TWI464439B - System and method for checking a machine - Google Patents
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Description
本發明涉及一種檢測系統及方法，尤其涉及一種儀器自檢系統及方法。 The invention relates to a detection system and method, in particular to an instrument self-test system and method.
當今在工業製造，國防科技，電子通訊，民用辦公等領域電子儀器設備的應用相當的廣泛。隨著社會的進步、經濟的發展，國防、基礎工業、民用設施對電子設備的依賴性也越來越強。可以說，電子儀器設備的發展決定著世界政治，經濟的發展命脈。在電腦研發的過程中，研發工程師經常需要借助如示波器、網路分析儀等電子測試儀器對產品進行相關測試，工程師再根據測試結果對產品品質進行判斷是否符合要求。在用儀器進行測量前，往往需要對儀器進行一系列的準備動作，如靜電防護、預熱、校準等。 Today, the application of electronic equipment in the fields of industrial manufacturing, national defense technology, electronic communication, and civil office is quite extensive. With the advancement of society and the development of the economy, the dependence of national defense, basic industries, and civilian facilities on electronic equipment is becoming stronger. It can be said that the development of electronic equipment and equipment determines the lifeline of world politics and economic development. In the process of computer R&D, R&D engineers often need to test the products with electronic test instruments such as oscilloscopes and network analyzers. The engineers then judge whether the product quality meets the requirements based on the test results. Before using the instrument for measurement, it is often necessary to perform a series of preparatory actions on the instrument, such as electrostatic protection, preheating, calibration, and so on.
工程師在利用儀器進行測試時容易忽略掉所有或部分步驟，這將造成以下問題：1.儀器不在正常的使用環境中使用可能會對儀器造成損壞。如正常使用電壓，必要的靜電防護等；2.如果沒有對儀器進行必要的準備動作確認，如預熱、儀器校準、自檢查等，儀器可能無法正常工作或得到錯誤的測試結果；3.測試前的儀器配件設置錯誤，將影響測試結果的準確性；4.不同測試人員測試時，由於儀器配件等設置不一樣，將導致同一待測物不同人員測 試時測試結果不一致，使設計人員無法判斷結果的準確性。 Engineers can easily ignore all or part of the steps when using the instrument for testing. This will cause the following problems: 1. The instrument may not be damaged if it is not used in a normal environment. Such as normal use of voltage, necessary static protection, etc.; 2. If the instrument does not confirm the necessary preparations, such as preheating, instrument calibration, self-inspection, etc., the instrument may not work properly or get wrong test results; 3. Test If the previous instrument accessories are set incorrectly, it will affect the accuracy of the test results. 4. When different testers test, because the instrument accessories are not the same, it will result in different people in the same test object. The test results are inconsistent, making it impossible for the designer to judge the accuracy of the results.
鑒於以上內容，有必要提供一種儀器自檢系統及方法，可以減少因為人員疏忽導致的問題。 In view of the above, it is necessary to provide an instrument self-test system and method that can reduce problems caused by human negligence.
一種儀器自檢系統，運行於測試儀器上，該測試儀器包括校準單元。該系統包括：獲取模組，用於獲取測試儀器的輸出電壓，該測試儀器的當前校準狀態；提示模組，用於若輸出電壓不在標準工作電壓範圍內，提示用戶關閉該測試儀器，調整該測試儀器的工作電壓至標準工作電壓範圍內，還用於提示用戶對測試儀器和測試人員做好靜電防護措施；調用模組，用於當該測試儀器的當前校準狀態不是校準成功狀態時，調用校準單元對該測試儀器進行校準；所述獲取模組，還用於當所述當前校準狀態是校準成功狀態時，接收所選擇的測試通道；所述提示模組，還用於當所選擇的測試通道沒有連接探棒時，提示用戶將該測試通道連接探棒；所述獲取模組，還用於當需要對所選擇的測試通道設置抗歪斜值時，接收用戶設置的抗歪斜值，所述校準單元根據該抗歪斜值對所述測試通道調整抗歪斜；及儲存模組，用於儲存該測試儀器在檢測過程中的自檢資訊。 An instrument self-test system that runs on a test instrument that includes a calibration unit. The system comprises: an acquisition module, configured to obtain an output voltage of the test instrument, a current calibration state of the test instrument, and a prompt module, configured to prompt the user to close the test instrument if the output voltage is not within the standard working voltage range, and adjust the The operating voltage of the test instrument is within the standard operating voltage range, and is also used to prompt the user to perform electrostatic protection measures on the test instrument and the tester; the calling module is used to call when the current calibration state of the test instrument is not a successful calibration state. The calibration unit calibrates the test instrument; the acquisition module is further configured to: when the current calibration state is a calibration success state, receive the selected test channel; the prompt module is further used when selected When the test channel is not connected to the probe, the user is prompted to connect the test channel to the probe; the acquisition module is further configured to receive the anti-skew value set by the user when the anti-skew value needs to be set for the selected test channel. The calibration unit adjusts the anti-skew to the test channel according to the anti-skew value; and a storage module for storing the tester Self-test information in the detection process.
一種儀器自檢方法，該方法包括如下步驟：(a)獲取測試儀器的輸出電壓；(b)若該輸出電壓不在標準工作電壓範圍內，提示用戶關閉該測試儀器，調整該測試儀器的工作電壓至標準工作電壓範圍內；(c)提示用戶對測試儀器和測試人員做好靜電防護措施；(d)當該測試儀器的當前校準狀態不是校準成功狀態時，調用校準單元對該測試儀器進行校準；(e)當該測試儀器 的當前校準狀態是校準成功狀態，接收用戶所選擇的測試通道；(f)當所選擇的測試通道沒有連接探棒時，提示用戶將該測試通道連接探棒；(g)當所選擇的測試通道有連接探棒且需要對所選擇的測試通道設置抗歪斜值時，接收用戶設置的抗歪斜值，所述校準單元根據該抗歪斜值對所述測試通道調整抗歪斜；及(h)儲存測試儀器在檢測過程中的自檢資訊。 An instrument self-test method, the method comprising the steps of: (a) obtaining an output voltage of a test instrument; (b) prompting a user to turn off the test instrument and adjusting an operating voltage of the test instrument if the output voltage is not within a standard operating voltage range (c) prompt the user to perform electrostatic protection measures on the test instrument and the tester; (d) when the current calibration state of the test instrument is not the calibration success state, call the calibration unit to calibrate the test instrument ; (e) when the test instrument The current calibration state is the calibration success state, receiving the test channel selected by the user; (f) prompting the user to connect the test channel to the probe when the selected test channel is not connected to the probe; (g) when the selected test Receiving a user-set anti-skew value when the channel has a connecting probe and needs to set an anti-skew value for the selected test channel, the calibration unit adjusts the anti-skew according to the anti-skew value; and (h) stores Self-test information of the test instrument during the test.
相較於習知技術，所述儀器自檢系統及方法，及時提醒測試人員對儀器進行測試前檢測相關事項，減少因為人員疏忽造成的。 Compared with the prior art, the self-checking system and method of the instrument promptly reminds the tester to detect the relevant items before the test of the instrument, thereby reducing the negligence caused by the personnel.
1‧‧‧測試儀器 1‧‧‧Testing equipment
10‧‧‧儀器自檢系統 10‧‧‧Inspection system
11‧‧‧顯示螢幕 11‧‧‧ Display screen
12‧‧‧資料庫 12‧‧‧Database
13‧‧‧校準單元 13‧‧‧ calibration unit
20‧‧‧獲取模組 20‧‧‧Getting module
21‧‧‧判斷模組 21‧‧‧Judgement module
22‧‧‧提示模組 22‧‧‧Cue module
23‧‧‧調用模組 23‧‧‧call module
24‧‧‧儲存模組 24‧‧‧ storage module
S30‧‧‧獲取測試儀器的輸出電壓 S30‧‧‧Get the output voltage of the test instrument
S31‧‧‧該輸出電壓是否在標準電壓範圍內 S31‧‧‧ Is the output voltage within the standard voltage range?
S32‧‧‧判定該輸出電壓不正常 S32‧‧‧ determines that the output voltage is abnormal
S33‧‧‧提示用戶調整該輸出電壓 S33‧‧‧ prompts the user to adjust the output voltage
S34‧‧‧判定該輸出電壓正常 S34‧‧‧Determine that the output voltage is normal
S35‧‧‧提示用戶確認該測試儀器和測試人員做好防護措施 S35‧‧‧ prompt the user to confirm that the test instrument and test personnel are taking protective measures
S36‧‧‧獲取該測試儀器的當前校準狀態 S36‧‧‧Get the current calibration status of the test instrument
S37‧‧‧該當前校準狀態是否為校準成功狀態 S37‧‧‧ Is the current calibration status a calibration success status?
S38‧‧‧對該測試儀器進行校準 S38‧‧‧ Calibrate the test instrument
S39‧‧‧更新該測試儀器的當前校準狀態 S39‧‧‧Update the current calibration status of the test instrument
S40‧‧‧接收用戶所選擇的該測試儀器的測試通道 S40‧‧‧ Receive the test channel of the test instrument selected by the user
S41‧‧‧偵測用戶選擇的測試通道是否連接了探棒 S41‧‧‧Detects whether the test channel selected by the user is connected to the probe
S42‧‧‧提示用戶對該測試通道連接探棒 S42‧‧‧ prompts the user to connect the probe to the test channel
S43‧‧‧用戶是否需要對選擇的測試通道設置抗歪斜值 S43‧‧‧Does the user need to set the anti-skew value for the selected test channel?
S44‧‧‧根據用戶設置的抗歪斜值對測試通道調整抗歪斜 S44‧‧‧Adjust the anti-skew to the test channel according to the anti-skew value set by the user
S45‧‧‧儲存測試儀器在檢測過程中的自檢資訊 S45‧‧‧ Self-test information of the storage test instrument during the test
圖1係本發明儀器自檢系統較佳實施例之硬體架構圖。 1 is a hardware architecture diagram of a preferred embodiment of the instrument self-test system of the present invention.
圖2係圖1中儀器自檢系統之功能模組圖。 Figure 2 is a functional block diagram of the instrument self-test system of Figure 1.
圖3係本發明儀器自檢方法較佳實施例之作業流程圖。 Figure 3 is a flow chart showing the operation of the preferred embodiment of the self-test method of the apparatus of the present invention.
如圖1所示，係本發明儀器自檢系統較佳實施例之運行環境圖。該儀器自檢系統10運行於測試儀器1上，該測試儀器1可以是示波器、網路分析儀等。該儀器自檢系統10用於在該測試儀器1進行測試工作之前，查看該測試儀器1是否做好檢測工作。該測試儀器1包括一個顯示螢幕11和資料庫12，該顯示螢幕11作為該測試儀器1的輸出介面，該資料庫12用於儲存該測試儀器1的標準工作電壓和當前校準狀態。該當前校準狀態包括：校準成功狀態和校準失敗狀態。該測試儀器1還包括校準單元13，該校準單元13用於對該測試儀器1進行校準，該校準包括對該測試儀器1的測試通道，探棒的校準。該校準單元13還用於調整該測試儀器1的各個通道歪斜情況。 As shown in Fig. 1, it is an operating environment diagram of a preferred embodiment of the instrument self-test system of the present invention. The instrument self-test system 10 operates on a test instrument 1, which may be an oscilloscope, a network analyzer, or the like. The instrument self-test system 10 is used to check whether the test instrument 1 performs the test work before the test instrument 1 performs the test work. The test instrument 1 comprises a display screen 11 as an output interface of the test instrument 1 and a database 12 for storing the standard operating voltage and the current calibration state of the test instrument 1. The current calibration status includes: a calibration success status and a calibration failure status. The test instrument 1 further comprises a calibration unit 13 for calibrating the test instrument 1 comprising a test channel for the test instrument 1 and a calibration of the probe. The calibration unit 13 is also used to adjust the skew of each channel of the test instrument 1.
如圖2所示，係圖1中儀器自檢系統10之功能模組圖。所述儀器自檢系統10包括：獲取模組20、判斷模組21、提示模組22、調用模組23及儲存模組24。所述模組是具有特定功能的軟體程式段，該軟體儲存於電腦可讀儲存介質或其他儲存設備，可被電腦或其他包含處理器的計算裝置執行，從而完成儀器自檢的作業流程。 As shown in FIG. 2, it is a functional module diagram of the instrument self-test system 10 in FIG. The device self-test system 10 includes an acquisition module 20, a determination module 21, a prompt module 22, a call module 23, and a storage module 24. The module is a software program segment with a specific function. The software is stored in a computer readable storage medium or other storage device, and can be executed by a computer or other computing device including a processor, thereby completing the workflow of the device self-test.
獲取模組20用於獲取測試儀器1的輸出電壓。 The acquisition module 20 is configured to acquire the output voltage of the test instrument 1.
判斷模組21用於判斷該輸出電壓是否在標準工作電壓範圍內，若該輸出電壓在標準工作電壓範圍內，該判斷模組21判定該測試儀器1的輸出電壓正常。若該輸出電壓不在標準工作電壓範圍內，則該判斷模組21判定該測試儀器1的輸出電壓不正常。例如，獲取模組20獲取的輸出電壓為210V，該測試儀器1的標準工作電壓範圍為220V~230V，則該判斷模組21判定該測試儀器1的輸出電壓不正常。 The determining module 21 is configured to determine whether the output voltage is within a standard operating voltage range. If the output voltage is within a standard operating voltage range, the determining module 21 determines that the output voltage of the testing device 1 is normal. If the output voltage is not within the standard operating voltage range, the determining module 21 determines that the output voltage of the testing instrument 1 is abnormal. For example, if the output voltage obtained by the acquisition module 20 is 210V and the standard operating voltage range of the test instrument 1 is 220V to 230V, the determination module 21 determines that the output voltage of the test instrument 1 is abnormal.
提示模組22用於當該測試儀器1的輸出電壓不正常時，提示用戶關閉該測試儀器1，調整該測試儀器1的工作電壓。本較佳實施例中，該提示模組22於顯示螢幕11上彈出對話方塊來提示用戶。 The prompting module 22 is configured to prompt the user to turn off the testing instrument 1 when the output voltage of the testing instrument 1 is abnormal, and adjust the working voltage of the testing instrument 1. In the preferred embodiment, the prompting module 22 pops up a dialog box on the display screen 11 to prompt the user.
該提示模組22還用於提示用戶確認該測試儀器1和測試人員做好靜電防護措施。若用戶確認該測試儀器1和測試人員均做好靜電防護措施，則獲取模組20用於從資料庫12中獲取該測試儀器1的當前校準狀態。 The prompt module 22 is further configured to prompt the user to confirm that the test instrument 1 and the tester perform electrostatic protection measures. If the user confirms that the test instrument 1 and the tester are all performing electrostatic protection measures, the acquisition module 20 is configured to obtain the current calibration state of the test instrument 1 from the database 12.
判斷模組21還用於判斷該測試儀器1的當前校準狀態是否為校準成功狀態。若該測試儀器1的當前校準狀態不是校準成功狀態，調用模組23用於調用校準單元13對該測試儀器1進行校準。 The judging module 21 is further configured to determine whether the current calibration state of the test instrument 1 is a calibration success state. If the current calibration state of the test instrument 1 is not a calibration success state, the calling module 23 is used to invoke the calibration unit 13 to calibrate the test instrument 1.
儲存模組24用於更新資料庫12中該測試儀器1的當前校準狀態。 The storage module 24 is used to update the current calibration state of the test instrument 1 in the database 12.
若該測試儀器1的當前校準狀態是校準成功狀態，所述獲取模組20還用於接收用戶所選擇的該測試儀器1的測試通道。所述判斷模組21還用於偵測用戶所選擇的測試通道是否連接了探棒。若用戶所選擇的測試通道沒有連接探棒，則提示模組22用於提示用戶將探棒連接到該測試通道上。 If the current calibration state of the test instrument 1 is a calibration success state, the acquisition module 20 is further configured to receive a test channel of the test instrument 1 selected by the user. The determining module 21 is further configured to detect whether the test channel selected by the user is connected to the probe. If the test channel selected by the user is not connected to the probe, the prompt module 22 is used to prompt the user to connect the probe to the test channel.
若用戶所選擇的測試通道都連接了探棒，則該判斷模組21還用於判斷用戶是否需要對所選擇的測試通道設置抗歪斜值。若用戶需要對所選擇的測試通道設置抗歪斜值，則所述獲取模組20還用於獲取用戶設置的抗歪斜值，所述校準單元13根據該抗歪斜值對所述測試通道調整抗歪斜。 If the test channel selected by the user is connected to the probe, the determining module 21 is further configured to determine whether the user needs to set an anti-skew value for the selected test channel. If the user needs to set the anti-skew value for the selected test channel, the acquisition module 20 is further configured to obtain a user-set anti-skew value, and the calibration unit 13 adjusts the anti-skew to the test channel according to the anti-skew value. .
儲存模組24將測試儀器1在檢測過程中的自檢資訊儲存到資料庫12中，該自檢資訊包括該測試儀器1每個測試通道的抗歪斜值，該測試儀器1的校準情況，探棒連接情況等。 The storage module 24 stores the self-test information of the test instrument 1 during the detection process into the database 12, the self-test information includes the anti-skew value of each test channel of the test instrument 1, and the calibration condition of the test instrument 1 Rod connection, etc.
如圖3所示，係本發明儀器自檢方法較佳實施例之作業流程圖。 As shown in FIG. 3, it is a flow chart of the operation of the preferred embodiment of the self-test method of the apparatus of the present invention.
步驟S30，獲取模組20獲取測試儀器1的輸出電壓。 In step S30, the acquisition module 20 acquires the output voltage of the test instrument 1.
步驟S31，判斷模組21判斷該輸出電壓是否在標準工作電壓範圍內。若該輸出電壓不在標準工作電壓範圍內，則進入步驟S32。若該輸出電壓在標準工作電壓範圍內，直接進入步驟S34。 In step S31, the determining module 21 determines whether the output voltage is within a standard operating voltage range. If the output voltage is not within the standard operating voltage range, then step S32 is reached. If the output voltage is within the standard operating voltage range, the process proceeds directly to step S34.
步驟S32，該判斷模組21判定該測試儀器1的輸出電壓不正常。於步驟S33中，提示模組22提示用戶關閉該測試儀器1，調整該測試儀器1的工作電壓至標準工作電壓範圍內，並轉入步驟S30。 In step S32, the determining module 21 determines that the output voltage of the testing instrument 1 is abnormal. In step S33, the prompting module 22 prompts the user to turn off the testing instrument 1, adjust the operating voltage of the testing instrument 1 to the standard operating voltage range, and proceeds to step S30.
步驟S34，判斷模組21判定該測試儀器1的輸出電壓正常。 In step S34, the determination module 21 determines that the output voltage of the test instrument 1 is normal.
步驟S35，所述提示模組22提示用戶確認該測試儀器1和測試人員做好防護措施。 In step S35, the prompting module 22 prompts the user to confirm that the testing instrument 1 and the testing personnel perform the protective measures.
步驟S36，獲取模組20從資料庫12中獲取該測試儀器1的當前校準狀態。 In step S36, the acquisition module 20 acquires the current calibration state of the test instrument 1 from the database 12.
步驟S37，判斷模組21判斷該測試儀器1的當前校準狀態是否為校準成功狀態。若該測試儀器1的當前校準狀態不是校準成功狀態，則於步驟S38中，調用模組23調用校準單元13對該測試儀器1進行校準，並進入步驟S39，儲存模組24更新資料庫12中該測試儀器1的當前校準狀態，轉至步驟S37。若該測試儀器1的當前校準狀態是校準成功狀態，則進入步驟S40。 In step S37, the determining module 21 determines whether the current calibration state of the test instrument 1 is a calibration success state. If the current calibration state of the test instrument 1 is not the calibration success state, then in step S38, the calling module 23 calls the calibration unit 13 to calibrate the test instrument 1, and proceeds to step S39, where the storage module 24 updates the database 12. The current calibration state of the test instrument 1 is passed to step S37. If the current calibration state of the test instrument 1 is the calibration success state, then step S40 is reached.
步驟S40，獲取模組20接收用戶所選擇的該測試儀器1的測試通道。 In step S40, the acquisition module 20 receives the test channel of the test instrument 1 selected by the user.
步驟S41，判斷模組21偵測用戶所選擇的測試通道是否連接了探棒。若用戶所選擇的測試通道沒有連接探棒，於步驟S42中，所述提示模組22提示用戶對該測試通道連接探棒。 In step S41, the determining module 21 detects whether the test channel selected by the user is connected to the probe. If the test channel selected by the user is not connected to the probe, in step S42, the prompting module 22 prompts the user to connect the probe to the test channel.
若用戶所選擇的測試通道連接了探棒，於步驟S43中，判斷模組21判斷用戶是否需要對所選擇的測試通道設置抗歪斜值。若用戶需要對所選擇的測試通道設置抗歪斜值，於步驟S44中，獲取模組20獲取用戶設置的抗歪斜值，所述校準單元13根據該抗歪斜值對所述測試通道調整抗歪斜，並進入步驟S45。若用戶不需要對所選擇的測試通道設置抗歪斜值，直接進入步驟S45。 If the test channel selected by the user is connected to the probe, in step S43, the determination module 21 determines whether the user needs to set the anti-skew value for the selected test channel. If the user needs to set the anti-skew value for the selected test channel, in step S44, the acquisition module 20 obtains the anti-skew value set by the user, and the calibration unit 13 adjusts the anti-skew according to the anti-skew value. And proceeds to step S45. If the user does not need to set the anti-skew value for the selected test channel, go directly to step S45.
步驟S45，所述儲存模組24儲存測試儀器1在檢測過程中的自檢資 訊到資料庫12中以備查詢，該自檢資訊包括該測試儀器1每個測試通道的抗歪斜值、該測試儀器1的校準情況、探棒連接情況等。 Step S45, the storage module 24 stores the self-testing of the testing instrument 1 during the detecting process. The information is stored in the database 12 for inquiry. The self-test information includes the anti-skew value of each test channel of the test instrument 1, the calibration condition of the test instrument 1, and the connection condition of the probe.
經過上述的步驟的測試儀器自檢，可使得測試儀器工作在正確的測試環境中，保證測試儀器和配件處於正確的設置下，保證了測試儀器的安全和測試結果的正確性與準確性；並且可以保證測試結果的一致性，增加了測試結果的可信度。 The self-test of the test instrument after the above steps can make the test instrument work in the correct test environment, ensure that the test instrument and accessories are in the correct setting, and ensure the safety of the test instrument and the correctness and accuracy of the test result; It can guarantee the consistency of test results and increase the credibility of test results.
最後所應說明的是，以上實施例僅用以說明本發明的技術方案而非限制，儘管參照以上較佳實施例對本發明進行了詳細說明，本領域的普通技術人員應當理解，可以對本發明的技術方案進行修改或等同替換，而不脫離本發明技術方案的精神和範圍。 It should be noted that the above embodiments are only intended to illustrate the technical solutions of the present invention and are not intended to be limiting, and the present invention will be described in detail with reference to the preferred embodiments thereof The technical solutions are modified or equivalently substituted without departing from the spirit and scope of the technical solutions of the present invention.
S30‧‧‧獲取測試儀器的輸出電壓 S30‧‧‧Get the output voltage of the test instrument
S31‧‧‧該輸出電壓是否在標準電壓範圍內 S31‧‧‧ Is the output voltage within the standard voltage range?
S32‧‧‧判定該輸出電壓不正常 S32‧‧‧ determines that the output voltage is abnormal
S33‧‧‧提示用戶調整該輸出電壓 S33‧‧‧ prompts the user to adjust the output voltage
S34‧‧‧判定該輸出電壓正常 S34‧‧‧Determine that the output voltage is normal
S35‧‧‧提示用戶確認該測試儀器和測試人員做好防護措施 S35‧‧‧ prompt the user to confirm that the test instrument and test personnel are taking protective measures
S36‧‧‧獲取該測試儀器的當前校準狀態 S36‧‧‧Get the current calibration status of the test instrument
S37‧‧‧該當前校準狀態是否為校準成功狀態？ S37‧‧‧ Is the current calibration status a successful calibration?
S38‧‧‧對該測試儀器進行校準 S38‧‧‧ Calibrate the test instrument
S39‧‧‧更新該測試儀器的當前校準狀態 S39‧‧‧Update the current calibration status of the test instrument
S40‧‧‧接收用戶所選擇的該測試儀器的測試通道 S40‧‧‧ Receive the test channel of the test instrument selected by the user
S41‧‧‧偵測用戶選擇的測試通道是否連接了探棒 S41‧‧‧Detects whether the test channel selected by the user is connected to the probe
S42‧‧‧提示用戶對該測試通道連接探棒 S42‧‧‧ prompts the user to connect the probe to the test channel
S43‧‧‧用戶是否需要對選擇的測試通道設置抗歪斜值 S43‧‧‧Does the user need to set the anti-skew value for the selected test channel?
S44‧‧‧根據用戶設置的抗歪斜值對測試通道調整抗歪斜 S44‧‧‧Adjust the anti-skew to the test channel according to the anti-skew value set by the user
S45‧‧‧儲存測試儀器在檢測過程中的自檢資訊 S45‧‧‧ Self-test information of the storage test instrument during the test
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| TW470878B (en) * | 1999-07-19 | 2002-01-01 | Tivo Inc | Self-test electronic assembly and test system |
| US20030112017A1 (en) * | 2001-12-18 | 2003-06-19 | Mc Pherson Mark E. | Calibration method and apparatus for signal analysis device |
| CN1175272C (en) * | 1997-05-19 | 2004-11-10 | 施蓝姆伯格资源管理服务公司 | Electronic revenue meter with automatic service sensing |
| TW200610274A (en) * | 2004-09-10 | 2006-03-16 | Ali Corp | Jitter signal circuit device of built-in-self-test phase locked loop and method thereof |
| US20080120579A1 (en) * | 2006-11-17 | 2008-05-22 | Todd Francis Lottmann | Methods, systems and user interface for evaluating product designs in light of promulgated standards |
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| CN1175272C (en) * | 1997-05-19 | 2004-11-10 | 施蓝姆伯格资源管理服务公司 | Electronic revenue meter with automatic service sensing |
| TW470878B (en) * | 1999-07-19 | 2002-01-01 | Tivo Inc | Self-test electronic assembly and test system |
| US20030112017A1 (en) * | 2001-12-18 | 2003-06-19 | Mc Pherson Mark E. | Calibration method and apparatus for signal analysis device |
| US6801042B2 (en) * | 2001-12-18 | 2004-10-05 | Tektronix, Inc. | Calibration method and apparatus for signal analysis device |
| TW200610274A (en) * | 2004-09-10 | 2006-03-16 | Ali Corp | Jitter signal circuit device of built-in-self-test phase locked loop and method thereof |
| US20080120579A1 (en) * | 2006-11-17 | 2008-05-22 | Todd Francis Lottmann | Methods, systems and user interface for evaluating product designs in light of promulgated standards |
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