TWI453405B - Drop test device - Google Patents

Drop test device Download PDF

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Publication number
TWI453405B
TWI453405B TW099110992A TW99110992A TWI453405B TW I453405 B TWI453405 B TW I453405B TW 099110992 A TW099110992 A TW 099110992A TW 99110992 A TW99110992 A TW 99110992A TW I453405 B TWI453405 B TW I453405B
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TW
Taiwan
Prior art keywords
drop test
test device
fixed
bracket
sliding
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TW099110992A
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Chinese (zh)
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TW201135222A (en
Inventor
Teng Tsung Huang
Guo-Jun Yu
yong-bing Hu
zhan Shang
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Hon Hai Prec Ind Co Ltd
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Priority to TW099110992A priority Critical patent/TWI453405B/en
Publication of TW201135222A publication Critical patent/TW201135222A/en
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Publication of TWI453405B publication Critical patent/TWI453405B/en

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Description

跌落測試裝置Drop test device

本發明涉及一種跌落測試裝置。The invention relates to a drop test device.

手機、數碼相機、MP3播放器、個人數位助理器(Personal Digital Assistant, 簡稱PDA)等小型消費性電子產品一般需進行跌落測試,以對該等電子產品進行剛強度檢測。為了提高測試效率,通常採用跌落測試裝置進行測試。Small consumer electronics such as mobile phones, digital cameras, MP3 players, and Personal Digital Assistants (PDAs) generally require a drop test to perform a rigid strength test on such electronic products. In order to improve the test efficiency, the drop test device is usually used for testing.

一種跌落測試裝置,其包括底座、支架、跌落台及定向夾具。支架基本垂直地固定於底座上。跌落台活動地裝設於該支架上,且其為框體結構。定向夾具固定於跌落台上。對檢測件進行跌落實驗時,首先根據需要調節跌落台之高度,然後,採用定向夾具夾持檢測件,最後,鬆開夾具,使檢測件從跌落台上跌落下來。A drop test device includes a base, a bracket, a drop table, and an orientation clamp. The bracket is fixed substantially perpendicularly to the base. The drop table is movably mounted on the bracket and is a frame structure. The orientation fixture is fixed to the drop table. When the test piece is subjected to the drop test, the height of the drop table is first adjusted as needed. Then, the detecting piece is held by the orientation jig, and finally, the jig is loosened, and the detecting piece is dropped from the drop table.

惟,上述跌落測試裝置於每次檢測後,需要再次將檢測件重新夾持於該定向夾具內,其難以進行連續之複數測試。However, the above-described drop test device needs to re-clamp the detecting member in the orientation jig again after each test, which makes it difficult to perform continuous plural test.

鑒於上述狀況,有必要提供一種可連續之複數測試之跌落測試裝置。In view of the above, it is necessary to provide a drop test device that can be continuously tested in multiple numbers.

一種跌落測試裝置,其用於對檢測件進行跌落測試,跌落測試裝置包括底座、固定於底座上之固定支架、固定於固定支架上之第一驅動件及與第一驅動件固定連接之滑動支架,滑動支架上設有抬起臂,底座上設置有定位件,第一驅動件驅動滑動支架,使滑動支架相對於固定支架可滑動,從而使檢測件之一端被抬起,另一端與定位件相抵持。A drop test device for performing a drop test on a test piece, the drop test device comprising a base, a fixing bracket fixed on the base, a first driving member fixed on the fixing bracket, and a sliding bracket fixedly connected to the first driving member The sliding bracket is provided with a lifting arm, and the base is provided with a positioning member, and the first driving member drives the sliding bracket to slide the sliding bracket relative to the fixing bracket, so that one end of the detecting member is lifted, and the other end and the positioning member are Resist.

上述跌落測試裝置之滑動支架設有抬起臂,底座上設置有定位件,使檢測件之一端被抬起臂抬起,跌落後仍處於原始位置,從而使跌落測試裝置對檢測件進行連續之複數測試。The sliding bracket of the above-mentioned drop test device is provided with a lifting arm, and the positioning member is arranged on the base, so that one end of the detecting member is lifted by the lifting arm, and is still in the original position after the falling, so that the drop test device continuously performs the detecting member. Plural test.

下面結合附圖及實施方式對本發明之跌落測試裝置作進一步詳細說明。The drop test apparatus of the present invention will be further described in detail below with reference to the accompanying drawings and embodiments.

請參閱圖1及圖2,本發明較佳實施方式之跌落測試裝置100包括一底座20、一固定支架30、一升降機構40、一第一控制件50、二復位機構60、一第二控制件70及一操作平台80。Referring to FIG. 1 and FIG. 2 , the drop test apparatus 100 of the preferred embodiment of the present invention includes a base 20 , a fixed bracket 30 , a lifting mechanism 40 , a first control member 50 , two reset mechanisms 60 , and a second control . A piece 70 and an operating platform 80.

固定支架30基本垂直地固定於底座20上。升降機構40固定於固定支架30上。二復位機構60設於底座20之相對兩側。第一控制件50及第二控制件70分別固定於底座20之同一側兩端上。操作平台80固定於底座20之另一相對側。第一控制件50用於控制升降機構40,第二控制件70用於控制復位機構60。操作平台80用於控制第一控制件50及第二控制件70。The fixing bracket 30 is fixed to the base 20 substantially vertically. The lifting mechanism 40 is fixed to the fixing bracket 30. The two reset mechanisms 60 are disposed on opposite sides of the base 20. The first control member 50 and the second control member 70 are respectively fixed to the opposite ends of the base 20 . The operating platform 80 is fixed to the other opposite side of the base 20. The first control member 50 is for controlling the lifting mechanism 40, and the second control member 70 is for controlling the reset mechanism 60. The operating platform 80 is used to control the first control member 50 and the second control member 70.

請參閱圖3,底座20包括一基板21、一承載板23及複數定位件25。基板21之一端開設有連相互平行之收容槽213。承載板23固定於基板21上,其一端開設有相互平行之二限位缺口231。限位缺口231與基板21之收容槽213相對應。定位件25固定於基板21上,且靠近承載板23之周緣。具體於本實施方式中,定位件25為靠近承載板23之邊緣設置之定位柱,其數量為六。Referring to FIG. 3 , the base 20 includes a base plate 21 , a carrier plate 23 , and a plurality of positioning members 25 . One end of the substrate 21 is provided with a receiving groove 213 which is parallel to each other. The carrier plate 23 is fixed on the substrate 21, and one end of the second limiting notch 231 is defined at one end thereof. The limit notch 231 corresponds to the receiving groove 213 of the substrate 21 . The positioning member 25 is fixed to the substrate 21 and is close to the periphery of the carrier plate 23. Specifically, in the embodiment, the positioning member 25 is a positioning post disposed near the edge of the carrier plate 23, and the number thereof is six.

請參閱圖4,固定支架30包括一支撐件31、二第一限位件32、一導向件34、二第二限位件35、一連接件36及二緩衝件37。Referring to FIG. 4 , the fixing bracket 30 includes a supporting member 31 , two first limiting members 32 , a guiding member 34 , two second limiting members 35 , a connecting member 36 and two buffering members 37 .

支撐件31基本垂直地固定於底座20之基板21上。支撐件31呈板體,其開設有二間隔設置之滑槽312。每一滑槽312從支撐件31與底座20之基板21相連之一端延伸至支撐件31之中部,以形成二第一連接部313及一位於該二第一連接部313中間位置之第二連接部315。The support member 31 is fixed substantially perpendicularly to the substrate 21 of the base 20. The support member 31 is a plate body which is provided with two spaced-apart slots 312. Each of the sliding slots 312 extends from one end of the support member 31 and the base plate 21 of the base 20 to the middle of the support member 31 to form two first connecting portions 313 and a second connection at a position intermediate the two first connecting portions 313. Part 315.

二第一限位件32分別與支撐件31之二第一連接部313固定連接。導向件34固定於支撐件31之第二連接部315上。導向件34為長條狀,其形成有沿其長度方向延伸之燕尾型之導軌341。二第二限位件35固定於支撐件31之第二連接部315上,且分別位於導向件34之兩端。The two first limiting members 32 are fixedly connected to the two first connecting portions 313 of the support member 31 respectively. The guide member 34 is fixed to the second connecting portion 315 of the support member 31. The guide member 34 has an elongated shape and is formed with a dovetail type guide rail 341 extending in the longitudinal direction thereof. The second limiting members 35 are fixed on the second connecting portion 315 of the support member 31 and are respectively located at two ends of the guiding member 34.

連接件36固定於支撐件31遠離滑槽312之一端。連接件36包括第一固定部361及與該第一固定部361之一端垂直相連之第二固定部363。第一固定部361固定於支撐件31上。第二固定部363遠離第一固定部361之一端延伸有相互間隔之二突起3631。The connecting member 36 is fixed to one end of the support member 31 away from the sliding slot 312. The connecting member 36 includes a first fixing portion 361 and a second fixing portion 363 perpendicularly connected to one end of the first fixing portion 361. The first fixing portion 361 is fixed to the support member 31. The second fixing portion 363 extends away from one end of the first fixing portion 361 and has two protrusions 3631 spaced apart from each other.

每一緩衝件37包括固定柱371及套設於固定柱371一端之緩衝墊373。固定柱371遠離緩衝墊373之一端穿設連接件36之突起3631。Each buffer member 37 includes a fixing post 371 and a cushion 373 sleeved at one end of the fixing post 371. The fixing post 371 is disposed away from the protrusion 3631 of the connecting member 36 away from one end of the cushion 373.

請參閱圖5,升降機構40包括第一驅動件41、滑動支架43、滑動件44及行程調節件45。Referring to FIG. 5, the lifting mechanism 40 includes a first driving member 41, a sliding bracket 43, a slider 44, and a stroke adjusting member 45.

本實施方式中,第一驅動件41為伸縮氣缸,其具有伸縮桿412。In the present embodiment, the first driving member 41 is a telescopic cylinder having a telescopic rod 412.

滑動支架43包括一本體431、二抬起臂432、二轉軸434、二滾輪435。二抬起臂432從本體431之一端朝向本體同一側彎折延伸。每一轉軸434固定於抬起臂432之自由端。每一滾輪435可轉動地套設於轉軸434上。本實施方式中,滾輪435為橡膠滾輪。The sliding bracket 43 includes a body 431, two lifting arms 432, two rotating shafts 434, and two rollers 435. The two lifting arms 432 are bent and extended from one end of the body 431 toward the same side of the body. Each of the rotating shafts 434 is fixed to the free end of the lifting arm 432. Each roller 435 is rotatably sleeved on the rotating shaft 434. In the present embodiment, the roller 435 is a rubber roller.

滑動件44固定於滑動支架43之本體431靠近抬起臂432之一側。滑動件44上開設有滑槽441。本實施方式中,滑槽441為燕尾型之滑槽。The slider 44 is fixed to the body 431 of the slide bracket 43 near one side of the lift arm 432. A sliding slot 441 is defined in the sliding member 44. In the present embodiment, the chute 441 is a dovetail type chute.

行程調節件45包括固定柱451及固定於固定柱451一端之套筒452。固定柱451固定於底座20之基板21上。第一驅動件41之伸縮桿412收容於套筒452內。The stroke adjusting member 45 includes a fixing post 451 and a sleeve 452 fixed to one end of the fixing post 451. The fixing post 451 is fixed to the base plate 21 of the base 20. The telescopic rod 412 of the first driving member 41 is received in the sleeve 452.

請參閱圖6,復位機構60包括固定件61、連接件63、第二驅動件65及抵持件66。連接件63之兩端分別固定連接固定件61及第二驅動件65。本實施方式中,第二驅動件65為驅動氣缸,其具有驅動軸651。抵持件66上開設有收容第二驅動件65端部之收容槽661。驅動軸651固定於收容槽661之底部。Referring to FIG. 6 , the reset mechanism 60 includes a fixing member 61 , a connecting member 63 , a second driving member 65 , and a resisting member 66 . Both ends of the connecting member 63 are fixedly connected to the fixing member 61 and the second driving member 65, respectively. In the present embodiment, the second driving member 65 is a driving cylinder having a drive shaft 651. The receiving member 66 defines a receiving groove 661 for receiving the end of the second driving member 65. The drive shaft 651 is fixed to the bottom of the receiving groove 661.

本實例方式中,第一控制件50及第二控制件70均為電磁閥,操作平台80為具有顯示幕的控制器。In the embodiment, the first control member 50 and the second control member 70 are both electromagnetic valves, and the operating platform 80 is a controller having a display screen.

請一併參閱圖1至圖6,組裝跌落測試裝置100時,首先,將固定支架30之支撐件31基本垂直地固定於底座20之基板21一端。然後,升降機構40之第一驅動件41固定於固定支架30之支撐件31遠離底座20之一端。固定支架30之導向件34之導軌341收容於升降機構40之滑動件44之滑槽441內。升降機構40之行程調節件45之固定柱451固定於底座20之基板21上,第一驅動件41之伸縮桿412收容於行程調節件45之套筒452內。滑動支架43之本體431於固定支架30之二第一限位件32之間滑動。滑動支架43之抬起臂432可收容於底座20之基板21之收容槽213及承載板之限位缺口231內。接著,將第一控制件50固定於底座20之基板21上,並與升降機構40之第一驅動件41電連接。接著,將第二控制件70固定於底座20之基板21上,並與復位機構60之第二驅動件65電連接。最後,將操作平台80固定於底座20之基板21上,並與第一控制件50及第二控制件70電連接。Referring to FIG. 1 to FIG. 6 together, when assembling the drop test device 100, first, the support member 31 of the fixing bracket 30 is fixed substantially perpendicularly to one end of the substrate 21 of the base 20. Then, the first driving member 41 of the lifting mechanism 40 is fixed to one end of the support member 31 of the fixing bracket 30 away from the base 20. The guide rail 341 of the guide member 34 of the fixing bracket 30 is received in the sliding groove 441 of the slider 44 of the lifting mechanism 40. The fixing post 451 of the stroke adjusting member 45 of the lifting mechanism 40 is fixed on the base plate 21 of the base 20, and the telescopic rod 412 of the first driving member 41 is received in the sleeve 452 of the stroke adjusting member 45. The body 431 of the sliding bracket 43 slides between the two first limiting members 32 of the fixing bracket 30. The lifting arm 432 of the sliding bracket 43 can be received in the receiving groove 213 of the base plate 21 of the base 20 and the limiting notch 231 of the carrying plate. Next, the first control member 50 is fixed to the substrate 21 of the base 20 and electrically connected to the first driving member 41 of the lifting mechanism 40. Next, the second control member 70 is fixed to the substrate 21 of the base 20 and electrically connected to the second driving member 65 of the reset mechanism 60. Finally, the operating platform 80 is fixed to the substrate 21 of the base 20 and electrically connected to the first control member 50 and the second control member 70.

對檢測件10進行跌落測試時,首先,將檢測件10之一端放置於底座20之承載板23上,且與定位件25相抵持,另一端放置於升降機構40之滑動支架43之抬起臂432上。然後,於操作平台80上設置好測試之控制參數,例如測試之次數、頻率等。When the detecting member 10 is subjected to the drop test, first, one end of the detecting member 10 is placed on the carrying plate 23 of the base 20, and is abutted against the positioning member 25, and the other end is placed on the lifting arm of the sliding bracket 43 of the lifting mechanism 40. On 432. Then, the control parameters of the test, such as the number of tests, the frequency, and the like, are set on the operating platform 80.

本發明之跌落測試裝置100之滑動支架43設有抬起臂432,底座20上設置有定位件25,使檢測件10之一端被抬起臂432抬起,跌落後仍處於原始位置,從而使跌落測試裝置100對檢測件10進行連續之複數測試。The sliding bracket 43 of the drop test device 100 of the present invention is provided with a lifting arm 432. The base 20 is provided with a positioning member 25, so that one end of the detecting member 10 is lifted by the lifting arm 432, and is still in the original position after falling, thereby The drop test apparatus 100 performs a continuous plural test on the detecting member 10.

固定支架30上設置有緩衝件37,使滑動支架43滑動時,可與緩衝件37相抵持,從而使滑動支架43平穩之往返滑動。滑動支架43之抬起臂432上設置有滾輪435,使抬起臂432與檢測件10之間之滑動摩擦轉換為滾動摩擦,減小摩擦力,以免磨損檢測件10。行程調節件45可根據測試之高度之不同,調節滑動支架43運動之行程。復位機構60可進一步地對檢測件10進行定位,從而提高測試精度。The fixing bracket 30 is provided with a cushioning member 37 for abutting against the cushioning member 37 when the sliding bracket 43 is slid, so that the sliding bracket 43 smoothly slides back and forth. The lifting arm 432 of the sliding bracket 43 is provided with a roller 435, which converts the sliding friction between the lifting arm 432 and the detecting member 10 into rolling friction, and reduces the frictional force to prevent the detecting member 10 from being worn. The stroke adjusting member 45 adjusts the stroke of the movement of the slide bracket 43 according to the height of the test. The reset mechanism 60 can further position the detecting member 10 to improve the test accuracy.

可理解,第一控制件50及第二控制件70均可省略,此時,由操作平台80控制升降機構40之第一驅動件41及復位機構60之第二驅動件65。滑動支架43之抬起臂432之個數可以為一或二以上。It can be understood that the first control member 50 and the second control member 70 can be omitted. At this time, the first driving member 41 of the lifting mechanism 40 and the second driving member 65 of the reset mechanism 60 are controlled by the operating platform 80. The number of the lifting arms 432 of the sliding bracket 43 may be one or two or more.

綜上所述,本發明確已符合發明專利之要件,遂依法提出專利申請。惟,以上所述者僅為本發明之較佳實施方式,自不能以此限制本案之申請專利範圍。舉凡熟悉本案技藝之人士援依本發明之精神所作之等效修飾或變化,皆應涵蓋於以下申請專利範圍內。In summary, the present invention has indeed met the requirements of the invention patent, and has filed a patent application according to law. However, the above description is only a preferred embodiment of the present invention, and it is not possible to limit the scope of the patent application of the present invention. Equivalent modifications or variations made by persons skilled in the art in light of the spirit of the invention are intended to be included within the scope of the following claims.

10‧‧‧檢測件10‧‧‧Test pieces

20‧‧‧底座20‧‧‧Base

21‧‧‧基板21‧‧‧Substrate

213‧‧‧收容槽213‧‧‧ housing trough

23‧‧‧承載板23‧‧‧Loading board

231‧‧‧限位缺口231‧‧‧ Limit gap

25‧‧‧定位件25‧‧‧ Positioning parts

30‧‧‧固定支架30‧‧‧Fixed bracket

31‧‧‧支撐件31‧‧‧Support

312‧‧‧滑槽312‧‧ ‧ chute

313‧‧‧第一連接部313‧‧‧ First connection

315‧‧‧第二連接部315‧‧‧Second connection

32‧‧‧第一限位件32‧‧‧First limiter

34‧‧‧導向件34‧‧‧ Guides

341‧‧‧導軌341‧‧‧rails

35‧‧‧第二限位件35‧‧‧second limiter

36‧‧‧連接件36‧‧‧Connecting parts

361‧‧‧第一固定部361‧‧‧First Fixed Department

363‧‧‧第二固定部363‧‧‧Second fixed department

3631‧‧‧突起3631‧‧‧ Protrusion

37‧‧‧緩衝件37‧‧‧ cushioning parts

371‧‧‧固定柱371‧‧‧Fixed column

373‧‧‧緩衝墊373‧‧‧ cushion

40‧‧‧升降機構40‧‧‧ Lifting mechanism

41‧‧‧第一驅動件41‧‧‧First drive

412‧‧‧伸縮桿412‧‧‧ Telescopic rod

43‧‧‧滑動支架43‧‧‧Sliding bracket

431‧‧‧本體431‧‧‧ Ontology

432‧‧‧抬起臂432‧‧‧ Lifting the arm

434‧‧‧轉軸434‧‧‧ shaft

435‧‧‧滾輪435‧‧‧Roller

44‧‧‧滑動件44‧‧‧Sliding parts

441‧‧‧滑槽441‧‧‧Chute

45‧‧‧行程調節件45‧‧‧Travel adjustment parts

451‧‧‧固定柱451‧‧‧Fixed column

452‧‧‧套筒452‧‧ ‧ sleeve

50‧‧‧第一控制件50‧‧‧First control

60‧‧‧復位機構60‧‧‧Reset mechanism

61‧‧‧固定件61‧‧‧Fixed parts

63‧‧‧連接件63‧‧‧Connecting parts

65‧‧‧第二驅動件65‧‧‧second drive

651‧‧‧驅動軸651‧‧‧ drive shaft

66‧‧‧抵持件66‧‧‧Resistance

661‧‧‧收容槽661‧‧‧ receiving trough

70‧‧‧第二控制件70‧‧‧Second control

80‧‧‧操作平台80‧‧‧Operation platform

100‧‧‧跌落測試裝置100‧‧‧Drop test device

圖1係本發明之跌落測試裝置之立體圖,該跌落測試裝置包括底座、固定支架、升降機構及復位機構。1 is a perspective view of a drop test device of the present invention, the drop test device including a base, a fixed bracket, a lifting mechanism, and a reset mechanism.

圖2係圖1所示之跌落測試裝置之局部分解圖。Figure 2 is a partially exploded view of the drop test apparatus shown in Figure 1.

圖3係圖1所示之跌落測試裝置之底座之放大分解立體圖。Fig. 3 is an enlarged exploded perspective view showing the base of the drop test device shown in Fig. 1.

圖4係圖1所示之跌落測試裝置之固定支架之放大分解立體圖。4 is an enlarged exploded perspective view of the fixing bracket of the drop test device shown in FIG. 1.

圖5係圖1所示之跌落測試裝置之升降機構之放大分解立體圖。Fig. 5 is an enlarged exploded perspective view showing the elevating mechanism of the drop test device shown in Fig. 1.

圖6係圖1所示之跌落測試裝置之重定機構之放大分解立體圖。Fig. 6 is an enlarged exploded perspective view showing the repositioning mechanism of the drop test device shown in Fig. 1.

10‧‧‧檢測件 10‧‧‧Test pieces

20‧‧‧底座 20‧‧‧Base

30‧‧‧固定支架 30‧‧‧Fixed bracket

40‧‧‧升降機構 40‧‧‧ Lifting mechanism

50‧‧‧第一控制件 50‧‧‧First control

60‧‧‧復位機構 60‧‧‧Reset mechanism

70‧‧‧第二控制件 70‧‧‧Second control

80‧‧‧操作平台 80‧‧‧Operation platform

100‧‧‧跌落測試裝置 100‧‧‧Drop test device

Claims (10)

一種跌落測試裝置,其用於對檢測件進行跌落測試,該跌落測試裝置包括底座及固定於該底座上之固定支架,其改良在於:該跌落測試裝置還包括固定於該固定支架上之第一驅動件及與該第一驅動件固定連接之滑動支架,該滑動支架上設有抬起臂,該底座上設置有定位件,該第一驅動件驅動該滑動支架,使該滑動支架相對於該固定支架可滑動,從而使該檢測件之一端被抬起,另一端與該定位件相抵持。A drop test device for performing a drop test on a test piece, the drop test device comprising a base and a fixing bracket fixed to the base, wherein the drop test device further comprises a first fixed on the fixed bracket a driving member and a sliding bracket fixedly coupled to the first driving member, the sliding bracket is provided with a lifting arm, the base is provided with a positioning member, and the first driving member drives the sliding bracket to make the sliding bracket relative to the sliding bracket The fixing bracket is slidable such that one end of the detecting member is lifted and the other end is abutted against the positioning member. 如申請專利範圍第1項所述之跌落測試裝置,其中該抬起臂之自由端設有滾輪。The drop test device of claim 1, wherein the free end of the lifting arm is provided with a roller. 如申請專利範圍第1項所述之跌落測試裝置,其中該底座包括基板及固定於該基板上之承載板,該定位件固定該基板上且靠近該承載板邊緣。The drop test device of claim 1, wherein the base comprises a substrate and a carrier plate fixed to the substrate, the positioning member being fixed on the substrate and adjacent to the edge of the carrier plate. 如申請專利範圍第3項所述之跌落測試裝置,其中該基板上開設有收容該抬起臂之收容槽,該承載板上開設有收容該抬起臂之限位缺口。The drop test device of claim 3, wherein the substrate is provided with a receiving slot for receiving the lifting arm, and the carrying plate is provided with a limiting notch for receiving the lifting arm. 如申請專利範圍第3項所述之跌落測試裝置,其中該定位件為靠近該承載板之邊緣設置之定位柱。The drop test device of claim 3, wherein the positioning member is a positioning post disposed adjacent to an edge of the carrier plate. 如申請專利範圍第3項所述之跌落測試裝置,其中該固定支架包括基本垂直地固定於該基板上之支撐件及固定於該支撐件上之導向件,該滑動支架設有相對於該導向件滑動之滑動件。The drop test device of claim 3, wherein the fixing bracket comprises a support member fixed substantially perpendicularly to the substrate and a guide member fixed to the support member, the slide bracket being provided with respect to the guide Sliding slider. 如申請專利範圍第6項所述之跌落測試裝置,其中該固定支架上還包括固定於該支撐件上且與該滑動支架相抵持之緩衝件。The drop test device of claim 6, wherein the fixing bracket further comprises a buffer member fixed to the support member and abutting the sliding bracket. 如申請專利範圍第6項所述之跌落測試裝置,其中該滑動件上開設有滑槽,該導向件上設有沿其長度方向延伸且與該滑槽相配合之導軌。The drop test device of claim 6, wherein the sliding member is provided with a sliding slot, and the guiding member is provided with a guiding rail extending along the longitudinal direction thereof and cooperating with the sliding slot. 如申請專利範圍第3項所述之跌落測試裝置,其中該跌落測試裝置還包括固定於該基板上且位於該承載板之相對兩側之二復位機構。The drop test device of claim 3, wherein the drop test device further comprises two reset mechanisms fixed on the substrate and located on opposite sides of the carrier plate. 如申請專利範圍第9項所述之跌落測試裝置,其中每一復位機構包括抵持件及驅使該抵持件運動之第二驅動件。The drop test device of claim 9, wherein each reset mechanism comprises a resisting member and a second driving member for driving the resisting member.
TW099110992A 2010-04-09 2010-04-09 Drop test device TWI453405B (en)

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US20080051228A1 (en) * 2006-06-09 2008-02-28 Harmon Andrew P Method & apparatus for testing and/or improving agility & response time
US20080184773A1 (en) * 2007-02-02 2008-08-07 Sony Ericsson Mobile Communications Ab Test equipment system and method for testing a component
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CN101532903A (en) * 2009-04-08 2009-09-16 南京航空航天大学 Drop test device for movable impact platform

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1979110A (en) * 2005-12-02 2007-06-13 陈夏宗 Detection method and apparatus for landing test
US20080051228A1 (en) * 2006-06-09 2008-02-28 Harmon Andrew P Method & apparatus for testing and/or improving agility & response time
US20080184773A1 (en) * 2007-02-02 2008-08-07 Sony Ericsson Mobile Communications Ab Test equipment system and method for testing a component
US20090019917A1 (en) * 2007-07-18 2009-01-22 Jui Jing Lim Test assembly and method
US20090090166A1 (en) * 2007-10-09 2009-04-09 Newport News Shipbuilding And Dry Dock Company Shock simulation generator
CN101532903A (en) * 2009-04-08 2009-09-16 南京航空航天大学 Drop test device for movable impact platform

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