TWI416086B - Strain measurement devic and measurement method - Google Patents

Strain measurement devic and measurement method Download PDF

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TWI416086B
TWI416086B TW99101725A TW99101725A TWI416086B TW I416086 B TWI416086 B TW I416086B TW 99101725 A TW99101725 A TW 99101725A TW 99101725 A TW99101725 A TW 99101725A TW I416086 B TWI416086 B TW I416086B
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strain
strain gauge
carbon nanotube
gauge
transverse
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TW99101725A
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TW201126150A (en
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Lu-Zhou Chen
Chang-Hong Liu
Jia-Ping Wang
Shou-Shan Fan
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Hon Hai Prec Ind Co Ltd
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  • Carbon And Carbon Compounds (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Abstract

The invention provides a strain measurement device, which includes a strain sheet, a clamp device for clamping and stretching said strain sheet. The strain sheet will generate longitudinal strain in stretched direction and a transversal strain in the direction perpendicular to the stretched directions, and a transversal strain recorder used for measuring said transversal strain of the strain sheet. The strain sheet contains a carbon nanotube film structure where the carbon nanotube film structure has a plurality of carbon nanotubes, the carbon nanotubes are respectively arranged in preferable orientations along a first and a second directions. The carbon nanotubes arranged in a preferable and predetermined orientation along a first direction are overlapped and crossed with those arranged in a preferable and predetermined orientation along a second direction, and an inclined angle between the first direction and the second direction is greater than zero degree and less than one hundred and eighty degrees.

Description

應變測量裝置及測量方法Strain measuring device and measuring method

本發明涉及一種應變測量裝置及測量方法,尤其涉及一種基於碳納米管的應變測量裝置及採用該應變裝置的測量方法。The present invention relates to a strain measuring device and a measuring method, and more particularly to a carbon nanotube-based strain measuring device and a measuring method using the same.

“應變”就是由於外力作用所產生的改變。應變計使用電阻來表示由外力引起的應變大小。應變計有多種不同的類型,最常見的就是電阻應變片。電阻應變片是一種將被測件上的應變變化轉換成為一種電信號的敏感器件。電阻應變片應用最多的是金屬電阻應變片和半導體應變片兩種。金屬電阻應變片又有絲狀應變片和金屬箔狀應變片兩種。通常是將應變片通過特殊的黏和劑緊密的黏合在產生力學應變基體上,當基體受力發生應力變化時,電阻應變片也一起產生形變,使應變片的阻值發生改變,從而使加在電阻上的電壓發生變化。這種應變片在受力時產生的阻值變化通常較小,一般這種應變片都組成應變電橋,並通過後續的儀錶放大器進行放大,再傳輸給處理電路(通常是A/D 轉換和CPU)顯示或執行機構。"Strain" is the change caused by the action of external forces. Strain gauges use electrical resistance to indicate the amount of strain caused by an external force. There are many different types of strain gauges, the most common being resistance strain gauges. A strain gage is a sensitive device that converts the strain change on the device under test into an electrical signal. The most widely used resistance strain gauges are metal resistance strain gauges and semiconductor strain gauges. The metal resistance strain gauge has two kinds of filament strain gauges and metal foil strain gauges. Usually, the strain gauge is tightly bonded to the mechanical strain matrix by a special adhesive. When the stress changes due to the force of the substrate, the strain gauges are also deformed together, so that the resistance of the strain gauge changes, thereby adding The voltage across the resistor changes. The strain gauges typically have a small change in resistance when stressed. Typically, such strain gauges form a strain bridge and are amplified by a subsequent instrumentation amplifier and transmitted to the processing circuitry (usually A/D conversion and CPU) display or actuator.

這種測量應變的裝置存在很多缺點,比如電阻的取值範圍應注意:阻值太小,所需的驅動電流太大,同時應變片的發熱致使本身的溫度過高,不同的環境中使用,使應變片的阻值變化太大,輸出零點漂移明顯,調零電路過於複雜。而電阻太大,阻抗太高,抗外界的電磁幹擾能力較差。一般均為幾十歐至幾十千歐左右。另外為了實現應變放大的功能,都需要搭接一套後續電路系統,笨重複雜,不利於測量微小物體的形變。This type of strain measuring device has many disadvantages. For example, the value range of the resistor should be noted that the resistance value is too small, the required driving current is too large, and the heat of the strain gauge causes the temperature itself to be too high, and is used in different environments. The resistance value of the strain gauge is changed too much, the output zero drift is obvious, and the zero adjustment circuit is too complicated. The resistance is too large, the impedance is too high, and the ability to resist external electromagnetic interference is poor. Generally, it is about tens of euros to several tens of kiloohms. In addition, in order to realize the function of strain amplification, it is necessary to lap a set of subsequent circuit systems, which is cumbersome and complicated, and is not conducive to measuring deformation of minute objects.

有鑒於此,提供一種新型的應變測量裝置及採用該應變測量裝置測量應變的方法實為必要,該應變測量裝置結構簡單,有利於測量物體的微小形變。In view of this, it is necessary to provide a novel strain measuring device and a method for measuring strain using the strain measuring device, which is simple in structure and is advantageous for measuring minute deformation of an object.

一種應變測量裝置,其包括:一應變片;一用於夾持並拉伸所述應變片的夾持裝置,所述應變片在拉伸方向上產生縱向應變,在垂直於拉伸方向上產生橫向應變;以及一用於測量所述應變片的橫向應變的橫向應變記錄器。所述應變片包括一奈米碳管膜結構,該奈米碳管膜結構包括多個奈米碳管,所述多個奈米碳管分別沿一第一方向與一第二方向擇優取向排列,沿第一方向擇優取向定向排列的奈米碳管與沿第二方向定向擇優取向排列的奈米碳管重疊交叉設置,所述第一方向與第二方向具有一夾角,所述夾角大於0度小於180度,使用時,應變片中沿所述第一方向與第二方向的夾角的平分線的方向與所述拉伸方向一致。A strain measuring device comprising: a strain gauge; a clamping device for clamping and stretching the strain gauge, the strain gauge generates longitudinal strain in a tensile direction, and is generated perpendicular to the tensile direction Transverse strain; and a transverse strain logger for measuring the transverse strain of the strain gauge. The strain gauge comprises a carbon nanotube membrane structure, the carbon nanotube membrane structure comprises a plurality of carbon nanotubes, and the plurality of carbon nanotubes are respectively arranged along a first direction and a second direction. And the carbon nanotubes aligned in the first direction and the aligned orientations of the carbon nanotubes are arranged in an overlapping manner, wherein the first direction has an angle with the second direction, and the angle is greater than 0. The degree is less than 180 degrees, and in use, the direction of the bisector of the angle between the first direction and the second direction in the strain gauge coincides with the stretching direction.

一種測量應變的方法,包括以下步驟:首先,提供一上述應變測量裝置;其次,對所述應變片的拉伸進行標定,獲得應變片的橫向應變與縱向應變的函數關係;再次,提供一待測樣品,將所述應變片與該待測樣片貼合;最後,將所述貼合有應變片的待測樣品固定於所述夾持裝置,對該待測樣品施加縱向的拉力,通過橫向應變記錄器測量待測樣品的橫向應變,通過資料處理裝置計算待測樣品的縱向應變。A method for measuring strain, comprising the steps of: firstly providing a strain measuring device; secondly, calibrating the strain of the strain gauge to obtain a transverse strain as a function of longitudinal strain of the strain gauge; Measuring the sample, bonding the strain gauge to the sample to be tested; finally, fixing the sample to be tested to which the strain gauge is attached is fixed to the clamping device, applying a longitudinal tensile force to the sample to be tested, and passing the transverse direction The strain logger measures the transverse strain of the sample to be tested, and calculates the longitudinal strain of the sample to be tested by the data processing device.

與先前技術相比較,所述應變測量裝置採用包括奈米碳管膜結構的應變片測量待測樣品的應變,且無需後續電路系統,使得測量方法簡單,容易操作,且更加容易實現。Compared with the prior art, the strain measuring device measures the strain of the sample to be tested by using a strain gauge including a carbon nanotube film structure, and does not require a subsequent circuit system, making the measuring method simple, easy to operate, and easier to implement.

下面將結合附圖及具體實施例對本發明進行詳細說明。The invention will be described in detail below with reference to the drawings and specific embodiments.

請參考圖1,本發明實施例提供一種應變測量裝置100,所述應變測量裝置100包括一橫向應變記錄器102,一夾持裝置108,一應變片12以及一資料處理裝置101。所述一夾持裝置108包括一第一夾持器104以及一第二夾持器106,所述第一夾持器104及第二夾持器106可以相對移動。所述資料處理裝置101通過資料線與所述橫向應變記錄器102電連接,從而可以實現資料傳輸。使用時,可將所述應變片12鋪設於一待測樣品16的表面,並將待測樣品16相對的兩端與所述應變片12接觸的部分黏結在一起,然後將待測樣品16相對的兩端分別固定於所述第一夾持器104以及所述第二夾持器106,通過使所述第一夾持器104以及所述第二夾持器106相對移動,對所述應變片12及待測樣品16施加應力。Referring to FIG. 1 , an embodiment of the present invention provides a strain measuring device 100 . The strain measuring device 100 includes a transverse strain recorder 102 , a clamping device 108 , a strain gauge 12 , and a data processing device 101 . The clamping device 108 includes a first holder 104 and a second holder 106. The first holder 104 and the second holder 106 are relatively movable. The data processing device 101 is electrically connected to the lateral strain recorder 102 through a data line, so that data transmission can be realized. In use, the strain gauge 12 can be laid on the surface of a sample 16 to be tested, and the opposite ends of the sample 16 to be tested are bonded to the portion in contact with the strain gauge 12, and then the sample 16 to be tested is relatively The two ends are respectively fixed to the first holder 104 and the second holder 106, and the strain is applied by relatively moving the first holder 104 and the second holder 106. The sheet 12 and the sample to be tested 16 are subjected to stress.

所述夾持裝置108用於固定並拉伸所述待測樣品16以及應變片12。所述第一夾持器104與所述第二夾持器106均具有一夾持端,該夾持端可以將表面貼有應變片12的待測樣品16固定。所述第一夾持器104及第二夾持器106可以採用金屬、陶瓷或塑膠製成。The clamping device 108 is used to fix and stretch the sample 16 to be tested and the strain gauge 12 . The first holder 104 and the second holder 106 each have a clamping end, and the clamping end can fix the sample 16 to be tested with the strain gauge 12 on the surface. The first holder 104 and the second holder 106 may be made of metal, ceramic or plastic.

所述橫向應變記錄器102用於測量所述應變片12的橫向應變,該橫向應變記錄器102可以記錄所述應變片12在初態的橫向長度,以及在受到應力時的橫向長度。該橫向應變記錄器102可以為數碼相機、攝像機、攝像頭等,用於記錄物體形態的圖像記錄裝置。本實施例中,所述橫向應變記錄器102為一數碼相機。The transverse strain recorder 102 is used to measure the transverse strain of the strain gauge 12, and the transverse strain recorder 102 can record the lateral length of the strain gauge 12 in the initial state and the lateral length when subjected to stress. The lateral strain recorder 102 can be a digital camera, a video camera, a camera, etc., for recording an image recording device in the form of an object. In this embodiment, the lateral strain recorder 102 is a digital camera.

所述資料處理裝置101用於計算所述應變片12的縱向應變。該資料處理裝置101為具有資料計算功能的計算裝置,具體可以為小型電腦、筆記本、伺服器或巨型電腦。本實施例中,該資料處理裝置101為小型電腦。The data processing device 101 is used to calculate the longitudinal strain of the strain gauge 12. The data processing device 101 is a computing device having a data calculation function, and specifically may be a small computer, a notebook, a server, or a supercomputer. In this embodiment, the data processing device 101 is a small computer.

所述應變片12為具有一定厚度的片材,可以根據待測樣品16表面的形狀任意裁減。請參閱圖2,本實施例中,該應變片12為一奈米碳管膜結構。該奈米碳管膜結構由多個奈米碳管145沿膜表面延伸排列形成,其中部分奈米碳管145基本沿一第一方向X擇優取向排列,另一部分奈米碳管145基本沿一第二方向Y擇優取向排列。所述第一方向X與第二方向Y成一定角度α,α大於0度小於180度。且基本沿第一方向X定向排列的奈米碳管145與基本沿第二方向Y定向排列的奈米碳管145相互交叉形成多個網格。當沿著與該應變片12中第一方向X或第二方向Y夾角的平分線的方向拉伸該應變片12時,該應變片12在垂直於該拉伸方向上將發生收縮;而當沿著與該應變片12中第一方向X或第二方向Y夾角的平分線的方向壓縮該應變片12時,該應變片12在垂直於壓縮方向發生膨脹。因此,該應變片12具有正泊松比的性質。本實施例中,α角為90度。The strain gauge 12 is a sheet having a certain thickness and can be arbitrarily cut according to the shape of the surface of the sample 16 to be tested. Referring to FIG. 2, in the embodiment, the strain gauge 12 is a carbon nanotube film structure. The carbon nanotube film structure is formed by extending a plurality of carbon nanotubes 145 along the surface of the film, wherein a portion of the carbon nanotubes 145 are arranged in a preferred orientation along a first direction X, and another portion of the carbon nanotubes 145 is substantially along the surface. The second direction Y is optimally oriented. The first direction X and the second direction Y form a certain angle α, and α is greater than 0 degrees and less than 180 degrees. The carbon nanotubes 145 aligned substantially in the first direction X and the carbon nanotubes 145 aligned substantially in the second direction Y intersect each other to form a plurality of meshes. When the strain gauge 12 is stretched in a direction perpendicular to the bisector of the strain gauge 12 in the first direction X or the second direction Y, the strain gauge 12 will contract in a direction perpendicular to the stretch direction; When the strain gauge 12 is compressed in a direction perpendicular to the bisector of the strain gauge 12 in the first direction X or the second direction Y, the strain gauge 12 expands perpendicular to the compression direction. Therefore, the strain gauge 12 has a property of a positive Poisson's ratio. In this embodiment, the angle α is 90 degrees.

請參閱圖3,該圖為本發明應變片12的泊松比與拉伸應變之間的關係圖。從該圖可以看出,本發明實施例提供的應變片12在與所述第一方向X或第二方向Y夾角的平分線的方向拉伸應變為5%時,泊松比為2.25;在與所述第一方向X或第二方向Y成45度角的方向拉伸應變為20%時,其泊松比值為3.25。Please refer to FIG. 3, which is a diagram showing the relationship between the Poisson's ratio and the tensile strain of the strain gauge 12 of the present invention. As can be seen from the figure, the strain gauge 12 provided by the embodiment of the present invention has a Poisson's ratio of 2.25 when the tensile strain in the direction of the bisector of the angle between the first direction X or the second direction Y is 5%; When the tensile strain in the direction at an angle of 45 degrees to the first direction X or the second direction Y is 20%, the Poisson's ratio is 3.25.

請參閱圖4,所述奈米碳管膜結構通過至少兩層奈米碳管膜交叉層疊設置形成。該奈米碳管膜由多個奈米碳管組成,所述多個奈米碳管首尾相連基本沿一個方向擇優取向排列。所述每兩個相鄰的奈米碳管膜中,一個奈米碳管膜中的奈米碳管基本沿著一第一方向X擇優取向排列,另一個奈米碳管膜中的奈米碳管基本沿著一第二方向Y擇優取向排列,所述第一方向X與所述第二方向Y相互垂直,且相鄰的兩個奈米碳管膜中的奈米碳管相互交叉形成多個網格。奈米碳管膜結構可包括10層~5000層交叉層疊設置的奈米碳管膜,所述奈米碳管膜的厚度為0.5奈米~1微米。本實施例中,所述奈米碳管膜結構包括100層奈米碳管膜。Referring to FIG. 4, the carbon nanotube film structure is formed by cross-stacking at least two layers of carbon nanotube films. The carbon nanotube film is composed of a plurality of carbon nanotubes, and the plurality of carbon nanotubes are arranged end to end in a preferred orientation in one direction. In each of the two adjacent carbon nanotube films, the carbon nanotubes in one of the carbon nanotube membranes are arranged in a preferred orientation along a first direction X, and the nanoparticles in the other carbon nanotube membrane are The carbon tubes are arranged substantially along a second direction Y, wherein the first direction X and the second direction Y are perpendicular to each other, and the carbon nanotubes in the adjacent two carbon nanotube films cross each other to form Multiple grids. The carbon nanotube membrane structure may comprise 10 to 5000 layers of carbon nanotube membranes stacked in a stack, the carbon nanotube membrane having a thickness of 0.5 nm to 1 μm. In this embodiment, the carbon nanotube membrane structure comprises a 100-layer carbon nanotube membrane.

圖5為圖4中奈米碳管膜結構中奈米碳管膜的掃描電鏡照片,所述奈米碳管膜是由若干奈米碳管組成的自支撐結構。所述若干奈米碳管為沿同一方向擇優取向排列。所述擇優取向是指在奈米碳管膜中大多數奈米碳管的整體延伸方向基本朝同一方向。而且,所述大多數奈米碳管的整體延伸方向基本平行於奈米碳管膜的表面。進一步地,所述奈米碳管膜中多數奈米碳管是通過凡德瓦爾力首尾相連。具體地,所述奈米碳管膜中基本朝同一方向延伸的大多數奈米碳管中每一奈米碳管與在延伸方向上相鄰的奈米碳管通過凡德瓦爾力首尾相連。當然,所述奈米碳管膜中存在少數隨機排列的奈米碳管,這些奈米碳管不會對奈米碳管膜中大多數奈米碳管的整體取向排列構成明顯影響。所述自支撐為奈米碳管膜不需要大面積的載體支撐,而只要相對兩邊提供支撐力即能整體上懸空而保持自身膜狀狀態,即將該奈米碳管膜置於(或固定於)間隔一定距離設置的兩個支撐體上時,位於兩個支撐體之間的奈米碳管膜能夠懸空保持自身膜狀狀態。所述自支撐主要通過奈米碳管膜中存在連續的通過凡德瓦爾力首尾相連延伸排列的奈米碳管而實現。Figure 5 is a scanning electron micrograph of a carbon nanotube film in the carbon nanotube film structure of Figure 4, the carbon nanotube film being a self-supporting structure composed of a plurality of carbon nanotubes. The plurality of carbon nanotubes are arranged in a preferred orientation along the same direction. The preferred orientation means that the majority of the carbon nanotubes in the carbon nanotube film extend substantially in the same direction. Moreover, the overall direction of extension of the majority of the carbon nanotubes is substantially parallel to the surface of the carbon nanotube film. Further, most of the carbon nanotubes in the carbon nanotube membrane are connected end to end by Van der Waals force. Specifically, each of the carbon nanotubes in the majority of the carbon nanotube membranes extending in the same direction and the carbon nanotubes adjacent in the extending direction are connected end to end by van der Waals force. Of course, there are a few randomly arranged carbon nanotubes in the carbon nanotube film, and these carbon nanotubes do not significantly affect the overall orientation of most of the carbon nanotubes in the carbon nanotube film. The self-supporting carbon nanotube film does not require a large-area carrier support, but can maintain a self-membrane state as long as the supporting force is provided on both sides, that is, the carbon nanotube film is placed (or fixed on) When the two supports are disposed at a certain distance, the carbon nanotube film located between the two supports can be suspended to maintain the self-membrane state. The self-supporting is mainly achieved by the presence of a continuous carbon nanotube in the carbon nanotube film which is continuously arranged by van der Waals force.

具體地,所述奈米碳管膜中基本朝同一方向延伸的多數奈米碳管,並非絕對的直線狀,可以適當的彎曲;或者並非完全按照延伸方向上排列,可以適當的偏離延伸方向。因此,不能排除奈米碳管膜的基本朝同一方向延伸的多數奈米碳管中並列的奈米碳管之間可能存在部分接觸。Specifically, most of the carbon nanotube membranes extending substantially in the same direction in the same direction are not absolutely linear, and may be appropriately bent; or may not be completely aligned in the extending direction, and may be appropriately deviated from the extending direction. Therefore, partial contact between the carbon nanotubes juxtaposed in the majority of the carbon nanotubes extending substantially in the same direction of the carbon nanotube film cannot be excluded.

本發明實施例進一步提供一種採用所述應變測量裝置100測量應變的方法,通過以下步驟實現:The embodiment of the invention further provides a method for measuring strain by using the strain measuring device 100, which is implemented by the following steps:

步驟S1,提供一應變測量裝置100。In step S1, a strain measuring device 100 is provided.

步驟S2,對所述應變片12的拉伸並進行標定,獲得應變片12的橫向應變與縱向應變的函數關係。In step S2, the strain gauge 12 is stretched and calibrated to obtain the transverse strain of the strain gauge 12. Longitudinal strain The function relationship.

請參閱圖6,定義方向a為應變片12的縱向應變方向,方向a與應變片12中的第一方向X成45度角。定義方向b為應變片12的橫向應變方向,且方向b與方向a垂直。定義應變片12的橫向應變為,縱向應變為。可以通過數值擬合的方法得到應變片12的橫向橫向應變與縱向應變為的函數關係。具體地,可以將所述應變片12裁減成長方型,使該長方型的應變片12的長邊與方向a平行。並將該長方型應變片12的短邊對應的兩端分別固定,然後沿方向a多次拉伸該應變片12,並記錄每次的橫向應變為,及其對應的縱向應變為。最後,通過二次多項式擬合可以獲得該應變片12的橫向應變與縱向應變的函數關係。該應變片12的橫向應變與縱向應變的關係曲線如圖7所示,從該圖可以看出,曲線上任意一點,該應變片12的橫向應變都遠大於對應得縱向應變。因此,當應變片12的縱向應變較小難於測量時,可以通過測量該應變片的橫向應變,由函數關係計算出應變片12的縱向應變。本實施例中,所述應變片12包括100層奈米碳管膜,利用數值擬合後所述應變片12的橫向應變與縱向應變的函數關係為:Referring to FIG. 6, the direction a is defined as the longitudinal strain direction of the strain gauge 12, and the direction a is at an angle of 45 degrees to the first direction X in the strain gauge 12. The direction b is defined as the transverse strain direction of the strain gauge 12, and the direction b is perpendicular to the direction a. Defining the transverse strain of the strain gauge 12 to Longitudinal strain is . The lateral transverse strain of the strain gauge 12 can be obtained by numerical fitting. With longitudinal strain The function relationship. Specifically, the strain gauge 12 may be cut into a square shape such that the long side of the rectangular strain gauge 12 is parallel to the direction a. The two ends of the short side of the rectangular strain gauge 12 are respectively fixed, and then the strain gauge 12 is stretched a plurality of times in the direction a, and the transverse strain is recorded for each time. And its corresponding longitudinal strain is . Finally, the transverse strain of the strain gauge 12 can be obtained by quadratic polynomial fitting. Longitudinal strain Functional relationship . Lateral strain of the strain gauge 12 Longitudinal strain The relationship curve is shown in Fig. 7. As can be seen from the figure, the transverse strain of the strain gauge 12 is arbitrary at any point on the curve. Both are much larger than the corresponding longitudinal strain . Therefore, when the strain gauge 12 is longitudinally strained When it is difficult to measure, it can measure the transverse strain of the strain gauge. By function relationship Calculate the longitudinal strain of the strain gauge 12 . In this embodiment, the strain gauge 12 includes a 100-layer carbon nanotube film, and the transverse strain of the strain gauge 12 after numerical fitting is used. Longitudinal strain The functional relationship is: .

請參見圖8,為了增大所述應變片12的泊松比,還可將所述長方型的應變片12沿著兩個長邊的中間部分裁減為對稱的弧形,使得所述應變片12裁減為啞鈴型狀,從而可以獲得更大的泊松比,以有利於測量。Referring to FIG. 8, in order to increase the Poisson's ratio of the strain gauge 12, the rectangular strain gauge 12 may be cut along a middle portion of the two long sides into a symmetrical arc so that the strain is made. The sheet 12 is cut into a dumbbell shape so that a larger Poisson's ratio can be obtained to facilitate measurement.

步驟S3,提供一待測樣品16,將所述應變片12與該待測樣品16貼合。In step S3, a sample 16 to be tested is provided, and the strain gauge 12 is attached to the sample 16 to be tested.

該待測樣品16為具有一定厚度的薄片,其形狀與所述應變片12相同。使用時,可以在該待測樣品16的一個表面的兩端塗一層黏合劑,然後將所述應變片12通過黏合劑黏附於該待測樣品16的表面。從而使得該待測樣品16與所述應變片12具有相同的縱向應變方向a,以及相同的橫向應變方向b。可以理解,也可以直接將應變片12貼合於待測樣品16的表面,不加黏合劑。The sample to be tested 16 is a sheet having a certain thickness and has the same shape as the strain gauge 12. In use, a layer of adhesive may be applied to both ends of one surface of the sample 16 to be tested, and then the strain gauge 12 is adhered to the surface of the sample 16 to be tested by an adhesive. Thereby, the sample to be tested 16 and the strain gauge 12 have the same longitudinal strain direction a and the same transverse strain direction b. It can be understood that the strain gauge 12 can also be directly attached to the surface of the sample 16 to be tested without adding a binder.

步驟S4,將所述貼合有應變片12的待測樣品16固定於所述夾持裝置108,對該待測樣品16施加縱向的拉力,使待測樣品16與應變片12產生相同的縱向應變In step S4, the sample 16 to be tested to which the strain gauge 12 is attached is fixed to the clamping device 108, and a longitudinal tensile force is applied to the sample 16 to be tested, so that the sample 16 to be tested and the strain gauge 12 have the same longitudinal direction. strain .

具體的,沿待測樣品16的縱向應變方向a,固定貼合有應變片12的待測樣品16的一端於所述第一夾持器104,固定所述貼合有應變片12的待測樣品16的另一端於所述第二夾持器106。使所述第一夾持器104及第二夾持器106,沿待測樣品16的縱向應變方向a相對移動,所述應變片12與待測樣品16產生相同的縱向應變Specifically, along the longitudinal strain direction a of the sample 16 to be tested, one end of the sample 16 to be tested to which the strain gauge 12 is attached is fixed to the first holder 104, and the test piece to which the strain gauge 12 is attached is fixed. The other end of the sample 16 is to the second holder 106. The first holder 104 and the second holder 106 are relatively moved along the longitudinal strain direction a of the sample 16 to be tested, and the strain gauge 12 generates the same longitudinal strain as the sample 16 to be tested. .

步驟S5,通過橫向應變記錄器102測量待測樣品16的橫向應變,通過資料處理裝置101計算待測樣品16的縱向應變Step S5, measuring the transverse strain of the sample 16 to be tested by the transverse strain recorder 102 Calculating the longitudinal strain of the sample 16 to be tested by the data processing device 101 .

當對貼合有應變片12的待測樣品16施加縱向的拉力時,所述應變片12的橫向應變可以通過橫向應變記錄器102測量出來,資料處理裝置101就可以通過該應變片12的橫向應變與縱向應變的函數關係計算出來,從而得到待測樣品16的縱向應變When a longitudinal tensile force is applied to the sample 16 to be tested to which the strain gauge 12 is attached, the transverse strain of the strain gauge 12 It can be measured by the transverse strain recorder 102, and the data processing device 101 can pass the transverse strain of the strain gauge 12. Longitudinal strain Functional relationship Calculated to obtain the longitudinal strain of the sample 16 to be tested .

與先前技術相比較,所述應變測量裝置100採用包括奈米碳管膜結構的應變片12測量待測樣品16的應變,且無需後續電路系統,使得測量方法簡單,容易操作,且更加容易實現。Compared with the prior art, the strain measuring device 100 measures the strain of the sample 16 to be tested by using the strain gauge 12 including the carbon nanotube film structure, and does not require a subsequent circuit system, so that the measuring method is simple, easy to operate, and easier to implement. .

綜上所述,本發明確已符合發明專利之要件,遂依法提出專利申請。惟,以上所述者僅為本發明之較佳實施例,自不能以此限制本案之申請專利範圍。舉凡熟悉本案技藝之人士援依本發明之精神所作之等效修飾或變化,皆應涵蓋於以下申請專利範圍內。In summary, the present invention has indeed met the requirements of the invention patent, and has filed a patent application according to law. However, the above description is only a preferred embodiment of the present invention, and it is not possible to limit the scope of the patent application of the present invention. Equivalent modifications or variations made by persons skilled in the art in light of the spirit of the invention are intended to be included within the scope of the following claims.

12‧‧‧應變片12‧‧‧ strain gauges

16‧‧‧待測樣品16‧‧‧Test samples

100‧‧‧應變測量裝置100‧‧‧ strain measuring device

101‧‧‧資料處理裝置101‧‧‧ data processing device

102‧‧‧橫向應變記錄器102‧‧‧Horizontal strain recorder

104‧‧‧第一夾持器104‧‧‧First holder

106‧‧‧第二夾持器106‧‧‧Second gripper

108‧‧‧夾持裝置108‧‧‧Clamping device

145‧‧‧奈米碳管145‧‧・Nano carbon tube

圖1為本發明實施例的應變測量裝置的立體結構示意圖。FIG. 1 is a schematic perspective structural view of a strain measuring device according to an embodiment of the present invention.

圖2為本發明實施例的應變測量裝置中的應變片中的奈米碳管膜結構的示意圖。2 is a schematic view showing the structure of a carbon nanotube film in a strain gauge in a strain measuring device according to an embodiment of the present invention.

圖3為本發明實施例奈米碳管泊松比材料的泊松比與拉伸應變之間的關係圖。3 is a graph showing the relationship between Poisson's ratio and tensile strain of a nano-carbon tube Poisson's ratio material according to an embodiment of the present invention.

圖4為本發明實施例的應變測量裝置中的應變片中的奈米碳管膜結構的掃描電鏡照片。4 is a scanning electron micrograph of a structure of a carbon nanotube film in a strain gauge in a strain measuring device according to an embodiment of the present invention.

圖5為本發明實施例的應變測量裝置中的應變片中的奈米碳管膜的掃描電鏡照片。Fig. 5 is a scanning electron micrograph of a carbon nanotube film in a strain gauge in a strain measuring device according to an embodiment of the present invention.

圖6為本發明實施例的應變測量裝置的應變片使用時的方位示意圖。FIG. 6 is a schematic view showing the orientation of a strain gauge of a strain measuring device according to an embodiment of the present invention.

圖7為本發明實施例的應變片的縱向應變與橫向應變的關係示意圖。Fig. 7 is a schematic view showing the relationship between the longitudinal strain and the transverse strain of the strain gauge according to the embodiment of the present invention.

圖8為本發明實施例的應變片的結構示意圖。FIG. 8 is a schematic structural view of a strain gauge according to an embodiment of the present invention.

12‧‧‧應變片 12‧‧‧ strain gauges

16‧‧‧待測樣品 16‧‧‧Test samples

100‧‧‧應變測量裝置 100‧‧‧ strain measuring device

101‧‧‧資料處理裝置 101‧‧‧ data processing device

102‧‧‧橫向應變記錄器 102‧‧‧Horizontal strain recorder

104‧‧‧第一夾持器 104‧‧‧First holder

106‧‧‧第二夾持器 106‧‧‧Second gripper

108‧‧‧夾持裝置 108‧‧‧Clamping device

Claims (20)

一種應變測量裝置,該應變測量裝置包括:
一應變片;
一用於夾持並拉伸所述應變片的夾持裝置,所述應變片在拉伸方向上產生縱向應變,在垂直於拉伸方向上產生橫向應變;以及一用於測量所述應變片的橫向應變的橫向應變記錄器;
所述應變片包括一奈米碳管膜結構,該奈米碳管膜結構包括多個奈米碳管,所述多個奈米碳管分別沿一第一方向與一第二方向擇優取向排列,沿第一方向擇優取向定向排列的奈米碳管與沿第二方向定向擇優取向排列的奈米碳管重疊交叉設置,所述第一方向與第二方向具有一夾角,所述夾角大於0度小於180度,使用時,應變片中沿所述第一方向與第二方向的夾角的平分線的方向與所述拉伸方向一致。
A strain measuring device comprising:
a strain gauge;
a holding device for holding and stretching the strain gauge, the strain gauge generating longitudinal strain in a tensile direction, generating a transverse strain perpendicular to the tensile direction; and a measuring strain gauge Lateral strain logger for transverse strain;
The strain gauge comprises a carbon nanotube membrane structure, the carbon nanotube membrane structure comprises a plurality of carbon nanotubes, and the plurality of carbon nanotubes are respectively arranged along a first direction and a second direction. And the carbon nanotubes aligned in the first direction and the aligned orientations of the carbon nanotubes are arranged in an overlapping manner, wherein the first direction has an angle with the second direction, and the angle is greater than 0. The degree is less than 180 degrees, and in use, the direction of the bisector of the angle between the first direction and the second direction in the strain gauge coincides with the stretching direction.
如申請專利範圍第1項所述的應變測量裝置,其中,該奈米碳管膜結構包括至少兩個層疊設置的奈米碳管膜,每一奈米碳管膜由多個首尾相連且基本沿同一方向擇優取向排列的奈米碳管構成,所述奈米碳管膜中的奈米碳管沿奈米碳管膜的表面延伸,每兩個相鄰的奈米碳管膜中,一個奈米碳管膜中的奈米碳管沿著所述第一方向擇優取向排列,另一個奈米碳管膜中的奈米碳管沿著所述第二方向擇優取向排列。The strain measuring device of claim 1, wherein the carbon nanotube membrane structure comprises at least two laminated carbon nanotube membranes, each of which is connected end to end and substantially Forming a carbon nanotube arranged in a preferred orientation, wherein the carbon nanotubes in the carbon nanotube membrane extend along the surface of the carbon nanotube membrane, one in each of two adjacent carbon nanotube membranes The carbon nanotubes in the carbon nanotube film are arranged in a preferred orientation along the first direction, and the carbon nanotubes in the other carbon nanotube film are arranged in a preferred orientation along the second direction. 如申請專利範圍第2項所述的應變測量裝置,其中,所述奈米碳管膜結構中,相鄰的奈米碳管膜之間通過凡德瓦爾力緊密結合。The strain measuring device according to claim 2, wherein in the carbon nanotube film structure, adjacent carbon nanotube films are tightly bonded by van der Waals force. 如申請專利範圍第2項所述的應變測量裝置,其中,所述奈米碳管膜結構包括10層~5000層奈米碳管膜,所述奈米碳管膜的厚度為0.5奈米~1微米。The strain measuring device according to claim 2, wherein the carbon nanotube film structure comprises 10 to 5000 layers of carbon nanotube film, and the thickness of the carbon nanotube film is 0.5 nm. 1 micron. 如申請專利範圍第4項所述的應變測量裝置,其中,所述奈米碳管膜結構的泊松比為0.5~3.5。The strain measuring device according to claim 4, wherein the carbon nanotube membrane structure has a Poisson ratio of 0.5 to 3.5. 如申請專利範圍第1項所述的應變測量裝置,其中,所述夾持裝置包括一第一夾持器以及一第二夾持器,所述第一夾持器及第二夾持器可以在縱向應變方向相對移動。The strain measuring device of claim 1, wherein the clamping device comprises a first holder and a second holder, and the first holder and the second holder are Relative movement in the direction of longitudinal strain. 如申請專利範圍第6項所述的應變測量裝置,其中,所述橫向應變記錄器為數碼相機、攝像機或攝像頭。The strain measuring device of claim 6, wherein the transverse strain recorder is a digital camera, a camera or a camera. 一種採用如申請專利範圍第項1至7項中任一項所述的應變測量裝置測量應變的方法,包括以下步驟:
拉伸所述應變片並標定,獲得該應變片的橫向應變與縱向應變的函數關係;
提供一待測樣品,將所述應變片貼合於該待測樣品的表面;
將貼合有應變片的待測樣品固定於所述夾持裝置,對該待測樣品施加縱向的拉力,使待測樣品與應變片產生相同的縱向應變;以及
通過所述橫向應變記錄器測量所述應變片的橫向應變,通過所述資料處理裝置計算出應變片的縱向應變。
A method of measuring strain using a strain measuring device according to any one of claims 1 to 7, comprising the steps of:
Stretching the strain gauge and calibrating to obtain a transverse strain as a function of longitudinal strain of the strain gauge;
Providing a sample to be tested, and attaching the strain gauge to a surface of the sample to be tested;
Fixing a sample to be tested with a strain gauge to the clamping device, applying a longitudinal tensile force to the sample to be tested, causing the sample to be tested to generate the same longitudinal strain as the strain gauge; and measuring by the transverse strain recorder The transverse strain of the strain gauge is calculated by the data processing device to calculate the longitudinal strain of the strain gauge.
如申請專利範圍第8項所述的測量應變的方法,其中,所述應變片的橫向應變與縱向應變的函數關係通過二次多項式擬合獲得。The method of measuring strain as described in claim 8, wherein the transverse strain of the strain gauge is obtained as a function of longitudinal strain by a quadratic polynomial fit. 如申請專利範圍第9項所述的測量應變的方法,其中,所述應變片為長方形片材,該長方型的應變片的長邊與應變片的縱向應變方向平行。The method of measuring strain according to claim 9, wherein the strain gauge is a rectangular sheet, and a long side of the rectangular strain gauge is parallel to a longitudinal strain direction of the strain gauge. 如申請專利範圍第10項所述的測量應變的方法,其中,所述應變片為沿著所述長方型的應變片兩個長邊的中間部分裁減為對稱的弧形。The method of measuring strain according to claim 10, wherein the strain gauge is cut into a symmetrical arc along a middle portion of the two long sides of the rectangular strain gauge. 如申請專利範圍第8項所述的測量應變的方法,其中,所述待測樣品與所述應變片具有相同的縱向應變方向,以及相同的橫向應變方向。The method of measuring strain according to claim 8, wherein the sample to be tested has the same longitudinal strain direction as the strain gauge, and the same transverse strain direction. 一種應變測量裝置,該應變測量裝置包括:
一應變片;
一用於夾持並拉伸所述應變片的夾持裝置,所述應變片在拉伸方向上產生縱向應變,在垂直於拉伸方向上產生橫向應變,所述夾持裝置包括一第一夾持器以及一第二夾持器,所述第一夾持器及第二夾持器用於在縱向應變方向相對移動並拉伸所述應變片;以及
一用於測量所述應變片的橫向應變的橫向應變記錄器;
所述應變片包括一奈米碳管膜結構,該奈米碳管膜結構包括多個奈米碳管,所述多個奈米碳管分別沿一第一方向與一第二方向擇優取向排列,沿第一方向擇優取向定向排列的奈米碳管與沿第二方向定向擇優取向排列的奈米碳管重疊交叉設置,所述第一方向與第二方向具有一夾角,所述夾角大於0度小於180度,使用時,應變片中沿所述第一方向與第二方向的夾角的平分線的方向與所述第一夾持器到一第二夾持器的方向一致。
A strain measuring device comprising:
a strain gauge;
a clamping device for clamping and stretching the strain gauge, the strain gauge generates longitudinal strain in a tensile direction, and generates transverse strain perpendicular to the tensile direction, the clamping device including a first a holder and a second holder, the first holder and the second holder for relatively moving in a longitudinal strain direction and stretching the strain gauge; and a transverse direction for measuring the strain gauge Strained transverse strain recorder;
The strain gauge comprises a carbon nanotube membrane structure, the carbon nanotube membrane structure comprises a plurality of carbon nanotubes, and the plurality of carbon nanotubes are respectively arranged along a first direction and a second direction. And the carbon nanotubes aligned in the first direction and the aligned orientations of the carbon nanotubes are arranged in an overlapping manner, wherein the first direction has an angle with the second direction, and the angle is greater than 0. The degree is less than 180 degrees. In use, the direction of the bisector of the angle between the first direction and the second direction in the strain gauge coincides with the direction of the first holder to a second holder.
如申請專利範圍第項13所述的應變測量裝置,其中,該奈米碳管膜結構包括至少兩個層疊設置的奈米碳管膜,每一奈米碳管膜由多個首尾相連且基本沿同一方向擇優取向排列的奈米碳管構成,所述奈米碳管膜中的奈米碳管沿奈米碳管膜的表面延伸,每兩個相鄰的奈米碳管膜中,一個奈米碳管膜中的奈米碳管沿著所述第一方向擇優取向排列,另一個奈米碳管膜中的奈米碳管沿著所述第二方向擇優取向排列。The strain measuring device of claim 13, wherein the carbon nanotube membrane structure comprises at least two laminated carbon nanotube membranes, each of which is connected end to end and substantially Forming a carbon nanotube arranged in a preferred orientation, wherein the carbon nanotubes in the carbon nanotube membrane extend along the surface of the carbon nanotube membrane, one in each of two adjacent carbon nanotube membranes The carbon nanotubes in the carbon nanotube film are arranged in a preferred orientation along the first direction, and the carbon nanotubes in the other carbon nanotube film are arranged in a preferred orientation along the second direction. 如申請專利範圍第項14所述的應變測量裝置,其中,所述應變片為長方形片材,該長方型的應變片的長邊與應變片的縱向應變方向平行。The strain measuring device according to claim 14, wherein the strain gauge is a rectangular sheet, and a long side of the rectangular strain gauge is parallel to a longitudinal strain direction of the strain gauge. 如申請專利範圍第項15所述的應變測量裝置,其中,所述應變片為沿著所述長方型的應變片兩個長邊的中間部分裁減為對稱的弧形。The strain measuring device according to claim 15, wherein the strain gauge is cut into a symmetrical arc along a middle portion of the two long sides of the rectangular strain gauge. 如申請專利範圍第項14所述的應變測量裝置,其中,所述橫向應變記錄器為數碼相機、攝像機或攝像頭。The strain measuring device of claim 14, wherein the transverse strain recorder is a digital camera, a camera or a camera. 一種採用如申請專利範圍第項13至17項中任一項所述的應變測量裝置測量應變的方法,包括以下步驟:
拉伸所述應變片並標定,獲得該應變片的橫向應變與縱向應變的函數關係;
提供一待測樣品,將所述應變片貼合於該待測樣品的表面;
將貼合有應變片的待測樣品固定於所述夾持裝置,對該待測樣品施加縱向的拉力,使待測樣品與應變片產生相同的縱向應變;以及
通過所述橫向應變記錄器測量所述應變片的橫向應變,通過所述資料處理裝置計算出應變片的縱向應變。
A method of measuring strain using a strain measuring device according to any one of claims 13 to 17, comprising the steps of:
Stretching the strain gauge and calibrating to obtain a transverse strain as a function of longitudinal strain of the strain gauge;
Providing a sample to be tested, and attaching the strain gauge to a surface of the sample to be tested;
Fixing a sample to be tested with a strain gauge to the clamping device, applying a longitudinal tensile force to the sample to be tested, causing the sample to be tested to generate the same longitudinal strain as the strain gauge; and measuring by the transverse strain recorder The transverse strain of the strain gauge is calculated by the data processing device to calculate the longitudinal strain of the strain gauge.
如申請專利範圍第項18所述的測量應變的方法,其中,所述應變片的橫向應變與縱向應變的函數關係通過二次多項式擬合獲得。A method of measuring strain as described in claim 18, wherein the transverse strain of the strain gauge is obtained as a function of longitudinal strain by a quadratic polynomial fit. 如申請專利範圍第項18所述的測量應變的方法,其中,所述待測樣品與所述應變片具有相同的縱向應變方向,以及相同的橫向應變方向。The method of measuring strain according to claim 18, wherein the sample to be tested has the same longitudinal strain direction as the strain gauge, and the same transverse strain direction.
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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03119564U (en) * 1990-03-23 1991-12-10
JP2006521212A (en) * 2003-01-23 2006-09-21 ウィリアム・マーシュ・ライス・ユニバーシティ Smart materials: Strain detection and stress measurement with nanotube sensing systems, nanotube sensing composites, and nanotube sensing devices
TW200938373A (en) * 2008-03-07 2009-09-16 Hon Hai Prec Ind Co Ltd Carbon nanotube composite film

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03119564U (en) * 1990-03-23 1991-12-10
JP2006521212A (en) * 2003-01-23 2006-09-21 ウィリアム・マーシュ・ライス・ユニバーシティ Smart materials: Strain detection and stress measurement with nanotube sensing systems, nanotube sensing composites, and nanotube sensing devices
TW200938373A (en) * 2008-03-07 2009-09-16 Hon Hai Prec Ind Co Ltd Carbon nanotube composite film

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