TWI528042B - Logic analyzer and its probe - Google Patents

Description

Logic analyzer and its probe

The invention relates to digital signal analysis; in particular to a logic analyzer and a probe thereof.

With the advancement of digital technology, such as electronic wafers, liquid crystal display (LCD) image processing chips, Complementary Metal-Oxide Semiconductor (CMOS), and Charge Coupled Device (CCD), etc. Electronic devices for transmitting data have become increasingly popular. With the advancement of digital technology, such as electronic wafers, liquid crystal display (LCD) image processing chips, Complementary Metal-Oxide Semiconductor (CMOS), and Charge Coupled Device (CCD), etc. Electronic devices for transmitting data have become increasingly popular.

When the R&D personnel develops the above-mentioned electronic device, the logic analyzer is usually used to capture the digital signal output by the electronic device, and the digital signal is compared with a basic signal to analyze the digital signal captured to determine the electronic device. Is the design normal?

However, when the conventional logic analyzer analyzes the signal, it usually analyzes the digital signal and then transmits the analysis result to the computer for display. Therefore, the researcher must connect the probe to the electronic device and turn the head. Watch the analysis results displayed on the computer screen, and this will not only increase the difficulty of the R&D personnel's detection. When the number of electronic devices to be detected is large and more probes are used, it is easy for the R&D personnel to confuse the probes. The detection channel corresponding to the stick is likely to cause delay in the detection operation.

In view of this, the object of the present invention is to provide a logic analyzer and a probe thereof, which enable the researcher to quickly and accurately know the analysis result of the digital signal corresponding to each probe.

To achieve the above objective, the logic analyzer provided by the present invention comprises a probe, a first transmission line, a display screen, a second transmission line and a host. The probe is used to connect to an object to be tested to capture the digital signal output by the object to be tested. The first transmission line is electrically connected to the probe. The display screen is disposed on the probe. The second transmission line is electrically connected to the display screen. The host is electrically connected to the first transmission line and the second transmission line, and is electrically connected to a computer, and receives the digital signal captured by the probe through the first transmission line, and analyzes the digital signal, and after analyzing And transmitting the analysis result to the display on the computer, and transmitting part of the set parameter information to the display screen through the second transmission line.

Therefore, through the above design, when the logic analyzer is used by the research and development personnel, the display screen on the probe can quickly and accurately know the parameter information corresponding to the digital signal captured by the probe.

10‧‧‧ Probe

12‧‧‧ grip

121‧‧‧Bevel

14‧‧‧Detection Department

21‧‧‧First transmission line

22‧‧‧second transmission line

30‧‧‧ display screen

40‧‧‧Host

100‧‧‧Test object

200‧‧‧ computer

210‧‧‧ screen

1 is a detection system using a logic analyzer of a preferred embodiment of the present invention.

2 is a perspective view of a probe of a preferred embodiment of the present invention.

In order that the present invention may be more clearly described, the preferred embodiments are illustrated in the accompanying drawings. Please refer to FIG. 1 for a preferred embodiment of the present invention. The logic analyzer is used to capture and parse the digital signal generated by the object to be tested 100, and transmit the analysis result to a computer 200, and includes a probe 10, a display screen 30, and a first transmission line 21. A second transmission line 22 and a host 40. The probe 10 includes a grip portion 12 and a detecting portion 14. Referring to FIG. 2 , the grip portion 12 is used for the developer to hold and is made of an insulator, and the top end of the grip portion 12 has a slope 121 . The detecting portion 14 is formed of a conductor and is disposed at a bottom end of the holding portion 12, and in the embodiment, the detecting portion 14 has a tapered shape at one end for receiving the object to be tested 100. The portion to be tested is used to capture the digital signal output by the object to be tested 100. Of course, in actual implementation, the detecting portion 14 may also be in the shape of a clip or other shape required for detecting.

The display screen 30 is disposed on the inclined surface 121 of the grip portion 12, and the detecting portion 14 is located at the top end and the bottom end of the opposite position of the grip portion 12, and in the embodiment, the display screen 30 is A liquid crystal screen, of course, in actual implementation, other elements that can display characters can be used instead.

The first transmission line 21 and one end of the second transmission line 22 are respectively embedded in the holding portion 12, and are respectively electrically connected to the detecting portion 14 and the display screen 30, and are buried at one end of the transmission lines 21 and 22. The purpose of the integration in the grip portion 12 is to prevent the wire from being too confusing and affecting the operation of the research and development personnel. Of course, in actual practice, the transmission lines 21 and 22 may be exposed outside the grip portion 12 . The parts are wrapped in a sleeve (not shown), and the transmission lines 21 and 22 are prevented from being entangled with each other to affect the operation.

The host 40 is configured with a plurality of parameter information (such as a waveform, a frequency, a trigger point, a channel to be captured, etc.), and is electrically connected to the first transmission line 21 and the second transmission line 22, and is electrically connected to the computer 200. In this way, when the researcher performs the detection and the detecting portion 14 of the probe 10 is connected to the portion to be tested of the object to be tested 100, the digital signal captured by the probe 10 is transmitted through the first transmission line 21. After the host 40, the host 40 analyzes according to the set parameter information, and after the analysis, the host 40 transmits the analysis result to the computer 200, so that the analysis result (such as a waveform) is displayed on the screen 210 of the computer 200. The frequency, the trigger point, the captured channel, etc., and the parameter information set by the basic part such as the sampling frequency, the trigger point and the channel name is transmitted to the display on the grip portion 12 through the second transmission line 22 Curtain 30 shows. In the embodiment, the host 40 has a built-in compiler for compiling the parameter information set by the analysis part of the host 40 into the corresponding I ² C signal, and outputting the information to the second transmission line 22, and the display screen 30 A corresponding interpreter is built in, for interpreting the I ² C signal transmitted by the second transmission line 22, and obtaining parameter information set by the portion corresponding to the I ² C signal (ie, sampling frequency, trigger point and channel) The name) is displayed on the display screen 30 (Fig. 2).

In this way, the R&D personnel can directly know the basic data of the digital signal captured by the display screen 30 during the detection, and can quickly and surely know the set parameter information compared with the object to be tested 100. The signal generated, without the occurrence of a misunderstanding. In addition, by designing the detecting portion 14 and the display screen 30 on opposite ends of the grip portion 12, the researcher holds the grip portion 12 and presses the detecting portion 14 against the object to be tested 100. When the detection is performed, the hand is not shielded from the display of the display screen 30, and the display screen 30 is disposed on the inclined surface 121 of the top of the grip portion 12, so that the line of sight of the developer can be conveniently viewed directly. The display screen 30 can directly and conveniently view the information displayed on the display screen 30, thereby greatly increasing the convenience in detection.

In summary, the R&D personnel can use the logic analyzer to view the analysis result directly through the screen 210 of the computer 200, and can directly and accurately view the display screen 30 on the probe 10, thereby quickly and accurately. Knowing the parameter information corresponding to the digital signal captured by the probe 10 not only facilitates the operation of the research and development personnel, but also improves the efficiency of the detection and analysis work of the research and development personnel.

In addition, the above description is only for the preferred embodiment of the present invention, and equivalent changes to the scope of the present invention and the scope of the patent application are intended to be included in the scope of the present invention.

10‧‧‧ Probe

12‧‧‧ grip

14‧‧‧Detection Department

21‧‧‧First transmission line

22‧‧‧second transmission line

30‧‧‧ display screen

40‧‧‧Host

100‧‧‧Test object

200‧‧‧ computer

210‧‧‧ screen

Claims (10)

A logic analyzer includes: a probe for receiving a digital signal outputted from the object to be tested; a first transmission line electrically connected to the probe; and a display screen And the second transmission line is electrically connected to the display screen; and a host is configured with a plurality of parameter information, and is electrically connected to the first transmission line and the second transmission line, and is electrically connected to a computer Sexually connecting, and receiving the digital signal captured by the probe through the first transmission line, and analyzing the digital signal according to the set parameter information, and after analyzing, transmitting the analysis result to the computer for display, and simultaneously The set parameter information is transmitted to the display screen through the second transmission line; wherein the probe has a grip portion and a detecting portion, the grip portion is made of an insulator, and the display screen is disposed on the grip The detecting portion is made of a conductor and is connected to the holding portion for receiving the object to be tested; wherein the first conductive line and one end of the second conductive line are respectively embedded in the In the grip And the probe portion respectively, and the display screen is connected. The logic analyzer of claim 1, wherein the detecting portion and the display screen are respectively disposed at opposite ends of the grip portion. The logic analyzer of claim 1, wherein one end of the grip has a slope, and the display screen is disposed on the slope. A logic analyzer includes: a probe for receiving a digital signal outputted from the object to be tested; a first transmission line electrically connected to the probe; and a display screen And the second transmission line is electrically connected to the display screen; and a host is configured with a plurality of parameter information, and is electrically connected to the first transmission line and the second transmission line, and is electrically connected to a computer Sexually connecting, and receiving the digital signal captured by the probe through the first transmission line, and analyzing the digital signal according to the set parameter information, and after analyzing, transmitting the analysis result to the computer for display, and simultaneously The set parameter information is transmitted to the display screen through the second transmission line; wherein the host has a compiler for compiling the parameter information set by the analyzed part of the host into a corresponding signal and outputting to the second transmission line And the display screen has an interpreter for interpreting the signal transmitted by the second transmission line, and obtaining parameter information set by the corresponding part of the signal to display The display on the screen. The logic analyzer of claim 4, wherein the compiler compiles the partial result of the analysis by the host into an I ² C signal, and the interpreter is configured to interpret the I ² C signal to obtain a corresponding part. Set the parameter information. A logic analyzer includes: a probe for receiving a digital signal outputted from the object to be tested; and a first transmission line electrically connecting the probe; a display screen is disposed on the probe; and a second transmission line electrically connected to the display screen; and a host, configured with a plurality of parameter information, and electrically connected to the first transmission line and the second transmission line, and Electrically connecting with a computer, and receiving the digital signal captured by the probe through the first transmission line, and analyzing the digital signal according to the set parameter information, and after analyzing, transmitting the analysis result to the computer for display. At the same time, part of the set parameter information is transmitted to the display screen through the second transmission line; wherein the host transmits the sampling frequency of the digital signal, the captured trigger point, and the captured channel name. The second transmission line is transmitted to the display on the display. a probe of a logic analyzer for receiving a digital signal outputted from the object to be tested, and transmitting the signal to the host of the logic analyzer for analysis; wherein the probe is A display screen is disposed, and the display screen displays the parameter information set by the host analyzing the digital signal; wherein the digital signal is transmitted to the host through a first transmission line, and the display screen is received through a second transmission line The host analyzes the parameter information set by the portion obtained by the digital signal. The probe of claim 7, further comprising a grip portion and a detecting portion, the grip portion being made of an insulator, and the display screen is disposed on the grip portion; the detecting portion is a conductor The utility model is formed and connected to the grip portion for receiving the object to be tested. The probe of claim 8, wherein the detecting portion and the display screen are respectively disposed at opposite ends of the grip portion. The probe of claim 8, wherein one end of the grip has a slope, and the display screen is disposed on the slope.