TWI447741B - Dynamic random access memory unit and data refreshing method thereof - Google Patents

Dynamic random access memory unit and data refreshing method thereof Download PDF

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TWI447741B
TWI447741B TW099125146A TW99125146A TWI447741B TW I447741 B TWI447741 B TW I447741B TW 099125146 A TW099125146 A TW 099125146A TW 99125146 A TW99125146 A TW 99125146A TW I447741 B TWI447741 B TW I447741B
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word line
line address
address
update
memory
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TW201205595A (en
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Kuen Huei Chang
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Winbond Electronics Corp
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動態隨機存取記憶體單元及其資料更新方法Dynamic random access memory unit and data updating method thereof

本發明是有關於一種動態隨機存取記憶體(Dynamic Random Access Memory,簡稱DRAM)之半導體記憶元件技術,且特別是有關於一種於指定字元線位址區間的記憶胞進行更新(refresh)操作的半導體記憶元件技術,藉以減少電能消耗。The present invention relates to a semiconductor random access memory (DRAM) semiconductor memory device technology, and in particular to a memory cell in a specified word line address interval for refresh operation (refresh operation) Semiconductor memory component technology to reduce power consumption.

動態隨機存取記憶體(DRAM)是利用電容內儲存電荷的多寡來代表一個二進位位元的"1"或"0",因此DRAM的每個記憶胞僅需一個電容及一個開關(或是電晶體)即可。Dynamic Random Access Memory (DRAM) uses the amount of charge stored in a capacitor to represent a binary bit "1" or "0", so each memory cell of the DRAM requires only one capacitor and one switch (or The transistor can be used.

實際操作時,DRAM中的電容會有漏電現象,而導致電容的電位差不足,使得DRAM所儲存的資料消失,因此DRAM必須進入更新(refresh)模式以對全部的記憶胞周期性地進行更新(亦可稱為資料充電/資料刷新)操作,確保DRAM中儲存資訊的正確性。如圖1與圖2所示,圖1是習知動態隨機存取記憶體單元10的方塊圖,圖2是習知動態隨機存取記憶體單元10的資料更新方法之訊號波形圖。請參照圖1,動態隨機存取記憶體單元10包括記憶體陣列110、更新時脈單元120及字元線位址計數器130。記憶體陣列110包括多條字元線(word line)與多條位元線(bit line),這些字元線與位元線相互垂直交叉,每個交叉點皆具備一個記憶胞,藉以儲存一個二進位(亦即"0"或"1")的位元資訊。In actual operation, the capacitance in the DRAM may leak, and the potential difference of the capacitor is insufficient, so that the data stored in the DRAM disappears. Therefore, the DRAM must enter a refresh mode to periodically update all the memory cells (also It can be called data charging/data refreshing operation to ensure the correctness of information stored in DRAM. 1 and FIG. 2, FIG. 1 is a block diagram of a conventional dynamic random access memory unit 10, and FIG. 2 is a signal waveform diagram of a data updating method of the conventional dynamic random access memory unit 10. Referring to FIG. 1, the DRAM memory unit 10 includes a memory array 110, an update clock unit 120, and a word line address counter 130. The memory array 110 includes a plurality of word lines and a plurality of bit lines. The word lines and the bit lines vertically intersect each other, and each of the intersections has a memory cell to store one bit. Bit information for binary (ie "0" or "1").

更新時脈單元120接收一進入(entry)更新訊號Sref ,藉以得知DRAM單元10是否位於更新模式中。於更新模式時,更新時脈單元120產生更新時脈訊號Sclk (請參照圖2),字元線位址計數器130藉由更新時脈訊號Sclk 來循環計算字元線位址WL。於本實施例中,更新時脈訊號Sclk 的每個脈衝間距為8μs,藉以避免更新週期過長而讓記憶體陣列110中之儲存資料錯誤。此外,記憶體陣列的字元線位址WL則由三位數的16進位數字組成,記憶體陣列110的字元線位址WL區間則由000H 至FFFH ,因此字元線位址計數器130由000H 依序計數至FFFH 後便重新由000H 開始計數。記憶體陣列110於更新模式中持續接收更新時脈訊號Sclk 及字元線位址WL,以週期性地將記憶體陣列110內之所有的記憶胞進行更新。但是在應用DRAM時,並非所有的記憶胞皆具儲存資訊,因此在對未具備儲存資訊的記憶胞進行充電/更新時,將會造成多餘的電荷消耗。The update clock unit 120 receives an entry update signal S ref to know if the DRAM unit 10 is in the update mode. In the update mode, the update clock unit 120 generates an update clock signal S clk (refer to FIG. 2 ), and the word line address counter 130 cyclically calculates the word line address WL by updating the clock signal S clk . In this embodiment, each pulse interval of the update clock signal S clk is 8 μs, so that the stored data in the memory array 110 is incorrect by avoiding the update period being too long. In addition, the word line address WL of the memory array is composed of three-digit hexadecimal digits, and the word line address WL interval of the memory array 110 is from 000 H to FFF H , so the word line address counter 130 is counted from 000 H to FFF H and then counted again from 000 H. The memory array 110 continuously receives the updated clock signal S clk and the word line address WL in the update mode to periodically update all of the memory cells in the memory array 110. However, when DRAM is applied, not all memory cells have stored information, so when charging/updating a memory cell that does not have stored information, it will cause excessive charge consumption.

藉此,便衍生出多種DRAM的更新技術以降低DRAM在更新模式時的耗電量。於美國專利第6,590,822號中揭露一種可自我更新(self-refresh)的記憶裝置,此記憶裝置利用電腦系統產生的更新指令訊號來遮蔽(mask)字元線位址資料中的一個或多個位元,預先提供部份(例如1/2、1/4、1/8或1/16等)的RAM記憶體區塊來儲存資料與進行更新操作,其他的記憶體區塊則關閉(disable)且不需使用,藉以減少耗電。然而,上述記憶裝置僅能對記憶體容量的固定倍率(如:1/2、1/4、1/8等)來儲存資料,過大的記憶體容量會在刷新資料時耗費多餘電能於未儲存資料的記憶體區塊中,但是過小的記憶體容量則不符電腦系統使用。上述的記憶裝置無法讓電腦系統詳細地指定出其所需使用的記憶體容量,因而降低電腦系統對於DRAM的應用自由度。In this way, a variety of DRAM update technologies are derived to reduce the power consumption of the DRAM in the update mode. A self-refresh memory device is disclosed in U.S. Patent No. 6,590,822, which utilizes an update command signal generated by a computer system to mask one or more bits in a word line address data. In advance, some RAM memory blocks (such as 1/2, 1/4, 1/8, or 1/16, etc.) are provided in advance to store data and update operations, and other memory blocks are disabled. And no need to use, in order to reduce power consumption. However, the above memory device can only store data at a fixed rate of memory capacity (eg, 1/2, 1/4, 1/8, etc.), and an excessive memory capacity consumes excess power when not refreshing data. The memory block of the data, but the memory capacity that is too small does not match the computer system. The above-mentioned memory device cannot allow the computer system to specify the memory capacity that it needs to use in detail, thereby reducing the degree of freedom of application of the computer system to the DRAM.

本發明提供一種動態隨機存取記憶體單元,其在更新模式時對指定之字元線位址區間對應的記憶胞進行更新,而停止更新位於指定字元線位址區間外的記憶胞,藉以於更新模式中減少電能的消耗。The present invention provides a dynamic random access memory unit that updates a memory cell corresponding to a specified word line address interval in an update mode, and stops updating a memory cell located outside a specified word line address interval, thereby Reduce power consumption in the update mode.

於另一角度而言,本發明提供一種動態隨機存取記憶體單元的資料更新方法,其在更新模式時將指定字元線位址區間的記憶胞進行更新,並停止更新位於指定字元線位址區間外的記憶胞,藉以減少電能消耗。In another aspect, the present invention provides a data update method for a dynamic random access memory unit, which updates a memory cell of a specified word line address interval and stops updating at a specified word line when updating a mode. Memory cells outside the address range to reduce power consumption.

本發明提出一種動態隨機存取記憶體單元,包括記憶體陣列、更新位址模組及更新控制模組。記憶體陣列包括多個記憶胞,而更新位址模組於更新模式時將循環產生一更新字元線位址。更新控制模組耦接至記憶體陣列與更新位址模組,並且更新控制模組首先取得起始字元線位址與對應之結束字元線位址,其中,這些起始字元線位址與對應之結束字元線位址可形成記憶體字元線位址區間。更新控制模組判斷上述更新字元線位址是否位於記憶體字元線位址區間內,若更新字元線位址位於記憶體字元線位址區間內,便對更新字元線位址所對應的記憶胞進行資料充電操作,否則便停止資料充電操作。The invention provides a dynamic random access memory unit, which comprises a memory array, an update address module and an update control module. The memory array includes a plurality of memory cells, and the update address module loops to generate an updated word line address in the update mode. The update control module is coupled to the memory array and the update address module, and the update control module first obtains a start word line address and a corresponding end word line address, wherein the start word line positions The address and the corresponding end word line address may form a memory word line address interval. The update control module determines whether the updated word line address is located in the memory word line address range, and if the updated word line address is located in the memory word line address range, the updated word line address is updated. The corresponding memory cell performs a data charging operation, otherwise the data charging operation is stopped.

以另一個觀點而言,本發明提供一種動態隨機存取記憶體單元的資料更新方法,而此動態隨機存取記憶體單元包括具有多個記憶胞的記憶體陣列,且動態隨機存取記憶體單元的資料更新方法包括下列步驟。取得起始字元線位址與對應的結束字元線位址,這些起始字元線位址與對應的結束字元線位址可形成記憶體字元線位址區間。並且,於更新模式時提供一更新位址模組,此更新位址模組循環產生更新字元線位址。以及,判斷上述更新字元線位址位於記憶體字元線位址區間,以對更新字元線位址所對應的記憶胞進行資料充電操作,否則便停止資料充電操作。In another aspect, the present invention provides a data update method for a dynamic random access memory cell, wherein the dynamic random access memory cell includes a memory array having a plurality of memory cells, and the dynamic random access memory The unit data update method includes the following steps. The start word line address and the corresponding end word line address are obtained, and the start word line address and the corresponding end word line address may form a memory word line address interval. Moreover, an update address module is provided in the update mode, and the update address module cyclically generates an update word line address. And determining that the updated word line address is located in the memory word line address interval to perform a data charging operation on the memory cell corresponding to the updated word line address, otherwise the data charging operation is stopped.

基於上述,本發明的實施例利用電腦系統的指令或者DRAM自行偵測具備資料之記憶胞的結果,來取得字元線位址區間。接著在更新模式時,更新控制模組判斷更新字元線位址是否在上述字元線位址區間內,藉以將字元線位址區間內的記憶胞進行更新動作,而停止更新位於字元線位址區間外的記憶胞,進而減少DRAM在更新模式的電能消耗。此外,本實施例亦可以藉由判斷DRAM中的記憶胞是否已儲存資訊來取得多個的字元線位址區間,藉以達成只需更新具備資料的記憶胞之目的。Based on the above, the embodiment of the present invention uses the instructions of the computer system or the DRAM to self-detect the result of the memory cell with the data to obtain the word line address interval. Then, in the update mode, the update control module determines whether the updated word line address is in the word line address interval, so that the memory cell in the word line address interval is updated, and the update is located in the character. The memory cells outside the line address interval, thereby reducing the power consumption of the DRAM in the update mode. In addition, in this embodiment, a plurality of word line address intervals can be obtained by determining whether the memory cells in the DRAM have stored information, thereby achieving the purpose of updating only the memory cells having the data.

為讓本發明之上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。The above described features and advantages of the present invention will be more apparent from the following description.

請參照圖3,圖3是依照本發明一實施例所述之一種動態隨機存取記憶體(DRAM)單元30的方塊圖。DRAM單元30包括記憶體陣列110、更新位址模組310及更新控制模組320。本實施例之記憶體陣列110具有多個記憶胞,其架構如圖4所示,圖4是依照本發明一實施例所述之記憶體陣列110的方塊圖。Please refer to FIG. 3. FIG. 3 is a block diagram of a dynamic random access memory (DRAM) unit 30 according to an embodiment of the invention. The DRAM unit 30 includes a memory array 110, an update address module 310, and an update control module 320. The memory array 110 of the present embodiment has a plurality of memory cells, the architecture of which is shown in FIG. 4. FIG. 4 is a block diagram of the memory array 110 according to an embodiment of the invention.

請參照圖4,記憶體陣列110於本實施例中包括記憶體區塊410、字元線解碼器420及訊號比較器模組430。記憶體區塊410包括字元線WL1~WLN與位元線BL1~BLM,其中N為字元線WL1~WLN的總數,M則為每一字元線WL1~WLN所對應的記憶胞個數。字元線WL1~WLN與位元線BL1~BLM相互垂直交叉,而每個交叉點皆具備一個記憶胞(未繪示),藉以儲存一個二進位(亦即"0"或"1")的位元資訊,記憶體陣列110可依據其中一條字元線WL1~WLN來選擇相對應的M位元(M-bit)資料以進行存入/取出/更新等動作。字元線解碼器420接收並對字元線位址WL進行解碼,以取得對應字元線位址WL的字元線WL1~WLN其中之一。訊號比較器模組430於更新模式時可接收更新時脈訊號Sclk 與時脈致能訊號Sen ,以將字元線位址WL所選擇的M個記憶胞進行儲存資訊的比較及資訊充電動作。Referring to FIG. 4, the memory array 110 includes a memory block 410, a word line decoder 420, and a signal comparator module 430 in this embodiment. The memory block 410 includes word lines WL1 WLWLN and bit lines BL1 BBLM, where N is the total number of word lines WL1 WL WLN, and M is the number of memory cells corresponding to each word line WL1 WL WLN. . The word lines WL1 WL WLN and the bit lines BL1 BBLM intersect perpendicularly to each other, and each intersection has a memory cell (not shown) for storing a binary bit (ie, "0" or "1"). For the bit information, the memory array 110 can select the corresponding M-bit data according to one of the word lines WL1 WLWLN to perform the operations of depositing/removing/updating. The word line decoder 420 receives and decodes the word line address WL to obtain one of the word lines WL1 WL WLN of the corresponding word line address WL. The signal comparator module 430 can receive the update clock signal S clk and the clock enable signal S en in the update mode to compare and store the information stored in the M memory cells selected by the word line address WL. action.

請繼續參考圖3,更新位址模組310接收進入更新訊號Sref ,藉以得知電腦系統是否讓DRAM單元30位於更新模式中,而更新位址模組310於更新模式時循環產生更新字元線位址WL。詳言之,更新位址模組310包括更新時脈單元120及字元線位址計數器130。更新時脈單元120於更新模式時產生更新時脈訊號Sclk 。位址計數器130耦接至更新時脈單元120,而位址計數器130接收並依據更新時脈訊號Sclk 來循環累計字元線位址WL(於本實施例中亦稱更新字元線位址WL)。換句話說,此處所指的「循環產生」為字元線位址計數器130依據每一個更新時脈訊號Sclk 的每一個脈衝將更新字元線位址WL加"1",當累加至記憶體陣列110的最後一個字元線位址時,再重新由記憶體陣列110的第一個字元線位址開始累計,藉以將記憶體陣列110中具有資料的記憶胞週期性進行資料刷新。Referring to FIG. 3, the update address module 310 receives the incoming update signal S ref to know whether the computer system causes the DRAM unit 30 to be in the update mode, and the update address module 310 cyclically generates the update character when updating the mode. Line address WL. In particular, the update address module 310 includes an update clock unit 120 and a word line address counter 130. The update clock unit 120 generates an update clock signal S clk when in the update mode. The address counter 130 is coupled to the update clock unit 120, and the address counter 130 receives and cyclically accumulates the word line address WL according to the update clock signal S clk (also referred to as the update word line address in this embodiment). WL). In other words, the "loop generation" referred to herein is the word line address counter 130 incrementing the update word line address WL by "1" according to each pulse of each update clock signal S clk , when accumulating to the memory When the last word line address of the body array 110 is re-integrated from the first word line address of the memory array 110, the memory cells having data in the memory array 110 are periodically refreshed.

圖3之更新控制模組320耦接至記憶體陣列110與更新位址模組310。於本實施例中,更新控制模組320包括暫存單元330及位址區間判斷單元340。暫存單元330用以儲存起始字元線位址WLstart1~WLstartP以及結束字元線位址WLstop1~WLstopP,這些起始字元線位址WLstart1~WLstartP與對應之結束字元線位址WLstop1~WLstopP可形成P個記憶體字元線位址區間,其中P為正整數,而記憶體字元線位址區間相互並不重疊。The update control module 320 of FIG. 3 is coupled to the memory array 110 and the update address module 310. In this embodiment, the update control module 320 includes a temporary storage unit 330 and an address interval determination unit 340. The temporary storage unit 330 is configured to store the start word line address WLstart1~WLstartP and the end word line address WLstop1~WLstopP, and the start word line address WLstart1~WLstartP and the corresponding end word line address WLstop1~ WLstopP can form P memory word line address intervals, where P is a positive integer, and memory word line address intervals do not overlap each other.

於本實施例中,圖3之位址區間判斷單元340耦接至暫存單元330,並且位址區間判斷單元340用以判斷更新字元線位址WL是否位於記憶體字元線位址區間AR1、AR2中。如果更新字元線位址WL位於記憶體字元線位址區間AR1、AR2內時,位址區間判斷單元340將更新字元線位址WL與更新致能訊號Sen 傳送至記憶體陣列110,以將對應更新字元線位址WL的記憶胞進行資料充電操作。此外,為了縮小DRAM單元30的電路面積,本實施例之位址區間判斷單元340以數位邏輯電路作為其實施方式,但本發明不應以此為限。In this embodiment, the address interval determining unit 340 of FIG. 3 is coupled to the temporary storage unit 330, and the address interval determining unit 340 is configured to determine whether the updated word line address WL is located in the memory word line address interval. AR1, AR2. If the update word line address WL is located in the memory word line address interval AR1, AR2, the address range judgment unit 340 transfers the update word line address WL and the update enable signal Sen to the memory array 110. To perform a data charging operation on the memory cell corresponding to the updated word line address WL. In addition, in order to reduce the circuit area of the DRAM unit 30, the address range determining unit 340 of the present embodiment has a digital logic circuit as its embodiment, but the present invention should not be limited thereto.

為了致使本領域具有通常知識者能更加了解本發明,以下詳細說明DRAM單元30的資料更新方法與流程,並舉例說明之,如圖5與圖6所示,圖5是依照本發明一實施例說明DRAM單元30的資料更新方法之流程圖,而圖6則是依照本發明一實施例說明DRAM單元30的資料更新方法之波形圖。請參照圖5,首先於步驟S510中,DRAM單元30首先取得起始字元線位址WLstart1~WLstartP與對應的結束字元線位址WLstop1~WLStopP,藉以形成記憶體字元線位址區間AR1、AR2。在此假設電腦系統先行提供2個記憶體字元線位址區間AR1、AR2(亦即P=2,並示意於圖4之記憶體區塊410上)至DRAM單元30的更新控制模組320中,第1個記憶體字元線位址區間AR1由WLstart1(005H )至WLstop1(0FEH )所組成,而第2個記憶體字元線位址區間AR2則由WLstart2(200H )至WLstop1(2FFH )所組成,其中,DRAM單元30可供儲存與比較的記憶體字元線位址區間之個數端視暫存單元的容量而定。In order to make the present invention more familiar to those skilled in the art, the data updating method and flow of the DRAM unit 30 will be described in detail below, and as illustrated in FIG. 5 and FIG. 6, FIG. 5 is an embodiment according to the present invention. A flowchart illustrating a method of updating data of the DRAM unit 30, and FIG. 6 is a waveform diagram illustrating a method of updating data of the DRAM unit 30 according to an embodiment of the present invention. Referring to FIG. 5, first in step S510, the DRAM unit 30 first obtains the start word line address WLstart1~WLstartP and the corresponding end word line address WLstop1~WLStopP, thereby forming a memory word line address interval AR1. , AR2. It is assumed here that the computer system first provides two memory word line address intervals AR1, AR2 (that is, P=2, and is illustrated on the memory block 410 of FIG. 4) to the update control module 320 of the DRAM unit 30. The first memory word line address interval AR1 is composed of WLstart1(005 H ) to WLstop1(0FE H ), and the second memory word line address interval AR2 is from WLstart2(200 H ) to WLstop1 (2FF H ) is formed, wherein the number of memory word line address intervals that the DRAM unit 30 can store and compare depends on the capacity of the temporary storage unit.

此外,於本實施例之步驟S510中,所取得的起始字元線位址WLstart1~WLstartP與結束字元線位址WLstop1~WLstopP可由電腦系統的特殊指令來預先設定。換句話說,電腦系統可預先設定其所需之記憶體容量,藉以讓電腦系統僅利用記憶體字元線位址區間AR1、AR2來存取資料。或者,於其他實施例中,DRAM單元30可以自行偵測記憶體陣列110中其內部已具備資料的記憶胞,並將記憶體字元線位址區間AR1、AR2的起始字元線位址與結束字元線位址儲存至暫存單元330中,以達成更新具備資料的記憶胞之目的。In addition, in step S510 of the embodiment, the obtained start word line address WLstart1~WLstartP and end word line address WLstop1~WLstopP can be preset by special instructions of the computer system. In other words, the computer system can pre-set the required memory capacity so that the computer system can access the data using only the memory word line address intervals AR1, AR2. Alternatively, in other embodiments, the DRAM unit 30 can detect the memory cells in the memory array 110 that have data therein, and set the start word line address of the memory word line address intervals AR1 and AR2. The end word line address is stored in the temporary storage unit 330 for the purpose of updating the memory cell having the data.

請繼續參考圖5,當進入更新模式時便執行步驟S520,更新位址模組310循環產生更新字元線位址WL(如圖6所示)。接著於步驟S530中,位址區間判斷單元340接收並判斷更新字元線位址WL是否位於記憶體字元線位址區間AR1、AR2。當更新字元線位址WL位於記憶體字元線位址區間AR1、AR2中時(例如更新字元線位址WL位於005H ~0FEH 、200H ~2FFH 之間),便進入步驟S540,位址區間判斷單元340讓更新致能訊號Sen 位於啟動電位(例如高電位),以使記憶體陣列110中之訊號比較器模組430(如圖4所示)能夠對更新字元線位址WL所對應的記憶胞進行資料充電操作。Referring to FIG. 5, when the update mode is entered, step S520 is performed, and the update address module 310 cyclically generates the update word line address WL (as shown in FIG. 6). Next, in step S530, the address section determining unit 340 receives and determines whether the updated word line address WL is located in the memory word line address interval AR1, AR2. When the update word line address WL is located in the memory word line address interval AR1, AR2 (for example, the update word line address WL is located between 005 H ~ 0FE H and 200 H ~ 2FF H ), the process proceeds to the step S540, address update interval judgment unit 340 so that the enabling signal S en located starting potential (e.g. high potential), so that memory array 110 of the signal comparator module 430 (FIG. 4) capable of updating characters The memory cell corresponding to the line address WL performs a data charging operation.

相對地,當更新字元線位址WL位於記憶體字元線位址區間AR1、AR2之外時(例如更新字元線位址WL位於000H ~004H 、0FFH ~1FFH 及300H ~FFFH 之間),便由步驟S530進入步驟S540,位址區間判斷單元340讓更新致能訊號Sen 位於關閉電位(例如低電位),以使訊號比較器模組430停止資料充電操作。此外,於步驟S540以及步驟S550結束後,便回到步驟S530以持續判斷更新字元線位址WL是否位於記憶體字元線位址區間AR1、AR2中。In contrast, when the update word line address WL is outside the memory word line address interval AR1, AR2 (for example, the update word line address WL is located at 000 H ~ 004 H , 0FF H ~ 1FF H and 300 H ~ between FFF H), then the step S530 into the step S540, the address update interval judgment unit 340 so that the enabling signal S en in the closed potential (e.g., low), so that the signal data comparator module 430 stops the charging operation. Further, after the end of step S540 and step S550, the process returns to step S530 to continuously determine whether the updated word line address WL is located in the memory word line address intervals AR1, AR2.

於符合本發明之其他實施例中,如圖7所示,圖7是依照本發明另一實施例所述之DRAM單元的方塊圖。請參照圖7,本實施例與上述實施例不同之處在於,本實施例之暫存單元可以利用多個起始字元線位址暫存器710_1~710_P及結束字元線位址暫存器720_1~720_P作為取代。每一個起始字元線位址暫存器710_i可以儲存一個起始字元線位址WLstarti,並且對應的結束字元線位址暫存器720_i則儲存一個結束字元線位址WLstopi,其中i為正整數且1≦i≦P。而本實施例的其他細部流程與說明已包含在上述各實施例中,故在此不予贅述。In other embodiments consistent with the present invention, as shown in FIG. 7, FIG. 7 is a block diagram of a DRAM unit in accordance with another embodiment of the present invention. Referring to FIG. 7, the difference between the embodiment and the foregoing embodiment is that the temporary storage unit of the embodiment can utilize a plurality of start word line address register 710_1~710_P and end word line address temporary storage. The 720_1~720_P are replaced. Each start word line address register 710_i may store a start word line address WLstarti, and the corresponding end word line address register 720_i stores an end word line address WLstopi, wherein i is a positive integer and 1≦i≦P. The other detailed procedures and descriptions of the present embodiment are included in the above embodiments, and thus are not described herein.

綜上所述,本發明的實施例利用電腦系統的指令或者DRAM自行偵測具備資料之記憶胞的結果,來取得字元線位址區間。接著在更新模式時,更新控制模組判斷更新字元線位址是否在上述字元線位址區間內,藉以將字元線位址區間內的記憶胞進行更新動作,而停止更新位於字元線位址區間外的記憶胞,進而減少DRAM在更新模式的電能消耗。此外,本實施例亦可以藉由判斷DRAM中的記憶胞是否已儲存資訊來取得多個的字元線位址區間,藉以達成只需更新具備資料的記憶胞之目的。In summary, the embodiment of the present invention uses the instructions of the computer system or the DRAM to detect the result of the memory cell with the data to obtain the word line address interval. Then, in the update mode, the update control module determines whether the updated word line address is in the word line address interval, so that the memory cell in the word line address interval is updated, and the update is located in the character. The memory cells outside the line address interval, thereby reducing the power consumption of the DRAM in the update mode. In addition, in this embodiment, a plurality of word line address intervals can be obtained by determining whether the memory cells in the DRAM have stored information, thereby achieving the purpose of updating only the memory cells having the data.

雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾,故本發明之保護範圍當視後附之申請專利範圍所界定者為準。Although the present invention has been disclosed in the above embodiments, it is not intended to limit the invention, and any one of ordinary skill in the art can make some modifications and refinements without departing from the spirit and scope of the invention. The scope of the invention is defined by the scope of the appended claims.

10、30...動態隨機存取記憶體(DRAM)單元10, 30. . . Dynamic random access memory (DRAM) unit

110...記憶體陣列110. . . Memory array

120...更新時脈單元120. . . Update clock unit

130...字元線位址計數器130. . . Word line address counter

310...更新位址模組310. . . Update address module

320...更新控制模組320. . . Update control module

330...暫存單元330. . . Staging unit

340...位址區間判斷單元340. . . Address interval judgment unit

410...記憶體區塊410. . . Memory block

420...字元線解碼器420. . . Character line decoder

430...訊號比較器模組430. . . Signal comparator module

710_1~710_P...起始字元線位址暫存器710_1~710_P. . . Start word line address register

720_1~720_P...結束字元線位址暫存器720_1~720_P. . . End character line address register

AR1、AR2...記憶體字元線位址區間AR1, AR2. . . Memory word line address interval

BL1~BLM...位元線BL1~BLM. . . Bit line

Sref ...進入更新訊號S ref . . . Enter the update signal

Sclk ...更新時脈訊號S clk . . . Update clock signal

Sen ...更新致能訊號S en . . . Update enable signal

WL...更新字元線位址WL. . . Update character line address

WL1~WLN...字元線WL1~WLN. . . Word line

WLstart1~WlstartP...起始字元線位址WLstart1~WlstartP. . . Start word line address

WLstop1~WlstopP...結束字元線位址WLstop1~WlstopP. . . End character line address

S510~S550...步驟S510~S550. . . step

圖1是習知動態隨機存取記憶體單元的方塊圖。1 is a block diagram of a conventional dynamic random access memory unit.

圖2是習知動態隨機存取記憶體單元的資料更新方法之波形圖。2 is a waveform diagram of a data updating method of a conventional dynamic random access memory unit.

圖3是依照本發明一實施例所述之一種動態隨機存取記憶體單元的方塊圖。FIG. 3 is a block diagram of a dynamic random access memory unit according to an embodiment of the invention.

圖4是依照本發明一實施例所述之記憶體陣列的方塊圖。4 is a block diagram of a memory array in accordance with an embodiment of the invention.

圖5是依照本發明一實施例說明動態隨機存取記憶體單元的資料更新方法之流程圖。FIG. 5 is a flow chart illustrating a method for updating data of a dynamic random access memory unit according to an embodiment of the invention.

圖6是依照本發明一實施例說明動態隨機存取記憶體單元的資料更新方法之波形圖。FIG. 6 is a waveform diagram illustrating a method for updating a data of a dynamic random access memory unit according to an embodiment of the invention.

圖7是依照本發明另一實施例所述之動態隨機存取記憶體單元的方塊圖。FIG. 7 is a block diagram of a dynamic random access memory unit according to another embodiment of the present invention.

30...動態隨機存取記憶體(DRAM)單元30. . . Dynamic random access memory (DRAM) unit

110...記憶體陣列110. . . Memory array

120...更新時脈單元120. . . Update clock unit

130...字元線位址計數器130. . . Word line address counter

310...更新位址模組310. . . Update address module

320...更新控制模組320. . . Update control module

330...暫存單元330. . . Staging unit

340...位址區間判斷單元340. . . Address interval judgment unit

Sref ...進入更新訊號S ref . . . Enter the update signal

Sclk ...更新時脈訊號S clk . . . Update clock signal

Sen ...更新致能訊號S en . . . Update enable signal

WL...更新字元線位址WL. . . Update character line address

Claims (10)

一種動態隨機存取記憶體單元,包括:一記憶體陣列,其包括多個記憶胞;一更新位址模組,用以於一更新模式時循環產生一更新字元線位址;以及一更新控制模組,耦接至該記憶體陣列與該更新位址模組,該更新控制模組取得至少一起始字元線位址與對應之至少一結束字元線位址,該些起始字元線位址與對應之該些結束字元線位址形成至少一記憶體字元線位址區間,且該更新控制模組判斷該更新字元線位址位於該些記憶體字元線位址區間,以對該更新字元線位址所對應之該些記憶胞進行一資料充電操作,否則停止該資料充電操作。 A dynamic random access memory unit includes: a memory array including a plurality of memory cells; an update address module for cyclically generating an updated word line address in an update mode; and an update The control module is coupled to the memory array and the update address module, and the update control module obtains at least one start word line address and corresponding at least one end word line address, the start words The meta-line address and the corresponding end word line address form at least one memory word line address interval, and the update control module determines that the update word line address is located in the memory word line position The address interval is performed by performing a data charging operation on the memory cells corresponding to the updated word line address, otherwise the data charging operation is stopped. 如申請專利範圍第1項所述之動態隨機存取記憶體單元,其中該更新位址模組包括:一更新時脈單元,用以於該更新模式產生一更新時脈訊號;以及一位址計數器,耦接至該更新時脈單元,該位址計數器接收並依據該更新時脈訊號來循環累計該更新字元線位址。 The dynamic random access memory unit of claim 1, wherein the update address module comprises: an update clock unit for generating an updated clock signal in the update mode; and an address The counter is coupled to the update clock unit, and the address counter receives and cyclically accumulates the update word line address according to the update clock signal. 如申請專利範圍第1項所述之動態隨機存取記憶體單元,其中該更新控制模組包括:一暫存單元,用以儲存該些起始字元線位址與該些結束字元線位址;以及 一位址區間判斷單元,耦接至該暫存單元,該位址區間判斷單元將該些起始字元線位址與對應之該些結束字元線位址形成該些記憶體字元線位址區間,並判斷該更新字元線位址是否位於該些記憶體字元線位址區間,其中當該更新字元線位址位於該些記憶體字元線位址區間時,該位址區間判斷單元將該更新位址與一更新致能訊號傳送至該記憶體陣列,以將對應該更新字元線位址之該些記憶胞進行該資料充電操作。 The dynamic random access memory unit of claim 1, wherein the update control module comprises: a temporary storage unit, configured to store the start word line addresses and the end word lines Address; and The address range determining unit is coupled to the temporary storage unit, and the address interval determining unit forms the memory word line by the starting word line address and the corresponding ending word line address An address interval, and determining whether the updated word line address is located in the memory word line address interval, wherein the updated word line address is located in the memory word line address interval, the bit The address interval judging unit transmits the update address and an update enable signal to the memory array to perform the data charging operation on the memory cells corresponding to the word line address. 如申請專利範圍第3項所述之動態隨機存取記憶體單元,其中該暫存單元包括:多個起始字元線位址暫存器,每一起始字元線位址暫存器用以儲存該些起始字元線位址之一;以及多個結束字元線位址暫存器,每一結束字元線位址暫存器用以儲存該些結束字元線位址之一,其中每一起始字元線位址與對應之每一結束字元線位址形成該些記憶體字元線位址區間。 The DRAM unit of claim 3, wherein the temporary storage unit comprises: a plurality of start word line address register, each start word line address register is used for Storing one of the start word line address addresses; and a plurality of end word line address registers, each end word line address register for storing one of the end word line addresses, Each of the start word line addresses and each of the corresponding end word line addresses form the memory word line address intervals. 如申請專利範圍第1項所述之動態隨機存取記憶體單元,其中該些記憶體字元線位址區間由一電腦系統所預先設定,該電腦系統包括該動態隨機存取記憶體單元,且該些記憶體字元線位址區間由該些起始字元線位址與對應之該些結束字元線位址所組成。 The dynamic random access memory unit according to claim 1, wherein the memory word line address intervals are preset by a computer system, and the computer system includes the dynamic random access memory unit. And the memory word line address intervals are composed of the start word line address and the corresponding end word line address. 如申請專利範圍第1項所述之動態隨機存取記憶體單元,其中該動態隨機存取記憶體單元自動偵測具備儲存資料之該些記憶胞,以取得並儲存該些起始字元線位址與該些結束字元線位址至該更新控制模組。The dynamic random access memory unit of claim 1, wherein the dynamic random access memory unit automatically detects the memory cells having the stored data to obtain and store the start word lines. The address and the end word line address are addressed to the update control module. 一種動態隨機存取記憶體單元的資料更新方法,該動態隨機存取記憶體單元包括具有多個記憶胞之一記憶體陣列,該動態隨機存取記憶體單元的資料更新方法包括:取得至少一起始字元線位址與對應之至少一結束字元線位址,其中該些起始字元線位址與對應之該些結束字元線位址形成至少一記憶體字元線位址區間;於一更新模式時,提供一更新位址模組,該更新位址模組循環產生一更新字元線位址;以及判斷該更新字元線位址位於該些記憶體字元線位址區間,以對該更新字元線位址所對應之該些記憶胞進行一資料充電操作,否則停止該資料充電操作。A data update method for a dynamic random access memory unit, the dynamic random access memory unit includes a memory array having a plurality of memory cells, and the data update method of the dynamic random access memory unit includes: obtaining at least one a start word line address and a corresponding at least one end word line address, wherein the start word line address and the corresponding end word line address form at least one memory word line address interval Providing an update address module in an update mode, the update address module cyclically generating an update word line address; and determining that the update word line address is located in the memory word line address The interval is performed by performing a data charging operation on the memory cells corresponding to the updated word line address, otherwise the data charging operation is stopped. 如申請專利範圍第7項所述之動態隨機存取記憶體單元的資料更新方法,循環產生該更新字元線位址的步驟包括:於該更新模式時,產生一更新時脈訊號;以及依據該更新時脈訊號來循環累計該更新字元線位址。The method for updating a data random access memory unit according to claim 7, wherein the step of generating the updated word line address comprises: generating an updated clock signal in the update mode; The update clock signal cyclically accumulates the updated word line address. 如申請專利範圍第7項所述之動態隨機存取記憶體單元的資料更新方法,取得該些起始字元線位址與對應之該些結束字元線位址的步驟包括:提供一電腦系統,該電腦系統預先設定該些記憶體字元線位址區間,該電腦系統包括該動態隨機存取記憶體單元,且該些記憶體字元線位址區間由該些起始字元線位址與對應之該些結束字元線位址所組成。The method for updating data of the dynamic random access memory unit according to claim 7, wherein the step of obtaining the start word line address and the corresponding end word line address comprises: providing a computer a system, the computer system pre-sets the memory word line address intervals, the computer system includes the dynamic random access memory unit, and the memory word line address intervals are from the start word lines The address is composed of the corresponding end word line addresses. 如申請專利範圍第7項所述之動態隨機存取記憶體單元的資料更新方法,取得該些起始字元線位址與對應之該些結束字元線位址的步驟包括:該動態隨機存取記憶體單元自動偵測具備儲存資料之該些記憶胞,以取得並儲存該些起始字元線位址與該些結束字元線位址。The method for updating data of the dynamic random access memory unit according to claim 7, wherein the step of obtaining the start word line address and the corresponding end word line address comprises: the dynamic random The access memory unit automatically detects the memory cells having the stored data to obtain and store the start word line addresses and the end word line addresses.
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