TWI449158B - Esd protection circuit for integrated circuit with multiple power domain - Google Patents
Esd protection circuit for integrated circuit with multiple power domain Download PDFInfo
- Publication number
- TWI449158B TWI449158B TW098120418A TW98120418A TWI449158B TW I449158 B TWI449158 B TW I449158B TW 098120418 A TW098120418 A TW 098120418A TW 98120418 A TW98120418 A TW 98120418A TW I449158 B TWI449158 B TW I449158B
- Authority
- TW
- Taiwan
- Prior art keywords
- circuit
- switch
- coupled
- power supply
- electrostatic discharge
- Prior art date
Links
Landscapes
- Semiconductor Integrated Circuits (AREA)
Description
本發明有關於具有多重電源區域積體電路之靜電放電防護電路,特別有關於在偵測到靜電放電訊號時,使內部電路和電源供應線或地線之間不導通的具有多重電源區域積體電路之靜電放電防護電路。The present invention relates to an electrostatic discharge protection circuit having multiple power supply area integrated circuits, and particularly relates to a multi-power supply area integrated body that does not conduct between an internal circuit and a power supply line or a ground line when an electrostatic discharge signal is detected. Electrostatic discharge protection circuit for circuits.
一般而言,積體電路內都會具有ESD(Electrostatic Discharge,靜電放電)防護機制,一般都是設立在輸入/輸出墊片和內部電路之間。然而一積體電路通常會具有多個電源區域(power domain),這些電源區域之間的介面亦可能會有ESD現象的產生。而在高速電路當中,電晶體的閘極氧化層(gate oxide)通常較薄,因此可能被ESD電流給打穿而造成電路的損壞。有些積體電路可能會在這些電源區域之間的訊號傳遞路徑上設置ESD防護元件,但這樣的元件往往會造成訊號的延遲而無法符合電路的高速需求。In general, the integrated circuit has an ESD (Electrostatic Discharge) protection mechanism, which is generally set between the input/output pad and the internal circuit. However, an integrated circuit usually has multiple power domains, and the interface between these power regions may also have an ESD phenomenon. In high-speed circuits, the gate oxide of the transistor is usually thin, so it may be broken by the ESD current and cause damage to the circuit. Some integrated circuits may place ESD protection components on the signal transmission path between these power supply areas, but such components tend to cause signal delays and fail to meet the high speed requirements of the circuit.
本發明之一目的為提供一種不同電源區域之電路的ESD防護機制。It is an object of the present invention to provide an ESD protection mechanism for circuits of different power supply areas.
本發明之另一目的為提供一種不位於訊號傳遞路徑上的的ESD防護機制。Another object of the present invention is to provide an ESD protection mechanism that is not located on the signal transmission path.
本發明之一實施例揭露了一種具有多重電源區域積體電路之靜電放電防護電路,包含:一ESD保護元件,耦接於一第一電源供應線和一第一地線之間;一第一內部電路,具有耦接於該第一電源供應線的一第一端;一第一開關,耦接於該第一內部電路的一第二端以及一第二地線之間;以及一第一ESD偵測電路,耦接於該第一開關,用以偵測一靜電放電訊號,並在該靜電放電訊號產生時,使該第一開關不導通。An embodiment of the present invention discloses an ESD protection circuit having a plurality of power supply area integrated circuits, including: an ESD protection component coupled between a first power supply line and a first ground line; An internal circuit having a first end coupled to the first power supply line; a first switch coupled between a second end of the first internal circuit and a second ground; and a first The ESD detection circuit is coupled to the first switch for detecting an electrostatic discharge signal, and the first switch is not turned on when the electrostatic discharge signal is generated.
本發明之另一實施例揭露了一種具有突發性電流防護機制的積體電路,包含:一第一欲保護電路,具有耦接於該第一電源供應線的一第一端;一第一開關,耦接於該第一欲保護電路的一第二端以及一第二地線之間;以及一第一突發性電流偵測電路,耦接於該第一開關,用以偵測一靜電放電訊號,並在該靜電放電訊號產生時,使該第一開關不導通。Another embodiment of the present invention discloses an integrated circuit having a sudden current protection mechanism, including: a first protection circuit having a first end coupled to the first power supply line; The switch is coupled between a second end of the first protection circuit and a second ground; and a first burst current detecting circuit is coupled to the first switch for detecting The electrostatic discharge signal, and when the electrostatic discharge signal is generated, the first switch is not turned on.
根據上述之實施例,可以對不同電源區域的電路提供ESD保護,而且保護元件不在訊號傳遞路徑上,因此可以避免訊號延遲的問題。According to the above embodiment, ESD protection can be provided to circuits of different power supply areas, and the protection elements are not on the signal transmission path, so that the problem of signal delay can be avoided.
在說明書及後續的申請專利範圍當中使用了某些詞彙來指稱特定的元件。所屬領域中具有通常知識者應可理解,硬體製造商可能會用不同的名詞來稱呼同一個元件。本說明書及後續的申請專利範圍並不以名稱的差異來作為區分元件的方式,而是以元件在功能上的差異來作為區分的準則。在通篇說明書及後續的請求項當中所提及的「包含」係為一開放式的用語,故應解釋成「包含但不限定於」。以外,「耦接」一詞在此係包含任何直接及間接的電氣連接手段。因此,若文中描述一第一裝置耦接於一第二裝置,則代表該第一裝置可直接電氣連接於該第二裝置,或透過其他裝置或連接手段間接地電氣連接至該第二裝置。此外,說明書中以及後續之申請專利範圍中所使用的第一裝置、第二裝置,並非表示其有先後次序之關係,僅表示其為不同之裝置。Certain terms are used throughout the description and following claims to refer to particular elements. Those of ordinary skill in the art should understand that a hardware manufacturer may refer to the same component by a different noun. The scope of this specification and the subsequent patent application do not use the difference of the names as the means for distinguishing the elements, but the difference in function of the elements as the criterion for distinguishing. The term "including" as used throughout the specification and subsequent claims is an open term and should be interpreted as "including but not limited to". In addition, the term "coupled" is used herein to include any direct and indirect electrical connection. Therefore, if a first device is coupled to a second device, it means that the first device can be directly electrically connected to the second device or indirectly electrically connected to the second device through other devices or connection means. In addition, the first device and the second device used in the specification and the following claims are not to be in a prioritized relationship, but merely indicate that they are different devices.
第1圖至第4圖分別繪示了根據本發明之實施例的具有多重電源區域積體電路之靜電放電防護電路100之電路圖。如第1a圖所示,具有多重電源區域積體電路之靜電放電防護電路100包含:一ESD保護元件101、一第一內部電路103(亦即一欲保護電路)、一第一開關105(如圖標示為開關1)、一第一ESD偵測電路107(如圖標示為ESD偵測電路1)、一第二開關109(如圖標示為開關2)以及一第二ESD偵測電路111(如圖標示為ESD偵測電路2)。其中,第一內部電路103耦接於第一電源供應線Vcc1與第二地線GND2之間,可視為一個電源區域;第二內部電路115耦接於第二電源供應線Vcc2與第一地線GND1之間,可視為另一個電源區域。ESD保護元件101耦接於第一電源供應線Vcc1和一第一地線GND1之間。第一內部電路103具有耦接於該第一電源供應線Vcc1的一第一端。第一開關105耦接於第一內部電路103的一第二端以及一第二地線GND2之間。第一ESD偵測電路107耦接於第一開關105,用以偵測一靜電放電訊號(例如一突發性的大電壓或一突發性大電流),並在該靜電放電訊號產生時,使第一開關105不導通。同樣的,第二開關109耦接於第一內部電路103與第一電源線Vcc1之間,第二ESD偵測電路111則耦接於第二開關109,用以偵測一靜電放電訊號(例如一突發性電壓或一突發性電流)並輸出一ESD通知訊號ES,並在靜電放電訊號產生時,使第二開關109不導通。藉由此種做法,可以避免ESD電流經延遲元件113(可為訊號線本身之寄生電阻,或配合電路運作速度需求而外加之電阻)流到第二內部電路115流而打穿第二內部電路115之電晶體的閘極氧化層。而且,由於第一開關105、第二開關109、第一ESD偵測電路107以及第二ESD偵測電路111皆未在訊號傳遞路線上(也就是第一內部電路103與第二內部電路115這兩個電源區域間的訊號介面),因此可改善習知技術中訊號會被延遲的問題。1 to 4 are circuit diagrams respectively showing an ESD protection circuit 100 having multiple power supply area integrated circuits in accordance with an embodiment of the present invention. As shown in FIG. 1a, the ESD protection circuit 100 having multiple power supply area integrated circuits includes: an ESD protection component 101, a first internal circuit 103 (ie, a protection circuit), and a first switch 105 (eg, The figure is labeled as switch 1), a first ESD detecting circuit 107 (shown as ESD detecting circuit 1), a second switch 109 (shown as switch 2) and a second ESD detecting circuit 111 ( As shown in the figure, the ESD detection circuit 2). The first internal circuit 103 is coupled between the first power supply line Vcc1 and the second ground line GND2, and can be regarded as a power supply area. The second internal circuit 115 is coupled to the second power supply line Vcc2 and the first ground. Between GND1, it can be regarded as another power supply area. The ESD protection component 101 is coupled between the first power supply line Vcc1 and a first ground line GND1. The first internal circuit 103 has a first end coupled to the first power supply line Vcc1. The first switch 105 is coupled between a second end of the first internal circuit 103 and a second ground line GND2. The first ESD detecting circuit 107 is coupled to the first switch 105 for detecting an electrostatic discharge signal (for example, a sudden large voltage or a sudden large current), and when the electrostatic discharge signal is generated, The first switch 105 is rendered non-conductive. Similarly, the second switch 109 is coupled between the first internal circuit 103 and the first power line Vcc1, and the second ESD detecting circuit 111 is coupled to the second switch 109 for detecting an electrostatic discharge signal (for example, A burst voltage or a sudden current) outputs an ESD notification signal ES, and causes the second switch 109 to be non-conductive when the electrostatic discharge signal is generated. By doing so, it is possible to prevent the ESD current from flowing through the delay element 113 (which may be the parasitic resistance of the signal line itself or the resistance added to the operation speed of the circuit) to the second internal circuit 115 to penetrate the second internal circuit. The gate oxide layer of the 115 transistor. Moreover, since the first switch 105, the second switch 109, the first ESD detecting circuit 107, and the second ESD detecting circuit 111 are not on the signal transmission path (that is, the first internal circuit 103 and the second internal circuit 115) The signal interface between the two power zones can therefore improve the delay in the signal in the prior art.
第1b圖所示的具有多重電源區域積體電路之靜電放電防護電路120之結構和元件大致上和第1圖中的a圖所示的具有多重電源區域積體電路之靜電放電防護電路相同,其不同之處在於第1b圖所示的第二ESD偵測電路111被省略,而第1b圖所示的具有多重電源區域積體電路之靜電放電防護電路使用第一ESD偵測電路107來同時控制第一開關105和第二開關109。因此第一ESD偵測電路107在感測到ESD訊號時,會同時使第一開關105和第二開關109不導通,以避免ESD電流流到第二內部電路115流經延遲元件113(此例中為一電阻)而打穿第二內部電路115之電晶體的閘極氧化層。其他詳細技術特徵已揭露於第1b圖,故在此不再贅述。在上述的實施例中,第一內部電路101都具有一PMOS 102和一NMOS 104。The structure and components of the ESD protection circuit 120 having the multi-power supply area integrated circuit shown in FIG. 1b are substantially the same as the ESD protection circuit having the multi-power supply area integrated circuit shown in FIG. The difference is that the second ESD detecting circuit 111 shown in FIG. 1b is omitted, and the electrostatic discharge protection circuit having the multiple power supply area integrated circuit shown in FIG. 1b uses the first ESD detecting circuit 107 to simultaneously The first switch 105 and the second switch 109 are controlled. Therefore, when the ESD detecting circuit 107 senses the ESD signal, the first switch 105 and the second switch 109 are simultaneously turned off to prevent the ESD current from flowing to the second internal circuit 115 and flowing through the delay element 113 (this example). The gate oxide layer of the transistor of the second internal circuit 115 is penetrated by a resistor. Other detailed technical features have been disclosed in FIG. 1b, and therefore will not be described again here. In the above embodiment, the first internal circuit 101 has a PMOS 102 and an NMOS 104.
第2a圖所示之具有多重電源區域積體電路之靜電放電防護電路200具有和第1a圖所示之具有多重電源區域積體電路之靜電放電防護電路100相同的元件。且具有多重電源區域積體電路之靜電放電防護電路200中的第一內部電路201和具有多重電源區域積體電路之靜電放電防護電路100中的第一內部電路101一樣具有一PMOS 202和NMOS 204。其不同之處在於,第2a圖中的NMOS 204之基底係直接連接至第二地線GND2,而第1a圖中的NMOS 104之基底係直接連接至NMOS 104的源極和第一開關105。若欲使用第1a圖中的結構,則可使用具有深層N型佈植層(Deep N Well)之NMOS來施行NMOS 104。The electrostatic discharge protection circuit 200 having the multiple power supply area integrated circuit shown in Fig. 2a has the same elements as the electrostatic discharge protection circuit 100 having the multiple power supply area integrated circuit shown in Fig. 1a. The first internal circuit 201 in the ESD protection circuit 200 having multiple power supply area integrated circuits has a PMOS 202 and an NMOS 204 like the first internal circuit 101 in the ESD protection circuit 100 having multiple power supply area integrated circuits. . The difference is that the base of the NMOS 204 in FIG. 2a is directly connected to the second ground GND2, and the base of the NMOS 104 in FIG. 1a is directly connected to the source of the NMOS 104 and the first switch 105. If the structure in Figure 1a is to be used, the NMOS 104 can be implemented using an NMOS having a deep N-type implant layer (Deep N Well).
同樣的,第2b圖所示之具有多重電源區域積體電路之靜電放電防護電路220具有和第1b圖所示之具有多重電源區域積體電路之靜電放電防護電路120相同的元件。且具有多重電源區域積體電路之靜電放電防護電路220中的第一內部電路203和具有多重電源區域積體電路之靜電放電防護電路120中的第一內部電路103一樣具有一PMOS 206和NMOS 208。其不同之處在於,第2b圖中的NMOS 208之基底係直接連接至第二地線GND2,而第1b圖中的NMOS 104之基底係直接連接至NMOS 104的源極和第一開關105。Similarly, the electrostatic discharge protection circuit 220 having the multiple power supply area integrated circuit shown in Fig. 2b has the same elements as the electrostatic discharge protection circuit 120 having the multiple power supply area integrated circuit shown in Fig. 1b. The first internal circuit 203 of the ESD protection circuit 220 having multiple power supply area integrated circuits has a PMOS 206 and an NMOS 208 like the first internal circuit 103 of the ESD protection circuit 120 having multiple power supply area integrated circuits. . The difference is that the base of the NMOS 208 in FIG. 2b is directly connected to the second ground GND2, and the base of the NMOS 104 in FIG. 1b is directly connected to the source of the NMOS 104 and the first switch 105.
在第3圖所示的實施例中,每一個電源區域的內部電路使用單一開關以及單一ESD偵測電路來作為防護。如第3a圖所示,ESD防護機制的積體電路300包含:ESD保護元件301、內部電路303、開關305以及ESD偵測電路307。同樣的,ESD偵測電路307耦接於開關305,用以偵測一靜電放電訊號(例如一突發性的大電壓或一突發性大電流),並在靜電放電訊號產生時,使開關305不導通。在第3a圖所示的實施例中,內部電路309和內部電路303屬於不同電源區域,但亦具有相對應的ESD保護元件311、開關313以及ESD偵測電路315,且其動作方式也和內部電路303相同。In the embodiment shown in Figure 3, the internal circuitry of each power region uses a single switch and a single ESD detection circuit as protection. As shown in FIG. 3a, the integrated circuit 300 of the ESD protection mechanism includes an ESD protection component 301, an internal circuit 303, a switch 305, and an ESD detection circuit 307. Similarly, the ESD detection circuit 307 is coupled to the switch 305 for detecting an electrostatic discharge signal (eg, a sudden large voltage or a sudden large current), and causing the switch to be generated when the electrostatic discharge signal is generated. 305 does not conduct. In the embodiment shown in FIG. 3a, the internal circuit 309 and the internal circuit 303 belong to different power supply areas, but also have corresponding ESD protection elements 311, switches 313, and ESD detection circuits 315, and their operation modes are also internal. Circuit 303 is the same.
第3b圖所示之具有多重電源區域積體電路之靜電放電防護電路320具有和第3a圖所示之具有多重電源區域積體電路之靜電放電防護電路300相同的元件。且具有多重電源區域積體電路之靜電放電防護電路320中的第一內部電路317和具有多重電源區域積體電路之靜電放電防護電路300中的第一內部電路303一樣具有一PMOS 306和NMOS 308。其不同之處在於,第3b圖中的NMOS 308之基底係直接連接至第二地線GND2,而第3a圖中的NMOS 304之基底係直接連接至NMOS 304的源極和第一開關305。The electrostatic discharge protection circuit 320 having the multiple power supply area integrated circuit shown in Fig. 3b has the same elements as the electrostatic discharge protection circuit 300 having the multiple power supply area integrated circuit shown in Fig. 3a. The first internal circuit 317 of the ESD protection circuit 320 having multiple power supply area integrated circuits has a PMOS 306 and an NMOS 308 like the first internal circuit 303 of the ESD protection circuit 300 having multiple power supply area integrated circuits. . The difference is that the base of the NMOS 308 in FIG. 3b is directly connected to the second ground GND2, and the base of the NMOS 304 in FIG. 3a is directly connected to the source of the NMOS 304 and the first switch 305.
在第4圖所示的實施例中,多個內部電路可以共用一組保護電路,這組保護電路包含兩開關以及一ESD偵測電路。如第4圖所示,內部電路401和403(此兩內部電路可以是同一電源區域之內部電路)共用開關405、開關407以及ESD偵測電路409,因此只要一組保護電路便可同時防止ESD電流流到內部電路411和413。In the embodiment shown in FIG. 4, a plurality of internal circuits can share a set of protection circuits, and the set of protection circuits includes two switches and an ESD detection circuit. As shown in FIG. 4, the internal circuits 401 and 403 (the internal circuits of the two internal circuits may be internal circuits of the same power supply area) share the switch 405, the switch 407, and the ESD detecting circuit 409, so that a set of protection circuits can simultaneously prevent ESD. Current flows to internal circuits 411 and 413.
第5圖繪示了第1圖至第4圖所示之電路的開關之示範性詳細結構。在第5a圖中係使用一NMOS 501來做為開關,NMOS 501之基底耦接至地線,而其閘極接收來自ESD偵測電路的ESD通知訊號ES而導通或不導通。在第5b圖中係使用一PMOS 503來做為開關,PMOS 503之基底耦接至地線,而其閘極接收來自ESD偵測電路的ESD通知訊號ES而導通或不導通。Fig. 5 is a diagram showing an exemplary detailed structure of the switches of the circuits shown in Figs. 1 to 4. In Figure 5a, an NMOS 501 is used as a switch. The base of the NMOS 501 is coupled to the ground and its gate receives the ESD notification signal ES from the ESD detection circuit to be turned on or off. In Figure 5b, a PMOS 503 is used as the switch. The base of the PMOS 503 is coupled to the ground and its gate receives the ESD notification signal ES from the ESD detection circuit to be turned on or off.
第6圖繪示了第1圖至第4圖所示之電路的ESD偵測電路600之示範性詳細結構。如第6圖所示,ESD偵測電路600具有一第一阻抗元件601、一第二阻抗元件603以及一反相器605。反相器605的輸入端耦接至第5圖所示的NMOS 501,而反相器605的輸出端耦接至第5圖所示的PMOS 503。第一阻抗元件601和第二阻抗元件603可由二極體、電容和電阻等來施行。Fig. 6 is a diagram showing an exemplary detailed structure of the ESD detecting circuit 600 of the circuits shown in Figs. 1 to 4. As shown in FIG. 6, the ESD detecting circuit 600 has a first impedance element 601, a second impedance element 603, and an inverter 605. The input of the inverter 605 is coupled to the NMOS 501 shown in FIG. 5, and the output of the inverter 605 is coupled to the PMOS 503 shown in FIG. The first impedance element 601 and the second impedance element 603 can be implemented by a diode, a capacitor, a resistor, or the like.
第7圖繪示了使用第5-6圖所示之結構的具有多重電源區域積體電路之靜電放電防護電路700之電路圖。如第7圖所示,具有多重電源區域積體電路之靜電放電防護電路700具有一內部電路701、一第一開關703、一第二開關705以及一ESD偵測電路707。在此實施例中,第一開關703係為一NMOS、第二開關705包含一PMOS 711以及一反相器713,而ESD偵測電路707包含一電阻715以及一電容717。正常狀態下電源Vcc2可以對電容717正常充電,因此接點A會保持在高位準狀態,第一開關703以及第二開關705會保持導通的狀況。而在ESD產生時,電容717無法正常充電,因此接點A會保持在低位準狀態,第一開關703以及第二開關705會變成不導通的狀況。須注意的是,第7圖所示之結構僅用以舉例,並非用以限定本發明,熟知此項技藝者當可任意更改電路結構而得到相同的結果。Fig. 7 is a circuit diagram showing an electrostatic discharge protection circuit 700 having a multi-power supply area integrated circuit using the structure shown in Figs. 5-6. As shown in FIG. 7, the ESD protection circuit 700 having multiple power supply area integrated circuits has an internal circuit 701, a first switch 703, a second switch 705, and an ESD detection circuit 707. In this embodiment, the first switch 703 is an NMOS, the second switch 705 includes a PMOS 711 and an inverter 713, and the ESD detecting circuit 707 includes a resistor 715 and a capacitor 717. In the normal state, the power supply Vcc2 can normally charge the capacitor 717, so the contact A will remain in the high level state, and the first switch 703 and the second switch 705 will remain in the on state. When the ESD is generated, the capacitor 717 cannot be normally charged, so the contact A will remain in the low level state, and the first switch 703 and the second switch 705 will become non-conductive. It should be noted that the structure shown in FIG. 7 is for example only and is not intended to limit the present invention, and those skilled in the art can obtain the same result when the circuit structure can be arbitrarily changed.
根據上述之實施例,可以對不同電源區域的電路提供ESD保護,而且保護元件不在訊號傳遞路徑上,因此可以避免訊號延遲的問題。According to the above embodiment, ESD protection can be provided to circuits of different power supply areas, and the protection elements are not on the signal transmission path, so that the problem of signal delay can be avoided.
以上所述僅為本發明之較佳實施例,凡依本發明申請專利範圍所做之均等變化與修飾,皆應屬本發明之涵蓋範圍。The above are only the preferred embodiments of the present invention, and all changes and modifications made to the scope of the present invention should be within the scope of the present invention.
100、120...具有多重電源區域積體電路之靜電放電防護電路100, 120. . . Electrostatic discharge protection circuit with multiple power supply area integrated circuits
101、301、311...ESD保護元件101, 301, 311. . . ESD protection component
103、201、203...第一內部電路103, 201, 203. . . First internal circuit
105、703...第一開關105, 703. . . First switch
107...第一ESD偵測電路107. . . First ESD detection circuit
109、705...第二開關109, 705. . . Second switch
111...第二ESD偵測電路111. . . Second ESD detection circuit
113...延遲元件113. . . Delay element
115...第二內部電路115. . . Second internal circuit
202、206、302、306、503、711...PMOS202, 206, 302, 306, 503, 711. . . PMOS
204、208、304、308、501...NMOS204, 208, 304, 308, 501. . . NMOS
303、309、317、401、403、411、413、701‧‧‧內部電路303, 309, 317, 401, 403, 411, 413, 701‧‧‧ internal circuits
305、313、405、407‧‧‧開關305, 313, 405, 407‧‧ ‧ switch
301、311‧‧‧ESD保護元件301, 311‧‧‧ ESD protection components
307、315、409、600、707‧‧‧ESD偵測電路307, 315, 409, 600, 707‧‧ ESD detection circuit
601‧‧‧第一阻抗元件601‧‧‧First impedance element
603‧‧‧第二阻抗元件603‧‧‧second impedance element
605、713‧‧‧反相器605, 713‧‧ ‧Inverter
715‧‧‧電阻715‧‧‧resistance
717‧‧‧電容717‧‧‧ Capacitance
第1a、1b、2a、2b、3a、3b圖以及第4圖分別繪示了根據本發明之實施例的具有多重電源區域積體電路之靜電放電防護電路之電路圖。1a, 1b, 2a, 2b, 3a, 3b, and 4 are circuit diagrams respectively showing an ESD protection circuit having multiple power supply area integrated circuits in accordance with an embodiment of the present invention.
第5圖繪示了第1a、1b、2a、2b、3a、3b圖以及第4圖所示之電路的開關之示範性詳細結構。Fig. 5 is a diagram showing an exemplary detailed structure of switches of the circuits 1a, 1b, 2a, 2b, 3a, 3b and 4th.
第6圖繪示了第1a、1b、2a、2b、3a、3b圖以及第4圖所示之電路的ESD偵測電路之示範性詳細結構。Fig. 6 is a diagram showing an exemplary detailed structure of the ESD detecting circuit of the circuits 1a, 1b, 2a, 2b, 3a, 3b and 4th.
第7圖繪示了使用第5-6圖所示之結構的具有多重電源區域積體電路之靜電放電防護電路之電路圖。Fig. 7 is a circuit diagram showing an electrostatic discharge protection circuit having a multi-power supply area integrated circuit using the structure shown in Figs. 5-6.
100、120...具有多重電源區域積體電路之靜電放電防護電路100, 120. . . Electrostatic discharge protection circuit with multiple power supply area integrated circuits
101...ESD保護元件101. . . ESD protection component
103...第一內部電路103. . . First internal circuit
105...第一開關105. . . First switch
107...第一ESD偵測電路107. . . First ESD detection circuit
109...第二開關109. . . Second switch
111...第二ESD偵測電路111. . . Second ESD detection circuit
113...延遲元件113. . . Delay element
115...第二內部電路115. . . Second internal circuit
Claims (14)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW098120418A TWI449158B (en) | 2009-06-18 | 2009-06-18 | Esd protection circuit for integrated circuit with multiple power domain |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW098120418A TWI449158B (en) | 2009-06-18 | 2009-06-18 | Esd protection circuit for integrated circuit with multiple power domain |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201101460A TW201101460A (en) | 2011-01-01 |
TWI449158B true TWI449158B (en) | 2014-08-11 |
Family
ID=44837023
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW098120418A TWI449158B (en) | 2009-06-18 | 2009-06-18 | Esd protection circuit for integrated circuit with multiple power domain |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI449158B (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI604676B (en) * | 2016-10-05 | 2017-11-01 | 瑞昱半導體股份有限公司 | Electrostatic discharge protection circuit across the power domain |
TWI604677B (en) * | 2016-10-05 | 2017-11-01 | 瑞昱半導體股份有限公司 | Electrostatic discharge protection circuit across the power domain |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW200513001A (en) * | 2003-09-23 | 2005-04-01 | Benq Corp | Protecting circuit and peripheral apparatus with protecting circuit and application |
US20050098830A1 (en) * | 2003-11-07 | 2005-05-12 | Atsushi Honjoh | Semiconductor device including a protection circuit |
TW200908276A (en) * | 2007-08-14 | 2009-02-16 | Winbond Electronics Corp | Electrostatic discharge protection circuit |
-
2009
- 2009-06-18 TW TW098120418A patent/TWI449158B/en active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW200513001A (en) * | 2003-09-23 | 2005-04-01 | Benq Corp | Protecting circuit and peripheral apparatus with protecting circuit and application |
US20050098830A1 (en) * | 2003-11-07 | 2005-05-12 | Atsushi Honjoh | Semiconductor device including a protection circuit |
TW200908276A (en) * | 2007-08-14 | 2009-02-16 | Winbond Electronics Corp | Electrostatic discharge protection circuit |
Also Published As
Publication number | Publication date |
---|---|
TW201101460A (en) | 2011-01-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5946175A (en) | Secondary ESD/EOS protection circuit | |
CN103715672B (en) | The clamp approaches of clamp circuit, semiconductor device and semiconductor device | |
CN108028251B (en) | Electrostatic discharge protection device and circuit device | |
US8339757B2 (en) | Electrostatic discharge circuit for integrated circuit with multiple power domain | |
US8810982B2 (en) | Semiconductor integrated circuit and protection circuit | |
US8139330B2 (en) | Semiconductor integrated circuit | |
US7889469B2 (en) | Electrostatic discharge protection circuit for protecting semiconductor device | |
CN101436592A (en) | semiconductor integrated circuit | |
US7274546B2 (en) | Apparatus and method for improved triggering and leakage current control of ESD clamping devices | |
US10158225B2 (en) | ESD protection system utilizing gate-floating scheme and control circuit thereof | |
US20100271736A1 (en) | Protecting lower voltage domain devices during operation in a higher voltage domain | |
US5894230A (en) | Modified keeper half-latch receiver circuit | |
CN102204054B (en) | Low voltage electrostatic discharge protection | |
US20080198520A1 (en) | Electrostatic discharge protection circuit with lowered driving voltage | |
CN104867922A (en) | Semiconductor Integrated Circuit Device, And Electronic Appliance Using The Same | |
US10454269B2 (en) | Dynamically triggered electrostatic discharge cell | |
CN101938118A (en) | Electrostatic discharge protection circuit with multiple power supply area integrated circuit | |
TWI449158B (en) | Esd protection circuit for integrated circuit with multiple power domain | |
JP6405986B2 (en) | Electrostatic protection circuit and semiconductor integrated circuit device | |
CN100568659C (en) | Electrostatic discharge protection circuit | |
JP2005093496A (en) | Semiconductor integrated circuit device | |
CN107947139B (en) | Electrostatic discharge protection circuit across power domains | |
JP5082841B2 (en) | Semiconductor device | |
KR20220108490A (en) | Electrostatic discharge protection circuit | |
JP2009284463A (en) | Auto-detecting input circuit for single-voltage-supply cmos |