TWI443212B - A method of manufacturing an oxide based target for physical vapor deposition - Google Patents

A method of manufacturing an oxide based target for physical vapor deposition Download PDF

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TWI443212B
TWI443212B TW101108830A TW101108830A TWI443212B TW I443212 B TWI443212 B TW I443212B TW 101108830 A TW101108830 A TW 101108830A TW 101108830 A TW101108830 A TW 101108830A TW I443212 B TWI443212 B TW I443212B
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zinc
preparation
zinc oxide
oxide powder
vapor deposition
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TW201337015A (en
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ru yuan Yang
Tsung Lin Yang
Cheng Hsueh Wu
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Sun Beam Tech Ind Co Ltd
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Description

一種適用於物理氣相沉積之氧化物靶材之製備方法Method for preparing oxide target suitable for physical vapor deposition

本發明係有關於一種靶材之製備方法,特別係有關於一種適用於物理氣相沉積之氧化物靶材之製備方法,藉由該方法可製得具有低體電阻、高密度與適當之晶粒大小之靶材。The invention relates to a method for preparing a target, in particular to a method for preparing an oxide target suitable for physical vapor deposition, by which a low bulk resistance, a high density and a suitable crystal can be obtained. Particle size target.

透明導電氧化物已被廣泛應用在液晶、電漿、電致發光等平面顯示器,以及非晶矽、微晶矽、銅銦鎵硒(CIGS)等薄膜型太陽電池之透明電極層(膜)中。目前,商用最常見透明導電膜層是以直流磁控濺鍍的方式,利用電漿離子化之氬離子轟擊成膜材料(即濺鍍靶材),而使靶材內大量之原子從表面被擊出並飛濺沈積於基板上來形成膜層。因此,濺鍍時需要有特性良好、可穩定成膜之濺鍍靶材。在習知技術中,供濺鍍透明導電膜用之靶材,係將原料粉末製作成形後,利用加熱燒結方式來形成塊狀的燒結體靶材。習知技術從靶材製程方面著手,可改善異常放電的兩個重點為提升燒結體靶材的電阻率和密度。目前最常被使用之透明導電燒結靶材,是主成分為氧化銦並添加了氧化錫的銦錫氧化物(Indium Tin Oxide,ITO),其商用靶材電阻率可達2 x 10-4 Ω-cm以下,而靶材相對密度已達到99%以上。然而,由於ITO含大量稀有金屬銦,製備成本昂貴且有日漸枯竭的可能,因此乃有礦源豐富、成本低廉之氧化鋅系透明導電材料被提出(期刊文獻:Thin Solid Films,v.124,1985,p .4 3-47)。氧化鋅系透明導電材料係以氧化鋅為主成分,並添加了n型摻雜元素(例如,硼(B)、鋁(Al)、鎵(Ga)、銦(In)、釔(Y)、鈧(Sc)、矽(Si)、鍺(Ge)...等)而形成的透明導電體,其中最好的摻雜有以鋁(Al)摻雜形成的AZO(Aluminum Doped Zinc Oxide)或以鎵(Ga)摻雜形成的GZO(Gallium Doped Zinc Oxide)兩種。Transparent conductive oxides have been widely used in flat panel displays such as liquid crystal, plasma, and electroluminescence, and in transparent electrode layers (films) of thin film solar cells such as amorphous germanium, microcrystalline germanium, and copper indium gallium selenide (CIGS). . At present, the most common transparent conductive film layer in commercial use is a DC magnetron sputtering method, which uses a plasma ionized argon ion to bombard a film forming material (ie, a sputtering target), so that a large number of atoms in the target are The film layer is formed by striking and splashing deposition on the substrate. Therefore, it is necessary to have a sputtering target having good characteristics and stable film formation at the time of sputtering. In the prior art, a target for sputtering a transparent conductive film is formed by molding a raw material powder, and then forming a bulk sintered target by a heating and sintering method. Conventional techniques start from the target process, and the two main points that can improve the abnormal discharge are to increase the resistivity and density of the sintered body target. The most commonly used transparent conductive sintered target is Indium Tin Oxide (ITO) whose main component is indium oxide and added with tin oxide. Its commercial target resistivity can reach 2 x 10 -4 Ω. Below -cm, and the relative density of the target has reached 99% or more. However, since ITO contains a large amount of rare metal indium, which is expensive to manufacture and has a tendency to be depleted, a zinc oxide-based transparent conductive material rich in mineral resources and low in cost is proposed (Journal: Thin Solid Films, v. 124, 1985) , p. 4 3-47). The zinc oxide-based transparent conductive material is mainly composed of zinc oxide, and an n-type doping element (for example, boron (B), aluminum (Al), gallium (Ga), indium (In), ytterbium (Y), A transparent conductor formed by strontium (Sc), bismuth (Si), germanium (Ge), etc., wherein the best doping is AZO (Aluminum Doped Zinc Oxide) formed by doping with aluminum (Al) or GZO (Gallium Doped Zinc Oxide) formed by doping with gallium (Ga).

參照日本公告專利第02-149459號,其揭示採用氬氣(Ar)氣氛燒結AZO比在空氣中燒結可獲得更高的燒結靶材密度和電阻率,燒結密度達到5.6 g/cm3 ,電阻率達到5×10-3 Ω-cm。雖然其密度可達99%,但電阻率仍遠不及於ITO,且其粉體製備來源皆需純化至4N或以上等級之粉體燒結始能達成。Referring to Japanese Laid-Open Patent Publication No. 02-149459, it is disclosed that sintering of AZO in an argon (Ar) atmosphere can achieve higher sintered target density and electrical resistivity than sintering in air, and the sintered density reaches 5.6 g/cm 3 , and the resistivity It reaches 5 × 10 -3 Ω-cm. Although its density can reach 99%, the resistivity is still far less than that of ITO, and its powder preparation source needs to be purified to 4N or above.

參照日本公告專利第07-258836號,其揭示AZO採用較細粒徑之氧化鋁粉末摻雜混合,燒結後可達到5.65 g/cm3 的密度和3×10-3 Ω-cm的電阻率,且其粉體製備來源皆需純化至4N(99.99%)或以上等級之粉體燒結始能達成。Referring to Japanese Laid-Open Patent Publication No. 07-258836, it is disclosed that AZO is doped and mixed with alumina powder of a relatively fine particle diameter, and can achieve a density of 5.65 g/cm 3 and a resistivity of 3 × 10 -3 Ω-cm after sintering. And the powder preparation source needs to be purified to 4N (99.99%) or above powder sintering can be achieved.

參照台灣公開專利第200702460號、第200706664號及第200730646號中,其揭示對GZO添加含量20~250 ppm、粒徑1μm以下之氧化鋁、氧化鋯或同時添加氧化鋁及氧化鋯,可提升燒結密度及電阻率。其中實施例最佳之燒結密度為5.64 g/cm3 及電阻率為1.48×10-3 Ω-cm,電阻率仍遠不及於ITO,且其粉體製備來源皆需純化至4N或以上等級之粉體燒結始能達成。Referring to Taiwan Patent Publication No. 200602460, No. 200706664 and No. 200730646, it is disclosed that the addition of alumina, zirconia or zirconia having a particle size of 20 to 250 ppm and a particle diameter of 1 μm or less can be improved in sintering. Density and resistivity. The best sintered density of the embodiment is 5.64 g/cm 3 and the resistivity is 1.48×10 -3 Ω-cm, and the resistivity is still far less than that of ITO, and the powder preparation source needs to be purified to 4N or above. Powder sintering can be achieved.

綜合觀之,上述專利文獻揭示之技術雖對氧化鋅系透明導電燒結靶材之密度和電阻率有些許提升,但其電阻率仍大幅高於ITO,仍為較不佳之濺鍍靶材。由上述可知,有必要提供一創新且富有進步性之氧化鋅系靶材,以解決上述問題。In summary, the technique disclosed in the above patent document has a slight increase in the density and electrical resistivity of the zinc oxide-based transparent conductive sintered target, but its resistivity is still much higher than that of ITO, which is still a poor sputtering target. From the above, it is necessary to provide an innovative and progressive zinc oxide target to solve the above problems.

職是之故,申請人乃細心試驗與研究,並一本鍥而不捨的精神,終於研究出一種適用於物理氣相沉積之氧化物靶材之製備方法,可以解決上述之問題。As a result of the job, the applicant has carefully studied and researched, and has been working hard to finally develop a method for preparing an oxide target suitable for physical vapor deposition, which can solve the above problems.

本發明之主要目的在於提供一種適用於物理氣相沉積之氧化物靶材之製備方法,其係藉由具混合均勻碳之氧化鋅原粉末進行燒結,進而增加載子濃度並降低電阻率。SUMMARY OF THE INVENTION A primary object of the present invention is to provide a method for preparing an oxide target suitable for physical vapor deposition by sintering a zinc oxide raw powder mixed with uniform carbon to increase the carrier concentration and reduce the electrical resistivity.

本發明之次要目的在於提供一種適用於物理氣相沉積之氧化物靶材之製備方法,其係藉由添加一摻雜元素進而提升載子濃度並降低電阻率。A secondary object of the present invention is to provide a method for preparing an oxide target suitable for physical vapor deposition by adding a doping element to thereby increase the carrier concentration and reduce the resistivity.

為達成上述之主要目的,本發明提出適用於物理氣相沉積之氧化物靶材之製備方法,其至少包括以下步驟:將一金屬鋅置於熔解爐中將該金屬鋅進行熔解;進行氧化步驟,以獲得一氧化鋅粉末;收集該氧化鋅粉末;將該氧化鋅粉末進行一成型步驟;以及進行一燒結步驟,以形成一適用於物理氣相沉積之氧化物靶材。In order to achieve the above main object, the present invention provides a method for preparing an oxide target suitable for physical vapor deposition, which comprises at least the steps of: dissolving a metal zinc in a melting furnace to melt the metal zinc; and performing an oxidation step Obtaining a zinc oxide powder; collecting the zinc oxide powder; performing the forming step of the zinc oxide powder; and performing a sintering step to form an oxide target suitable for physical vapor deposition.

為達成上述之次要目的,本發明提出適用於物理氣相沉積之氧化物靶材之製備方法,其至少包括以下步驟:將一金屬鋅進行熔解;進行氧化步驟,以獲得一氧化鋅粉末;收集該氧化鋅粉末;混合該氧化鋅粉末與至少一摻雜元素並進行一成型步驟;以及進行一燒結步驟,以形成一適用於物理氣相沉積之氧化物靶材。In order to achieve the above secondary object, the present invention provides a method for preparing an oxide target suitable for physical vapor deposition, which comprises at least the steps of: melting a metal zinc; performing an oxidation step to obtain a zinc oxide powder; Collecting the zinc oxide powder; mixing the zinc oxide powder with at least one doping element and performing a forming step; and performing a sintering step to form an oxide target suitable for physical vapor deposition.

根據本發明之一特徵,其中該氧化鋅粉末含有一碳元素分佈,且該碳元素之重量含量係介於該氧化鋅粉末之50ppm至500ppm之間。According to a feature of the invention, the zinc oxide powder contains a carbon element distribution, and the carbon element has a weight content of between 50 ppm and 500 ppm of the zinc oxide powder.

根據本發明之另一特徵,其中該適用於物理氣相沉積之氧化物靶材之相對密度係為80%至99%之間。According to another feature of the invention, the relative density of the oxide target suitable for physical vapor deposition is between 80% and 99%.

根據本發明之又一特徵,其中該適用於物理氣相沉積之氧化物靶材之電阻率係為1×10-2 Ω-cm至1×10-4 Ω-cm之間。According to still another feature of the present invention, the oxide target suitable for physical vapor deposition has a resistivity of between 1 × 10 -2 Ω-cm and 1 × 10 -4 Ω-cm.

根據本發明之再一特徵,其中該該摻雜元素係選自一n型摻雜元素。According to still another feature of the invention, the doping element is selected from an n-type doping element.

本發明之一種適用於物理氣相沉積之氧化物靶材之製備方法具有以下之功效:The preparation method of the oxide target suitable for physical vapor deposition of the present invention has the following effects:

1. 本發明之氧化鋅粉末含有碳元素分佈,其可增加載子濃度並降低體電阻率;1. The zinc oxide powder of the present invention contains a carbon element distribution which increases the concentration of the carrier and lowers the volume resistivity;

2. 本發明之靶材具有低體電阻、高密度與適當之晶粒大小;2. The target of the present invention has low bulk resistance, high density and appropriate grain size;

3. 本發明之氧化鋅粉末製作容易,無需進一步精練,可進一步降低製作成本,具有較佳的商業利用價值;3. The zinc oxide powder of the invention is easy to manufacture and can be further reduced in production cost without further scouring, and has better commercial utilization value;

4. 鋅元素為礦藏豐富之物質,因此,本發明之靶材製備成型能夠有效降低價格。4. The zinc element is a mineral-rich substance, and therefore, the target preparation of the present invention can effectively reduce the price.

為讓本發明之上述和其他目的、特徵、和優點能更明顯易懂,下文特舉數個較佳實施例,並配合所比較表,作詳細說明如下。The above and other objects, features and advantages of the present invention will become more apparent and understood.

雖然本發明可表現為不同形式之實施例,但附圖所示者及於下文中說明者係為本發明可之較佳實施例,並請瞭解本文所揭示者係考量為本發明之一範例,且並非意圖用以將本發明限制於圖示及/或所描述之特定實施例中。While the invention may be embodied in various forms, the embodiments illustrated in the drawings It is not intended to limit the invention to the particular embodiments illustrated and/or described.

現請參考第1圖,其顯示為本發明之一種適用於物理氣相沉積之氧化物靶材之製備方法。其包含下列之步驟:Referring now to Figure 1, there is shown a method of preparing an oxide target suitable for physical vapor deposition of the present invention. It contains the following steps:

步驟110:將一金屬鋅置於熔解爐中將該金屬鋅進行熔解;Step 110: placing a metal zinc in a melting furnace to melt the metal zinc;

步驟120:進行氧化步驟,以獲得一氧化鋅粉末;Step 120: performing an oxidation step to obtain zinc oxide powder;

步驟130:收集該氧化鋅粉末;Step 130: collecting the zinc oxide powder;

步驟140:將該氧化鋅粉末進行一成型步驟;以及Step 140: performing a molding step of the zinc oxide powder;

步驟150:進行一燒結步驟,以形成一適用於物理氣相沉積之氧化物靶材。Step 150: Perform a sintering step to form an oxide target suitable for physical vapor deposition.

其中,金屬鋅係選自一純鋅或一廢鋅原料之一。在一實施例中係選自廢鋅原料,將廢鋅原料於石墨坩堝內進行1000℃以上的高溫下熔解並轉換為鋅蒸汽。藉此,該氧化鋅粉末含有均勻碳元素分佈,其可增加載子濃度並降低體電阻率。隨後被鼓入的空氣氧化生成氧化鋅,並在冷卻管後收集得到氧化鋅粉末。值得注意的是,該氧化鋅粉末之純度係為99.0%至99.8%之間,較佳為99.8%。且,於本發明之重要特徵係為該氧化鋅粉末含有一碳元素分佈,且該碳元素之重量含量係介於該氧化鋅粉末之50ppm(百萬分之五十)至500ppm(百萬分之五百)之間。碳元素之功用係為與氧化鋅作用而形成更多導電載子濃度來降低體電阻率,所製得之氧化鋅系透明導電靶材不僅密度高且電阻率小,其中電阻率的降低並未造成燒結密度的下降,故氧化鋅系透明導電靶材具有較佳之鍍膜的特性,其與ITO靶材水準十分接近。Among them, the metal zinc is selected from one of pure zinc or a waste zinc raw material. In one embodiment, it is selected from the waste zinc raw material, and the waste zinc raw material is melted in a graphite crucible at a high temperature of 1000 ° C or higher and converted into zinc vapor. Thereby, the zinc oxide powder contains a uniform carbon element distribution which increases the carrier concentration and lowers the volume resistivity. The entrained air is then oxidized to form zinc oxide and collected after cooling the tube to obtain zinc oxide powder. It is to be noted that the zinc oxide powder has a purity of between 99.0% and 99.8%, preferably 99.8%. Moreover, an important feature of the present invention is that the zinc oxide powder contains a carbon element distribution, and the weight content of the carbon element is between 50 ppm (50 parts per million) and 500 ppm (parts per million) of the zinc oxide powder. Between five). The function of carbon element is to form more conductive carrier concentration with zinc oxide to reduce the volume resistivity. The obtained zinc oxide transparent conductive target not only has high density and low resistivity, but the resistivity is not lowered. As a result of a decrease in the sintered density, the zinc oxide-based transparent conductive target has a preferable coating property, which is very close to the level of the ITO target.

此外,步驟140中之該成型步驟,本發明係選擇性地以乾壓、冷均壓或鑄漿成形方式進行該成型步驟。其中,成型塊材時,仍需注意氧化鋅粉末於模具中是否有平整,以避免試片受到負荷壓力不均造成生胚密度不均勻。Further, in the forming step in step 140, the present invention selectively performs the forming step in a dry pressing, cold equalizing or cast forming manner. Among them, when forming the block, it is still necessary to pay attention to whether the zinc oxide powder is flat in the mold, so as to avoid unevenness of the raw embryo density caused by the uneven pressure of the test piece.

最後再於步驟150中進行一燒結步驟。本發明燒結步驟可以以常壓燒結、正壓燒結、熱壓燒結或熱均壓燒結方式進行該燒結緻密化步驟。此外,該燒結步驟之燒結溫度係為1100℃至1500℃,並且於大氣、氮氣或惰性氣體(例如:氬氣(Ar))氣氛中進行該燒結緻密化步驟。最後,得到適用於物理氣相沉積之氧化物靶材之相對密度係為80%至99%之間、該體電阻率係為1×10-2 Ω-cm至1×10-4 Ω-cm之間,且晶粒大小係為2μm至5μm之間。其中相對密度係指阿基米德量測結果得之真實密度與XRD所測得之理論密度之比值。Finally, a sintering step is performed in step 150. The sintering step of the present invention may be carried out by atmospheric pressure sintering, positive pressure sintering, hot press sintering or hot pressure sintering. Further, the sintering step is performed at a sintering temperature of 1100 ° C to 1500 ° C, and the sintering densification step is carried out in an atmosphere of nitrogen, nitrogen or an inert gas (for example, argon (Ar)). Finally, the relative density of the oxide target suitable for physical vapor deposition is between 80% and 99%, and the volume resistivity is from 1×10 -2 Ω-cm to 1×10 -4 Ω-cm. Between and the grain size is between 2 μm and 5 μm. The relative density refers to the ratio of the true density obtained by the Archimedes measurement to the theoretical density measured by XRD.

現請參考第2圖,其顯示為本發明之另一種適用於物理氣相沉積之氧化物靶材之製備方法。其與圖1並無太大之差異,主要係將步驟140改為步驟240,亦即以乾式球磨或溼式球磨方式混合該氧化鋅粉末與至少一摻雜元素並進行一成型步驟。該摻雜元素係為n型摻雜元素,選自硼(B)、鋁(Al)、鎵(Ga)、銦(In)、釔(Y)、鈧(Sc)、矽(Si)、鍺(Ge)及其混合物所組成之群,較佳摻雜元素為氧化鋁,其摻雜濃度為1.0至10.0重量百分比(wt%)。最後,得到適用於物理氣相沉積之氧化物靶材之相對密度係為80%至99%之間、該體電阻率係為1×10-2 Ω-cm至1×10-4 Ω-cm之間,且晶粒大小係為2μm至5μm之間。Referring now to Figure 2, there is shown another method of preparing an oxide target suitable for physical vapor deposition of the present invention. It is not much different from FIG. 1, mainly by changing step 140 to step 240, that is, mixing the zinc oxide powder with at least one doping element by dry ball milling or wet ball milling and performing a molding step. The doping element is an n-type doping element selected from the group consisting of boron (B), aluminum (Al), gallium (Ga), indium (In), ytterbium (Y), strontium (Sc), cerium (Si), germanium. The group consisting of (Ge) and a mixture thereof, preferably doped with alumina, has a doping concentration of 1.0 to 10.0 weight percent (wt%). Finally, the relative density of the oxide target suitable for physical vapor deposition is between 80% and 99%, and the volume resistivity is from 1×10 -2 Ω-cm to 1×10 -4 Ω-cm. Between and the grain size is between 2 μm and 5 μm.

本發明之適用於物理氣相沉積之氧化物靶材可適用於真空蒸鍍(Vacuum Evaporation)、濺鍍(Sputtering)與離子蒸鍍(Ion Plating)等之物理法鍍膜製程。The oxide target suitable for physical vapor deposition of the present invention can be applied to a physical plating process such as vacuum evaporation, sputtering, and ion plating.

<實施例1><Example 1>

首先,將一金屬純鋅置於熔解爐中將該金屬鋅進行熔解,接著於石墨坩堝內進行1000℃高溫下熔解並轉換為鋅蒸汽。藉此,該氧化鋅粉末含有均勻碳元素分佈,其可增加載子濃度並降低體電阻率。隨後被鼓入的空氣氧化生成氧化鋅,並在冷卻管後收集得到純度99.8%的氧化鋅粉末。接著,將氧化鋅粉末以及去離子水(DI-Water)置入含有氧化鋯球之研磨罐中,使用球磨機以轉速300(rad/sec)進行球磨(Ball mixing)並持續12小時。爾後,將球磨後的氧化鋅溶液置入烘箱並以70℃烘乾該溶液。接續著,將烘乾的粉體置入研缽磨成粉末,並利用過篩機以篩網(200mesh)過篩之。然後,將過篩後之粉末放入玻璃燒杯中,搖晃擺動上下左右約半小時,進行簡單造粒(Granulation)。其中,此項動作仍可以使得粉末流動性增加。接著,將造粒完成之粉末加入1wt%的黏結劑(聚乙烯醇,Polyvinyl Alcohol,PVA)放入研缽內研磨混合均勻後再量取3克粉末置入直徑15mm之圓柱磨具內;接著,使用乾式壓模機(乾壓)以1000 psi為負荷壓力製成試片。結著,將試片置入高溫箱型爐於大氣中進行燒結;燒結參數之溫度為1100℃並持溫兩個小時。最後完成靶材並將該靶材進行材料分析。由X光繞射分析儀分析結果如圖3,該靶材確實為純相之氧化鋅;由電子顯微鏡分析結果如圖4,該靶材之晶粒大小為0.8μm;四點探針測量法測得體電阻率為1.0×10-3 Ω-cm;以及阿基米德量測結果得之相對密度為97%。其中相對密度係指阿基米德量測結果得之真實密度與XRD所測得之理論密度之比值。First, a metal pure zinc is placed in a melting furnace to melt the metal zinc, and then melted in a graphite crucible at a high temperature of 1000 ° C and converted into zinc vapor. Thereby, the zinc oxide powder contains a uniform carbon element distribution which increases the carrier concentration and lowers the volume resistivity. The air that was blown in was then oxidized to form zinc oxide, and after cooling the tube, zinc oxide powder having a purity of 99.8% was collected. Next, zinc oxide powder and deionized water (DI-Water) were placed in a grinding pot containing zirconia balls, and ball mixing was performed at a number of revolutions of 300 (rad/sec) using a ball mill for 12 hours. Thereafter, the ball milled zinc oxide solution was placed in an oven and the solution was dried at 70 °C. Subsequently, the dried powder was placed in a mortar and ground into a powder, and sieved by a sieve machine (200 mesh). Then, the sieved powder was placed in a glass beaker, and shaken up and down for about half an hour to perform simple granulation. Among them, this action can still increase the fluidity of the powder. Next, the granulated powder is added to a 1 wt% binder (polyvinyl alcohol, Polyvinyl Alcohol, PVA), ground in a mortar, and uniformly mixed, and then 3 g of the powder is placed in a cylindrical abrasive having a diameter of 15 mm; A test piece was prepared using a dry molding machine (dry pressure) at a load pressure of 1000 psi. After the test, the test piece was placed in a high-temperature box furnace and sintered in the atmosphere; the temperature of the sintering parameter was 1100 ° C and the temperature was held for two hours. The target is finally completed and the target is subjected to material analysis. The results of the analysis by the X-ray diffraction analyzer are shown in Fig. 3. The target is indeed pure phase zinc oxide; the result of electron microscopy analysis is shown in Fig. 4. The grain size of the target is 0.8 μm; four-point probe measurement method The measured volume resistivity was 1.0 × 10 -3 Ω-cm; and the relative density of the Archimedes measurement was 97%. The relative density refers to the ratio of the true density obtained by the Archimedes measurement to the theoretical density measured by XRD.

<實施例2><Example 2>

實施例2大致如實施例1之步驟,其主要差異係:以乾式球磨方式混合該氧化鋅粉末與氧化鋁,其氧化鋁摻雜濃度為3.0重量百分比(wt%),亦即是氧化鋅與氧化鋁之比為:97%:3%。最後,得到之靶材係為純相之氧化鋅、相對密度係為94%、體電阻率係為1.2×10-4 Ω-cm,且晶粒大小係為3μm。Example 2 is substantially the same as the step of Example 1, the main difference is that the zinc oxide powder and the alumina are mixed by dry ball milling, and the alumina doping concentration is 3.0 weight percent (wt%), that is, zinc oxide and The ratio of alumina is: 97%: 3%. Finally, the obtained target was a pure phase zinc oxide having a relative density of 94%, a volume resistivity of 1.2 × 10 -4 Ω-cm, and a crystal grain size of 3 μm.

<實施例3><Example 3>

實施例3大致如實施例2之步驟,其主要差異係:以乾式球磨方式混合該氧化鋅粉末與氧化鋁,其氧化鋁摻雜濃度為2.0重量百分比(wt%)。最後,得到之靶材係為純相之氧化鋅、相對密度係為93%、體電阻率係為1.0×10-4 Ω-cm,且晶粒大小係為3.2μm。Example 3 is substantially as in the procedure of Example 2, the main difference being that the zinc oxide powder and alumina were mixed by dry ball milling with an alumina doping concentration of 2.0 weight percent (wt%). Finally, the obtained target was a pure phase zinc oxide having a relative density of 93%, a volume resistivity of 1.0 × 10 -4 Ω-cm, and a grain size of 3.2 μm.

<實施例4><Example 4>

實施例4大致如實施例1之步驟,其主要差異係:將試片置入高溫箱型爐於氮氣中進行燒結;燒結參數之溫度為1200℃並持溫兩個小時。最後完成靶材並將該靶材進行材料分析。得到之靶材係為純相之氧化鋅、相對密度係為92%、體電阻率係為0.5×10-4 Ω-cm,且晶粒大小係為4μm。Example 4 is roughly as the procedure of Example 1. The main difference is that the test piece is placed in a high temperature box furnace and sintered in nitrogen; the sintering parameter temperature is 1200 ° C and the temperature is maintained for two hours. The target is finally completed and the target is subjected to material analysis. The target was obtained as pure phase zinc oxide, having a relative density of 92%, a volume resistivity of 0.5 × 10 -4 Ω-cm, and a grain size of 4 μm.

<實施例5><Example 5>

實施例5大致如實施例1之步驟,其主要差異係:將試片置入高溫箱型爐於氬氣中進行燒結;燒結參數之溫度為1300℃並持溫兩個小時。最後完成靶材並將該靶材進行材料分析。得到之靶材係為純相之氧化鋅、相對密度係為93%、體電阻率係為1.5×10-4 Ω-cm,且晶粒大小係為4.2μm。Example 5 is substantially the same as the procedure of Example 1. The main difference is that the test piece is placed in a high-temperature box furnace and sintered in argon; the temperature of the sintering parameter is 1300 ° C and the temperature is maintained for two hours. The target is finally completed and the target is subjected to material analysis. The target obtained was a pure phase zinc oxide having a relative density of 93%, a volume resistivity of 1.5 × 10 -4 Ω-cm, and a grain size of 4.2 μm.

<實施例6><Example 6>

實施例6大致如實施例1之步驟,其主要差異係:將氧化鋅粉末以及DI-Water置入含有氧化鋯球之研磨罐中,使用球磨機以轉速600(rad/sec)進行球磨(Ball mixing)並持續12小時;燒結參數之溫度為改為1400℃並持溫三個小時。最後完成靶材並將該靶材進行材料分析。由X光繞射分析儀分析確實該靶材為純相之氧化鋅;由電子顯微鏡分析結果得知該靶材之晶粒大小為5μm;四點探針測量法測得體電阻率為1.3×10-4 Ω-cm;以及阿基米德量測結果得之相對密度為95%。Example 6 is substantially the same as the procedure of Example 1, the main difference is that zinc oxide powder and DI-Water are placed in a grinding jar containing zirconia balls, and ball milling is performed at a rotation speed of 600 (rad/sec) using a ball mill (Ball mixing) ) and lasted for 12 hours; the temperature of the sintering parameters was changed to 1400 ° C and held for three hours. The target is finally completed and the target is subjected to material analysis. The target was pure phase zinc oxide by X-ray diffraction analyzer; the grain size of the target was 5 μm as determined by electron microscopy; the volume resistivity measured by four-point probe measurement was 1.3×10. -4 Ω-cm; and the Archimedes measurement results have a relative density of 95%.

<實施例7><Example 7>

實施例7大致如實施例2之步驟,其主要差異係:混合該氧化鋅粉末與氧化鋁,其氧化鋁摻雜濃度為4.0重量百分比(wt%);球磨機改以轉速800(rad/sec)進行球磨(Ball mixing)並持續24小時;以及燒結參數之溫度為改為1500℃並持溫三個小時。得到之靶材係為純相之氧化鋅、相對密度係為93%、體電阻率係為1.3×10-4 Ω-cm,且晶粒大小係為4.3μm。Example 7 is substantially as the step of Example 2, the main difference being: mixing the zinc oxide powder with alumina, the alumina doping concentration is 4.0 weight percent (wt%); the ball mill is changed to the rotation speed 800 (rad/sec) Ball mixing was carried out for 24 hours; and the temperature of the sintering parameters was changed to 1500 ° C and held for three hours. The target was obtained as pure phase zinc oxide, having a relative density of 93%, a volume resistivity of 1.3 × 10 -4 Ω-cm, and a grain size of 4.3 μm.

<實施例8><Example 8>

實施例8大致如實施例7之步驟,其主要差異係:混合該氧化鋅粉末與氧化銦,其氧化銦摻雜濃度為10.0重量百分比(wt%)。得到之靶材係為純相之氧化鋅、相對密度係為92.5%、體電阻率係為1.1×10-4 Ω-cm,且晶粒大小係為5.3μm。Example 8 is substantially as in the step of Example 7, the main difference being: mixing the zinc oxide powder with indium oxide with an indium oxide doping concentration of 10.0 weight percent (wt%). The target was obtained as pure phase zinc oxide, having a relative density of 92.5%, a volume resistivity of 1.1 × 10 -4 Ω-cm, and a grain size of 5.3 μm.

<實施例9><Example 9>

實施例9大致如實施例8之步驟,其主要差異係:混合該氧化鋅粉末與氧化鎵,其氧化鎵摻雜濃度為5.0重量百分比(wt%);球磨機改以轉速1000(rad/sec)進行球磨(Ball mixing)並持續2小時;以及燒結參數之溫度為改為1500℃並持溫兩個小時。得到之靶材係為純相之氧化鋅、相對密度係為94%、體電阻率係為1.35×10-4 Ω-cm,且晶粒大小係為3.1μm。Example 9 is substantially the same as the step of Example 8, the main difference is: mixing the zinc oxide powder with gallium oxide, the gallium oxide doping concentration is 5.0 weight percent (wt%); the ball mill is changed to the rotation speed 1000 (rad/sec) Ball mixing was carried out for 2 hours; and the temperature of the sintering parameters was changed to 1500 ° C and held for two hours. The target was obtained as pure phase zinc oxide, having a relative density of 94%, a volume resistivity of 1.35 × 10 -4 Ω-cm, and a grain size of 3.1 μm.

綜上所述,本發明之一種適用於物理氣相沉積之氧化物靶材之製備方法具有以下之功效:In summary, the method for preparing an oxide target suitable for physical vapor deposition of the present invention has the following effects:

1. 藉由熔解爐中將該金屬鋅進行熔解,該氧化鋅粉末含有均勻碳元素分佈,其可增加載子濃度並降低體電阻率;1. Melting the metal zinc in a melting furnace, the zinc oxide powder containing a uniform carbon element distribution, which can increase the carrier concentration and reduce the volume resistivity;

2. 本發明之靶材具有低體電阻、高密度與適當之晶粒大小;2. The target of the present invention has low bulk resistance, high density and appropriate grain size;

3. 本發明之氧化鋅粉末製作容易,無需進一步精練,可進一步降低製作成本,具有較佳的商業利用價值;3. The zinc oxide powder of the invention is easy to manufacture and can be further reduced in production cost without further scouring, and has better commercial utilization value;

4. 鋅元素為礦藏豐富之物質,因此,本發明之靶材製備成型能夠有效降低價格。4. The zinc element is a mineral-rich substance, and therefore, the target preparation of the present invention can effectively reduce the price.

雖然本發明已以前述較佳實施例揭示,然其並非用以限定本發明,任何熟習此技藝者,在不脫離本發明之精神和範圍內,當可作各種之更動與修改。如上述的解釋,都可以作各型式的修正與變化,而不會破壞此發明的精神。因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。While the present invention has been described in its preferred embodiments, it is not intended to limit the scope of the invention, and various modifications and changes can be made without departing from the spirit and scope of the invention. As explained above, various modifications and variations can be made without departing from the spirit of the invention. Therefore, the scope of the invention is defined by the scope of the appended claims.

100...適用於物理氣相沉積之氧化物靶材之製備方法流程圖(一)100. . . Flow chart of preparation method of oxide target suitable for physical vapor deposition (1)

200...適用於物理氣相沉積之氧化物靶材之製備方法流程圖(二)200. . . Flow chart of preparation method of oxide target suitable for physical vapor deposition (2)

第1圖顯示為本發明之一種適用於物理氣相沉積之氧化物靶材之製備方法。Figure 1 shows a method of preparing an oxide target suitable for physical vapor deposition of the present invention.

第2圖顯示為本發明之一種適用於物理氣相沉積之氧化物靶材之製備方法。Figure 2 shows a method of preparing an oxide target suitable for physical vapor deposition of the present invention.

第3圖顯示為本發明之實施例1至實施例5之x光繞射分析儀之分析結果圖。Fig. 3 is a view showing the analysis results of the x-ray diffraction analyzers of Examples 1 to 5 of the present invention.

第4圖顯示為本發明之實施例1之電子顯微鏡分析結果圖。Fig. 4 is a graph showing the results of electron microscope analysis of Example 1 of the present invention.

100...適用於物理氣相沉積之氧化物靶材之製備方法流程圖(一)100. . . Flow chart of preparation method of oxide target suitable for physical vapor deposition (1)

Claims (19)

一種適用於物理氣相沉積之氧化物靶材之製備方法,其至少包括以下步驟:(a)將一金屬鋅置於一石墨坩堝內進行1000℃以上的高溫下熔解以轉換為一鋅蒸汽;(b)導入空氣,將該鋅蒸汽氧化成一氧化鋅粉末,該氧化鋅粉末之純度係為99.0%至99.8%之間;(c)於一冷卻管收集該氧化鋅粉末;(d)將該氧化鋅粉末進行一成型步驟;以及(e)進行一燒結步驟,以形成一適用於物理氣相沉積之氧化物靶材;其中,該氧化鋅粉末含有一碳元素分佈,且該碳元素之重量含量係介於該氧化鋅粉末之50ppm至500ppm之間。 A method for preparing an oxide target suitable for physical vapor deposition, comprising at least the following steps: (a) placing a metal zinc in a graphite crucible and melting at a high temperature of 1000 ° C or higher to convert into a zinc vapor; (b) introducing air, oxidizing the zinc vapor into zinc oxide powder, the purity of the zinc oxide powder being between 99.0% and 99.8%; (c) collecting the zinc oxide powder in a cooling tube; (d) The zinc oxide powder is subjected to a molding step; and (e) performing a sintering step to form an oxide target suitable for physical vapor deposition; wherein the zinc oxide powder contains a carbon element distribution, and the weight of the carbon element The content is between 50 ppm and 500 ppm of the zinc oxide powder. 如申請專利範圍第1項之製備方法,其中步驟(a)之該金屬鋅係選自一純鋅或一廢鋅原料之一。 The preparation method of claim 1, wherein the metal zinc of the step (a) is selected from one of a pure zinc or a waste zinc raw material. 如申請專利範圍第1項之製備方法,其中步驟(e)之該氧化物靶材之晶粒大小係為2μm至5μm之間。 The preparation method of claim 1, wherein the oxide target of the step (e) has a grain size of between 2 μm and 5 μm. 如申請專利範圍第1項之製備方法,其中步驟(e)之該燒結步驟之燒結溫度係為1100℃至1500℃之間。 The preparation method of claim 1, wherein the sintering temperature of the sintering step of the step (e) is between 1100 ° C and 1500 ° C. 如申請專利範圍第1項之製備方法,其中步驟(e)之該氧化物靶材之密度係介於80%至99%之間。 The preparation method of claim 1, wherein the oxide target of the step (e) has a density of between 80% and 99%. 如申請專利範圍第1項之製備方法,其中步驟(e)之該氧化物靶材之體電阻率係為1×110-2 Ω-cm至1×10-4 Ω-cm之間。The preparation method of claim 1, wherein the oxide target of the step (e) has a bulk resistivity of from 1 × 10 2 -2 Ω-cm to 1 × 10 -4 Ω-cm. 如申請專利範圍第1項之製備方法,其中步驟(d)更包含先混合該氧化鋅粉末與至少一摻雜元素,再進行該成型步驟。 The preparation method of claim 1, wherein the step (d) further comprises first mixing the zinc oxide powder with at least one doping element, and then performing the molding step. 如申請專利範圍第7項之製備方法,其中該摻雜元素係選自一n型摻雜元素。 The preparation method of claim 7, wherein the doping element is selected from an n-type doping element. 如申請專利範圍第8項之製備方法,其中該n型摻雜元素係選自硼(B)、鋁(Al)、鎵(Ga)、銦(In)、釔(Y)、鈧(Sc)、矽(Si)、鍺(Ge)及其混合物所組成之群組之一。 The preparation method of claim 8, wherein the n-type doping element is selected from the group consisting of boron (B), aluminum (Al), gallium (Ga), indium (In), ytterbium (Y), and cerium (Sc). One of the groups consisting of 矽(Si), 锗(Ge), and mixtures thereof. 如申請專利範圍第8項之製備方法,其中該n型摻雜元素之摻雜濃度為1.0至10.0重量百分比(wt%)。 The preparation method of claim 8, wherein the n-type doping element has a doping concentration of 1.0 to 10.0% by weight (wt%). 一種適用於物理氣相沉積之氧化物靶材之製備方法,其包括以下步驟: (a)將一金屬鋅於一石墨坩堝內進行1000℃以上的高溫下熔解以轉換為一鋅蒸汽;(b)導入空氣,將該鋅蒸汽氧化成一氧化鋅粉末,該氧化鋅粉末之純度係為99.0%至99.8%之間;(c)於一冷卻管收集該氧化鋅粉末;(d)混合該氧化鋅粉末與至少一摻雜元素並進行一成型步驟;以及(e)進行一燒結步驟,以形成一適用於物理氣相沉積之氧化物靶材;其中,該氧化鋅粉末含有一碳元素分佈,且該碳元素之重量含量係介於該氧化鋅粉末之50ppm至500ppm之間。 A method for preparing an oxide target suitable for physical vapor deposition, comprising the steps of: (a) melting a metal zinc in a graphite crucible at a high temperature of 1000 ° C or higher to convert it into a zinc vapor; (b) introducing air to oxidize the zinc vapor to a zinc oxide powder, the purity of the zinc oxide powder Between 99.0% and 99.8%; (c) collecting the zinc oxide powder in a cooling tube; (d) mixing the zinc oxide powder with at least one doping element and performing a forming step; and (e) performing a sintering step And forming an oxide target suitable for physical vapor deposition; wherein the zinc oxide powder contains a carbon element distribution, and the carbon element has a weight content of between 50 ppm and 500 ppm of the zinc oxide powder. 如申請專利範圍第11項之製備方法,其中步驟(a)之該金屬鋅係選自一純鋅或一廢鋅原料之一。 The preparation method of claim 11, wherein the metal zinc of the step (a) is selected from one of a pure zinc or a waste zinc raw material. 如申請專利範圍第11項之製備方法,其中步驟(e)之該氧化物靶材之晶粒大小係為2μm至5μm之間。 The preparation method of claim 11, wherein the oxide target of the step (e) has a grain size of between 2 μm and 5 μm. 如申請專利範圍第11項之製備方法,其中步驟(d)之該摻雜元素係選自一n型摻雜元素。 The preparation method of claim 11, wherein the doping element of the step (d) is selected from an n-type doping element. 如申請專利範圍第14項之製備方法,其中該n型摻雜元素係 選自硼(B)、鋁(Al)、鎵(Ga)、銦(In)、釔(Y)、鈧(Sc)、矽(Si)、鍺(Ge)及其混合物所組成之群組之一。 The preparation method of claim 14, wherein the n-type doping element is a group selected from the group consisting of boron (B), aluminum (Al), gallium (Ga), indium (In), yttrium (Y), strontium (Sc), cerium (Si), germanium (Ge), and mixtures thereof One. 如申請專利範圍第14項之製備方法,其中該n型摻雜元素之摻雜濃度為1.0至10.0重量百分比(wt%)。 The preparation method of claim 14, wherein the n-type doping element has a doping concentration of 1.0 to 10.0% by weight (wt%). 如申請專利範圍第11項之製備方法,其中步驟(e)之該燒結步驟之燒結溫度係為1100℃至1500℃之間。 The preparation method of claim 11, wherein the sintering temperature of the sintering step of the step (e) is between 1100 ° C and 1500 ° C. 如申請專利範圍第11項之製備方法,其中步驟(e)之該適用於物理氣相沉積之氧化物靶材之密度係為80%至99%之間。 The preparation method of claim 11, wherein the density of the oxide target suitable for physical vapor deposition in step (e) is between 80% and 99%. 如申請專利範圍第11項之製備方法,其中步驟(e)之該適用於物理氣相沉積之氧化物靶材之體電阻率係介於1×10-2 Ω-cm至1×10-4 Ω-cm之間。The preparation method of claim 11, wherein the oxide resistivity of the oxide target suitable for physical vapor deposition in step (e) is between 1×10 -2 Ω-cm and 1×10 -4 Between Ω-cm.
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