TWI456335B - 影像計算量測裝置及方法 - Google Patents

影像計算量測裝置及方法 Download PDF

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Publication number
TWI456335B
TWI456335B TW101120960A TW101120960A TWI456335B TW I456335 B TWI456335 B TW I456335B TW 101120960 A TW101120960 A TW 101120960A TW 101120960 A TW101120960 A TW 101120960A TW I456335 B TWI456335 B TW I456335B
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TW
Taiwan
Prior art keywords
image
projected
optical member
capturing device
optical
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TW101120960A
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English (en)
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TW201250370A (en
Inventor
Hitoshi Itoh
Fumihiro Nakashige
Norihiko Shutoh
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Ricoh Co Ltd
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Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Publication of TW201250370A publication Critical patent/TW201250370A/zh
Application granted granted Critical
Publication of TWI456335B publication Critical patent/TWI456335B/zh

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  • Testing Of Optical Devices Or Fibers (AREA)
  • Projection Apparatus (AREA)
  • Overhead Projectors And Projection Screens (AREA)

Claims (6)

  1. 一種影像計算量測裝置，具備：用使所投射的投影影像的投影光的一部分擴散透過的材料製作的光學構件；透射影像攝影裝置，對投射在該光學構件上並透過的投影影像進行攝影；影像處理裝置，對從該攝影裝置輸出的影像信號進行分析，計算出所述投影影像的光學特性並數值化，該影像計算量測裝置對所述投影影像的光學特性進行計算量測，其特徵在於：將所述光學構件在投影光的波長區域中的反射率設為90%以上、97%以下。
  2. 如申請專利範圍第1項所述的影像計算量測裝置，其中，設置有對由所述光學構件反射的投影影像進行攝影的反射影像攝影裝置，對由反射側的所述反射影像攝影裝置攝影所得的投影影像的光學特性與由透過側的所述透射影像攝影裝置攝影所得的投影影像的光學特性進行比較，計算出以由反射側的反射影像攝影裝置攝影所得的投影影像的光學特性為基準的修正量。
  3. 如申請專利範圍第1項所述的影像計算量測裝置，其中，在對來自外部的光進行遮蔽的框體內設置所述透射影像攝影裝置，在作為所述透射影像攝影裝置的攝影區域的該框體的一部分中具備所述光學構件，相對於所述光學構件將所述透射影像攝影裝置固定設置在規定的位置。
  4. 如申請專利範圍第1項至第3項中任意一項所述的影像計算量測裝置，其中，所述光學構件是螢幕，投射到該螢幕上的投影影像是來自投影機的投影影像。
  5. 如申請專利範圍第1項至第3項中任意一項所述的影像計算量測裝置，其中，投射到所述光學構件上的投影影像是隔著鏡頭的影像。
  6. 一種影像計算量測方法，係藉由：使所投射之投影影像的投影光的一 部分擴散透過；對所透過的投影影像進行攝影；接著，對由攝影所輸出的影像信號進行分析，計算出所述投影影像的光學特性並數值化，而對所述投影影像的光學特性進行計算量測的影像計算量測方法，其特徵在於：將所投射之投影影像的投影光的波長區域中的反射率設為90%以上、97%以下。
TW101120960A 2011-06-13 2012-06-12 影像計算量測裝置及方法 TWI456335B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2011130791 2011-06-13
JP2012091716A JP2013019886A (ja) 2011-06-13 2012-04-13 画像計測装置

Publications (2)

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TW201250370A TW201250370A (en) 2012-12-16
TWI456335B true TWI456335B (zh) 2014-10-11

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TW (1) TWI456335B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9972075B2 (en) 2016-08-23 2018-05-15 National Taiwan University Of Science And Technology Image correction method of projector and image correction system

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106575074B (zh) 2014-07-30 2020-06-05 康宁股份有限公司 高对比度、基于玻璃的可写入/可擦除前投影屏幕
JP7270025B2 (ja) * 2019-02-19 2023-05-09 富士フイルム株式会社 投影装置とその制御方法及び制御プログラム
US20240027357A1 (en) * 2020-10-02 2024-01-25 Dai Nippon Printing Co., Ltd. Sparkle contrast correcting method, comparing method, comparing apparatus, electronic display manufacturing method, and anti-glare layer manufacturing method

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1126273A1 (en) * 2000-02-09 2001-08-22 Orbis Oy Method and arrangement for inspecting a transparent object for flaws
JP2002202218A (ja) * 2000-10-18 2002-07-19 Seiko Epson Corp レンズの評価方法およびレンズ評価装置
TWI226459B (en) * 2002-07-15 2005-01-11 Seiko Epson Corp Production method for illuminating optical unit, production device for illuminating optical unit, illuminating optical unit produced by this production method, and projector
US20060098279A1 (en) * 2004-11-10 2006-05-11 Naofumi Yamauchi Screen and image projection system using the same

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1126273A1 (en) * 2000-02-09 2001-08-22 Orbis Oy Method and arrangement for inspecting a transparent object for flaws
JP2002202218A (ja) * 2000-10-18 2002-07-19 Seiko Epson Corp レンズの評価方法およびレンズ評価装置
TWI226459B (en) * 2002-07-15 2005-01-11 Seiko Epson Corp Production method for illuminating optical unit, production device for illuminating optical unit, illuminating optical unit produced by this production method, and projector
US20060098279A1 (en) * 2004-11-10 2006-05-11 Naofumi Yamauchi Screen and image projection system using the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9972075B2 (en) 2016-08-23 2018-05-15 National Taiwan University Of Science And Technology Image correction method of projector and image correction system

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TW201250370A (en) 2012-12-16
JP2013019886A (ja) 2013-01-31

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