TWI408822B - Thin silicon solar cell and its manufacturing method - Google Patents
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- TWI408822B TWI408822B TW098146175A TW98146175A TWI408822B TW I408822 B TWI408822 B TW I408822B TW 098146175 A TW098146175 A TW 098146175A TW 98146175 A TW98146175 A TW 98146175A TW I408822 B TWI408822 B TW I408822B
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本發明係有關薄型矽晶太陽能電池及其製造方法,旨在提供一種藉由低溫長膜方式及低溫熱擴散方式成型之薄型矽晶太陽能電池及其製造方法。The present invention relates to a thin twinned solar cell and a method of manufacturing the same, and aims to provide a thin twinned solar cell formed by a low temperature long film method and a low temperature thermal diffusion method, and a method of manufacturing the same.
近年基於工業高度發展,使得地球上化石能源快速枯竭,且導致環境污染日趨嚴重。因此,世界各國基於能源需求與環保理由,皆致力於發展替代能源。太陽能對現今人類而言為可利用之最豐富資源,且不需運輸成本、乾淨以及對地球不增加熱負載等優點。基於上述優點,太陽能為現今最具開發潛力之清淨再生能源之一。In recent years, based on the high industrial development, the fossil energy on the earth has rapidly dried up, and environmental pollution has become increasingly serious. Therefore, all countries in the world are committed to the development of alternative energy sources based on energy demand and environmental reasons. Solar energy is the most abundant resource available to humans today, and it does not require transportation costs, cleanliness, and no increase in heat load on the Earth. Based on the above advantages, solar energy is one of the most renewable energy sources with the most potential for development today.
太陽能電池(solar cell)係利用光伏效應(photovoltaic effect),將太陽光能轉換為電能之半導體元件,基本上任何半導體的二極體皆可將光能轉換成電能。太陽能電池產生電能係基於光導效應(photoconductive effect)與內部電場兩因素。因此,選擇太陽能電池發電的材料時,必須考量材料的光導效應及如何產生內部電場。A solar cell is a semiconductor component that converts solar energy into electrical energy using a photovoltaic effect. Basically, any semiconductor diode converts light energy into electrical energy. The solar cell generates electrical energy based on two factors: photoconductive effect and internal electric field. Therefore, when selecting materials for solar cell power generation, it is necessary to consider the light guiding effect of the material and how to generate an internal electric field.
如吾人所知悉,光照射於物質上時,一部光將為物質吸收,他部則經由反射或穿透而離開物質。基於此原理,選取作為太陽能電池材質的重要考量之一即為吸光材質的光吸收特性,較高的光吸收特性能使輸出功率增加。太陽電池性能的高低主要以光電之間的轉換效率來評斷。而影響轉換效率的因子包含太陽光強度、溫度;材料的阻值與基質的品質、缺陷密度;pn接面的濃度、深度;表面對光反射率大小;金屬電極線寬、線高、接觸電阻等。故對各種影響因子須嚴密控制才得以製造出具高轉換效率的太陽電池。As we know, when light shines on a substance, one light will absorb the substance, and the other part will leave the substance by reflection or penetration. Based on this principle, one of the important considerations for selecting the material of a solar cell is the light absorption property of the light absorbing material, and the higher light absorbing property can increase the output power. The performance of solar cells is mainly judged by the conversion efficiency between photovoltaics. The factors affecting the conversion efficiency include sunlight intensity and temperature; material resistance and matrix quality, defect density; concentration and depth of pn junction; surface to light reflectance; metal electrode line width, line height, contact resistance Wait. Therefore, it is necessary to closely control various influence factors to produce a solar cell with high conversion efficiency.
轉換效率與成本為現今製造太陽能電池所選用半導體材料之主要考量。目前市場上的太陽能電池,以矽為原料的太陽能電池市佔率為大宗。依晶體結構分類,分別為單晶太陽能電池、複晶太陽能電池以及非晶型太陽能電池等三種。以理論轉換效率而言,仍以單晶矽太陽能電池為較高,約為25%,複晶矽則近似次之約為20%,非晶型矽則大約為15%左右。使用其他化合物半導體來做為光電轉換基板,例如III-V族之砷化鎵(GaAs),理論轉換效率則可高達26%以上。Conversion efficiency and cost are the main considerations for the semiconductor materials currently selected for the manufacture of solar cells. At present, solar cells on the market, the market share of solar cells using bismuth as raw materials is large. According to the crystal structure classification, there are three kinds of single crystal solar cells, polycrystalline solar cells, and amorphous solar cells. In terms of theoretical conversion efficiency, the single crystal germanium solar cell is still higher, about 25%, the polycrystalline germanium is about 20%, and the amorphous germanium is about 15%. Using other compound semiconductors as photoelectric conversion substrates, such as III-V gallium arsenide (GaAs), the theoretical conversion efficiency can be as high as 26% or more.
太陽能電池的轉換效率與製作成本依照其結構及製程步驟的不同而有顯著差異,高效率的太陽能電池通常結構複雜,製程步驟繁複,如使用多道光罩及多道高溫製程,而且使用載子生命期長但是價格昂貴的FZ(floating zone)級矽晶片,製作成本也就相對提升,在量產上較不利。目前矽晶圓大多由拉伸法(Czochralski method)所製造,而後將所製成之矽晶棒切片(slice)成晶圓,成為矽太陽能電池之基板。The conversion efficiency and manufacturing cost of solar cells are significantly different according to their structure and process steps. High-efficiency solar cells are often complicated in structure and complicated in process steps, such as using multiple masks and multiple high-temperature processes, and using carrier life. The long-term but expensive FZ (floating zone)-grade germanium wafers have relatively high production costs and are disadvantageous in mass production. At present, most of the germanium wafers are manufactured by the Czochralski method, and then the resulting crystals are sliced into wafers to form a substrate for the solar cell.
而習有製作矽晶太陽能電池技術一般係採用如Sanyo公司所研發雙面低溫成膜方式製成,如第五圖所示,其主要係於一矽晶板31正面以低溫成膜方式(例如濺鍍法或電漿化學氣相沉積)依序形成一本質非晶矽層32以及一n型非晶矽摻質層33,並於背面依序形成一本質非晶矽層32以及一p型非晶矽摻質層36,再分別於n型非晶矽摻質層33及p型非晶矽摻質層36表面依序形成透明導電膜34以及電極層35、37。Xi's production of silicon solar cell technology is generally made by double-sided low-temperature film formation method developed by Sanyo Co., Ltd., as shown in the fifth figure, which is mainly based on the front side of a crystal plate 31 at a low temperature film formation (for example Sputtering or plasma chemical vapor deposition) sequentially forms an intrinsic amorphous germanium layer 32 and an n-type amorphous germanium dopant layer 33, and sequentially forms an intrinsic amorphous germanium layer 32 and a p-type on the back side. The amorphous germanium dopant layer 36 is sequentially formed with a transparent conductive film 34 and electrode layers 35 and 37 on the surface of the n-type amorphous germanium dopant layer 33 and the p-type amorphous germanium dopant layer 36, respectively.
由於成本仍為矽太陽能電池工業最主要之考量因素,現今矽太陽能電池典型厚度為200至300微米,若能減低其矽基板厚度,則於量產上可降低其成本。Since the cost is still the most important factor in the solar cell industry, today's solar cells typically have a thickness of 200 to 300 microns. If the thickness of the substrate is reduced, the cost can be reduced in mass production.
雖減少矽基板厚度得以降低製造成本,然,厚度太薄則容易產生彎曲形變,變形程度隨尺寸及製程溫度上升,而擴大翹曲之程度。惟目前一般使用的高溫熱擴散製作矽晶太陽電池技術尚未有對應薄形矽基板(指厚度小於150微米)之有效解決方案。是以,克服基板變薄時於電池製作中所導致的形變,為當務之急。Although reducing the thickness of the ruthenium substrate can reduce the manufacturing cost, if the thickness is too thin, the bending deformation is likely to occur, and the degree of deformation increases with the size and the process temperature, and the degree of warpage is increased. However, the currently used high-temperature thermal diffusion fabrication of twin-crystal solar cell technology has not yet had an effective solution for thin-shaped germanium substrates (referring to thicknesses less than 150 μm). Therefore, it is imperative to overcome the deformation caused by the battery during the thinning of the substrate.
為解決上述問題,本發明提出一製作薄形化太陽能電池的方法。In order to solve the above problems, the present invention proposes a method of fabricating a thinned solar cell.
本發明係之主要目的即在提供一種藉由低溫長膜方式及低溫熱擴散方式成型之薄型矽晶太陽能電池及其製造方法。The main object of the present invention is to provide a thin twin crystal solar cell formed by a low temperature long film method and a low temperature thermal diffusion method, and a method of manufacturing the same.
為達上揭目的,本發明之薄型矽晶太陽能電池係設有一基板,而該基板正反兩面分別設有一n型摻質層以及一p型摻質層,該n型摻質層以及p型摻質層表面並設有第一、第二電極層;其中,該n型摻質層為非晶矽結構,係藉由低溫長膜技術如電漿化學氣相沉積法或熱燈絲化學氣相沉積法所形成。另一邊的p型摻質層係藉由低溫長膜技術如濺鍍法蒸鍍一層非晶矽層,之後結合金屬層經低溫熱擴散所形成。In order to achieve the above object, the thin-type twin solar cell of the present invention is provided with a substrate, and an n-type dopant layer and a p-type dopant layer are respectively disposed on the front and back sides of the substrate, the n-type dopant layer and the p-type The surface of the dopant layer is provided with first and second electrode layers; wherein the n-type dopant layer is an amorphous germanium structure, which is formed by a low temperature long film technique such as plasma chemical vapor deposition or hot filament chemical vapor phase Formed by a deposition method. The p-type dopant layer on the other side is formed by vapor deposition of an amorphous germanium layer by a low temperature long film technique such as sputtering, and then formed by a low temperature thermal diffusion in combination with the metal layer.
本發明之特點,可參閱本案圖式及實施例之詳細說明而獲得清楚地瞭解。The features of the present invention can be clearly understood by referring to the drawings and the detailed description of the embodiments.
本發明「薄型矽晶太陽能電池及其製造方法」,本發明薄型矽晶太陽能電池10之基本結構如第一圖所示,其至少包含有:一基板11,該基板11可以為n型或p型矽晶基板;一本質非晶矽層12,係設於該基板11一表面,如圖所示之實施例中,該本質非晶矽層12係設於該基板11之正面111;一n型摻質層13,係設於該本質非晶矽層12表面;一透明導電膜14,係設於該n型摻質層13與第一電極層15之間,該透明導電膜14可以為金屬氧化物透明導電膜;第一電極層15,係設於該透明導電膜14表面,如圖所示該第一電極層15可以為複數條狀結構;一p型摻質層16,係設於該基板11相對於本質非晶矽層12之另側表面,如圖所示之實施例中,該p型摻質層16係設於該基板11之背面112,該p型摻質層16係由一本質非晶矽層結合金屬層在低溫條件下熱擴散結晶化所形成;一透明導電膜14,係另設於該p型摻質層16與第二電極層17之間,該透明導電膜14可以為金屬氧化物透明導電膜;第二電極層17,係設於該透明導電膜14表面,如圖所示該第二電極層17可以為整面覆蓋的面狀結構,亦可以為如第二圖所示之複數條狀結構;如此則構成一薄型矽晶太陽能電池10。According to the present invention, the basic structure of the thin twinned solar cell 10 of the present invention is as shown in the first figure, and comprises at least a substrate 11 which may be n-type or p- The intrinsic amorphous germanium layer 12 is disposed on a surface of the substrate 11. In the embodiment shown in the figure, the intrinsic amorphous germanium layer 12 is disposed on the front surface 111 of the substrate 11; The type of the doped layer 13 is disposed on the surface of the intrinsic amorphous layer 12; a transparent conductive film 14 is disposed between the n-type dopant layer 13 and the first electrode layer 15, and the transparent conductive film 14 may be a metal oxide transparent conductive film; the first electrode layer 15 is disposed on the surface of the transparent conductive film 14, as shown, the first electrode layer 15 may be a plurality of strip structures; a p-type dopant layer 16, On the other side surface of the substrate 11 with respect to the intrinsic amorphous germanium layer 12, in the embodiment shown in the figure, the p-type dopant layer 16 is disposed on the back surface 112 of the substrate 11, and the p-type dopant layer 16 is provided. It is formed by an intrinsic amorphous germanium layer combined with a metal layer formed by thermal diffusion crystallization under low temperature conditions; a transparent conductive film 14 is separately provided Between the p-type dopant layer 16 and the second electrode layer 17, the transparent conductive film 14 may be a metal oxide transparent conductive film; the second electrode layer 17 is disposed on the surface of the transparent conductive film 14, as shown in the figure The second electrode layer 17 may be a planar structure covered by the entire surface, or may be a plurality of strip structures as shown in the second figure; thus, a thin twinned solar cell 10 is constructed.
而本發明中薄型矽晶太陽能電池之製造方法則如第三圖所示,其至少包含有下列步驟:步驟A、提供一基板11,如第四圖(A)所示,並於該基板11表面進行清洗;步驟B、於該基板11之正面111設有一保護層21,該保護層21可以為氧化矽,如第四圖(B)所示,該氧化矽層可藉由低溫長膜(可為電漿化學氣相沉積)之方式形成,該氧化矽層21之厚度係小於50nm;步驟C、於該基板11之另一相對表面(背面112)以低溫長膜(可為濺鍍或電漿化學氣相沉積)之方式形成一本質非晶矽層22,如第四圖(C)所示,該本質非晶矽層22之厚度係小於30nm;步驟D、於該本質非晶矽層22上以濺鍍或熱蒸鍍方式形成一金屬層23(可以為鋁金屬),如第四圖(D)所示,該金屬層23之厚度係小於100nm;步驟E、進行低溫擴散,使該本質非晶矽層22與該金屬層23結晶化而形成p型摻質層16,如第四圖(E)所示,當進行低溫擴散時,可藉由擴散溫度、擴散時間以及擴散氣雰氣體中氫氣分壓的調控,達到不同厚度、不同結晶性及導電性之p型矽摻質層,如表一所示中實驗一至實驗四係為不同低溫擴散的條件,對於形成p型矽摻質層的結晶性與電性影響。而本發明低溫擴散之溫度可以低至175℃,並於10~38Torr氫氣分壓之氫氣/氬氣混合氣體環境下退火處理30~90分鐘,而其中以實驗二中溫度為200℃,於38Torr氫氣分壓退火處理30分鐘低溫熱擴散後,所形成導電率4.1×101 (Ω×cm)-1 為佳;The method for manufacturing the thin-type twinned solar cell of the present invention is as shown in the third figure, and comprises at least the following steps: Step A, providing a substrate 11, as shown in the fourth figure (A), and on the substrate 11 The surface is cleaned; step B, a protective layer 21 is disposed on the front surface 111 of the substrate 11, and the protective layer 21 may be yttrium oxide. As shown in the fourth diagram (B), the yttrium oxide layer may be formed by a low temperature long film ( It can be formed by plasma chemical vapor deposition. The thickness of the yttrium oxide layer 21 is less than 50 nm; in step C, the other opposite surface (back surface 112) of the substrate 11 is formed by a low temperature film (which can be sputtered or A plasma amorphous vapor deposition layer 22 forms an intrinsic amorphous germanium layer 22, as shown in the fourth diagram (C), the thickness of the intrinsic amorphous germanium layer 22 is less than 30 nm; and step D, the amorphous germanium layer A metal layer 23 (which may be aluminum metal) is formed on the layer 22 by sputtering or thermal evaporation. As shown in the fourth diagram (D), the thickness of the metal layer 23 is less than 100 nm; step E, low temperature diffusion, The intrinsic amorphous germanium layer 22 and the metal layer 23 are crystallized to form a p-type dopant layer 16, as shown in the fourth diagram (E), when low temperature is performed In the case of dispersion, the p-type ytterbium dopant layer of different thickness, different crystallinity and conductivity can be achieved by the diffusion temperature, the diffusion time and the partial pressure of hydrogen in the diffusion atmosphere gas, as shown in Table 1 in Experiment 1 to Experiment. The four systems are conditions for different low-temperature diffusion, and have an effect on the crystallinity and electrical properties of the p-type tantalum dopant layer. The temperature of the low temperature diffusion of the present invention can be as low as 175 ° C, and is annealed in a hydrogen/argon mixed gas atmosphere of 10 to 38 Torr for 30 to 90 minutes, wherein the temperature in the second experiment is 200 ° C at 38 Torr. After hydrogen partial pressure annealing treatment for 30 minutes, after low temperature thermal diffusion, the formed conductivity is 4.1×10 1 (Ω×cm) −1 ;
步驟F、於該步驟E中進行低溫擴散後,係藉由強酸劑來去除低溫擴散後所殘留之金屬層、矽鋁合金以及氧化矽保護層,其中該基板背面112則形成p型摻質層16以及反應物層24,此時可藉由強酸劑如鹽酸來去除低溫擴散後所殘留之反應物層24,如第四圖(F)所示,使該基板背面僅剩餘p型摻質層16,之後,原基板正面的氧化矽保護層21可藉由氫氟酸去除之;步驟G、於該基板相對該p型摻質層16之另側表面藉由低溫長膜(可為電漿化學氣相沉積或熱燈絲化學氣相沉積)方式形成有一本質非晶矽層12,如第四圖(G)所示;步驟H、於該本質非晶矽層12表面藉由低溫長膜(可為電漿化學氣相沉積或熱燈絲化學氣相沉積)方式形成一n型摻質層13,如第四圖(H)所示;步驟I、係於該n型摻質層13以及p型摻質層16表面分別設置透明導電膜14,如第四圖(I)所示;步驟J、分別於該n型摻質層13以及p型摻質層16表面之透明導電膜14上形成第一、第二電極層15、17,則形成如第四圖(J)以及第一圖所示薄型矽晶太陽能電池10之結構。Step F, after performing low-temperature diffusion in the step E, removing the metal layer, the yttrium aluminum alloy and the yttrium oxide protective layer remaining after the low-temperature diffusion by using a strong acid agent, wherein the back surface 112 of the substrate forms a p-type dopant layer 16 and the reactant layer 24, wherein the reactant layer 24 remaining after the low-temperature diffusion can be removed by a strong acid agent such as hydrochloric acid, as shown in the fourth diagram (F), leaving only the p-type dopant layer on the back surface of the substrate. After that, the yttrium oxide protective layer 21 on the front surface of the original substrate can be removed by hydrofluoric acid; in step G, the substrate is opposite to the surface of the p-type dopant layer 16 by a low temperature long film (which can be a plasma) A chemically vapor deposited or hot filament chemical vapor deposition method forms an intrinsic amorphous germanium layer 12 as shown in the fourth diagram (G); and a step H on the surface of the intrinsic amorphous germanium layer 12 by a low temperature long film ( An n-type dopant layer 13 may be formed for plasma chemical vapor deposition or hot filament chemical vapor deposition, as shown in the fourth diagram (H); step I, in the n-type dopant layer 13 and p The transparent dopant film 14 is respectively disposed on the surface of the type dopant layer 16, as shown in the fourth diagram (I); and the step J is respectively performed on the n-type dopant layer 13 The first and second electrode layers 15, 17 are formed on the transparent conductive film 14 on the surface of the p-type dopant layer 16, and the structure of the thin-type silicon solar cell 10 as shown in the fourth (J) and first drawings is formed.
值得一提的是,本發明係以低溫長膜(濺鍍、電漿化學氣相沉積或熱燈絲化學氣相沉積)方式結合低溫熱擴散方式來製作矽晶太陽能電池所需的p型摻質層,並搭配另一邊以n型摻質層/矽晶基板之異質接面形成主電池結構,不僅成型方式較為簡便,可避免薄型基板於高溫製程中造成應力形變,其中,低溫擴散後的p型摻質層之導電率可達~10-1 (Ω×cm)-1 以上,以提高整體薄型矽晶太陽能電池之特性。It is worth mentioning that the present invention is a low-temperature long film (sputtering, plasma chemical vapor deposition or hot filament chemical vapor deposition) combined with low-temperature thermal diffusion to prepare the p-type doping required for the twin solar cell. The main layer structure is formed by the heterogeneous junction of the n-type dopant layer/twisted substrate on the other side, which not only has a simple molding method, but also avoids stress deformation of the thin substrate in a high-temperature process, wherein the low-temperature diffusion The conductivity of the p-type dopant layer can reach ~10 -1 (Ω×cm) -1 or more to improve the characteristics of the overall thin-type twin solar cell.
綜上所述,本發明提供一較佳可行之薄型矽晶太陽能電池及其製造方法,爰依法提呈發明專利之申請;本發明之技術內容及技術特點已揭示如上,然而熟悉本項技術之人士仍可能基於本發明之揭示而作各種不背離本案發明精神之替換及修飾。因此,本發明之保護範圍應不限於實施例所揭示者,而應包括各種不背離本發明之替換及修飾,並為以下之申請專利範圍所涵蓋。In summary, the present invention provides a preferred and feasible thin-type silicon solar cell and a manufacturing method thereof, and an application for an invention patent according to the law; the technical content and technical features of the present invention have been disclosed above, but are familiar with the present technology. It is still possible for a person to make various substitutions and modifications without departing from the spirit of the invention. Therefore, the scope of the present invention should be construed as being limited by the scope of the appended claims
10...薄型矽晶太陽能電池10. . . Thin silicon solar cell
11...基板11. . . Substrate
111...正面111. . . positive
112...背面112. . . back
12...本質非晶矽層12. . . Intrinsic amorphous layer
13...n型摻質層13. . . N-type dopant layer
15...第一電極層15. . . First electrode layer
14...透明導電膜14. . . Transparent conductive film
16...p型摻質層16. . . P-type dopant layer
17...第二電極層17. . . Second electrode layer
21...保護層twenty one. . . The protective layer
22...本質非晶矽層twenty two. . . Intrinsic amorphous layer
23...金屬層twenty three. . . Metal layer
24...反應物層twenty four. . . Reactive layer
31...矽晶板31. . . Crystal plate
32...本質非晶矽層32. . . Intrinsic amorphous layer
33...n型摻質層33. . . N-type dopant layer
34...透明導電膜34. . . Transparent conductive film
35...電極層35. . . Electrode layer
36...p型摻質層36. . . P-type dopant layer
37...電極層37. . . Electrode layer
第一圖係為本發明中薄型矽晶太陽能電池第一實施例之結構側視圖。The first figure is a side view of the structure of the first embodiment of the thin-type twin solar cell of the present invention.
第二圖係為本發明中薄型矽晶太陽能電池第二實施例之結構側視圖。The second drawing is a side view of the structure of the second embodiment of the thin-type twin solar cell of the present invention.
第三圖係為本發明中薄型矽晶太陽能電池製造方法之流程方塊示意圖。The third figure is a schematic block diagram of a method for manufacturing a thin-type twin solar cell in the present invention.
第四圖(A)~(J)係為中本發明薄型矽晶太陽能電池製造方法之結構示意圖。The fourth (A) to (J) are structural schematic views of the manufacturing method of the thin-type twin solar cell of the present invention.
第五圖係為習有太陽能電池之結構側視圖。The fifth figure is a side view of the structure of a solar cell.
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