TWI456188B - 偏光膜之區分系統及區分方法 - Google Patents

偏光膜之區分系統及區分方法 Download PDF

Info

Publication number
TWI456188B
TWI456188B TW098109857A TW98109857A TWI456188B TW I456188 B TWI456188 B TW I456188B TW 098109857 A TW098109857 A TW 098109857A TW 98109857 A TW98109857 A TW 98109857A TW I456188 B TWI456188 B TW I456188B
Authority
TW
Taiwan
Prior art keywords
mark
gap
polarizing
film
detecting
Prior art date
Application number
TW098109857A
Other languages
English (en)
Chinese (zh)
Other versions
TW200951423A (en
Inventor
Atsuhiko Shinozuka
Osamu Hirose
Original Assignee
Sumitomo Chemical Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Chemical Co filed Critical Sumitomo Chemical Co
Publication of TW200951423A publication Critical patent/TW200951423A/zh
Application granted granted Critical
Publication of TWI456188B publication Critical patent/TWI456188B/zh

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/342—Sorting according to other particular properties according to optical properties, e.g. colour
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H29/00—Delivering or advancing articles from machines; Advancing articles to or into piles
    • B65H29/58—Article switches or diverters
    • B65H29/60—Article switches or diverters diverting the stream into alternative paths
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2511/00—Dimensions; Position; Numbers; Identification; Occurrences
    • B65H2511/50—Occurence
    • B65H2511/51—Presence
    • B65H2511/512—Marks, e.g. invisible to the human eye; Patterns
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2553/00—Sensing or detecting means
    • B65H2553/40—Sensing or detecting means using optical, e.g. photographic, elements
    • B65H2553/42—Cameras

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Sorting Of Articles (AREA)
  • Control Of Conveyors (AREA)
  • Controlling Sheets Or Webs (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
TW098109857A 2008-03-31 2009-03-26 偏光膜之區分系統及區分方法 TWI456188B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008090435A JP5415709B2 (ja) 2008-03-31 2008-03-31 偏光フィルムの仕分けシステム

Publications (2)

Publication Number Publication Date
TW200951423A TW200951423A (en) 2009-12-16
TWI456188B true TWI456188B (zh) 2014-10-11

Family

ID=41135383

Family Applications (1)

Application Number Title Priority Date Filing Date
TW098109857A TWI456188B (zh) 2008-03-31 2009-03-26 偏光膜之區分系統及區分方法

Country Status (8)

Country Link
JP (1) JP5415709B2 (sk)
KR (1) KR101593251B1 (sk)
CN (1) CN101980797B (sk)
CZ (1) CZ2010720A3 (sk)
PL (1) PL392793A1 (sk)
SK (1) SK50382010A3 (sk)
TW (1) TWI456188B (sk)
WO (1) WO2009123004A1 (sk)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101837351B (zh) * 2010-06-02 2012-09-19 天津大学 基于图像检测法的油封弹簧全自动分选系统及方法
US20150085276A1 (en) * 2012-03-23 2015-03-26 Toray Industries, Inc. Method for inspecting length-measurable product, and inspection device
WO2014119772A1 (ja) * 2013-01-30 2014-08-07 住友化学株式会社 画像生成装置、欠陥検査装置および欠陥検査方法
JP5815909B1 (ja) * 2014-10-10 2015-11-17 住友化学株式会社 セパレータ原反の製造方法、セパレータの製造方法、セパレータ原反、及びセパレータ原反製造装置
CN105293064A (zh) * 2015-12-04 2016-02-03 邢台职业技术学院 一种电气自动化包装缺陷检测装置
CN106918603B (zh) * 2015-12-25 2021-04-27 中钞印制技术研究院有限公司 光谱检测方法及系统
KR20170081550A (ko) * 2016-03-07 2017-07-12 동우 화인켐 주식회사 필름 분류 시스템 및 방법
KR101955757B1 (ko) * 2016-06-08 2019-03-07 삼성에스디아이 주식회사 필름 처리장치 및 처리방법
US11127538B2 (en) 2017-02-20 2021-09-21 The Research Foundation For The State University Of New York Multi-cell multi-layer high voltage supercapacitor apparatus including graphene electrodes
CN107727654B (zh) * 2017-09-29 2019-12-24 绵阳京东方光电科技有限公司 膜层检测方法、装置及膜层检测系统
CN111054639B (zh) * 2019-12-18 2021-04-13 南京冠石科技股份有限公司 一种偏光板在线检测装置
CN111208136B (zh) * 2020-01-16 2023-04-07 东莞维科电池有限公司 一种在线检查涂层隔膜朝向的方法及装置

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09109372A (ja) * 1995-10-18 1997-04-28 Datsuku Eng Kk 製品検査装置及びそのマーク有無検査手段
JPH10194585A (ja) * 1997-01-14 1998-07-28 Mitsubishi Paper Mills Ltd 平判枚葉自動選別装置
JPH10296151A (ja) * 1997-04-28 1998-11-10 Sony Corp 塗布制御装置及び方法
EP1178301A1 (en) * 1999-03-18 2002-02-06 Nkk Corporation Defect marking method and device
CN1461948A (zh) * 2002-05-31 2003-12-17 住友化学工业株式会社 偏光膜的检查方法及检查装置
TWM316389U (en) * 2007-01-15 2007-08-01 Els System Technology Co Ltd Testing machine used for optical thin films

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001305070A (ja) 2000-04-19 2001-10-31 Sumitomo Chem Co Ltd シート状製品の欠陥マーキング方法および装置
CN101025399B (zh) * 2006-02-20 2010-09-29 鸿富锦精密工业（深圳）有限公司 快速检验镜片缺陷的方法
CN101063659A (zh) * 2006-04-26 2007-10-31 陈岳林 纸张纸病检测系统

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09109372A (ja) * 1995-10-18 1997-04-28 Datsuku Eng Kk 製品検査装置及びそのマーク有無検査手段
JPH10194585A (ja) * 1997-01-14 1998-07-28 Mitsubishi Paper Mills Ltd 平判枚葉自動選別装置
JPH10296151A (ja) * 1997-04-28 1998-11-10 Sony Corp 塗布制御装置及び方法
EP1178301A1 (en) * 1999-03-18 2002-02-06 Nkk Corporation Defect marking method and device
CN1461948A (zh) * 2002-05-31 2003-12-17 住友化学工业株式会社 偏光膜的检查方法及检查装置
TWM316389U (en) * 2007-01-15 2007-08-01 Els System Technology Co Ltd Testing machine used for optical thin films

Also Published As

Publication number Publication date
JP2009244063A (ja) 2009-10-22
CN101980797B (zh) 2013-05-22
JP5415709B2 (ja) 2014-02-12
WO2009123004A1 (ja) 2009-10-08
KR20100135788A (ko) 2010-12-27
SK50382010A3 (sk) 2011-02-04
CN101980797A (zh) 2011-02-23
PL392793A1 (pl) 2011-02-28
CZ2010720A3 (cs) 2011-08-31
KR101593251B1 (ko) 2016-02-11
TW200951423A (en) 2009-12-16

Similar Documents

Publication Publication Date Title
TWI456188B (zh) 偏光膜之區分系統及區分方法
TWI418779B (zh) 缺陷檢查裝置及方法
EP2059029A3 (en) Image composition determining apparatus, image composition determining method and program
EP1973064A3 (en) Object image detection method and object image detection device
JP2010256359A5 (sk)
TW200736599A (en) Defect inspection device for inspecting defect by image analysis
JP2009163229A5 (sk)
TW200506354A (en) Method for inspecting a transparent film for foreign material
JP2009029622A5 (sk)
WO2007137261A3 (en) Methods and systems for detecting pinholes in a film formed on a wafer or for monitoring a thermal process tool
WO2008139735A1 (ja) 表面検査装置および表面検査方法
EP1973060A3 (en) Object image detection method and object image detection device
JP2008116451A (ja) 負荷がかかっているサンプルにおける故障事象を位置特定するためのシステムおよび方法
JP2011232111A5 (sk)
TWI718132B (zh) 層積光學薄膜的缺陷檢查方法，光學薄膜的缺陷檢查方法及層積光學薄膜的製造方法
EP2600308A3 (en) Information processing apparatus, information processing method, program and computer-readable storage medium
JP2010168041A5 (sk)
JP2010287098A5 (sk)
KR20160022044A (ko) 광학 필름 검사 장치
TWI663391B (zh) 積層光學膜之缺陷檢查方法、光學膜之缺陷檢查方法及積層光學膜之製造方法
JP2008128944A5 (sk)
KR20120129020A (ko) 필름 결함 모니터링 장치 및 방법
TW201800744A (zh) 缺陷檢查用攝影裝置、缺陷檢查系統、膜製造裝置、缺陷檢查用攝影方法、缺陷檢查方法及膜的製造方法
ATE394763T1 (de) Detektion von rauch mit einer videokamera
TWM305898U (en) Object tester