TWI400747B - Laser irradiation method and device - Google Patents
Laser irradiation method and device Download PDFInfo
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- 230000001678 irradiating effect Effects 0.000 claims description 3
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- 229910052799 carbon Inorganic materials 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
- H01L21/263—Bombardment with radiation with high-energy radiation
- H01L21/268—Bombardment with radiation with high-energy radiation using electromagnetic radiation, e.g. laser radiation
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/062—Shaping the laser beam, e.g. by masks or multi-focusing by direct control of the laser beam
- B23K26/0622—Shaping the laser beam, e.g. by masks or multi-focusing by direct control of the laser beam by shaping pulses
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/08—Devices involving relative movement between laser beam and workpiece
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Description
本發明為關於雷射照射方法及裝置。詳言之,該雷射照射方法及裝置係有關於可以進行雷射照射並使得在雷射照射後之被處理基板不會出現條紋般之處理圖案。The present invention relates to a laser irradiation method and apparatus. In particular, the laser irradiation method and apparatus are related to a processing pattern in which laser irradiation can be performed and the processed substrate after the laser irradiation is not streaked.
在先前技術,習知之半導體裝置之製造方法是當將具有帶狀照射區域之光線射束照射在被處理基板時,在帶狀照射區域之短軸方向上使光線射束掃描式地移動,同時在帶狀照射區域之長軸方向上使帶狀照射區域振動(例如參照專利文獻1)。In the prior art, a conventional semiconductor device is manufactured by scanning a light beam in a short-axis direction of a strip-shaped irradiation region while irradiating a light beam having a strip-shaped irradiation region on a substrate to be processed, while simultaneously The strip-shaped irradiation region is vibrated in the longitudinal direction of the strip-shaped irradiation region (see, for example, Patent Document 1).
[專利文獻1]日本專利特公平04-10216號公報[Patent Document 1] Japanese Patent Special Publication No. 04-10216
在上述之先前技術中,因為使帶狀照射區域在長軸方向上以一定頻率(例如1kHz)振動,所以在帶狀照射區域之長軸方向,就該帶狀照射區域之位置之變化而言,成為規則地變化。In the above prior art, since the strip-shaped irradiation region is vibrated at a certain frequency (for example, 1 kHz) in the long-axis direction, in the long-axis direction of the strip-shaped irradiation region, in terms of the change in the position of the strip-shaped irradiation region , become a regular change.
但是,當帶狀照射區域之長軸方向之位置變化成為規則時,在處理後之被處理基板會出現條紋般之處理圖案,嚴重之情況下甚至會出現可以辨視程度之條紋,而成為問題點。However, when the positional change in the long-axis direction of the strip-shaped irradiation region becomes a rule, a stripe-like treatment pattern appears on the substrate to be processed after the treatment, and in a serious case, even a stripe which can be discerned is formed, which becomes a problem. point.
因此,本發明之目的是提供一種雷射照射方法及裝置,可以進行雷射照射並使得在雷射照射後之被處理基板不會出現條紋般之處理圖案。SUMMARY OF THE INVENTION Accordingly, it is an object of the present invention to provide a laser irradiation method and apparatus which can perform laser irradiation and which does not cause a stripe-like processing pattern on a substrate to be processed after laser irradiation.
在第1觀點,本發明提供一種雷射照射方法,其係在半導體基板(S)上形成一照射雷射光之帶狀照射區域(6);同時一面在帶狀照射區域(6)之長軸方向上變化帶狀照射區域(6)之位置,並一面在帶狀照射區域(6)之短軸方向上使半導體基板(S)移動,如此之雷射照射方法;其特徵為:使在帶狀照射區域(6)之長軸方向的位置,和位置變化時序之至少一方成為不規則。In a first aspect, the present invention provides a laser irradiation method in which a strip-shaped irradiation region (6) for irradiating laser light is formed on a semiconductor substrate (S); and a long axis of a strip-shaped irradiation region (6) is simultaneously provided. The position of the strip-shaped irradiation region (6) is changed in the direction, and the semiconductor substrate (S) is moved in the short-axis direction of the strip-shaped irradiation region (6), such that the laser irradiation method is characterized in that: At least one of the position in the long axis direction of the shaped irradiation region (6) and the position change timing is irregular.
在上述第1觀點之雷射照射方法中,在雷射光帶狀照射區域(6)之長軸方向上,同時一面變化帶狀照射區域(6)之位置並一面進行雷射照射,使該位置不規則地變化;或者是使各位置成為數個不同地方之固定位置,但使位置之變化之時序成為不規則變化;或者是使位置之不規則變化和變化位置之時序均為不規則變化。依照此種方式,經由位置和變化位置之時序之至少一方之不規則變化,則在雷射照射後之被處理基板不會出現條紋般之處理圖案。In the laser irradiation method according to the first aspect, the position of the strip-shaped irradiation region (6) is simultaneously changed in the longitudinal direction of the laser beam-shaped irradiation region (6), and the laser beam is irradiated to the position. Irregularly changing; or making each position a fixed position in several different places, but making the timing of the change of the position change irregularly; or making the irregularity of the position and the timing of changing the position are irregular changes. According to this aspect, the irregularity of at least one of the timings of the position and the change position causes the stripe-like processing pattern to not appear on the substrate to be processed after the laser irradiation.
在第2觀點,本發明所提供之雷射照射方法,其特徵在於在上述第1觀點之雷射照射方法中,使上述之帶狀照射區域(6)之位置成為2個以上,順序地選擇該等位置之一,並使選擇時序成為隨機。According to a second aspect of the present invention, in the laser irradiation method of the first aspect, the position of the strip-shaped irradiation region (6) is two or more, and the steps are sequentially selected. One of these locations and makes the selection timing random.
在上述第2觀點之雷射照射方法中,在雷射光之帶狀照射區域(6)之長軸方向,同時一面變化帶狀照射區域(6)之位置,並一面進行雷射照射,而位置為多個不同地方之固定位置但位置變化時序為不規則地變化。利用此種方式,則在雷射照射後之被處理基板不會出現條紋般之處理圖案。In the laser irradiation method according to the second aspect described above, the position of the strip-shaped irradiation region (6) is changed while the longitudinal direction of the strip-shaped irradiation region (6) of the laser light is changed, and the laser beam is irradiated. It is a fixed position for a plurality of different places but the position change timing is irregularly changed. In this way, the processed substrate after the laser irradiation does not have a stripe-like processing pattern.
在第3觀點,本發明所提供之雷射照射方法,其特徵在於在上述第2觀點之雷射照射方法中,上述之雷射光照射是以脈波(pulse)狀進行,以在該脈波間隔之1倍至16倍間隨機選擇之間隔,變化上述帶狀照射區域(6)之位置。According to a third aspect of the present invention, in the laser irradiation method of the second aspect, the laser light irradiation is performed in a pulse shape in the pulse wave. The position of the strip-shaped irradiation region (6) is changed at intervals randomly selected between 1 and 16 times the interval.
在上述第3觀點之雷射照射方法中,可以使位置變化時序實質上成為不規則。In the laser irradiation method according to the third aspect described above, the position change timing can be made substantially irregular.
在第4觀點,本發明所提供之雷射照射方法,其特徵在於在上述第1觀點之雷射照射方法中,使上述帶狀照射區域(6)之位置為5個位置以上,並隨機選擇該等位置之一,而選擇時序可為固定或隨機。According to a fourth aspect of the present invention, in the laser irradiation method of the first aspect, the position of the strip-shaped irradiation region (6) is set to five or more positions, and is randomly selected. One of these positions, and the selection timing can be fixed or random.
在上述第4觀點之雷射照射方法中,在雷射光之帶狀照射區域(6)之長軸方向上,同時一面變化帶狀照射區域(6)之位置,並一面進行雷射照射,使該位置成為5個位置以上之固定位置,而從該等之中的位置選擇是不規則地變化。依照此種方式,使該位置實質上成為不規則,則在雷射照射後之被處理基板不會出現條紋般之處理圖案。In the laser irradiation method according to the fourth aspect described above, the position of the strip-shaped irradiation region (6) is simultaneously changed in the longitudinal direction of the strip-shaped irradiation region (6) of the laser light, and laser irradiation is performed thereon. This position is a fixed position of five or more positions, and the position selection from among them is irregularly changed. According to this aspect, if the position is substantially irregular, the processed substrate after the laser irradiation does not have a stripe-like processing pattern.
在第5觀點,本發明所提供之雷射照射方法,其特徵在於在上述第4觀點之雷射照射方法中,上述之雷射光照射是以脈波狀進行,在每一個脈波變化上述帶狀照射區域(6)之位置。According to a fifth aspect of the present invention, in the laser irradiation method of the fourth aspect, the laser light irradiation is performed in a pulse wave manner, and the band is changed for each pulse wave. The position of the illuminated area (6).
在上述第5觀點之雷射照射方法中,因為使位置變化之時序成為固定,所以控制變為容易。In the laser irradiation method according to the fifth aspect described above, since the timing of the position change is fixed, the control becomes easy.
在第6觀點,本發明所提供之雷射照射方法,其特徵在於在上述第4觀點之雷射照射方法中,上述之雷射光照射是以脈波狀進行,以在該脈波間隔之1倍至16倍間隨機選擇之間隔,變化上述帶狀照射區域(6)之位置。According to a sixth aspect of the present invention, in the laser irradiation method of the fourth aspect, the laser light irradiation is performed in a pulse wave manner at a pulse wave interval of 1 The position of the above-mentioned strip-shaped irradiation region (6) is changed by an interval of a random selection of 16 times.
在上述第6觀點之雷射照射方法中,可以使位置變化時序實質上成為不規則。In the laser irradiation method according to the sixth aspect described above, the position change timing can be made substantially irregular.
在第7觀點,本發明提供一種雷射照射裝置(100),其特徵在於具備有:雷射振盪器(1),用來輸出雷射光(A);光學元件(2),用來輸入上述雷射光(A),並使所輸出之雷射光(B1、B2)之位置可於2個位置以上變化;光學系統(3、4),使上述雷射光(B1、B2)之位置之變化方向成為帶狀照射區域(6)之長軸方向,在該帶狀照射區域整形上述雷射光(B1、B2),使其照射在半導體基板(S);移動台(5),用來保持上述半導體基板(S),並能在上述帶狀照射區域(6)之短軸方向移動;切換手段(10),用以順序選擇並切換上述雷射光(B1、B2)之一個;以及,切換時序控制手段(8),用來使上述之切換時序成為隨機。In a seventh aspect, the present invention provides a laser irradiation apparatus (100), characterized by comprising: a laser oscillator (1) for outputting laser light (A); and an optical element (2) for inputting the above Laser light (A), and the position of the output laser light (B1, B2) can be changed at two or more positions; the optical system (3, 4) causes the position of the laser light (B1, B2) to change direction The long axis direction of the strip-shaped irradiation region (6), the laser light (B1, B2) is shaped on the strip-shaped irradiation region to be irradiated onto the semiconductor substrate (S), and the mobile station (5) is used to hold the semiconductor a substrate (S) movable in a short axis direction of the strip-shaped irradiation region (6); a switching means (10) for sequentially selecting and switching one of the laser light (B1, B2); and switching timing control Means (8) is used to make the above switching timing random.
在上述第7觀點之雷射照射裝置(100)中,適合於用來實施上述第2觀點之雷射照射方法。The laser irradiation device (100) according to the seventh aspect described above is suitable for the laser irradiation method for performing the second aspect described above.
在第8觀點,本發明所提供之雷射照射裝置,其特徵在於在上述第7觀點之雷射照射裝置中,上述雷射振盪器(1)以脈波狀輸出雷射光;而上述切換時序控制手段(8)是使上述雷射光之脈波間隔之1倍至16倍間隨機選擇之間隔,成為上述切換之時序。According to a seventh aspect of the invention, in the laser irradiation apparatus of the seventh aspect, the laser oscillator (1) outputs laser light in a pulse wave shape; and the switching timing The control means (8) is an interval at which the pulse wave interval of the laser light is randomly selected from 1 to 16 times, and becomes the timing of the switching.
在上述第8觀點之雷射照射裝置(100)中,適合於用來實施上述第3觀點之雷射照射方法。The laser irradiation apparatus (100) according to the eighth aspect described above is suitable for the laser irradiation method for implementing the third aspect described above.
在第9觀點,本發明所提供之雷射照射裝置(200),其特徵在於具備有:雷射振盪器(1),用來輸出雷射光(A);光學元件(2),用來輸入上述雷射光(B1),並使所輸出之雷射光(B1~B5)之位置可於5個位置以上變化;光學系統(3、4),使上述雷射光(B1~B5)之位置的變化方向成為帶狀照射區域(6)之長軸方向,在該帶狀照射區域整形上述雷射光(B1~B5),使其照射在半導體基板(S);移動台(5),用來保持上述半導體基板(S),並能在上述帶狀照射區域(6)之短軸方向移動;切換手段(10),用以隨機選擇並切換上述雷射光(B1~B5)之一個;以及,切換時序控制手段(8),用來使上述之切換時序成為固定或隨機。According to a ninth aspect, a laser irradiation apparatus (200) according to the present invention is characterized by comprising: a laser oscillator (1) for outputting laser light (A); and an optical element (2) for inputting The above-mentioned laser light (B1), and the position of the output laser light (B1 to B5) can be changed at five or more positions; the optical system (3, 4) changes the position of the above-mentioned laser light (B1 to B5) The direction is the long axis direction of the strip-shaped irradiation region (6), and the laser light (B1 to B5) is shaped in the strip-shaped irradiation region to be irradiated onto the semiconductor substrate (S); and the moving table (5) is used to hold the above a semiconductor substrate (S) movable in a short axis direction of the strip-shaped irradiation region (6); a switching means (10) for randomly selecting and switching one of the laser light (B1 to B5); and switching timing The control means (8) is used to make the switching timing described above fixed or random.
在上述第9觀點之雷射照射裝置(100)中,適合於用來實施上述第4觀點之雷射照射方法。The laser irradiation device (100) according to the ninth aspect is suitable for the laser irradiation method for carrying out the fourth aspect.
在第10觀點,本發明所提供之雷射照射裝置,其特徵在於在第7觀點之雷射照射裝置中,上述雷射振盪器(1)以脈波狀輸出雷射光,而上述切換時序控制手段(8)是使與上述雷射光之脈波間隔相同之間隔,成為上述切換之時序。According to a tenth aspect, in the laser irradiation apparatus of the seventh aspect, the laser oscillator (1) outputs laser light in a pulse waveform, and the switching timing control The means (8) is such that the interval between the pulse waves of the laser light is the same as the timing of the switching.
在上述第10觀點之雷射照射裝置(100)中,適合於用來實施上述第5觀點之雷射照射方法。The laser irradiation apparatus (100) of the tenth aspect is suitable for the laser irradiation method for implementing the above fifth aspect.
在第11觀點,本發明所提供之雷射照射裝置,其特徵在於在上述第7觀點之雷射照射裝置中,上述雷射振盪器(1)以脈波狀輸出雷射光,而上述切換時序控制手段(8)是使在上述雷射光之脈波間隔之1倍至16倍間隨機選擇之間隔,成為上述切換之時序。According to a seventh aspect of the invention, in the laser irradiation apparatus of the seventh aspect, the laser oscillator (1) outputs laser light in a pulse waveform, and the switching timing The control means (8) is a timing at which the switching is randomly selected between 1 and 16 times the pulse interval of the laser light.
在上述第11觀點之雷射照射裝置(100)中,適合於用來實施上述第6觀點之雷射照射方法。The laser irradiation device (100) according to the eleventh aspect is suitable for the laser irradiation method for carrying out the sixth aspect.
在第12觀點,本發明所提供之雷射照射裝置,其特徵在於在上述第7至上述第11之任一觀點之雷射照射裝置中,上述光學元件(2)為聲光偏轉器。According to a thirteenth aspect, in the laser irradiation apparatus of any one of the seventh to eleventh aspect, the optical element (2) is an acousto-optic deflector.
在上述第12觀點之雷射照射裝置(100)中,因為使用作為光學元件(2)之聲光偏轉器,所以當與先前技術中之XY載物台相當之移動台(5)或與先前技術中之碳加熱器相當之雷射振盪器(1)或光學系統(3)進行移動之情況比較時,可以以高速進行位置控制。In the laser irradiation apparatus (100) of the above-described twelfth aspect, since the acousto-optic deflector as the optical element (2) is used, when it is equivalent to the XY stage of the prior art, the mobile station (5) or the previous When the carbon heater of the technology is compared with the case where the laser oscillator (1) or the optical system (3) is moved, the position control can be performed at a high speed.
依照本發明之雷射照射方法和裝置,經由使位置和變化位置之時序之至少一方成為不規則,而使雷射照射後之被處理基板不會出現條紋般之處理圖案。亦即,可以抑制由於帶狀照射區域在其長軸方向規則振動所造成之照射不均。According to the laser irradiation method and apparatus of the present invention, at least one of the timings of the position and the changed position is made irregular, so that the processed substrate after the laser irradiation does not have a stripe-like processing pattern. That is, it is possible to suppress uneven illumination due to regular vibration of the strip-shaped irradiation region in the longitudinal direction thereof.
下面利用圖示之實施形態用來更詳細地說明本發明。另外,此處之說明並不用來限定本發明。The present invention will now be described in more detail by way of embodiments shown in the drawings. In addition, the description herein is not intended to limit the invention.
圖1是構造說明圖,用來表示實施例1之雷射照射裝置100。1 is a configuration explanatory view showing a laser irradiation apparatus 100 of Embodiment 1.
該雷射照射裝置100具備有:雷射振盪器1,對應於觸發脈波T,而脈波式地輸出雷射光;聲光偏轉器(AOD元件)2,用來變化被輸入之雷射光A的輸出方向;均化器光學系統3和p-lens 4,使從AOD元件2輸出之雷射光B1或B2之位置之變化方向成為帶狀照射區域6之長軸方向,在該帶狀照射區域6對雷射光B1或B2進行整形,並使其照射在半導體基板S;移動台5,用來保持半導體基板S並使其在帶狀照射區域6之短軸方向移動;雷射振盪觸發脈波產生器7,用來以例如250 μ s之間隔,輸出觸發脈波T;切換時序控制電路8,以在觸發脈波T之脈波間隔之1倍至16倍之間,隨機選擇之間隔,輸出切換脈波t;第1 AOD元件驅動脈波產生器91,輸出第1偏向脈波b1,用來使從AOD元件2輸出之雷射光成為雷射光B1之方向;第2 AOD元件驅動脈波產生器92,用來輸出第2偏向脈波b2,而使從AOD元件2輸出之雷射光成為雷射光B1之方向;以及,切換電路10,對應於切換脈波t使第1偏向脈波b1和第2偏向脈波b2交替地切換,將其輸入到AOD元件2。The laser irradiation apparatus 100 includes a laser oscillator 1 that outputs laser light in response to a pulse wave T, and an acousto-optic deflector (AOD element) 2 for changing the input laser light A. Output direction; homogenizer optical system 3 and p-lens 4, such that the direction of change of the position of the laser beam B1 or B2 output from the AOD element 2 becomes the long-axis direction of the strip-shaped illumination region 6, in which the strip-shaped illumination region 6 pairs of the laser light B1 or B2 are shaped and irradiated on the semiconductor substrate S; the mobile station 5 is used to hold the semiconductor substrate S and move it in the short-axis direction of the strip-shaped illumination region 6; the laser oscillation triggers the pulse wave a generator 7 for outputting a trigger pulse T at intervals of, for example, 250 μs; switching the timing control circuit 8 between 1 and 16 times the pulse interval of the trigger pulse T, at a randomly selected interval, The switching pulse wave t is output; the first AOD element drives the pulse wave generator 91, and outputs a first deflection pulse b1 for causing the laser light output from the AOD element 2 to be in the direction of the laser light B1; and the second AOD element driving the pulse wave a generator 92 for outputting the second biasing pulse b2 to output the lightning from the AOD element 2 Light becomes a direction of the laser beam B1; and, a switching circuit 10, the switching pulse t corresponding to the first pulse toward b1 and the second switch alternately deflecting the pulse wave b2, which is inputted to the AOD element 2.
圖2是時序圖,用來說明觸發脈波T,雷射光之輸出期間,切換脈波t,和帶狀照射區域6之位置變化。2 is a timing chart for explaining the trigger pulse wave T, the switching pulse wave t during the output of the laser light, and the positional change of the strip-shaped irradiation region 6.
觸發脈波T之間隔τ為例如250 μ s之固定之值。The interval τ of the trigger pulse T is a fixed value of, for example, 250 μs.
雷射光與觸發脈波T同步,以例如脈波幅度W=125 μ s之脈波狀輸出。The laser light is synchronized with the trigger pulse wave T, for example, in the form of a pulse wave having a pulse wave amplitude of W = 125 μs.
切換脈波t,與雷射光之停止同步地被輸出。切換脈波t之間隔K是隨機地選擇,例如250 μ s、500 μ s、750 μ s、...、3750 μ s、4000 μ s之任一個。The switching pulse wave t is output in synchronization with the stop of the laser light. The interval K of the switching pulse t is randomly selected, for example, 250 μs, 500 μs, 750 μs, ..., 3750 μs, 4000 μs.
帶狀照射區域6之位置交替地成為B1或B2,但是因為切換之間隔K實質上為不規則,所以於位置B1或B2照射之時間成為不規則。The position of the strip-shaped irradiation region 6 alternately becomes B1 or B2, but since the interval K of the switching is substantially irregular, the time of irradiation at the position B1 or B2 becomes irregular.
依照實施例1之雷射照射裝置100時,在帶狀照射區域6之長軸方向上,同時一面使帶狀照射區域6之位置變化,並一面進行雷射照射。帶狀照射區域6之位置固定在B1和B2之2個位置,但是亦可以使切換位置之時序成為不規則之變化。利用此種方式,在雷射照射後之被處理基板S不會出現條紋般之處理圖案。另外,因為使用AOD元件2進行位置之切換,所以可以高速地切換。According to the laser irradiation apparatus 100 of the first embodiment, the position of the strip-shaped irradiation region 6 is simultaneously changed in the longitudinal direction of the strip-shaped irradiation region 6, and laser irradiation is performed. The position of the strip-shaped irradiation area 6 is fixed at two positions of B1 and B2, but the timing of the switching position can also be changed irregularly. In this manner, the processed substrate S after the laser irradiation does not have a stripe-like processing pattern. In addition, since the position switching is performed using the AOD element 2, it is possible to switch at a high speed.
另外,在上述說明中是使該位置固定在B1和B2之2個位置,但是亦可以使該位置成為3個以上,順序地切換。Further, in the above description, the position is fixed at two positions B1 and B2, but the position may be three or more, and the positions may be sequentially switched.
圖3是構造說明圖,用來表示實施例2之雷射照射裝置200。Fig. 3 is a structural explanatory view showing the laser irradiation apparatus 200 of the second embodiment.
該雷射照射裝置200具備有:雷射振盪器1,對應於觸發脈波T,而脈波式地輸出雷射光;AOD元件(聲光偏轉器)2,用來變化被輸入之雷射光A的輸出方向;均化器光學系統3和p-lens 4,使從AOD元件2輸出之雷射光B1~B5之位置之變化方向成為帶狀照射區域6之長軸方向,在該帶狀照射區域6對雷射光B1~B5進行整形,並使其照射在半導體基板S;移動台5,用來保持半導體基板S並使其在帶狀照射區域6之短軸方向移動;雷射振盪觸發脈波產生器7,用來以例如250 μ s之間隔,輸出觸發脈波T;切換時序控制電路8,以與觸發脈波T之脈波間隔相同之間隔K,輸出切換脈波t;第1~第5 AOD元件驅動脈波產生器91~95,用來輸出第1~第5偏向脈波b1~b5,而使從AOD元件2輸出之雷射光成為雷射光B1~B5之方向;以及,切換電路10,對應於切換脈波t隨機選擇第1~第5偏向脈波b1~b5之任一個,將其輸入到AOD元件2。The laser irradiation device 200 includes a laser oscillator 1 that outputs laser light in a pulse wave type corresponding to the trigger pulse wave T, and an AOD element (acoustic light deflector) 2 for changing the input laser light A. The output direction; the homogenizer optical system 3 and the p-lens 4, the direction of the change of the position of the laser light B1 to B5 output from the AOD element 2 becomes the long-axis direction of the strip-shaped irradiation region 6, in which the strip-shaped irradiation region 6 pairs of laser light B1~B5 are shaped and irradiated on the semiconductor substrate S; the mobile station 5 is used to hold the semiconductor substrate S and move it in the short axis direction of the strip-shaped illumination region 6; the laser oscillation triggers the pulse wave The generator 7 is configured to output a trigger pulse T at an interval of, for example, 250 μs; and switch the timing control circuit 8 to output a switching pulse t at the same interval K as the pulse wave interval of the trigger pulse T; The fifth AOD element drives the pulse wave generators 91 to 95 for outputting the first to fifth deflection pulses b1 to b5, so that the laser light output from the AOD element 2 becomes the direction of the laser light B1 to B5; and, switching The circuit 10 randomly selects any one of the first to fifth deflection pulses b1 to b5 corresponding to the switching pulse wave t, and inputs it to AOD component 2.
圖4是時序圖,用來說明觸發脈波T,雷射光之輸出期間,切換脈波t,和帶狀照射區域6之位置變化。4 is a timing chart for explaining the trigger pulse wave T, the switching pulse wave t during the output of the laser light, and the positional change of the strip-shaped irradiation region 6.
觸發脈波T之間隔τ為例如250 μ s之固定之值。The interval τ of the trigger pulse T is a fixed value of, for example, 250 μs.
雷射光與觸發脈波T同步,以例如脈波幅度W=125 μ s之脈波狀輸出。The laser light is synchronized with the trigger pulse wave T, for example, in the form of a pulse wave having a pulse wave amplitude of W = 125 μs.
切換脈波t,與雷射光之停止同步地被輸出。切換脈波t之間隔K例如為250 μ s。The switching pulse wave t is output in synchronization with the stop of the laser light. The interval K of the switching pulse t is, for example, 250 μs.
帶狀照射區域6之位置是不規則地選擇B1~B5之任一個。因此,在各個照射位置B1~B5照射之時間成為固定,但是要在哪一位置照射則成為不規則。The position of the strip-shaped irradiation area 6 is any one of B1 to B5 which is irregularly selected. Therefore, the time of irradiation at each of the irradiation positions B1 to B5 is fixed, but it is irregular at which position to illuminate.
依照實施例2之雷射照射裝置200時,在帶狀照射區域6之長軸方向上,同時一面使帶狀照射區域6之位置變化,並一面進行雷射照射。帶狀照射區域6之位置成為B1~B5之任一個,各個位置之照射時間為固定。但是,成為哪一個位置變成不規則,所以在雷射照射後之被處理基板S不會出現條紋般之處理圖案。另外,因為使用AOD元件2進行位置之切換,所以可以高速地切換。According to the laser irradiation apparatus 200 of the second embodiment, the position of the strip-shaped irradiation region 6 is simultaneously changed in the longitudinal direction of the strip-shaped irradiation region 6, and laser irradiation is performed. The position of the strip-shaped irradiation region 6 is any one of B1 to B5, and the irradiation time at each position is fixed. However, since the position becomes irregular, the processed substrate S after the laser irradiation does not have a stripe-like processing pattern. In addition, since the position switching is performed using the AOD element 2, it is possible to switch at a high speed.
在實施例2之雷射照射裝置200中,亦可以使用實施例1之切換時序控制電路8。In the laser irradiation apparatus 200 of the second embodiment, the switching timing control circuit 8 of the first embodiment can also be used.
依照實施例3之雷射照射裝置時,在帶狀照射區域6之長軸方向上,同時一面使帶狀照射區域6之位置變化並一面進行雷射照射。帶狀照射區域6之位置成為B1~B5之任一個,但是成為哪一個位置變成不規則。另外,各個位置之照射時間亦成為不規則。因此,在雷射照射後之被處理基板S不會出現條紋般之處理圖案。另外,因為使用AOD元件2進行位置之切換,所以可以高速地切換。According to the laser irradiation apparatus of the third embodiment, the laser irradiation is performed while changing the position of the strip-shaped irradiation region 6 in the longitudinal direction of the strip-shaped irradiation region 6. The position of the strip-shaped irradiation area 6 is any one of B1 to B5, but which position becomes irregular. In addition, the irradiation time at each position is also irregular. Therefore, the processed substrate S after the laser irradiation does not have a stripe-like processing pattern. In addition, since the position switching is performed using the AOD element 2, it is possible to switch at a high speed.
本發明之雷射照射方法及裝置可以利用在例如半導體層之製作或活性化處理。The laser irradiation method and apparatus of the present invention can be utilized, for example, in the fabrication or activation of a semiconductor layer.
1...雷射振盪器1. . . Laser oscillator
2...AOD元件2. . . AOD component
3...均化器光學系統3. . . Homogenizer optical system
4...p-lens4. . . P-lens
5...移動台5. . . Mobile station
6...帶狀照射區域6. . . Ribbon irradiation area
7...雷射振盪觸發脈波產生器7. . . Laser oscillation trigger pulse generator
8...切換時序控制電路8. . . Switching timing control circuit
10...切換電路10. . . Switching circuit
91~95...AOD元件驅動脈波產生器91~95. . . AOD component driven pulse generator
100、200...雷射照射裝置100, 200. . . Laser irradiation device
A、B1~B5...雷射光(位置)A, B1~B5. . . Laser light (location)
b1...第1偏向脈波B1. . . First bias pulse
b2...第2偏向脈波B2. . . Second bias pulse
b3~b5...偏向脈波B3~b5. . . Biased pulse
S...被處理基板(半導體基板)S. . . Substrate to be processed (semiconductor substrate)
T...觸發脈波T. . . Trigger pulse
t...切換脈波t. . . Switching pulse
圖1是實施例1之雷射照射裝置之構造說明圖。Fig. 1 is a structural explanatory view of a laser irradiation apparatus of a first embodiment.
圖2是用來表示實施例1之雷射照射裝置動作之時序圖。Fig. 2 is a timing chart showing the operation of the laser irradiation apparatus of the first embodiment.
圖3是實施例2之雷射照射裝置之構造說明圖。Fig. 3 is a structural explanatory view of a laser irradiation apparatus of a second embodiment;
圖4是用來表示實施例2之雷射照射裝置動作之時序圖。Fig. 4 is a timing chart showing the operation of the laser irradiation apparatus of the second embodiment.
1...雷射振盪器1. . . Laser oscillator
2...AOD元件2. . . AOD component
3...均化器光學系統3. . . Homogenizer optical system
4...p-lens4. . . P-lens
5...移動台5. . . Mobile station
6...帶狀照射區域6. . . Ribbon irradiation area
7...雷射振盪觸發脈波產生器7. . . Laser oscillation trigger pulse generator
8...切換時序控制電路8. . . Switching timing control circuit
91、92...AOD元件驅動脈波產生器91, 92. . . AOD component driven pulse generator
100...雷射照射裝置100. . . Laser irradiation device
A、B1、B2...雷射光(位置)A, B1, B2. . . Laser light (location)
b1...第1偏向脈波B1. . . First bias pulse
b2...第2偏向脈波B2. . . Second bias pulse
S...被處理基板S. . . Substrate to be processed
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US5858807A (en) * | 1996-01-17 | 1999-01-12 | Kabushiki Kaisha Toshiba | Method of manufacturing liquid crystal display device |
US20050282367A1 (en) * | 2004-06-18 | 2005-12-22 | Bruland Kelly J | Semiconductor structure processing using multiple laser beam spots spaced on-axis on non-adjacent structures |
US20060131587A1 (en) * | 2003-05-21 | 2006-06-22 | Hitachi, Ltd. | Method of manufacturing an active matrix substrate and an image display device using the same |
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US5858807A (en) * | 1996-01-17 | 1999-01-12 | Kabushiki Kaisha Toshiba | Method of manufacturing liquid crystal display device |
US20060131587A1 (en) * | 2003-05-21 | 2006-06-22 | Hitachi, Ltd. | Method of manufacturing an active matrix substrate and an image display device using the same |
US20050282367A1 (en) * | 2004-06-18 | 2005-12-22 | Bruland Kelly J | Semiconductor structure processing using multiple laser beam spots spaced on-axis on non-adjacent structures |
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