TWI481848B - Optical registration carrier - Google Patents

Description

Optical address carrier

The present disclosure relates to a test element, and more particularly to an inspection carrier having an optical addressing function.

When the sample is optically detected, since the detected point of the detected sample is not a single position, it is often a plurality of non-fixed positions. However, there is no regular feature point on the tested subject for reference. Usually, it can only be taken by open-loop method for image or signal detection, or by optical scanning device, such as laser. A galvanometer, optical encoder or magnetic encoder configured on a galvo mirror outputs the current scanning position information of the optical scanning device, and then uses a complex and non-linear coordinate transformation relationship to derive the actual The location of the measured point.

Since the distance of the measured point from the above-mentioned position information output point is much larger than the dimension of the tested object, the measurement error is amplified when the nonlinear coordinate conversion is performed, resulting in the positioning accuracy between the estimated position of the measured point and the actual position. difference. In addition, for a sample test piece that requires long-term continuous observation, once the sample test piece is removed from the original detection device, an image misalignment occurs when the observation piece is moved again. It is not conducive to the comparison of the time before and after the sample changes.

The disclosure relates to an optical device having a sample detecting device and a position detecting device. The device simultaneously obtains the test information of the sample and the corresponding address information to address the test result and location of all the sample points on the sample. The present disclosure provides a carrier having an optical addressing function. The carrier is capable of addressing the sampled sample image detection result to a corresponding address code of the carrier code region.

According to an embodiment of the present disclosure, a carrier carrying a sample is proposed. The carrier includes a body of the carrier, a detection zone on the body, and a coding zone. The sample is carried in the detection zone. The coding region includes at least one coded microstructure located on or in the body, the coded microstructure having a size of at least less than 100 microns. The plurality of sample sample images obtained from the detection zone may correspond to a plurality of address codes of the coding region, and all relative positions between each sample sample image and its corresponding address code are the same.

According to an embodiment of the present disclosure, a carrier carrying a sample is proposed. The carrier includes a plurality of detection zones on the surface of the carrier and a plurality of coding zones. The sample is carried in multiple detection zones. A plurality of coding regions are interleaved with a plurality of detection regions. The plurality of sample sample images obtained for each detection zone may correspond to a plurality of address codes of each code region, and all relative positions between each sample sample image and its corresponding address code are the same.

According to another embodiment of the present disclosure, an address of a sample carrier is proposed Addressing method. The sample carrier has at least a coding zone and a sample detection zone. The moving scanning beam is aimed at the target address encoding section of the coding region. The address encoding section is scanned to decode the sector address code of the address encoding section in which the address is located. Comparing the sector address code of the address coding section and the sector address code of the target address coding section, where the sector address code of the address coding section and the sector address code of the target address coding section are compared Differently, after estimating the required fine-tuning distance, the scanning beam is moved, and the address encoding section is scanned again to decode the sector address code of the address encoding section. When the sector address code of the address coding section is the same as the sector address code of the target address coding section, the scan target address coding section generates a clock signal, which triggers the corresponding sample image signal of the sample detection area.

According to an embodiment of the present disclosure, a sample image sampling method of a sample carrier is proposed. The sample carrier has a microstructured region comprising a groove and a track or a microstructured region of light and dark interphase stripes and a sample detection zone, the sample being carried in the sample detection zone. A beam of light is used to scan the microstructured regions of the trenches and tracks or the microstructured regions of the light and dark stripes to generate a clock signal to trigger sampling of corresponding sample image signals in the sample detection zone. The sample in the sample detection zone is scanned by another beam, sampled, processed, and the corresponding sample image is generated.

The above described features and advantages of the present invention will be more apparent from the following description.

1, 2‧‧‧ Optical equipment

10, 20, 30, 40, 50, 60, 70, 80‧‧‧ optical devices

12, 12-1, 12-2, 22, 32, 42, 52, 62, 72, 82, 92-1, 92-2, 92-3, 92-4‧‧‧

12A, 22A, 32A, 42A, 52A, 62A, 72A, 82A, 272A, 274A, 920A, 922A, 924A, 926A, 2760A‧‧‧ detection area

12B, 22B, 32B, 42B, 52B, 62B, 72B, 82B, 272B, 274B, 920B, 922B, 924B, 926B, 2760B‧‧‧ coding area

102, 142, 202, 242, 302, 342, 402, 442, 502, 542, 602, 742, 842 ‧ ‧ light source

104, 144, 204, 244, 304, 344, 404, 444, 504, 544, 604, 644, 704, 744, 804, 844 ‧ ‧ sensors

106, 146, 206, 246, 306, 346, 406, 446, 506, 546, 606, 646, 706, 746, 806, 846 ‧ ‧ splitter components

110, 140, 210, 240, 310, 340, 410, 440, 510, 540, 610, 640, 710, 740, 810, 840 ‧ ‧ objective lens

108, 208‧‧ ‧ actuator

121‧‧‧ track

123‧‧‧ditch

160, 260‧‧ ‧ controller

180, 280‧‧ ‧ processing module

182, 282‧ ‧ processing unit

184, 284‧‧‧ arithmetic

186, 286‧‧‧ storage unit

643, 843‧‧‧ quarter wave board

2600‧‧‧Substrate

2610‧‧‧Positive photoresist layer

2610A‧‧‧ patterned positive photoresist layer

2620‧‧‧Address Code Section

2620a‧‧‧First track

2620b‧‧‧second track

2620c‧‧‧first ditch

2620d‧‧‧second ditch

271‧‧‧ surface

272, 274‧‧‧ test strips

273‧‧‧ top surface

2740, 2760‧‧‧ subjects

2742‧‧‧ cell culture container

276‧‧‧Microtiter plate

2762‧‧‧Microwell

2764‧‧‧Adjacent areas

2771‧‧‧First coding area

2772‧‧‧Second coding area

B1, B2‧‧‧

C1, C2, C3‧‧‧ coding location

L1, L2‧‧‧ beams

m‧‧‧Microstructure

P1, P2‧‧‧ specimen position

S1, S2‧‧‧ Optical Signal

S‧‧‧sample/sample

X1~X4‧‧‧ position

X, Y, Z‧‧ Direction

1 to 3 are schematic views of optical devices in accordance with various embodiments of the present disclosure.

4 to 9 are schematic views of an optical device and a test strip according to various embodiments of the present disclosure.

10A-10D are schematic views of a test strip according to various embodiments of the present disclosure.

FIG. 11 is a top plan view of a test piece according to an embodiment of the present disclosure.

FIG. 12 is a schematic diagram of a second light beam being focused on different positions of a test strip according to an embodiment of the present disclosure.

FIG. 13 is a schematic diagram showing the intensity of the second light signal corresponding to the second light beam being focused on the different tracks in the interval B2 of FIG. 11 .

14-15 are schematic diagrams showing scan paths of optical devices in accordance with various embodiments of the present disclosure.

16 is a flow chart of an optical addressing method in accordance with an embodiment of the present disclosure.

Figure 17 shows the mapping between the detection zone and the region of interest in the coding zone and the scanning of the two regions.

Figure 18 shows an image segment in which the scan range includes the region of interest.

Figure 19 shows the scanning direction of the scanning beam of the groove and the track with respect to the address encoding section and the chord waveform signal obtained after the scanning.

Figure 20 shows that the code is divided into a plurality of address coded sectors and a sector address code.

FIG. 21A shows an embodiment of the present invention. The coding region is composed of a track/channel microstructure with a barcode, and the clock signal is obtained through the decoding microstructure, and the image is captured according to the clock signal.

21B shows that the coding region is encoded by a strip according to an embodiment of the present disclosure. The track/trunk microstructure of the code is obtained by decoding the microstructure to obtain a clock signal and a segment address code, and capturing an image according to the clock signal.

21C shows a flow chart of an address addressing method in accordance with an embodiment of the present disclosure.

Fig. 22A is an example of "interlaced 25 code" coding.

Fig. 22B shows a symbol table of "interlaced 25 code".

Figure 23 shows the bar code of the section number (X77, Y33) in the special case where eight adjacent thick lines are arranged together.

Fig. 24 shows a spacer in which a plurality of black and white thin lines are placed between the X-direction data barcode area and the Y-direction data barcode area of the barcode.

Figure 25 shows the same group of data barcode areas repeated in the barcode.

Fig. 26A is an example of binary coded "0" and "1" codes.

Figure 26B shows the address encoding rules for the address encoding section.

An example of the binary address encoding shown in Fig. 26C is that the sector number of the address encoding section is (X5, Y5).

27A-27C illustrate fabrication steps for fabricating a code region or an address code segment using a yellow lithography process.

Figures 28A-28B show different types of carriers with detection and coding zones.

Figure 29 is a schematic illustration of a microtiter plate having coding regions positioned on different focal planes.

1 to 3 are schematic views of optical devices in accordance with various embodiments of the present disclosure. Referring first to FIG. 1 , the optical device 1 includes an optical device 10 , a controller 160 , and a processing module 180 . Controller 160 is, for example, a circuit that includes actuator 108. The optical device 10 includes a sample detecting device and a position detecting device. The sample detecting device includes a first light source 102, a first sensor 104, a first beam splitting element 106, and a first objective lens 110. The position detecting device includes a second light source 142, a second sensor 144, a second beam splitting element 146, and a second objective lens 140.

The optical device 1 can be used to detect a test strip 12 comprising a detection zone 12A and a coding zone 12B. In one embodiment, the detection area 12A has a sample S, and the detection area 12A has a plurality of detection positions (not shown), and the code area 12B has a plurality of coding positions (not shown). The first light source 102 is focused on the sample S through the first objective lens 110, and the second light source 142 is focused on the code region 12B through the second objective lens 140. The first light source 102 and the second light source 142 are simultaneously focused. The first beam splitting element 106 and the second beam splitting element 146 are, for example, a dichroic mirror. As shown in FIG. 1, the first light splitting element 106 can be applied to reflect the first light source 102 to the first objective lens 110 and then focus on the detection area 12A, and the second light splitting element 146 is applied to reflect the second light source 142 to the second objective lens 140. Focusing on the coding area 12B.

In one embodiment, the first light source 102 provides a light beam having a first wavelength, and the second light source 142 provides a light beam having a second wavelength. The first wavelength and the second wavelength may be the same or different, and are not limited. When the first wavelength is the same as the second wavelength, the first light source 102 and the second light source 142 can be integrated into a single light source to save space and cost. When the first wavelength is different from the second wavelength, it can be separately checked The characteristics of the measurement area 12A and the coding area 12B provide a light source of a suitable wavelength. For example, when the specimen is a fluorescently labeled biological sample, the first wavelength of the first source 102 needs to be a specific wavelength at which such a fluorescent marker can be excited. However, the first wavelength of the first light source 102 is not necessarily suitable for detecting the code region 12B. Therefore, the first light source 102 and the second light source 142 are independent light sources, which can improve the application range of detection and addressing.

In this embodiment, the encoding position includes position encoding information of different reflectances or different optical polarization directions. As shown in FIG. 1 , the controller 160 controls the first light beam L1 of the first light source 102 to focus on a plurality of detection positions to generate a plurality of first optical signals S1 respectively, and the first optical signals S1 can pass the first splitting light. Element 106 is passed to first sensor 104. In addition, the controller 160 can control the second light beam L2 of the second light source 142 to focus on the plurality of code positions to generate a plurality of second light signals S2, and the second light signals S2 can pass through the second light splitting element 146 and transmit To the second sensor 144.

In this embodiment, the actuator 108 is disposed on the first objective lens 110 and the second objective lens 140 for receiving the controller 160 to command the movement of the first objective lens 110 and the second objective lens 140. The first objective lens 110 and the first objective lens 110 The relative positions of the two objective lenses 140 are fixed. Therefore, displacement between the first objective lens 110 and the second objective lens 140 and the test piece 12 can be generated, thereby obtaining a plurality of sample information and coded information. It should be noted that each of the detection positions of the first light beam L1 is in focus with a corresponding position of the second light beam L2, and the controller 160 controls the first objective lens 110 and the second objective lens 140. When the focus position moves at the same time, the relative position of the fixed does not change. The processing module 180 can then follow the first optical signals The number S1 and the second optical signals S2 calculate the addressing information of the sample.

As shown in FIG. 1 , the processing module 180 can include a processing unit 182 , an operator 184 , and a storage unit 186 . The processing unit 182 is coupled to the first sensor 104 and the second sensor 144. The processing unit 182 is, for example, a microprocessor or a processor. The arithmetic unit 184 is, for example, a computer or a central processing unit (CPU). The storage unit 186 is, for example, a memory, a magnetic tape, a magnetic disk, or a compact disk. The storage unit 186 is selectively disposed and coupled to the computing unit 184.

In this embodiment, the operator 184 commands the controller 160 to adjust the focus positions of the first objective lens 110 and the second objective lens 140. Further, the controller 160 controls the scan path of the first light beam L1 of the first light source 102 to pass through the detection position, so that the incident first light beam L1 is reflected by the first light signals S1. At the same time, the controller 160 controls the scanning path of the second light beam L2 of the second light source 142 to pass through the encoding position, so that the incident second light beam L2 is reflected by the encoding positions to the second optical signals S2. Then, the processing unit 182 receives the first optical signal S1 and the second optical signals S2, and the relative position between each sample position and the code position corresponding to the sample position is fixed, so The received first optical signal S1 generates a sample information, and generates a position information corresponding to the sample information according to the received second optical signal S2. Then, the operator calculates the address information of the sample based on the location information. The storage unit 186 can receive and store the addressing information.

Referring to FIG. 2, the optical device 2 includes an optical device 20, a controller 260, and a processing module 280. Controller 260 is, for example, a circuit that includes actuator 208. The optical device 20 includes a sample detecting device and a position detecting device, and the detecting device package The first light source 202, the first sensor 204, the first beam splitting element 206, and the first objective lens 210 are included. The position detecting device includes a second light source 242, a second sensor 244, a second beam splitting element 246, and a second objective lens 240.

The optical device 2 can be used to detect a test strip 22 comprising a detection zone 22A and a coding zone 22B. The processing module 280 can include a processing unit 282, an arithmetic unit 284, and a storage unit 286. The processing unit 282 is coupled to the first sensor 204 and the second sensor 244. The optical device 2 includes elements and a method of detecting the detecting piece 22 in close proximity to the optical device 1, except that the controller 260 is used to control the movement of the entire optical device 20 such that displacement between the optical device 20 and the detecting piece 22 is caused. According to the results of multiple sample information and coding information. The controller 260 controls the actuator 208 to move the entire optical device 20 such that the entire optical device 20 can move in one direction perpendicular to the optical axis of the first light beam L1 of the first light source 202, and along parallel to the first light source The first light beam L1 of 202 moves in one of the optical axes to scan the slice 22. Then, the processing module 280 can then obtain the sample inspection result and the corresponding address information of the sample according to the first optical signal S1 and the second optical signals S2.

As shown in FIG. 3, the optical device 3 includes an optical device 20, a controller 260, and a processing module 280. The optical device 3 is similar to the optical device 2. The same elements between the optical device 2 and the optical device 3 are denoted by the same reference numerals, and the similarities are not repeated here. The difference between the optical device 3 of FIG. 3 and the optical device 2 of FIG. 2 is that the actuator 308 is for controlling the object to be tested 22 such that the slice 22 can follow the first light beam L1 perpendicular to the first light source 202. The optical axis moves in one of the directions and moves in a direction parallel to the optical axis of the first light beam L1 of the first light source 202.

4 to 9 are schematic views of an optical device and a detected test piece according to different embodiments of the present disclosure. Referring to FIG. 4, the optical device 30 includes a sample detecting device and a position detecting device. The sample detecting device includes a first light source 302, a first sensor 304, a first beam splitting element 306, and a first objective lens. 310. The position detecting device includes a second light source 342, a second sensor 344, a second beam splitting element 346, and a second objective lens 340. The optical device 30 can be replaced with the optical device 10 or the optical device 20 described above to be applied to the optical devices 1 to 3.

The optical device of the application optics 30 can be used to detect a patch 32 that includes a detection zone 32A and a code zone 32B. The optical device 30 includes an element and a method for detecting the detecting piece 32 in close proximity to the optical devices 10 and 20, with the difference that the positions of the first light source 302 and the first sensor 304 of the optical device 30 are mutually exchanged, and the second light source is exchanged. The positions set by 342 and the second sensor 344 are interchanged. Therefore, the transmission paths of the first optical signal S1 and the second optical signal S2 are different from the optical device 10 of FIG. 1 and the optical device 20 of FIGS. 2 to 3.

Referring to FIG. 5 , the optical device 40 includes a sample detecting device and a position detecting device. The sample detecting device includes a first light source 402 , a first sensor 404 , a first beam splitting component 406 , and a first objective lens 410 . . The position detecting device includes a second light source 442, a second sensor 444, a second beam splitting element 446, and a second objective lens 440. The optical device 40 can be replaced with the optical device 10 or the optical device 20 described above to be applied to the optical devices 1 to 3.

The optical device of the application optics 40 can be used to detect a test strip 42 that includes a detection zone 42A and a coding zone 42B. Optical device 40 includes components The method of detecting the test strip 42 is very close to the optical device 30, with the difference that the positions of the first light source 402 and the first sensor 404 of the optical device 40 are interchanged. Therefore, the transmission path of the first optical signal S1 is different from that of the optical device 30 of FIG.

Referring to FIG. 6 , the optical device 50 includes a sample detecting device and a position detecting device. The sample detecting device includes a first light source 502 , a first sensor 504 , a first beam splitting component 506 , and a first objective lens 510 . . The position detecting device includes a second light source 542, a second sensor 544, a second beam splitting element 546, and a second objective lens 540. The optical device 50 can be replaced with the optical device 10 or the optical device 20 described above to be applied to the optical devices 1 to 3.

The optical device of the application optics 50 can be used to detect a test strip 52 comprising a detection zone 52A and a coding zone 52B. The optical device 50 includes components and methods of detecting the test strip 52 in close proximity to the optical device 30, with the difference that the positions of the second light source 542 and the second sensor 544 of the optical device 50 are interchanged. Therefore, the transmission path of the second optical signal S2 is different from that of the optical device 30 of FIG.

Referring to FIG. 7 , the optical device 60 includes a sample detecting device and a position detecting device. The sample detecting device includes a first light source 602 , a first sensor 604 , a first beam splitting component 606 , and a first objective lens 610 . . The position detecting device includes a second sensor 644, a second beam splitting element 646 and a second objective lens 640. The optical device 60 can be replaced with the optical device 10 or the optical device 20 described above to be applied to the optical devices 1 to 3.

The optical device of the application optics device 60 can be used to detect a test strip 62 that includes a detection zone 62A and a coding zone 62B. The optical device 60 includes components and methods of detecting the test strip 62 that are in close proximity to the optical devices 10 and 20, with the difference being optical. The device 60 is only provided with the first light source 602, while omitting the setting of the second light source. That is to say, the first light sources 102 and 202 and the second light sources 142 and 242 of the optical devices 10 to 20 of FIGS. 1 to 3 are integrated into a single first light source 602, thereby saving space and cost. In addition, the second beam splitting element 646 of this embodiment is, for example, a Polarization Beam Splitter (PBS), and the quarter wave plate 643 is disposed between the second beam splitting element 646 and the second objective lens 640. The energy efficiency of the second optical signal S2 that is transmitted back to the second sensor 644 can be improved.

Referring to FIG. 8 , the optical device 70 includes a sample detecting device and a position detecting device. The sample detecting device includes a first sensor 704 , a first beam splitting component 706 , and a first objective lens 710 . The position detecting device includes a second light source 742, a second sensor 744, a second beam splitting element 746, and a second objective lens 740. The optical device 70 can be replaced with the optical device 10 or the optical device 20 described above to be applied to the optical devices 1 to 3.

The optical device of the application optics 70 can be used to detect a test strip 72 that includes a detection zone 72A and a coded zone 72B. The optical device 70 includes elements and methods of detecting the test piece 72 that are in close proximity to the optical devices 10 and 20, with the difference that the optical device 70 only provides the second light source 742, omitting the arrangement of the first light source. That is, the first light sources 102 and 202 and the second light sources 142 and 242 of the optical devices 10 and 20 of FIGS. 1 to 3 are integrated into a single second light source 742, thereby saving space and cost.

Referring to FIG. 9 , the optical device 80 includes a sample detecting device and a position detecting device. The sample detecting device includes a first sensor 804 , a first beam splitting component 806 , and a first objective lens 810 . The position detecting device includes a second light source 842 and a quarter wave plate 843. The second sensor 844, the second beam splitting element 846, and the second objective lens 840. The optical device 80 can be replaced with the optical device 10 or the optical device 20 described above to be applied to the optical devices 1 to 3.

The optical device of the application optics 80 can be used to detect a patch 82 that includes a detection zone 82A and a code zone 82B. The optical device 80 includes components and methods of detecting the patch 82 that are in close proximity to the optical devices 10 and 20, with the difference that the optical device 80 only provides the second light source 842, omitting the arrangement of the first light source to save space and cost. In addition, the second beam splitting element 846 of this embodiment is, for example, a polarization beam splitter, and the quarter wave plate 843 is disposed between the second beam splitter 846 and the second objective lens 840, which can be improved back to the first The energy efficiency of the second optical signal S2 of the second sensor 844.

10A-10D are schematic views of a test piece according to different embodiments of the present disclosure. Each of the test pieces 92-1~92-4 has detection areas 920A-926A and coding areas 920B-926B, which can be applied to any implementation of the present disclosure. For example, the optical device 10~80. Referring to FIG. 10A, a plurality of coding positions C1 to C2 of the coding region 920B of the slice 92-1 may respectively correspond to a plurality of microstructures m, for example, holes having a plurality of specific manners, and the specific arrangement is Related to location coding. Further, when the focus position of the first light source is moved from the sample position P1 to the sample position P2, the focus position of the second light source is correspondingly moved from the code position C1 to the code position C2, and the sample position P1 and the code position C1 The distance d1 between the two is the same as the distance d2 between the sample position P2 and the code position C2.

Referring to FIG. 10B, the slice 92-2 is similar to the slice 92-1, and the difference is The plurality of microstructures m corresponding to the plurality of coding positions C1 to C2 are arranged in a specific manner in a circular hole and a long hole. Of course, the microstructure m may also be a hole or a groove (not shown) of other shapes, and is not limited. Referring to FIG. 10C, the plurality of micro-structures m corresponding to the plurality of coding positions C1 to C2 may also be a structure in which a plurality of groove tracks and holes (including round holes or long holes) are mixed. Referring to FIG. 10D, the plurality of micro-structures m corresponding to the plurality of coding positions C1 to C2 may also be a plurality of groove tracks, and each of the groove tracks is provided with a plurality of coding structures or position coding information.

In another embodiment, the plurality of coding positions C1 C C2 may also correspond to a plurality of position coded information with different reflectances or different optical polarization directions. In other words, the coding positions C1 to C2 are not limited to the microstructures of FIGS. 10A to 10D, and signals of different light intensities may be generated as long as the light beams are irradiated to the coding positions C1 to C2. In other words, as long as the beam is focused on different coding positions, the reflection is a plurality of optical signals, and the energy of the optical signals is different, and the form of the coding position is not limited.

FIG. 11 is a top plan view of a test piece according to an embodiment of the present disclosure. Hereinafter, the optical device 1 of FIG. 1 will be taken as an example to describe a specific method for the optical device 1 to detect and address the slice 12. Referring to FIG. 1 and FIG. 11 together, the detecting piece 12 (for example, a detecting test piece) has a coding area 12B having a plurality of coding positions C1 C C3, for example, corresponding to the groove 123 and the track 121 having a plurality of microstructures. . The controller 160 controls the second light beam L2 of the second light source 142 to scan the coding structure of each of the grooves 123 and the tracks 121 to obtain position coded information. Moreover, the controller 160 controls the beam to scan across the groove 123 and the track 121 to obtain a cross-track information.

In an embodiment, different coding structures are arranged on different grooves 123 and tracks 121 in the coding area 12B according to the coding mode, and the coding structure on each track is along the Y-axis direction of the slice 12 (ie, The track direction of the groove 123 and the rail 121 is distributed in the section B1, and the section B2 at both ends of the track is not provided with the coding structure.

FIG. 12 is a schematic diagram of a light beam focused on different positions of the patch 12 according to an embodiment of the present disclosure. As shown in FIG. 12, when the first light beam L1 is moved from the first position X1 to the second position X2, the second light beam L2 is correspondingly moved from the third position X3 to the fourth position X4, and the first position X1 is The distance between the third position X3 is equal to the distance between the second position X2 and the fourth position X4.

FIG. 13 is a schematic diagram showing the intensity of the second optical signal S2 corresponding when the second light beam L2 is focused on the interval B2 of FIG. 11 and spans different tracks along the X-axis direction of the slice 12. Referring to FIG. 13, when the second light beam L2 is focused on the interval B2 and spans different tracks along the X-axis direction of the slice 12, the second sensor 144 (shown in FIG. 1) senses the position information. The light intensity will have the strongest signal when the second beam L2 is focused on the rail 121. When the second light beam L2 is focused on the groove 123 between the two adjacent land 121, the second sensor 144 senses that the light intensity representing the position information has the weakest signal. strength. By the difference in light intensity representing the position information, the position of the groove track in which the second light beam L2 is focused can be derived. And, by counting the light intensity waveforms representing the position information, the number of cross rails can be estimated. Further, during the scanning process (for example, the second light beam L2 is moved along the Y-axis direction of the slice 12), the position information light intensity can be maintained at the strongest or the weakest by servo control. Know the groove and track of this scan Specific location. And by reading the position coding structure on the groove track, the accurate addressing information can be obtained through decoding.

14-15 are schematic diagrams showing scan paths of optical devices in accordance with various embodiments of the present disclosure. Referring to FIG. 14 first, the second light beam L2 may be scanned from one end of the groove track of the coded area 12B to the other end, then folded back according to the original path, and cross-tracked in the interval B2 of the coded area 12B, and then repeated above. Scan action. Referring to FIG. 15, the second light beam L2 may also be scanned from one end of the groove track of the coded area 12B to the other end, cross-tracked in the interval B2 of the coded area 12B, and then scanned from the end of the position-coded groove track in the opposite direction to At the other end, the above-described S-shaped cross-track and scanning operations are repeated.

In this embodiment, the planning of the scan paths of the slices 12-1 and 12-2 may be performed along the track structure of the groove track of the code area 12B, or may be along the groove structure of the groove track of the code area 12B. To scan. In addition, the groove pitch of the groove track of the coding area 12B can be shortened to improve the scanning resolution (ie, the density of image or signal sampling points), or the groove of the groove track of the coding region 12B of FIGS. 14-15. The track is also filled with the position coding structure. At this time, the scanning resolution of the signal will be twice the scanning resolution of the coding area 12B originally shown in FIGS. 14-15.

16 is a flow chart of an optical addressing method in accordance with an embodiment of the present disclosure. First, the test piece is carried first. Next, step S400 is performed to move the light beam to the detection area and the coding area of the slice using the controller. Then, step S410 is performed to perform an action across the groove track. Step S420 is executed to lock the groove track. Step S430 is performed to perform scanning. Step S440 is performed to obtain the sample information and the location information. Go to step S450, Store sample information and location information. Next, step S460 is performed to perform a determining step to confirm whether to perform the next groove track scanning. If yes, the process returns to step S410. If no, step S470 is performed to perform position decoding, image processing, reconstruction, and display. Finally, uninstall the test piece. Of course, the optical addressing method disclosed in the foregoing embodiments can be used without limitation.

The optical device and the addressing method disclosed in the above embodiments disclose a light beam projected on a sample of a detection area of a slice to perform image capturing or signal detection, and are adjacent to a coding area of the detection area on the slice. Another beam is projected in this coding area to obtain position information. Since the two beams are adjacent and synchronously moved, the sample information of each sampling point has a corresponding position information, so that the image or signal represented by the sample information has the addressing feature. In addition, the measured point can be any position and can take image or signal detection for multiple measured points, and even multiple detections of the same position can be used to eliminate random noise by processing the average of these detections. , the result of producing a high signal noise ratio (S/N) value. Or, in the case where the signal is weak, a long-time integral superposition is performed to obtain sufficient energy but no result of positional offset. Through the registration method, small-scale images can be spliced out of a wide range of images without reducing the resolution.

In addition, since the two beams of the detection area and the coding area are adjacent and synchronously moved, the relationship between the position information obtained by measuring the optical signal reflected by the beam of the coding area and the position of the actual actual measured point is simple. And linear, the error accumulation is small and the positioning accuracy is high; and because the detection area and the coding area are simultaneously located in the same test piece or test piece (bearing On the container, even if it leaves the original detection device midway, it will be traceable when it is moved in again, and there will be no image misalignment, which is very convenient for time-change comparison of the sample, and image or signal processing. Furthermore, the optical device of the above embodiment, in addition to being used for optical detection, can also be applied to optical operations such as optical therapy, laser light clamps, etc., to provide assistance in precise positioning required for the operation process.

In addition, using the coding principles of the barcode or the optical disc, the above address codes can be designed as an address coding structure or an address coding microstructure. That is, the address code can be obtained by decoding (or reading) the code or data stored by the address-encoding microstructure, and the address-coded microstructure may result in different optical signals depending on the design of the barcode or the optical disc.

The bar code can be used as a medium with storage capacity, consisting of rectangular black lines of different thicknesses (typically varying in the millimeter range) and blank lines parallel to the black lines. Although bar codes have different coding principles, bar codes basically consist of four parts: (1) start code, (2) data code, (3) check code to ensure data accuracy, and (4) termination code. Take 39 code (code 3 of 9, code 39) as an example, that is, a character consists of 5 black lines (bar) and 4 white (space) lines (space) for a total of 9 lines, of which 3 The strip is a thick line. An optical reading device (usually a laser or CCD scanner) uses the difference between the low and high reflections of the scanned black line (low reflectivity) and the white line (high reflectivity) to generate pulse waves of different time widths to distinguish The difference between one or more symbols, the message on the barcode is interpreted.

Optical discs are another kind of media that can provide huge storage capacity. quality. The recording principle of the optical disc is to record data in a pit pattern which is spirally distributed on the polycarbonate substrate. When reading data, the laser light is focused on the surface of the disc by the objective lens, and the intensity of the reflected light caused by the focused laser spot irradiated on the recording area and the non-recording area is different, and can be used to discriminate the change of the read pit. And converted to data. Light reflected from the disc will be incident on the detector. Usually a quadrant detector is used. The detector converts the optical signal into an electrical signal. Using the electrical signals of each part of the 4-point detector, mathematical operations can further obtain focus and tracking error information. The focusing error signal (FES) is generally generated by an astigmatic focusing detection method, which subtracts the sum of the signals of the two diagonal portions from the sum of the signals of the two diagonal portions of the other direction. One of the most common methods for tracking error signals (TES) is to use the "push-pull method" to generate re-writable or recordable. TES of the disc. When the focused beam output from the optical pickup objective lens is incident on the groove track structure of the optical disk, the reflected beam will include 0th order, -1st order, +1st order, and higher order beams. The groove structure of a disc is like a grating. However, due to the limited aperture of the objective lens, only the 0th order beam and some of the -1st order and +1st order beams can be collected by the objective lens. The reflected beam will be projected onto a quad detector, and the -1st beam and the +1st order beam will interfere with the 0th order beam because of the different phase from the 0th order beam. In general, the -1st order beam is incident on two adjacent parts of the 4-point detector, and the +1st order beam is incident on the other two adjacent parts of the 4-point detector. The signal difference between these two parts is called "push-pull signal". The sum of all the signals on the 4-point detector is called the "cross-track signal". For all discs, such as DVD or Blu-ray discs, basically these The definition of the law and the signal are almost the same. For more information on optical storage, reference is made to the book "Optical Recording: A Technical Overview, Addison-Wesley, 1990" and U.S. Patent No. 5,946,287 and U.S. Patent No. 6,629,070.

For biomedical or biological applications, the size of the observed target or sample can range from a few nanometers to tens of microns, and the resulting image should have an resolution of at least a few hundred nanometers. In the present disclosure, the size of the address-coding structure in the coding region should be less than 1 mm and can be changed depending on the structural size of the sample. If used to encode a sample of cell size, the size of the coding structure must be at least less than 100 microns, for example, the mammalian cell size is about 10 to 50 microns. For samples of cell size, the size of the coding structure must be less than one micron.

Figure 17 shows the mapping between the detection zone and the Region of Interest (ROI) in the coding zone and the beam used to scan the two regions. As shown on the left side of Fig. 17, after selecting the region of interest for image observation in the sample, the region of interest Rs (marked by the solid line) of the sample can be made to correspond to the servo mechanism of the optical device as described above. The servo pattern Ra (marked by a dashed line) to the coding area opposite thereto. As shown in the right part of FIG. 17, the light beam L1 of the sample detecting device and the light beam L2 of the position detecting device are respectively focused on the detecting area 12A and the encoding area 12B, and the image signal and the slave encoding area are extracted from the detecting area 12A. The address read by 12B can be synchronized by the servo mechanism of the above optical device.

Figure 18 shows an image segment in which the scan range includes the ROI. As shown in Fig. 18, the servo pattern Ra (dashed mark) corresponding to the coding area of the ROI can be drawn Divided into multiple cell blocks (ie, address coded segments) Bi (marked with thick lines), and the smallest unit of the image segment (eg, image segment (i, j)) is defined for each address coded segment, and used Take the ROI. That is to say, with the small image segment (i, j), it is possible to capture the sample image of the ROI only by scanning a specific segment (the scanning segment marked with a solid line), which helps to more quickly, Capture images more accurately.

Similar to the principle of bar code, in order to locate the captured image, each image segment can be defined as a single variable sector, such as segment 1, segment 2, etc., or defined as containing one. A section of the above variables, such as a section (1, 1), a section (1, 2), etc. Recording the segment code in the microstructure of the address encoding section provides at least two functions: (i) recording the address code (segment code) of the image segment, and (ii) providing the clock signal as 撷Take the time base of the sample image pixels.

In particular, the encoded microstructure of the address encoding section can be compiled into a sector address code (eg, an image sector number) of the encoding region. Moreover, by decoding the coded microstructure, a clock signal corresponding to the sample image signal in the sampling detection area can also be obtained.

Figure 19 shows the scanning direction of the scanning beam relative to the grooves and tracks in the address encoding section and the waveform signal obtained by the scanning. As shown in FIG. 19, when a Gaussian beam is incident on an address coding section having a track microstructure (including a bar code signal) and is scanned in a direction perpendicular to the direction in which the groove extends (as indicated by an arrow), A photodetector can be used to capture the signal reflected from the track microstructure. Among them, the photodetector can detect the diffracted light of 0th order, +1st order, and -1st order. The photodetector described herein is, for example, a second sensor included in the position detecting device, which can be used to capture a position signal. The photodetector described herein is, for example, a 4-point detector. Due to the 0th order diffracted light The diffracted lights of +1st order and -1st order have a phase difference with each other, so interference occurs. These interference signals can generate a push-pull signal after mathematical operations. As shown in the middle of Fig. 19, it is a sine wave signal obtained by mathematically calculating the diffraction signal received by the 4-point detector. The chord signal can also be further converted into a square wave signal by the comparator, as shown in the lower part of FIG. The difference between the frequency and the amplitude of the signal can be used to solve the data of the currently scanned address code segment (ie, segment (i, j)). In addition, the sine wave signal or square wave signal of the push-pull signal can also be used to generate a clock signal to accurately trigger the synchronization circuit, so that another photodetector can perform sample (sample) image sampling in the detection area. Another photodetector described herein is, for example, a first sensor included in the sample detecting device, which can be used to capture a sample (sample) image signal. Another photodetector described herein is, for example, an avalanche photo-diode (APD) or a photomultiplier tube (PMT).

Code area embodiment

Example 1

The address coding section is a cell block of the coding area. As shown in FIG. 20, each cell block has a specific sector number: (X a , Y b ), where X a represents the X direction. The a- th block, Y b represents the b- th block in the Y direction. Therefore, the detection area in which the sample (sample) is located can be divided into a plurality of detection sections of the same size and each has a corresponding address coding section. When the optical device scans the microstructure of the address encoding section by using the beam of the position detecting device (laser beam) and decodes the data of the address encoding section in the encoding area, the specimen of the optical device at the same time The detecting device can obtain the image information of the specimen in the detection area and generate a complete image.

The address encoding section is a microcoded address code of the section. Here, the track/groove microstructure of the address coding section is illustrated by the coding principle of "interlaced 25 code" as an example, as shown in FIGS. 21A-21B, and how the optical device is included (the optical device included in the aforementioned optical device) The controller and the processing module, in which the optical read head, the decoding module and the image image generating module are included in the implementation, the information in the track/groove microstructure is read to generate the clock signal. And the segment address code, and further extract sample signals located at different positions in the detection area and generate images.

According to an embodiment of the present disclosure, FIG. 21A shows that the address encoding section is mainly composed of a linear track/groove microstructure having a fixed period, and the sector address code is arranged by the "interlaced 25 code" coding principle. And incorporated into the linear track/groove microstructure with a fixed period, so that a small portion of the linear track/groove microstructure will be wider, for example, 2 times wider, so the overall structure is similar to the grating structure. The lower half and the middle portion of Fig. 21A show a cross-sectional view and a top view, respectively, of the address coded segment microstructure. The image sampling method uses a beam (L2 in Figure 17) to scan the address-encoded segment linear track/groove microstructure and generate a clock signal. The other beam (L1 of Fig. 17) scans the sample detection area and regularly captures the light intensity signal (sample signal) of the corresponding position according to the clock signal. Finally, the image generation module compares the light corresponding to different positions of the detection area. The sample information of the intensity signal is connected together to produce a complete image.

FIG. 21B discloses that when the beam is in the linear track/groove microstructure of the scanning address encoding section, in addition to generating the clock signal, the segment encoding signal can also be captured and generated, and the segment encoding signal is transmitted through the decoding module. After decoding, the sector address code (X a , Y b ) of the address coding section can be obtained.

21C shows a flow chart of an address addressing method in accordance with an embodiment of the present disclosure. First, start scanning (ie reading). Next, the scanning beam is moved to the coding region and aimed at the target segment N in the ROI, and the (address coded) segment is scanned to decode the segment address code of the segment in which it is located. Then, it is determined whether the sector address code of the sector in which the sector is located is the same as the sector address code of the target sector N. Wherein, when the sector address code of the segment is different from the segment address code of the target segment N, the required fine-tuning distance is estimated and the scanning beam is moved, and the (address-coded) segment is scanned again to decode The segment address code of the zone in which it is located. When the sector address code of the sector is the same as the sector address code of the target sector N, this means that the address coding section is the target address coding section N, and the target area can be scanned by this time. The track/channel microstructure of the segment N generates a clock signal, and another scanning beam samples the sample image signal corresponding to the detection region according to the clock signal to capture a corresponding image of the sample in the detection region. After the corresponding image of the sample in the detection zone is completed, it is determined whether all segments of the ROI have been scanned. If all segments of the ROI have not been scanned, the scanning beam is moved to the next segment and the segment address code for the segment is scanned to capture the sample image. If all the segments of the ROI have been scanned, the processing module will process the image of the ROI and finally complete the scan.

The present case is not limited to the embodiments disclosed above.

Fig. 22A is an example of "interlaced 25 code" coding. The encoding rule shown in FIG. 22A: the thick line represents the bit "1", the thin line represents the bit "0", and the Arabic numeral can be represented by 5 thick black lines plus 5 thin black lines. Or 5 bits consisting of 2 thick white lines plus 3 thin white lines, and the black and white lines intersect to form A series of digital barcodes. For example, the character "3" is composed of a black line "11000", the character "8" is composed of a white line "10010", the character "5" is composed of a black line "10100", and the character "2" is composed of a white line "01001". composition. The start (START) character consists of the black line "00" and the end (END) character consists of the black line "10". Figure 22B shows an interlaced 25-character character table. In the example shown, the thick line width is 2 to 3 times the width of the thin line. However, the thick line width and the thin line width are not within the limit, as long as the thick line or thin line can be distinguished. 21A and 21B, the segment address number is converted into a linear track/groove microstructure by the coding principle of "interlaced 25 code", wherein the groove represents a black line and the track represents a white line; or the groove represents a white line, and the track Indicates a black line.

Here, the encoding rule of the barcode is not limited to the embodiment, any type of one-dimensional encoding rules, such as: Code 39 code, Code 32 code, Code 93 code, Code bar code, interlaced 25 code, industrial 25 code, matrix 25 code. , Code 11 code, Code 128 code, China Post code, UPC code bar code, EAN code bar code, ISBN code bar code, ISSN code bar code, MSI code, etc., or their variants, can be used as this disclosure Addressing coding rules.

The microstructure of the coding region is not limited to a linear track/groove microstructure. In addition, the present disclosure can also adopt a planar pattern similar to a commercial barcode label with a fixed period of light and dark stripes, as long as the matching device can scan and obtain the data of the clock signal and the segment address code.

Example 2

For example, the "interlaced 25-code" encoding rule, when the segment number is (X77, Y33), there will be a special case where 8 consecutive thick lines are adjacent (see Figure 23): X-square The tens digit "7" of the octet is composed of black line 00011, the unit digit "7" in the X direction is composed of white line "00011", and the tens digit "3" in the Y direction is composed of black line "11000". The ones digit "3" in the Y direction is composed of a white line "11000". When these characters are concatenated, it is "00000011111111000000". At this time, there will be 8 thick lines consecutively adjacent to each other. This may cause the device to generate an error when generating the clock signal or interpreting the segment address code, so the most It is good to reduce the number of thick lines adjacent to each other. In this case, a plurality of black and white thin lines may be placed between the X-direction data barcode area and the Y-direction data barcode area to separate the X-direction data barcode and the Y-direction data barcode, and avoid the above-mentioned 8 thick lines continuously. In the case of being adjacent to each other, as shown in the space of FIG.

Example 3

In this embodiment, in order to avoid the situation that the servo coding area is unfortunately contaminated or scratched, and the segment address code of the address coding section cannot be correctly interpreted, the complex array can be repeatedly arranged in the address coding section. The data barcode area of the same sector address code (the data barcode area of the group), the data barcode area of the group includes the X-direction sector address code, the interval area and the Y-direction sector address code. As shown in FIG. 25, repeating the group of data barcode regions of the same segment address code twice ensures the correctness of the segment address code. When the two sets of segment numbers are different, it means that one of them has an error. At this time, the scanning beam can be read again after moving a short distance. Alternatively, the group of data bar codes of the same segment address code may be repeatedly arranged three times, and when at least two of the three groups of segment address codes are identical, the segment address code is correctly decoded.

Example 4

26A and 26B disclose an example of using a digital binary encoding rule as a sector ID code. As shown in the left part of Fig. 26A, the binary data "0" is composed of 12 black and white stripes, wherein the first, fifth, and nine stripes from the left are thick black stripes. As shown in the right part of Fig. 26A, the binary data "1" is composed of 12 black and white stripes, and the first stripe from the left is a thick black stripe. In the present disclosure, the combination of stripes of "0" and "1" of the binary code is not limited to the combination in this embodiment. Of course, this coded stripe can also be represented using a track/groove microstructure.

Fig. 26B illustrates the principle of address information configuration of the address coding section. For example, the sector address code may represent a sector number in the X direction by 4 bits and a sector number in the Y direction in 5 bits. Therefore, 16 sector address codes (in the case of decimal, 0 to 15) can be listed in the X direction, and the sector address code of 32 can be encoded in the Y direction (in the case of decimal, 0 to 31) . Figure 26C shows the linear track/groove microstructure (striped structure) listed in the segment address code (X5, Y5).

In the present disclosure, the address coding section or coding area can be formed into a microstructure using a yellow lithography process, nanoimprinting or injection molding. In one embodiment, the address encoding section or encoding area is fabricated using a yellow lithography process. As shown in FIGS. 27A-C, a substrate 2600, such as a germanium substrate, a glass substrate, or a plastic material substrate, may be provided, and a positive-type photoresist layer 2610 having a thickness d1 is coated on the substrate. Using a photomask (not shown) having a coding pattern as a mask, the positive photoresist layer 2610 is exposed to deep ultraviolet rays. Exposure is performed to form a patterned positive photoresist layer 2610A having the encoded pattern. Finally, a patterned metal reflective layer is overlaid on the patterned positive photoresist layer using vacuum sputtering or evaporation to complete the address encoding section 2620 (located in the encoding region). The metal reflective layer can be made, for example, of gold, silver, aluminum or alloys thereof.

In general, the address encoding section includes one or more microstructures having parallel grooves and a plurality of tracks sandwiched between the parallel grooves, the grooves and tracks being alternately arranged. Wherein, any one of the tracks is located between any two adjacent grooves in the groove, and the widths of the grooves may be the same or different, and the widths of the tracks may be the same or different.

As shown in the cross-sectional view of FIG. 27C, the address encoding section 2620 includes at least a first rail 2620a having a first width w1 and a second rail 2620b having a second width w2, a first trench 2620c having a second width w2, and A second groove 2620d having a first width w1. When the address encoding section 2620 is read or scanned using a scanning beam of wavelength λ, if the thickness d1 of the photoresist layer is approximately 1/4 of the wavelength λ (i.e., d1) λ/4), scanning the address encoding section 2620 can obtain better cross-track signals. For example, when the scanning beam wavelength λ is 650 nm, the thickness d1 is about 160 nm, and the widths w1 and w2 are 350 nm and 700 nm, respectively. If the thickness d1 of the photoresist layer is about 1/8 to 1/6 of the wavelength λ of the scanning beam (ie, d1) λ/8~λ/6), scanning the address coding section can obtain a better push-pull signal.

Alternatively, the photoresist material described above may be a positive or negative photoresist material, and the microstructures formed on the address code segments described above may be designed as rail and trench structures of various widths. Not limited to the manufacturing, materials or design of the coding section The embodiment described above.

The carrier of the present disclosure may be a test strip or a test sheet, such as a pathological test piece, a cell culture chamber slides, a microfluidic chip, a microfluidic plate or a microplate. (the so-called microtiter plate). By providing a design of the coding region on the carrier (slice or microplate) for carrying the sample or in the carrier, the address coding section recorded by the optical scanning device can be referred to, and the sample is provided on the carrier. Absolute address or coordinates. This method is especially useful when multiple scans of the same test strip or carrier are required at different times. This way, you can easily return to any area of interest (ROI) for repeated observation and recording. And when there is a need to replace between different platforms of the optical device, the region of interest can also be quickly detected by inputting the absolute address or coordinates of the sample on the carrier.

Since the coding region is formed on a carrier (slice or microplate) or in a carrier, the carrier for carrying the sample can provide an optical addressing function, while allowing the sampling point detection result for the sample to be addressed to the encoding. The corresponding address code in the address coding section of the area.

Regarding the location of the coding region of the carrier, the detection region does not have to be on the same focal plane as the coding region. Figures 28A-28B show the detection and coding regions of different types of carriers. As shown in FIG. 28A, the detection zone 272A and the coding zone 272B carrying the sample S (such as a tissue section) are located on the same surface (the same focal plane) 271 of the test strip 272. In FIG. 28B, the test strip 274 includes a body 2740 provided with at least one cell culture vessel 2742. Wherein sample S (eg, cultured cells) is located on test strip 274 The upper surface 273 is within the detection zone 274A. However, the address coded microstructure 2750 is embedded within the body 2740 of the test strip 274, wherein the detection zone 274A and the coded zone 274B are located on different focal planes.

Figure 29 shows a bottom view and a cross-sectional view of a microtiter plate having coding regions positioned on different focal planes. In another example, as shown in FIG. 29, the carrier is a microtiter plate 276 having a body 2760 and a plurality of microwells 2762 disposed on the body 2760. The sample S is loaded into the circular microwell 2762, and the detection zone 2760A for carrying the sample S is enclosed within the microwell 2762. The coding region 2760B is located within the adjacent region 2764 of the microwell 2762 and at the bottom of the adjacent region 2764. The coding region 2760B includes a first coding region 2771 and a second coding region 2772 at different focal planes, and the two regions 2771/2772 are buried within an adjacent region 2764 of the microwell 2762.

In an embodiment, the detection zone and the coding zone are located on two different focal planes. In other embodiments, one or more of the code regions may be disposed on different focal planes or on a different focal plane than the detection region. When the position detecting device focuses on the coding regions on different focal planes for addressing, the sample detecting device also focuses on different positions of the samples on different focal planes, thereby realizing layered scanning of the sample structure and three-dimensional structure of the sample. Reconstruction.

The present disclosure has been disclosed in the above embodiments, but it is not intended to limit the disclosure, and any person skilled in the art can make some changes and refinements without departing from the spirit and scope of the disclosure. The scope of protection of this disclosure is subject to the definition of the scope of the appended claims.

S‧‧‧ sample

276‧‧‧Microtiter plate

2760‧‧‧ Subject

2760A‧‧‧Detection area

2760B‧‧‧ coding area

2762‧‧‧Microwell

2764‧‧‧Adjacent areas

2771‧‧‧First coding area

2772‧‧‧Second coding area

Claims (13)

A carrier for carrying a sample, comprising: a plurality of detection zones on the surface of the carrier, wherein the sample is carried in the plurality of detection zones; and a plurality of coding zones, wherein the plurality of coding zones and the plurality of detection zones a staggered configuration; wherein each of the plurality of sample images of the sample on the detection area corresponds to a plurality of address codes of each of the code regions, and a relative position between each sample image and a corresponding address code thereof is the same of. The carrier for carrying a sample according to claim 1, further comprising a plurality of microwells mounted on the main body, respectively surrounding the plurality of detection zones, wherein the plurality of coding zones are located between the plurality of microwells In or on adjacent areas. The carrier for carrying a sample according to claim 2, wherein each of the coding regions comprises a first coding region and a second coding region located on different focal planes, and the first coding region and the second coding region are buried In or on the adjacent region between the plurality of microwells. The carrier for carrying a sample according to claim 3, wherein the first coding region or the second coding region comprises at least one coded microstructure located in the adjacent region between the plurality of microwells or And the at least one coded microstructure of the first coding region or the second coding region is encoded with a segment code. The carrier for carrying a sample according to claim 4, wherein the coding principle of the at least one coding microstructure is selected from Code 39 code, Code 32 code, Code 93 code, Code bar code, interlaced 25 code, and industry 25 Code, matrix 25 code, Code 11 code, Code 128 code, China Post code, UPC specification bar code, EAN code bar code, ISBN code bar code, ISSN code bar code, MSI code or digital binary code rule. The carrier for carrying a sample according to claim 4, wherein the at least one coding microstructure of the first coding area or the second coding area comprises generating a clock signal by scanning, and the clock signal is used for sampling Corresponding sample images in the detection zone. The carrier for carrying a sample according to claim 4, wherein the at least one coded microstructure comprises a plurality of grooves and a plurality of tracks alternately arranged, the plurality of grooves being parallel to each other and the plurality of tracks The rail is located between any two adjacent grooves. The carrier for carrying a sample according to claim 7, wherein the plurality of grooves comprises at least one first groove having a first width and/or at least one second groove having a second width. The carrier for carrying a sample according to claim 7 wherein the plurality of rails comprises at least one first rail having a first width and/or at least one second rail having a second width. An address addressing method for a sample carrier, wherein the sample carrier has at least a coding region and a sample detection region, the sample being carried in the sample detection region, the method comprising: a) moving a scanning beam to target a target address of the coding region Encoding the section; b) scanning the address encoding section to decode the sector address code of the address encoding section of the address; c) comparing the sector address code of the address coding section of the address with the sector address code of the target address coding section, where the sector address code of the location coded section and the target address coding area The segment address code of the segment is different. After the required fine adjustment distance is estimated, the scanning beam is moved, and the address encoding segment of the address is scanned again to decode the segment address code of the coded segment of the address; and d) When the sector address code of the address coding section is the same as the sector address code of the target address coding section, scanning the target address coding section to generate a clock signal, triggering sampling of the corresponding sample in the sample detection area Image signal. The address addressing method of the sample carrier of claim 10, wherein the target address coding section comprises a track and a groove microstructure, and the microstructure of the track and the groove of the target address coded section is scanned. The clock signal is generated. The address addressing method of the sample carrier of claim 10, further comprising scanning a sample in the sample detection zone by another beam, by sampling, processing, and generating the corresponding sample image. The address addressing method of the sample carrier of claim 10, further comprising repeating steps a) through d) a plurality of times to scan a plurality of the address encoding segments in the coding region.