TWI483547B - Capacitance sensing circuit with anti-electromagnetic capability - Google Patents

Capacitance sensing circuit with anti-electromagnetic capability Download PDF

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TWI483547B
TWI483547B TW099134517A TW99134517A TWI483547B TW I483547 B TWI483547 B TW I483547B TW 099134517 A TW099134517 A TW 099134517A TW 99134517 A TW99134517 A TW 99134517A TW I483547 B TWI483547 B TW I483547B
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switch
coupled
capacitor
output
signal
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TW099134517A
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TW201114179A (en
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Sitronix Technology Corp
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605Measuring capacitance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/12Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
    • G01D5/14Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
    • G01D5/24Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying capacitance
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K2217/00Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/94Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
    • H03K2217/96Touch switches
    • H03K2217/9607Capacitive touch switches
    • H03K2217/960705Safety of capacitive touch and proximity switches, e.g. increasing reliability, fail-safe

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Electronic Switches (AREA)

Description

具抗電磁干擾能力之電容感測電路 Capacitive sensing circuit with anti-electromagnetic interference capability

本發明係有關於一種電容感應電路,其係尤指一種具抗電磁干擾能力之電容感測電路。 The invention relates to a capacitance sensing circuit, in particular to a capacitance sensing circuit with electromagnetic interference resistance.

按,由於現今電腦科技的發展對於電容感應偵測的應用日驅廣泛,例如指紋辨識、微機電加速感測器以及電容式觸控面板,而在傳統電容感應偵測技術上普遍使用電容對頻率轉換的電路,請一併參閱第一圖,係為習知技術之電容感測裝置之方塊圖。如圖所示,此習知技術係透過一第一比較器100’、一第二比較器102’、一控制電路104’以及一電阻106’形成一振盪電路,該振盪電路耦接一待測電容108’,並利用該待測電容108’的電容值大小差異而產生不同的振盪頻率,且依據不同之振盪頻率而得知該待測電容108’的電容值大小,以達到電容偵測的目的。 According to the development of computer technology, the application of capacitive sensing is widely used, such as fingerprint identification, MEMS accelerometers and capacitive touch panels. Capacitance vs. frequency is commonly used in traditional capacitive sensing technology. For the circuit to be converted, please refer to the first figure, which is a block diagram of a conventional capacitive sensing device. As shown in the figure, the prior art is configured to form an oscillating circuit through a first comparator 100', a second comparator 102', a control circuit 104', and a resistor 106'. The oscillating circuit is coupled to a test unit. Capacitor 108', and using the difference in capacitance value of the capacitor 108' to be tested, different oscillation frequencies are generated, and the capacitance value of the capacitor 108' to be tested is known according to different oscillation frequencies to achieve capacitance detection. purpose.

再者,請一併參閱第二圖,係為習知技術之另一電容感測裝置之方塊圖。如圖所示,此習知技術係透過一定電流源200’、一第一控制開關201’、一第二控制開關202’、一積分電容203’以及一比較器204’以形成一固定斜率產生電路,該固定斜率產生電路耦接一待測電容205’,並利用待測電容205’的電容值的不同而起始電壓不同,使比較器204’的致能時間不同,以達到電容偵測的目的。 Furthermore, please refer to the second figure together as a block diagram of another capacitive sensing device of the prior art. As shown, the prior art generates a fixed slope by forming a fixed current source 200', a first control switch 201', a second control switch 202', an integrating capacitor 203', and a comparator 204'. The circuit, the fixed slope generating circuit is coupled to a capacitor 205' to be tested, and uses different capacitance values of the capacitor 205' to be tested, and the starting voltage is different, so that the enabling time of the comparator 204' is different to achieve capacitance detection. the goal of.

另,請一併參閱第三圖,係為習知技術之另一電容感測裝置 之方塊圖。如圖所示,此習知技術係透過複數緩衝器300’、一頻率相位偵測器301’、一控制單元302’、與一可控制緩衝器303’形成一生成時間對數位轉換器。該生成時間對數位轉換器耦接一待測電容304’,並生成時間對數位轉換器係利用待測電容304’之電容值大小的不同而導致控制單元302’輸出之控制訊號的時間差異,以達到電容偵測之目的。 In addition, please refer to the third figure together, which is another capacitive sensing device of the prior art. Block diagram. As shown, the prior art technique forms a generation time-to-digital converter through a complex buffer 300', a frequency phase detector 301', a control unit 302', and a controllable buffer 303'. The generation time-to-digital converter is coupled to a capacitor 304 to be tested, and generates a time-to-digital converter that utilizes a difference in the magnitude of the capacitance of the capacitor 304 to be tested to cause a time difference of the control signal output by the control unit 302'. To achieve the purpose of capacitance detection.

惟查,上述第一圖至第三圖之技術並無對電磁干擾有免疫能力,尤其是電容感測器之應用普遍需結合微處理器等周邊電路進行運用,當電磁雜訊從電容耦合至比較器,振盪頻率將出現失真,抑或是導致起始電壓失準,以致對電容之偵測產生錯誤,上述電路並對電容的偵測較耗費時脈週期等缺點。 However, the techniques in the above first to third figures are not immune to electromagnetic interference. In particular, the application of capacitive sensors generally needs to be combined with peripheral circuits such as microprocessors. When electromagnetic noise is capacitively coupled to In the comparator, the oscillation frequency will be distorted, or the initial voltage will be misaligned, so that the detection of the capacitance is wrong. The above circuit and the detection of the capacitance are more complicated than the clock cycle.

因此,如何針對上述問題而提出一種新穎具抗電磁干擾能力之電容感應電路,其可避免因電磁雜訊而影響電容感應電路的效能,使可解決上述之問題。 Therefore, how to solve the above problems and propose a novel capacitive sensing circuit with anti-electromagnetic interference capability, which can avoid the influence of electromagnetic noise on the performance of the capacitive sensing circuit, so that the above problems can be solved.

本發明之目的之一,在於提供一種具抗電磁干擾能力之電容感測電路,其藉由一差分電路消除共模雜訊,以達到抗電磁干擾的能力。 One of the objects of the present invention is to provide a capacitive sensing circuit with electromagnetic interference resistance, which eliminates common mode noise by a differential circuit to achieve electromagnetic interference resistance.

本發明之目的之一,在於提供一種具抗電磁干擾能力之電容感測電路,其藉由動態範圍調整一濾波器的輸出,使電容感測電路具低耗費時脈週期數的特性。 One of the objects of the present invention is to provide a capacitance sensing circuit with electromagnetic interference resistance, which adjusts the output of a filter by dynamic range, so that the capacitance sensing circuit has the characteristics of low time-consuming pulse period.

本發明之目的之一,在於提供一種具抗電磁干擾能力之電容感測電路,其藉由一第五開關與一第六開關而消除待測電容之寄生電容的影響,進而增加電容感測電路之待測電容的動態量測範圍。 One of the objectives of the present invention is to provide a capacitive sensing circuit with electromagnetic interference resistance, which eliminates the influence of the parasitic capacitance of the capacitor to be tested by a fifth switch and a sixth switch, thereby increasing the capacitance sensing circuit. The dynamic measurement range of the capacitor to be tested.

本發明之具抗電磁干擾能力之電容感測電路包含一濾波器與一差分電路。濾波器耦接一待測電容,並接收複數參考訊號而產生一第一濾波訊號與一第二濾波訊號,以及差分電路接收第一濾波訊號與第二濾波訊號,並消除第一濾波訊號第二濾波訊號之共模雜訊而產生一差分訊號,差分訊號之大小相關於待測電容之大小,而達到待測電容偵測的目的。並藉由差分電路消除共模雜訊,以達到抗電磁干擾的能力,且差分電路可動態範圍調整濾波器的輸出,使電容感測電路具低耗費時脈週期數的特性。 The capacitive sensing circuit with electromagnetic interference resistance of the present invention comprises a filter and a differential circuit. The filter is coupled to a capacitor to be tested, and receives a plurality of reference signals to generate a first filtered signal and a second filtered signal, and the differential circuit receives the first filtered signal and the second filtered signal, and eliminates the first filtered signal. The common mode noise of the filtered signal generates a differential signal, and the magnitude of the differential signal is related to the size of the capacitor to be tested, and achieves the purpose of detecting the capacitance to be tested. The common mode noise is eliminated by the differential circuit to achieve the capability of resisting electromagnetic interference, and the differential circuit can adjust the output of the filter in a dynamic range, so that the capacitance sensing circuit has the characteristics of low time-consuming pulse period.

習知技術: Conventional technology:

100’‧‧‧第一比較器 100’‧‧‧First comparator

102’‧‧‧第二比較器 102’‧‧‧Second comparator

104’‧‧‧控制電路 104'‧‧‧Control circuit

106’‧‧‧電阻 106’‧‧‧Resistance

108’‧‧‧待測電容 108’‧‧‧Measured capacitance

200’‧‧‧定電流源 200'‧‧‧ constant current source

201’‧‧‧第一控制開關 201’‧‧‧First control switch

202’‧‧‧第二控制開關 202’‧‧‧Second control switch

203’‧‧‧積分電容 203'‧‧‧Integral Capacitance

204’‧‧‧比較器 204'‧‧‧ comparator

205’‧‧‧待測電容 205’‧‧‧Measured capacitance

300’‧‧‧複數緩衝器 300’‧‧‧Multiple buffers

301’‧‧‧頻率相位偵測器 301’‧‧‧ Frequency Phase Detector

302’‧‧‧控制單元 302’‧‧‧Control unit

303’‧‧‧可控制緩衝器 303'‧‧‧Controllable buffer

304’‧‧‧待測電容 304'‧‧‧Measured capacitance

本發明: this invention:

10‧‧‧濾波器 10‧‧‧ filter

11‧‧‧開關模組 11‧‧‧Switch Module

120‧‧‧第一開關 120‧‧‧First switch

122‧‧‧第二開關 122‧‧‧Second switch

124‧‧‧第三開關 124‧‧‧third switch

126‧‧‧第四開關 126‧‧‧fourth switch

14‧‧‧第一輸出電容 14‧‧‧First output capacitor

16‧‧‧第一輸出開關 16‧‧‧First output switch

18‧‧‧第二輸出電容 18‧‧‧second output capacitor

19‧‧‧第二輸出開關 19‧‧‧Second output switch

20‧‧‧差分電路 20‧‧‧Differential circuit

30‧‧‧待測電容 30‧‧‧Measured capacitance

32‧‧‧寄生電容 32‧‧‧Parasitic capacitance

40‧‧‧放大器 40‧‧‧Amplifier

50‧‧‧放大器 50‧‧‧Amplifier

60‧‧‧第五開關 60‧‧‧ fifth switch

62‧‧‧第六開關 62‧‧‧ sixth switch

第一圖係為習知技術之電容感測裝置之方塊圖;第二圖係為習知技術之另一電容感測裝置之方塊圖;第三圖係為習知技術之另一電容感測裝置之方塊圖;第四圖係為本發明之一較佳實施例之電容感測電路的方塊圖;第五圖係為第四圖之一較佳實施例之濾波器的電路圖;第六圖係為本發明之一較佳實施例之電容感測電路之輸出波形圖;第七A圖係為本發明之一較佳實施例之開關控制的時序圖;第七B圖係為本發明之另一較佳實施例之開關控制的時序圖;第八圖係為本發明之另一較佳實施例之濾波器的電路圖;第九圖係為本發明之另一較佳實施例之濾波器的電路圖;第十A圖係為本發明之一較佳實施例之第九圖的時序圖;第十B圖係為本發明之另一較佳實施例之第九圖的時序圖;第十C圖係為本發明之另一較佳實施例之第九圖的時序圖;第十D圖係為本發明之另一較佳實施例之第九圖的時序圖;以及 第十一圖係為本發明之另一較佳實施例之濾波器的電路圖。 The first figure is a block diagram of a conventional capacitive sensing device; the second figure is a block diagram of another capacitive sensing device of the prior art; and the third figure is another capacitive sensing of the prior art. 4 is a block diagram of a capacitive sensing circuit according to a preferred embodiment of the present invention; and FIG. 5 is a circuit diagram of a filter of a preferred embodiment of the fourth embodiment; The output waveform diagram of the capacitance sensing circuit of a preferred embodiment of the present invention; the seventh diagram is a timing diagram of the switch control according to a preferred embodiment of the present invention; and the seventh diagram is the present invention. A timing diagram of a switch control of another preferred embodiment; an eighth diagram is a circuit diagram of a filter according to another preferred embodiment of the present invention; and a ninth diagram is a filter of another preferred embodiment of the present invention. 10A is a timing diagram of a ninth diagram of a preferred embodiment of the present invention; and a tenth diagram is a timing diagram of a ninth diagram of another preferred embodiment of the present invention; Figure C is a timing diagram of a ninth diagram of another preferred embodiment of the present invention; The timing diagram of a ninth preferred embodiment according to FIG.; And Figure 11 is a circuit diagram of a filter of another preferred embodiment of the present invention.

茲為使 貴審查委員對本發明之結構特徵及所達成之功效有更進一步之瞭解與認識,謹佐以較佳之實施例及配合詳細之說明,說明如後:請參閱第四圖,係為本發明之一較佳實施例之電容感測電路的方塊圖。如圖所示,本發明之具抗電磁干擾能力之電容感測電路係可應用於指紋辨識、加速感測器與觸控面板等。該電容感測電路包含一濾波器10與一差分電路20。濾波器10耦接一待測電容30,並濾波器10接收複數參考訊號而產生一第一濾波訊號與一第二濾波訊號,即濾波器10接收一第一參考訊號VREF1、一第二參考訊號VREF2、一第三參考訊號VREF3與一第四參考訊號VREF4,而產生第一濾波訊號與第二濾波訊號,其中,本發明之濾波器10的一較佳實施例為一有限脈衝響應濾波器(Finite Impulse Response,FIR)。 In order to provide a better understanding and understanding of the structural features and the efficacies of the present invention, please refer to the preferred embodiment and the detailed description, as explained below: please refer to the fourth figure. A block diagram of a capacitive sensing circuit in accordance with a preferred embodiment of the invention. As shown in the figure, the capacitive sensing circuit with electromagnetic interference resistance of the present invention can be applied to fingerprint recognition, acceleration sensors and touch panels. The capacitance sensing circuit includes a filter 10 and a differential circuit 20. The filter 10 is coupled to a capacitor 30 to be tested, and the filter 10 receives a plurality of reference signals to generate a first filtered signal and a second filtered signal. The filter 10 receives a first reference signal V REF1 and a second reference. A first filtered signal and a second filtered signal are generated by the signal V REF2 , a third reference signal V REF3 and a fourth reference signal V REF4 , wherein a preferred embodiment of the filter 10 of the present invention is a finite pulse Response Filter (Finite Impulse Response, FIR).

差分電路20係接收第一濾波訊號與第二濾波訊號,並差分電路20可消除第一濾波訊號第二濾波訊號之共模雜訊而產生一差分訊號,其中,差分訊號之大小相關於待測電容30之大小,即差分電路20可運算出第一濾波訊號與第二濾波訊號的差值,而產生差分訊號,由於差分訊號相關於待測電容30,也就是待測電容30之電容值大小將會影響第一濾波訊號與第二濾波訊號的大小,而使差分電路20所產生之差分訊號的大小依據待測電容30之電容值大小而不同,所以,後續電路(圖中未示)可依據差分訊號而得知待測電容30之電容值。由於本發明係利用差分電路20相減第一濾波 訊號與第二濾波訊號而得知差分訊號,所以,當有一電磁干擾雜訊產生於第一濾波訊號與第二濾波訊號時,差分電路20即可在相減第一濾波訊號與第二濾波訊號的同時,消除電磁干擾雜訊,也就是消除共模雜訊,以達到抗電磁干擾的能力。其中,本發明之差分電路20之一較佳實施例為一差分放大器。 The differential circuit 20 receives the first filtered signal and the second filtered signal, and the differential circuit 20 cancels the common mode noise of the first filtered signal and the second filtered signal to generate a differential signal, wherein the magnitude of the differential signal is related to the measured signal. The size of the capacitor 30, that is, the difference circuit 20 can calculate the difference between the first filtered signal and the second filtered signal to generate a differential signal, since the differential signal is related to the capacitor 30 to be tested, that is, the capacitance value of the capacitor 30 to be tested. The size of the first filtered signal and the second filtered signal will be affected, and the magnitude of the differential signal generated by the differential circuit 20 varies according to the capacitance value of the capacitor 30 to be tested. Therefore, the subsequent circuit (not shown) can The capacitance value of the capacitor 30 to be tested is known according to the differential signal. Since the present invention utilizes the differential circuit 20 to subtract the first filter The differential signal is obtained by the signal and the second filtered signal. Therefore, when an electromagnetic interference noise is generated by the first filtered signal and the second filtered signal, the differential circuit 20 can subtract the first filtered signal and the second filtered signal. At the same time, the elimination of electromagnetic interference noise, that is, the elimination of common mode noise, in order to achieve the ability to resist electromagnetic interference. Among them, a preferred embodiment of the differential circuit 20 of the present invention is a differential amplifier.

此外,本發明之具抗電磁干擾能例之電容感測電路更包含一放大器40。放大器40係耦接於差分電路20,並放大器40係接收並放大差分訊號,本發明係藉由差分電路20與放大器40而形成一動態範圍調整電路,此動態範圍調整電路可有效降低偵測待測電容30的偵測時脈週期,進而減少功率的消耗,以達到省電的目的。其中,放大器40為一可調式增益放大器(Variable Gain Amplifier,VGA)。 In addition, the capacitive sensing circuit of the present invention having an anti-electromagnetic interference performance further includes an amplifier 40. The amplifier 40 is coupled to the differential circuit 20, and the amplifier 40 receives and amplifies the differential signal. The present invention forms a dynamic range adjustment circuit by the differential circuit 20 and the amplifier 40. The dynamic range adjustment circuit can effectively reduce the detection. The detection of the clock cycle of the capacitor 30, thereby reducing power consumption, to achieve power saving purposes. The amplifier 40 is a Variable Gain Amplifier (VGA).

請一併參閱第五圖,係為係為第四圖之一較佳實施例之濾波器的電路圖。如圖所示,本發明之具抗電磁干擾能力之電容感測電路的濾波器10包含一開關模組12、一第一輸出電容14、一第一輸出開關16、一第二輸出電容18與一第二輸出開關19。開關模組12係耦接待測電容30,並接收該些參考訊號,即開關模組12接收第一參考訊號VREF1與第二參考訊號VREF2,第一輸出電容14耦接開關模組12之一第一輸出端,第一輸出開關16耦接第一輸出電容14與參考訊號之間,而產生第一濾波訊號,即第一輸出開關16係第一輸出電容14與第三參考訊號VREF3之間而輸出第一濾波訊號,第二輸出電容18耦接開關模組12之第二輸出端,第二輸出開關19係耦接第二輸出電容18與參考訊號之間,而產生第二濾波訊號,即第二輸出開關19係耦接第二輸出電容18與第四參考訊號VREF4之間而輸出第二濾波訊號。 Referring to FIG. 5 together, it is a circuit diagram of a filter which is a preferred embodiment of the fourth figure. As shown in the figure, the filter 10 of the capacitive sensing circuit with electromagnetic interference resistance of the present invention comprises a switch module 12, a first output capacitor 14, a first output switch 16, and a second output capacitor 18. A second output switch 19. The switch module 12 is coupled to the receiving capacitor 30 and receives the reference signals. The switch module 12 receives the first reference signal V REF1 and the second reference signal V REF2 , and the first output capacitor 14 is coupled to the switch module 12 . a first output terminal, the first output switch 16 is coupled between the first output capacitor 14 and the reference signal to generate a first filtered signal, that is, the first output switch 16 is the first output capacitor 14 and the third reference signal V REF3 The first output signal is outputted, and the second output capacitor 18 is coupled to the second output end of the switch module 12, and the second output switch 19 is coupled between the second output capacitor 18 and the reference signal to generate a second filter. The second output switch 19 is coupled between the second output capacitor 18 and the fourth reference signal V REF4 to output a second filtered signal.

此外,開關模組12包含一第一開關120、一第二開關122、一第三開關124與一第四開關126。第一開關120之一端耦接第一參考訊號VREF1,第一開關120之另一端耦接待測電容30,第二開關122之一端耦接待測電容30與第一開關120,第二開關122之另一端耦接第一輸出電容14,第三開關124之一端耦接第二參考訊號VREF2,第三開關124之另一端耦接待測電容30,第四開關126之一端耦接待測電容30與第三開關124,第四開關126之另一端耦接第二輸出電容18。如此,本發明係藉由控制開開模組12、第一輸出開關16第二輸出開關19的導通/截止的順序,而產生第一濾波訊號與第二濾波訊號。 In addition, the switch module 12 includes a first switch 120, a second switch 122, a third switch 124, and a fourth switch 126. One end of the first switch 120 is coupled to the first reference signal V REF1 , and the other end of the first switch 120 is coupled to the receiving capacitance 30 , and one end of the second switch 122 is coupled to the receiving capacitor 30 and the first switch 120 , and the second switch 122 The other end is coupled to the first output capacitor 14, the third end of the third switch 124 is coupled to the second reference signal V REF2 , the other end of the third switch 124 is coupled to the receiving capacitor 30 , and the other end of the fourth switch 126 is coupled to the receiving capacitor 30 and The third switch 124 and the other end of the fourth switch 126 are coupled to the second output capacitor 18 . Thus, in the present invention, the first filtered signal and the second filtered signal are generated by controlling the turn-on/turn-off sequence of the open module 12 and the second output switch 19 of the first output switch 16.

請一併參閱第六圖與第七A圖,係為本發明之一較佳實施例之電容感測電路之輸出波形圖與開關控制的時序圖。如圖所示,本發明之電容感測電路係先導通與截止第一輸出開關16與第二輸出開關19之後,依序導通與截止第一開關120、第二開關122、第三開關124與第四開關126,而使在第一輸出電容14產生第一濾波訊號V1的電壓斜率變化,並且第一輸出電容14耦接第三參考訊號VREF3,所以,使第一濾波訊號V1以第三參考訊號VREF3為一起始電壓而電壓訊號之斜率變化;同理,在第二輸出電容18產生第二濾波訊號V2的電壓斜率變化,即第二輸出電容18耦接第四參考訊號VREF4,所以,使第二濾波訊號V2以第四參考訊號VREF4為一起始電壓而電壓訊號之斜率變化,由於第一濾波訊號V1的電壓斜率與第二濾波訊號V2的電壓斜率為相反,因此,差分電路20可藉由第一濾波訊號V1與第二濾波訊號V2的差異值而產生差分訊號。其中,第一輸出電容14與第二輸出電容18為一積分電容。 Please refer to FIG. 6 and FIG. 7A together, which are timing diagrams of output waveform diagram and switch control of the capacitance sensing circuit according to a preferred embodiment of the present invention. As shown in the figure, the capacitance sensing circuit of the present invention turns on and off the first switch 120, the second switch 122, and the third switch 124 sequentially after turning on and off the first output switch 16 and the second output switch 19. The fourth switch 126 changes the slope of the voltage of the first filtered signal V 1 at the first output capacitor 14 , and the first output capacitor 14 is coupled to the third reference signal V REF3 , so that the first filtered signal V 1 is The third reference signal V REF3 is a starting voltage and the slope of the voltage signal changes. Similarly, the second output capacitor 18 generates a voltage slope change of the second filtered signal V 2 , that is, the second output capacitor 18 is coupled to the fourth reference signal. V REF4 , so that the second filter signal V 2 has a fourth reference signal V REF4 as a starting voltage and the slope of the voltage signal changes due to the voltage slope of the first filtered signal V 1 and the voltage slope of the second filtered signal V 2 . In contrast, the difference circuit 20 can generate a differential signal by the difference value between the first filtered signal V 1 and the second filtered signal V 2 . The first output capacitor 14 and the second output capacitor 18 are an integral capacitor.

請復參閱第五圖與第七A圖,若有一電磁干擾訊號由待測電容 30進入,將切換開關頻率比電磁干擾訊號頻率高,由第一開關120導通後,將電磁干擾訊號儲存於待測電容30,於第二開關122導通之後,第一輸出電容14之端點會得到第一開關120及第二開關122之電磁干擾訊號差異值,因切換開關頻率比電磁干擾訊號頻率高,所以該差異值幾乎等於該電磁干擾訊號之斜率;再者,由第三開關124導通後,將電磁干擾訊號儲存於待測電容30,於第四開關126導通之後,第二輸出電容18之端點會得到第三開關124及第四開關126之電磁干擾訊號差異值,因為切換開關頻率比電磁干擾訊號頻率高,所該差異值幾乎等於該電磁干擾訊號之斜率,透過差分電路20可將兩訊號之共模電磁干擾訊號之斜率消除。 Please refer to Figure 5 and Figure 7A for an electromagnetic interference signal from the capacitor to be tested. 30 enters, the switching frequency is higher than the electromagnetic interference signal frequency, after the first switch 120 is turned on, the electromagnetic interference signal is stored in the capacitor 30 to be tested, after the second switch 122 is turned on, the end of the first output capacitor 14 Obtaining the difference value of the electromagnetic interference signals of the first switch 120 and the second switch 122. Since the switching switch frequency is higher than the electromagnetic interference signal frequency, the difference value is almost equal to the slope of the electromagnetic interference signal; and further, the third switch 124 is turned on. After that, the electromagnetic interference signal is stored in the capacitor 30 to be tested. After the fourth switch 126 is turned on, the end of the second output capacitor 18 obtains the electromagnetic interference signal difference between the third switch 124 and the fourth switch 126, because the switch The frequency is higher than the frequency of the electromagnetic interference signal, and the difference value is almost equal to the slope of the electromagnetic interference signal, and the slope of the common mode electromagnetic interference signal of the two signals can be eliminated through the differential circuit 20.

此外,請一併參閱第七B圖,係為係為本發明之另一較佳實施例之開關控制的時序圖。如圖所示,本實施例與第七A圖之實施例不同之處,在於本實施例之開關控制的順序係第一輸出開關14、第二輸出開關19與第一開關120同時導通/截止之後,再依序導通/截止第二開關122、第三開關124與第四開關126,如此,本實施例之濾波器亦可產生如第六圖之波形。 In addition, please refer to FIG. 7B as a timing diagram of the switch control of another preferred embodiment of the present invention. As shown in the figure, the difference between the embodiment and the embodiment of FIG. 7A is that the sequence of the switch control in this embodiment is that the first output switch 14, the second output switch 19 and the first switch 120 are simultaneously turned on/off. Then, the second switch 122, the third switch 124, and the fourth switch 126 are sequentially turned on/off. Thus, the filter of the embodiment can also generate a waveform as shown in FIG.

請參閱第八圖,係為本發明之另一較佳實施例之濾波器的電路圖。如圖所示,本實施例與第五圖之實施例不同之處,在於本實施例增加一放大器50。放大器50具有一第一輸入端、一第二輸入端、一第一輸出端與一第二輸出端,第一輸入端與第二輸入端係耦接開關模組12,第一輸出端與第二輸出端係用以輸出第一濾波訊號與第二濾波訊號,第一輸出電容14耦接放大器50之第一輸入端與第一輸出端之間,第二輸出電容18耦接放大器50之第二輸入端與第二輸出端之間,第一輸出開關16之一端耦接開關模組12 與放大器50,第一輸出開關16之另一端耦接第三參考訊號VREF3,第二輸出開關19之一端耦接開關模組12與放大器50,第二輸出開關19之另一端耦接第四參考訊號VREF4。如此,由於本發明增加放大器50以增加電壓增益,以增加放大第一濾波訊號與第二濾波訊號,而可使用較小電容值的第一輸出電容14與第二輸出電容18,進而達到省成本的目的。其中,本發明之放大器50一較佳實施例為一運算放大器(Operational Amplifier,OPA)。 Please refer to the eighth figure, which is a circuit diagram of a filter according to another preferred embodiment of the present invention. As shown in the figure, the difference between this embodiment and the embodiment of the fifth embodiment is that an amplifier 50 is added to the embodiment. The amplifier 50 has a first input end, a second input end, a first output end and a second output end. The first input end and the second input end are coupled to the switch module 12, the first output end and the first output end The second output terminal is coupled between the first input end and the first output end of the amplifier 50, and the second output capacitor 18 is coupled to the first output end of the amplifier 50. Between the two input terminals and the second output terminal, one end of the first output switch 16 is coupled to the switch module 12 and the amplifier 50, and the other end of the first output switch 16 is coupled to the third reference signal V REF3 , and the second output switch 19 The other end of the second output switch 19 is coupled to the fourth reference signal V REF4 . Thus, since the present invention increases the amplifier 50 to increase the voltage gain to increase the amplification of the first filtered signal and the second filtered signal, the first output capacitor 14 and the second output capacitor 18 of a smaller capacitance value can be used, thereby achieving cost savings. the goal of. A preferred embodiment of the amplifier 50 of the present invention is an Operational Amplifier (OPA).

此外,請參閱第九圖,係為本發明之另一較佳實施例之濾波器的電路圖。如圖所示,由於本發明之待測電容30會產生一寄生電容32,寄生電容32係耦接待測電容30之一端,並耦接開關模組12。因為寄生電容32的關係,會使本發明之電容感測電路在量測待測電容30的動態範圍會過小,所以,本發明在本實施例之電容感測電路的濾波器10中更包含了一第五開關60與一第六開關62。第五開關60之一端係耦接參考訊號(即第三參考訊號VREF3),第五開關60之另一端則耦接寄生電容32。第六開關62之一端係耦接第五開關60與寄生電容32,第六開關62之另一端耦接參考訊號(即第四參考訊號VREF4)。如此,本實施例係配合開關模組12之第一開關120至第四開關126的導通次序,以達到增加待測電容30之動態量測範圍。以下係會針對第五開關60與第六開關62如何配合開關模組12之第一開關120至第四開關126的導通次序進行運作而進行說明。 Further, please refer to the ninth drawing, which is a circuit diagram of a filter according to another preferred embodiment of the present invention. As shown in the figure, since the capacitor 30 to be tested of the present invention generates a parasitic capacitor 32, the parasitic capacitor 32 is coupled to one end of the receiving capacitor 30 and coupled to the switch module 12. Because of the relationship of the parasitic capacitance 32, the dynamic sensing range of the capacitance sensing circuit of the present invention is too small. Therefore, the present invention further includes the filter 10 of the capacitance sensing circuit of the present embodiment. A fifth switch 60 and a sixth switch 62. One end of the fifth switch 60 is coupled to the reference signal (ie, the third reference signal V REF3 ), and the other end of the fifth switch 60 is coupled to the parasitic capacitor 32 . One end of the sixth switch 62 is coupled to the fifth switch 60 and the parasitic capacitor 32, and the other end of the sixth switch 62 is coupled to the reference signal (ie, the fourth reference signal V REF4 ). Thus, in this embodiment, the conduction sequence of the first switch 120 to the fourth switch 126 of the switch module 12 is matched to increase the dynamic measurement range of the capacitor 30 to be tested. Hereinafter, the operation of the fifth switch 60 and the sixth switch 62 in cooperation with the first switch 120 to the fourth switch 126 of the switch module 12 will be described.

請一併參閱第十A圖,係為本發明之一較佳實施例之第九圖的時序圖。如圖所示,當第一輸出開關16與第二輸出開關19導通時,第五開關60亦導通,第一開關120在第一輸出開關16與第二輸出開關19導通之後接著導通,第五開關60在第一開關120截止的 同時亦截止,此時,第二開關122與第六開關62則導通,之後第三開關124導通,第三開關124截止時,第六開關62亦截止,之後第四開關126與第五開關60導通,如此重複上述複數開關導通/截止次序,即可使寄生電容32之電容值相對於待測電容30之電容值之影響降低,而達到增加待測電容30之動態量測範圍。其中,由上述之該些開關的次序可知,第一輸出電容14的電壓為: 若n趨近於無限大時, Please refer to FIG. 10A together, which is a timing diagram of the ninth diagram of a preferred embodiment of the present invention. As shown, when the first output switch 16 and the second output switch 19 are turned on, the fifth switch 60 is also turned on, and the first switch 120 is turned on after the first output switch 16 and the second output switch 19 are turned on, and fifth. The switch 60 is also turned off while the first switch 120 is turned off. At this time, the second switch 122 and the sixth switch 62 are turned on, and then the third switch 124 is turned on. When the third switch 124 is turned off, the sixth switch 62 is also turned off. The fourth switch 126 and the fifth switch 60 are turned on, and thus repeating the on/off sequence of the plurality of switches, the influence of the capacitance value of the parasitic capacitor 32 relative to the capacitance value of the capacitor 30 to be tested is reduced, and the capacitance to be tested is increased. Dynamic measurement range. Wherein, according to the sequence of the switches mentioned above, the voltage of the first output capacitor 14 is: If n approaches infinity,

即由上述可知,當待測電容30之電容值遠大於寄生電容32之電容值,而使寄生電容32可以忽略,而達到增加待測電容30之動態量測範圍,即本實施例可避免VC14的電壓與VC18的電壓太早交集,而影響待測電容30之動態量測範圍,此外,第二輸出電容18亦可由上述的方式得知。同時,請一併參閱第十C圖,其第一開關120至第六開關62間的導通/截止次序與第十A圖大致上相同,不同之處僅在於第一輸出開關16與第二輸出開關19導通的同時,第一開關120與第五開關60亦導通。其餘皆與第十A圖相同,故在此不再加以贊述。 That is, as described above, when the capacitance value of the capacitor 30 to be tested is much larger than the capacitance value of the parasitic capacitor 32, the parasitic capacitance 32 can be neglected, and the dynamic measurement range of the capacitor 30 to be tested is increased, that is, the embodiment can avoid V. The voltage of C14 overlaps with the voltage of V C18 too early, which affects the dynamic measurement range of the capacitor 30 to be tested. Further, the second output capacitor 18 can also be known from the above. Meanwhile, please refer to FIG. 10C, the on/off sequence between the first switch 120 and the sixth switch 62 is substantially the same as that of the tenth A picture, except that the first output switch 16 and the second output are only the first output switch 16 and the second output. While the switch 19 is turned on, the first switch 120 and the fifth switch 60 are also turned on. The rest are the same as in Figure 10A, so they are not mentioned here.

請一併參閱第十B圖,係為本發明之另一較佳實施例之第九圖的時序圖。如圖所示,本實施例與第十A圖之實施例不同之處,在於第一輸出開關16與第二輸出開關19導通時,第六開關62亦導通,第一開關120在第一輸出開關16與第二輸出開關19導通之後接著導通,第六開關62在第一開關120截止的同時亦截止,此時,第二開關122與第五開關60則導通,之後第三開關124導通,第 三開關124截止時,第五開關60亦截止,之後第四開關126與第六開關62導通,如此重複上述複數開關導通/截止次序,即可使寄生電容32之電容值相對於待測電容30之電容值之影響增加,而透過寄生電容32的的電容值,以得知待測電容30的電容值,如此亦可達到增加待測電容30之動態量測範圍。其中,由上述之該些開關的次序可知,第一輸出電容14的電壓為: 若n趨近於無限大時, Please refer to FIG. 10B, which is a timing diagram of a ninth diagram of another preferred embodiment of the present invention. As shown in the figure, the embodiment is different from the embodiment of FIG. A in that, when the first output switch 16 and the second output switch 19 are turned on, the sixth switch 62 is also turned on, and the first switch 120 is at the first output. After the switch 16 and the second output switch 19 are turned on, the sixth switch 62 is also turned off while the first switch 120 is turned off. At this time, the second switch 122 and the fifth switch 60 are turned on, and then the third switch 124 is turned on. When the third switch 124 is turned off, the fifth switch 60 is also turned off, and then the fourth switch 126 and the sixth switch 62 are turned on, so that the above-mentioned plurality of switch on/off sequences are repeated, so that the capacitance value of the parasitic capacitor 32 is relative to the capacitance to be tested. The influence of the capacitance value of 30 is increased, and the capacitance value of the parasitic capacitor 32 is used to know the capacitance value of the capacitor 30 to be tested, so that the dynamic measurement range of the capacitor 30 to be tested can be increased. Wherein, according to the sequence of the switches mentioned above, the voltage of the first output capacitor 14 is: If n approaches infinity,

由上述可知,寄生電容32之電容值遠大於待測電容30之電容值,而透過寄生電容32的的電容值,以得知待測電容30的電容值,如此亦可達到增加待測電容30之動態量測範圍,即本實施例可避免VC14的電壓與VC18的電壓太晚交集,而影響待測電容30之動態量測範圍,此外,第二輸出電容18亦可由上述的方式得知。同時,請一併參閱第十D圖,其第一開關120至第六開關62間的導通/截止次序與第十B圖大致上相同,不同之處僅在於第一輸出開關16與第二輸出開關19導通的同時,第一開關120與第六開關62亦導通。其餘皆與第十B圖相同,故在此不再加以贊述。 It can be seen from the above that the capacitance value of the parasitic capacitance 32 is much larger than the capacitance value of the capacitance 30 to be tested, and the capacitance value of the parasitic capacitance 32 is passed to know the capacitance value of the capacitance 30 to be tested, so that the capacitance to be tested can be increased by 30. The dynamic measurement range, that is, the embodiment can prevent the voltage of V C14 from intersecting the voltage of V C18 too late, and affect the dynamic measurement range of the capacitor 30 to be tested. In addition, the second output capacitor 18 can also be obtained by the above method. know. Meanwhile, please refer to the tenth D picture, the on/off sequence between the first switch 120 and the sixth switch 62 is substantially the same as that of the tenth B picture, except that the first output switch 16 and the second output are only the first output switch 16 and the second output. While the switch 19 is turned on, the first switch 120 and the sixth switch 62 are also turned on. The rest are the same as the tenth B picture, so they are not mentioned here.

請參閱第十一圖,係為本發明之另一較佳實施例之濾波器的電路圖。如圖所示,本實施例與第九圖之實施例不同之處,在於本實施例增加一個放大器50。放大器50具有一第一輸入端、一第二輸入端、一第一輸出端與一第二輸出端,第一輸入端與第二輸入端係耦接開關模組12,第一輸出端與第二輸出端係用以輸出第一濾波訊號與第二濾波訊號,第一輸出電容14耦接放大器50之第 一輸入端與第一輸出端之間,第二輸出電容18耦接放大器50之第二輸入端與第二輸出端之間,第一輸出開關16之一端耦接開關模組12與放大器50,第一輸出開關16之另一端耦接第三參考訊號VREF3,第二輸出開關19之一端耦接開關模組12與放大器50,第二輸出開關19之另一端耦接第四參考訊號VREF4。如此,由於本發明增加放大器50以增加電壓增益,以增加放大第一濾波訊號與第二濾波訊號,而可使用較小電容值的第一輸出電容14與第二輸出電容18,進而達到省成本的目的。其餘結構皆與第九圖相同,故於此不再加以贊述。 Please refer to FIG. 11 , which is a circuit diagram of a filter according to another preferred embodiment of the present invention. As shown in the figure, this embodiment differs from the embodiment of the ninth embodiment in that an amplifier 50 is added to the present embodiment. The amplifier 50 has a first input end, a second input end, a first output end and a second output end. The first input end and the second input end are coupled to the switch module 12, the first output end and the first output end The second output terminal is coupled between the first input end and the first output end of the amplifier 50, and the second output capacitor 18 is coupled to the first output end of the amplifier 50. Between the two input terminals and the second output terminal, one end of the first output switch 16 is coupled to the switch module 12 and the amplifier 50, and the other end of the first output switch 16 is coupled to the third reference signal V REF3 , and the second output switch 19 . The other end of the second output switch 19 is coupled to the fourth reference signal V REF4 . Thus, since the present invention increases the amplifier 50 to increase the voltage gain to increase the amplification of the first filtered signal and the second filtered signal, the first output capacitor 14 and the second output capacitor 18 of a smaller capacitance value can be used, thereby achieving cost savings. the goal of. The rest of the structure is the same as the ninth figure, so it will not be mentioned here.

綜上所述,本發明之具阻抗電磁干擾能力之電容感測電路,其由一濾波器耦接一待測電容,並接收複數參考訊號而產生一第一濾波訊號與一第二濾波訊號,並由一差分電路接收第一濾波訊號與第二濾波訊號,並消除第一濾波訊號第二濾波訊號之共模雜訊而產生一差分訊號,差分訊號之大小相關於待測電容之大小,而達到待測電容偵測的目的。並藉由差分電路消除共模雜訊,以達到抗電磁干擾的能力,且差分電路可動態範圍調整濾波器的輸出,使電容感測電路具低耗費時脈週期數的特性。 In summary, the capacitive sensing circuit with impedance electromagnetic interference capability of the present invention is coupled to a capacitor to be tested by a filter, and receives a plurality of reference signals to generate a first filtered signal and a second filtered signal. And receiving, by a differential circuit, the first filtered signal and the second filtered signal, and canceling the common mode noise of the second filtered signal of the first filtered signal to generate a differential signal, wherein the magnitude of the differential signal is related to the size of the capacitor to be tested, and The purpose of detecting the capacitance to be tested is achieved. The common mode noise is eliminated by the differential circuit to achieve the capability of resisting electromagnetic interference, and the differential circuit can adjust the output of the filter in a dynamic range, so that the capacitance sensing circuit has the characteristics of low time-consuming pulse period.

本發明係實為一具有新穎性、進步性及可供產業利用者,應符合我國專利法所規定之專利申請要件無疑,爰依法提出發明專利申請,祈 鈞局早日賜准專利,至感為禱。 The invention is a novelty, progressive and available for industrial use, and should meet the requirements of the patent application stipulated in the Patent Law of China, and the invention patent application is filed according to law, and the prayer bureau will grant the patent as soon as possible. prayer.

惟以上所述者,僅為本發明之一較佳實施例而已,並非用來限定本發明實施之範圍,舉凡依本發明申請專利範圍所述之形狀、構造、特徵及精神所為之均等變化與修飾,均應包括於本發明之申請專利範圍內。 However, the above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention, and the shapes, structures, features, and spirits described in the claims are equivalently changed. Modifications are intended to be included in the scope of the patent application of the present invention.

10‧‧‧濾波器 10‧‧‧ filter

20‧‧‧差分電路 20‧‧‧Differential circuit

30‧‧‧待測電容 30‧‧‧Measured capacitance

40‧‧‧放大器 40‧‧‧Amplifier

Claims (17)

一種具抗電磁干擾能力之電容感測電路,其包含:一濾波器,耦接一待測電容,並接收複數參考訊號而產生一第一濾波訊號與一第二濾波訊號,該濾波器包含:一開關模組,耦接該待測電容,並接收該些參考訊號;一第一輸出電容,耦接該開關模組之一第一輸出端;一第一輸出開關,耦接該第一輸出電容與該參考訊號之間,而產生該第一濾波訊號;一第二輸出電容,耦接該開關模組之一第二輸出端;以及一第二輸出開關,耦接該第二輸出電容與該參考訊號之間,而產生該第二濾波訊號;以及一差分電路,接收該第一濾波訊號與該第二濾波訊號,並消除該第一濾波訊號與該第二濾波訊號之共模雜訊而產生一差分訊號,該差分訊號之大小相關於該待測電容之大小;其中,該待測電容更包含一寄生電容,該寄生電容耦接該待測電容之一端與該開關模組。 A capacitive sensing circuit with electromagnetic interference resistance, comprising: a filter coupled to a capacitor to be tested, and receiving a plurality of reference signals to generate a first filtered signal and a second filtered signal, the filter comprising: a switch module coupled to the capacitor to be tested and receiving the reference signals; a first output capacitor coupled to the first output of the switch module; a first output switch coupled to the first output Between the capacitor and the reference signal, the first filter signal is generated; a second output capacitor is coupled to the second output end of the switch module; and a second output switch coupled to the second output capacitor Between the reference signals, the second filtered signal is generated; and a differential circuit receives the first filtered signal and the second filtered signal, and cancels the common mode noise of the first filtered signal and the second filtered signal And generating a differential signal, the magnitude of the differential signal being related to the size of the capacitor to be tested; wherein the capacitor to be tested further comprises a parasitic capacitor coupled to one end of the capacitor to be tested and the switch module. 如申請專利範圍第1項所述之具抗電磁干擾能力之電容感測電路,其更包括:一放大器,接收並放大該差分訊號。 The capacitive sensing circuit with electromagnetic interference resistance according to claim 1, further comprising: an amplifier that receives and amplifies the differential signal. 如申請專利範圍第2項所述之具抗電磁干擾能力之電容感測電路,其中該放大器為一可調式增益放大器(Variable Gain Amplifier,VGA)。 The capacitive sensing circuit with anti-electromagnetic interference capability as described in claim 2, wherein the amplifier is a Variable Gain Amplifier (VGA). 如申請專利範圍第1項所述之具抗電磁干擾能力之電容感測電路,其中該開關模組包括:一第一開關,其一端耦接該參考訊號,該第一開關之另一端耦接該待測電容;一第二開關,其一端耦接該待測電容與該第一開關,該第二開關之另一端耦接該第一輸出電容;一第三開關,其一端耦接該參考訊號,該第三開關之另一端耦接該待測電容;以及一第四開關,其一端耦接該待測電容與該第三開關,該第四開關之另一端耦接該第二輸出電容。 The capacitive sensing circuit of the electromagnetic interference-resistant capability of claim 1, wherein the switch module comprises: a first switch, one end of which is coupled to the reference signal, and the other end of the first switch is coupled a second switch, one end of which is coupled to the capacitor to be tested and the first switch, the other end of the second switch is coupled to the first output capacitor; and a third switch is coupled to the reference at one end a signal, the other end of the third switch is coupled to the capacitor to be tested; and a fourth switch, one end of which is coupled to the capacitor to be tested and the third switch, and the other end of the fourth switch is coupled to the second output capacitor . 如申請專利範圍第1項所述之具抗電磁干擾能力之電容感測電路,其中該第一輸出電容與該第二輸出電容為一積分電容。 The capacitive sensing circuit with electromagnetic interference resistance according to claim 1, wherein the first output capacitor and the second output capacitor are an integrating capacitor. 如申請專利範圍第1項所述之具抗電磁干擾能力之電容感測電路,其中該差分電路為一差分放大器。 The capacitive sensing circuit with electromagnetic interference resistance according to claim 1, wherein the differential circuit is a differential amplifier. 如申請專利範圍第1項所述之具抗電磁干擾能力之電容感測電路,其應用於指紋辨識、加速感測器與觸控面板。 The capacitive sensing circuit with anti-electromagnetic interference capability as described in claim 1 is applied to fingerprint recognition, acceleration sensors and touch panels. 如申請專利範圍第1項所述之具抗電磁干擾能力之電容感測電路,其中該濾波器更包括:一第五開關,其一端耦接該參考訊號,該第五開關之另一端耦接該寄生電容;以及一第六開關,其一端耦接該第五開關與該寄生電容,該第六開關之另一端耦接該參考訊號。 The capacitor sensing circuit of claim 1, wherein the filter further comprises: a fifth switch, one end of which is coupled to the reference signal, and the other end of the fifth switch is coupled The parasitic capacitance is coupled to the fifth switch and the parasitic capacitor, and the other end of the sixth switch is coupled to the reference signal. 一種具抗電磁干擾能力之電容感測電路,其包含:一濾波器,耦接一待測電容,並接收複數參考訊號而產生一第一濾波訊號與一第二濾波訊號,該濾波器包含: 一開關模組,耦接該待測電容,並接收該些參考訊號;一放大器,具有一第一輸入端、一第二輸入端、一第一輸出端與一第二輸出端,該第一輸入端與該第二輸入端係耦接該開關模組,該第一輸出端與該第二輸出端係用以輸出該第一濾波訊號與該第二濾波訊號;一第一輸出電容,耦接該放大器之該第一輸入端與該第一輸出端之間;一第二輸出電容,耦接該放大器之該第二輸入端與該第二輸出端之間;一第一輸出開關,其一端耦接該開關模組與該放大器,該第一輸出開關之另一端耦接該參考訊號;以及一第二輸出開關,其一端耦接該開關模組與該放大器,該第二輸出開關之另一端耦接該參考訊號;及一差分電路,接收該第一濾波訊號與該第二濾波訊號,並消除該第一濾波訊號與該第二濾波訊號之共模雜訊而產生一差分訊號,該差分訊號之大小相關於該待測電容之大小;其中,該待測電容更包含一寄生電容,該寄生電容耦接該待測電容之一端與該開關模組。 A capacitive sensing circuit with electromagnetic interference resistance, comprising: a filter coupled to a capacitor to be tested, and receiving a plurality of reference signals to generate a first filtered signal and a second filtered signal, the filter comprising: a switch module coupled to the capacitor to be tested and receiving the reference signals; an amplifier having a first input terminal, a second input terminal, a first output terminal, and a second output terminal, the first The first output end and the second output end are configured to output the first filtered signal and the second filtered signal; a first output capacitor coupled Connected between the first input end of the amplifier and the first output end; a second output capacitor coupled between the second input end of the amplifier and the second output end; a first output switch One end of the switch module is coupled to the amplifier, the other end of the first output switch is coupled to the reference signal, and a second output switch is coupled to the switch module and the amplifier at one end, and the second output switch The other end is coupled to the reference signal; and a differential circuit receives the first filtered signal and the second filtered signal, and cancels the common mode noise of the first filtered signal and the second filtered signal to generate a differential signal. The size of the differential signal is related to The magnitude of the capacitance to be measured; wherein the measured capacitor further comprises a parasitic capacitance, the parasitic capacitance coupled to the capacitance measured with an end of the switch module. 如申請專利範圍第9項所述之具抗電磁干擾能力之電容感測電路,其中該開關模組包括:一第一開關,其一端耦接該參考訊號,該第一開關之另一端耦接該待測電容;一第二開關,其一端耦接該待測電容與該第一開關,該第二開關之另一端耦接該第一輸出電容與該放大器;一第三開關,其一端耦接該參考訊號,該第三開關之另一端耦接 該待測電容;以及一第四開關,其一端耦接該待測電容與該第三開關,該第四開關之另一端耦接該第二輸出電容與該放大器。 The capacitive sensing circuit of the anti-electromagnetic interference capability of claim 9, wherein the switch module comprises: a first switch, one end of which is coupled to the reference signal, and the other end of the first switch is coupled a second switch having one end coupled to the capacitor to be tested and the first switch, the other end of the second switch coupled to the first output capacitor and the amplifier; and a third switch coupled at one end Connected to the reference signal, the other end of the third switch is coupled And a fourth switch, one end of which is coupled to the capacitor to be tested and the third switch, and the other end of the fourth switch is coupled to the second output capacitor and the amplifier. 如申請專利範圍第9項所述之具抗電磁干擾能力之電容感測電路,該放大器為一運算放大器(Operational Amplifier,OPA)。 The capacitive sensing circuit with electromagnetic interference resistance according to claim 9 is an operational amplifier (OPA). 如申請專利範圍第9項所述之具抗電磁干擾能力之電容感測電路,其中該第一輸出電容與該第二輸出電容為一積分電容。 The capacitive sensing circuit with anti-electromagnetic interference capability according to claim 9 , wherein the first output capacitor and the second output capacitor are an integral capacitor. 如申請專利範圍第9項所述之具抗電磁干擾能力之電容感測電路,其更包括:一放大器,接收並放大該差分訊號。 The capacitive sensing circuit with electromagnetic interference resistance according to claim 9 further includes: an amplifier that receives and amplifies the differential signal. 如申請專利範圍第13項所述之具抗電磁干擾能力之電容感測電路,其中該放大器為一可調式增益放大器(Variable Gain Amplifier,VGA)。 The capacitive sensing circuit with electromagnetic interference resistance according to claim 13 is the variable gain amplifier (VGA). 如申請專利範圍第9項所述之具抗電磁干擾能力之電容感測電路,其中該差分電路為一差分放大器。 The capacitive sensing circuit with electromagnetic interference resistance according to claim 9 is wherein the differential circuit is a differential amplifier. 如申請專利範圍第9項所述之具抗電磁干擾能力之電容感測電路,其應用於指紋辨識、加速感測器與觸控面板。 The capacitive sensing circuit with anti-electromagnetic interference capability as described in claim 9 of the patent application is applied to a fingerprint identification, an acceleration sensor and a touch panel. 如申請專利範圍第9項所述之具抗電磁干擾能力之電容感測電路,其中該濾波器更包括:一第五開關,其一端耦接該參考訊號,該第五開關之另一端耦接該寄生電容;以及一第六開關,其一端耦接該第五開關與該寄生電容,該第六開關之另一端耦接該參考訊號。 The capacitor sensing circuit of the anti-electromagnetic interference capability of claim 9, wherein the filter further comprises: a fifth switch, one end of which is coupled to the reference signal, and the other end of the fifth switch is coupled The parasitic capacitance is coupled to the fifth switch and the parasitic capacitor, and the other end of the sixth switch is coupled to the reference signal.
TW099134517A 2009-10-08 2010-10-08 Capacitance sensing circuit with anti-electromagnetic capability TWI483547B (en)

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TWI559232B (en) * 2014-12-15 2016-11-21 義隆電子股份有限公司 Sensing method and circuit of fingerprint sensor
CN105701441B (en) 2014-12-15 2018-10-09 义隆电子股份有限公司 Sensing method and circuit of fingerprint sensor
TWI569211B (en) * 2014-12-26 2017-02-01 義隆電子股份有限公司 Sensing method and device of fingerprint sensor
CN105352565B (en) * 2015-11-02 2024-05-07 智恒(厦门)微电子有限公司 Differential capacitance level sensor
TWI696119B (en) * 2019-03-05 2020-06-11 大陸商北京集創北方科技股份有限公司 Noise elimination method, control device and information processing device for fingerprint identification
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