TWI472738B - Material aging test apparatus and method thereof - Google Patents

Material aging test apparatus and method thereof Download PDF

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TWI472738B
TWI472738B TW102127796A TW102127796A TWI472738B TW I472738 B TWI472738 B TW I472738B TW 102127796 A TW102127796 A TW 102127796A TW 102127796 A TW102127796 A TW 102127796A TW I472738 B TWI472738 B TW I472738B
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aging test
test apparatus
material aging
platform
light
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TW102127796A
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TW201506376A (en
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yi wei Lin
Yu Tai Li
Hung Sen Wu
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Ind Tech Res Inst
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材料老化測試設備及其測試方法Material aging test equipment and test method thereof

本揭露係有關於一種測試設備及測試方法,尤指一種材料老化測試設備及其測試方法。The disclosure relates to a test device and a test method, and more particularly to a material aging test device and a test method thereof.

太陽能是一種永不耗盡且無污染的能源,在解決目前石化能源所面臨的污染與短缺時,一直是最受矚目的焦點。其中,又以太陽能電池(solar cell)可直接將太陽能轉換為電能,而成為目前相當重要的替代能源方案之一。Solar energy is an energy that is never depleted and pollution-free. It has always been the focus of attention when solving the pollution and shortages faced by petrochemical energy. Among them, the solar cell can directly convert solar energy into electric energy, and it has become one of the most important alternative energy solutions.

一般而言,此種長時間在戶外環境使用的產品,其耐候性往往受到環境、氣候的影響。舉例來說,無論是太陽能電池本身亦或其封裝材料,其長時間在太陽光底下運作的情況下,紫外線是造成材料劣化的原因之一。In general, the weather resistance of such products used in outdoor environments for a long time is often affected by the environment and climate. For example, whether it is the solar cell itself or its packaging material, ultraviolet light is one of the causes of material deterioration in the case of long-term operation under the sun.

因此,為了提昇產品的使用壽命,並在短時間內獲得產品的耐候參數,通常會對產品進行加速老化測試,而當老化測試完成後,再對經過老化測試的樣品進行頻譜量測,以作為老化參數調控的依據。Therefore, in order to improve the service life of the product and obtain the weathering parameters of the product in a short time, the product is usually subjected to accelerated aging test, and when the aging test is completed, the aging test sample is subjected to spectrum measurement as a measure. The basis for the regulation of aging parameters.

然而,若以太陽模擬光源、氙燈或是紫外線燈管作為老化測試設備加速老化的測試光源時,由於受限於光源的運作模式,多是以大面積光源照射樣品,因而減弱了光源在單位面積上的照 度,此時為提高老化的速率,通常會以提高光源強度為一方式,但此舉卻容易造成樣品溫度增加,容易導致樣品受熱,進而影響樣品老化的因素。此外,上述老化光源多採大範圍面積老化,不易對樣品進行局部照射及對各個局部投射不同照度的光源。此外,上述光源皆以一定範圍的波長對樣品進行老化照射,其可能無法進一步地提供單一波長光源或隨著條件微調其波長範圍。However, if the solar analog light source, xenon lamp or ultraviolet lamp is used as the test source for accelerating aging of the aging test equipment, it is limited by the operation mode of the light source, and the sample is irradiated with a large area light source, thereby weakening the light source in the unit area. Photo Degree, in order to increase the rate of aging, usually to improve the intensity of the light source as a way, but this will easily lead to an increase in the temperature of the sample, which will easily lead to heat of the sample, which in turn affects the aging of the sample. In addition, the above-mentioned aging light source adopts a large-area aging, and it is difficult to locally irradiate the sample and to project a light source of different illuminance for each part. In addition, the above-mentioned light sources aging the sample with a range of wavelengths, which may not further provide a single wavelength source or fine-tune its wavelength range with conditions.

如前所述,完成老化測試後,再對經過老化測試的樣品進行頻譜量測,以作為老化參數調控的依據。就相關技術領域業者而言,老化測試設備與頻譜量測設備多是獨立的二種設備,且由於老化測試設備所採用之光源與頻譜量測設備所採用之光源不同,會將完成老化測試的樣品移送至頻譜量測平台進行頻譜量測。As described above, after the aging test is completed, the sample subjected to the aging test is subjected to spectrum measurement as a basis for the regulation of the aging parameter. As far as the relevant technical field is concerned, the aging test equipment and the spectrum measurement equipment are mostly two independent devices, and since the light source used in the aging test equipment is different from the light source used in the spectrum measurement equipment, the aging test will be completed. The sample is transferred to a spectrum measurement platform for spectral measurement.

此外,若將頻譜量測設備設置於老化測試設備內部並配合一旋轉平台,利用平台旋轉將完成老化測試之樣品送至頻譜系統相對應位置以進行樣品頻譜量測,其所能達成之功效為可縮短樣品移送過程的時間,但是老化測試與頻譜量測所採用之光源不同,因此也不易同時進行老化測試與頻譜量測,此外,可能會使設備體積極為龐大。In addition, if the spectrum measuring device is set inside the aging test device and cooperates with a rotating platform, the sample of the aging test is sent to the corresponding position of the spectrum system by using the platform rotation to perform the sample spectrum measurement, and the effect can be achieved. The time required for the sample transfer process can be shortened, but the aging test is different from the light source used for the spectrum measurement, so it is not easy to perform the aging test and the spectrum measurement at the same time, and in addition, the device may be extremely bulky.

基於上述,如何提高老化測試效率,並能於老化測試過程中同步進行頻譜量測,是目前研究的課題之一。Based on the above, how to improve the efficiency of aging test and to perform spectrum measurement synchronously in the aging test process is one of the research topics.

本揭露提出一種材料老化測試設備,包括一脈衝雷射光源,用以提供一第一光束;一擴束組件,用以將該第一光束轉換成一第二光束後投射至一物件;一平台,用以承載該物件;以及一頻譜分析儀,用以量測該物件因該第二光束之投射所產生之頻譜響 應。The present invention provides a material aging test apparatus comprising a pulsed laser source for providing a first beam; a beam expanding component for converting the first beam into a second beam and projecting to an object; For carrying the object; and a spectrum analyzer for measuring the spectral response of the object due to the projection of the second beam should.

本揭露提出一種材料老化測試方法,包括由一脈衝雷射光源提供一第一光束投射至一擴束組件;該第一光束經由該擴束組件轉換成一第二光束後投射至一物件,並持續投射一段時間;以及於該第二光束投射於該物件之該段時間內,由一頻譜分析儀量測該物件因該第二光束之投射所產生之頻譜響應。The present invention provides a material aging test method, comprising: providing a first beam of light from a pulsed laser source to a beam expanding component; the first beam is converted into a second beam by the beam expanding component and projected onto an object, and continues Projecting for a period of time; and during a period of time during which the second beam is projected onto the object, the spectrum response of the object due to the projection of the second beam is measured by a spectrum analyzer.

為使本揭露之結構、目的和功效有更進一步之了解,茲配合圖示詳細說明如后。In order to further understand the structure, purpose and function of the present disclosure, a detailed description will be given in conjunction with the drawings.

100‧‧‧材料老化測試設備100‧‧‧Material aging test equipment

110‧‧‧基座110‧‧‧Base

120‧‧‧平台120‧‧‧ platform

130‧‧‧脈衝雷射光源130‧‧‧pulse laser source

140、140A、140B‧‧‧擴束組件140, 140A, 140B‧‧‧ Expanding components

141、142‧‧‧光學元件141, 142‧‧‧ optical components

150‧‧‧平台150‧‧‧ platform

160‧‧‧溫度控制模組160‧‧‧temperature control module

170‧‧‧頻譜分析儀170‧‧‧ spectrum analyzer

171‧‧‧濾光片171‧‧‧Filter

200‧‧‧物件200‧‧‧ objects

A1、A2、A3、A4‧‧‧區塊Blocks A1, A2, A3, A4‧‧

B1‧‧‧第一光束B1‧‧‧First beam

B2‧‧‧第二光束B2‧‧‧second beam

C1、C2、C3、C4‧‧‧曲線C1, C2, C3, C4‧‧‧ curves

L1、L2、L3、L4‧‧‧路徑L1, L2, L3, L4‧‧‧ path

SP1、SP2、SP3、SP4‧‧‧光斑SP1, SP2, SP3, SP4‧‧‧ spot

圖1係本揭露一實施例之架構示意圖。FIG. 1 is a schematic structural diagram of an embodiment of the present disclosure.

圖2係圖1的第二光束在物件上形成光斑的移動路徑示意圖。2 is a schematic view showing a moving path of a second light beam of FIG. 1 to form a spot on an object.

圖3係本揭露之擴束組件一實施例之結構示意圖。3 is a schematic structural view of an embodiment of the beam expanding assembly of the present disclosure.

圖4係本揭露之擴束組件另一實施例之結構示意圖。4 is a schematic structural view of another embodiment of the beam expander assembly of the present disclosure.

圖5係本揭露之擴束組件又一實施例之結構示意圖。FIG. 5 is a schematic structural view of still another embodiment of the beam expander assembly of the present disclosure.

圖6係本揭露利用脈衝雷射光源作為老化測試光源與傳統老化測試光源之比較曲線圖。FIG. 6 is a graph comparing the use of a pulsed laser source as an aging test source and a conventional burn-in test source.

圖7係本揭露物件之光子數量隨時間變化之頻譜響應圖。Figure 7 is a graph of the spectral response of the number of photons of the present invention as a function of time.

圖8係將圖7積分後之頻譜響應圖。Figure 8 is a spectrum response diagram after integration of Figure 7.

以下將參照隨附之圖式來描述本揭露為達成目的所使用的技術手段與功效,而以下圖式所列舉之實施例僅為輔助說明,以利瞭解,但本案之技術手段並不限於所列舉圖式。The technical means and functions used in the present disclosure for the purpose of the present invention will be described with reference to the accompanying drawings, and the embodiments illustrated in the following drawings are only for the purpose of illustration, but the technical means of the present invention are not limited thereto. List the schema.

請參閱圖1所示,材料老化測試設備100係用以對一物件200進行光老化測試,藉以得知材料的耐候特性。材料老化測試設備 100包括一基座110、一平台120、一脈衝雷射光源130、一擴束組件140以及一頻譜分析儀170。基座110例如是一花崗石座,而將平台120、脈衝雷射光源130、擴束組件140與頻譜分析儀170架設其上。平台120例如是一X軸-Y軸移動平台,其用以承載並驅使物件200移動。擴束組件140位在平台120與物件200的上方。脈衝雷射光源130所發出光束經由擴束組件140而投射至平台120上的物件200。此外,材料老化測試設備100還包括設置在平台120上的一平台150與一溫度控制模組160,其中平台150是利用真空吸附的方式將物件200固定其上,而溫度控制模組160設置在平台150內且具有水冷式迴路(未繪示),用以對平台150上的物件200提供冷卻的效果。Referring to FIG. 1 , the material aging test apparatus 100 is used to perform photoaging test on an object 200 to obtain weather resistance characteristics of the material. Material aging test equipment 100 includes a pedestal 110, a platform 120, a pulsed laser source 130, a beam expander assembly 140, and a spectrum analyzer 170. The pedestal 110 is, for example, a granite seat, and the platform 120, the pulsed laser source 130, the beam expanding assembly 140, and the spectrum analyzer 170 are erected thereon. The platform 120 is, for example, an X-axis-Y-axis moving platform that carries and drives the movement of the article 200. The beam expanding assembly 140 is positioned above the platform 120 and the article 200. The beam emitted by the pulsed laser source 130 is projected to the object 200 on the platform 120 via the beam expanding assembly 140. In addition, the material aging test apparatus 100 further includes a platform 150 disposed on the platform 120 and a temperature control module 160, wherein the platform 150 is fixed to the object 200 by vacuum adsorption, and the temperature control module 160 is disposed at The platform 150 has a water-cooled circuit (not shown) for providing cooling effect to the article 200 on the platform 150.

脈衝雷射光源130用以提供一第一光束B1至擴束組件140,並經由擴束組件140將第一光束B1轉換成一第二光束B2後方投射至物件200表面。該第一光束B1的功率可調整,且該第一光束B1的波長可調整。在此,本實施例的脈衝雷射光源130是以產生波長範圍280nm(奈米)至400nm的第一光束B1與第二光束B2,亦即以對材料劣化有明顯影響的紫外光作為光老化的照射光源。The pulsed laser source 130 is configured to provide a first beam B1 to the beam expanding assembly 140, and convert the first beam B1 into a second beam B2 via the beam expanding assembly 140 to project to the surface of the object 200. The power of the first beam B1 is adjustable, and the wavelength of the first beam B1 is adjustable. Here, the pulsed laser light source 130 of the present embodiment is configured to generate a first light beam B1 and a second light beam B2 having a wavelength range of 280 nm (nano) to 400 nm, that is, ultraviolet light having a significant influence on material deterioration as photoaging. The source of illumination.

在本實施例中,脈衝雷射光源130為短脈衝雷射,其脈衝寬度小於1μs,脈衝重覆率大於或等於10Hz,以讓雷射的平均能量能轉換成週期性且瞬時的高能量,而讓物件200所承受的照度具有周期性且瞬時的高強度老化作用,但是低累積能量的老化效果。In the present embodiment, the pulsed laser source 130 is a short pulse laser having a pulse width of less than 1 μs and a pulse repetition rate greater than or equal to 10 Hz to convert the average energy of the laser into a periodic and instantaneous high energy. The illuminance experienced by the object 200 has a periodic and instantaneous high-intensity aging effect, but a low cumulative energy aging effect.

舉例來說,當物件200為太陽能電池模組時,以能量為100Mj(百萬焦耳),脈衝寬度為5ns(奈秒)以及脈衝重覆率10Hz(赫茲)的脈衝雷射光源130為例,經擴束組件140而投射至物件200 上的第二光束B2,其平均功率密度能依據不同的擴束面積調整為10kw/m2 (千瓦/平方公尺)至0.1kw/m2 ,但因脈衝雷射光源130的特性,而使物件200所承受的瞬間照度(以5ns進行換算)達20Mkw/m2 ~0.2Mkw/m2 ,依照此適中的平均功率密度作用下,將可以對太陽能電池模組進行加速光老化的作用而不致於導致模組的燒熔或再結晶(回火)作用。類似地,當物件200為高分子材料時,第二光束B2的平均功率密度為5kw/m2 至0.1kw/m2 ,可對物件200進行加速光老化的作用而不致於導致高分子材料的破壞。For example, when the object 200 is a solar cell module, a pulsed laser source 130 having an energy of 100 Mj (million joules), a pulse width of 5 ns (nanoseconds), and a pulse repetition rate of 10 Hz (hertz) is taken as an example. The second beam B2 projected onto the object 200 by the beam expander assembly 140 can have an average power density adjusted to 10 kw/m 2 (kilowatts per square meter) to 0.1 kw/m 2 depending on the different beam expanding area, but The characteristics of the pulsed laser source 130 are such that the instantaneous illumination (converted in 5 ns) of the object 200 is 20 Mkw/m 2 to 0.2 Mkw/m 2 , and the solar cell can be used according to the moderate average power density. The module performs accelerated photoaging without causing the module to melt or recrystallize (temper). Similarly, when the object 200 is a polymer material, the second power beam B2 has an average power density of 5 kw/m 2 to 0.1 kw/m 2 , which can accelerate the photoaging of the object 200 without causing a polymer material. damage.

除了提供瞬時高功率密度的老化特性外,藉由雷射的脈衝特性,其異於現有持續性的照射光源,因而照射在物件200上的能量並不會因此而累積,亦即物件200的溫度並不會因持續照射而逐漸增加,故能有效地降低物件200因熱效應而影響其光老化測試。換句話說,本實施例的材料老化測試設備100,其藉由設置在平台150內的溫度控制模組160便足以達到控制物件200溫度的效果。在本實施例中,溫度控制模組160可將平台150上的物件200溫度維持在10℃至60℃,除避免熱量累積而影響其光老化外,亦能有效地避免材料發生再結晶(或退火)的現象,甚至因燒熔而損壞。In addition to providing an aging characteristic of instantaneous high power density, the laser is different from the existing continuous illumination source by the pulse characteristics of the laser, so that the energy irradiated on the object 200 does not accumulate, that is, the temperature of the object 200. It does not gradually increase due to continuous irradiation, so it can effectively reduce the photoaging test of the object 200 due to thermal effects. In other words, the material aging test apparatus 100 of the present embodiment is sufficient to achieve the effect of controlling the temperature of the object 200 by the temperature control module 160 disposed in the platform 150. In this embodiment, the temperature control module 160 can maintain the temperature of the object 200 on the platform 150 at 10 ° C to 60 ° C, in addition to avoiding heat accumulation and affecting its photoaging, it can also effectively prevent material from recrystallization (or The phenomenon of annealing) is even damaged by burning.

圖2是圖1的第二光束在物件上形成光斑的移動路徑示意圖。請同時參考圖1與圖2,在本實施例中,藉由平台120帶動物件200移動,而能讓使用者控制第二光束B2在物件200上的移動路徑,並進一步地依據測試條件而調整第二光束B2的移動路徑、功率與波長範圍。2 is a schematic view showing a moving path of a second light beam of FIG. 1 to form a spot on an object. Referring to FIG. 1 and FIG. 2 simultaneously, in the embodiment, the movement of the animal member 200 by the platform 120 allows the user to control the moving path of the second light beam B2 on the object 200, and further adjusts according to the test conditions. The path of movement, power and wavelength range of the second beam B2.

舉例來說,將物件200表面區分成四個區塊A1至A4,並使 第二光束B2在區塊A1至A4中分別以不同路徑行經物件200的表面,同時讓第二光束B2的功率、波長甚或照射面積隨著路徑而改變。如此一來,在區塊A1中,第二光束B2在物件200上形成的光斑SP1便是以路徑L1進行掃描。同樣地,在區塊A2至A4亦能以類似方式而讓光斑SP2至SP4分別以路徑L2至L4進行掃描,其中所述路徑L1至L4可以分別具有不同的疏密程度。如此一來,使用者便能在同一物件200上以多種條件形成的光斑進行照射,因而能以更有效率的方式取得物件200對於光老化的耐受參數。此外,藉由可調波長的脈衝雷射光源130,亦能針對部分特定波長而對物件200產生選擇性老化的結果,使用者並能因此找出物件200的材料特徵對應特定吸收波長的相對關係。For example, the surface of the object 200 is divided into four blocks A1 to A4, and The second light beam B2 travels through the surfaces of the object 200 in different paths in the blocks A1 to A4, respectively, while allowing the power, wavelength or even the illumination area of the second light beam B2 to change with the path. As a result, in the block A1, the spot SP1 formed on the object 200 by the second light beam B2 is scanned by the path L1. Similarly, the patches SP2 to SP4 can be scanned in the similar manner with the paths L2 to L4 in the blocks A2 to A4, respectively, wherein the paths L1 to L4 can have different degrees of density, respectively. In this way, the user can illuminate the spot formed by the various conditions on the same object 200, thereby obtaining the tolerance parameter of the object 200 for photoaging in a more efficient manner. In addition, by the pulsed laser source 130 of the tunable wavelength, the result of selective aging of the object 200 can also be generated for a portion of the specific wavelength, and the user can thereby find the relative relationship between the material characteristics of the object 200 and the specific absorption wavelength. .

此外,為順利達到上述效果,從脈衝雷射光源130投射出的第一光束B1可以先以擴束組件140對其進行轉換,而後以第二光束B2投射在物件200上以形成所需條件的光斑。圖3係本揭露之擴束組件一實施例之結構示意圖。請參考圖3,擴束組件140是由多個光學元件(或透鏡組)141、142所組成,以將第一光束B1的光斑面積擴大並整形成所需的輪廓,亦即使本實施例的第二光束B2的光斑面積大於第一光束B1的光斑面積。如圖2所繪示,在20cm2 (平方公分)的物件200上形成面積大於1cm2 的光斑SP1至SP4,而再以圖2所繪示不同路徑掃描物件200,以達到對物件200進行加速光老化的效果。此外,經由擴束之後的第二光束B2,其單位面積能量亦會因此小於第一光束B1的單位面積能量,此舉同時降低物件200所承受的能量而避免溫度過高。In addition, in order to achieve the above effect smoothly, the first light beam B1 projected from the pulsed laser light source 130 may be first converted by the beam expanding component 140, and then projected onto the object 200 by the second light beam B2 to form a desired condition. Spot. 3 is a schematic structural view of an embodiment of the beam expanding assembly of the present disclosure. Referring to FIG. 3, the beam expander assembly 140 is composed of a plurality of optical elements (or lens groups) 141, 142 to enlarge and shape the spot area of the first light beam B1, even if the embodiment is The spot area of the second light beam B2 is larger than the spot area of the first light beam B1. As shown in FIG. 2, the spots SP1 to SP4 having an area larger than 1 cm 2 are formed on the object 200 of 20 cm 2 (cm 2 ), and the object 200 is scanned with different paths as shown in FIG. 2 to accelerate the object 200. The effect of photoaging. In addition, the energy per unit area of the second light beam B2 after the expansion is also smaller than the energy per unit area of the first light beam B1, which simultaneously reduces the energy received by the object 200 and avoids excessive temperature.

在此並未限制擴束組件的組成,任何能對脈衝雷射光源130 所發出的第一光束B1予以擴束、整形者,皆可適用於本實施例。圖4是本揭露另一實施例擴束組件的示意圖,本實施例擴束組件140A為伽利略擴束鏡組(Galilean beam expander),在結構上異於圖3所繪示者為開普勒式擴束鏡組(Keplerian beam expander),但卻能達到類似的擴束效果。此外,圖5是本揭露另一實施例擴束組件的示意圖,擴束組件140B能同時針對雙光束分別進行擴束整形的效果。據此,使用者能針對物件的面積大小與外形,而藉由這些擴束組件以進一步設定所需的光斑輪廓及大小。The composition of the beam expander assembly is not limited herein, and any pulsed laser source 130 can be used. The emitted first light beam B1 is expanded and shaped, and is applicable to the present embodiment. 4 is a schematic diagram of a beam expander assembly according to another embodiment of the present disclosure. In this embodiment, the beam expander assembly 140A is a Galilean beam expander, and the structure is different from that shown in FIG. The Keplerian beam expander, but achieves a similar expansion effect. In addition, FIG. 5 is a schematic diagram of a beam expander assembly according to another embodiment of the present disclosure, and the beam expander assembly 140B can simultaneously perform beam expansion shaping effects on the dual beams. Accordingly, the user can further set the desired spot profile and size by the beam expander assembly for the size and shape of the object.

本揭露由脈衝雷射光源作為老化測試光源之效果,可參閱圖6所示,其中,曲線C1、C2、C3分別代表於相同條件下採用傳統氙燈照射三種不同材質物件時,其黃化指數隨時間變化之曲線,對於曲線C1、C2所代表的物件而言,都需要高達5,600小時,方能使黃化指數趨近10,至於曲線C3所代表的物件,甚至要超過5,600小時才有可能使黃化指數趨近於10。然而,於相同條件下,當採用脈衝雷射光源作為老化測試光源照射曲線C1所代表之材料時,僅需400小時即可達到所需的黃化指數等於10,如圖6中之曲線C4所示,證明本揭露採用脈衝雷射光源作為老化測試光源具有其可實施性並能達成其功效,本揭露老化的時程確實比傳統老化的方式有明顯加速的效果。The effect of the pulsed laser light source as the aging test light source is as shown in FIG. 6 , wherein the curves C1, C2 and C3 respectively represent the yellowing index of the three different materials when the same xenon lamp is used under the same conditions. The curve of time change, for the objects represented by curves C1 and C2, needs up to 5,600 hours to make the yellowing index approach 10, and the object represented by curve C3 may even exceed 5,600 hours. The yellowing index approaches 10. However, under the same conditions, when a pulsed laser source is used as the material represented by the aging test light source illumination curve C1, it takes only 400 hours to achieve the desired yellowing index equal to 10, as shown by curve C4 in FIG. It is shown that the use of a pulsed laser source as an aging test source has its implementability and can achieve its efficacy. The time course of aging is indeed significantly accelerated compared to the conventional aging method.

在此說明,圖6所示曲線C1、C2、C3為參考文獻的結果,且為相同材質但不同配方之材料。至於利用脈衝雷射光源老化(亦即本揭露)的結果為曲線C4,亦是相同材質但不同配方之材料。關於上述參考文獻,其係National Renewable Energy Laboratory(NREL)於2008年12月4-5日於中國上海所召開之”APP International PV Reliability Workshop”會議,由John Pern,Ph.D.所提出之公開文獻。Here, the curves C1, C2, and C3 shown in FIG. 6 are the results of the reference, and are materials of the same material but different formulations. As for the result of aging with a pulsed laser source (i.e., the present disclosure), curve C4 is also a material of the same material but different formulations. The above reference is the National Renewable Energy Laboratory (NREL) held on December 4-5, 2008 in Shanghai, China. Reliability Workshop", an open document by John Pern, Ph.D.

請參考圖1所示,說明本揭露之頻譜分析儀170之作用。當第二光束B2投射於物件200時,可使物件200激發螢光,頻譜分析儀170量測物件200的材料分子吸收雷射光源能量後材料分子因躍遷所產生的螢光,此螢光會因躍遷的機制不同而有不同的激發螢光波長,而物件200老化程度與激發螢光的衰減有關,請參閱圖7所示,物件在老化的同時,經由頻譜量測每一段時間,包括0小時、16小時、21小時、26小時及31小時之頻譜響應,顯示物件的頻譜響應會隨著時間增加而下降。將圖7的頻譜響應圖作積分,更可看出頻譜響應隨時間而下降的效果,如圖8所示,其中,20mJ為投射物件的能量。據此,本揭露採用頻譜分析儀170配合濾光片171,於第二光束B2投射於物件200之一段時間內,由頻譜分析儀170量測物件200因第二光束B2之投射所產生之頻譜響應。Please refer to FIG. 1 to illustrate the role of the spectrum analyzer 170 of the present disclosure. When the second light beam B2 is projected on the object 200, the object 200 can be excited to emit fluorescence, and the spectrum analyzer 170 measures the fluorescence of the material molecules due to the transition of the material molecules of the object 200 after the energy of the laser light source. Due to the different mechanisms of the transition, there are different excitation wavelengths, and the aging degree of the object 200 is related to the attenuation of the excitation fluorescence. Referring to FIG. 7, the object is measured by the spectrum at intervals while aging, including 0. The spectral response of hours, 16 hours, 21 hours, 26 hours, and 31 hours shows that the spectral response of the object decreases over time. By integrating the spectrum response diagram of Fig. 7, the effect of the spectral response decreasing with time can be seen, as shown in Fig. 8, where 20 mJ is the energy of the projection object. Accordingly, the present disclosure uses the spectrum analyzer 170 to cooperate with the filter 171. During the period in which the second beam B2 is projected onto the object 200, the spectrum analyzer 170 measures the spectrum of the object 200 due to the projection of the second beam B2. response.

頻譜分析儀170可與材料老化測試設備100一併啟動,也可於脈衝雷射光源130射出第一光束B1時啟動,沒有一定限制,但至少於第二光束B2開始投射於物件200,直至物件200激發螢光之頻譜響應達到最高點並隨時間下降(如圖7所示)至最低點(無頻譜響應)之間的時間,量測物件200的頻譜響應,例如,若物件是太陽能電池模組時,通常其螢光範圍約為400~800nm。而濾光片171之種類,係依所測試物件200之不同而可更換。例如,頻譜分析儀170可以採用350~1000nm之可見光量測,濾光片171可以採用可見光濾光片(如380~720nm)以濾掉380nm以下的高能量短波長激發光源,僅量測到380~720nm的螢光吸收。如果以白光 光源替代脈衝雷射光源130時,則無需使用濾光片,僅量測其反射的可見光部分即可。The spectrum analyzer 170 can be started together with the material aging test device 100, or can be activated when the pulsed laser source 130 emits the first beam B1, without limitation, but at least the second beam B2 starts to be projected on the object 200 until the object The spectral response of the object 200 is measured, for example, if the object is a solar cell module, the time between the spectral response of the 200 excitation fluorescence reaching the highest point and decreasing with time (as shown in Figure 7) to the lowest point (no spectral response). In the case of a group, the fluorescence range is usually about 400 to 800 nm. The type of the filter 171 can be replaced depending on the object to be tested 200. For example, the spectrum analyzer 170 can measure the visible light of 350 to 1000 nm, and the filter 171 can use a visible light filter (such as 380 to 720 nm) to filter out the high-energy short-wavelength excitation source below 380 nm, and only measure 380. ~720nm fluorescence absorption. If white light When the light source is used in place of the pulsed laser source 130, it is not necessary to use a filter, and only the visible portion of the reflection can be measured.

請參閱圖1所示,藉由本揭露提出之材料老化測試設備,可提供一種材料老化測試方法,其包括以下步驟:由一脈衝雷射光源130提供一第一光束B1投射至一擴束組件140;第一光束B1經由擴束組件140轉換成一第二光束B2後投射至一物件200,並持續投射一段時間;以及於第二光束B2投射於物件200之一段時間內,由一頻譜分析儀170量測物件200因第二光束B2之投射所產生之頻譜響應。Referring to FIG. 1 , with the material aging test apparatus proposed by the present disclosure, a material aging test method can be provided, which includes the steps of: projecting a first light beam B1 from a pulsed laser source 130 to a beam expander assembly 140. The first beam B1 is converted into a second beam B2 via the beam expanding assembly 140 and projected onto an object 200 for a period of time; and a period of time during which the second beam B2 is projected onto the object 200 by a spectrum analyzer 170. The spectral response of the object 200 due to the projection of the second beam B2 is measured.

在本揭露的上述實施例中,材料老化測試設備透過使用短脈衝雷射作為光源,並經由擴束組件調整其光束面積以降低其單位面積平均照度,因而能以較低累積能量但最強瞬間能量的光源照射物件,其能有效改善以燈管式或燈箱式之光老化設備所產生的問題。再者,由於脈衝雷射光源能提供物件局部區塊的光老化照射,因此搭配以移動平台而使脈衝雷射光源以不同功率、不同路徑與不同波長照射物件,而在同一物件上完成各種不同條件的光老化照射。此舉讓材料老化測試設備能以更有效率的方式找出物件的光老化參數。此外,本揭露所提供之材料老化測試係採用脈衝雷射作為光源,於物件老化的過程中,可即時同步量測物件的頻譜響應(亦即物件所激發螢光的衰減情形),作為材料老化評估之依據。In the above embodiment of the present disclosure, the material aging test apparatus uses a short pulse laser as a light source and adjusts the beam area thereof through the beam expander assembly to reduce the average illuminance per unit area, thereby enabling a lower cumulative energy but the strongest instantaneous energy. The light source illuminates the object, which can effectively improve the problems caused by the lamp-type or light box-type photo-aging device. Furthermore, since the pulsed laser source can provide photo-aged illumination of the local block of the object, the pulsed laser source is used to illuminate the object with different powers, different paths and different wavelengths, and the different objects are completed on the same object. Conditioned photoaging exposure. This allows the material aging test equipment to find the photo-aging parameters of the object in a more efficient manner. In addition, the material aging test provided by the present disclosure uses a pulsed laser as a light source to accurately measure the spectral response of the object (ie, the attenuation of the fluorescent light excited by the object) during the aging of the object, as the material aging. Basis for evaluation.

綜上所述,本揭露採用單一光源(脈衝雷射)即可同步進行老化及頻譜檢測,不必更換光源,且由於物件係設置於可多軸移 動之平台,可用以承載並驅使物件移動,因此也無須移動物件。In summary, the present disclosure uses a single light source (pulse laser) to simultaneously perform aging and spectrum detection without having to replace the light source, and since the object is placed in a multi-axis shift The moving platform can be used to carry and drive the movement of objects, so there is no need to move objects.

惟以上所述者,僅為本揭露之實施例而已,當不能以此限定本揭露實施之範圍;故,凡依本揭露申請專利範圍及說明書內容所作之簡單的等效變化與修飾,皆應仍屬本揭露專利涵蓋之範圍內。However, the above description is only for the embodiments of the present disclosure, and the scope of the disclosure should not be limited thereto; therefore, the simple equivalent changes and modifications made by the scope of the application and the contents of the specification should be It is still within the scope of this disclosure.

100‧‧‧材料老化測試設備100‧‧‧Material aging test equipment

110‧‧‧基座110‧‧‧Base

120‧‧‧平台120‧‧‧ platform

130‧‧‧脈衝雷射光源130‧‧‧pulse laser source

140‧‧‧擴束組件140‧‧‧Expanded components

150‧‧‧平台150‧‧‧ platform

160‧‧‧溫度控制模組160‧‧‧temperature control module

170‧‧‧頻譜分析儀170‧‧‧ spectrum analyzer

171‧‧‧濾光片171‧‧‧Filter

200‧‧‧物件200‧‧‧ objects

B1‧‧‧第一光束B1‧‧‧First beam

B2‧‧‧第二光束B2‧‧‧second beam

Claims (18)

一種材料老化測試設備,包括:一脈衝雷射光源,用以提供一第一光束;一擴束組件,用以將該第一光束轉換成一第二光束後投射至一物件;一平台,用以承載該物件;以及一頻譜分析儀,用以量測該物件因該第二光束之投射所產生之頻譜響應。A material aging test apparatus includes: a pulsed laser source for providing a first beam; a beam expanding component for converting the first beam into a second beam and projecting to an object; a platform for Carrying the object; and a spectrum analyzer for measuring a spectral response of the object due to the projection of the second beam. 如申請專利範圍第1項所述的材料老化測試設備,其中該頻譜分析儀與該物件之間設有一濾光片。The material aging test apparatus of claim 1, wherein a filter is disposed between the spectrum analyzer and the object. 如申請專利範圍第1項所述的材料老化測試設備,其中該平台為一移動式平台,該物件隨該移動式平台移動,而使該第二光束以至少一路徑投射至該物件。The material aging test apparatus of claim 1, wherein the platform is a mobile platform, and the object moves with the mobile platform, and the second light beam is projected to the object in at least one path. 如申請專利範圍第3項所述的材料老化測試設備,其中該物件分隔為多個老化區,該第二光束以多個路徑投射於該些老化區,不同老化區含不同疏密路徑。The material aging test apparatus of claim 3, wherein the object is divided into a plurality of aging zones, and the second light beam is projected to the aging zones by a plurality of paths, and the different aging zones comprise different dense paths. 如申請專利範圍第1項所述的材料老化測試設備,其中該第一光束的功率可調整。The material aging test apparatus of claim 1, wherein the power of the first beam is adjustable. 如申請專利範圍第1項所述的材料老化測試設備,其中該第一光束的波長可調整。The material aging test apparatus of claim 1, wherein the wavelength of the first light beam is adjustable. 如申請專利範圍第6項所述的材料老化測試設備,其中該第一光束波長可調整範圍是280nm至400nm。The material aging test apparatus of claim 6, wherein the first beam wavelength is adjustable from 280 nm to 400 nm. 如申請專利範圍第1項所述的材料老化測試設備,其中該物件為太陽能電池,且該第二光束的平均功率密度為10kw/m2 至 0.1kw/m2Material as defined in claim 1 range item aging test apparatus, wherein the article is a solar cell, and the second average power density of the beam is 10kw / m 2 to 0.1kw / m 2. 如申請專利範圍第1項所述的材料老化測試設備,其中該物件為高分子材料,而且該第二光束的平均功率密度為5kw/m2 至0.1kw/m2The material aging test apparatus according to claim 1, wherein the object is a polymer material, and the second light beam has an average power density of 5 kw/m 2 to 0.1 kw/m 2 . 如申請專利範圍第1項所述的材料老化測試設備,其中該脈衝雷射光源的脈衝寬度小於1μs,脈衝重覆率大於或等於10Hz。The material aging test apparatus according to claim 1, wherein the pulsed laser light source has a pulse width of less than 1 μs and a pulse repetition rate of greater than or equal to 10 Hz. 如申請專利範圍第1項所述的材料老化測試設備,其中該第二光束投射在該物件上的面積大於1cm2The material aging test apparatus of claim 1, wherein the second light beam is projected onto the object by an area greater than 1 cm 2 . 如申請專利範圍第1項所述的材料老化測試設備,還包括:一溫度控制模組,連接該平台,以調整該平台用以承載該物件處的溫度。The material aging test apparatus of claim 1, further comprising: a temperature control module connected to the platform to adjust the temperature at which the platform is used to carry the object. 如申請專利範圍第12項所述的材料老化測試設備,其中該平台溫度可調範圍為10℃至60℃。The material aging test apparatus of claim 12, wherein the platform temperature is adjustable from 10 ° C to 60 ° C. 如申請專利範圍第1項所述的材料老化測試設備,其中該第二光束投射於該物件時,可使該物件激發螢光。The material aging test apparatus of claim 1, wherein the object is caused to emit fluorescence when the second light beam is projected onto the object. 一種材料老化測試方法,包括:由一脈衝雷射光源提供一第一光束投射至一擴束組件;該第一光束經由該擴束組件轉換成一第二光束後投射至一物件,並持續投射一段時間;以及於該第二光束投射於該物件之該段時間內,由一頻譜分析儀量測該物件因該第二光束之投射所產生之頻譜響應。A material aging test method includes: providing a first beam of light from a pulsed laser source to a beam expander assembly; the first beam is converted into a second beam by the beam expander assembly, projected onto an object, and continues to project a segment And a time period during which the second beam is projected onto the object, the spectrum response of the object due to the projection of the second beam is measured by a spectrum analyzer. 如申請專利範圍第15項所述的材料老化測試方法,其中該頻譜分析儀量測該物件之頻譜響應之時間,係至少於該第二光束開始投射於該物件,直至該物件激發螢光之頻譜響應達到最高 點並隨時間下降至最低點為止之間的時間。The material aging test method according to claim 15, wherein the spectrum analyzer measures the spectral response time of the object, at least the second light beam starts to be projected on the object until the object emits fluorescence. The highest spectral response The time between the point and the time to fall to the lowest point. 如申請專利範圍第16項所述的材料老化測試方法,其中該物件激發螢光之頻譜響應下降至之該最低點係指該物件無頻譜響應之時點。The material aging test method according to claim 16, wherein the spectral response of the object-excited fluorescence decreases to the lowest point when the object has no spectral response. 如申請專利範圍第15項所述的材料老化測試方法,其中該第二光束投射於該物件時,可使該物件激發螢光,該頻譜分析儀係量測該物件所產生之螢光之頻譜響應。The material aging test method according to claim 15, wherein the second beam is projected onto the object to cause the object to emit fluorescence, and the spectrum analyzer measures the spectrum of the fluorescence generated by the object. response.
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