TWI438461B - - Google Patents

Info

Publication number
TWI438461B
TWI438461B TW101101282A TW101101282A TWI438461B TW I438461 B TWI438461 B TW I438461B TW 101101282 A TW101101282 A TW 101101282A TW 101101282 A TW101101282 A TW 101101282A TW I438461 B TWI438461 B TW I438461B
Authority
TW
Taiwan
Application number
TW101101282A
Other languages
Chinese (zh)
Other versions
TW201329483A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW101101282A priority Critical patent/TW201329483A/en
Priority to CN201210462130.8A priority patent/CN103207293B/en
Publication of TW201329483A publication Critical patent/TW201329483A/en
Application granted granted Critical
Publication of TWI438461B publication Critical patent/TWI438461B/zh

Links

TW101101282A 2012-01-12 2012-01-12 Probe pressure calibration method and calibration apparatus thereof TW201329483A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW101101282A TW201329483A (en) 2012-01-12 2012-01-12 Probe pressure calibration method and calibration apparatus thereof
CN201210462130.8A CN103207293B (en) 2012-01-12 2012-11-16 Probe needle pressure correction method and correction equipment thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW101101282A TW201329483A (en) 2012-01-12 2012-01-12 Probe pressure calibration method and calibration apparatus thereof

Publications (2)

Publication Number Publication Date
TW201329483A TW201329483A (en) 2013-07-16
TWI438461B true TWI438461B (en) 2014-05-21

Family

ID=48754578

Family Applications (1)

Application Number Title Priority Date Filing Date
TW101101282A TW201329483A (en) 2012-01-12 2012-01-12 Probe pressure calibration method and calibration apparatus thereof

Country Status (2)

Country Link
CN (1) CN103207293B (en)
TW (1) TW201329483A (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI498565B (en) * 2013-12-11 2015-09-01 Mpi Corp Probe system, probe height adjusting method, and probe position sensing method
TWI522637B (en) 2013-12-13 2016-02-21 Mpi Corp Detection of the operation of the system
TWI526132B (en) * 2013-12-13 2016-03-11 Mpi Corp Correction film structure
TWI516786B (en) * 2013-12-13 2016-01-11 Mpi Corp Detection and debugging of the system
TWI503556B (en) * 2013-12-31 2015-10-11 Mpi Corp Detection and operation of detection system
CN103855049B (en) * 2014-03-27 2016-08-17 上海华力微电子有限公司 A kind of intelligent probe card pin pressure control system and control method
CN104251923B (en) * 2014-09-17 2017-06-30 大族激光科技产业集团股份有限公司 Measure with two cable probe unit and its application process
JP6436321B2 (en) * 2015-04-09 2018-12-12 株式会社村田製作所 Method and apparatus for measuring electrical characteristics of electronic parts
CN110045269A (en) * 2019-05-09 2019-07-23 肇庆学院 A kind of apparatus for testing chip and method
CN110187259A (en) * 2019-06-10 2019-08-30 德淮半导体有限公司 A kind of adjustment system and method for adjustment preventing probe mark shift in wafer test
CN112014710B (en) * 2020-08-27 2023-04-21 泉芯集成电路制造(济南)有限公司 Acupressure adaptation method, acupressure adaptation device, acupressure equipment and readable storage medium
CN113075525B (en) * 2021-04-14 2022-03-22 东莞市谷麦光学科技有限公司 Voltage correction method for LED light splitting station

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI302201B (en) * 2006-04-11 2008-10-21 Promos Technologies Inc Inspecting method and adjusting method of pressure of probe
CN200959017Y (en) * 2006-08-14 2007-10-10 北京京城清达电子设备有限公司 Probe applicating mechanism
JP5101152B2 (en) * 2007-04-11 2012-12-19 日置電機株式会社 Circuit board inspection equipment
JP5074878B2 (en) * 2007-10-15 2012-11-14 東京エレクトロン株式会社 Inspection device
CN101726673B (en) * 2008-10-16 2012-12-05 旺矽科技股份有限公司 Spot measurement device
TWI398650B (en) * 2009-04-20 2013-06-11 Chroma Ate Inc Device and method for controlling test current of chip prober

Also Published As

Publication number Publication date
CN103207293B (en) 2016-01-06
TW201329483A (en) 2013-07-16
CN103207293A (en) 2013-07-17

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