TWI490077B - Calibration apparatus and a compensation controlling method for multi-axes machines using the same - Google Patents

Calibration apparatus and a compensation controlling method for multi-axes machines using the same Download PDF

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TWI490077B
TWI490077B TW101145041A TW101145041A TWI490077B TW I490077 B TWI490077 B TW I490077B TW 101145041 A TW101145041 A TW 101145041A TW 101145041 A TW101145041 A TW 101145041A TW I490077 B TWI490077 B TW I490077B
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distance
disposed
reference point
laser
calibration device
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TW101145041A
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TW201420261A (en
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Han Jou Lee
Yu Chiao Wang
Ssu Min Hu
yang xin Lin
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Ind Tech Res Inst
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q11/00Accessories fitted to machine tools for keeping tools or parts of the machine in good working condition or for cooling work; Safety devices specially combined with or arranged in, or specially adapted for use in connection with, machine tools
    • B23Q11/001Arrangements compensating weight or flexion on parts of the machine
    • B23Q11/0028Arrangements compensating weight or flexion on parts of the machine by actively reacting to a change of the configuration of the machine
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/24Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves
    • B23Q17/2452Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves for measuring features or for detecting a condition of machine parts, tools or workpieces

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Machine Tool Sensing Apparatuses (AREA)

Description

校準裝置及多軸機械之補償方法Calibration device and multi-axis mechanical compensation method

本揭露係有關於一種校準裝置及多軸機械之補償方法,尤指一種應用於多軸機械補償量測之校準裝置及補償方法。The disclosure relates to a calibration device and a multi-axis mechanical compensation method, and more particularly to a calibration device and a compensation method applied to multi-axis mechanical compensation measurement.

在多軸機械加工製程中所使用的座標系有機台機械座標系、工件程式座標系與加工工件座標系,在加工前必需先確認這三者的關係,再進行調整或補償修正,讓工件程式座標系與加工工件座標系相符,如此方可獲得正確的加工結果。The coordinate system used in the multi-axis machining process is the organic mechanical coordinate system, the workpiece program coordinate system and the workpiece coordinate system. Before processing, the relationship between the three must be confirmed, and then the adjustment or compensation correction is performed to make the workpiece program. The coordinates are consistent with the workpiece coordinate system so that the correct machining results are obtained.

既有的非接觸補償修正方法,可使用雷射測距感測器取代傳統探針,讓使用者可以用較安全、較快速的方式進行補償控制。但雷射測距感測器種類眾多,價格落差很大,而價格又與量測精確度有關,且CCD(Charge Coupled Device,電荷耦合元件)本身並無中心點標示,應用時需進行校正,因此,如何改善量測系統之性價比,是相關技術領域人士急需解決之課題。The existing non-contact compensation correction method can replace the traditional probe with a laser ranging sensor, so that the user can perform compensation control in a safer and faster manner. However, there are many types of laser ranging sensors, and the price difference is large, and the price is related to the measurement accuracy. The CCD (Charge Coupled Device) itself has no center point indication, and needs to be corrected when applied. Therefore, how to improve the cost performance of the measurement system is an urgent problem for people in the related art.

於一實施例中,本揭露提出一種校準裝置,其包含一座體,於座體設有複數雷射感測器、一反射件、一基準點結構及一感光元件。該座體具有一第一面,每一該雷射感測器具有一出光端以發射一雷射光束,該複數雷射光束係相互平行,反射件係可分離地設置於該座體,該反射件包 括一反射面,該反射面與第一面之間具有一距離,每一出光端與反射面之距離相同,該複數雷射光束係垂直投射於反射面;該基準點結構具有一基準點;以及,該感光元件係用以偵測該基準點。In one embodiment, the present disclosure provides a calibration apparatus including a body having a plurality of laser sensors, a reflector, a reference point structure, and a photosensitive element. The base body has a first surface, each of the laser sensors has a light emitting end for emitting a laser beam, the plurality of laser beams are parallel to each other, and the reflecting member is detachably disposed on the seat body, the reflection Package a reflective surface having a distance between the reflective surface and the first surface, each optical end is at the same distance from the reflective surface, and the plurality of laser beams are vertically projected on the reflective surface; the reference point structure has a reference point; And, the photosensitive element is used to detect the reference point.

於一實施例中,本揭露更提出一種多軸機械之補償方法,其係備置一校準裝置,該校準裝置包括一座體,於座體設有複數雷射感測器、一反射件、一基準點結構以及一感光元件,該座體具有一第一面,每一雷射感測器具有一出光端,雷射感測器係由出光端發射一雷射光束,該複數雷射光束係相互平行,反射件包括一反射面,反射面與第一面之間具有一距離,每一出光端與反射面之距離相同,該複數雷射光束係垂直投射於反射面,基準點結構具有一基準點,感光元件係用以偵測該基準點;將校準裝置安裝於一可移動之多軸機械之一端面;驅動每一雷射感測器發出一雷射光束,以量測出光端至反射面之距離,該距離為一第一距離;紀錄該第一距離,並將每一雷射感測器之讀值歸零,以該第一距離作為該多軸機械補償控制之依據;將該反射件取下,並將該多軸機械移動至一工作平台上方,於該工作平台設有一目標物,由該複數雷射感測器量測該工作平台至每一該出光面之距離,該距離為一第二距離,該第二距離大於該第一距離;將該多軸機械朝向該工作平台移動一第三距離,該第三距離係該第一距離與該第二距離之差值;以及,由該感光元件偵測該基準點是否對準該目標物。In an embodiment, the present disclosure further provides a multi-axis mechanical compensation method, which is provided with a calibration device, the calibration device includes a body, and the base body is provided with a plurality of laser sensors, a reflector, and a reference. a dot structure and a photosensitive element, the base body has a first surface, each of the laser sensors has a light emitting end, and the laser sensor emits a laser beam from the light emitting end, the plurality of laser beams are parallel to each other The reflector comprises a reflecting surface, the reflecting surface has a distance from the first surface, and each of the light emitting ends is at the same distance from the reflecting surface. The plurality of laser beams are vertically projected on the reflecting surface, and the reference point structure has a reference point. The photosensitive element is used for detecting the reference point; the calibration device is mounted on one end surface of a movable multi-axis machine; each laser sensor is driven to emit a laser beam to measure the light end to the reflective surface The distance is a first distance; the first distance is recorded, and the reading value of each laser sensor is zeroed, and the first distance is used as a basis for the multi-axis mechanical compensation control; Piece removed and will The multi-axis machine moves to a working platform, and the working platform is provided with an object, and the distance between the working platform and each of the light-emitting surfaces is measured by the plurality of laser sensors, and the distance is a second distance, The second distance is greater than the first distance; the multi-axis machine is moved toward the working platform by a third distance, wherein the third distance is a difference between the first distance and the second distance; and, detected by the photosensitive element Whether the reference point is aligned with the target.

以下將參照隨附之圖式來描述本揭露為達成目的所使用的技術手段與功效,而以下圖式所列舉之實施例僅為輔助說明,以利 貴審查委員瞭解,但本揭露之技術手段並不限於所列舉圖式。The technical means and functions used in the present disclosure for the purpose of the present invention will be described with reference to the accompanying drawings, and the embodiments illustrated in the following drawings are only for the purpose of explanation, and are to be understood by the reviewing members, but the technical means of the present disclosure are It is not limited to the illustrated figures.

本案申請人曾於中華民國專利申請案申請號第101134642號提出一種「用於多軸機械之補償控制方法」(以下稱該前案),該前案技術是利用多組非接觸式距離感測器以特定控制程序之技術手段,達成工件位置與姿態之量測與補償之效,以解決既有確認工件與機台設備相對空間關係過程中之干涉碰撞、校準時間長與工件備料花費高之問題。為實現該前案技術,其係於多軸機械的端面設置三個距離量測器,且各個距離量測器與該端面的中心距離相等,接著控制該端面以其中心為軸心旋轉,並令該三個距離量測器分別對工件表面進行距離量測,直到該三個距離量測器之其中兩個所量測到之距離相同,接著再令該端面以前述兩個距離量測器的連線為軸翻轉,直到該兩個距離量測器以外的另一個距離量測器與前述兩個距離量測器所量測到的距離相同,最後記錄上述控制該端面所產生的資料,以供該多軸機械作為補償控制的依據。The applicant of the present invention has proposed a "compensation control method for multi-axis machinery" (hereinafter referred to as the previous case) in the Patent Application No. 101134642 of the Republic of China. The prior art technique utilizes multiple sets of non-contact distance sensing. The measurement and compensation effect of the workpiece position and attitude is achieved by the technical means of the specific control program, so as to solve the interference collision in the process of confirming the relative spatial relationship between the workpiece and the machine equipment, the long calibration time and the high cost of the workpiece preparation. problem. In order to realize the prior art, three distance measuring devices are arranged on the end faces of the multi-axis machine, and the distance measuring devices are equal to the center distance of the end faces, and then the end faces are controlled to rotate with the center thereof as an axis, and Having the three distance measuring devices measure the distance of the workpiece surface until the distance measured by two of the three distance measuring devices is the same, and then the end surface is measured by the two distance measuring devices The line is flipped until the other distance measuring device other than the two distance measuring devices is the same as the distance measured by the two distance measuring devices, and finally the data generated by the control of the end face is recorded. The multi-axis machine is used as the basis for compensation control.

上述用於多軸機械之補償控制方法可解決習知以探測棒量測之接觸式量測法所存在之缺失,惟該前案技術需要使用多個非接觸測距儀,並且該多個非接觸測距儀必須垂直於安裝面,而同時要讓多個非接觸測距儀同時垂直於水平面並不容易安裝。此外,該前案技術使用之非接觸測距儀,若選用雷射測距儀進行實現,線性度高且重現性高之雷射測距儀其成本極高。此外,該前案技術使用之非接觸 測距儀,若選用低價的CMOS(互補氧化金屬半導體)雷射測距儀進行實現,雖可降低成本,但卻有線性度低的問題。此外,前案技術中進行X、Y位置量測時,需要使多軸機械之中心點對準目標點,雖可用CCD進行輔助確認,但因為CCD無中心點,所以必需另外確認CCD與多軸機械中心點之關係方能協助對準程序。The above-mentioned compensation control method for multi-axis machine can solve the lack of the conventional contact measurement method for detecting the rod measurement, but the prior art technique requires the use of a plurality of non-contact distance measuring instruments, and the plurality of non-contacts The contact range finder must be perpendicular to the mounting surface, while at the same time having multiple non-contact rangefinders perpendicular to the horizontal plane is not easy to install. In addition, the non-contact range finder used in the prior art technology, if a laser range finder is used, the laser range finder with high linearity and high reproducibility is extremely expensive. In addition, the non-contact use of the prior case technology The range finder, if a low-cost CMOS (complementary oxidized metal semiconductor) laser range finder is used, can reduce the cost, but has the problem of low linearity. In addition, in the X- and Y-position measurement in the prior art, it is necessary to align the center point of the multi-axis machine with the target point. Although the CCD can be used for auxiliary confirmation, since the CCD has no center point, it is necessary to separately confirm the CCD and the multi-axis. The relationship between the mechanical center points can assist in the alignment procedure.

據此,本案提供一種校準裝置以改善該前案。Accordingly, the present application provides a calibration device to improve the prior case.

請參閱第一圖至第五圖所示實施例結構,該校準裝置100,包含一座體10、複數雷射感測器20、一反射件30、一基準點結構40及一感光元件50(請參閱第四圖所示),該感光元件50係採用CCD(Charge Coupled Device,電荷耦合元件)。Referring to the structure of the embodiment shown in FIG. 1 to FIG. 5 , the calibration apparatus 100 includes a body 10 , a plurality of laser sensors 20 , a reflector 30 , a reference point structure 40 , and a photosensitive element 50 (please Referring to the fourth figure, the photosensitive element 50 is a CCD (Charge Coupled Device).

該座體10具有相對之一第一面11以及一第二面12,於本實施例中,該座體10呈現一圓盤狀。於座體10設有複數安裝槽13,每一安裝槽13係用以設置一雷射感測器20,每一安裝槽13包括至少相對之二側壁131、132,於其中一側壁131設有一弧形槽133,於弧形槽133設有一定位栓134,該定位栓134具有一第一軸向端135,該第一軸向端135具有一釋放位置以及一鎖固位置,於安裝槽13相對於該弧形槽133之一側設有一第一樞接孔136。該安裝槽13之底部係貫穿該座體10之第一面11,雷射感測器20係由第一面11(亦即該座體10之底部)向上嵌入設置於該安裝槽13之二側壁131、132間,雷射感測器20相對應於該第一樞接孔之位置設有一第二樞接孔22,藉由栓體或軸體(圖中未示出)穿設於第一樞接孔136及第二樞接孔22,可將雷射感測器20可轉動地設置於安裝槽13內。每 一雷射感測器20具有一出光端21用以發射一雷射光束,雷射感測器20係外露於該第一面11,亦即雷射感測器20係以該出光端21朝下之狀態嵌入該安裝槽13內。於本實施例中,係設置三個安裝槽13,用以安裝三個雷射感測器20,該三個安裝槽13係環繞於該圓盤狀座體10中心外圍等角設置,三個雷射感測器20之出光端21都是朝向該圓盤狀座體10中心,於安裝槽13頂部設有第一出線孔137,可提供連接雷射感測器20之線路走線之用。The base 10 has a first surface 11 and a second surface 12. In this embodiment, the base 10 has a disk shape. The mounting body 13 is provided with a plurality of mounting slots 13 each for mounting a laser sensor 20, each mounting slot 13 including at least two opposite side walls 131, 132, and one of the side walls 131 is provided The arcuate groove 133 is provided with a positioning pin 134 at the arcuate groove 133. The positioning pin 134 has a first axial end 135. The first axial end 135 has a release position and a locking position. A first pivot hole 136 is disposed on one side of the arcuate groove 133. The bottom of the mounting slot 13 extends through the first surface 11 of the base 10. The laser sensor 20 is embedded in the mounting slot 13 by the first surface 11 (ie, the bottom of the base 10). Between the side walls 131 and 132, the laser sensor 20 is provided with a second pivot hole 22 corresponding to the first pivot hole, and is inserted through the plug body or the shaft body (not shown). A pivot hole 136 and a second pivot hole 22 rotatably mount the laser sensor 20 in the mounting groove 13. each A laser sensor 20 has a light-emitting end 21 for emitting a laser beam, and the laser sensor 20 is exposed on the first surface 11, that is, the laser sensor 20 is connected to the light-emitting end 21 The lower state is embedded in the mounting groove 13. In this embodiment, three mounting slots 13 are provided for mounting three laser sensors 20, which are arranged around the center periphery of the disc-shaped housing 10 at equal angles, three The light-emitting end 21 of the laser sensor 20 is directed toward the center of the disk-shaped base 10, and a first outlet hole 137 is provided at the top of the mounting groove 13 to provide a line connecting the laser sensor 20. use.

於理想狀況下,雷射感測器20與安裝槽13係相互嵌合呈緊配合,且雷射感測器20所產生之雷射光束係垂直於該第一面11射出座體10,且各雷射光束相互平行,但由於尺寸誤差等多種因素影響,常導致雷射光束無法垂直於該第一面11射出座體10,因此必須藉由弧形槽133及定位栓134對雷射感測器20進行微調。In an ideal situation, the laser sensor 20 and the mounting groove 13 are closely fitted to each other, and the laser beam generated by the laser sensor 20 is perpendicular to the first surface 11 to emit the housing 10, and Each of the laser beams is parallel to each other. However, due to various factors such as a dimensional error, the laser beam is often unable to be perpendicular to the first surface 11 to exit the base 10. Therefore, the arc 133 and the positioning pin 134 must be used for the sense of the laser. The detector 20 performs fine adjustment.

請參閱第一圖及第五圖所示,該定位栓134之第一軸向端135位於該釋放位置時(如第一圖所示狀態),雷射感測器20可以第二樞接孔22為中心於安裝槽13內擺動,於雷射感測器20擺動過程中,可以改變所發出之雷射光束之角度,當雷射感測器20擺動至一所需位置時,雷射光束L1可達到垂直第一面11之狀態,即可將定位栓134鎖入弧形槽133,使第一軸向端135抵靠於雷射感測器20,亦即第一軸向端135位於鎖固位置時,該第一軸向端135係頂抵於雷射感測器20一側並將雷射感測器20定位於安裝槽13內,使雷射感測器20之位置固定而無法再擺動。如此一一以上述方法微調各個雷射感測器20,即可使雷射感測器20所產生之雷射光束係垂直於該第一面11射出座體 10,且各雷射光束相互平行。關於雷射感測器20與安裝槽13、定位栓134相互配合之尺寸,允許具有一定的誤差範圍值,例如,定位栓134頂抵雷射感測器20可能造成雷射感測器20之位移誤差,可以藉由雷射感測器20與安裝槽13搭配的尺寸得到限制,使達到一容許誤差。Referring to the first and fifth figures, when the first axial end 135 of the positioning pin 134 is in the release position (as shown in the first figure), the laser sensor 20 can be the second pivot hole. 22 is centered in the mounting slot 13 for swinging. During the swinging of the laser sensor 20, the angle of the emitted laser beam can be changed. When the laser sensor 20 is swung to a desired position, the laser beam is irradiated to a desired position. L1 can reach the state of the vertical first face 11, that is, the positioning pin 134 can be locked into the arcuate groove 133, so that the first axial end 135 abuts against the laser sensor 20, that is, the first axial end 135 is located. In the locking position, the first axial end 135 abuts against the side of the laser sensor 20 and positions the laser sensor 20 in the mounting slot 13 to fix the position of the laser sensor 20 Can't swing anymore. Thus, each of the laser sensors 20 is fine-tuned in the above manner, so that the laser beam generated by the laser sensor 20 is perpendicular to the first surface 11 to emit the body. 10, and each of the laser beams is parallel to each other. The size of the laser sensor 20 interacting with the mounting groove 13 and the positioning pin 134 allows a certain error range value. For example, the positioning pin 134 abutting the laser sensor 20 may cause the laser sensor 20 to be The displacement error can be limited by the size of the laser sensor 20 in combination with the mounting groove 13 to achieve a tolerance.

請參閱第一圖至第四圖及第六圖所示,該反射件30係可分離地設置於座體10之第一面11,於本實施例中,反射件30係一圓筒狀結構,其一軸向端部(圖示反射件30之頂部)開放,相對另一軸向端部(圖示反射件30之底部)設有一反射面31,該反射面31具有反射特性,使反射件30設有該反射面31之軸向端部係呈現封閉態樣(如第六圖所示)。該反射面31係平行於第一面11,反射面31與第一面11之間具有一距離,每一雷射感測器20之出光端21與反射面31之距離相同,該雷射光束L1係垂直投射於反射面31。反射件30與座體10之間設有一第一快拆結構,該第一快拆結構係於座體10之第一面11設有複數第一卡合槽14,每一第一卡合槽14具有一弧度,該複數第一卡合槽14係圍繞於一第一中心C1呈環形設置,該第一中心C1係該圓盤狀座體10之中心。此外,於反射件30相對於反射面31之軸向端部之外圍設有複數第一凸件32,該複數第一凸件32係圍繞於第一中心C1呈環形設置。將反射件30設有第一凸件32之一端與座體10之第一面11相靠合並相對旋轉反射件30與座體10,每一第一凸件32係可對應並卡合於一第一卡合槽14內,藉此將反射件30結合於座體10底面(亦即第一面11)。雷射感測器20所發出之雷射光束L1投射至反射面31後,可反射回雷射感測器20, 藉此可由雷射感測器20量測出光端21至反射面31之距離。當量測完畢之後,可反向相對旋轉反射件30與座體10,即可將反射件30與座體10分離。Referring to the first to fourth and sixth figures, the reflector 30 is detachably disposed on the first surface 11 of the base 10. In the embodiment, the reflector 30 is a cylindrical structure. An axial end portion (the top of the illustrated reflecting member 30) is open, and a reflecting surface 31 is provided opposite to the other axial end portion (the bottom portion of the reflecting member 30 is illustrated), and the reflecting surface 31 has a reflective characteristic to enable the reflecting member The axial end portion of the reflecting surface 31 is provided with a closed state (as shown in the sixth figure). The reflecting surface 31 is parallel to the first surface 11 and has a distance between the reflecting surface 31 and the first surface 11. The light emitting end 21 of each laser sensor 20 has the same distance from the reflecting surface 31. The laser beam is the same. The L1 is vertically projected on the reflecting surface 31. A first quick release structure is disposed between the reflector member 30 and the base body 10. The first quick release structure is disposed on the first surface 11 of the base body 10 and is provided with a plurality of first engaging slots 14 for each first engaging slot. 14 has a curvature, and the plurality of first engaging grooves 14 are annularly disposed around a first center C1, and the first center C1 is the center of the disk-shaped housing 10. In addition, a plurality of first protrusions 32 are disposed on the periphery of the axial end of the reflection member 30 with respect to the reflection surface 31, and the plurality of first protrusions 32 are annularly disposed around the first center C1. The reflector member 30 is provided with one end of the first protrusion 32 and the first surface 11 of the base 10 is opposite to the rotating reflector 30 and the base 10, and each of the first protrusions 32 can be corresponding to and engaged with the first member 32. In the first engaging groove 14, the reflecting member 30 is coupled to the bottom surface of the base 10 (that is, the first surface 11). After the laser beam L1 emitted by the laser sensor 20 is projected onto the reflecting surface 31, it can be reflected back to the laser sensor 20. Thereby, the distance from the light end 21 to the reflecting surface 31 can be measured by the laser sensor 20. After the equivalent measurement is completed, the reflector 30 and the base 10 can be oppositely rotated, and the reflector 30 can be separated from the base 10.

請參閱第一圖至第四圖所示,於座體10之第二面12設有一筒件15,該筒件15具有一長度方向,筒件15沿著長度方向具有相對之一第一端151以及一第二端152,第一端151係連接於座體10,於座體10設有一第一貫穿部157,第一貫穿部157係位於感光元件50與基準點結構40之間。感光元件50係設置於筒件15內,於筒件15之筒身設有一第二出線孔153,可提供連接感光元件50之線路走線之用。於筒件15設有複數調整孔154,該複數調整孔154係以筒件15之長度方向複數陣列為複數列,且該複數列調整孔154係等角設置於筒件15,於本實施例中,係以二個調整孔154為一列,於筒件15設有三列調整孔154,每一調整孔154設有一調整栓155,每一調整栓155具有一第二軸向端156,將調整栓155穿設於調整孔154,該第二軸向端156係朝向感光元件50之外表面,該第二軸向端156具有一釋放位置以及一鎖固位置,當第二軸向端156位於釋放位置時(如第四圖所示態樣),第二軸向端156係與感光元件50分離,當第二軸向端156位於鎖固位置時,156第二軸向端可頂抵於感光元件50之外表面。藉由位於不同位置之調整栓155頂抵於感光元件50,可微調感光元件50之垂直度。Referring to the first to fourth figures, the second surface 12 of the base 10 is provided with a tubular member 15 having a longitudinal direction, and the tubular member 15 has a first end opposite to the longitudinal direction. 151 and a second end 152, the first end 151 is connected to the base 10, and the base 10 is provided with a first through portion 157. The first through portion 157 is located between the photosensitive element 50 and the reference point structure 40. The photosensitive member 50 is disposed in the tubular member 15. A second outlet opening 153 is defined in the barrel of the tubular member 15 for providing a line connecting the photosensitive member 50. The plurality of adjustment holes 154 are provided in the plurality of adjustment holes 154 in the plurality of rows in the longitudinal direction of the cylindrical member 15, and the plurality of adjustment holes 154 are equiangularly disposed on the cylindrical member 15, in this embodiment. The two adjusting holes 154 are arranged in a row, and the cylindrical member 15 is provided with three rows of adjusting holes 154. Each adjusting hole 154 is provided with an adjusting pin 155. Each adjusting pin 155 has a second axial end 156, which will be adjusted. The second axial end 156 has a release position and a locking position when the second axial end 156 is located. The second axial end 156 has a release position and a locking position. When the position is released (as shown in the fourth figure), the second axial end 156 is separated from the photosensitive element 50. When the second axial end 156 is in the locked position, the second axial end of the 156 can be offset. The outer surface of the photosensitive member 50. The verticality of the photosensitive member 50 can be finely adjusted by the adjustment pin 155 at a different position abutting against the photosensitive member 50.

其次,該基準點結構40包括一插槽41以及一板體42,插槽41係設置於座體10之第一面11,插槽41具有一第二貫穿部411,第二貫穿部411係相對應於第一貫穿部 157。板體42係由透明材質之材料構成,,例如可採用玻璃或透明壓克力,於板體42設有一十字刻紋,該十字刻紋係由相互垂直之一第一紋路421以及一第二紋路422構成,第一紋路421與第二紋路422之交會點係形成一基準點423;板體42係設置於插槽41內,基準點423係相對應於第一貫穿部157與第二貫穿部411之位置。上述關於微調感光元件50之垂直度,其作用即在於使微調感光元件50之垂直度可與該基準點423對齊。The reference point structure 40 includes a slot 41 and a plate 42. The slot 41 is disposed on the first surface 11 of the base 10. The slot 41 has a second through portion 411, and the second through portion 411 is Corresponding to the first penetration 157. The plate body 42 is made of a transparent material, for example, glass or transparent acrylic, and the plate body 42 is provided with a cross-cut pattern which is perpendicular to one of the first lines 421 and a second. The line 422 is formed, and a point of intersection between the first line 421 and the second line 422 forms a reference point 423; the plate 42 is disposed in the slot 41, and the reference point 423 corresponds to the first through portion 157 and the second through portion The position of the part 411. The above-mentioned fine adjustment of the verticality of the photosensitive member 50 is such that the verticality of the fine adjustment photosensitive member 50 can be aligned with the reference point 423.

請參閱第一圖及第六圖所示,該筒件15之第二端152係用以與一多軸機械200之一端面210相結合,該第二端與該多軸機械200之一端面210之間設有一第二快拆結構,該第二快拆結構係於端面210設有複數第二卡合槽220,每一第二卡合槽220具有一弧度,該複數第二卡合槽220係圍繞於一第二中心C2呈環形設置,於本實施例中,該第二中心C2與該第一中心C1同軸。此外,於筒件15之第二端152外圍設有複數第二凸件158,該複數第二卡合槽220係圍繞於第二中心C2呈環形設置。將筒件15設有第二凸件158之一端與多軸機械200之端面210相靠合,並旋轉筒件15,每一第二凸件158可對應並卡合於一第二卡合槽220內,即可將筒件15與端面210相結合,藉此可將座體10結合於多軸機械200之端面210。就第六圖所示,多軸機械200之端面210、感光元件50、板體42之基準點423係同心,感光元件50可透過第一貫穿部157與第二貫穿部411偵測到板體42上之基準點423(請參閱第二圖所示)。Referring to the first and sixth figures, the second end 152 of the tubular member 15 is coupled to one end surface 210 of a multi-axis machine 200, and the second end and one end surface of the multi-axis machine 200 A second quick release structure is disposed between the 210s. The second quick release structure is provided with a plurality of second engaging slots 220 on the end surface 210, each second engaging slot 220 has a curvature, and the second plurality of engaging slots The 220 series is disposed in a ring shape around a second center C2. In this embodiment, the second center C2 is coaxial with the first center C1. In addition, a plurality of second protrusions 158 are disposed on the periphery of the second end 152 of the tubular member 15, and the plurality of second engagement slots 220 are annularly disposed around the second center C2. One end of the second protruding member 158 is disposed on the tubular member 15 to abut the end surface 210 of the multi-axis machine 200, and the tubular member 15 is rotated, and each of the second protruding members 158 can be correspondingly engaged with the second engaging groove. In the case of 220, the tubular member 15 can be joined to the end face 210, whereby the seat body 10 can be coupled to the end face 210 of the multi-axis machine 200. As shown in the sixth figure, the end surface 210 of the multi-axis machine 200, the photosensitive element 50, and the reference point 423 of the plate body 42 are concentric, and the photosensitive element 50 can detect the plate body through the first through portion 157 and the second through portion 411. Reference point 423 on 42 (see the second figure).

請參閱第一圖至第四圖所示,本揭露該校準裝置100 的組裝程序可為,先利用調整栓155調整感光元件50的垂直度,並固定在座體10之中心位置上;其次,將雷射感測器20分別放入安裝槽13中;其次,將雷射感測器20通電以進行雷射光束角度調整,可微調弧形槽133之定位栓134,當雷射感測器20的讀值為最小值,即完成垂直度校正後,再將定位栓134鎖緊在安裝槽13;其次,將具有十字刻紋之板體42插入插槽41內,滑至定位,該基準點423即為多軸機械之端面的中心參考位置;其次,將反射件30之第一凸件32旋轉卡入座體10第一面11之第一卡合槽14內,如此即可完成該校準裝置100之組裝,其組合態樣如第一圖所示。Referring to the first to fourth figures, the calibration apparatus 100 is disclosed. The assembly procedure may be such that the verticality of the photosensitive element 50 is first adjusted by the adjusting pin 155 and fixed at the center position of the base 10; secondly, the laser sensor 20 is respectively placed in the mounting groove 13; secondly, the lightning is applied The sensor 20 is energized to adjust the laser beam angle, and the positioning pin 134 of the curved groove 133 can be finely adjusted. When the reading value of the laser sensor 20 is the minimum value, that is, the verticality correction is completed, the positioning pin is further 134 is locked in the mounting groove 13; secondly, the plate 42 having the cross-stitched pattern is inserted into the slot 41, and is slid to the position, the reference point 423 is the center reference position of the end face of the multi-axis machine; secondly, the reflecting member is The first protruding member 32 of the 30 is rotated into the first engaging groove 14 of the first surface 11 of the base 10, so that the assembly of the calibration device 100 can be completed, and the combined form is as shown in the first figure.

請參閱第六圖至第八圖所示,說明使用該校準裝置100之多軸機械之補償方法。將已經調校及組裝完成之校準裝置100安裝於多軸機械200之端面210,如第六圖所示態樣,驅動雷射感測器20發出雷射光束L1,可量測出雷射感測器20出光端21(可參考第二圖所示)至反射面31之距離,距離為一第一距離H1。其次,紀錄該第一距離H1,並將每一雷射感測器20之讀值歸零,以第一距離H1作為該多軸機械200補償控制之依據。其次,將反射件30取下,並將多軸機械200移動至一工作平台230上方,於工作平台230設有一目標物240,由雷射感測器20量測工作平台230至每一出光端21之距離,該距離為一第二距離H2,第二距離H2大於第一距離H1,如第七圖所示;其次,將多軸機械200朝向工作平台230移動一第三距離H3,該第三距離H3係第一距離H1與第二距離H2之差值,如第八圖所示,此時,雷射感測器20與工作平台230之距離為該第一 距離H1,其次,由感光元件50偵測該基準點是否對準該目標物240,如此即完成該多軸機械200之補償。Please refer to the sixth to eighth figures for explaining the multi-axis mechanical compensation method using the calibration apparatus 100. The calibration device 100, which has been calibrated and assembled, is mounted on the end surface 210 of the multi-axis machine 200. As shown in the sixth figure, the laser sensor 20 is driven to emit a laser beam L1 to measure the sense of the laser. The distance between the light-emitting end 21 of the detector 20 (refer to the second figure) to the reflecting surface 31 is a first distance H1. Next, the first distance H1 is recorded, and the reading value of each of the laser sensors 20 is zeroed, and the first distance H1 is used as the basis for the multi-axis mechanical compensation control. Next, the reflector 30 is removed, and the multi-axis machine 200 is moved over a working platform 230. The target platform 240 is disposed on the working platform 230, and the working platform 230 is measured by the laser sensor 20 to each light-emitting end. a distance of 21, the distance is a second distance H2, the second distance H2 is greater than the first distance H1, as shown in the seventh figure; secondly, moving the multi-axis machine 200 toward the work platform 230 by a third distance H3, the The distance between the first distance H1 and the second distance H2 of the three-distance H3 system is as shown in the eighth figure. At this time, the distance between the laser sensor 20 and the working platform 230 is the first The distance H1, and secondly, whether the reference point is aligned with the target 240 by the photosensitive element 50, thus completing the compensation of the multi-axis machine 200.

請參閱第九圖與第十圖所示座體另一實施例結構,該座體10A係以第一圖之座體10之結構衍生而出,座體10A呈現扁平圓盤狀,其具有一第一面11A、一第二面12A,於第一面11A設有插槽41A以及複數第一卡合槽14A,於第二面12A設有一筒件15A,於該筒件15A周圍圍繞等角設有三個安裝槽13A,該安裝槽13A係由相對之二側壁131A、132A構成,於其中一側壁131A設有一弧形槽133A以及第一樞接孔136A,雷射感測器(圖中未示出)係被夾合於該二側壁131A、132A之間,樞接於第一樞接孔136A,並可藉由弧形槽133A微調且固定雷射感測器。Referring to the structure of another embodiment of the base body shown in the ninth and tenth diagrams, the base body 10A is derived from the structure of the seat body 10 of the first figure, and the seat body 10A has a flat disc shape, which has a The first surface 11A and the second surface 12A are provided with a slot 41A and a plurality of first engaging slots 14A on the first surface 11A, and a tubular member 15A is disposed on the second surface 12A, and an isometric surround around the tubular member 15A. There are three mounting slots 13A. The mounting slots 13A are formed by two opposite sidewalls 131A and 132A. One of the sidewalls 131A is provided with an arcuate slot 133A and a first pivoting hole 136A. The laser sensor (not shown) It is shown that it is sandwiched between the two side walls 131A, 132A, pivotally connected to the first pivot hole 136A, and the laser sensor can be finely adjusted and fixed by the curved groove 133A.

請第十一圖所示座體又一實施例結構,該座體10B係以第九圖座體10A之結構衍生而出,於座體10B之第一面11B設有相互垂直之一第一基準線421B以及一第二基準線422B,第一基準線421B與第二基準線422B係橫跨第一貫穿部157B,第一基準線421B與第二基準線422B之交會點係對應於第一貫穿部157B,第一基準線421B與第二基準線422B之交會點係形成一基準點423B。該第一基準線421B與第二基準線422B之材質或尺寸沒有限制,能與所使用之感光元件之規格相搭配,使感光元件可清晰偵測該第一基準線421B與第二基準線422B所形成之基準點423B即可。In another embodiment of the housing shown in FIG. 11 , the base 10B is derived from the structure of the ninth housing 10A, and the first surface 11B of the housing 10B is provided with one of the first sides. The reference line 421B and the second reference line 422B, the first reference line 421B and the second reference line 422B cross the first through portion 157B, and the intersection of the first reference line 421B and the second reference line 422B corresponds to the first The penetration portion 157B forms a reference point 423B at the intersection of the first reference line 421B and the second reference line 422B. The material or size of the first reference line 421B and the second reference line 422B are not limited, and can be matched with the specifications of the photosensitive element used, so that the photosensitive element can clearly detect the first reference line 421B and the second reference line 422B. The formed reference point 423B is sufficient.

惟以上所述者,僅為本揭露之實施例而已,當不能以之限定本揭露所實施之範圍。即大凡依本揭露申請專利範圍所作之均等變化與修飾,皆應仍屬於本揭露專利涵蓋之範圍內,謹請 貴審查委員明鑑,並祈惠准,是所至禱。However, the above description is only for the embodiments of the present disclosure, and the scope of the disclosure is not limited thereto. That is to say, the average changes and modifications made by the applicants in accordance with the scope of the application for patents should still fall within the scope of the disclosure of this patent. I would like to ask your review committee to give a clear understanding and pray for the best.

100‧‧‧校準裝置100‧‧‧ calibration device

10、10A、10B‧‧‧座體10, 10A, 10B‧‧‧ body

11、11A、11B‧‧‧第一面11, 11A, 11B‧‧‧ first side

12、12A‧‧‧第二面12, 12A‧‧‧ second side

13、13A‧‧‧安裝槽13, 13A‧‧‧ mounting slots

131、132、131A、132A‧‧‧二側壁131, 132, 131A, 132A‧‧‧ two side walls

133、133A‧‧‧弧形槽133, 133A‧‧‧ arc groove

134‧‧‧定位栓134‧‧‧ Positioning bolt

135‧‧‧第一軸向端135‧‧‧First axial end

136、136A‧‧‧第一樞接孔136, 136A‧‧‧ first pivot hole

137‧‧‧第一出線孔137‧‧‧First outlet hole

14、14A‧‧‧第一卡合槽14, 14A‧‧‧ first engagement slot

15、15A‧‧‧筒件15, 15A‧‧‧Piece

151‧‧‧第一端151‧‧‧ first end

152‧‧‧第二端152‧‧‧ second end

153‧‧‧第二出線孔153‧‧‧Second outlet

154‧‧‧調整孔154‧‧‧Adjustment hole

155‧‧‧調整栓155‧‧‧ adjustment bolt

156‧‧‧第二軸向端156‧‧‧second axial end

157、157B‧‧‧第一貫穿部157, 157B‧‧‧ first penetration

158‧‧‧第二凸件158‧‧‧second convex parts

20‧‧‧雷射感測器20‧‧‧Laser sensor

21‧‧‧出光端21‧‧‧Lighting end

22‧‧‧第二樞接孔22‧‧‧Second pivot hole

30‧‧‧反射件30‧‧‧Reflecting parts

31‧‧‧反射面31‧‧‧reflecting surface

32‧‧‧第一凸件32‧‧‧First convex parts

40‧‧‧基準點結構40‧‧‧ reference point structure

41、41A‧‧‧插槽41, 41A‧‧‧ slots

411‧‧‧第二貫穿部411‧‧‧Second penetration

42‧‧‧板體42‧‧‧ board

421‧‧‧第一紋路421‧‧‧First grain

422‧‧‧第二紋路422‧‧‧Second lines

421B‧‧‧第一基準線421B‧‧‧First baseline

422B‧‧‧第二基準線422B‧‧‧second baseline

423、423B‧‧‧基準點423, 423B‧‧ ‧ benchmark points

50‧‧‧感光元件50‧‧‧Photosensitive elements

200‧‧‧多軸機械200‧‧‧Multi-axis machinery

210‧‧‧端面210‧‧‧ end face

220‧‧‧第二卡合槽220‧‧‧Second engagement slot

230‧‧‧工作平台230‧‧‧Working Platform

240‧‧‧目標物240‧‧‧ Targets

C1‧‧‧第一中心C1‧‧‧First Center

C2‧‧‧第二中心C2‧‧‧ Second Center

H1‧‧‧第一距離H1‧‧‧first distance

H2‧‧‧第二距離H2‧‧‧Second distance

H3‧‧‧第三距離H3‧‧‧ third distance

L1‧‧‧雷射光束L1‧‧‧Laser beam

第一圖係本揭露校準裝置之一實施例之組合結構示意圖。The first figure is a schematic diagram of the combined structure of one embodiment of the calibration apparatus.

第二圖係第一圖實施例之分解結構示意圖。The second drawing is a schematic exploded view of the first embodiment.

第三圖係第一圖座體實施例之底視結構示意圖。The third figure is a bottom view of the first figure embodiment.

第四圖係第三圖之A-A剖面結構示意圖。The fourth figure is a schematic view of the A-A cross-sectional structure of the third figure.

第五圖係微調雷射感測器之動作示意圖。The fifth figure is a schematic diagram of the action of fine-tuning the laser sensor.

第六圖係第三圖之B-B剖面配合反射件之結構示意圖。The sixth figure is a schematic view of the structure of the B-B section of the third figure with the reflecting member.

第七圖及第八圖係將本揭露實施於多軸機械補償控制之結構示意圖。The seventh and eighth figures are schematic views of the structure in which the present disclosure is implemented in multi-axis mechanical compensation control.

第九圖係本揭露校準裝置之座體另一實施例之頂視立體結構示意圖。The ninth drawing is a top perspective view of another embodiment of the housing of the calibration device.

第十圖係第九圖實施例之底視立體結構示意圖。The tenth figure is a bottom view three-dimensional structure diagram of the ninth embodiment.

第十一圖係本揭露校準裝置之座體又一實施例之底視立體結構示意圖。The eleventh figure is a schematic bottom perspective view of still another embodiment of the housing of the calibration device.

100‧‧‧校準裝置100‧‧‧ calibration device

10‧‧‧座體10‧‧‧ body

11‧‧‧第一面11‧‧‧ first side

12‧‧‧第二面12‧‧‧ second side

13‧‧‧安裝槽13‧‧‧Installation slot

131、132‧‧‧二側壁131, 132‧‧‧ two side walls

133‧‧‧弧形槽133‧‧‧ arc slot

134‧‧‧定位栓134‧‧‧ Positioning bolt

135‧‧‧第一軸向端135‧‧‧First axial end

136‧‧‧第一樞接孔136‧‧‧First pivot hole

137‧‧‧第一出線孔137‧‧‧First outlet hole

15‧‧‧筒件15‧‧‧Clocks

151‧‧‧第一端151‧‧‧ first end

152‧‧‧第二端152‧‧‧ second end

153‧‧‧第二出線孔153‧‧‧Second outlet

154‧‧‧調整孔154‧‧‧Adjustment hole

158‧‧‧第二凸件158‧‧‧second convex parts

30‧‧‧反射件30‧‧‧Reflecting parts

Claims (12)

一種校準裝置,包含:一座體,其具有一第一面;複數雷射感測器,係設置於該座體,每一該雷射感測器具有一出光端以發射一雷射光束,該複數雷射光束係相互平行;一反射件,係可分離地設置於該座體,該反射件包括一具有反射特性之反射面,該反射面與該第一面之間具有一距離,每一該出光端與該反射面之距離相同,該複數雷射光束係垂直投射於該反射面;一基準點結構,係設置於該座體,該基準點結構具有一基準點;以及一感光元件,係設置於該座體,該感光元件係用以偵測該基準點。A calibration device comprising: a body having a first surface; a plurality of laser sensors disposed on the body, each of the laser sensors having a light emitting end to emit a laser beam, the plurality The laser beams are parallel to each other; a reflective member is detachably disposed on the base, the reflective member includes a reflective surface having a reflective characteristic, the reflective surface having a distance from the first surface, each of the The light emitting end is at the same distance from the reflecting surface, and the plurality of laser beams are vertically projected on the reflecting surface; a reference point structure is disposed on the base body, the reference point structure has a reference point; and a photosensitive element is The photo sensor is configured to detect the reference point. 如申請專利範圍第1項所述之校準裝置,其中該座體具有複數安裝槽,每一該安裝槽係用以設置一該雷射感測器,每一該安裝槽包括至少相對之二側壁,於其中一側壁設有一弧形槽,於該弧形槽設有一定位栓,該定位栓具有一第一軸向端,該雷射感測器係設置且樞接於該二側壁間,該出光端係外露於該第一面,該定位栓係穿設於該弧形槽,該第一軸向端係朝向該雷射感測器之一側,該第一軸向端具有一釋放位置以及一鎖固位置,該第一軸向端位於該釋放位置時,該雷射感測器係可以該樞接位置為中心擺動,該第一軸向端位於該鎖固位置時,該第一軸向端係頂抵於該雷射感測器一側並將該雷 射感測器定位於該安裝槽內。The calibration device of claim 1, wherein the base has a plurality of mounting slots, each of the mounting slots for arranging a laser sensor, each of the mounting slots including at least two opposite sidewalls An arcuate slot is disposed on one of the side walls, and a positioning pin is disposed on the arcuate slot, the positioning pin has a first axial end, and the laser sensor is disposed and pivotally connected between the two sidewalls. The light-emitting end is exposed on the first surface, the positioning bolt is disposed in the arc-shaped groove, the first axial end is facing one side of the laser sensor, and the first axial end has a release position And a locking position, the laser sensor is oscillating about the pivoting position when the first axial end is in the releasing position, and the first axial end is located at the locking position, the first The axial end is attached to the side of the laser sensor and the mine is The sensor is positioned in the mounting slot. 如申請專利範圍第1項所述之校準裝置,其中該複數雷射感測器係以該感光元件為中心,環繞設置於該感光元件之週圍。The calibration device of claim 1, wherein the plurality of laser sensors are centered around the photosensitive element and are disposed around the photosensitive element. 如申請專利範圍第3項所述之校準裝置,其中該複數雷射感測器係等角環繞設置於該感光元件之週圍。The calibration device of claim 3, wherein the plurality of laser sensors are equiangularly disposed around the photosensitive element. 如申請專利範圍第1項所述之校準裝置,其中該反射件與該座體之間設有一第一快拆結構,該第一快拆結構包括:複數第一卡合槽,每一該第一卡合槽具有一弧度,該複數第一卡合槽係圍繞於一第一中心呈環形設置;以及複數第一凸件,該複數第一凸件係圍繞於該第一中心呈環形設置,每一第一凸件係對應卡合於一第一卡合槽內,該座體之該第一面以及該反射件相對於該反射面之一端其中之一設置該複數第一卡合槽,另一則設置該複數第一凸件。The calibration device of claim 1, wherein the first quick release structure is disposed between the reflector and the base body, and the first quick release structure comprises: a plurality of first engagement slots, each of the first a plurality of first engaging grooves are annularly disposed around a first center; and a plurality of first protruding members are annularly disposed around the first center. Each of the first protruding members is correspondingly engaged with a first engaging groove, and the first surface of the seat body and the reflecting member are disposed with respect to one of the reflective surfaces to provide the plurality of first engaging grooves. The other is to set the plurality of first convex members. 如申請專利範圍第1項所述之校準裝置,其中該座體具有相對於該第一面之一第二面,於該第二面設有一筒件,該筒件具有一長度方向,該筒件沿著該長度方向具有相對之一第一端以及一第二端,該感光元件係設置於該筒件內,於該筒件設有複數調整栓,每一該調整栓具有一第二軸向端,該調整栓係穿設於該筒件,該第二軸向端係朝向該感光元件之外表面,該第二軸向端具有一釋放位置以及一鎖固位置,該第二軸向端位於該釋放位置時,該第二軸向端係與該感光元件分離,該第二軸向端位於該鎖固位置時,該第二軸向端係頂抵於該感光元 件之外表面。The calibration device of claim 1, wherein the seat body has a second surface opposite to the first surface, and the second surface is provided with a cylindrical member having a length direction, the tube The piece has a first end and a second end along the length direction, and the photosensitive element is disposed in the barrel, and the tube is provided with a plurality of adjusting bolts, each of the adjusting bolts having a second axis The adjusting pin is disposed at the end of the tubular member, the second axial end is facing the outer surface of the photosensitive element, and the second axial end has a releasing position and a locking position, the second axial direction When the end is in the release position, the second axial end is separated from the photosensitive element, and when the second axial end is in the locking position, the second axial end is slid against the photosensitive element The outer surface of the piece. 如申請專利範圍第6項所述之校準裝置,其中該複數調整栓係以該筒件之該長度方向複數陣列為複數列,且該複數列調整栓係等角設置於該筒件。The calibration device of claim 6, wherein the plurality of adjustment tethers are in a plurality of arrays in the longitudinal direction of the tubular member, and the plurality of adjustment tethers are equiangularly disposed on the tubular member. 如申請專利範圍第6項所述之校準裝置,其中該筒件之該第一端係連接於該座體,於該座體設有一第一貫穿部,該第一貫穿部係位於該感光元件與該基準點結構之間。The calibration device of claim 6, wherein the first end of the tubular member is coupled to the base body, and the base body is provided with a first through portion, the first through portion being located at the photosensitive member Between this reference point structure. 如申請專利範圍第8項所述之校準裝置,其中該基準點結構包括:一插槽,係設置於該第一面,該插槽具有一第二貫穿部,該第二貫穿部係相對應於該第一貫穿部;以及一板體,其係由透明材質之材料構成,於該板體設有一十字刻紋,該十字刻紋係由相互垂直之一第一紋路以及一第二紋路構成,該第一紋路與該第二紋路之交會點係形成該基準點,該板體係設置於該插槽內,該基準點係相對應於該第一貫穿部與該第二貫穿部之位置。The calibration device of claim 8, wherein the reference point structure comprises: a slot disposed on the first surface, the slot having a second through portion, the second through portion corresponding to And the first through portion; and a plate body, which is made of a material of a transparent material, wherein the plate body is provided with a cross engraving, and the cross engraving is formed by one of the first lines and a second line that are perpendicular to each other. The intersection of the first line and the second line forms the reference point, and the plate system is disposed in the slot, and the reference point corresponds to the position of the first through portion and the second through portion. 如申請專利範圍第8項所述之校準裝置,其中該基準點結構包括相互垂直之一第一基準線以及一第二基準線,該第一基準線與該第二基準線係橫跨該第一貫穿部,該第一基準線與該第二基準線之交會點係對應於該第一貫穿部,該第一基準線與該第二基準線之交會點係形成該基準點。The calibration device of claim 8, wherein the reference point structure comprises a first reference line and a second reference line perpendicular to each other, the first reference line and the second reference line spanning the first In a penetrating portion, an intersection point of the first reference line and the second reference line corresponds to the first penetrating portion, and an intersection point of the first reference line and the second reference line forms the reference point. 如申請專利範圍第6項所述之校準裝置,其中該筒件之該第二端係用以與一多軸機械之一端面相結合,該第二端與該多軸機械之一端面之間設有一第二快拆結構,該 第二快拆結構包括:複數第二卡合槽,每一該第二卡合槽具有一弧度,該複數第二卡合槽係圍繞於一第二中心呈環形設置;以及複數第二凸件,該複數第二凸件係圍繞於該第二中心呈環形設置,每一第二凸件係對應卡合於一第二卡合槽內,該筒件之該第二端以及該多軸機械之該端面其中之一設置該複數第二卡合槽,另一則設置該複數第二凸件。The calibration device of claim 6, wherein the second end of the tubular member is coupled to one end surface of a multi-axis machine, and the second end is disposed between one end surface of the multi-axis machine There is a second quick release structure, the The second quick release structure includes: a plurality of second engaging grooves, each of the second engaging grooves has a curvature, the plurality of second engaging grooves are annularly disposed around a second center; and the plurality of second protruding members The plurality of second protruding members are annularly disposed around the second center, and each of the second protruding members is correspondingly engaged in a second engaging groove, the second end of the tubular member and the multi-axis mechanical mechanism One of the end faces is provided with the plurality of second engaging grooves, and the other is provided with the plurality of second protruding members. 一種多軸機械補償方法,其包含:備置一校準裝置,該校準裝置包括一座體,於該座體設有複數雷射感測器、一反射件、一基準點結構以及一感光元件,該座體具有一第一面,每一該雷射感測器具有一出光端,該雷射感測器係由該出光端發射一雷射光束,該複數雷射光束係相互平行,該反射件包括一反射面,該反射面與該第一面之間具有一距離,每一該出光端與該反射面之距離相同,該複數雷射光束係垂直投射於該反射面,該基準點結構具有一基準點,該感光元件係用以偵測該基準點;將該校準裝置安裝於一可移動之多軸機械之一端面;驅動每一該雷射感測器發出一雷射光束,以量測該出光端至該反射面之距離,該距離為一第一距離;紀錄該第一距離,並將每一該雷射感測器之讀值歸零,以該第一距離作為該多軸機械補償控制之依據;將該反射件取下,並將該多軸機械移動至一工作平台上方,於該工作平台設有一目標物,由該複數雷射感測器量測該工作平台至每一該出光面之距離,該距離為一第二距離,該第二距離大於該第一距離; 將該多軸機械朝向該工作平台移動一第三距離,該第三距離係該第一距離與該第二距離之差值;以及由該感光元件偵測該基準點是否對準該目標物。A multi-axis mechanical compensation method, comprising: preparing a calibration device, the calibration device comprising a body, wherein the base body is provided with a plurality of laser sensors, a reflector, a reference point structure and a photosensitive element, the seat The body has a first surface, each of the laser sensors has a light emitting end, and the laser sensor emits a laser beam from the light emitting end, the plurality of laser beams are parallel to each other, and the reflecting member comprises a a reflecting surface having a distance from the first surface, each of the light emitting ends being at the same distance from the reflecting surface, the plurality of laser beams being vertically projected on the reflecting surface, the reference point structure having a reference Point, the photosensitive element is used for detecting the reference point; the calibration device is mounted on one end surface of a movable multi-axis machine; each of the laser sensors is driven to emit a laser beam to measure the a distance from the light exit end to the reflective surface, the distance being a first distance; recording the first distance, and zeroing the reading value of each of the laser sensors, the first distance being used as the multi-axis mechanical compensation Basis of control; the reflector And moving the multi-axis machine to a working platform, wherein the working platform is provided with a target, and the distance between the working platform and each of the light-emitting surfaces is measured by the plurality of laser sensors, the distance is one a second distance, the second distance being greater than the first distance; Moving the multi-axis machine toward the working platform by a third distance, the third distance being a difference between the first distance and the second distance; and detecting, by the photosensitive element, whether the reference point is aligned with the target.
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CN110744473A (en) * 2019-10-28 2020-02-04 天津盛相电子有限公司 Auxiliary tool for assembling automobile outer covering part
CN111531498B (en) * 2020-05-09 2021-06-29 南通利元亨机械有限公司 Raymond mill mounting platform
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Citations (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5639853B2 (en) * 1974-01-14 1981-09-16
JPH09196623A (en) * 1995-11-15 1997-07-31 Sokkia Co Ltd Multiaxis laser interference length measuring instrument
TW442652B (en) * 2000-09-11 2001-06-23 Asia Optical Co Inc Optical receiver circuit of laser range-finder
CN2715106Y (en) * 2004-04-07 2005-08-03 刘杰波 Non-contact laser relative height measuring device
CN1829900A (en) * 2003-07-28 2006-09-06 莱卡地球系统公开股份有限公司 Device for checking or calibrating the angle-dependent alignment of a high-precision test piece
CN101149252A (en) * 2006-09-22 2008-03-26 株式会社拓普康 Position measuring device, position measuring method and position measuring program
CN101306505A (en) * 2008-06-20 2008-11-19 吴士旭 Method and device of alignment detection and adjustment of conterminous rotation shafts
JP2009236849A (en) * 2008-03-28 2009-10-15 Honda Motor Co Ltd Work measuring technique
CN101561347A (en) * 2009-05-15 2009-10-21 中国科学院上海光学精密机械研究所 Binocular visual axis deviation detection device and method for video glasses
TW201015046A (en) * 2008-10-08 2010-04-16 Nat Applied Res Laboratoires Method and equipment for measuring a rotating object
CN101913105A (en) * 2010-08-16 2010-12-15 合肥工业大学 Non-contact three-dimensional optical measuring head and method for in-situ measurement of numerical control machine
TW201111739A (en) * 2009-09-18 2011-04-01 Arcs Prec Technology Co Ltd Lens mount for use in measurement device
TW201118513A (en) * 2009-07-16 2011-06-01 Asml Netherlands Bv Position calibration of alignment heads in a multi-head alignment system
JP2011185608A (en) * 2010-03-04 2011-09-22 Yamaha Motor Co Ltd Inspection device and inspection method
TW201208219A (en) * 2010-06-07 2012-02-16 Gsi Group Corp Laser processing with oriented sub-arrays
TW201231202A (en) * 2011-01-31 2012-08-01 Hong-Long Chen Laser machining mechanism
CN102681483A (en) * 2012-04-16 2012-09-19 大连数控技术研究院 Coordinate system for automatically compensating temperature deformation and tool shape offset

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2685764B1 (en) * 1991-12-30 1995-03-17 Kreon Ind HIGH RESOLUTION COMPACT OPTICAL SENSOR FOR THREE-DIMENSIONAL SHAPE ANALYSIS.
DE19747027A1 (en) * 1997-04-21 1998-10-22 Wegu Messtechnik Multiple sensor scan device e.g. for coordinate measuring device
CN101209530B (en) * 2006-12-26 2011-12-14 财团法人工业技术研究院 Device and method for detecting cutting tool state
CN201183204Y (en) * 2008-02-22 2009-01-21 济南大学 Straight line displacement distance measuring apparatus based on linear array CCD sequence laser image match correlation
CN101780649B (en) * 2009-01-16 2012-10-10 鸿富锦精密工业(深圳)有限公司 Cutter detecting system and method
CN102001025B (en) * 2010-10-22 2013-02-06 西安交通大学 Processing precision property online measurement device and method for super-heavy lathe
TW201238699A (en) * 2011-03-24 2012-10-01 Ind Tech Res Inst On line vibration detected and intelligent control apparatus during cutting process which integrated with machine tool's IO module and method thereof

Patent Citations (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5639853B2 (en) * 1974-01-14 1981-09-16
JPH09196623A (en) * 1995-11-15 1997-07-31 Sokkia Co Ltd Multiaxis laser interference length measuring instrument
TW442652B (en) * 2000-09-11 2001-06-23 Asia Optical Co Inc Optical receiver circuit of laser range-finder
CN1829900A (en) * 2003-07-28 2006-09-06 莱卡地球系统公开股份有限公司 Device for checking or calibrating the angle-dependent alignment of a high-precision test piece
CN2715106Y (en) * 2004-04-07 2005-08-03 刘杰波 Non-contact laser relative height measuring device
CN101149252A (en) * 2006-09-22 2008-03-26 株式会社拓普康 Position measuring device, position measuring method and position measuring program
JP2009236849A (en) * 2008-03-28 2009-10-15 Honda Motor Co Ltd Work measuring technique
CN101306505A (en) * 2008-06-20 2008-11-19 吴士旭 Method and device of alignment detection and adjustment of conterminous rotation shafts
TW201015046A (en) * 2008-10-08 2010-04-16 Nat Applied Res Laboratoires Method and equipment for measuring a rotating object
CN101561347A (en) * 2009-05-15 2009-10-21 中国科学院上海光学精密机械研究所 Binocular visual axis deviation detection device and method for video glasses
TW201118513A (en) * 2009-07-16 2011-06-01 Asml Netherlands Bv Position calibration of alignment heads in a multi-head alignment system
TW201111739A (en) * 2009-09-18 2011-04-01 Arcs Prec Technology Co Ltd Lens mount for use in measurement device
JP2011185608A (en) * 2010-03-04 2011-09-22 Yamaha Motor Co Ltd Inspection device and inspection method
TW201208219A (en) * 2010-06-07 2012-02-16 Gsi Group Corp Laser processing with oriented sub-arrays
CN101913105A (en) * 2010-08-16 2010-12-15 合肥工业大学 Non-contact three-dimensional optical measuring head and method for in-situ measurement of numerical control machine
TW201231202A (en) * 2011-01-31 2012-08-01 Hong-Long Chen Laser machining mechanism
CN102681483A (en) * 2012-04-16 2012-09-19 大连数控技术研究院 Coordinate system for automatically compensating temperature deformation and tool shape offset

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