TWI383126B - - Google Patents
Info
- Publication number
- TWI383126B TWI383126B TW98142436A TW98142436A TWI383126B TW I383126 B TWI383126 B TW I383126B TW 98142436 A TW98142436 A TW 98142436A TW 98142436 A TW98142436 A TW 98142436A TW I383126 B TWI383126 B TW I383126B
- Authority
- TW
- Taiwan
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW98142436A TW201120405A (en) | 2009-12-11 | 2009-12-11 | Height measurement device having probe and method for using the device to measure height. |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW98142436A TW201120405A (en) | 2009-12-11 | 2009-12-11 | Height measurement device having probe and method for using the device to measure height. |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201120405A TW201120405A (en) | 2011-06-16 |
| TWI383126B true TWI383126B (https=) | 2013-01-21 |
Family
ID=45045153
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW98142436A TW201120405A (en) | 2009-12-11 | 2009-12-11 | Height measurement device having probe and method for using the device to measure height. |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW201120405A (https=) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5135308A (en) * | 1990-03-09 | 1992-08-04 | Carl-Zeiss-Stiftung | Method and apparatus for non-contact measuring of object surfaces |
| EP1089607A2 (en) * | 1998-02-27 | 2001-04-04 | Matsushita Electric Industrial Co., Ltd. | Component recognizing method and apparatus |
| EP1160539B1 (en) * | 1995-07-26 | 2003-07-02 | Stephen James Crampton | Scanning apparatus and method |
| TWI237687B (en) * | 2004-04-13 | 2005-08-11 | Chien Hui Chuan | Computer control measuring center |
| US7115890B2 (en) * | 2003-11-18 | 2006-10-03 | Applied Materials, Inc. | Method and apparatus for inspecting a sample having a height measurement ahead of a focal area |
| WO2007015561A1 (en) * | 2005-08-02 | 2007-02-08 | Matsushita Electric Industrial Co., Ltd. | Electronic component mounter and mounting method |
-
2009
- 2009-12-11 TW TW98142436A patent/TW201120405A/zh not_active IP Right Cessation
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5135308A (en) * | 1990-03-09 | 1992-08-04 | Carl-Zeiss-Stiftung | Method and apparatus for non-contact measuring of object surfaces |
| EP1160539B1 (en) * | 1995-07-26 | 2003-07-02 | Stephen James Crampton | Scanning apparatus and method |
| EP1089607A2 (en) * | 1998-02-27 | 2001-04-04 | Matsushita Electric Industrial Co., Ltd. | Component recognizing method and apparatus |
| US7115890B2 (en) * | 2003-11-18 | 2006-10-03 | Applied Materials, Inc. | Method and apparatus for inspecting a sample having a height measurement ahead of a focal area |
| TWI237687B (en) * | 2004-04-13 | 2005-08-11 | Chien Hui Chuan | Computer control measuring center |
| WO2007015561A1 (en) * | 2005-08-02 | 2007-02-08 | Matsushita Electric Industrial Co., Ltd. | Electronic component mounter and mounting method |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201120405A (en) | 2011-06-16 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |