TWI438990B - 用於產生超音波之改良中紅外線雷射 - Google Patents

用於產生超音波之改良中紅外線雷射 Download PDF

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Publication number
TWI438990B
TWI438990B TW098116307A TW98116307A TWI438990B TW I438990 B TWI438990 B TW I438990B TW 098116307 A TW098116307 A TW 098116307A TW 98116307 A TW98116307 A TW 98116307A TW I438990 B TWI438990 B TW I438990B
Authority
TW
Taiwan
Prior art keywords
laser
yag
wavelength
output
frequency converter
Prior art date
Application number
TW098116307A
Other languages
English (en)
Chinese (zh)
Other versions
TW201010217A (en
Inventor
Thomas E Drake
Marc Dubois
Peter W Lorraine
John B Deaton
Robert Filkins
Original Assignee
Lockheed Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lockheed Corp filed Critical Lockheed Corp
Publication of TW201010217A publication Critical patent/TW201010217A/zh
Application granted granted Critical
Publication of TWI438990B publication Critical patent/TWI438990B/zh

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22Details, e.g. general constructional or apparatus details
    • G01N29/24Probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1702Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1702Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
    • G01N2021/1706Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids in solids
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N2021/8472Investigation of composite materials

Landscapes

  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Lasers (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
TW098116307A 2008-05-15 2009-05-15 用於產生超音波之改良中紅外線雷射 TWI438990B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US12/120,949 US8064488B2 (en) 2008-05-15 2008-05-15 Mid-IR laser for generation of ultrasound

Publications (2)

Publication Number Publication Date
TW201010217A TW201010217A (en) 2010-03-01
TWI438990B true TWI438990B (zh) 2014-05-21

Family

ID=40875178

Family Applications (1)

Application Number Title Priority Date Filing Date
TW098116307A TWI438990B (zh) 2008-05-15 2009-05-15 用於產生超音波之改良中紅外線雷射

Country Status (10)

Country Link
US (1) US8064488B2 (enExample)
EP (1) EP2286202A1 (enExample)
JP (1) JP5396671B2 (enExample)
KR (1) KR101622418B1 (enExample)
CN (1) CN102077079B (enExample)
BR (1) BRPI0912757A2 (enExample)
CA (1) CA2725457A1 (enExample)
IL (1) IL209293A (enExample)
TW (1) TWI438990B (enExample)
WO (1) WO2009140474A1 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012019189A2 (en) 2010-08-06 2012-02-09 Par Systems, Inc. Containerized systems
KR101989155B1 (ko) 2012-08-01 2019-06-17 삼성전자주식회사 초음파 변환기, 이를 포함하는 초음파 발생 장치 및 시스템
US10839509B2 (en) 2015-07-10 2020-11-17 3Scan Inc. Spatial multiplexing of histological stains

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3249877B2 (ja) * 1994-03-24 2002-01-21 東京瓦斯株式会社 発振波長切替式レーザ装置および気体の濃度測定装置
US6025547A (en) * 1998-03-10 2000-02-15 Pioneer Hi-Bred International, Inc. Inbred maize line PH1CA
US6795198B1 (en) * 1998-05-28 2004-09-21 Martin Fuchs Method and device for measuring thin films and semiconductor substrates using reflection mode geometry
US6633384B1 (en) 1998-06-30 2003-10-14 Lockheed Martin Corporation Method and apparatus for ultrasonic laser testing
US7286241B2 (en) 1999-06-24 2007-10-23 Lockheed Martin Corporation System and method for high-speed laser detection of ultrasound
US6335943B1 (en) * 1999-07-27 2002-01-01 Lockheed Martin Corporation System and method for ultrasonic laser testing using a laser source to generate ultrasound having a tunable wavelength
JP2001352118A (ja) * 2000-06-08 2001-12-21 Cyber Laser Kk 光源装置および同光源装置を使用したレーザ装置
US6756528B1 (en) * 2001-01-12 2004-06-29 Pioneer Hi-Bred International, Inc. Inbred maize line PH6KW
US7370532B2 (en) 2002-01-11 2008-05-13 Lockheed Martin Corporation RF communications method and system for laser ultrasonic testing
US7369250B2 (en) * 2005-03-25 2008-05-06 Lockheed Martin Corporation System and method to inspect components having non-parallel surfaces
CN1332481C (zh) * 2005-06-03 2007-08-15 厦门大学 1052nm连续波瓦级Nd:YAG全固体激光器
US7784348B2 (en) * 2006-12-22 2010-08-31 Lockheed Martin Corporation Articulated robot for laser ultrasonic inspection

Also Published As

Publication number Publication date
KR101622418B1 (ko) 2016-05-18
TW201010217A (en) 2010-03-01
JP2011522227A (ja) 2011-07-28
WO2009140474A1 (en) 2009-11-19
KR20110010113A (ko) 2011-01-31
CN102077079A (zh) 2011-05-25
EP2286202A1 (en) 2011-02-23
US20090285244A1 (en) 2009-11-19
US8064488B2 (en) 2011-11-22
BRPI0912757A2 (pt) 2016-05-17
CA2725457A1 (en) 2009-11-19
IL209293A0 (en) 2011-01-31
IL209293A (en) 2013-03-24
JP5396671B2 (ja) 2014-01-22
AU2009246278A1 (en) 2009-11-19
CN102077079B (zh) 2014-07-09

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MM4A Annulment or lapse of patent due to non-payment of fees