TWI470231B - Test equipment and test methods - Google Patents

Description

Test equipment and test methods

The present invention relates to a test apparatus, and more particularly to a three-dimensional dynamic test apparatus and test method.

At present, there are many kinds of semiconductor packages, such as opto electronic devices or micro electro mechanical systems (MEMS), and the like, such as image sensing components, radio frequency components (RF) Circuits, accelerators, gyroscopes, micro actuators, or process sensors.

As the electrical functionality of semiconductor packages increases, the way in which semiconductor packages are inspected is also important to ensure product yield. For the gyroscope, in addition to the general line test, the reliability of the motion state (such as the tilt angle) is usually also tested. Devices commonly used to test gyroscopes include three-dimensional turning devices to provide testing of various directional motion states. However, the three-dimensional turning device has a large moving space, and thus there is a problem of winding the peripheral wires. Therefore, it is necessary to limit the actuating path of the three-dimensional turning device to avoid the peripheral wires, so that some azimuth angles cannot be measured.

Therefore, the industry has developed a test device for avoiding the winding of peripheral wires. Referring to the Chinese Patent No. 201128194 or as shown in FIG. 1, the conventional test device 1 includes a three-dimensional inverting device 10, a carrying platform 11, and a first A control device 12 and a second control device 13. The three-dimensional turning device 10 has a frame body 100 and a first shaft member 101 coupled to the frame body 100. And a second shaft member 102, the first shaft member 101 and the second shaft member 102 are perpendicular to each other, and the first shaft member 101 is pivotally connected to the carrying platform 11. A first wireless transmission unit 110 and a plurality of test sockets 111 are disposed on the loading platform 11 , and the first wireless transmission unit 110 is electrically connected to the test sockets 111 to transmit test information. The first control device 12 can be a general notebook computer having a second wireless transmission unit 120 and a memory (not shown) for receiving test information and storing information, and the first and second wireless transmission units 110 120 can be a Bluetooth transmission module, a radio frequency transmission module or other equivalent wireless transmission module. The second control device 13 is disposed on the frame body 100 and has a power module 130. The second control device 13 is configured to control the three-dimensional inversion device 10 to perform the inversion, the test sockets 111 and the first wireless transmission portion 110. Information transmission control, test flow control, data transcoding and other related detection and control.

As can be seen from the above, the conventional test device 1 is completely wireless by the design of the first and second wireless transmission portions 110, 120 to overcome the problem of winding the peripheral wires, so that the rotation of the three-dimensional inversion device 10 is not Limit to improve the quality of the test.

However, when a plurality of conventional test devices 1 are used at the same time, the signals of the first and second wireless transmission units 110 and 120 of each device easily interfere with each other, resulting in incorrect information received by the first control device 12.

Moreover, when the three-dimensional inverting device 10 rotates, the test sockets 111 and the first wireless transmission portion 110 perform information transmission. If the rotation speed of the three-dimensional inversion device 10 is too fast or the angle is inappropriate, the information transmission will be affected. The stability and correctness of the three-dimensional inverting device 10 still need to maintain a certain range of speed and angle, so that the three-dimensional inversion cannot be further improved. The rotational speed and angle of the device 10.

Further, in the conventional test apparatus 1, the second control device 13 is attached to the frame body 100, so that it is easily damaged by an external force.

In addition, in the conventional test device 1, the memory system is disposed in an external computer (ie, the first control device 12). If the computer is lost or infected, the entire test device 1 may not operate.

Therefore, how to overcome the various problems in the above-mentioned prior art has become a problem that is currently being solved.

In order to overcome the problems of the above-mentioned prior art, the present invention provides a test device for integrating a required electronic module on an integrated test board, and then pivoting the integrated test board to the three-dimensional flip device. The test board has a test area, a first plug-in transmission unit, and a storage unit electrically connected to the first plug-in transmission unit, and a control device having a second plug-in transmission unit is provided by The second plug-in transmission unit is inserted into the first plug-in transmission unit, and the control device is electrically connected to the integrated test board.

Therefore, using the test device of the present invention for testing, a test method can be obtained, comprising: placing a test piece on a test area of the integrated test board; then, flipping the three-dimensional flip device, and the integrated test board Measure the test piece, store the measured information, and then stop flipping the three-dimensional inverting device; then, plug the second plug-in transmission part of the control device to the first plug-in transmission part, In order for the control device to obtain the measured information.

It can be seen from the above that the test device and the test method of the present invention are The design of the first and second plug-in transmission sections eliminates the need for wireless communication devices, thereby avoiding the problem of conventional control devices receiving incorrect information.

Furthermore, when the three-dimensional inverting device is actuated by the design of the plug-in transmission portion, there is no electrical connection between the first and second plug-in transmission portions to improve the rotation speed and angle of the three-dimensional inverting device. .

Moreover, the required electronic module is integrated on the integrated test board, so that there is no electronic module on the frame, and thus the electronic module is not easily damaged by external force collision.

In addition, the storage unit is disposed in the integrated test board, so that the user does not have to worry about the problems of the prior art such as loss of the computer or infection with a virus.

The other embodiments of the present invention will be readily understood by those skilled in the art from this disclosure.

It is to be understood that the structure, the proportions, the size, and the like of the present invention are intended to be used in conjunction with the disclosure of the specification, and are not intended to limit the invention. The conditions are limited, so it is not technically meaningful. Any modification of the structure, change of the proportional relationship or adjustment of the size should remain in this book without affecting the effects and the objectives that can be achieved by the present invention. The technical content disclosed in the invention can be covered. At the same time, the terms “upper”, “lower”, “before”, “after”, “left”, “right” and “one” as quoted in this manual are also for the convenience of description, not To limit the scope of implementation of the present invention, the relative relationship changes or adjustments, without substantial changes in the technical content, It is also considered to be within the scope of the invention.

Referring to FIG. 2 , the present invention provides a testing device 2 including: a set of three-dimensional inverting device 20 , an integrated test board 21 pivotally connected to the three-dimensional inverting device 20 , and a plug-in type electrically connected to the integrated type The control device 22 of the test board 21 and a pick-and-place device 23 electrically connected to the control device 22.

The three-dimensional inverting device 20 has a frame body 200, a first shaft member 201 and a second shaft member 202 that are coupled to the frame body 200. The first shaft member 201 and the second shaft member 202 are perpendicular to each other, and the first The shaft member 201 is pivotally connected to the integrated test board 21.

The integrated test board 21 has at least one test area 211, a first plug-in transmission unit 210, a plurality of electronic modules 212, and electrically connected to the first plug-in transmission unit 210 and is a plurality of electronic modules. The storage unit (212 is disposed inside the integrated test board 21, and thus is not shown) used in 212, and the storage unit is a memory.

In the embodiment, the integrated test board 21 has two opposite surfaces, and the test area 211 is disposed on at least one surface of the integrated test board 21, and has a plurality of test seats on the test area 211 ( Multi-site socket) 211a to carry a plurality of test pieces 3 at the same time.

Furthermore, the first plug-in transmission unit 210 is exposed on the surface of the integrated test board 21.

Moreover, the electronic module 212 can be an on-board self-calibrate module, a power supply module, and an embedded on-board automatic module. Test equipment), Dynamic Ducking module, memory. The rotation angle self-detection module is used to confirm that the rotation angle of the automatic machine (such as the three-dimensional inversion device 20) is correct; the embedded automatic test module embeds the module required for testing into the integrated test board 21 For example: power supply module, DC electrical measurement module, functional test module, multiplexer (MUX) module, relay (Relay) module, microcontroller (MCU) module, etc.; The connection module is electrically connected to the first plug-in transmission unit 210.

The control device 22 has a second plug-in transmission unit 220 corresponding to the first plug-in transmission unit 210 for plugging the first plug-in transmission unit 210 by the second plug-in transmission unit 220. The control device 22 is electrically connected to the integrated test board 21.

In this embodiment, the control device 22 can be a PLC system, and the dynamic signal connection module dynamically adjusts the connection between the automatic test module and the control device 22 by the signal transmission line 22a according to the requirements of the test content. The connection and disconnection, that is, the connection and separation between the first and second plug-in transmission units 210, 220.

Furthermore, the first plug-in transmission unit 210 has a socket, and the second plug-in transmission unit 220 has a plug. In another embodiment, the first plug-in transmission unit 210 may have a plug, and the second plug-in transmission unit 220 has a socket.

The pick-and-place device 23 is a robot arm, and is electrically connected to the control device 22 by another transmission line 22b. There is no particular limitation on the variety of the pick-and-place device 23.

The present invention provides a test method for measuring a test piece 3 such as a gyroscope by applying the test device 2 described above, the flow of which is as follows.

First, the plurality of test pieces 3 are placed on the test area 211 of the integrated test board 21; at this time, the first and second plug-in transfer units 210, 220 are separated from each other.

Then, the three-dimensional inverting device 20 performs the front, rear, left, right, up, and down directions by the first shaft member 201 and the second shaft member 202 (such as the rotation arrow shown in FIG. 2), and the integration The test board 21 measures the test pieces 3, and stores the measured information in the storage unit.

Then, after the end of the test, the three-dimensional inverting device 20 is turned over, and the second plug-in transmission unit 220 of the control device 22 is inserted into the first plug-in transmission unit 210 in an automated control manner. The control device 22 obtains the measured information. In fact, after the test is completed, the second plug-in transmission unit 220 can be directly inserted into the first plug-in transmission unit 210, and the time course of the plug-in can be controlled according to the process requirements.

Finally, the dynamic signal connection module analyzes the measurement information to cause the control device 22 to operate the pick and place device 23 to take out the test piece 3 on the test area 211. In fact, the good test piece 3 is taken to the next stage of the process, and the bad test piece 3 is taken to a collection area (not shown) to control the quality of the product.

In summary, the test device 2 of the present invention and the test method thereof are mainly used by the design of the first and second plug-in transmission units 210, 220, instead of the design of the conventional wireless transmission, so that multiple test devices are simultaneously used. When the signals of the transmission parts of the respective devices do not interfere with each other, the control device 22 does not Receive an error message.

Furthermore, by the design of the plug-in transmission unit, when the three-dimensional inverting device 20 is activated, there is no electrical connection between the first and second plug-in transmission units 210, 220, that is, no information transmission is required. The rotation of the three-dimensional reversing device 20 does not affect the stability and correctness of the information transmission. Therefore, the present invention can improve the rotation speed and angle of the three-dimensional reversing device 20, so that the operation of the three-dimensional reversing device 20 is not limited.

Moreover, the required electronic module 212 is integrated on the integrated test board 21, so that there is no electronic component on the frame 200, and thus the electronic modules 212 are not easily damaged by external force, especially These embedded automated test modules are less susceptible to external forces.

In addition, the test device 2 of the present invention provides the storage unit (such as a memory) in the integrated test board 21, so that the user does not need to use an external computer, so the user does not need to worry about the computer being lost or infected with viruses. The technical problem thus effectively avoids the problem that the entire test equipment 2 cannot operate due to the failure of the control device 22. That is, after the control device 22 fails, the test device 2 of the present invention can still perform the test first, and store the tested data in the storage portion, and after the control device 22 is updated or repaired, the first The second plug-in transmission units 210, 220 are coupled for transmission. Therefore, the test apparatus 2 of the present invention can perform the test operation while performing the update or repair of the control device 22 to save the process time.

The above embodiments are intended to illustrate the principles of the invention and its effects, and are not intended to limit the invention. Anyone skilled in the art can modify the above embodiments without departing from the spirit and scope of the present invention. change. Therefore, the scope of protection of the present invention should be as set forth in the appended claims.

1, 2‧‧‧ test equipment

10, 20‧‧‧3D turning device

100, 200‧‧‧ frame

101, 201‧‧‧ first shaft

102, 202‧‧‧second shaft parts

11‧‧‧Loading station

110‧‧‧First Wireless Transmission Department

111, 211a‧‧‧ test seat

12‧‧‧First control unit

120‧‧‧Second Wireless Transmission Department

13‧‧‧Second control device

130‧‧‧Power Module

21‧‧‧Integrated test board

210‧‧‧First plug-in transmission

211‧‧‧ test area

212‧‧‧Electronic module

22‧‧‧Control device

22a, 22b‧‧‧ transmission line

220‧‧‧Second plug-in transmission department

23‧‧‧ pick and place device

3‧‧‧Test pieces

1 is a perspective view of a conventional test apparatus; and FIG. 2 is a perspective view of the test apparatus of the present invention.

2‧‧‧Test equipment

20‧‧‧Three-dimensional turning device

200‧‧‧ frame

201‧‧‧First shaft

202‧‧‧Second shaft parts

21‧‧‧Integrated test board

210‧‧‧First plug-in transmission

211‧‧‧ test area

211a‧‧‧ test seat

212‧‧‧Electronic module

22‧‧‧Control device

22a, 22b‧‧‧ transmission line

220‧‧‧Second plug-in transmission department

23‧‧‧ pick and place device

3‧‧‧Test pieces

Claims (8)

A test device includes: a three-dimensional inverting device for three-dimensionally flipping an integrated test board; the integrated test board pivotally connecting the three-dimensional inverting device, and having a test area, a first plug-in transmission unit, and Electrically connecting the storage portion of the first plug-in transmission portion, wherein the storage portion stores the measured information; and the control device has a second plug-in transmission portion, and is configured to be used as the three-dimensional inversion device When the integrated test board is stopped, the second plug-in transmission portion is plugged into the first plug-in transmission portion, thereby electrically connecting the control device to the integrated test board and via the second plug The pull-out transmission unit and the first plug-in transmission unit obtain the information obtained by the measurement. The test apparatus of claim 1, wherein the three-dimensional turning device has a frame body, a first shaft member and a second shaft member that are coupled to the frame body, and the first shaft member and the second shaft member are perpendicular to each other And the first shaft member is pivotally connected to the integrated test board. The test apparatus of claim 1, wherein the integrated test board has opposite surfaces, and the test area is disposed on at least one surface of the integrated test board. The test device of claim 1, wherein the integrated test board has a rotation angle self-detection module, a power supply module, an embedded automatic test module, and a dynamic signal connection module. A test method includes: providing a test device, comprising: a control device, a three-dimensional flip device, and an integrated test board pivotally connected to the three-dimensional flip device, the integrated test board having a test area, a first plug-in transmission unit, And electrically connecting the storage portion of the first plug-in transmission portion, and the control device has a second plug-in transmission portion; placing the test piece on the test area of the integrated test board; and flipping the three-dimensional flip device The integrated test board is used to measure the test piece, and the information obtained by the storage portion is stored; the flipping of the three-dimensional inverting device is stopped; and the second plug-in transmission portion of the control device is plugged in The first plug-in transmission unit is configured to enable the control device to obtain the measured information. The test method of claim 5, wherein the three-dimensional turning device has a frame body, a first shaft member and a second shaft member that are coupled to the frame body, and the first shaft member and the second shaft member are perpendicular to each other And the first shaft member is pivotally connected to the integrated test board. The test method of claim 5, wherein the integrated test board has opposite surfaces, and the test area is disposed on at least one surface of the integrated test board. For example, the test method described in claim 5, wherein the integrated test board has a rotation angle self-detection module, a power supply module, an embedded automatic test module, and a dynamic signal connection module.