TWI481845B - Processing device for testing sample - Google Patents

Processing device for testing sample Download PDF

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Publication number
TWI481845B
TWI481845B TW101150638A TW101150638A TWI481845B TW I481845 B TWI481845 B TW I481845B TW 101150638 A TW101150638 A TW 101150638A TW 101150638 A TW101150638 A TW 101150638A TW I481845 B TWI481845 B TW I481845B
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Taiwan
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test tube
rotating arm
initial position
processing device
sample processing
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TW101150638A
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Chinese (zh)
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TW201425902A (en
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Sheng Li Chang
Tian Yuan Chen
Kuo Chi Chiu
chu yu Huang
yi ling Wu
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Ind Tech Res Inst
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Priority to TW101150638A priority Critical patent/TWI481845B/en
Priority to CN201310062875.XA priority patent/CN103900866B/en
Publication of TW201425902A publication Critical patent/TW201425902A/en
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Publication of TWI481845B publication Critical patent/TWI481845B/en

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  • Sampling And Sample Adjustment (AREA)

Description

檢測樣品處理裝置Test sample processing device

本揭露是有關於一種處理裝置,且特別是有關於一種檢測樣品處理裝置。The present disclosure relates to a processing apparatus, and more particularly to a detecting sample processing apparatus.

在一般生化檢測分析中,經常會使用到各種不同的操作來進行檢測樣品的處理。在此以檢驗血液為例,檢測人員通常將血球溶液、血漿溶液及相關試劑溶液加入至試管中,並使試管中的溶液混合均勻。接著,會將試管利用離心力的方式作離心沈澱處理,使得血球沈澱於試管底部。之後,先將上清液倒除掉,再加入再懸浮溶液於試管中,並以適當力量去搖晃試管中的液體。此時,檢測人員可利用如顯微鏡來觀測試管中的紅血球凝集的情形,以判讀紅血球凝集或分散的情況。In general biochemical detection and analysis, various operations are often used to perform sample processing. In the case of blood test, the tester usually adds the blood cell solution, the plasma solution and the related reagent solution to the test tube, and mixes the solution in the test tube uniformly. Next, the test tube is centrifuged to precipitate the blood cells at the bottom of the test tube. Thereafter, the supernatant is first removed, and then the resuspension solution is added to the test tube, and the liquid in the test tube is shaken with an appropriate force. At this time, the examiner can use a microscope to observe the agglutination of the red blood cells in the test tube to judge the agglutination or dispersion of the red blood cells.

上述將試劑或待測樣品(如血液)滴入到試管中作混合,接著再經過如離心沈澱、靜置、於顯微鏡下觀測等處理過程。檢測人員通常會利用各種不同的裝置來作上述的動作,例如利用離心機來操作離心沈澱的動作,而震盪器則可晃動試管中的待測樣品,之後還需利用顯微鏡來觀測試管內的待測樣品。The above reagent or sample to be tested (such as blood) is dropped into a test tube for mixing, and then subjected to a process such as centrifugation, standing, observation under a microscope, and the like. The inspector usually uses a variety of different devices to perform the above-mentioned actions, such as using a centrifuge to operate the centrifugal sedimentation, while the oscillator can shake the sample to be tested in the test tube, and then use the microscope to observe the in-tube test. Test the sample.

本揭露提供一種檢測樣品處理裝置,包括一離心馬 達、一旋轉臂以及至少一試管架。旋轉臂耦接於離心馬達。至少一試管架連接於旋轉臂。試管架具有一第一限位部及一復位部,其中第一限位部適於抵觸於旋轉臂,且試管架相對於旋轉臂位於一初始位置。當離心馬達驅動旋轉臂旋轉時,旋轉臂經由復位部帶動試管架相對於旋轉臂轉動,使試管架相對於旋轉臂遠離初始位置。當離心馬達停止驅動旋轉臂旋轉時,復位部受重力影響使試管架相對於旋轉臂復位至初始位置,且第一限位部抵觸於旋轉臂。The present disclosure provides a test sample processing apparatus including a centrifugal horse Up, a rotating arm and at least one test tube rack. The rotating arm is coupled to the centrifugal motor. At least one test tube rack is coupled to the rotating arm. The test tube rack has a first limit portion and a reset portion, wherein the first limit portion is adapted to be in contact with the rotating arm, and the test tube rack is located at an initial position with respect to the rotating arm. When the centrifugal motor drives the rotating arm to rotate, the rotating arm drives the test tube holder to rotate relative to the rotating arm via the reset portion, so that the test tube holder is away from the initial position with respect to the rotating arm. When the centrifugal motor stops driving the rotation of the rotating arm, the reset portion is affected by the gravity to reset the test tube holder to the initial position with respect to the rotating arm, and the first limiting portion abuts against the rotating arm.

為讓本揭露之上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。The above described features and advantages of the present invention will be more apparent from the following description.

圖1A及圖1B分別是本揭露一實施例之檢測樣品處理裝置的示意圖。需說明的是,圖1B僅繪出旋轉臂及試管架,以便於說明。請參考圖1A及圖1B,在本實施例中,檢測樣品處理裝置100包括一離心馬達110、一旋轉臂120以及至少一試管架130。旋轉臂120耦接於離心馬達110。試管架130連接於旋轉臂120。試管架130具有一第一限位部132及一復位部134,其中第一限位部132如圖1A所示適於抵觸於旋轉臂120,且試管架130相對於旋轉臂120位於如圖1A所示的一初始位置P1。1A and 1B are schematic views of a sample processing apparatus for detecting a sample according to an embodiment of the present disclosure. It should be noted that FIG. 1B only depicts the rotating arm and the test tube rack for convenience of explanation. Referring to FIG. 1A and FIG. 1B , in the embodiment, the sample processing device 100 includes a centrifugal motor 110 , a rotating arm 120 , and at least one test tube rack 130 . The rotating arm 120 is coupled to the centrifugal motor 110. The test tube rack 130 is coupled to the rotating arm 120. The test tube holder 130 has a first limiting portion 132 and a reset portion 134. The first limiting portion 132 is adapted to be in contact with the rotating arm 120 as shown in FIG. 1A, and the test tube holder 130 is located relative to the rotating arm 120 as shown in FIG. 1A. An initial position P1 is shown.

當離心馬達110驅動旋轉臂120旋轉時,旋轉臂120經由復位部134帶動試管架130相對於旋轉臂120轉動,使試管架130如圖1B所示相對於旋轉臂120遠離如圖1A 所示的初始位置P1,且第一限位部132未抵觸於旋轉臂120。當離心馬達110停止驅動旋轉臂120旋轉時,復位部134受重力影響使試管架130相對於旋轉臂120復位至初始位置P1,且第一限位部132抵觸於旋轉臂120。如此一來,試管架130藉由復位部134而能夠快速地復位至如圖1A所示的初始位置P1,並藉由第一限位部132抵觸於旋轉臂120以使試管架130維持在初始位置P1而不會晃動。When the centrifugal motor 110 drives the rotating arm 120 to rotate, the rotating arm 120 drives the test tube holder 130 to rotate relative to the rotating arm 120 via the resetting portion 134, so that the test tube holder 130 is away from the rotating arm 120 as shown in FIG. 1B as shown in FIG. 1A. The initial position P1 is shown, and the first limiting portion 132 does not interfere with the rotating arm 120. When the centrifugal motor 110 stops driving the rotation of the rotating arm 120, the reset portion 134 is affected by the gravity to reset the test tube holder 130 relative to the rotating arm 120 to the initial position P1, and the first limiting portion 132 abuts against the rotating arm 120. In this way, the test tube rack 130 can be quickly reset to the initial position P1 as shown in FIG. 1A by the reset portion 134, and the first limit portion 132 is in contact with the rotating arm 120 to maintain the test tube rack 130 at the initial position. Position P1 without shaking.

需說明的是,本實施例的旋轉臂120的兩端例如呈ㄇ字形且各端可裝設一個試管架130。在其他實施例中,旋轉臂的兩端例如呈U字形或V字形。此外,還可以依據實際檢測狀況將旋轉臂設計成十字形,而能夠裝設四個試管架130,本揭露不對旋轉臂的形狀及旋轉臂可裝載試管架的數目加以限制。It should be noted that both ends of the rotating arm 120 of the embodiment are, for example, in a U shape, and one test tube holder 130 can be disposed at each end. In other embodiments, both ends of the rotating arm are, for example, U-shaped or V-shaped. In addition, the rotating arm can be designed in a cross shape according to the actual detection condition, and four test tube racks 130 can be installed. The present disclosure does not limit the shape of the rotating arm and the number of the rotating arm capable of loading the test tube rack.

圖2是圖1A之試管架的示意圖。圖3是圖1A之旋轉臂的示意圖。請參考圖2及圖3,在本實施例中,復位部134自第一限位部132的一端延伸而成,且復位部134的延伸方向D1偏離於如圖1A所示的試管架130的初始位置P1。因此,當離心馬達110停止驅動旋轉臂120旋轉時,復位部134受重力影響使試管架130從如圖1B所示遠離如圖1A所示的初始位置P1而朝初始位置P1移動。當第一限位部132抵觸於旋轉臂120時,試管架130相對於旋轉臂120復位至如圖1A所示的初始位置P1。Figure 2 is a schematic illustration of the test tube rack of Figure 1A. Figure 3 is a schematic illustration of the swivel arm of Figure 1A. Referring to FIG. 2 and FIG. 3 , in the embodiment, the reset portion 134 extends from one end of the first limiting portion 132 , and the extending direction D1 of the reset portion 134 is offset from the test tube rack 130 as shown in FIG. 1A . Initial position P1. Therefore, when the centrifugal motor 110 stops driving the rotation of the rotating arm 120, the reset portion 134 is affected by the gravity to move the test tube rack 130 from the initial position P1 as shown in FIG. 1A toward the initial position P1 as shown in FIG. 1B. When the first limiting portion 132 abuts against the rotating arm 120, the test tube rack 130 is reset relative to the rotating arm 120 to the initial position P1 as shown in FIG. 1A.

詳細而言,試管架130更具有一懸軸136。旋轉臂120具有一軸孔120a。懸軸136穿設於軸孔120a,以將試管架 130樞設於旋轉臂120。旋轉臂120具有一第二限位部122,第一限位部132用以接觸於第二限位部122,使試管架130相對於旋轉臂120位於初始位置P1。在本實施例中,第一限位部132為具止擋的效果的凸柱,而第二限位部122為具受擋的效果的擋塊,但本發明並不以此為限。第一限位部132及第二限位部122的形狀及種類可以依照實際需求改變,只要能夠達到止擋的效果即可。據此,當離心馬達110驅動旋轉臂120旋轉時,旋轉臂120帶動試管架130相對於旋轉臂120轉動,第一限位部132如圖1B所示遠離第二限位部122,並使試管架130相對於旋轉臂120遠離如圖1A所示的初始位置P1。當離心馬達110停止驅動旋轉臂120旋轉時,復位部134受重力影響使試管架130復位至如圖1A所示的初始位置P1,且第一限位部132抵觸於第二限位部122。In detail, the test tube rack 130 further has a suspension shaft 136. The rotating arm 120 has a shaft hole 120a. The suspension shaft 136 is disposed in the shaft hole 120a to guide the test tube rack 130 is pivoted to the rotating arm 120. The rotating arm 120 has a second limiting portion 122 for contacting the second limiting portion 122 to position the test tube holder 130 relative to the rotating arm 120 at the initial position P1. In the embodiment, the first limiting portion 132 is a protruding post with a stop effect, and the second limiting portion 122 is a blocking member having a blocking effect, but the invention is not limited thereto. The shape and type of the first limiting portion 132 and the second limiting portion 122 can be changed according to actual needs, as long as the effect of the stop can be achieved. According to this, when the centrifugal motor 110 drives the rotating arm 120 to rotate, the rotating arm 120 drives the test tube holder 130 to rotate relative to the rotating arm 120, and the first limiting portion 132 moves away from the second limiting portion 122 as shown in FIG. 1B, and the test tube is The frame 130 is away from the rotating arm 120 away from the initial position P1 as shown in FIG. 1A. When the centrifugal motor 110 stops driving the rotation of the rotating arm 120, the reset portion 134 is affected by the gravity to reset the test tube holder 130 to the initial position P1 as shown in FIG. 1A, and the first limiting portion 132 abuts against the second limiting portion 122.

圖4是圖1A具有使用方向性之試管的示意圖。請參考圖2至圖4,檢測樣品處理裝置100更包括一試管150。試管150裝設於試管架130,試管150具有至少一容置孔152。而容置孔152用以盛裝如血液之待測液體50。詳細而言,試管架130更具有一插銷138,而試管150具有一固定孔154。插銷134插設於固定孔154,以將試管150與試管架130裝設在一起。此外,本實施例的試管150具有一第一組裝部156,第一組裝部156為試管150上端設計成具有斜邊形狀的結構。試管架130更具有一第二組裝部139,第二組裝部139鄰近於插銷138且為斜邊形狀的 結構,且第一組裝部156的形狀與第二組裝部139的形狀相配合。如此一來,可藉由第一組裝部156與第二組裝部139的形狀配合,而能夠便於使用者將試管150裝設於試管架130,以確保試管150裝設的方向無誤。本揭露不對第一組裝部及第二組裝部的形狀及位置所在加以限制,只要能達到匹配性,進而達到防呆功能即可。Fig. 4 is a schematic view of the test tube of Fig. 1A using directionality. Referring to FIG. 2 to FIG. 4, the test sample processing device 100 further includes a test tube 150. The test tube 150 is mounted on the test tube rack 130, and the test tube 150 has at least one receiving hole 152. The receiving hole 152 is for holding the liquid 50 to be tested, such as blood. In detail, the test tube rack 130 further has a latch 138, and the test tube 150 has a fixing hole 154. The latch 134 is inserted into the fixing hole 154 to mount the test tube 150 and the test tube holder 130 together. Further, the test tube 150 of the present embodiment has a first assembly portion 156 which is designed to have a beveled shape at the upper end of the test tube 150. The test tube rack 130 further has a second assembly portion 139 adjacent to the pin 138 and having a beveled shape. The structure and the shape of the first assembly portion 156 match the shape of the second assembly portion 139. In this way, the shape of the first assembly portion 156 and the second assembly portion 139 can be matched, so that the user can easily install the test tube 150 on the test tube holder 130 to ensure that the direction in which the test tube 150 is installed is correct. The present disclosure does not limit the shape and position of the first assembly portion and the second assembly portion, as long as the matching can be achieved, and the foolproof function can be achieved.

但若當檢測應用為無須顧忌試管方向性時,即使用之試管可具有對稱性結構,則試管架130就不需設置第二組裝部139,試管150也可不需設置第一組裝部156。However, if the detection application is to avoid the directionality of the test tube, that is, the test tube used may have a symmetrical structure, the test tube holder 130 does not need to be provided with the second assembly portion 139, and the test tube 150 may not need to be provided with the first assembly portion 156.

需說明的是,本實施例是將插銷138設置於試管架130,固定孔154設置在試管150。然而,也可以將插銷138設置於試管150,固定孔154設置於試管架130,只要達到定位之目的即可。本揭露不對固定孔及插銷的形狀及位置所在加以限制。It should be noted that, in this embodiment, the latch 138 is disposed on the test tube holder 130, and the fixing hole 154 is disposed in the test tube 150. However, the pin 138 may also be disposed in the test tube 150, and the fixing hole 154 may be disposed in the test tube holder 130 as long as the positioning purpose is achieved. The disclosure does not limit the shape and position of the fixing holes and the pins.

在本實施例中,如圖1A及圖1B所示,檢測樣品處理裝置100更包括一推擺臂160以及一推擺馬達170。推擺臂160耦接於推擺馬達170。推擺臂160用以擺動試管架130,使試管架130相對於旋轉臂120遠離初始位置P1。在此不對推擺臂160擺動的角度(即擺動幅度)及擺動速度加以限制,可依照實際檢測需求而來進行調整。在本實施例中,試管架130具有一接觸桿134a。接觸桿134a可滑動地接觸於推擺臂160,使試管架130相對於旋轉臂120遠離初始位置P1。詳細而言,試管架130更具有一滾輪134b。滾輪134b套設於接觸桿134a,用以增加復位部134 與推擺臂160之間的順暢度。在此配置之下,試管架130於離心過程之後,可藉由推擺臂160來擺動試管架130,以將試管150中的待測液體50混合均勻。In the present embodiment, as shown in FIG. 1A and FIG. 1B, the sample processing device 100 further includes a push arm 160 and a push motor 170. The swing arm 160 is coupled to the push motor 170. The swing arm 160 is used to swing the test tube rack 130 such that the test tube rack 130 is away from the initial position P1 with respect to the rotating arm 120. Here, the angle at which the swing arm 160 swings (ie, the swing amplitude) and the swing speed are not limited, and the adjustment can be performed according to the actual detection demand. In the present embodiment, the test tube rack 130 has a contact rod 134a. The contact rod 134a is slidably contacted with the push arm 160 such that the test tube holder 130 is away from the initial position P1 with respect to the rotating arm 120. In detail, the test tube rack 130 further has a roller 134b. The roller 134b is sleeved on the contact rod 134a for adding the reset portion 134. Smoothness with the push arm 160. Under this configuration, the test tube rack 130 can swing the test tube rack 130 by the swing arm 160 after the centrifugation process to uniformly mix the liquid to be tested 50 in the test tube 150.

圖5是圖1A之檢測樣品處理裝置的示意圖。需說明的是,此時離心馬達110停止驅動旋轉臂120旋轉,且試管架130被推擺臂160擺動至遠離如圖1A所示的初始位置P1。請參考圖5,在本實施例中,檢測樣品處理裝置100更包括一移動平台180、一光學取像單元190以及一移動馬達182。移動馬達182耦接於移動平台180,且移動平台180配置於試管架130的上方。光學取像單元190配置於移動平台180。詳細而言,光學取像單元190包括一照明光源192、一成像光學模組194以及一照相模組196,其中照明光源192與照相模組196及成像光學模組194位於試管架130的相對兩側。照相模組196連接於成像光學模組194,且照相模組196例如為CCD或CMOS感測器,但本發明不限制於此。Figure 5 is a schematic illustration of the test sample processing device of Figure 1A. It should be noted that at this time, the centrifugal motor 110 stops driving the rotating arm 120 to rotate, and the test tube rack 130 is swung by the push arm 160 away from the initial position P1 as shown in FIG. 1A. Referring to FIG. 5, in the embodiment, the sample processing device 100 further includes a moving platform 180, an optical imaging unit 190, and a moving motor 182. The moving motor 182 is coupled to the mobile platform 180 , and the mobile platform 180 is disposed above the test tube rack 130 . The optical imaging unit 190 is disposed on the mobile platform 180. In detail, the optical imaging unit 190 includes an illumination source 192, an imaging optical module 194, and a camera module 196. The illumination source 192 and the camera module 196 and the imaging optical module 194 are located opposite to the test tube holder 130. side. The camera module 196 is coupled to the imaging optics module 194, and the camera module 196 is, for example, a CCD or CMOS sensor, although the invention is not limited thereto.

當推擺臂160如圖5所示使試管架130相對於旋轉臂120遠離如圖1A所示的初始位置P1時,光學取像單元190藉由移動平台180移動而能逐一擷取試管150中的各容置孔152內的影像。具體而言,照明光源192用以照射試管150中的各容置孔152,成像光學模組194用以將來自試管150中的各容置孔152的光線轉換成影像,而照相模組196擷取影像,以供檢測人員觀察或拍照,並將此影像作為檢測的依據。需說明的是,此時的試管150需為如玻璃或透 明塑膠等透明材質所製成,以供照明光源192照射並可穿透。When the swing arm 160 moves the test tube holder 130 away from the rotating arm 120 from the initial position P1 as shown in FIG. 1A as shown in FIG. 5, the optical image capturing unit 190 can move the test tube 150 one by one by moving the moving platform 180. The images in each of the receiving holes 152. Specifically, the illumination source 192 is configured to illuminate the accommodating holes 152 in the test tube 150. The imaging optical module 194 is configured to convert the light from each of the accommodating holes 152 in the test tube 150 into an image, and the camera module 196 Take the image for the examiner to observe or take a picture, and use this image as the basis for the test. It should be noted that the test tube 150 at this time needs to be as glass or transparent. It is made of transparent material such as plastic, which is used for illumination source 192 to illuminate and penetrate.

圖6是圖1A之檢測樣品處理裝置的控制流程圖。請參考圖1A及圖6。在本實施例中,檢測樣品處理裝置100更包括一旋轉原點檢知器60、一推擺原點檢知器70、一位置原點檢知器80。旋轉原點檢知器60配置於離心馬達110,用以檢測旋轉臂120是否復位於初始位置P1,將試管架130相對於旋轉臂120復位至初始位置P1。推擺原點檢知器70配置於推擺馬達170,用以檢測推擺臂160是否復位於初始位置P1,將試管架130相對於旋轉臂120復位至初始位置P1。位置原點檢知器80配置於移動馬達182,用以檢測移動平台180是否復位於初始位置P1。Figure 6 is a control flow chart of the test sample processing device of Figure 1A. Please refer to FIG. 1A and FIG. 6. In the present embodiment, the sample processing device 100 further includes a rotation origin detector 60, a push-point origin detector 70, and a position origin detector 80. The rotation origin detector 60 is disposed in the centrifugal motor 110 for detecting whether the rotating arm 120 is reset to the initial position P1, and resets the test tube rack 130 to the initial position P1 with respect to the rotating arm 120. The push-point origin detector 70 is disposed on the push-pull motor 170 for detecting whether the swing arm 160 is reset to the initial position P1, and resets the test tube rack 130 to the initial position P1 with respect to the rotating arm 120. The position origin detector 80 is disposed on the moving motor 182 to detect whether the moving platform 180 is reset to the initial position P1.

當控制電腦10要發送控制訊號給離心馬達控制器20作離心動作前,會發送控制訊號給推擺馬達控制器30,使推擺臂160移動到遠離旋轉臂120及試管架130旋轉範圍之位置,以避免機構件的運動干涉。離心馬達控制器20接收到離心動作控制訊號後,離心馬達驅動器22便開始驅動離心馬達110,而使離心馬達110驅動旋轉臂120旋轉,以讓旋轉臂120帶動試管架130相對於旋轉臂120轉動。Before the control computer 10 sends a control signal to the centrifugal motor controller 20 for centrifugal operation, a control signal is sent to the push motor controller 30 to move the push arm 160 away from the rotational range of the rotating arm 120 and the test tube rack 130. To avoid the motion interference of the machine components. After the centrifugal motor controller 20 receives the centrifugal motion control signal, the centrifugal motor driver 22 starts to drive the centrifugal motor 110, and the centrifugal motor 110 drives the rotating arm 120 to rotate, so that the rotating arm 120 drives the test tube holder 130 to rotate relative to the rotating arm 120. .

當離心馬達110停止驅動旋轉臂120旋轉時,旋轉臂120回歸到初始位置P1,且復位部134受重力影響使試管架130相對於旋轉臂120復位至如圖1A所示的初始位置P1,此時旋轉原點檢知器60提供旋轉臂原點偵測訊號S1給控制電腦10。如此一來,控制電腦10確保試管架130 相對於旋轉臂120復位至如圖1A所示的初始位置P1之後,此時控制電腦10便發送控制訊號給推擺馬達控制器30,使推擺臂160復位至如圖1A所示的初始位置P1。推擺原點檢知器70提供推擺臂原點偵測訊號S2給控制電腦10,以確保推擺臂160復位至如圖1A所示的初始位置P1。When the centrifugal motor 110 stops driving the rotation of the rotating arm 120, the rotating arm 120 returns to the initial position P1, and the resetting portion 134 is affected by gravity to reset the test tube holder 130 relative to the rotating arm 120 to the initial position P1 as shown in FIG. 1A. The rotating origin detector 60 provides a rotating arm origin detection signal S1 to the control computer 10. In this way, the control computer 10 ensures the test tube rack 130 After the rotating arm 120 is reset to the initial position P1 as shown in FIG. 1A, the control computer 10 sends a control signal to the push motor controller 30 to reset the push arm 160 to the initial position as shown in FIG. 1A. P1. The push-point origin detector 70 provides a swing arm origin detection signal S2 to the control computer 10 to ensure that the push arm 160 is reset to the initial position P1 as shown in FIG. 1A.

之後,控制電腦10才會開始執行推擺臂160擺動試管架130的動作。此時控制電腦10便發送控制訊號給推擺馬達控制器30,使推擺馬達驅動器32驅動推擺馬達170,以讓推擺馬達170驅動推擺臂160執行擺動試管架130的動作。當推擺馬達170停止驅動推擺臂160擺動並讓推擺臂160復位時,此時推擺原點檢知器70提供推擺臂原點偵測訊號S2給控制電腦10,控制電腦10則不再發送控制訊號給推擺馬達控制器30。如此一來,推擺馬達驅動器32便能停止驅動推擺馬達170,而使推擺臂160不再擺動。Thereafter, the control computer 10 starts to perform the action of the swing arm 160 swinging the test tube rack 130. At this time, the control computer 10 sends a control signal to the push motor controller 30, and causes the push motor driver 32 to drive the push motor 170 to cause the push motor 170 to drive the push arm 160 to perform the operation of swinging the test tube rack 130. When the push motor 170 stops driving the swing arm 160 to swing and resets the push arm 160, the push origin detector 70 provides the swing arm origin detection signal S2 to the control computer 10, and the control computer 10 The control signal is no longer sent to the push motor controller 30. In this way, the push-pull motor driver 32 can stop driving the push-pull motor 170, so that the push-pull arm 160 no longer swings.

另外,當需要光學取像單元190進行後續觀察或拍照時,控制電腦10可驅動推擺臂160而將試管架130平放至如圖5所示的位置。與此同時,控制電腦10發送訊號給移動平台控制器40,使移動平台驅動器42驅動移動馬達182,以讓移動馬達182驅動移動平台180。接著,控制電腦10控制光學取像單元190進行取像的動作。如此一來,光學取像單元190便可以藉由移動平台180移動而能逐一擷取試管150中的容置孔152內的影像。當然,若不需要操作光學取像單元190時,移動馬達182驅動移動平台180而使移動平台180復位至移動平台180的初始位置。此時 位置原點檢知器80提供移動平台原點偵測訊號S3給控制電腦10,以讓控制電腦10不再發送控制訊號給移動平台控制器40。如此一來,移動平台驅動器42便能停止驅動移動馬達182,而使移動平台180不再移動。In addition, when the optical imaging unit 190 is required for subsequent observation or photographing, the control computer 10 can drive the push arm 160 to lay the test tube rack flat to the position shown in FIG. At the same time, the control computer 10 sends a signal to the mobile platform controller 40 to cause the mobile platform driver 42 to drive the mobile motor 182 to cause the mobile motor 182 to drive the mobile platform 180. Next, the control computer 10 controls the optical image capturing unit 190 to perform an image capturing operation. In this way, the optical image capturing unit 190 can capture the image in the receiving hole 152 in the test tube 150 one by one by moving the moving platform 180. Of course, if it is not necessary to operate the optical image taking unit 190, the moving motor 182 drives the moving platform 180 to reset the moving platform 180 to the initial position of the moving platform 180. at this time The location origin detector 80 provides the mobile platform origin detection signal S3 to the control computer 10 to cause the control computer 10 to no longer send control signals to the mobile platform controller 40. As such, the mobile platform driver 42 can stop driving the mobile motor 182, causing the mobile platform 180 to no longer move.

此外,上述檢測樣品處理裝置100在旋轉臂120的一端設置如擋塊的第二限位部122,來使試管架130維持在如圖1A所示的初始位置P1而不會晃動。然而,本發明不對此加以限制,以下藉由圖式加以舉例說明。Further, the above-described test sample processing apparatus 100 is provided with a second stopper portion 122 such as a stopper at one end of the rotary arm 120 to maintain the test tube holder 130 at the initial position P1 as shown in FIG. 1A without shaking. However, the invention is not limited thereto, and the following is exemplified by the drawings.

圖7A與圖7B為本揭露之試管架及旋轉臂的另一實施例的示意圖。圖8為圖7A之試管架的示意圖。圖9為圖7A之旋轉臂的示意圖。請參考圖7A、圖7B、圖8及圖9,在本實施例中,試管架230具有一第一限位部232(例如為導引塊),而旋轉臂220具有一第二限位部222(例如為導引槽)。試管架230的第一限位部232可在旋轉臂220中之第二限位部222內的一第一止擋點222a與一第二止擋點222b之間移動。第一限位部232如圖7A所示位於第一止擋點222a,使試管架230相對於旋轉臂220位於如圖7A所示的初始位置P1。當離心馬達110驅動旋轉臂220旋轉時,旋轉臂220如圖7B所示帶動試管架230相對於旋轉臂220轉動,使第一限位部232如圖7B所示遠離第一止擋點222a,且試管架230相對於旋轉臂220遠離如圖7A所示的初始位置P1。當離心馬達110停止驅動旋轉臂220旋轉時,復位部134受重力影響使試管架230從遠離第一止擋點222a移動至第一止擋點222a,使試管架230相對 於旋轉臂220復位至如圖7A所示的初始位置P1。7A and 7B are schematic views of another embodiment of the test tube rack and the rotating arm of the present disclosure. Figure 8 is a schematic illustration of the test tube rack of Figure 7A. Figure 9 is a schematic illustration of the swivel arm of Figure 7A. Referring to FIG. 7A, FIG. 7B, FIG. 8 and FIG. 9, in the embodiment, the test tube holder 230 has a first limiting portion 232 (for example, a guiding block), and the rotating arm 220 has a second limiting portion. 222 (for example, a guiding groove). The first limiting portion 232 of the test tube holder 230 is movable between a first stop point 222a and a second stop point 222b in the second limiting portion 222 of the rotating arm 220. The first limiting portion 232 is located at the first stopping point 222a as shown in FIG. 7A, so that the test tube holder 230 is positioned relative to the rotating arm 220 at the initial position P1 as shown in FIG. 7A. When the centrifugal motor 110 drives the rotating arm 220 to rotate, the rotating arm 220 rotates the test tube holder 230 relative to the rotating arm 220 as shown in FIG. 7B, so that the first limiting portion 232 is away from the first stopping point 222a as shown in FIG. 7B. And the test tube rack 230 is away from the rotating arm 220 away from the initial position P1 as shown in FIG. 7A. When the centrifugal motor 110 stops driving the rotating arm 220 to rotate, the resetting portion 134 is affected by the gravity to move the test tube holder 230 away from the first stopping point 222a to the first stopping point 222a, so that the test tube holder 230 is opposite. The rotating arm 220 is reset to the initial position P1 as shown in FIG. 7A.

綜上所述,本揭露所提出之檢測樣品處理裝置將試管架設計成具限位部及復位部。據此,當離心馬達停止驅動旋轉臂旋轉時,復位部受重力影響使試管架能夠相對於旋轉臂快速地復位至初始位置,並藉由限位部抵觸於旋轉臂以使試管架維持在初始位置而不會晃動。In summary, the test sample processing device proposed in the present disclosure designs the test tube rack to have a limit portion and a reset portion. According to this, when the centrifugal motor stops driving the rotation of the rotating arm, the reset portion is affected by the gravity, so that the test tube rack can be quickly reset to the initial position with respect to the rotating arm, and the limiting portion is in contact with the rotating arm to maintain the test tube rack at the initial position. Location without shaking.

此外,檢測樣品處理裝置還結合了推擺臂及推擺馬達。如此一來,試管架於上述離心過程之後,可藉由推擺臂及推擺馬達來擺動試管架,便能將試管中的待測液體混合均勻,而無需再另外經由人工來操作此晃動試管的動作。In addition, the test sample processing device incorporates a push arm and a push motor. In this way, after the above-mentioned centrifugation process, the test tube holder can be swung by the push arm and the push-pull motor, and the liquid to be tested in the test tube can be evenly mixed without additionally manually operating the shake test tube. Actions.

另外,檢測樣品處理裝置更結合了光學取像單元。據此,檢測人員可經由上述推擺臂將試管架擺動至固定位置,並利用光學取像單元擷取試管架中的試管的影像,以供檢測人員觀察或拍照,並將此影像作為檢測的依據。In addition, the detection sample processing device further incorporates an optical imaging unit. According to this, the detecting personnel can swing the test tube rack to a fixed position via the above-mentioned push arm, and use the optical image capturing unit to capture the image of the test tube in the test tube rack for the inspection personnel to observe or photograph, and use the image as a detection. in accordance with.

雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾,故本發明之保護範圍當視後附之申請專利範圍所界定者為準。Although the present invention has been disclosed in the above embodiments, it is not intended to limit the invention, and any one of ordinary skill in the art can make some modifications and refinements without departing from the spirit and scope of the invention. The scope of the invention is defined by the scope of the appended claims.

10‧‧‧控制電腦10‧‧‧Control computer

20‧‧‧離心馬達控制器20‧‧‧ centrifugal motor controller

22‧‧‧離心馬達驅動器22‧‧‧ centrifugal motor drive

30‧‧‧推擺馬達控制器30‧‧‧Pushing motor controller

32‧‧‧推擺馬達驅動器32‧‧‧Pushing motor drive

40‧‧‧移動平台控制器40‧‧‧Mobile platform controller

42‧‧‧移動平台驅動器42‧‧‧Mobile Platform Driver

50‧‧‧待測液體50‧‧‧ liquid to be tested

60‧‧‧旋轉原點檢知器60‧‧‧Rotation origin detector

70‧‧‧推擺原點檢知器70‧‧‧Pushing the origin detector

80‧‧‧位置原點檢知器80‧‧‧ Position origin detector

100‧‧‧檢測樣品處理裝置100‧‧‧Test sample processing device

110‧‧‧離心馬達110‧‧‧ centrifugal motor

120、220‧‧‧旋轉臂120, 220‧‧‧ rotating arm

120a‧‧‧軸孔120a‧‧‧Axis hole

122、222‧‧‧第二限位部122, 222‧‧‧ Second Limit Department

130、230‧‧‧試管架130, 230‧‧‧ test tube rack

132、232‧‧‧第一限位部132, 232‧‧‧First Limitation Department

134‧‧‧復位部134‧‧‧Reset Department

134a‧‧‧接觸桿134a‧‧‧Contact rod

134b‧‧‧滾輪134b‧‧‧Roller

136‧‧‧懸軸136‧‧‧suspension shaft

138‧‧‧插銷138‧‧‧ latch

139‧‧‧第二組裝部139‧‧‧Second Assembly Department

150‧‧‧試管150‧‧‧test tube

152‧‧‧容置孔152‧‧‧ accommodating holes

154‧‧‧固定孔154‧‧‧Fixed holes

156‧‧‧第一組裝部156‧‧‧First Assembly Department

160‧‧‧推擺臂160‧‧‧Pushing arm

170‧‧‧推擺馬達170‧‧‧Pushing motor

180‧‧‧移動平台180‧‧‧Mobile platform

182‧‧‧移動馬達182‧‧‧Moving motor

190‧‧‧光學取像單元190‧‧‧Optical image capture unit

192‧‧‧照明光源192‧‧‧ illumination source

194‧‧‧成像光學模組194‧‧‧ imaging optical module

196‧‧‧照相模組196‧‧‧Photographic module

222a‧‧‧第一止擋點222a‧‧‧First stop point

222b‧‧‧第二止擋點222b‧‧‧second stop point

D1‧‧‧延伸方向D1‧‧‧ extending direction

P1‧‧‧初始位置P1‧‧‧ initial position

S1‧‧‧旋轉臂原點偵測訊號S1‧‧‧ Rotary arm origin detection signal

S2‧‧‧推擺臂原點偵測訊號S2‧‧‧Pushing arm origin detection signal

S3‧‧‧移動平台原點偵測訊號S3‧‧‧Mobile platform origin detection signal

圖1A及圖1B分別是本揭露一實施例之檢測樣品處理裝置的示意圖。1A and 1B are schematic views of a sample processing apparatus for detecting a sample according to an embodiment of the present disclosure.

圖2是圖1A之試管架的示意圖。Figure 2 is a schematic illustration of the test tube rack of Figure 1A.

圖3是圖1A之旋轉臂的示意圖。Figure 3 is a schematic illustration of the swivel arm of Figure 1A.

圖4是圖1A具有使用方向性之試管的示意圖。Fig. 4 is a schematic view of the test tube of Fig. 1A using directionality.

圖5是圖1A之檢測樣品處理裝置的示意圖。Figure 5 is a schematic illustration of the test sample processing device of Figure 1A.

圖6是圖1A之檢測樣品處理裝置的控制流程圖。Figure 6 is a control flow chart of the test sample processing device of Figure 1A.

圖7A與圖7B為本揭露之試管架及旋轉臂的另一實施例的示意圖。7A and 7B are schematic views of another embodiment of the test tube rack and the rotating arm of the present disclosure.

圖8為圖7A之試管架的示意圖。Figure 8 is a schematic illustration of the test tube rack of Figure 7A.

圖9為圖7A之旋轉臂的示意圖。Figure 9 is a schematic illustration of the swivel arm of Figure 7A.

60‧‧‧旋轉原點檢知器60‧‧‧Rotation origin detector

70‧‧‧推擺原點檢知器70‧‧‧Pushing the origin detector

100‧‧‧檢測樣品處理裝置100‧‧‧Test sample processing device

110‧‧‧離心馬達110‧‧‧ centrifugal motor

120‧‧‧旋轉臂120‧‧‧Rotating arm

122‧‧‧第二限位部122‧‧‧Second Limitation

130‧‧‧試管架130‧‧‧Test tube rack

132‧‧‧第一限位部132‧‧‧First Limitation

134‧‧‧復位部134‧‧‧Reset Department

134a‧‧‧接觸桿134a‧‧‧Contact rod

134b‧‧‧滾輪134b‧‧‧Roller

136‧‧‧懸軸136‧‧‧suspension shaft

139‧‧‧第二組裝部139‧‧‧Second Assembly Department

150‧‧‧試管150‧‧‧test tube

160‧‧‧推擺臂160‧‧‧Pushing arm

170‧‧‧推擺馬達170‧‧‧Pushing motor

P1‧‧‧初始位置P1‧‧‧ initial position

Claims (17)

一種檢測樣品處理裝置,包括:一離心馬達;一旋轉臂,耦接於該離心馬達;以及至少一試管架,連接於該旋轉臂,該試管架具有一第一限位部及一復位部,其中該第一限位部適於抵觸於該旋轉臂,且該試管架相對於該旋轉臂位於一初始位置,當該離心馬達驅動該旋轉臂旋轉時,該旋轉臂經由該復位部帶動該試管架相對於該旋轉臂轉動,使該試管架相對於該旋轉臂遠離該初始位置,當該離心馬達停止驅動該旋轉臂旋轉時,該復位部受重力影響使該試管架相對於旋轉臂復位至該初始位置,且該第一限位部抵觸於該旋轉臂。A test sample processing device includes: a centrifugal motor; a rotating arm coupled to the centrifugal motor; and at least one test tube rack coupled to the rotating arm, the test tube rack having a first limiting portion and a reset portion The first limiting portion is adapted to be in contact with the rotating arm, and the test tube rack is located at an initial position relative to the rotating arm, and when the centrifugal motor drives the rotating arm to rotate, the rotating arm drives the test tube via the resetting portion Rotating relative to the rotating arm to move the test tube holder away from the initial position relative to the rotating arm. When the centrifugal motor stops driving the rotating arm to rotate, the resetting portion is affected by gravity to reset the test tube holder relative to the rotating arm to The initial position, and the first limiting portion is in contact with the rotating arm. 如申請專利範圍第1項所述之檢測樣品處理裝置,其中該復位部自該第一限位部的一端延伸而成,且該復位部的延伸方向偏離於該試管架的該初始位置,當該離心馬達停止驅動該旋轉臂旋轉時,該復位部受重力影響使該試管架從遠離該初始位置而朝該初始位置移動,當該第一限位部抵觸於該旋轉臂時,該試管架相對於該旋轉臂復位至該初始位置。The test sample processing device of claim 1, wherein the reset portion extends from one end of the first limiting portion, and the extending direction of the reset portion deviates from the initial position of the test tube rack. When the centrifugal motor stops driving the rotating arm to rotate, the resetting portion is affected by gravity to move the test tube rack away from the initial position toward the initial position, and when the first limiting portion abuts the rotating arm, the test tube holder It is reset to the initial position with respect to the rotating arm. 如申請專利範圍第1項所述之檢測樣品處理裝置,其中該旋轉臂具有一第二限位部,該第一限位部抵觸於該第二限位部,使該試管架相對於該旋轉臂位於該初始位置,當該離心馬達驅動該旋轉臂旋轉時,該旋轉臂帶動該試管架相對於該旋轉臂轉動,使該第一限位部遠離該第 二限位部,並使該試管架相對於該旋轉臂遠離該初始位置,當該離心馬達停止驅動該旋轉臂旋轉時,該復位部受重力影響使該試管架復位至該初始位置,且該第一限位部抵觸於該第二限位部。The test sample processing device of claim 1, wherein the rotating arm has a second limiting portion that abuts the second limiting portion to rotate the test tube holder relative to the rotation The arm is located at the initial position, and when the centrifugal motor drives the rotating arm to rotate, the rotating arm drives the test tube holder to rotate relative to the rotating arm, so that the first limiting portion is away from the first a second limiting portion, and moving the test tube holder away from the initial position relative to the rotating arm, when the centrifugal motor stops driving the rotating arm to rotate, the resetting portion is affected by gravity to reset the test tube rack to the initial position, and the The first limiting portion is in contact with the second limiting portion. 如申請專利範圍第1項所述之檢測樣品處理裝置,其中該旋轉臂具有一第二限位部,該第一限位部在該第二限位部內的一第一止擋點與一第二止擋點之間移動,該第一限位部位於該第一止擋點,使該試管架相對於該旋轉臂位於該初始位置,當該離心馬達驅動該旋轉臂旋轉時,該旋轉臂帶動該試管架相對於該旋轉臂轉動,使該第一限位部遠離該第一止擋點,且該試管架相對於該旋轉臂遠離該初始位置,當該離心馬達停止驅動該旋轉臂旋轉時,該復位部受重力影響使該試管架從遠離該第一止擋點移動至該第一止擋點,使該試管架相對於該旋轉臂復位至該初始位置。The test sample processing device of claim 1, wherein the rotating arm has a second limiting portion, and the first limiting portion has a first stop point and a first portion in the second limiting portion. Moving between two stop points, the first limiting portion is located at the first stopping point, so that the test tube holder is located at the initial position with respect to the rotating arm, and when the centrifugal motor drives the rotating arm to rotate, the rotating arm Driving the test tube holder relative to the rotating arm to move the first limiting portion away from the first stopping point, and the test tube holder is away from the initial position relative to the rotating arm, when the centrifugal motor stops driving the rotating arm to rotate The reset portion is moved by gravity to move the test tube rack away from the first stop point to the first stop point, so that the test tube holder is reset to the initial position relative to the rotating arm. 如申請專利範圍第1項所述之檢測樣品處理裝置,更包括:一試管,裝設於該試管架,該試管具有至少一容置孔,該容置孔用以盛裝一待測液體。The test sample processing device of claim 1, further comprising: a test tube mounted on the test tube rack, the test tube having at least one receiving hole for containing a liquid to be tested. 如申請專利範圍第5項所述之檢測樣品處理裝置,其中該試管架更具有一插銷,該試管具有一固定孔,該插銷插設於該固定孔,以將該試管與該試管架裝設在一起。The test sample processing device of claim 5, wherein the test tube rack further has a latch, the test tube has a fixing hole, and the latch is inserted into the fixing hole to install the test tube and the test tube rack Together. 如申請專利範圍第5項所述之檢測樣品處理裝 置,其中該試管具有一第一組裝部,該試管架更具有一第二組裝部,而該第一組裝部的形狀與該第二組裝部的形狀相配合,以將該試管與該試管架裝設在一起。Test sample processing equipment as described in item 5 of the patent application scope The test tube has a first assembly portion, the test tube holder further has a second assembly portion, and the shape of the first assembly portion matches the shape of the second assembly portion to the test tube and the test tube holder Installed together. 如申請專利範圍第1項所述之檢測樣品處理裝置,其中該試管架更具有一懸軸,該旋轉臂具有一軸孔,該懸軸穿設於該軸孔以將該試管架樞設於該旋轉臂。The test sample processing device of claim 1, wherein the test tube rack further has a suspension shaft, the rotary arm has a shaft hole, the suspension shaft is disposed through the shaft hole to pivot the test tube rack Rotating arm. 如申請專利範圍第1項所述之檢測樣品處理裝置,更包括:一旋轉原點檢知器,配置於該離心馬達,該旋轉原點檢知器用以檢測該旋轉臂是否復位至該初始位置。The test sample processing device of claim 1, further comprising: a rotary origin detector disposed on the centrifugal motor, the rotary origin detector for detecting whether the rotary arm is reset to the initial position . 如申請專利範圍第1項所述之檢測樣品處理裝置,更包括:一推擺馬達;以及一推擺臂,耦接於該推擺馬達,該推擺臂用以擺動該試管架,使該試管架相對於該旋轉臂遠離該初始位置。The test sample processing device of claim 1, further comprising: a push-pull motor; and a push-pull arm coupled to the push-pull motor for swinging the test tube rack to The test tube rack is remote from the initial position relative to the rotating arm. 如申請專利範圍第10項所述之檢測樣品處理裝置,其中該試管架更具有一接觸桿,該接觸桿接觸於該推擺臂,使該試管架相對於該旋轉臂遠離該初始位置。The test sample processing device of claim 10, wherein the test tube holder further has a contact rod that contacts the push arm to move the test tube holder away from the initial position relative to the rotating arm. 如申請專利範圍第11項所述之檢測樣品處理裝置,其中該試管架更具有一滾輪,該滾輪套設於該接觸桿。The test sample processing device of claim 11, wherein the test tube rack further has a roller, and the roller is sleeved on the contact rod. 如申請專利範圍第10項所述之檢測樣品處理裝置,更包括:一推擺原點檢知器,配置於該推擺馬達,用以檢測該推擺臂是否復位至該初始位置。The test sample processing device of claim 10, further comprising: a push-push origin detector disposed on the push-pull motor for detecting whether the push-pull arm is reset to the initial position. 如申請專利範圍第10項所述之檢測樣品處理裝置,更包括:一移動平台,配置於該試管架的上方;以及一光學取像單元,配置於該移動平台,其中當該推擺臂使該試管架相對於該旋轉臂遠離該初始位置時,該光學取像單元藉由該移動平台移動而能逐一擷取該試管的影像。The test sample processing device of claim 10, further comprising: a mobile platform disposed above the test tube rack; and an optical image capturing unit disposed on the mobile platform, wherein the push arm When the test tube rack is away from the initial position relative to the rotating arm, the optical image capturing unit can capture the image of the test tube one by one by moving the moving platform. 如申請專利範圍第14項所述之檢測樣品處理裝置,其中該光學取像單元包括一照明光源、一成像光學模組以及一照相模組,該照相模組連接於該成像光學模組,當該推擺臂使該試管架相對於該旋轉臂遠離該初始位置時,該照明光源與該照相模組及該成像模組位於該試管架的相對兩側,該照明光源用以照射該試管,而該成像光學模組用以將來自該試管的光線轉換成一影像,而該照相模組擷取該影像。The test sample processing device of claim 14, wherein the optical image capturing unit comprises an illumination source, an imaging optical module, and a camera module, wherein the camera module is coupled to the imaging optical module. When the pusher arm moves the test tube holder away from the initial position relative to the rotating arm, the illumination light source and the camera module and the imaging module are located on opposite sides of the test tube rack, and the illumination light source is used to illuminate the test tube. The imaging optical module is configured to convert light from the test tube into an image, and the camera module captures the image. 如申請專利範圍第15項所述之檢測樣品處理裝置,其中該照相模組包括一CCD或CMOS感測器。The test sample processing device of claim 15, wherein the camera module comprises a CCD or CMOS sensor. 如申請專利範圍第14項所述之檢測樣品處理裝置,更包括:一移動馬達,耦接於該移動平台;以及一位置原點檢知器,配置於該移動馬達,用以檢測該移動平台是否復位於初始位置。The test sample processing device of claim 14, further comprising: a mobile motor coupled to the mobile platform; and a position origin detector disposed on the mobile motor for detecting the mobile platform Whether to reset to the initial position.
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