TWI442853B - Method and protection apparatus for protecting a thermal sensitive component in a thermal process - Google Patents

Method and protection apparatus for protecting a thermal sensitive component in a thermal process Download PDF

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Publication number
TWI442853B
TWI442853B TW100139655A TW100139655A TWI442853B TW I442853 B TWI442853 B TW I442853B TW 100139655 A TW100139655 A TW 100139655A TW 100139655 A TW100139655 A TW 100139655A TW I442853 B TWI442853 B TW I442853B
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Taiwan
Prior art keywords
heat sensitive
sensitive component
protection device
substrate
thermoelectric material
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TW100139655A
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Chinese (zh)
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TW201318495A (en
Inventor
Michk Huang
Ben Chiu
Cliff Chen
Theron L Lewis
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Ibm
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Priority to TW100139655A priority Critical patent/TWI442853B/en
Priority to US13/663,811 priority patent/US9059373B2/en
Publication of TW201318495A publication Critical patent/TW201318495A/en
Application granted granted Critical
Publication of TWI442853B publication Critical patent/TWI442853B/en
Priority to US14/734,698 priority patent/US20150362227A1/en
Priority to US14/737,632 priority patent/US20150276275A1/en

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    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F25REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
    • F25BREFRIGERATION MACHINES, PLANTS OR SYSTEMS; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS
    • F25B21/00Machines, plants or systems, using electric or magnetic effects
    • F25B21/02Machines, plants or systems, using electric or magnetic effects using Peltier effect; using Nernst-Ettinghausen effect
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3447Lead-in-hole components
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/18Printed circuits structurally associated with non-printed electric components
    • H05K1/181Printed circuits structurally associated with non-printed electric components associated with surface mounted components
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3457Solder materials or compositions; Methods of application thereof
    • H05K3/3468Applying molten solder
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N10/00Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects
    • H10N10/10Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects operating with only the Peltier or Seebeck effects
    • H10N10/17Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects operating with only the Peltier or Seebeck effects characterised by the structure or configuration of the cell or thermocouple forming the device
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10007Types of components
    • H05K2201/10128Display
    • H05K2201/10136Liquid Crystal display [LCD]
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10007Types of components
    • H05K2201/10219Thermoelectric component
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/04Soldering or other types of metallurgic bonding
    • H05K2203/044Solder dip coating, i.e. coating printed conductors, e.g. pads by dipping in molten solder or by wave soldering
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/11Treatments characterised by their effect, e.g. heating, cooling, roughening
    • H05K2203/1121Cooling, e.g. specific areas of a PCB being cooled during reflow soldering
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/30Details of processes not otherwise provided for in H05K2203/01 - H05K2203/17
    • H05K2203/304Protecting a component during manufacturing
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/22Secondary treatment of printed circuits
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00Metal working
    • Y10T29/49Method of mechanical manufacture
    • Y10T29/49826Assembling or joining

Description

在一熱製程中保護一熱敏感元件的方法及保護裝置Method and protection device for protecting a heat sensitive component in a thermal process

本發明係涉及一種保護裝置及方法。更具體地說,本發明涉及一種在製程中保護熱敏感元件以防止因熱而損壞的保護裝置及方法。The present invention relates to a protection device and method. More particularly, the present invention relates to a protection device and method for protecting a heat sensitive component during processing to prevent damage from heat.

在現今環保意識高漲的趨勢下,於印刷電路板組裝(printed circuit board assembly,PCBA)技術中,無鉛(lead free)製程需求日增。例如過去印刷電路板組裝用的錫鉛焊料轉用為目前較通用的錫銀銅(SAC)合金焊料或錫銅。典型上無鉛焊料的熔點、焊錫溫度、波焊溫度較錫鉛焊料高20~30℃以上,加上無鉛焊料沾錫性較差,一般組裝業者會調高錫溫以改善加工性。In today's high environmental awareness, the demand for lead free processes is increasing in printed circuit board assembly (PCBA) technology. For example, in the past, tin-lead solder for printed circuit board assembly was converted to the current more common tin-silver-copper (SAC) alloy solder or tin-copper. Typically, the melting point, soldering temperature, and wave soldering temperature of lead-free solder are 20~30°C higher than that of tin-lead solder. In addition, the solder-free soldering performance of lead-free solder is poor. Generally, the assembler will increase the tin temperature to improve the processability.

在一般印刷電路板組裝製程中,某些熱敏感元件僅可承受一較低溫度的共晶焊料(eutectic solder)的熱應力(thermal stress),然而對於無鉛製程的高溫需求,這些熱敏感元件卻不適用。例如,常見在一印刷電路板組裝有一液晶顯示器(LCD),此液晶顯示器就無法承受無鉛波焊(wave soldering)製程的熱應力。In a typical printed circuit board assembly process, some heat sensitive components can only withstand the thermal stress of a lower temperature eutectic solder, but for the high temperature requirements of lead-free processes, these heat sensitive components Not applicable. For example, it is common to assemble a liquid crystal display (LCD) on a printed circuit board that cannot withstand the thermal stresses of a wave soldering process.

因應上述熱敏感元件的限制,常使用手工焊接(hand soldering)以將液晶顯示器組裝至液晶顯示器上,然相較於自動化製程,此習用技術並非一可靠的(reliable)製程,不符合成本效益,也較無效率。In view of the limitations of the above-mentioned heat sensitive components, hand soldering is often used to assemble a liquid crystal display onto a liquid crystal display. However, compared to an automated process, this conventional technique is not a reliable process and is not cost effective. Also less efficient.

本發明一方面在印刷電路板組裝製程中,提供一種保護裝置及方法,以保護熱敏感元件並防止因熱而損壞。In one aspect of the invention, in a printed circuit board assembly process, a protection device and method are provided to protect the heat sensitive component from damage due to heat.

本發明一方面在一種無鉛製程中,對於熱敏感元件,提供一可靠的組裝製程,不但符合環保的要求,具高效率的優點,且符合成本效益。In one aspect of the invention, in a lead-free process, a reliable assembly process is provided for the heat sensitive component, which not only meets the requirements of environmental protection, but also has the advantages of high efficiency and is cost-effective.

根據本發明一實施例,一種用於一熱製程中一熱敏感元件的方法:提供一板以設置該熱敏感元件於該板上;提供由一熱電材料所製造且可移除的一保護裝置;以及在該熱製程中以該保護裝置保護該熱敏感元件,其中回應於施加一電壓至該保護裝置,該保護裝置在該熱製程中對該熱敏感元件進行冷卻。In accordance with an embodiment of the invention, a method for a heat sensitive component in a thermal process: providing a plate to place the heat sensitive component on the panel; providing a protective device made of a thermoelectric material and removable And protecting the heat sensitive component with the protection device in the thermal process, wherein in response to applying a voltage to the protection device, the protection device cools the heat sensitive component during the thermal process.

根據本發明另一實施例,該保護裝置包括:一帽蓋本體,在該熱製程中帽蓋(cap)該熱敏感元件且與該熱敏感元件進行熱溝通;以及一電池,導致該熱電材料產生一熱電效應以對該熱敏感元件進行冷卻。According to another embodiment of the present invention, the protection device includes: a cap body in which the heat sensitive element is capped and in thermal communication with the heat sensitive element; and a battery that causes the thermoelectric material A thermoelectric effect is generated to cool the heat sensitive element.

根據本發明另一實施例,該帽蓋本體可包括一第二本體部份及配置於該第二本體部份上的一第一本體部份,其中該一第一本體部份及一第二本體部份其中之一的材料為一P型熱電材料,其中另一的材料為一N型熱電材料。According to another embodiment of the present invention, the cap body can include a second body portion and a first body portion disposed on the second body portion, wherein the first body portion and the second portion One of the materials of the body portion is a P-type thermoelectric material, and the other material is an N-type thermoelectric material.

根據本發明另一實施例,該帽蓋本體包括一第一基體,一第二基體,該第一基體及該第二基體間的一P型熱電材料晶片及一N型熱電材料晶片,及一PN接面之電極,該第一基體及該第二基體可密封以界定一密封空間。在該保護裝置保護該熱敏感元件的步驟前,更包括:對該保護裝置之該密封空間進行抽真空。According to another embodiment of the present invention, the cap body includes a first substrate, a second substrate, a P-type thermoelectric material wafer between the first substrate and the second substrate, and an N-type thermoelectric material wafer, and a The electrodes of the PN junction, the first substrate and the second substrate are sealable to define a sealed space. Before the step of protecting the heat sensitive component by the protection device, the method further comprises: vacuuming the sealed space of the protection device.

根據本發明另一實施例,一種用於一熱製程中一熱敏感元件的保護裝置,該熱敏感元件設置於一板上。該保護裝置包括:一可移除裝置本體,具有一空洞,以容納該熱敏感元件的至少一部分且由一熱電材料所製造,在該熱製程中以保護該熱敏感元件;以及一電池,用以施加一電壓至該可移除裝置本體,以使該保護裝置對該熱敏感元件進行冷卻。In accordance with another embodiment of the present invention, a protection device for a heat sensitive component in a thermal process is disposed on a board. The protection device includes: a removable device body having a cavity to accommodate at least a portion of the heat sensitive component and being fabricated from a thermoelectric material for protecting the heat sensitive component during the thermal process; and a battery for A voltage is applied to the body of the removable device to cause the protective device to cool the heat sensitive element.

根據本發明另一實施例,該可移除裝置本體包括一第二本體部份及配置於該第二本體部份上的一第一本體部份,其中該一第一本體部份及一第二本體部份其中之一的材料為一P型熱電材料,其中另一的材料為一N型熱電材料。According to another embodiment of the present invention, the removable body includes a second body portion and a first body portion disposed on the second body portion, wherein the first body portion and the first body portion One of the two body portions is made of a P-type thermoelectric material, and the other material is an N-type thermoelectric material.

根據本發明另一實施例,該可移除裝置本體包括一第一基體,一第二基體,該第一基體及該第二基體間的一P型熱電材料晶片及一N型熱電材料晶片,及一PN接面之電極,該第一基體及該第二基體可密封以界定一密封空間。在該保護裝置保護該熱敏感元件前,更對該保護裝置之該密封空間進行抽真空。According to another embodiment of the present invention, the removable device body includes a first substrate, a second substrate, a P-type thermoelectric material wafer between the first substrate and the second substrate, and an N-type thermoelectric material wafer. And an electrode of the PN junction, the first substrate and the second substrate are sealable to define a sealed space. Before the protection device protects the heat sensitive component, the sealed space of the protection device is further evacuated.

本說明書中所提及的特色、優點、或類似表達方式並不表示,可以本發明實現的所有特色及優點應在本發明之任何單一的具體實施例內。而是應明白,有關特色及優點的表達方式是指結合具體實施例所述的特定特色、優點、或特性係包括在本發明的至少一具體實施例內。因此,本說明書中對於特色及優點、及類似表達方式的論述與相同具體實施例有關,但亦非必要。The features, advantages, and similar expressions of the present invention are not to be construed as being limited by the scope of the invention. Rather, the specific features, advantages, or characteristics described in connection with the specific embodiments are included in at least one embodiment of the invention. Therefore, the description of features and advantages, and similar expressions in this specification are related to the same specific embodiments, but are not essential.

此外,可以任何合適的方式,在一或多個具體實施例中結合本發明所述特色、優點、及特性。相關技術者應明白,在沒有特定具體實施例之一或多個特定特色或優點的情況下,亦可實施本發明。在其他例子中應明白,特定具體實施例中的其他特色及優點可能未在本發明的所有具體實施例中出現。In addition, the features, advantages, and characteristics of the invention may be combined in any suitable manner in one or more embodiments. It will be apparent to those skilled in the art that the present invention may be practiced without a particular feature or advantage. In other instances, it is apparent that other features and advantages of the specific embodiments may not be present in all embodiments of the invention.

參考以下說明及隨附申請專利範圍或利用如下文所提之本發明的實施方式,即可更加明瞭本發明的這些特色及優點。These features and advantages of the present invention will become more apparent from the description of the appended claims appended claims.

本說明書中「一具體實施例」或類似表達方式的引用是指結合該具體實施例所述的特定特色、結構、或特性係包括在本發明的至少一具體實施例中。因此,在本說明書中,「在一具體實施例中」及類似表達方式之用語的出現未必指相同的具體實施例。A reference to "a particular embodiment" or a similar expression in the specification means that a particular feature, structure, or characteristic described in connection with the specific embodiment is included in at least one embodiment of the invention. Therefore, the appearances of the phrase "in a particular embodiment"

下文以第一圖開始參照附圖說明根據本發明實施例,說明在一熱製程中對於一板上之一熱敏感元件所使用的保護裝置及其方法。第一圖顯示了一個面板(panel)100的一較佳實施例,其包括一板104(例如但不限於一印刷電路板),其上配置一熱敏感元件108(例如但不限於一顯示器模組(display module)),以及其他環繞於顯示器模組108的各種元件,可包括但不限於人機界面(man/machine interface)112,電容116,開關(switch)124,轉換器(transducer)128,記憶體132,微控制器(micro controller)136,壓力感應器140,發光二極體(LED)144,及其他元件(例如電感,電阻,連接器等等)元件等等。上述這些元件都可能是習知元件,像是在許多習知資料處理系統中所使用的元件,可被組態成如本發明所描述而運作。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, a protective device and a method for a heat sensitive component on a board in a thermal process in accordance with an embodiment of the present invention will be described with reference to the accompanying drawings. The first figure shows a preferred embodiment of a panel 100 that includes a board 104 (such as, but not limited to, a printed circuit board) having a heat sensitive component 108 disposed thereon (such as, but not limited to, a monitor module) A display module, and other components surrounding the display module 108, may include, but are not limited to, a man/machine interface 112, a capacitor 116, a switch 124, a transducer 128. , memory 132, micro controller 136, pressure sensor 140, light emitting diode (LED) 144, and other components (such as inductors, resistors, connectors, etc.) components and the like. All of the above elements may be conventional components, such as those used in many conventional data processing systems, and may be configured to operate as described herein.

印刷電路板104係為一種基板,可提供各種元件連接與安裝,且透過不同元件的互相組合而達到特定功效及效果。常見的印刷電路板104包括主機板、顯示卡、面板卡(panel card)、以及無線網卡等等;顯示器模組108可為一液晶顯示器模組、一電漿顯示器模組等等;而上述元件可藉由表面黏著技術(surface mount technology,SMT)結合於電路板上(例如SMT元件),或可以波焊技術(wave soldering)將其固定於電路板上(例如針腳元件),或可以其他連接技術進行結合,本發明均不欲加以限制。The printed circuit board 104 is a kind of substrate, which can provide various components to be connected and mounted, and achieves specific effects and effects through mutual combination of different components. A common printed circuit board 104 includes a motherboard, a display card, a panel card, a wireless network card, and the like; the display module 108 can be a liquid crystal display module, a plasma display module, etc.; It can be bonded to a circuit board (such as an SMT component) by surface mount technology (SMT), or it can be fixed to a circuit board (such as a pin component) by wave soldering, or can be connected. The technology is combined and the invention is not intended to be limited.

一般而言,在波焊製程中,其焊接係利用幫浦將錫爐內之液態錫形成一條長形的錫波,然後利用輸送帶以斜向上升的方式而將電路板通過錫波,因此液態錫在針腳元件之接腳處進孔、填錫,並形成焊點,上述製程為習知波焊製程的一部份,在此不加贅述。In general, in the wave soldering process, the soldering system uses a pump to form a long tin wave into the liquid tin in the tin furnace, and then the board is passed through the tin wave by means of a conveyor belt in a diagonally rising manner. The liquid tin is filled into the hole at the pin of the pin member, filled with tin, and forms a solder joint. The above process is a part of the conventional wave soldering process, and will not be described herein.

表面粘著技術則是將元件直接黏著至印刷電路板之基板的相關技術。在一習知表面粘著技術中,係利用一表面粘著貼裝機(surface mounter machine)配合表面粘著技術,將元件佈設於電路板上,然後進行後續的製程。上述將各元件黏貼至電路板表面上的表面粘著為習知技術的一部份,在此亦不加贅述。同時。但元件與電路板的連接亦可使用其他習用技術形成,本發明並不欲加以限制。Surface adhesion technology is a related technique for directly bonding components to a substrate of a printed circuit board. In a conventional surface sticking technique, a surface mounter machine is used in conjunction with a surface mount technique to lay components onto a circuit board and then perform subsequent processes. The surface sticking of the components to the surface of the board as described above is part of the prior art and will not be described here. Simultaneously. However, the connection of the components to the circuit board can also be formed using other conventional techniques, and the invention is not intended to be limited.

第二圖係根據本發明一較佳實施例,例示了前述板104(例如但不限於印刷電路板),熱敏感元件108(例如但不限顯示器模組,電解電容,或固態電容等等),及保護裝置200及其相關製程的示意圖。印刷電路板104具有一正面202,一背面204,穿孔208,及一印刷電路212。為了使顯示器模組108連接於印刷電路板104上,顯示器模組108具有焊接連接216,因此焊接連接216可穿過穿孔208,進而焊接連接216可焊接至背面204的印刷電路212。換言之,焊接連接216與印刷電路212元件的焊接與顯示器模組108係配置於印刷電路板104的不同表面上。除了熱敏感元件108外,還有其它電子元件288,該等電子元件288可藉由焊接製程,波焊製程,或手焊製程而附著於印刷電路板104上。The second diagram illustrates the aforementioned board 104 (such as but not limited to a printed circuit board), a heat sensitive component 108 (such as but not limited to a display module, an electrolytic capacitor, or a solid capacitor, etc.) in accordance with a preferred embodiment of the present invention. And a schematic diagram of the protection device 200 and its associated processes. The printed circuit board 104 has a front side 202, a back side 204, a through hole 208, and a printed circuit 212. In order to connect the display module 108 to the printed circuit board 104, the display module 108 has a solder connection 216 so that the solder connection 216 can pass through the via 208, and the solder connection 216 can be soldered to the printed circuit 212 of the back side 204. In other words, the soldering of the solder connections 216 to the components of the printed circuit 212 and the display module 108 are disposed on different surfaces of the printed circuit board 104. In addition to the heat sensitive component 108, there are other electronic components 288 that can be attached to the printed circuit board 104 by soldering processes, wave soldering processes, or hand soldering processes.

熱敏感元件108,顧名思義為對熱敏感的元件,且在過熱環境中容易損壞。就與電路板接合的元件而言,一般分為引腳插入型(pin through hole,PTH)及表面黏著型,兩種型式對於熱的忍受度不一樣,典型上引腳插入型對於熱的忍受度大約是110度℃以下,而表面黏著型大概是230度℃以下。就引腳插入型元件而言,以顯示器模組為例,在溫度大約超過100℃,就容易因為熱衝擊或熱疲勞而遭受永久性的損害,而以電解電容或固態電容為例,在溫度大約超過105或110℃,就容易因為電容裂解而遭受永久性的損害。The heat sensitive component 108, as the name implies, is a heat sensitive component and is susceptible to damage in an overheated environment. For components that are bonded to a board, they are generally classified into a pin through hole (PTH) and a surface mount type. The two types have different tolerances to heat, and the pin insertion type is generally resistant to heat. The degree is about 110 degrees ° C or less, and the surface adhesion type is about 230 degrees ° C or less. In the case of a lead-inserted component, in the case of a display module, at a temperature of more than about 100 ° C, it is susceptible to permanent damage due to thermal shock or thermal fatigue, and an electrolytic capacitor or a solid capacitor is taken as an example at a temperature. Above about 105 or 110 ° C, it is easy to suffer permanent damage due to capacitive cracking.

另一方面,為了達到良好的焊接結果,在焊接製程中,顯示器模組108常必須處於高溫環境中一段時間。根據本發明一較佳實施例之波焊製程,顯示器模組108插置於印刷電路板104上,然後慢慢加熱到約70~95℃。接著進行實際的焊接製程,其溫度典型上約為90~95℃,並持續至少30~45秒,之後溫度慢慢下降以進行凝固階段。特別是當使用環保的無鉛焊料時,更要進行一高溫製程,其溫度約95℃,時間約超過30秒,其目的為製造一可靠而良好的的焊點。On the other hand, in order to achieve good soldering results, the display module 108 must often be in a high temperature environment for a period of time during the soldering process. In accordance with a wave soldering process in accordance with a preferred embodiment of the present invention, display module 108 is interposed on printed circuit board 104 and then slowly heated to about 70 to 95 °C. The actual soldering process is then carried out, typically at a temperature of about 90 to 95 ° C for at least 30 to 45 seconds, after which the temperature slowly drops to effect the solidification phase. In particular, when an environmentally-friendly lead-free solder is used, a high-temperature process is carried out at a temperature of about 95 ° C for about 30 seconds, in order to produce a reliable and good solder joint.

回到第二圖,根據本發明一較佳實施例,保護裝置200可包括一具有一空洞258(void)的保護裝置本體260而以空洞258容納熱敏感元件108的至少一部分,且保護裝置本體260由一熱電材料所製造;保護裝置200更可包括一電池264,用以施加一電壓292至保護裝置本體260,以使保護裝置200產生熱電效應而對熱敏感元件108進行冷卻。Returning to the second figure, in accordance with a preferred embodiment of the present invention, the protection device 200 can include a protection device body 260 having a void 258 and receiving at least a portion of the heat sensitive component 108 with a void 258, and protecting the device body The 260 is made of a thermoelectric material; the protection device 200 further includes a battery 264 for applying a voltage 292 to the protection device body 260 to cause the protection device 200 to generate a thermoelectric effect to cool the heat sensitive element 108.

根據本發明一較佳實施例,保護裝置200可包括:一帽蓋本體260,環繞熱敏感元件108的至少一部分且由一熱電材料所製造,在熱製程中以保護熱敏感元件108;以及一電池264,用以施加一電壓292至帽蓋本體260,以使保護裝置200產生熱電效應而對熱敏感元件108進行冷卻。帽蓋本體260可包括一第一本體部份268及一第二本體部份272。一第一本體部份268及一第二本體部份272相連結,且第一本體部份268電耦合至電池264的陽極276,而第二本體部份272電耦合至電池264的陰極280。第一本體部份268的材料可為一P型熱電材料;第二本體部份272的材料可為一N型熱電材料。P型熱電材料和N型熱電材料,可為具有高熱電優值之半導體或半金屬元素或化合物,例如但不限於摻入銻及硒的碲化鉍((BiSb)2(TeSe)3)系列、碲化鉛(PbTe)及鉛錫碲(PbSnTe)系列、半-豪斯勒(Half-Heusler)介金屬合金系列、矽(Si)及矽鍺(SiGe)系列、金屬矽化物(Silicide)之化合物系列、或二硒化鎢(WSe 2)系列等。第一本體部份268與第二本體部份272的形狀可分別為平板形狀、或其他適合形狀;保護裝置200更包括卡合件284,非卡合件或其他類似的結構以利帽蓋的動作,例如側壁、或其他適合形狀,本發明對以上均不欲加以限制。According to a preferred embodiment of the present invention, the protection device 200 can include: a cap body 260 surrounding at least a portion of the heat sensitive component 108 and fabricated from a thermoelectric material to protect the heat sensitive component 108 during the thermal process; The battery 264 is configured to apply a voltage 292 to the cap body 260 to cause the protection device 200 to generate a thermoelectric effect to cool the heat sensitive element 108. The cap body 260 can include a first body portion 268 and a second body portion 272. A first body portion 268 and a second body portion 272 are coupled, and the first body portion 268 is electrically coupled to the anode 276 of the battery 264 and the second body portion 272 is electrically coupled to the cathode 280 of the battery 264. The material of the first body portion 268 may be a P-type thermoelectric material; the material of the second body portion 272 may be an N-type thermoelectric material. P-type thermoelectric materials and N-type thermoelectric materials, which may be semiconductor or semi-metal elements or compounds with high thermoelectric figure of merit, such as, but not limited to, bismuth telluride (BiSb) 2 (TeSe) 3 series doped with antimony and selenium. , PbTe and PbSnTe series, Half-Heusler metal alloy series, Si (Si) and SiGe series, Silicide Compound series, or tungsten selenide (WSe 2) series. The shape of the first body portion 268 and the second body portion 272 may be respectively a flat plate shape or other suitable shape; the protection device 200 further includes a snap member 284, a non-engagement member or the like to facilitate the cap. Actions, such as side walls, or other suitable shapes, are not intended to limit the invention.

在一較佳實施例中,卡合件284可為一對連接可移除帽蓋本體260的彈片,用以卡合熱敏感元件108,且與可移除帽蓋本體260共同作用以在熱製程中帽蓋熱敏感元件108以熱敏感元件108進行熱溝通,進而基於熱電材料的熱電效應以對熱敏感元件108進行冷卻。卡合件284的材料可以為鋁或其它適用的材料,本發明並不欲加以限制。上述帽蓋本體260及/或卡合件284之熱電效應及保護裝置/方法的進一步細節隨後將會有詳盡的描述及說明。In a preferred embodiment, the engaging member 284 can be a pair of elastic pieces connecting the removable cap body 260 for engaging the heat sensitive element 108 and cooperating with the removable cap body 260 to be hot. The cap heat sensitive element 108 in the process communicates thermally with the heat sensitive element 108 to further cool the heat sensitive element 108 based on the thermoelectric effect of the thermoelectric material. The material of the engaging member 284 may be aluminum or other suitable materials, and the invention is not intended to be limited. Further details of the thermoelectric effect and protection device/method of the cap body 260 and/or the engaging member 284 will be described and illustrated in detail later.

根據本發明一較佳實施例,因應上述各種高溫環境,為了有效地保護設置於板104(例如但不限於印刷電路板)上熱敏感元件108(例如但不限顯示器模組),第三圖例示了一種在一熱製程中保護熱敏感元件108的方法300。請參見第一圖至第三圖,方法300包括:提供一板104(步驟304);提供由一熱電材料所製造且可移除的一保護裝置200(請參見第二圖)(步驟308);在熱製程中以保護裝置200保護熱敏感元件108,其中回應於施加一電壓292至保護裝置200,保護裝置200在熱製程中對熱敏感元件108進行冷卻(步驟312);以及在熱製程後,從熱敏感元件上移除保護裝置(步驟316)。In accordance with a preferred embodiment of the present invention, in order to effectively protect the heat sensitive component 108 (e.g., but not limited to a display module) disposed on the board 104 (such as but not limited to a printed circuit board) in response to the various high temperature environments described above, the third diagram A method 300 of protecting a heat sensitive component 108 in a thermal process is illustrated. Referring to the first to third figures, the method 300 includes: providing a board 104 (step 304); providing a protection device 200 (see the second figure) made of a thermoelectric material (see step 308) Protecting the heat sensitive component 108 with the protective device 200 during the thermal process, wherein the protective device 200 cools the heat sensitive component 108 during the thermal process in response to applying a voltage 292 to the protective device 200 (step 312); and in the thermal process Thereafter, the protective device is removed from the heat sensitive component (step 316).

所謂熱電效應是一個由電壓產生溫差的直接轉換,且反之亦然。就一熱電裝置而言,回應於一電壓施加於其上,會產生一溫差,另一方面,當其兩端有溫差時會產生一電壓。熱電效應一般可應用於冷卻物體、加熱物體、產生電力、或測量溫度。The so-called thermoelectric effect is a direct conversion of the temperature difference caused by voltage, and vice versa. In the case of a thermoelectric device, in response to a voltage applied thereto, a temperature difference is generated, and on the other hand, a voltage is generated when there is a temperature difference at both ends. Thermoelectric effects are generally applied to cooling objects, heating objects, generating electricity, or measuring temperature.

熱電效應一般可包括了三個分別經定義過的效應,塞貝克效應(Seebeck effect)、帕爾帖效應(Peltier effect),與湯姆森效應(Thomson effect)。熱電效應應為熟此技藝領域者所習知,進一步可參見例如http://en.wikipedia.org/wiki/Thermoelectric_effect。The thermoelectric effect can generally include three separately defined effects, the Seebeck effect, the Peltier effect, and the Thomson effect. Thermoelectric effects are well known to those skilled in the art, and further see, for example, http://en.wikipedia.org/wiki/Thermoelectric_effect.

第四圖係對塞貝克效應作進一步的解說,在第四圖中,由塞貝克效應產生的電壓可以如下表示,其中S AS B 是金屬A和B的塞貝克係數,T 1T 2 是兩塊金屬結合處的溫度。另一方面,帕爾帖效應即為塞貝克效應的反效應,即當在兩種金屬之迴路中加入電源產生電勢後,不同金屬的接觸點會有一個溫差。The fourth figure is a further explanation of the Seebeck effect. In the fourth figure, the voltage generated by the Seebeck effect can be expressed as follows, where S A and S B are the Seebeck coefficients of metals A and B, T 1 and T 2 is the temperature at the junction of the two metals. On the other hand, the Peltier effect is the inverse effect of the Seebeck effect, that is, when a potential is generated by adding a power source to the circuit of two metals, there is a temperature difference at the contact point of the different metals.

根據本發明一較佳實施例,上述熱製程可為一波焊製程,一SMT回焊製程,一手焊製程,或者一重工製程。更廣義來說,該熱製程可為一印刷電路板製程的一個子製程,例如但不限於一修復(repair)製程,一製造(manufacture)製程,或一重工(rework)製程。According to a preferred embodiment of the present invention, the thermal process may be a wave soldering process, an SMT reflow process, a one hand soldering process, or a rework process. More broadly, the thermal process can be a sub-process of a printed circuit board process such as, but not limited to, a repair process, a manufacturing process, or a rework process.

根據本發明一較佳實施例,第五圖例示了前述板104(例如但不限於印刷電路板),熱敏感元件108(例如但不限顯示器模組,電解電容,或固態電容等等),及保護裝置550及其相關製程的示意圖。如前述,除了熱敏感元件108外,還有其它電子元件288配置於板104之上,該等電子元件288可藉由焊接製程,波焊製程,或手焊製程而附著於印刷電路板104上。In accordance with a preferred embodiment of the present invention, the fifth diagram illustrates the aforementioned board 104 (such as, but not limited to, a printed circuit board), a heat sensitive component 108 (such as but not limited to a display module, an electrolytic capacitor, or a solid capacitor, etc.), And a schematic diagram of the protection device 550 and its associated processes. As described above, in addition to the heat sensitive component 108, other electronic components 288 are disposed on the board 104. The electronic components 288 may be attached to the printed circuit board 104 by a soldering process, a wave soldering process, or a soldering process. .

同理,為了達到良好的焊接結果,熱敏感元件108在焊接製程中,常必須處於高溫環境中一段時間。請參見第五圖,保護裝置550具有一第一基體554,一第二基體558,第一基體554及第二基體558間的P型熱電材料晶片562、N型熱電材料晶片566,及PN接面之電極(未顯示於圖中)。P型熱電材料晶片562以及N型熱電材料晶片566可以相互交錯方式或其他類似、等效方式排列於第一基體554及第二基體558間。第一基體554可為一外殼,第二基體558可為一內殼,藉由焊牢(welding)技術可形成焊牢部分590而密封第一基體(外殼)554及第二基體(內殼)558以形成一密封空間560,以利後續抽真空的動作。類似地,第一基體(外殼)554及第二基體(內殼)558可界定一空洞578而以第二基體(內殼)558容納熱敏感元件108的至少一部分。保護裝置550還具有一電池264,以類似方式施加一電壓292至第一基體(外殼)554及第二基體(內殼)558,以使保護裝置550產生熱電效應而對熱敏感元件108進行冷卻。Similarly, in order to achieve good soldering results, the heat sensitive component 108 must often be in a high temperature environment for a period of time during the soldering process. Referring to FIG. 5, the protection device 550 has a first substrate 554, a second substrate 558, a P-type thermoelectric material wafer 562, a N-type thermoelectric material wafer 566, and a PN connection between the first substrate 554 and the second substrate 558. The electrode of the face (not shown in the figure). The P-type thermoelectric material wafer 562 and the N-type thermoelectric material wafer 566 may be arranged between the first substrate 554 and the second substrate 558 in a staggered manner or in other similar or equivalent manner. The first base 554 can be an outer casing, and the second base 558 can be an inner casing. The welded portion 590 can be formed by a welding technique to seal the first base (the outer casing) 554 and the second base (the inner casing). 558 to form a sealed space 560 for subsequent vacuuming. Similarly, the first substrate (outer casing) 554 and the second substrate (inner casing) 558 can define a void 578 and the second substrate (inner casing) 558 can accommodate at least a portion of the heat sensitive element 108. The protection device 550 also has a battery 264 that applies a voltage 292 to the first substrate (outer casing) 554 and the second substrate (inner casing) 558 in a similar manner to cause the protection device 550 to generate a thermoelectric effect to cool the heat sensitive element 108. .

第一基體(外殼)554及第二基體(內殼)558的材料可以為鋁或其它適用的材料;P型熱電材料晶片562的材料可以為前述的P型熱電材料,N型熱電材料晶片566的材料可以為前述的N型熱電材料;第一基體(外殼)554及第二基體(內殼)558的形狀可分別為帽蓋形狀或其他適合形狀;第一基體(外殼)554及第二基體(內殼)558可直接一體成形,或分別由複數平板焊牢而成並藉由例如焊牢部分594而連結密封,對於以上本發明均不欲加以限制。The material of the first substrate (outer casing) 554 and the second substrate (inner casing) 558 may be aluminum or other suitable materials; the material of the P-type thermoelectric material wafer 562 may be the aforementioned P-type thermoelectric material, and the N-type thermoelectric material wafer 566. The material may be the aforementioned N-type thermoelectric material; the first substrate (outer casing) 554 and the second substrate (inner casing) 558 may be respectively in the shape of a cap or other suitable shape; the first substrate (outer casing) 554 and the second The base (inner casing) 558 may be integrally formed integrally, or may be separately welded by a plurality of flat plates and joined by a sealing portion 594, for example, and the present invention is not intended to be limited.

根據本發明一較佳實施例,因應上述各種高溫環境,為了在各種高溫環境下有效地保護設置於板104(例如但不限於印刷電路板)上熱敏感元件108(例如但不限顯示器模組,電解電容,或固態電容等等),第六圖例示了一種在一熱製程中保護熱敏感元件108的方法660。請參見第一圖至第五圖,方法660包括:提供一板104(步驟664);提供由一熱電材料所製造且可移除的一保護裝置550(請參見第五圖)(步驟668);對保護裝置550進行抽真空(約一大氣壓)(步驟672),該抽真空的步驟可達成隔絕熱傳和增加冷卻的目的;在熱製程中以保護裝置550保護熱敏感元件108,其中回應於施加一電壓292至保護裝置550,保護裝置550在熱製程中對熱敏感元件108進行冷卻(步驟676);以及在熱製程後,從熱敏感元件上移除保護裝置(步驟680)。In accordance with a preferred embodiment of the present invention, heat sensitive components 108 (e.g., but not limited to display modules) disposed on board 104 (such as, but not limited to, a printed circuit board) are effectively protected in various high temperature environments in response to the various high temperature environments described above. The sixth figure illustrates a method 660 of protecting the heat sensitive element 108 in a thermal process. Referring to the first to fifth figures, the method 660 includes: providing a board 104 (step 664); providing a protection device 550 (see FIG. 5) made of a thermoelectric material (see step 668) Vacuuming (about one atmosphere) of the protection device 550 (step 672), the vacuuming step can achieve the purpose of insulating heat transfer and increasing cooling; protecting the heat sensitive component 108 with the protection device 550 during the thermal process, wherein the response Applying a voltage 292 to the protection device 550, the protection device 550 cools the heat sensitive element 108 during the thermal process (step 676); and after the thermal process, removes the protection device from the heat sensitive element (step 680).

第七圖係根據本發明一較佳實施例,例示了在波焊製程中保護一熱敏感元件108的示意圖。在印刷電路板104上,除了熱敏感元件108外,還有其它電子元件508。請參見第一圖至第六圖,其中印刷電路板104具有穿孔208以供熱敏感元件108上之焊接連接216通過。在第七圖中係使用波焊製程以連接焊接連接216至印刷電路板104的印刷電路212(如前述,印刷電路212與熱敏感元件108係分別位於板104的相異面上)。第七圖中所示的波焊製程係使用一習知的波焊機500,包括一隧道504,波焊槽(wave soldering tank)512,以及其它未顯示組成件,包括外殼,輸送裝置(用來將待焊接的工件經由隧道504而輸送),預熱區等等,上述各元件為習知波焊機500的一部份,在此不加贅述。典型的波焊製程的溫度約為90℃至260℃,在波焊製程期間,保護裝置200(或第五圖中的保護裝置550)係熱耦合至熱敏感元件108,使得保護裝置200對熱敏感元件108隔離熱且提供一冷源(cold source)以阻止熱敏感元件200的溫度因波焊製程而上昇。然後在波焊製程的結束後,即可移除保護裝置200。The seventh figure illustrates a schematic diagram of protecting a heat sensitive component 108 during a wave soldering process in accordance with a preferred embodiment of the present invention. On the printed circuit board 104, in addition to the heat sensitive component 108, there are other electronic components 508. Referring to the first to sixth figures, the printed circuit board 104 has perforations 208 for the solder connections 216 on the heat sensitive component 108 to pass. In the seventh diagram, a wave soldering process is used to connect the solder connection 216 to the printed circuit 212 of the printed circuit board 104 (as previously described, the printed circuit 212 and the heat sensitive component 108 are respectively located on opposite sides of the board 104). The wave soldering process shown in the seventh figure uses a conventional wave soldering machine 500, including a tunnel 504, a wave soldering tank 512, and other components not shown, including a housing, and a conveyor (for The workpiece to be welded is conveyed via the tunnel 504, the preheating zone, etc., and the above components are part of the conventional wave soldering machine 500, and are not described herein. The typical wave soldering process has a temperature of about 90 ° C to 260 ° C. During the wave soldering process, the protective device 200 (or the protective device 550 in the fifth figure) is thermally coupled to the heat sensitive element 108 such that the protective device 200 is hot The sensing element 108 isolates heat and provides a cold source to prevent the temperature of the heat sensitive element 200 from rising due to the wave soldering process. The protective device 200 can then be removed after the end of the wave soldering process.

第八圖係例示了在SMT回焊製程中保護一熱敏感元件808的示意圖,根據本發明一較佳實施例,在SMT熱敏感元件808回流焊過程中,SMT熱敏感元件808對於熱的忍受度大約是230度℃,持續時間約20~40秒。然應用第二圖中的保護裝置200(或第五圖中的保護裝置550)可以保護SMT熱敏感元件808在可忍受溫度以下(例如約230度℃以下),其製程時間亦可延長(例如約30~80秒)。請再參見第八圖之較佳實施例所示之技術細節,在印刷電路板104上,除了熱敏感元件108外,還有其它電子元件604,該等電子元件604可藉由一SMT製程而附著於印刷電路板104上。在第八圖中亦例示SMT回焊製程及相關裝置,SMT回焊製程可使用一習知的SMT回焊爐600,包括一回焊爐爐體608,以及其它未顯示組成件,包括一輸送裝置(用來將待回焊的工件經由回焊爐爐體608而輸送,上述各元件為習知SMT回焊爐600的一部份,在此不加贅述。典型的SMT回焊製程的溫度約為183℃至260℃,在SMT回焊製程期間,保護裝置200(或第五圖中的保護裝置550)係熱耦合至熱敏感元件108,使得保護裝置200對熱敏感元件108隔離熱且提供一冷源以阻止熱敏感元件108的溫度因SMT回焊製程而上昇,而維持在約230度℃以下。然後在SMT回焊製程的結束後,即可移除保護裝置200。The eighth figure illustrates a schematic diagram of protecting a heat sensitive component 808 during an SMT reflow process. According to a preferred embodiment of the present invention, the SMT heat sensitive component 808 is resistant to heat during reflow of the SMT thermal sensitive component 808. The degree is about 230 degrees ° C and the duration is about 20 to 40 seconds. However, the application of the protection device 200 in the second figure (or the protection device 550 in the fifth figure) can protect the SMT thermal sensor 808 below the tolerable temperature (eg, below about 230 degrees C), and the process time can be extended (eg, About 30 to 80 seconds). Referring again to the technical details shown in the preferred embodiment of the eighth embodiment, on the printed circuit board 104, in addition to the heat sensitive component 108, there are other electronic components 604 that can be fabricated by an SMT process. Attached to the printed circuit board 104. Also illustrated in the eighth figure is an SMT reflow process and associated apparatus. The SMT reflow process can utilize a conventional SMT reflow oven 600, including a reflow oven body 608, and other components not shown, including a transfer. The device is used to transport the workpiece to be reflowed through the reflow furnace body 608. The above components are part of the conventional SMT reflow furnace 600, and will not be described here. The temperature of a typical SMT reflow process is not mentioned here. About 183 ° C to 260 ° C, during the SMT reflow process, the protection device 200 (or the protection device 550 in the fifth figure) is thermally coupled to the heat sensitive element 108 such that the protection device 200 isolates heat from the heat sensitive element 108 and A cold source is provided to prevent the temperature of the heat sensitive component 108 from rising due to the SMT reflow process, while remaining below about 230 degrees C. The protective device 200 can then be removed after the end of the SMT reflow process.

請再參見第七圖所示之波焊製程,以下就本發明一較佳實施例說明其冷卻的情形。在目標溫度保持在100℃以下的情形,如果期望的溫度是95℃,然目前的溫度是125℃,而製程時間持續約28秒,可應用下面的方程式計算由工件(即熱敏感元件108)所移除(或添加)的熱Q(watts)。Referring again to the wave soldering process shown in the seventh embodiment, a cooling embodiment will be described below in accordance with a preferred embodiment of the present invention. In the case where the target temperature is kept below 100 ° C, if the desired temperature is 95 ° C, and the current temperature is 125 ° C, and the process time lasts for about 28 seconds, the following equation can be used to calculate the workpiece (ie, heat sensitive element 108). The removed (or added) thermal Q (watts).

Q=m Cp (Ts -Tf )/t,其中:Q=m C p (T s -T f )/t, where:

m 為工件之質量(重量)(Kg),m is the mass (weight) of the workpiece (Kg),

Cp  為工件之熱焓比(heat capacity)(J/Kg℃),C p is the heat capacity of the workpiece (J/Kg ° C),

T 為對工件降溫(或升溫)所需的時間(seconds),T is the time required to cool (or warm) the workpiece,

Ts  為起始溫度(℃),T s is the starting temperature (°C),

Tf  為最終溫度(℃)。T f is the final temperature (° C.).

因此,在一工件重量為10.6克且Cp 為0.6 J/Kg℃的實施例中,可如下式計算所移除的熱。Thus, the weight of a workpiece and 10.6 g Example C p is 0.6 J / Kg ℃, the following equation can be calculated to remove the heat.

Q=10.6/1000*1000*0.6*(125-95)/28=6.8Q=10.6/1000*1000*0.6*(125-95)/28=6.8

根據本發明典型示範實施例,在各種熱製程中,熱敏感元件可被有效地保護且確保良好的散熱及冷卻,同時製程/組裝的效率可大幅提高,適用於任何具有熱溫度限制的工件。例如,可以改善習用技術中對於熱敏感元件採用手工焊接或迷你波焊(mini wave soldering)所導致的製程/組裝之效率低落問題,適用於各種製程而節省成本,同時上述耐高溫製程更有效地提高其產品良率。According to an exemplary embodiment of the present invention, heat sensitive components can be effectively protected and ensure good heat dissipation and cooling in various thermal processes, while the efficiency of process/assembly can be greatly improved, and is applicable to any workpiece having a thermal temperature limit. For example, it is possible to improve the efficiency of the process/assembly caused by manual soldering or mini wave soldering in the conventional technology, which is suitable for various processes and saves cost, and the above high temperature process is more effective. Improve the yield of its products.

所描述的典型實施例,係以顯示器模組及具有帽蓋本體之保護裝置為示範而說明,然而各種形式/形狀的保護裝置,例如但不限於環狀本體,套狀本體等等;再者,除了顯示器模組,也適用於其他熱敏感元件,例如但不限於電解電容,或固態電容等等,本發明並不欲加以限制。The exemplary embodiment described is exemplified by a display module and a protection device having a cap body, but various forms/shapes of protection devices such as, but not limited to, an annular body, a sleeve body, etc.; In addition to the display module, it is also applicable to other heat sensitive components such as, but not limited to, electrolytic capacitors, or solid capacitors, etc., and the invention is not intended to be limited.

在不脫離本發明精神或必要特性的情況下,可以其他特定形式來體現本發明。應將所述具體實施例各方面僅視為解說性而非限制性。因此,本發明的範疇如隨附申請專利範圍所示而非如前述說明所示。所有落在申請專利範圍之等效意義及範圍內的變更應視為落在申請專利範圍的範疇內。The present invention may be embodied in other specific forms without departing from the spirit and scope of the invention. The aspects of the specific embodiments are to be considered as illustrative and not restrictive. Accordingly, the scope of the invention is indicated by the appended claims rather All changes that fall within the meaning and scope of the patent application are deemed to fall within the scope of the patent application.

100...面板100. . . panel

104...板,印刷電路板104. . . Board, printed circuit board

108...熱敏感元件,顯示器模組108. . . Heat sensitive component

112...人機界面112. . . HMI

116...電容116. . . capacitance

124...開關124. . . switch

128...轉換器128. . . converter

132...記憶體132. . . Memory

136...微控制器136. . . Microcontroller

140...壓力感應器140. . . Pressure sensor

144...發光二極體144. . . Light-emitting diode

200...保護裝置200. . . protective device

202...正面202. . . positive

204...背面204. . . back

208...穿孔208. . . perforation

212...印刷電路212. . . Printed circuit

216...焊接連接216. . . Welded connection

258...空洞258. . . Empty hole

260...保護裝置本體260. . . Protection device body

264...電池264. . . battery

260...帽狀本體260. . . Cap body

268...第一本體部份268. . . First body part

272...第二本體部份272. . . Second body part

276...陽極276. . . anode

280...陰極280. . . cathode

284...卡合件284. . . Clip

288...電子元件288. . . Electronic component

292...電壓292. . . Voltage

300...方法300. . . method

304...步驟304. . . step

308...步驟308. . . step

312...步驟312. . . step

316...步驟316. . . step

500...波焊機500. . . Wave welder

504...隧道504. . . tunnel

508...電子元件508. . . Electronic component

512...波焊槽512. . . Wave solder bath

550...保護裝置550. . . protective device

554...第一基體554. . . First substrate

558...第二基體558. . . Second substrate

562...P型熱電材料晶片562. . . P-type thermoelectric material wafer

566...N型熱電材料晶片566. . . N-type thermoelectric material wafer

560...密封空間560560. . . Sealed space 560

578...空洞578. . . Empty hole

590...焊牢部分590. . . Welded part

594...焊牢部分594. . . Welded part

600...SMT回焊爐600. . . SMT reflow furnace

604...電子元件604. . . Electronic component

608...回焊爐爐體608. . . Reflow furnace body

660...方法660. . . method

664...步驟664. . . step

668...步驟668. . . step

672...步驟672. . . step

676...步驟676. . . step

680...步驟680. . . step

808...熱敏感元件,顯示器模組808. . . Heat sensitive component

為了立即瞭解本發明的優點,請參考如附圖所示的特定具體實施例,詳細說明上文簡短敘述的本發明。在瞭解這些圖示僅描繪本發明的典型具體實施例並因此不將其視為限制本發明範疇的情況下,參考附圖以額外的明確性及細節來說明本發明,圖式中:In order to immediately understand the advantages of the present invention, the present invention briefly described above will be described in detail with reference to the specific embodiments illustrated in the accompanying drawings. The invention is described with additional clarity and detail with reference to the accompanying drawings in which: FIG.

第一圖為根據本發明一較佳實施例,例示一面板之一較佳實施例的示意圖。The first figure is a schematic diagram illustrating a preferred embodiment of a panel in accordance with a preferred embodiment of the present invention.

第二圖根據本發明一較佳實施例,例示用於熱敏感元件之保護裝置的示意圖。Second Embodiment A schematic diagram of a protection device for a heat sensitive component is illustrated in accordance with a preferred embodiment of the present invention.

第三圖為根據本發明一較佳實施例,例示熱製程中用於保護熱敏感元件的方法的流程圖。The third figure is a flow chart illustrating a method for protecting a heat sensitive component in a thermal process in accordance with a preferred embodiment of the present invention.

第四圖係例示熱電效應之塞貝克效應的示意圖。The fourth figure is a schematic diagram illustrating the Seebeck effect of the thermoelectric effect.

第五圖根據本發明一較佳實施例,例示用於熱敏感元件之保護裝置的示意圖。Fifth Figure is a schematic illustration of a protection device for a heat sensitive component in accordance with a preferred embodiment of the present invention.

第六圖為根據本發明一較佳實施例,例示熱製程中用於保護熱敏感元件的方法的流程圖。Figure 6 is a flow chart illustrating a method for protecting a heat sensitive component in a thermal process in accordance with a preferred embodiment of the present invention.

第七圖為根據本發明一較佳實施例,在波焊製程中保護熱敏感元件的示意圖。Figure 7 is a schematic illustration of the protection of heat sensitive components in a wave soldering process in accordance with a preferred embodiment of the present invention.

第八圖為根據本發明一較佳實施例,在SMT回焊製程中保護一熱敏感元件的示意圖。Figure 8 is a schematic illustration of the protection of a heat sensitive component during an SMT reflow process in accordance with a preferred embodiment of the present invention.

104...板104. . . board

108...熱敏感元件108. . . Heat sensitive component

200...保護裝置200. . . protective device

202...正面202. . . positive

204...背面204. . . back

208...穿孔208. . . perforation

212...印刷電路212. . . Printed circuit

216...焊接連接216. . . Welded connection

258...空洞258. . . Empty hole

260...保護裝置本體260. . . Protection device body

264...電池264. . . battery

260...帽狀本體260. . . Cap body

268...第一本體部份268. . . First body part

272...第二本體部份272. . . Second body part

276...陽極276. . . anode

280...陰極280. . . cathode

284...卡合件284. . . Clip

288...電子元件288. . . Electronic component

292...電壓292. . . Voltage

Claims (15)

一種用於一熱製程中保護一熱敏感元件的方法,該熱敏感元件設置於一板上,包括:提供該板;提供由一熱電材料所製造且可移除的一保護裝置;以及在該熱製程中以該保護裝置保護該熱敏感元件,其中回應於施加一電壓至該保護裝置,該保護裝置在該熱製程中對該熱敏感元件進行冷卻。A method for protecting a heat sensitive component in a thermal process, the heat sensitive component being disposed on a board, comprising: providing the board; providing a protective device made of a thermoelectric material and removable; and The heat sensitive component is protected by the protective device during the thermal process, wherein in response to applying a voltage to the protective device, the protective device cools the thermally sensitive component during the thermal process. 如請求項1之方法,其中該熱製程為一印刷電路板製程的一個子製程,且該印刷電路板製程可選自由一製造(manufacture)製程,一修復(repair)製程,以及一重工製程所組成的群體。The method of claim 1, wherein the thermal process is a sub-process of a printed circuit board process, and the printed circuit board process is selectable from a manufacturing process, a repair process, and a rework process. The group that makes up. 如請求項1之方法,其中該熱製程為一波焊製程,該波焊製程的溫度約為90℃至260℃,且該板包括穿孔以供該熱敏感元件上之焊接連接(solder connection)通過;或其中該熱製程為一SMT回焊製程,該SMT回焊製程的溫度約為183°C至260℃,且該板更包括藉由一SMT製程而附著於其上的電子元件。The method of claim 1, wherein the thermal process is a wave soldering process, the wave soldering process has a temperature of about 90 ° C to 260 ° C, and the plate includes a perforation for a solder connection on the heat sensitive component. Passing; or wherein the thermal process is an SMT reflow process, the temperature of the SMT reflow process is about 183 ° C to 260 ° C, and the board further includes electronic components attached thereto by an SMT process. 如請求項1之方法,更包括:使用一波焊製程以連接該焊接連接至該板的一印刷電路,其中該印刷電路與該熱敏感元件係分別位於該板的相異面上;以及回應於該波焊製程的結束,移除該保護裝置。The method of claim 1, further comprising: using a wave soldering process to connect the solder circuit to a printed circuit of the board, wherein the printed circuit and the heat sensitive component are respectively located on opposite sides of the board; and responding At the end of the wave soldering process, the protection device is removed. 如請求項4之方法,其中在該波焊製程期間,該保護裝置係熱耦合至該熱敏感元件,使得該保護裝置對該熱敏感元件隔離熱且因一熱電效應而提供一冷源(cold source)以阻止該熱敏感元件的溫度因該波焊製程而上昇。The method of claim 4, wherein during the wave soldering process, the protection device is thermally coupled to the heat sensitive component such that the protective device isolates heat from the heat sensitive component and provides a cold source due to a thermoelectric effect (cold Source) to prevent the temperature of the heat sensitive component from rising due to the wave soldering process. 如請求項1之方法,其中該保護裝置包括:一帽蓋本體,在該熱製程中帽蓋該熱敏感元件且與該熱敏感元件進行熱溝通;以及一電池,導致該熱電材料產生一熱電效應以對該熱敏感元件進行冷卻。The method of claim 1, wherein the protection device comprises: a cap body in which the heat sensitive component is capped and in thermal communication with the heat sensitive component; and a battery that causes the thermoelectric material to generate a thermoelectric The effect is to cool the heat sensitive element. 如請求項6之方法,其中該帽蓋本體包括一第二本體部份及配置於該第二本體部份上的一第一本體部份,其中該一第一本體部份及一第二本體部份其中之一的材料為一P型熱電材料,其中另一的材料為一N型熱電材料。The method of claim 6, wherein the cap body comprises a second body portion and a first body portion disposed on the second body portion, wherein the first body portion and the second body One of the materials is a P-type thermoelectric material, and the other material is an N-type thermoelectric material. 如請求項6之方法,其中該帽蓋本體包括一第一基體,一第二基體,該第一基體及該第二基體間的一P型熱電材料晶片及一N型熱電材料晶片,及一PN接面之電極,該第一基體及該第二基體可密封以界定一密封空間。The method of claim 6, wherein the cap body comprises a first substrate, a second substrate, a P-type thermoelectric material wafer and an N-type thermoelectric material wafer between the first substrate and the second substrate, and a The electrodes of the PN junction, the first substrate and the second substrate are sealable to define a sealed space. 如請求項8之方法,在該保護裝置保護該熱敏感元件的步驟前,更包括:對該保護裝置之該密封空間進行抽真空。The method of claim 8, before the step of protecting the heat sensitive component by the protection device, further comprising: evacuating the sealed space of the protection device. 一種保護裝置,用於一熱製程中一熱敏感元件,該熱敏感元件設置於一板上,包括:一可移除裝置本體,具有一空洞,以容納該熱敏感元件的至少一部分且由一熱電材料所製造,在該熱製程中以保護該熱敏感元件;以及一電池,用以施加一電壓至該可移除裝置本體,以使該保護裝置對該熱敏感元件進行冷卻。A protection device for a heat sensitive component in a thermal process, the heat sensitive component being disposed on a board, comprising: a removable device body having a cavity to receive at least a portion of the heat sensitive component and comprising A thermoelectric material is fabricated in the thermal process to protect the heat sensitive component; and a battery for applying a voltage to the removable device body to cause the protective device to cool the heat sensitive component. 如請求項10之保護裝置,其中該熱製程可選自由一波焊製程,一SMT回焊製程,一手焊製程,以及一重工(rework)製程所組成的群體。The protection device of claim 10, wherein the thermal process is selected from the group consisting of a wave soldering process, an SMT reflow process, a one-hand soldering process, and a rework process. 如請求項10之保護裝置,其中該熱製程為一波焊製程,該波焊製程的溫度約為90℃至260℃,且該板包括穿孔以供該熱敏感元件上之焊接連接通過;或其中該熱製程為一SMT回焊製程,該SMT回焊製程的溫度約為183℃至260℃,且該板更包括藉由一SMT回焊製程而附著於其上的電子元件。The protection device of claim 10, wherein the thermal process is a wave soldering process, the wave soldering process has a temperature of about 90 ° C to 260 ° C, and the plate includes a perforation for the solder joint on the heat sensitive component to pass; or The hot process is an SMT reflow process, the temperature of the SMT reflow process is about 183 ° C to 260 ° C, and the board further includes electronic components attached thereto by an SMT reflow process. 如請求項10之保護裝置,其中該可移除裝置本體,包括一第二本體部份及配置於該第二本體部份上的一第一本體部份,其中該一第一本體部份及一第二本體部份其中之一的材料為一P型熱電材料,其中另一的材料為一N型熱電材料。The protection device of claim 10, wherein the removable device body comprises a second body portion and a first body portion disposed on the second body portion, wherein the first body portion and One of the second body portions is made of a P-type thermoelectric material, and the other material is an N-type thermoelectric material. 如請求項10之保護裝置,其中該可移除裝置本體包括一第一基體,一第二基體,該第一基體及該第二基體間的一P型熱電材料晶片及一N型熱電材料晶片,及一PN接面之電極,該第一基體及該第二基體可密封以界定一密封空間。The protection device of claim 10, wherein the removable device body comprises a first substrate, a second substrate, a P-type thermoelectric material wafer and an N-type thermoelectric material wafer between the first substrate and the second substrate And an electrode of a PN junction, the first substrate and the second substrate are sealable to define a sealed space. 如請求項14之保護裝置,在該保護裝置保護該熱敏感元件前,更對該保護裝置之該密封空間進行抽真空。The protection device of claim 14, wherein the sealed space of the protection device is evacuated before the protection device protects the heat sensitive component.
TW100139655A 2011-10-31 2011-10-31 Method and protection apparatus for protecting a thermal sensitive component in a thermal process TWI442853B (en)

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US13/663,811 US9059373B2 (en) 2011-10-31 2012-10-30 Protecting a thermal sensitive component in a thermal process
US14/734,698 US20150362227A1 (en) 2011-10-31 2015-06-09 Method and protection apparatus for protecting a thermal sensitive component in a thermal process
US14/737,632 US20150276275A1 (en) 2011-10-31 2015-06-12 Method and protection apparatus for protecting a thermal sensitive component in a thermal process

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