TWI398622B - The Device and Method of Detecting Angle Error by Laser Interferometer - Google Patents
The Device and Method of Detecting Angle Error by Laser Interferometer Download PDFInfo
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本發明係關於一種雷射干涉儀檢測角度誤差之裝置與方法,特別是指一種雷射干涉儀經由該接收器接收反射的反射光束,並分別獲得兩組位移量,兩組位移量再利用三角函數就能由角隅稜鏡的距離,並獲得誤差信號的裝置與方法。The invention relates to a device and a method for detecting an angular error of a laser interferometer, in particular to a laser interferometer receiving a reflected reflected beam through the receiver, and respectively obtaining two sets of displacement amounts, and the two sets of displacements are reused by the triangle. The function and method of obtaining the error signal by the distance of the corners.
台灣經濟發展貢獻之一仰賴於產品的高品質與高穩定度,要維持這樣的高水準,長久以來大家都偏重在使用最新最優良的設備,或是訂定更嚴密的控管制度,卻忽略要維持高水準必須要先具有精確的測量。工業角度量測儀器一直被定位在「機台或操作前的初步設定」,但隨著操作技術的進步與各式各樣機台的推出,其產品也就越來越多樣化,其儀器精度也越來越高,用途也越來越廣泛,相對其產業價值的重要性也日漸重要。One of the contributions of Taiwan's economic development relies on the high quality and high stability of its products. To maintain such a high standard, everyone has long been concentrating on using the latest and best equipment, or setting a stricter control system, but ignoring it. To maintain a high level, you must first have accurate measurements. Industrial angle measuring instruments have been positioned in the "preliminary setting before the machine or operation", but with the advancement of operating technology and the introduction of various types of machines, the products are more and more diversified, and the accuracy of the instruments is also It is getting higher and higher, and its use is becoming more and more extensive, and its importance relative to its industrial value is also becoming more and more important.
目前在產業界中,要加工或量測產品的時候,都需要將產品放置在平台上,但是平台運動時,即會產生角度誤差,但在產品精度要求不大時,可以無視平台之角度誤差,但現在的產品愈來愈微小,對產品尺寸的精準度也愈來愈高時,平台的誤差就不可忽略了;尤其現今精密加工及精密量測之技術漸漸崛起,精度的要求是奈米等級,是故現在也必須將平台的誤差納入考慮,方能有效地提升產品之整個品質與良率。At present, in the industry, when processing or measuring products, the products need to be placed on the platform, but when the platform moves, the angle error will be generated, but when the product accuracy is not large, the angle error of the platform can be ignored. However, the current products are getting smaller and smaller, and the accuracy of the product size is getting higher and higher. The error of the platform can not be ignored. Especially the technology of precision machining and precision measurement is gradually emerging, and the precision requirement is nanometer. Level, it is now necessary to take into account the error of the platform, in order to effectively improve the overall quality and yield of the product.
目前量測角度誤差之精密儀器包括HP雷射干涉儀、Renishaw雷射干涉儀、SIOS雷射干涉儀與自動視準儀。Precision instruments for measuring angular errors include HP Laser Interferometer, Renishaw Laser Interferometer, SIOS Laser Interferometer and Automatic Sight.
HP雷射干涉儀與Renishaw雷射干涉儀較為普遍,主要是利用角度反射鏡與角度分光鏡進行量測;量測的原理是將雷射射入角度分光鏡,角度分光鏡會將光分成兩道光,再分別射入由兩個角隅稜鏡所組成的角度反射鏡,當雷射光射入角度反射鏡後,會產生與入射光平行的反射光,並射入角度分光鏡,合為一道干涉光束,再經由感測器接收,當有角度誤差時,即可測得兩角隅稜鏡的差值,再利用三角函數計算,就能得到角度。其缺點為價格昂貴。HP laser interferometer and Renishaw laser interferometer are more common, mainly using angle mirror and angle beam splitter for measurement; the principle of measurement is to shoot the laser into the angle beam splitter, the angle beam splitter will split the light into two The road light is then injected into the angle mirror consisting of two corners. When the laser light enters the angle mirror, it will generate reflected light parallel to the incident light and enter the angle beam splitter. The interference beam is received by the sensor. When there is an angular error, the difference between the two corners can be measured, and then the trigonometric function is used to calculate the angle. The disadvantage is that it is expensive.
SIOS雷射干涉儀角度量測原理是將SIOS雷射干涉儀垂直射入平面鏡,並依原光路射入SIOS雷射干涉儀之感測器中,當有角度誤差時經過計算求出;其缺點為只適合短行程量測,如果量測的距離太長會因為角度的問題無法測得。The SIOS laser interferometer angle measurement principle is that the SIOS laser interferometer is vertically injected into the plane mirror, and is injected into the sensor of the SIOS laser interferometer according to the original optical path, and is calculated and calculated when there is an angular error; For short-stroke measurements only, if the measured distance is too long, it will not be measured due to the angle problem.
自動視準儀量測之量測原理是由自動視準儀打出平行光直接垂直射入反射鏡,並依原光路射回自動視準儀,即可測得角度值。自動視準儀對轉動角度雖具有高解析度,但不適宜在機具上進行線上量測。The principle of measuring the automatic collimator is that the parallel collimator directly shoots the mirror directly into the mirror, and shoots the auto collimator according to the original optical path to measure the angle value. Although the automatic collimator has a high resolution for the angle of rotation, it is not suitable for on-line measurement on the implement.
本案發明人鑑於上述量測角度誤差儀器所衍生的各項缺點,乃亟思加以改良創新,並經多年苦心孤詣潛心研究後,終於成功研發完成本件雷射干涉儀檢測角度誤差之裝置與方法。In view of the shortcomings derived from the above-mentioned measuring angle error instrument, the inventor of the present invention has improved and innovated, and after years of painstaking research, he finally succeeded in researching and developing the device and method for detecting the angular error of the laser interferometer.
本發明之目的即在於提供一種光學非接觸式檢測模式,以達成高精確度要求之雷射干涉儀檢測角度誤差之裝置。SUMMARY OF THE INVENTION It is an object of the present invention to provide an optical non-contact detection mode for achieving a high accuracy requirement for a laser interferometer to detect angular errors.
本發明之次一目的係在於提供一種光學式儀器具有高解析度,而且並不會受到磁場的干擾造成量測的誤差的檢測角度誤差之裝置。A second object of the present invention is to provide an apparatus for detecting an angular error of an optical instrument with high resolution without being disturbed by a magnetic field.
本發明之另一目的係在於提供一種可以利用於各種工作場合上,並具有低成本、高精確度、體積小、攜帶方便、架設簡易及檢測迅速等特性的檢測角度誤差之裝置。Another object of the present invention is to provide a device that can be utilized in various workplaces and has a low-cost, high-accuracy, small-volume, easy-to-carry, easy to set up, and fast detection characteristics.
可達成上述發明目的之雷射干涉儀檢測角度誤差之裝置與方法,包括有:雷射干涉儀,用以接收與輸出一第一光束及一第二光束,其訊號接收器可為內置型與外加型;角隅稜鏡,係配置於移動平台的移動端上,用以接收並傳遞該光束至反射鏡,並接收自反射鏡返還的反射光束,再經由該角隅稜鏡反射轉至該雷射干涉儀;反射鏡,係用於反射雷射干涉儀之光束。The apparatus and method for detecting an angular error of a laser interferometer capable of achieving the above object includes: a laser interferometer for receiving and outputting a first beam and a second beam, wherein the signal receiver can be a built-in type and An additional type; a corner 隅稜鏡 is disposed on the moving end of the mobile platform for receiving and transmitting the light beam to the mirror, and receiving the reflected light beam returned from the mirror, and then transmitting to the Laser interferometer; a mirror used to reflect the beam of a laser interferometer.
請參閱圖一,本發明所提供之雷射干涉儀檢測角度誤差之裝置與方法,主要包括有:一雷射干涉儀1、至少二角隅稜鏡21,22以及至少二反射鏡31,32所構成;該雷射干涉儀1用以接收與輸出一第一光束11及一第二光束12;本發明利用雷射干涉儀1其內部自有相同特性的兩個或多個光源的光波來達成量測功能;在本實施例中利用雷射干涉儀1內部的雙光束讀取頭來接收與輸出一第一光束11及一第二光束12;該角隅稜鏡21,22係配置於第一光束11以及第二光束12的傳遞路徑上並位於移動平台4的移動端41上,用以接收並傳遞該光束至反射鏡31,32,以及接收自反射鏡31,32返還的反射光束A再經由該角隅稜鏡21,22反射轉變成反射光束B至該雷射干涉儀1;角隅稜鏡21,22的特色為,入射至角隅稜鏡21,22的光束與從角隅稜鏡21,22反射出的光束平行,有角度問題的時候亦同,所以可克服因角度變化的問題。Referring to FIG. 1 , the apparatus and method for detecting an angular error of a laser interferometer provided by the present invention mainly include: a laser interferometer, at least two corners 21, 22, and at least two mirrors 31, 32. The laser interferometer 1 is configured to receive and output a first light beam 11 and a second light beam 12; the present invention utilizes light waves of two or more light sources having the same characteristics inside the laser interferometer 1 A measurement function is achieved; in the embodiment, a dual beam readhead inside the laser interferometer 1 is used to receive and output a first beam 11 and a second beam 12; the corners 21, 22 are arranged in The first beam 11 and the second beam 12 are on the transmission path of the moving platform 41 for receiving and transmitting the beam to the mirrors 31, 32, and the reflected beam received from the mirrors 31, 32. A is further reflected by the corners 21, 22 into a reflected beam B to the laser interferometer 1; the corners 21, 22 are characterized by a beam incident from the corners 21, 22 and a slave angle The beams reflected by 隅稜鏡21,22 are parallel, and the same is true when there are angle problems, so the angle can be overcome. The problem of degree change.
該反射鏡31,32設置於該雷射干涉儀1與該角隅稜鏡21,22之間,該反射鏡31,32係用以使該反射光束A垂直反射回角隅稜鏡21,22,使該角隅稜鏡21,22反射各產生一光束至該反射鏡31,32,再經由該反射鏡31,32將各反射光束A反射至該角隅稜鏡21,22,該角隅稜鏡21,22係當移動端41產生誤差時,用以將該反射光束B返回該雷射干涉儀1,使雷射干涉儀1測得該誤差信號。The mirrors 31, 32 are disposed between the laser interferometer 1 and the corners 21, 22, and the mirrors 31, 32 are configured to reflect the reflected beam A vertically back to the corners 21, 22 The corners 21, 22 are each reflected to generate a light beam to the mirrors 31, 32, and the reflected beams A are reflected to the corners 21, 22 via the mirrors 31, 32.稜鏡21,22 is used to return the reflected beam B to the laser interferometer 1 when the mobile terminal 41 generates an error, so that the laser interferometer 1 measures the error signal.
其中該移動端41移動一微小距離時,使得該角隅稜鏡 21,22與該反射鏡31,32之間的反射光束A會產生變化,並同步使得該二角隅稜鏡21,22各產生一反射光束B,該反射光束B經由雷射干涉儀1的接收器接收後,並分別獲得兩組位移量,將兩組位移量相減,就能得到相對之位移量,再由角隅稜鏡21,22的距離與三角函數計算,即可獲得角度誤差信號。Where the mobile terminal 41 moves a small distance, the corner 隅稜鏡 The reflected beam A between the 21, 22 and the mirrors 31, 32 changes, and is synchronized such that the dimples 21, 22 each produce a reflected beam B, which is transmitted via the laser interferometer 1 After the receiver receives, and obtains two sets of displacements respectively, the two sets of displacements are subtracted, and the relative displacement can be obtained. Then, the angles of the angles 21 and 22 are calculated by the trigonometric function, and the angular error can be obtained. signal.
量測偏搖度誤差架構如圖一與圖二所示,雷射干涉儀1之讀取頭將雙光源分別射入二角隅稜鏡21,22中,由二角隅稜鏡21,22反射出二道光束射入反射鏡31,32,由於入射光會與反射鏡31,32的鏡面垂直,所以會反射反射光束B回雷射干涉儀1之接收器,因此雷射干涉儀1之讀取頭可分別獲得兩組位移量,將位移量相減,就能得到相對之位移量,再由角隅稜鏡21,22的距離與三角函數計算,即可獲得偏搖度誤差(Yaw error)。The measurement of the skewness error architecture is shown in Fig. 1 and Fig. 2. The read head of the laser interferometer 1 injects the dual light sources into the two corners 21, 22, respectively, by the two corners 21, 22 The reflected two beams are incident on the mirrors 31, 32. Since the incident light is perpendicular to the mirror surface of the mirrors 31, 32, the reflected beam B is reflected back to the receiver of the laser interferometer 1, so that the laser interferometer 1 The reading head can obtain two sets of displacements respectively, and the displacement amount can be subtracted to obtain the relative displacement amount, and then the distance between the angles , 21, 22 and the trigonometric function can be calculated to obtain the yaw degree error (Yaw Error).
量測俯仰度誤差架構如圖三與圖四所示,雷射干涉儀1之讀取頭將雙光源分別射入二角隅稜鏡21,22中,由二角隅稜鏡21,22反射出二道光束射入反射鏡31,32,由於入射光會與反射鏡31,32的鏡面垂直,所以會反射反射光束B回雷射之接收器,因此雷射干涉儀1之讀取頭可分別獲得兩組位移量,將位移量相減,就能得到相對之位移量,再由角隅稜鏡21,22的距離與三角函數計算,即可獲得俯仰度誤差(Pitch error)。The measurement of the pitch error structure is shown in Figure 3 and Figure 4. The read head of the laser interferometer 1 injects the dual light sources into the two corners 21, 22, which are reflected by the two corners 21, 22. Two beams of light are incident on the mirrors 31, 32. Since the incident light is perpendicular to the mirror surface of the mirrors 31, 32, the reflected beam B is reflected back to the receiver of the laser, so that the read head of the laser interferometer 1 can The two sets of displacements are obtained separately, and the displacement is subtracted to obtain the relative displacement. Then, the distance between the angles 21 and 22 and the trigonometric function are calculated to obtain the pitch error.
如圖五與圖六所示,實線為原始的角度,虛線為轉動一個角度後的光束,可得知當有角度變化的的時候,入射至角隅稜鏡21,22的第一光束11以及一第二光束12與從角隅稜鏡21,22反射出的光束為平行的;當角隅稜鏡21,22轉動θ時,光會轉動2 θ。As shown in Fig. 5 and Fig. 6, the solid line is the original angle, and the broken line is the beam after rotating an angle. It can be known that the first beam 11 incident on the corners 21, 22 when there is an angular change And a second beam 12 is parallel to the beams reflected from the corners 21, 22; when the corners 21, 22 are rotated by θ, the light is rotated by 2 θ.
計算角度量測原理是利用圖七與圖八所示,角隅稜鏡21,22的角度α與第一雷射讀取頭可以讀取到L1的光束長,第二雷射讀取頭可以讀取到L2的光束長,由式(1-1)可以求出x,就可以利用三角函數就能求出角度的位移量α:x=(L1-L2)/2 (1-1)The calculation of the angle measurement principle is as shown in Figure 7 and Figure 8. The angle α of the corners 21, 22 and the first laser read head can read the beam length of L1, and the second laser read head can When the beam length of L2 is read, x can be obtained by the equation (1-1), and the displacement amount of the angle can be obtained by a trigonometric function: x = (L1 - L2) / 2 (1-1)
α =tan-1 [x /d ] (1-2) α =tan -1 [ x / d ] (1-2)
d為兩個角隅稜鏡21,22中心點的距離。d is the distance between the center points of the two corners 21, 22.
本發明一種雷射干涉儀1檢測角度誤差之檢測方法,其中該雷射干涉儀1所射出之第一光束11及第二光束12透射穿過該反射鏡31,32到達該角隅稜鏡21,22,使該角隅稜鏡21,22反射各產生一光束至該反射鏡31,32,再經由該反射鏡31,32將各反射光束A反射至該角隅稜鏡21,22,返還的反射光束A經由該角隅稜鏡21,22反射轉變成二反射光束B至該雷射干涉儀1,並使雷射干涉儀1分別獲得兩組位移量,將兩組位移量相減,就能得到相對之位移量,再由角隅稜鏡21,22的距離與三角函數計算,即可獲得誤差信號。A method for detecting an angular error of a laser interferometer 1 according to the present invention, wherein a first beam 11 and a second beam 12 emitted by the laser interferometer 1 are transmitted through the mirror 31, 32 to the corner 21 22, causing the corners 21, 22 to reflect a respective beam to the mirrors 31, 32, and then reflecting the reflected beams A to the corners 21, 22 via the mirrors 31, 32, and returning The reflected beam A is reflected by the corners 21, 22 into two reflected beams B to the laser interferometer 1, and the laser interferometer 1 respectively obtains two sets of displacements, and the two sets of displacements are subtracted, The relative displacement can be obtained, and then the distance between the corners 21, 22 and the trigonometric function can be used to obtain the error signal.
上列詳細說明係針對本發明之一可行實施例之具體說 明,惟該實施例並非用以限制本發明之專利範圍,凡未脫離本發明技藝精神所為之等效實施或變更,均應包含於本案之專利範圍中。The above detailed description is specific to one of the possible embodiments of the present invention. It is to be understood that the scope of the invention is not limited to the scope of the invention, and the equivalents of the invention are intended to be included in the scope of the invention.
綜上所述,本案不但在空間型態上確屬創新,並能較習用物品增進上述多項功效,應已充分符合新穎性及進步性之法定發明專利要件,爰依法提出申請,懇請 貴局核准本件發明專利申請案,以勵發明,至感德便。In summary, this case is not only innovative in terms of space type, but also can enhance the above-mentioned multiple functions compared with the customary items. It should fully comply with the statutory invention patent requirements of novelty and progressiveness, and apply for it according to law. This invention patent application, in order to invent invention, to the sense of virtue.
1‧‧‧雷射干涉儀1‧‧‧Laser Interferometer
11‧‧‧第一光束11‧‧‧First beam
12‧‧‧第二光束12‧‧‧second beam
21,22‧‧‧角隅稜鏡21,22‧‧‧Corner
31,32‧‧‧反射鏡31,32‧‧‧Mirror
4‧‧‧移動平台4‧‧‧Mobile platform
41‧‧‧移動端41‧‧‧Mobile
A‧‧‧反射光束A‧‧·reflected beam
B‧‧‧反射光束B‧‧·reflected beam
圖一為本發明雷射干涉儀量測偏搖角度架構之立體示意圖;圖二為該雷射干涉儀量測偏搖角度架構之上視圖;圖三為該雷射干涉儀量測俯仰角度之立體示意圖;圖四為該雷射干涉儀量測俯仰角度之上視圖;圖五為該角隅稜鏡逆時針轉動,實線為原始的角度,虛線為轉動一個角度後的光路之示意圖;圖六為該角隅稜鏡順時針轉動,實線為原始的角度,虛線為轉動一個角度後的光路之示意圖;圖七為本發明光路之示意圖;圖八為該雷射干涉儀計算角度量測原理之示意圖。1 is a perspective view of the deflection angle architecture of the laser interferometer according to the present invention; FIG. 2 is a top view of the deflection interferometer of the laser interferometer; FIG. 3 is a top view of the laser interferometer measuring the pitch angle Figure 4 is a top view of the laser interferometer measuring the pitch angle; Figure 5 is the angle of the counterclockwise rotation, the solid line is the original angle, and the dotted line is the schematic diagram of the optical path after rotating an angle; Sixth, the corner is rotated clockwise, the solid line is the original angle, the broken line is the schematic diagram of the optical path after rotating an angle; FIG. 7 is a schematic diagram of the optical path of the present invention; FIG. 8 is the angle measurement of the laser interferometer Schematic diagram of the principle.
1...雷射干涉儀1. . . Laser interferometer
11...第一光束11. . . First beam
12...第二光束12. . . Second beam
21,22...角隅稜鏡21,22. . . Horn
31,32...反射鏡31,32. . . Reflector
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TW98118965A TWI398622B (en) | 2009-06-06 | 2009-06-06 | The Device and Method of Detecting Angle Error by Laser Interferometer |
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
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US6775013B2 (en) * | 2001-03-07 | 2004-08-10 | Optodyne, Inc. | Method and apparatus for measuring displacement or motion error |
TWI247095B (en) * | 2004-06-30 | 2006-01-11 | Nat Huwei Institue Of Technolo | Optical revolving spindle error measurement device |
TWI260394B (en) * | 2005-08-24 | 2006-08-21 | Univ Nat Formosa | Error-measuring apparatus for nano-scale rotary axle |
TWI292816B (en) * | 2006-07-14 | 2008-01-21 | Univ Nat Formosa |
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Publication number | Priority date | Publication date | Assignee | Title |
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US6775013B2 (en) * | 2001-03-07 | 2004-08-10 | Optodyne, Inc. | Method and apparatus for measuring displacement or motion error |
TWI247095B (en) * | 2004-06-30 | 2006-01-11 | Nat Huwei Institue Of Technolo | Optical revolving spindle error measurement device |
TWI260394B (en) * | 2005-08-24 | 2006-08-21 | Univ Nat Formosa | Error-measuring apparatus for nano-scale rotary axle |
TWI292816B (en) * | 2006-07-14 | 2008-01-21 | Univ Nat Formosa |
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