J之連接被解除之情形時,則使滑件SL移至+Z側以使窗部W成為關閉狀態。據此,即能防止塵埃等異物侵入收容室RM。In this configuration, the control unit CONT can open and close the window portion W depending on the connection state with the external processing device. In this case, when the external processing device is connected to the connection portion J, the control device CONT moves the slider SL to the -Z side to open the window portion W. Further, when the connection between the external processing device and the connection portion J is released, the control device CONT moves the slider SL to the +Z side to close the window portion W. According to this, it is possible to prevent foreign matter such as dust from entering the storage chamber RM.

又,上述實施形態,雖係以滾筒R配置成與基板S之第一面Sa及第二面Sb之雙方接觸之構成為例做了說明,但不限於此。例如,亦可以是配置成接觸基板S之第一面Sa、而不與第二面Sb接觸之構成。Further, in the above-described embodiment, the configuration in which the drum R is disposed in contact with both the first surface Sa and the second surface Sb of the substrate S has been described as an example, but the invention is not limited thereto. For example, it may be configured to contact the first surface Sa of the substrate S without contacting the second surface Sb.

作為此例,如圖18所示,例如有使用形成為直角二等邊三角形狀之引導構件701及702來彎折基板S之構成等。如圖18所示,基板搬送部CV具有二個搬送部CV1及CV2。於圖中+X側之搬送部CV1,基板S係經由複數個滾筒R以僅接觸第一面Sa之方式呈漩渦狀(圖中+X側)向內側彎折後,再經由滾筒R1彎折向引導構件701。As an example of this, as shown in FIG. 18, for example, the configuration of the substrate S is performed by using the guide members 701 and 702 formed in a right-angled equilateral triangle shape. As shown in FIG. 18, the substrate transfer unit CV has two transfer units CV1 and CV2. In the transport unit CV1 on the +X side in the figure, the substrate S is bent inward in a spiral shape (+X side in the drawing) so as to contact only the first surface Sa via a plurality of rollers R, and then bent through the roller R1. The guide member 701 is folded.

搬送部CV1中,基板S於滾筒R1之下游側係被引導構件701之一邊701a彎折。此基板S於一邊701a之下游側則被引導構件701之斜邊701b以45°角度彎折。又,基板S之此斜邊701b之下游側,在被引導構件701之另一邊701c彎折後,朝向引導構件702。以此方式,基板S之第一面Sa以此方式繞於引導構件701。In the conveyance unit CV1, the substrate S is bent by one side 701a of the guide member 701 on the downstream side of the drum R1. The substrate S is bent at an angle of 45° by the oblique side 701b of the guiding member 701 on the downstream side of the one side 701a. Further, the downstream side of the oblique side 701b of the substrate S is bent toward the other side 701c of the guided member 701, and then faces the guiding member 702. In this way, the first face Sa of the substrate S is wound around the guiding member 701 in this manner.

另一方面,基板S之朝向引導構件702之部分,於引導構件702之一邊702a彎折,與引導構件701之情形同樣的,沿著斜邊702b及另一邊702c依序被彎折。基板S於另一邊702c之下游側則朝向滾筒R2。基板S之第一面Sa以此方式繞於引導構件702。On the other hand, the portion of the substrate S facing the guiding member 702 is bent at one side 702a of the guiding member 702, and is bent along the oblique side 702b and the other side 702c in the same manner as in the case of the guiding member 701. The substrate S faces the drum R2 on the downstream side of the other side 702c. The first face Sa of the substrate S is wound around the guiding member 702 in this manner.

基板S於滾筒R2之下游側,經由複數個滾筒R呈漩渦狀朝向外側彎折後,朝向圖中-X側之搬送部CV2。於搬送部CV2,其構成與上述搬送部CV1相同。也就是說,係僅與基板S之第一面Sa一邊接觸、一邊將此基板S彎折成漩渦狀之構成,於中央部設有滾筒R1、引導構件701、702及滾筒R2。The substrate S is bent toward the outside in a spiral shape via a plurality of rollers R on the downstream side of the drum R2, and then faces the conveying portion CV2 on the -X side in the drawing. The configuration of the transport unit CV2 is the same as that of the transport unit CV1 described above. In other words, the substrate S is bent into a spiral shape only in contact with the first surface Sa of the substrate S, and the roller R1, the guiding members 701 and 702, and the roller R2 are provided at the center portion.

如圖18所示,基板S被彎折成第一面Sa與滾筒R、R1、R2及引導構件701、702接觸,而第二面Sb不與此等滾筒及引導構件接觸。在此種構成中,由於基板搬送部CV能在不接觸基板S之第二面Sb表面之情形下搬送基板S,因此能保護第二面Sb之狀態。As shown in Fig. 18, the substrate S is bent so that the first surface Sa is in contact with the rollers R, R1, R2 and the guiding members 701, 702, and the second surface Sb is not in contact with the rollers and the guiding members. In such a configuration, since the substrate transfer portion CV can transport the substrate S without contacting the surface of the second surface Sb of the substrate S, the state of the second surface Sb can be protected.

又,關於引導構件701及702之構成,不限於形成為上述直角二等邊三角形之構成,例如亦可是將圓筒狀之滾筒配置在直角二等邊三角形之各邊的構成。Further, the configuration of the guiding members 701 and 702 is not limited to the configuration of the right-angled equilateral triangle, and for example, the cylindrical drum may be disposed on each side of the right-angled equilateral triangle.

此外,亦可例如圖19所示,將圖18所示之構成作成於Y方向重疊之構成。此場合,係於搬送部CV1及CV2之+Y側設置搬送部CV3及CV4。搬送部CV1與搬送部CV3為相同構成、搬送部CV2與搬送部CV4為相同構成。搬送部CV1及CV2與搬送部CV3及CV4之間,配置有方向轉換用滾筒801~804。Further, as shown in FIG. 19, for example, the configuration shown in FIG. 18 may be formed so as to overlap in the Y direction. In this case, the transport units CV3 and CV4 are provided on the +Y side of the transport units CV1 and CV2. The conveyance unit CV1 and the conveyance unit CV3 have the same configuration, and the conveyance unit CV2 and the conveyance unit CV4 have the same configuration. The direction changing rollers 801 to 804 are disposed between the transport units CV1 and CV2 and the transport units CV3 and CV4.

基板S在被捲繞於搬送部CV1及CV2後,經由方向轉換用滾筒801及802而被方向轉換,而至搬送部CV3及CV4。又,此基板S在繞至搬送部CV3及CV4後,經由方向轉換用滾筒803及804被方向轉換,再度繞至搬送部CV1及搬送部CV2。此外,繞於方向轉換用滾筒801~804的,恆為基板S之第一面Sa。以此方式,基板S在搬送部CV1~搬送部CV4之間循環。After being wound around the conveyance units CV1 and CV2, the substrate S is direction-converted by the direction change rollers 801 and 802 to the conveyance units CV3 and CV4. After the substrate S is wound around the conveyance units CV3 and CV4, the direction change rollers 803 and 804 are direction-converted, and are again wound around the conveyance unit CV1 and the conveyance unit CV2. Further, it is always the first surface Sa of the substrate S that is wound around the direction changing rollers 801 to 804. In this way, the substrate S circulates between the transport portion CV1 and the transport portion CV4.

圖19所示構成中,基板S係在Y方向被收容成二層。此場合,亦可以是於Y方向並排設置窗部W1及W2之構成。由於能對在Y方向配置二層之基板S之各個分別進行處理,因此能提高處理效率。In the configuration shown in Fig. 19, the substrate S is housed in two layers in the Y direction. In this case, the windows W1 and W2 may be arranged side by side in the Y direction. Since each of the substrates S in which the two layers are arranged in the Y direction can be processed separately, the processing efficiency can be improved.

此外,亦可例如圖20所示,將圖18所示構成於X方向及Z方向配置複數個。此場合,於搬送部CV1及CV2之-Z側設有搬送部CV3及CV4。又,搬送部CV1與搬送部CV3為相同構成,搬送部CV2與搬送部CV4為相同構成。圖20所示構成中,例如針對各搬送部CV1~CV4,可以分別設置窗部W1~W4之構成。如此,由於能在複數處進行處理,因此能提高處理效率。Further, as shown in FIG. 20, for example, a plurality of configurations may be arranged in the X direction and the Z direction in the configuration shown in FIG. 18. In this case, the transport units CV3 and CV4 are provided on the -Z side of the transport units CV1 and CV2. Further, the transport unit CV1 and the transport unit CV3 have the same configuration, and the transport unit CV2 and the transport unit CV4 have the same configuration. In the configuration shown in FIG. 20, for example, the respective window portions W1 to W4 may be provided for each of the transport units CV1 to CV4. In this way, since processing can be performed at a plurality of places, processing efficiency can be improved.

又,除上述實施形態之構成外,亦可以是作成例如於基板保管裝置STR之收容室RM設置處理部之構成。此場合,例如可配置對基板進行鍍敷處理、洗淨處理、乾燥處理、熱處理等各種處理之處理部。如圖18所示,當係基板S之第二面Sb不接觸基板搬送部CV之構成時,對此第二面Sb進行處理之處理部PA2可設在收容室RM。Further, in addition to the configuration of the above-described embodiment, the processing unit may be provided in the storage chamber RM of the substrate storage device STR, for example. In this case, for example, a processing unit that performs various processes such as a plating process, a washing process, a drying process, and a heat treatment on the substrate can be disposed. As shown in FIG. 18, when the second surface Sb of the base substrate S does not contact the substrate transfer portion CV, the processing portion PA2 that processes the second surface Sb may be provided in the storage chamber RM.

又,上述實施形態中,雖係針對保管長邊方向為無端狀之基板之保管裝置做了說明,但並不限於此構成。例如,亦可於容器CT內配置供應用滾筒、回收用滾筒、用以將捲於供應滾筒之基板搬送至上述窗部W1之複數個滾筒、以及為將透過窗部W1之基板以回收用滾筒加以捲繞而將基板送至回收滾筒之複數個滾筒,以保管以捲對捲(roll to roll)方式搬送之基板。Further, in the above-described embodiment, the storage device for storing the substrate having the endless longitudinal direction is described, but the configuration is not limited thereto. For example, a supply roller, a recovery roller, a plurality of rollers for conveying the substrate wound on the supply roller to the window portion W1, and a substrate for the transmission window portion W1 may be disposed in the container CT. The substrate is wound and the substrate is sent to a plurality of rollers of the recovery drum to store the substrate conveyed by roll to roll.

又,上述實施形態,雖係以滾筒R配置成中心軸與Y方向平行之構成為例做了說明,但不限於此。例如,亦可以是將滾筒R配置成中心軸與X方向或Z方向平行之構成,亦可適用本發明。Further, in the above-described embodiment, the configuration in which the drum R is disposed such that the central axis is parallel to the Y direction has been described as an example, but the invention is not limited thereto. For example, the drum R may be arranged such that the central axis is parallel to the X direction or the Z direction, and the present invention is also applicable.

此外,例如於圖18、圖19及圖20所示實施形態中,亦可採用於基板保管裝置STR及基板保管裝置STR2所採用之將搬送路徑調短的機構。亦即,在為了使用處理裝置對基板施以處理而將基板拉出而使其露出之情形時,採用移動滾筒使搬送路徑縮短以使基板搬送路徑之路徑長維持一定的調整機構。Further, for example, in the embodiment shown in FIGS. 18, 19, and 20, a mechanism for shortening the transport path used in the substrate storage device STR and the substrate storage device STR2 may be employed. In other words, when the substrate is pulled out and exposed to the substrate by the processing device, the transfer path is shortened by moving the roller so that the path length of the substrate transfer path is maintained constant.

1‧‧‧第一層部分 1‧‧‧ first floor

2‧‧‧第二層部分 2‧‧‧Second floor

10‧‧‧收容裝置搬入口 10‧‧‧ containment device entrance

11‧‧‧收容裝置搬出口 11‧‧‧ containment device

12‧‧‧基板裝填裝置 12‧‧‧Substrate loading device

20‧‧‧容器(筐體) 20‧‧‧Container (housing)

20a‧‧‧容器之一壁部 20a‧‧‧One of the walls of the container

22‧‧‧搬入滾筒 22‧‧‧ moving into the drum

23‧‧‧方向轉換滾筒 23‧‧‧ Directional change roller

24‧‧‧折返部 24‧‧‧Departure

24a~24h‧‧‧折返部之滾筒 24a~24h‧‧‧Folding roller

25‧‧‧搬出滾筒 25‧‧‧ moving out of the drum

29‧‧‧突出部 29‧‧‧Protruding

30N‧‧‧排出埠(基板插入部) 30N‧‧‧ discharge line (substrate insertion part)

30X‧‧‧拉入埠(收入埠、基板拉出部) 30X‧‧‧ Pull-in (receipt 基板, substrate pull-out)

39‧‧‧連接埠 39‧‧‧Links

40‧‧‧車架 40‧‧‧ frame

41‧‧‧軌道 41‧‧‧ Track

42‧‧‧台車(載台) 42‧‧‧Trolley (stage)

42c‧‧‧軌 42c‧‧‧ track

43、44‧‧‧升降機構 43, 44‧‧‧ Lifting mechanism

126‧‧‧切刀 126‧‧‧Cutter

567‧‧‧滾筒支承構件 567‧‧‧Roll support member

568‧‧‧引導部 568‧‧‧Guidance Department

569、575‧‧‧驅動機構 569, 575‧‧‧ drive mechanism

571a‧‧‧支承面 571a‧‧‧ support surface

590、591‧‧‧裝置側連接部 590, 591‧‧‧ device side connection

592、593‧‧‧夾持滾筒 592, 593‧‧‧Clamping roller

595‧‧‧處理部 595‧‧‧Processing Department

595a‧‧‧處理面 595a‧‧‧Processing surface

672、673‧‧‧引導滾筒 672, 673‧‧‧ Guide roller

674、675‧‧‧機械臂部 674, 675‧‧ mechanical arm

676、677‧‧‧臂驅動部 676, 677‧‧‧ Arm drive department

678‧‧‧安裝部 678‧‧‧Installation Department

679‧‧‧基板支承構件 679‧‧‧Substrate support member

679a‧‧‧支承面 679a‧‧‧support surface

695‧‧‧處理部 695‧‧‧Processing Department

700‧‧‧滑動驅動部 700‧‧‧Sliding drive department

701、702‧‧‧引導構件 701, 702‧‧‧ Guided components

CONT‧‧‧控制裝置 CONT‧‧‧ control device

CT‧‧‧容器 CT‧‧‧ container

CTa、CTb‧‧‧壁部 CTa, CTb‧‧‧ wall

CV‧‧‧基板搬送部 CV‧‧‧Substrate Transfer Department

EN‧‧‧基板搬入口 EN‧‧‧Substrate entrance

FL‧‧‧地面 FL‧‧‧ Ground

GD‧‧‧引導裝置 GD‧‧‧ guiding device

J‧‧‧連接部 J‧‧‧Connecting Department

PR、PR1~PR5、PRA~PRF、PA‧‧‧基板處理裝置(處理裝置) PR, PR1~PR5, PRA~PRF, PA‧‧‧ substrate processing device (processing device)

R‧‧‧滾筒 R‧‧‧Roller

RM‧‧‧收容室 RM‧‧‧ containment room

S‧‧‧基板 S‧‧‧Substrate

Sa‧‧‧基板S之第1面 Sa‧‧‧ The first side of the substrate S

Sb‧‧‧基板S之第2面 The second side of the Sb‧‧‧ substrate S

SP‧‧‧基板支承部 SP‧‧‧Substrate support

ST、STR、STR2‧‧‧基板收容裝置(基板保管裝置) ST, STR, STR2‧‧‧ substrate storage device (substrate storage device)

SYS‧‧‧基板處理系統 SYS‧‧‧ substrate processing system

W、W1、W2‧‧‧窗部 W, W1, W2‧‧‧ Window Department

圖1係顯示本發明實施形態之基板處理系統之全體構成的前視圖。Fig. 1 is a front elevational view showing the overall configuration of a substrate processing system according to an embodiment of the present invention.

圖2係顯示本實施形態之基板收容裝置之構成的圖。Fig. 2 is a view showing the configuration of a substrate housing device of the embodiment.

圖3係顯示本實施形態之基板裝填裝置之構成的圖。Fig. 3 is a view showing the configuration of a substrate loading apparatus of the embodiment.

圖4係顯示本實施形態之基板構成的圖。Fig. 4 is a view showing the structure of a substrate of the embodiment.

圖5係本實施形態之基板處理系統之部分構成的圖。Fig. 5 is a view showing a partial configuration of a substrate processing system of the embodiment.

圖6係本實施形態之基板處理系統之部分構成的圖。Fig. 6 is a view showing a partial configuration of a substrate processing system of the embodiment.

圖7係本實施形態之基板處理裝置之構成的圖。Fig. 7 is a view showing the configuration of a substrate processing apparatus of the embodiment.

圖8係本發明另一實施形態之基板處理系統之部分構成的圖。Fig. 8 is a view showing a partial configuration of a substrate processing system according to another embodiment of the present invention.

圖9A係本發明另一實施形態之基板處理系統之部分構成的圖。Fig. 9A is a view showing a partial configuration of a substrate processing system according to another embodiment of the present invention.

圖9B係本發明另一實施形態之基板處理系統之部分構成的圖。Fig. 9B is a view showing a partial configuration of a substrate processing system according to another embodiment of the present invention.

圖10係本發明另一實施形態之基板處理系統之部分構成的圖。Fig. 10 is a view showing a part of the configuration of a substrate processing system according to another embodiment of the present invention.

圖11係本發明另一實施形態之基板處理系統之部分構成的圖。Figure 11 is a view showing a part of the configuration of a substrate processing system according to another embodiment of the present invention.

圖12係顯示基板保管裝置之內部構成的剖面圖。Fig. 12 is a cross-sectional view showing the internal structure of a substrate storage device.

圖13係顯示基板保管裝置之一動作例的剖面圖。Fig. 13 is a cross-sectional view showing an operation example of one of the substrate storage devices.

圖14係顯示另一基板保管裝置之構成的剖面圖。Fig. 14 is a cross-sectional view showing the configuration of another substrate storage device.

圖15係顯示另一基板保管裝置之一動作例的剖面圖。Fig. 15 is a cross-sectional view showing an operation example of another substrate storage device.

圖16係顯示基板保管裝置之另一例的圖。Fig. 16 is a view showing another example of the substrate storage device.

圖17係顯示基板保管裝置之另一例的圖。 Fig. 17 is a view showing another example of the substrate storage device.

圖18係顯示基板保管裝置之另一例的圖。 Fig. 18 is a view showing another example of the substrate storage device.

圖19係顯示基板保管裝置之另一例的圖。 Fig. 19 is a view showing another example of the substrate storage device.

圖20係顯示基板保管裝置之另一例的圖。 Fig. 20 is a view showing another example of the substrate storage device.

1‧‧‧第一層部分 1‧‧‧ first floor

2‧‧‧第二層部分 2‧‧‧Second floor

2a‧‧‧壁部 2a‧‧‧ wall

10‧‧‧收容裝置搬入口 10‧‧‧ containment device entrance

11‧‧‧收容裝置搬出口 11‧‧‧ containment device

12‧‧‧基板裝填裝置 12‧‧‧Substrate loading device

30N‧‧‧排出埠(基板插入部) 30N‧‧‧ discharge line (substrate insertion part)

30X‧‧‧拉入埠(收入埠、基板拉出部) 30X‧‧‧ Pull-in (receipt 基板, substrate pull-out)

40‧‧‧車架 40‧‧‧ frame

41‧‧‧軌道 41‧‧‧ Track

42‧‧‧台車(載台) 42‧‧‧Trolley (stage)

42c‧‧‧軌 42c‧‧‧ track

43、44‧‧‧升降機構 43, 44‧‧‧ Lifting mechanism

CONT‧‧‧控制裝置 CONT‧‧‧ control device

FL‧‧‧地面 FL‧‧‧ Ground

GD‧‧‧引導裝置 GD‧‧‧ guiding device

PR(PR1~PR4)‧‧‧基板處理裝置(處理裝置) PR (PR1~PR4)‧‧‧Substrate processing device (processing device)

ST‧‧‧基板收容裝置(基板保管裝置) ST‧‧‧Substrate storage device (substrate storage device)

SYS‧‧‧基板處理系統 SYS‧‧‧ substrate processing system

Claims (13)

一種用於在長條的可撓性片材基板形成電子零件的基板處理系統,具備:複數個基板收容裝置,具有為了收容既定的長度的該片材基板而以壁部所圍繞之收容室、以將該片材基板於長度方向從該收容室搬出並且於長度方向往該收容室內部搬入之方式形成於該壁部之一部分的開口部、或者以使該片材基板之一部分露出於該收容室外部之方式形成於該壁部之一部分的窗部;複數個基板處理裝置,具備可連接於前述基板收容裝置之該開口部或窗部的連接部,在前述基板收容裝置之一個連接於前述連接部的狀態下,從該開口部取出前述片材基板並進行既定的處理之後,透過該開口部而返回該收容室,或對露出於該窗部之該片材基板之一部分進行既定的處理;引導裝置,以前述複數個基板收容裝置之各個分別與前述複數個基板處理裝置之各個連接之方式進行引導;以及控制裝置,控制前述引導裝置以將前述複數個基板收容裝置之各個分別與前述複數個基板處理裝置之各個以既定順序連接。 A substrate processing system for forming an electronic component on a long flexible sheet substrate, comprising: a plurality of substrate housing devices; and a housing chamber surrounded by a wall portion for accommodating the sheet substrate of a predetermined length; The sheet substrate is formed in the opening portion of the wall portion so as to be carried out from the storage chamber in the longitudinal direction, and is carried into the housing chamber in the longitudinal direction, or a part of the sheet substrate is exposed to the housing. The outdoor unit is formed in a window portion of one of the wall portions; the plurality of substrate processing apparatuses include a connection portion connectable to the opening or the window portion of the substrate housing device, and one of the substrate housing devices is connected to the In the state of the connection portion, the sheet substrate is taken out from the opening portion and subjected to a predetermined process, and then returned to the storage chamber through the opening portion, or a predetermined process is performed on a portion of the sheet substrate exposed to the window portion. The guiding device is configured to connect each of the plurality of substrate housing devices to each of the plurality of substrate processing devices Guide; and a control means for controlling the guiding means to the receiving means of each of a plurality of substrates, respectively, and each of the plurality of substrate processing apparatus connected in a predetermined order. 如申請專利範圍第1項之基板處理系統,其中,前述複數個基板處理裝置,包含對前述片材基板進行第1處理的第1基板處理裝置、與對前述片材基板進行前述第1 處理之後製程之第2處理的第2基板處理裝置;前述控制裝置控制前述引導裝置,以將前述複數個基板收容裝置中收容進行前述第1處理前之前述片材基板的前述基板收容裝置連接於前述第1基板處理裝置,並將前述複數個基板收容裝置中收容進行了前述第1處理後之前述片材基板的前述基板收容裝置連接於前述第2基板處理裝置。 The substrate processing system according to the first aspect of the invention, wherein the plurality of substrate processing apparatuses include a first substrate processing apparatus that performs the first processing on the sheet substrate, and performs the first step on the sheet substrate a second substrate processing apparatus that processes the second processing of the subsequent processing; the control apparatus controls the guiding apparatus to connect the substrate housing apparatus that accommodates the sheet substrate before the first processing in the plurality of substrate housing apparatuses In the first substrate processing apparatus, the substrate housing device that accommodates the sheet substrate subjected to the first processing in the plurality of substrate housing devices is connected to the second substrate processing apparatus. 如申請專利範圍第1或2項之基板處理系統,其中,前述開口部,具有往前述收容室搬入前述片材基板之基板搬入口、與從前述收容室搬出前述片材基板之基板搬出口;前述複數個基板處理裝置,具有將收容在前述收容室之前述片材基板從前述基板搬出口拉出至外部的基板拉出部、對以前述基板拉出部拉出之前述基板進行處理的處理部、以及將經前述處理部進行了處理之前述片材基板從前述基板搬入口插入前述收容室的基板插入部。 The substrate processing system according to the first or second aspect of the invention, wherein the opening has a substrate carrying inlet for loading the sheet substrate into the storage chamber, and a substrate carrying port for carrying out the sheet substrate from the storage chamber; The plurality of substrate processing apparatuses include a substrate pull-out portion that pulls the sheet substrate accommodated in the storage chamber from the substrate carry-out port to the outside, and processes the substrate pulled out by the substrate pull-out portion. And the sheet substrate processed by the processing unit is inserted into the substrate insertion portion of the storage chamber from the substrate carrying inlet. 如申請專利範圍第3項之基板處理系統,其中,前述複數個基板處理裝置之各個,具有具複數個壁面的筐體;前述連接部設在前述筐體中之一壁面;前述基板拉出部及前述基板插入部中之至少一方,係設在前述一壁面。 The substrate processing system of claim 3, wherein each of the plurality of substrate processing apparatuses has a housing having a plurality of wall surfaces; the connecting portion is provided on one of the wall surfaces; and the substrate drawing portion At least one of the substrate insertion portions is provided on the one wall surface. 如申請專利範圍第1項之基板處理系統,其中,前述引導裝置,具有支承前述複數個基板收容裝置之各個的載台;以及驅動前述載台之載台驅動部。 The substrate processing system according to claim 1, wherein the guiding device includes a stage that supports each of the plurality of substrate housing devices, and a stage driving unit that drives the stage. 如申請專利範圍第5項之基板處理系統,其中,前述引導裝置,具有引導前述載台之引導軌條;前述引導軌條,係設置成前述載台可在前述複數個基板處理裝置之間循環。 The substrate processing system of claim 5, wherein the guiding device has a guiding rail for guiding the stage; the guiding rail is arranged such that the stage can be cycled between the plurality of substrate processing devices . 如申請專利範圍第6項之基板處理系統,其中,前述引導裝置,具有支承前述複數個基板收容裝置之第2載台;以及驅動前述第2載台之第2載台驅動部。 The substrate processing system of claim 6, wherein the guiding device includes a second stage that supports the plurality of substrate housing devices, and a second stage driving unit that drives the second stage. 如申請專利範圍第7項之基板處理系統,其中,前述第2載台,係沿著前述複數個基板處理裝置之排列方向設置成可旋轉;前述複數個基板收容裝置,係以排列於前述第2載台之旋轉方向之方式,配置在前述第2載台上。 The substrate processing system of claim 7, wherein the second stage is rotatably arranged along an arrangement direction of the plurality of substrate processing apparatuses; and the plurality of substrate housing apparatuses are arranged in the foregoing The second stage is placed on the second stage in such a manner that the rotation direction of the stage is two. 如申請專利範圍第1項之基板處理系統,其中,前述複數個基板處理裝置,係於重力方向重疊配置複數個。 The substrate processing system according to claim 1, wherein the plurality of substrate processing apparatuses are arranged in a plurality of overlapping directions in the gravity direction. 如申請專利範圍第1項之基板處理系統,其中,前述控制裝置,根據在前述複數個基板處理裝置之各個之處理時間之長度,設定前述基板收容裝置之引導目標。 The substrate processing system according to claim 1, wherein the control device sets a guidance target of the substrate housing device based on a length of processing time of each of the plurality of substrate processing devices. 如申請專利範圍第1項之基板處理系統,其中,前述複數個基板收容裝置,係收容長度彼此不同之片材基板。 The substrate processing system according to claim 1, wherein the plurality of substrate housing devices accommodate sheet substrates having different lengths. 如申請專利範圍第1項之基板處理系統,其中,前述複數個基板處理裝置,包含進行相同處理的複數個基板處理裝置; 前述引導裝置,係將前述基板收容裝置搬送至前述進行相同處理之複數個基板處理裝置之任一個。 The substrate processing system of claim 1, wherein the plurality of substrate processing apparatuses include a plurality of substrate processing apparatuses that perform the same processing; In the above-described guiding device, the substrate housing device is transported to any one of a plurality of substrate processing devices that perform the same processing. 一種顯示元件之製造方法,係用於在長條的可撓性片材基板形成顯示元件,其特徵在於,包含:準備前述片材基板的步驟;使用申請專利範圍第1至12項中任一項之基板處理系統於前述片材基板上形成顯示元件的步驟;以及前述顯示元件之組裝步驟。 A method of manufacturing a display element for forming a display element on a long flexible sheet substrate, comprising: a step of preparing the sheet substrate; and using any one of claims 1 to 12 The substrate processing system of the item forms a display element on the sheet substrate; and the assembly step of the display element.
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