TWI387756B - Automatic testing system, instrument controlling apparatus, and operating method thereof - Google Patents

Automatic testing system, instrument controlling apparatus, and operating method thereof Download PDF

Info

Publication number
TWI387756B
TWI387756B TW98109580A TW98109580A TWI387756B TW I387756 B TWI387756 B TW I387756B TW 98109580 A TW98109580 A TW 98109580A TW 98109580 A TW98109580 A TW 98109580A TW I387756 B TWI387756 B TW I387756B
Authority
TW
Taiwan
Prior art keywords
control device
test system
instrument control
operating
user
Prior art date
Application number
TW98109580A
Other languages
Chinese (zh)
Other versions
TW201035562A (en
Inventor
Yen Sheng Liao
Hung Bin Chen
Original Assignee
Chroma Ate Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chroma Ate Inc filed Critical Chroma Ate Inc
Priority to TW98109580A priority Critical patent/TWI387756B/en
Publication of TW201035562A publication Critical patent/TW201035562A/en
Application granted granted Critical
Publication of TWI387756B publication Critical patent/TWI387756B/en

Links

Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Debugging And Monitoring (AREA)
  • User Interface Of Digital Computer (AREA)

Description

自動測試系統、儀控裝置及其運作方法Automatic test system, instrument control device and operation method thereof

本發明係與自動測試有關,並且特別地,關於一種能夠提供人性化操作介面以簡化測試命令集之編寫難度的自動測試系統、儀控裝置及其運作方法。The present invention relates to automated testing and, in particular, to an automated test system, instrumentation apparatus, and method of operation that can provide a user-friendly interface to simplify the programming of test command sets.

近年來,隨著科技不斷地發展,各種電子裝置在研發階段或已製造成產品要出廠之前,均需要進行相關的測試程序,以確保電子產品能夠符合安全規範及產品規格之要求。In recent years, with the continuous development of technology, various electronic devices need to carry out relevant testing procedures before the development stage or before the products are manufactured, to ensure that the electronic products can meet the requirements of safety regulations and product specifications.

一般而言,於目前市面上常見的自動測試系統中,其編寫測試命令集之人機介面的設計方式不外乎有下列兩種方式。第一種方式是:該自動測試系統的人機介面將所有的測試命令如同打字般逐行地書寫下來,如圖一所示。此種方式之最大缺點是:操作人員必須熟記每一道測試命令的名稱,並且需要遵守該自動測試系統自行定義的書寫格式,因此,此種方式不但執行的難度較高,需要相當專業且熟練的操作人員才能夠勝任,而且花費的時間也非常長。In general, in the automatic test systems that are currently available on the market, the human-machine interface for writing test command sets is designed in the following two ways. The first way is: the human machine interface of the automatic test system writes all test commands line by line like typing, as shown in Figure 1. The biggest disadvantage of this method is that the operator must memorize the name of each test command and must follow the written format defined by the automatic test system. Therefore, this method is not only difficult to perform, but also requires considerable professionalism and skill. The operator is competent and takes a long time.

至於另一種方式則是:該自動測試系統的人機介面先將所有的測試命令加以列表,甚至可以透過樹狀結構將所有的測試命令加以分類,如圖二所示,當使用者點選編輯視窗上方的樹狀結構中之測試命令「SetAllLOAD_InputState」時,編輯視窗下方的測試命令編輯列即會自動列出此一測試The other way is: the human-machine interface of the automatic test system first lists all the test commands, and even classifies all the test commands through the tree structure, as shown in Figure 2, when the user clicks on the editor. When the test command "SetAllLOAD_InputState" in the tree structure above the window, the test command edit column below the edit window will automatically list this test.

命令。藉由此種方式,當使用者在操作該自動測試系統的人機介面時,可以採用「點選」的方式來取代傳統的「逐行打字」之方式以完成測試命令集之編寫,的確可以降低操作人員實際執行時之難度,也可縮短部分的操作時間。command. In this way, when the user operates the human-machine interface of the automatic test system, the "click-through" method can be used to replace the traditional "progressive typing" method to complete the test command set. It reduces the difficulty of the actual operation of the operator, and can also shorten part of the operation time.

然而,隨著電子產品所具備的功能愈來愈繁複,其需要測試的功能項目愈來愈多,以交換式電源自動測試系統為例,光是某單一項功能測試項目所對應之控制命令長度往往高達數百行甚至上千行之多,至於整個交換式電源測試所需的控制命令集之內容更是龐大,即使透過「點選」的方式亦相當曠日廢時,嚴重影響各種電子設備研發測試以及產品上市之時程。However, as the functions of electronic products become more and more complicated, more and more functional items need to be tested. Taking the automatic test system of switching power supply as an example, it is the length of the control command corresponding to a single functional test item. It is often as many as hundreds or even thousands of lines. As for the content of the control command set required for the entire switched power test, it is even larger. Even if the method of "clicking" is quite wasteful, it will seriously affect various electronic devices. R&D testing and time-to-market.

因此,本發明之主要範疇在於提供一種能夠提供人性化操作介面之自動測試系統、儀控裝置及其運作方法,以解決上述問題。Therefore, the main scope of the present invention is to provide an automatic test system, an instrument control device and a method for operating the same that can provide a user-friendly operation interface to solve the above problems.

本發明之一範疇在於提供一種自動測試系統。根據一具體實施例,該自動測試系統包含複數個儀器及一儀控裝置。於此實施例中,該儀控裝置係用以控制該複數個儀器分別對一待測物進行測試。實際上,該複數個儀器可以是各種不同的測試儀器,但不以此為限。One aspect of the present invention is to provide an automated test system. According to a specific embodiment, the automatic test system includes a plurality of instruments and an instrument control device. In this embodiment, the instrument control device is configured to control the plurality of instruments to respectively test a test object. In fact, the plurality of instruments can be various test instruments, but not limited thereto.

於此實施例中,該儀控裝置將會顯示包含複數個操作單元之一操作畫面,其中,該複數個操作單元係分別對應於該複數個儀器之不同功能或操作狀態。於一特定時間間隔內,該儀控裝置將會記錄使用者於該操作畫面上所執行之至少一操作步驟並據以產生一記錄檔。實際上,該特定時間間隔係從一開始記錄時間至一結束記錄時間為止,並且該開始記錄時間及該結束記錄時間係由使用者所決定。In this embodiment, the instrument control device will display an operation screen including one of the plurality of operation units, wherein the plurality of operation units respectively correspond to different functions or operation states of the plurality of instruments. During a specific time interval, the instrument control device will record at least one operation step performed by the user on the operation screen and accordingly generate a log file. Actually, the specific time interval is from the beginning of the recording time to the end of the recording time, and the start recording time and the end recording time are determined by the user.

本發明之另一範疇在提供一種儀控裝置。根據一具體實施例,本發明之儀控裝置係應用於一自動測試系統中,並且該自動測試系統包含有複數個儀器,用以分別對一待測物進行測試。Another aspect of the invention provides an instrument control device. According to a specific embodiment, the instrument control device of the present invention is applied to an automatic test system, and the automatic test system includes a plurality of instruments for respectively testing a test object.

於此實施例中,該儀控裝置包含一顯示模組及一記錄模組。其中,該顯示模組係用以顯示包含複數個操作單元之一操作畫面。該複數個操作單元係分別對應於該複數個儀器之不同功能或操作狀態。該記錄模組係用以於一特定時間間隔內,記錄使用者於該操作畫面上所執行之至少一操作步驟並據以產生一記錄檔。In this embodiment, the instrument control device includes a display module and a recording module. The display module is configured to display an operation screen including one of the plurality of operation units. The plurality of operating units respectively correspond to different functions or operating states of the plurality of instruments. The recording module is configured to record at least one operation step performed by the user on the operation screen and generate a record file according to a specific time interval.

本發明之再一範疇係提供一種運作一自動測試系統之方法。該自動測試系統包含複數個儀器及一儀控裝置,其中,該儀控裝置係用以控制該複數個儀器分別對一待測物進行測試。根據一具體實施例,本發明之自動測試系統運作方法包含下列步驟:(a)該儀控裝置顯示包含複數個操作單元之一操作畫面,其中該複數個操作單元係分別對應於該複數個儀器之不同功能或操作狀態;以及(b)於一特定時間間隔內,該儀控裝置記錄使用者於該操作畫面上所執行之至少一操作步驟並據以產生一記錄檔。Yet another aspect of the present invention is to provide a method of operating an automated test system. The automatic test system comprises a plurality of instruments and an instrument control device, wherein the instrument control device is configured to control the plurality of instruments to respectively test a test object. According to a specific embodiment, the automatic test system operation method of the present invention comprises the following steps: (a) the instrument control device displays an operation screen including one of a plurality of operation units, wherein the plurality of operation units respectively correspond to the plurality of instruments And (b) during a specific time interval, the instrument control device records at least one operational step performed by the user on the operation screen and accordingly generates a log file.

相較於先前技術,根據本發明之自動測試系統、儀控裝置及其運作方法能夠提供一種較為人性化的操作介面,透過此一操作介面,使用者不需熟記所有測試命令的名稱及參數內容,只需實際操作各種測試的流程步驟,儀控裝置即會同時將使用者於操作期間內操作所有測試儀器之功能或按鈕的操作歷程加以記錄下來,並自動轉化成自動測試系統執行所需之測試命令集,故可大幅減少原先操作人員編寫測試命令集所耗費的大量時間與精神,亦有效縮短各種電子設備研發測試以及產品上市之時程。Compared with the prior art, the automatic test system, the instrument control device and the operation method thereof according to the present invention can provide a more user-friendly operation interface. Through this operation interface, the user does not need to memorize the names and parameters of all test commands. Content, only need to actually operate the various process steps of the test, the instrument control device will simultaneously record the operation history of all the test instrument functions or buttons during the operation period, and automatically convert it into the automatic test system. The test command set can greatly reduce the time and spirit spent by the original operator in writing the test command set, and effectively shorten the time and duration of various electronic equipment R&D tests and product launches.

關於本發明之優點與精神可以藉由以下的發明詳述及所附圖式得到進一步的瞭解。The advantages and spirit of the present invention will be further understood from the following detailed description of the invention.

根據本發明之第一具體實施例為一種自動測試系統。請參照圖三,圖三係繪示該自動測試系統之功能方塊圖。如圖三所示,自動測試系統1包含儀控裝置10、第一儀器11、第二儀器12及第三儀器13。其中,第一儀器11、第二儀器12及第三儀器13均耦接至儀控裝置10。於實際應用中,第一儀器11~第三儀器13可以為任何種類的測試儀器,譬如:負載模組(Load Module)、電源供應器(Power Source)等,但不以此為限。此外,自動測試系統1所包含之儀器的數量可視實際測試時之需求而定,並不以此例的三個為限。A first embodiment in accordance with the present invention is an automated test system. Please refer to FIG. 3, which is a functional block diagram of the automatic test system. As shown in FIG. 3, the automatic test system 1 includes an instrument control device 10, a first instrument 11, a second instrument 12, and a third instrument 13. The first instrument 11, the second instrument 12, and the third instrument 13 are all coupled to the instrument control device 10. In practical applications, the first instrument 11 to the third instrument 13 can be any type of test instrument, such as a load module, a power source, etc., but not limited thereto. In addition, the number of instruments included in the automatic test system 1 may be determined according to the actual test requirements, and is not limited to the three of the examples.

於此實施例中,自動測試系統1之儀控裝置10之主要功能在於控制第一儀器11、第二儀器12及第三儀器13分別對一待測物進行測試。如圖三所示,儀控裝置10包含有設定模組100、顯示模組102、記錄模組104及編輯模組106。其中,顯示模組102耦接至設定模組100及記錄模組104;記錄模組104耦接至設定模組100及編輯模組106。接下來,將分別就儀控裝置10所包含之各模組及其具備之功能進行詳細之介紹。In this embodiment, the main function of the instrument control device 10 of the automatic test system 1 is to control the first instrument 11, the second instrument 12, and the third instrument 13 to test a test object, respectively. As shown in FIG. 3 , the instrument control device 10 includes a setting module 100 , a display module 102 , a recording module 104 , and an editing module 106 . The display module 102 is coupled to the setting module 100 and the recording module 104. The recording module 104 is coupled to the setting module 100 and the editing module 106. Next, each module included in the instrument control device 10 and its functions will be described in detail.

首先,在實際對一待測物進行測試之前,使用者需先透過設定模組100自行設定於顯示模組102所顯示之操作畫面中的複數個操作單元之種類、數目及排列情形,以及該複數個操作單元與第一儀器11至第三儀器13之不同功能或操作狀態之間的對應關係。實際上,該操作畫面可透過電腦圖形化儀控軟體實現之,但不以此為限;該複數個操作單元可以旋鈕、按鈕、調整捲軸及/或輸入框之型式顯示於操作畫面,但不以此為限。First, before actually testing a test object, the user needs to manually set the type, number, and arrangement of the plurality of operation units in the operation screen displayed by the display module 102 through the setting module 100, and A correspondence between a plurality of operating units and different functions or operational states of the first to third instruments 11 to 13. In fact, the operation screen can be realized by the computer graphics controller software, but not limited thereto; the plurality of operation units can be displayed on the operation screen by the knob, the button, the adjustment scroll and/or the input box, but not This is limited to this.

請參照圖四,圖四係繪示於操作畫面中所顯示的操作單元之一範例。如圖四所示,操作畫面2包含負載操作單元(CC、CV及CP)21~23、負載(loading)數值調整旋鈕24、關閉按鈕25、示波器畫面26、取得波形按鈕27、電壓(voltage)數值調整旋鈕28、頻率(frequency)數值調整旋鈕29、取得電壓值(V)顯示框30以及取得電流值(I)顯示框31等操作單元。Please refer to FIG. 4, which is an example of an operation unit displayed on the operation screen. As shown in FIG. 4, the operation screen 2 includes load operation units (CC, CV, and CP) 21 to 23, a load value adjustment knob 24, a close button 25, an oscilloscope screen 26, a waveform button 27, and a voltage. An operation unit such as a numerical adjustment knob 28, a frequency value adjustment knob 29, a voltage value (V) display frame 30, and a current value (I) display frame 31 are obtained.

值得注意的是,上述顯示於操作畫面2的這些操作單元21~31的種類、數目及排列情形均可由使用者依實際需要事先透過設定模組100自行設定。當使用者透過設定模組100於操作畫面2新增一操作單元時,亦須選定該操作單元所對應的測試儀器及測試命令,並且這些資訊將會被儲存於一對照表中。之後每次使用者啟動儀控裝置10時,儀控裝置10即會根據儲存於對照表中之資料內容依序建立顯示於操作畫面2之各個操作單元,而每個操作單元亦均對應於一道儀器控制命令。It should be noted that the types, the number, and the arrangement of the operation units 21 to 31 displayed on the operation screen 2 can be set by the user through the setting module 100 in advance according to actual needs. When the user adds an operation unit to the operation screen 2 through the setting module 100, the test instrument and the test command corresponding to the operation unit must also be selected, and the information will be stored in a comparison table. Then, each time the user activates the instrument control device 10, the instrument control device 10 sequentially creates the operation units displayed on the operation screen 2 according to the contents of the data stored in the comparison table, and each operation unit also corresponds to one operation unit. Instrument control commands.

舉例而言,假設對照表中記錄有:負載操作單元(CC)21之種類為「按鈕」,其位置為(10,60),所對應的控制命令為「SetLoad_Mode,0」。當使用者啟動儀控裝置10時,儀控裝置10即會根據對照表的內容在操作畫面2的X=10,Y=60之位置上設置一CC按鈕,當此CC按鈕被使用者點選時,儀控裝置10即會對相對應的負載儀器送出「SetLoad_Mode」的控制命令,且參數值為0。For example, it is assumed in the comparison table that the type of the load operation unit (CC) 21 is "button", the position is (10, 60), and the corresponding control command is "SetLoad_Mode, 0". When the user activates the instrument control device 10, the instrument control device 10 sets a CC button at the position of X=10 and Y=60 of the operation screen 2 according to the content of the comparison table, when the CC button is clicked by the user. When the instrument control device 10 sends a control command of "SetLoad_Mode" to the corresponding load device, the parameter value is 0.

接著,當使用者已透過設定模組100完成所有設定工作後,即可開始透過操作畫面2所顯示各個操作單元執行至少一操作步驟。於此實施例中,儀控裝置10的記錄模組104即用以於一特定時間間隔內,記錄使用者於該操作畫面上所執行之至少一操作步驟並據以產生一記錄檔。實際上,該特定時間間隔係從一開始記錄時間至一結束記錄時間為止,並且該開始記錄時間及該結束記錄時間可以由使用者所決定。此外,該至少一操作步驟可包含輸入數值或指令、以滑鼠點選/控制操作單元及/或以觸控方式點選/控制操作單元等動作,但並不以此為限。Then, after the user has completed all the setting operations through the setting module 100, at least one operation step can be started through each operation unit displayed on the operation screen 2. In this embodiment, the recording module 104 of the instrument control device 10 is configured to record at least one operation step performed by the user on the operation screen during a specific time interval and accordingly generate a log file. In fact, the specific time interval is from the beginning of the recording time to the end of the recording time, and the starting recording time and the ending recording time can be determined by the user. In addition, the at least one operation step may include inputting a numerical value or an instruction, selecting/controlling the operation unit by a mouse, and/or clicking/controlling the operation unit by a touch control, but is not limited thereto.

也就是說,當使用者擬定好測試計畫後,即可啟動錄製的功能,在開始錄製至停止錄製的這段期間內,使用者透過滑鼠或觸控方式點選操作單元之順序、間隔及數值,以及透過鍵盤輸入的數值,還有傳送給測試儀器的測試命令名稱,均會被儀控裝置10的記錄模組104記錄下來。接下來,將以圖四所示之操作畫面2為例進行說明。That is to say, when the user draws up the test plan, the recording function can be started. During the period from the start of recording to the stop of recording, the user selects the order and interval of the operation unit through the mouse or touch mode. The value, as well as the value entered through the keyboard, and the name of the test command transmitted to the test instrument, are recorded by the recording module 104 of the instrument control device 10. Next, the operation screen 2 shown in FIG. 4 will be described as an example.

假設使用者啟動錄製功能後,間隔了500ms的時間後才透過滑鼠左鍵將電壓數值調整旋鈕28旋轉至110後放開,又間隔了400ms的時間後,使用者再用滑鼠左鍵將頻率數值調整旋鈕29旋轉至60後放開,再間隔了600ms的時間後,使用者透過滑鼠左鍵將負載數值調整旋鈕24旋轉至1後放開。此時,記錄模組104即會根據使用者於此段時間內的操作歷程產生記錄檔,圖五即繪示記錄模組104根據上述操作歷程所產生之記錄檔的一範例。Assume that after the user starts the recording function, after the interval of 500ms, the voltage value adjustment knob 28 is rotated to 110 by the left mouse button, and then released, and after the interval of 400ms, the user will use the left mouse button again. After the frequency value adjustment knob 29 is rotated to 60 and then released, after the interval of 600 ms, the user rotates the load value adjustment knob 24 to 1 by the left mouse button and then releases. At this time, the recording module 104 generates a recording file according to the operation history of the user during the period of time. FIG. 5 shows an example of the recording file generated by the recording module 104 according to the above operation history.

由於該記錄檔已記錄有使用者於該特定時間間隔內操作複數個操作單元之一操作歷程,並且該操作歷程包含有操作順序、測試命令、數值以及每一操作步驟間的時間間隔,因此,使用者即可透過編輯模組106適當地編輯該記錄檔以產生一自動測試系統控制命令集。Since the log file has recorded an operation history of the user operating a plurality of operation units during the specific time interval, and the operation history includes an operation sequence, a test command, a value, and a time interval between each operation step, The user can appropriately edit the log file through the editing module 106 to generate an automatic test system control command set.

綜上所述,此實施例所揭露之自動測試系統可提供一種較為人性化的操作介面,使得使用者不需熟記所有測試命令的名稱及參數內容,儀控裝置即會在使用者實際操作各種測試的流程步驟的同時將使用者所有的操作歷程加以記錄下來,並自動轉化成自動測試系統執行所需之測試命令集。In summary, the automatic test system disclosed in this embodiment can provide a more user-friendly operation interface, so that the user does not need to memorize the names and parameter contents of all test commands, and the instrument control device is actually operated by the user. The process steps of various tests simultaneously record all the user's operating history and automatically convert them into the test command set required for the automatic test system to execute.

根據本發明之第二具體實施例為一種應用於一自動測試系統之儀控裝置。於此實施例中,該自動測試系統包含複數個儀器,用以分別對一待測物進行測試。該儀控裝置包含設定模組、顯示模組、記錄模組及編輯模組。其中,顯示模組係耦接至設定模組及記錄模組;記錄模組係耦接至設定模組及編輯模組。A second embodiment in accordance with the present invention is an instrument control device for use in an automated test system. In this embodiment, the automatic test system includes a plurality of instruments for testing a test object separately. The instrument control device comprises a setting module, a display module, a recording module and an editing module. The display module is coupled to the setting module and the recording module; the recording module is coupled to the setting module and the editing module.

於此實施例中,設定模組係用以供使用者設定複數個操作單元於該操作畫面之種類、數目與排列情形,以及該複數個操作單元與該複數個儀器之不同功能或操作狀態之間的對應關係。顯示模組係用以顯示包含該複數個操作單元之操作畫面。於一特定時間間隔內,該記錄模組記錄使用者於該操作畫面上所執行之至少一操作步驟並據以產生一記錄檔。編輯模組則用以供使用者編輯該記錄檔以產生一自動測試系統控制命令集。至於該儀控裝置之詳細情形請參照第一具體實施例中之儀控裝置及其圖示,在此不另行贅述。In this embodiment, the setting module is configured to allow the user to set the type, number, and arrangement of the plurality of operating units on the operation screen, and different functions or operating states of the plurality of operating units and the plurality of instruments. Correspondence between the two. The display module is used to display an operation screen including the plurality of operation units. The recording module records at least one operation step performed by the user on the operation screen and generates a log file according to a specific time interval. The editing module is used by the user to edit the log file to generate an automatic test system control command set. For details of the instrument control device, refer to the instrument control device and its illustration in the first embodiment, which will not be further described herein.

根據本發明之第三具體實施例為一種運作一自動測試系統之方法。該自動測試系統包含複數個儀器及一儀控裝置,其中,該儀控裝置係用以控制該複數個儀器分別對一待測物進行測試。請參照圖六,圖六係繪示該自動測試系統運作方法的流程圖。如圖六所示,該自動測試系統運作方法首先執行步驟S10及S11,分別設定複數個操作單元顯示於操作畫面之種類、數目及排列情形,以及設定複數個操作單元與複數個儀器之不同功能或操作狀態之間的對應關係。實際上,步驟S10及S11之執行順序並無一定之限制。A third embodiment of the present invention is a method of operating an automated test system. The automatic test system comprises a plurality of instruments and an instrument control device, wherein the instrument control device is configured to control the plurality of instruments to respectively test a test object. Please refer to FIG. 6 , which is a flow chart showing the operation method of the automatic test system. As shown in FIG. 6, the automatic test system operation method firstly performs steps S10 and S11, respectively setting the types, numbers and arrangement of the plurality of operation units displayed on the operation screen, and setting different functions of the plurality of operation units and the plurality of instruments. Or the correspondence between operational states. Actually, the order of execution of steps S10 and S11 is not limited.

接著,該自動測試系統運作方法執行步驟S12,令該儀控裝置顯示包含該複數個操作單元之操作畫面。實際上,該操作畫面可透過電腦圖形化儀控軟體實現之,但不以此為限;該複數個操作單元可以一旋鈕、一按鈕、一調整軸或一輸入框之型式顯示於該操作畫面。之後,該自動測試系統運作方法執行步驟S13,令該儀控裝置於一特定時間間隔內,記錄使用者於該操作畫面上所執行之至少一操作步驟並據以產生一記錄檔。實際上,該特定時間間隔係從一開始記錄時間至一結束記錄時間為止,該開始記錄時間及該結束記錄時間係由使用者所決定。Then, the automatic test system operation method performs step S12, and causes the instrument control device to display an operation screen including the plurality of operation units. In fact, the operation screen can be realized by the computer graphics controller software, but not limited thereto; the plurality of operation units can be displayed on the operation screen by a knob, a button, an adjustment axis or an input box. . Then, the automatic test system operation method performs step S13, and causes the instrument control device to record at least one operation step performed by the user on the operation screen and generate a record file in a specific time interval. In fact, the specific time interval is from the beginning of the recording time to the end of the recording time, and the starting recording time and the ending recording time are determined by the user.

此外,該記錄檔可記錄有使用者於該特定時間間隔內操作該複數個操作單元之一操作歷程,該操作歷程包含操作順序、測試命令、數值以及每一操作步驟間的時間間隔。至於該至少一操作步驟則可包含輸入數值或指令、以滑鼠點選/控制操作單元及/或以觸控方式點選/控制操作單元。In addition, the log file may record an operation history of the user operating the plurality of operation units during the specific time interval, the operation history including an operation sequence, a test command, a numerical value, and a time interval between each operation step. The at least one operation step may include inputting a value or an instruction, clicking/controlling the operation unit with a mouse, and/or clicking/controlling the operation unit by touch.

由於該記錄檔已記錄有使用者於該特定時間間隔內操作複數個操作單元之一操作歷程,並且該操作歷程包含有操作順序、測試命令、數值以及每一操作步驟間的時間間隔,因此,該自動測試系統運作方法可再進一步執行步驟S14,編輯該記錄檔以產生一自動測試系統控制命令集。Since the log file has recorded an operation history of the user operating a plurality of operation units during the specific time interval, and the operation history includes an operation sequence, a test command, a value, and a time interval between each operation step, The automatic test system operation method can further perform step S14 to edit the log file to generate an automatic test system control command set.

相較於先前技術,根據本發明之自動測試系統、儀控裝置及其運作方法能夠提供一種較為人性化的操作介面,透過此一操作介面,使用者不需熟記所有測試命令的名稱及參數內容,只需實際操作各種測試的流程步驟,儀控裝置即會同時將使用者於操作期間內操作所有測試儀器之功能或按鈕的操作歷程加以記錄下來,並自動轉化成自動測試系統執行所需之測試命令集,故可大幅減少原先操作人員編寫測試命令集所耗費的大量時間與精神,亦有效縮短各種電子設備研發測試以及產品上市之時程。Compared with the prior art, the automatic test system, the instrument control device and the operation method thereof according to the present invention can provide a more user-friendly operation interface. Through this operation interface, the user does not need to memorize the names and parameters of all test commands. Content, only need to actually operate the various process steps of the test, the instrument control device will simultaneously record the operation history of all the test instrument functions or buttons during the operation period, and automatically convert it into the automatic test system. The test command set can greatly reduce the time and spirit spent by the original operator in writing the test command set, and effectively shorten the time and duration of various electronic equipment R&D tests and product launches.

藉由以上較佳具體實施例之詳述,係希望能更加清楚描述本發明之特徵與精神,而並非以上述所揭露的較佳具體實施例來對本發明之範疇加以限制。相反地,其目的是希望能涵蓋各種改變及具相等性的安排於本發明所欲申請之專利範圍的範疇內。The features and spirit of the present invention will be more apparent from the detailed description of the preferred embodiments. On the contrary, the intention is to cover various modifications and equivalents within the scope of the invention as claimed.

S10~S14...流程步驟S10~S14. . . Process step

1...自動測試系統1. . . Automatic test system

10...儀控裝置10. . . Instrument control device

11...第一儀器11. . . First instrument

12...第二儀器12. . . Second instrument

13...第三儀器13. . . Third instrument

100...設定模組100. . . Setting module

102...顯示模組102. . . Display module

104...記錄模組104. . . Recording module

106...編輯模組106. . . Editing module

2...操作畫面2. . . Operation screen

21~23...負載操作單元21~23. . . Load operating unit

24...負載數值調整旋鈕twenty four. . . Load value adjustment knob

25...關閉按鈕25. . . Close button

26...示波器畫面26. . . Oscilloscope screen

27...取得波形按鈕27. . . Get waveform button

28...電壓數值調整旋鈕28. . . Voltage value adjustment knob

29...頻率數值調整旋鈕29. . . Frequency value adjustment knob

30...取得電壓值顯示框30. . . Get voltage value display box

31...取得電流值顯示框31. . . Get current value display box

圖一及圖二係分別繪示傳統上兩種不同的測試命令集編寫方式之示意圖。Figure 1 and Figure 2 are schematic diagrams showing the traditional writing methods of two different test command sets.

圖三係繪示根據本發明之第一具體實施例之自動測試系統的功能方塊圖。Figure 3 is a functional block diagram showing an automatic test system in accordance with a first embodiment of the present invention.

圖四係繪示於操作畫面中所顯示的操作單元之一範例。Figure 4 is an example of an operating unit displayed in the operation screen.

圖五係繪示記錄模組根據上述操作歷程所產生之記錄檔的一範例。FIG. 5 is a diagram showing an example of a recording file generated by the recording module according to the above operation history.

圖六係繪示根據本發明之第三具體實施例之自動測試系統運作方法的流程圖。Figure 6 is a flow chart showing the operation of the automatic test system according to the third embodiment of the present invention.

1...自動測試系統1. . . Automatic test system

10...儀控裝置10. . . Instrument control device

11...第一儀器11. . . First instrument

12...第二儀器12. . . Second instrument

13...第三儀器13. . . Third instrument

100...設定模組100. . . Setting module

102...顯示模組102. . . Display module

104...記錄模組104. . . Recording module

106...編輯模組106. . . Editing module

Claims (24)

一種自動測試系統,包含:複數個儀器;以及一儀控裝置,耦接至該複數個儀器,用以控制該複數個儀器分別對一待測物進行測試,該儀控裝置顯示包含複數個操作單元之一操作畫面,該複數個操作單元係分別對應於該複數個儀器之不同功能或操作狀態,於一特定時間間隔內,該儀控裝置記錄使用者於該操作畫面上所執行之至少一操作步驟並據以產生一記錄檔。An automatic test system comprising: a plurality of instruments; and an instrument control device coupled to the plurality of instruments for controlling the plurality of instruments to respectively test a test object, the instrument control device display comprising a plurality of operations One of the unit operating screens, the plurality of operating units respectively corresponding to different functions or operating states of the plurality of instruments, wherein the instrument control device records at least one performed by the user on the operation screen during a specific time interval Operation steps and accordingly generate a log file. 如申請專利範圍第1項所述之自動測試系統,其中該特定時間間隔係從一開始記錄時間至一結束記錄時間為止,該開始記錄時間及該結束記錄時間係由使用者所決定。The automatic test system of claim 1, wherein the specific time interval is from a start recording time to an end recording time, and the start recording time and the end recording time are determined by a user. 如申請專利範圍第1項所述之自動測試系統,其中該記錄檔係記錄有使用者於該特定時間間隔內操作該複數個操作單元之一操作歷程,該操作歷程包含操作順序、測試命令、數值以及每一操作步驟間的時間間隔。The automatic test system of claim 1, wherein the record file records an operation history of the user operating the plurality of operation units during the specific time interval, the operation history includes an operation sequence, a test command, The value and the time interval between each operation step. 如申請專利範圍第1項所述之自動測試系統,其中該記錄檔能夠被編輯而成為一自動測試系統控制命令集。The automatic test system of claim 1, wherein the log file can be edited to become an automatic test system control command set. 如申請專利範圍第1項所述之自動測試系統,其中該至少一操作步驟包含輸入數值或指令、以滑鼠點選/控制操作單元及/或以觸控方式點選/控制操作單元。The automatic test system of claim 1, wherein the at least one operation step comprises inputting a value or an instruction, clicking/controlling the operation unit with a mouse, and/or clicking/controlling the operation unit by touch. 如申請專利範圍第1項所述之自動測試系統,其中該複數個操作單元顯示於該操作畫面之種類、數目及排列情形係由使用者設定。The automatic test system of claim 1, wherein the type, number and arrangement of the plurality of operation units displayed on the operation screen are set by a user. 如申請專利範圍第1項所述之自動測試系統,其中該複數個操作單元係以一旋鈕、一按鈕、一調整捲軸及/或一輸入框之型式顯示於該操作畫面。The automatic test system of claim 1, wherein the plurality of operating units are displayed on the operation screen in a pattern of a knob, a button, an adjustment scroll, and/or an input box. 如申請專利範圍第1項所述之自動測試系統,其中該複數個操作單元與該複數個儀器之不同功能或操作狀態之間的對應關係係由使用者所設定。The automatic test system of claim 1, wherein the correspondence between the plurality of operating units and different functions or operating states of the plurality of instruments is set by a user. 一種儀控裝置,應用於一自動測試系統中,該自動測試系統包含複數個儀器,用以分別對一待測物進行測試,該儀控裝置包含:一顯示模組,用以顯示包含複數個操作單元之一操作畫面,其中該複數個操作單元係分別對應於該複數個儀器之不同功能或操作狀態;以及一記錄模組,耦接至該顯示模組,該記錄模組於一特定時間間隔內,記錄使用者於該操作畫面上所執行之至少一操作步驟並據以產生一記錄檔。An instrument control device is applied to an automatic test system, the automatic test system includes a plurality of instruments for respectively testing a test object, the instrument control device comprising: a display module for displaying a plurality of An operation unit, wherein the plurality of operation units respectively correspond to different functions or operation states of the plurality of instruments; and a recording module coupled to the display module, the recording module is at a specific time During the interval, at least one operation step performed by the user on the operation screen is recorded and a log file is generated accordingly. 如申請專利範圍第9項所述之儀控裝置,其中該特定時間間隔係從一開始記錄時間至一結束記錄時間為止,該開始記錄時間及該結束記錄時間係由使用者所決定。The instrument control device of claim 9, wherein the specific time interval is from a start recording time to an end recording time, and the start recording time and the end recording time are determined by a user. 如申請專利範圍第9項所述之儀控裝置,其中該記錄檔係記錄有使用者於該特定時間間隔內操作該複數個操作單元之一操作歷程,該操作歷程包含操作順序、測試命令、數值以及每一操作步驟間的時間間隔。The instrument control device of claim 9, wherein the record file records an operation history of the user operating the plurality of operation units during the specific time interval, the operation history includes an operation sequence, a test command, The value and the time interval between each operation step. 如申請專利範圍第9項所述之儀控裝置,進一步包含:一編輯模組,耦接至該記錄模組,用以編輯該記錄檔以產生一自動測試系統控制命令集。The instrument control device of claim 9, further comprising: an editing module coupled to the recording module for editing the log file to generate an automatic test system control command set. 如申請專利範圍第9項所述之儀控裝置,其中該至少一操作步驟包含輸入數值或指令、以滑鼠點選/控制操作單元及/或以觸控方式點選/控制操作單元。The instrument control device of claim 9, wherein the at least one operation step comprises inputting a numerical value or an instruction, selecting/controlling the operation unit with a mouse, and/or clicking/controlling the operation unit by touch. 如申請專利範圍第9項所述之儀控裝置,進一步包含:一設定模組,耦接至該顯示模組,用以供使用者設定該複數個操作單元於該操作畫面之種類、數目及排列情形。The instrument control device of claim 9 further comprising: a setting module coupled to the display module for the user to set the type and number of the plurality of operating units in the operation screen Arrange the situation. 如申請專利範圍第14項所述之儀控裝置,其中使用者亦能透過該設定模組設定該複數個操作單元與該複數個儀器之不同功能或操作狀態之間的對應關係。The instrument control device of claim 14, wherein the user can also set a correspondence between the plurality of operating units and different functions or operating states of the plurality of instruments through the setting module. 如申請專利範圍第9項所述之儀控裝置,其中該複數個操作單元係以一旋鈕、一按鈕、一調整捲軸及/或一輸入框之型式顯示於該操作畫面。The instrument control device according to claim 9, wherein the plurality of operation units are displayed on the operation screen in a form of a knob, a button, an adjustment reel and/or an input frame. 一種運作一自動測試系統之方法,該自動測試系統包含複數個儀器及一儀控裝置,該儀控裝置係用以控制該複數個儀器分別對一待測物進行測試,該方法包含下列步驟:該儀控裝置顯示包含複數個操作單元之一操作畫面,其中該複數個操作單元係分別對應於該複數個儀器之不同功能或操作狀態;以及於一特定時間間隔內,該儀控裝置記錄使用者於該操作畫面上所執行之至少一操作步驟並據以產生一記錄檔。A method for operating an automatic test system, the automatic test system comprising a plurality of instruments and an instrument control device, wherein the instrument control device is configured to control the plurality of instruments to respectively test a test object, the method comprising the following steps: The instrument control device displays an operation screen including one of a plurality of operation units, wherein the plurality of operation units respectively correspond to different functions or operation states of the plurality of instruments; and the instrument control device records and uses during a specific time interval At least one operational step performed on the operation screen and accordingly generates a log file. 如申請專利範圍第17項所述之方法,其中該特定時間間隔係從一開始記錄時間至一結束記錄時間為止,該開始記錄時間及該結束記錄時間係由使用者所決定。The method of claim 17, wherein the specific time interval is from a start recording time to an end recording time, and the start recording time and the end recording time are determined by a user. 如申請專利範圍第17項所述之方法,其中該記錄檔係記錄有使用者於該特定時間間隔內操作該複數個操作單元之一操作歷程,該操作歷程包含操作順序、測試命令、數值以及每一操作步驟間的時間間隔。The method of claim 17, wherein the record file records an operation history of the user operating the plurality of operation units during the specific time interval, the operation history including an operation sequence, a test command, a value, and The time interval between each operation step. 如申請專利範圍第17項所述之方法,進一步包含下列步驟:編輯該記錄檔以產生一自動測試系統控制命令集。The method of claim 17, further comprising the step of editing the log file to generate an automatic test system control command set. 如申請專利範圍第17項所述之方法,其中該至少一操作步驟包含輸入數值或指令、以滑鼠點選/控制操作單元及/或以觸控方式點選/控制操作單元。The method of claim 17, wherein the at least one operating step comprises inputting a value or an instruction, selecting/controlling the operating unit with a mouse, and/or clicking/controlling the operating unit by touch. 如申請專利範圍第17項所述之方法,進一步包含下列步驟:設定該複數個操作單元顯示於該操作畫面之種類、數目及排列情形。The method of claim 17, further comprising the step of: setting the type, number, and arrangement of the plurality of operating units displayed on the operation screen. 如申請專利範圍第17項所述之方法,進一步包含下列步驟:設定該複數個操作單元與該複數個儀器之不同功能或操作狀態之間的對應關係。The method of claim 17, further comprising the step of setting a correspondence between the plurality of operating units and different functions or operating states of the plurality of instruments. 如申請專利範圍第17項所述之方法,其中該複數個操作單元係以一旋鈕、一按鈕、一調整軸或一輸入框之型式顯示於該操作畫面。The method of claim 17, wherein the plurality of operating units are displayed on the operation screen in the form of a knob, a button, an adjustment axis or an input frame.
TW98109580A 2009-03-24 2009-03-24 Automatic testing system, instrument controlling apparatus, and operating method thereof TWI387756B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW98109580A TWI387756B (en) 2009-03-24 2009-03-24 Automatic testing system, instrument controlling apparatus, and operating method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW98109580A TWI387756B (en) 2009-03-24 2009-03-24 Automatic testing system, instrument controlling apparatus, and operating method thereof

Publications (2)

Publication Number Publication Date
TW201035562A TW201035562A (en) 2010-10-01
TWI387756B true TWI387756B (en) 2013-03-01

Family

ID=44855880

Family Applications (1)

Application Number Title Priority Date Filing Date
TW98109580A TWI387756B (en) 2009-03-24 2009-03-24 Automatic testing system, instrument controlling apparatus, and operating method thereof

Country Status (1)

Country Link
TW (1) TWI387756B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI459002B (en) * 2010-11-10 2014-11-01 Delta Electronics Inc Automatic test system and test process

Also Published As

Publication number Publication date
TW201035562A (en) 2010-10-01

Similar Documents

Publication Publication Date Title
US20100250220A1 (en) System and apparatus for managing test procedures within a hardware-in-the-loop simulation system
JP2007004734A (en) Information processing system, information processing method and computer program
US20060020429A1 (en) Method and apparatus for configuring interfaces for automated systems
US6725449B1 (en) Semiconductor test program debugging apparatus
US9547479B2 (en) Method for adapting GUI-based instrument components in a visual programming language
JP3835589B2 (en) Drawing device and computer-readable recording medium recording drawing program
US20200147712A1 (en) Systems and methods to design part weld processes
TWI387756B (en) Automatic testing system, instrument controlling apparatus, and operating method thereof
TWI705258B (en) A circuit troubleshooting system
CN101887087B (en) Automatic test system and operating method and instrument control device thereof
JP4941674B2 (en) Simulation system
JPH08328829A (en) Parameter change history managing system
CN103077010A (en) Development support apparatus and development support program
CN101727384B (en) Control method for automatically testing application software
JP3913414B2 (en) Editor device and recording medium recording editor program
US20030093728A1 (en) Test executive system with a tape recorder type control interface
JP2002062910A (en) Editor device and storage medium recording editor program
JP3517466B2 (en) Operability verification method and device
JP2001075791A (en) Editor device and recording medium recording editor program
JP3422646B2 (en) Analysis equipment
CN110580207A (en) Logic test application generation method based on QT framework
JP3795473B2 (en) Editor device and recording medium recording editor program
US20070115257A1 (en) Sequence status display during output for signal generator
JP3809151B2 (en) Sequence program editing device
JP6795568B2 (en) Tracer and programmable controller