TWI541868B - 脈衝氣體電漿摻雜方法及設備 - Google Patents
脈衝氣體電漿摻雜方法及設備 Download PDFInfo
- Publication number
- TWI541868B TWI541868B TW103112594A TW103112594A TWI541868B TW I541868 B TWI541868 B TW I541868B TW 103112594 A TW103112594 A TW 103112594A TW 103112594 A TW103112594 A TW 103112594A TW I541868 B TWI541868 B TW I541868B
- Authority
- TW
- Taiwan
- Prior art keywords
- gas
- substrate
- plasma
- dopant
- gas mixture
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P32/00—Diffusion of dopants within, into or out of wafers, substrates or parts of devices
- H10P32/10—Diffusion of dopants within, into or out of semiconductor bodies or layers
- H10P32/12—Diffusion of dopants within, into or out of semiconductor bodies or layers between a solid phase and a gaseous phase
- H10P32/1204—Diffusion of dopants within, into or out of semiconductor bodies or layers between a solid phase and a gaseous phase from a plasma phase
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32412—Plasma immersion ion implantation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3244—Gas supply means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3244—Gas supply means
- H01J37/32449—Gas control, e.g. control of the gas flow
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
- H10D30/024—Manufacture or treatment of FETs having insulated gates [IGFET] of fin field-effect transistors [FinFET]
- H10D30/0241—Manufacture or treatment of FETs having insulated gates [IGFET] of fin field-effect transistors [FinFET] doping of vertical sidewalls, e.g. using tilted or multi-angled implants
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Plasma Technology (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201361808321P | 2013-04-04 | 2013-04-04 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201511095A TW201511095A (zh) | 2015-03-16 |
| TWI541868B true TWI541868B (zh) | 2016-07-11 |
Family
ID=51654732
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW103112594A TWI541868B (zh) | 2013-04-04 | 2014-04-03 | 脈衝氣體電漿摻雜方法及設備 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9165771B2 (https=) |
| JP (1) | JP6068727B2 (https=) |
| KR (1) | KR101815746B1 (https=) |
| TW (1) | TWI541868B (https=) |
| WO (1) | WO2014165669A2 (https=) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6499835B2 (ja) * | 2014-07-24 | 2019-04-10 | 株式会社日立ハイテクノロジーズ | プラズマ処理装置およびプラズマ処理方法 |
| JP2016122769A (ja) * | 2014-12-25 | 2016-07-07 | 東京エレクトロン株式会社 | ドーピング方法および半導体素子の製造方法 |
| DE102015102055A1 (de) * | 2015-01-16 | 2016-07-21 | Infineon Technologies Ag | Verfahren zum Bearbeiten einer Halbleiteroberfläche |
| JP6545053B2 (ja) * | 2015-03-30 | 2019-07-17 | 東京エレクトロン株式会社 | 処理装置および処理方法、ならびにガスクラスター発生装置および発生方法 |
| JP2016225356A (ja) * | 2015-05-27 | 2016-12-28 | 東京エレクトロン株式会社 | 半導体素子の製造方法 |
| US10256075B2 (en) * | 2016-01-22 | 2019-04-09 | Applied Materials, Inc. | Gas splitting by time average injection into different zones by fast gas valves |
| CN109075041B (zh) * | 2016-04-05 | 2022-12-06 | 瓦里安半导体设备公司 | 将加工物质与掺杂剂植入工件的方法及用于工件的设备 |
| CN106098543B (zh) * | 2016-06-13 | 2019-05-14 | 北京大学 | 一种在室温环境下向硅材料中引入固态杂质的方法 |
| CN105931951B (zh) * | 2016-06-13 | 2019-05-14 | 北京大学 | 一种在室温环境下向砷化镓材料引入杂质的方法 |
| FR3057704B1 (fr) * | 2016-10-13 | 2019-05-24 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Procede de fabrication d'un semi-conducteur dope n avec du phosphore ou de l'arsenic permettant des resistances carrees optimisees |
| US11772058B2 (en) * | 2019-10-18 | 2023-10-03 | Taiwan Semiconductor Manufacturing Company Limited | Gas mixing system for semiconductor fabrication |
| US11315790B2 (en) * | 2019-10-22 | 2022-04-26 | Applied Materials, Inc. | Enhanced substrate amorphization using intermittent ion exposure |
| FI129609B (en) | 2020-01-10 | 2022-05-31 | Picosun Oy | Substrate processing apparatus |
| KR20210123128A (ko) * | 2020-04-02 | 2021-10-13 | 삼성전자주식회사 | 반도체 장치의 제조에 사용되는 장치 |
| CN117276410B (zh) * | 2023-11-17 | 2024-03-29 | 浙江晶科能源有限公司 | 钝化接触太阳能电池及其制备方法 |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20010054601A1 (en) | 1996-05-13 | 2001-12-27 | Jian Ding | Low ceiling temperature process for a plasma reactor with heated source of a polymer-hardening precursor material |
| JP2000294538A (ja) * | 1999-04-01 | 2000-10-20 | Matsushita Electric Ind Co Ltd | 真空処理装置 |
| US6383954B1 (en) * | 1999-07-27 | 2002-05-07 | Applied Materials, Inc. | Process gas distribution for forming stable fluorine-doped silicate glass and other films |
| AU2001288225A1 (en) | 2000-07-24 | 2002-02-05 | The University Of Maryland College Park | Spatially programmable microelectronics process equipment using segmented gas injection showerhead with exhaust gas recirculation |
| JP2002184710A (ja) | 2000-12-18 | 2002-06-28 | Sony Corp | 半導体層のドーピング方法、薄膜半導体素子の製造方法、及び薄膜半導体素子 |
| US6534871B2 (en) * | 2001-05-14 | 2003-03-18 | Sharp Laboratories Of America, Inc. | Device including an epitaxial nickel silicide on (100) Si or stable nickel silicide on amorphous Si and a method of fabricating the same |
| US7205240B2 (en) * | 2003-06-04 | 2007-04-17 | Applied Materials, Inc. | HDP-CVD multistep gapfill process |
| US20050221020A1 (en) * | 2004-03-30 | 2005-10-06 | Tokyo Electron Limited | Method of improving the wafer to wafer uniformity and defectivity of a deposited dielectric film |
| US20070066038A1 (en) | 2004-04-30 | 2007-03-22 | Lam Research Corporation | Fast gas switching plasma processing apparatus |
| WO2007026889A1 (ja) * | 2005-09-01 | 2007-03-08 | Matsushita Electric Industrial Co., Ltd. | プラズマ処理装置、プラズマ処理方法、これに用いられる誘電体窓及びその製造方法 |
| US7932181B2 (en) | 2006-06-20 | 2011-04-26 | Lam Research Corporation | Edge gas injection for critical dimension uniformity improvement |
| US7790586B2 (en) | 2006-11-15 | 2010-09-07 | Panasonic Corporation | Plasma doping method |
| US7820533B2 (en) | 2007-02-16 | 2010-10-26 | Varian Semiconductor Equipment Associates, Inc. | Multi-step plasma doping with improved dose control |
| US7939447B2 (en) | 2007-10-26 | 2011-05-10 | Asm America, Inc. | Inhibitors for selective deposition of silicon containing films |
| JP5231441B2 (ja) * | 2007-10-31 | 2013-07-10 | 国立大学法人東北大学 | プラズマ処理システム及びプラズマ処理方法 |
| US7972968B2 (en) * | 2008-08-18 | 2011-07-05 | Applied Materials, Inc. | High density plasma gapfill deposition-etch-deposition process etchant |
| JP2012517689A (ja) | 2009-02-12 | 2012-08-02 | パナソニック株式会社 | 半導体装置及びその製造方法 |
| WO2011080876A1 (ja) * | 2009-12-28 | 2011-07-07 | パナソニック株式会社 | プラズマドーピング装置 |
| US8513107B2 (en) | 2010-01-26 | 2013-08-20 | Taiwan Semiconductor Manufacturing Co., Ltd. | Replacement gate FinFET devices and methods for forming the same |
| WO2011161965A1 (en) | 2010-06-23 | 2011-12-29 | Tokyo Electron Limited | Plasma doping device, plasma doping method, method for manufacturing semiconductor element, and semiconductor element |
| US8003503B1 (en) * | 2010-09-30 | 2011-08-23 | Tokyo Electron Limited | Method of integrating stress into a gate stack |
| US8133349B1 (en) | 2010-11-03 | 2012-03-13 | Lam Research Corporation | Rapid and uniform gas switching for a plasma etch process |
| US9277637B2 (en) | 2010-11-17 | 2016-03-01 | Tokyo Electron Limited | Apparatus for plasma treatment and method for plasma treatment |
| US8435845B2 (en) * | 2011-04-06 | 2013-05-07 | International Business Machines Corporation | Junction field effect transistor with an epitaxially grown gate structure |
| JP2013026345A (ja) * | 2011-07-19 | 2013-02-04 | Toshiba Corp | 半導体装置の製造方法 |
-
2014
- 2014-04-03 JP JP2016506614A patent/JP6068727B2/ja active Active
- 2014-04-03 TW TW103112594A patent/TWI541868B/zh active
- 2014-04-03 KR KR1020157031579A patent/KR101815746B1/ko active Active
- 2014-04-03 US US14/244,481 patent/US9165771B2/en active Active
- 2014-04-03 WO PCT/US2014/032814 patent/WO2014165669A2/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| JP6068727B2 (ja) | 2017-01-25 |
| WO2014165669A3 (en) | 2015-11-12 |
| JP2016522567A (ja) | 2016-07-28 |
| US20140302666A1 (en) | 2014-10-09 |
| TW201511095A (zh) | 2015-03-16 |
| KR101815746B1 (ko) | 2018-01-30 |
| US9165771B2 (en) | 2015-10-20 |
| KR20150138369A (ko) | 2015-12-09 |
| WO2014165669A2 (en) | 2014-10-09 |
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