TWI537110B - Method for point calibration for robotic arm - Google Patents

Method for point calibration for robotic arm Download PDF

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TWI537110B
TWI537110B TW103127419A TW103127419A TWI537110B TW I537110 B TWI537110 B TW I537110B TW 103127419 A TW103127419 A TW 103127419A TW 103127419 A TW103127419 A TW 103127419A TW I537110 B TWI537110 B TW I537110B
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mechanical arm
geometric
geometric block
correcting
block
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TW103127419A
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TW201605596A (en
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羅文保
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友上科技股份有限公司
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Description

機械手臂點位校正之方法 Robot arm point correction method

本發明係有關於一種機械手臂點位校正之方法,尤其是指一種調教一機械手臂與一收容器結構之平面呈相對垂直之機械手臂校正方法,機械手臂係藉由自動化之點位校正垂直伸入收容器結構內取出或置放液晶面板之基板或半導體之晶圓等其中之一種待取物件,而不至於造成待取物件之刮傷者。 The invention relates to a method for correcting the position of a mechanical arm, in particular to a method for correcting a mechanical arm that is relatively perpendicular to a plane of a mechanical arm and a container structure, and the mechanical arm is vertically aligned by an automated point correction. One of the substrates to be taken, such as the substrate of the liquid crystal panel or the wafer of the semiconductor, is taken out or placed in the structure of the receiving container, so as not to cause scratching of the object to be taken.

按,目前在半導體廠或液晶面板廠皆是使用收容器結構做為搭載晶圓(wafer)運輸的載具,而用以乘載晶圓或面板的收容器結構就是所謂的晶圓傳送盒或晶舟盒(front-opening unified pods,簡稱FOUP),尤其是在半導體廠繁雜的生產過程中,晶圓常會因為製程上的需求,例如前段元件製程、中段鈷、鎳製程,以及後段鋁、銅製程的切換等,都必須做晶舟盒的置換,以防止半導體元件的污染而導致的效能不彰等問題,而晶舟盒置換的過程在目前半導體製程的生產架構下,往往需要耗費冗長的時間等待機台的置換與系統的執行,因而耽誤了不少的生產週期,在本導體廠講求生產效率與降低生產週期的要求下,進一步改善晶舟置換的時間與方式,以快速縮短晶片製造週期,有效騰出更多置換機台的產能供其他產品使用,是目前半導體廠責無旁貸的任務。 According to the current, in the semiconductor factory or the LCD panel factory, the container structure is used as a carrier for wafer transportation, and the container structure for carrying the wafer or the panel is a so-called wafer cassette or Front-opening unified pods (FOUP), especially in the complicated production process of semiconductor factories, wafers are often due to process requirements, such as the front-end component process, the middle-stage cobalt, nickel process, and the rear aluminum and copper. The switching of the process, etc., must be replaced by the boat box to prevent the problem of inefficiency caused by the contamination of the semiconductor components, and the process of replacing the wafer boat is often tedious in the current production structure of the semiconductor process. Time to wait for the replacement of the machine and the execution of the system, thus delaying a lot of production cycles, further improving the time and mode of the boat replacement in order to quickly shorten the wafer manufacturing under the requirements of the conductor factory to ensure production efficiency and reduce the production cycle. The cycle, effectively freeing up the capacity of more replacement machines for other products, is currently the task of the semiconductor factory.

目前半導體廠的晶舟置換皆是使用電荷耦合元件(Charge Coupled Device,簡稱CCD)等照相裝置進行掃描定位,首先係於 遵循半導體晶圓傳送盒規格的置換機台內,使用電荷耦合元件以上下掃描方式確認晶圓傳送盒的載入位置,再由電腦運算將欲置入晶圓傳送盒的晶圓依需要的位置以機械手臂置入;然而,電荷耦合元件掃描的動作常耗費許多時間,此外,由於電荷耦合元件的掃描只針對晶圓傳送盒內置入位置的垂直掃描,水平位置是否準確並無法得知,且機械手臂係安裝於晶圓傳送盒之置換機台上,因此必須力求置換機台水平安置,否則稍有不慎,將會使機械手臂夾持的晶圓撞擊晶圓傳送盒而造成晶圓破碎的情事發生;再者,收容器結構之點位校正一開始皆是由線上人員在機台上一步一步操作並讓機台記憶的「教導(teaching)」方式完成程式之設定,後續相同的產品或是收容器結構就使用同一支程式運作,若有新的產品或新的收容器結構,線上人員就必須再進行一次「教導」以建立一新程式給新產品使用,而一次的「教導」時間常需要經歷兩、三個小時才能完成,在講求效益與縮短生產週期的面板廠或晶圓廠,此時間的耗費不容小覷;因此,為了有效達到全方位的收容器結構定位,使機械手臂傳送晶圓或面板時不會因為收容器結構偏移而撞碎或刮傷晶圓與面板,並且能有效達到減少收容器結構校正的時間以縮短日益複雜的生產週期,仍是半導體或液晶面板設備業者需持續努力克服與解決之課題。 At present, the wafer boat replacement in the semiconductor factory is using a photographic device such as a Charge Coupled Device (CCD) for scanning and positioning. In the replacement machine that conforms to the specification of the semiconductor wafer transfer cassette, the charge transfer element is used to confirm the loading position of the wafer transfer cassette by the above scanning method, and then the wafer to be placed in the wafer transfer cassette is required by the computer operation. The robotic arm is placed; however, the charge-coupled element scanning operation often takes a lot of time. In addition, since the scanning of the charge-coupled element is only for the vertical scanning of the built-in position of the wafer transfer cassette, the horizontal position is accurate and unknown, and The robot arm is mounted on the replacement machine of the wafer transfer box, so it is necessary to try to displace the machine horizontally. Otherwise, it will cause the wafer held by the robot arm to hit the wafer transfer box and cause the wafer to be broken. In addition, the point correction of the container structure is initially set by the online personnel on the machine step by step and let the machine remember the "teaching" method to complete the program setting, followed by the same product Or the container structure works with the same program. If there is a new product or a new container structure, the online staff must do it again. "Teaching" to create a new program for new products, and a "teaching" time often takes two or three hours to complete. In a panel factory or fab that emphasizes efficiency and shortens the production cycle, the time is not enough. Therefore, in order to effectively achieve the omnidirectional positioning of the container structure, the robot arm does not crush or scratch the wafer and the panel due to the structural offset of the container when transferring the wafer or the panel, and can effectively reduce the receipt. The time required to correct the structure of the container to shorten the increasingly complex production cycle is still a problem that semiconductor or liquid crystal panel equipment manufacturers must continue to overcome and solve.

今,發明人即是鑑於上述之機械手臂點位校正方法因存在人工教導校正之時間過長而延誤產品之生產週期等諸多缺失,於是乃一本孜孜不倦之精神,並藉由其豐富之專業知識及多年之實務經驗所輔佐,而加以改善,並據此研創出本發明。 Nowadays, the inventor is in view of the above-mentioned mechanical arm point correction method, because of the existence of artificial teaching correction time is too long and delays the production cycle of the product and many other defects, so it is a tireless spirit, and with its rich professional knowledge With the help of years of practical experience, and improved, and based on this, the present invention was developed.

本發明主要目的為提供一種機械手臂點位校正之方法,尤其是指一種調教一機械手臂與一收容器結構之平面呈相對垂直之機 械手臂校正方法,機械手臂係藉由自動化之點位校正垂直伸入收容器結構內取出或置放液晶面板之基板或半導體之晶圓等其中之一種待取物件,而不至於造成待取物件之刮傷。 The main object of the present invention is to provide a method for correcting the position of a mechanical arm, in particular to a machine in which a robot arm and a receiving container structure are relatively perpendicular to each other. The arm correction method, the robot arm is one of the objects to be taken, such as the substrate of the liquid crystal panel or the semiconductor wafer, which is vertically inserted into the container structure by the automatic point correction, without causing the object to be taken. Scratch.

為了達到上述實施目的,本發明人提出一種機械手臂點位校正之方法,係至少包括下列步驟:首先,使用設置於一機械手臂上之校準模組掃描至少三個幾何塊狀物,其中等幾何塊狀物係設置於相對應垂直一收容器結構之表面上;最後,藉由至少三個幾何塊狀物確定表面之水平狀態,機械手臂係接收水平狀態,調整機械手臂以垂直之方位角進入收容器結構將一待取物件置入或取出。 In order to achieve the above-mentioned implementation, the inventors propose a method for correcting the position of a mechanical arm, which at least includes the following steps: First, scanning at least three geometric blocks using a calibration module disposed on a robot arm, wherein equal geometry The block is disposed on the surface of the corresponding vertical receiving container structure; finally, the horizontal state of the surface is determined by at least three geometrical blocks, the mechanical arm receives the horizontal state, and the adjustment arm enters the vertical azimuth angle The container structure places or removes an object to be taken.

如上所述的機械手臂點位校正之方法,其中校準模組係發射一雷射光束,並以左右來回方式掃描每一幾何塊狀物,以確定幾何塊狀物之中心點位置。 The method of mechanical arm position correction as described above, wherein the calibration module emits a laser beam and scans each geometric block in a left-right round-trip manner to determine a center point position of the geometric block.

如上所述的機械手臂點位校正之方法,其中幾何塊狀物係具有一凸出部突出於表面。 The method of mechanical arm point correction as described above, wherein the geometric block has a projection protruding from the surface.

如上所述的機械手臂點位校正之方法,其中凸出部以表面為切割面,係呈方形、圓形、三角形或多邊形等其中之一種形狀。 The method for correcting the position of the robot arm as described above, wherein the protruding portion has a surface as a cutting surface and is in a shape of one of a square, a circle, a triangle, or a polygon.

如上所述的機械手臂點位校正之方法,其中幾何塊狀物係具有一凹入部凹陷於表面。 The method of mechanical arm point correction as described above, wherein the geometric block has a recessed portion recessed to the surface.

如上所述的機械手臂點位校正之方法,其中凹入部以表面為切割面,係呈方形、圓形、三角形或多邊形等其中之一種形狀。 The method for correcting the position of the robot arm as described above, wherein the concave portion has a surface as a cutting surface and is in a shape of one of a square, a circle, a triangle, or a polygon.

如上所述的機械手臂點位校正之方法,其中待取物係為液晶面板之基板或半導體之晶圓等其中之一種。 The method for correcting the position of the robot arm as described above, wherein the object to be taken is one of a substrate of a liquid crystal panel or a wafer of a semiconductor.

藉此,本發明之機械手臂點位校正之方法係藉由將一可調教式之機械手臂與一收容器結構之平面呈相對垂直之機械手臂校正方法,使機械手臂可藉由自動化之點位校正垂直伸入收容器結構內取出或置放液晶面板之基板或半導體之晶圓等其中之一種待取物 件,而不至於造成待取物件之刮傷之優勢者;此外,本發明之機械手臂點位校正之方法係以校準模組發射之雷射光線聚焦在至少三個幾何塊狀物上,藉由雷射光線在幾何塊狀物上左右掃描之動作,以計算出每一個幾何塊狀物之中心點位置,再以至少三個幾何塊狀物形成一平面之方式計算出幾何塊狀物所位平面的平面方程式,亦即決定幾何塊狀物所位平面之平面座標系後,即可決定此平面座標系之法向量,機械手臂即是以平面座標系之法向量所呈現之方向將液晶面板之基板或半導體之晶圓等其中之一種物件置入或取出收容器結構,具有不使液晶面板之基板或半導體之晶圓等待取物件撞擊到收容器結構而造成刮傷或破碎的情事發生等優點;最後,本發明之機械手臂點位校正之方法係可取代傳統位於液晶面板廠或半導體晶圓廠內以人工教育機台執行由收容器結構取出或置放待取物件之方式,具有減少機台之學習時間、加速產品之生產週期、減低人為失誤之機率,以及減少線上人員之工作負擔等優勢。 Therefore, the method for correcting the position of the mechanical arm of the present invention enables the robot arm to be automated by using a robotic arm correction method in which a robot arm of an adjustable teaching body is perpendicular to a plane of a container structure. Correcting one of the objects to be taken, such as a substrate or a semiconductor wafer, which is inserted into or placed in the structure of the container vertically The method of correcting the scratch of the object to be taken; in addition, the method for correcting the position of the robot arm of the present invention focuses the laser light emitted by the calibration module on at least three geometric blocks, The action of scanning the left and right of the laser beam on the geometric block to calculate the position of the center point of each geometric block, and then calculating the geometric block by forming at least three geometric blocks to form a plane The plane equation of the bit plane, that is, the plane coordinate system that determines the plane of the geometric block, determines the normal vector of the plane coordinate system, and the mechanical arm is the liquid crystal in the direction represented by the normal vector of the plane coordinate system. The substrate of the panel or the wafer of the semiconductor or the like is placed or taken out of the container structure, and the substrate or the semiconductor wafer of the liquid crystal panel is not caused to hit the container structure to cause scratching or breaking. Finally, the method for correcting the position of the robot arm of the present invention can replace the traditionally located in the liquid crystal panel factory or the semiconductor fab to perform the manual education machine. Remove the structure or placement of objects waiting mode, with a reduced learning time of the machine, to accelerate the production cycle of the product, reducing the chance of human error, as well as reduces the work load of the line art and other advantages.

(1)‧‧‧機械手臂 (1)‧‧‧Machining arm

(11)‧‧‧校準模組 (11)‧‧‧ Calibration Module

(111)‧‧‧雷射光束 (111)‧‧‧Laser beam

(2)‧‧‧幾何塊狀物 (2) ‧‧‧Geometric masses

(21)‧‧‧凸出部 (21) ‧ ‧ bulging

(3)‧‧‧收容器結構 (3) ‧ ‧ container structure

(31)‧‧‧容置槽 (31) ‧‧‧ accommodating slots

(4)‧‧‧表面 (4) ‧ ‧ surface

(5)‧‧‧待取物件 (5) ‧ ‧ items to be taken

(S1)‧‧‧步驟一 (S1)‧‧‧Step one

(S2)‧‧‧步驟二 (S2)‧‧‧Step 2

第一圖:本發明機械手臂點位校正之方法之步驟流程圖 The first figure: the flow chart of the steps of the method for correcting the position of the mechanical arm of the present invention

第二圖:本發明機械手臂點位校正之方法其一較佳實施例之點位校正示意圖 The second figure: a method for correcting the position of a preferred embodiment of the present invention

第三圖:本發明機械手臂點位校正之方法其二較佳實施例之點位校正示意圖 The third figure: the method for correcting the position of the mechanical arm of the present invention

本發明之目的及其結構設計功能上的優點,將依據以下圖面所示之較佳實施例予以說明,俾使審查委員能對本發明有更深入且具體之瞭解。 The object of the present invention and its structural design and advantages will be explained in the light of the preferred embodiments shown in the following drawings, so that the reviewing committee can have a more in-depth and specific understanding of the present invention.

首先,請參閱第一~三圖所示,為本發明機械手臂點位校正之方法之步驟流程圖、其一較佳實施例之點位校正示意圖,以及其 二較佳實施例之點位校正示意圖,其中本發明之機械手臂點位校正之方法主要係包括有如下步驟: 步驟一(S1):使用設置於一機械手臂(1)上之校準模組(11)掃描至少三個幾何塊狀物(2),其中幾何塊狀物(2)係設置於相對應垂直一收容器結構(3)之表面(4)上;如第二圖所示,在本發明其一較佳實施例中,垂直於收容器結構(3)之表面(4)上係設置有四個幾何塊狀物(2)之結構;此外,如第三圖所示,在本發明其二較佳實施例中,係為另一種收容器結構(3),於垂直收容器結構(3)之表面(4)上設置有八個幾何塊狀物(2)之結構;以及 步驟二(S2):藉由至少三個幾何塊狀物(2)確定表面(4)之水平狀態,機械手臂(1)係接收水平狀態,調整機械手臂(1)以垂直之方位角進入收容器結構(3)將一待取物件(5)置入或取出;在本發明其一較佳實施例中,收容器結構(3)係由複數個容置槽(31)所組成,而每一容置槽係用以放置一待取物件(5),其中待取物件(5)係為液晶面板之基板或半導體之晶圓等其中之一種物件,當使用本發明之機械手臂點位校正之方法所製備的收容器結構(3)應用於液晶面板廠或半導體晶圓廠時,可有效以機械手臂(1)夾持液晶面板之基板或半導體之晶圓等其中之一種物件,並以垂直於收容器結構(3)之方式精準置入或取出收容器結構(3),而具有不會造成液晶面板之基板或半導體之晶圓等待取物件(5)之抓傷的優勢。 First, please refer to the first to third figures, which are flowcharts of the steps of the method for correcting the position of the robot arm of the present invention, and a schematic diagram of the position correction of the preferred embodiment thereof, and The schematic diagram of the position correction of the second preferred embodiment, wherein the method for correcting the position of the mechanical arm of the present invention mainly comprises the following steps: Step 1 (S1): scanning at least three geometric blocks (2) using a calibration module (11) disposed on a robot arm (1), wherein the geometric block (2) is disposed at a corresponding vertical position On the surface (4) of the container structure (3); as shown in the second figure, in a preferred embodiment of the invention, four surfaces are provided perpendicular to the surface (4) of the container structure (3). The structure of the geometric block (2); further, as shown in the third figure, in the second preferred embodiment of the present invention, it is another container structure (3) in the vertical container structure (3) a structure of eight geometric blocks (2) provided on the surface (4); Step 2 (S2): determining the horizontal state of the surface (4) by at least three geometrical blocks (2), the mechanical arm (1) receiving the horizontal state, and adjusting the mechanical arm (1) to enter the vertical azimuth The container structure (3) puts or takes out an object to be taken (5); in a preferred embodiment of the invention, the container structure (3) is composed of a plurality of accommodating grooves (31), and each A receiving slot is used for placing an object to be taken (5), wherein the object to be taken (5) is one of a substrate of a liquid crystal panel or a wafer of a semiconductor, etc., when using the mechanical arm point correction of the present invention When the container structure (3) prepared by the method is applied to a liquid crystal panel factory or a semiconductor fab, the robot arm (1) can be used to sandwich one of the liquid crystal panel substrate or the semiconductor wafer, and the like. The container structure (3) is accurately placed or taken out perpendicularly to the container structure (3), and has the advantage that the substrate of the liquid crystal panel or the wafer of the semiconductor is not required to be scratched by the object (5).

此外,校準模組(11)係發射一雷射光束(111),並以左右來回方式掃描每一幾何塊狀物(2),以確定幾何塊狀物(2)之中心點位置;再者,幾何塊狀物(2)係具有一凸出部(21)突出於表面(4),而凸出部(21)以表面(4)為切割面,係呈方形、圓形、三角形或多邊形等其中之一種形狀;在本發明其一較佳實施例中,幾何塊狀物(2)係為一直徑為20公厘(mm)的圓形凸出部(21)結構,而校準模組(11) 係發射一雷射光束(111)聚焦在幾何塊狀物(2)上;首先,當雷射光束(111)聚集在一幾何塊狀物(2)上之任一點後,係先往右方移動,待雷射光束(111)偵測到幾何塊狀物(2)之邊界時,再對應往幾何塊狀物(2)的另一邊移動,雷射光束(111)係偵測到幾何塊狀物(2)另一邊之邊界即停止掃描,以計算出掃描之距離;再者,當掃描之距離與幾何塊狀物(2)之直徑20mm長度不符時,則校準模組(11)會往四周圍之任一點移動,再依上述之掃描程序左右掃描幾何塊狀物(2),直到找到掃描的距離等於幾何塊狀物(2)之直徑長度才停止;再者,校準模組(11)依掃描到的幾何塊狀物(2)直徑長度,移動雷射光束(111)找到幾何塊狀物(2)的中心點位置並記錄;之後,校準模組(11)持續依上述程序掃描另外兩個幾何塊狀物(2)結構,掃描三個幾何塊狀物(2)後可決定設置幾何塊狀物(2)之表面(4)的平面座標系,以確定表面(4)之水平狀態;最後,機械手臂(1)會接收表面(4)之水平狀態,並調整機械手臂(1)以與表面(4)呈垂直之方位角進入收容器結構(3)將一待取物件(5)置入或取出,亦即決定表面(4)之平面座標系後,亦可決定此平面座標系之法向量,機械手臂(1)即是以法向量所呈現之方向將液晶面板之基板或半導體之晶圓等其中之一種物件置入或取出收容器結構(3);然而必須注意的是,上述校準模組(11)發射之雷射光束(111)向右開始掃描幾何塊狀物(2)之方向是為說明方便起見,而非以本發明所舉為限,且熟此技藝者當知道校準模組(11)發射之雷射光束(111)只要向左或向右完全掃描幾何塊狀物(2),而得到幾何塊狀物(2)之左右掃描距離,並不會影響本發明的實際實施。 In addition, the calibration module (11) emits a laser beam (111) and scans each geometric block (2) back and forth to determine the center point position of the geometric block (2); The geometric block (2) has a projection (21) protruding from the surface (4), and the projection (21) has a surface (4) as a cutting surface, which is a square, a circle, a triangle or a polygon. One of the shapes; in a preferred embodiment of the invention, the geometric block (2) is a circular projection (21) having a diameter of 20 mm, and the calibration module (11) A laser beam (111) is emitted to focus on the geometric block (2); first, when the laser beam (111) is concentrated at any point on a geometric block (2), it is first to the right Moving, when the laser beam (111) detects the boundary of the geometric block (2), it moves to the other side of the geometric block (2), and the laser beam (111) detects the geometric block. The boundary of the other side of the object (2) stops scanning to calculate the distance of the scan; furthermore, when the distance of the scan does not match the length of the geometric block (2) by 20 mm, the calibration module (11) will Move to any point around the four points, and then scan the geometric block (2) left and right according to the above scanning procedure until the distance of the scan is found to be equal to the diameter of the geometric block (2); in addition, the calibration module ( 11) According to the length of the scanned geometric block (2), move the laser beam (111) to find the position of the center point of the geometric block (2) and record; after that, the calibration module (11) continues according to the above procedure Scanning the other two geometric block (2) structures, scanning the three geometric blocks (2) to determine the plane coordinates of the surface (4) of the geometric block (2) To determine the horizontal state of the surface (4); finally, the robot arm (1) will receive the horizontal state of the surface (4) and adjust the mechanical arm (1) to enter the receiving structure at an azimuth angle perpendicular to the surface (4). (3) After the object to be taken (5) is placed or removed, that is, after determining the plane coordinate system of the surface (4), the normal vector of the plane coordinate system can also be determined, and the mechanical arm (1) is the normal vector. The orientation is such that one of the substrate of the liquid crystal panel or the semiconductor wafer or the like is placed in or taken out of the container structure (3); however, it must be noted that the laser beam emitted by the calibration module (11) (111) The direction of scanning the geometric block (2) to the right is for convenience of description, and is not limited to the invention, and the skilled artisan knows the laser beam emitted by the calibration module (11) ( 111) As long as the geometric block (2) is completely scanned left or right, the left and right scanning distance of the geometric block (2) is obtained, and the actual implementation of the present invention is not affected.

再者,幾何塊狀物(2)亦可為具有一凹入部(圖式無標示)凹陷於表面(4)之態樣,凹入部以表面(4)為切割面,係呈方形、圓形、三角形或多邊形等其中之一種形狀,其中校準模組(11)發射之雷射 光束(111)亦聚焦在具有一凹入部之幾何塊狀物(2)上,再藉由上述之校正程序達到表面(4)之水平狀態之確定,有效使機械手臂(1)以垂直之方位角進入收容器結構(3)將一液晶面板之基板或半導體之晶圓等其中一種待取物件(5)置入或取出。 Furthermore, the geometric block (2) may also have a concave portion (not shown) recessed on the surface (4), and the concave portion has a surface (4) as a cutting surface, and has a square shape and a circular shape. One of a shape such as a triangle or a polygon, in which the calibration module (11) emits a laser The beam (111) is also focused on the geometric block (2) having a recess, and the horizontal state of the surface (4) is determined by the above-mentioned calibration procedure, effectively making the robot arm (1) in a vertical orientation. The corner entering the container structure (3) puts or takes out one of the objects (5) to be taken, such as a substrate of a liquid crystal panel or a wafer of a semiconductor.

由上述之實施說明可知,本發明機械手臂點位校正之方法與現有技術相較之下,本發明具有以下優點: It can be seen from the above description that the method for correcting the position of the robot arm of the present invention has the following advantages compared with the prior art:

1.本發明之機械手臂點位校正之方法係藉由將一可調教式之機械手臂與一收容器結構之平面呈相對垂直之機械手臂校正方法,使機械手臂可藉由自動化之點位校正垂直伸入收容器結構內取出或置放液晶面板之基板或半導體之晶圓等其中之一種待取物件,而不至於造成待取物件之刮傷之優勢者。 1. The method for correcting the position of the mechanical arm of the present invention enables the robot arm to be corrected by automatic point by means of a robotic arm correction method in which a robot arm of an adjustable teaching type is perpendicular to a plane of a container structure. Vertically extending into the structure of the container to take out or place one of the substrate of the liquid crystal panel or the wafer of the semiconductor, etc., without causing the advantage of scratching the object to be taken.

2.本發明之機械手臂點位校正之方法係以校準模組發射之雷射光線聚焦在至少三個幾何塊狀物上,藉由雷射光線在幾何塊狀物上左右掃描之動作,以計算出每一個幾何塊狀物之中心點位置,再以至少三個幾何塊狀物形成一平面之方式計算出幾何塊狀物所位平面的平面方程式,亦即決定幾何塊狀物所位平面之平面座標系後,即可決定此平面座標系之法向量,機械手臂即是以平面座標系之法向量所呈現之方向將液晶面板之基板或半導體之晶圓等其中之一種物件置入或取出收容器結構,具有不使液晶面板之基板或半導體之晶圓等待取物件撞擊到收容器結構而造成刮傷或破碎的情事發生等優點。 2. The method for correcting the position of the mechanical arm of the present invention is to focus the laser beam emitted by the calibration module on at least three geometric blocks, and to scan the left and right of the laser beam on the geometric block. Calculate the position of the center point of each geometric block, and then calculate the plane equation of the plane of the geometric block by forming at least three geometric blocks, that is, determine the plane of the geometric block. After the plane coordinate system, the normal vector of the plane coordinate system can be determined, and the robot arm puts one of the liquid crystal panel substrate or the semiconductor wafer into the direction represented by the normal vector of the plane coordinate system or The structure of taking out the container has the advantages that the substrate of the liquid crystal panel or the wafer of the semiconductor is not caused to hit the container structure, causing scratches or breakage.

3.本發明之機械手臂點位校正之方法係可取代傳統位於液晶面板廠或半導體晶圓廠內以人工教育機台執行由收容器結構取出或置放待取物件之方式,具有減少機台之學習時間、加速產品之生產週期、減低人為失誤之機率,以及減少線上人員之工作負擔等優勢。 3. The method for correcting the position of the mechanical arm of the present invention can replace the traditional method of removing or placing the object to be taken by the container structure by the artificial education machine in the liquid crystal panel factory or the semiconductor fab, and has the mechanism of reducing the machine. Learning time, accelerating the production cycle of products, reducing the chances of human error, and reducing the workload of online personnel.

綜上所述,本發明機械手臂點位校正之方法,的確能藉由上述所揭露之實施例,達到所預期之使用功效,且本發明亦未曾公開於申請前,誠已完全符合專利法之規定與要求。爰依法提出發明專利之申請,懇請惠予審查,並賜准專利,則實感德便。 In summary, the method for correcting the position of the robot arm of the present invention can achieve the intended use efficiency by the above-disclosed embodiments, and the present invention has not been disclosed before the application, and has completely complied with the patent law. Regulations and requirements.爰Issuing an application for a patent for invention in accordance with the law, and asking for a review, and granting a patent, is truly sensible.

惟,上述所揭之圖示及說明,僅為本發明之較佳實施例,非為限定本發明之保護範圍;大凡熟悉該項技藝之人士,其所依本發明之特徵範疇,所作之其它等效變化或修飾,皆應視為不脫離本發明之設計範疇。 The illustrations and descriptions of the present invention are merely preferred embodiments of the present invention, and are not intended to limit the scope of the present invention; those skilled in the art, which are characterized by the scope of the present invention, Equivalent variations or modifications are considered to be within the scope of the design of the invention.

(S1)‧‧‧步驟一 (S1)‧‧‧Step one

(S2)‧‧‧步驟二 (S2)‧‧‧Step 2

Claims (7)

一種機械手臂點位校正之方法,其步驟包括有:步驟一:使用設置於一機械手臂上之校準模組掃描至少三個幾何塊狀物,以計算出每一個幾何塊狀物之中心點位置,其中該等幾何塊狀物係設置於相對應垂直一收容器結構之表面上;以及步驟二:藉由該至少三個幾何塊狀物形成一平面之方式,計算出幾何塊狀物所位平面的平面方程式,於決定幾何塊狀物所位平面之平面座標系後,確定該表面之水平狀態,該機械手臂係接收該水平狀態,繼決定此平面座標系之法向量,調整該機械手臂以該平面座標系之法向量所呈現垂直之方位角進入該收容器結構將一待取物件置入或取出。 A method for mechanical arm point correction includes the following steps: Step 1: Scan at least three geometric blocks using a calibration module disposed on a robot arm to calculate a center point position of each geometric block. , wherein the geometric block is disposed on a surface of the corresponding vertical container structure; and step 2: calculating a geometric block by forming the at least three geometric blocks The planar equation of the plane determines the horizontal state of the surface after determining the plane coordinate system of the plane of the geometric block. The mechanical arm receives the horizontal state, and then determines the normal vector of the plane coordinate system, and adjusts the mechanical arm. A vertical azimuth angle represented by the normal vector of the plane coordinate system enters the container structure to place or remove an object to be taken. 如申請專利範圍第1項所述之機械手臂點位校正之方法,其中該校準模組係發射一雷射光束,並以左右來回方式掃描每一幾何塊狀物,以確定該幾何塊狀物之中心點位置。 The method for correcting a mechanical arm point according to claim 1, wherein the calibration module emits a laser beam and scans each geometric block in a left-right manner to determine the geometric block. The center point position. 如申請專利範圍第1項所述之機械手臂點位校正之方法,其中該幾何塊狀物係具有一凸出部突出於該表面。 The method of mechanical arm position correction according to claim 1, wherein the geometric block has a protrusion protruding from the surface. 如申請專利範圍第3項所述之機械手臂點位校正之方法,其中該凸出部以該表面為切割面,係呈方形、圓形、三角形或多邊形其中之一。 The method for correcting a mechanical arm point according to the third aspect of the invention, wherein the protruding portion has one of a square, a circle, a triangle or a polygon with the surface as a cutting surface. 如申請專利範圍第1項所述之機械手臂點位校正之方法,其中該幾何塊狀物係具有一凹入部凹陷於該表面。 The method of mechanical arm position correction according to claim 1, wherein the geometric block has a concave portion recessed on the surface. 如申請專利範圍第5項所述之機械手臂點位校正之方法,其中該凹入部以該表面為切割面,係呈方形、圓形、三角形或多邊形其中之一。 The method for correcting the position of a robot arm according to claim 5, wherein the concave portion has one of a square, a circle, a triangle or a polygon with the surface as a cutting surface. 如申請專利範圍第1項所述之機械手臂點位校正之方法,其中該待取物係為液晶面板之基板或半導體之晶圓其中之一。 The method for correcting a mechanical arm point according to the first aspect of the invention, wherein the object to be taken is one of a substrate of a liquid crystal panel or a wafer of a semiconductor.
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10260870B2 (en) 2017-09-19 2019-04-16 Industrial Technology Research Institute On-line measuring system, datum calibrating method, deviation measuring method and computer-readable medium
US10737387B2 (en) 2017-12-05 2020-08-11 Industrial Technology Research Institute Robot arm calibration device and method thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10260870B2 (en) 2017-09-19 2019-04-16 Industrial Technology Research Institute On-line measuring system, datum calibrating method, deviation measuring method and computer-readable medium
US10737387B2 (en) 2017-12-05 2020-08-11 Industrial Technology Research Institute Robot arm calibration device and method thereof

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