TWI532814B - Manufacture of adhesive sheet and electronic parts - Google Patents

Manufacture of adhesive sheet and electronic parts Download PDF

Info

Publication number
TWI532814B
TWI532814B TW101117878A TW101117878A TWI532814B TW I532814 B TWI532814 B TW I532814B TW 101117878 A TW101117878 A TW 101117878A TW 101117878 A TW101117878 A TW 101117878A TW I532814 B TWI532814 B TW I532814B
Authority
TW
Taiwan
Prior art keywords
meth
mass
acrylate
parts
adhesive sheet
Prior art date
Application number
TW101117878A
Other languages
Chinese (zh)
Other versions
TW201300491A (en
Inventor
Takeshi Saito
Kazunori Shikano
Original Assignee
Denka Company Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Denka Company Ltd filed Critical Denka Company Ltd
Publication of TW201300491A publication Critical patent/TW201300491A/en
Application granted granted Critical
Publication of TWI532814B publication Critical patent/TWI532814B/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J4/00Adhesives based on organic non-macromolecular compounds having at least one polymerisable carbon-to-carbon unsaturated bond ; adhesives, based on monomers of macromolecular compounds of groups C09J183/00 - C09J183/16
    • C09J4/06Organic non-macromolecular compounds having at least one polymerisable carbon-to-carbon unsaturated bond in combination with a macromolecular compound other than an unsaturated polymer of groups C09J159/00 - C09J187/00
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J151/00Adhesives based on graft polymers in which the grafted component is obtained by reactions only involving carbon-to-carbon unsaturated bonds; Adhesives based on derivatives of such polymers
    • C09J151/06Adhesives based on graft polymers in which the grafted component is obtained by reactions only involving carbon-to-carbon unsaturated bonds; Adhesives based on derivatives of such polymers grafted on to homopolymers or copolymers of aliphatic hydrocarbons containing only one carbon-to-carbon double bond
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/20Adhesives in the form of films or foils characterised by their carriers
    • C09J7/22Plastics; Metallised plastics
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/30Adhesives in the form of films or foils characterised by the adhesive composition
    • C09J7/38Pressure-sensitive adhesives [PSA]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L21/6836Wafer tapes, e.g. grinding or dicing support tapes
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2203/00Applications of adhesives in processes or use of adhesives in the form of films or foils
    • C09J2203/326Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2301/00Additional features of adhesives in the form of films or foils
    • C09J2301/40Additional features of adhesives in the form of films or foils characterized by the presence of essential components
    • C09J2301/416Additional features of adhesives in the form of films or foils characterized by the presence of essential components use of irradiation
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2433/00Presence of (meth)acrylic polymer
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2451/00Presence of graft polymer
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68327Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
    • H01L2221/68336Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding involving stretching of the auxiliary support post dicing
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68381Details of chemical or physical process used for separating the auxiliary support from a device or wafer

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Adhesive Tapes (AREA)
  • Dicing (AREA)

Description

黏著片材及電子零件之製造方法 Adhesive sheet and method for manufacturing electronic parts

本發明係關於黏著片材及使用該黏著片材之電子零件的製造方法。 The present invention relates to an adhesive sheet and a method of manufacturing an electronic component using the same.

半導體晶圓,在形成電路之後貼合黏著片材,然後經過切割成元件薄片(切割)、洗滌、烘乾、黏著片材之拉伸(擴展)、自黏著片材剝離元件薄片(拾取)、裝配等各個工序。 在該等工序中所使用的黏著片材(切割膠帶),自切割工序至烘乾工序對於所切割之元件薄片(晶片)具有充分的黏著力,但在拾取工序時則希望減少黏著力至無黏著劑沉積物之出現。 A semiconductor wafer is bonded to an adhesive sheet after forming a circuit, and then cut into a component sheet (cut), washed, dried, stretched (expanded) of the adhesive sheet, and self-adhesive sheet peeled component sheet (picked), Assembly and other processes. The adhesive sheet (cut tape) used in these processes has sufficient adhesion to the cut component sheet (wafer) from the dicing step to the drying step, but it is desirable to reduce the adhesion to no during the picking process. Adhesive deposits appear.

作為黏著片材,有在對於紫外缐及/或者電子束等活化光線具有穿透性的基材上塗佈藉由紫外缐等而產生聚合固化反應的黏著劑層者。至於該黏著片材,採用的方法為:在切割工序後將紫外缐等照射至黏著劑層,並通過聚合固化黏著劑層來降低黏著力,然後拾取被切割之晶片。 As the adhesive sheet, there is a layer of an adhesive which is subjected to a polymerization curing reaction by ultraviolet ray or the like on a substrate which is transparent to an activating light such as ultraviolet ray and/or an electron beam. As for the adhesive sheet, the method is as follows: after the cutting process, ultraviolet ray or the like is irradiated to the adhesive layer, and the adhesive layer is cured by polymerization to lower the adhesive force, and then the cut wafer is picked up.

作為此種黏著片材,於專利文獻1及專利文獻2中,揭示有在基材面上塗佈黏著劑而形成的黏著片材,該黏著劑含有:例如可藉由活化光線而三維網狀化的、且在分子內具有光聚合性不飽和雙鍵的化合物(多官能性寡聚體)。 As such an adhesive sheet, Patent Document 1 and Patent Document 2 disclose an adhesive sheet formed by applying an adhesive to a surface of a substrate, the adhesive containing, for example, a three-dimensional network by activating light. A compound (polyfunctional oligomer) having a photopolymerizable unsaturated double bond in the molecule.

此外,專利文獻3揭示了一種半導體加工用的黏著片材,該黏著片材藉由在基材面上塗覆一種由基礎聚合物、放射線聚合性化合物、放射線聚合性聚合開始劑組成的黏著劑 層來形成。 Further, Patent Document 3 discloses an adhesive sheet for semiconductor processing by coating an adhesive layer composed of a base polymer, a radiation polymerizable compound, and a radiation polymerizable polymerization initiator on a substrate surface. Layers are formed.

[先前技術文獻] [Previous Technical Literature] [專利文獻] [Patent Literature]

[專利文獻1]日本特開昭60-196956號公報 [Patent Document 1] Japanese Patent Laid-Open Publication No. SHO 60-196956

[專利文獻2]日本特開昭60-223139號公報 [Patent Document 2] Japanese Laid-Open Patent Publication No. 60-223139

[專利文獻3]日本特開昭2002-285134號公報 [Patent Document 3] Japanese Laid-Open Patent Publication No. 2002-285134

在半導體晶圓之加工工序中,在通過測試形成有電路的半導體晶圓之性能而篩分優良品與不良品時,有時會對半導體晶圓進行加熱。又,在除去切割工序中的切削水時,亦對半導體晶圓進行加熱。 In the semiconductor wafer processing step, when the good and defective products are screened by testing the performance of the semiconductor wafer on which the circuit is formed, the semiconductor wafer may be heated. Further, when the cutting water in the dicing step is removed, the semiconductor wafer is also heated.

在進行此種對半導體晶圓的加熱之情形下,有時黏著片材之黏著劑層會因為加熱而軟化,黏著片材過度地黏著於半導體晶圓。如果黏著片材過度地黏著於半導體晶圓,則即使照射紫外缐等而固化黏著劑層亦不會充分降低黏著劑層之黏著力,且成為產生拾取困難或者黏著劑沉積物等不良的原因。 In the case where such heating of the semiconductor wafer is performed, the adhesive layer of the adhesive sheet may be softened by heating, and the adhesive sheet may be excessively adhered to the semiconductor wafer. If the adhesive sheet is excessively adhered to the semiconductor wafer, curing the adhesive layer even if it is irradiated with ultraviolet ray or the like does not sufficiently lower the adhesive force of the adhesive layer, and causes a problem such as difficulty in picking up or deposit of the adhesive or the like.

因此,本發明之主要目的在於提供一種黏著片材,其在加熱時很難產生黏著劑層之軟化。 Accordingly, it is a primary object of the present invention to provide an adhesive sheet which is difficult to produce softening of the adhesive layer upon heating.

本發明人等發現,黏著劑所包含的增黏樹脂之軟化為加熱時導致黏著劑層軟化的主要原因。 The present inventors have found that the softening of the tackifying resin contained in the adhesive is a main cause of softening of the adhesive layer upon heating.

基於該知識,本發明提供一種黏著片材,其係在基材上 積層光固化型黏著劑層而成者,其特徵在於:形成前述光固化型黏著劑層的光固化型黏著劑,包含(甲基)丙烯酸酯共聚物、光聚合性化合物、多官能異氰酸酯固化劑、聚矽氧類接枝共聚物與光聚合起始劑,不包含增黏樹脂,上述基材由丙烯類共聚物形成,該丙烯類共聚物係丙烯、1-丁烯與乙烯之共聚物,上述(甲基)丙烯酸酯共聚物係(甲基)丙烯酸乙酯、(甲基)丙烯酸丁酯與(甲基)丙烯酸甲氧基乙酯之共聚物,上述多官能異氰酸酯固化劑包含3個以上之異氰酸酯基,上述光聚合起始劑自23℃至500℃以10℃/分的升溫速度升溫時,質量損失率為10%的溫度為250℃以上,上述光聚合性化合物,係具有四個以上乙烯基之丙烯酸胺酯寡聚體,且該光聚合性化合物相對於(甲基)丙烯酸酯共聚物100質量份係5質量份以上200質量份以下,上述多官能異氰酸酯固化劑相對於(甲基)丙烯酸酯共聚物100質量份係0.5質量份以上20質量份以下,上述光聚合起始劑相對於(甲基)丙烯酸酯共聚物100質量份係0.1質量份以上20質量份以下。該黏著片材,由於在黏著劑中不包含增黏樹脂,故即使在加熱之情形下亦不會產生黏著劑層之軟化。 Based on this knowledge, the present invention provides an adhesive sheet which is attached to a substrate. A photocurable adhesive layer which forms the photocurable adhesive layer, and comprises a (meth) acrylate copolymer, a photopolymerizable compound, and a polyfunctional isocyanate curing agent. a polyfluorene-based graft copolymer and a photopolymerization initiator, which does not contain a tackifying resin, and the substrate is formed of a propylene-based copolymer which is a copolymer of propylene, 1-butene and ethylene. The (meth) acrylate copolymer is a copolymer of ethyl (meth)acrylate, butyl (meth)acrylate and methoxyethyl (meth)acrylate, and the polyfunctional isocyanate curing agent contains three or more. When the photopolymerization initiator is heated at a temperature elevation rate of 10 ° C /min from 23 ° C to 500 ° C, the temperature loss rate is 10% at a temperature of 250 ° C or higher, and the photopolymerizable compound has four The above-mentioned vinyl acrylate acrylate oligomer, and the photopolymerizable compound is 5 parts by mass or more and 200 parts by mass or less based on 100 parts by mass of the (meth) acrylate copolymer, and the above polyfunctional isocyanate curing agent is relative to (A) base) 100 parts by mass of acrylate-based copolymer 20 parts by mass 0.5 parts by mass or less, the photopolymerization initiator with respect to 20 parts by mass of (meth) acrylic acid ester copolymer 100 parts by mass 0.1 part by mass or less based. Since the adhesive sheet does not contain a tackifying resin in the adhesive, softening of the adhesive layer does not occur even in the case of heating.

該黏著片材,在電子零件之檢驗工序中貼合在該電子零件上而較佳地使用。 The adhesive sheet is preferably used by being attached to the electronic component in the inspection process of the electronic component.

又,本發明提供一種黏著劑,其係用於形成在電子零件的檢驗工序中貼合於該電子零件上的黏著片材中積層於基材上之黏著劑層,其特徵在於:包含(甲基)丙烯酸酯共聚 物、光聚合性化合物、多官能異氰酸酯固化劑、光聚合起始劑與聚矽氧類接枝共聚物,不包含增黏樹脂,上述基材由丙烯類共聚物形成,該丙烯類共聚物係丙烯、1-丁烯與乙烯之共聚物,上述(甲基)丙烯酸酯共聚物係(甲基)丙烯酸乙酯、(甲基)丙烯酸丁酯與(甲基)丙烯酸甲氧基乙酯之共聚物,上述多官能異氰酸酯固化劑包含3個以上之異氰酸酯基,上述光聚合起始劑自23℃至500℃以10℃/分的升溫速度升溫時,質量損失率為10%的溫度為250℃以上,上述光聚合性化合物,係具有四個以上乙烯基之丙烯酸胺酯寡聚體,且該光聚合性化合物相對於(甲基)丙烯酸酯共聚物100質量份係5質量份以上200質量份以下,上述多官能異氰酸酯固化劑相對於(甲基)丙烯酸酯共聚物100質量份係0.5質量份以上20質量份以下,上述光聚合起始劑相對於(甲基)丙烯酸酯共聚物100質量份係0.1質量份以上20質量份以下。 Moreover, the present invention provides an adhesive for forming an adhesive layer laminated on a substrate in an adhesive sheet attached to the electronic component in an inspection process of an electronic component, characterized in that: Acrylate copolymerization a material, a photopolymerizable compound, a polyfunctional isocyanate curing agent, a photopolymerization initiator, and a polyfluorene-based graft copolymer, which do not contain a tackifier resin, and the substrate is formed of a propylene-based copolymer, and the propylene-based copolymer is Copolymer of propylene, 1-butene and ethylene, copolymerization of the above (meth) acrylate copolymer with ethyl (meth) acrylate, butyl (meth) acrylate and methoxy ethyl (meth) acrylate The polyfunctional isocyanate curing agent contains three or more isocyanate groups, and when the photopolymerization initiator is heated at a temperature increase rate of 10 ° C /min from 23 ° C to 500 ° C, the temperature loss rate is 10% and the temperature is 250 ° C. In the above, the photopolymerizable compound is an urethane acrylate oligomer having four or more vinyl groups, and the photopolymerizable compound is contained in an amount of 5 parts by mass or more and 200 parts by mass based on 100 parts by mass of the (meth) acrylate copolymer. In the following, the polyfunctional isocyanate curing agent is used in an amount of 0.5 parts by mass or more and 20 parts by mass or less based on 100 parts by mass of the (meth) acrylate copolymer, and the photopolymerization initiator is 100 parts by mass based on the (meth) acrylate copolymer. 0.1 quality The amount is 20 parts by mass or less.

此外,本發明還提供一種電子零件之製造方法,其包含將貼合有黏著片材之電子零件加熱至60~150℃的加熱工序,其特徵在於:作為前述黏著片材,使用一種在基材上積層光固化型黏著劑層而成之黏著片材,該基材由丙烯類共聚物形成,該丙烯類共聚物係丙烯、1-丁烯與乙烯之共聚物,且形成該光固化型黏著劑層的光固化型黏著劑包含(甲基)丙烯酸酯共聚物、光聚合性化合物、多官能異氰酸酯固化劑、光聚合起始劑與聚矽氧類接枝共聚物,不包含增黏樹脂,上述(甲基)丙烯酸酯共聚物係(甲基)丙烯酸乙 酯、(甲基)丙烯酸丁酯與(甲基)丙烯酸甲氧基乙酯之共聚物,上述多官能異氰酸酯固化劑包含3個以上之異氰酸酯基,上述光聚合起始劑自23℃至500℃以10℃/分的升溫速度升溫時,質量損失率為10%的溫度為250℃以上,上述光聚合性化合物,係具有四個以上乙烯基之丙烯酸胺酯寡聚體,且該光聚合性化合物相對於(甲基)丙烯酸酯共聚物100質量份係5質量份以上200質量份以下,上述多官能異氰酸酯固化劑相對於(甲基)丙烯酸酯共聚物100質量份係0.5質量份以上20質量份以下,上述光聚合起始劑相對於(甲基)丙烯酸酯共聚物100質量份係0.1質量份以上20質量份以下。 Moreover, the present invention provides a method of manufacturing an electronic component, comprising: a heating process of heating an electronic component to which an adhesive sheet is bonded to 60 to 150 ° C, wherein: as the adhesive sheet, a substrate is used. An adhesive sheet formed by laminating a layer of a photocurable adhesive layer formed of a propylene-based copolymer which is a copolymer of propylene, 1-butene and ethylene, and which forms the photocurable adhesive The photocurable adhesive of the agent layer comprises a (meth) acrylate copolymer, a photopolymerizable compound, a polyfunctional isocyanate curing agent, a photopolymerization initiator, and a polyfluorene-based graft copolymer, and does not contain a tackifying resin. The above (meth) acrylate copolymer is (meth) acrylate B a copolymer of an ester, a butyl (meth)acrylate and a methoxyethyl (meth)acrylate, the polyfunctional isocyanate curing agent comprising three or more isocyanate groups, and the photopolymerization initiator is from 23 ° C to 500 ° C When the temperature is raised at a temperature increase rate of 10 ° C /min, the temperature loss rate is 10% and the temperature is 250 ° C or higher, and the photopolymerizable compound is an acrylamide ester oligomer having four or more vinyl groups, and the photopolymerizability is obtained. The compound is 5 parts by mass or more and 200 parts by mass or less based on 100 parts by mass of the (meth) acrylate copolymer, and the polyfunctional isocyanate curing agent is 0.5 parts by mass or more and 20 parts by mass based on 100 parts by mass of the (meth) acrylate copolymer. In the following, the photopolymerization initiator is 0.1 parts by mass or more and 20 parts by mass or less based on 100 parts by mass of the (meth) acrylate copolymer.

在該電子零件之製造方法中,用於性能試驗之加熱工序,至少可以在切割工序之前後的一方實施。即,該電子零件之製造方法,可以包含:貼合工序,其將前述黏著片材貼合在半導體晶圓或者基板與環狀框架上;加熱工序,其將貼合有前述黏著片材之半導體晶圓或者基板裝載於60~150℃的工作臺上使該黏著片材與工作臺相接觸,藉由吸附固定來加熱,並檢驗該半導體晶圓或者基板;切割工序,其將貼付了前述黏著片材的半導體晶圓或者基板切割之後作為半導體晶片或者半導體零件;光照工序,其向前述黏著片材之光固化型黏著劑層照射活化光線;擴展工序,其為增寬前述半導體晶片或者半導體零件之間的間隔而拉伸前述黏著片材;拾取工序,其自前述黏著片材拾取前述半導體晶片或者半導體零件。又,該電子零件之製造 方法,亦可以包含:貼合工序,其將前述黏著片材貼合在半導體晶圓或者基板與環狀框架上;切割工序,其將貼付了前述黏著片材的半導體晶圓或者基板切割之後作為半導體晶片或者半導體零件;加熱工序,其將貼合有前述黏著片材之半導體晶片或者半導體零件裝載於60~150℃的工作臺上使黏著片材與工作臺相接觸,藉由吸附固定來加熱,並檢驗前述半導體晶片或者半導體零件;光照工序,其向前述黏著片材之光固化型黏著劑層照射活化光線;擴展工序,其為增寬前述半導體晶片或者半導體零件之間的間隔而拉伸前述黏著片材;拾取工序,其自前述黏著片材拾取前述半導體晶片或者半導體零件。 In the method of manufacturing an electronic component, the heating process for the performance test may be performed at least one of the steps before and after the cutting process. That is, the method of manufacturing the electronic component may include a bonding step of bonding the adhesive sheet to a semiconductor wafer or a substrate and an annular frame, and a heating step of bonding the semiconductor to which the adhesive sheet is bonded The wafer or substrate is mounted on a table at 60 to 150 ° C to bring the adhesive sheet into contact with the table, heated by adsorption and inspection, and the semiconductor wafer or substrate is inspected; and the cutting process is applied to the adhesive. a semiconductor wafer or a substrate after the sheet is cut as a semiconductor wafer or a semiconductor component; a light irradiation step of irradiating the photocurable adhesive layer of the adhesive sheet with activating light; and an expanding step of widening the semiconductor wafer or the semiconductor component The adhesive sheet is stretched at intervals therebetween, and a pick-up process is performed to pick up the semiconductor wafer or the semiconductor component from the adhesive sheet. Moreover, the manufacture of the electronic component The method may further include a bonding step of bonding the adhesive sheet to a semiconductor wafer or a substrate and an annular frame, and a dicing step of cutting the semiconductor wafer or substrate to which the adhesive sheet is attached a semiconductor wafer or a semiconductor component; a heating process in which a semiconductor wafer or a semiconductor component to which the adhesive sheet is bonded is mounted on a table at 60 to 150 ° C to bring the adhesive sheet into contact with a table, and is heated by adsorption and fixation. And inspecting the semiconductor wafer or the semiconductor component; and irradiating the photocurable adhesive layer of the adhesive sheet with activating light; and expanding the film to stretch the space between the semiconductor wafer or the semiconductor component The adhesive sheet; a picking step of picking up the semiconductor wafer or the semiconductor component from the adhesive sheet.

在這裡,於「增黏樹脂」中,包含為提高丙烯酸類黏著劑之黏性而先前混合之樹脂,例如松香樹脂、萜烯樹脂、脂肪族石油樹脂、芳香族石油樹脂、氫化石油樹脂、苯並呋喃-茚樹脂、苯乙烯樹脂、二甲苯樹脂以及該等樹脂的混合物等。 Here, the "tackifying resin" includes a resin previously mixed to improve the viscosity of the acrylic adhesive, such as rosin resin, terpene resin, aliphatic petroleum resin, aromatic petroleum resin, hydrogenated petroleum resin, benzene. And a furan-indene resin, a styrene resin, a xylene resin, a mixture of the resins, and the like.

依據本發明,提供一種加熱時很難產生黏著劑層之軟化的黏著片材。 According to the present invention, there is provided an adhesive sheet which is hard to produce softening of an adhesive layer upon heating.

以下,說明本發明之較佳實施形態。另外,以下說明之實施形態係顯示本發明之代表性實施形態之一例者,對本發明之範圍的解釋並非因此狹窄。 Hereinafter, preferred embodiments of the present invention will be described. Further, the embodiments described below show an example of a representative embodiment of the present invention, and the explanation of the scope of the present invention is not so narrow.

1.黏著片材 Adhesive sheet

(1)光固化型黏著劑 (1) Light curing adhesive

(1-1)增黏樹脂 (1-1) tackifying resin

(1-2)(甲基)丙烯酸酯共聚物 (1-2) (meth) acrylate copolymer

(1-3)光聚合性化合物 (1-3) Photopolymerizable compound

(1-4)多官能異氰酸酯固化劑 (1-4) Polyfunctional isocyanate curing agent

(1-5)光聚合起始劑 (1-5) Photopolymerization initiator

(2)基材 (2) Substrate

2.電子零件之製造方法 2. Method of manufacturing electronic parts

(1)貼合工序 (1) Fitting process

(2)加熱工序 (2) Heating process

(3)切割工序 (3) Cutting process

(4)光(紫外缐)照射工序 (4) Light (ultraviolet light) irradiation process

(5)擴展.拾取工序 (5) Extension. Picking process

1.黏著片材 Adhesive sheet

本發明之黏著片材,其在基材上積層光固化型黏著劑層(以下,亦單純稱之為「黏著劑層」)而成,其特徵在於在黏著劑中不包含增黏樹脂。本發明之黏著劑,即使在被加熱之情形下也不產生起因於增黏樹脂之軟化的黏著劑層之軟化,故不會過度地黏著於半導體晶圓等。因此,在本發明之黏著片材,可藉由紫外缐等照射充分降低黏著劑層之黏著力,且可以防止拾取不良及黏著劑沉積物。 In the adhesive sheet of the present invention, a photocurable adhesive layer (hereinafter also referred to simply as "adhesive layer") is laminated on the substrate, and the tackifier is not contained in the adhesive. The adhesive of the present invention does not cause softening of the adhesive layer due to softening of the tackifying resin even when heated, and therefore does not excessively adhere to the semiconductor wafer or the like. Therefore, in the adhesive sheet of the present invention, the adhesion of the adhesive layer can be sufficiently reduced by irradiation with ultraviolet rays or the like, and pickup defects and adhesive deposits can be prevented.

(1)光固化型黏著劑 (1) Light curing adhesive

本發明之黏著片材的形成黏著劑層之光固化型黏著劑,包含(甲基)丙烯酸酯共聚物、光聚合性化合物、多官能異 氰酸酯固化劑與光聚合起始劑,不包含增黏樹脂。 The photocurable adhesive forming the adhesive layer of the adhesive sheet of the present invention comprises a (meth) acrylate copolymer, a photopolymerizable compound, and a polyfunctional The cyanate curing agent and the photopolymerization initiator do not contain a tackifying resin.

(1-1)增黏樹脂 (1-1) tackifying resin

作為加熱時導致黏著劑層之軟化的增黏樹脂,無特別之限定,然而可列舉松香樹脂、萜烯樹脂、脂肪族石油樹脂、芳香族石油樹脂、氫化石油樹脂、苯並呋喃-茚樹脂、苯乙烯樹脂、二甲苯樹脂以及該等樹脂的混合物。 The tackifier resin which causes softening of the adhesive layer during heating is not particularly limited, and examples thereof include rosin resins, terpene resins, aliphatic petroleum resins, aromatic petroleum resins, hydrogenated petroleum resins, benzofuran-indene resins, and the like. A styrene resin, a xylene resin, and a mixture of such resins.

黏著劑中只要不包含增黏樹脂,亦可以添加剝離增強劑、抗老化劑、填料、紫外缐吸收劑以及光穩定劑等各種添加劑。在剝離增強劑中,可以使用例如聚矽氧類接枝共聚物。 As long as the tackifier resin is not contained in the adhesive, various additives such as a peeling enhancer, an anti-aging agent, a filler, an ultraviolet ray absorbing agent, and a light stabilizer may be added. Among the peeling enhancers, for example, a polyfluorene-based graft copolymer can be used.

(1-2)(甲基)丙烯酸酯共聚物 (1-2) (meth) acrylate copolymer

(甲基)丙烯酸酯共聚物係,僅為(甲基)丙烯酸酯單體之聚合物,或者,(甲基)丙烯酸酯單體與乙烯基化合物單體之共聚物。另外,(甲基)丙烯酸酯係指丙烯酸酯與甲基丙烯酸酯之總稱。包含(甲基)丙烯酸酯等(甲基)的化合物等也同樣,係指在名稱中包含「甲基」之化合物與不包含「甲基」之化合物的總稱。 The (meth) acrylate copolymer is only a polymer of a (meth) acrylate monomer or a copolymer of a (meth) acrylate monomer and a vinyl compound monomer. Further, (meth) acrylate means a general term for acrylate and methacrylate. Similarly, a compound containing a (meth) acrylate (meth) acrylate or the like is a generic term for a compound containing a "methyl group" in the name and a compound not including a "methyl group".

作為(甲基)丙烯酸酯的單體,可以列舉例如(甲基)丙烯酸丁酯、2-(甲基)丙烯酸丁酯、t-(甲基)丙烯酸丁酯、(甲基)丙烯酸戊酯、(甲基)丙烯酸辛酯、(甲基)丙烯酸2-乙基己酯、(甲基)丙烯酸壬酯、(甲基)丙烯酸癸酯、(甲基)丙烯酸月桂酯、(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸異丙酯、(甲基)丙烯酸十三酯、(甲基)丙烯酸十四酯、(甲基)丙烯酸十六酯、(甲基)丙烯酸十八酯、(甲基)丙 烯酸環己酯、(甲基)丙烯酸異莰酯、(甲基)丙烯酸雙環戊酯、甲基丙烯酸苄酯、(甲基)丙烯酸甲氧基乙酯、(甲基)丙烯酸乙氧乙酯、(甲基)丙烯酸丁氧甲酯以及乙氧基-n-(甲基)丙烯酸丙酯、(甲基)丙烯酸-2-羥乙酯、(甲基)丙烯酸-2-羥基丙酯、(甲基)丙烯酸-4-羥基丁酯。 Examples of the monomer of the (meth) acrylate include butyl (meth)acrylate, butyl 2-(meth)acrylate, butyl t-(meth)acrylate, and amyl (meth)acrylate. Octyl (meth)acrylate, 2-ethylhexyl (meth)acrylate, decyl (meth)acrylate, decyl (meth)acrylate, lauryl (meth)acrylate, (meth)acrylate Ester, ethyl (meth)acrylate, isopropyl (meth)acrylate, tridecyl (meth)acrylate, tetradecyl (meth)acrylate, hexadecyl (meth)acrylate, (methyl) Octadecyl acrylate, (meth) propyl Cyclohexyl enoate, isodecyl (meth) acrylate, dicyclopentanyl (meth) acrylate, benzyl methacrylate, methoxyethyl (meth) acrylate, ethoxyethyl (meth) acrylate , butoxymethyl (meth)acrylate and propyl ethoxy-n-(meth)acrylate, 2-hydroxyethyl (meth)acrylate, 2-hydroxypropyl (meth)acrylate, ( 4-hydroxybutyl methacrylate.

作為能夠在(甲基)丙烯酸酯單體上共聚的乙烯基化合物單體,可列舉含官能基單體,其包含一種以上羧基、環氧基、醯胺基、胺基、羥甲基、磺酸基、磺胺酸基或者亞燐酸酯基等官能基群。 Examples of the vinyl compound monomer copolymerizable on the (meth) acrylate monomer include a functional group-containing monomer containing one or more carboxyl groups, an epoxy group, a decylamino group, an amine group, a hydroxymethyl group, and a sulfonate. A functional group such as an acid group, a sulfamic acid group or a sulfonate group.

作為具有羧基之單體,例如有(甲基)丙烯酸、丁烯酸、馬來酸、無水馬來酸、亞甲基丁二酸、反丁烯二酸、丙烯醯胺基-N-乙醇酸及桂皮酸。 As the monomer having a carboxyl group, for example, (meth)acrylic acid, crotonic acid, maleic acid, anhydrous maleic acid, methylene succinic acid, fumaric acid, acrylamido-N-glycolic acid And cinnamic acid.

作為具有環氧基之單體,例如有丙烯基丙三基醚以及(甲基)丙烯酸環氧丙基醚。 Examples of the monomer having an epoxy group include propenyl propyl triether ether and (meth)acrylic acid epoxy propyl ether.

作為具有醯胺基之單體,例如有(甲基)丙烯醯胺。 As the monomer having a guanamine group, for example, (meth) acrylamide.

作為具有胺基之單體,例如有丙烯酸-N,N-二甲胺乙酯。 As the monomer having an amine group, for example, N-N-dimethylamine ethyl acrylate is used.

作為具有羥甲基之單體,例如有N-羥甲基丙烯醯胺。 As the monomer having a methylol group, for example, N-methylol acrylamide can be used.

(1-3)光聚合性化合物 (1-3) Photopolymerizable compound

作為光聚合性化合物,例如可以使用三羥甲基丙烷三丙烯酸酯、新戊四醇四丙烯酸酯、三丙烯酸異戊四醇酯、季戊四醇三丙烯酸酯、二新戊四醇一羥五丙烯酸酯、聚二季戊四醇六丙烯酸酯、1,4-丁二醇雙丙烯酸酯、1,6己二醇雙丙稀酸酯、聚乙二醇二丙烯酸酯、三聚氰酸三乙基丙烯酸 酯、市售之低聚酯丙烯酸酯等。 As the photopolymerizable compound, for example, trimethylolpropane triacrylate, neopentyltetraol tetraacrylate, pentaerythritol triacrylate, pentaerythritol triacrylate, dipentaerythritol monohydroxypentaacrylate, or the like can be used. Polydipentaerythritol hexaacrylate, 1,4-butanediol diacrylate, 1,6 hexanediol diacrylate, polyethylene glycol diacrylate, triethyl acrylate Ester, commercially available oligomeric acrylate, and the like.

作為光聚合性化合物,除前述丙烯酸酯類化合物,還可以使用丙烯酸胺酯寡聚體。丙烯酸胺酯寡聚體係,在使聚酯型態與聚醚型態等聚醇化合物與多價異氰酸化合物反應而得之端異氰酸酯氨基甲酸乙酯預聚物上,反應具有羥基之(甲基)丙烯酸酯而得。 As the photopolymerizable compound, in addition to the above acrylate compound, an urethane acrylate oligomer can also be used. An urethane oligo-polymer system having a hydroxyl group on a terminal isocyanate urethane prepolymer obtained by reacting a polyester compound with a polyether-type polyvalent alcohol compound and a polyvalent isocyanate compound Base) acrylate derived.

在多價異氰酸化合物中,例如可以使用2,4-甲苯基二異氰酸酯、2,6-甲苯基二異氰酸酯、1,3-二異氰酸二甲苯酯、1,4-二異氰酸二甲苯酯、4,4-二苯基甲烷二異氰酸酯、三甲基六亞甲基二異氰酸酯、六亞甲基二異氰酸酯、二異氰酸異佛爾酮等。又,在具有羥基之(甲基)丙烯酸酯中,例如可以使用(甲基)丙烯酸-2-羥乙酯、(甲基)丙烯酸-2-羥基丙酯、聚乙二醇(甲基)丙烯酸酯、三丙烯酸異戊四醇酯、環氧丙醇二(甲基)丙烯酸酯、二新戊四醇一羥五丙烯酸酯等。 Among the polyvalent isocyanate compounds, for example, 2,4-tolyl diisocyanate, 2,6-tolyl diisocyanate, 1,3-diisocyanate, 1,4-diisocyanate can be used. Xylene ester, 4,4-diphenylmethane diisocyanate, trimethylhexamethylene diisocyanate, hexamethylene diisocyanate, isophorone diisocyanate, and the like. Further, among the (meth) acrylate having a hydroxyl group, for example, 2-hydroxyethyl (meth)acrylate, 2-hydroxypropyl (meth)acrylate, or polyethylene glycol (meth)acrylic acid can be used. Ester, pentaerythritol triacrylate, propylene glycol di(meth) acrylate, dipentaerythritol monohydroxy pentoxide, and the like.

作為光聚合性化合物,較佳的是,具有四個以上乙烯基之丙烯酸胺酯寡聚體,在紫外缐等照射後的黏著劑之固化良好的一點。 As the photopolymerizable compound, an urethane acrylate oligomer having four or more vinyl groups is preferred, and the adhesive after irradiation with ultraviolet ray or the like is well cured.

光聚合性化合物之混合量,較佳的是,對於(甲基)丙烯酸酯共聚物100質量份設定為5質量份以上200質量份以下。如果使光聚合性化合物之混合量減少,則照射放射線之後的黏著片材之剝離性降低,容易產生半導體晶片之拾取不良。另一方面,如果增加光聚合性化合物之混合量,則由於切割時黏著劑之刮起很容易產生拾取不良,且由於 反應殘渣產生微小的黏著劑沉積物,導致污染。 The amount of the photopolymerizable compound is preferably 5 parts by mass or more and 200 parts by mass or less based on 100 parts by mass of the (meth) acrylate copolymer. When the amount of the photopolymerizable compound is reduced, the peeling property of the adhesive sheet after irradiation with radiation is lowered, and the pickup failure of the semiconductor wafer is likely to occur. On the other hand, if the amount of the photopolymerizable compound is increased, picking up due to the sticking of the adhesive during cutting is liable to cause picking failure, and The reaction residue produces tiny deposits of adhesive that cause contamination.

(1-4)多官能異氰酸酯固化劑 (1-4) Polyfunctional isocyanate curing agent

在多官能異氰酸酯固化劑中,使用包含兩個以上異氰酸酯基者,例如芳香族聚異氰酸酯、脂肪族聚異氰酸酯、脂環族聚異氰酸酯、該等二聚物及三聚物、加成物等。 Among the polyfunctional isocyanate curing agents, those containing two or more isocyanate groups, for example, aromatic polyisocyanates, aliphatic polyisocyanates, alicyclic polyisocyanates, such dimers and trimers, adducts and the like are used.

作為芳香族聚異氰酸酯,例如有1,3-苯二異氰酸酯、4,4'-二苯二異氰酸酯、1,4-苯二異氰酸酯、4,4'-二苯基甲烷二異氰酸酯、2,4-甲苯基二異氰酸酯、2,6-甲苯基二異氰酸酯、4,4'-甲苯胺二異氰酸酯、2,4,6-甲苯基異氰酸酯、1,3,5-甲苯基異氰酸酯苯、联大茴香胺聯異氰酸酯、4,4'-二苯醚二異氰酸酯、4,4',4"-三苯甲烷甲苯基異氰酸酯、ω,ω'-二異氰酸酯-1,3-二甲苯、ω,ω'-二異氰酸酯-1,4-二甲苯、ω,ω'-二異氰酸酯-1,4-二乙苯、1,4-四甲基苯二亞甲基二異氰酸酯以及1,3-四甲基苯二亞甲基二異氰酸酯。 Examples of the aromatic polyisocyanate include 1,3-benzene diisocyanate, 4,4'-diphenyl diisocyanate, 1,4-phenylene diisocyanate, 4,4'-diphenylmethane diisocyanate, and 2,4-. Tolyl diisocyanate, 2,6-tolyl diisocyanate, 4,4'-toluidine diisocyanate, 2,4,6-tolyl isocyanate, 1,3,5-tolyl isocyanate benzene, dianion amine Isocyanate, 4,4'-diphenyl ether diisocyanate, 4,4',4"-triphenylmethane tolyl isocyanate, ω,ω'-diisocyanate-1,3-xylene, ω,ω'-diisocyanate -1,4-xylene, ω,ω'-diisocyanate-1,4-diethylbenzene, 1,4-tetramethylbenzenedimethylene diisocyanate, and 1,3-tetramethylbenzene dimethylene Diisocyanate.

作為脂肪族聚異氰酸酯,例如有伸丙基二異氰酸酯、伸丁基二異氰酸酯、六亞甲基二異氰酸酯、五亞甲基二異氰酸酯、1,2-伸丙基二異氰酸酯、2,3-丁烯二異氰酸酯、1,3-丁烯二異氰酸酯、十二亞甲基二異氰酸酯以及2,4,4-三甲基六亞甲基二異氰酸酯。 As the aliphatic polyisocyanate, for example, propyl diisocyanate, butyl diisocyanate, hexamethylene diisocyanate, pentamethylene diisocyanate, 1,2-propyl diisocyanate, 2,3-butene Diisocyanate, 1,3-butene diisocyanate, dodecamethylene diisocyanate and 2,4,4-trimethylhexamethylene diisocyanate.

作為脂環族聚異氰酸酯,例如有3-異氰酸甲基3,5,5-三甲基環己異氰酸酯、1,3-環戊烷二異氰酸酯、1,3-環己烷二異氰酸酯、1,4-環己烷二異氰酸酯、甲基-2,4-環己烷二異氰酸酯、甲基-2,6-環己烷二異氰酸酯、4,4'-亞甲雙(環己烷異氰酸酯)、1,4-二(環己烷異氰酸酯)環己烷以及1,4- 二(異氰酸酯基亞甲基)環己烷。 As the alicyclic polyisocyanate, for example, 3-isocyanatomethyl 3,5,5-trimethylcyclohexyl isocyanate, 1,3-cyclopentane diisocyanate, 1,3-cyclohexane diisocyanate, 1 , 4-cyclohexane diisocyanate, methyl-2,4-cyclohexane diisocyanate, methyl-2,6-cyclohexane diisocyanate, 4,4'-methylenebis(cyclohexane isocyanate), 1,4-bis(cyclohexane isocyanate)cyclohexane and 1,4- Bis(isocyanatemethylene)cyclohexane.

作為二聚物及三聚物、加成物,例如有二苯基甲烷二異氰酸酯之二聚物、六亞甲基二異氰酸酯之三聚物、三羥甲基丙烷與甲苯基二異氰酸酯的加成物、三羥甲基丙烷與六亞甲基二異氰酸酯的加成物。 Examples of dimers and trimers and adducts include dimers of diphenylmethane diisocyanate, trimer of hexamethylene diisocyanate, and addition of trimethylolpropane and tolyl diisocyanate. An adduct of trimethylolpropane and hexamethylene diisocyanate.

前述聚異氰酸酯中,具有三個以上異氰酸酯基為較佳,特別佳的是,六亞甲基二異氰酸酯之三聚物、三羥甲基丙烷與甲苯基二異氰酸酯的加成物、三羥甲基丙烷與六亞甲基二異氰酸酯的加成物。 Among the above polyisocyanates, it is preferred to have three or more isocyanate groups, and particularly preferred is a trimer of hexamethylene diisocyanate, an adduct of trimethylolpropane and tolyl diisocyanate, and a trimethylol group. An adduct of propane with hexamethylene diisocyanate.

多官能異氰酸酯固化劑之混合比,較佳的是,對於(甲基)丙烯酸酯共聚物100質量份設定為0.5質量份以上20質量份以下,更佳的是,設定為1.0質量份以上10質量份以下。如果多官能異氰酸酯固化劑為0.5質量份以上,則黏著力並不過強,故能夠抑制拾取不良之發生。如果多官能異氰酸酯固化劑為20質量份以下,則黏著力並不降低,切割時可以維持半導體晶片的保持性。 The mixing ratio of the polyfunctional isocyanate curing agent is preferably 0.5 parts by mass or more and 20 parts by mass or less based on 100 parts by mass of the (meth) acrylate copolymer, and more preferably 1.0 parts by mass or more and 10 parts by mass. The following. When the polyfunctional isocyanate curing agent is 0.5 parts by mass or more, the adhesive force is not excessively strong, so that occurrence of pickup failure can be suppressed. When the polyfunctional isocyanate curing agent is 20 parts by mass or less, the adhesive force is not lowered, and the retention of the semiconductor wafer can be maintained at the time of dicing.

(1-5)光聚合起始劑 (1-5) Photopolymerization initiator

在光聚合起始劑中,可以使用安息香、安息香芳烷醚類、苯乙酮類、蔥肽類、塞噸酮類、縮酮類、二苯基酮類或者氧雜蒽酮類等。 Among the photopolymerization initiators, benzoin, benzoin aryl ethers, acetophenones, onion peptides, ketoxines, ketals, diphenylketones or xanthones can be used.

作為安息香,例如有安息香、安息香甲醚、安息香乙醚、安息香二丙醚等。 Examples of the benzoin include benzoin, benzoin methyl ether, benzoin ethyl ether, benzoin dipropyl ether and the like.

作為苯乙酮類,例如有安息香芳烷醚類、苯乙酮、2,2-二甲氧基-2-苯乙酮、2,2-二乙氧基-2-苯乙酮、1,1-二氯苯 乙酮等。 As the acetophenones, for example, benzoin aryl ethers, acetophenone, 2,2-dimethoxy-2-acetophenone, 2,2-diethoxy-2-acetophenone, 1, 1-dichlorobenzene Ethyl ketone and the like.

作為蔥肽類,有2-甲基蒽醌、2-乙基蒽醌、2-叔-丁基蒽醌、1-氯蒽醌等。 Examples of the onion peptides include 2-methylhydrazine, 2-ethylhydrazine, 2-tert-butylhydrazine, 1-chloroindole and the like.

作為塞噸酮類,例如有2,4-二甲基塞噸酮、2,4-二異丙基塞噸酮、2-氯塞噸酮、2,4-二異丙基塞噸酮等。 Examples of the ketoxines include 2,4-dimethyl ketoxime, 2,4-diisopropyl ketoxime, 2-chloroseptone, 2,4-diisopropyl ketoxime, and the like. .

作為縮酮類,例如有苯乙酮二甲基縮酮、苯甲基二甲基縮酮、苯甲基二苯基硫、一硫化四甲基秋蘭姆、偶氮雙異丁腈、二苯基、雙乙醯、β-氯蒽醌等。 Examples of the ketals include acetophenone dimethyl ketal, benzyl dimethyl ketal, benzyl diphenyl sulphide, tetramethyl thiuram monosulfide, azobisisobutyronitrile, and Phenyl, diacetyl, β-chloropurine and the like.

光聚合起始劑,自溫度23℃以10℃/分的升溫速度升溫至500℃,質量損失率為10%時之溫度為250℃以上為佳。 在後述之加熱工序中將貼合於晶圓等中的黏著片材加熱至60~150℃時,如果光聚合起始劑揮發或劣化,則在後工序即光照工序中的黏著劑層之固化不充分,無法充分降低黏著力,成為導致後續拾取工序中拾取不良的主要原因。因此,較佳的是,使用具有如上所述之性狀,加熱時很難產生揮發及劣化的光聚合起始劑。 The photopolymerization initiator is heated from a temperature of 23 ° C to a temperature increase rate of 10 ° C / min to 500 ° C, and a mass loss rate of 10% is preferably 250 ° C or more. When the adhesive sheet bonded to the wafer or the like is heated to 60 to 150 ° C in the heating step described later, if the photopolymerization initiator is volatilized or deteriorated, the adhesive layer is cured in the subsequent step, that is, in the light irradiation step. Insufficient, the adhesion cannot be sufficiently reduced, which is the main cause of poor pickup in the subsequent picking process. Therefore, it is preferred to use a photopolymerization initiator which has the above-described properties and is less likely to cause volatilization and deterioration upon heating.

作為前述溫度為250℃以上的光聚合起始劑,可以列舉乙酮,1-[9-乙基-6-(2-甲苯甲醯基)-9H-咔唑-3-基]-,1-(O-乙醯基肟)(BASF JAPAN公司製造、產品名稱IRGACURE OXE02)、2,4,6-三甲基苯甲酰基-二苯基膦氧化物(BASF JAPAN公司製造,產品名稱LUCIRIN TPO)以及2-羥基-1-{4-[4-(2-羥基-2-甲基-丙醯基)-苯甲基]-苯基}-2-甲基-丙烷-1-酮(BASF JAPAN公司製造,產品名稱IRGACURE127)、2-苯基-2-二甲胺基-1-(4-嗎啉基苯基)-丁酮-1(BASF JAPAN 公司製造,產品名稱IRGACURE369)、2-二甲胺基-2-(4-甲基-苯甲基)-1-(4-嗎啉-4-基-苯基)-丁烷-1-酮(BASF JAPAN公司製造,產品名稱IRGACURE379)、二(2,4,6-三甲基苯甲酰基)-苯基膦氧化物(BASF JAPAN公司製造,產品名稱IRGACURE819)等。 As the photopolymerization initiator having a temperature of 250 ° C or higher, ethyl ketone, 1-[9-ethyl-6-(2-toluamyl)-9H-carbazol-3-yl]-, 1 -(O-Ethyl hydrazine) (manufactured by BASF JAPAN, product name IRGACURE OXE02), 2,4,6-trimethylbenzoyl-diphenylphosphine oxide (manufactured by BASF JAPAN, product name LUCIRIN TPO And 2-hydroxy-1-{4-[4-(2-hydroxy-2-methyl-propenyl)-benzyl]-phenyl}-2-methyl-propan-1-one (BASF) Manufactured by JAPAN, product name IRGACURE127), 2-phenyl-2-dimethylamino-1-(4-morpholinylphenyl)-butanone-1 (BASF JAPAN Manufactured by the company, product name IRGACURE 369), 2-dimethylamino-2-(4-methyl-benzyl)-1-(4-morpholin-4-yl-phenyl)-butan-1-one (manufactured by BASF JAPAN, product name IRGACURE 379), bis(2,4,6-trimethylbenzoyl)-phenylphosphine oxide (manufactured by BASF JAPAN, product name: IRGACURE 819).

其中,特別是以前述溫度為270℃以上的乙酮,1-[9-乙基-6-(2-甲苯甲醯基)-9H-咔唑-3-基]-,1-(O-乙醯基肟)(BASF JAPAN公司製造、產品名稱IRGACURE OXE02)、2,4,6-三甲基苯甲酰基-二苯基膦氧化物(BASF JAPAN公司製造,產品名稱LUCIRIN TPO)以及2-羥基-1-{4-[4-(2-羥基-2-甲基-丙醯基)-苯甲基]-苯基}-2-甲基-丙烷-1-酮(BASF JAPAN公司製造,產品名稱IRGACURE127)為佳。 Among them, especially the above-mentioned temperature is 270 ° C or more of ethyl ketone, 1-[9-ethyl-6-(2-toluamyl)-9H-carbazol-3-yl]-, 1-(O- Ethyl acetate (manufactured by BASF JAPAN, product name IRGACURE OXE02), 2,4,6-trimethylbenzoyl-diphenylphosphine oxide (manufactured by BASF JAPAN, product name LUCIRIN TPO) and 2- Hydroxy-1-{4-[4-(2-hydroxy-2-methyl-propenyl)-benzyl]-phenyl}-2-methyl-propan-1-one (manufactured by BASF JAPAN, Product name IRGACURE127) is preferred.

光聚合起始劑之混合量,較佳的是,對於(甲基)丙烯酸酯聚合物100質量份為0.1質量份以上20質量份以下。若混合量過少,則照射放射線後之黏著片材的剝離性降低,容易產生半導體晶片之拾取不良。另一方面,若混合量過多,則光聚合起始劑流向黏著劑表面,導致污染。 The amount of the photopolymerization initiator to be added is preferably 0.1 parts by mass or more and 20 parts by mass or less based on 100 parts by mass of the (meth) acrylate polymer. When the amount of the mixture is too small, the peeling property of the adhesive sheet after irradiation with radiation is lowered, and the pickup failure of the semiconductor wafer is likely to occur. On the other hand, if the amount of the mixture is too large, the photopolymerization initiator flows to the surface of the adhesive to cause contamination.

在光聚合起始劑中,根据需要亦可以組合1種或者2種先前衆所周知的光聚合促進劑而並用。在光聚合促進劑中,可以使用安息香酸類及第三級胺等。作為第三級胺,可以列舉三乙胺、四亞乙基五胺、二甲胺乙醚等。 In the photopolymerization initiator, one or two kinds of previously known photopolymerization accelerators may be used in combination as needed. Among the photopolymerization accelerators, benzoic acid, tertiary amine, and the like can be used. Examples of the tertiary amine include triethylamine, tetraethylenepentamine, dimethylamine ether and the like.

黏著劑層之厚度,較佳為3μm以上至100μm,特別是以5μm以上至20μm為佳。若黏著劑層過厚,黏著力會變得 過高,拾取性降低。又,若黏著劑層過薄,黏著力會變得過低,切割時的晶片保持性降低,有時在環狀框架與薄片之間產生剝離。 The thickness of the adhesive layer is preferably from 3 μm to 100 μm, particularly preferably from 5 μm to 20 μm. If the adhesive layer is too thick, the adhesion will become Too high, the pickup is reduced. Further, when the adhesive layer is too thin, the adhesive force is too low, and the wafer retainability at the time of dicing is lowered, and peeling may occur between the annular frame and the sheet.

(2)基材 (2) Substrate

作為基材之材料,例如可以列舉利用金屬離子將聚氯乙烯、聚對酞酸乙二酯、乙烯-醋酸乙烯共聚物、乙烯-丙烯酸-丙烯酸酯薄膜、乙烯-丙烯酸乙酯共聚物、聚乙烯、聚丙烯、丙烯類共聚物、乙烯-丙烯酸共聚物以及乙烯-(甲基)丙烯酸共聚物及乙烯-(甲基)丙烯酸-(甲基)丙烯酸酯共聚物等交聯之離聚物樹脂等。基材可以是該等樹脂的混合物或共聚物,亦可以是由該等樹脂組成之薄膜及薄片之積層體。 Examples of the material of the substrate include polyvinyl chloride, polyethylene terephthalate, ethylene-vinyl acetate copolymer, ethylene-acrylic acid-acrylate film, ethylene-ethyl acrylate copolymer, and polyethylene using metal ions. , polypropylene, propylene copolymer, ethylene-acrylic acid copolymer, and ethylene-(meth)acrylic acid copolymer and ethylene-(meth)acrylic acid-(meth)acrylate copolymer, etc. . The substrate may be a mixture or a copolymer of the resins, or may be a laminate of a film and a sheet composed of the resins.

在基材之材料中,使用丙烯類共聚物為佳。將耐熱性與伸長性良好的丙烯類共聚物使用為材料,可以得到即使加熱也不會引起軟化及熔化,不產生收縮,又能夠在擴展.拾取工序中充分拉伸的黏著片材。 Among the materials of the substrate, a propylene-based copolymer is preferably used. A propylene-based copolymer having good heat resistance and extensibility is used as a material, and it can be obtained that it does not cause softening and melting even when heated, does not cause shrinkage, and can be expanded. An adhesive sheet that is sufficiently stretched in the picking process.

作為丙烯類共聚物,例如有丙烯與其他成分之隨機共聚物、丙烯與其他成分之嵌段共聚物、丙烯與其他成分之交替共聚物。作為其他成分,有乙烯、1-丁烯、1-戊烯、1-己烯、1-庚烯等α-烯烴、至少由兩種以上α-烯烴組成之共聚物、苯乙烯-二烯共聚物等。 Examples of the propylene-based copolymer include a random copolymer of propylene and other components, a block copolymer of propylene and other components, and an alternating copolymer of propylene and other components. As other components, there are an α-olefin such as ethylene, 1-butene, 1-pentene, 1-hexene or 1-heptene, a copolymer composed of at least two or more α-olefins, and a styrene-diene copolymer. Things and so on.

在丙烯類共聚物中,特別是以丙烯與1-丁烯以及乙烯的共聚物為佳。丙烯與1-丁烯以及乙烯的共聚物,除耐熱性之外還具有柔軟性,故藉由對其之使用可以得到擴展性良 好之黏著片材。 Among the propylene-based copolymers, a copolymer of propylene with 1-butene and ethylene is preferred. A copolymer of propylene and 1-butene and ethylene has flexibility in addition to heat resistance, so that it can be expanded by using it. Good adhesion to the sheet.

基材,可以是由前述材料組成之單層或者多層之薄膜或者薄片,亦可以是積層由不同材料組成之薄膜等者。基材之厚度為50~200μm,較佳為70~150μm。 The substrate may be a single layer or a plurality of layers or sheets composed of the foregoing materials, or may be a film composed of different materials. The thickness of the substrate is 50 to 200 μm, preferably 70 to 150 μm.

對於基材,較佳的是,實施靜電防止處理。作為靜電防止處理,有向基材添加抗靜電劑之處理、向基材表面塗佈抗靜電劑之處理、藉由電暈放電之處理。 For the substrate, it is preferred to carry out static electricity prevention treatment. As the static electricity prevention treatment, there is a treatment of adding an antistatic agent to the substrate, a treatment of applying an antistatic agent to the surface of the substrate, and a treatment by corona discharge.

作為抗靜電劑,例如可以使用四級胺鹽單體等。作為四級胺鹽單體,例如可以列舉二甲胺乙酯四級氯化物、二乙胺乙酯四級氯化物、甲基乙基胺甲基丙烯酸酯四級氯化物、p-二甲胺苯乙烯四級氯化物以及p-二乙胺苯乙烯四級氯化物。其中,以二甲胺乙酯四級氯化物為佳。 As the antistatic agent, for example, a quaternary amine salt monomer or the like can be used. Examples of the quaternary amine salt monomer include dimethylamine ethyl ester tetrachloride, diethylamine ethyl ester tetrachloride, methyl ethylamine methacrylate tetrachloride, and p-dimethylamine. Styrene quaternary chloride and p-diethylamine styrene quaternary chloride. Among them, dimethylamine ethyl ester tetrachloride is preferred.

2.電子零件之製造方法 2. Method of manufacturing electronic parts

本發明之電子零件之製造方法,包含將貼合前述黏著片材之電子零件加熱至60~150℃之工序。下面,依次說明製造方法之具體工序。然而,本發明所說的「電子零件」係指半導體晶圓、基板、半導體晶片、半導體零件等。 The method for producing an electronic component according to the present invention includes the step of heating the electronic component to which the adhesive sheet is bonded to 60 to 150 °C. Hereinafter, specific steps of the manufacturing method will be sequentially described. However, the term "electronic component" as used in the present invention means a semiconductor wafer, a substrate, a semiconductor wafer, a semiconductor component, or the like.

(1)貼合工序 (1) Fitting process

首先,在貼合工序中,將黏著片材貼合至半導體晶圓(或者基板)與環狀框架上。晶圓,可以是矽晶圓以及氮化鎵晶圓、碳化矽晶圓、藍寶石晶圓等先前通用之晶圓。 First, in the bonding step, the adhesive sheet is bonded to the semiconductor wafer (or substrate) and the annular frame. Wafers can be wafers and previously used wafers such as gallium nitride wafers, tantalum carbide wafers, and sapphire wafers.

(2)加熱工序 (2) Heating process

在實施形成於晶圓等之電路試驗的情形下,貼合工序之後,對晶圓等以60~150℃左右加熱15分~5小時左右。具體 地說,將貼合有黏著片材之半導體晶圓或者基板裝載於60~150℃的工作臺上使黏著片材與工作臺相接觸,藉由吸附固定來加熱,並檢驗半導體晶圓或者基板。又,在得到半導體晶片或者半導體零件之後實施電路之試驗的情形下,在以下說明之切割工序之後同樣實施加熱工序。即,將貼合有黏著片材之半導體晶片或者半導體零件裝載於60~150℃的工作臺上使黏著片材與工作臺相接觸,藉由吸附固定來加熱,並檢驗半導體晶片或者半導體零件。此外,加熱工序還以切割工序後除去切削水之目的實施,同樣對半導體晶片等以60~150℃左右加熱15分~5小時左右。 In the case of performing a circuit test formed on a wafer or the like, after the bonding step, the wafer or the like is heated at about 60 to 150 ° C for about 15 minutes to 5 hours. specific In other words, the semiconductor wafer or substrate to which the adhesive sheet is attached is mounted on a table at 60 to 150 ° C to bring the adhesive sheet into contact with the table, heat by adsorption, and inspect the semiconductor wafer or substrate. . Moreover, in the case where the test of the circuit is performed after the semiconductor wafer or the semiconductor component is obtained, the heating process is performed in the same manner after the dicing process described below. That is, the semiconductor wafer or the semiconductor component to which the adhesive sheet is bonded is placed on a table at 60 to 150 ° C to bring the adhesive sheet into contact with the stage, and is heated by adsorption and fixation, and the semiconductor wafer or the semiconductor component is inspected. Further, the heating step is carried out for the purpose of removing the cutting water after the dicing step, and the semiconductor wafer or the like is heated at about 60 to 150 ° C for about 15 minutes to 5 hours.

本發明之黏著片材,由於即使在被加熱之情形下也不會產生起因於增黏樹脂之軟化的黏著劑層之軟化,故不會過度地黏著於半導體晶圓等。因此,本發明之電子零件的製造方法,在後述之紫外缐照射工序及拾取工序中,藉由紫外缐等照射可以充分降低黏著劑層之黏著力,且可以防止拾取不良及黏著劑沉積物。 The adhesive sheet of the present invention does not excessively adhere to a semiconductor wafer or the like because it does not cause softening of the adhesive layer due to softening of the tackifying resin even when heated. Therefore, in the method of producing an electronic component according to the present invention, in the ultraviolet ray irradiation step and the pickup step which will be described later, the adhesion of the adhesive layer can be sufficiently reduced by irradiation with ultraviolet ray or the like, and pickup defects and adhesive deposits can be prevented.

(3)切割工序 (3) Cutting process

在切割工序中,將矽晶圓等切割之後做成半導體晶片或者半導體零件。切割工序之後,有時會以除去切削水之目的實施前述加熱工序。 In the dicing process, a germanium wafer or the like is diced to form a semiconductor wafer or a semiconductor component. After the dicing step, the heating step may be performed for the purpose of removing cutting water.

(4)光照工序 (4) Lighting process

在光照工序中,自基材側向光固化型黏著劑層照射紫外缐等活化光線。作為紫外缐之光源,可以使用低壓水銀燈、高壓水銀燈、超高壓水銀燈、金屬鹵素燈。又,亦可 以替代紫外缐使用電子束,作為電子束之光源,可以使用α缐、β缐、γ缐。 In the light irradiation process, the photocurable adhesive layer is irradiated with an active light such as ultraviolet ray from the substrate side. As the light source of the ultraviolet ray, a low pressure mercury lamp, a high pressure mercury lamp, an ultra high pressure mercury lamp, or a metal halide lamp can be used. Also, An electron beam is used instead of the ultraviolet ray, and as a light source of the electron beam, α缐, β缐, γ缐 can be used.

藉由光照射使黏著劑層經三維網狀化而固化,且使黏著劑層之黏著力降低。此時,如上所述,由於本發明之黏著片材即使加熱也不會過度地黏著於晶圓等,故藉由紫外缐等之照射可以充分降低黏著力。 The adhesive layer is solidified by three-dimensional reticulation by light irradiation, and the adhesion of the adhesive layer is lowered. At this time, as described above, the adhesive sheet of the present invention does not excessively adhere to the wafer or the like even if it is heated, so that the adhesion can be sufficiently reduced by irradiation with ultraviolet rays or the like.

(5)擴展.拾取工序 (5) Extension. Picking process

在擴展.拾取工序中,為增寬半導體晶片或者半導體零件之間的間隔,拉伸黏著片材,並利用針銷等向上頂晶片或者零件。然後,利用真空筒夾或者空氣鑷子吸附晶片或者零件,自黏著片材之黏著劑層剝離而拾取。此時,在本發明之黏著片材中,藉由紫外缐等之照射己經實現充分的黏著力之降低,故晶片或者零件與黏著劑層之間的剝離變得容易,得到良好之拾取性,亦不會產生黏著劑沉積物等不良。 In the expansion. In the pick-up process, in order to widen the interval between the semiconductor wafer or the semiconductor component, the adhesive sheet is stretched, and the wafer or the component is lifted upward by a pin or the like. Then, the wafer or the part is adsorbed by a vacuum collet or air tweezers, and the adhesive layer of the adhesive sheet is peeled off and picked up. At this time, in the adhesive sheet of the present invention, sufficient adhesion is reduced by irradiation with ultraviolet rays or the like, so that peeling between the wafer or the part and the adhesive layer becomes easy, and good pickup property is obtained. It also does not cause defects such as adhesive deposits.

在拾取工序之後,經由晶粒附著封膠將拾取之晶片或者零件搭載於引線框架中。搭載後,加熱晶粒附著封膠,加熱黏著晶片或者零件與引線框架。然後,利用樹脂模製搭載於引線框架上的晶片或者零件。 After the picking process, the picked wafer or part is loaded into the lead frame via the die attach sealant. After being mounted, the heated die attaches the sealant and heats the bonded wafer or part to the lead frame. Then, the wafer or the component mounted on the lead frame is molded by a resin.

[實施例] [Examples] <實施例1> <Example 1>

按照「表1」所示之混合調製光固化型黏著劑。將光固化型黏著劑塗佈於聚對酞酸乙二酯製的分離器薄膜上,塗佈使乾燥後之黏著層之厚度達到10μm。將該黏著層積層 於基材薄膜上,以40℃熟化7日,得到黏著片材。在基材薄膜(K-1)中,使用藉由T型壓出將日本蒙泰昭和株式會社製造的丙烯類共聚物(件號:X500F)成膜為80μm者。 The photocurable adhesive was prepared according to the mixing shown in "Table 1". The photocurable adhesive was applied onto a separator film made of polyethylene terephthalate, and the thickness of the adhesive layer after drying was applied to 10 μm. Adhesive layer The substrate film was aged at 40 ° C for 7 days to obtain an adhesive sheet. In the base film (K-1), a propylene-based copolymer (part: X500F) manufactured by Nippon Monterey Showa Co., Ltd. was formed into a film of 80 μm by T-type extrusion.

[基材薄膜] [Substrate film]

K-1:日本蒙泰昭和株式會社製造的丙烯類共聚物(件號:X500F);將丙烯與1-丁烯以及乙烯作為聚合成份含有,MFR(熔融指數)值為7.5g/10分、密度0.89g/cm3K-1: a propylene copolymer (part number: X500F) manufactured by Monta Showa Co., Ltd., Japan; propylene and 1-butene and ethylene are contained as a polymerization component, and the MFR (melt index) is 7.5 g/10 min. The density is 0.89 g/cm 3 .

K-2:日本蒙泰昭和株式會社製造的丙烯類共聚物(件號:Q300F);將丙烯與乙烯作為聚合成份含有,MFR值為0.9g/10分、密度0.89g/cm3K-2: a propylene copolymer (part number: Q300F) manufactured by Monta Showa Co., Ltd.; propylene and ethylene are contained as a polymerization component, and have an MFR value of 0.9 g/10 min and a density of 0.89 g/cm 3 .

K-3:日本東洋曹達工業株式會社製造的乙烯類共聚物(件號:合成乙烯樹脂537)、乙酸乙烯酯含量6%、MFR值為8.5g/10分、密度0.93g/cm3K-3: an ethylene-based copolymer (part number: synthetic vinyl resin 537) manufactured by Japan Toyo Soda Co., Ltd., a vinyl acetate content of 6%, an MFR value of 8.5 g/10 minutes, and a density of 0.93 g/cm 3 .

K-4:日本東洋曹達工業株式會社製造的低密度聚乙烯(件號:Petrothene170)、MFR值為1.0g/10分、密度0.92g/cm3K-4: Low density polyethylene (part number: Petrothene 170) manufactured by Toyo Soda Industrial Co., Ltd., MFR value of 1.0 g/10 min, and density of 0.92 g/cm 3 .

[光固化型黏著劑] [Photocurable adhesive] [(甲基)丙烯酸酯共聚物] [(Meth)acrylate copolymer]

A-1:日本瑞翁(Zeon)株式會社製造之丙烯酸橡膠AR53L;可藉由丙烯酸乙酯54%、丙烯酸丁酯19%、丙烯酸甲氧基乙酯24%之共聚物、乳化聚合而得。 A-1: Acrylic rubber AR53L manufactured by Zeon Co., Ltd.; obtained by emulsion polymerization of a copolymer of 54% ethyl acrylate, 19% butyl acrylate, and 24% methoxyethyl acrylate.

A-2:綜研化學株式會社製造之SK-Dyne1496;可藉由丙烯酸2-乙基己酯96%、丙烯酸2-羥乙酯4%之共聚物、溶液聚合而得。 A-2: SK-Dyne 1496 manufactured by Soken Chemical Co., Ltd.; can be obtained by solution polymerization of a copolymer of 2-ethylhexyl acrylate 96% and 2-hydroxyethyl acrylate 4%.

[光聚合性化合物] [Photopolymerizable compound]

B-1:根上工業株式會社製造之UN-905;其係在二異氰酸異佛爾酮之三聚物中反應以二新戊四醇五丙烯酸酯為主 要成分的丙烯酸酯而獲得者,其乙烯基之數量為15個。 B-1: UN-905 manufactured by Gensei Kogyo Co., Ltd.; it is mainly reacted with dipentaerythritol pentaacrylate in the terpolymer of isophorone diisocyanate. The acrylate of the component was obtained, and the number of vinyl groups was 15.

B-2:新中村化學株式會社製造之A-TMPT;三羥甲基丙烷三丙烯酸酯、乙烯基之數量為15個。 B-2: A-TMPT manufactured by Shin-Nakamura Chemical Co., Ltd.; the number of trimethylolpropane triacrylate and vinyl is 15.

[多官能異氰酸酯固化劑] [Polyfunctional isocyanate curing agent]

C-1:日本聚氨酯工業株式會社製造之CORONATE L-45E;2,4-甲苯基二異氰酸酯之三羥甲基丙烷加成物。 C-1: CORONATE L-45E manufactured by Nippon Polyurethane Industry Co., Ltd.; trimethylolpropane adduct of 2,4-tolyl diisocyanate.

C-2:伸丙基二異氰酸酯。 C-2: propyl diisocyanate.

[光聚合起始劑] [Photopolymerization initiator]

D-1:BASF JAPAN公司製造之IRGACURE OXE02;乙酮,1-[9-乙基-6-(2-甲苯甲醯基)-9H-咔唑-3-基]-,1-(O-乙醯基肟)、質量損失率為10%時的溫度為320℃。 D-1: IRGACURE OXE02 manufactured by BASF JAPAN; ethyl ketone, 1-[9-ethyl-6-(2-toluamyl)-9H-carbazol-3-yl]-, 1-(O- The temperature at which the mass loss rate is 10% is 320 ° C.

D-2:BASF JAPAN公司製造之LUCIRIN TPO;2,4,6-三甲基苯甲酰基-二苯基膦氧化物、質量損失率為10%時的溫度為270℃。 D-2: LUCIRIN TPO manufactured by BASF JAPAN Co., Ltd.; 2,4,6-trimethylbenzoyl-diphenylphosphine oxide, and the temperature at a mass loss rate of 10% was 270 °C.

D-3:BASF JAPAN公司製造之IRGACURE127;2-羥基-1-{4-[4-(2-羥基-2-甲基-丙醯基)-苯甲基]-苯基}-2-甲基-丙烷-1-酮、質量損失率為10%時的溫度為275℃。 D-3: IRGACURE127 manufactured by BASF JAPAN; 2-hydroxy-1-{4-[4-(2-hydroxy-2-methyl-propenyl)-benzyl]-phenyl}-2- The base-propan-1-one and the mass loss rate of 10% were 275 °C.

D-4:BASF JAPAN公司製造之IRGACURE651;二苯甲基縮酮、質量損失率為10%時的溫度為185℃。 D-4: IRGACURE 651 manufactured by BASF JAPAN Co., Ltd.; a diphenylmethyl ketal having a temperature loss rate of 185 ° C at a mass loss rate of 10%.

[聚矽氧類接枝共聚物] [Polyoxygenated graft copolymer]

E-1:綜研化學株式會社製造之UTMM-LS2;於聚矽氧分子鏈之末端聚合由具有(甲基)丙烯醯基之聚矽氧類寡聚體類單位以及甲基丙烯酸甲酯等組成之丙烯酸乙烯單位而成之聚矽氧類接枝共聚物。 E-1: UTMM-LS2 manufactured by Soken Chemical Co., Ltd.; polymerized at the end of the polyoxyl molecular chain by a polyoxyl oxy group unit having a (meth) acrylonitrile group and methyl methacrylate A polyoxymethylene graft copolymer of ethylene acrylate units.

[增黏樹脂] [Tackifying Resin]

F-1:安原化工株式會社製造之YS POLYSTAR S145;萜烯酚類增黏樹脂、軟化點為145℃。 F-1: YS POLYSTAR S145 manufactured by Anwara Chemical Co., Ltd.; terpene phenolic tackifying resin having a softening point of 145 °C.

將所得之黏著片材貼合於形成虛擬電路模型之直徑8英寸、厚度0.1mm之矽晶圓與環狀框架,並進行切割。將矽晶圓設置於加熱版上,使黏著片材貼合面與相對側面相接觸,在以120℃加熱1小時之後,實施光照射及擴展.拾取之各個工序。 The obtained adhesive sheet was bonded to a tantalum wafer and an annular frame having a diameter of 8 inches and a thickness of 0.1 mm which were formed into a virtual circuit model, and cut. The silicon wafer is placed on the heating plate, and the bonding surface of the adhesive sheet is brought into contact with the opposite side surface. After heating at 120 ° C for 1 hour, light irradiation and expansion are carried out. Pick up the various processes.

切割工序之條件如下所述。 The conditions of the cutting process are as follows.

切割裝置:DISCO公司製造之DAD341 Cutting device: DAD341 manufactured by DISCO

切割板:DISCO公司製造之NBC-ZH205O-27HEEE Cutting board: NBC-ZH205O-27HEEE manufactured by DISCO

切割板形狀:外徑55.56mm、齒寬35μm、內徑19.05mm。 Cutting plate shape: outer diameter 55.56 mm, tooth width 35 μm, inner diameter 19.05 mm.

切割板轉速:40,000rpm Cutting board speed: 40,000 rpm

切割板進料速度:50mm/秒 Cutting board feeding speed: 50mm / sec

切割尺寸:10mm角 Cutting size: 10mm angle

對黏著片材之切削深度:15μm Cutting depth for adhesive sheets: 15μm

切削水溫度:25℃ Cutting water temperature: 25 ° C

切削水量:1.0升/分 Cutting water volume: 1.0 l / min

光照射工序之條件如下所述。 The conditions of the light irradiation process are as follows.

紫外缐照射:利用高壓水銀燈之照射量為150mJ/cm2Ultraviolet 缐 irradiation: The irradiation amount using a high pressure mercury lamp was 150 mJ/cm 2 .

擴展.拾取工序之條件如下所述。 Expansion. The conditions of the picking process are as follows.

拾取裝置:佳能機械株式會社製造之CAP-300II Pickup device: CAP-300II manufactured by Canon Machinery Co., Ltd.

擴展量:8mm Expansion amount: 8mm

針銷形狀:250μmR Pin shape: 250μmR

針銷數量:5根 Number of pins: 5

針銷頂上高度:0.3mm Pin top height: 0.3mm

在切割工序及擴展.拾取工序中,進行以下評價。 In the cutting process and expansion. In the picking up process, the following evaluation was performed.

(1)晶片保持性 (1) Wafer retention

對於晶片保持性,在切割工序之後,基於半導體晶片固定於黏著片材上之半導體晶片之殘存率,藉由以下基準進行評價。 With respect to wafer retention, after the dicing process, the residual rate of the semiconductor wafer fixed on the adhesive sheet by the semiconductor wafer was evaluated by the following criteria.

優:晶片移動不足5% Excellent: less than 5% wafer movement

良:晶片移動為5%以上10%以下 Good: wafer movement is 5% or more and 10% or less

不可:晶片移動為10%以上 No: the wafer movement is more than 10%

(2)拾取性 (2) Picking property

對於拾取性,在拾取工序中,基於半導體晶片被拾取之比率,藉由以下基準進行評價。 For the pick-up property, in the pickup process, based on the ratio at which the semiconductor wafer was picked up, evaluation was performed by the following criteria.

優:晶片之拾取成功率為95%以上 Excellent: The chip picking success rate is over 95%

良:晶片之拾取成功率為80%以上95%以下 Good: The chip picking success rate is 80% or more and 95% or less.

不可:晶片之拾取成功率為不足80% No: the chip picking success rate is less than 80%

將評價結果顯示於[表1]。在實施例1之黏著片材中,晶片保持性以及拾取性均被評價為優。 The evaluation results are shown in [Table 1]. In the adhesive sheet of Example 1, both wafer retainability and pick-up property were evaluated as excellent.

<實施例4、5、參考例1~8> <Examples 4 and 5, Reference Examples 1 to 8>

除對基材薄膜之材料、(甲基)丙烯酸酯共聚物以及光聚合性化合物、多官能異氰酸酯固化劑、光聚合起始劑、聚矽氧類接枝共聚物之種類或者有無添加做出如[表1]所述之變更之外,以與實施例1相同之方法製造黏著片材並進行 評價。結果如「表1」所示。 In addition to the material of the base film, the (meth) acrylate copolymer, and the photopolymerizable compound, the polyfunctional isocyanate curing agent, the photopolymerization initiator, the polyfluorene-based graft copolymer, or the presence or absence of addition, In the same manner as in Example 1, an adhesive sheet was produced and carried out in the same manner as in the above-described modification. Evaluation. The results are shown in Table 1.

<實施例13~17、參考例9~12> <Examples 13 to 17, Reference Examples 9 to 12>

將利用與實施例1相同之方法獲得之黏著片材貼合於形成虛擬電路模型之直徑8英寸、厚度0.1mm之矽晶圓與環狀框架上,並進行切割。將矽晶圓設置於加熱版上,使黏著片材貼合面與相對側面相接觸,在以[表1]所示之條件加熱之後,以與實施例1相同之條件實施光照射及擴展.拾取之各個工序。結果如「表1」所示。 The adhesive sheet obtained by the same method as in Example 1 was bonded to a tantalum wafer and an annular frame having a diameter of 8 inches and a thickness of 0.1 mm which were formed into a virtual circuit model, and was cut. The tantalum wafer was placed on a heating plate, and the adhesive sheet bonding surface was brought into contact with the opposite side surface. After heating under the conditions shown in [Table 1], light irradiation and expansion were carried out under the same conditions as in Example 1. Pick up the various processes. The results are shown in Table 1.

<比較例1> <Comparative Example 1>

不添加聚矽氧類接枝共聚物,除添加增黏樹脂以外,以與實施例1相同之方法製造黏著片材,並進行評價。結果如「表1」所示。 An adhesive sheet was produced and evaluated in the same manner as in Example 1 except that the polyoxymethylene graft copolymer was not added, except that the tackifier resin was added. The results are shown in Table 1.

在實施例4、5、13~17、參考例1~12中,確保良好之晶片保持性及拾取性。另一方面,在比較例1中,拾取性不良,黏著劑沉積物也明顯。 In Examples 4, 5, 13 to 17, and Reference Examples 1 to 12, good wafer retention and pick-up properties were ensured. On the other hand, in Comparative Example 1, the pick-up property was poor and the adhesive deposit was also remarkable.

[產業之可利用性] [Industrial availability]

本發明之黏著片材,由於即使在被加熱之情形下也不會產生黏著劑層之軟化,不會過度地黏著於半導體晶圓等,故藉由紫外缐等之照射可以充分降低黏著劑層之黏著力,得到良好的拾取性。因此,本發明之黏著片材,在半導體晶圓之加工工序中,能夠較佳地使用於在形成電路之半導體晶圓等之性能試驗或者切割工序中包含以除去切削水為目的之加熱工序之情形。 In the adhesive sheet of the present invention, since the adhesive layer is not softened even when heated, it does not excessively adhere to the semiconductor wafer or the like, so that the adhesive layer can be sufficiently reduced by irradiation with ultraviolet rays or the like. The adhesion is good and the pick-up is good. Therefore, in the semiconductor wafer processing step, the adhesive sheet of the present invention can be preferably used in a performance test or a dicing step of forming a semiconductor wafer or the like to include a heating process for removing cutting water. situation.

Claims (6)

一種黏著片材,其係在基材上積層光固化型黏著劑層而成者,其特徵在於:形成前述光固化型黏著劑層的光固化型黏著劑,包含(甲基)丙烯酸酯共聚物、光聚合性化合物、多官能異氰酸酯固化劑、聚矽氧類接枝共聚物與光聚合起始劑,不包含增黏樹脂,上述基材由丙烯類共聚物形成,該丙烯類共聚物係丙烯、1-丁烯與乙烯之共聚物,上述(甲基)丙烯酸酯共聚物係(甲基)丙烯酸乙酯、(甲基)丙烯酸丁酯與(甲基)丙烯酸甲氧基乙酯之共聚物,上述多官能異氰酸酯固化劑包含3個以上之異氰酸酯基,上述光聚合起始劑自23℃至500℃以10℃/分的升溫速度升溫時,質量損失率為10%的溫度為250℃以上,上述光聚合性化合物,係具有四個以上乙烯基之丙烯酸胺酯寡聚體,且該光聚合性化合物相對於(甲基)丙烯酸酯共聚物100質量份係5質量份以上200質量份以下,上述多官能異氰酸酯固化劑相對於(甲基)丙烯酸酯共聚物100質量份係0.5質量份以上20質量份以下,上述光聚合起始劑相對於(甲基)丙烯酸酯共聚物100質量份係0.1質量份以上20質量份以下。 An adhesive sheet comprising a photocurable adhesive layer comprising the (meth) acrylate copolymer, wherein the photocurable adhesive layer is formed by laminating a photocurable adhesive layer on a substrate. a photopolymerizable compound, a polyfunctional isocyanate curing agent, a polyfluorene-based graft copolymer, and a photopolymerization initiator, which do not contain a tackifying resin, and the above substrate is formed of a propylene-based copolymer which is propylene. a copolymer of 1-butene and ethylene, the above (meth) acrylate copolymer is a copolymer of ethyl (meth) acrylate, butyl (meth) acrylate and methoxy ethyl (meth) acrylate The polyfunctional isocyanate curing agent contains three or more isocyanate groups, and when the photopolymerization initiator is heated at a temperature increase rate of 10 ° C /min from 23 ° C to 500 ° C, the temperature loss rate is 10% and the temperature is 250 ° C or higher. The photopolymerizable compound is an urethane acrylate oligomer having four or more vinyl groups, and the photopolymerizable compound is contained in an amount of 5 parts by mass or more and 200 parts by mass or less based on 100 parts by mass of the (meth) acrylate copolymer. , the above polyfunctional The cyanate curing agent is 0.5 parts by mass or more and 20 parts by mass or less based on 100 parts by mass of the (meth) acrylate copolymer, and the photopolymerization initiator is 0.1 part by mass based on 100 parts by mass of the (meth) acrylate copolymer. More than 20 parts by mass or less. 如請求項1之黏著片材,其於電子零件之檢驗工序中貼合在該電子零件上而使用。 The adhesive sheet of claim 1 is used by being attached to the electronic component in the inspection process of the electronic component. 一種黏著劑,其係用於形成在電子零件的檢驗工序中貼合於該電子零件上的黏著片材中積層於基材上之黏著劑層,其特徵在於:包含(甲基)丙烯酸酯共聚物、光聚合性化合物、多官能異氰酸酯固化劑、光聚合起始劑與聚矽氧類接枝共聚物,不包含增黏樹脂,上述基材由丙烯類共聚物形成,該丙烯類共聚物係丙烯、1-丁烯與乙烯之共聚物,上述(甲基)丙烯酸酯共聚物係(甲基)丙烯酸乙酯、(甲基)丙烯酸丁酯與(甲基)丙烯酸甲氧基乙酯之共聚物,上述多官能異氰酸酯固化劑包含3個以上之異氰酸酯基,上述光聚合起始劑自23℃至500℃以10℃/分的升溫速度升溫時,質量損失率為10%的溫度為250℃以上,上述光聚合性化合物,係具有四個以上乙烯基之丙烯酸胺酯寡聚體,且該光聚合性化合物相對於(甲基)丙烯酸酯共聚物100質量份係5質量份以上200質量份以下,上述多官能異氰酸酯固化劑相對於(甲基)丙烯酸酯共聚物100質量份係0.5質量份以上20質量份以下,上述光聚合起始劑相對於(甲基)丙烯酸酯共聚物100質量份係0.1質量份以上20質量份以下。 An adhesive for forming an adhesive layer laminated on a substrate in an adhesive sheet attached to the electronic component in an inspection process of an electronic component, comprising: (meth) acrylate copolymerization a material, a photopolymerizable compound, a polyfunctional isocyanate curing agent, a photopolymerization initiator, and a polyfluorene-based graft copolymer, which do not contain a tackifier resin, and the substrate is formed of a propylene-based copolymer, and the propylene-based copolymer is Copolymer of propylene, 1-butene and ethylene, copolymerization of the above (meth) acrylate copolymer with ethyl (meth) acrylate, butyl (meth) acrylate and methoxy ethyl (meth) acrylate The polyfunctional isocyanate curing agent contains three or more isocyanate groups, and when the photopolymerization initiator is heated at a temperature increase rate of 10 ° C /min from 23 ° C to 500 ° C, the temperature loss rate is 10% and the temperature is 250 ° C. In the above, the photopolymerizable compound is an urethane acrylate oligomer having four or more vinyl groups, and the photopolymerizable compound is contained in an amount of 5 parts by mass or more and 200 parts by mass based on 100 parts by mass of the (meth) acrylate copolymer. Below, the above The amount of the isocyanate curing agent is 0.5 parts by mass or more and 20 parts by mass or less based on 100 parts by mass of the (meth) acrylate copolymer, and the photopolymerization initiator is 0.1 parts by mass based on 100 parts by mass of the (meth) acrylate copolymer. More than 20 parts by mass or less. 一種電子零件之製造方法,其包含將貼合有黏著片材之電子零件加熱至60~150℃的加熱工序,其特徵在於:作為前述黏著片材,使用一種在基材上積層光固化型 黏著劑層而成之黏著片材,該基材由丙烯類共聚物形成,該丙烯類共聚物係丙烯、1-丁烯與乙烯之共聚物,且形成該光固化型黏著劑層的光固化型黏著劑包含(甲基)丙烯酸酯共聚物、光聚合性化合物、多官能異氰酸酯固化劑、光聚合起始劑與聚矽氧類接枝共聚物,不包含增黏樹脂,上述(甲基)丙烯酸酯共聚物係(甲基)丙烯酸乙酯、(甲基)丙烯酸丁酯與(甲基)丙烯酸甲氧基乙酯之共聚物,上述多官能異氰酸酯固化劑包含3個以上之異氰酸酯基,上述光聚合起始劑自23℃至500℃以10℃/分的升溫速度升溫時,質量損失率為10%的溫度為250℃以上,上述光聚合性化合物,係具有四個以上乙烯基之丙烯酸胺酯寡聚體,且該光聚合性化合物相對於(甲基)丙烯酸酯共聚物100質量份係5質量份以上200質量份以下,上述多官能異氰酸酯固化劑相對於(甲基)丙烯酸酯共聚物100質量份係0.5質量份以上20質量份以下,上述光聚合起始劑相對於(甲基)丙烯酸酯共聚物100質量份係0.1質量份以上20質量份以下。 A method for producing an electronic component, comprising: a heating step of heating an electronic component to which an adhesive sheet is bonded to 60 to 150° C., wherein the adhesive sheet is laminated on a substrate and cured by light curing. An adhesive sheet formed of an adhesive layer formed of a propylene-based copolymer which is a copolymer of propylene, 1-butene and ethylene, and forms a photocurable layer of the photocurable adhesive layer The adhesive includes a (meth) acrylate copolymer, a photopolymerizable compound, a polyfunctional isocyanate curing agent, a photopolymerization initiator, and a polyfluorene-based graft copolymer, and does not contain a tackifying resin, and the above (meth) The acrylate copolymer is a copolymer of ethyl (meth)acrylate, butyl (meth)acrylate and methoxyethyl (meth)acrylate, and the polyfunctional isocyanate curing agent contains three or more isocyanate groups, and the above When the photopolymerization initiator is heated at a temperature increase rate of 10 ° C /min from 23 ° C to 500 ° C, the temperature loss rate is 10% and the temperature is 250 ° C or higher, and the photopolymerizable compound is an acrylic acid having four or more vinyl groups. An amine ester oligomer, and the photopolymerizable compound is 5 parts by mass or more and 200 parts by mass or less based on 100 parts by mass of the (meth) acrylate copolymer, and the above polyfunctional isocyanate curing agent is copolymerized with respect to (meth) acrylate. 100 quality 20 parts by mass 0.5 parts by mass or more lines or less, the photopolymerization initiator with respect to 20 parts by mass of (meth) acrylic acid ester copolymer 100 parts by mass 0.1 part by mass or less based. 如請求項4之電子零件之製造方法,其包含:貼合工序,其將前述黏著片材貼合至半導體晶圓或者基板與環狀框架上;加熱工序,其將貼合有前述黏著片材之半導體晶圓或者基板裝載於60~150℃的工作臺上使該黏著片材與工作 臺相接觸,藉由吸附固定來加熱,並檢驗該半導體晶圓或者基板;切割工序,其將貼付了前述黏著片材的半導體晶圓或者基板切割之後做成半導體晶片或者半導體零件;光照工序,其向前述黏著片材之光固化型黏著劑層照射活化光線;擴展工序,其為增寬前述半導體晶片或者半導體零件之間的間隔而拉伸前述黏著片材;拾取工序,其自前述黏著片材拾取前述半導體晶片或者半導體零件。 The method of manufacturing an electronic component according to claim 4, comprising: a bonding step of bonding the adhesive sheet to a semiconductor wafer or a substrate and an annular frame; and a heating step of bonding the adhesive sheet The semiconductor wafer or substrate is mounted on a workbench at 60~150 °C to make the adhesive sheet work. The semiconductor phase is contacted, heated by adsorption and inspection, and the semiconductor wafer or substrate is inspected; and the dicing process is performed by cutting the semiconductor wafer or substrate to which the adhesive sheet is attached to form a semiconductor wafer or a semiconductor component; And irradiating the photocurable adhesive layer of the adhesive sheet with activating light; the expanding step of stretching the adhesive sheet by widening the interval between the semiconductor wafer or the semiconductor component; and the picking step from the adhesive sheet The semiconductor wafer or semiconductor component is picked up. 如請求項4之電子零件之製造方法,其包含:貼合工序,其將前述黏著片材貼合至半導體晶圓或者基板與環狀框架上;切割工序,其將貼付了前述黏著片材的半導體晶圓或者基板切割之後做成半導體晶片或者半導體零件;加熱工序,其將貼合有前述黏著片材之半導體晶片或者半導體零件裝載於60~150℃的工作臺上使黏著片材與工作臺相接觸,藉由吸附固定來加熱,並檢驗前述半導體晶片或者半導體零件;光照工序,其向前述黏著片材之光固化型黏著劑層照射活化光線;擴展工序,其為增寬前述半導體晶片或者半導體零件之間的間隔而拉伸前述黏著片材;拾取工序,其自前述黏著片材拾取前述半導體晶片或者半導體零件。 A method of manufacturing an electronic component according to claim 4, comprising: a bonding step of bonding the adhesive sheet to a semiconductor wafer or a substrate and an annular frame; and a cutting step of attaching the adhesive sheet After the semiconductor wafer or the substrate is diced, the semiconductor wafer or the semiconductor component is formed; and the heating process is performed, and the semiconductor wafer or the semiconductor component to which the adhesive sheet is bonded is mounted on a workbench at 60 to 150 ° C to bond the sheet and the workbench. Contacting, heating by adsorption fixation, and inspecting the semiconductor wafer or semiconductor component; illumination process, irradiating the photocurable adhesive layer of the adhesive sheet with activating light; expanding step of widening the semiconductor wafer or The adhesive sheet is stretched by a space between the semiconductor parts; and a pick-up process is performed to pick up the semiconductor wafer or the semiconductor component from the adhesive sheet.
TW101117878A 2011-05-19 2012-05-18 Manufacture of adhesive sheet and electronic parts TWI532814B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2011112268 2011-05-19
JP2011200854 2011-09-14

Publications (2)

Publication Number Publication Date
TW201300491A TW201300491A (en) 2013-01-01
TWI532814B true TWI532814B (en) 2016-05-11

Family

ID=47176932

Family Applications (1)

Application Number Title Priority Date Filing Date
TW101117878A TWI532814B (en) 2011-05-19 2012-05-18 Manufacture of adhesive sheet and electronic parts

Country Status (3)

Country Link
JP (1) JP5890405B2 (en)
TW (1) TWI532814B (en)
WO (1) WO2012157615A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI686457B (en) * 2015-03-03 2020-03-01 日商琳得科股份有限公司 Semiconductor processing sheet

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6373251B2 (en) * 2013-02-22 2018-08-15 デンカ株式会社 Method for manufacturing electronic component using adhesive sheet
JP2015156438A (en) * 2014-02-20 2015-08-27 リンテック株式会社 Method of manufacturing semiconductor chip
JP6506744B2 (en) * 2014-05-12 2019-04-24 デンカ株式会社 Heat resistant adhesive sheet for semiconductor inspection and semiconductor inspection method
TWI826613B (en) * 2018-12-14 2023-12-21 日商三菱化學股份有限公司 Adhesive resin composition, adhesive resin cured product, adhesive sheet, and image display device laminate
CN110699019A (en) * 2019-11-26 2020-01-17 深圳市益达兴科技股份有限公司 High-temperature-resistant acrylate pressure-sensitive adhesive and double-sided adhesive without base material

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3196173B2 (en) * 1996-11-07 2001-08-06 松下電器産業株式会社 Contactor and semiconductor device inspection method
JP2006111659A (en) * 2004-10-12 2006-04-27 Nitto Denko Corp Pressure-sensitive adhesive sheet for laser processing and method for producing laser processed product using the same
JP4805765B2 (en) * 2006-09-12 2011-11-02 電気化学工業株式会社 An adhesive sheet for fixing an electronic component and a method for manufacturing an electronic component using the same.
JP5055097B2 (en) * 2007-11-08 2012-10-24 日東電工株式会社 Inspection adhesive sheet
JP2011044444A (en) * 2007-12-19 2011-03-03 Denki Kagaku Kogyo Kk Multilayered pressure-sensitive adhesive sheet, and manufacturing method for electronic component with multilayered pressure-sensitive adhesive sheet
JP2011253833A (en) * 2008-09-29 2011-12-15 Denki Kagaku Kogyo Kk Method of manufacturing semiconductor member and adhesive tape
JP5468523B2 (en) * 2010-11-11 2014-04-09 電気化学工業株式会社 Manufacturing method of pressure-sensitive adhesive, pressure-sensitive adhesive sheet and electronic component.

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI686457B (en) * 2015-03-03 2020-03-01 日商琳得科股份有限公司 Semiconductor processing sheet

Also Published As

Publication number Publication date
WO2012157615A1 (en) 2012-11-22
JPWO2012157615A1 (en) 2014-07-31
JP5890405B2 (en) 2016-03-22
TW201300491A (en) 2013-01-01

Similar Documents

Publication Publication Date Title
TW201507052A (en) Heat-resistant adhesive sheet for use in checking semiconductor
JP6506744B2 (en) Heat resistant adhesive sheet for semiconductor inspection and semiconductor inspection method
TWI532814B (en) Manufacture of adhesive sheet and electronic parts
TWI502638B (en) Method for producing electronic component
TWI666294B (en) Adhesive sheet, manufacturing method of electronic component
TWI583767B (en) Adhesive sheet and process for producing electronic component
TWI704208B (en) Adhesive tape for semiconductor processing and method for manufacturing semiconductor wafer or semiconductor component using the tape
KR20170106982A (en) Dicing tape
WO2012172959A1 (en) Adhesive sheet, and method for manufacturing electronic component
TWI686853B (en) Mask integrated surface protection tape with release liner
JP2015185692A (en) Adhesive tape for semiconductor wafer processing, and method of processing semiconductor wafer
JP5210346B2 (en) Method for manufacturing adhesive sheet and electronic component
TWI639673B (en) Adhesive film
WO2018083987A1 (en) Adhesive sheet for stealth dicing
TWI726089B (en) Adhesive tape for semiconductor processing, and manufacturing method of semiconductor chip or semiconductor component using the adhesive tape
JPWO2018168403A1 (en) Substrate for back grinding tape
JP2018137376A (en) Adhesive tape for semiconductor processing, semiconductor chip using the same, and method for manufacturing semiconductor component