TWI472741B - Auxiliary Alignment Method and Its System - Google Patents

Auxiliary Alignment Method and Its System Download PDF

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TWI472741B
TWI472741B TW101118127A TW101118127A TWI472741B TW I472741 B TWI472741 B TW I472741B TW 101118127 A TW101118127 A TW 101118127A TW 101118127 A TW101118127 A TW 101118127A TW I472741 B TWI472741 B TW I472741B
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tested
auxiliary alignment
processing unit
message
display module
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TW101118127A
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TW201348694A (en
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Guang Shiah Wang
Shih Chang Chiu
Yen Te Lu
Yu Ming Tsao
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Machvision Inc
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Description

待測物之輔助對位方法與其系統Auxiliary alignment method of test object and its system

本發明係關於一種待測物之輔助對位方法與其系統,尤指一種用於電子工業之檢測程序中輔助辨識一待測物的特定特徵位於該待測物上之位置的方法與其系統。The present invention relates to an auxiliary alignment method and system thereof for a test object, and more particularly to a method and system for assisting in identifying a position of a specific feature of a test object on the object to be tested in a detection process of the electronic industry.

電子工業中,印刷電路板等電子元件的製造過程中會先利用自動光學檢測系統(Automatic Optical Inspection,AOI)進行檢測,以檢測出該印刷電路板表面的缺陷,一般而言,該印刷電路板可為具有複數部件(pieces)的軟性印刷電路板、硬性印刷電路板、晶圓等,因為各該部件的品質直接關係到各該部件設置電子元件後是否能正常運作,因此對該印刷電路板進行品質檢測為相當的重要環節。In the electronics industry, electronic components such as printed circuit boards are first tested using an Automatic Optical Inspection (AOI) to detect defects on the surface of the printed circuit board. Generally, the printed circuit board It can be a flexible printed circuit board having a plurality of pieces, a rigid printed circuit board, a wafer, etc., because the quality of each component is directly related to whether each of the components can function normally after the electronic component is disposed, and thus the printed circuit board is Quality testing is a very important part.

其中,該自動光學檢測系統在完成該印刷電路板的檢測後,會將該待測物上所檢測出具有缺陷的部件之相關檢測結果傳送到一複檢站,再藉由該複檢站的複檢裝置以人工判讀的方式確認該檢測結果是否為真實缺陷或僅為該自動光學檢測系統的誤判,以在確認為真實缺陷之後利用人工或機器的方式進行該部件的特定位置打印塗銷,以在後續以表面黏著技術(SMT)的方式設置電子元件時,排除具有缺陷的部件。Wherein, after the automatic optical detection system completes the detection of the printed circuit board, the relevant detection result of the component detected on the object to be tested is transmitted to a rechecking station, and then by the rechecking station The re-inspection device confirms whether the detection result is a real defect or only a misjudgment of the automatic optical detection system by manual interpretation, so as to perform a specific position print-off of the component by manual or machine after confirming as a real defect. In the case where the electronic component is subsequently disposed in a surface adhesion technique (SMT), the defective component is excluded.

再者,上述檢測程序中僅能針對該印刷電路板之一第一面中具有缺陷的部件進行處理,但實務上,對於具有缺 陷的部件係需要進行雙面的打印塗銷,以避免相對於被塗銷之第一面的第二面被設置電子元件,然而,針對該第二面的打印塗銷目前仍以人工的方式來進行,具體來說,操作員需依照該第一面上具有缺陷的部件位置對應尋找該部件位於該第二面的位置,以標註或直接塗銷其特定點,但此種僅以人工進行對位的方式,當位於該印刷電路板的部件數量增多或形狀不對稱時,很容易發生標記錯誤、標記數量缺漏等的情況,且在操作上相當耗時,造成檢測程序上很大的缺失。Furthermore, in the above detection procedure, only the defective component in the first side of the printed circuit board can be processed, but in practice, there is a defect. The trapped component is required to be printed on both sides to avoid the electronic component being placed relative to the second side of the first side of the coated pin, however, the printout for the second side is still manually To perform, specifically, the operator needs to find the position of the component on the second surface according to the position of the component having defects on the first surface, to mark or directly mark the specific point thereof, but the manual is only performed manually. In the way of alignment, when the number of components located on the printed circuit board is increased or the shape is asymmetrical, it is easy to cause marking errors, missing marks, etc., and it is quite time consuming in operation, resulting in a large lack of detection procedures. .

因此,本發明係提供一種待測物之輔助對位方法與其系統,可輔助操作員能夠輕易地且快速地辨識該待測物之第一面上特定位置所對應位於該第二面的位置,以達到降低操作員的作業時間,甚至可進一步應用於在一特定程序中對待測物之第一面及第二面的特定部件進行對位標記,達到提升產線效率的功效。Therefore, the present invention provides an auxiliary alignment method and system thereof for the object to be tested, which can assist the operator to easily and quickly recognize the position of the specific position on the first surface of the object to be tested corresponding to the second surface. In order to reduce the operator's working time, it can be further applied to the alignment of specific parts on the first side and the second side of the object to be tested in a specific program, thereby improving the efficiency of the production line.

本發明之一目的在於提供一種待測物之輔助對位方法與其系統,可輔助操作員在檢測程序中能夠輕易地且快速地辨識該缺陷在待測物中相對應之第一面與第二面中的對應位置,達到提升產線效率的功效。An object of the present invention is to provide an auxiliary alignment method and a system thereof for the object to be tested, which can assist the operator in easily and quickly identifying the first side and the second corresponding to the defect in the object to be tested in the detection program. The corresponding position in the surface can improve the efficiency of the production line.

為達上述目的及其他目的,本發明提供一種待測物之輔助對位方法,係用於輔助辨識一待測物之一待測區中的特定特徵之位置,該輔助對位方法包含:提供具有一處理 單元及一顯示模組之一輔助對位系統,且該處理單元電連接該顯示模組;令該處理單元接收包含該特定特徵之一特徵訊息;以及令該處理單元根據該特徵訊息而對應產生一標識訊息,並在該顯示模組之特定區域內顯示該標識訊息,其中該特定區域與該待測區相對應。To achieve the above and other objects, the present invention provides an auxiliary alignment method for a test object for assisting in identifying a position of a specific feature in a test area of a test object, the auxiliary alignment method comprising: providing Have a treatment One of the unit and a display module assists the alignment system, and the processing unit is electrically connected to the display module; the processing unit receives a feature message including the specific feature; and causes the processing unit to generate a corresponding message according to the feature message An identification message is displayed, and the identification message is displayed in a specific area of the display module, wherein the specific area corresponds to the area to be tested.

為達上述目的及其他目的,本發明提供一種待測物之輔助對位系統,係用於輔助辨識一待測物之一待測區中的特定特徵之位置,該輔助對位系統包含一處理單元及一顯示模組。其中,該處理單元,係用於接收包含該特定特徵之一特徵訊息以對應產生一標識訊息;該顯示模組,係電連接該處理單元,且該顯示模組用於在其特定區域內顯示該標識訊息,其中該特定區域與該待測區相對應。To achieve the above and other objects, the present invention provides an auxiliary alignment system for a test object for assisting in identifying a position of a specific feature in a test area of a test object, the auxiliary alignment system including a process Unit and a display module. The processing unit is configured to receive a feature message including the specific feature to generate an identifier message; the display module is electrically connected to the processing unit, and the display module is configured to display in a specific area thereof. The identification message, wherein the specific area corresponds to the area to be tested.

於一實施例中,該特徵訊息係包含一檢測結果及一控制訊息,該檢測結果係由一檢測裝置或一複檢裝置所提供,且該控制訊息係由一輸入模組所提供。In one embodiment, the feature message includes a detection result and a control message, and the detection result is provided by a detecting device or a recheck device, and the control message is provided by an input module.

於一實施例中,該檢測結果係包含該待測物的特定位置及缺陷位置之至少其中一者,該控制訊息係包含該待測物的尺寸、形狀、排版之至少其中一者。In one embodiment, the detection result includes at least one of a specific location and a defect location of the object to be tested, and the control message includes at least one of a size, a shape, and a layout of the object to be tested.

於一實施例中,該顯示模組係為一顯示螢幕,且該標識訊息的顯示方法係為在該顯示螢幕上之特定像素位置發亮。In one embodiment, the display module is a display screen, and the display method of the identification message is illuminated at a specific pixel position on the display screen.

於一實施例中,該檢測裝置或該複檢裝置係產生關於該待測物之一第一面的檢測結果,而該處理單元係產生關於該待測物中對應於該第一面之第二面的標識訊息。In one embodiment, the detecting device or the rechecking device generates a detection result about a first side of the object to be tested, and the processing unit generates a first image corresponding to the first surface of the object to be tested. Two sides of the logo message.

於一實施例中,該檢測裝置係或該複檢裝置產生關於該待測物之一第一面的檢測結果,而該處理單元係產生關於該待測物中該第一面的標識訊息及對應於該第一面之第二面的標識訊息。In one embodiment, the detecting device or the rechecking device generates a detection result about a first side of the object to be tested, and the processing unit generates an identification message about the first side of the object to be tested and An identification message corresponding to the second side of the first side.

於一實施例中,該處理單元更包含一切換器,係用以切換該顯示模組顯示該待測物之第一面的標識訊息及第二面的標識訊息之至少其中一者。In one embodiment, the processing unit further includes a switch for switching the display module to display at least one of an identification message of the first side of the object to be tested and an identification message of the second side.

於一實施例中,該顯示螢幕係顯示一十字定位標誌,該十字定位標誌係具有由中心向外漸層變化的色彩分布或灰階變化,該十字定位標誌用以對應該待測物之至少一定位孔以定位該待測物。In one embodiment, the display screen displays a cross-positioning mark having a color distribution or a gray-scale change that gradually changes from the center to the object to be tested. A positioning hole is positioned to position the object to be tested.

於一實施例中,該顯示模組更包含至少一定位件,係設置於該顯示模組,該定位件用以對應該待測物之至少一定位孔以定位該待測物。In one embodiment, the display module further includes at least one positioning component disposed on the display module, and the positioning component is configured to correspond to at least one positioning hole of the object to be tested to locate the object to be tested.

藉此,本發明之待測物之輔助對位方法與其系統,係利用處理單元與顯示模組,來輔助操作員在檢測程序中能夠輕易地且快速地辨識待測物的特定特徵位於該待測物中相對應之第一面與第二面上的對應位置,達到提升產線效率的功效。Thereby, the auxiliary alignment method and the system thereof of the present invention use the processing unit and the display module to assist the operator in easily and quickly identifying the specific feature of the object to be tested in the detection program. The corresponding position on the first side and the second side of the corresponding object can improve the efficiency of the production line.

為充分瞭解本發明之目的、特徵及功效,茲藉由下述具體之實施例,並配合所附之圖式,對本發明做一詳細說明,說明如後: 請參照第1圖與第3圖,第1圖係為本發明一具體實施例之待測物之輔助對位系統的功能方塊圖,第2圖及第3圖為待測物利用輔助對位系統進行特定特徵對位的示意圖。於第1圖中,輔助對位系統10,係用於輔助辨識一待測物之一待測區的特定特徵位於該待測物上的位置,該輔助對位系統10包含:一處理單元12及一顯示模組14。其中該顯示模組14係供操作員觀看。In order to fully understand the objects, features and advantages of the present invention, the present invention will be described in detail by the following specific embodiments and the accompanying drawings. Please refer to FIG. 1 and FIG. 3 , which are functional block diagrams of the auxiliary alignment system of the object to be tested according to an embodiment of the present invention, and FIG. 2 and FIG. 3 show the auxiliary alignment of the object to be tested. A schematic diagram of the system performing a specific feature alignment. In FIG. 1 , the auxiliary alignment system 10 is configured to assist in identifying a position of a specific feature of a to-be-tested object on the object to be tested, and the auxiliary alignment system 10 includes: a processing unit 12 And a display module 14. The display module 14 is for viewing by an operator.

該處理單元12,係用於接收包含該特定特徵之一特徵訊息Sin,且該處理單元12執行一軟體程式以對應產生一標識訊息,其中該特定特徵係例如包含一檢測結果,該檢測結果係可由一檢測裝置(圖未示)或一複檢裝置(圖未示)所提供,其中該檢測結果係可包含該待測物上的特定位置或缺陷位置之至少其中一者。The processing unit 12 is configured to receive a feature message Sin including the specific feature, and the processing unit 12 executes a software program to generate an identification message, wherein the specific feature includes, for example, a detection result, and the detection result is It may be provided by a detecting device (not shown) or a rechecking device (not shown), wherein the detecting result may include at least one of a specific position or a defect position on the object to be tested.

該顯示模組14,係電連接該處理單元12,且該顯示模組14用於在其特定區域內顯示該標識訊息,其中該特定區域與該待測物的待測區相對應,其中該待測區係可僅為該待測物上之部分區域或為該待測物上之全部區域,舉例來說,若該待測區之面積小於該待測物之面積,則該特定區域之面積小於該待測物之面積,若該待測區之面積等於該待測物之面積,則該特定區域之面積等於該待測物之面積。The display module 14 is electrically connected to the processing unit 12, and the display module 14 is configured to display the identification message in a specific area thereof, wherein the specific area corresponds to the area to be tested of the object to be tested, wherein the The area to be tested may be only a partial area on the object to be tested or all areas on the object to be tested. For example, if the area of the area to be tested is smaller than the area of the object to be tested, the specific area The area is smaller than the area of the object to be tested. If the area of the area to be tested is equal to the area of the object to be tested, the area of the specific area is equal to the area of the object to be tested.

本實施例中,該特徵訊息Sin係包含該檢測結果及一控制訊息,且該控制訊息係由一輸入模組(圖未示)所提供。其中,該輸入模組係可透過操作員的輸入設定而產生該控制訊息,該控制訊息係可包含例如該待測物之尺寸、形狀、 排版之至少其中一者的資訊。In this embodiment, the feature message Sin includes the detection result and a control message, and the control message is provided by an input module (not shown). The input module can generate the control message through an operator input setting, and the control message can include, for example, the size and shape of the object to be tested. Information on at least one of the typesetting.

具體來說,如第2圖所示,本實施例以該待測物為具有複數部件(pieces)32的一印刷電路板3為例示說明,且各該部件32周圍設置有槽孔34,而該待測區31的面積係可小於或等於該印刷電路板3之面積。其中,前述之該待測物之尺寸、形狀可為各該部件32的尺寸、形狀或該印刷電路板3的尺寸、形狀;該排版可為該等部件32於該印刷電路板3上的排版,例如該等部件32的數量及排列方式;該待測物上之特定位置可為該印刷電路板3上特定部件32的位置,而該待測物之缺陷位置可為由該檢測裝置所檢測出位於該印刷電路板3上具有缺陷的部件32之位置。Specifically, as shown in FIG. 2, the present embodiment is exemplified by a printed circuit board 3 having a plurality of pieces 32, and each of the members 32 is provided with a slot 34. The area of the area to be tested 31 may be less than or equal to the area of the printed circuit board 3. The size and shape of the object to be tested may be the size and shape of each component 32 or the size and shape of the printed circuit board 3; the typesetting may be a typesetting of the components 32 on the printed circuit board 3. For example, the number and arrangement of the components 32; the specific position on the object to be tested may be the position of the specific component 32 on the printed circuit board 3, and the defect location of the object to be tested may be detected by the detecting device The location of the component 32 having defects on the printed circuit board 3 is located.

回到第1圖,其中,該標識訊息係可經人眼所辨識出,例如該顯示模組14係可為LED燈板或顯示螢幕。其中,若該輸入模組產生該控制訊息,且該檢測裝置或該複檢裝置係產生關於該待測物中第一面的檢測結果,而該處理單元12係可根據具有該控制訊息及該檢測結果之特徵訊息Sin而產生關於該待測物中該第一面的標識訊息及對應於該第一面之一第二面的標識訊息,亦即該顯示模組14可用於顯示關於該第一面的標識訊息及關於該第二面的標識訊息之至少其中一者,該處理單元12亦可僅產生關於該待測物中對應於該第一面之第二面的標識訊息,進而顯示在顯示模組14。Returning to FIG. 1 , the identification message can be recognized by the human eye. For example, the display module 14 can be an LED light board or a display screen. Wherein, if the input module generates the control message, and the detecting device or the rechecking device generates a detection result about the first side of the object to be tested, the processing unit 12 can have the control message according to the The characteristic message Sin of the detection result generates an identification message about the first side of the object to be tested and an identification message corresponding to the second side of the first side, that is, the display module 14 can be used to display the first The at least one of the identification information of the one side and the identification information about the second side, the processing unit 12 may also generate only the identification information corresponding to the second side of the first surface of the object to be tested, and then display In the display module 14.

具體而言,如第2圖所示,一併參考第1圖,該顯示模組14係以具有邊框142與定義有顯示區144之一顯示螢 幕為例來說明,該檢測結果係包含該檢測裝置所檢測出位於該印刷電路板3的一第一面36之具有缺陷.的部件32的位置,且該輸入模組經由操作員輸入該印刷電路板3的尺寸、形狀、排版而產生該控制訊息後,該處理單元12接收到具有該控制訊息及該檢測結果之特徵訊息Sin即執行該軟體程式以對應產生關於該印刷電路板3之第一面36的標識訊息及關於對應於該第一面36之第二面38的標識訊息,該標識訊息的顯示方式係於該顯示區144上之特定像素位置發亮呈現顏色區塊30,例如紅色區塊等,且該顏色區塊30之形狀與各該部件32相同。Specifically, as shown in FIG. 2, referring to FIG. 1 together, the display module 14 has a frame 142 and one of the display areas 144 defined to display the firefly. As an example, the detection result includes a position of the component 32 detected by the detecting device on a first surface 36 of the printed circuit board 3 having a defect, and the input module inputs the printing via an operator. After the control message is generated by the size, shape and layout of the circuit board 3, the processing unit 12 receives the feature message Sin having the control message and the detection result, and executes the software program to correspondingly generate the information about the printed circuit board 3. An identification message of a side 36 and an identification message corresponding to the second side 38 of the first side 36, the manner in which the identification message is displayed is illuminated at a particular pixel location on the display area 144 to present a color block 30, such as A red block or the like, and the shape of the color block 30 is the same as each of the members 32.

舉例來說,當該待測區31之面積係等於該印刷電路板3之面積,則可於該顯示區144內與該印刷電路板3之邊界所圍繞的區域大小相同之特定區域1442內顯示出該印刷電路板3的第一面36之缺陷位置,以供操作員將該印刷電路板3對應地放置於該顯示螢幕上時對照出具有缺陷的部件32,於此,先以該印刷電路板3之第二面38貼附至該顯示區144表面且對應於該特定區域1442的位置,此時,如第3圖所示,該顏色區塊30會透過該印刷電路板3上對應具有缺陷的部件32周圍之槽孔34顯露出,即具有缺陷之部件32會被與該印刷電路板3相異之顏色所圍繞,以供該操作員觀看,上述步驟使該操作員可輕易地且快速地立即辨識並確認具有缺陷的部件32位於該第一面36的位置,同時,該操作員可直接於該印刷電路板3的第一面36進行打印塗銷。其中,該顏色區塊30之面積係略大於各該部件32 的面積,以在該印刷電路板3覆蓋於該顯示區144之特定區域1442上時,該顏色區塊30之一部分仍可藉由具有缺陷的部件32周圍之槽孔34顯露出供操作員觀看。For example, when the area of the area to be tested 31 is equal to the area of the printed circuit board 3, it can be displayed in the specific area 1442 of the same size of the area surrounded by the boundary of the printed circuit board 3 in the display area 144. Defective position of the first face 36 of the printed circuit board 3 for the operator to compare the defective component 32 when the printed circuit board 3 is correspondingly placed on the display screen, where the printed circuit is first used The second surface 38 of the board 3 is attached to the surface of the display area 144 and corresponds to the position of the specific area 1442. At this time, as shown in FIG. 3, the color block 30 will have a corresponding transmission through the printed circuit board 3. The slot 34 around the defective component 32 is revealed, i.e., the defective component 32 is surrounded by a color different from the printed circuit board 3 for viewing by the operator. The above steps allow the operator to easily and The component 32 having defects is quickly identified and confirmed to be in the position of the first face 36, and the operator can print the pin directly to the first face 36 of the printed circuit board 3. Wherein, the area of the color block 30 is slightly larger than each of the components 32. The area of the color block 30 can still be exposed by the slot 34 around the defective component 32 for viewing by the operator when the printed circuit board 3 covers a particular area 1442 of the display area 144. .

再者,該處理單元12可執行該軟體程式,並根據位於該第一面36之具有缺陷的部件32的位置,使該處理單元進行反轉且對應產生具有缺陷的部件32位於該第二面38之位置的標識訊息,以在該顯示區144上之特定像素位置發亮而呈現顏色區塊30,於此,以該印刷電路板3之第一面36貼附至該顯示區144表面且對應於該特定區域1442的位置,此時,該顏色區塊30會透過該印刷電路板3上對應具有缺陷的部件32周圍之槽孔34顯露出,即具有缺陷之部件32會被與該印刷電路板3相異之顏色所圍繞,以供該操作員觀看,上述步驟使該操作員可立即辨識並確認具有缺陷的部件32位於該第二面38的位置,改善習知該操作員需根據該檢測結果而一個一個對應地尋找具有缺陷之部件32以進行打印塗銷。Furthermore, the processing unit 12 can execute the software program, and according to the position of the component 32 having the defect on the first surface 36, the processing unit is reversed and the component 32 having the defect is correspondingly located on the second surface. The identification message at the position of 38 is illuminated by a particular pixel location on the display area 144 to present a color block 30, where the first side 36 of the printed circuit board 3 is attached to the surface of the display area 144 and Corresponding to the position of the specific area 1442, at this time, the color block 30 is exposed through the slot 34 around the corresponding defective component 32 on the printed circuit board 3, that is, the defective component 32 is printed with the defect. The circuit board 3 is surrounded by a different color for viewing by the operator. The above steps allow the operator to immediately recognize and confirm that the defective component 32 is located at the second face 38, improving the conventional operator's The result of the test is to find the defective component 32 one by one for printing and coating.

其中,該標識訊息亦可利用閃爍或其他可經人眼辨識的方式,於該印刷電路板3上具有缺陷的部件32周圍之槽孔或具有缺陷的部件32旁特定位置之槽孔顯露出,供該操作員易於觀察和辨識。Wherein, the identification message may also be exposed by a blinking or other eye-recognisable manner to a slot around the component 32 having the defect on the printed circuit board 3 or a slot at a specific position adjacent to the defective component 32. It is easy for the operator to observe and identify.

於一實施例中,該處理單元12可更包含一切換器(圖未示),係用以切換而選擇該顯示模組顯示該待測物之第一面的標識訊息及第二面的標識訊息之至少其一中者。In an embodiment, the processing unit 12 further includes a switch (not shown) for switching to select the display module to display the identification information of the first side of the object to be tested and the identifier of the second side. At least one of the messages.

於一實施例中,該顯示螢幕係可用於顯示一十字定位 標誌(圖未示),該十字定位標誌係具有由其中心向外漸層變化的色彩分布或灰階變化,用以對應位於該待測物之至少一定位孔,使該待測物放置於該顯示螢幕上進行對位時,該十字定位標誌可藉由該定位孔部分地顯示而供操作員觀測,可藉由該十字定位標誌的色彩或灰階分布辨識該待測物所在之位置相對該顯示螢幕的位置,進一步決定該待測物需移動的方向,以將該待測物放置於適當的位置而準確地進行該待測物的對位標記,避免放置待測物時擋住螢幕所顯示的定位標誌而造成難以定位的情況。In an embodiment, the display screen can be used to display a cross position a mark (not shown) having a color distribution or a gray scale change gradually changing from the center to the at least one positioning hole of the object to be tested, so that the object to be tested is placed on When the display screen is aligned, the cross positioning mark can be partially displayed by the positioning hole for the operator to observe, and the position of the object to be tested can be identified by the color or gray scale distribution of the cross positioning mark. The position of the display screen further determines the direction in which the object to be tested needs to be moved, so that the object to be tested is placed in an appropriate position to accurately perform the alignment mark of the object to be tested, thereby avoiding blocking the screen when the object to be tested is placed. The positioning flag is displayed to cause difficulty in positioning.

值得注意的是,該處理單元於提供給操作者使用前,應先進行像素數目與實際距離的相對調整,以使在該顯示模組所顯示之標識訊息的尺寸係等同於該待測物之實際尺寸。It should be noted that before the processing unit is provided for use by the operator, the relative adjustment between the number of pixels and the actual distance should be performed, so that the size of the identification message displayed on the display module is equivalent to the object to be tested. Actual size.

再者,於一實施例中,該顯示模組14可更包含至少一定位件(圖未示),該定位件可為描述該定位孔之位置的十字標誌亦可為描述待測物之外型的其他標誌,或者該定位件可為定位針、定位凸柱等,該定位件係設置於該顯示模組14,例如位於該顯示螢幕的邊框142上,用以對應該待測物上之至少一定位標誌以將該待測物定位於該顯示模組14,使該待測物放置於該顯示模組時,各該定位標誌可對應地套設在各該定位件,以使該待測物放置於適當的位置而準確地進行該特定特徵的對位標記。Furthermore, in an embodiment, the display module 14 can further include at least one positioning member (not shown), and the positioning member can be a cross mark describing the position of the positioning hole or can be used to describe the object to be tested. The locating member is disposed on the display module 14 , for example, on the frame 142 of the display screen for corresponding to the object to be tested. At least one positioning mark is used to position the object to be tested on the display module 14 so that the object to be tested is placed on the display module, and each of the positioning marks can be correspondingly disposed on each of the positioning members to enable the object to be tested. The test object is placed in an appropriate position to accurately perform the alignment mark of the particular feature.

請參照第4圖,係為本發明一具體實施例之待測物之輔助對位方法的步驟流程圖。如圖所示,待測物之輔助對 位方法,係用於輔助辨識一待測物之一待測區的特定特徵位於該待測物上的位置。Please refer to FIG. 4, which is a flow chart of the steps of the auxiliary alignment method of the object to be tested according to an embodiment of the present invention. As shown in the figure, the auxiliary pair of the object to be tested The bit method is used to assist in identifying a position of a specific feature of a test object on the object to be tested.

其中,該輔助對位方法係起始於步驟S31,提供具有一處理單元及一顯示模組之一輔助對位系統,且該處理單元電連接該顯示模組。The auxiliary alignment method starts from step S31, and provides an auxiliary alignment system having a processing unit and a display module, and the processing unit is electrically connected to the display module.

接著步驟S32,令該處理單元接收包含該特定特徵之一特徵訊息。Next, in step S32, the processing unit receives a feature message including one of the specific features.

又接著步驟S33,令該處理單元根據該特徵訊息而對應產生一標識訊息,並在該顯示模組之特定區域內顯示該標識訊息,以供操作員辨識並將該特定特徵對位標記於該待測物上,其中該特定區域與該待測區相對應。Step S33, the processing unit correspondingly generates an identification message according to the feature information, and displays the identification message in a specific area of the display module for the operator to recognize and mark the specific feature in the On the object to be tested, the specific area corresponds to the area to be tested.

綜上所述,本發明之待測物之輔助對位方法與其系統,係利用處理單元與顯示模組,來輔助操作員在檢測程序中能夠輕易地且快速地辨識待測物的特定特徵位於該待測物中相對應之第一面與第二面中的對應位置,達到提升產線效率的功效。In summary, the auxiliary alignment method and system of the object to be tested according to the present invention utilizes a processing unit and a display module to assist an operator in easily and quickly identifying a specific feature of the object to be tested in the detection program. The corresponding position in the first surface and the second surface corresponding to the object to be tested achieves the effect of improving the efficiency of the production line.

本發明在上文中已以較佳實施例揭露,然熟習本項技術者應理解的是,該實施例僅用於描繪本發明,而不應解讀為限制本發明之範圍,舉凡與該實施例等效之變化與置換,均應設為涵蓋於本發明之範疇內。因此,本發明之保護範圍當以申請專利範圍所界定者為準。The present invention has been disclosed in the above preferred embodiments, and it should be understood by those skilled in the art that the present invention is not intended to limit the scope of the present invention. Equivalent variations and permutations are intended to be encompassed within the scope of the invention. Therefore, the scope of protection of the present invention is defined by the scope of the patent application.

10‧‧‧輔助對位系統10‧‧‧Auxiliary registration system

12‧‧‧處理單元12‧‧‧Processing unit

14‧‧‧顯示模組14‧‧‧Display module

142‧‧‧邊框142‧‧‧Border

144‧‧‧顯示區144‧‧‧ display area

1442‧‧‧特定區域1442‧‧‧Specific areas

3‧‧‧印刷電路板3‧‧‧Printed circuit board

30‧‧‧顏色區塊30‧‧‧Color block

31‧‧‧待測區31‧‧‧Down area

32‧‧‧部件32‧‧‧ Parts

34‧‧‧槽孔34‧‧‧Slots

36‧‧‧第一面36‧‧‧ first side

38‧‧‧第二面38‧‧‧ second side

S31、S32、S33‧‧‧步驟S31, S32, S33‧‧‧ steps

Sin‧‧‧特徵訊息Sin‧‧‧Characteristics

第1圖為本發明一具體實施例之待測物之輔助對位系 統的功能方塊圖。1 is an auxiliary alignment system of a test object according to an embodiment of the present invention The function block diagram.

第2圖為本發明一具體實施例之待測物利用輔助對位系統進行對位的示意圖。FIG. 2 is a schematic diagram of the object to be tested being aligned by the auxiliary alignment system according to an embodiment of the present invention.

第3圖為本發明一具體實施例之待測物利用輔助對位系統進行對位的示意圖。FIG. 3 is a schematic diagram of the object to be tested being aligned by the auxiliary alignment system according to an embodiment of the present invention.

第4圖為本發明一具體實施例之待測物之輔助對位方法的步驟流程圖。FIG. 4 is a flow chart showing the steps of the auxiliary alignment method of the object to be tested according to an embodiment of the present invention.

S31、S32、S33‧‧‧步驟S31, S32, S33‧‧‧ steps

Claims (14)

一種待測物之輔助對位方法,係用於輔助辨識一待測物之一待測區中的特定特徵之位置,該輔助對位方法包含:提供具有一處理單元及一顯示模組之一輔助對位系統,該處理單元電連接該顯示模組;令該處理單元接收包含該特定特徵之一特徵訊息;以及令該處理單元根據該特徵訊息而對應產生一標識訊息,並在該顯示模組之特定區域內顯示該標識訊息,以供該待測物對應放置於該顯示模組上時對照出具該特定特徵之位置,其中該特定區域與該待測區相對應。 An auxiliary alignment method of the object to be tested is used for assisting in identifying the position of a specific feature in a test area of a test object, the auxiliary alignment method comprising: providing one of a processing unit and a display module An auxiliary alignment system, the processing unit is electrically connected to the display module; the processing unit receives a feature message including the specific feature; and causes the processing unit to generate an identification message according to the feature message, and in the display mode The identification information is displayed in a specific area of the group for the position of the specific feature to be compared when the object to be tested is placed on the display module, wherein the specific area corresponds to the area to be tested. 如申請專利範圍第1項所述之輔助對位方法,其中該特徵訊息係包含一檢測結果及一控制訊息,該檢測結果係由一檢測裝置或一複檢裝置所提供,且該控制訊息係由一輸入模組所提供。 The auxiliary alignment method according to claim 1, wherein the characteristic message includes a detection result and a control message, and the detection result is provided by a detecting device or a rechecking device, and the control message is Provided by an input module. 如申請專利範圍第2項所述之輔助對位方法,其中該檢測結果係包含該待測物的特定位置及缺陷位置之至少其中一者,該控制訊息係包含該待測物的尺寸、形狀及排版之至少其中一者。 The auxiliary alignment method according to claim 2, wherein the detection result includes at least one of a specific position and a defect position of the object to be tested, and the control message includes a size and a shape of the object to be tested. And at least one of the typesetting. 如申請專利範圍第1項所述之輔助對位方法,其中該顯示模組係為一顯示螢幕,且該標識訊息的顯示方法係為在該顯示螢幕上之特定像素位置發亮。 The auxiliary alignment method of claim 1, wherein the display module is a display screen, and the display method of the identification message is illuminated at a specific pixel position on the display screen. 如申請專利範圍第2項所述之輔助對位方法,其中該檢測裝置或該複檢裝置係產生關於該待測物之一第一面的 檢測結果,而該處理單元係產生關於該待測物中對應於該第一面之一第二面的標識訊息。 The auxiliary alignment method of claim 2, wherein the detecting device or the rechecking device generates a first side of the object to be tested The detection result is generated, and the processing unit generates an identification message corresponding to the second side of the first surface of the object to be tested. 如申請專利範圍第2項所述之輔助對位方法,其中該檢測裝置或該複檢裝置係產生關於該待測物之一第一面的檢測結果,而該處理單元係產生關於該待測物中該第一面的標識訊息及對應於該第一面之一第二面的標識訊息。 The auxiliary alignment method of claim 2, wherein the detecting device or the rechecking device generates a detection result about a first side of the object to be tested, and the processing unit generates The identification message of the first side and the identification message corresponding to the second side of the first side. 一種待測物之輔助對位系統,用於輔助辨識一待測物之一待測區中的特定特徵之位置,該輔助對位系統包含:一處理單元,係用於接收包含該特定特徵之一特徵訊息以對應產生一標識訊息;以及一顯示模組,係電連接該處理單元,且該顯示模組用於承載該待測物以及在其特定區域內顯示該標識訊息,以供該待測物對應放置於該顯示模組上時對照出具該特定特徵之位置,其中該特定區域與該待測區相對應。 An auxiliary alignment system of a test object for assisting in identifying a location of a specific feature in a test area of a test object, the auxiliary alignment system comprising: a processing unit for receiving the specific feature a feature message correspondingly generates an identification message; and a display module electrically connected to the processing unit, and the display module is configured to carry the object to be tested and display the identification message in a specific area thereof for the When the object is placed on the display module, the position corresponding to the specific feature is compared, wherein the specific area corresponds to the area to be tested. 如申請專利範圍第7項所述之輔助對位系統,其中該特徵訊息係包含一檢測結果及一控制訊息,該檢測結果係由一檢測裝置或一複檢裝置所提供,且該控制訊息係由一輸入模組所提供。 The auxiliary alignment system of claim 7, wherein the characteristic message comprises a detection result and a control message, and the detection result is provided by a detecting device or a rechecking device, and the control message is Provided by an input module. 如申請專利範圍第7項所述之輔助對位系統,其中該顯示模組係為一顯示螢幕。 The auxiliary alignment system of claim 7, wherein the display module is a display screen. 如申請專利範圍第8項所述之輔助對位系統,其中該檢測裝置係產生關於該待測物之一第一面的檢測結果,而該處理單元係產生關於該待測物中對應於該第一面之一 第二面的標識訊息。 The auxiliary alignment system according to claim 8, wherein the detecting device generates a detection result about a first side of the object to be tested, and the processing unit generates, regarding the object to be tested, corresponding to the One of the first side The second side of the identification message. 如申請專利範圍第8項所述之輔助對位系統,其中該檢測裝置或該複檢裝置係產生關於該待測物之一第一面的檢測結果,而該處理單元係產生關於該待測物中該第一面的標識訊息及對應於該第一面之一第二面的標識訊息。 The auxiliary alignment system of claim 8, wherein the detecting device or the rechecking device generates a detection result about a first side of the object to be tested, and the processing unit generates The identification message of the first side and the identification message corresponding to the second side of the first side. 如申請專利範圍第11項所述之輔助對位系統,其中該處理單元更包含一切換器,係用以切換該顯示模組顯示該待測物之第一面的標識訊息及第二面的標識訊息之至少其中一者。 The auxiliary alignment system of claim 11, wherein the processing unit further comprises a switch for switching the display module to display the identification information of the first side of the object to be tested and the second side Identify at least one of the messages. 如申請專利範圍第9項所述之輔助對位系統,其中該顯示螢幕係顯示一十字定位標誌,該十字定位標誌係具有由其中心向外漸層變化的色彩分布或灰階變化,該十字定位標誌用以對應該待測物之至少一定位孔以定位該待測物。 The auxiliary alignment system of claim 9, wherein the display screen displays a cross-positioning mark having a color distribution or a gray scale change gradually changing from the center thereof, the cross The positioning mark is configured to correspond to at least one positioning hole of the object to be tested to locate the object to be tested. 如申請專利範圍第7項所述之輔助對位系統,其中該顯示模組更包含至少一定位件,係設置於該顯示模組。The auxiliary alignment system of claim 7, wherein the display module further comprises at least one positioning component disposed on the display module.
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