TWI405948B - Non-contacting aligning method for planes in three-dimensional environment - Google Patents

Non-contacting aligning method for planes in three-dimensional environment Download PDF

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TWI405948B
TWI405948B TW099103058A TW99103058A TWI405948B TW I405948 B TWI405948 B TW I405948B TW 099103058 A TW099103058 A TW 099103058A TW 99103058 A TW99103058 A TW 99103058A TW I405948 B TWI405948 B TW I405948B
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angle
stripe light
light
stripe
full
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TW201128164A (en
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Chien Chung Jeng
Chiu Hsien Wu
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Nat Univ Chung Hsing
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Abstract

A non-contacting aligning method for planes in a three-dimensional environment is disclosed. The method includes: projecting a light beam in a predetermined incident angle onto a transparent first object and an opaque second object that are facing each other; and calculating a distance between the first and second objects basing on the tangent trigonometric function of the incident angle of the light beam.

Description

非接觸式3D全平面位置對準法Non-contact 3D full plane position alignment

本發明係涉及量測二物件之疊對誤差的方法及裝置,更詳而言之,是一種利用非接觸式的量測手段,監測二物件疊對時的XY軸誤差,以及監測二物件疊對時的垂直相對距離(Z軸)及平行度。The invention relates to a method and a device for measuring the stacking error of two objects, and more particularly, a non-contact measuring method for monitoring the XY axis error of two object pairs and monitoring the two object stacks The vertical relative distance (Z axis) and parallelism of the time.

在微影製程中,將光罩圖案一的轉移到一電路基板,以及將該光罩上已定義好的圖案轉移到晶圓表面的製程中,涉及了物件疊對誤差之量測及校正技術,以確保圖案能精準的轉移。因此疊對二物件的XY軸定位、垂直相對距離之Z軸定位、以及平行定位在微影製程中非常重要。除了微影製程之外,安裝超導量子干涉儀(SQUID Microscope)的感測頭時,感測頭與樣品的相對距離和平行度,對干涉儀的敏感度有直接的影響。In the lithography process, transferring the reticle pattern to a circuit substrate and transferring the defined pattern on the reticle to the wafer surface process involves measuring and correcting the error of the object stacking error To ensure that the pattern can be transferred accurately. Therefore, the XY-axis positioning of the two-piece object, the Z-axis positioning of the vertical relative distance, and the parallel positioning are very important in the lithography process. In addition to the lithography process, when the sensor head of a SQUID Microscope is installed, the relative distance and parallelism of the sensor head to the sample have a direct influence on the sensitivity of the interferometer.

茲以微影製程為例,說明傳統技術如何解決疊對物件之XYZ三軸定位的問題。Take the lithography process as an example to illustrate how traditional techniques can solve the problem of XYZ triaxial positioning of stacked objects.

已知,利用一設定於Z軸的影像擷取裝置可監看該疊對物件XY軸標記點的疊對情形。而Z軸監測方法之一,係採用移動鏡頭以監看疊對物件焦平面影像來達成,在移動監看的過程中,若發生焦平面產生對焦變化時,表示二疊對物件之間有一傾斜角度。但是此一方法於影像解析度不足時將難以判讀,且無法確切得知傾斜角度。It is known to use an image capture device set on the Z-axis to monitor the overlapping of the XY-axis mark points of the stack of objects. One of the Z-axis monitoring methods is to use a moving lens to monitor the focal plane image of the object. In the process of moving monitoring, if the focal plane produces a focus change, it means that there is a tilt between the two stacks of objects. angle. However, this method is difficult to interpret when the image resolution is insufficient, and the tilt angle cannot be known exactly.

Z軸監測方法之二,係利用至少兩個影像擷取裝置從不同角度拍攝,比對不同角度的影像,以求得Z軸方向的距離,但需經過複雜的演算,且對位操作非常困難,亦無法精確量出疊對物件之間的傾斜角度。The second method of Z-axis monitoring is to use at least two image capturing devices to shoot from different angles and compare the images at different angles to obtain the distance in the Z-axis direction, but it requires complicated calculation and it is very difficult to operate the alignment. It is also impossible to accurately measure the tilt angle between the objects.

本案之目的係在提供一種以非接觸式的手段監測二疊對物件垂直相對距離以及平行度的方法,配合X-Y軸平面監測,達到3D全平面位置對準的目的。The purpose of this case is to provide a non-contact method for monitoring the vertical relative distance and parallelism of the objects of the two stacks, and the X-Y axis plane monitoring to achieve the 3D full plane position alignment.

本案上述之非接觸式手段主要以斜向入射的條紋光投影於疊對物件,利用條紋光入射角度和入射角正切三角函數計算出二疊對物件的垂直相對距離。從該二疊對物件X-Y軸平面觀察投影的條紋光是否彼此平行來判斷兩者的平行度。當該二疊對物件之間出現一傾斜夾角時,相鄰二條紋光之間會產生一夾角,利用該夾角和三角函數關係式計算出二疊對物件之間的傾斜角度。一已知的調整手段可利用上述的量測結果調整其中一疊對物件,以達到疊對物件X-Y-Z三軸定位並確定疊對物件保持平行的目的。The non-contact method described above mainly projects the obliquely incident stripe light onto the stacked object, and uses the stripe light incident angle and the incident angle tangent trigonometric function to calculate the vertical relative distance of the two stacks of the object. The parallelism of the two is determined by observing whether the projected stripe lights are parallel to each other from the plane of the X-Y axis of the object. When a tilt angle occurs between the two pairs of objects, an angle is formed between adjacent two stripe lights, and the angle between the two stacks is calculated by using the angle and the trigonometric relationship. A known adjustment means can use the above-mentioned measurement results to adjust one of the pairs of objects to achieve the purpose of overlapping the object X-Y-Z triaxial positioning and determining that the overlapping objects remain parallel.

實現上述非接觸式手段的裝置包括一影像擷取裝置、一條紋光產生裝置和一計算裝置。該影像擷取裝置被設定在一疊對的第一物件和第二物件的Z軸,該條紋光產生裝置產生一條紋光,該條紋光以預定角度投影在第一物件和第二物件,第二物件所反射的條紋光投影在該第一物件,投影於該第一物件和第二物件上的條紋光影像被該影像擷取裝置所擷取,該計算裝置量測呈現於該第一物件上的二條紋光的距離並利用已知的條紋光入射角度,以入射角正切三角函數計算出第一物件和第二物件的相對垂直距離。此外,可藉由第二物件上的條紋光與第一物件上的條紋光平行度來判斷第一和第二物件是否平行。亦可藉由該第一物件和第二物件上的條紋光夾角以及三角函數關係式計算出第一物件相對於第二物件的傾斜角度。以便於一已知的調整手段利用上述的量測結果調整該第一物件使與第二物件平行。本案上述影像擷取裝置可擷取第一和第二物件的X-Y軸平面影像,判斷兩者之疊對標記點是否對準。據此本案非接觸式手段可達到3D全平面位置對準之目的。The apparatus for implementing the above non-contact means includes an image capturing device, a stripe light generating device and a computing device. The image capturing device is configured to set a Z-axis of the first object and the second object, the stripe light generating device generates a stripe light that is projected at a predetermined angle on the first object and the second object, The stripe light reflected by the two objects is projected on the first object, and the stripe light image projected on the first object and the second object is captured by the image capturing device, and the computing device measures the first object. The distance between the two stripe lights is used and the relative vertical distance of the first object and the second object is calculated by the incident angle tangent trigonometric function using the known incident angle of the stripe light. In addition, whether the first and second objects are parallel may be determined by the parallelism of the stripe light on the second object with the stripe light on the first object. The angle of inclination of the first object relative to the second object may also be calculated by the angle of the stripe light on the first object and the second object and a trigonometric relationship. In order to facilitate the adjustment of the first object by a known adjustment means, the first object is made parallel to the second object. In the above case, the image capturing device can capture the X-Y axis plane images of the first and second objects, and determine whether the overlapping pairs of the two points are aligned. According to this, the non-contact method of this case can achieve the purpose of 3D full-plane position alignment.

如第一圖,描述計算平行疊對的一第一物件10和一第二物件20之垂直相對距離Z的方法。斜向入射的條紋光30以預定角度(θ)投影在可透光的第一物件10和可反射光線的第二物件20,第二物件20所反射的條紋光投影在該第一物件10。因此,該第一物件10具有一入射條紋光31和一反射條紋光32,該第二物件20則具有一道入射條紋光33。假設該第一物件10的入射條紋光31和反射條紋光32兩道條紋光31,32的距離為2X,利用公式1可計算出第一物件10和第二物件20的垂直相對距離Z。As a first figure, a method of calculating the vertical relative distance Z of a first object 10 and a second object 20 of a parallel stack is described. The obliquely incident stripe light 30 is projected at a predetermined angle (θ) on the first object 10 that is permeable to light and the second object 20 that reflects light, and the stripe light reflected by the second object 20 is projected on the first object 10. Therefore, the first object 10 has an incident stripe light 31 and a reflective stripe light 32, and the second object 20 has an incident stripe light 33. Assuming that the distance between the two stripe lights 31, 32 of the incident stripe light 31 and the reflected stripe light 32 of the first object 10 is 2X, the vertical relative distance Z of the first object 10 and the second object 20 can be calculated by Equation 1.

如第二圖和第三圖,係以一正前方的俯視圖描述上述三道條紋光31,32,33呈現於第一物件10和第二物件20,以及第一物件10和該第二物件20的垂直相對距離Z改變時,呈現於該第一物件10的入射條紋光31和反射條紋光32的相對距離亦會有所改變。垂直相對距離Z較大時,入射條紋光31和反射條紋光32的相對距離差較大,反之,則較小。As shown in the second and third figures, the three stripe lights 31, 32, 33 are presented in the first object 10 and the second object 20, and the first object 10 and the second object 20 are depicted in a front view. When the vertical relative distance Z changes, the relative distance between the incident stripe light 31 and the reflected stripe light 32 present in the first object 10 also changes. When the vertical relative distance Z is large, the difference in the relative distance between the incident stripe light 31 and the reflected stripe light 32 is large, and conversely, it is small.

如第四圖和第五圖,係以一正前方的俯視圖描述若第一物件10相對於該第二物件20發生傾斜,上述三道條紋光31,32,33的變化。當該第一物件10與第二物件20之間有一傾斜角度φ時,呈現於該第一物件10的入射條紋光31和反射條紋光32會與呈現於該第二物件20的入射條紋光33有一夾角ψ,以公式2可計算出該傾斜角度φ。As shown in the fourth and fifth figures, the change of the three stripe lights 31, 32, 33 is described as if the first object 10 is tilted relative to the second object 20 in a front view. When the first object 10 and the second object 20 have an oblique angle φ, the incident stripe light 31 and the reflected stripe light 32 present in the first object 10 and the incident stripe light 33 present in the second object 20 There is an angle ψ, and the inclination angle φ can be calculated by the formula 2.

一已知的調整手段可利用上述的垂直相對距離Z調整該第一物件10相對於該第二物件20的垂直距離而達一目標值。亦可利用所計算出的傾斜角度φ調整該第一物件10,使其與第二物件20保持平行。A known adjustment means can adjust the vertical distance of the first object 10 relative to the second object 20 by a vertical relative distance Z to achieve a target value. The first object 10 can also be adjusted to be parallel with the second object 20 by using the calculated tilt angle φ.

如第六圖和第七圖,描述實現上述方法的裝置,包括一影像擷取裝置40、一條紋光產生裝置50和與該影像擷取裝置40耦合的計算裝置60。該影像擷取裝置40被設定在該第一物件10和第二物件20的Z軸,該條紋光產生裝置50可產生上述的條紋光30,投影於該第一物件10的入射條紋光31和反射條紋光32以及第二物件20的入射條紋光33的影像被該影像擷取裝置40所擷取,該計算裝置60可藉由所擷取的影像量測該第一物件10之入射條紋光31和反射條紋光32的相對距離,並利用已知的條紋光入射角度θ,以公式一計算出第一物件10和第二物件20的相對垂直距離Z。藉由第二物件20上的條紋光與第一物件10上的各條紋光平行度來判斷第一和第二物件是否平行。當第一和第二物件之間具有一傾斜角度時,該計算裝置60以公式二計算出該第一物件10的傾斜角度φ。Apparatus for implementing the above method, including an image capture device 40, a stripe light generating device 50, and a computing device 60 coupled to the image capture device 40, are depicted as in the sixth and seventh figures. The image capturing device 40 is disposed on the Z-axis of the first object 10 and the second object 20, and the stripe light generating device 50 can generate the stripe light 30, the incident stripe light 31 projected on the first object 10, and The image of the reflected stripe light 32 and the incident stripe light 33 of the second object 20 is captured by the image capturing device 40. The computing device 60 can measure the incident stripe light of the first object 10 by the captured image. 31 and the relative distance of the reflected stripe light 32, and using the known stripe light incident angle θ, the relative vertical distance Z of the first object 10 and the second object 20 is calculated by Equation 1. Whether the first and second objects are parallel is determined by the parallelism of the stripe light on the second object 20 and the stripe light on the first object 10. When there is an oblique angle between the first and second objects, the computing device 60 calculates the tilt angle φ of the first object 10 by Equation 2.

上述的條紋光產生裝置50主要包括:一光源51,一供該光源51安裝並可調整該光源入射角的角度調整器52,一使該光源51呈預定寬度(約500μm)條紋狀的輔助器53。所述的光源51可為LED,該輔助器53為一具有狹縫54的構造,LED光源透過該狹縫54再經由一凸透鏡55聚焦而以條紋光呈現於該第一物件10和該第二物件20。條紋光的寬度約500μm。所述的光源51亦可為雷射光,該輔助器53則為一柱狀透鏡,可產生寬度約60μm的條紋光呈現於該第一物件10和該第二物件20。The above-mentioned stripe light generating device 50 mainly includes: a light source 51, an angle adjuster 52 for mounting the light source 51 and adjusting the incident angle of the light source, and an auxiliary device for causing the light source 51 to have a stripe shape with a predetermined width (about 500 μm). 53. The light source 51 can be an LED. The auxiliary device 53 has a configuration with a slit 54. The LED light source is focused through the slit 54 and then focused by a convex lens 55 to be present in the first object 10 and the second stripe light. Object 20. The stripe light has a width of about 500 μm. The light source 51 can also be laser light, and the auxiliary device 53 is a cylindrical lens, and the stripe light having a width of about 60 μm can be generated on the first object 10 and the second object 20.

在本案實施例中,由於可透光的第一物件10大多係為高透光率之玻璃所構成,為使條紋光得以清晰的呈現在可透光的第一物件10(玻璃)上,可使用三氧化二鋁粉末將第一物件10的表面進行研磨以產生一顯影面,該顯影面經表面處理後其透光率降低,且具有部份反光效果,則使入射條紋光31與反射條紋光32可清楚地呈現於該顯影面上。In the embodiment of the present invention, since the first object 10 that is permeable to light is mostly composed of glass with high light transmittance, in order to make the stripe light clearly appear on the first object 10 (glass) that can transmit light, The surface of the first article 10 is ground using an aluminum oxide powder to produce a developing surface which has a reduced light transmittance after surface treatment and has a partial reflection effect to cause the incident stripe light 31 and the reflection stripe Light 32 can be clearly presented on the development surface.

在本案之另一實施例中,可於第一物件10之表面以鍍膜方式產生一具部份反光效果之顯影面,使入射條紋光31與反射條紋光32可清楚地呈現於該顯影面上。In another embodiment of the present invention, a developing surface having a partial reflective effect can be formed on the surface of the first object 10 by coating, so that the incident stripe light 31 and the reflected stripe light 32 can be clearly presented on the developing surface. .

如第八圖,上述影像擷取裝置40亦可擷取第一物件10和第二物件20的X-Y軸平面影像,判斷兩者之標記點15是否對準。據此本案上述裝置可監測X-Y-Z三軸全平面位置。As shown in the eighth figure, the image capturing device 40 can also capture the X-Y plane image of the first object 10 and the second object 20 to determine whether the marking points 15 of the two are aligned. According to the above device, the above device can monitor the X-Y-Z triaxial full plane position.

雖然本案是以一個最佳實施例做說明,但精於此技藝者能在不脫離本案精神與範疇下做各種不同形式的改變。以上所舉實施例僅用以說明本案而已,非用以限制本案之範圍。舉凡不違本案精神所從事的種種修改或變化,俱屬本案申請專利範圍。Although the present case is illustrated by a preferred embodiment, those skilled in the art can make various forms of changes without departing from the spirit and scope of the present invention. The above embodiments are only used to illustrate the present case and are not intended to limit the scope of the present invention. All kinds of modifications or changes that are not in violation of the spirit of the case are the scope of patent application in this case.

10‧‧‧第一物件10‧‧‧First object

15‧‧‧標記點15‧‧‧ points

20‧‧‧第二物件20‧‧‧Second objects

30‧‧‧條紋光30‧‧‧Striped light

31‧‧‧入射條紋光31‧‧‧ incident streak light

32‧‧‧反射條紋光32‧‧‧ Reflection stripe light

33‧‧‧入射條紋光33‧‧‧ incident stripe light

40‧‧‧影像擷取裝置40‧‧‧Image capture device

50‧‧‧條紋光產生裝置50‧‧‧Striped light generating device

51‧‧‧光源51‧‧‧Light source

52‧‧‧角度調整器52‧‧‧ Angle adjuster

53‧‧‧輔助器53‧‧‧Assistor

54‧‧‧狹縫54‧‧‧slit

55‧‧‧凸透鏡55‧‧‧ convex lens

60‧‧‧計算裝置60‧‧‧ Computing device

第一圖係以側視圖描述平行疊對物件之垂直相對距離的計算方法。The first figure is a side view depicting the calculation of the vertical relative distance of the parallel stack of objects.

第二圖係以一正前方的俯視圖描述條紋光呈現於疊對物件的情形。The second figure depicts a situation in which stripe light is present in a stack of objects in a top view.

第三圖係以一正前方的俯視圖描述疊對物件之相對距離變化時條紋光變化的情形。The third figure describes the case where the stripe light changes when the relative distance between the objects is changed in a front view.

第四圖係以一側視圖描述疊對物件之間具有一傾斜角度。The fourth figure depicts a tilt angle between the stacked objects in a side view.

第五圖係以一正前方的俯視圖描述疊對物件之間有一傾斜角度時條紋光變化的情形。The fifth figure depicts a situation in which the stripe light changes when there is an oblique angle between the objects in a front view.

第六圖係本案裝置之示意圖之一。The sixth figure is one of the schematic diagrams of the device of the present invention.

第七圖係本案裝置之示意圖之二。The seventh picture is the second schematic of the device in this case.

第八圖係以俯視圖描述疊對物件X-Y軸平面具有疊對標記物。The eighth figure depicts the stacked object X-Y axis plane with a pair of markers in a top view.

10‧‧‧第一物件10‧‧‧First object

20‧‧‧第二物件20‧‧‧Second objects

30‧‧‧條紋光30‧‧‧Striped light

40‧‧‧影像擷取裝置40‧‧‧Image capture device

50‧‧‧條紋光產生裝置50‧‧‧Striped light generating device

51‧‧‧光源51‧‧‧Light source

52‧‧‧角度調整器52‧‧‧ Angle adjuster

53‧‧‧輔助器53‧‧‧Assistor

54‧‧‧狹縫54‧‧‧slit

55‧‧‧凸透鏡55‧‧‧ convex lens

60‧‧‧計算裝置60‧‧‧ Computing device

Claims (6)

一種非接觸式3D全平面位置對準法,包括:將一條紋光以預定入射角投影於疊對的一可透光的第一物件和一不透光的第二物件;以及以該條紋光之入射角的正切三角函數計算出該第一物件和該第二物件的垂直相對距離,並以該第一物件之條紋光與該第二物件之條紋光在一平面上所呈現的一夾角計算該第一物件和該第二物件之間的傾斜角度。 A non-contact 3D full-plane position alignment method includes: projecting a stripe light at a predetermined incident angle to a pair of permeable first objects and a opaque second object; and using the stripe light The tangent trigonometric function of the incident angle calculates the vertical relative distance between the first object and the second object, and calculates the angle between the stripe light of the first object and the stripe light of the second object on a plane. An angle of inclination between the first object and the second object. 如申請專利範圍第1項所述非接觸式3D全平面位置對準法,其係以下列關係式計算該傾斜角度之近似值,其中傾斜角度為該第一物件和該第二物件之間的傾斜角度,夾角為該第一物件之條紋光與該第二物件之條紋光在一平面上所呈現的夾角角度: The non-contact 3D full-plane position alignment method according to claim 1, wherein the approximation of the inclination angle is calculated by the following relationship, wherein the inclination angle is an inclination between the first object and the second object. The angle is the angle between the stripe light of the first object and the stripe light of the second object on a plane: 如申請專利範圍第1項所述非接觸式3D全平面位置對準法,其係以下列關係式計算該傾斜角度的真值,其中傾斜角度為該第一物件和該第二物件之間的傾斜角度,夾角為該第一物件之條紋光與該第二物件之條紋光在一平面上所呈現的夾角角度: The non-contact 3D full-plane position alignment method according to claim 1, wherein the true value of the tilt angle is calculated by the following relationship, wherein the tilt angle is between the first object and the second object. The angle of inclination is an angle between the stripe light of the first object and the stripe light of the second object on a plane: 如申請專利範圍第1項所述非接觸式3D全平面位置對準法,其中該可透光的第一物件表面係設有一具部份反光率之顯影面。 The non-contact 3D full-surface alignment method according to claim 1, wherein the surface of the first object that is permeable to light is provided with a developing surface having a partial reflectivity. 如申請專利範圍第4項所述非接觸式3D全平面位置對準法,其中該第一物件表面係以三氧化二鋁粉末進行研磨以形成該顯影面。 The non-contact 3D full planar alignment method according to claim 4, wherein the surface of the first object is ground with an aluminum oxide powder to form the developing surface. 如申請專利範圍第4項所述非接觸式3D全平面位置對準法,其中該第一物件表面鍍膜方式產生一具部份反光率之顯影面。 The non-contact 3D full-plane position alignment method according to claim 4, wherein the first object surface coating method produces a developing surface having a partial reflectance.
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TWI457541B (en) 2012-12-24 2014-10-21 Ind Tech Res Inst Method for detecting tilt angle of object surface, method for compensating thereof and system therefore

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JPH0299803A (en) * 1988-10-07 1990-04-11 Fuji Photo Film Co Ltd Measuring apparatus for floating amount of transparent film
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JPH0299803A (en) * 1988-10-07 1990-04-11 Fuji Photo Film Co Ltd Measuring apparatus for floating amount of transparent film
TW375678B (en) * 1999-05-21 1999-12-01 Lin Qing Rou Laser interferometer for measuring angle of rotation of roll-axis
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