TWI488324B - Solar cell, module comprising the same, method of manufacturing the same and method of manufacturing dielectric layer of the same - Google Patents
Solar cell, module comprising the same, method of manufacturing the same and method of manufacturing dielectric layer of the same Download PDFInfo
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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Description
本發明是有關於一種太陽能電池、其模組及其相關的製造方法,特別是指一種矽晶太陽能電池、其模組、其製造方法及其介電層的製造方法。The invention relates to a solar cell, a module thereof and a related manufacturing method thereof, in particular to a twinned solar cell, a module thereof, a manufacturing method thereof and a method for manufacturing the dielectric layer.
在已知的矽晶太陽能電池中,由於其基板的矽材料有懸鍵(dangling bond)存在,進而形成載子的陷阱(trap),導致載子複合速率變大並降低光電轉換效率,因此在現有技術中,會於基板上形成一層由介電材料製成的鈍化層來鈍化基板表面,以減少懸鍵數量,提升光電轉換效率。In the known twinned solar cell, since the germanium material of the substrate has a dangling bond, thereby forming a trap of the carrier, the carrier recombination rate is increased and the photoelectric conversion efficiency is lowered, so In the prior art, a passivation layer made of a dielectric material is formed on the substrate to passivate the surface of the substrate to reduce the number of dangling bonds and improve photoelectric conversion efficiency.
而鈍化層材料例如氮化矽或氧化矽,其中,氧化矽鈍化層通常使用電漿增強化學氣相沉積(PECVD)、原子層沉積(ALD)或高溫熱氧化等方式形成,其中的熱氧化法為先將基板升至900℃以上的高溫,再通入水氣與氧氣進行氧化層的成長。但上述各種方式的缺點為製程速度慢、製程時間較長並導致生產成本較高。此外,上述方式的製程溫度高,例如PECVD可達400℃以上,使電池基板上的射極層(emitter)的摻雜元素容易大量擴散到該氧化矽鈍化層中,從而影響該氧化矽鈍化層的品質與鈍化功能。The passivation layer material is, for example, tantalum nitride or tantalum oxide, wherein the tantalum oxide passivation layer is usually formed by plasma enhanced chemical vapor deposition (PECVD), atomic layer deposition (ALD) or high temperature thermal oxidation, wherein thermal oxidation is performed. The method is to raise the substrate to a high temperature of 900 ° C or higher, and then pass water vapor and oxygen to grow the oxide layer. However, the disadvantages of the above various methods are slow process speed, long process time and high production cost. In addition, the process temperature of the above method is high, for example, PECVD can reach 400 ° C or more, so that the doping element of the emitter layer on the battery substrate is easily diffused into the passivation layer of the yttrium oxide, thereby affecting the passivation layer of the yttrium oxide. The quality and passivation function.
因此,本發明之目的,即在提供一種製程速度快、生產成本較低的太陽能電池的介電層的製造方法及太陽能電池的製造方法。Accordingly, an object of the present invention is to provide a method for producing a dielectric layer of a solar cell having a high process speed and a low production cost, and a method for producing a solar cell.
本發明之另一目的,即在提供一種膜層品質佳、鈍化效果佳、具有良好的光電轉換效率的太陽能電池及其模組。Another object of the present invention is to provide a solar cell and a module thereof which have good film quality, good passivation effect, and good photoelectric conversion efficiency.
於是,本發明太陽能電池的介電層的製造方法,包含:提供一個具有一表面且為半導體材質的基板,以非浸入的方式使該基板的該表面受到一溶液潤溼,加熱該基板,且加熱溫度不小於該溶液的沸點溫度,其中該溶液沸點溫度不大於338℃,使該基板的該表面上受到該溶液潤溼之處形成一介電層,使該介電層上方形成一抗反射層。Therefore, the method for fabricating a dielectric layer of a solar cell of the present invention comprises: providing a substrate having a surface and being made of a semiconductor material, the surface of the substrate being wetted by a solution in a non-immersed manner, and heating the substrate, and The heating temperature is not less than the boiling temperature of the solution, wherein the boiling temperature of the solution is not more than 338 ° C, so that a surface of the substrate is wetted by the solution to form a dielectric layer, so that an anti-reflection is formed above the dielectric layer. Floor.
本發明太陽能電池的製造方法,包含:提供一個具有一表面且為半導體材質的基板,該基板的該表面形成有一射極層,且該基板上還形成有n型或p型的矽半導體材料,移除該矽半導體材料,並使該基板的該表面上餘留一第一溶液。將該基板置放於一加熱環境,該加熱環境達到不小於該第一溶液的沸點溫度,其中該第一溶液沸點溫度不大於338℃,進而使該基板的該表面上餘留有該第一溶液之處形成一介電層,使該介電層上方形成一抗反射層。The method for manufacturing a solar cell of the present invention comprises: providing a substrate having a surface and a semiconductor material, the surface of the substrate is formed with an emitter layer, and an n-type or p-type germanium semiconductor material is further formed on the substrate. The germanium semiconductor material is removed and a first solution remains on the surface of the substrate. The substrate is placed in a heating environment, the heating environment is not less than the boiling temperature of the first solution, wherein the boiling temperature of the first solution is not more than 338 ° C, thereby leaving the first surface of the substrate A dielectric layer is formed at the solution to form an anti-reflective layer over the dielectric layer.
本發明太陽能電池,包含:一第一導電型的基板、一個氧化矽層,及一配置於該基板上的電極。該第一導電型的基板包括一配置於其一表面處的第二導電型的射極層。該氧化矽層位於該基板的該表面上,該氧化矽層中矽原子之2p軌域光譜之正三價與正一價的強度之比值小於1。The solar cell of the present invention comprises: a first conductivity type substrate, a ruthenium oxide layer, and an electrode disposed on the substrate. The substrate of the first conductivity type includes a second conductivity type emitter layer disposed at a surface thereof. The ruthenium oxide layer is on the surface of the substrate, and the ratio of the positive trivalent to the positive monovalent intensity of the 2p orbital spectrum of the ruthenium atom in the ruthenium oxide layer is less than 1.
本發明太陽能電池模組,包含:相對設置的一第一板材與一第二板材、數個如上述的太陽能電池,及一封裝材 。該等太陽能電池相連接並且排列於該第一板材與該第二板材間。該封裝材位於該第一板材及該第二板材間,並包覆在該等太陽能電池周圍。The solar cell module of the present invention comprises: a first plate and a second plate disposed opposite to each other, a plurality of solar cells as described above, and a packaging material . The solar cells are connected and arranged between the first plate and the second plate. The encapsulant is located between the first plate and the second plate and is wrapped around the solar cells.
有關本發明之前述及其他技術內容、特點與功效,在以下配合參考圖式之一個較佳實施例的詳細說明中,將可清楚的呈現。The above and other technical contents, features and advantages of the present invention will be apparent from the following detailed description of the preferred embodiments.
參閱圖1、2,本發明太陽能電池模組之一較佳實施例包含:上下相對設置的一第一板材1與一第二板材2、數個相連接並且排列於該第一板材1與該第二板材2間的太陽能電池3,及一位於該第一板材1及該第二板材2間,並包覆在該等太陽能電池3周圍的封裝材4。此外,亦可採用兩個以上的封裝材4進行太陽能電池之模組封裝。Referring to FIG. 1 and FIG. 2, a preferred embodiment of the solar cell module of the present invention comprises: a first plate 1 and a second plate 2 disposed opposite to each other and connected to the first plate 1 and A solar cell 3 between the second plate 2 and a package 4 between the first plate 1 and the second plate 2 and wrapped around the solar cells 3. In addition, two or more package materials 4 may be used for module packaging of the solar cell.
該第一板材1與該第二板材2在實施上沒有特殊限制,可以使用玻璃或塑膠材質的板材,而且位於電池受光面一側的板材必須為可透光。若為雙面受光之太陽能電池時,則該第一板材1與該第二板材2皆必須為可透光之材質。該封裝材4的材質例如可透光的乙烯醋酸乙烯共聚物(EVA)或其他可用於太陽能電池模組封裝之相關材料。The first plate 1 and the second plate 2 are not particularly limited in implementation, and a plate made of glass or plastic may be used, and the plate on the side of the light receiving surface of the battery must be permeable to light. In the case of a double-sided light-receiving solar cell, both the first plate 1 and the second plate 2 must be permeable to light. The material of the encapsulant 4 is, for example, a light transmissive ethylene vinyl acetate copolymer (EVA) or other related materials that can be used for solar cell module packaging.
該等太陽能電池3透過圖未示出的焊接導線(ribbon)而電連接。該等太陽能電池3的結構都相同,以下僅以其中一個為例而進行說明。The solar cells 3 are electrically connected through soldering wires (not shown). The configurations of the solar cells 3 are the same, and only one of them will be described below as an example.
該太陽能電池3包含:一第一導電型的基板31、一個氧化矽層(SiOx )32、一抗反射層33,以及一配置於該基板 31上的電極34。The solar cell 3 includes a substrate 31 of a first conductivity type, a ruthenium oxide layer (SiO x ) 32, an anti-reflection layer 33, and an electrode 34 disposed on the substrate 31.
本實施例的第一導電型的基板31為矽基板,並包括一配置於其一表面311處的第二導電型的射極層312。該第一導電型與該第二導電型是指半導體材料的導電形式,其中一個為p型,另一個為n型,在本實施例中,是以n型基板31搭配p型射極層312為例,當然,實施時兩者的導電形式可以相反。一般而言,矽摻雜磷可得到n型材料,矽摻雜硼可得到p型材料。The substrate 31 of the first conductivity type of the present embodiment is a germanium substrate and includes a second conductivity type emitter layer 312 disposed on a surface 311 thereof. The first conductivity type and the second conductivity type refer to a conductive form of a semiconductor material, one of which is a p-type and the other of which is an n-type. In the present embodiment, the n-type substrate 31 is matched with the p-type emitter layer 312. As an example, of course, the conductive form of both can be reversed when implemented. In general, yttrium-doped phosphorus provides an n-type material, and yttrium-doped boron provides a p-type material.
本發明的該基板31與該射極層312中的其中一個的材料可以為矽摻雜硼。且該氧化矽層32中的硼平均濃度與該基板31的該表面311下深度10nm處(相當於該射極層312內)的硼平均濃度的比值小於2。由於硼在氧化矽中的溶解度大於在矽中的溶解度,加上以往電池的氧化矽層的製程溫度過高,因此會有相當多的硼進入該氧化矽層中。但本發明的上述比值低於已知電池的上述比值,主要是因為本發明以較低溫的製程製作該氧化矽層32(本發明的製法後續會有說明),因此可以有效地降低該氧化矽層32中的硼含量,進而提升該氧化矽層32的品質與鈍化效果。The material of one of the substrate 31 and the emitter layer 312 of the present invention may be germanium doped boron. The ratio of the average concentration of boron in the yttrium oxide layer 32 to the average concentration of boron at a depth of 10 nm below the surface 311 of the substrate 31 (corresponding to the inside of the emitter layer 312) is less than 2. Since the solubility of boron in cerium oxide is greater than that in cerium, and the process temperature of the cerium oxide layer of the conventional battery is too high, a considerable amount of boron enters the cerium oxide layer. However, the above ratio of the present invention is lower than the above ratio of the known battery, mainly because the present invention produces the yttrium oxide layer 32 in a relatively low temperature process (the method of the present invention will be described later), so that the yttrium oxide can be effectively reduced. The boron content in layer 32 further enhances the quality and passivation of the yttria layer 32.
另一方面,本發明的該基板31與該射極層312中的其中一個的材料可以為矽摻雜磷,而該氧化矽層32中的磷平均濃度與該基板31的該表面311下深度10nm處的磷平均濃度的比值小於0.16,其中由於磷在氧化矽中的溶解度小於在矽中的溶解度,故而使得上述比值小於1。本發明的製程方式同樣可以降低磷進入該氧化矽層32中的比例,本發 明的上述比值低於已知電池的上述比值,進而提升該氧化矽層32的品質與鈍化效果。On the other hand, the material of one of the substrate 31 and the emitter layer 312 of the present invention may be germanium doped phosphorus, and the average concentration of phosphorus in the tantalum oxide layer 32 and the depth of the surface 311 of the substrate 31 The ratio of the average phosphorus concentration at 10 nm is less than 0.16, wherein the above ratio is less than 1 because the solubility of phosphorus in cerium oxide is less than that in cerium. The process of the present invention can also reduce the proportion of phosphorus entering the ruthenium oxide layer 32, The above ratio is lower than the above ratio of the known battery, thereby improving the quality and passivation effect of the ruthenium oxide layer 32.
該氧化矽層32位於該基板31的該表面311上,用於鈍化該表面311,減少懸鍵與載子陷阱的存在,從而幫助降低載子表面複合速率並提升光電轉換效率。本發明之氧化矽層32中矽原子之2p軌域光譜之正三價(Si3+ )與正一價(Si+ )的強度之比值小於1。由於Si3+ 的含量愈多代表懸鍵愈多,而本發明有效降低Si3+ 的含量,表示該氧化矽層32確實達到良好的鈍化效果。而該2p軌域光譜是透過X射線光電子能譜(X-ray photoelectron spectroscopy,XPS)技術所測得。The yttrium oxide layer 32 is located on the surface 311 of the substrate 31 for passivating the surface 311 to reduce the presence of dangling bonds and carrier traps, thereby helping to reduce the surface recombination rate of the carrier and improve the photoelectric conversion efficiency. The ratio of the positive trivalent (Si 3+ ) to the positive monovalent (Si + ) intensity of the 2p orbital spectrum of the germanium atom in the cerium oxide layer 32 of the present invention is less than 1. Since the more the content of Si 3+ represents the more the dangling bonds, the present invention effectively reduces the content of Si 3+ , indicating that the yttrium oxide layer 32 does achieve a good passivation effect. The 2p orbital spectrum is measured by X-ray photoelectron spectroscopy (XPS).
該氧化矽層32的厚度較佳地為0.5nm~10nm,更佳地為1nm~3nm,最佳為1.5nm。該氧化矽層32具有上述厚度可提供較佳的鈍化效果。The thickness of the ruthenium oxide layer 32 is preferably from 0.5 nm to 10 nm, more preferably from 1 nm to 3 nm, most preferably from 1.5 nm. The yttrium oxide layer 32 having the above thickness provides a better passivation effect.
該氧化矽層32中含有硼或磷,這是因為該射極層312中的摻雜元素也會擴散到該氧化矽層32中。此外,該氧化矽層32無可避免地會含有硫、氯、鐵、鈉,而且因為該氧化矽層32的形成方式可以用酸、鹼溶液或無機、有機溶液或其混合物來替換或搭配使用,其中,因受限於這些化學溶液的純淨度無法絕對純淨,通常裡頭會含有較多的硫、氯、鐵、鈉等成份,如此使得氧化矽層32中的硫與氯的濃度會大於50ppm,鐵與鈉的濃度會大於5 ppm。但本實施例以水來潤溼製作時,該氧化矽層32中的硫與氯的濃度皆會小於50ppm,鐵與鈉的濃度皆會小於5 ppm,硫、氯、鐵、 鈉的含量較少,也就是雜質較少,可避免影響該氧化矽層32的品質與鈍化功能。The yttrium oxide layer 32 contains boron or phosphorus because the doping elements in the emitter layer 312 also diffuse into the yttrium oxide layer 32. In addition, the ruthenium oxide layer 32 inevitably contains sulfur, chlorine, iron, sodium, and because the yttrium oxide layer 32 can be formed by using an acid, an alkali solution or an inorganic or organic solution or a mixture thereof. Among them, because the purity of these chemical solutions is not absolutely pure, usually there will be more sulfur, chlorine, iron, sodium and other components, so that the concentration of sulfur and chlorine in the yttrium oxide layer 32 will be greater than 50ppm. The concentration of iron and sodium will be greater than 5 ppm. However, when the present embodiment is wetted with water, the concentration of sulfur and chlorine in the ruthenium oxide layer 32 will be less than 50 ppm, and the concentration of iron and sodium will be less than 5 ppm, sulfur, chlorine, iron, The content of sodium is small, that is, the impurities are less, and the quality and passivation function of the ruthenium oxide layer 32 can be avoided.
補充說明,本實施例的該基板31的該表面311是指受光的一面,該氧化矽層32配置在該射極層312上,也就是在該受光面上,但不需以此為限。該氧化矽層32也可以配置於該基板31的背面,或者可以同時配置於該受光面與該背面。另外,本發明的氧化矽層32的設計,也可以應用於雙面入光的電池上。In addition, the surface 311 of the substrate 31 of the present embodiment refers to a light receiving surface, and the yttrium oxide layer 32 is disposed on the emitter layer 312, that is, on the light receiving surface, but is not limited thereto. The ruthenium oxide layer 32 may be disposed on the back surface of the substrate 31 or may be disposed on the light receiving surface and the back surface at the same time. In addition, the design of the ruthenium oxide layer 32 of the present invention can also be applied to a double-sided light-emitting battery.
該抗反射層33配置於該氧化矽層32上,該抗反射層33的材料包含氮化矽(SiNx ),也可以與該氧化矽層32配合以鈍化、修補該基板31的表面311,尤其是該氧化矽層32的厚度夠薄時,例如1.5nm時,該氮化矽的抗反射層33中的氫(H)可穿透該氧化矽層32而對該表面311產生鈍化效果。亦即,該抗反射層33除了具有抗反射功能、幫助提升光線入射量以外,亦可具有鈍化的效果。較佳地,該抗反射層33的厚度為45nm~95nm。The anti-reflective layer 33 is disposed on the yttrium oxide layer 32. The material of the anti-reflective layer 33 includes tantalum nitride (SiN x ), and may also cooperate with the yttrium oxide layer 32 to passivate and repair the surface 311 of the substrate 31. In particular, when the thickness of the yttria layer 32 is sufficiently thin, for example, at 1.5 nm, hydrogen (H) in the anti-reflective layer 33 of the tantalum nitride can penetrate the yttrium oxide layer 32 to impart a passivation effect to the surface 311. That is, the anti-reflection layer 33 has an anti-reflection function and helps to increase the incident amount of light, and may have a passivation effect. Preferably, the anti-reflection layer 33 has a thickness of 45 nm to 95 nm.
本實施例的電極34可包括一穿過該抗反射層33與該氧化矽層32而電連接該基板31的該表面311的第一電極部341,及一配置於該基板31的背面的第二電極部342。該電極34的功能在於將電池產生的電能傳輸到外部。The electrode 34 of the present embodiment may include a first electrode portion 341 electrically connected to the surface 311 of the substrate 31 through the anti-reflection layer 33 and the yttria layer 32, and a first surface disposed on the back surface of the substrate 31. Two electrode portions 342. The function of the electrode 34 is to transfer the electrical energy generated by the battery to the outside.
參閱圖3、4、5,本發明太陽能電池的製造方法之一較佳實施例包含:Referring to Figures 3, 4 and 5, a preferred embodiment of the method of fabricating a solar cell of the present invention comprises:
(1)步驟61:提供該具有該表面311的基板31,接著藉由磷或硼的擴散製程於該表面311處形成該射極層312,在 此同時,該基板31除了該表面311以外的其它表面處也會因為擴散製程而形成有n型或p型的矽半導體材料35,該矽半導體材料35的導電性與材料皆與該射極層312相同,該矽半導體材料35通常為n型的磷矽玻璃(PSG)或p型的硼矽玻璃(BSG)。一般而言,該基板31的背面僅會在靠近周圍處才會有該矽半導體材料35的存在,此端視所採用之擴散製程與設備而定。(1) Step 61: providing the substrate 31 having the surface 311, and then forming the emitter layer 312 at the surface 311 by a diffusion process of phosphorus or boron, At the same time, the surface of the substrate 31 other than the surface 311 is formed with an n-type or p-type germanium semiconductor material 35 due to a diffusion process, and the conductivity and material of the germanium semiconductor material 35 are combined with the emitter layer. Similarly to 312, the germanium semiconductor material 35 is typically n-type phosphorous glass (PSG) or p-type boron germanium glass (BSG). In general, the back side of the substrate 31 will only have the germanium semiconductor material 35 near the periphery, depending on the diffusion process and equipment used.
(2)步驟62:移除該矽半導體材料35,本步驟又稱為絕緣(isolation)製程,主要是以HF、NH4 F或其混合物等溶液溼蝕刻以移除該矽半導體材料35。由於isolation製程為已知技術,且非本發明的改良重點,所以不再詳述。接著以一第一溶液清洗該基板31,使該表面311上餘留該第一溶液,該第一溶液可包含水、去離子水(DI Water)與其他可供清洗之用的溶液之任一者。該第一溶液可選自於水(包含DI Water)、過氧化氫溶液、硝酸溶液、硫酸溶液、磷酸溶液、氫化氨溶液、鹽酸溶液、臭氧溶液、硼酸溶液、乙酸溶液,及此等之一組合所構成之群組。本實施例是以水清洗該基板31。該第一溶液的沸點溫度不大於338℃。(2) Step 62: Removing the germanium semiconductor material 35, this step is also referred to as an isolation process, and is mainly wet etching with a solution of HF, NH 4 F or a mixture thereof to remove the germanium semiconductor material 35. Since the isolation process is a known technique and is not an improvement of the present invention, it will not be described in detail. Then, the substrate 31 is washed with a first solution, and the first solution is left on the surface 311. The first solution may include water, deionized water (DI Water) and other solutions for cleaning. By. The first solution may be selected from the group consisting of water (including DI Water), hydrogen peroxide solution, nitric acid solution, sulfuric acid solution, phosphoric acid solution, hydrogenated ammonia solution, hydrochloric acid solution, ozone solution, boric acid solution, acetic acid solution, and the like. The group formed by the combination. This embodiment washes the substrate 31 with water. The boiling point temperature of the first solution is not more than 338 °C.
(3)步驟63:將該基板31置放於一加熱環境中,於本實施例中,該加熱環境藉由提供一加熱載具5來實施,也就是將該基板31置放於該加熱載具5上,該加熱載具5例如一加熱器或其他具有加熱功能之類似儀器或設備,且該加熱載具5前側表面具有一螢幕51、至少一溫度控制件52等設計。該基板31是置於該加熱器的一加熱板或一加熱平台 上。本實施例在置放該基板31之前,該加熱載具5已事先預熱到100℃或高於100℃,也就是預熱達到不小於該表面311上餘留的該第一溶液(本實施例為水)的沸點溫度。當然,若採用來清洗與潤濕的該第一溶液不同時,其沸點溫度即會有差異,例如使用純硫酸時,其沸點溫度為338℃,故加熱溫度亦得達到338℃。(3) Step 63: The substrate 31 is placed in a heating environment. In this embodiment, the heating environment is implemented by providing a heating carrier 5, that is, the substrate 31 is placed on the heating load. The heating carrier 5 is, for example, a heater or other similar instrument or device having a heating function, and the front surface of the heating carrier 5 has a screen 51, at least one temperature control member 52, and the like. The substrate 31 is a heating plate or a heating platform placed on the heater on. In this embodiment, before the substrate 31 is placed, the heating carrier 5 has been preheated to 100 ° C or higher, that is, the preheating is not less than the first solution remaining on the surface 311 (this embodiment) For example, the boiling temperature of water). Of course, if the first solution used for cleaning and wetting is different, the boiling temperature will be different. For example, when pure sulfuric acid is used, the boiling temperature is 338 ° C, so the heating temperature is also 338 ° C.
預熱該加熱載具5有助於以較均勻的溫度烘烤該基板31,透過此加熱烘烤的方式,使該表面311氧化,進而使該表面311上餘留有該第一溶液之處形成一介電層,該介電層的類型包含有氧化層,例如上述文中提及之該氧化矽層32。在本實施例中,加熱該基板31的時間約為2分鐘左右。接著使該基板31降溫後再自該加熱載具5上取下該基板31。Preheating the heating carrier 5 helps to bake the substrate 31 at a relatively uniform temperature, and the surface 311 is oxidized by means of the heat baking, so that the first solution remains on the surface 311. A dielectric layer is formed, the type of dielectric layer comprising an oxide layer, such as the yttria layer 32 mentioned above. In the present embodiment, the time for heating the substrate 31 is about 2 minutes. Then, the substrate 31 is cooled, and then the substrate 31 is removed from the heating carrier 5.
另外,上述該基板31置放於該加熱載具5上時,可採直接接觸加熱,或是間接加熱之方式,例如該加熱載具5上可設置一些頂撐元件(圖未示),透過該些頂撐元件頂起該基板31以進行隔空加熱。當然,在熱源之選擇上,亦可採用烘烤、UV燈、紅外線燈或/及熱風等熱源作為加熱時的同步搭配使用。In addition, when the substrate 31 is placed on the heating carrier 5, it may be directly contacted with heating or indirectly heated. For example, the heating carrier 5 may be provided with some top supporting members (not shown). The top support members jack up the substrate 31 for air heating. Of course, in the selection of the heat source, a heat source such as baking, UV lamp, infrared lamp or/and hot air can also be used as a synchronous combination for heating.
(4)步驟64:利用PECVD鍍膜等方式於該氧化矽層32上沉積該抗反射層33,再以網印或真空鍍膜等方式形成該電極34。(4) Step 64: depositing the anti-reflection layer 33 on the ruthenium oxide layer 32 by means of PECVD plating or the like, and forming the electrode 34 by screen printing or vacuum plating.
進一步地,在該基板31置於該加熱載具5上之前,還可先以非浸入的方式於該基板31的該表面311提供一含有 水分的第二溶液,以使該表面311潤溼。該非浸入的方式包含以噴灑與塗佈之任一方式使該表面311受到該第二溶液潤溼,該非浸入的方式是指該基板31並非完全浸泡在該第二溶液中。該第二溶液可以與該第一溶液相同或不同,該第二溶液可選自於水(包含DI Water)、過氧化氫溶液、硝酸溶液、硫酸溶液、磷酸溶液、氫化氨溶液、鹽酸溶液、臭氧溶液、硼酸溶液、乙酸溶液,及此等之一組合所構成之群組,且該第二溶液的沸點溫度不大於338℃。透過此步驟讓該基板31的該表面311更加潤溼,上述的酸性溶液或水的覆蓋,有助於幫助該表面311氧化以形成該氧化矽層32(即介電層)。Further, before the substrate 31 is placed on the heating carrier 5, a surface of the substrate 31 may be provided in a non-immersed manner. A second solution of moisture is used to wet the surface 311. The non-immersing means comprises wetting the surface 311 by the second solution in any manner of spraying and coating, the non-immersing means that the substrate 31 is not completely immersed in the second solution. The second solution may be the same as or different from the first solution, and the second solution may be selected from the group consisting of water (including DI Water), hydrogen peroxide solution, nitric acid solution, sulfuric acid solution, phosphoric acid solution, hydrogenated ammonia solution, hydrochloric acid solution, An ozone solution, a boric acid solution, an acetic acid solution, and a combination of the above, and the second solution has a boiling temperature of not more than 338 °C. By this step, the surface 311 of the substrate 31 is more wetted, and the above-mentioned acidic solution or water coverage helps to oxidize the surface 311 to form the yttrium oxide layer 32 (i.e., the dielectric layer).
此外,上述以非浸入的方式於該表面311提供含有水分的第二溶液的步驟,也可以在該基板31置放於該加熱載具5上之後再進行,也就是說,當該基板31受到加熱或烘烤的同時,可再於該表面311上噴灑或塗佈該第二溶液。另外,也可以在該基板31置放於該加熱載具5上加熱之前與之後,都以非浸入的方式於該表面311提供該第二溶液。或可於該基板31置放於該加熱載具5上加熱之前與之後皆採用浸入之方式來施予該第二溶液。抑或是,該基板31於上述之置放前後可分別採用浸入/非浸入或是非浸入/浸入之方式來選擇性搭配提供該第二溶液。In addition, the step of providing the second solution containing moisture on the surface 311 in a non-immersing manner may be performed after the substrate 31 is placed on the heating carrier 5, that is, when the substrate 31 is subjected to The second solution may be sprayed or coated on the surface 311 while being heated or baked. Alternatively, the second solution may be provided on the surface 311 in a non-immersed manner before and after the substrate 31 is placed on the heating carrier 5. Alternatively, the second solution may be applied by immersion before and after the substrate 31 is placed on the heating carrier 5. Alternatively, the substrate 31 can be selectively provided with the second solution by immersion/non-immersion or non-immersion/immersion before and after the placement.
補充說明的是,由於本發明實施時該氧化矽層32可以鄰近電池的受光面而配置,也可以配置於背面,或者同時配置於該受光面與該背面。因此製造時,可依設計需求而 於該基板31上需要潤溼的任何表面上使該第一溶液殘留以及利用該第二溶液潤溼,以在預定處形成氧化矽層32。雖然本實施例的第一溶液的功能為清洗該基板31,但透過使該第一溶液殘留於該基板31上,亦具有潤溼該基板31的功能。It should be noted that, in the implementation of the present invention, the ruthenium oxide layer 32 may be disposed adjacent to the light-receiving surface of the battery, may be disposed on the back surface, or may be disposed on the light-receiving surface and the back surface. Therefore, when manufacturing, it can be designed according to the needs. The first solution remains and is wetted with the second solution on any surface of the substrate 31 that needs to be wetted to form a ruthenium oxide layer 32 at a predetermined location. Although the function of the first solution of the present embodiment is to clean the substrate 31, the first solution remains on the substrate 31 to have the function of wetting the substrate 31.
本發明太陽能電池的介電層的製造方法之一較佳實施例,實際上就是用於製造該氧化矽層32,在此再針對本發明的介電層製法作一總結。該方法包含以下步驟:提供具有該表面311的該基板31,以非浸入的方式使該基板31的該表面311受到一溶液潤溼,並加熱該基板31,且加熱溫度不小於該溶液的沸點溫度,且該溶液沸點溫度不大於338℃。此步驟可幫助溶液與該表面311反應,使該表面311上受到該溶液潤溼之處氧化而形成該氧化矽層32(即介電層)。在此該溶液可以是指該第一溶液或該第二溶液,但不限於此,只要是能用於潤溼該基板311的溶液即可。而用於潤溼該基板31的該溶液種類可以為上述所列舉的該第一溶液的種類。A preferred embodiment of the method of fabricating a dielectric layer for a solar cell of the present invention is actually used to fabricate the hafnium oxide layer 32, and a summary of the dielectric layer process of the present invention is further provided herein. The method comprises the steps of: providing the substrate 31 having the surface 311, moisturizing the surface 311 of the substrate 31 with a solution in a non-immersed manner, and heating the substrate 31, and the heating temperature is not less than the boiling point of the solution. Temperature, and the boiling temperature of the solution is not more than 338 °C. This step assists in the reaction of the solution with the surface 311 to oxidize the surface 311 where it is wetted to form the yttria layer 32 (i.e., the dielectric layer). Here, the solution may refer to the first solution or the second solution, but is not limited thereto, as long as it is a solution which can be used to wet the substrate 311. The type of the solution used to wet the substrate 31 may be the kind of the first solution listed above.
進一步說明:潤溼步驟與加熱步驟的先後順序不必限定,可以先使該基板31的該表面311受到該溶液潤溼後,再加熱該基板31。另一方面,也可以先加熱該基板31,再使該表面311受到該溶液潤溼。加熱該基板31時,可以先預熱該加熱載具5,使該加熱載具5的溫度不小於該溶液的沸點溫度,再將該基板31置放於該加熱載具5上進行加熱。當然,也可以在該加熱載具5尚未達到該溶液的沸點溫 度時就置放該基板31,而最後的加熱溫度仍須不小於該溶液的沸點溫度。此外,該加熱載具5不一定要先預熱,也可以將該基板31置於該加熱載具5上之後再加熱。由上述說明可知,本發明將該基板31置放於該加熱載具5上進行加熱的動作,可在該加熱載具5的溫度不小於該溶液的沸點溫度之前或之後進行。Further, the order of the wetting step and the heating step is not limited, and the surface 31 of the substrate 31 may be wetted by the solution before the substrate 31 is heated. Alternatively, the substrate 31 may be heated first, and the surface 311 may be wetted by the solution. When the substrate 31 is heated, the heating carrier 5 may be preheated so that the temperature of the heating carrier 5 is not less than the boiling temperature of the solution, and the substrate 31 is placed on the heating carrier 5 for heating. Of course, it is also possible that the heating carrier 5 has not reached the boiling temperature of the solution. The substrate 31 is placed at a time, and the final heating temperature is still not less than the boiling temperature of the solution. Further, the heating carrier 5 does not have to be preheated first, and the substrate 31 may be placed on the heating carrier 5 and then heated. As apparent from the above description, the operation of placing the substrate 31 on the heating carrier 5 for heating can be performed before or after the temperature of the heating carrier 5 is not less than the boiling temperature of the solution.
值得一提的是,以成長1.5nm的氧化矽層32為例,利用PECVD、ALD及熱氧化法(需使用900℃以上的高溫)所需的時間包含升降溫度分別為30分鐘、90分鐘與60分鐘左右,而利用本發明的加熱烘烤方式只需要數分鐘,例如小於5分鐘即可,有效地縮短製程時間並可降低生產成本,而且製程步驟簡單方便。本發明的加熱烘烤溫度僅需要等於或大於水或其它潤溼溶液的沸點溫度即可,因此製程溫度低,可以降低該射極層312的摻雜元素擴散到該氧化矽層32中的比例,同時降低該氧化矽層32中的其它雜質的比例,從而製作出品質佳、鈍化效果佳的氧化矽層32,並能提升電池的光電轉換效率。It is worth mentioning that the time required for PECVD, ALD, and thermal oxidation (using a high temperature of 900 ° C or higher) using a 1.5 nm ruthenium oxide layer 32 includes a rise and fall temperature of 30 minutes and 90 minutes, respectively. The heating and baking method of the present invention takes only about several minutes, for example, less than 5 minutes, which can effectively shorten the processing time and reduce the production cost, and the process steps are simple and convenient. The heating and baking temperature of the present invention only needs to be equal to or greater than the boiling temperature of water or other wetting solution, so that the process temperature is low, and the proportion of the doping element of the emitter layer 312 diffusing into the yttrium oxide layer 32 can be lowered. At the same time, the proportion of other impurities in the yttrium oxide layer 32 is lowered, thereby producing a yttrium oxide layer 32 of good quality and good passivation effect, and the photoelectric conversion efficiency of the battery can be improved.
惟以上所述者,僅為本發明之較佳實施例而已,當不能以此限定本發明實施之範圍,即大凡依本發明申請專利範圍及發明說明內容所作之簡單的等效變化與修飾,皆仍屬本發明專利涵蓋之範圍內。The above is only the preferred embodiment of the present invention, and the scope of the invention is not limited thereto, that is, the simple equivalent changes and modifications made by the scope of the invention and the description of the invention are All remain within the scope of the invention patent.
1‧‧‧第一板材1‧‧‧ first plate
2‧‧‧第二板材2‧‧‧Second plate
3‧‧‧太陽能電池3‧‧‧Solar battery
31‧‧‧基板31‧‧‧Substrate
311‧‧‧表面311‧‧‧ surface
312‧‧‧射極層312‧‧ ‧ emitter layer
32‧‧‧氧化矽層32‧‧‧Oxide layer
33‧‧‧抗反射層33‧‧‧Anti-reflective layer
34‧‧‧電極34‧‧‧ electrodes
341‧‧‧第一電極部341‧‧‧First electrode section
342‧‧‧第二電極部342‧‧‧Second electrode
35‧‧‧矽半導體材料35‧‧‧矽 Semiconductor materials
4‧‧‧封裝材4‧‧‧Package
5‧‧‧加熱載具5‧‧‧heating vehicle
51‧‧‧螢幕51‧‧‧ screen
52‧‧‧溫度控制件52‧‧‧temperature control
61~64‧‧‧步驟61~64‧‧‧Steps
圖1是一局部的剖視示意圖,顯示本發明太陽能電池模組之一較佳實施例; 圖2是該太陽能電池模組的一太陽能電池的示意圖;圖3是本發明太陽能電池的製造方法的一較佳實施例的步驟流程方塊圖;圖4是該製造方法的各步驟的流程示意圖;及圖5是該製造方法中將一基板置於一加熱載具上的示意圖。1 is a partial cross-sectional view showing a preferred embodiment of the solar cell module of the present invention; 2 is a schematic diagram of a solar cell of the solar cell module; FIG. 3 is a block flow diagram of a preferred embodiment of the method for fabricating the solar cell of the present invention; and FIG. 4 is a schematic flow chart of each step of the manufacturing method; And FIG. 5 is a schematic view showing a substrate placed on a heating carrier in the manufacturing method.
61~64‧‧‧步驟61~64‧‧‧Steps
Claims (13)
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US20060121695A1 (en) * | 2002-03-08 | 2006-06-08 | Matsushita Electric Industrial Co., Ltd. | Method for manufacturing semiconductor thin film |
TWM355461U (en) * | 2008-12-09 | 2009-04-21 | Ind Tech Res Inst | Solar cell |
TW201214743A (en) * | 2010-07-29 | 2012-04-01 | Hikaru Kobayashi | Solar cell and process for production thereof, and solar cell production device |
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US20060121695A1 (en) * | 2002-03-08 | 2006-06-08 | Matsushita Electric Industrial Co., Ltd. | Method for manufacturing semiconductor thin film |
TWM355461U (en) * | 2008-12-09 | 2009-04-21 | Ind Tech Res Inst | Solar cell |
TW201214743A (en) * | 2010-07-29 | 2012-04-01 | Hikaru Kobayashi | Solar cell and process for production thereof, and solar cell production device |
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