TWI462240B - Apparatus and method for flipping the wafer - Google Patents
Apparatus and method for flipping the wafer Download PDFInfo
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Description
本發明係有關一種積體電路(IC)的製程,特別是關於一種將晶片翻面(flip)的裝置及方法。The present invention relates to a process for an integrated circuit (IC), and more particularly to an apparatus and method for flipping a wafer.
由於以薄膜製程技術在矽或砷化鎵等晶圓上製程的IC元件尺寸極為微小,結構也極為脆弱,因此,IC封裝即在建立IC元件的保護與組織架構,以防止外力或環境因素的破壞,並確保訊號與能量的傳遞。IC封裝始於晶圓製造完成後,包含晶片的黏結固定、電路聯線、結構封膠與電路版之結合、系統組合以至於產品完成之間的所有製程。而在不同層級的封裝過程中,將晶片翻面往往是造成產能下降的因素之一。以IC封裝中的晶圓級封裝為例,其是一種在晶圓製造完成後直接在整片晶圓上進行封裝測試,再切割成單顆晶片,不經過打線和填膠的製程。由於切割等製程的緣故,如圖1中的A圖所示,經過晶圓級封裝製程後的晶片10,是長有凸塊(bump)或植球12的那一面朝上,但在後續的程序中需要的是相反的那一面朝上,如圖1中的B圖所示,因此還要再經過取放機(handler)對晶片10進行翻面作業,此程序包含使用機器手臂對晶片一顆一顆進行取起、翻面及放下的連續動作,因此非常耗時,是產出(throughput)的瓶頸。再者,一般的取放機只有取起及放下的動作,如果加入翻面的動作,則機器手臂的機構和控制會變得很複雜。Because the IC components fabricated on wafers such as germanium or gallium arsenide are extremely small in size and extremely fragile, the IC package is designed to protect the external components or environmental factors. Destroy and ensure the transmission of signals and energy. IC packaging begins after wafer fabrication, including all bonding between wafer bonding, circuit bonding, structural encapsulation and circuit board, system integration, and product completion. In the packaging process of different levels, turning the wafer is often one of the factors that cause the capacity to decline. For example, a wafer-level package in an IC package is a process in which a package is directly tested on a whole wafer after the wafer is manufactured, and then cut into a single wafer without being subjected to wire bonding and filling. Due to the process of cutting and the like, as shown in FIG. 1A, the wafer 10 after the wafer level packaging process is the side with the bump or the ball 12 facing upward, but in the subsequent What is needed in the program is that the opposite side is facing up, as shown in FIG. 1B, so that the wafer 10 is further turned over by a handler, which includes using a robot arm pair. The wafers are continuously moved up, down and down, which is very time consuming and is the bottleneck of the throughput. Moreover, the general pick-and-place machine only has the action of taking up and lowering, and if the flipping action is added, the mechanism and control of the robot arm become complicated.
因此,一種可於各層級的封裝中自動化將大量的晶片翻面的裝置及方法乃為所冀。Therefore, an apparatus and method for automatically turning a large number of wafers in a package of each level is desirable.
本發明的目的之一,在於提出一種將晶片翻面的裝置及方法。One of the objects of the present invention is to provide an apparatus and method for turning a wafer over.
本發明的目的之一,在於提出一種可於各層級的封裝中自動化將大量的晶片翻面的裝置及方法。One of the objects of the present invention is to provide an apparatus and method for automatically turning a large number of wafers in a package of each level.
根據本發明,一種將晶片翻面的裝置包含可開闔的第一平台及第二平台皆連接翻轉軸,載有晶片的第一載具放置在該第一平台上,未載有晶片的第二載具面對面地蓋在該第一載具上,藉該翻轉軸闔上該第二平台並翻轉該第一平台及該第二平台,因而使該第一載具上的晶片倒置於該第二載具上。According to the present invention, a device for flipping a wafer includes a first platform that can be opened and a second platform are connected to the flip shaft, and the first carrier carrying the wafer is placed on the first platform, and the first wafer is not loaded. The second carrier is placed face to face on the first carrier, and the second platform is flipped over the flipping shaft and the first platform and the second platform are flipped, thereby placing the wafer on the first carrier on the first On the second vehicle.
根據本發明,一種將晶片翻面的方法包含將載有晶片的第一載具放置在第一平台上,將未載有晶片的第二載具面對面地蓋在該第一載具上,闔上第二平台使與該第一平台一起夾住該第一載具及該第二載具,翻轉該第一平台及該第二平台,使該第一載具上的晶片倒置於該第二載具上,移開該第一平台,以及移離該第一載具。According to the present invention, a method of flipping a wafer includes placing a first carrier carrying a wafer on a first platform and a second carrier not loaded with a wafer on a first carrier, The upper second platform clamps the first carrier and the second carrier together with the first platform, and flips the first platform and the second platform to cause the wafer on the first carrier to be placed on the second On the carrier, the first platform is removed and removed from the first carrier.
圖2係一較佳實施例所使用的載具(carrier)14,其上有複數個槽16,每一個槽16供放入一個圖3的托盤24。托盤24是習知技術,其上有複數個槽26,每一個槽26供放入一個晶片。而根據不同層級的晶片大小尺寸的差異,載具14的設計將有所改變,以適用不同尺寸的托盤,如局部放大圖18所示,較佳者,在槽16的邊緣設置彈性件,例如簧片20,以推抵放置在槽16中的托盤,一方面幫助固定托盤,另一方面將托盤定位在槽16的中心;較佳者,載具14的角落有定位孔22。2 is a carrier 14 used in a preferred embodiment having a plurality of slots 16 therein, each slot 16 for receiving a tray 24 of FIG. The tray 24 is a conventional technique having a plurality of grooves 26 therein, each of which is for placing a wafer. Depending on the size of the wafers of different levels, the design of the carrier 14 will be modified to accommodate trays of different sizes, as shown in partial enlarged view 18. Preferably, an elastic member is provided at the edge of the slot 16, for example The reed 20, to urge against the tray placed in the slot 16, assists in securing the tray on the one hand and the tray in the center of the slot 16 on the other hand; preferably, the carrier 14 has a locating aperture 22 in the corner thereof.
圖4A到圖4B展示整批晶片翻面的過程,為了簡潔的緣故,圖中有些細節省略了。參照圖4A,可開闔的第一平台30及第二平台32皆連接翻轉軸28,翻轉軸28包含同軸心的第一軸及第二軸,第一軸連接第一平台30的一側,第二軸連接第二平台32的一側,第一軸及第二軸可分別或同時轉動。第一載具34和第二載具38皆是圖2的載具14,第一載具34上有複數個托盤24承載晶片,第二載具38上也有相同數量的托盤24但未載有晶片。步驟S1將第一載具34放置在第一平台30上,步驟S2使用夾爪36將第二載具38面對面地蓋在第一載具34上,步驟S3藉轉動第二軸闔上第二平台32,使與第一平台30一起夾住第一載具34及第二載具38,接著參照圖4B,步驟S4同時轉動第一軸及第二軸而翻轉閉闔的第一平台30及第二平台32,因此將第一載具34及第二載具38翻轉成上下位置互換,於是在第一載具34上的晶片被倒置在第二載具38上,步驟S5藉轉動第一軸掀開第一平台30,步驟S6使用夾爪36將第一載具34移離。4A through 4B show the process of flipping the entire batch of wafers, some of which are omitted for the sake of brevity. Referring to FIG. 4A, the openable first platform 30 and the second platform 32 are connected to the flip shaft 28, and the flip shaft 28 includes a concentric first shaft and a second shaft, and the first shaft is coupled to one side of the first platform 30, The second shaft is coupled to one side of the second platform 32, and the first shaft and the second shaft are rotatable separately or simultaneously. The first carrier 34 and the second carrier 38 are both the carrier 14 of FIG. 2. The first carrier 34 has a plurality of trays 24 carrying wafers, and the second carrier 38 has the same number of trays 24 but is not loaded. Wafer. Step S1 places the first carrier 34 on the first platform 30, step S2 uses the jaws 36 to cover the second carrier 38 face to face on the first carrier 34, and step S3 rotates the second shaft to the second The platform 32 is configured to sandwich the first carrier 34 and the second carrier 38 together with the first platform 30. Referring to FIG. 4B, the step S4 simultaneously rotates the first shaft and the second shaft to flip the closed first platform 30 and The second platform 32 thus reverses the first carrier 34 and the second carrier 38 into upper and lower positions, so that the wafer on the first carrier 34 is inverted on the second carrier 38, and the first step is performed by the step S5. The shaft splits the first platform 30, and step S6 uses the jaws 36 to move the first carrier 34 away.
圖5的實施例提供更多的細節,其中夾爪36、定位銷48、壓制器50和小槌52在立體圖中省略了,以免遮住其他元件。翻面裝置40可搭配上載器(loader)及下載器(unloader)於其前後,俾將第一載具34送到第一平台30上,以及將第二載具38從第二平台32上取出,此種組合可達成完全自動化大量生產。上載器及下載器係本技術領域慣用的裝置。藉驅動器42及44分別驅動翻轉軸28的第一軸和第二軸,可將第一平台30及第二平台32如同書本一般的打開或閉闔,如前所述。第一平台30及第二平台32各有凹槽可放入第一載具34及第二載具38。夾爪36可上下及前後移動,藉以將第二載具38放置在第一平台30上的第一載具34上,以及將第一載具34從第二平台32上的第二載具34上移到第一平台30的上方,以備下一次晶片翻面時作為第二載具。一實施例中,第一平台30有讓開孔46,其下方有可活動的定位銷48,當第一載具34在第一平台30上時,向上移動定位銷48穿過第一平台30上的讓開孔46貼著第一載具34的外緣,接著,第二載具38的外緣將貼著定位銷48蓋在第一載具34上,使彼此對準。另一實施例中,定位銷48穿過第一平台30上的讓開孔46與第一載具34上的定位孔22,接著,第二載具38的定位孔22將對準定位銷48蓋在第一載具34上,使彼此對準。較佳者,當定位銷48向上移動穿過讓開孔46時,使用壓制器50壓住第一載具34,以避免第一載具34跳動造成的晶片位移。較佳者,當第二平台32闔上時,再次向上移動定位銷48穿過第一平台30上的讓開孔46,同時推擠第一載具34及第二載具38的外緣,或是同時穿過第一載具34及第二載具38上的定位孔22,以確認第一載具34及第二載具38是否彼此對準。較佳者,第二平台32的後方有小槌52,當第一平台30及第二平台32翻轉後,利用小槌52敲擊第一載具34或第一平台30,幫助第一載具34上的晶片掉落第二載具38上。The embodiment of Figure 5 provides more detail in which the jaws 36, locating pins 48, press 50 and small cymbal 52 are omitted in the perspective view to avoid obscuring other components. The flipping device 40 can be coupled to the loader and the unloader before and after, and the first carrier 34 is sent to the first platform 30, and the second carrier 38 is removed from the second platform 32. This combination can achieve fully automated mass production. Uploaders and downloaders are devices conventional in the art. By driving the first and second axes of the flip shaft 28 by the drivers 42 and 44, respectively, the first platform 30 and the second platform 32 can be opened or closed as a book, as previously described. The first platform 30 and the second platform 32 each have a recess for the first carrier 34 and the second carrier 38. The jaws 36 are movable up and down and back and forth to place the second carrier 38 on the first carrier 34 on the first platform 30 and the first carrier 34 from the second carrier 34 on the second platform 32. Move up to the top of the first platform 30 for the next time the wafer is turned over as the second carrier. In one embodiment, the first platform 30 has a recess 46 with a movable locating pin 48 beneath it. When the first carrier 34 is on the first platform 30, the locating pin 48 is moved upwardly through the first platform 30. The upper opening 46 is placed against the outer edge of the first carrier 34. Then, the outer edge of the second carrier 38 will be placed against the first carrier 34 against the positioning pin 48 to align with each other. In another embodiment, the positioning pin 48 passes through the opening 46 on the first platform 30 and the positioning hole 22 on the first carrier 34. Then, the positioning hole 22 of the second carrier 38 will be aligned with the positioning pin 48. Covered on the first carrier 34 to align with each other. Preferably, when the locating pin 48 moves up through the escaping aperture 46, the first carrier 34 is pressed using the press 50 to avoid wafer displacement caused by the first carrier 34 bouncing. Preferably, when the second platform 32 is up, the positioning pin 48 is moved upward again through the opening 46 on the first platform 30 while pushing the outer edges of the first carrier 34 and the second carrier 38. Or the positioning holes 22 on the first carrier 34 and the second carrier 38 are simultaneously passed to confirm whether the first carrier 34 and the second carrier 38 are aligned with each other. Preferably, the rear of the second platform 32 has a small cymbal 52. After the first platform 30 and the second platform 32 are inverted, the first carrier 34 or the first platform 30 is tapped by the small cymbal 52 to assist the first carrier 34. The wafer is dropped onto the second carrier 38.
從上述實施例所展示的過程可知,藉由夾爪36回收載具再利用,在這一次晶片翻面時,第一載具34上的晶片被移轉到第二載具38上,而被倒空的第一載具34則成為下一次晶片翻面時的第二載具,因此在大量生產時,從上載器不斷送入載有晶片的載具到第一平台30上,下載器不斷從第二平台32取出載有晶片的載具,可以快速地將大量的晶片翻面。It can be seen from the process shown in the above embodiment that the carrier is reused by the jaws 36. When the wafer is turned over, the wafer on the first carrier 34 is transferred to the second carrier 38, and is The first carrier 34 that is emptied becomes the second carrier when the wafer is turned over the next time. Therefore, in mass production, the carrier carrying the wafer is continuously fed from the uploader to the first platform 30, and the downloader is continuously By removing the carrier carrying the wafer from the second stage 32, a large number of wafers can be quickly turned over.
圖6A、圖6B及圖6C係本發明於第二載具38面對面蓋在第一載具34上時各實施例於槽16的局部剖面圖。於圖6A中,托盤24的厚度與第一載具34和第二載具38上槽16的深度相當,因此托盤24之間並無空隙產生。但是若托盤24的厚度與槽16的深度有明顯落差時,托盤24之間就會產生空隙,使晶片10在翻轉時斜置,甚至掉出槽26外,影響翻面流程。為了解決此問題,圖6B的實施例於槽16的底部的角落設有讓開孔54,當第一載具34和第二載具38面對面疊合時,使用具有銷56的壓板58向下移動,銷56穿過讓開孔54將托盤24往下推,以消除空隙60。一實施列中,壓板58可設計在夾爪36的內側。圖6C為另一實施例,於載具34、38中槽16的底部設有彈性件62推抵托盤24,以消除空隙。6A, 6B, and 6C are partial cross-sectional views of the embodiment of the present invention in the embodiment of the second carrier 38 when the second carrier 38 is placed over the first carrier 34. In FIG. 6A, the thickness of the tray 24 is comparable to the depth of the grooves 16 on the first carrier 34 and the second carrier 38, so that no gap is created between the trays 24. However, if the thickness of the tray 24 and the depth of the groove 16 are significantly different, a gap is formed between the trays 24, so that the wafer 10 is inclined when it is turned over, and even falls out of the groove 26, which affects the turning process. To solve this problem, the embodiment of Fig. 6B is provided with a recess 54 in the corner of the bottom of the slot 16, which is lowered using a pressure plate 58 having a pin 56 when the first carrier 34 and the second carrier 38 are stacked face to face. Moving, the pin 56 passes through the opening 54 to push the tray 24 down to eliminate the void 60. In an embodiment, the pressure plate 58 can be designed on the inside of the jaws 36. Figure 6C is another embodiment in which the bottom of the slot 16 in the carriers 34, 38 is provided with an elastic member 62 that pushes against the tray 24 to eliminate voids.
上述實施例係以載具14承載裝有晶片的托盤24,在其他實施例中,也可以直接以載具承載晶片。The above embodiment employs a carrier 14 carrying a tray 24 containing wafers. In other embodiments, the wafer can also be carried directly on the carrier.
圖7係本發明的另一實施例,將翻轉軸28改為設置在第一平台30和第二平台32的兩側邊的中心位置上,以減小翻轉軸28在轉動時所需的轉矩。而圖8A到圖8C展示圖7之實施例將整批晶片翻面的過程,為了簡潔的緣故,圖中有些細節省略了。其過程與圖4相似,開始時第一載具34上有複數個托盤24承載晶片,第二載具38上也有相同數量的托盤24但未載有晶片。步驟S11使用夾爪36將第一載具34放置在第一平台30上,步驟S12使用夾爪36將第二載具38面對面地蓋在第一載具34上,接著參照圖8B,步驟S13使用夾爪36將第二平台32闔於第一平台30上,並與第一平台30一起夾住第一載具34及第二載具38,步驟S14轉動翻轉軸28而翻轉閉闔的第一平台30及第二平台32,因此將第一載具34及第二載具38翻轉成上下位置互換,於是在第一載具34上的晶片被倒置在第二載具38上,步驟S15使用夾爪36將第一平台30移開,最後參照圖8C,步驟S16使用夾爪36將第一載具34移離,步驟S17使用夾爪36將承載有翻完面的晶片的第二載具38夾離第二平台32。Figure 7 is another embodiment of the present invention in which the inverting shaft 28 is instead disposed at a central position on both sides of the first platform 30 and the second platform 32 to reduce the rotation required for the turning shaft 28 to rotate. Moment. 8A to 8C show the process of flipping the entire batch of wafers in the embodiment of Fig. 7. For the sake of brevity, some details are omitted in the drawings. The process is similar to that of FIG. 4, in which the first carrier 34 has a plurality of trays 24 carrying wafers, and the second carrier 38 has the same number of trays 24 but no wafers. Step S11 uses the jaws 36 to place the first carrier 34 on the first platform 30, and the step S12 uses the jaws 36 to cover the second carrier 38 face to face on the first carrier 34, and then referring to FIG. 8B, step S13 The second platform 32 is clamped on the first platform 30 by using the clamping jaws 36, and the first carrier 34 and the second carrier 38 are clamped together with the first platform 30, and the step S14 is rotated to rotate the tilting shaft 28 to turn over the closed platform. a platform 30 and a second platform 32, so that the first carrier 34 and the second carrier 38 are inverted to be interchanged with the upper and lower positions, so that the wafer on the first carrier 34 is inverted on the second carrier 38, step S15 The first platform 30 is removed using the jaws 36. Finally, referring to Figure 8C, the step S16 uses the jaws 36 to move the first carrier 34 away, and the step S17 uses the jaws 36 to carry the second load of the wafer that has been turned over. The 38 is clamped away from the second platform 32.
以上對於本發明之較佳實施例所作的敘述係為闡明之目的,而無意限定本發明精確地所揭露的形式,基於以上的教導或從本發明的實施例學習而作修改或變化是可能的,實施例係為解說本發明的原理以及讓熟習該項技術者以各種實施例利用本發明在實際應用上而選擇及敘述,本發明的技術思想企圖由以下的申請專利範圍及其均等來決定。The above description of the preferred embodiments of the present invention is intended to be illustrative, and is not intended to limit the scope of the present invention. It is possible to make modifications or variations based on the above teachings or learning from the embodiments of the present invention. The embodiments are described and illustrated in the practical application by the skilled person in the various embodiments using the present invention. The technical idea of the present invention is determined by the following claims and their equals. .
10...晶圓級封裝的晶片10. . . Wafer level packaged wafer
12...凸塊或植球12. . . Bump or ball
14...載具14. . . vehicle
16...槽16. . . groove
18...局部放大圖18. . . Partial enlargement
20...簧片20. . . Reed
22...定位孔twenty two. . . Positioning hole
24...托盤twenty four. . . tray
26...槽26. . . groove
28...翻轉軸28. . . Flip axis
30...第一平台30. . . First platform
32...第二平台32. . . Second platform
34...第一載具34. . . First vehicle
36...夾爪36. . . Jaws
38...第二載具38. . . Second vehicle
40...翻面裝置40. . . Turning device
42...驅動器42. . . driver
44...驅動器44. . . driver
46...讓開孔46. . . Let open
48...定位銷48. . . Locating pin
50...壓制器50. . . Suppressor
52...小槌52. . . Xiao Yan
54...讓開孔54. . . Let open
56...銷56. . . pin
58...壓板58. . . Press plate
60...空隙60. . . Void
62...彈性件62. . . Elastic part
圖1係晶圓級封裝的晶片的示意圖;Figure 1 is a schematic illustration of a wafer of a wafer level package;
圖2係本發明的載具的實施例;Figure 2 is an embodiment of a carrier of the present invention;
圖3係習知的托盤;Figure 3 is a conventional tray;
圖4A及圖4B係本發明將晶片翻面的過程;4A and 4B are processes for turning a wafer over the surface of the present invention;
圖5係本發明的翻面裝置的實施例;Figure 5 is an embodiment of a turning device of the present invention;
圖6A、圖6B及圖6C係本發明於第二載具38面對面蓋在第一載具34上時各實施例於槽16的局部剖面圖;6A, 6B, and 6C are partial cross-sectional views of the embodiment of the present invention in the groove 16 when the second carrier 38 is placed face to face on the first carrier 34;
圖7係本發明的翻面裝置的另一實施例;以及Figure 7 is another embodiment of the flipping device of the present invention;
圖8A至圖8C係本發明圖7實施例將晶片翻面的過程。8A through 8C are views showing the process of turning the wafer over in the embodiment of Fig. 7 of the present invention.
28...翻轉軸28. . . Flip axis
30...第一平台30. . . First platform
32...第二平台32. . . Second platform
34...第一載具34. . . First vehicle
36...夾爪36. . . Jaws
38...第二載具38. . . Second vehicle
Claims (20)
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TW100123682A TWI462240B (en) | 2011-07-05 | 2011-07-05 | Apparatus and method for flipping the wafer |
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TW100123682A TWI462240B (en) | 2011-07-05 | 2011-07-05 | Apparatus and method for flipping the wafer |
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TWI462240B true TWI462240B (en) | 2014-11-21 |
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Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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TWM257008U (en) * | 2004-05-26 | 2005-02-11 | All Ring Tech Co Ltd | A chip overturning mechanism |
TWM331744U (en) * | 2007-09-19 | 2008-05-01 | Global Master Tech Co Ltd | Flipping device for chip |
TW200935994A (en) * | 2008-02-04 | 2009-08-16 | Prov Technology Corp | Arrangement device for overturning the electronic elements |
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Publication number | Priority date | Publication date | Assignee | Title |
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TWM257008U (en) * | 2004-05-26 | 2005-02-11 | All Ring Tech Co Ltd | A chip overturning mechanism |
TWM331744U (en) * | 2007-09-19 | 2008-05-01 | Global Master Tech Co Ltd | Flipping device for chip |
TW200935994A (en) * | 2008-02-04 | 2009-08-16 | Prov Technology Corp | Arrangement device for overturning the electronic elements |
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